A bidirectional logic mapping connection structure for charging device interconnect testing

CN122592072APending Publication Date: 2026-08-18XIAMEN XINGYAO HONGNENG NEW ENERGY CO LTD
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Patent Information

Application Number
CN202610791747.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-06-03
Publication Date
2026-08-18

AI Technical Summary

Technical Problem

如果连接结构只能适配某一种端子命名方式,或者缺少端子映射和切换能力,就难以用于不同标准接口之间的互连测试

Benefits of technology

[0025] 1. The device under test can be directly connected to this connection structure using existing two-way charging guns or power supply side interfaces to form a test closed loop. This connection structure itself is a dedicated test device, but unlike traditional load boxes or general-purpose test benches, it does not require an external actual power supply object, has simple wiring, and is easy to perform factory debugging and on-site maintenance.

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Abstract

This invention discloses a bidirectional logic mapping connection structure for interconnection testing of charging devices. Two interface docking units are respectively equipped with a first charging interface and a second charging interface, used to form a pluggable connection with a charging gun or power supply side interface. The internal logic mapping path is located within an insulating support structure, including a first-end channel group, a second-end channel group, and an intermediate mapping connection area connecting the two. The mapping configuration component is implemented by an intermediate control circuit board. The intermediate control circuit board obtains the test role status through the communication ports of the two interfaces and controls the relay group and / or analog switch to complete channel matching for the high-voltage path, low-voltage signal path, and communication path, establishing controlled closed-loop mutual test conditions. This connection structure does not preset a fixed master-slave direction; both interface docking units can serve as test input sides or test output sides, and support the use of the same or different charging interface standards at both ends. A corresponding relationship is established according to functional channel categories through a terminal mapping table.
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Description

Technical Field

[0001] This invention relates to interface interconnection testing technology for charging equipment of electric vehicles, and more particularly to a bidirectional logical mapping connection structure for establishing a controlled closed-loop interconnection of DC charging interfaces in test mode. Background Technology

[0002] During factory commissioning, on-site maintenance, and fault location of DC charging piles, charging stacks, and modular DC charging systems, it is typically necessary to verify the power path, communication path, control guidance, connection confirmation, interlocking, and auxiliary power supply functions of the charging interface. Existing methods often rely on external power users, dedicated test benches, or temporary adapter bundles, which are cumbersome and not conducive to rapid switching between multiple standard interfaces.

[0003] In actual testing, the charging device under test is usually equipped with a charging gun or other power supply interface. If these existing interfaces can be used in conjunction with a connection structure with internal mapping function to form a test closed loop, the reliance on external vehicles, battery packs, load boxes or dedicated test benches can be reduced.

[0004] The problem lies in the fact that the two power supply interfaces cannot be simply short-circuited wire by wire. Although the terminal definitions of the charging gun and the power receiving interface correspond, their physical connection relationships and testing roles are different. During testing, the main controller of the charging equipment needs to set one side to charging output mode and the other side to simulate power receiving mode; the connection structure in the middle must be controlled to connect, disconnect, or simulate equivalently for the high-voltage path, communication path, control guidance, connection confirmation, and other channels according to the different roles of the two sides. Ordinary wiring harnesses or simple adapters cannot meet the dual requirements of this physical connection relationship and role recognition switching.

[0005] Furthermore, different charging interface standards (such as GB / T, CCS, CHAdeMO, ChaoJi, NACS, MCS, and other standards applicable to electric equipment such as ships and low-altitude aircraft) differ in terms of terminal definitions, communication physical layers, auxiliary power supply, and locking interlocks. If the connection structure can only adapt to a certain terminal naming method, or lacks terminal mapping and switching capabilities, it will be difficult to use for interconnection testing between different standard interfaces. Summary of the Invention

[0006] The main technical problem to be solved by the present invention is to provide a bidirectional logic mapping connection structure for interconnection testing of charging devices, which can complete controlled interconnection and logic mapping on its own, so that the charging device under test can be directly plugged in for testing using an existing charging gun or power supply side interface.

[0007] To address the aforementioned technical problems, this invention provides a bidirectional logic mapping connection structure for interconnection testing of charging devices, comprising at least two interface docking units, an insulating support structure, an internal logic mapping path, and a mapping configuration component.

