Low-temperature aging test methods, apparatus, equipment and storage media for solid-state drives

Abstract

This invention discloses a method, apparatus, device, and storage medium for low-temperature aging testing of solid-state drives (SSDs). The method includes: performing a full-disk pre-read scan of the SSD under test and identifying low-temperature sensitive areas based on the scan results; writing differentiated interference test data to physical blocks of different sensitivity levels on the SSD under test, and simultaneously applying composite load pressure simulating real-world usage scenarios; monitoring the health status and response latency of the SSD under test during the application of composite load pressure, dynamically adjusting the applied composite load pressure level based on the monitored health status and response latency, and capturing key degradation indicators of the SSD's failure evolution process; calculating a low-temperature aging loss factor based on the recorded key degradation indicators, and classifying the SSD under test according to the low-temperature aging loss factor. This invention effectively improves the accuracy of low-temperature aging testing of SSDs.

Description

Technical Field

[0001] This invention relates to the field of solid-state drive (SSD) technology, and specifically to a method, apparatus, device, and storage medium for low-temperature aging testing of SSDs. Background Technology

[0002] Solid-state drives (SSDs) are critical storage devices in modern computer systems, and their performance and reliability are essential for the overall system operation. During the production and testing of SSDs, low temperatures are a significant factor affecting their performance. In real-world applications, SSDs may face low-temperature operating conditions, which can cause the read / write threshold voltage of flash memory chips to drift, compressing the read margin and leading to read / write errors or reduced data retention.

[0003] Existing SSD testing methods primarily focus on simple high and low temperature tests and full-disk read / write operations, applying only static high-temperature stress. This results in limited test stimuli and incomplete failure mode coverage. These methods cannot effectively identify and filter potential weak blocks and struggle to automate testing in the complex scenarios of real-world applications. Particularly in low-temperature environments, existing testing methods fail to account for the read / write threshold voltage drift characteristics of flash memory chips, leading to discrepancies between test results and reliability in actual usage scenarios. Furthermore, current technologies typically employ power-loss protection to improve reliability, but this approach lacks effective prediction of SSD failures.

[0004] Therefore, improving the accuracy of low-temperature aging tests for solid-state drives is a technical problem that urgently needs to be solved. Summary of the Invention

[0005] This invention provides a method, apparatus, device, and storage medium for low-temperature aging testing of solid-state drives (SSDs), which solves the technical problem of low accuracy in existing low-temperature aging tests for SSDs.

[0006] In a first aspect, the present invention provides a low-temperature aging test method for solid-state drives, comprising: A low-temperature test environment is constructed for the solid-state drive under test. A full disk pre-read scan is performed on the solid-state drive under test, and the low-temperature sensitive areas of the solid-state drive under test are identified based on the full disk pre-read scan results. Based on the distribution information of the low-temperature sensitive area, differentiated interference test data is written to the physical blocks of the solid-state drive under test with different sensitivity levels, and composite load pressure simulating real usage scenarios is applied simultaneously. During the application of composite load pressure, the health status and response latency of the solid-state drive under test are monitored, and the pressure level of the composite load is dynamically adjusted based on the monitored health status and response latency, and key degradation indicators of the failure evolution process of the solid-state drive under test are captured. The low-temperature aging loss factor is calculated based on the recorded key degradation indicators, and the solid-state drive under test is graded according to the low-temperature aging loss factor.

[0007] Optionally, the step of constructing a low-temperature test environment for the solid-state drive under test, performing a full-disk pre-read scan of the solid-state drive under test, and identifying the low-temperature sensitive areas of the solid-state drive under test based on the full-disk pre-read scan results includes: The solid-state drive under test is placed in a constant temperature chamber, and the target temperature of the constant temperature chamber is set to the critical temperature that causes a predetermined offset in the flash memory threshold voltage. A full disk pre-read scan is performed on the user-available space of the solid-state drive under test, and the number of read retries for each physical block is recorded. By statistically analyzing the number of read retries for each physical block and combining the spatial correlation of each physical block within its physical neighborhood, at least one low-temperature sensitive area was identified.

[0008] Optionally, the statistical distribution analysis of the number of read retries for each physical block, combined with the spatial correlation of each physical block within its physical neighborhood, identifies at least one low-temperature sensitive area, including: Based on the number of read retries for each physical block, the median and interquartile range of the number of read retries are determined, and the upper limit of the dynamic threshold is calculated based on the median and the interquartile range. Physical blocks whose read retries exceed the upper limit of the dynamic threshold are identified as candidate block sets; Determine whether the voltage offset of each candidate block in the candidate block set is greater than a preset offset threshold, and whether the proportion of candidate blocks in the physical neighborhood of each candidate block is greater than a preset ratio. Candidate blocks and their physical neighborhoods with voltage offsets greater than a preset offset threshold and a proportion of candidate blocks within their physical neighborhood greater than a preset ratio are identified as low-temperature sensitive areas.

