A method and system for issuing configurations for an ATE tester

Abstract

The application discloses a method and system for issuing configuration of ATE tester, the method comprises presetting a common parameter set, an SDK module receiving an instruction set, judging whether each instruction is related to a configuration instruction in the common parameter set; according to the judgment result, forwarding the instruction to the lower module for execution and processing the next instruction; or, judging the type of the instruction, intercepting and processing the instruction according to the judged type, if there is a corresponding value in the common parameter set that meets the condition, then directly completing the processing in the SDK module; otherwise, forwarding the current instruction to the lower module for execution, and synchronously updating the common parameter set; then processing the next instruction. The application pre-sets the common parameter set, and intercepts and judges when receiving the configuration instruction, so that the instructions corresponding to the existing values are directly processed, without being forwarded to the lower module, thereby eliminating the transmission overhead of redundant configuration instructions in the issuing link, greatly shortening the response time of the configuration instruction, and significantly improving the test efficiency.

Description

Technical Field

[0001] This invention relates to the field of integrated circuit testing equipment technology, and in particular to a method and system for distributing configurations to an ATE tester. Background Technology

[0002] When testing chips or electronic components, ATE (Automatic Test Equipment) testers need to issue a large number of configuration commands for execution at each level. Currently, after receiving a command set, the ATE tester forwards each configuration command sequentially and completely to the lower-level module for execution, regardless of whether the parameter value carried by the current configuration command matches the actual configuration state of the tester. Because the testing process often involves a large number of repetitive configuration settings, the same configuration parameter may be repeatedly set to the same value across different test items, resulting in a large number of redundant commands being issued to the lower levels for execution, causing unnecessary consumption of system resources and time overhead.

[0003] In addition, when the test program needs to read the current value of a certain configuration parameter, the SDK module must also forward the read request to the underlying module level by level and wait for the return result. The entire read chain is long and the response latency is high.

[0004] The above problems are particularly prominent in application scenarios with large-scale testing and many configuration items, resulting in a significant increase in overall testing time and a marked decrease in testing efficiency. Summary of the Invention

[0005] The purpose of this invention is to provide a method and system for issuing configuration commands to an ATE test machine, thereby solving the problem of low testing efficiency caused by repeated issuance of configuration commands.

[0006] To address the aforementioned technical problems, this invention provides a configuration distribution method for an ATE test machine, comprising: A pre-defined common parameter set is used to divide the configuration items of the common parameter set and generate configuration instructions corresponding to the configuration items. The SDK module receives the instruction set to be tested, queries each instruction in the instruction set one by one, and determines whether the current instruction is related to the configuration instructions in the common parameter set. Based on the judgment result, the current instruction is forwarded to the lower-level module for execution and processing of the next instruction; or, the type of the current instruction is determined, and based on the determined type, the current instruction is intercepted and processed using the common parameter set. If there is a corresponding value in the common parameter set that meets the conditions, the processing is completed directly in the SDK module without forwarding to the lower-level module; otherwise, the current instruction is forwarded to the lower-level module for execution, and the common parameter set is updated synchronously; then the next instruction is processed.

[0007] Furthermore, the specific division of the configuration items in the common parameter set includes: Based on the resources currently used by the test equipment, the configuration items of the common parameter set are divided according to resource levels, including at least one of slot level, VP level, or DUT level.

[0008] Furthermore, the configuration items preset in the common parameter set include commonly used configuration parameters in the test process, and the common parameter set supports manually adding, modifying or deleting configuration items.

[0009] Furthermore, the instruction set is automatically generated based on the selected resource level when loading the project. The instruction set includes AC test instructions, DC test instructions, configuration instructions, and business operation instructions, wherein the configuration instructions include setting instructions and reading instructions.

[0010] Furthermore, determining whether the current instruction is related to the configuration instructions in the common parameter set specifically includes: If the current instruction is not related to the configuration instruction, the current instruction is forwarded to the lower-level module for execution, and the next instruction is processed. If the current instruction is related to the configuration instruction, then determine the type of the current instruction.

