Three-dimensional scanning method and related apparatus
Patent Information
- Application Number
- CN202610645220.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-11
- Publication Date
- 2026-08-18
AI Technical Summary
然而,当被测对象存在多种不同材质区域时,扫描前预先设置的探测参数难以适配整个扫描过程中的不同材质扫描需求,往往需要中断扫描并重新设置探测参数
Smart Images

Figure CN122601796A_ABST
Abstract
Description
Technical Field
[0001] The embodiments described in this application relate to the field of three-dimensional reconstruction technology, and in particular to a three-dimensional scanning method and related apparatus. Background Technology
[0002] In the field of 3D scanning, it is usually necessary to pre-set the measurement configuration of the scanning equipment before scanning, such as camera exposure time, laser power, and other detection parameters, and then scan the object to be measured to generate point cloud data. However, when the object to be measured has multiple regions with different materials, the detection parameters set before scanning are difficult to adapt to the different material scanning needs throughout the scanning process, often requiring the scanning to be interrupted and the detection parameters to be reset.
[0003] It is evident that the existing technology still suffers from low efficiency in 3D scanning. Summary of the Invention
[0004] In view of this, various embodiments of this application aim to provide a three-dimensional scanning method and related apparatus, which can improve the efficiency of three-dimensional scanning to a certain extent.
[0005] In a first aspect, one embodiment of this application provides a three-dimensional scanning method, the method comprising: during the process of a scanning device scanning a test object to generate point cloud data, dynamically adjusting the detection parameters of the scanning device based on a preset parameter adjustment strategy; wherein the detection parameters include at least one of laser optical projection power, camera exposure time, camera gain coefficient, and laser optical projection mode.
[0006] Optionally, based on a preset parameter adjustment strategy, the detection parameters of the scanning device are dynamically adjusted, including: during the process of the scanning device scanning and generating point cloud data, switching cyclically between multiple preset detection parameter combinations; wherein the multiple preset detection parameter combinations are respectively for different materials.
[0007] Optionally, the different materials include ordinary materials, reflective metal materials, and highly light-absorbing composite materials; wherein, the laser optical projection power in the detection parameter combination for the reflective metal material is lower than the laser optical projection power in the detection parameter combination for the ordinary material; and the laser optical projection power and camera exposure time in the detection parameter combination for the highly light-absorbing composite material are higher than the laser optical projection power and camera exposure time in the detection parameter combination for the ordinary material.
[0008] Optionally, the detection parameters of the scanning device can be dynamically adjusted based on a preset parameter adjustment strategy, including: dynamically adjusting the detection parameters based on the analysis results of the images acquired by the scanning device.
[0009] Optionally, based on the analysis results of the images acquired by the scanning device, the detection parameters are dynamically adjusted, including: analyzing the images to extract at least two different image feature quantification indicators; and coordinating the adjustment of the detection parameters of the scanning device according to the specified parameter adjustment rules corresponding to the at least two different image feature quantification indicators.
[0010] Optionally, the image feature quantization index includes at least one of the following: overall image grayscale value, image feature sharpness, and image noise value; the detection parameters of the scanning device are coordinated and adjusted according to specified parameter adjustment rules corresponding to the at least two different image feature quantization indices, including: determining the camera exposure time adjustment value of the scanning device based on the overall image grayscale value and a first mapping relationship; wherein the first mapping relationship includes a corresponding image grayscale value range and a camera exposure time adjustment value; determining the laser optical projection power adjustment value of the scanning device based on the image feature sharpness and a second mapping relationship; wherein the second mapping relationship includes a corresponding image sharpness range and a laser optical projection power adjustment value; and determining the camera gain coefficient adjustment value of the scanning device based on the image noise value and a third mapping relationship; wherein the third mapping relationship includes a corresponding image noise value range and a camera gain coefficient adjustment value.
[0011] Optionally, the first mapping relationship is: the higher the overall grayscale value of the image, the shorter the exposure time is adjusted by the corresponding camera exposure time adjustment value; the second mapping relationship is: the lower the feature sharpness of the image, the higher the projection power is adjusted by the corresponding laser optical projection power adjustment value; and the third mapping relationship is: the lower the noise value of the image, the higher the camera gain coefficient is adjusted by the corresponding camera gain coefficient adjustment value.
[0012] Optionally, based on a preset parameter adjustment strategy, the detection parameters of the scanning device are dynamically adjusted, including: determining the scanning area information of the scanning device relative to the object under test during the scanning process of generating point cloud data; wherein the scanning area information is used to characterize the scanned area on the surface of the object under test; and invoking preset detection parameter configuration information associated with the scanning area information; wherein the preset detection parameter configuration information includes detection parameters configured based on the material distribution of the object under test in the scanned area.
[0013] Secondly, one embodiment of this application provides a three-dimensional scanning device, including: an adjustment module, used to dynamically adjust the detection parameters of the scanning device based on a preset parameter adjustment strategy during the process of the scanning device scanning the object to be measured to generate point cloud data; wherein the detection parameters include at least one of laser optical projection power, camera exposure time, camera gain coefficient and laser optical projection mode.
[0014] Thirdly, one embodiment of this application also provides an electronic device, the electronic device including a memory and a processor, the memory storing at least one computer program, the at least one computer program being loaded and executed by the processor to implement the method as described above.
[0015] Fourthly, one embodiment of this application also provides a computer-readable storage medium storing at least one computer program that, when executed by a processor, can implement the method described above.
