A scintillator pulse radiation nonlinear luminescence emission spectrum measurement system and method

Abstract

The present application provides a scintillator pulse radiation nonlinear luminescence emission spectrum measurement system and method, which is used to solve the technical problem that the emission spectrum of the scintillator working in the nonlinear region is difficult to measure. The scintillator pulse radiation nonlinear luminescence emission spectrum measurement system provided by the present application adopts the same standard scintillator as the measurement reference as the measured scintillator, and divides the measured visible light signal into two paths, so that the waveform and spectrum information of the measured visible light signal emitted by the measured scintillator can be obtained simultaneously in a single shot and non-reproducible experiment, and time synchronization is obtained. At the same time, by comparing the waveform of the standard visible light signal emitted by the standard scintillator, the time when the measured scintillator works in the nonlinear luminescence region and the linear luminescence region can be judged, not only the emission spectrum measurement of the scintillator pulse radiation linear luminescence can be realized, but also the emission spectrum measurement of the scintillator pulse radiation nonlinear luminescence can be realized.

Description

Technical Field

[0001] This invention relates to a system and method for measuring the pulse emission spectrum of a scintillator, specifically to a system and method for measuring the emission spectrum of nonlinear luminescence from a scintillator pulse radiation. Background Technology

[0002] Under high pulse dose rate irradiation conditions, the luminescence intensity and time response of a scintillator will change accordingly, that is, the scintillator is working in the nonlinear luminescence region. Obtaining the emission spectrum of the scintillator during nonlinear luminescence can further explain the physical mechanism of the nonlinear luminescence of the scintillator.

[0003] Currently, there is considerable research on the emission spectrum of scintillators during nonlinear emission, but it remains difficult to measure the emission spectrum when the scintillator operates in the nonlinear region. The research report "Nonlinear Response and Origin of Slow Component of Two-Dimensional Perovskite Scintillator [J], The Journal of Physical Chemistry C, 2024, 128, 6719-6725. doi:10.1021 / acs.jpcc.3c07558" points out that when the pulse dose rate of a two-dimensional perovskite scintillator exceeds a certain value, its luminescence intensity changes nonlinearly with increasing dose rate, and the descent portion of its emission curve is prolonged. Theoretical simulations investigated the effect of different proportions of the fast and slow components of the scintillator on the emission curve, confirming that the increase in the intensity of the slow component leads to the extension of the emission time, and demonstrating that the fast and slow components of the scintillator have different emission spectra.

[0004] The above study, through theoretical analysis and experimental verification, has preliminarily demonstrated that the nonlinearity of the luminescence of two-dimensional perovskite scintillators is caused by the increase in the proportion of the slow component, and that the fast and slow components have different emission spectra. However, no further research has been conducted on the emission spectrum when measuring the luminescence nonlinearity of the scintillator. Summary of the Invention

[0005] The main objective of this invention is to solve the technical problem that the emission spectrum of a scintillator is difficult to measure when it is operating in the nonlinear region, and to provide an emission spectrum measurement system and method for nonlinear emission of scintillator pulse radiation.

[0006] To achieve the above objectives, the technical solution provided by this invention is as follows:

[0007] A scintillator pulse radiation nonlinear emission spectrum measurement system is characterized by comprising a radiation source, a beam splitter, a first photoelectric converter, an oscilloscope, a spectrometer, an ICCD camera, a pulse signal generator, a standard scintillator, and a second photoelectric converter.

[0008] The radiation source is used to generate pulsed rays and trigger signals;

[0009] The standard scintillator and the scintillator under test are the same scintillator and are both located within the radiation range of the radiation source. The pulsed rays emitted by the radiation source excite the standard scintillator and the scintillator under test to emit light, corresponding to the generation of a standard visible light signal and a visible light signal under test. The distance between the standard scintillator and the radiation source allows the standard scintillator to operate in the linear emission region, while the scintillator under test is movable relative to the radiation source.

[0010] The first photoelectric converter is located on the optical path of the standard visible light signal and is used to convert the standard visible light signal into a corresponding electrical signal. The beam splitter is located on the optical path of the visible light signal to be tested and is used to split the visible light signal to be tested into two paths, which are respectively denoted as the first optical signal to be tested and the second optical signal to be tested. The second photoelectric converter is located on the optical path of the first optical signal to be tested and is used to convert the first optical signal to be tested into a corresponding electrical signal. The spectrometer and the ICCD camera are located sequentially on the optical path of the second optical signal to be tested. The spectrometer is used to split the second optical signal to be tested according to the wavelength, and the ICCD camera is used to image the spectrum after splitting.