[0011] Furthermore, the step of intercepting the current instruction based on the determined type using the common parameter set specifically includes: If the current instruction is a setting instruction, then the parameter value carried by the current instruction is compared with the parameter value of the corresponding configuration item in the public parameter set; If they are completely identical, skip the current instruction and proceed directly to the next instruction. If there is no complete inconsistency, the current instruction is forwarded to the lower-level module for execution, and the parameter values ​​after execution are updated in the common parameter set before continuing to process the next instruction.

[0012] Furthermore, if the current instruction is a setting instruction and there are some parameter values ​​that are inconsistent with the corresponding configuration items in the common parameter set, then only the inconsistent parts are forwarded to the lower-level module for execution, and the parameter values ​​after execution are updated in the common parameter set, and then the next instruction is processed.

[0013] Furthermore, the step of intercepting the current instruction based on the determined type using the common parameter set further includes: If the current instruction is a read instruction, then check whether the parameter value of the corresponding configuration item exists in the public parameter set; If it exists, the value is read directly from the common parameter set and returned without forwarding it to the lower-level module, and then the next instruction is processed. If it does not exist, the current instruction is forwarded to the lower-level module for execution, and the parameter values ​​after execution are synchronously updated to the common parameter set.

[0014] Furthermore, the common parameter set is initialized during the loading process and updated in real time after each instruction is forwarded to the lower-level module for execution, so as to keep the configuration items in the common parameter set consistent with the current actual configuration state of the test machine.

[0015] On the other hand, the present invention provides a configuration distribution system for an ATE test machine, comprising: A preset module is used to preset a common parameter set and divide the configuration items of the common parameter set; The SDK module connects to the host computer and is used to receive the instruction set to be tested, determine whether the current instruction is related to the common parameter set, and intercept and process the relevant instructions. The lower-level module, including the ATOS module and the FPGA module connected in sequence, is used to execute the instructions issued by the SDK module.

[0016] Compared with the prior art, the present invention has at least the following beneficial effects: This invention pre-configures a common parameter set in the SDK module and prioritizes interception and judgment based on the common parameter set when receiving configuration instructions. This allows instructions with existing values ​​to be processed directly in the SDK module without being forwarded to lower-level modules, thereby effectively eliminating the transmission overhead of redundant configuration instructions in the distribution link, significantly shortening the response time of configuration instructions, and significantly improving test execution efficiency.

[0017] Furthermore, by finely dividing the configuration items of the common parameter set according to resource levels, the interception process can accurately correspond to the configuration status of different resource levels, improving the accuracy of parameter management. By adopting a processing strategy of only issuing the differing parts of some inconsistent parameter values ​​in the setting instructions, unnecessary instruction transmission volume is further reduced. By updating the common parameter set in real time after each instruction is issued, the continuous consistency between the configuration status of the common parameter set and the actual status of the test machine is ensured, thereby improving the reliability of the interception judgment results and avoiding configuration errors caused by state asynchrony. Attached Figure Description

[0018] Figure 1 This is a flowchart of a configuration distribution method for an ATE test machine according to an embodiment of the present invention; Figure 2 This is a flowchart of a specific embodiment of the present invention; Figure 3 This is a schematic diagram of the configuration distribution system for an ATE test machine according to an embodiment of the present invention. Detailed Implementation

[0019] Based on the teachings of this specification, those skilled in the art can form new technical solutions by combining different implementation methods without creating technical contradictions. Such variations should be considered to fall within the protection scope of this application.

[0020] The following will describe in more detail a configuration distribution method and system for an ATE test machine according to the present invention, with reference to the accompanying drawings, which illustrate preferred embodiments of the invention. It should be understood that those skilled in the art can modify the invention described herein while still achieving its advantageous effects. Therefore, the following description should be understood as being of general knowledge to those skilled in the art and is not intended to limit the invention.

