Sample holder and measuring device

Abstract

Provided is a technique capable of more appropriately performing fixation of a sample holder that is supposed to be rotated on a sample stage. According to an aspect of the present invention, a sample holder for measurement by radiation is provided. The sample holder has a base portion and a holding portion. The base portion is configured to be rotated about a rotation axis and has a first face and a second face. The first face is connected to the holding portion. The second face has a first recess and a second recess and is located on the opposite side of the first face in the direction in which the rotation axis extends. The first recess is provided at a position on the rotation axis. The second recess is provided at a position that is offset from the rotation axis. The holding portion is configured to be capable of holding a sample.

Description

Technical Field

[0001] This invention relates to a sample holder and a measuring device. Background Technology

[0002] Patent document 1 discloses: a sample mounting component of an X-ray CT measuring device that can perform CT value calibration and measurement of the sample without changing the sample at one time, and can eliminate the need for positioning operations each time when using the same sample container, and an X-ray CT measurement method using the sample mounting component of the X-ray CT measuring device. Existing technical documents Patent documents

[0003] Patent Document 1: Japanese Patent Application Publication No. 2022-144482 Summary of the Invention The problem the invention aims to solve

[0004] There is a need for a technique that allows for more appropriate measurement of a sample or sample holder on a sample stage during the measurement process, while the sample or sample holder is fixed in place.

[0005] In view of the above, for a sample holder that is conceived to rotate on a sample stage, the present invention provides a technique for more appropriately fixing the sample holder. Solution for solving the problem

[0006] According to one aspect of the present invention, a sample holder for measurements by radiation is provided. The sample holder has a base and a holding portion. The base is configured to rotate about a rotation axis and has a first surface and a second surface. The first surface is connected to the holding portion. The second surface has a first recess and a second recess, located opposite to the first surface in the direction extending along the rotation axis. The first recess is provided at a position on the rotation axis. The second recess is provided at a position offset from the rotation axis. The holding portion is configured to hold a sample.

[0007] According to this disclosure, for a sample holder that is designed to rotate on a sample stage, the fixation of the sample holder can be performed more appropriately. Attached Figure Description

[0008] Figure 1 This is a diagram showing an example of measuring device 1. Figure 2 This represents the three-dimensional representation of sample holder 2. Figure 1 Example diagram. Figure 3 It means perspective. Figure 2 Stereoscopic of sample holder 2 Figure 1 Example diagram. Figure 4 Other solids representing sample holder 2 Figure 1 Example diagram. Figure 5 This diagram illustrates the relationship between the sample holder 2, the sample stage 3, the holder standby section 4, and the holder transport section 5. Figure 6 It means Figure 5 A bottom view of the sample holder 2 and sample stage 3 along line AA Figure 1 Example diagram. Figure 7 This represents the solid form of sample holder 1000. Figure 1 Example diagram. Figure 8 This represents the solid form of sample holder 2000. Figure 1 Example diagram. Detailed Implementation

[0009] [Implementation Method] Embodiments of the present invention will now be described with reference to the accompanying drawings. The various features shown in the embodiments described below can be combined with each other. Furthermore, the present invention is not limited to these embodiments. Also, in the accompanying drawings of this specification, for ease of understanding of the feature portions, constituent elements are sometimes represented at a different scale than the actual proportions.

[0010] (Measuring device 1) In this section, the measuring device 1 will be described. Figure 1 This diagram illustrates an example of the measuring apparatus 1. The measuring apparatus 1 is used to measure the radiation RD passing through a sample SN. For example, the measuring apparatus 1 includes a sample holder 2, a sample stage 3, a holder standby section 4, a holder transport section 5, an irradiation section 6, and a detection section 7. Passing through the sample SN means that the sample SN is arranged in the optical path. For example, the radiation RD passing through the sample SN can also include rays that undergo physical phenomena such as transmission, reflection, diffraction, and scattering within the sample SN. Examples of radiation RD include alpha rays, beta rays, gamma rays, X-rays, neutron rays, etc. Therefore, the sample holder 2 of this embodiment can be used to measure the passing radiation RD.

[0011] Sample holder 2 is a holder used for measurements via radiation RD. Sample holder 2 holds sample SN. Further details about sample holder 2 will be provided in the context of... Figures 2-4 At the same time, a detailed explanation will be provided.

[0012] Sample SN is held by sample holder 2. Sample SN can be any object, such as a battery, screw, etc.

[0013] The sample stage 3 is configured to accommodate the sample holder 2. Regarding the sample stage 3, further details will be provided in the context of... Figures 5-6 At the same time, a detailed explanation will be provided.

[0014] The standby unit 4 is configured to allow multiple sample holders 2, which are equipped with samples SN before and / or after measurement, to standby.

[0015] The holder delivery unit 5 is configured to deliver the sample holder 2. Regarding the holder standby unit 4 and the holder delivery unit 5, a discussion will follow in conjunction with... Figure 6 At the same time, a detailed explanation will be provided.