[0008] The at least two interface docking units include a first interface docking unit and a second interface docking unit. The first interface docking unit and the second interface docking unit are respectively provided with a first charging interface and a second charging interface, which are used to form a pluggable connection with the charging gun or the power supply side interface.

[0009] The insulating support structure is used to support the interface docking unit and carry the internal logic mapping path;

[0010] The internal logic mapping path is disposed within the insulating support structure, including a first end channel group, a second end channel group, and an intermediate mapping connection area connecting the first end channel group and the second end channel group; the first end channel group and the second end channel group are respectively led out by the corresponding functional channel terminals of the first charging interface and the second charging interface;

[0011] The intermediate mapping connection area is used to establish electrical connection, equivalent termination, isolated sampling, protocol adaptation or equivalent mapping of corresponding functional channels in the first end channel group and the second end channel group according to a preset correspondence under test conditions, so as to form controlled closed-loop mutual test conditions.

[0012] The preset correspondence includes a preset electrical mapping relationship, which is used to perform complementary correspondence, cross correspondence, functional correspondence or equivalent conversion on at least one set of corresponding functional channels, so that the interconnection relationship between the two end interfaces is equivalent to the docking relationship between the charging device side interface and the power user side interface.

[0013] The mapping configuration component is disposed in or electrically connected to the intermediate mapping connection area, and is used to selectively enable, disable or switch the electrical connection relationship or equivalent mapping relationship of the corresponding functional channel according to the preset mapping relationship, standard configuration data or terminal mapping table; the mapping configuration component controls the corresponding functional channel to complete channel matching according to the test role status of the interfaces on both sides.

[0014] The connection structure does not have a fixed master-slave direction. Both the first interface docking unit and the second interface docking unit can participate in closed-loop mutual testing as test input side or test output side, and are only enabled in the test state or debugging stage, and are isolated from the normal charging path.

[0015] In a preferred embodiment: the corresponding functional channel includes at least a power path, a communication path, a control guidance path, a connection confirmation path, a lockout interlock path, and an auxiliary power supply path; wherein, the power path is classified as a high-voltage path, and the other paths are classified as low-voltage signal paths or low-voltage auxiliary power supply paths.

[0016] In a preferred embodiment, the system further includes a first interface base mechanism and a second interface base mechanism. The first interface base mechanism is disposed between the first interface docking unit and the insulating support structure, and the second interface base mechanism is disposed between the second interface docking unit and the insulating support structure. The first interface base mechanism and the second interface base mechanism are used to fix the corresponding interface docking units and lead out their terminal channels. The first interface base mechanism and the second interface base mechanism are one of the following: a power receiving interface base, a gun base, an interface base, or a mounting and fixing structure.

[0017] In a preferred embodiment: the at least two interface docking units are the same or different in structure, and correspond to the same or different charging interface standards respectively; the connection structure establishes a corresponding relationship at the functional channel level through a replaceable interface socket mechanism, internal logic mapping path, communication adapter circuit or a combination thereof, so as to adapt to different charging interface standards; the connection structure is an internal test structure of the charging device or a dedicated test accessory that can be repeatedly plugged in and out.

[0018] In a preferred embodiment: the mapping configuration component includes an intermediate control circuit board, which includes a control circuit and a group of relays and / or analog switches driven by the control circuit, for switching between at least two sets of preset mapping relationships to change the interconnection relationship of corresponding functional channels.

[0019] In a preferred embodiment: the internal logic mapping path includes a switchable polarity alignment path corresponding to the high-voltage power path and an energy path isolation and measurement branch; the switchable polarity alignment path is used to perform same-name direct correspondence or different-name complementary correspondence switching on the power path; the energy path isolation and measurement branch is used to disconnect the main energy path on at least one end of the tested interface side while maintaining the measurement connection in the test state, so that the charging device can collect DC voltage through the measurement link.

[0020] In a preferred embodiment: the internal logic mapping path includes communication branches, status branches and / or auxiliary power supply branches corresponding to the low-voltage signal path, used to perform pass-through, cross-connection, equivalent termination, isolation sampling, protocol adaptation, power supply presence detection or status simulation on the corresponding path.