[0021] The invention is described more specifically by way of example in the following paragraphs with reference to the accompanying drawings. The advantages and features of the invention will become clearer from the following description. It should be noted that the drawings are in a very simplified form and use non-precise proportions, and are only used to facilitate and clarify the illustration of the embodiments of the invention.

[0022] Example 1 In automated testing scenarios for semiconductor chips and electronic components, the test program needs to send numerous configuration commands to lower-level modules via the SDK module during operation to set the operating parameters of the test machine. To avoid unnecessary consumption of system resources by repetitive configuration commands, such as... Figure 1 As shown in the figure, this embodiment of the invention proposes a configuration distribution method for ATE test machines. This method introduces a common parameter set mechanism at the SDK level, and achieves the interception and processing of redundant instructions by caching and comparing the configuration status, thereby improving the overall test execution efficiency.

[0023] This method specifically includes the following steps: Step 1: Pre-set a common parameter set, divide the configuration items of the common parameter set, and generate configuration instructions corresponding to the configuration items.

[0024] By predefining the structure and configuration items of the common parameter set, the SDK module has the basic data support to intercept and judge configuration commands. Based on each configuration item in the common parameter set, the system automatically generates corresponding configuration commands, enabling rapid matching and determination of whether the current command falls within the configuration scope covered by the common parameter set during subsequent command processing.

[0025] Step 2: The SDK module receives the instruction set to be tested, queries each instruction in the instruction set one by one, and determines whether the current instruction is related to the configuration instructions in the common parameter set.

[0026] The instruction set is automatically constructed by the test program during the project loading phase and contains all the instruction sequences required to execute the complete test process. The SDK module iterates through the instructions in the instruction set sequentially and performs a correlation judgment on each instruction to determine whether the instruction belongs to the category of configuration instructions included in the public parameter set.

[0027] Step 3: Based on the judgment result, forward the current instruction to the lower-level module for execution and processing of the next instruction; or, determine the type of the current instruction. Based on the type judgment, differentiated interception and processing strategies can be adopted for different types of instructions, thereby achieving more refined configuration management.

[0028] Based on the determined type, the current instruction is intercepted and processed using the common parameter set. If a corresponding value that meets the conditions exists in the common parameter set, the processing is completed directly in the SDK module without forwarding to the lower-level module; otherwise, the current instruction is forwarded to the lower-level module for execution, and the common parameter set is updated synchronously; then the next instruction is processed.

[0029] In this embodiment, the division of configuration items in the common parameter set specifically includes: Based on the resources currently used by the test equipment, the configuration items of the common parameter set are divided according to resource levels, including at least one of slot level, VP level, or DUT level.

[0030] The slot level corresponds to the physical slot where each test board resides in the test equipment chassis. This is the highest level of resource management, suitable for managing the overall configuration parameters of the board. The VP (Virtual Pin) level corresponds to virtual pins or channel resources on the test board, belonging to the intermediate level, suitable for fine-grained configuration management of channel parameters. The DUT (Device Under Test) level corresponds to the pin mapping relationship of a specific device under test, representing the finest-grained resource level, suitable for configuring parameters directly related to a specific device under test. By finely dividing configuration items according to resource levels, the common parameter set can accurately correspond to the configuration status of different levels. During interception judgment, precise matching is performed according to the resource level, avoiding mutual interference between configuration statuses of different levels, thereby improving the accuracy and reliability of parameter management.

[0031] Furthermore, the pre-configured items in the common parameter set include commonly used configuration parameters in the testing process, such as voltage thresholds, current limits, timing parameters, channel enable states, and other frequently set or read parameters. The common parameter set supports manual addition, modification, or deletion of configuration items by operators to meet customized needs in different testing scenarios. Manual addition allows non-pre-configured extended configuration items to be included in the management scope of the common parameter set; manual modification allows adjustments to the initial values ​​or associated information of existing configuration items; and manual deletion allows the removal of configuration items that no longer need to be included in interception management. Through this manual maintenance mechanism, the coverage of the common parameter set can be flexibly expanded or adjusted according to actual testing needs, rather than being limited to a fixed set of pre-configured configuration items, thereby improving the adaptability of the common parameter set to diverse testing scenarios.