[0009] Optionally, based on the distribution information of the low-temperature sensitive area, differentiated interference test data is written to physical blocks of different sensitivity levels of the solid-state drive under test, and composite load pressure simulating real-world usage scenarios is applied simultaneously, including: Based on the distribution information of the low-temperature sensitive area, test data with different data interference characteristics are written to physical blocks that belong to the low-temperature sensitive area and physical blocks that do not belong to the low-temperature sensitive area, respectively. Within the test partition of the user's available space, construct a set of files with a preset file size distribution; Through multi-threaded concurrent operation, the loop writing and delayed verification operations of the low-temperature sensitive area, as well as the update operation of the metadata of the file set, are executed synchronously.

[0010] Optionally, the step of synchronously executing cyclic writing and delayed verification operations on the low-temperature sensitive area, as well as updating the metadata of the file set through multi-threaded concurrent operations, includes: At least two concurrent threads are started. The first thread performs a write operation on the address range corresponding to the low temperature sensitive area, and reads and verifies after a preset time delay after the write is completed. A second thread, which executes synchronously with the first thread, performs metadata update operations on the file set. The metadata update operations include at least one of file attribute modification, file renaming, and directory creation.

[0011] Optionally, during the application of composite load pressure, the health status and response latency of the solid-state drive under test are monitored, and the pressure level of the composite load is dynamically adjusted based on the monitored health status and response latency. Key degradation indicators of the solid-state drive under test's failure evolution process are also captured, including: The health status data of the solid-state drive under test is collected at preset time intervals, and the input / output response latency of the solid-state drive under test is monitored in real time. When the health status data of the solid-state drive under test meets the first preset degradation condition, the stress level of the applied composite load is reduced. When the input / output response delay of the solid-state drive under test meets the second preset degradation condition, the application of composite load is stopped, and a forced verification is performed on the low-temperature sensitive area to capture key degradation indicators in the fault evolution process.

[0012] Optionally, the step of calculating the low-temperature aging loss factor based on the recorded key degradation indicators, and classifying the solid-state drive under test according to the low-temperature aging loss factor, includes: The low-temperature aging loss factor of the solid-state drive under test is calculated based on the recorded changes in uncorrectable errors before and after the test, the error correction code correction rate, and the failure area of ​​the low-temperature sensitive area. The calculated low-temperature aging loss factor is compared with the preset loss factor threshold. If the calculated low-temperature aging loss factor is less than or equal to the preset loss factor threshold, the solid-state drive under test is determined to be a qualified product; otherwise, it is determined to be a non-qualified product.

[0013] In a second aspect, the present invention provides a low-temperature aging test apparatus for a solid-state drive, comprising: The scanning module is used to construct a low-temperature test environment for the solid-state drive under test, perform a full disk pre-read scan of the solid-state drive under test, and identify the low-temperature sensitive areas of the solid-state drive under test based on the full disk pre-read scan results; The writing module is used to write differentiated interference test data to physical blocks of different sensitivity levels of the solid-state drive under test based on the distribution information of the low temperature sensitive area, and simultaneously apply composite load pressure simulating real use scenarios. The capture module is used to monitor the health status and response latency of the solid-state drive under test during the application of composite load pressure, and dynamically adjust the pressure level of the composite load based on the monitored health status and response latency, and capture key degradation indicators of the failure evolution process of the solid-state drive under test. The processing module is used to calculate the low-temperature aging loss factor based on the recorded key degradation indicators, and to perform grading processing on the solid-state drive under test based on the low-temperature aging loss factor.

[0014] Thirdly, the present invention provides a computer device, the device including a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other through the communication bus; Memory, used to store computer programs; When the processor executes a program stored in the memory, it implements the steps of the low-temperature aging test method for the solid-state drive described in any one of the first aspects above.

[0015] Fourthly, the present invention provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the low-temperature aging test method for a solid-state drive as described in any one of the first aspects above.

[0016] Compared with existing technologies, the present invention provides a method, apparatus, device, and storage medium for low-temperature aging testing of solid-state drives (SSDs). By performing a full-disk pre-read scan and spatial correlation analysis on the SSD under test, it can accurately identify low-temperature sensitive areas and apply test stress to weak areas of the flash memory medium, significantly improving the defect detection rate of low-temperature weak blocks. Simultaneously, based on an adaptive load adjustment mechanism using health status and response delay feedback, it automatically reduces load pressure when a degradation trend is detected in the flash memory medium, protecting the degradation process before the failure escalates. This allows for a complete capture of the degradation process of the SSD under test from initial degradation to critical failure, effectively improving the accuracy of low-temperature aging testing of SSDs. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention, and not all embodiments. For those skilled in the art, other drawings obtained from these drawings without creative effort are all within the scope of protection of this application.

[0018] Figure 1 This is a flowchart of a low-temperature aging test method for a solid-state drive provided in an embodiment of the present invention.

[0019] Figure 2 This is a flowchart of an embodiment of the present invention for identifying the low-temperature sensitive area of ​​the solid-state drive under test.

[0020] Figure 3 This is a flowchart of applying a composite load pressure simulating a real-world usage scenario to a solid-state drive under test, as provided in an embodiment of the present invention.

[0021] Figure 4 This is a flowchart of a method for capturing key degradation indicators in the failure evolution process of a solid-state drive under test, provided by an embodiment of the present invention.

