An automatic deviation correction method for electrode plate film cutting and slitting

Abstract

The application relates to the technical field of battery processing, and discloses an automatic deviation rectification method for die cutting and slitting of an electrode sheet film, which can realize collaborative closed-loop control on die cutting and slitting processes by simultaneously acquiring positive and reverse surface images of the electrode sheet, extracting the widths of the coating area and the non-coating area respectively, and combining independent die cutting deviation rectification amount and slitting deviation rectification amount calculation formulas, so that the defects of process isolation and large accumulated error in traditional technologies are overcome; the double-formula mathematical model significantly improves the deviation rectification accuracy and stability, and avoids size fluctuation; positive and reverse surface image data linkage analysis fundamentally guarantees the consistency of positive and reverse surface sizes, and completely changes the disadvantages of independent adjustment of the two surfaces; the whole deviation rectification process does not need manual intervention, and detection, calculation and execution are automatically completed, so that the product consistency, the yield and the production efficiency are greatly improved, and the automatic deviation rectification method can be widely applied to the die cutting and slitting manufacturing links of lithium battery electrode sheets.

Description

Technical Field

[0001] This invention relates to the field of battery processing technology, and in particular to an automatic correction method for electrode film cutting and slitting. Background Technology

[0002] In the manufacturing process of battery electrodes, die-cutting and slitting are key processes that determine the dimensional accuracy and consistency of the electrodes. Die-cutting refers to cutting off the uncoated areas on both sides of the electrode along its width to form tabs. Slitting, on the other hand, involves cutting along the length of the die-cut electrode from the center, resulting in two separate electrode pieces.

[0003] The width of the coated area and the width of the uncoated area of ​​the electrode directly affect the winding or stacking quality of the battery cell and the final battery performance. Therefore, electrode alignment technology is needed to control the position of the electrodes. However, current traditional electrode alignment technologies typically have the following technical shortcomings:

[0004] (1) Process isolation: It can only correct deviations for a single process (such as die-cutting or slitting), and cannot simultaneously take into account the dimensional balance of die-cutting and slitting processes, resulting in cumulative errors between the preceding and following processes.

[0005] (2) Insufficient precision: The lack of a dedicated mathematical model and the simple correction logic result in low correction precision and large dimensional fluctuations during the correction process, making it difficult to meet the requirements of high-precision manufacturing.

[0006] (3) The front and back sides cannot be linked: The size control of the front and back sides of the electrode is independent of each other and cannot be linked for adjustment, resulting in poor consistency between the front and back sides.

[0007] (4) Reliance on manual labor: The large reliance on operators to make manual adjustments based on experience leads to poor product consistency, low yield rate and low production efficiency.

[0008] Therefore, there is an urgent need for a method that can solve the above problems at the same time and achieve high precision, full automation, and front and back side linkage for correction and control. Summary of the Invention

[0009] This invention provides an automatic correction method for electrode film cutting and slitting to solve the problems existing in the prior art.

[0010] To achieve the above objectives, the present invention provides the following technical solution:

[0011] In a first aspect, the present invention provides an automatic correction method for electrode film cutting and slitting, the method comprising:

[0012] S1. Obtain the front and back images of the electrode;

[0013] S2. Determine the width of the coated area and the width of the uncoated area based on the front image and the back image, respectively;

[0014] S3. Calculate the slitting correction amount and the die-cutting correction amount based on the width of the coated area and the width of the uncoated area, respectively;

[0015] S4. Based on the die-cutting correction amount and the slitting correction amount, perform closed-loop correction control on the die-cutting and slitting of the electrode sheet respectively.

[0016] Furthermore, in the automatic correction method for electrode film cutting and slitting, step S2 includes:

[0017] S21. Based on the front image, determine the width A1 of the coating area on the left side of the front, the width A2 of the coating area on the right side of the front, the width a1 of the uncoated area on the left side of the front, and the width a2 of the uncoated area on the right side of the front, respectively.

[0018] S22. Based on the reverse image, determine the width B1 of the coating area on the left side of the reverse side, the width B2 of the coating area on the right side of the reverse side, the width b1 of the uncoated area on the left side of the reverse side, and the width b2 of the uncoated area on the right side of the reverse side.

[0019] Furthermore, in the automatic correction method for electrode film cutting and slitting, step S3 includes:

[0020] S31. Calculate the die-cutting correction amount according to the following formula;

[0021] Die-cutting correction amount = ((a1+b1)-(a2+b2)) / 4;

[0022] S32. Calculate the cutting correction amount according to the following formula;

[0023] Segmentation correction amount = ((A1+B1)-(A2+B2)) / 4.