[0021] In a preferred embodiment: the operating power of the mapping configuration component is provided by the auxiliary power supply terminal of at least one interface docking unit, the low-voltage power supply inside the charging device, the independent power supply, the external power supply or the energy storage unit; the mapping configuration component obtains the role status information or conduction control signal of the interfaces on both sides through the communication port, control signal terminal or control interface of at least one interface docking unit or the connection structure.

[0022] In a preferred embodiment: the connection structure is only enabled when the test state is valid, the normal charging path is isolated, at least two interface docking units are plugged in, the roles on both sides are determined, the standard configuration data or terminal mapping table matches, and the safety interlocking conditions are met; when the standard configuration data cannot be determined, or is inconsistent with the role status, plugging status, terminal detection results, or communication identification results, the internal logic mapping path remains disconnected.

[0023] In a preferred embodiment: the first charging interface and the second charging interface respectively conform to any one of the DC charging interface standards of GB / T, CCS, CHAdeMO, ChaoJi, NACS, and MCS, or conform to the power receiving interface standard of vehicles, ships, low-altitude aircraft, or other electric equipment; the standard configuration data includes interface standard identifier, terminal mapping relationship, communication configuration, threshold parameters, test items, and power connection structure; the terminal mapping table is used to classify the specific terminal identifiers in different standards into functional channel categories and establish a connection relationship with the corresponding branches in the internal logical mapping path.

[0024] Compared with the prior art, the present invention has the following beneficial effects:

[0025] 1. The device under test can be directly connected to this connection structure using existing two-way charging guns or power supply side interfaces to form a test closed loop. This connection structure itself is a dedicated test device, but unlike traditional load boxes or general-purpose test benches, it does not require an external actual power supply object, has simple wiring, and is easy to perform factory debugging and on-site maintenance.

[0026] 2. The intermediate control circuit board obtains test role information through the existing communication ports on both sides, and controls the relay group and / or analog switch to complete channel matching accordingly. The test role is set by the main control unit, and the hardware connection relationship is executed by the intermediate control circuit board. The connection relationship is consistent and repeatable, reducing the risk of manual wiring errors and uncertain status.

[0027] 3. By isolating the energy path and measurement branch, disconnect the main energy path on at least one end of the interface under test while maintaining the measurement connection during the test, thereby reducing the risk of high-pressure backflow damaging the equipment.

[0028] 4. The internal preset mapping relationship and terminal mapping table enable the two charging device side interfaces to establish a test connection relationship equivalent to "charging device side connecting to power user side", which solves the matching problem caused by the corresponding terminal functions but different test roles. Attached Figure Description

[0029] Figure 1 This is an overall schematic diagram of the bidirectional logic mapping connection structure of the present invention; the first charging gun 110 and the second charging gun 120 in the figure are used to represent the external plug-in state.

[0030] Figure 2 This is a schematic diagram of the internal terminals and coupling connections of the interface docking unit;

[0031] Figure 3 This is a three-dimensional exploded view of the bidirectional logic mapping connection structure of the present invention;

[0032] Figure 4 This is a schematic diagram showing the connection between the two side interface assemblies and the middle connection assembly;

[0033] Explanation of reference numerals in the attached figures:

[0034] 111-First docking unit, 121-Second docking unit, 130-Insulating housing, 148-Mapping configuration component, 150-First connection switching circuit, 151-Second connection switching circuit, 160-First connection terminal wire, 161-Second connection terminal wire harness, 210-High voltage terminal group, 211-High voltage wiring terminal, 220-Second side high voltage terminal, 221-First side-PLC-terminal, 222-Second side-PLC-terminal, 223-First side coupler, 224-Second side coupling circuit, 225-First side low voltage wiring terminal, 226-Signal connection line terminal group; Detailed Implementation

[0035] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, the accompanying drawings show only the parts relevant to the present invention, and not all of the structures.

[0036] In the description of this invention, unless otherwise explicitly specified and limited, the terms "connected," "linked," and "fixed" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0037] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0038] In the description of this embodiment, the terms "upper," "lower," "right," and "left," etc., refer to the orientation or positional relationship shown in the accompanying drawings. They are used only for ease of description and simplification of operation, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the present invention. In addition, the terms "first" and "second" are used only for distinction in description and have no special meaning.