[0016] Fifthly, one embodiment of this application also provides a computer program product for implementing the method as described above.
[0017] In the various embodiments provided in this application, multiple embodiments dynamically adjust the detection parameters of the scanning device based on a preset parameter adjustment strategy during the process of scanning the object under test to generate point cloud data, thereby achieving adaptive adjustment of the detection parameters during the scanning process and improving the efficiency of three-dimensional scanning. Attached Figure Description
[0018] Figure 1 A schematic diagram of a three-dimensional reconstruction system provided in one embodiment of this application.
[0019] Figure 2 A schematic diagram of the operation of a three-dimensional reconstruction system provided in one embodiment of this application.
[0020] Figure 3 A schematic diagram of a three-dimensional scanning device provided for one embodiment of this application.
[0021] Figure 4 A schematic diagram of an electronic device provided according to one embodiment of this application. Detailed Implementation
[0022] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments.
[0023] In the description of the embodiments of this application, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, features defined with "first" and "second" may explicitly or implicitly include one or more of the stated features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly specified.
[0024] In the field of 3D scanning, it is typically necessary to pre-set the measurement configuration of the scanning equipment before scanning, such as camera exposure time and laser power, and then control the scanning equipment to scan the object to be measured to generate point cloud data. This method can, to a certain extent, complete the 3D scanning of the object.
[0025] However, in practical applications, the object being measured often does not consist of a single material region, but rather may contain multiple regions of different materials at different locations. Because different material regions have varying requirements for the adaptation of scanning equipment's detection parameters, a pre-set set of detection parameters is usually insufficient to consistently meet the scanning needs of different material regions throughout the entire scanning process. Thus, during scanning, when the scanning equipment encounters a material region that does not match the current detection parameters, the scanning process often needs to be interrupted, the corresponding detection parameters reset, and subsequent scanning resumed. This results in poor continuity of the scanning process and low scanning efficiency.
[0026] It is evident that the related technologies still suffer from low efficiency in 3D scanning.
[0027] Please see Figure 1 and Figure 2 In various embodiments of this application, the 3D reconstruction system may include a variety of electronic devices. Specifically, the 3D reconstruction system may include a tracker and a scanning device. Both the tracker and the scanning device may integrate computing chips and memory, enabling them to possess certain data processing capabilities. In some embodiments, the electronic devices of the 3D reconstruction system may further include a host computer, which can receive data provided by the tracker and the scanning device and perform data processing. The host computer may be a desktop computer, laptop computer, tablet computer, workstation, or server, etc. In some embodiments, the 3D reconstruction system may not include a tracker, and the scanning device may be a handheld scanner.
[0028] Scanning devices can include, but are not limited to, optical scanning devices. Optical scanning devices can include, but are not limited to, structured light scanners, laser scanners, and light pens. For example, a laser scanner can measure the distance to an object's surface by emitting a laser beam and detecting changes in the laser's reflection time or phase, thus generating high-precision scan data. Specifically, this scan data can be three-dimensional point cloud data. A structured light scanner can project a structured light pattern (such as stripes or a dot matrix) onto an object's surface and generate scan data by detecting the light reflected from the object's surface.
[0029] This application does not specify the particular type or principle of the scanning device.
[0030] The scanning device possesses tracking features, which can serve as positioning features for the device. Multiple tracking features can be deployed at various locations on the scanning device, allowing for tracking of the device's spatial pose. In some embodiments, the tracking features may include, but are not limited to, marker points, coded points, stereo targets, geometric features of objects, and other features that can be acquired and identified by the tracker. The marker points can be reflective, in which case the tracker emits light and receives the reflected light. In some embodiments, the marker points can be luminescent, in which case the tracker can directly receive the light emitted by the marker points.
[0031] A tracker can be used based on stereo vision tracking principles to output tracking information corresponding to the position and orientation of a scanning device in space. This tracking information can be used to determine pose information representing the spatial orientation of the scanning device. Each tracker includes a camera. The number of cameras in a tracker can be one or more. Preferably, the tracker is a binocular tracker or a multi-view tracker. The number of cameras in different trackers can be the same or different. The tracker can form tracking information from images captured by the cameras. Specifically, the camera can continuously capture multiple image frames, with small time intervals between the multiple image frames, resulting in corresponding differences between the multiple image frames as the scanning device moves in space. The tracking information can include frame information. Each frame information can include image frames captured by multiple cameras of the corresponding tracker at the same time. It can be understood that each frame information can include at least one image frame.
[0032] The 3D scanning method can be applied to the aforementioned 3D reconstruction system. Specifically, it can be applied to one or more electronic devices within the system. Those skilled in the art can deploy the electronic devices that execute the 3D scanning method according to the specific circumstances.
[0033] This application provides a three-dimensional scanning method. The three-dimensional scanning method may include: dynamically adjusting the detection parameters of the scanning device based on a preset parameter adjustment strategy during the process of scanning the object to be measured by the scanning device to generate point cloud data.
[0034] In this embodiment, the 3D scanning method can be applied to an electronic device. The electronic device can be one or more devices in a 3D reconstruction system. Specifically, the electronic device can be the scanning device itself, or a data processing device, such as a host computer, that is communicatively connected to the scanning device and used to control the scanning process. The scanning device can be used to scan the object under test to obtain scanning data of the object's surface. The scanning data can include point cloud data. Point cloud data can be understood as a data set of multiple point data used to characterize the spatial morphology of the object's surface, wherein each point data can include spatial coordinate information. In some embodiments, the point data can also include intensity information, color information, or other attribute information related to the acquisition process. Thus, the electronic device can control the working state of the scanning device during the scanning process, thereby improving the continuity and efficiency of the 3D scanning process.