[0016] The irradiation unit 6 irradiates the sample SN, which is disposed in the sample holder 2, with radiation RD. In the irradiation unit 6, a radiation source corresponding to the type and energy of the generated radiation RD can be used. The irradiation unit 6 can also be configured to change the energy of the generated radiation RD via any mechanism.

[0017] The detection unit 7 detects the radiation RD that has passed through the sample SN. A detector corresponding to the type of radiation RD can be used in the detection unit 7.

[0018] (Sample holder 2) In the following Figures 2-8 The XYZ coordinate system is a Cartesian coordinate system set with the sample holder 2 as the reference. The X-axis, Y-axis, and Z-axis are shown in the figure. For example, the X-axis extends in a direction parallel to the line connecting the center of the first recess (positioning part 206) and the center of the second recess (idleness suppression part 207). The X-axis sign is: positive (positive X-axis direction) on the first recess (positioning part 206) side and negative (negative X-axis direction) on the second recess (idleness suppression part 207) side. For example, the Y-axis extends in a direction orthogonal to the line connecting the center of the first recess (positioning part 206) and the center of the second recess (idleness suppression part 207). The Y-axis sign is: positive (positive Y-axis direction) on the first wall part 202a side and negative (negative Y-axis direction) on the first wall part 202b side, with the rotation axis RA as the reference. For example, the Z-axis extends in the direction extending along the rotation axis RA. The Z-axis sign: the first face 200 side is positive (positive Z-axis direction), and the second face 205 side is negative (negative Z-axis direction).

[0019] The following is combined Figures 2-4 The sample holder 2 of this embodiment will be described. Figure 2 This represents the three-dimensional representation of sample holder 2. Figure 1 Example diagram. Figure 3 It means perspective. Figure 2 Stereoscopic of sample holder 2 Figure 1 Example diagram. Figure 4Other solids representing sample holder 2 Figure 1 Example diagram.

[0020] The sample holder 2 may have a base 20 and a holding portion 21. Both the base 20 and the holding portion 21 may be formed of a material capable of transmitting a certain degree of radiation RD. For example, both the base 20 and the holding portion 21 may be radiotransmissive. Both the base 20 and the holding portion 21 may be primarily composed of a material with a low density suitable for the transmission of radiation RD; for example, in the case of X-rays, this material may be a resin such as polystyrene or polypropylene. This reduces the influence of absorption and scattering of radiation RD by the sample holder 2. The base 20 and the holding portion 21 may be integrally formed or separately formed. In the case of separate forming, the holding portion 21 can be replaced with components of various shapes depending on the type of sample SN.

[0021] The base 20 has a shape for being disposed on the sample stage 3. Furthermore, the base 20 may also have a shape for being held by the holder standby section 4 and the holder transport section 5. The base 20 is configured to rotate about the rotation axis RA, from the positive Z-axis direction toward the negative Z-axis direction (from the first surface 200 toward the second surface 205), and may sequentially include a first surface 200, a first cylindrical portion 201, a first columnar portion 202, a second cylindrical portion 203, a second columnar portion 204, and a second surface 205.

[0022] The first surface 200 is the surface connecting the holding elements 210a, 210b, and 210c that serve as the holding part 21. Furthermore, the first surface 200 can be configured to enable the positioning of the sample SN in the Z-axis direction by contacting it. When viewed from the Z-axis direction, the shape of the first surface 200 can be a circle centered on the rotation axis RA. Additionally, if the sample SN is a battery, electrodes (not shown) for energizing the battery can be provided on the first surface 200.

[0023] The first cylindrical portion 201 may have a cylindrical shape with the rotation axis RA as its center, and may have a holding portion connecting surface 201a, an R-shaped wall portion 201b, an outer peripheral wall portion 201c, an R-shaped wall portion 201d, and a first column connecting surface 201e. The holding portion connecting surface 201a may be the portion corresponding to the bottom surface of the cylinder, and as in the embodiment, may be formed by a first surface 200. The R-shaped wall portion 201b connects the holding portion connecting surface 201a and the outer peripheral wall portion 201c, and may have an R-shape. The outer peripheral wall portion 201c may be the portion corresponding to the side surface of the cylinder. The R-shaped wall portion 201d connects the outer peripheral wall portion 201c and the first column connecting surface 201e, and may have an R-shape. The first column connecting surface 201e connects to the ends of the first wall portions 202a and 202b in the short side direction (negative Z-axis direction), and to the ends of the first arcuate wall portions 202c and 202d in the axial direction (negative Z-axis direction). The first column connecting surface 201e can be a surface that is paired with the retaining part connecting surface 201a, and can have the same shape as the retaining part connecting surface 201a.

[0024] A retainer identification section DI may be provided on the side of the outer peripheral wall portion 201c. The retainer identification section DI is configured to identify information of the sample holder 2. The retainer identification section DI may be provided on the outer peripheral wall portion 201c and located on the opposite side of the idle suppression section 207, across the rotation axis RA in radial direction. For example, information for identifying the sample holder 2 may be assigned to the retainer identification section DI by any method such as a QR code (registered trademark), barcode, RFID tag, or image recognition. As a result, the position of the retainer identification section DI can be fixed, thereby enabling efficient identification of information of the sample holder 2.

