High-efficiency galvanometer aging test method and test tool system

Abstract

This invention discloses a high-efficiency galvanometer aging test method and test fixture system, comprising: supplying power to the aging board by outputting DC power supply voltage through an ACDC power module; connecting multiple galvanometers to be aged to multiple galvanometer interfaces on the aging board one by one; performing time-division control on the multiple galvanometers to be aged through a control module on the aging board, so that the acceleration and deceleration segments of each galvanometer to be aged are staggered in time; repeating the time-division control until the predetermined aging test time is completed; and enabling multiple galvanometers to be connected and controlled simultaneously for aging tests through a single aging board, realizing parallel aging of multiple galvanometers and significantly improving the throughput of aging tests.

Description

Technical Field

[0001] This invention relates to the field of galvanometer aging test technology, and more specifically, to an efficient galvanometer aging test method and test fixture system. Background Technology

[0002] The galvanometer scanner is a core component in laser processing equipment. It uses a drive motor to deflect a reflecting mirror, enabling rapid and precise positioning of the laser beam. The performance stability and lifespan of the galvanometer directly determine the processing quality and reliability of the laser processing equipment.

[0003] In the manufacturing process of galvanometers, burn-in testing is an essential quality control step. Burn-in testing involves running the galvanometer continuously under specified environmental conditions for a certain period of time. By simulating actual working conditions, it exposes potential defects that may appear in the early stages of product use, thereby screening out failed products and ensuring the reliability of products leaving the factory. For galvanometer components, burn-in testing requires driving the galvanometer motor to repeatedly cycle according to a specific motion curve (acceleration-constant speed-deceleration) to verify the stability of key components such as the motor, position sensor, and drive circuit under long-term working conditions.

[0004] However, existing galvanometer aging test techniques have the following problems: First, the aging efficiency is low, making batch parallel testing impossible. Most existing galvanometer aging kits use a one-to-one aging method, meaning one kit can only age one galvanometer at a time. This one-to-one testing mode requires a large amount of aging testing equipment and space when dealing with large-scale galvanometer production, severely limiting production efficiency. Although some solutions can achieve simultaneous aging of a small number of galvanometers (e.g., one-to-two, one-to-three), these essentially connect multiple independent aging channels in parallel, failing to solve the current superposition problem during parallel aging, and also have limited scalability.

[0005] Secondly, there is the issue of current overload when multiple galvanometers are aged simultaneously. During operation, the galvanometer motor requires a large drive current only during acceleration and deceleration phases, with very small current during the constant-speed phase. When aging multiple galvanometers simultaneously, if they happen to be in the acceleration or deceleration phase at the same time, the high-current phases of each galvanometer will overlap, causing a sharp increase in the instantaneous output current of the ACDC power module. This can easily trigger the power supply overcurrent protection, causing the entire aging system to shut down. To avoid this problem, existing technologies typically adopt a conservative strategy of reducing power supply capacity utilization, such as using power modules with power far exceeding the actual average power consumption, or artificially limiting the number of galvanometers aged simultaneously. This, however, reverts to an inefficient aging mode.

[0006] Third, there is a serious waste of hardware resources and a large physical footprint. In traditional one-to-one aging equipment, each galvanometer needs to be equipped with an independent aging control board, power harness and connection interface. When large-scale aging is required, not only are the hardware costs high, but the equipment occupies a huge area and the wiring is messy, which is not conducive to the standardized management of the production workshop.

[0007] Fourth, there is a lack of universal compatibility with different types of galvanometers. Different types of galvanometers differ in motor parameters, motion amplitude, and operating speed. Existing old-fashioned galvanometer fittings are usually customized for specific models of galvanometers, with parameters that are not adjustable or have a limited adjustment range. When it is necessary to age different types or speed specifications of galvanometers, it is often necessary to replace or modify the old-fashioned galvanometer fittings, which increases the complexity and time cost of production changeover. Summary of the Invention

[0008] To address at least one of the aforementioned technical problems, this invention proposes an efficient galvanometer aging test method and test fixture system.

[0009] The first aspect of this invention provides a highly efficient galvanometer aging test method, comprising the following steps: S1, which outputs DC power supply voltage through the ACDC power module to power the aging board; S2, connect the multiple galvanometers to be aged to the multiple galvanometer interfaces on the aging board one by one; S3, the control module on the aging board performs time-division control on multiple galvanometers to be aged, so that the acceleration and deceleration phases of each galvanometer to be aged are staggered in time during the motion process. S4. Repeat step S3 until the predetermined aging test time is completed.