[0011] The input terminal of the pulse signal generator is connected to the output terminal of the radiation source, and is used to trigger the pulse signal generator to work and generate a pulse signal through the trigger signal; the output terminal of the pulse signal generator is connected to the input terminal of the ICCD camera, and is used to trigger the ICCD camera to work through the pulse signal.

[0012] The oscilloscope input is connected to the first photoelectric converter, the second photoelectric converter, and the output of the ICCD camera, respectively. It is used to convert the electrical signals corresponding to the standard visible light signal and the first light signal under test into corresponding waveforms and perform maximum value normalization processing to obtain the standard normalized waveform and the first normalized waveform under test. The first normalized waveform under test and the standard normalized waveform are compared in real time, and the working area of ​​the scintillator under test is determined based on the comparison result. The oscilloscope is also used to combine the first normalized waveform under test and the shutter information sent by the ICCD camera to realize the time synchronization of the first light signal under test and the second light signal under test.

[0013] Furthermore, the distance between the standard scintillator and the radiation source is greater than 5m;

[0014] The distance between the scintillator under test and the radiation source can be adjusted between 0.1m and 6m.

[0015] Furthermore, the first photoelectric converter includes a first phototube and a first high-voltage power supply. The first phototube is located in the optical path of the standard visible light signal, and the first high-voltage power supply is used to provide high voltage to the first phototube.

[0016] The second photoelectric converter includes a second phototube and a second high-voltage power supply. The second phototube is located in the optical path of the first optical signal to be measured, and the second high-voltage power supply is used to provide high voltage to the second phototube.

[0017] The output terminals of the first phototube and the second phototube are respectively connected to the input terminal of the oscilloscope via coaxial cables.

[0018] Furthermore, the beam splitter is placed close to the scintillator under test.

[0019] Furthermore, the beam splitter has a transmittance of more than 80% for visible light.

[0020] Furthermore, the operating wavelength of the spectrometer is between 200 nm and 900 nm.

[0021] Furthermore, the ICCD camera has a shutter width range of 1ns to 10s, a gain voltage range of 0 to 5V, and a pixel array of B×C, wherein the value of B ranges from 1280 to 2048, and the value of C ranges from 1280 to 2048.

[0022] In addition, the present invention also provides a method for measuring the emission spectrum of nonlinear luminescence from pulsed radiation of a scintillator, which is characterized by including the following steps:

[0023] Step 1: Construct the emission spectrum measurement system for the nonlinear emission of pulsed radiation from the scintillator described above;

[0024] Step 2: Set the distance between the scintillator under test and the standard scintillator and the radiation source to be the same, and make both of them work in the linear emission region;

[0025] Step 3: Turn on the radiation source to generate pulsed rays that excite the scintillator under test and the standard scintillator to emit light, generating a standard visible light signal and a visible light signal under test. The visible light signal under test is split by a beam splitter to form a first visible light signal and a second visible light signal under test. After the standard visible light signal and the first visible light signal under test are converted into corresponding electrical signals, the oscilloscope converts them into corresponding waveforms and performs maximum value normalization processing to obtain the standard normalized waveform and the first normalized waveform under test. At the same time, the trigger signal emitted by the radiation source triggers the pulse signal generator to work, causing the pulse signal generator to emit a pulse signal to trigger the ICCD camera to work. The ICCD camera acquires the spectral information of the second visible light signal under test through a spectrometer, and the ICCD camera simultaneously outputs a shutter signal to the oscilloscope.

[0026] Step 4: The oscilloscope combines the first normalized waveform under test and the shutter information sent by the ICCD camera to determine whether the shutter signal completely covers the first normalized waveform under test in time. If so, it indicates that the first and second light signals under test are synchronized in time, and step 5 is executed; otherwise, the shutter width and delay information of the ICCD camera are adjusted according to the judgment result until the shutter signal of the ICCD camera completely covers the first normalized waveform under test in time.

[0027] Step 5: Gradually decrease the distance between the scintillator under test and the radiation source using a preset distance as the step value until the first normalized waveform under test changes compared to the standard normalized waveform. This indicates that the scintillator under test is working in the nonlinear emission region. The spectral information of the second light signal under test acquired by the ICCD camera at the current moment is the emission spectrum of the nonlinear emission of the pulse radiation of the scintillator under test, thus completing the measurement.