[0032] In this embodiment, the instruction set is automatically generated based on the selected resource level when the project is loaded. Specifically, after the test program starts the project loading operation, the system automatically constructs a complete instruction set based on the test resource level information configured in the current project. The instruction set includes AC test instructions, DC test instructions, configuration instructions, and service operation instructions. AC test instructions are used to perform AC parameter tests, measuring parameters such as the chip's timing characteristics and AC gain. DC test instructions are used to perform DC parameter tests, measuring static parameters such as the chip's voltage and current. Service operation instructions are used to control the overall operation logic of the test process, such as reset, trigger, and synchronization operations. Configuration instructions are specifically used to set or query various operating parameters of the test machine. The configuration instructions are further subdivided into setting instructions and reading instructions. Setting instructions are used to write target parameter values ​​to the test machine, and reading instructions are used to obtain the current actual parameter values ​​from the test machine. The automatic generation mechanism of the above instruction set, combined with the resource level, can reduce manual intervention, lower the probability of instruction configuration errors, and provide structured instruction input for subsequent interception judgment.

[0033] In this embodiment, the step of determining whether the current instruction is related to the configuration instructions in the common parameter set is as follows: if the current instruction is not related to the configuration instructions, the current instruction is forwarded to the lower-level module for execution, and the next instruction is processed; if the current instruction is related to the configuration instructions, the type of the current instruction is determined.

[0034] When the SDK module traverses the instruction set, it matches each instruction with the configuration instructions contained in the common parameter set. If the current instruction cannot find a corresponding entry in the common parameter set (i.e., the current instruction is not related to the configuration instruction), the SDK module directly forwards the current instruction to the lower-level module for execution, and then proceeds to the next instruction processing decision. Non-configuration instructions are not affected by the common parameter set interception mechanism and execute the normal processing flow. If the current instruction matches a configuration instruction (i.e., the current instruction is related to the configuration instruction), the SDK module does not immediately proceed to the next step, but further determines the type of the current instruction, providing a basis for subsequent differentiated interception processing. Through the above correlation judgment, configuration instructions and non-configuration instructions in the instruction set are processed separately, ensuring that the normal execution of non-configuration instructions is not affected, while implementing targeted interception strategies for configuration instructions.

[0035] Furthermore, the current instruction is intercepted based on the determined type using the common parameter set. If the current instruction is a setting instruction, the parameter value carried by the current instruction is compared with the parameter value of the corresponding configuration item in the common parameter set. The comparison result is handled in the following ways: If the comparison results are completely consistent, the current instruction is skipped, and the next instruction is processed directly. That is, if all parameter values ​​to be set by the current instruction are the same as the corresponding configuration items in the common parameter set, it indicates that the actual configuration state of the test machine completely matches the target parameter values ​​of this setting instruction. There is no need to repeat the configuration operation; the SDK module can skip the current instruction without forwarding it to the lower-level module, and continue processing the next instruction. This approach effectively eliminates redundant instruction issuance caused by repeatedly setting the same configuration parameters in the testing process, and significantly reduces the processing load of the underlying modules in test scenarios with dense and repetitive configuration parameters.

[0036] If the comparison results are completely inconsistent, the current instruction is forwarded to the lower-level module for execution, and the parameter values ​​after execution are updated to the common parameter set. Then, the next instruction is processed. That is, if all parameter values ​​to be set by the current instruction are different from the corresponding configuration items in the common parameter set, the SDK module forwards the current instruction completely to the lower-level module for execution. After execution, the parameter values ​​are synchronously updated to the common parameter set, and the next instruction is processed. Through real-time updates after execution, the common parameter set always reflects the latest actual configuration status of the test machine.

