Domain controller premature failure screening aging test system, method and electronic equipment

Abstract

This invention discloses a domain controller premature failure screening aging test system, method, and electronic device. The system includes a working environment adjustment module for providing a test working environment for the product under test, having at least two adjustable working environment factors; a working test module connected to the product under test for controlling its power-on and power-off; a performance test module connected to the working test module for performing performance tests on the product under test using the working test module, having at least two performance tests; and a data acquisition module connected to the product under test for acquiring its working data. This invention can simulate more complex usage environments, obtain long-term aging effect data in a shorter time, and evaluate the product's performance under extreme conditions, thus providing a more comprehensive assessment of product durability. By designing test processes to address product-related issues, product problems can be identified early, improving product yield.

Description

Technical Field

[0001] This invention relates to the field of automotive manufacturing technology, and in particular to a domain controller premature failure screening aging test system, method, and electronic device. Background Technology

[0002] With societal progress and rapid technological development, productivity has increased significantly, and automobiles have become an indispensable means of transportation for daily life. Along with rising living standards, the automotive industry is booming, constantly updating automotive hardware to enhance the user experience. As automotive electronics technology continues to evolve, it is developing cutting-edge technologies such as navigation and domain controllers. These technologies are installed in various hardware components to improve vehicle comfort. Because of the high importance of these products, the corresponding testing quality requirements are also increasing. One crucial aspect is testing the aging properties of automotive electronic products under high and low temperature conditions.

[0003] Traditional aging test methods typically involve placing the product under conditions close to real-world usage and recording the results over a long period. While this method is the closest to reality, it is time-consuming and costly. Summary of the Invention

[0004] This invention provides a domain controller premature failure screening aging test system, method, and electronic device to solve the problems of excessive time consumption and high cost in the prior art when performing aging tests on domain controllers.

[0005] According to a first aspect of the present invention, a domain controller premature failure screening aging test system is provided, comprising: The working environment adjustment module is used to provide a test working environment for the product under test, and has at least two working environment factors that can be adjusted. The working test module connects to the product under test to control its power-on and power-off. A performance testing module, connected to a working testing module, is used to perform performance testing on the product under test using the working testing module, and has at least two performance tests. The data acquisition module connects to the product under test to acquire its operational data.

[0006] According to a second aspect of the present invention, a method for premature failure screening and aging test of a domain controller is provided, for use in the premature failure screening and aging test system of the domain controller described in the first aspect, comprising: Adjust the first and / or second working environment factors to create different test working environment scenarios; Performance testing is conducted on the product under test in different testing environments. The performance testing includes: Wake up the product under test; Perform first and / or second performance tests on the product to be tested; Put the product under test into a dormant state.

[0007] According to a third aspect of the present invention, a domain controller premature failure screening aging test apparatus is provided, connected to the domain controller premature failure screening aging test system described in the first aspect, comprising: The test working environment control module is connected to the working environment adjustment module and is used to adjust the first working environment factor and / or the second working environment factor to form different test working environment scenarios. The testing module, connected to the performance testing module, is used to perform performance testing on the product under test in different testing environments. The performance testing includes: Wake up the product under test; Perform first and / or second performance tests on the product to be tested; Put the product under test into a dormant state.

[0008] According to a fourth aspect of the present invention, an electronic device is provided, characterized in that it comprises: at least one processor, and a memory communicatively connected to the at least one processor, and further comprising a communication interface connected to at least one module in the domain controller premature death screening aging test system described in the first aspect above, wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to cause the at least one processor to send test instructions generated after executing the instructions to the module through the communication interface, so as to be able to execute the domain controller premature death screening aging test method described in the second aspect above.

[0009] The domain controller premature failure screening aging test system of this invention is equipped with a working environment adjustment module that has at least two adjustable working environment factors to adjust the working environment of the domain controller during testing. This allows for the simulation of multiple working environments by adjusting these at least two working environment factors multiple times during a single test. Simultaneously, the system includes a performance testing module with at least two performance tests. Combined with the working environment adjustment module, this enables the domain controller under test to undergo multiple performance tests in various working environments, simulating more complex usage environments. It can obtain long-term aging effect data in a shorter time and evaluate the product's performance under extreme conditions, thus providing a more comprehensive assessment of the product's durability. In use, the system can be tailored to the testing focus of different R&D stages (R&D, pilot production, mass production), targeting areas prone to premature failure by adjusting working environment factors, performance tests, and test times. This allows for early detection of product problems, enabling timely improvements, increasing production efficiency, effectively ensuring product functionality and quality, and improving product yield. Attached Figure Description