[0028] Furthermore, step 1 also includes setting the gain voltage of the ICCD camera;

[0029] In step 4, when adjusting the shutter width of the ICCD camera, the shutter width of the ICCD camera should be twice the visible light signal emitted by the scintillator under test in terms of time.

[0030] Furthermore, in step 5, the preset distance is 50cm.

[0031] Compared with the prior art, the present invention has the following beneficial technical effects:

[0032] 1. The present invention provides an emission spectrum measurement system for nonlinear luminescence of scintillator pulse radiation. It uses a standard scintillator identical to the one under test as the measurement reference and employs a beam splitter to divide the visible light signal under test into two paths. This allows for the simultaneous acquisition of the waveform and spectral information of the visible light signal emitted by the scintillator under test in a single, non-repeatable experiment, achieving time synchronization. Simultaneously, by comparing the waveform with the standard visible light signal emitted by the standard scintillator, the system determines the time when the scintillator under test operates in the nonlinear or linear emission region. This system can simultaneously measure the emission spectrum of both linear and nonlinear luminescence of scintillator pulse radiation. The system is simple, efficient, and widely applicable to the emission spectrum measurement of nonlinear luminescence of scintillators.

[0033] 2. The present invention provides a method for measuring the emission spectrum of nonlinear luminescence from pulsed radiation of a scintillator. It is easy to operate and effectively improves the signal-to-noise ratio of the pulsed emission spectrum of the scintillator by setting the shutter delay and width, gain voltage of the ICCD camera and matching it with the pulse width and intensity of the radiation source. Attached Figure Description

[0034] Figure 1This is a schematic diagram of an embodiment of the emission spectrum measurement system for nonlinear emission of scintillator pulse radiation according to the present invention.

[0035] The annotations in the attached figures are explained as follows:

[0036] 1-Radiation source, 2-Beam splitter, 3-Second phototube, 4-Second high-voltage power supply, 5-Oscilloscope, 6-Spectrometer, 7-ICCD camera, 8-Pulse signal generator, 9-Standard scintillator, 10-First phototube, 11-First high-voltage power supply, 12-Scintillator under test. Detailed Implementation

[0037] To make the objectives, advantages, and features of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. Those skilled in the art should understand that these embodiments are merely used to explain the technical principles of the present invention and are not intended to limit the scope of protection of the present invention.

[0038] like Figure 1 As shown, an emission spectrum measurement system for nonlinear emission of scintillator pulse radiation includes a radiation source 1, a beam splitter 2, a first photoelectric converter, an oscilloscope 5, a spectrometer 6, an ICCD camera 7, a pulse signal generator 8, a standard scintillator 9, and a second photoelectric converter.

[0039] Radiation source 1 is used to generate pulse rays and trigger signals. The pulse rays are used to excite the standard scintillator 9 and the scintillator under test 12 to emit light, and the trigger signals are used to trigger the pulse signal generator 8 to work.

[0040] The standard scintillator 9 and the scintillator under test 12 are the same scintillator and are both located within the radiation range of the radiation source 1. They are used to make the pulse rays emitted by the radiation source 1 excite the standard scintillator 9 and the scintillator under test 12 to emit light, thereby generating a standard visible light signal and a visible light signal under test.

[0041] Since the closer the scintillator is to the radiation source 1, the greater the radiation dose it receives, and the scintillator will operate in the nonlinear emission region, while the farther the scintillator is from the radiation source 1, the smaller the radiation dose it receives, and the scintillator will operate in the linear emission region. Therefore, as a comparison benchmark, the distance between the standard scintillator 9 and the radiation source 1 needs to be set so that the standard scintillator 9 operates in the linear emission region. In this embodiment, the distance between the standard scintillator 9 and the radiation source 1 is 5m. The scintillator under test 12 can be moved relative to the radiation source 1 to keep the distance between them between 0.1m and 6m. Even if the scintillator under test 12 can operate in the linear emission region, it can also operate in the nonlinear emission region. By comparing the emission spectrum of the scintillator under test 12 with the emission spectrum of the standard scintillator 9, it can be determined whether the scintillator under test 12 operates in the nonlinear emission region or the linear emission region, thus completing the emission spectrum measurement of the nonlinear emission of the scintillator pulse radiation. Since the distance between the standard scintillator 9 and the radiation source 1 in this embodiment is 5m, it is preferable to set the distance between the scintillator 12 under test and the radiation source 1 to be 5m at the beginning of the test, which can effectively ensure that the scintillator 12 under test works in the linear light emission region at the beginning of the test.