[0025] The first column portion 202 is columnar in shape. The first column portion 202 may have two first wall portions 202a, 202b and two first arcuate wall portions 202c, 202d located radially inward from the circle of the cylinder defined by the outer peripheral wall portion 201c.

[0026] For example, each of the two first wall portions 202a and 202b can have a rectangular shape parallel to the ZX plane, such that the X-axis direction is the direction of the longer side and the Z-axis direction is the direction of the shorter side. The two first wall portions 202a and 202b can each have the same shape. The first wall portion 202a can be positioned opposite to the first wall portion 202b in the radial direction of the rotation axis RA.

[0027] Each of the two first arcuate wall portions 202c and 202d can protrude in a direction away from the rotation axis RA, thereby defining the circumferential direction of each of the first arcuate wall portions 202c and 202d. Furthermore, each of the first arcuate wall portions 202c and 202d can extend parallel to the rotation axis RA, thereby defining the axial direction of each of the first arcuate wall portions 202c and 202d. The first wall portion 202a can be positioned radially opposite to the first wall portion 202b along the rotation axis RA.

[0028] For example, one end of the first wall portion 202a in the long side direction (positive X-axis direction) can be connected to one end of the first arc-shaped wall portion 202c in the circumferential direction (positive Y-axis direction), and one end of the first wall portion 202b in the long side direction (negative X-axis direction) can be connected to one end of the first arc-shaped wall portion 202d in the circumferential direction (negative Y-axis direction). Similarly, the other end of the first wall portion 202a in the long side direction (negative X-axis direction) can be connected to the other end of the first arc-shaped wall portion 202d in the circumferential direction (positive Y-axis direction), and the other end of the first wall portion 202b in the long side direction (positive X-axis direction) can be connected to the other end of the first arc-shaped wall portion 202c in the circumferential direction (negative Y-axis direction).

[0029] The second cylindrical portion 203 may have a cylindrical shape with the rotation axis RA as its center, and may have a first cylindrical connecting surface 203a, an R-shaped wall portion 203b, an outer peripheral wall portion 203c, an R-shaped wall portion 203d, and a second cylindrical connecting surface 203e. When viewed from the Z-axis direction, the shape of the second cylindrical portion 203 may be the same as that of the first cylindrical portion 201, which is circular. The first cylindrical connecting surface 203a may be the portion corresponding to the bottom surface of the cylinder. Furthermore, the first cylindrical connecting surface 203a may be connected to the ends of the first wall portions 202a and 202b in the short side direction (negative Z-axis direction), and to the ends of the first arc-shaped wall portions 202c and 202d in the axial direction (negative Z-axis direction). The R-shaped wall portion 203b connects the first cylindrical connecting surface 203a and the outer peripheral wall portion 203c, and may have an R-shape. The outer peripheral wall portion 203c may be the portion corresponding to the side surface of the cylinder. The R-shaped wall portion 203d connects the outer peripheral wall portion 203c to the second column connecting surface 203e and may have an R-shape. The second column connecting surface 203e may connect to the ends of the second wall portions 204a and 204b in the short side direction (positive Z-axis direction) and the ends of the second arc-shaped wall portions 204c and 204d in the short side direction (positive Z-axis direction). The second column connecting surface 203e may be a surface paired with the first column connecting surface 203a and may have the same shape as the first column connecting surface 203a.

[0030] The second column portion 204 is columnar in shape. When viewed from the Z-axis direction, the shape of the second column portion 204 can be the same as that of the first column portion 202, which is circular. The second column portion 204 may have two second wall portions 204a and 204b, two second arcuate wall portions 204c and 204d, and a mounting surface 204e, located radially inward of the rotation axis RA compared to the second cylindrical portion 203.

[0031] For example, each of the two second wall portions 204a and 204b can have a rectangular shape parallel to the ZX plane, such that the X-axis direction is the direction of the longer side and the Z-axis direction is the direction of the shorter side. The two second wall portions 204a and 204b can each have the same shape. The second wall portion 204a can be positioned opposite to the second wall portion 204b in the radial direction of the rotation axis RA.

[0032] Two second arcuate wall portions 204c and 204d can be formed to define the circumferential direction by protruding in a direction away from the rotation axis RA. Furthermore, each of the second arcuate wall portions 204c and 204d can be formed to define the axial direction of its respective portion by extending parallel to the rotation axis RA. The second arcuate wall portion 204c can be positioned opposite to the second arcuate wall portion 204d in the radial direction of the rotation axis RA.

[0033] For example, one end of the second wall portion 204a in the long side direction (positive X-axis direction) can be connected to one end of the second arc-shaped wall portion 204c in the circumferential direction (positive Y-axis direction), and one end of the second wall portion 204b in the long side direction (negative X-axis direction) can be connected to one end of the second arc-shaped wall portion 204d in the circumferential direction (negative Y-axis direction). Similarly, the other end of the second wall portion 204a in the long side direction (negative X-axis direction) can be connected to the other end of the second arc-shaped wall portion 204d in the circumferential direction (positive Y-axis direction), and the other end of the second wall portion 204b in the long side direction (positive X-axis direction) can be connected to the other end of the second arc-shaped wall portion 204c in the circumferential direction (negative Y-axis direction).