[0037] If the current instruction has some parameter values ​​that are inconsistent with the corresponding configuration item in the common parameter set, only the inconsistent parts are forwarded to the lower-level module for execution, and the executed parameter values ​​are updated in the common parameter set before processing the next instruction. That is, if some parameter values ​​in the current instruction are the same as those stored in the common parameter set, and some parameter values ​​are different, the SDK module only extracts the inconsistent parameter parts, and forwards the instruction containing only the differing parameters to the lower-level module for execution, while the parameter parts that are the same as those in the common parameter set are not forwarded. After the differing parts are executed, the executed parameter values ​​are updated in the common parameter set before processing the next instruction. This partial difference handling strategy can further reduce the amount of data sent to the lower-level module and reduce instruction transmission overhead in scenarios where only a few parameters change in the setting instruction. It plays an important role in improving processing efficiency in multi-parameter configuration instruction scenarios.

[0038] In this embodiment, the step of intercepting the current instruction based on the determined type using the common parameter set further includes: If the current instruction is a read instruction, then the system searches the common parameter set to see if the parameter value of the corresponding configuration item exists.

[0039] If it exists, the value is read directly from the common parameter set and returned without forwarding it to the lower-level module, and then the next instruction is processed.

[0040] If it does not exist, the current instruction is forwarded to the lower-level module for execution, and the parameter values ​​after execution are synchronously updated to the common parameter set.

[0041] When the corresponding configuration item's parameter value exists in the public parameter set, it indicates that the parameter value has been written into the public parameter set during previous initialization or configuration execution. The SDK module directly reads the parameter value from the public parameter set and returns it to the host computer without forwarding the read instruction to the lower-level module, and can continue processing the next instruction. When the corresponding configuration item's parameter value does not exist in the public parameter set, it indicates that the configuration item has not been cached. The SDK module needs to forward the read instruction to the lower-level module for execution. After the lower-level module returns the actual parameter value, it synchronously updates the parameter value to the public parameter set so that subsequent read instructions for the same configuration item can be directly obtained from the public parameter set without being sent to the lower-level module again. Through the above read interception mechanism, in scenarios where the same configuration parameter is frequently read, the instruction response time can be significantly shortened, reducing the access pressure on the lower-level module caused by read operations.

[0042] In this embodiment, the common parameter set is initialized during the loading process and updated in real time each time an instruction is forwarded to the lower-level module for execution.

[0043] Specifically, when the test program executes the loading process, the system initializes all preset configuration items in the common parameter set, setting the parameter values ​​of each configuration item to initial values ​​corresponding to the initial state of the test machine, for comparison and query during subsequent instruction processing. The common parameter set is updated in real-time after each instruction is forwarded to the lower-level module for execution. That is, whenever a configuration instruction is actually executed by the lower-level module, the parameter value corresponding to the execution result is immediately written back to the corresponding configuration item in the common parameter set, ensuring that the configuration items in the common parameter set are consistent with the current actual configuration state of the test machine. The initialization operation during the loading process ensures that the common parameter set has a valid baseline configuration state before instruction processing begins, while the real-time update mechanism ensures that the configuration items in the common parameter set remain consistent with the current actual configuration state of the test machine throughout the entire test run. This guarantees the accuracy of subsequent interception judgments and prevents erroneous interception processing caused by the common parameter set being out of sync with the actual configuration state, thus affecting the correctness of the test results.

[0044] Example 2 like Figure 3 As shown, this embodiment provides a configuration distribution system for an ATE test machine. The system is used to implement the configuration distribution method described in Embodiment 1 above. The system includes a preset module, an SDK module, and a lower-level module.

[0045] The pre-configured module is used to pre-configure a common parameter set and divide the configuration items of the common parameter set, providing a basic data structure for the interception and judgment of the SDK module. During the system initialization phase, the pre-configured module completes the structural definition and configuration item division of the common parameter set, and organizes and stores the division results according to resource hierarchy. Through the unified maintenance of the common parameter set by the pre-configured module, the entire system has a clear structural foundation for perceiving and managing the configuration status, and also provides a unified operation entry point for operators to manually expand or adjust the coverage of the common parameter set.