[0010] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0011] Figure 1 This is a schematic diagram of a domain controller premature failure screening aging test system according to an embodiment of the present invention. Figure 2 This is a schematic diagram of a domain controller premature failure screening aging test system according to another embodiment of the present invention; Figure 3 This is a circuit connection diagram of a domain controller premature death screening aging test system according to an embodiment of the present invention. Figure 4 This is a flowchart of a domain controller premature failure screening aging test method according to an embodiment of the present invention; Figure 5 This is a schematic diagram of an example scheme for a domain controller premature failure screening aging test method according to an embodiment of the present invention; Figure 6 for Figure 5 A flowchart illustrating an example of a domain controller premature aging screening test method. Figure 7 This is a schematic diagram of a domain controller premature failure screening aging test device according to an embodiment of the present invention; Figure 8 This is a schematic diagram of the structure of an embodiment of the electronic device of the present invention.

[0012] Explanation of reference numerals in the attached diagram: 1. Operating environment adjustment module; 11. Ambient temperature adjustment module; 12. Voltage input adjustment module; 2. Operating test module; 21. CAN communication box; 22. Camera module; 23. Radar module; 24. Watchdog module; 3. Performance test module; 31. Link test unit; 32. Memory test unit; 4. Data acquisition module; 5. Product under test; 6. Test operating environment control module; 7. Test module; 810. Processor; 820. Memory; 830. Input device; 840. Output device. Detailed Implementation

[0013] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0014] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other.

[0015] This invention can be described in the general context of computer-executable instructions, such as program modules, that are executed by a computer. Generally, program modules include routines, programs, objects, elements, data structures, etc., that perform a specific task or implement a specific abstract data type. This invention can also be practiced in distributed computing environments where tasks are performed by remote processing devices connected via a communication network. In distributed computing environments, program modules can reside in local and remote computer storage media, including storage devices.

[0016] In this invention, terms such as "module," "device," and "system" refer to relevant entities applied to a computer, such as hardware, combinations of hardware and software, software, or software in execution. More specifically, for example, an element can be, but is not limited to, a process running on a processor, a processor, an object, an executable element, an execution thread, a program, and / or a computer. Furthermore, an application program or script running on a server, and the server itself, can also be an element. One or more elements may be in an execution process and / or thread, and elements may be localized on a single computer and / or distributed across two or more computers, and may be run on various computer-readable media. Elements can also communicate via local and / or remote processes based on signals having one or more data packets, for example, signals from data interacting with another element in a local system, a distributed system, and / or interacting with other systems via signals over a network of the Internet.

[0017] Finally, it should be noted that in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising" or "including" include not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0018] The present invention will now be described in further detail with reference to the accompanying drawings.

[0019] Figure 1 The schematic diagram illustrates the components of a domain controller premature death screening aging test system according to an embodiment of the present invention, with reference to... Figure 1 As shown, the domain controller premature failure screening aging test system of the present invention includes the following modules: a working environment adjustment module 1, used to provide a test working environment for the product under test 5, having at least two adjustable working environment factors; a working test module 2, connected to the product under test 5, used to control the power-on and power-off of the product under test 5; a performance test module 3, connected to the working test module 2, used to perform performance tests on the product under test 5 using the working test module 2, having at least two performance tests; and a data acquisition module 4, connected to the product under test 5, used to acquire the working data of the product under test 5.