[0024] Furthermore, in the automatic correction method for electrode film cutting and slitting, step S2 includes:

[0025] S21. Based on the front image, determine the width A1 of the coating area on the left side of the front, the width A2 of the coating area on the right side of the front, the width a1 of the uncoated area on the left side of the front, and the width a2 of the uncoated area on the right side of the front, respectively.

[0026] S22. Based on the reverse image, determine the width b1 of the uncoated area on the left side of the reverse side and the width b2 of the uncoated area on the right side of the reverse side.

[0027] Furthermore, in the automatic correction method for electrode film cutting and slitting, step S3 includes:

[0028] S301. Calculate the die-cutting correction amount according to the following formula;

[0029] Die-cutting correction amount = ((a1+b1)-(a2+b2)) / 4;

[0030] S302. Calculate the cutting correction amount according to the following formula;

[0031] Segmentation correction amount = ((a1-b1)-(a2-b2)+2×A1-2×A2) / 4.

[0032] Furthermore, in the automatic correction method for electrode film cutting and slitting, step S4 includes:

[0033] S41. Determine the sign of the die-cutting correction amount and the slitting correction amount;

[0034] S42. If the die-cutting correction amount is positive, the electrode is moved to the right by the distance of the die-cutting correction amount; if the die-cutting correction amount is negative, the electrode is moved to the left by the absolute value of the die-cutting correction amount.

[0035] S43. If the cutting correction amount is positive, the electrode is moved to the right by the distance of the cutting correction amount; if the cutting correction amount is negative, the electrode is moved to the left by the absolute value of the cutting correction amount.

[0036] Furthermore, in the automatic correction method for electrode film cutting and slitting, step S4 includes:

[0037] S401. Based on the die-cutting correction amount and the slitting correction amount, perform closed-loop correction control on the die-cutting and slitting of the electrode sheet respectively, and monitor the tension change of the electrode sheet in real time during the correction process.

[0038] S402. When the electrode tension exceeds the preset tension range, pause the correction and continue the correction after the tension returns to the preset tension range.

[0039] Furthermore, in the automatic correction method for electrode film cutting and slitting, the method further includes:

[0040] S5. After completing the correction control, return to execute S1 to S3 again to obtain new die-cutting correction amount and slitting correction amount;

[0041] S6. Determine whether the absolute value of the new die-cutting correction amount is less than the first preset threshold and whether the absolute value of the new slitting correction amount is less than the second preset threshold.

[0042] S7. If the absolute value of the new die-cutting correction amount is less than the first preset threshold and the absolute value of the new slitting correction amount is less than the second preset threshold, then the correction is determined to be complete, and the current electrode position is maintained; otherwise, return to execute S4 until the requirements of the first preset threshold and the second preset threshold are met.

[0043] In a second aspect, the present invention provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the automatic correction method for electrode film cutting and slitting as provided in the first aspect above.

[0044] Thirdly, the present invention provides a computer-readable storage medium having computer-executable instructions stored thereon, the computer-executable instructions being executed by a computer processor to realize the automatic correction method for electrode film cutting and slitting as provided in the first aspect above.

[0045] Compared with the prior art, the present invention has the following beneficial effects:

[0046] This invention provides an automatic correction method for electrode film cutting and slitting. By simultaneously acquiring images of the front and back sides of the electrode and extracting the widths of the coated and uncoated areas respectively, and combining independent calculation formulas for die-cutting and slitting correction amounts, it enables collaborative closed-loop control of the die-cutting and slitting processes. This effectively overcomes the shortcomings of isolated processes and large cumulative errors in traditional technologies. The dual-formula mathematical model significantly improves the correction accuracy and stability, avoiding dimensional fluctuations. The linked analysis of front and back image data fundamentally ensures the consistency of front and back dimensions, completely changing the drawbacks of independent adjustment of the two sides. The entire correction process requires no manual intervention, automatically completing detection, calculation, and execution, greatly improving product consistency, yield, and production efficiency. It can be widely applied to the die-cutting and slitting manufacturing of lithium battery electrodes. Attached Figure Description

[0047] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0048] Figure 1 This is a flowchart illustrating an automatic correction method for electrode film cutting and slitting provided in Embodiment 1 of the present invention;

[0049] Figure 2 This is a schematic diagram of the coated area and the uncoated area on the electrode sheet provided in Embodiment 1 of the present invention;