[0035] In this embodiment, the electronic device can dynamically adjust the detection parameters of the scanning device based on a preset parameter adjustment strategy during the process of the scanning device scanning the object under test to generate point cloud data. This can be understood as the detection parameters being parameters that affect the scanning device's detection and data acquisition effects on the object under test. For example, the detection parameters may include at least one of the following: camera exposure time, laser optical projection power, camera gain coefficient, and laser optical projection mode. The camera exposure time characterizes the duration for which the camera in the scanning device receives light signals during a single image acquisition process, and this exposure time affects the brightness of the acquired image. The laser optical projection power characterizes the light energy output intensity of the laser in the scanning device when projecting optically onto the object under test, and this power affects the light intensity received by the object's surface and the strength of the returned light signal. The camera gain coefficient characterizes the gain of the camera in the scanning device in amplifying the acquired signal, and this gain coefficient affects the image signal enhancement effect. The laser optical projection mode characterizes the projection method used by the laser in the scanning device when projecting optically onto the surface of the object under test. The laser optical projection mode can include, for example, a single-line projection mode or a multi-line projection mode, and different laser optical projection modes can correspond to different optical projection distribution states. In this application, the specific type of the detection parameters is not limited; any parameter related to the point cloud data generated by the scanning device can be used as the detection parameters. The parameter adjustment strategy can be understood as a pre-set parameter control rule used to instruct the electronic device to adjust the detection parameters in a specified manner during the scanning process. In this way, the electronic device does not only set the detection parameters once before the scan begins, but can dynamically adjust the detection parameters during the scan according to the preset parameter adjustment strategy.
[0036] In this embodiment, the electronic device can control the scanning device to perform continuous scanning of the object under test. The object under test can include various material regions in a real-world scenario. For example, different locations on the same object can include regions of ordinary material, reflective material, or light-absorbing material. Since different material regions typically have different requirements for the adaptation of detection parameters, if only a fixed set of detection parameters is set before scanning begins, a mismatch between the current detection parameters and the material region may occur when the scanning device scans different material regions. For example, the signal acquired in a local area may be too strong or too weak, or the scanning features may be unclear, thus affecting the generation of point cloud data. Therefore, the electronic device can dynamically adjust the detection parameters according to a preset parameter adjustment strategy during the continuous scanning and point cloud data generation process, ensuring that the detection parameters maintain a good adaptation relationship with the current scanning requirements during the scanning process.
[0037] In this embodiment, the dynamic adjustment can be understood as changing the detection parameters at different stages of the scanning task performed by the scanning device, rather than keeping the same set of detection parameters unchanged throughout the entire scanning task. Specifically, the electronic device can update the detection parameters while the scanning device continuously outputs scanning data, and apply the updated detection parameters to subsequent scanning processes. Thus, adaptive adjustment of the detection parameters can be achieved without interrupting the current scanning task of the scanning device. The parameter adjustment strategy can be pre-stored in the memory of the electronic device and executed by the computing chip during the scanning process. In some embodiments, the parameter adjustment strategy may include strategy information for indicating the detection parameter switching method, adjustment rules, or invocation logic. This application does not limit the specific implementation method of the parameter adjustment strategy.
[0038] For example, an electronic device can control a scanning device to continuously scan a target object to generate point cloud data of the target object. At the start of the scan, the scanning device can scan the initial region of the target object according to initial detection parameters. As the scan continues, the electronic device can invoke a preset parameter adjustment strategy to dynamically adjust the detection parameters of the scanning device, so that the adjusted detection parameters are used for scanning subsequent regions. Thus, even if different regions of the target object have different requirements for the detection parameters of the scanning device, the electronic device can still adjust the detection parameters during the scan without pausing the scanning device and manually resetting them, thereby ensuring continuous execution of the scanning process.
[0039] As can be seen from the above embodiments, in the multiple embodiments of this application, the electronic device dynamically adjusts the detection parameters of the scanning device based on a preset parameter adjustment strategy during the scanning process of the scanning device to generate point cloud data, thereby realizing adaptive adjustment of the detection parameters during the scanning process and improving the efficiency of three-dimensional scanning.
[0040] In some implementations, the electronic device can cyclically switch between multiple preset combinations of detection parameters during the scanning process of the scanning device to generate point cloud data; wherein the multiple preset combinations of detection parameters are respectively for different materials.
[0041] In this embodiment, the electronic device can pre-store multiple sets of detection parameter combinations and, during the continuous scanning of the object under test by the scanning device, cyclically switch between these multiple sets of detection parameter combinations according to a preset switching order, so that different time periods of the scanning process correspond to different detection parameter combinations. In this way, without pausing the scanning process, the scanning device can sequentially use multiple different detection parameter combinations to perform scanning while generating point cloud data.
[0042] In this embodiment, the detection parameter combination can be understood as a set of parameter configurations consisting of multiple detection parameters, used to jointly characterize the detection configuration of the scanning device in a certain scanning state. Specifically, a set of detection parameter combinations may include at least two or more parameters among camera exposure time, laser optical projection power, camera gain coefficient, and laser optical projection mode. In this application, there is no limitation on which specific detection parameters are included in each set of detection parameter combinations; any parameter that can be used to characterize the detection configuration of the scanning device under the corresponding scanning conditions can be used as the detection parameter combination. The multiple preset detection parameter combinations are designed for different materials, meaning that different detection parameter combinations are used to adapt to the scanning requirements corresponding to different materials. Thus, for different material regions that may exist on the surface of the object being measured, different detection parameter combinations can be preset so that different material regions can correspond to a more suitable detection parameter configuration during the scanning process.