[0010] In a preferred embodiment of the present invention, the time-division control logic of the galvanometer to be aged is as follows: After the i-th galvanometer enters the uniform speed working stage, the (i+1)-th galvanometer begins to enter the acceleration working stage, where i is a positive integer less than N, and N is the total number of galvanometers to be aged; and after the i-th galvanometer enters the deceleration working stage, the (i-1)-th galvanometer has completed the deceleration working stage, where i is a positive integer greater than 1 and less than or equal to N.

[0011] In a preferred embodiment of the present invention, the time interval between the start times of the acceleration phase of two adjacent galvanometers to be aged is equal to the duration of the acceleration phase of the previous galvanometer, and the time interval between the start times of the deceleration phase of two adjacent galvanometers to be aged is equal to the duration of the deceleration phase of the previous galvanometer.

[0012] In a preferred embodiment of the present invention, the total duration of the acceleration phase of all N galvanometers to be aged is less than or equal to the sum of the duration of the uniform phase of the first galvanometer to be aged and the start time of the acceleration phase of the Nth galvanometer to be aged.

[0013] In a preferred embodiment of the present invention, parameter configuration is also included, wherein configuration parameters are input to the control module through a host computer or configuration interface, and the configuration parameters include the acceleration segment duration, the constant speed segment duration and the deceleration segment duration of each galvanometer.

[0014] A second aspect of this invention provides a high-efficiency galvanometer aging test fixture system, applied to a high-efficiency galvanometer aging test method, comprising: ACDC power module, used to output DC power supply voltage; An aging board is electrically connected to the ACDC power module. The aging board is equipped with a control module and multiple galvanometer interfaces. The control module is connected to each of the multiple galvanometers to be aged through the galvanometer interfaces. The control module is configured to perform time-division control on multiple galvanometers to be aged, so that the acceleration and deceleration phases of different galvanometers to be aged are staggered in time during the motion process.

[0015] In a preferred embodiment of the present invention, the control module includes a field-programmable gate array (FPGA) or a complex programmable logic device (CPLD).

[0016] In a preferred embodiment of the present invention, the protocol control harness between the control module and each of the aging mirrors is connected one-to-one.

[0017] In a preferred embodiment of the present invention, the DC power supply voltage output by the ACDC power module is ±15V, and the aging board inputs the ±15V DC power supply voltage to the galvanometer to be aged through the galvanometer interface.

[0018] The technical solution of the present invention has the following advantages compared with the prior art: This invention allows for the simultaneous connection and control of multiple galvanometers for aging tests using a single aging plate, enabling parallel aging of a pair of multiple galvanometers and significantly improving the throughput of aging tests. Compared to the traditional one-to-one approach, aging efficiency is increased by several to tens of times within the same timeframe.

[0019] This invention uses FPGA / CPLD to precisely control multiple galvanometers in a time-division manner, staggering the acceleration and deceleration phases of each galvanometer on the time axis. This ensures that at any given time, only one galvanometer is operating in a high-current phase. The instantaneous peak output current of the ACDC power module is approximately equal to the peak current of a single galvanometer during aging, preventing overcurrent protection from being triggered. This eliminates the need for an additional high-power power supply, reducing power supply costs while ensuring reliability.

[0020] This invention integrates the control module, multiple galvanometer interfaces, and power supply wiring onto a single aging board, with centralized power supply via an ACDC power module, significantly reducing the number of hardware components and physical footprint. The aging board features a compact design, accommodating a large number of galvanometer interfaces within a limited space, meeting the site requirements for high-volume aging tests.

[0021] In this invention, the ±15V voltage output by the ACDC power module is directly supplied to each galvanometer interface through the aging board PCB traces. The protocol control harness adopts a one-to-one connection method, and the overall structure is simple and clear, avoiding the reliability risks such as messy harnesses and poor contact in traditional solutions. It also facilitates maintenance and management on the production site.

[0022] The control module of this invention features configurable parameters, allowing users to dynamically adjust control parameters such as acceleration time, constant speed time, deceleration time, and motion amplitude according to actual needs. This enables flexible adaptation to the aging test requirements of different types and speed specifications of galvanometers. When switching production products, there is no need to replace or modify existing equipment; only the configuration parameters need to be modified, significantly reducing production switchover costs and time.