[0050] Figure 3This is a schematic diagram of the structure of a computer device provided in Embodiment 2 of the present invention. Detailed Implementation

[0051] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0052] Example 1

[0053] Please refer to Figure 1 This is a flowchart illustrating an automatic correction method for electrode film cutting and slitting according to Embodiment 1 of the present invention. This method is applicable to scenarios involving electrode cutting and can be implemented by software and / or hardware. The method specifically includes the following steps:

[0054] S1. Obtain the front and back images of the electrode;

[0055] It should be noted that this step requires the use of image acquisition equipment (such as a high-precision industrial camera) to acquire images of both the front and back sides of the electrode. The purpose of acquiring these images is to enable a comprehensive analysis of the characteristics of both sides of the electrode later on. During the electrode production process, the condition of both sides has a significant impact on cutting accuracy, etc. Only by acquiring images of both sides simultaneously can the overall state of the electrode be accurately determined, providing sufficient information for subsequent correction operations.

[0056] S2. Determine the width of the coated area and the width of the uncoated area based on the front image and the back image, respectively;

[0057] It should be noted that after obtaining images of the front and back sides of the electrode, image processing techniques (such as edge detection algorithms) are used to analyze the images. The coated area is the region on the electrode coated with active materials, while the uncoated area is the edge region without any coating. Image processing techniques can accurately identify the boundaries of these two areas, and then measure the width of the coated area and the width of the uncoated area on both sides. Determining the width of these two areas is a crucial basis for subsequent calculations of the correction amount, because different cutting processes (die-cutting and slitting) require corresponding adjustments based on the width of these two areas.

[0058] S3. Calculate the slitting correction amount and the die-cutting correction amount based on the width of the coated area and the width of the uncoated area, respectively;

[0059] It should be noted that this step is the core calculation part of the entire correction method. Separate calculation formulas exist for the two different cutting processes: die-cutting and slitting. These formulas are mathematical models established based on a comprehensive consideration of factors such as electrode manufacturing processes, cutting requirements, and potential deviations in actual production. By substituting the widths of the coated and uncoated areas measured in the previous steps into the corresponding formulas, the slitting correction amount and die-cutting correction amount can be calculated. These two correction amounts represent the adjustments required to the electrode or cutting mechanism during the slitting and die-cutting processes to ensure that the cut electrode dimensions meet the requirements.

[0060] S4. Based on the die-cutting correction amount and the slitting correction amount, perform closed-loop correction control on the die-cutting and slitting of the electrode sheet respectively.

[0061] It should be noted that after obtaining the die-cutting and slitting correction values, these values ​​are fed back to the corresponding correction actuators. Closed-loop correction control means that the correction actuators adjust the position of the electrode sheet or cutting mechanism in real time based on these correction values, and continuously monitor the size of the cut electrode sheet during the cutting process, comparing the actual size with the target size. If a deviation still exists, the correction value is adjusted again based on the new deviation, and this feedback and adjustment process continues until the size of the cut electrode sheet reaches the required accuracy range. This closed-loop control method ensures the cutting accuracy of the die-cutting and slitting processes, improving product quality.

[0062] In one embodiment of this example, step S2 can be further refined to include the following steps:

[0063] S21. Based on the front image, determine the width A1 of the coating area on the left side of the front, the width A2 of the coating area on the right side of the front, the width a1 of the uncoated area on the left side of the front, and the width a2 of the uncoated area on the right side of the front, respectively.

[0064] It should be noted that, please refer to Figure 2 Image processing techniques were used to analyze the acquired front-side image of the electrode. Specific algorithms (such as edge detection algorithms) were used to identify the boundaries between the coated and uncoated areas on the left and right sides of the front side. Then, the widths of the coated area on the left side (denoted as A1), the coated area on the right side (denoted as A2), the uncoated area on the left side (denoted as a1), and the uncoated area on the right side (denoted as a2) were measured. These width data form the basis for subsequent calculations of the correction amount; accurate measurement of these widths provides precise adjustment data for the die-cutting and slitting processes.

[0065] S22. Based on the reverse image, determine the width B1 of the coating area on the left side of the reverse side, the width B2 of the coating area on the right side of the reverse side, the width b1 of the uncoated area on the left side of the reverse side, and the width b2 of the uncoated area on the right side of the reverse side.