[0043] In this embodiment, the electronic device can predetermine multiple sets of detection parameter combinations for different materials based on experimental test results, empirical parameters, or historical scanning data, and store these multiple sets of detection parameter combinations as strategy content in the parameter adjustment strategy. During the scanning process where the scanning device scans the object under test and continuously generates point cloud data, the electronic device can control the scanning device to repeatedly switch between the multiple sets of detection parameter combinations in a preset order. For example, the electronic device can switch in the order of a first detection parameter combination, a second detection parameter combination, and a third detection parameter combination, and after switching to the third detection parameter combination, switch back to the first detection parameter combination to continue the subsequent cycle. The cyclic switching can be a periodic switching performed in chronological order, or it can be switched according to a specified acquisition cycle during the scanning process; this application does not specifically limit this.
[0044] In this embodiment, since the object under test may include various material regions in practical applications, and different material regions typically have different requirements for the adaptation of detection parameters, if only a single set of detection parameters is used for continuous scanning, a mismatch between the current detection parameters and the material region may easily occur when the scanning device scans certain material regions. By cyclically switching between multiple sets of detection parameter combinations specifically for different materials, the scanning device can periodically adopt detection parameter configurations corresponding to the scanning requirements of different materials during continuous scanning. In this way, even if the electronic device does not individually identify the current material at every moment during the scanning process, it can still provide different material regions with scanning opportunities for the corresponding detection parameter combinations during the scanning process through cyclic switching, thereby improving the scanning adaptability to multi-material objects under test.
[0045] In some embodiments, the different materials include ordinary materials, reflective metal materials, and highly light-absorbing composite materials; wherein, the laser optical projection power in the detection parameter combination for the reflective metal material is lower than the laser optical projection power in the detection parameter combination for the ordinary material; and the laser optical projection power and camera exposure time in the detection parameter combination for the highly light-absorbing composite material are higher than the laser optical projection power and camera exposure time in the detection parameter combination for the ordinary material.
[0046] In this embodiment, when the electronic device cycles through multiple preset combinations of detection parameters to target different materials, these different materials can include ordinary materials, reflective metallic materials, and highly light-absorbing composite materials. Specifically, ordinary materials can be understood as materials that do not have significant strong reflective or light-absorbing properties; reflective metallic materials can be understood as materials that have strong reflective ability to the optical projection emitted by the scanning device; and highly light-absorbing composite materials can be understood as materials that have strong absorption ability to the optical projection emitted by the scanning device, resulting in a relatively weak returned light signal. Thus, the electronic device can use ordinary materials as reference materials in conventional scanning scenarios and configure corresponding detection parameter combinations for reflective metallic materials and highly light-absorbing composite materials respectively, in order to improve scanning adaptability under different material conditions. Further details on ordinary materials, reflective metallic materials, and highly light-absorbing composite materials can be found in Table 1 below.
[0047] Table 1. Introduction to Common Materials, Reflective Metallic Materials, and Highly Light-Absorbing Composite Materials The higher the reflectivity value, the better the material's reflective ability. The higher the roughness value, the rougher the material's surface.
[0048] In this embodiment, the laser optical projection power in the detection parameter combination for the reflective metal material is lower than the laser optical projection power in the detection parameter combination for the ordinary material. This can be understood as the laser optical projection power characterizing the energy intensity of the optical projection emitted by the scanning device during scanning. When the surface of the object being measured is a reflective metal material, because this type of material has a strong reflective ability to incident light, if the laser optical projection power set for ordinary materials is still used, it is easy to cause the reflected light signal to be too strong, resulting in local overbrightness, feature area saturation, or distortion of the acquisition results. Therefore, the electronic device can reduce the laser optical projection power when setting the detection parameter combination for reflective metal materials, so that the light energy projected onto the surface of the reflective metal material is relatively reduced. In this way, the scanning effect of the scanning device on the area can be avoided to a certain extent due to excessively strong reflected signals.
[0049] In this embodiment, the laser optical projection power and camera exposure time in the detection parameter combination for the strongly light-absorbing composite material are higher than those in the detection parameter combination for ordinary materials. This can be understood as the camera exposure time characterizing the duration for which the camera in the scanning device receives light signals during a single image acquisition. When the surface of the object being measured is a strongly light-absorbing composite material, the light signal returned to the scanning device is typically weak due to the material's strong absorption capacity for incident light. If the laser optical projection power and camera exposure time set for ordinary materials are still used, the acquired signal in that area will easily be weak, the image will be dark, and this will affect the subsequent generation of point cloud data. Therefore, when setting the detection parameter combination for the strongly light-absorbing composite material, the electronic device can increase the laser optical projection power and extend the camera exposure time to enhance the light energy projected onto that area and increase the time for the camera to receive the returned light signal. This allows the scanning device to obtain a more sufficient optical signal when scanning the area of the strongly light-absorbing composite material, which is beneficial for improving the scanning quality of that area.