[0034] The shape of the surface formed by the configuration surface 204e can correspond to the shape of the region surrounded by two second wall portions 204a, 204b and two second arc-shaped wall portions 204c, 204d when viewed from the Z-axis direction. In the embodiment shown in the figure, the configuration surface 204e can be composed of a second surface 205.

[0035] The second surface 205 is configured to fix the sample holder 2 onto the sample stage 3. Furthermore, the second surface 205 may have at least two recesses, including a positioning portion 206 (first recess) and a idling suppression portion 207 (second recess) in the embodiment. The second surface 205 may be located on the opposite side of the first surface 200 in the direction extending along the rotation axis RA. Additionally, the XY plane may be a plane parallel to both the first surface 200 and the second surface 205.

[0036] The positioning part 206 is configured to position the sample holder 2 on the sample stage 3. For example, the positioning part 206 is located at a position on the rotation axis RA. For example, the positioning part 206 may define a shape as a first recess on the second surface 205, which is inserted into the positioning part 31 (e.g., a first protrusion) provided on the rotation axis RA on the sample stage 3. For example, the positioning part 206 may be a hole recessed into the shape of a cone portion 206a defining a conical shape and a cylindrical portion 206b defining a cylindrical shape. For example, the cone portion 206a may be located closer to the opening side (negative Z-axis direction) of the cylindrical portion 206b and expand towards the opening side.

[0037] The idling suppression section 207 is configured to suppress idling of the sample holder 2 relative to the sample stage 3. For example, the idling suppression section 207 is located off the rotation axis RA. For example, the idling suppression section 207 may define a shape as a second recess on the second surface 205, which is inserted into the idling suppression section 32 (e.g., a second protrusion) located on the sample stage 3 off the rotation axis RA. For example, the idling suppression section 207 as the second recess may be a hole with an elliptical cylindrical shape, the major axis of which is perpendicular to the rotation axis RA. The idling suppression section 207 as the second recess may also be a hole with a cone-shaped portion 207a defining a cone shape and an elliptical cylindrical portion 207b defining an elliptical cylindrical shape. The cone-shaped portion 207a may be located closer to the opening side (negative Z-axis direction) of the elliptical cylindrical portion 207b and expand towards the opening side. With the positioning unit 206 and the idle rotation suppression unit 207, during the imaging process using radiation RD, the sample holder 2 can be positioned on the sample stage 3 while preventing the sample holder 2 from idling relative to the sample stage 3, thereby making the obtained image less prone to blurring.

[0038] The holding part 21 is configured to hold the sample SN. The shape of the holding part 21 can be selected according to the type of sample SN. In an embodiment, the holding part 21 includes a first holding element 210a, a second holding element 210b, and a third holding element 210c, which are multiple holding elements that hold the sample SN by deformation.

[0039] Each of the plurality of retaining elements 210a, 210b, and 210c may have base ends 211a, 211b, and 211c, end portions 212a, 212b, and 212c, inner wall portions 213a, 213b, and 213c, and outer wall portions 214a, 214b, and 214c, respectively. Each of the plurality of retaining elements 210a, 210b, and 210c may have the same shape.

[0040] Each of the plurality of retaining elements 210a, 210b, 210c may be configured to extend from the base ends 211a, 211b, 211c connected to the first surface 200 toward the end portions 212a, 212b, 212c along the positive Z-axis. The length from the base ends 211a, 211b, 211c to the end portions 212a, 212b, 212c is, for example, approximately 30 mm, but is not limited thereto. Each of the end portions 212a, 212b, 212c may have an R-shape.

[0041] Each of the inner wall portions 213a, 213b, and 213c can be formed as an arc shape depicting a circle centered on the rotation axis RA. Similarly, each of the outer wall portions 214a, 214b, and 214c can be formed as an arc shape depicting a circle centered on the rotation axis RA. The diameter of the circle in the inner wall portions 213a, 213b, and 213c is smaller than the diameter of the circle in the outer wall portions 214a, 214b, and 214c.

[0042] The spacing between adjacent holding elements can be adjusted to allow visual identification of sample identification information (not shown) attached to the sample SN. For example, the sample SN can be configured such that the sample identification information is located between the first holding element 210a and the second holding element 210b. In this case, the spacing L1 between the first holding element 210a and the second holding element 210b can be larger than the spacing L2 between the second holding element 210b and the third holding element 210c, and larger than the spacing L3 between the third holding element 210c and the first holding element 210a. For example, spacing L1 is approximately 12 mm, and spacings L2 and L3 are approximately 5 mm, but are not limited thereto. The sample identification information can be assigned to identify the sample SN using any method such as a QR code (registered trademark), barcode, RFID tag, image recognition, etc. Thus, the information assigned to the sample SN can be read from the gaps between the holding elements.