[0066] It should be noted that you should refer to this again. Figure 2 Similarly, image processing techniques are used to process the reverse side image of the electrode. The boundaries between the coated and uncoated areas on the left and right sides of the reverse side are identified, and the widths of the coated area on the left (B1), the coated area on the right (B2), the uncoated area on the left (b1), and the uncoated area on the right (b2) are measured. Obtaining the width information of these areas on the reverse side, and combining it with the data from the front side, allows for a comprehensive consideration of the front and back sides of the electrode, making the correction calculation more accurate.

[0067] Correspondingly, S3 can be further refined to include the following steps:

[0068] S31. Calculate the die-cutting correction amount according to the following formula;

[0069] Die-cutting correction amount = ((a1+b1)-(a2+b2)) / 4;

[0070] It should be noted that the principle behind this formula is based on a comprehensive consideration of the width of the uncoated areas on both sides of the electrode. By calculating the difference between the sum of the widths of the uncoated areas on the left side of the front and the left side of the back (a1+b1) and the sum of the widths of the uncoated areas on the right side of the front and the right side of the back (a2+b2), and then dividing by 4, the adjustment amount required for the die-cutting process is obtained. This calculation balances the impact of the difference in the width of the uncoated areas on the front and back on the die-cutting position, ensuring that the dimensions of the die-cut electrode meet the requirements.

[0071] S32. Calculate the cutting correction amount according to the following formula;

[0072] Segmentation correction amount = ((A1+B1)-(A2+B2)) / 4.

[0073] It should be noted that this formula is for calculating the width of the coating areas on both the left and right sides of the electrode. Calculate the difference between the sum of the widths of the coating areas on the left side of the front and the left side of the back (A1+B1) and the sum of the widths of the coating areas on the right side of the front and the right side of the back (A2+B2), then divide by 4 to obtain the correction amount for the slitting process. This formula can accurately adjust the slitting position based on the difference in the widths of the coating areas on the front and back, ensuring the dimensional accuracy of the slitting electrode.

[0074] In one embodiment of this example, on the other hand, S2 can be further refined to include the following steps:

[0075] S21. Based on the front image, determine the width A1 of the coating area on the left side of the front, the width A2 of the coating area on the right side of the front, the width a1 of the uncoated area on the left side of the front, and the width a2 of the uncoated area on the right side of the front, respectively.

[0076] It should be noted that, similar to S21 above, image processing techniques are used to analyze the front image of the electrode to identify the boundaries between the coated and uncoated areas on the left and right sides of the front image. The widths of the coated area on the left (A1), the coated area on the right (A2), the uncoated area on the left (a1), and the uncoated area on the right (a2) are then measured. These data provide relevant front-side information for subsequent calculations of the correction amount.

[0077] S22. Based on the reverse image, determine the width b1 of the uncoated area on the left side of the reverse side and the width b2 of the uncoated area on the right side of the reverse side.

[0078] It should be noted that the reverse side image of the electrode is processed, but here we only focus on the width of the uncoated areas on the left and right sides of the reverse side, which are measured and recorded as b1 and b2 respectively. Unlike the first implementation method, this implementation method simplifies the acquisition of reverse side data, only acquiring the width information of the uncoated areas, which is more in line with actual production needs in some cases and reduces the amount of data processing.

[0079] Correspondingly, S3 can be further refined to include the following steps:

[0080] S301. Calculate the die-cutting correction amount according to the following formula;

[0081] Die-cutting correction amount = ((a1+b1)-(a2+b2)) / 4;

[0082] It should be noted that, similarly, the calculation is based on the combined width of the uncoated areas on both sides of the front and back. By calculating the difference between the sum of the widths on both sides and dividing by 4, the correction amount for the die-cutting process is obtained, in order to balance the impact of the difference in the width of the uncoated areas on the front and back on the die-cutting position.

[0083] S302. Calculate the cutting correction amount according to the following formula;

[0084] Segmentation correction amount = ((a1-b1)-(a2-b2)+2×A1-2×A2) / 4.

[0085] It should be noted that this formula considers not only the difference in width between the uncoated areas on the front and back sides ((a1-b1)-(a2-b2)), but also the difference in width between the coated areas on the front side (2×A1-2×A2). This comprehensive calculation method allows for a more complete consideration of the dimensional relationships between the front and back sides of the electrode and between the coated and uncoated areas, thus enabling a more accurate calculation of the correction amount in the slitting process and ensuring slitting precision.