[0020] The working environment adjustment module 1 has at least two adjustable working environment factors. By adjusting one working environment factor individually or simultaneously adjusting two or more working environment factors, the working environment scenario of the product under test 5 can be switched and adjusted, thereby simulating more different working environments. These working environment factors may include, but are not limited to, temperature, voltage input value, humidity, and other working environment factors that the domain controller may encounter during normal operation. Adjusting these working environment factors individually or simultaneously adjusting two or more of these working environment factors can create different working environments, thereby simulating various different working environment scenarios for testing the domain controller. For example, refer to... Figure 2 As shown, in some possible implementations, the working environment adjustment module 1 is configured to have two adjustable working environment factors, including a first working environment factor and a second working environment factor. The first working environment factor is temperature, and the second working environment factor is input voltage. Therefore, in this implementation, the working environment adjustment module 1 may include an ambient temperature adjustment module 11 and a voltage input adjustment module 12. The ambient temperature adjustment module 11 provides the test environment temperature for the product under test 5 and controls and adjusts the test environment temperature. The voltage input adjustment module 12 is connected to the product under test 5 and provides an input voltage to the product under test 5, controlling and adjusting the magnitude of the input voltage. Specifically, the ambient temperature adjustment module 11 can be configured as a high and low temperature strain chamber. The product under test 5 can be directly placed in the high and low temperature strain chamber for testing, thus only needing to control the high and low temperature strain chamber to adjust the temperature inside the chamber to simulate different working environment temperatures. The voltage input adjustment module 12 may include a DC power supply, which is connected to the product under test 5 to provide the input voltage to the product under test 5. Furthermore, a relay control box can be installed between the DC power supply and the product under test 5, thereby enabling the power supply between the DC power supply and the product under test 5 to be controlled via the relay control box. The DC power supply can adjust its output voltage, thereby adjusting the input voltage of the product under test 5, and thus simulating the input voltage magnitude under different actual working environments.

[0021] The operational testing module 2 is used to perform operational testing on the product under test 5, such as controlling the power-on and power-off of the product under test 5, as described in the following example. Figure 2As shown, in some possible implementations, the working test module 2 may include a CAN communication box 21. The CAN communication box 21 is connected to the product under test (DUT) 5. Since the DUT 5 is already connected to a DC power supply and a relay control box, connecting the CAN communication box 21 to the DUT 5 also enables power supply to the CAN communication box 21. Controlling the CAN communication box 21 allows the DUT 5 to be woken up or put into sleep mode, thus enabling power-on and power-off of the DUT 5. Specifically, how the CAN communication box 21 controls the DUT 5 to wake up or put it into sleep mode can be implemented according to relevant existing technologies. For example, the test program can control the CAN communication box to send commands to the DUT 5. After recognizing the command, the DUT 5 can enter a sleep state or a wake-up state based on the recognized command. (Refer to...) Figure 2 As shown, the working test module 2 may further include a watchdog module 24. This watchdog module 24 can be a hardware watchdog module, or a hardware or software watchdog module built into the product under test 5, for watchdog function testing of the product under test 5. In this invention, each module in the working environment adjustment module 1 and the working test module 2 can be uniformly controlled by an external control device (such as a computer) to achieve collaborative operation of each module. Simultaneously, each module in the working environment adjustment module 1 and the working test module 2 can also have built-in test programs for controlling their operation, enabling automatic startup according to a pre-set test program and autonomous completion of the overall test process based on the test program.

[0022] Performance testing module 3 is used to perform performance testing on the product under test 5. It has at least two performance tests. Combined with different working environments simulated by working environment adjustment module 1, different performance tests are executed under different working environment scenarios, which can simulate the different functional operations of the domain controller under these working environment scenarios to a certain extent. Simultaneously, performance testing module 3 can adjust the performance test amplitude when performing performance testing on the product under test 5, thereby simulating the working state and workload of the domain controller during operation. Combined with working environment adjustment module 1, it can simulate the different working states and workloads of the domain controller under different working environments. For example, refer to... Figure 2 As shown, in some possible implementations, the performance testing module 3 is configured to perform two different performance tests, including a first performance test and a second performance test, namely a link test and a memory test. Furthermore, the performance testing module 3 may include a link test unit 31 and a memory test unit 32, whereby the link test unit 31 is used to perform link testing on the product 5 under test, and the memory test unit 32 is used to perform memory testing on the product 5 under test. (Refer to...) Figure 2As shown, in this embodiment, the working test module 2 further includes a camera module 22 and / or a radar module 23. The camera module 22 and radar module 23 are hardware modules required for link testing or memory testing of the product under test 5. The link testing unit 31 and the memory testing unit 32 can be independent unit modules with corresponding test programs and connected to the product under test 5 for testing the product under test 5. Alternatively, they can be configured to share the same processing unit module with the data acquisition module 4, so as to perform corresponding tests on the product under test 5 by writing corresponding test programs and connecting to the product under test 5. These processing unit modules may include MCU chips, which can then control the CAN communication box 21 and the camera module 22 and / or radar to perform link testing or memory testing on the product under test 5.