[0023] Although the present invention performs peak-shifting processing on the acceleration and deceleration phases of each galvanometer, the uniform speed phases of each galvanometer overlap in time. Since the current in the uniform speed phase is extremely small, multiple galvanometers being in the uniform speed phase at the same time will not cause overcurrent risk. The present invention maximizes the use of parallel time while ensuring power supply safety, achieving a balance between peak-shifting scheduling and efficient aging. Attached Figure Description

[0024] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, some of the drawings in the following description are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0025] Figure 1 This is a schematic diagram of time-division aging control of different galvanometers according to an embodiment of the present invention; Figure 2 This is a schematic diagram of the aging motion position and current of a single galvanometer in an embodiment of the present invention; Figure 3 This is a schematic diagram of the aging time sequence decomposition of three low-speed galvanometers according to an embodiment of the present invention; Figure 4 This is a schematic diagram of the aging time sequence decomposition of multiple low-speed galvanometers according to an embodiment of the present invention; Figure 5 This is a hardware physical block diagram of an embodiment of the present invention. Detailed Implementation

[0026] To better understand the above-mentioned objectives, features, and advantages of the present invention, the present invention will be further described in detail below with reference to specific embodiments. It should be noted that, unless otherwise specified, the embodiments and features described in these embodiments can be combined with each other.

[0027] Many specific details are set forth in the following description in order to provide a full understanding of the invention. However, the invention may also be practiced in other ways different from those described herein, and therefore the scope of protection of the invention is not limited to the specific embodiments disclosed below.

[0028] Example 1 See Figures 1-4 As shown, this invention proposes a highly efficient galvanometer aging test method, comprising the following steps: S1, which outputs DC power supply voltage through the ACDC power module to power the aging board; S2, connect the multiple galvanometers to be aged to the multiple galvanometer interfaces on the aging board one by one; S3 uses the control module on the aging board to perform time-division control on multiple galvanometers to be aged, so that the acceleration and deceleration phases of each galvanometer to be aged are set out in time during the motion process. S4. Repeat step S3 until the predetermined aging test time is completed.

[0029] When the galvanometer is working, it only requires a large current during the motor acceleration and deceleration phases, and the current is very small during the constant speed phase. However, when aging multiple galvanometers at the same time, the aging current during the acceleration or deceleration phases is very large, which may trigger the AC / DC overcurrent protection.

[0030] The software performs time-sharing operation of the galvanometers. Each galvanometer being aged has a certain time phase difference between its acceleration and deceleration phases, which can be understood as staggered operation, thereby avoiding excessive AC / DC current triggering current protection during the same period.

[0031] In one specific embodiment of the present invention, taking the aging of three galvanometers as an example, after the first galvanometer completes acceleration, it begins to work at a constant speed. Only then can the second galvanometer begin acceleration. After the second galvanometer enters constant speed work, only then can the third galvanometer enter constant speed work. Only after the third galvanometer enters constant speed work can the first galvanometer begin deceleration. After the first galvanometer completes deceleration, the second galvanometer begins deceleration. After the second galvanometer completes deceleration, the third galvanometer begins deceleration. Only after the third galvanometer completes deceleration does the next round of work begin.

[0032] According to an embodiment of the present invention, the time-division control logic of the galvanometer to be aged is as follows: After the i-th galvanometer enters the uniform speed working stage, the (i+1)-th galvanometer begins to enter the acceleration working stage, where i is a positive integer less than N and N is the total number of galvanometers to be aged; and after the i-th galvanometer enters the deceleration working stage, the (i-1)-th galvanometer has completed the deceleration working stage, where i is a positive integer greater than 1 and less than or equal to N.

[0033] According to an embodiment of the present invention, the time interval between the start times of the acceleration phase of two adjacent galvanometers to be aged is equal to the duration of the acceleration phase of the previous galvanometer, and the time interval between the start times of the deceleration phase of two adjacent galvanometers to be aged is equal to the duration of the deceleration phase of the previous galvanometer.

[0034] According to an embodiment of the present invention, the total duration of the acceleration phase of all N galvanometers to be aged is less than or equal to the sum of the duration of the uniform phase of the first galvanometer to be aged and the start time of the acceleration phase of the Nth galvanometer to be aged.