[0086] In one embodiment of this example, step S4 can be further refined to include the following steps:

[0087] S41. Determine the sign of the die-cutting correction amount and the slitting correction amount;

[0088] It's important to note that the sign of the correction amount is crucial in determining the electrode's movement direction. Mathematically, positive and negative numbers represent opposite directions. In the scenario of electrode cutting and correction, determining the sign of the correction amount clarifies whether the electrode should move left or right, providing accurate directional guidance for subsequent correction operations. This step is a vital logical step in the entire correction control process, ensuring that the correction action is performed in the correct direction.

[0089] S42. If the die-cutting correction amount is positive, the electrode is moved to the right by the distance of the die-cutting correction amount; if the die-cutting correction amount is negative, the electrode is moved to the left by the absolute value of the die-cutting correction amount.

[0090] It should be noted that when the die-cutting correction amount is positive, it means that according to the previously calculated results, the electrode is offset to the left from the ideal position at the current die-cutting position. To ensure that the die-cut electrode dimensions meet the requirements, the electrode needs to be moved to the right by the distance specified by the correction amount. For example, if the die-cutting correction amount is 2mm, then the electrode is moved 2mm to the right. This allows for more accurate cutting to the predetermined dimensions in subsequent die-cutting operations.

[0091] When the die-cutting correction amount is negative, it means that the electrode is offset to the right relative to the ideal position at the current die-cutting position. In this case, the electrode needs to be moved to the left, and the distance moved is the absolute value of the correction amount. Because the correction amount itself is negative, taking its absolute value gives the actual distance that needs to be moved. For example, if the die-cutting correction amount is -3mm, then the electrode should be moved 3mm to the left to ensure die-cutting accuracy.

[0092] S43. If the cutting correction amount is positive, the electrode is moved to the right by the distance of the cutting correction amount; if the cutting correction amount is negative, the electrode is moved to the left by the absolute value of the cutting correction amount.

[0093] It should be noted that, similar to the case where the die-cutting correction amount is positive, a positive slitting correction amount indicates that the electrode is offset to the left at the current slitting position. To ensure the electrode size meets requirements after slitting, the electrode needs to be moved to the right by the distance specified by the slitting correction amount. For example, if the slitting correction amount is 1.5mm, the electrode will be moved 1.5mm to the right to ensure the accuracy of the slitting operation.

[0094] When the slitting correction amount is negative, it means that the electrode is offset to the right at the current slitting position. Therefore, the electrode needs to be moved to the left by a distance equal to the absolute value of the slitting correction amount. For example, if the slitting correction amount is -2.5mm, then the electrode should be moved 2.5mm to the left to ensure that the dimensions of the slitting electrode meet the standard.

[0095] For example, when a1=3, a2=1, b1=3, b2=1, then the die cutting correction amount = (3+3)-(1+1)) / 4=1mm, that is, the electrode needs to be moved 1mm to the right during die cutting;

[0096] When a1=5, a2=1, b1=3, b2=2, then the die-cutting correction amount = (5+3)-(1+2)) / 4=1.25mm, that is, the electrode needs to be moved to the right by 1.25mm during die-cutting;

[0097] When a1=3, a2=3, b1=3, b2=3, A1=78, A2=80, then the cutting correction amount = ((3-3)-(3-3)+2*78-2*80) / 4=-1mm, that is, the electrode needs to be moved 1mm to the left during cutting.

[0098] In one embodiment of this example, step S4 can be further refined to include the following steps:

[0099] S401. Based on the die-cutting correction amount and the slitting correction amount, perform closed-loop correction control on the die-cutting and slitting of the electrode sheet respectively, and monitor the tension change of the electrode sheet in real time during the correction process.

[0100] It should be noted that closed-loop correction control is a feedback control system. It achieves precise control of the electrode position by continuously comparing the difference between the actual output (electrode position) and the desired output (preset die-cutting and slitting positions) (i.e., die-cutting correction amount and slitting correction amount). Based on this difference, it adjusts the control signal to achieve precise control of the electrode position. During the die-cutting and slitting process, various factors (such as equipment precision and material properties) may cause positional deviations in the electrode. Closed-loop correction control can detect these deviations in a timely manner and automatically adjust them.

[0101] During die-cutting and slitting, electrodes need to maintain a certain tension. Excessive tension may cause the electrodes to stretch, deform, or break, while insufficient tension may cause wrinkles or misalignment, affecting the accuracy of die-cutting and slitting as well as the overall quality of the electrodes. Real-time monitoring of tension changes can promptly detect abnormal tension and allow for appropriate adjustments.

[0102] S402. When the electrode tension exceeds the preset tension range, pause the correction and continue the correction after the tension returns to the preset tension range.