[0043] At least a portion of each of the inner wall portions 213a, 213b, and 213c may have multiple protrusions 215a, 215b, and 215c. Each of the multiple protrusions 215a, 215b, and 215c may contact the sample SN, thereby holding the sample SN. For example, the protrusions 215a, 215b, and 215c may be positioned further towards the end portions 212a, 212b, and 212c than the base ends 211a, 211b, and 211c, and protrude close to the rotation axis RA. In this embodiment, the sample SN is cylindrical and can be held by being clamped by the protrusions 215a, 215b, and 215c. Thus, a cylindrical sample SN with a size equal to the diameter of the circle defined by the inner wall portions 213a, 213b, and 213c can be held. Furthermore, since the sample SN can be clamped by the protrusions 215a, 215b, and 215c, there is no need to use adhesives or double-sided tape to fix the sample SN, thus allowing for easy loading and unloading of the sample SN. Moreover, since the sample SN can be clamped by the protrusions 215a, 215b, and 215c, it can cope with the thermal expansion of the battery when the sample SN is a battery.

[0044] Figure 5 This diagram illustrates the relationship between the sample holder 2, the sample stage 3, the holder standby section 4, and the holder transport section 5. The X-axis, viewed from the Z-axis, defines the direction in which the sample holder 2 moves between the holder standby section 4 and the holder transport section 5. The Z-axis defines the direction in which the sample holder 2 is positioned onto the sample stage 3 by the holder transport section 5.

[0045] (Sample stage 3) The sample stage 3 may include a rotating part (not shown), a stage portion 30, a positioning part 31, and a idling suppression part 32. The rotating part can rotate the stage portion 30 and the sample holder 2 disposed on the stage portion 30 about the rotation axis RA. The stage portion 30 can be in contact with the second surface 205 to accommodate the sample holder 2.

[0046] For example, the positioning part 31 is cylindrical and can be positioned on the rotation axis RA. For example, by engaging with the positioning part 206, which is a first concave part, the positioning part 31, as a first protrusion, can more accurately position the sample SN on the sample stage 3 at the center of the optical axis of the radiation RD. Furthermore, as long as a concave-convex structure for positioning the sample holder 2 on the sample stage 3 is formed, a protrusion can be formed on the sample holder 2 side and a concave part on the sample stage 3 side.

[0047] For example, the idling suppression part 32 is cylindrical and can be positioned off-axis RA. For example, the idling suppression part 32, as a second protrusion, can prevent the sample holder 2 from idling independently of the sample stage 3 by engaging with the idling suppression part 207, which is a second recess. Furthermore, as long as a concave-convex structure is formed to prevent idling between the sample holder 2 and the sample stage 3, a protrusion can be formed on the sample holder 2 side and a recess on the sample stage 3 side. The first and second protrusions can have the same shape. Thus, to prevent the sample holder 2 from idling relative to the sample stage 3, the sample holder 2 can be positioned on the sample stage 3.

[0048] Figure 6 It means Figure 5 A bottom view of the sample holder 2 and sample stage 3 along line AA Figure 1 The example diagram shows that, since the idling suppression part 32 is a cylindrical second convex part and the idling suppression part 207 is an elliptical cylindrical second concave part, therefore... Figure 6 As shown, the second protrusion engages with the second recess with a gap in the X-axis direction (radial). The gap can be provided on both sides of the positive and negative X-axis directions, or only on one side. Therefore, since the recess is larger than the protrusion, the operation of inserting the sample holder 2 from the holder delivery section 5 becomes easier.

[0049] (Standby unit 4) The holder standby section 4 has a plurality of holding portions 40 for holding the sample holder 2. The holding portions 40 may have a shape suitable for configuring the sample holder 2. For example, the holding portion 40 may have a stepped portion 400 and a cut-out portion 401. The stepped portion 400 may be formed into a more rounded and recessed shape than other parts of the holder standby section 4. The cut-out portion 401 may define a space for the second post portion 204 to be inserted.

[0050] The holding portion 40 can be configured to cooperate with the second cylindrical portion 203 and the second column portion 204, enabling the holder standby portion 4 to hold the sample holder 2. For example, the second column connecting surface 203e can function as a surface supported by the stepped portion 400. The shape of the cut portion 401 can fit against the two second wall portions 204a, 204b and the second arc-shaped wall portion 204d when the second column portion 204 is inserted, or it can have a small gap. Thus, the sample holder 2 can be held by the holder standby portion 4. Furthermore, when the sample holder 2 is held by the holder standby portion 4, the sample holder 2 can be positioned in the circumferential direction of the rotation axis RA.

[0051] (Retainer delivery unit 5) The sample holder transport section 5 transports the sample holder 2 between the sample holder standby section 4 and the sample stage 3. The sample holder transport section 5 may have a shape suitable for transporting the sample holder 2. For example, the sample holder transport section 5 may have two parallel sections 50a and 50b and a curved section 51. Each of the parallel sections 50a and 50b extends in parallel. The curved section 51 is connected to the ends of the parallel sections 50a and 50b on the same side and may have a shape that depicts an arc corresponding to the first arcuate wall section 202d.