[0022] Figure 5 This is a low-temperature aging test device for solid-state drives provided in an embodiment of the present invention.

[0023] Figure 6 This is a schematic diagram of the structure of a computer device provided in an embodiment of the present invention.

[0024] Figure 7 This is a schematic diagram of the structure of a computer-readable storage medium provided in an embodiment of the present invention. Detailed Implementation

[0025] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0026] To make the description of this disclosure more detailed and complete, illustrative descriptions of embodiments and specific examples of the present invention are provided below; however, these are not the only forms of implementing or utilizing the specific embodiments of the present invention. The embodiments cover features of multiple specific embodiments and the methods, steps, and their order for constructing and operating these specific embodiments. However, other specific embodiments may also be used to achieve the same or equivalent functions and step sequences. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without inventive effort are within the scope of protection of this application.

[0027] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in sequences other than those illustrated or described herein.

[0028] In the description of the embodiments of the present invention, unless otherwise stated, " / " means "or". For example, A / B can mean A or B. The word "and / or" in the text is merely a description of the relationship between related objects, indicating that there can be three relationships. For example, A and / or B can mean: A exists alone, A and B exist simultaneously, and B exists alone. In addition, in the description of the embodiments of this application, "multiple" means two or more. Other quantifiers should be understood similarly. The preferred embodiments described herein are only used to illustrate and explain the present invention and are not intended to limit the present invention. Furthermore, the embodiments and features in the embodiments of this application can be combined with each other without conflict.

[0029] To address the low accuracy of existing low-temperature aging tests for solid-state drives (SSDs), this invention provides a method for low-temperature aging tests of SSDs, such as... Figure 1 The flowchart described above illustrates a low-temperature aging test method for a solid-state drive provided in an embodiment of the present invention, which includes the following steps.

[0030] S10: Construct a low-temperature test environment for the solid-state drive (SSD) under test, perform a full-disk pre-read scan on the SSD, and identify low-temperature sensitive areas based on the full-disk pre-read scan results. Specifically, in this embodiment of the invention, by constructing a low-temperature test environment and performing a full-disk pre-read scan on the SSD, distribution data reflecting the ease of reading each physical block under low-temperature conditions is obtained, and low-temperature sensitive areas are identified based on this data. This invention enables test stress to be concentrated on the areas most likely to fail, avoiding the problem of weak blocks being difficult to expose in the traditional full-disk uniform pressure method, and improving the testing efficiency of the SSD under test.

[0031] S20: Based on the distribution information of the low-temperature sensitive areas, differentiated interference test data is written to physical blocks of different sensitivity levels of the solid-state drive under test, and a composite load pressure simulating real-world usage scenarios is applied simultaneously. Specifically, in this embodiment of the invention, the identified low-temperature sensitive area information is used to write test data with different interference characteristics to physical blocks of different sensitivity levels, and a composite load pressure simulating real-world usage scenarios is applied simultaneously. The differentiated data interference characteristics allow weak areas to withstand stronger stress to accelerate defect exposure, while maintaining a normal stress level for normal areas; the simultaneously applied composite load pressure simulates the complex working conditions of media read / write and file system operations coexisting in real-world application environments, which can induce composite failure modes that are difficult to trigger under single stress. Through the synergistic effect of differentiated pressure and composite load, this invention makes the test conditions closer to actual usage scenarios, and can comprehensively evaluate the overall reliability of solid-state drives in low-temperature environments.

[0032] S30: During the application of composite load pressure, the health status and response latency of the solid-state drive under test are monitored, and the pressure level of the composite load is dynamically adjusted based on the monitored health status and response latency, capturing key degradation indicators of the solid-state drive's failure evolution process. Specifically, in this embodiment of the invention, the degradation of the solid-state drive under stress is a gradual process. Health status indicators can reflect the early deterioration trend of the media, and response latency indicators can reflect the degree to which the device is approaching its functional limits. Dynamic adjustment of the load based on these indicators can reduce the pressure in time before the failure escalates to preserve evidence of degradation, or stop the load when the device is on the verge of failure to capture critical state data. This invention achieves closed-loop adaptive control of test pressure, avoiding the loss of degradation process data due to instantaneous device failure.

[0033] S40: Calculate the low-temperature aging loss factor based on the recorded key degradation indicators, and classify the solid-state drive under test according to the low-temperature aging loss factor. Specifically, in this embodiment of the invention, degradation information from multiple dimensions is integrated into a quantifiable loss factor, which objectively characterizes the overall degradation degree of the solid-state drive under test in the low-temperature aging test through numerical methods, providing a unified decision-making basis for classified treatment.