[0023] The data acquisition module 4 connects to the product under test 5 to acquire its operational data. Specifically, this operational data includes whether data is transmitted normally through various interfaces, whether DDR storage is functioning correctly, and whether the autonomous driving system is running normally (whether it starts up normally, whether programs run normally, etc.). The specific operational data to be acquired depends on the performance test being performed, and will vary depending on the specific performance test. The data acquisition module 4 can be configured with relevant hardware modules to collect the data and connect to devices with data processing capabilities to acquire the operational data of the product under test 5. Alternatively, it can directly connect the product under test 5 to devices with data processing capabilities to detect whether the product under test 5 is operating normally. When the data acquisition module 4 connects to these hardware modules or the product under test 5, data signals can be transmitted via a direct line connection or a wireless network connection. These devices with data processing capabilities can include commonly used electronic devices such as personal computers and smartphones. The electronic device can also have an external or internal display module, such as a screen, to display the acquired data, compare it with preset normal data, or analyze the acquired data to generate and display the results. Additionally, the electronic device can be equipped with other peripheral modules, such as a mouse and keyboard, for user control; further examples will not be provided here.

[0024] For example, Figure 3 A schematic diagram illustrating the circuit connection of a domain controller premature death screening aging test system according to an embodiment of the present invention is shown. (Refer to...) Figure 3 As shown, in this embodiment, the working environment adjustment module 1 includes an ambient temperature adjustment module 11 ( Figure 3(Not shown in the diagram) and voltage input adjustment module 12. The ambient temperature adjustment module 11 is configured as a high and low temperature strain chamber, which is enclosed on the outside of the product under test 5. The voltage input adjustment module 12 is configured as a DC power supply. The DC power supply is connected to each product under test 5 to supply power to each product under test 5 and can adjust the voltage output to each product under test 5. The products under test 5 are connected in parallel to ensure that the voltage received by each product under test 5 from the DC power supply is consistent. A relay control box is set between the DC power supply and the product under test 5 to control the power-on and power-off of the product under test 5. The working test module 2 includes a CAN communication box 21 connected to the product under test 5, a camera module 22, and a radar module 23. The product under test 5 has a built-in watchdog module 24 ( Figure 3 (Not shown in the diagram). Data acquisition module 4 is a computer, which connects wirelessly to each product under test 5. Data from each product under test 5 is uploaded to the computer via a data network (such as Ethernet) to collect the operating data of each product under test 5. The DC power supply and the high and low temperature strain chamber are both connected to the computer, allowing the computer to issue commands to control the voltage output of the DC power supply and the ambient temperature of the high and low temperature strain chamber to control the operating environment of the product under test 5. The performance testing module 3 is integrated into the computer and sends commands to each product under test 5 through the connection to control the product under test 5 to perform link testing or memory testing, etc.

[0025] This invention also provides a domain controller premature failure screening aging test method, which is used in any of the above-described domain controller premature failure screening aging test systems, with reference to... Figure 4 As shown, the method flow includes: Step S11: Adjust the first working environment factor and / or the second working environment factor to form different test working environment scenarios; Step S12: Perform performance tests on the product under test 5 in different test working environment scenarios.

[0026] When performing aging tests on a domain controller using the domain controller premature death screening aging test system of the present invention, step S11 can be executed to control the working environment adjustment module 1 to adjust the first working environment factor and / or the second working environment factor throughout the aging test process, thereby enabling different test working environment scenarios to be formed throughout the aging test process.

[0027] Step S12 allows for further control of the performance testing module 3 to perform first and / or second performance tests on the domain controller based on the hardware in the working testing module 2, under different test environment scenarios. This simulates different working states and intensities in different working environments. It should be noted that when executing step S12, the performance tests performed can be limited to the first performance test, the second performance test, or both. The specific execution flow can be designed based on the issues of concern during the premature aging screening test of the product under test 5. During the testing process, the working data information of the product under test is also acquired synchronously to monitor its working status in real time.

[0028] In some possible implementations, after conducting premature aging screening tests on the current product 5, the working data information obtained during the testing process can be analyzed and processed to form analysis results, which can then be output to the display module for display. This will help staff to better analyze the current status of the product being tested.