[0035] Specifically, the statement in this application that "the total acceleration duration of all N galvanometers to be aged ≤ the duration of the uniform speed segment of the first galvanometer to be aged + the start time of the acceleration segment of the Nth galvanometer to be aged" does not limit the relationship between the uniform speed and acceleration parameters of a single galvanometer. Rather, it is a global timing constraint for the batch parallel aging of N galvanometers, used to limit the maximum number N galvanometers that can be aged simultaneously on a single aging board. The fact that the duration of the uniform speed segment of a single galvanometer is greater than its own acceleration segment duration is a fundamental attribute for the normal operation of a galvanometer and a prerequisite for the timing staggered peak scheme of this invention. Furthermore, this formula is for multi-device parallel scenarios, and the constraint boundary changes synchronously with the total number of galvanometers N; therefore, the applicable scenarios of the two formulas do not overlap.

[0036] Parallel aging calculations using N=3 galvanometers: Given that the acceleration period of a single galvanometer is b = 0.5 ms; according to the time-division rule: the acceleration start interval between adjacent galvanometers = the acceleration duration of the previous galvanometer, therefore: the acceleration start time of galvanometer 1. ; Acceleration start time of galvanometer 2 ;Galvanometer 3 acceleration start time ; Total acceleration time for all N units = N × b = 3 × 0.5 = 1.5 ms; The duration of the first constant speed phase is c + the starting time of the third acceleration phase. ; Constraint judgment: 1.5ms≤10.0ms, the timing constraint is met, and the three galvanometers can stably stagger and parallel age-up; Timing effect: The acceleration intervals of the three galvanometers are completely staggered, and at any given time only one galvanometer is in the high-current acceleration phase, with no current superposition.

[0037] N=8 parallel aging calculations using galvanometers: The acceleration period for a single unit remains b=0.5ms; The acceleration start time of galvanometer 8. ; Total acceleration time for all N stages = 8 × 0.5 = 4.0 ms; The first uniform speed segment duration c + galvanometer 8 acceleration start time ; Constraint judgment: 4.0ms≤12.5ms, the timing constraint is met, and 8 galvanometers can stably perform parallel aging. Boundary explanation: If N continues to increase, the total acceleration time of all galvanometers increases synchronously and linearly, and the right side of the formula only increases slightly (only the acceleration start time of the last galvanometer is added); when N increases to the critical value, the total acceleration time will be equal to the value on the right side, reaching the upper limit of the number of galvanometers that a single board can support.

[0038] According to an embodiment of the present invention, the method further includes parameter configuration, wherein configuration parameters are input to the control module through a host computer or a configuration interface. The configuration parameters include the duration of the acceleration segment, the duration of the constant speed segment, and the duration of the deceleration segment for each galvanometer.

[0039] In one specific embodiment of the present invention, the time-division aging control logic for the three galvanometers is as follows: Taking the simultaneous aging of three galvanometers (galvanometer 1, galvanometer 2, and galvanometer 3) as an example, the time-sharing control logic of the control module is explained in detail.

[0040] During operation, the motion curve of the galvanometer includes three stages: acceleration, constant speed, and deceleration. The motor requires a large drive current during the acceleration and deceleration stages, while the current required during the constant speed stage is very small. If all three galvanometers are simultaneously in the acceleration stage, the instantaneous total current will reach three times the acceleration current of a single galvanometer, which can easily trigger the overcurrent protection of the ACDC power module.

[0041] The following time-sharing control logic is adopted: The control galvanometer 1 starts working, and the galvanometer 1 goes through the acceleration phase and then enters the constant speed phase.

[0042] After galvanometer 1 completes the acceleration phase and enters the constant speed phase (at this time, the current of galvanometer 1 has switched from a large current to a small current), galvanometer 2 is controlled to start entering the acceleration phase.

[0043] After galvanometer 2 completes the acceleration phase and enters the constant speed phase, control galvanometer 3 to start entering the acceleration phase.

[0044] After galvanometer 3 completes the acceleration phase and enters the constant speed phase, control galvanometer 1 to start entering the deceleration phase.

[0045] After galvanometer 1 completes the deceleration phase, control galvanometer 2 to begin entering the deceleration phase.

[0046] After galvanometer 2 completes the deceleration phase, control galvanometer 3 to begin entering the deceleration phase.