[0103] It should be noted that when the electrode tension exceeds the preset tension range, it indicates that the current stress state of the electrode is unstable. If the correction operation continues, the abnormal changes in electrode tension may lead to inaccurate correction, or even further increase the electrode deviation, affecting the quality of die-cutting and slitting. For example, if the electrode tension is too high, continued correction may cause the electrode to be overstretched, resulting in inaccurate die-cut dimensions or electrode breakage.

[0104] Once the tension returns to the preset range, the system will restart the correction operation and continue to adjust the position of the electrode according to the previously calculated die-cutting correction amount and slitting correction amount until the position of the electrode reaches the preset die-cutting and slitting position standards.

[0105] In one embodiment of this invention, the method further includes:

[0106] S5. After completing the correction control, return to execute S1 to S3 again to obtain new die-cutting correction amount and slitting correction amount;

[0107] It should be noted that a single correction control may not completely eliminate the positional deviation of the electrode during the die-cutting and slitting processes. By re-executing S1 to S3, the current die-cutting and slitting position information of the electrode can be obtained again, and then the new die-cutting correction amount and slitting correction amount can be recalculated. In this way, the correction strategy can be continuously adjusted according to the latest changes in the electrode position, gradually improving the accuracy of the correction and making the electrode position closer to the ideal state.

[0108] S6. Determine whether the absolute value of the new die-cutting correction amount is less than the first preset threshold and whether the absolute value of the new slitting correction amount is less than the second preset threshold.

[0109] It should be noted that the preset thresholds (first preset threshold and second preset threshold) are the standards for measuring whether the correction effect meets the requirements. By comparing the absolute values ​​of the new die-cutting correction amount and slitting correction amount with the corresponding preset thresholds, it can be determined whether the positional deviation of the electrode has been reduced to an acceptable range. If the absolute value of the correction amount is less than the preset threshold, it means that the position of the electrode is close to the ideal position, and the correction effect is good; otherwise, it indicates that further correction operations are needed.

[0110] S7. If the absolute value of the new die-cutting correction amount is less than the first preset threshold and the absolute value of the new slitting correction amount is less than the second preset threshold, then the correction is determined to be complete, and the current electrode position is maintained; otherwise, return to execute S4 until the requirements of the first preset threshold and the second preset threshold are met.

[0111] It should be noted that when the absolute value of the new die-cutting correction amount is less than the first preset threshold and the absolute value of the new slitting correction amount is less than the second preset threshold, it indicates that the electrode position has reached the expected accuracy requirement, and the correction process can end. At this time, the system will maintain the current position of the electrode and will no longer perform correction operations to ensure that the electrode maintains a stable position during subsequent die-cutting and slitting processes, thus ensuring the stability of product quality.

[0112] If the absolute value of the new correction amount does not meet the preset threshold, it indicates that the electrode position still has a large deviation, and correction control needs to continue. The system will automatically return to step S4 to readjust the electrode position based on the newly calculated die-cutting and slitting correction amounts. This process will repeat until the electrode position deviation meets the preset threshold.

[0113] Although this invention frequently uses terms such as electrode and coating area, the possibility of using other terms is not excluded. These terms are used merely for the convenience of describing and explaining the essence of this invention; interpreting them as any additional limitation would contradict the spirit of this invention.

[0114] This invention provides an automatic correction method for electrode film cutting and slitting. By simultaneously acquiring images of the front and back sides of the electrode and extracting the widths of the coated and uncoated areas respectively, and combining independent calculation formulas for die-cutting and slitting correction amounts, it enables collaborative closed-loop control of the die-cutting and slitting processes. This effectively overcomes the shortcomings of isolated processes and large cumulative errors in traditional technologies. The dual-formula mathematical model significantly improves the correction accuracy and stability, avoiding dimensional fluctuations. The linked analysis of front and back image data fundamentally ensures the consistency of front and back dimensions, completely changing the drawbacks of independent adjustment of the two sides. The entire correction process requires no manual intervention, automatically completing detection, calculation, and execution, greatly improving product consistency, yield, and production efficiency. It can be widely applied to the die-cutting and slitting manufacturing of lithium battery electrodes.

[0115] Example 2

[0116] Figure 3 This is a schematic diagram of the structure of a computer device provided in Embodiment 2 of the present invention. Figure 3 A block diagram of an exemplary computer device 12 suitable for implementing embodiments of the present invention is shown. Figure 3 The computer device 12 shown is merely an example and should not impose any limitation on the functionality and scope of use of the embodiments of the present invention.