[0029] It is understood that during the aging test of the domain controller using the premature death screening aging test system of the present invention, the control can be achieved by the staff manually operating the working environment adjustment module 1 and the performance test module 3 to realize the aging test of the domain controller, or by the program to realize the fully automated control to realize the aging test of the domain controller.

[0030] For example, refer to Figure 5 and Figure 6 The diagram illustrates the test method flow of the domain controller premature death screening aging test system of the present invention during aging tests, using the overall process of performing premature death screening aging tests on a certain model of domain controller as an example. Reference is made to... Figure 5 As shown, Figure 5 The X-axis represents the test time axis, the Y-axis on the left represents the ambient temperature, and the Y-axis on the right represents the output voltage of the controller in the input domain. Figure 5 The smooth line represents the change in ambient temperature, while the bar-like section represents the change in voltage during performance testing. Figure 5 This shows how the various processes are distributed along the same timeline. (Refer to...) Figure 6 As shown, Figure 6 To and Figure 5 The corresponding test flowchart is in Figure 6The flowchart shown illustrates the specific execution sequence of the domain controller premature failure screening aging test system during aging testing. During this test, the working environment adjustment module 1 can adjust two different working environment factors: ambient temperature and the output voltage of the product under test 5. The performance test module 3 primarily performs two performance tests on the product under test 5: link testing and memory testing (DDR MemTest). The link testing includes short-cycle link testing (simulated EOL) and long-cycle link testing. Short-cycle link testing involves several 100-second continuous link tests, including watchdog timers and sleep / wake-up mechanisms. Long-cycle link testing involves a single continuous link test exceeding 800 seconds, focusing solely on link testing without watchdog timers or sleep / wake-up mechanisms. The specific number of cycles in the short-cycle link test and the duration of the long-cycle link test are determined based on the parameters and performance required for the current aging test. A startup test may also be included to determine if the product under test has started, confirmed by reading the version number. This can be done directly by acquiring the operating data from the data acquisition module 4 connected to the product under test 5.

[0031] Reference Figure 5 As shown, the test environment was adjusted as follows throughout the testing process: Set the temperature to 30℃ and maintain it for 30 minutes; The temperature was lowered at a rate of -4℃ / min until it reached -40℃, and then held at that temperature for 60 minutes. Increase the temperature at a rate of 4℃ / min until it reaches 70℃, and then hold the temperature for 60 minutes. Cool down at a rate of -4℃ / minute until reaching 20℃; Because the product may function normally under normal voltage supply, but may fail to adapt to power fluctuations and thus cause problems, this test, based on the aforementioned ambient temperature settings, also adjusted the operating voltage throughout the entire testing process to test the product, including: Set the power output voltage of the product under test 5 to 12V and run for 5000s; Set the power output voltage of the product under test 5 to 16V and run for 4000s; Set the power output voltage of the product under test 5 to 12V until the test ends.

[0032] In the above design, the overall operating environment is configured with six scenarios through temperature regulation: normal temperature, high temperature, low temperature, heating up, and cooling down. These scenarios incorporate 12V and 16V input voltage designs, resulting in eight different scenarios: normal temperature with 12V input voltage, normal temperature cooling with 12V input voltage, low temperature with 12V input voltage, low temperature with 16V input voltage, low temperature heating up with 16V input voltage, high temperature with 16V input voltage, high temperature with 12V input voltage, and high temperature cooling with 12V input voltage. Once these different test operating environment scenarios are established, link testing or memory testing can be performed within each of these scenarios. However, it is not necessary to perform link and memory testing in every single test operating environment scenario. The test process for the domain controller can be designed based on known issues with the current product or the product's operation under specific scenarios and working conditions. For example, if a product might experience startup problems in low-temperature environments, the performance testing process can be adjusted to concentrate power-on / off function tests in low-temperature environments. This allows the invention to adjust testing content at any time, focusing on areas prone to premature failure, identifying them early, and promptly analyzing and improving any problems that arise. (Refer to...) Figure 5 As shown in this embodiment, the specific process for performance testing is as follows: Nine short-cycle link tests were performed on product 5 to be tested, with each test lasting 100 seconds followed by a 10-second sleep period. Wake up product 5 under test, perform link testing on product 5 for 800 seconds, and then sleep for 10 seconds; Wake up and perform three short-cycle link tests on product 5 to be tested, with each test lasting 100 seconds and then 10 seconds of sleep. Keep the product under test 5 in a dormant state until the ambient temperature drops to -40°C; Wake up and perform 13 short-cycle link tests on product 5 to be tested, with each test lasting 100 seconds and then 10 seconds of sleep; Wake up product 5 under test, perform a memory test on product 5 under test for 1200 seconds, and then put product 5 under test into sleep mode for 10 seconds. Wake up product 5 under test, perform link test on product 5 under test for 1200 seconds, and put product 5 under test into sleep mode for 10 seconds. Wake up and perform 17 short-cycle link tests on product 5 to be tested, with each test lasting 100 seconds and then 10 seconds of sleep; Wake up product 5 under test, perform a memory test on product 5 under test for 1200 seconds, and then put product 5 under test into sleep mode for 10 seconds. Wake up product 5 under test, perform link test on product 5 under test for 1200 seconds, and put product 5 under test into sleep mode for 10 seconds. Wake up and perform three short-cycle link tests on product 5 to be tested, with each test lasting 100 seconds and then 10 seconds of sleep. Keep the product under test 5 in a dormant state for 600 seconds; Wake up and perform 3 short-cycle link tests on product 5 to be tested, with each test lasting 100 seconds and then 10 seconds of sleep.