[0046] The SDK module connects to the host computer and is used to receive the instruction set to be tested, determine whether the current instruction is related to the common parameter set, and intercept and process the relevant instructions. It is the core functional module responsible for instruction scheduling and interception processing in the entire system. The SDK module significantly reduces the number of redundant instructions entering the underlying execution link through the interception mechanism, effectively reducing the processing load of the lower-level modules and the overall system latency.

[0047] The lower-level module includes an ATOS module and an FPGA module connected in sequence, used to execute instructions issued by the SDK module. The ATOS module, as the test operating system layer, is responsible for receiving instructions from the SDK module, parsing and scheduling them, converting the instructions into operation sequences recognizable by the underlying hardware, and then passing them to the FPGA module. The FPGA module, as the underlying hardware logic layer, directly drives the physical hardware resources of the test machine to perform corresponding test or configuration operations, and returns the execution results level by level to the ATOS module, which then reports them to the SDK module. The SDK module then writes the execution results into a common parameter set to complete the update. Through the collaborative work of the ATOS module and the FPGA module, the lower-level module can fully receive various instructions forwarded by the SDK module, achieving precise control over the hardware resources of the test machine. Because only the instructions that actually need to be executed are sent to the lower-level module after being intercepted and filtered by the SDK module, the burden of unnecessary processing on the lower-level module is effectively reduced, helping to improve the utilization efficiency of the underlying hardware resources.

[0048] Example 3 like Figure 2 As shown, this embodiment is a specific implementation based on Embodiment 1 and Embodiment 2.

[0049] In this embodiment, after the system starts, the host computer triggers an initialization operation via the CPU. The operator or the system pre-writes the configuration items that need to be managed in the test process into a common parameter set, forming a configuration status cache structure stored inside the SDK module, which serves as the benchmark for comparison and querying of all subsequent configuration instructions.

[0050] After the preset is completed, the system loads resources and classifies the preset configuration items in the common parameter set into hierarchical categories according to three dimensions: SLOT (slot), VP (virtual pin), and DUT (device under test).

[0051] After the partitioning is completed, the system constructs the instruction set required for this test. In this embodiment, the instruction set includes instruction 1 "Read DDR data", instruction 2 "Configure the power channel measurement range of each DUT to 200UA", and instruction 3 "Read the wave table period and other configurations". After the instruction set is constructed, the SDK module begins to process the instructions one by one.

[0052] When the SDK module executes instruction 1, it first enters the first judgment node, that is, to determine whether instruction 1 is related to configuration instructions. The SDK module compares instruction 1 with the configuration instructions in the common parameter set one by one. It finds that instruction 1 is not related to any configuration instructions in the common parameter set, but belongs to business operation instructions. Therefore, the SDK module does not intercept instruction 1 at all, and directly sends instruction 1 to the lower-level module (i.e., the ATOS module, and then the ATOS module passes it to the FPGA module for execution). After the lower-level module completes the execution, it returns the execution result. The SDK module records the completion of this execution, and at the same time updates the status of the common parameter set accordingly (updates if the execution involves changes in configuration status, otherwise leaves it unchanged), and then processes instruction 2.

[0053] When executing instruction 2, the SDK module first determines whether instruction 2 is related to configuration instructions. Instruction 2 involves power channel range parameters at the DUT level. After comparison, the SDK module finds that instruction 2 belongs to the configuration item category covered by the common parameter set, and then proceeds to the second judgment node, that is, to determine whether instruction 2 is a setting instruction or a reading instruction.

[0054] Since instruction 2 is an operation to write the target range value of 200UA to the test machine, which is a setting instruction, it enters the third judgment node. That is, the system compares the target parameter value of 200UA carried by instruction 2 with the parameter value stored in the corresponding DUT level power channel range configuration item in the common parameter set to determine whether the two are the same configuration.

[0055] At this point, there are two scenarios: If the value of this configuration item in the common parameter set is already 200UA, which is completely consistent with the target value of this instruction, it means that the actual configuration status of the test machine is completely consistent with the target of this setting. There is no need to repeat the execution. The SDK module skips the instruction directly without forwarding it to the lower-level module, ends the processing of instruction 2, and continues to execute instruction 3. The whole process does not generate any instruction transmission overhead to the lower level.

