Measurement methods and related apparatus

Abstract

The application provides a measurement method and related device, which are used for reducing measurement cost while ensuring measurement accuracy. In the method, a base station or a radar can compensate for phase changes of signals reflected by a target to be measured based on phase changes of a reference target, a direction of the reference target relative to an antenna, and a direction of the target to be measured relative to the antenna, eliminate effects caused by antenna shaking, improve measurement accuracy of deformation measurement, and implement micro-deformation measurement. Moreover, since the method does not depend on high-precision IMU, it is beneficial to reduce measurement cost.

Description

Technical Field

[0001] This application relates to the field of deformation measurement technology, and more specifically, to a measurement method and related apparatus. Background Technology

[0002] Currently, deformation measurement can be performed using measurement systems (such as integrated sensing and communication base stations). Measurement scenarios involving micro-deformation place higher demands on measurement accuracy, such as requiring sub-millimeter level precision. However, measurement systems commonly suffer from receiver (e.g., antenna feeder) wobbling, which severely affects the accuracy of deformation measurements. To address this issue, an inertial measurement unit (IMU) can be used to measure the displacement of the antenna feeder wobbling, thereby calibrating the antenna feeder's wobbling.

[0003] However, high-precision IMUs are expensive, and how to reduce measurement costs while ensuring measurement accuracy has become an urgent problem to be solved. Summary of the Invention

[0004] This application provides a measurement method and related apparatus for reducing measurement costs while ensuring measurement accuracy.

[0005] Firstly, this application provides a measurement method. This method can be executed by a measurement system. The measurement system has a transmitting device and a receiving device, the transmitting device for transmitting measurement signals, and the receiving device for receiving measurement signals. The transmitting device and the receiving device can be different devices, or they can be the same device. For example, the transmitting device and the receiving device can be the same antenna, or they can be different antennas. The measurement system may also include a processing device for performing measurements based on the measurement signals received by the receiving device. In one implementation, the measurement system is a single device or a component within a single device. Accordingly, the transmitting device, the receiving device, and the processing device are integrated and deployed in the same device. For example, the device can be a base station or a radar. This application does not limit the type and number of components included in the measurement system, as long as the components in the measurement system can realize the functions of the transmitting device, the receiving device, and the processing device. For example, these one or more components include one or more of circuits, chips, chip systems, logic modules, software modules, or software code. Alternatively, in one implementation, the measurement system includes multiple devices or components within multiple devices. Accordingly, two or more of the transmitting, receiving, or processing devices are deployed separately in different devices. For example, the multiple devices include one or more of a base station, radar, server, or core network equipment. For instance, the transmitting and receiving devices are integrated in the same device (e.g., a base station or radar), while the processing device is deployed in other devices (e.g., a server or core network equipment). Alternatively, the transmitting and receiving devices may be deployed in different devices (e.g., different base stations or different radars), the processing and transmitting devices may be integrated in the same device, or the processing and receiving devices may be integrated in the same device, or the processing device may be deployed in a device other than the one containing the transmitting and receiving devices.

[0006] In the method provided in the first aspect, a measurement request can be obtained, the measurement request instructing the measurement of the deformation of a target object. Then, based on the measurement request, a receiving device receives a first signal reflected by a target to be measured on the target object and a second signal reflected by a reference target. Then, based on reference information, a first phase of the first signal, and a second phase of the second signal, a measurement result is output. The reference information includes first information, second information, third information, and fourth information. The first information indicates a first distance from the target to be measured to the receiving device; the second information indicates a second distance from the reference target to the receiving device; the third information indicates a first angle of the target to be measured relative to the receiving device; the fourth information indicates a second angle of the reference target relative to the receiving device; and the measurement result indicates the change in the distance from the target to the receiving device due to the displacement of the target to be measured (referred to as the first displacement).

[0007] The first phase and the first distance can be used to determine the change in distance from the target to the receiving device. The second phase and the second distance can be used to determine the change in distance from the reference target to the receiving device (referred to as the first change). By selecting a fixed target as the reference target, the first change can be understood as the change in distance from the reference target to the receiving device caused by the displacement of the receiving device. Since the change in distance from the target to the receiving device caused by the movement of the receiving device generally changes with the change in angle of the target relative to the receiving device, the first angle, the second angle, and the first change can be used to more accurately eliminate the change caused by the movement of the receiving device (referred to as the second change) from the change in distance from the target to the receiving device. This results in a more accurate change in distance from the target to the receiving device caused by the first displacement of the target, thus measuring the micro-deformation of the target object.

[0008] In this application, the change in distance can indicate both the magnitude and direction of the change, whereby the direction of the change can indicate an increase, a decrease, or no change in distance. For example, the change in distance can be signed, either a positive "+" or a negative "-". Correspondingly, the absolute value of the change indicates the magnitude of the change, and the sign indicates the direction of the change. For instance, a positive sign indicates an increase in distance, while a negative sign indicates a decrease. Furthermore, since the method provided in the first aspect does not rely on a high-precision IMU, it is advantageous for reducing measurement costs.

[0009] In this application, the target may refer to an object or a portion of an object.

[0010] This application does not limit the computational process of determining the measurement result based on reference information, the first phase of the first signal, and the second phase of the second signal. The following example illustrates the principle of determining the measurement result based on the first phase, the second phase, and reference information.

[0011] Optionally, the second phase and the second distance are used to determine a first change in the distance from the reference target to the receiving device caused by the displacement of the receiving device (referred to as the second displacement), the first change and the second angle are used to determine the second displacement, the second displacement and the first angle are used to determine a second change in the distance from the target to be measured to the receiving device caused by the second displacement, and the second change, the first phase and the first distance are used to determine the measurement result.

[0012] Since both the first and second changes are caused by the second displacement of the receiving device, and since the first and second changes are related not only to the second displacement but also to the first and second angles, it is beneficial to determine the second displacement more accurately based on the first change and the second angle, and to determine the second change more accurately based on the second displacement and the first angle. This allows for more precise compensation for the interference caused by the change in the distance between the target and the receiving device due to the movement of the receiving device, thereby improving the accuracy of the measurement results and enabling the detection of micro-deformations of the target object.

[0013] In this application, the second displacement can be a two-dimensional vector or a three-dimensional vector.

[0014] This application does not limit the calculation process for determining the second change based on the second displacement and the first angle. The principle of determining the second change based on the second displacement and the first angle is illustrated below with an example.

[0015] Optionally, the second displacement can be projected onto the straight line between the target and the receiving device at a first angle, and the second change can be determined based on the projected displacement. For example, the magnitude (or modulus) of the projected displacement is the absolute value of the second change. For example, when the direction of the projected displacement is from the receiving device to the target, the second change indicates a decrease in distance, and the sign of the second change can be negative. For example, when the direction of the projected displacement is from the target to the receiving device, the second change indicates an increase in distance, and the sign of the second change can be positive. This simplifies the complexity of determining the second change and reduces the computational overhead required for measurement.

[0016] Alternatively, the second displacement may be used to determine a first function, the function value of which is the change in distance from the target to the receiving device caused by the second displacement. The independent variable of the first function is the angle of the target relative to the receiving device, which is any angle within a first angle range, including both the first angle and the second angle. The first function is used to perform a polynomial expansion at the first angle to obtain a second function, and the function value of the second function, when the independent variable is the second angle, is used to determine the second change. Alternatively, the first function may be used to perform a polynomial expansion at the second angle to obtain a second function, and the function value of the second function, when the independent variable is the first angle, is used to determine the second change.

[0017] The first function can also be understood as a mapping from multiple angles to multiple changes. The multiple angles include the angles of multiple positions relative to the receiving device, and the multiple changes include the changes in the distance from the multiple positions to the receiving device caused by the second displacement. Furthermore, the multiple angles include both the first angle and the second angle. These multiple angles can be understood as multiple angles within the aforementioned first angle range.

[0018] Optionally, the first function is used to perform a polynomial expansion at the first angle to obtain a second function. When the independent variable of the second function is the second angle, the function value of the second function can be approximately equal to the function value of the first function when the independent variable of the first function is the second angle (i.e., the first change). In the polynomial represented by the second function, one term is the function value of the first function when the independent variable of the first function is the first angle (i.e., the second change). The other terms of the polynomial include first-order small quantity terms or include first-order small quantity terms and higher-order small quantity terms. The small quantity refers to the angle difference between the first angle and the second angle. The small quantity terms include the angle difference and the second displacement. By reducing the angle difference, for example, making the angle difference less than the angle difference threshold, it is beneficial to reduce the impact of the measurement accuracy of the second displacement on the measurement accuracy of the second change. This is beneficial to reduce the measurement accuracy requirements of the second displacement while ensuring the measurement accuracy of the second change, thereby reducing the measurement complexity and measurement cost.

[0019] Optionally, the first function is used to perform a polynomial expansion at the second angle to obtain a second function. When the independent variable of the second function is the first angle, the function value of the second function can be approximately equal to the function value of the first function when the independent variable of the first function is the first angle (i.e., the second change). In the polynomial represented by the second function, one term is the function value of the first function when the independent variable of the first function is the second angle (i.e., the first change). The other terms of the polynomial include first-order small quantity terms or include first-order small quantity terms and higher-order small quantity terms. The small quantity refers to the angle difference between the first angle and the second angle. The small quantity term includes the angle difference and the second displacement. By reducing the angle difference, for example, making the angle difference less than the angle difference threshold, it is beneficial to reduce the impact of the measurement accuracy of the second displacement on the measurement accuracy of the second change. This is beneficial to reduce the measurement accuracy requirements of the second displacement while ensuring the measurement accuracy of the second change, thereby reducing the measurement complexity and measurement cost.

[0020] This application does not limit the calculation process for determining the second displacement based on the first change and the second angle. The principle of determining the second displacement based on the first change and the second angle is illustrated below with an example.

[0021] Optionally, the magnitude of the second displacement is the same as the absolute value of the first change, and the direction of the second displacement is parallel to the straight line between the reference target and the receiving device. For example, the first change can indicate the direction of the distance change. Based on the first change indicating an increase in the distance between the reference target and the receiving device, the direction of the second displacement can be from the reference target towards the receiving device. Based on the first change indicating a decrease in the distance between the reference target and the receiving device, the direction of the second displacement can be from the receiving device towards the reference target.