[0034] As an optional implementation method, such as Figure 2 The above, Figure 2 This is a flowchart of an embodiment of the present invention for identifying the low-temperature sensitive area of ​​a solid-state drive under test. In step S10, the process of constructing a low-temperature test environment for the solid-state drive under test, performing a full disk pre-read scan on the solid-state drive under test, and identifying the low-temperature sensitive area of ​​the solid-state drive under test based on the full disk pre-read scan results includes: S11: Place the solid-state drive under test in a constant temperature chamber, and set the target temperature of the chamber to a critical temperature that causes a predetermined shift in the flash memory threshold voltage. Specifically, in this embodiment of the invention, based on the semiconductor physical characteristics of flash memory, that is, as the ambient temperature decreases, the channel carrier mobility decreases, causing the threshold voltage of the storage cell to drift positively, thereby compressing the voltage margin of the read operation. By setting the target temperature of the constant temperature chamber to the critical temperature of this drift phenomenon, such as -10°C, it is possible to effectively stimulate the edge cells that have difficulty reading due to process deviations, while avoiding the self-protection mechanism of the solid-state drive controller that may be triggered by excessively low temperatures, thus ensuring the effectiveness of the test environment and the safety of the equipment. This invention, through precise temperature settings, constructs a physical environment that best exposes the underlying defects of the medium, providing a foundation for subsequent sensitive detection.

[0035] S12: Perform a full pre-read scan of the user-available space of the solid-state drive under test and record the number of read retries for each physical block. Specifically, in this embodiment of the invention, a testing tool is used to bypass the file system layer and directly perform a low-level full read-only scan of the physical blocks. Due to threshold voltage drift caused by low temperature, weak blocks that were originally at the decision boundary require the controller to repeatedly try different read voltage levels to correctly decode the data, resulting in a significant increase in the number of read retries. By recording this parameter block by block, the read robustness of each physical block at low temperature can be quantitatively reflected. This invention obtains raw data on media reliability through a full-disk scan. Compared with conventional self-test information reading, this method can capture signs of media performance degradation earlier and more microscopically.

[0036] S13: Perform statistical distribution analysis on the number of read retries for each physical block, and combine this with the spatial correlation of each physical block within its physical neighborhood to identify at least one low-temperature sensitive area. Specifically, in this embodiment of the invention, a method combining statistics and spatial analysis is used. First, the distribution of the total number of read retries is modeled, and outlier noise is eliminated using the interquartile range rule to determine the sensitivity threshold. Second, based on the array structure characteristics of the flash memory, the physical neighborhood characteristics of candidate blocks are analyzed. If the number of retries for a certain block exceeds the limit and multiple adjacent blocks also exhibit similar characteristics, it is determined to be a spatially correlated low-temperature sensitive area. This invention effectively distinguishes between isolated random bad blocks and areas of process defects, significantly reducing the false alarm rate, and ensuring that the identified sensitive areas truly reflect potential failure risk areas at low temperatures.

[0037] As an optional implementation, in step S13, the statistical distribution analysis of the number of read retries for each physical block, combined with the spatial correlation of each physical block within its physical neighborhood, identifies at least one low-temperature sensitive area, including: S131: Based on the number of read retries for each physical block, determine the median and interquartile range of the read retries, and calculate the upper limit of the dynamic threshold based on the median and the interquartile range. Specifically, in this embodiment of the invention, based on the number of read retries for each physical block, factory-preset bad block data is removed, and only the valid dataset in the user's available space is retained. The dynamic threshold is calculated based on the median and the interquartile range. The upper limit is shown in formula (1): (1) in, This represents the median of the valid dataset. This represents the interquartile range of the valid dataset.

[0038] Based on the statistical principle of normal distribution, this invention can effectively eliminate extreme outliers caused by occasional interference, ensuring the objectivity and adaptability of the threshold setting. By combining data cleaning with robust statistics, the interference of factory-preset bad blocks is eliminated, and an adaptive screening benchmark that fits the physical characteristics of the solid-state drive under test is constructed, avoiding missed detections or false alarms caused by fixed thresholds.

[0039] S132: Physical blocks with a read retrieval count greater than the upper limit of the dynamic threshold are identified as candidate block sets. Specifically, in this embodiment of the invention, physical blocks with a read retrieval count greater than the upper limit of the dynamic threshold T_upper are included in the candidate set, and the read voltage offset ΔV_read corresponding to each candidate block is retrieved. This offset is obtained through the main control firmware debugging interface and is defined as the difference between the current read voltage and the nominal threshold voltage. This invention uses the voltage offset as a second criterion to accurately identify blocks where the threshold voltage has substantially drifted due to low temperature.

[0040] S133: Determine whether the voltage offset of each candidate block in the candidate block set is greater than a preset offset threshold, and whether the proportion of candidate blocks in the physical neighborhood of each candidate block is greater than a preset ratio. Specifically, in this embodiment of the invention, a physical address neighborhood matrix is ​​constructed, and each candidate block is sequentially determined to satisfy a two-factor constraint condition: first, whether the read voltage offset is greater than a preset offset threshold, for example, |ΔV_read|>50mV; second, within a 4×4 physical neighborhood centered on the block, at least 30% of the adjacent blocks belong to the same candidate set. This invention effectively distinguishes isolated random noise from large-scale process defects through spatial correlation analysis.