[0039] like Figures 1 to 4 As shown, the bidirectional logic mapping connection structure for interconnection testing of charging devices described in this invention is mainly divided into three parts: a first interface assembly, a middle connection assembly, and a second interface assembly. Both the first and second interface assemblies are power-receiving interface structures used to form a pluggable connection with the charging gun. The middle connection assembly is used to realize the internal logic mapping and channel switching control between the two interfaces.

[0040] The first interface assembly and the second interface assembly correspond to the first docking unit 111 and the second docking unit 121, respectively. Both are equipped with charging interfaces, which can be implemented using a power receiving interface assembly, a power receiving interface socket, a gun socket, or an equivalent interface component. The structural forms can be the same or different to adapt to the same or different types of charging interface standards. The insulating support structure consists of an insulating shell 130 and an internal mounting support part, which is used to fix and support the interface assemblies on both sides and to carry the internal logic mapping path and mapping configuration component 148.

[0041] The internal logic mapping path is located inside the insulating support structure, including a first end channel group, a second end channel group, and an intermediate mapping connection area connecting the two groups of channels. The first end channel group is led out from the functional channel terminals of the first docking unit 111 via the first connection terminal harness 160, and the second end channel group is led out from the functional channel terminals of the second docking unit 121 via the second connection terminal harness 161. Both groups of channels are connected to the intermediate mapping connection area to realize the matching, switching, and equivalent mapping of functional channels.

[0042] The mapping configuration component 148 is the core component of the central connection assembly, specifically implemented using an internal connection conversion circuit board. This board integrates control circuitry, relay groups, and / or analog switches, and includes a first connection switching circuit 150, a second connection switching circuit 151, a coupler 223, a coupling circuit 224, a communication processing circuit, and control circuitry. Its main function is to establish a controlled internal logic mapping path between the two interface assemblies. Based on the roles of both sides, it performs conduction, disconnection, switching, sampling, or adaptation processing on the high-voltage path, low-voltage signal path, and communication path. The mapping configuration component 148, according to preset mapping relationships, standard configuration data, or terminal mapping tables, and in conjunction with the test role status of the two interfaces, drives the relay groups or analog switches to selectively enable, disable, conduct, disconnect, isolate sampling, or adapt protocols for each functional channel, thereby completing channel matching and establishing controlled closed-loop mutual test conditions that meet test requirements. The operating power of the mapping configuration component 148 can be provided by the auxiliary power supply terminal of the interface under test, the internal low-voltage power supply of the equipment, an independent power supply, an external power supply, or an energy storage unit. The interfaces on both sides communicate with the mapping configuration component 148 through existing communication ports or control signal terminals, so that the mapping configuration component 148 can know which side is in the charging output state and which side is in the analog power receiving state.

[0043] The mapping configuration component 148 only performs switching when preset activation conditions are met. Before activation, it is necessary to confirm that the test status is valid, the status of both sides of the role is determined, the standard configuration data matches, the interface is plugged in correctly, and the safety interlock conditions are met; after these conditions are met, the control circuit drives the relay group and / or analog switch to conduct the target mapping path. If a configuration mismatch, abnormal role status, loose plugging, interlock disconnection, overcurrent, communication identification abnormality, or test completion is detected, the mapping configuration component 148 will keep the internal logic mapping path disconnected or restore it to the disconnected state.

[0044] like Figures 1 to 4 As shown, the internal logic mapping path does not connect the first terminal channel group and the second terminal channel group line by line in a fixed manner. Instead, it establishes configurable connection, sampling, or equivalent termination relationships according to a preset correspondence through an intermediate mapping connection area. Standard configuration data and terminal mapping tables are used to configure the switching relationships of the mapping configuration component 148, the first connection switching circuit 150, the second connection switching circuit 151, and related branches.

[0045] Based on this, the internal logic mapping path supports two basic mapping methods: direct mapping and logical mapping. Direct mapping is used when the functional channels of the two interfaces can be directly matched; logical mapping is used when both tested interfaces are charging device side interfaces, or when an equivalent role correspondence needs to be formed in the test.