[0022] Alternatively, based on the receipt of the measurement request, fifth information can also be obtained, which indicates the direction of the second displacement. The direction of the second displacement, together with the first change and the second angle, is used to determine the second displacement, which helps to improve the measurement accuracy of the second displacement and thus improve the accuracy of the measurement results.

[0023] This application does not limit the method of obtaining the fifth information. Optionally, the acceleration and / or angular velocity measured by an inertial measurement unit (IMU) can be obtained. The IMU is used to measure the acceleration and / or angular velocity of the receiving device. Then, the direction of the second displacement is determined based on the acceleration and / or angular velocity measured by the IMU. Compared with calculating the distance the receiving device moves in each coordinate system based on the acceleration measured by the IMU, the acceleration and / or angular velocity measured by the IMU are determined based on the ratio between the distances the receiving device moves in different coordinate systems. Therefore, compared with measuring the second displacement based on the IMU, calculating the second displacement based on the first change in phase of the measurement signal reflected from the reference target, the second angle, and the direction of the second displacement has higher accuracy. This is beneficial to reduce the accuracy requirements of the IMU and reduce measurement costs while ensuring the accuracy of the measurement results.

[0024] Optionally, the first information is determined based on the phase of a third signal, and the second information is determined based on the phase of a fourth signal. The third signal is a signal reflected by the target under test and received by the receiving device before the measurement request is obtained, and the fourth signal is a signal reflected by the reference target and received by the receiving device before the measurement request is obtained.

[0025] Optionally, the first information and the second information are determined based on the coordinates of the receiving device, the target to be measured, and the reference target measured before the measurement request is obtained.

[0026] Optionally, the third information includes the azimuth and / or elevation angles of the target under test relative to the receiving device measured before obtaining the measurement request, and the fourth information includes the azimuth and / or elevation angles of the reference target relative to the receiving device measured before obtaining the measurement request.

[0027] Secondly, this application provides a measurement method. This method can be executed by a processing device. The processing device can be one of the processing devices described above. For example, the processing device can be a computer device or a component within a computer device, which may include one or more of the following: circuitry, chips, chip systems, logic modules, software modules, or software code.

[0028] In the method provided in the second aspect, a measurement request can be obtained, the measurement request instructing the measurement of the deformation of a target object; based on the measurement request, a first phase of a first signal and a second phase of a second signal are obtained, the first signal and the second signal being signals reflected by a target to be measured on the target object and a reference target, respectively, received by a receiving device; a measurement result is output based on the first phase of the first signal, the second phase of the second signal, and reference information, the reference information including first information, second information, third information, and fourth information, the first information indicating a first distance from the target to be measured to the receiving device, the second information indicating a second distance from the reference target to the receiving device, the third information indicating a first angle of the target to be measured relative to the receiving device, the fourth information indicating a second angle of the reference target relative to the receiving device, and the measurement result indicating the change in the distance from the target to the receiving device caused by a first displacement of the target to be measured.

[0029] Since both the first and second changes are caused by the second displacement of the receiving device, and since the first and second changes are related not only to the second displacement but also to the first and second angles, it is beneficial to determine the second displacement more accurately based on the first change and the second angle, and to determine the second change more accurately based on the second displacement and the first angle. This allows for more precise compensation for the interference caused by the change in the distance between the target and the receiving device due to the movement of the receiving device, thereby improving the accuracy of the measurement results and enabling the detection of micro-deformations of the target object.

[0030] Optionally, the measurement signal is transmitted via a transmitting device based on the measurement request.

[0031] The implementation and effects of the method provided in the second aspect can be understood by referring to the implementation and effects of the processing operations in the method provided in the first aspect. The processing operations in the method provided in the first aspect include, for example, obtaining measurement requests, outputting measurement results, and obtaining fifth information.

[0032] The reference information in the method provided in the second aspect can be understood by referring to the reference information in the method provided in the first aspect, and will not be repeated here.

[0033] Thirdly, this application provides a system. The system may include a receiving device and a processing device. The processing device is configured to acquire a measurement request, the measurement request instructing the measurement of deformation of a target object. The receiving device is configured to, after the processing device acquires the measurement request, receive a first signal reflected by a target to be measured on the target object and a second signal reflected by a reference target. The processing device is further configured to, based on the measurement request, acquire a first phase of the first signal and a second phase of the second signal, and then, based on reference information, the first phase of the first signal, and the second phase of the second signal, output a measurement result. The reference information includes first information, second information, third information, and fourth information; the first information indicates a first distance from the target to be measured to the receiving device; the second information indicates a second distance from the reference target to the receiving device; the third information indicates a first angle of the target to be measured relative to the receiving device; the fourth information indicates a second angle of the reference target relative to the receiving device; and the measurement result indicates the change in distance from the target to the receiving device caused by a first displacement of the target to be measured.

[0034] Optionally, the second phase and the second distance are used to determine a first change in the distance from the reference target to the receiving device caused by a second displacement of the receiving device. The first change and the second angle are used to determine the second displacement. The second displacement and the first angle are used to determine a second change in the distance from the target to the receiving device caused by the second displacement. The second change, the first phase, and the first distance are used to determine the measurement result.

[0035] Optionally, the second displacement is used to determine a first function, the function value of which is the change in distance from the target to the receiving device caused by the second displacement. The independent variable of the first function is the angle of the target relative to the receiving device, which is any angle within a first angle range, including both the first angle and the second angle. The first function is used to perform a polynomial expansion at the first angle to obtain a second function, and the function value of the second function, when the independent variable is the second angle, is used to determine the second change. Alternatively, the first function is used to perform a polynomial expansion at the second angle to obtain a second function, and the function value of the second function, when the independent variable is the first angle, is used to determine the second change.

[0036] Optionally, the magnitude of the second displacement is the same as the absolute value of the first change, and the direction of the second displacement is parallel to the straight line between the reference target and the receiving device.

[0037] Optionally, the processing device is further configured to acquire fifth information based on the measurement request, the fifth information indicating the direction of the second displacement, the direction of the second displacement being used together with the first change and the second angle to determine the second displacement.

[0038] Optionally, the processing device is specifically used to acquire the acceleration and / or angular velocity measured by the inertial measurement unit, the inertial measurement unit being used to measure the acceleration and / or angular velocity of the receiving device's movement; and to determine the direction of the second displacement based on the acquired acceleration and / or angular velocity.

[0039] Optionally, the first information is determined based on the phase of a third signal, and the second information is determined based on the phase of a fourth signal. The third signal is a signal reflected by the target under test and received by the receiving device before the measurement request is obtained, and the fourth signal is a signal reflected by the reference target and received by the receiving device before the measurement request is obtained.

[0040] Optionally, the first information and the second information are determined based on the coordinates of the receiving device, the target to be measured, and the reference target measured before the measurement request is obtained.

[0041] Optionally, the third information includes the azimuth and / or elevation angles of the target under test relative to the receiving device measured before obtaining the measurement request, and the fourth information includes the azimuth and / or elevation angles of the reference target relative to the receiving device measured before obtaining the measurement request.

[0042] Optionally, the system may also include a transmitting device for transmitting measurement signals.

[0043] The system provided in the third aspect can be understood with reference to the measurement system mentioned in the first aspect, and the transmitting device, receiving device and processing device in the system can be understood with reference to the transmitting device, receiving device and processing device mentioned in the first aspect, respectively.

[0044] Fourthly, this application provides an apparatus. The apparatus may be a processing device as mentioned in the first or second aspect. The apparatus may include a processor configured to execute a computer program or computer instructions stored in memory to perform processing operations as described in the first aspect or any implementation thereof, or to perform methods as described in the second aspect or any implementation thereof.

[0045] Fifthly, this application provides an apparatus, which can be the processing apparatus mentioned in the first or second aspect. The apparatus may include an acquisition module and a processing module. The acquisition module is used to acquire a measurement request, the measurement request instructing the measurement of deformation of a target object. The acquisition module is further used to acquire, based on the measurement request, a first phase of a first signal and a second phase of a second signal, the first signal and the second signal being signals reflected by a target to be measured on the target object and a reference target, respectively, received by a receiving device. The processing module is used to output a measurement result based on reference information, the first phase of the first signal, and the second phase of the second signal. The reference information includes first information, second information, third information, and fourth information; the first information indicates a first distance from the target to the receiving device; the second information indicates a second distance from the reference target to the receiving device; the third information indicates a first angle of the target to be measured relative to the receiving device; the fourth information indicates a second angle of the reference target relative to the receiving device; and the measurement result indicates the change in distance from the target to the receiving device caused by a first displacement of the target to be measured.

[0046] Optionally, the second phase and the second distance are used to determine a first change in the distance from the reference target to the receiving device caused by a second displacement of the receiving device. The first change and the second angle are used to determine the second displacement. The second displacement and the first angle are used to determine a second change in the distance from the target to the receiving device caused by the second displacement. The second change, the first phase, and the first distance are used to determine the measurement result.

[0047] Optionally, the second displacement is used to determine a first function, the function value of which is the change in distance from the target to the receiving device caused by the second displacement. The independent variable of the first function is the angle of the target relative to the receiving device, which is any angle within a first angle range, including both the first angle and the second angle. The first function is used to perform a polynomial expansion at the first angle to obtain a second function, and the function value of the second function, when the independent variable is the second angle, is used to determine the second change. Alternatively, the first function is used to perform a polynomial expansion at the second angle to obtain a second function, and the function value of the second function, when the independent variable is the first angle, is used to determine the second change.

[0048] Optionally, the magnitude of the second displacement is the same as the absolute value of the first change, and the direction of the second displacement is parallel to the straight line between the reference target and the receiving device.

[0049] Optionally, the acquisition module is further configured to acquire fifth information based on the measurement request, the fifth information indicating the direction of the second displacement, the direction of the second displacement being used together with the first change and the second angle to determine the second displacement.

[0050] Optionally, the acquisition module is specifically used to acquire the acceleration and / or angular velocity measured by the inertial measurement unit, the inertial measurement unit being used to measure the acceleration and / or angular velocity of the receiving device; and to determine the direction of the second displacement based on the acquired acceleration and / or angular velocity.

[0051] Optionally, the first information is determined based on the phase of a third signal, and the second information is determined based on the phase of a fourth signal. The third signal is a signal reflected by the target under test and received by the receiving device before the measurement request is obtained, and the fourth signal is a signal reflected by the reference target and received by the receiving device before the measurement request is obtained.