[0047] After galvanometer 3 completes the deceleration phase, all three galvanometers complete a full aging cycle and begin the next cycle.

[0048] The core of the above control logic is that at any given time, only one galvanometer is in the acceleration or deceleration phase (i.e., the high-current phase), thus ensuring that the output current of the ACDC power module is always within a safe range and will not trigger overcurrent protection. At the same time, the uniform speed phases of each galvanometer overlap in time, improving the parallel efficiency of the aging test.

[0049] Basic power consumption parameters: Static operating power consumption of a single galvanometer < 10W; Dynamic peak power consumption during high-speed aging acceleration / deceleration ≤ 50W; Power supply selection criteria: Each aging board should be equipped with a rated power of 50W or above ±15V output ACDC power supply module; Overcurrent protection threshold matching logic: The time-sharing control logic of this invention ensures that only one galvanometer is in the dynamic high current stage at any given time. The instantaneous peak load of the power supply is equal to the maximum dynamic power consumption of a single galvanometer. Therefore, the ACDC overcurrent protection threshold can be set to 55-60A (with a safety margin of 10%-20%). Matching principle: When multiple galvanometers are running synchronously at constant speed, the total static power consumption is low and overcurrent protection will not be triggered; during acceleration and deceleration, peak power consumption is strictly staggered, and there is no superposition of dynamic power consumption of multiple units. The rated power of the power supply only needs to be adapted to the peak power consumption of a single galvanometer, and there is no need to select the power supply based on the total power consumption of all galvanometers.

[0050] Time-sharing control ensures that the peak current of the acceleration phase and the peak current of the deceleration phase of each of the galvanometers to be aged do not overlap on the time axis through staggered scheduling, thereby making the instantaneous output current peak of the ACDC power module equal to the instantaneous current peak of a single galvanometer during aging.

[0051] Example 2 like Figure 5 As shown, a second aspect of the present invention provides a high-efficiency galvanometer aging test fixture system, applied to a high-efficiency galvanometer aging test method, comprising: ACDC power module, used to output DC power supply voltage; The aging board is electrically connected to the ACDC power module. The aging board is equipped with a control module and multiple galvanometer interfaces. The control module is connected to each of the multiple galvanometers to be aged through the galvanometer interfaces. The control module is configured to perform time-division control on multiple galvanometers to be aged, so that the acceleration and deceleration phases of different galvanometers during the motion process are staggered in time.

[0052] The aging test fixture system can be configured and adjusted to adapt to aging different types of galvanometers. It can be dynamically adjusted according to needs, such as aging the same type of galvanometer but at different aging speeds, or aging galvanometers at different speeds, to achieve the highest efficiency and meet the requirements.

[0053] Specifically, the AC / DC power module is used to convert external AC power into a stable DC power supply voltage, outputting ±15V DC voltage to provide operating power for the entire system.

[0054] The aging board is the core component of this fixture system, housing a control module and multiple galvanometer interfaces. The control module utilizes an FPGA (Field-Programmable Gate Array) chip as the timing control core for aging tests. The number of galvanometer interfaces is defined based on physical space and actual aging requirements, enabling simultaneous aging of multiple galvanometers on a single pair.

[0055] In terms of power supply connection, the ±15V DC voltage output by the AC / DC power module is directly transmitted to each galvanometer interface through the power traces on the aging board, and then directly supplied to each galvanometer to be aged. This power supply method eliminates the need for additional power harnesses, avoids the problem of messy wiring, and reduces the physical footprint.

[0056] The protocol control harness between the control module and each galvanometer to be aged adopts a one-to-one connection method, that is, each galvanometer interface is independently connected to the corresponding pin of the control module to ensure the independence and reliability of the control signal.