[0041] S134: Candidate blocks and their physical neighborhoods with voltage offsets greater than a preset offset threshold and a proportion of candidate blocks within their physical neighborhood greater than a preset ratio are identified as low-temperature sensitive areas. Specifically, in this embodiment, candidate blocks and their physical neighborhoods that simultaneously satisfy |ΔV_read|>50mV and have a neighborhood proportion greater than 30% are marked as extremely low-temperature sensitive areas; blocks that only meet the read retry count condition but have weak neighborhood correlation are marked as secondary observation areas, and a low-temperature sensitive area mapping table is generated, recording the starting physical address and range of both. Based on the risk level, the identified abnormal areas are managed in a refined hierarchical manner. The first-level area represents high-risk clustered defects, and the second-level area represents potential isolated risks. By identifying low-temperature sensitive areas, this invention allows testing resources to be concentrated in the highest-risk areas, thereby improving screening accuracy while optimizing the testing efficiency of the solid-state drives under test.

[0042] As an optional implementation method, such as Figure 3 The above, Figure 3 This is a flowchart illustrating the application of a composite load stress simulating a real-world usage scenario to a solid-state drive (SSD) under test, as provided in an embodiment of the present invention. In step S20, based on the distribution information of the low-temperature sensitive area, differentiated interference test data is written to physical blocks of different sensitivity levels on the SSD under test, and a composite load stress simulating a real-world usage scenario is applied simultaneously, including: S21: Based on the distribution information of the low-temperature sensitive area, test data with different data interference characteristics are written to physical blocks belonging to and not belonging to the low-temperature sensitive area. Specifically, in this embodiment of the invention, according to the physical characteristics of flash memory, a pseudo-random sequence is written to the first-level low-temperature sensitive area. By shortening the data insertion interval to 4KB, charge-coupled interference is enhanced, and the programming verification voltage is passed through the main control firmware debugging interface, while the read margin is compressed. For the second-level observation area, a 1010 alternating high-frequency bit sequence is written to simulate the boundary state charge distribution. This invention creates unconventional test charge disturbances in the sensitive area through differentiated data patterns and voltage stress configurations, forcing weak blocks caused by low-temperature threshold voltage drift to be exposed in a very short time, significantly improving the defect excitation efficiency of the solid-state drive under test.

[0043] S22: Within the test partition of the user's available space, a file set with a preset file size distribution is constructed. Specifically, in this embodiment of the invention, within the test partition of the user's available space, a file size set is constructed, where 20% of the large files occupy 80% of the total storage space, and 80% of the small files occupy 20% of the total storage space. Specifically, this is configured as 105 large files of 64MB and 720 small files of 16KB. This invention is based on statistical analysis of real-world application scenarios and simulates the storage situation in an operating system where a small number of large files and a massive number of small files coexist. It restores the real file system metadata load through a specific file size ratio. This invention overcomes the drawbacks of traditional single test data models, making the test environment highly realistic and effectively verifying the logical address to physical address mapping management capabilities of solid-state drives under complex data distribution.

[0044] S23: Through multi-threaded concurrent operation, the cyclic writing and delayed verification operations to the low-temperature sensitive area, as well as the metadata update operation of the file set, are executed synchronously. Specifically, in this embodiment of the invention, a dual-threaded asynchronous model is constructed. The main thread performs cyclic writing and CRC32 verification of fragmented files within the logical address range corresponding to the first-level low-temperature sensitive area. After each write, a second read is performed after a 60-second delay to test the data retention capability. The secondary thread performs file attribute modification, renaming, and directory creation operations at a high frequency of 50 times per second, forcing the main controller to frequently update the FTL mapping table. This invention accurately simulates the resource scheduling conflict of the main controller under high load conditions by superimposing the combined pressure of read / write verification and metadata storm. It can not only accelerate the exposure of the data retention defects of the medium, but also effectively detect the logical errors and response delays of the FTL algorithm in low-temperature environments.

[0045] As an optional implementation, in step S23, the synchronous execution of cyclic writing and delayed verification operations on the low-temperature sensitive area, as well as the update operation of the metadata of the file set through multi-threaded concurrent operation, includes: S231: Start at least two concurrent threads. The first thread performs a write operation on the address range corresponding to the low-temperature sensitive area, and performs a read verification after a preset delay after the write is completed. Specifically, in this embodiment of the invention, based on the principle of flash memory data retention characteristics, and utilizing the physical characteristic that the charge leakage rate is slow but the read margin is compressed under low-temperature conditions, a 60-second delay window is set after writing the test data before performing CRC32 integrity verification. This invention effectively activates and detects the data retention capability defects of the low-temperature sensitive area by introducing a time-dimensional stress test.

[0046] S232: A second thread, executed synchronously with the first thread, performs a metadata update operation on the file set. This metadata update operation includes at least one of file attribute modification, file renaming, and directory creation. Specifically, in this embodiment of the invention, a second thread, executed synchronously with the first thread, performs a metadata update operation on the file set. This operation includes performing at least one of file attribute modification, file renaming, and directory creation at a high frequency of 50 times per second. Based on the working mechanism of the solid-state drive's FTL management layer, and utilizing the characteristic that metadata updates inevitably trigger FTL mapping table rewriting and garbage collection thread scheduling, a high-intensity metadata storm is constructed in the background. This operating mode forces the main control chip to frequently handle logical address changes in the file system while dealing with the difficulties of reading low-temperature media, greatly increasing the main control chip's computational load and cache scheduling pressure.