[0052] Optionally, the first information and the second information are determined based on the coordinates of the receiving device, the target to be measured, and the reference target measured before the measurement request is obtained.

[0053] Optionally, the third information includes the azimuth and / or elevation angles of the target under test relative to the receiving device measured before obtaining the measurement request, and the fourth information includes the azimuth and / or elevation angles of the reference target relative to the receiving device measured before obtaining the measurement request.

[0054] Sixthly, this application provides a chip or chip system. The chip or chip system can be one of the processing devices mentioned above. The chip or chip system includes at least one processor for implementing the processing operations described in the first aspect or any implementation thereof, or performing the methods described in the second aspect or any implementation thereof. For example, the chip can be a baseband chip, a modem chip, a system-on-chip (SoC) chip (such as an SoC chip containing a modem core), a system-in-a-package (SIP) chip, or a communication module, etc.

[0055] In one possible design, the chip or chip system may further include a memory for storing program instructions and data necessary for the device. The chip system may consist of chips or may include chips and other discrete devices. Optionally, the chip system may also include interface circuitry that provides program instructions and / or data to the at least one processor.

[0056] In a seventh aspect, this application provides an apparatus. This apparatus can be a processing apparatus as mentioned in the first or second aspect. The apparatus includes at least one logic circuit and an input / output interface, the logic circuit being configured to implement the processing operations described in the first aspect or any implementation thereof, or to execute the methods described in the second aspect or any implementation thereof.

[0057] Eighthly, this application provides a computer-readable storage medium having a computer program or instructions stored thereon, characterized in that, when the computer program or instructions are executed by a processor, the processing operation described in the first aspect or any implementation thereof is performed, or the method described in the second aspect or any implementation thereof is performed.

[0058] Ninthly, this application provides a computer program product containing instructions that, when run on a computer, cause the processing operation described in the first aspect or any implementation thereof to be performed, or the method described in the second aspect or any implementation thereof to be performed.

[0059] The technical effects of any of the design methods in aspects three through nine can be found in the technical effects of the corresponding design methods in aspects one through two above, and will not be repeated here. Attached Figure Description

[0060] Figure 1 and Figure 2 The structures of the measurement systems are schematically shown below;

[0061] Figure 3 This schematically illustrates a scenario for deformation measurement and the structure of a measurement system.

[0062] Figure 4 This schematically illustrates the basic principle of how a base station measures deformation using carrier phase.

[0063] Figure 5 A simplified diagram illustrating a deformation measurement scenario provided in this application is shown schematically.

[0064] Figure 6 This is a flowchart of the deformation measurement method provided in this application;

[0065] Figure 7 A schematic diagram of the distance image;

[0066] Figure 8 Provide an example of a calculated azimuth-elevation diagram;

[0067] Figure 9 The diagram schematically illustrates the antenna of a multi-channel base station and the coordinate system of that antenna. Detailed Implementation

[0068] This application can be used to measure the deformation of an object (or target object). The purpose of deformation measurement is to monitor the degree of deformation of the target object, which can be a bridge, building, slope, mine, etc. To measure the minute deformation of the target object, high precision (e.g., sub-millimeter level) is required. Therefore, the measurement system can utilize carrier phase to measure the deformation of the target object.

[0069] Figure 1 The structure of the measurement system is schematically illustrated. For example... Figure 1 As shown, the measurement system includes a transmitting device, a receiving device, and a processing device. The processing device can be connected to both the transmitting device and the receiving device.

[0070] The transmitting device is used to transmit measurement signals. The transmitting device can also be called a transmitting node. Measurement signals refer to electromagnetic waves propagating through space; they can also be called radio frequency (RF) signals. From a frequency perspective, the measurement signal can include electromagnetic waves within any frequency range, such as radio waves, microwaves, and infrared radiation. From an application perspective, the measurement signal can be a communication signal or a sensing signal (SS). Communication signals are used to carry data for communication between different devices. Sensing signals are radio frequency signals used to sense the environment or targets. Sensing signals can be sensing reference signals (SERS), positioning reference signals (PRS), or sounding reference signals (SRS), etc., and can be transmitted in the form of a beam. From a waveform perspective, the measurement signal can be a carrier wave, which can be a continuous wave with a fixed frequency and amplitude, and the carrier wave waveform can be a sine wave.

[0071] The receiving device receives the measurement signal. After the transmitting device transmits the measurement signal, the signal can be reflected or scattered by an object, and the receiving device can receive the reflected or scattered measurement signal. The receiving device can also be called a receiving node. The measurement signal reflected or scattered by an object can also be called an echo signal (ES). This application uses the example of a receiving device receiving a measurement signal reflected by an object.

[0072] The processing device is used to measure the deformation of a target object based on the phase (called carrier phase) of the measurement signal received by the receiving device.

[0073] This application does not limit the specific structure of the measurement system. Figure 2 The structure of the measurement system is schematically illustrated. For example... Figure 2 As shown, the measurement system includes a processor, a transceiver, and one or more antennas. Optionally, the measurement system also includes a memory. Optionally, the measurement system also includes a network interface. The processor, transceiver, memory, and network interface are connected, for example, via a bus. In this application, the connection may include various interfaces, transmission lines, or buses, etc., and this application is not limited thereto.

[0074] The processor is used to measure the deformation of a target object. For example, the processor executes computer program code to measure the deformation of the target object. This computer program code may be built into the processor or, as shown in the example... Figure 2 The data is stored in memory.

[0075] A transceiver can be used to send measurement signals to or receive measurement signals from an antenna.

[0076] Antennas are used to receive measurement signals from transceivers, radiate measurement signals into the surrounding space, or receive measurement signals reflected from the surrounding space.

[0077] A transceiver may include a transmitter Tx and / or a receiver Rx. Specifically, after the antenna receives a measurement signal, the receiver Rx of the transceiver is used to receive the measurement signal from the antenna, process the measurement signal (e.g., demodulate and sample the measurement signal to obtain a digital signal), and send the processed signal to a processor. The transmitter Tx in the transceiver is used to generate the measurement signal to be transmitted to the antenna, which then radiates the measurement signal into the surrounding space.

[0078] A transceiver can also be called a transceiver unit, transceiver, or transceiver device. Optionally, the receiver Rx in a transceiver, which performs the receiving function, can be regarded as a receiving unit, input port, or receiving circuit, etc., and the transmitter Tx in a transceiver, which performs the transmitting function, can be regarded as a transmitting unit, transmitter, or transmitting circuit, etc.

[0079] Memory is primarily used to store computer program code and data (such as measurement results). Memory can exist independently, connected to the processor. Alternatively, memory can be integrated with the processor, for example, integrated within a single chip.

[0080] The network interface is used to enable the measurement system to communicate with other devices via a communication link.

[0081] Figure 2By way of example only, a measurement system may include more or fewer devices. For instance, the measurement system may also include other signal processing devices, including at least one of the following: a power amplifier, a local oscillator, a mixer, an analog-to-digital converter, or a clock source. The following description uses the deployment of other signal processing devices within a transceiver as an example.

[0082] This application does not limit the type of measurement system. For example, the measurement system can be a base station or radar equipment, or it can be a component within a base station or radar equipment, where the component can refer to a circuit, chip, or chip system, etc. For example, the radar can be a roadside radar, and the base station can be a sensing integrated base station.

[0083] This radar device can be a microwave radar; the structure of a microwave radar can be referenced. Figure 2 As shown. Alternatively, the radar device can be a lidar. For example, by... Figure 2 The measurement system shown, after replacing the antenna with an optoelectronic device, can be a lidar or a component within a lidar system. The optoelectronic device can include a photodetector and a laser, with the laser acting as the transmitter and the photodetector as the receiver.

[0084] Figure 1 In the measurement system shown, the transmitting device and the receiving device can be the same device, for example, Figure 2 The antenna shown can function as both a transmitter and a receiver, or the transmitter and receiver can be different devices, for example... Figure 2 Some of the antennas shown are used as transmitting devices, while the others are used as receiving devices. Figure 1 Taking a measurement system including a transmitting device as an example, Figure 2 Taking a measurement system that includes a transmitting device as an example, in some examples, the measurement system may not include a transmitting device, and the measurement signal may be transmitted by a device other than the measurement system.

[0085] Taking a transceiver device (where the transmitting and receiving devices are the same) as an example, the transceiver device may include... Figure 2 The antenna shown may include a processing device. Figure 2 The processor shown. Figure 2 The other devices shown can be integrated into the transceiver unit, integrated into the processing unit, or separately deployed in other devices besides the transceiver unit and the processing unit.

[0086] Optional, Figure 1 or Figure 2 In this context, a single rectangular frame representing a device or component can be broken down into multiple devices or components, which can be deployed integratedly or separately. For example, Figure 1The processing apparatus shown may include a first processing apparatus and a second processing apparatus. The first processing apparatus and the second processing apparatus may be integrated in the same device, or they may be separately deployed in different devices.

[0087] Figure 3 This schematically illustrates a scenario for deformation measurement and the structure of a measurement system. For example... Figure 3 As shown, the measurement system includes the base station's main unit and the base station's antenna feeder, which is mounted on a pole.

[0088] Antenna feeder can include Figure 2 The antenna shown may optionally include a feed line for connecting the antenna and the transceiver.

[0089] The host of the base station may include Figure 1 The processing device shown, or including Figure 2 The measurement system shown includes all components except the antenna.

[0090] Figure 3 Taking the antenna feeder as the receiving device and the receiving device mounted on the mast as an example, this application does not limit the installation location of the receiving device. For example, the receiving device can also be mounted on the tower.

[0091] This application does not limit the communication system supported by the base station. For example, the communication system can be satellite communication, 5th generation (5G) system or new radio (NR), 5G-Advanced (5G-A), long term evolution (LTE) system, LTE frequency division duplex (FDD) system, LTE time division duplex (TDD) system, universal mobile telecommunication system (UMTS), vehicle to everything (V2X) communication system, future communication networks or future communication systems after 5G networks, etc.

[0092] In addition to having stronger communication capabilities, the aforementioned communication system can also have sensing capabilities. It can be a communication system with integrated sensing and communication (ISAC). An integrated sensing and communication system means that the communication system can communicate through communication signals (which can also be described as communication channels) and perform sensing and measurement through sensing signals (which can also be described as sensing channels).