[0056] If the value of this configuration item in the common parameter set is different from 200UA, it indicates that the actual range configuration of the test machine is inconsistent with the target value, and the setting operation needs to be actually performed. The SDK module forwards instruction 2 completely to the lower-level module for execution. After receiving it, the ATOS module passes it to the FPGA module to write 200UA. After the execution is completed, the 200UA value written this time is synchronously updated to the common parameter set to maintain the consistency between the common parameter set and the actual state of the test machine. Then, instruction 3 is retrieved and executed.

[0057] When executing instruction 3, the SDK module first determines whether instruction 3 is related to configuration instructions. Instruction 2 involves configurations such as the wave table period. After comparison, the SDK module finds that instruction 3 belongs to the configuration items covered by the common parameter set, so it proceeds to the second judgment node, that is, to determine whether instruction 3 is a setting instruction or a reading instruction.

[0058] Since instruction 3 reads the actual parameter value of the period table in the wave table, rather than writing it, it is a read instruction. Therefore, it enters the fourth judgment node, that is, the system queries the common parameter set according to the read instruction of instruction 3, so as to determine whether the value corresponding to the period configuration item in the wave table already exists in the common parameter set.

[0059] At this point, there are two scenarios: If the value corresponding to instruction 3 is already stored in the public parameter set, it means that the value has been written into the public parameter set during a previous execution. In this case, the SDK module directly reads the value from the public parameter set and returns it to the host computer. The entire reading operation is completed at the SDK level, without sending the reading instruction to the ATOS module and FPGA module. This effectively avoids the round-trip transmission delay of initiating a read request to the lower layer. After processing instruction 3, the entire configuration process is completed.

[0060] If the value corresponding to instruction 3 does not yet exist in the public parameter set, it means that the value has never been written to the public parameter set before. The SDK module forwards instruction 3 to the lower-level module, and the FPGA module reads the current actual wave table period value of the test machine and returns the result to the SDK module level by level. The SDK module then writes the returned value into the public parameter set for updating, so that subsequent read instructions for the same configuration item can be directly obtained from the public parameter set without re-issuing processing. After processing instruction 3, the entire configuration process is completed.

[0061] This process repeats continuously. The SDK module processes each instruction in the instruction set according to its relation to configuration, whether it is a setting instruction, whether the configuration is the same, and whether the read is within the preset set, until all instructions in the instruction set have been processed, thus ending the entire configuration distribution process. Through this process, all instructions already present in the common parameter set are intercepted at the SDK level. Only instructions that actually need to be executed are forwarded to the lower-level modules, thereby significantly reducing the number of instructions entering the lower-level execution chain, reducing the workload of the lower-level modules, and improving the test execution efficiency of the ATE test machine.

[0062] In summary, this invention pre-configures a common parameter set in the SDK module and prioritizes interception and judgment based on the common parameter set when receiving configuration instructions. This allows instructions with existing values ​​to be processed directly in the SDK module without being forwarded to lower-level modules, thereby effectively eliminating the transmission overhead of redundant configuration instructions in the distribution link, significantly shortening the response time of configuration instructions, and significantly improving test execution efficiency.

[0063] Furthermore, by finely dividing the configuration items of the common parameter set according to resource levels, the interception process can accurately correspond to the configuration status of different resource levels, improving the accuracy of parameter management. By adopting a processing strategy of only issuing the differing parts of some inconsistent parameter values ​​in the setting instructions, unnecessary instruction transmission volume is further reduced. By updating the common parameter set in real time after each instruction is issued, the continuous consistency between the configuration status of the common parameter set and the actual status of the test machine is ensured, thereby improving the reliability of the interception judgment results and avoiding configuration errors caused by state asynchrony.

