Laser testing system and method

Abstract

The present disclosure provides a laser testing system and method. The laser testing system comprises a base, a carrier, a moving seat, a function testing module and a driving mechanism. The base is provided with a testing station. The carrier is used to fix a laser to be tested, and the carrier can move relative to the base and move to the testing station. The moving seat is movably arranged on the base. The number of function testing modules is at least two, and each function testing module is installed on the moving seat. The driving mechanism is connected with the moving seat. The driving mechanism is configured to drive the moving seat to move, so that any one of the function testing modules moves to a position opposite to the carrier on the testing station. The laser testing method of the present disclosure is applied to the above laser testing system.

Description

Technical Field

[0001] This disclosure relates to a laser testing system and method. Background Technology

[0002] In the field of laser testing, it is often necessary to test multiple parameters of the same laser, such as power-current-voltage (PIV) characteristics, spectral characteristics, near-field spot size, and far-field divergence angle. To achieve these multiple tests, existing equipment typically uses the following method: instruments with different testing functions are fixed at different workstations, and the laser is moved to align with each testing instrument in turn to complete the corresponding test.

[0003] However, moving the laser presents several problems: The laser needs to maintain stable electrical contact with the powered probe during testing; frequent laser movement can easily lead to loosening or misalignment of the contact between the probe and the laser electrode, affecting test stability and measurement accuracy. Furthermore, multiple movements and repositionings reduce testing efficiency. On the other hand, the dispersed placement of various testing instruments results in a large overall footprint and low integration of the equipment. Summary of the Invention

[0004] This disclosure provides a laser testing system and method.

[0005] According to one aspect of this disclosure, a laser testing system is provided, comprising: a base with a testing station; a carrier for fixing a laser to be tested, the carrier being movable relative to the base and to the testing station; a movable base movably disposed on the base; functional testing modules, at least two of which are mounted on the movable base; and a drive mechanism connected to the movable base; wherein the drive mechanism is configured to drive the movable base to move, such that any one of the functional testing modules moves to a position opposite to the carrier on the testing station.

[0006] According to one aspect of the technical solution of this disclosure, after the laser under test is fixed to the carrier, the carrier moves to the test station, and the laser under test remains in a fixed position during the test. When it is necessary to switch test items, the drive mechanism drives the moving base to move, which in turn moves the functional test module mounted on the moving base, so that the required functional test module is positioned relative to the carrier on the test station, and thus the functional test module performs the corresponding test on the laser under test. This technical solution achieves test switching by moving the functional test module instead of moving the laser under test, reducing or even avoiding relative movement between the laser under test and the external electrical connection, which is beneficial to maintaining the stability of electrical contact, improving test accuracy and test efficiency. At the same time, mounting multiple functional test modules on the same moving base can reduce the space occupied by the equipment and improve the integration of the equipment.

[0007] According to an embodiment of the laser testing system disclosed herein, a base is provided with an electrode sleeve at the testing station, and a carrier is provided with a latch-type electrode assembly. The latch-type electrode assembly includes: an electrode latch post, which is electrically connected to the power supply terminal of the laser to be tested; and an operating component, which is connected to the electrode latch post and is used to control the lifting and lowering movement of the electrode latch post; wherein, when the carrier is located at the testing station and the electrode latch post is lowered, the electrode latch post engages with the electrode sleeve.

[0008] In this embodiment, the operating component controls the electrode latch to descend, causing it to engage with the electrode sleeve on the base, thereby supplying power to the laser under test. The electrode latch serves as both a conductive electrode and a mechanical latch; its descent simultaneously achieves positioning and locking as well as electrical connection, simplifying the operation and ensuring the reliability of the power supply connection after the carrier moves to the test station.

[0009] According to an embodiment of the laser testing system of the present disclosure, the base is provided with a vertically extending guide hole, and the latch-type electrode assembly further includes: a guide post, which is connected to the operating component and is positioned opposite to the guide hole; wherein, when the carrier is located at the test station and the electrode latch post is lowered, the guide post is at least partially confined within the guide hole.