[0093] The term "base station" as used in this application can broadly encompass, or be replaced by, various names including: NodeB, evolved NodeB (eNB), next-generation NodeB (gNB), relay station, access point, transmitting and receiving point (TRP), transmitter point, master station, auxiliary station, motor slide retainer (MSR) node, home base station, network controller, access node, wireless node, access point (AP), transmission node, transceiver node, baseband unit (BBU), remote radio unit (RRU), active antenna unit (AAU), remote radio head (RRH), central unit (CU), distributed unit (DU), positioning node, or integrated sensing base station, etc. A base station can be a macro base station, micro base station, relay node, donor node, or similar entity, or a combination thereof. A base station can also refer to a module, modem, or chip installed within the aforementioned equipment or apparatus. Base stations can also be mobile switching centers, devices that perform base station functions in D2D, V2X, and M2M communications, and devices that perform base station functions in future communication systems.

[0094] Below, we will introduce Figure 3 The application scenarios shown.

[0095] like Figure 3 As shown, the target object is a bridge. This application does not limit the type of target object; for example, the target object can be a building, a slope, or a mine.

[0096] The target object includes the target to be measured (or the point to be measured), which characterizes the degree of deformation of the target object. In one possible implementation, the target to be measured is a target deployed on the target object. For example, if the target object is a bridge, to observe the downward deformation of the bridge, a target is deployed on the bridge (e.g., on the side of the bridge). As the bridge vibrates up and down, the position of the target will deform. Alternatively, in another possible implementation, the target to be measured is a portion of the surface area of ​​the target object.

[0097] A reference target is an object whose position is relatively stable. For example, a reference target is an object whose absolute position remains unchanged under ideal conditions, or an object that does not move relative to the ground. That is, the reference target will not sway due to external vibrations, geological settlement of the mounting base, or other factors.

[0098] The reference target can be located in a suitable location, such as on a bridge pier, a concrete open space, or the roof or wall of a low building, which helps to ensure that the position of the reference target remains unchanged in the long term.

[0099] For example, if the target object is a bridge, since the bridge piers are more stable than the abutments, spans, and deck, the reference target can be located on the bridge piers.

[0100] Optionally, the reference target is an artificial reference target; or, the reference target is a natural reference target.

[0101] Here, "artificial reference target" refers to a reference target deployed manually. For example, the reference target can be a target.

[0102] Natural reference targets refer to reference points that exist in nature, such as buildings or rocks.

[0103] This application does not limit the selection criteria for natural reference points. Examples of methods for selecting natural reference targets will be given later, and will not be elaborated here.

[0104] In this application, the target can refer to a man-made corner reflector, or any device or apparatus that enhances the reflection of electromagnetic waves (e.g., a reconfigurable intelligence surface, RIS). The target can be a passive or an active device.

[0105] The measurement system can measure the deformation of a target object using the basic principle of carrier phase measurement. The following section uses a base station as an example to illustrate the basic principle of base station deformation measurement using carrier phase.

[0106] like Figure 4 As shown, the base station first performs a first measurement on the target to obtain the carrier phase of the target. Then, the base station performs a second measurement on the target to obtain the carrier phase of the target. When the target object deforms, the magnitude of the deformation (or, in other words, the change in distance / displacement between the target and the antenna caused by the deformation) can be calculated based on the phase change between the two measurements, specifically satisfying the following formula:

[0107]

[0108] Where d represents the change in distance / displacement between the target and the antenna caused by the deformation of the target object, and λ represents the wavelength. Characterizes the carrier phase obtained by the base station during the first measurement of the target under test. It represents the carrier phase obtained by the base station when performing a second measurement on the target under test.

[0109] because Figure 3 The gantry shown generally has some sway, which causes the antenna fixed to the gantry to also sway, which seriously affects the accuracy of deformation measurement.

[0110] To compensate for the distance change caused by antenna sway, an inertial measurement unit (IMU) can be installed on the antenna or mast. The acceleration of the antenna is measured by the IMU, and then the acceleration is integrated twice to obtain the displacement of the antenna. Based on the displacement of the antenna, the distance change / displacement between the target and the antenna caused by the antenna sway is calculated.

[0111] However, the displacement of the antenna feed is obtained by integrating the acceleration measured by the IMU twice. In order to ensure high accuracy of deformation measurement, a high-precision IMU needs to be installed, which increases the cost of the measurement system.

[0112] Based on this, this application proposes a measurement scheme that reduces the cost of the measurement system while ensuring high accuracy in deformation measurement.

[0113] Figure 5 This illustration schematically depicts a deformation measurement scenario provided by this application. Figure 5 In the middle, the receiving device is Figure 3 Taking the antenna feed shown as an example, the black-filled triangle represents the target to be measured, the white-filled triangle represents the reference target, the black-filled circle represents the antenna feed at the first position, and the white-filled circle represents the antenna feed at the second position.

[0114] Figure 6 This is a flowchart of the deformation measurement method provided in this application. The following is in conjunction with… Figure 4 The scene shown introduces Figure 6 The method flow is shown.

[0115] S601. Obtain a measurement request. The measurement request indicates that the deformation of the target object be measured.

[0116] The measurement system can acquire measurement requests, which instruct the measurement of the deformation of the target object. (Continue to refer to...) Figure 1 Optionally, the processing device may acquire the measurement request. The following text uses the example of the processing device acquiring the measurement request.

[0117] In one possible implementation, the processing device can receive measurement requests sent by other devices. (Taking the measurement system as an example...) Figure 3 Taking the base station shown as an example, the host of the base station can receive measurement requests sent by other devices through a network interface or transceiver. This application does not limit the type of other devices; for example, other devices can be base stations, terminals, or core network equipment.

[0118] Alternatively, in one possible implementation, the processing device provides an input interface to the user for acquiring measurement requests. This input interface can be an Application Programming Interface (API). Taking a radar device as an example, the radar device can provide an API to the user and then acquire the measurement requests issued by the user through the API.

[0119] Alternatively, in one possible implementation, the measurement request can be generated internally within the processing device. For example, the processing device can generate a measurement request during the execution of computer program code.

[0120] S602. Based on the measurement request, a measurement signal s1(t) is transmitted through the transmitting device and the reflected measurement signal x1(t) is received through the receiving device.

[0121] After the measurement system receives the measurement request, it can transmit a measurement signal (denoted as s1(t)) through the transmitting device and receive the reflected measurement signal (denoted as x1(t)) through the receiving device. Figure 6 Taking the integrated deployment of transmitting and receiving devices as an example, the integrated transmitting and receiving devices are called transceivers.

[0122] S602 takes the measurement system including a transmitting device and a receiving device as an example. In some examples, the measurement system may not include a transmitting device. The measurement signal (i.e., s1(t)) is transmitted by a device other than the measurement system. Accordingly, after the measurement system obtains the measurement request, it can receive the reflected measurement signal (denoted as x1(t)) through the receiving device without transmitting the measurement signal s1(t) through the transmitting device.

[0123] The reflected measurement signal includes the signal reflected by the target object (called the first signal) and the signal reflected by the reference target (called the second signal). Assume that the target object is in the first position when it reflects the measurement signal s1(t).

[0124] In this application, the phase of the first signal is referred to as the first phase, and the phase of the second signal is referred to as the second phase. After the receiving device receives the reflected measurement signal, the measurement system can determine the first phase of the first signal and the second phase of the second signal.

[0125] Continue to refer to Figure 1 Optionally, after the processing device receives the measurement request, it can control the transmitting device to transmit the measurement signal s1(t) and control the receiving device to receive the measurement signal x1(t). Then, based on the measurement signal s1(t) and the measurement signal x1(t), the first phase of the first signal and the second phase of the second signal are determined.

[0126] The following uses a measurement system as an example. Figure 4 The base station shown, and the host of the base station includes Figure 2 Taking the measurement system shown, excluding the antenna, as an example, the process of determining the first phase and the second phase is illustrated.

[0127] After receiving a measurement request, the processor can control the transmitter to send a measurement signal to the antenna. The antenna can radiate the measurement signal, which can be represented as:

[0128] s1(t)=Aexp(j(2πf0t+φ));

[0129] Where A represents the signal strength of the measured signal, φ represents the phase of the measured signal, and f0 is the frequency (or carrier frequency) of the measured signal.

[0130] After the antenna transmits the measurement signal s1(t), it can receive the reflected measurement signal (called the echo signal). The receiver can receive this echo signal, which can be represented as:

[0131] x1(t)=s1(t-τ)=a0Aexp(j(2πf0(t-τ)+φ));

[0132] Where τ represents the time delay between the moment the antenna receives the echo signal and the moment it transmits the measurement signal, and a0 represents the complex scattering coefficient of the target under test.

[0133] A transceiver can process received signals and send the processed signals to a processor.

[0134] For example, the transceiver can mix the received signal and the reference signal to obtain an intermediate frequency (IF) signal, and then sample the IF signal to obtain a digital signal. The sampled signal can be represented as y[0], y[1], ..., y[k], ... . f s Where k is the sampling frequency and k is the sampling point number. Since the sampling number indicates the signal transmission distance, k can also be called the distance cell number. Optionally, after receiving the sampled signal, the transceiver can also perform matched filtering on the sampled signal.

[0135] In the field of signal processing, matched filtering is a signal processing technique used to extract signals from noise, especially when the signal is known and subjected to additive noise interference. The basic idea of ​​matched filtering is to design a filter whose impulse response is the conjugate and time-reversed form of the signal. When the filter is convolved with the superposition of the signal and noise, the signal component is maximized, while the noise component is minimized due to its randomness.

[0136] After the transceiver receives the sampled digital signal, it can send the digital signal to the processor. After receiving the digital signal, the processor can process the digital signal to obtain the first phase and the second phase.

[0137] For example, the processor performs a Fast Fourier Transform on the digital signal to obtain a complex-form result. This result includes a series of discrete frequency domain components, with different frequency components corresponding to different signal transmission distances. The processor can extract the real and imaginary parts from the complex-form result to determine the phase.

[0138] For example, the complex form of the processed result corresponding to the measurement signal reflected by the target under test can be denoted as u1, and the complex form of the processed result corresponding to the measurement signal reflected by the reference target can be denoted as v1. u1 and v1 can be expressed as follows:

[0139]

[0140] Where λ represents the wavelength of the measurement signal, and R1 represents the current position of the target and the antenna feed (e.g., ...). Figure 5 The distance between the reference target and the second position shown is φ1, which represents the carrier phase of u1 (i.e., the first phase), r1 represents the distance between the reference target and the second position of the antenna feed, and δ1 represents the carrier phase of v1 (i.e., the second phase).