[0046] For high-voltage power paths, the internal logic mapping path includes a switchable polarity alignment path and an energy path isolation and measurement branch. The switchable polarity alignment path performs same-name direct correspondence in one state and different-name complementary correspondence in another state; the energy path isolation and measurement branch disconnects the main energy path on at least one end of the interface under test during testing, while retaining voltage sampling or other measurement connections. Figure 2 and Figure 4 The high-voltage terminal group 210, high-voltage terminal 220 and their corresponding access paths can be used as specific access examples of high-voltage power paths.

[0047] For low-voltage signal paths, the internal logic mapping paths are divided into three categories according to their functions: communication branches (to realize direct connection, cross-connection or protocol adaptation), status branches (to realize equivalent termination of connection confirmation, interlocking, status simulation or status sampling), and auxiliary power supply branches (to realize selective access and power supply presence detection).

[0048] The terminal mapping table categorizes specific terminal identifiers from different standards into their corresponding functional channel categories and establishes connections with the corresponding branches in the internal logic mapping path. Thus, the protection focus of this connection structure lies in functional channel mapping and controlled switching, rather than being limited to the terminal naming conventions of a particular standard.

[0049] The terminal mapping table is established based on functional channels rather than terminal names, and includes at least the interface standard identifier, terminal identifier, functional channel category, test role, and target connection method. After reading the terminal mapping table, the intermediate control circuit board performs functional matching between the interface configured for charging output and the interface configured for simulating power receiving. For example: high-voltage positive and negative channels are used for polarity alignment and voltage sampling; communication channels are used for pass-through, cross-connection, or protocol adaptation; control guidance and connection confirmation channels are used for equivalent termination, status sampling, or status simulation; auxiliary power supply channels are used for power supply presence detection or selective access. The specific terminal names in the terminal mapping table may vary depending on the interface standard, but after being categorized into the above functional channel categories, the intermediate control circuit board controls the relay group and / or analog switch to complete the matching.

[0050] This connection structure does not have a fixed master-slave orientation. Both the first docking unit 111 and the second docking unit 121 can be used as input or output sides as needed for testing. During testing, the charging device under test configures one side of its interface as a charging output state and the other side as a simulated power receiving end state. The interfaces on both sides send role information to the mapping configuration component 148 through their respective communication ports. The control circuit executes the corresponding channel switching logic according to the role information.

[0051] The functional channels of this connection structure are divided into two main categories: high-voltage power paths and low-voltage signal paths. The high-voltage power paths correspond to the charging energy transmission channels, while the low-voltage signal paths include communication paths, control guidance paths, connection confirmation paths, interlocking paths, and auxiliary power supply paths. The internal logic mapping path for the high-voltage power paths includes switchable polarity alignment paths and energy path isolation and measurement branches. The switchable polarity alignment paths allow for same-name direct connection or opposite-name complementary connection switching of the power paths. The energy path isolation and measurement branches can disconnect the main energy path at at least one end of the tested interface while maintaining the measurement connection, reducing the risk of high-voltage backflow and meeting the DC voltage acquisition requirements of the charging equipment. For the low-voltage signal paths, the internal logic mapping path includes communication branches, status branches, and auxiliary power supply branches, enabling direct connection, cross-connection, equivalent termination, isolated sampling, protocol adaptation, power supply presence detection, or status simulation for the corresponding paths.

[0052] The working power supply of the mapping configuration component 148 can be provided by the auxiliary power supply terminal of at least one interface docking unit, the low-voltage power supply inside the charging device, the independent power supply, the external power supply or the energy storage unit. The required role status information and conduction control signals can be obtained through the communication ports of the two side interfaces, the control signal terminals or the control interface of the connection structure itself.

[0053] To ensure the safety and reliability of the testing process, this connection structure is equipped with activation condition judgment logic. The internal logic mapping path is only allowed to enter the working state when the test state is valid, the normal charging path is isolated, the interface docking unit is plugged in, the roles on both sides are determined, the standard configuration data or terminal mapping table matches, and all safety interlock conditions are met. When the standard configuration data cannot be determined, does not match the role status, the plugging status is abnormal, the terminal detection results are inconsistent, or the communication identification is abnormal, the internal logic mapping path remains disconnected.