[0064] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A method for distributing configurations to an ATE test machine, characterized in that, include: A pre-defined common parameter set is used to divide the configuration items of the common parameter set and generate configuration instructions corresponding to the configuration items. The SDK module receives the instruction set to be tested, queries each instruction in the instruction set one by one, and determines whether the current instruction is related to the configuration instructions in the common parameter set. Based on the judgment result, the current instruction is forwarded to the lower-level module for execution and processing of the next instruction; or, the type of the current instruction is determined, and based on the determined type, the current instruction is intercepted and processed using the common parameter set. If there is a corresponding value in the common parameter set that meets the conditions, the processing is completed directly in the SDK module without forwarding to the lower-level module; otherwise, the current instruction is forwarded to the lower-level module for execution, and the common parameter set is updated synchronously; then the next instruction is processed.

2. The configuration distribution method for an ATE test machine as described in claim 1, characterized in that, The specific division of the configuration items in the common parameter set includes: Based on the resources currently used by the test equipment, the configuration items of the common parameter set are divided according to resource levels, including at least one of slot level, VP level, or DUT level.

3. The configuration distribution method for an ATE test machine as described in claim 1, characterized in that, The common parameter set contains pre-set configuration items that are commonly used in the test process, and the common parameter set supports manually adding, modifying or deleting configuration items.

4. The configuration distribution method for an ATE test machine as described in claim 1, characterized in that, The instruction set is automatically generated based on the selected resource level when the project is loaded. The instruction set includes AC test instructions, DC test instructions, configuration instructions, and business operation instructions. The configuration instructions include setting instructions and reading instructions.

5. The configuration distribution method for an ATE test machine as described in claim 1, characterized in that, The determination of whether the current instruction is related to the configuration instructions in the common parameter set specifically includes: If the current instruction is not related to the configuration instruction, the current instruction is forwarded to the lower-level module for execution, and the next instruction is processed. If the current instruction is related to the configuration instruction, then determine the type of the current instruction.

6. The configuration distribution method for an ATE test machine as described in claim 5, characterized in that, The interception of the current instruction based on the determined type using the common parameter set specifically includes: If the current instruction is a setting instruction, then the parameter value carried by the current instruction is compared with the parameter value of the corresponding configuration item in the public parameter set; If they are completely identical, skip the current instruction and proceed directly to the next instruction. If there is no complete inconsistency, the current instruction is forwarded to the lower-level module for execution, and the parameter values ​​after execution are updated in the common parameter set before continuing to process the next instruction.

7. The configuration distribution method for an ATE test machine as described in claim 6, characterized in that, If the current instruction is a setting instruction and there are some parameter values ​​that are inconsistent with the corresponding configuration items in the common parameter set, then only the inconsistent parts are forwarded to the lower-level module for execution, and the parameter values ​​after execution are updated in the common parameter set, and then the next instruction is processed.

8. The configuration distribution method for an ATE test machine as described in claim 5, characterized in that, The step of intercepting the current instruction based on the determined type using the common parameter set further includes: If the current instruction is a read instruction, then check whether the parameter value of the corresponding configuration item exists in the public parameter set; If it exists, the value is read directly from the common parameter set and returned without forwarding it to the lower-level module, and then the next instruction is processed. If it does not exist, the current instruction is forwarded to the lower-level module for execution, and the parameter values ​​after execution are synchronously updated to the common parameter set.

9. The configuration distribution method for an ATE test machine as described in claim 1, characterized in that, The common parameter set is initialized during the loading process and updated in real time after each instruction is forwarded to the lower-level module for execution. This is used to ensure that the configuration items in the common parameter set are consistent with the current actual configuration state of the test machine.

10. A configuration distribution system for an ATE test machine, characterized in that, include: A preset module is used to preset a common parameter set and divide the configuration items of the common parameter set; The SDK module connects to the host computer and is used to receive the instruction set to be tested, determine whether the current instruction is related to the common parameter set, and intercept and process the relevant instructions. The lower-level module, including the ATOS module and the FPGA module connected in sequence, is used to execute the instructions issued by the SDK module.

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