[0050] In this embodiment, the detection parameter combinations corresponding to ordinary materials can serve as a reference basis for determining the differences in parameter configurations for different materials. The electronic device can set detection parameter combinations for ordinary materials, reflective metal materials, and strongly light-absorbing composite materials based on the reflection and absorption characteristics of different materials for optical projection. Thus, for reflective metal materials, excessive reflection can be suppressed by reducing the laser's optical projection power; for strongly light-absorbing composite materials, insufficient signal can be compensated by increasing the laser's optical projection power and extending the camera's exposure time. This results in a parameter configuration relationship between the detection parameter combinations corresponding to different materials that is adapted to the material's optical properties.
[0051] For example, the first combination of detection parameters is suitable for ordinary materials (see Table 1 below), the second combination of detection parameters is suitable for reflective metal materials (see Table 2 below), and the third combination of detection parameters is suitable for strongly light-absorbing composite materials (see Table 3 below).
[0052] Table 2 First Detection Parameter Combination Table 3 Second Detection Parameter Combinations Table 4 Third Detection Parameter Combinations In some implementations, the electronic device can dynamically adjust the detection parameters based on the analysis results of the images acquired by the scanning device.
[0053] In this embodiment, the electronic device can dynamically adjust the detection parameters based on the analysis results of the images acquired by the scanning device. Specifically, during the scanning process of the object under test and the generation of point cloud data, the scanning device can simultaneously acquire images corresponding to the surface of the object under test. These images can be understood as image data obtained by the scanning device during the scanning process, used to characterize the imaging state of the current scanning area. Thus, the electronic device can analyze these images to obtain analysis results characterizing the current scanning state, and adjust the detection parameters based on these analysis results.
[0054] In this embodiment, the analysis result can be understood as the result obtained by the electronic device after processing the image, reflecting the current image performance status. For example, the analysis result can be used to characterize whether the current image is too bright, too dark, has unclear features, or has abnormal signal performance. Since the scanning device may correspond to different material conditions when scanning different areas of the object under test, the performance status of the images acquired by the scanning device at different scanning stages will usually differ. The electronic device dynamically adjusts the detection parameters based on the image analysis results. This can be understood as the electronic device not continuously scanning based solely on a pre-fixed single parameter configuration, but rather updating the detection parameters in a targeted manner based on the actual image performance acquired during the scanning process. In this way, the adjustment of the detection parameters can be made more closely aligned with the actual acquisition situation during the scanning process.
[0055] In this embodiment, the electronic device can analyze the images acquired by the scanning device while the scanning device continuously generates point cloud data, and control the scanning device to adjust the detection parameters after obtaining the analysis results. Specifically, the electronic device can determine whether the currently used detection parameters need to be adjusted based on the analysis results, and if adjustment is required, output parameter adjustment control information corresponding to the analysis results, so that the scanning device can continue to perform subsequent scanning according to the adjusted detection parameters. In this way, the detection parameters can be adaptively adjusted based on the real-time image performance during the scanning process without pausing the current scanning task, thereby avoiding the problem of insufficient adaptation to subsequent scanning areas caused by relying solely on preset parameters before scanning.
[0056] In this embodiment, the detection parameters are dynamically adjusted based on the analysis results of the images acquired by the scanning device. This adjustment can be made on a single detection parameter or by jointly adjusting multiple detection parameters. This application does not limit the specific type of detection parameters adjusted based on the analysis results. For example, the electronic device can adjust the camera exposure time, laser optical projection power, camera gain coefficient, or other detection parameters related to the point cloud data generated by the scanning device based on the analysis results. In this way, the electronic device can adaptively update the detection configuration of the scanning device according to the scanning state reflected in the current image, thereby improving the matching degree between the subsequent scanning process and the current scanning requirements.
[0057] In some implementations, the electronic device can analyze the image to extract at least two different image feature quantification metrics; and coordinately adjust the detection parameters of the scanning device according to specified parameter adjustment rules corresponding to the at least two different image feature quantification metrics.
[0058] In this embodiment, when the electronic device dynamically adjusts the detection parameters based on the analysis results of the images acquired by the scanning device, it can do so by analyzing the images to extract at least two different image feature quantification indicators, and then coordinating the adjustment of the scanning device's detection parameters according to the specified parameter adjustment rules corresponding to each of the at least two different image feature quantification indicators. Specifically, the electronic device can process the images acquired by the scanning device during the scanning process and extract at least two image feature quantification indicators from the images, each used to characterize different dimensions of image performance. Subsequently, the electronic device can determine the adjustment method for the scanning device's detection parameters according to the specified parameter adjustment rules corresponding to each of the different image feature quantification indicators, and coordinate the adjustment of the corresponding detection parameters. In this way, the electronic device can adjust the detection parameters more specifically by combining multiple dimensions of image performance, rather than adjusting them in isolation based on a single image performance.
[0059] In this embodiment, the image feature quantification index can be understood as an index value extracted by the electronic device from the image, used to quantify and characterize the current image state. Different image feature quantification indices can reflect the image's performance in different aspects. For example, the at least two different image feature quantification indices can be used to characterize the image's brightness state, feature performance state, noise performance state, or other states related to scan quality. In this application, the specific type of the image feature quantification index is not limited; any index that can be used to quantify and characterize a certain type of image performance feature can be used as the image feature quantification index.
[0060] In this embodiment, the specified parameter adjustment rule can be understood as a pre-set rule used to establish the correspondence between image feature quantization indicators and detection parameter adjustment methods. Specifically, different image feature quantization indicators can correspond to different specified parameter adjustment rules, which are used to instruct the electronic device how to adjust the corresponding detection parameters when the image feature quantization indicators are in different states. In this way, the electronic device can call the corresponding specified parameter adjustment rules according to the extracted different image feature quantization indicators, thereby determining the detection parameter adjustment information corresponding to each image feature quantization indicator.