[0141] For example, the processing device can acquire the distance between the target and the antenna feed (denoted as R0) and the distance between the reference target and the antenna feed (denoted as r0) measured before S601. The processing device can determine the value of τ corresponding to R0, and determine the value of k (denoted as k) based on the value of τ. T According to y[k T Determine u1, and then determine φ1. For example, c is the speed of light. Similarly, the processing device can determine the value of τ corresponding to r0, and determine the value of k based on the value of τ (denoted as k). R According to y[k R Determine v1, and then determine δ1. For example,

[0142] The measurement methods of R0 and r0 will be illustrated later, and will not be discussed in detail here.

[0143] S603, based on reference information, the first phase of the first signal, and the second phase of the second signal, output the measurement result;

[0144] After acquiring the first phase and the second phase, the measurement system can output the measurement result based on the first phase, the second phase, and reference information. The measurement result indicates the change in distance between the target and the receiving device caused by the displacement of the target (referred to as the first displacement).

[0145] Continue to refer to Figure 1 The transmitting device sends a measurement signal s1(t), and the receiving device receives the reflected measurement signal x1(t). The processing device then acquires the first phase of the first signal corresponding to the target and the second phase of the second signal corresponding to the reference target. Based on the first phase, the second phase, and the reference information, it outputs the measurement result. The following text uses the output of the measurement result by the processing device as an example.

[0146] The reference information includes first information, second information, third information, and fourth information. The first information indicates a first distance from the target under test to the receiving device, the second information indicates a second distance from the reference target to the receiving device, the third information indicates a first angle of the target under test relative to the receiving device, and the fourth information indicates a second angle of the reference target relative to the receiving device.

[0147] By introducing a fixed reference target and measuring the phase change of the signal reflected by the reference target, it is beneficial to determine the change in distance from the reference target to the receiving device caused by the displacement of the receiving device (referred to as the second displacement) (referred to as the first change). Since the change in distance from the target to the receiving device caused by the movement of the receiving device generally changes with the angle of the target relative to the receiving device, the first angle, the second angle, and the first change can be used to more accurately eliminate the change caused by the movement of the receiving device (referred to as the second change) in the change in distance from the target to the receiving device. That is, to eliminate the phase interference introduced by the movement of the receiving device in deformation measurement, thereby obtaining a more accurate change in the position of the target, so as to realize the measurement of the micro-deformation of the target object. In addition, since the measurement accuracy of the first change does not depend on a high-precision IMU, it is beneficial to reduce the cost of the measurement system.

[0148] Optional, such as Figure 6 In step S604, the measurement system can measure reference information before S601. The implementation of S604 will be illustrated later; it will not be discussed in detail here. Furthermore, Figure 6 As an example only, the reference information may be measurements taken by other devices outside the measurement system prior to S601.

[0149] Assuming that when the measurement system or other equipment outside the measurement system measures reference information, the receiving device is located in the first position, then the displacement (second displacement) of the receiving device can be understood as a vector from the first position to the second position. The first distance is the distance from the target to be measured to the first position of the receiving device, the second distance is the distance from the reference target to the first position of the receiving device, the first angle is the angle of the target to be measured relative to the first position of the receiving device, and the second angle is the angle of the reference target relative to the first position of the receiving device.

[0150] This application does not limit the method by which the processing device obtains the reference information after receiving a measurement request. For example, the processing device may obtain the reference information from memory, or it may obtain the reference information from other devices.

[0151] This application does not limit the manner in which the processing device outputs measurement results. For example, the processing device may send the measurement results to other devices, or the processing device may output the measurement results to the user via an API, or the processing device may output the measurement results via the chip's interface.

[0152] To measure reference information, the target to be measured can be installed before S601, either by installing an artificial reference target or selecting a natural reference target, and then the reference information can be measured.

[0153] The following examples illustrate the types and measurement methods of first and second information.

[0154] In one implementation, the first information can be the carrier phase (referred to as the third phase, denoted as φ0) corresponding to the target under test, acquired by the receiving device before S601, and the second information can be the carrier phase (referred to as the fourth phase, denoted as δ0) corresponding to the reference target, acquired by the receiving device before S601. Since the carrier phase can be used to determine the transmission distance of the measurement signal, the third phase corresponding to the target under test can be used to indicate the distance from the target under test to the first position of the receiving device (e.g., R0 as described above), and the fourth phase corresponding to the reference target can be used to indicate the distance from the reference target to the first position of the receiving device (e.g., r0 as described above).

[0155] For example, before S601, the processing device can send a measurement signal through a transmitting device and receive the echo signal of the measurement signal through a receiving device, thereby determining φ0 and δ0. This process can be understood with reference to the process of the processing device obtaining φ1 and δ1 described above. For example, the processing device can send a measurement signal (denoted as s0(t)) through a transmitting device, and then receive the reflected measurement signal (denoted as x0(t)) through a receiving device. The received signal is sampled, and the signal corresponding to the measurement signal reflected by the target under test (denoted as u0) and the signal corresponding to the measurement signal reflected by the reference target (denoted as v0) are determined from the sampled signal. u0 and v0 can be represented as follows:

[0156]

[0157] Where R0 represents the distance between the target under test and the first position of the antenna feed, φ0 represents the carrier phase of u0 (i.e., the third phase), r0 represents the distance between the reference target and the first position of the antenna feed, and δ0 represents the carrier phase of v0 (i.e., the fourth phase).

[0158] φ0 can be the result of a single measurement or the result of multiple measurements. Similarly, δ0 can be the result of a single measurement or the result of multiple measurements. For example, the receiving device can acquire echo signals over a period of time before S601, demodulate multiple measurement signals reflected by the target under test and multiple measurement signals reflected by the reference target, statistically analyze the multiple measurement signals reflected by the target under test to obtain φ0, and statistically analyze the multiple measurement signals reflected by the reference target to obtain δ0. This application does not limit the statistical method; for example, it can use methods such as calculating the average, maximum, minimum, or median to perform the statistical analysis.

[0159] Alternatively, in one implementation, the first information may include, prior to S601, the coordinates of the target under test in the first coordinate system (denoted as [x], measured by the measuring device). T ,y T ,z T ] T ), and the coordinates of the first position of the receiving device in the first coordinate system (denoted as [x A ,y A ,z A ] T The second information may include, prior to S601, the coordinates of the reference target in the first coordinate system measured by the measuring device (denoted as [x]). R ,y R ,z R ] T ), and the coordinates of the first position of the receiving device in the first coordinate system (i.e., [x] A ,y A,z A ] T The first coordinate system can be the global coordinate system. The x-axis of the global coordinate system can point due east, the y-axis can point due north, and the z-axis can point in the opposite direction of gravity.

[0160] This application does not limit the type of measuring equipment. For example, the measuring equipment may be a total station, real-time kinematic (RTK), global navigation satellite system (GNSS), or global positioning system (GPS), etc.

[0161] The following examples illustrate the types and measurement methods of third and fourth information.

[0162] The third information indicates the first angle; for example, the third information includes the azimuth angle of the target relative to the first position of the receiving device (denoted as ). ) and pitch angle (denoted as θ) t ).

[0163] For example, the measuring device can measure the following before S601: and θ t The measuring equipment can directly measure it. and θ t Alternatively, the measuring device can measure [x]. T ,y T ,z T ] T and [x A ,y A ,z A ] T Afterwards, the measuring device is based on [x] T ,y T ,z T ] T and [x A ,y A ,z A ] T calculate and θ t Alternatively, for example, the processing device can obtain [x] T ,y T ,z T ] T and [x A ,y A ,z A ] T Afterwards, based on [x] T,y T ,z T ] T and [x A ,y A ,z A ] T calculate and θ t For example, θ t These can be represented as follows:

[0164]

[0165] The definition of atan2(·,·) is as follows:

[0166]

[0167] arccos(a) represents the arccosine value of a, and arctan(a) represents the arctangent value of a.

[0168] The fourth information indicates the second angle; for example, the fourth information includes the azimuth angle of the reference target relative to the first position of the receiving device (denoted as...). ) and pitch angle (denoted as θ) r ).

[0169] For example, taking a human-made reference target as an example, the measuring device can measure the target before step S601. and θ r The measuring equipment can directly measure it. and θ r Alternatively, the measuring device can measure [x]. R ,y R ,z R ] T and [x A ,y A ,z A ] T Afterwards, the measuring device is based on [x] R ,y R ,z R ] T and [x A ,y A ,z A ] T calculate and θ r Alternatively, for example, the processing device can obtain [x] R ,y R ,z R ] T and [x A ,y A,z A ] T Afterwards, based on [x] R ,y R ,z R ] T and [x A ,y A ,z A ] T calculate and θ r .

[0170] The following section will provide examples of methods for measuring the azimuth and elevation angles of a natural reference target relative to a first position of the receiving device; these will not be elaborated upon here.

[0171] After acquiring the first phase, the second phase, and the reference information, the processing device can determine the measurement result based on the first phase, the second phase, and the reference information. This application does not limit the specific implementation of this process.

[0172] For example, the processing device determines first compensation information based on a second phase and second information, the first compensation information indicating a first change in the distance from the reference target to the receiving device caused by a second displacement of the receiving device. Then, the processing device determines second compensation information based on the first compensation information, third information, and fourth information, the second compensation information indicating a second change in the distance from the target to the receiving device caused by the second displacement. Finally, the processing device determines a measurement result based on the first phase, the first information, and the second compensation information.

[0173] The following example illustrates a method by which a processing device determines first compensation information based on a second phase and second information.

[0174] In this application, the first change is denoted as Δr1, the second phase as δ1, the second information as the fourth phase (i.e., δ0), and the distance indicated by the second information is r0. Then:

[0175]

[0176] In other words, the processing device can determine the first change Δr1 indicated by the first compensation information based on the second phase δ1 and the r0 or δ0 indicated by the second information, where Δr1 is:

[0177] or,

[0178]

[0179] Here, phase(s) represents taking the phase of the complex number s.

[0180] Assume the second information includes [x] R ,y R,z R ] T and [x A ,y A ,z A ] T ,So,

[0181] The following example illustrates a method by which a receiving and processing device determines second compensation information based on first compensation information, third information, and fourth information.