[0042] The first photoelectric converter includes a first phototube 10 and a first high-voltage power supply 11, which provides high voltage to the first phototube 10. The first phototube 10 is located in the optical path of a standard visible light signal and is used to receive the standard visible light signal and convert it into a corresponding electrical signal.

[0043] Beam splitter 2 is a 1-to-2 beam splitter located in the optical path of the visible light signal to be tested. It is used to split the visible light signal to be tested into two paths, denoted as the first test light signal and the second test light signal, respectively. The first test light signal is transmitted to the oscilloscope 5 for recording after photoelectric conversion. The ICCD camera 7, operating in spectral acquisition mode, records the spectral information of the second test light signal and sends the shutter information corresponding to the current spectral information to confirm whether the first and second test light signals are time-synchronized. In this embodiment, it is preferable to place the beam splitter 2 close to the scintillator 12 to be tested, and the transmittance of the beam splitter 2 for visible light is greater than 80%.

[0044] The second photoelectric converter includes a second phototube 3 and a second high-voltage power supply 4, which provides high voltage to the second phototube 3. The second phototube 3 is located in the optical path of the first optical signal to be measured and is used to receive the first optical signal to be measured and convert it into a corresponding electrical signal. In this embodiment, the second photoelectric converter and the first photoelectric converter are of the same model, and the operating voltage of the first high-voltage power supply 11 and the second high-voltage power supply 4 is adjustable between 800V and 1500V.

[0045] Spectrometer 6 and ICCD camera 7 are sequentially located on the optical path of the second optical signal to be measured. Spectrometer 6 is used to split the second optical signal to be measured according to its wavelength, and ICCD camera 7 is used to image the spectrum after splitting. In this embodiment, the operating wavelength of spectrometer 6 is between 200nm and 900nm, the shutter width of ICCD camera 7 is between 1ns and 10s, the gain voltage is between 0 and 5V, and the pixel array is B×C, where the value of B ranges from 1280 to 2048, and the value of C ranges from 1280 to 2048.

[0046] The input terminal of the pulse signal generator 8 is connected to the output terminal of the radiation source 1, and is used to trigger the pulse signal generator 8 to operate and generate a pulse signal via a trigger signal. The output terminal of the pulse signal generator 8 is connected to the input terminal of the ICCD camera 7, and is used to trigger the ICCD camera 7 to operate via a pulse signal.

[0047] The input terminals of the oscilloscope 5 are connected to the output terminals of the first phototube 10, the second phototube 3, and the ICCD camera 7 via coaxial cables. It is used to convert the electrical signals corresponding to the standard visible light signal and the first test light signal into corresponding waveforms and perform maximum value normalization processing to obtain the standard normalized waveform and the first test normalized waveform. Simultaneously, it compares the first test normalized waveform and the standard normalized waveform in real time, and determines whether the scintillator 12 under test is operating in the nonlinear emission region based on the comparison result. The oscilloscope 5 is also used to combine the first test normalized waveform and the shutter information sent by the ICCD camera 7 to achieve time synchronization between the first test light signal and the second test light signal.

[0048] A method for measuring the emission spectrum of nonlinear luminescence from pulsed radiation of a scintillator, specifically including the following steps:

[0049] Step 1: Build the emission spectrum measurement system for the nonlinear emission of pulsed radiation from the scintillator described above, and set the gain voltage of the ICCD camera 7 to obtain a signal with a high signal-to-noise ratio.

[0050] Step 2: Set the distance between the scintillator 12 under test and the standard scintillator 9 and the radiation source 1 to be the same, and make both of them work in the linear emission region.

[0051] Step 3: Turn on radiation source 1 to generate pulsed rays that excite the scintillator 12 under test and the standard scintillator 9 to emit light, generating a standard visible light signal and a visible light signal under test. The visible light signal under test is split by beam splitter 2 to form a first light signal under test and a second light signal under test. After the standard visible light signal and the first light signal under test are converted into corresponding electrical signals, they are converted into corresponding waveforms by oscilloscope 5 and the maximum value is normalized to obtain the standard normalized waveform and the first normalized waveform under test. At the same time, the trigger signal emitted by radiation source 1 triggers the pulse signal generator 8 to work, so that the pulse signal generator 8 emits a pulse signal to trigger the ICCD camera 7 to work. The ICCD camera 7 obtains the spectral information of the second light signal under test through the spectrometer 6, and the ICCD camera 7 simultaneously outputs a shutter signal to the oscilloscope 5.