[0117] like Figure 3As shown, the computer device 12 is represented in the form of a general-purpose computing device. The components of the computer device 12 may include, but are not limited to: one or more processors or processing units 16, system memory 28, and bus 18 connecting different system components (including system memory 28 and processing unit 16).

[0118] Bus 18 represents one or more of several bus architectures, including a memory bus or memory controller, a peripheral bus, a graphics acceleration port, a processor, or a local bus using any of the various bus architectures. For example, these architectures include, but are not limited to, the Industry Standard Architecture (ISA) bus, the Micro Channel Architecture (MAC) bus, the Enhanced ISA bus, the Video Electronics Standards Association (VESA) local bus, and the Peripheral Component Interconnect (PCI) bus.

[0119] Computer device 12 typically includes a variety of computer system readable media. These media can be any available media that can be accessed by computer device 12, including volatile and non-volatile media, removable and non-removable media.

[0120] System memory 28 may include computer system readable media in the form of volatile memory, such as random access memory (RAM) 30 and / or cache memory 32. Computer device 12 may further include other removable / non-removable, volatile / non-volatile computer system storage media. By way of example only, storage system 34 may be used to read and write non-removable, non-volatile magnetic media (…). Figure 3 Not shown; usually referred to as a "hard drive"). Although Figure 3 Not shown, a disk drive for reading and writing to a removable non-volatile disk (e.g., a "floppy disk") and an optical disk drive for reading and writing to a removable non-volatile optical disk (e.g., a CD-ROM, DVD-ROM, or other optical media) may be provided. In these cases, each drive may be connected to bus 18 via one or more data media interfaces. Memory 28 may include at least one program product having a set (e.g., at least one) of program modules configured to perform the functions of the embodiments of the present invention.

[0121] A program / utility 40 having a set (at least one) of program modules 42 may be stored, for example, in memory 28. Such program modules 42 include, but are not limited to, an operating system, one or more application programs, other program modules, and program data. Each or some combination of these examples may include an implementation of a network environment. Program modules 42 typically perform the functions and / or methods described in the embodiments of the present invention.

[0122] Computer device 12 can also communicate with one or more external devices 14 (e.g., keyboard, pointing device, display 24, etc.), and with one or more devices that enable a user to interact with the computer device 12, and / or with any device that enables the computer device 12 to communicate with one or more other computing devices (e.g., network card, modem, etc.). This communication can be performed via input / output (I / O) interface 22. Furthermore, computer device 12 can also communicate with one or more networks (e.g., local area network (LAN), wide area network (WAN), and / or public networks, such as the Internet) via network adapter 20. As shown, network adapter 20 communicates with other modules of computer device 12 via bus 18. It should be understood that, although... Figure 3 As not shown, it can be used in conjunction with computer device 12 with other hardware and / or software modules, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup storage systems.

[0123] The processing unit 16 executes various functional applications and data processing by running programs stored in the system memory 28, such as implementing the automatic correction method for electrode film cutting and slitting provided in the embodiments of the present invention.

[0124] Example 3

[0125] Embodiment 3 of the present invention provides a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, implement the automatic correction method for electrode film cutting and slitting as provided in all embodiments of the present invention.

[0126] Any combination of one or more computer-readable media may be used. A computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. A computer-readable storage medium can be, for example—but not limited to—an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples (a non-exhaustive list) of computer-readable storage media include: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this document, a computer-readable storage medium can be any tangible medium that contains or stores a program that can be used by or in connection with an instruction execution system, apparatus, or device.

[0127] Computer-readable signal media may include data signals propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media may also be any computer-readable medium other than computer-readable storage media, capable of sending, propagating, or transmitting programs for use by or in connection with an instruction execution system, apparatus, or device.

[0128] Program code contained on a computer-readable medium may be transmitted using any suitable medium, including—but not limited to—wireless, wire, optical fiber, RF, etc., or any suitable combination thereof.

[0129] Computer program code for performing the operations of this invention can be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, and C++, as well as conventional procedural programming languages ​​such as "C" or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network—including a local area network (LAN) or a wide area network (WAN)—or can be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0130] Finally, it should be noted that although the above embodiments have been described in the description and drawings of this invention, this should not limit the scope of patent protection of this invention. Any technical solutions that are based on the essential concept of this invention, utilize the content described in the description and drawings of this invention to make equivalent structural or procedural substitutions or modifications, as well as the direct or indirect application of the technical solutions of the above embodiments to other related technical fields, are all included within the scope of patent protection of this invention.