[0182] In this application, the second change is denoted as Δr2, and the azimuth and elevation angles indicated by the third information are respectively... and θ t The azimuth and elevation angles indicated by the fourth information are respectively and θ r , Δθ=θ t -θ R .

[0183] In one implementation, the processing device can project the first change Δr1 onto the straight line between the target under test and the first position of the receiving device based on the third and fourth information, and this projection is the second change Δr2.

[0184] Alternatively, in one implementation, the processing device determines a second displacement of the receiving device based on the first compensation information and the fourth information, and then determines the second compensation information based on the second displacement of the receiving device and the third information.

[0185] The following example illustrates how the processing device determines the second displacement of the receiving device based on the first compensation information and the fourth information.

[0186] For example, the processing device can approximate the direction of the second displacement of the receiving device as parallel to the straight line containing the reference target and the first position of the receiving device. The second displacement of the receiving device is denoted as [Δx, Δy, Δz]. T The first change indicated by the first compensation information is Δr1, and the azimuth indicated by the fourth information is... The pitch angle indicated by the fourth piece of information is θ. r Assuming the z-direction is perpendicular to the second displacement of the receiving device, then Δz = 0, and the second displacement of the receiving device satisfies the following expression:

[0187]

[0188] It is evident that the processing device can base its actions on the first change Δr1 indicated by the first compensation information and the change indicated by the fourth information. and θ r The second displacement of the receiving device is determined.

[0189] Alternatively, the processing device may acquire fifth information based on the measurement request, the fifth information indicating the direction of the second displacement of the receiving device, and then determine the second displacement of the receiving device based on the first compensation information, the fourth information, and the fifth information.

[0190] Assuming Δz = 0, and the angle difference (or included angle) between the second displacement and the straight line containing the reference target and the receiving device is α, then the second displacement of the receiving device satisfies the following expression:

[0191]

[0192] Assume the azimuth angle of the second displacement of the receiving device indicated by the fifth information is... The azimuth angle of the reference target relative to the first position is because This can be understood as the azimuth angle of the second position relative to the first position. Therefore,

[0193] This application does not limit the method of obtaining the fifth information. For example, the processing device may, upon receiving a measurement request, acquire the acceleration and / or angular velocity measured by an inertial measurement unit (IMU), which measures the acceleration and / or angular velocity of the receiving device. Then, based on the acceleration and / or angular velocity measured by the IMU, the direction of the second displacement of the receiving device is determined. Examples will be provided later. The measurement methods will not be discussed in detail here. The inertial measurement unit can be replaced with other measuring devices, such as GNSS.

[0194] This application does not limit the installation location of the inertial measurement unit. For example, the inertial measurement unit is installed on the receiving device, or the inertial measurement unit is installed on the mast where the receiving device is located, and the acceleration of the receiving device is measured by measuring the acceleration of the mast.

[0195] Combining a reference target with an inertial measurement unit allows for a relaxation of the requirements on the deployment location of the reference target.

[0196] After the processing device determines the second displacement of the receiving device, it can determine the second compensation information based on the second displacement of the receiving device and the third information.

[0197] In one implementation, the processing device can project the second displacement of the receiving device onto the straight line between the target to be measured and the first position of the receiving device, based on the first angle indicated by the third information. This projection is the second change Δr2 indicated by the second compensation information.

[0198] Alternatively, in one implementation, the processing device may determine the second compensation information based on the first compensation information, the second displacement of the receiving device, the third information, and the fourth information.

[0199] For example, the second displacement (e.g., [Δx, Δy, Δz]) T This is used to determine the first function, whose function value is the change in distance from the target to the receiving device caused by the second displacement. The independent variable of the first function is the angle of the target relative to the receiving device. The angle includes the azimuth angle of the target's first position relative to the receiving device. Taking the pitch angle θ as an example, the second displacement is a three-dimensional vector and represented as [Δx, Δy, Δz]. T For example, the first function can be represented as In this application, the sign before the semicolon inside the parentheses of a function represents the function's independent variable, and the sign after the semicolon inside the parentheses represents the function's parameter. For example, the first function can be represented as:

[0200]

[0201] The first function is at the second angle (e.g.) and θ r The function value of ) (denoted as Δr1) is the first change, and the first function is at the first angle (e.g. and θ t The function value of ) (denoted as Δr2) is the second change, and Δr1 and Δr2 can be expressed as follows:

[0202]

[0203] The first function is used to perform a polynomial expansion at the first value of the independent variable to obtain the second function. The second angle (e.g., with the first value as indicated by the fourth information) is then used. and θ r For example, the second function can be expressed as: The second function can be expressed as:

[0204]

[0205] The first value is the first angle indicated by the third information (e.g.) and θ t For example, the second function can be expressed as: The second function can be expressed as:

[0206]

[0207] This application does not limit the method of polynomial expansion. For example, the polynomial expansion can be a Taylor expansion, a Maclaurin expansion, or a Fourier series expansion, etc. This application does not limit the order of the polynomial expansion; for example, a first-order polynomial expansion or a second-order polynomial expansion can be used. This application does not limit... In the form of.

[0208] In and θ r Taking the first-order Taylor expansion of the first function as an example, assuming Δz = 0, that is, the second displacement is a two-dimensional vector, and the second function is at the first angle (e.g., θ) t , function value It can be represented as:

[0209]

[0210] in,

[0211] In and θ t Taking the first-order Taylor expansion of the first function as an example, assuming Δz = 0, that is, the second displacement is a two-dimensional vector, and the second function is at the second angle (e.g., θ) r , function value It can be represented as:

[0212]

[0213] in,

[0214] Optional, Since it is a second-order small quantity, it can be ignored. Taking the expansion at the first angle as an example, Δr1 can be expressed as:

[0215]

[0216] Optionally, if the pitch angle of the reference target is very close to the pitch angle of the target to be measured, Δθ can be ignored. Taking the first angle expansion as an example, Δr1 can be expressed as:

[0217]

[0218] Optionally, if the azimuth of the reference target is very close to the azimuth of the target to be measured, This can be ignored. Taking the expansion at the first angle as an example, Δr1 can be expressed as:

[0219]

[0220] This can be understood as the effect of the second displacement caused by the movement of the receiving device on the signal v1 (denoted as γ). ref Assume the displacement of the receiving device from the first position to the second position is [Δx, Δy, Δz]. T Then we have:

[0221]

[0222] This can be understood as the effect of the second displacement caused by the movement of the receiving device on the signal u1 (denoted as γ). sar The displacement of the receiving device from the first position to the second position is denoted as [Δx, Δy, Δz]. T Then we have:

[0223]

[0224] The preceding text used the first formula to describe the relationship between Δr2 and Δr1 as an example; alternatively, the first formula describes γ. ref and γ tar Given the relationship between them, the first formula can be:

[0225]

[0226] The following example illustrates a method by which a processing device determines the change in distance between the target under test and the receiving device due to the first displacement of the target under test, based on the first phase, the first information, and the second compensation information.

[0227] In this application, the change in distance between the target and the receiving device caused by the first displacement of the target is denoted as ΔR, the second change indicated by the second compensation information is denoted as Δr2, the first phase is φ1, the first information is the third phase (i.e., φ0), and the distance indicated by the first information is R0. Then:

[0228] or,

[0229]

[0230] In other words, the processing device can determine the change in distance ΔR between the target under test and the receiving device caused by the first displacement of the target under test, based on the first phase φ1, φ0 or R0 indicated by the first information, and Δr2 indicated by the second compensation information.

[0231] This application does not limit the specific method by which the processing device determines ΔR. Optionally, This can be understood as compensating for the influence component caused by the second displacement of the receiving device in u1, resulting in a compensated signal. The compensated signal can be expressed as:

[0232]

[0233] by For example, the compensated signal can be represented as:

[0234]

[0235] The processing device can determine ΔR based on the compensated signal.

[0236] The expression for Δr1 has been introduced above; this application does not limit the determination of the processing device. In an exemplary manner, in, |v1| represents taking the conjugate of the signal v0, and |v1| represents taking the modulus of the complex number v1.

[0237] As described above, the processing device can determine the azimuth angle of the second displacement of the receiving device as indicated by the fifth information. To determine the second displacement of the receiving device. Below, using an example where the measurement system includes the base station's main unit and its antenna feeder, with the antenna feeder mounted on a mast, we will illustrate how to measure acceleration using an inertial measurement unit. The method.

[0238] Assume the IMU is fixed on the antenna feeder, and its x, y, and z axes are parallel to the x, y, and z axes of the global coordinate system, respectively. The IMU is clock-synchronized with the base station, and its sampling rate is the same as the symbol rate or pulse repetition frequency (PRF) of the measurement signal transmitted by the base station. This sampling rate is denoted as f. prf Hz.

[0239] That is, every time the base station takes a measurement after the initial moment. The base station transmits a measurement signal once per second and receives the reflected measurement signal. Let s be the m-th measurement signal transmitted by the base station. (m) The reflected measurement signal received by the base station is denoted as x. (m) The base station operates according to the sampling frequency f. s For the received measurement signal x (m) Sampling and matched filtering are performed to obtain u (m) and v (m) .

[0240] When the base station transmits the measurement signal for the mth time, the IMU can obtain a set of acceleration measurement results, denoted as... Assuming the base station's antenna feeder is free from vibration at the initial measurement moment, the vibration velocity of the base station's antenna feeder during the m-th signal transmission can be estimated as follows:

[0241]

[0242] The sway displacement of the base station's antenna feeder can be estimated as follows:

[0243]

[0244] So, the azimuth angle of the base station's antenna feeder's sway displacement in the global coordinate system.

[0245] This application does not limit the number of channels of the receiving device. Taking a receiving device with a single channel as an example, the measurement system can receive the reflected measurement signal through the single channel of the receiving device, and determine the carrier phase of the measurement signal reflected by the target under test and the carrier phase of the measurement signal reflected by the reference target based on the measurement signal received through that channel. Taking a receiving device with multiple channels as an example, the measurement system can receive the reflected measurement signals separately through multiple channels of the receiving device, and determine the carrier phase of the measurement signal reflected by the target under test and the carrier phase of the measurement signal reflected by the reference target based on the multiple measurement signals received by the multiple channels respectively.

[0246] The previous section introduced methods for measuring deformation using a reference target. The reference target can be a natural reference target. Below, using the measurement system as a base station as an example, we will introduce how the measurement system selects a natural reference target.