[0047] As an optional implementation method, such as Figure 4 The above, Figure 4 This is a flowchart of a method for capturing key degradation indicators during the failure evolution process of a solid-state drive (SSD) under test, provided by an embodiment of the present invention. In step S30, during the application of composite load pressure, the health status and response latency of the SSD under test are monitored, and the pressure level of the composite load is dynamically adjusted based on the monitored health status and response latency, and key degradation indicators during the failure evolution process of the SSD under test are captured, including: S31: Collect health status data of the solid-state drive under test at preset time intervals, and monitor the input / output response latency of the solid-state drive under test in real time. Specifically, in this embodiment of the invention, based on the gradual failure mechanism of solid-state drives, open-source tools are used to poll and read SMART information every 15 minutes, focusing on capturing health indicators such as hardware error correction and recovery count and the current number of sectors to be mapped. At the same time, the response time of a single IO operation is tracked in real time through kernel logs and IO monitoring tools. This invention establishes a dual-track monitoring mechanism that combines software and hardware, reflecting the physical aging degree inside the flash memory medium through SMART data and reflecting the real-time scheduling status of the main controller firmware through IO latency, thereby perceiving the true health status of the solid-state drive under test under low temperature and high pressure testing.

[0048] S32: When the health status data of the solid-state drive under test meets the first preset degradation condition, the pressure level of the applied composite load is reduced. Specifically, in this embodiment of the invention, based on the negative feedback control principle, the first preset degradation condition can be set as the hardware error correction recovery count exceeding 10,000 times or the first appearance of a sector to be mapped. Once this condition is triggered, the system determines that the media reliability has reached an inflection point, and then automatically executes a dynamic load reduction strategy, reducing the write block size from 1MB to 64KB and reducing the random write ratio from 50% to 10%. This invention achieves dynamic control of the testing process, avoiding irreversible hard failure of the media due to excessive load.

[0049] S33: When the input / output response latency of the solid-state drive under test meets the second preset degradation condition, the application of composite load is stopped, and a forced verification is performed on the low-temperature sensitive area to capture key degradation indicators in the fault evolution process. Specifically, in this embodiment of the invention, based on the failure interception mechanism, the second preset degradation condition can be set as a single IO time exceeding 200 milliseconds and occurring three times consecutively within one minute. Once a pre-disk failure state is determined, the system immediately suspends the regular load and instead calls the testing tool to perform high-intensity read / write verification on the addresses in the low-temperature sensitive area mapping table, recording the uncorrectable error count and latency distribution at this time. This invention accurately captures the critical point state before the fault outbreak, and through forced verification, locks down the specific physical location and error mode that caused the latency surge, providing high-value micro-failure data for subsequent root cause analysis and reliability modeling.

[0050] As an optional implementation, in step S40, calculating the low-temperature aging loss factor based on the recorded key degradation indicators and classifying the solid-state drive under test according to the low-temperature aging loss factor includes: S41: Based on the recorded changes in uncorrectable errors before and after the test, the error correction code correction rate, and the failure area of ​​the low-temperature sensitive region, calculate the low-temperature aging loss factor of the solid-state drive under test. In this embodiment of the invention, the low-temperature aging loss factor of the solid-state drive under test is calculated as shown in formula (2): (2) in, This indicates the number of uncorrectable error sectors at the end of the test. This indicates the number of uncorrectable faulty sectors at the start of the test. Indicates the end of the test Error correction rate Indicates the end of the test Error correction rate; express Area of ​​failed blocks within the region Indicates the available capacity for the user. Indicates the test duration. , , This represents the weighting coefficient.

[0051] This invention transforms dispersed physical characterization parameters into a unified reliability metric by constructing a quantitative comprehensive evaluation index, thereby achieving accurate digital characterization of the low-temperature aging degree of solid-state drives.

[0052] S42: Compare the calculated low-temperature aging loss factor with a preset loss factor threshold. Specifically, in this embodiment of the invention, based on a graded early warning mechanism, a dynamic threshold range is set, which can compare the calculated loss factor with the preset low-temperature aging loss factor threshold. The values ​​are compared with two key thresholds, 0.02 and 0.08, to determine the product's reliability level. This invention avoids the subjectivity of human experience in judgment by comparing the calculated low-temperature aging loss factor with a preset loss factor threshold, making the reliability assessment of solid-state drives from different batches and models comparable.

[0053] S43: If the calculated low-temperature aging loss factor is less than or equal to a preset loss factor threshold, the solid-state drive under test is determined to be a qualified product; otherwise, it is determined to be a defective product. Specifically, in this embodiment of the invention, if the calculated low-temperature aging loss factor is less than or equal to a preset loss factor threshold, the solid-state drive under test is determined to be a qualified product; otherwise, it is determined to be a defective product. Specifically, when... When the product is deemed qualified, it is allowed to leave the factory; when When it is determined to be an edge reliability disk; when The disk is identified as a reliability warning disk. This invention enables refined hierarchical management of solid-state drives, maximizing inventory turnover and resource utilization while ensuring end-user data security, achieving the best balance between reliability and cost.