[0057] There is theoretically no upper limit to the number of interfaces on an aging board galvanometer. However, in practical engineering applications, multiple constraints limit the number of interfaces on a single aging board to ≤20, based on the following criteria: Physical wiring constraints: The signal traces and power supply copper foils on a single standard-sized PCB board have limited current carrying capacity. With more than 20 interfaces, issues such as congested traces and excessive voltage drop will occur. Heat dissipation constraints: When the galvanometers run synchronously at a constant speed with 20 or fewer channels, the heat generation of the aging board is controllable and no additional heat dissipation module is required; if the number of channels exceeds 20, the continuous accumulation of heat will cause the board temperature to exceed the limit. Aging efficiency constraint: Based on the timing constraint formula of this invention, when N>20, the uniform speed time of the first galvanometer needs to be greatly extended, the aging cycle of a single batch is lengthened by a factor of two, and the production efficiency is significantly reduced. Power load constraints: A single ACDC module can handle the maximum dynamic power consumption of a single galvanometer in a time-sharing manner; the average power consumption of the entire unit is stable and controllable within 20 channels. Conventional mass-production and older chemical installations uniformly adopt a single-board 16-20 channel galvanometer interface design specification.

[0058] The present invention has a maximum of 20 galvanometer interfaces on a single aging board. The conventional FPGA / CPLD control chip has ≥32 general I / O pins, which can directly meet the connection requirements of 20 galvanometer one-to-one protocol control lines. No additional pin expansion circuit is required in single board scenarios. If the production line needs to complete the large-scale aging of more than 20 galvanometers at one time, multiple aging boards are independently networked and work in parallel. Each aging board is equipped with an independent FPGA control module and an independent AC-DC power supply module. The timing of each board does not interfere with each other. The aging parameters are synchronously issued by the host computer, realizing large-scale batch aging without the need for single board expansion pins.

[0059] The aging test fixture system has a parameter configuration register in its control module (FPGA / CPLD), allowing users to dynamically adjust the following parameters via a host computer or configuration interface: Galvanometer acceleration time: Adjust the duration of the acceleration segment according to the motor characteristics of different types of galvanometers; Galvanometer uniform speed time: Adjust the duration of the uniform speed segment according to the aging speed requirements; Galvanometer deceleration time: Adjust the duration of the deceleration stage according to the motor characteristics of different types of galvanometers; Galvanometer motion amplitude: Adjust the motion amplitude according to the swing angle range of different galvanometers; Aging cycle count: Set the total number of cycles according to the aging test standards.

[0060] This aging test fixture has configurable parameters, allowing for batch aging of high-speed, medium-speed, and low-speed galvanometers of different specifications. However, multiple galvanometers in the same batch, simultaneously connected to the aging board for parallel testing, should use the same acceleration, constant speed, and deceleration parameters. The time-sharing peak-shaving control logic of this invention is designed for batch parallel scenarios with galvanometers of the same parameters, ensuring that only a single galvanometer is in the high-current acceleration / deceleration phase at any given time. If high-speed and low-speed galvanometers with significantly different motion duration parameters are mixed and connected in the same batch, the timing peak-shaving logic will be disrupted, leading to a risk of power overload due to multiple galvanometers simultaneously experiencing high current, which is not an applicable aging condition for this invention.

[0061] According to an embodiment of the present invention, the control module includes an FPGA or a CPLD.

[0062] According to an embodiment of the present invention, the protocol control harness between the control module and each aging mirror is connected one-to-one.

[0063] According to an embodiment of the present invention, the DC power supply voltage output by the ACDC power module is ±15V, and the aging board inputs the ±15V DC power supply voltage to the aging mirror through the galvanometer interface.

[0064] The technical solution of the present invention has the following advantages compared with the prior art: This invention allows for the simultaneous connection and control of multiple galvanometers for aging tests using a single aging plate, enabling parallel aging of a pair of multiple galvanometers and significantly improving the throughput of aging tests. Compared to the traditional one-to-one approach, aging efficiency is increased by several to tens of times within the same timeframe.

[0065] This invention uses FPGA / CPLD to precisely control multiple galvanometers in a time-division manner, staggering the acceleration and deceleration phases of each galvanometer on the time axis. This ensures that at any given time, only one galvanometer is operating in a high-current phase. The instantaneous peak output current of the ACDC power module is approximately equal to the peak current of a single galvanometer during aging, preventing overcurrent protection from being triggered. This eliminates the need for an additional high-power power supply, reducing power supply costs while ensuring reliability.

[0066] This invention integrates the control module, multiple galvanometer interfaces, and power supply wiring onto a single aging board, with centralized power supply via an ACDC power module, significantly reducing the number of hardware components and physical footprint. The aging board features a compact design, accommodating a large number of galvanometer interfaces within a limited space, meeting the site requirements for high-volume aging tests.