[0033] In this process, memory testing was not conducted under normal temperature conditions. This is because memory tests generally function normally at room temperature, but the likelihood of failure increases under high or low temperatures. Therefore, the overall process only includes memory testing in high and low temperature environments. Link testing, on the other hand, is the primary functionality and needs to ensure normal operation at different temperatures; therefore, it is tested in both high and low temperature environments.

[0034] The premature aging screening test method provided by this invention is an accelerated aging experiment. It utilizes the premature aging screening test system of this invention to simulate more complex usage environments, thereby obtaining long-term aging effect data in a shorter time. This data is used to evaluate the product's performance under extreme conditions. Furthermore, the varying test durations and diverse test contents during the aging test increase its complexity, allowing for better early detection of potential problems and risks. This enables a more comprehensive assessment of product durability, prediction of product lifespan, and identification of potential failure modes. This invention not only helps manufacturers reduce market return rates and customer complaints but also promotes continuous product improvement and innovation.

[0035] Reference Figure 7 As shown, the present invention also provides a domain controller premature failure screening aging test device, which is connected to the domain controller premature failure screening aging test system provided by the present invention, for use in performing premature failure screening aging tests on the domain controller to be tested. (Refer to...) Figure 7 As shown, the domain controller premature failure screening aging test equipment includes: The test working environment control module 6 is connected to the working environment adjustment module 1 and is used to adjust the first working environment factor and / or the second working environment factor to form different test working environment scenarios. Test module 7, connected to performance test module 3, is used to perform performance tests on the product 5 under different test environments. The performance tests include: Wake up product 5 to be tested; Perform a first performance test and / or a second performance test on product 5 to be tested; Put the product under test into sleep mode.

[0036] The control and adjustment of the test environment scenario by the test environment control module 6, and the control of the performance test module 3 by the test module 7, can be referred to the relevant descriptions in the domain controller premature failure screening aging test method described above, and therefore will not be repeated here. For example, the domain controller premature failure screening aging test equipment of this embodiment can be any intelligent device with a processor 810, including but not limited to computers, smartphones, personal computers, robots, cloud servers, etc.

[0037] The domain controller premature failure screening aging test system of the present invention is equipped with a working environment adjustment module 1, which has at least two adjustable working environment factors, to adjust the working environment of the domain controller during testing. This allows for the simulation of multiple working environments by adjusting these at least two working environment factors multiple times during a single test. Simultaneously, the system includes a performance test module 3, which has at least two performance tests. Combined with the working environment adjustment module 1, the system can perform multiple performance tests on the domain controller under test in various working environments, thereby simulating more complex usage environments. This allows for the acquisition of long-term aging effect data in a shorter time and the evaluation of product performance under extreme conditions, enabling a more comprehensive assessment of product durability. In use, the system can be tailored to the testing focus of different R&D stages (R&D stage, pilot production stage, mass production stage), targeting areas prone to premature failure by adjusting working environment factors, performance tests, and test times. This allows for early detection of product problems, enabling timely improvements, increasing production efficiency, effectively ensuring product functionality and quality, and improving product yield.