[0054] In this embodiment of the invention, by performing a full-disk pre-read scan and spatial correlation analysis on the solid-state drive under test, low-temperature sensitive areas can be accurately identified, allowing test stress to be applied directionally to weak areas of the flash memory medium, significantly improving the defect detection rate of low-temperature weak blocks. Simultaneously, based on an adaptive load adjustment mechanism using health status and response delay feedback, the load pressure is automatically reduced when a degradation trend of the flash memory medium is detected, protecting the degradation site before the fault escalates. This comprehensively captures the degradation process of the solid-state drive under test from initial degradation to critical failure, effectively improving the accuracy of low-temperature aging tests for solid-state drives.

[0055] Based on the above-mentioned low-temperature aging test method for solid-state drives, this invention provides a low-temperature aging test apparatus for solid-state drives, such as... Figure 5As shown in Figure 5, the structural schematic diagram of this solid-state drive (SSD) low-temperature aging test device includes: a scanning module 51, used to construct a low-temperature test environment for the SSD under test, perform a full-disk pre-read scan of the SSD under test, and identify the low-temperature sensitive areas of the SSD under test based on the full-disk pre-read scan results; a writing module 52, used to write differentiated interference test data to physical blocks of different sensitivity levels of the SSD under test based on the distribution information of the low-temperature sensitive areas, and simultaneously apply composite load pressure simulating real-world usage scenarios; a capture module 53, used to monitor the health status and response latency of the SSD under test during the application of composite load pressure, and dynamically adjust the pressure level of the composite load based on the monitored health status and response latency, and capture key degradation indicators of the fault evolution process of the SSD under test; and a processing module 54, used to calculate the low-temperature aging loss factor based on the recorded key degradation indicators, and perform graded processing on the SSD under test based on the low-temperature aging loss factor.

[0056] For further details regarding the implementation of the above technical solution by each module in the above-mentioned low-temperature aging test device for solid-state drives, please refer to the description in the low-temperature aging test method for solid-state drives provided in the above-mentioned embodiments of the invention, which will not be repeated here.

[0057] Please refer to Figure 6This is a schematic diagram of the structure of a computer device provided in an embodiment of the present invention. The device includes a processor 601, which can be implemented using a general-purpose central processing unit (CPU), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, for executing relevant programs to implement the technical solutions provided in the embodiments of this application; and a memory 602, which can be implemented using a read-only memory (ROM), static storage device, dynamic storage device, or random access memory (RAM), etc. The memory 602 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program code is stored in the memory 602 and is called and executed by the processor 601. The input / output interface 603 is used to realize information input and output. The communication interface 604 is used to realize communication interaction between this device and other devices. Communication can be realized by wired means (e.g., USB, network cable, etc.) or by wireless means (e.g., mobile network, WIFI, Bluetooth, etc.). The bus 605 transmits information between the various components of the device (e.g., processor 601, memory 602, input / output interface 603 and communication interface 604). The processor 601, memory 602, input / output interface 603 and communication interface 604 realize communication connection between each other within the device through the bus 605.

[0058] Please refer to Figure 7 This is a schematic diagram of a computer-readable storage medium structure according to an embodiment of the present invention. The storage medium 70 of this embodiment stores program instructions 71 capable of implementing the aforementioned low-temperature aging test method for a solid-state drive. These program instructions 71 can be stored in the storage medium in the form of a software product, including several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute all or part of the steps of the method described in various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks, or terminal devices such as computers, servers, mobile phones, and tablets.

[0059] In the several embodiments provided by this invention, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0060] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated units described above can be implemented in hardware or as software functional units. The above are merely embodiments of the present invention and do not limit the patent scope of the present invention. Any equivalent structural or procedural transformations made based on the description and drawings of the present invention, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of the present invention.

[0061] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention in any way. Although the present invention has been disclosed above with reference to preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make some modifications or alterations to the above-disclosed technical content to create equivalent embodiments without departing from the scope of the present invention. Any simple modifications, equivalent changes and alterations made to the above embodiments based on the technical essence of the present invention without departing from the scope of the present invention shall still fall within the scope of the present invention.

Claims

1. A low-temperature aging test method for solid-state drives, characterized in that, include: Constructing a low-temperature test environment for the solid-state drive (SSD) under test, performing a full disk pre-read scan on the SSD, and identifying the low-temperature sensitive areas of the SSD based on the full disk pre-read scan results, including: The solid-state drive under test is placed in a constant temperature chamber, and the target temperature of the constant temperature chamber is set to the critical temperature that causes a predetermined offset in the flash memory threshold voltage. A full disk pre-read scan is performed on the user-available space of the solid-state drive under test, and the number of read retries for each physical block is recorded. Statistical distribution analysis of the number of read retries for each physical block was performed, and at least one low-temperature sensitive area was identified by combining the spatial correlation of each physical block within the physical neighborhood. Based on the distribution information of the low-temperature sensitive area, differentiated interference test data is written to the physical blocks of the solid-state drive under test with different sensitivity levels, and composite load pressure simulating real usage scenarios is applied simultaneously. During the application of composite load pressure, the health status and response latency of the solid-state drive under test are monitored, and the pressure level of the composite load is dynamically adjusted based on the monitored health status and response latency, and key degradation indicators of the failure evolution process of the solid-state drive under test are captured. The low-temperature aging loss factor is calculated based on the recorded key degradation indicators, and the solid-state drive under test is graded according to the low-temperature aging loss factor.