Claims

1. An automatic correction method for electrode film cutting and slitting, characterized in that, The method includes: S1. Obtain the front and back images of the electrode; S2. Determine the width of the coated area and the width of the uncoated area based on the front image and the back image, respectively; S3. Calculate the slitting correction amount and the die-cutting correction amount based on the width of the coated area and the width of the uncoated area, respectively; S4. Based on the die-cutting correction amount and the slitting correction amount, perform closed-loop correction control on the die-cutting and slitting of the electrode sheet respectively.

2. The automatic correction method for electrode film cutting and slitting according to claim 1, characterized in that, S2 includes: S21. Based on the front image, determine the width A1 of the coating area on the left side of the front, the width A2 of the coating area on the right side of the front, the width a1 of the uncoated area on the left side of the front, and the width a2 of the uncoated area on the right side of the front, respectively. S22. Based on the reverse image, determine the width B1 of the coating area on the left side of the reverse side, the width B2 of the coating area on the right side of the reverse side, the width b1 of the uncoated area on the left side of the reverse side, and the width b2 of the uncoated area on the right side of the reverse side.

3. The automatic correction method for electrode film cutting and slitting according to claim 2, characterized in that, S3 includes: S31. Calculate the die-cutting correction amount according to the following formula; Die-cutting correction amount = ((a1+b1)-(a2+b2)) / 4; S32. Calculate the cutting correction amount according to the following formula; Segmentation correction amount = ((A1+B1)-(A2+B2)) / 4.

4. The automatic correction method for electrode film cutting and slitting according to claim 1, characterized in that, S2 includes: S21. Based on the front image, determine the width A1 of the coating area on the left side of the front, the width A2 of the coating area on the right side of the front, the width a1 of the uncoated area on the left side of the front, and the width a2 of the uncoated area on the right side of the front, respectively. S22. Based on the reverse image, determine the width b1 of the uncoated area on the left side of the reverse side and the width b2 of the uncoated area on the right side of the reverse side.

5. The automatic correction method for electrode film cutting and slitting according to claim 4, characterized in that, S3 includes: S301. Calculate the die-cutting correction amount according to the following formula; Die-cutting correction amount = ((a1+b1)-(a2+b2)) / 4; S302. Calculate the cutting correction amount according to the following formula; Segmentation correction amount = ((a1-b1)-(a2-b2)+2×A1-2×A2) / 4.

6. The automatic correction method for electrode film cutting and slitting according to claim 1, characterized in that, S4 includes: S41. Determine the sign of the die-cutting correction amount and the slitting correction amount; S42. If the die-cutting correction amount is positive, the electrode is moved to the right by the distance of the die-cutting correction amount; if the die-cutting correction amount is negative, the electrode is moved to the left by the absolute value of the die-cutting correction amount. S43. If the cutting correction amount is positive, the electrode is moved to the right by the distance of the cutting correction amount; if the cutting correction amount is negative, the electrode is moved to the left by the absolute value of the cutting correction amount.

7. The automatic correction method for electrode film cutting and slitting according to claim 1, characterized in that, S4 includes: S401. Based on the die-cutting correction amount and the slitting correction amount, perform closed-loop correction control on the die-cutting and slitting of the electrode sheet respectively, and monitor the tension change of the electrode sheet in real time during the correction process. S402. When the electrode tension exceeds the preset tension range, pause the correction and continue the correction after the tension returns to the preset tension range.

8. The automatic correction method for electrode film cutting and slitting according to claim 1, characterized in that, The method further includes: S5. After completing the correction control, return to execute S1 to S3 again to obtain new die-cutting correction amount and slitting correction amount; S6. Determine whether the absolute value of the new die-cutting correction amount is less than the first preset threshold and whether the absolute value of the new slitting correction amount is less than the second preset threshold. S7. If the absolute value of the new die-cutting correction amount is less than the first preset threshold and the absolute value of the new slitting correction amount is less than the second preset threshold, then the correction is determined to be complete, and the current electrode position is maintained; otherwise, return to execute S4 until the requirements of the first preset threshold and the second preset threshold are met.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the automatic correction method for electrode film cutting and slitting as described in any one of claims 1-8.

10. A computer-readable storage medium having computer-executable instructions stored thereon, characterized in that, The computer-executable instructions are executed by a computer processor to implement the automatic correction method for electrode film cutting and slitting as described in any one of claims 1-8.

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