[0052] Step 4: The oscilloscope 5, combining the first normalized waveform under test and the shutter information sent by the ICCD camera 7, determines whether the shutter signal completely covers the first normalized waveform under test in time. If so, it indicates that the first and second light signals under test are synchronized in time, and step 5 is executed; otherwise, the shutter width and delay information of the ICCD camera 7 are adjusted according to the determination result until the shutter signal of the ICCD camera 7 completely covers the first normalized waveform under test in time. In this embodiment, when adjusting the shutter width of the ICCD camera 7, the shutter width of the ICCD camera 7 is twice the visible light signal emitted by the scintillator 12 under test in time.

[0053] Step 5: Gradually decrease the distance between the scintillator 12 under test and the radiation source 1 in preset steps of 50cm until the first normalized waveform under test changes compared to the standard normalized waveform. Since the first normalized waveform under test and the standard normalized waveform have the same waveform in the linear region, when the first normalized waveform under test changes compared to the standard normalized waveform, it indicates that the scintillator 12 under test is operating in the nonlinear emission region. The spectral information of the second light signal under test acquired by the ICCD camera 7 at the current moment is the emission spectrum of the nonlinear pulse radiation of the scintillator 12 under test, thus completing the measurement.

[0054] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the present invention.

Claims

1. A system for measuring the emission spectrum of nonlinear luminescence from pulsed scintillator radiation, characterized in that: It includes a radiation source (1), a beam splitter (2), a first photoelectric converter, an oscilloscope (5), a spectrometer (6), an ICCD camera (7), a pulse signal generator (8), a standard scintillator (9), and a second photoelectric converter; The radiation source (1) is used to generate pulsed rays and trigger signals; The standard scintillator (9) and the scintillator under test (12) are the same scintillator and are both located within the radiation range of the radiation source (1). The pulse rays emitted by the radiation source (1) excite the standard scintillator (9) and the scintillator under test (12) to emit light, thereby generating a standard visible light signal and a visible light signal under test. The distance between the standard scintillator (9) and the radiation source (1) allows the standard scintillator (9) to operate in the linear emission region, while the scintillator under test (12) is movable relative to the radiation source (1). The first photoelectric converter is located on the optical path of the standard visible light signal and is used to convert the standard visible light signal into a corresponding electrical signal; the beam splitter (2) is located on the optical path of the visible light signal to be tested and is used to split the visible light signal to be tested into two paths, which are respectively denoted as the first light signal to be tested and the second light signal to be tested; the second photoelectric converter is located on the optical path of the first light signal to be tested and is used to convert the first light signal to be tested into a corresponding electrical signal; the spectrometer (6) and the ICCD camera (7) are located on the optical path of the second light signal to be tested in sequence. The spectrometer (6) is used to split the second light signal to be tested according to the wavelength, and the ICCD camera (7) is used to image the spectrum after splitting. The input terminal of the pulse signal generator (8) is connected to the output terminal of the radiation source (1) and is used to trigger the pulse signal generator (8) to work and generate a pulse signal through the trigger signal; the output terminal of the pulse signal generator (8) is connected to the input terminal of the ICCD camera (7) and is used to trigger the ICCD camera (7) to work through the pulse signal. The input terminals of the oscilloscope (5) are respectively connected to the output terminals of the first photoelectric converter, the second photoelectric converter, and the ICCD camera (7). It is used to convert the electrical signals corresponding to the standard visible light signal and the first light signal to be tested into corresponding waveforms and perform maximum value normalization processing to obtain the standard normalized waveform and the first normalized waveform to be tested. The first normalized waveform to be tested and the standard normalized waveform are compared in real time. The working area of ​​the scintillator (12) to be tested is determined according to the comparison result. The time synchronization of the first light signal to be tested and the second light signal to be tested is achieved by combining the first normalized waveform to be tested and the shutter information sent by the ICCD camera (7).

2. The emission spectrum measurement system for nonlinear luminescence of scintillator pulse radiation according to claim 1, characterized in that: The distance between the standard scintillator (9) and the radiation source (1) is greater than 5m; The distance between the scintillator (12) under test and the radiation source (1) is adjusted between 0.1m and 6m.