[0061] In this embodiment, the electronic device coordinates and adjusts the detection parameters of the scanning device according to the specified parameter adjustment rules corresponding to the at least two different image feature quantification indicators. This can be understood as the electronic device not adjusting the detection parameters independently and unrelatedly for each image feature quantification indicator, but rather comprehensively determining and jointly adjusting one or more detection parameters based on the adjustment needs corresponding to multiple image feature quantification indicators. Specifically, when different image feature quantification indicators correspond to different detection parameters, the electronic device can determine the adjustment method for each detection parameter separately and apply multiple adjustment results to the scanning device. When different image feature quantification indicators affect the same detection parameter, the electronic device can also coordinate different adjustment needs according to a preset coordination logic to determine the final result used to adjust the detection parameter.
[0062] In this embodiment, the electronic device can periodically or frame-by-frame analyze the acquired images during the continuous scanning and point cloud data generation process of the scanning device. This analysis extracts at least two different image feature quantification indicators and determines the adjustment result of the detection parameters according to corresponding specified parameter adjustment rules. After determining the adjustment result of the detection parameters, the electronic device can control the scanning device to continue subsequent scanning according to the adjusted detection parameters. In this way, the electronic device can dynamically update the detection parameters based on the image state information continuously acquired during the scanning process without interrupting the current scanning task, thereby improving the scanning device's adaptability to different scanning conditions.
[0063] In some embodiments, the image feature quantization index includes at least one of the following: overall image grayscale value, image feature sharpness, and image noise value; the electronic device can determine the camera exposure time adjustment value of the scanning device based on the overall image grayscale value and a first mapping relationship; wherein, the first mapping relationship includes a corresponding image grayscale value range and a camera exposure time adjustment value; based on the image feature sharpness and a second mapping relationship, the laser optical projection power adjustment value of the scanning device is determined; wherein, the second mapping relationship includes a corresponding image sharpness range and a laser optical projection power adjustment value; based on the image noise value and a third mapping relationship, the camera gain coefficient adjustment value of the scanning device is determined; wherein, the third mapping relationship includes a corresponding image noise value range and a camera gain coefficient adjustment value.
[0064] In this embodiment, the overall grayscale value of the image can be used to characterize the overall brightness of the image, the feature sharpness of the image can be used to characterize the recognizability of the scanning features in the image, and the noise value of the image can be used to characterize the noise intensity in the image. Thus, the electronic device can characterize the current image state from different dimensions and accordingly adjust different detection parameters.
[0065] In this embodiment, the electronic device can determine the camera exposure time adjustment value of the scanning device based on the overall grayscale value of the image and the first mapping relationship. The first mapping relationship can include a corresponding image grayscale value range and a camera exposure time adjustment value. This can be understood as the electronic device first determining the image grayscale value range in which the current overall grayscale value of the image lies, and then adjusting the camera exposure time according to the camera exposure time adjustment value corresponding to that grayscale value range. In this way, the camera exposure time can be adapted to the current image brightness state.
[0066] In this embodiment, the electronic device can also determine the laser optical projection power adjustment value of the scanning device based on the feature sharpness of the image and the second mapping relationship. The second mapping relationship can include a corresponding image sharpness range and a laser optical projection power adjustment value. Specifically, the electronic device can call the corresponding laser optical projection power adjustment value according to the image sharpness range in which the current image's feature sharpness falls, thereby adjusting the laser optical projection power. This allows the projection power to match the performance state of the current scanned features.
[0067] In this embodiment, the electronic device can also determine the camera gain coefficient adjustment value of the scanning device based on the noise value of the image and a third mapping relationship. The third mapping relationship can include a corresponding image noise value range and a camera gain coefficient adjustment value. Specifically, the electronic device can determine the image noise value range in which the noise value of the current image falls, and adjust the camera gain coefficient according to the corresponding camera gain coefficient adjustment value. This allows the camera gain coefficient to be aligned with the current image noise state.
[0068] In some implementations, the first mapping relationship is: the higher the overall grayscale value of the image, the shorter the exposure time is adjusted by the corresponding camera exposure time adjustment value; the second mapping relationship is: the lower the feature sharpness of the image, the higher the projection power is adjusted by the corresponding laser optical projection power adjustment value; and the third mapping relationship is: the lower the noise value of the image, the higher the camera gain coefficient is adjusted by the corresponding camera gain coefficient adjustment value.
[0069] In this embodiment, the first mapping relationship can be: the higher the overall grayscale value of the image, the shorter the exposure time should be due to the corresponding camera exposure time adjustment value. Specifically, when the electronic device determines that the overall grayscale value of the current image is at a high level, it can shorten the camera exposure time using the corresponding camera exposure time adjustment value; when the overall grayscale value of the image is at a low level, it can extend the camera exposure time using the corresponding camera exposure time adjustment value. In this way, the camera exposure time can be adapted to the overall brightness and darkness of the current image.
[0070] In this embodiment, the second mapping relationship can be: the lower the feature sharpness of the image, the higher the corresponding laser optical projection power adjustment value. This can be understood as follows: when the electronic device analyzes that the scanning features in the current image are not clear enough, the laser optical projection power can be increased to enhance the optical projection effect of the scanning device on the corresponding area; conversely, when the feature sharpness of the image is high, a lower projection power can be used. In this way, the laser optical projection power can be coordinated with the feature representation state in the current image.