[0038] In some embodiments, the present invention provides a non-volatile computer-readable storage medium storing one or more programs including execution instructions, which can be read and executed by electronic devices (including but not limited to computers, servers, or network devices) to perform the domain controller premature failure screening aging test method of any of the above embodiments of the present invention.

[0039] In some embodiments, the present invention also provides a computer program product, the computer program product including a computer program stored on a non-volatile computer-readable storage medium, the computer program including program instructions, which, when executed by a computer, cause the computer to perform the domain controller premature failure screening aging test method of any of the above embodiments.

[0040] In some embodiments, the present invention also provides an electronic device, comprising: at least one processor, and a memory communicatively connected to the at least one processor, and further comprising a communication interface connected to at least one module in the domain controller premature death screening aging test system, wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to cause the at least one processor to send test instructions generated after executing the instructions to the module through the communication interface, so as to be able to execute the domain controller premature death screening aging test method of any of the above embodiments.

[0041] In some embodiments, the present invention also provides a storage medium storing a computer program, characterized in that the program, when executed by a processor 810, implements the domain controller premature failure screening aging test method of any of the above embodiments.

[0042] Figure 8 This is a schematic diagram of the hardware structure of an electronic device for an execution domain controller premature failure screening aging test method provided in another embodiment of this application, as shown below. Figure 8 As shown, the device includes: One or more processors 810 and memory 820, Figure 8 Take the 810 processor as an example.

[0043] The device for performing the premature aging test method for domain controllers may also include: an input device 830 and an output device 840.

[0044] The processor 810, memory 820, input device 830, and output device 840 can be connected via a bus or other means. Figure 8 Taking the example of a connection between China and Israel via a bus.

[0045] The memory 820, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs, non-volatile computer-executable programs, and modules, such as the program instructions / modules corresponding to the domain controller premature failure screening aging test method in the embodiments of this application. The processor 810 executes various functional applications and data processing of the server by running the non-volatile software programs, instructions, and modules stored in the memory 820, thereby implementing the domain controller premature failure screening aging test method in the above-described method embodiments.

[0046] Memory 820 may include a program storage area and a data storage area. The program storage area may store the operating system and applications required for at least one function; the data storage area may store data created based on the use of the domain controller premature failure screening aging test method, etc. Furthermore, memory 820 may include high-speed random access memory and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, memory 820 may optionally include memory remotely located relative to processor 810, and these remote memories can be connected to the electronic device via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0047] Input device 830 can receive input digital or character information and generate signals related to user settings and function control of the image processing device. Output device 840 may include display devices such as a display screen.

[0048] The one or more modules are stored in the memory 820, and when executed by the one or more processors 810, they perform the domain controller premature aging screening test method in any of the above method embodiments.

[0049] The above-described product can perform the methods provided in the embodiments of this application, and has the corresponding functional modules and beneficial effects for performing the methods. Technical details not described in detail in this embodiment can be found in the methods provided in the embodiments of this application.

[0050] The electronic devices in this application embodiments exist in various forms, including but not limited to: (1) Mobile communication devices: These devices are characterized by their mobile communication capabilities and primarily aim to provide voice and data communication. These terminals include: smartphones (e.g., iPhones), multimedia phones, feature phones, and low-end phones, etc.

[0051] (2) Ultra-mobile personal computer devices: These devices fall under the category of personal computers, possessing computing and processing capabilities, and generally also have mobile internet access features. These terminals include PDAs, MIDs, and UMPCs, such as the iPad.

[0052] (3) Portable entertainment devices: These devices can display and play multimedia content. This category includes audio and video players (such as iPods), handheld game consoles, e-book readers, as well as smart toys and portable car navigation devices.

[0053] (4) Server: A device that provides computing services. The components of a server include a processor, hard disk, memory, system bus, etc. Servers are similar to general computer architectures, but because they need to provide highly reliable services, they have higher requirements in terms of processing power, stability, reliability, security, scalability, and manageability.

[0054] (5) Other electronic devices with data interaction functions.

[0055] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0056] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented using software plus a general-purpose hardware platform, or of course, using hardware. Based on this understanding, the above technical solutions, in essence or the parts that contribute to the related technology, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0057] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. A domain controller premature failure screening aging test system, characterized in that, include: The working environment adjustment module is used to provide a test working environment for the product under test, and has at least two working environment factors that can be adjusted. The working test module connects to the product under test to control its power-on and power-off. A performance testing module, connected to a working testing module, is used to perform performance testing on the product under test using the working testing module, and has at least two performance tests. The data acquisition module connects to the product under test to acquire its operational data.