3. The emission spectrum measurement system for nonlinear luminescence of scintillator pulse radiation according to claim 2, characterized in that: The first photoelectric converter includes a first phototube (10) and a first high-voltage power supply (11). The first phototube (10) is located in the optical path of the standard visible light signal, and the first high-voltage power supply (11) is used to provide high voltage to the first phototube (10). The second photoelectric converter includes a second phototube (3) and a second high-voltage power supply (4). The second phototube (3) is located in the optical path of the first optical signal to be measured, and the second high-voltage power supply (4) is used to provide high voltage to the second phototube (3). The output terminals of the first phototube (10) and the second phototube (3) are respectively connected to the input terminal of the oscilloscope (5) via coaxial cables.

4. The emission spectrum measurement system for nonlinear luminescence of scintillator pulse radiation according to claim 3, characterized in that: The beam splitter (2) is placed close to the scintillator (12) to be tested.

5. The emission spectrum measurement system for nonlinear luminescence of scintillator pulse radiation according to claim 4, characterized in that: The beam splitter (2) has a transmittance of more than 80% for visible light.

6. The emission spectrum measurement system for nonlinear luminescence of scintillator pulse radiation according to claim 1, characterized in that: The working wavelength of the spectrometer (6) is between 200nm and 900nm.

7. The emission spectrum measurement system for nonlinear luminescence of scintillator pulse radiation according to claim 6, characterized in that: The ICCD camera (7) has a shutter width range of 1ns to 10s, a gain voltage range of 0 to 5V, and a pixel array of B×C, where the value of B ranges from 1280 to 2048 and the value of C ranges from 1280 to 2048.

8. A method for measuring the emission spectrum of nonlinear luminescence from pulsed radiation of a scintillator, characterized in that, Includes the following steps: Step 1: Construct an emission spectrum measurement system for nonlinear luminescence of pulsed radiation from a scintillator as described in any of claims 1-7; Step 2: Set the distance between the scintillator under test (12) and the standard scintillator (9) and the radiation source (1) to be the same, and make both of them work in the linear emission region; Step 3: Turn on the radiation source (1) to generate pulse rays to excite the scintillator under test (12) and the standard scintillator (9) to emit light, generating a standard visible light signal and a visible light signal under test; the visible light signal under test is split by the beam splitter (2) to form a first light signal under test and a second light signal under test; after the standard visible light signal and the first light signal under test are converted into corresponding electrical signals, the oscilloscope (5) converts them into corresponding waveforms and performs maximum value normalization processing to obtain a standard normalized waveform and a first normalized waveform under test; at the same time, the trigger signal emitted by the radiation source (1) triggers the pulse signal generator (8) to work, so that the pulse signal generator (8) emits a pulse signal to trigger the ICCD camera (7) to work; the ICCD camera (7) obtains the spectral information of the second light signal under test through the spectrometer (6), and the ICCD camera (7) simultaneously outputs a shutter signal to the oscilloscope (5); Step 4: The oscilloscope (5) combines the first normalized waveform to be tested and the shutter information sent by the ICCD camera (7) to determine whether the shutter signal completely covers the first normalized waveform to be tested in time. If so, it indicates that the first light signal to be tested and the second light signal to be tested are synchronized in time, and step 5 is executed; otherwise, the shutter width and delay information of the ICCD camera (7) are adjusted according to the judgment result until the shutter signal of the ICCD camera (7) completely covers the first normalized waveform to be tested in time. Step 5: Using a preset distance as the step value, gradually decrease the distance between the scintillator (12) under test and the radiation source (1) until the first normalized waveform under test changes compared with the standard normalized waveform, indicating that the scintillator (12) under test is working in the nonlinear emission region at this time. The spectral information of the second light signal under test acquired by the ICCD camera (7) at the current moment is the emission spectrum of the nonlinear emission of the pulse radiation of the scintillator (12) under test, and the measurement is completed.

9. The emission spectrum measurement method for nonlinear luminescence of scintillator pulse radiation according to claim 8, characterized in that: Step 1 also includes setting the gain voltage of the ICCD camera (7); In step 4, when adjusting the shutter width of the ICCD camera (7), the shutter width of the ICCD camera (7) is twice the visible light signal emitted by the scintillator (12) under test in time.

10. The emission spectrum measurement method for nonlinear luminescence of scintillator pulse radiation according to claim 9, characterized in that: In step 5, the preset distance is 50cm.

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