[0071] In this embodiment, the third mapping relationship can be: the lower the noise value of the image, the higher the corresponding camera gain coefficient adjustment value becomes. Specifically, the electronic device can call the corresponding camera gain coefficient adjustment value based on the noise level of the current image to adjust the camera gain coefficient. In this way, a correspondence can be established between the adjustment of the camera gain coefficient and the noise state of the current image.
[0072] In this embodiment, the electronic device can determine the camera exposure time adjustment value, the laser optical projection power adjustment value, and the camera gain coefficient adjustment value based on the first mapping relationship, the second mapping relationship, and the third mapping relationship, respectively, and use the aforementioned adjustment values together to adjust the detection parameters of the scanning device. In this way, a correspondence can be pre-established between the overall grayscale value of the image, the feature sharpness of the image, and the noise value of the image and the adjustment direction of the corresponding detection parameters, enabling the electronic device to quickly determine the parameter adjustment result corresponding to the current image state during the scanning process.
[0073] For example, the first mapping relationship can be found in Table 4, the second mapping relationship in Table 5, and the third mapping relationship in Table 6.
[0074] Table 5 First Mapping Relationship Table 6 Second Mapping Relationship Table 7 Third Mapping Relationship In some implementations, the electronic device can determine the scanning area information relative to the object under test during the scanning process of generating point cloud data; wherein the scanning area information is used to characterize the scanned area on the surface of the object under test; and invoke preset detection parameter configuration information associated with the scanning area information; wherein the preset detection parameter configuration information includes detection parameters configured based on the material distribution of the object under test in the scanned area.
[0075] In this embodiment, when the electronic device dynamically adjusts the detection parameters of the scanning device based on a preset parameter adjustment strategy, it can also determine the scanning area information of the scanning device relative to the object under test during the scanning process of generating point cloud data, and call the preset detection parameter configuration information associated with the scanning area information. Specifically, during the continuous scanning of the object under test by the scanning device, the electronic device can determine the scanning area corresponding to the current scanning process on the surface of the object under test, and use the relevant information characterizing the scanning area as the scanning area information. In this way, the electronic device can call the detection parameters corresponding to the current scanning area based on the position range corresponding to that area.
[0076] In this embodiment, the scanning area information can be used to characterize the scanned area of the surface of the object under test. It can be understood that the scanning area information can be information used to indicate which area of the object under test the scanning device is currently scanning. For example, the scanning area information may include area number, area location, area range, or other information that can characterize the scanned area. In this application, the specific representation of the scanning area information is not limited; any method that can distinguish different scanned areas of the surface of the object under test can be used as the scanning area information.
[0077] In this embodiment, after determining the scanning area information, the electronic device can call up preset detection parameter configuration information associated with the scanning area information. The preset detection parameter configuration information can be understood as pre-established parameter configuration content, used to indicate the detection parameters used by the scanning device in the corresponding scanning area. The preset detection parameter configuration information includes detection parameters configured based on the material distribution of the object under test in the scanned area. That is, the electronic device can pre-configure corresponding detection parameters for different scanning areas according to the material distribution of different areas on the surface of the object under test, and establish an association between the scanning area information and the preset detection parameter configuration information. Thus, when the scanning device scans different areas, the electronic device can call up the preset detection parameter configuration information corresponding to the current scanning area, so that the detection parameters are adapted to the material distribution of that area.
[0078] In this embodiment, if the object under test has different material distributions in different areas of its surface, the electronic device can pre-set multiple preset detection parameter configurations for each area based on the material distribution before scanning begins. For example, for scanned areas with a high proportion of reflective metallic material, a lower laser optical projection power can be configured; for scanned areas with a high proportion of strongly light-absorbing composite material, a higher laser optical projection power and a longer camera exposure time can be configured. Subsequently, during the scanning process, the electronic device can switch and call the corresponding preset detection parameter configurations according to the determined scanning area information. In this way, the scanning device can use detection parameters corresponding to the material distribution of different areas without interrupting the scanning process and manually resetting them.
[0079] Please see Figure 3 This application provides a three-dimensional scanning device. The three-dimensional scanning device includes an adjustment module.
[0080] The adjustment module is used to dynamically adjust the detection parameters of the scanning device based on a preset parameter adjustment strategy during the process of the scanning device scanning the object under test to generate point cloud data.
[0081] The specific functions and effects achieved by the three-dimensional scanning device in this embodiment can be explained by referring to other embodiments of this application, and will not be repeated here.
[0082] This application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, causes the processor to implement the method as described above.
[0083] This application also provides a computer program product containing instructions that, when executed by a processor, implement the method as described above.
[0084] Please see Figure 4 Embodiments of this application may provide an electronic device, the electronic device comprising: a memory, and one or more processors communicatively connected to the memory; the memory storing instructions executable by the one or more processors, the instructions being executed by the one or more processors to cause the one or more processors to implement the method as described above.
[0085] In some embodiments, the electronic device may include a processor, a storage medium, and a communication interface connected to a system bus. The storage medium may store related computer programs.
[0086] It is understood that the specific examples in this document are only intended to help those skilled in the art better understand the embodiments of this application, and are not intended to limit the scope of the invention.
[0087] It is understood that in the various embodiments of this application, the sequence number of each process does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.
[0088] It is understood that the various implementation methods described in this application can be implemented individually or in combination, and the implementation methods in this application are not limited in this respect.