[0247] Step 1: The base station transmits a wide-beam waveform s(t) through the antenna and receives the reflected echo signals through multiple channels of the antenna.

[0248] Assume the antenna has multiple receiving channels (or simply channels), arranged as N. y ×N z The matrix, therefore, the antenna includes N y ×N z The base station can receive echo signals through multiple channels of the antenna, and will receive the (n)th channel. y ,n z The echo signals received by ) channels are denoted as Where, n y =1,…, or N y n y =1,…,N y ,n z =1,…, or N z .

[0249] Step 2: The base station samples the signals received from multiple channels respectively;

[0250] The base station samples the signals received from multiple channels separately. Taking the (n)th... y ,n z Taking the echo signal received by 10 channels as an example, we will analyze it.

[0251] The sampled signal may include in, f s Where k is the sampling frequency, and k is the sampling point number (or distance cell number).

[0252] Step 3: The base station performs matched filtering on the sampled signals received from multiple channels.

[0253] The result of matched filtering is also called a range profile. A range profile is a one-dimensional projection of the distribution of scattering points from a target or environment onto the radar's radial range. Figure 7 The distance image is schematically shown. Figure 7 The horizontal axis represents the sampling point number, and the vertical axis represents the result after matched filtering. The amplitude gain, measured in units such as dB, can be used to represent the intensity of signal energy.

[0254] Step 4: The base station selects M in the distance image. R The natural targets corresponding to each peak point are used as candidate natural reference targets;

[0255] The base station can select M with a larger amplitude gain from the range image. R The natural targets corresponding to the peak points are used as candidate natural reference targets, and M is used as the natural reference target. R The candidate natural reference targets are denoted as Among them, M R It is a positive integer.

[0256] For example, Figure 7 The natural targets corresponding to the 79th sampling point, the 106th sampling point, the 143rd sampling point, the 176th sampling point, and the 209th sampling point shown can be used as candidate natural reference targets.

[0257] It is important to note that the sampling point numbers corresponding to the candidate natural reference targets do not include the sampling point numbers corresponding to the target being measured. Specifically, the sampling point number (or distance cell number) corresponding to the target being measured... c is the speed of light.

[0258] Step 5: The base station estimates M based on the matched filtering results corresponding to multiple channels. R The azimuth and elevation angles of the candidate natural reference targets;

[0259] For a candidate natural reference target k1, the base station can extract the matched filtering result corresponding to the k1th candidate natural reference target from the matched filtering results of the sampled signals received from all channels, and then calculate the azimuth-elevation map of the candidate natural reference target through an angle estimation algorithm.

[0260] Taking the angle estimation algorithm as an example, the iterative adaptive approach (IAA) algorithm proposed by Yadibi in his paper "Source Localization and Sensing: A Nonparametric Iterative Adaptive Approach Based on Weighted Least Squares," the azimuth-elevation (AE) map of the candidate natural reference target is used. φ∈Φ, θ∈Θ Let Φ represent a complex number, Θ be a preset set of azimuth angles, and Θ be a preset set of pitch angles.

[0261] Figure 8 An example of an azimuth-elevation map obtained using the IAA algorithm is given. Figure 8 In, Φ={-90°,-89°,…,0°,1°,…,89°,90°}, Θ={-15°,-14°,…,0°,1°,…,14°,15°}. Figure 8 In this diagram, the pixel color represents the amplitude gain of AE(φ,φ), which can be red (R), green (G), or blue (B). The azimuth and elevation angles corresponding to the pixel with the largest amplitude gain in the azimuth-elevation image are taken as the azimuth angles of the candidate natural reference target. Pitch angle

[0262] The base station can identify the remaining candidate natural reference targets k2,…, Perform the above operations to obtain the azimuth angle of each candidate natural reference target. and pitch angle

[0263] It should be noted that the azimuth and elevation angles mentioned above are angles of the candidate natural reference target in the coordinate system of the base station's antenna. Figure 9 An example of a multi-channel base station antenna and its coordinate system is provided.

[0264] Step 6: The base station will determine the azimuth angle of the candidate natural reference target. and pitch angle Switch to the global coordinate system;

[0265] For example, suppose that in the coordinate system of the base station's antenna, the x-axis points due east and is parallel to the global coordinate system, the y-axis points due north and is parallel to the global coordinate system, and the z-axis points in the opposite direction of gravity and is parallel to the global coordinate system. In this case, the azimuth and elevation angles of the candidate natural reference target in the global coordinate system are still [value missing].

[0266] Step 7: The base station updates the candidate natural reference targets based on the angle threshold;

[0267] For example, a base station can be set with a certain angular interval threshold, such as φ. g and θ g Among them, φ g >0 and θ g >0. Assume the azimuth and elevation angles of the target object relative to the base station's antenna are respectively... And c, the updated azimuth angle (e.g., φ) of the candidate natural reference target. k ) and pitch angle (e.g., θ) k ) Must meet:

[0268]

[0269] Where |·| represents the absolute value of a real number.

[0270] For example, suppose the first M R The ′ candidate natural reference targets satisfy the angular spacing threshold. It should be noted that the selected φ g and θ g The smaller the value, the better the compensation effect of the method in this application on antenna sway, and the higher the accuracy of deformation measurement. However, there may not be a suitable natural reference target in the natural environment, so an artificial reference target can be installed.

[0271] The base station can repeat steps 1 through 7 multiple times to collect M. s The matched filtering result of each candidate natural reference target after each transmission, reception, sampling, and matched filtering is denoted as: Among them, t s =1,2,…,M s Then, according to certain criteria, the more stable natural reference targets among the candidate natural reference targets are selected. This criterion can be chosen from options such as amplitude deviation or phase variance. For example, let's take amplitude deviation as the criterion. in, Represents a computational sequence or set variance Represents a computational sequence or set The average value of the mean. Then the azimuth angle of the finally selected natural reference target. pitch angle is

[0272] This application takes measuring deformation through a single reference target as an example. Optionally, deformation can be measured through multiple reference targets respectively, and then the multiple measurement results are statistically analyzed (e.g., averaged or weighted averaged) to output the statistical results.

[0273] The foregoing described the apparatus provided in the fourth aspect of this application, which may include a processor. Optionally, the apparatus may be... Figure 2 The measurement system shown or including Figure 2 The measurement system shown includes all or part of the components except the antenna, provided that the device includes... Figure 2 The processor shown is sufficient. This processor is used to execute computer programs in memory to perform the steps performed by the processing device described above.

[0274] The apparatus provided in the fifth aspect of this application has also been described above. This apparatus may include an acquisition module and a processing module. The functions of the acquisition module and the processing module are described above and will not be repeated here. The acquisition module and the processing module interact to implement the steps performed by the processing device or processor as shown in the previous example. For example, the acquisition module is used to execute S601 and S602, and the processing module is used to execute S603. Optionally, the acquisition module is also used to execute S604.

[0275] The acquisition module can be implemented through software, hardware, or a combination of both. Similarly, the processing module can be implemented through software, hardware, or a combination of both. For example, the implementation of the processing module will be illustrated below. Likewise, the implementation of the acquisition module can be understood by referring to the implementation of the processing module.

[0276] As an example of a software functional unit, a processing module may include code running on a computing instance. A computing instance may include at least one of a physical host (computing device), a virtual machine, or a container. Furthermore, the aforementioned computing instance may be one or more. For example, a processing module may include code running on multiple hosts / virtual machines / containers. It should be noted that the multiple hosts / virtual machines / containers used to run the code may be distributed within the same region or in different regions. Further, the multiple hosts / virtual machines / containers used to run the code may be distributed within the same availability zone (AZ) or in different AZs, each AZ comprising one or more geographically proximate data centers. Typically, a region may include multiple AZs.

[0277] Similarly, multiple hosts / virtual machines / containers used to run this code can be distributed within the same Virtual Private Cloud (VPC) or across multiple VPCs. Typically, a VPC is set up within a region. Communication between two VPCs within the same region, as well as between VPCs in different regions, requires a communication gateway to be set up within each VPC to enable interconnection between VPCs.

[0278] As an example of a hardware functional unit, a processing module may include at least one computing device, such as a server. Alternatively, a processing module may be implemented using a central processing unit (CPU), an application-specific integrated circuit (ASIC), or a programmable logic device (PLD). The aforementioned PLD may be implemented using a complex programmable logical device (CPLD), a field-programmable gate array (FPGA), a generic array logic (GAL), a data processing unit (DPU), a neural network processing unit (NPU), a system-on-chip (SoC), an offload card, an accelerator card, or any combination thereof.

[0279] The processing module comprises multiple computing devices that can be distributed within the same region or in different regions. These computing devices can also be distributed within the same Availability Zone (AZ) or in different AZs. Similarly, they can be distributed within the same Virtual Private Cloud (VPC) or multiple VPCs. These computing devices can be any combination of computing devices such as servers, ASICs, PLDs, CPLDs, FPGAs, GALs, DPUs, NPUs, SoCs, offloading cards, and accelerator cards.

[0280] The preceding text also describes a chip or chip system provided in the sixth aspect of this application, which includes at least one processor for implementing the steps performed by the processing device or processor as described in the preceding example.

[0281] In this application, any processor or chip mentioned herein may be a general-purpose central processing unit, a microprocessor, an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or one or more integrated circuits for controlling the execution of a program that controls the methods provided in any of the above embodiments.

[0282] The memory mentioned above can be read-only memory (ROM) or other types of static storage devices that can store static information and instructions, such as random access memory (RAM).

[0283] The preceding text also describes the apparatus provided in the seventh aspect of this application, which includes at least one logic circuit and an input / output interface, the logic circuit being used to implement the steps performed by the processing device or processor in the preceding examples.

[0284] The preceding text also describes a computer-readable storage medium provided in the eighth aspect of this application, which includes computer instructions that, when executed on a computer, cause the computer to perform the steps performed by the processing device or processor in the preceding examples.

[0285] The preceding text also describes a computer program product including computer instructions provided in the ninth aspect of this application, which, when run on a computer, causes the computer to perform steps as described in the preceding example performed by a processing device or processor.

[0286] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the explanations and beneficial effects of the relevant contents in any of the above-mentioned devices can be referred to the corresponding method embodiments provided above, and will not be repeated here.