[0054] A first interface seat mechanism and a second interface seat mechanism can be respectively provided between the first docking unit 111 and the second docking unit 121 and the insulating support structure. The interface seat mechanism is used to fix the corresponding interface assembly and reliably lead out the terminal channel, and can be configured as a replaceable structure. In conjunction with the internal logic mapping path, communication adapter circuit, and terminal mapping table, this connection structure can adapt to various DC charging interface standards such as GB / T, CCS, CHAdeMO, ChaoJi, NACS, and MCS, as well as the power receiving interfaces of electric equipment such as vehicles, ships, and low-altitude aircraft. The terminal mapping table categorizes and maps terminals of different standards according to functional channel categories, rather than being limited to specific terminal names, ensuring stable matching between different interfaces at the functional level.

[0055] Figure 2 and Figure 4A specific terminal lead-out method is illustrated. The high-voltage terminal group 210, high-voltage wiring terminal 211, PLC terminal 221, coupler 223, low-voltage wiring terminal 225, and signal connection line terminal group 226 can serve as an example of access to one side of the interface assembly; the high-voltage terminal 220, PLC terminal 222, and coupling circuit 224 can serve as an example of access to the other side of the interface assembly. The high-voltage path, low-voltage signal path, and communication path of both side interface assemblies are respectively introduced into the mapping configuration component 148, and corresponding functional partitions are formed thereon.

[0056] During testing, the two charging guns of the charging device under test are inserted into the first docking unit 111 and the second docking unit 121, respectively. The device's main control unit sets the test roles for the interfaces on both sides. The mapping configuration component 148 completes channel matching based on the acquired role information, standard configuration data, and terminal mapping table, forming a test closed loop between the interfaces on both sides, equivalent to the docking of the charging device interface and the power-consuming object interface. The entire testing process requires no external load box, actual vehicle, or battery pack, is simple to wire, has stable operation, and high repeatability, making it particularly suitable for scenarios such as factory debugging of charging equipment, on-site maintenance, and fault location.

[0057] The above is only one specific embodiment of the present invention, but the design concept of the present invention is not limited thereto. Any non-substantial modifications made to the present invention using this concept shall be deemed as infringing the protection scope of the present invention.

Claims

1. A bidirectional logic mapping connection structure for interconnection testing of charging devices, characterized in that, It includes at least two interface docking units, an insulating support structure, an internal logic mapping path, and a mapping configuration component; The at least two interface docking units include a first interface docking unit and a second interface docking unit. The first interface docking unit and the second interface docking unit are respectively provided with a first charging interface and a second charging interface, which are used to form a pluggable connection with the charging gun or the power supply side interface. The insulating support structure is used to support the interface docking unit and carry the internal logic mapping path; The internal logic mapping path is disposed within the insulating support structure, including a first end channel group, a second end channel group, and an intermediate mapping connection area connecting the first end channel group and the second end channel group; the first end channel group and the second end channel group are respectively led out by the corresponding functional channel terminals of the first charging interface and the second charging interface; The intermediate mapping connection area is used to establish electrical connection, equivalent termination, isolated sampling, protocol adaptation or equivalent mapping of corresponding functional channels in the first end channel group and the second end channel group according to a preset correspondence under test conditions, so as to form controlled closed-loop mutual test conditions. The preset correspondence includes a preset electrical mapping relationship, which is used to perform complementary correspondence, cross correspondence, functional correspondence or equivalent conversion on at least one set of corresponding functional channels, so that the interconnection relationship between the two end interfaces is equivalent to the docking relationship between the charging device side interface and the power user side interface. The mapping configuration component is disposed in or electrically connected to the intermediate mapping connection area, and is used to selectively enable, disable or switch the electrical connection relationship or equivalent mapping relationship of the corresponding functional channel according to the preset mapping relationship, standard configuration data or terminal mapping table; the mapping configuration component controls the corresponding functional channel to complete channel matching according to the test role status of the interfaces on both sides. The connection structure does not have a fixed master-slave direction. Both the first interface docking unit and the second interface docking unit can participate in closed-loop mutual testing as test input side or test output side, and are only enabled in the test state or debugging stage, and are isolated from the normal charging path.