[0052] The sample holder transport section 5 can be configured to cooperate with the first cylindrical section 201 and the first column section 202 to hold the sample holder 2. For example, the sample holder transport section 5 moves in the negative X-axis direction so that the first column section 202 is located in the space defined by the parallel sections 50a, 50b and the curved section 51. Then, the sample holder transport section 5 moves in the positive Z-axis direction, supporting the sample holder 2 using the first column connecting surface 201e. The movement of the sample holder transport section 5 while holding the sample holder 2 allows it to transport the sample holder 2. The shapes of the parallel sections 50a, 50b and the curved section 51 can conform to the two first wall sections 202a, 202b and the first arcuate wall section 202d, or have a small gap. Thus, the sample holder 2 can be held by the sample holder transport section 5. Furthermore, when the sample holder 2 is held by the sample holder transport section 5, the sample holder 2 can be positioned in the circumferential direction of the rotation axis RA.

[0053] According to this disclosure, the fixation of the sample holder 2, which is designed to rotate on the sample stage 3, can be performed more appropriately.

[0054] [other] The following is combined Figures 7-8 The sample holders 1000 and 2000 of the modified examples will be described.

[0055] Figure 7 This represents the solid form of sample holder 1000. Figure 1 The figure shows an example. The base 1020 of the modified sample holder 1000 has a structure substantially the same as the base 20 of the embodiment. The holding portion 1021 has a first holding element 1021a, a second holding element 1021b, and a third holding element 1021c. Each of the first holding element 1021a, the second holding element 1021b, and the third holding element 1021c has a larger arc size drawn around the rotation axis RA compared to each of the first holding element 210a, the second holding element 210b, and the third holding element 210c.

[0056] Figure 8 This represents the solid form of sample holder 2000. Figure 1The figure shows an example. The base 2020 of the modified sample holder 2000 has a structure that is substantially the same as that of the base 20 in the embodiment. In addition to the first holding element 2021a, the second holding element 2021b, and the third holding element 2021c, the holding part 2021 also has a fourth holding element 2021d, which are configured to depict an arc shape centered on the rotation axis RA.

[0057] In the embodiment, although it is described that the retainer identification part DI is provided on the first cylindrical part 201, in the modified example, it may be provided at any position, for example, it may be provided on the second cylindrical part 203.

[0058] In a modified example, when the sample holder 2 is held by the holder standby section 4, it is not necessary to use the second column connecting surface 203e, the second wall portions 204a, 204b, and the second arc-shaped wall portion 204d. Alternatively, the second column connecting surface 203e, the second wall portions 204a, 204b, and the second arc-shaped wall portion 204c can be used; the first column connecting surface 201e, the first wall portions 202a, 202b, and the first arc-shaped wall portion 202c can also be used; and the first column connecting surface 201e, the first wall portions 202a, 202b, and the first arc-shaped wall portion 202d can also be used. The same applies to the holder transport section 5.

[0059] This disclosure may also be provided in the various ways described below.

[0060] (1) A sample holder for measurement by radiation, characterized in that: it has a base and a holding portion, the base being configured to rotate about a rotation axis and having a first surface and a second surface, the first surface being connected to the holding portion, the second surface having a first recess and a second recess and being located on the opposite side of the first surface in the direction extending from the rotation axis, the first recess being disposed at a position on the rotation axis, the second recess being disposed at a position offset from the rotation axis, and the holding portion being configured to hold a sample.

[0061] Based on this aspect, for a sample holder that is designed to rotate on a sample stage, the fixation of the sample holder can be performed more appropriately.

[0062] (2) The sample holder according to (1), wherein, on the first surface, as the first recess, a cylindrical recessed hole is defined, and on the first surface, as the second recess, a hole in the shape of an elliptical cylinder is defined with the major axis direction orthogonal to the rotation axis as the second recess.

[0063] According to this aspect, while positioning the sample holder on the sample stage, it is possible to prevent it from spinning freely relative to the sample stage.

[0064] (3) The sample holder according to (2), wherein the sample holder is configured to be disposed on a sample stage, the sample stage having a rotating part, a first protrusion and a second protrusion, the rotating part causing the sample holder to rotate about the rotating axis, the first protrusion being cylindrical in shape, disposed at a position on the rotating axis and fitting with the first recess, the second protrusion being cylindrical in shape, disposed at a position offset from the rotating axis and fitting with the second recess with a gap in the radial direction of the rotating axis.

[0065] In this respect, to prevent the sample holder from spinning freely relative to the sample stage, the sample holder can be positioned on the sample stage.