[0287] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces, or indirect coupling or communication connection between apparatuses or units, and may be electrical, mechanical, or other forms.

[0288] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0289] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0290] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the essential contribution of the technical solution of this application, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, ROM, RAM, magnetic disks, or optical disks.

[0291] In this application, unless otherwise specified, the same or similar parts between the various embodiments can be referred to each other. In the various embodiments of this application, and the various methods / designs / implementations within each embodiment, unless otherwise specified or logically conflicting, the terminology and / or descriptions between different embodiments and between the various methods / designs / implementations within each embodiment are consistent and can be mutually referenced. The technical features in different embodiments and the various methods / designs / implementations within each embodiment can be combined to form new embodiments, methods, or implementations based on their inherent logical relationships. The following descriptions of the embodiments of this application do not constitute a limitation on the scope of protection of this application.

[0292] In this application embodiment, "multiple" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, "at least one of A, B, and C" includes A, B, C, AB, AC, BC, or ABC. Furthermore, unless otherwise specified, the ordinal numbers such as "first" and "second" mentioned in this application embodiment are used to distinguish multiple objects and are not used to limit the order, sequence, priority, or importance of multiple objects.

[0293] In the embodiments of this application, "send" and "receive" refer to the direction of signal transmission. For example, "send information to XX" can be understood as the destination of the information being XX, which may include direct transmission via the air interface or indirect transmission by other units or modules via the air interface. "Receive information from YY" can be understood as the source of the information being YY, which may include direct reception from YY via the air interface or indirect reception from YY by other units or modules via the air interface. "Send" can also be understood as the "output" of the chip interface, and "receive" can also be understood as the "input" of the chip interface. In other words, sending and receiving can occur between devices, such as between network devices and terminal devices, or within a device, such as between components, modules, chips, software modules, or hardware modules within the device via a bus, wiring, or interface. It is understood that information may undergo necessary processing, such as encoding and modulation, between the source and destination of the information transmission, but the destination can understand the valid information from the source. Similar expressions in this application can be understood in a similar way and will not be elaborated further.

[0294] In the embodiments of this application, "instruction" can include direct and indirect instructions, as well as explicit and implicit instructions. The information indicated by a certain piece of information (hereinafter referred to as instruction information) is called the information to be instructed. In specific implementation, there are many ways to indicate the information to be instructed, such as, but not limited to, directly indicating the information to be instructed, such as the information to be instructed itself or its index. It can also indirectly indicate the information to be instructed by indicating other information, where there is an association between the other information and the information to be instructed; or it can only indicate a part of the information to be instructed, while the other parts are known or pre-agreed upon. For example, the instruction can be implemented by using a pre-agreed (e.g., protocol predefined or pre-configured) arrangement of various information, thereby reducing the instruction overhead to a certain extent. This application does not limit the specific method of instruction. It is understood that for the sender of the instruction information, the instruction information can be used to indicate the information to be instructed; for the receiver of the instruction information, the instruction information can be used to determine the information to be instructed.

[0295] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit it. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art can understand that they can still modify the technical solutions described in the foregoing embodiments, or make equivalent substitutions for some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A measurement method, characterized in that, include: Obtain a measurement request, which instructs that the deformation of the target object be measured; Based on the measurement request, the receiving device receives a first signal reflected by the target to be measured on the target object and a second signal reflected by the reference target. Based on reference information, the first phase of the first signal, and the second phase of the second signal, a measurement result is output. The reference information includes first information, second information, third information, and fourth information. The first information indicates a first distance from the target under test to the receiving device, the second information indicates a second distance from the reference target to the receiving device, the third information indicates a first angle of the target under test relative to the receiving device, and the fourth information indicates a second angle of the reference target relative to the receiving device. The measurement result indicates the change in the distance from the target under test to the receiving device caused by a first displacement of the target under test.

2. The method according to claim 1, characterized in that, The second phase and the second distance are used to determine the first change in the distance from the reference target to the receiving device caused by the second displacement of the receiving device. The first change and the second angle are used to determine the second displacement. The second displacement and the first angle are used to determine the second change in the distance from the target to the receiving device caused by the second displacement. The second change, the first phase, and the first distance are used to determine the measurement result.

3. The method according to claim 2, characterized in that, The second displacement is used to determine the first function, the function value of the first function is the change in the distance from the target to the receiving device caused by the second displacement, the independent variable of the first function is the angle of the target relative to the receiving device, the angle of the target relative to the receiving device is any angle within a first angle range, the first angle range includes the first angle and the second angle; The first function is used to perform a polynomial expansion at the first angle to obtain a second function. When the independent variable of the second function is the second angle, the function value of the second function is used to determine the second change. or, The first function is used to perform a polynomial expansion at the second angle to obtain a second function. When the independent variable of the second function is the first angle, the function value of the second function is used to determine the second change.

4. The method according to claim 2 or 3, characterized in that, The magnitude of the second displacement is the same as the absolute value of the first change, and the direction of the second displacement is parallel to the straight line between the reference target and the receiving device.

5. The method according to claim 2 or 3, characterized in that, The method further includes: Based on the measurement request, fifth information is obtained, which indicates the direction of the second displacement. The direction of the second displacement is used together with the first change and the second angle to determine the second displacement.

6. The method according to claim 5, characterized in that, The acquisition of the fifth information includes: Acquire acceleration and / or angular velocity measured by an inertial measurement unit, wherein the inertial measurement unit is used to measure the acceleration and / or angular velocity of the receiving device during movement; The direction of the second displacement is determined based on the obtained acceleration and / or angular velocity.

7. The method according to any one of claims 1-6, characterized in that, The first information is determined based on the phase of a third signal, and the second information is determined based on the phase of a fourth signal. The third signal is a signal reflected by the target under test and received by the receiving device before the measurement request is obtained. The fourth signal is a signal reflected by the reference target and received by the receiving device before the measurement request is obtained.

8. The method according to any one of claims 1-6, characterized in that, The first information and the second information are determined based on the coordinates of the receiving device, the target to be measured, and the reference target measured before the measurement request is received.

9. The method according to any one of claims 1-8, characterized in that, The third information includes the azimuth and / or elevation angles of the target under test relative to the receiving device, measured before the measurement request is obtained, and the fourth information includes the azimuth and / or elevation angles of the reference target relative to the receiving device, measured before the measurement request is obtained.

10. A measurement method, characterized in that, include: Obtain a measurement request, which instructs that the deformation of the target object be measured; Based on the measurement request, the first phase of the first signal and the second phase of the second signal are obtained, wherein the first signal and the second signal are respectively the signal reflected by the target to be measured on the target object and the signal reflected by the reference target, which are received by the receiving device. Based on reference information, the first phase of the first signal, and the second phase of the second signal, a measurement result is output. The reference information includes first information, second information, third information, and fourth information. The first information indicates a first distance from the target under test to the receiving device, the second information indicates a second distance from the reference target to the receiving device, the third information indicates a first angle of the target under test relative to the receiving device, and the fourth information indicates a second angle of the reference target relative to the receiving device. The measurement result indicates the change in the distance from the target under test to the receiving device caused by a first displacement of the target under test.

11. The method according to claim 10, characterized in that, The second phase and the second distance are used to determine the first change in the distance from the reference target to the receiving device caused by the second displacement of the receiving device. The first change and the second angle are used to determine the second displacement. The second displacement and the first angle are used to determine the second change in the distance from the target to the receiving device caused by the second displacement. The second change, the first phase, and the first distance are used to determine the measurement result.

12. A system, characterized in that, The system includes a receiving device and a processing device; The processing device is used to acquire a measurement request, which instructs the measurement of the deformation of the target object; The receiving device is used to receive a first signal reflected by the target to be measured on the target object and a second signal reflected by the reference target after the processing device obtains the measurement request; The processing device is further configured to output a measurement result based on reference information, a first phase of the first signal, and a second phase of the second signal. The reference information includes first information, second information, third information, and fourth information. The first information indicates a first distance from the target under test to the receiving device, the second information indicates a second distance from the reference target to the receiving device, the third information indicates a first angle of the target under test relative to the receiving device, and the fourth information indicates a second angle of the reference target relative to the receiving device. The measurement result indicates the change in the distance from the target under test to the receiving device caused by a first displacement of the target under test.

13. The system according to claim 12, characterized in that, The second phase and the second distance are used to determine the first change in the distance from the reference target to the receiving device caused by the second displacement of the receiving device. The first change and the second angle are used to determine the second displacement. The second displacement and the first angle are used to determine the second change in the distance from the target to the receiving device caused by the second displacement. The second change, the first phase, and the first distance are used to determine the measurement result.

14. An apparatus, characterized in that, The device includes an acquisition module and a processing module; The acquisition module is used to acquire a measurement request, which instructs the measurement of the deformation of the target object; The acquisition module is further configured to acquire, based on the measurement request, a first phase of a first signal and a second phase of a second signal, wherein the first signal and the second signal are respectively signals reflected by the target to be measured on the target object and signals reflected by the reference target, which are received by the receiving device. The processing module is used to output a measurement result based on reference information, a first phase of the first signal, and a second phase of the second signal. The reference information includes first information, second information, third information, and fourth information. The first information indicates a first distance from the target under test to the receiving device, the second information indicates a second distance from the reference target to the receiving device, the third information indicates a first angle of the target under test relative to the receiving device, and the fourth information indicates a second angle of the reference target relative to the receiving device. The measurement result indicates the change in the distance from the target under test to the receiving device caused by a first displacement of the target under test.

15. The apparatus according to claim 14, characterized in that, The second phase and the second distance are used to determine the first change in the distance from the reference target to the receiving device caused by the second displacement of the receiving device. The first change and the second angle are used to determine the second displacement. The second displacement and the first angle are used to determine the second change in the distance from the target to the receiving device caused by the second displacement. The second change, the first phase, and the first distance are used to determine the measurement result.

16. A device, characterized in that, The device includes a processor for executing a computer program or computer instructions in memory to perform processing operations of the method as claimed in any one of claims 1-9 or to perform the method as claimed in claim 10 or 11.

17. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program or computer instructions that, when executed on a computer, cause the processing operation of the method as described in any one of claims 1-9 or the method as described in claim 10 or 11 to be performed.

18. A computer program product, characterized in that, When the computer program product is run on a computer, it causes the processing operation of the method as described in any one of claims 1-9 or the method as described in claim 10 or 11 to be performed.

Images