2. The low-temperature aging test method for solid-state drives according to claim 1, characterized in that, The statistical distribution analysis of the number of read retries for each physical block, combined with the spatial correlation of each physical block within its physical neighborhood, identifies at least one low-temperature sensitive area, including: Based on the number of read retries for each physical block, the median and interquartile range of the number of read retries are determined, and the upper limit of the dynamic threshold is calculated based on the median and the interquartile range. Physical blocks whose read retries exceed the upper limit of the dynamic threshold are identified as candidate block sets; Determine whether the voltage offset of each candidate block in the candidate block set is greater than a preset offset threshold, and whether the proportion of candidate blocks in the physical neighborhood of each candidate block is greater than a preset ratio. Candidate blocks and their physical neighborhoods with voltage offsets greater than a preset offset threshold and a proportion of candidate blocks within their physical neighborhood greater than a preset ratio are identified as low-temperature sensitive areas.

3. The low-temperature aging test method for solid-state drives according to claim 1, characterized in that, Based on the distribution information of the low-temperature sensitive zone, differentiated interference test data is written to physical blocks of different sensitivity levels of the solid-state drive under test, and composite load pressure simulating real-world usage scenarios is applied simultaneously, including: Based on the distribution information of the low-temperature sensitive area, test data with different data interference characteristics are written to physical blocks that belong to the low-temperature sensitive area and physical blocks that do not belong to the low-temperature sensitive area, respectively. Within the test partition of the user's available space, construct a set of files with a preset file size distribution; Through multi-threaded concurrent operation, the loop writing and delayed verification operations of the low-temperature sensitive area, as well as the update operation of the metadata of the file set, are executed synchronously.

4. The low-temperature aging test method for solid-state drives according to claim 3, characterized in that, The method of synchronously executing cyclic writing and delayed verification operations on the low-temperature sensitive area, as well as updating the metadata of the file set through multi-threaded concurrent operation, includes: At least two concurrent threads are started. The first thread performs a write operation on the address range corresponding to the low temperature sensitive area, and reads and verifies after a preset time delay after the write is completed. A second thread, which executes synchronously with the first thread, performs metadata update operations on the file set. The metadata update operations include at least one of file attribute modification, file renaming, and directory creation.

5. The low-temperature aging test method for solid-state drives according to claim 1, characterized in that, During the application of composite load pressure, the health status and response latency of the solid-state drive under test are monitored, and the pressure level of the composite load is dynamically adjusted based on the monitored health status and response latency. Key degradation indicators of the solid-state drive under test's fault evolution process are also captured, including: The health status data of the solid-state drive under test is collected at preset time intervals, and the input / output response latency of the solid-state drive under test is monitored in real time. When the health status data of the solid-state drive under test meets the first preset degradation condition, the stress level of the applied composite load is reduced. When the input / output response delay of the solid-state drive under test meets the second preset degradation condition, the application of composite load is stopped, and a forced verification is performed on the low-temperature sensitive area to capture key degradation indicators in the fault evolution process.

6. The low-temperature aging test method for solid-state drives according to claim 1, characterized in that, The step of calculating the low-temperature aging loss factor based on recorded key degradation indicators and classifying the solid-state drive under test according to the low-temperature aging loss factor includes: The low-temperature aging loss factor of the solid-state drive under test is calculated based on the recorded changes in uncorrectable errors before and after the test, the error correction code correction rate, and the failure area of ​​the low-temperature sensitive area. The calculated low-temperature aging loss factor is compared with the preset loss factor threshold. If the calculated low-temperature aging loss factor is less than or equal to the preset loss factor threshold, the solid-state drive under test is determined to be a qualified product; otherwise, it is determined to be a non-qualified product.

7. A low-temperature aging test device for solid-state drives, characterized in that, The apparatus is used to implement the low-temperature aging test method for solid-state drives as described in any one of claims 1-6, comprising: The scanning module is used to construct a low-temperature test environment for the solid-state drive under test, perform a full disk pre-read scan on the solid-state drive under test, and identify the low-temperature sensitive areas of the solid-state drive under test based on the full disk pre-read scan results. The writing module is used to write differentiated interference test data to physical blocks of different sensitivity levels of the solid-state drive under test based on the distribution information of the low temperature sensitive area, and simultaneously apply composite load pressure simulating real use scenarios. The capture module is used to monitor the health status and response latency of the solid-state drive under test during the application of composite load pressure, and dynamically adjust the pressure level of the composite load based on the monitored health status and response latency, and capture key degradation indicators of the failure evolution process of the solid-state drive under test. The processing module is used to calculate the low-temperature aging loss factor based on the recorded key degradation indicators, and to perform grading processing on the solid-state drive under test based on the low-temperature aging loss factor.

8. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the low-temperature aging test method for solid-state drives as described in any one of claims 1 to 6.

9. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by the processor, it implements the steps of the low-temperature aging test method for solid-state drives as described in any one of claims 1 to 6.

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