[0067] In this invention, the ±15V voltage output by the ACDC power module is directly supplied to each galvanometer interface through the aging board PCB traces. The protocol control harness adopts a one-to-one connection method, and the overall structure is simple and clear, avoiding the reliability risks such as messy harnesses and poor contact in traditional solutions. It also facilitates maintenance and management on the production site.

[0068] The control module of this invention features configurable parameters, allowing users to dynamically adjust control parameters such as acceleration time, constant speed time, deceleration time, and motion amplitude according to actual needs. This enables flexible adaptation to the aging test requirements of different types and speed specifications of galvanometers. When switching production products, there is no need to replace or modify existing equipment; only the configuration parameters need to be modified, significantly reducing production switchover costs and time.

[0069] Although the present invention performs peak-shifting processing on the acceleration and deceleration phases of each galvanometer, the uniform speed phases of each galvanometer overlap in time. Since the current in the uniform speed phase is extremely small, multiple galvanometers being in the uniform speed phase at the same time will not cause overcurrent risk. The present invention maximizes the use of parallel time while ensuring power supply safety, achieving a balance between peak-shifting scheduling and efficient aging.

[0070] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0071] The above description of the disclosed embodiments enables those skilled in the art to make or use the invention. Various modifications to the above embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

[0072] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A high efficiency galvanometer burn-in test method, characterized in that, Includes the following steps: S1, which outputs DC power supply voltage through the ACDC power module to power the aging board; S2, connect the multiple galvanometers to be aged to the multiple galvanometer interfaces on the aging board one by one; S3, the control module on the aging board performs time-division control on multiple galvanometers to be aged, so that the acceleration and deceleration phases of each galvanometer to be aged are staggered in time during the motion process. S4. Repeat step S3 until the predetermined aging test time is completed.

2. The high-efficiency galvanometer aging test method according to claim 1, characterized in that, The time-division control logic of the galvanometer to be aged is as follows: After the i-th galvanometer enters the uniform speed working stage, the (i+1)-th galvanometer begins to enter the acceleration working stage, where i is a positive integer less than N, and N is the total number of galvanometers to be aged; and after the i-th galvanometer enters the deceleration working stage, the (i-1)-th galvanometer has completed the deceleration working stage, where i is a positive integer greater than 1 and less than or equal to N.

3. The high-efficiency galvanometer aging test method according to claim 2, characterized in that, The time interval between the start of the acceleration phase of two adjacent galvanometers to be aged is equal to the duration of the acceleration phase of the previous galvanometer to be aged, and the time interval between the start of the deceleration phase of two adjacent galvanometers to be aged is equal to the duration of the deceleration phase of the previous galvanometer to be aged.

4. The high-efficiency galvanometer aging test method according to claim 3, characterized in that, The total acceleration phase duration of all N galvanometers to be aged is less than or equal to the sum of the duration of the uniform phase of the first galvanometer to be aged and the start time of the acceleration phase of the Nth galvanometer to be aged.

5. The high-efficiency galvanometer aging test method according to claim 4, characterized in that, It also includes parameter configuration, where configuration parameters are input to the control module via a host computer or configuration interface. The configuration parameters include the duration of the acceleration segment, the duration of the constant speed segment, and the duration of the deceleration segment for each galvanometer.

6. A high-efficiency galvanometer aging test fixture system, applied to the high-efficiency galvanometer aging test method according to any one of claims 1-5, characterized in that, include: ACDC power module, used to output DC power supply voltage; An aging board is electrically connected to the ACDC power module. The aging board is equipped with a control module and multiple galvanometer interfaces. The control module is connected to each of the multiple galvanometers to be aged through the galvanometer interfaces. The control module is configured to perform time-division control on multiple galvanometers to be aged, so that the acceleration and deceleration phases of different galvanometers to be aged are staggered in time during the motion process.

7. The high-efficiency galvanometer aging test fixture system according to claim 6, characterized in that, The control module includes a field-programmable gate array (FPGA) or a complex programmable logic device (CPLD).

8. The high-efficiency galvanometer aging test fixture system according to claim 6, characterized in that, The protocol control harness between the control module and each of the aging mirrors is connected one-to-one.

9. The high-efficiency galvanometer aging test fixture system according to claim 6, characterized in that, The DC power supply voltage output by the ACDC power module is ±15V, and the aging board inputs the ±15V DC power supply voltage to the galvanometer to be aged through the galvanometer interface.

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