2. The bidirectional logic mapping connection structure for interconnection testing of charging devices according to claim 1, characterized in that: The corresponding functional channels include at least a power path, a communication path, a control guidance path, a connection confirmation path, a lockout interlock path, and an auxiliary power supply path; wherein, the power path is classified as a high-voltage path, and the other paths are classified as low-voltage signal paths or low-voltage auxiliary power supply paths.

3. The bidirectional logic mapping connection structure for interconnection testing of charging devices according to claim 1, characterized in that: It also includes a first interface base mechanism and a second interface base mechanism. The first interface base mechanism is disposed between the first interface docking unit and the insulating support structure, and the second interface base mechanism is disposed between the second interface docking unit and the insulating support structure. The first interface base mechanism and the second interface base mechanism are used to fix the corresponding interface docking unit and lead out its terminal channel. The first interface base mechanism and the second interface base mechanism are one of the following: power receiving interface base, gun base, interface base or mounting and fixing structure.

4. The bidirectional logic mapping connection structure for interconnection testing of charging devices according to claim 1, characterized in that: The at least two interface docking units are the same or different in structure, and correspond to the same or different charging interface standards respectively; the connection structure establishes a corresponding relationship at the functional channel level through a replaceable interface socket mechanism, internal logic mapping path, communication adapter circuit or a combination thereof, so as to adapt to different charging interface standards; the connection structure is an internal test structure of the charging device or a dedicated test accessory that can be repeatedly plugged in and out.

5. A bidirectional logic mapping connection structure for interconnection testing of charging devices according to claim 1, characterized in that: The mapping configuration component includes an intermediate control circuit board, which includes a control circuit and a group of relays and / or analog switches driven by the control circuit, for switching between at least two sets of preset mapping relationships to change the interconnection relationship of corresponding functional channels.

6. The bidirectional logic mapping connection structure for interconnection testing of charging devices according to claim 1, characterized in that: The internal logic mapping path includes a switchable polarity alignment path corresponding to the high-voltage power path and an energy path isolation and measurement branch; the switchable polarity alignment path is used to perform same-name direct correspondence or different-name complementary correspondence switching on the power path; the energy path isolation and measurement branch is used to disconnect the main energy path on at least one end of the tested interface side while maintaining the measurement connection in the test state, so that the charging device can collect DC voltage through the measurement link.

7. The bidirectional logic mapping connection structure for interconnection testing of charging devices according to claim 1, characterized in that: The internal logic mapping path includes communication branches, status branches, and / or auxiliary power supply branches corresponding to the low-voltage signal path, which are used to perform pass-through, cross-connection, equivalent termination, isolation sampling, protocol adaptation, power supply presence detection, or status simulation on the corresponding path.

8. The bidirectional logic mapping connection structure for interconnection testing of charging devices according to claim 1, characterized in that: The power supply for the mapping configuration component is provided by the auxiliary power supply terminal of at least one interface docking unit, the low-voltage power supply inside the charging device, an independent power supply, an external power supply, or an energy storage unit; the mapping configuration component obtains the role status information or conduction control signal of the interfaces on both sides through the communication port, control signal terminal, or control interface of at least one interface docking unit or the connection structure.

9. A bidirectional logic mapping connection structure for interconnection testing of charging devices according to claim 1, characterized in that: The connection structure is only enabled when the test state is valid, the normal charging path is isolated, at least two interface docking units are plugged in, the roles on both sides are determined, the standard configuration data or terminal mapping table matches, and the safety interlocking conditions are met; when the standard configuration data cannot be determined, or is inconsistent with the role status, plugging status, terminal detection results, or communication identification results, the internal logic mapping path remains disconnected.

10. A bidirectional logic mapping connection structure for interconnection testing of charging devices according to claim 1, characterized in that: The first charging interface and the second charging interface respectively conform to any one of the DC charging interface standards of GB / T, CCS, CHAdeMO, ChaoJi, NACS, and MCS, or conform to the power receiving interface standard of vehicles, ships, low-altitude aircraft, or other electric equipment; the standard configuration data includes interface standard identifier, terminal mapping relationship, communication configuration, threshold parameters, test items, and power connection structure; the terminal mapping table is used to classify the specific terminal identifiers in different standards into functional channel categories and establish a connection relationship with the corresponding branches in the internal logical mapping path.