[0066] (4) The sample holder according to any one of (1) to (3), wherein the base has a first cylindrical portion, a first column portion, a second cylindrical portion and a second column portion in sequence from the first surface toward the second surface, the first cylindrical portion having a cylindrical shape and having the first surface, the first column portion connected to the first cylindrical portion having a column shape and having two first wall portions that are radially inward of the rotation axis than the first cylindrical portion, the first wall portion of one of the two first wall portions being disposed at an opposite position in the radial direction of the rotation axis relative to the first wall portion of the other, the second cylindrical portion connected to the first column portion having a cylindrical shape, the second column portion connected to the second cylindrical portion having the second surface and having a column shape, and having two second wall portions that are radially inward of the rotation axis than the second cylindrical portion, the second wall portion of one of the two second wall portions being disposed at an opposite position in the radial direction of the rotation axis relative to the second wall portion of the other.

[0067] Based on this, it is possible to hold the sample holder by the holder standby section and the holder transport section.

[0068] (5) The sample holder according to (4), wherein the first column has a first arcuate wall portion connected to the two first walls portion and raised away from the rotation axis, the second column has a second arcuate wall portion connected to the two second walls portion and raised away from the rotation axis, and the first arcuate wall portion is disposed in opposite positions to the second arcuate wall portion in the radial direction of the rotation axis, separated by the rotation axis.

[0069] According to this aspect, when the sample holder is held by the holder standby section and the holder transport section, the sample holder can be positioned in the circumferential direction of the rotation axis.

[0070] (6) The sample holder according to (4) or (5), wherein the first cylindrical portion has a holder identification portion configured to identify information of the sample holder and is disposed on the side of the first cylindrical portion and is located on the opposite side of the second recess relative to the rotation axis radially across the rotation axis.

[0071] Based on this, the position of the retainer identification section can be fixed, thereby enabling efficient identification of sample retainer information.

[0072] (7) The sample holder according to any one of (1) to (6), wherein the holding portion includes a plurality of holding elements for holding the sample, each of the plurality of holding elements having a base end portion and an inner wall portion, the base end portion being connected to the first surface, and at least a portion of each of the inner wall portions having a protrusion that protrudes close to the axis of rotation.

[0073] Based on this, the sample can be held by multiple protrusions.

[0074] (8) The sample holder according to any one of (1) to (7), wherein the holding portion includes a plurality of holding elements for holding the sample by deformation, the plurality of holding elements including a first holding element, a second holding element and a third holding element, wherein the distance between the first holding element and the second holding element is greater than the distance between the second holding element and the third holding element.

[0075] Based on this, it is possible to read the information assigned to the sample from the gaps between the elements.

[0076] (9) The sample holder according to (8), wherein each of the first holding element, the second holding element and the third holding element has an arc-shaped inner wall portion that depicts a circle centered on the rotation axis of the first surface, the sample being cylindrical and being held by contact with the inner wall portion.

[0077] Based on this aspect, a sample can maintain its cylindrical shape through its inner wall.

[0078] (10) The sample holder according to any one of (1) to (9), wherein the base and the holding portion are radiotransmittable.

[0079] Based on this, the effects of radiation absorption and scattering caused by the sample holder can be reduced.

[0080] (11) A measuring device for measuring by radiation, characterized in that: it comprises a sample holder, an irradiation unit and a detection unit disposed on a sample stage, wherein the sample holder is the sample holder described in any one of (1) to (10) above, the irradiation unit irradiates the sample disposed on the sample holder with radiation, and the detection unit detects the radiation after passing through the sample.

[0081] Based on this aspect, the sample holder of this embodiment can be used to perform measurements of transmitted radiation. Of course, it's not limited to this.

[0082] Finally, while various embodiments related to this disclosure have been described, these are merely examples and are not intended to limit the scope of the invention. This novel embodiment can be implemented in various other ways, with various omissions, substitutions, and modifications possible without departing from the spirit of the invention. This embodiment and its variations are included within the scope and spirit of the invention, as well as within the scope of the invention described in the claims and its equivalents. Explanation of reference numerals in the attached figures

[0083] 1: Measuring device 2: Sample holder 20: base 200: First page 201: First cylindrical section 201a: Retaining the connection surface of the part, 201b: R-wall section, 201c: Peripheral wall portion, 201d: R-wall section, 201e: First column connection surface, 202: First column, 202a: First wall section, 202b: First wall section 202c: First arc-shaped wall portion, 202d: First arc-shaped wall portion, 203: Second cylindrical section 203a: First column connection surface, 203b: R-wall portion, 203c: Peripheral wall portion, 203d: R-wall portion, 203e: Second column connection surface 204: Second column, 204a: Second wall section 204b: Second wall section 204c: Second arcuate wall portion 204d: Second arcuate wall portion, 204e: Configuration plane, 205: Second page 206: Positioning Department 206a: Conical part, 206b: Cylindrical portion, 207: Idle Speed ​​Suppression Section 207a: Conical part, 207b: Elliptical cylindrical portion, 21: Maintaining the department, 210a: First retaining element 210b: Second retention element 210c: Third retention element 211a: Base end, 211b: Base end, 211c: base end, 212a: Terminal portion, 212b: End portion, 212c: terminal part, 213a: Inner wall portion, 213b: Inner wall portion, 213c: Inner wall portion, 214a: Outer wall portion, 214b: Outer wall portion, 214c: Outer wall portion 215a: convex part, 215b: convex part, 215c: convex part, 3: Sample stage, 30: Platform section, 31: Positioning Department 32: Idle speed suppression section 4: Holder standby section, 40: Maintaining the department, 400: Step section 401: Incision site, 5: Retainer conveyor section 50a: Parallel part, 50b: Parallel section, 51: Curved section 6: Irradiation part, 7: Testing Department DI: Retainer Identification Unit L1: Spacing L2: Spacing L3: Spacing RA: Rotation axis RD: Radiation, SN: Sample 1000: Sample holder 1020: Base 1021: Maintaining Department 1021a: First retaining element 1021b: Second retention element 1021c: Third retention element 2000: Sample holder 2020: Base 2021: Maintain Department, 2021a: First Maintaining Element 2021b: Second Maintenance Element 2021c: The Third Maintaining Element 2021d: Fourth retention element.