2. The domain controller premature failure screening aging test system according to claim 1, characterized in that, The performance testing module includes: The link test unit connects to the product under test to perform link testing on the product under test. The memory test unit connects to the product under test for memory testing.

3. The domain controller premature failure screening aging test system according to claim 2, characterized in that, The working test module also includes a watchdog module, which is connected to or built into the product under test for watchdog function testing of the product under test.

4. The domain controller premature failure screening aging test system according to claim 1, characterized in that, The working environment adjustment module includes: The ambient temperature adjustment module is used to provide the test environment temperature for the product under test and to control and adjust the test environment temperature. The voltage input adjustment module is connected to the product under test to input voltage to the product under test and to control and adjust the magnitude of the input voltage.

5. The domain controller premature failure screening aging test system according to claim 4, characterized in that, The ambient temperature adjustment module is a high and low temperature strain chamber. The product to be tested is placed inside the high and low temperature strain chamber to provide a test ambient temperature for the product to be tested.

6. The domain controller premature failure screening aging test system according to claim 4, characterized in that, The voltage input adjustment module includes a DC power supply, which is connected to the product under test to supply input voltage to the product under test. A relay control box is provided between the DC power supply and the product under test.

7. The domain controller premature failure screening aging test system according to claim 1, characterized in that, The working test module is set as a CAN communication box, which is connected to the product under test to control the power-on and power-off of the product under test by waking it up or putting it into sleep mode.

8. The domain controller premature failure screening aging test system according to claim 7, characterized in that, The operational testing module also includes a camera module and / or a radar module. The link test unit is connected to the CAN communication box and the camera module and / or radar module to perform link testing on the product under test; The memory testing unit is connected to a camera module and / or a radar module to perform memory testing on the product under test.

9. A method for premature failure screening and aging test of a domain controller, used in the premature failure screening and aging test system for a domain controller as described in any one of claims 1 to 8, characterized in that, include: Adjust the first and / or second working environment factors to create different test working environment scenarios; Performance testing is conducted on the product under test in different testing environments. The performance testing includes: Wake up the product under test; Perform first and / or second performance tests on the product to be tested; Put the product under test into a dormant state.

10. The domain controller premature failure screening aging test method according to claim 9, characterized in that, include: The first environmental factor is ambient temperature, and the second environmental factor is the output voltage of the product under test. The first performance test is a link test, including short-cycle link tests and / or long-cycle link tests. The short-cycle link test is to perform several link tests lasting 100 seconds each, and the long-cycle link test is to perform a single link test lasting more than 800 seconds. The second performance test is a memory test. Adjusting the test environment scenario formed by the first and / or second working environment factors, including: The first test environment was set to an ambient temperature of 30 degrees Celsius and an input output voltage of 12V for the product under test. The second test environment was set to a temperature decrease from 30 degrees Celsius with a slope of -4 degrees Celsius, and the output voltage of the product under test was 12V. The third test environment is set to an ambient temperature of -40 degrees Celsius and an input output voltage of 12V for the product under test. The fourth test environment is set to an ambient temperature of -40 degrees Celsius and an input output voltage of 16V for the product under test. The fifth test environment is set to a temperature range starting from -40 degrees Celsius and increasing at a rate of 4 degrees Celsius. The output voltage of the product under test is 16V. The sixth test environment is set to an ambient temperature of 70 degrees Celsius and an input output voltage of 16V for the product under test. The seventh test environment is set to an ambient temperature of 70 degrees Celsius and an input output voltage of 12V for the product under test. The eighth test environment is set to an ambient temperature that starts at 70 degrees and continues to decrease at a rate of -4 degrees, with the output voltage of the product under test being 12V.

11. An electronic device, characterized in that, The system includes at least one processor and a memory communicatively connected to the at least one processor, and further includes a communication interface connected to at least one module in the domain controller premature death screening aging test system according to any one of claims 1 to 8, wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to cause the at least one processor to send test instructions generated after executing the instructions to the module through the communication interface, so as to be able to execute the domain controller premature death screening aging test method according to claim 9 or 10.

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