[0089] Unless otherwise stated, all technical and scientific terms used in the embodiments of this application have the same meaning as commonly understood by one of ordinary skill in the art. The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to limit the scope of this application. The term "and / or" as used in this application includes any and all combinations of one or more of the associated listed items. The singular forms "a," "the," and "the" as used in the embodiments of this application and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise.
[0090] It is understood that the processor in the embodiments of this application can be an integrated circuit chip with signal processing capabilities. During implementation, each step of the above method embodiments can be completed by the integrated logic circuits in the processor's hardware or by instructions in software form. The processor can be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. It can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of this application. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the methods disclosed in the embodiments of this application can be directly embodied in the execution of a hardware decoding processor, or executed by a combination of hardware and software modules in the decoding processor. The software modules can be located in random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, registers, or other mature storage media in the art. This storage medium is located in memory; the processor reads information from the memory and, in conjunction with its hardware, completes the steps of the above method.
[0091] It is understood that the memory in the embodiments of this application may be volatile memory or non-volatile memory, or may include both volatile and non-volatile memory. Specifically, non-volatile memory may be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. Volatile memory may be random access memory (RAM). It should be noted that the memory in the systems and methods described herein is intended to include, but is not limited to, these and any other suitable types of memory.
[0092] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.
[0093] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the aforementioned method implementations, and will not be repeated here.
[0094] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.
[0095] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment, depending on actual needs.
[0096] In addition, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.
[0097] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause an electronic device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.
[0098] The above description is merely a specific embodiment of this application, but the scope of protection of this invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this invention should be determined by the scope of the claims.
Claims
1. A three-dimensional scanning method, characterized in that, The method includes: During the process of scanning the object under test to generate point cloud data, the detection parameters of the scanning device are dynamically adjusted based on a preset parameter adjustment strategy. The detection parameters include at least one of the following: laser optical projection power, camera exposure time, camera gain coefficient, and laser optical projection mode.
2. The method according to claim 1, characterized in that, Based on a preset parameter adjustment strategy, the detection parameters of the scanning device are dynamically adjusted, including: During the process of scanning and generating point cloud data by the scanning device, multiple preset combinations of detection parameters are cyclically switched; each of the multiple preset combinations of detection parameters is designed for a different material.
3. The method according to claim 2, characterized in that, The different materials include ordinary materials, reflective metal materials, and highly light-absorbing composite materials; Specifically, the laser optical projection power in the detection parameter combination for the reflective metal material is lower than the laser optical projection power in the detection parameter combination for the ordinary material; the laser optical projection power and camera exposure time in the detection parameter combination for the strongly light-absorbing composite material are higher than the laser optical projection power and camera exposure time in the detection parameter combination for the ordinary material.
4. The method according to claim 1, characterized in that, Based on a preset parameter adjustment strategy, the detection parameters of the scanning device are dynamically adjusted, including: The detection parameters are dynamically adjusted based on the analysis results of the images acquired by the scanning device.
5. The method according to claim 4, characterized in that, Based on the analysis results of the images acquired by the scanning device, the detection parameters are dynamically adjusted, including: The image is analyzed to extract at least two different image feature quantification metrics; The detection parameters of the scanning device are adjusted in a coordinated manner according to the specified parameter adjustment rules corresponding to the at least two different image feature quantification indices.
6. The method according to claim 5, characterized in that, The image feature quantification index includes at least one of the following: overall image grayscale value, image feature sharpness, and image noise value; According to the specified parameter adjustment rules corresponding to the at least two different image feature quantization indices, the detection parameters of the scanning device are coordinated and adjusted, including: Based on the overall grayscale value of the image and the first mapping relationship, the camera exposure time adjustment value of the scanning device is determined; wherein, the first mapping relationship includes the corresponding image grayscale value range and the camera exposure time adjustment value; Based on the image's feature sharpness and a second mapping relationship, the laser optical projection power adjustment value of the scanning device is determined; wherein, the second mapping relationship includes a corresponding image sharpness range and a laser optical projection power adjustment value; Based on the noise value of the image and the third mapping relationship, the camera gain coefficient adjustment value of the scanning device is determined; wherein, the third mapping relationship includes the corresponding image noise value range and the camera gain coefficient adjustment value.
7. The method according to claim 6, characterized in that, The first mapping relationship is: the higher the overall grayscale value of the image, the shorter the exposure time is due to the corresponding camera exposure time adjustment value; The second mapping relationship is: the lower the feature sharpness of the image, the higher the corresponding laser optical projection power adjustment value is to make the projection power higher; The third mapping relationship is: the lower the noise value of the image, the higher the corresponding camera gain coefficient adjustment value is.
8. The method according to claim 1, characterized in that, Based on a preset parameter adjustment strategy, the detection parameters of the scanning device are dynamically adjusted, including: Determine the scanning area information relative to the object under test during the scanning process of the scanning device generating point cloud data; wherein, the scanning area information is used to characterize the scanned area on the surface of the object under test; Invoke preset detection parameter configuration information associated with the scanned area information; wherein, the preset detection parameter configuration information includes detection parameters configured based on the material distribution of the object under test in the scanned area.
9. An electronic device, characterized in that, The electronic device includes a memory and a processor, wherein the memory stores at least one computer program, which is loaded and executed by the processor to implement the method as described in any one of claims 1 to 8.
10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores at least one computer program, which, when executed by a processor, is capable of implementing the method as described in any one of claims 1 to 8.
11. A computer program product, characterized in that, The computer program product is used to implement the method as described in any one of claims 1 to 8.