Claims

1. A sample holder for measurements performed by radiation, characterized in that: It has a base and a retaining part. The base is configured to rotate about a rotation axis and has a first surface and a second surface. The first surface is connected to the retaining part. The second surface has a first recess and a second recess, and is located on the opposite side of the first surface in the direction in which the rotation axis extends. The first recess is located at a position on the rotation axis. The second recess is located at a position offset from the rotation axis. The holding part is configured to hold the sample.

2. The sample holder according to claim 1, wherein, On the first surface, a cylindrical recessed hole is defined as the first recess. On the first surface, as the second recess, a hole is defined that is recessed in an elliptical cylindrical shape with the major axis direction orthogonal to the rotation axis as the direction of the major axis.

3. The sample holder according to claim 2, wherein, The sample holder is configured to be disposed on the sample stage. The sample stage has a rotating part, a first protrusion, and a second protrusion. The rotating part rotates the sample holder around the rotating axis. The first protrusion is cylindrical, positioned on the rotation axis, and engages with the first recess. The second protrusion is cylindrical in shape, located at a position offset from the rotation axis, and engages with the second recess with a gap in the radial direction of the rotation axis.

4. The sample holder according to any one of claims 1 to 3, wherein, The base portion has, in sequence from the first surface toward the second surface, a first cylindrical portion, a first columnar portion, a second cylindrical portion, and a second columnar portion. The first cylindrical portion has a cylindrical shape and has the first surface. The first columnar portion is connected to the first cylindrical portion, has a columnar shape, and has two first wall portions that are radially inward of the first cylindrical portion relative to the first cylindrical portion on the rotation axis. One of the two first wall portions is positioned radially opposite to the other first wall portion on the rotation axis. The second cylindrical portion is connected to the first cylindrical portion and has a cylindrical shape. The second column portion is connected to the second cylindrical portion, has the second surface, and has a column shape. It also has two second wall portions that are radially inner to the rotation axis than the second cylindrical portion. One of the two second wall portions is positioned in the opposite direction to the other in the rotation axis.

5. The sample holder according to claim 4, wherein, The first column portion has a first arc-shaped wall portion, which connects to the two first wall portions and protrudes away from the axis of rotation. The second column portion has a second arc-shaped wall portion, which connects to the two second wall portions and protrudes away from the axis of rotation. The first arc-shaped wall portion is positioned opposite to the second arc-shaped wall portion in the radial direction of the rotation axis, across the rotation axis.

6. The sample holder according to claim 4 or 5, wherein, The first cylindrical portion has a retainer identification portion. The retainer identification unit is configured as follows: It can identify information about the sample holder, and, It is disposed on the side of the first cylindrical portion, and is located on the opposite side of the second recess relative to the rotation axis radially across the rotation axis.

7. The sample holder according to any one of claims 1 to 6, wherein, The holding section includes multiple holding elements for holding the sample. Each of the plurality of retaining elements has a base end portion and an inner wall portion. The base ends are respectively connected to the first surface. At least a portion of each of the inner wall portions has a protrusion. The protrusion protrudes close to the axis of rotation.

8. The sample holder according to any one of claims 1 to 7, wherein, The retaining part includes multiple retaining elements that retain the sample by deformation. The plurality of holding elements includes a first holding element, a second holding element, and a third holding element. The distance between the first holding element and the second holding element is greater than the distance between the second holding element and the third holding element.

9. The sample holder according to claim 8, wherein, Each of the first retaining element, the second retaining element, and the third retaining element has an arc-shaped inner wall portion that depicts a circle centered on the rotation axis of the first surface. The sample is cylindrical and is held in place by contact with the inner wall portion.

10. The sample holder according to any one of claims 1 to 9, wherein, The base and the retaining portion are radiolucent.

11. A measuring device that measures using radiation, characterized in that: It is equipped with a sample holder, an irradiation unit, and a detection unit, all mounted on a sample stage. The sample holder is the sample holder according to any one of claims 1 to 10. The irradiation unit irradiates the sample disposed on the sample holder with radiation. The detection unit detects the radiation emitted after the sample has passed through it.

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