[0010] In the technical solution of this embodiment, as the electrode latch descends, the guide post enters the guide hole, and the guide post and the guide hole cooperate to achieve auxiliary positioning of the carrier at the test station.

[0011] According to an embodiment of the laser testing system disclosed herein, a base is provided with a loading station, and a carrier is movable between the loading station and a testing station; the base is provided with a transverse slide rail, and the carrier is slidably disposed on the transverse slide rail and is capable of linearly moving along the transverse slide rail between the loading station and the testing station.

[0012] In this embodiment, the loading station is used to place and remove the laser to be tested, and the transverse slide rail guides the carrier to move linearly along a fixed trajectory between the loading station and the testing station. The operator only needs to push the carrier to send the laser to be tested from the loading station to the testing position, making the operation simple and convenient.

[0013] According to an embodiment of the laser testing system disclosed herein, the functional testing modules are arranged in a straight line along the moving direction of the movable base. The driving mechanism includes: a drive motor mounted on the base; a lead screw and nut module, the lead screw of the lead screw and nut module being connected to the drive motor for transmission, and the nut of the lead screw and nut module being fixedly connected to the movable base; and a limit switch disposed on the base for detecting the moving position of the movable base.

[0014] In this embodiment, the drive motor drives the movable base to move linearly via a lead screw and nut module, and each functional test module moves synchronously with the movable base. Simultaneously, a limit switch detects the position signal of the movable base, which can be fed back to the host computer or the drive motor controller to achieve closed-loop control, ensuring accurate alignment of the functional test module with the laser under test after each switch.

[0015] According to one embodiment of the laser testing system disclosed herein, the functional testing module includes a PIV / spectral testing module, a near-field spot testing module, and a far-field spot testing module.

[0016] According to one embodiment of the laser testing system of the present disclosure, the carrier is detachably provided with a fixture base for fixing a COS chip, a BAR bar, or a VCSEL laser.

[0017] In the technical solution of this embodiment, by changing the fixture base, the same carrier can be adapted to fix different types of lasers to be tested, including COS chips, BAR bars and VCSEL lasers, thus improving the applicability of the product.

[0018] According to another aspect of this disclosure, a laser testing method is provided, applied to a laser testing system, comprising: fixing the laser to be tested to a carrier and moving the carrier to a testing station; receiving test items selected by a user via a host computer, the test items including at least PIV / spectral testing, and at least one of near-field spot testing and far-field spot testing; driving a moving base to move according to the test items selected by the user via a drive mechanism, so that the corresponding functional test module moves to a position relative to the laser to be tested on the carrier located at the testing station; and supplying power to the laser to be tested and testing the selected test items through the functional test module.

[0019] According to another aspect of the technical solution disclosed herein, after the laser under test is fixed to the carrier and moved to the test station, its position remains unchanged. The host computer, based on the test item selected by the user, controls the drive mechanism to move the moving base, moving the corresponding functional test module to align with the laser under test, then powering on and executing the test. Throughout the testing process, switching between test items is achieved by moving the functional test module rather than the laser under test, avoiding relative movement between the laser under test and the electrical connection, ensuring the stability of the power supply connection, and simultaneously enabling the automatic execution of multiple test items at the same test station.

[0020] According to one embodiment of the laser testing method of this disclosure, when the user selects a test item including near-field spot test or far-field spot test, the camera integration time in the functional test module is adjusted to adapt to the power of the laser under test.

[0021] In this embodiment, the camera integration time can be automatically adjusted according to the power of the laser under test. When the laser under test has a high power, the integration time is shortened to avoid camera saturation; when the power is low, the integration time is extended to ensure image brightness. By adjusting the integration time instead of the traditional method of switching mechanical attenuators, the optical path structure is simplified and the testing range is expanded.

[0022] According to an embodiment of the laser testing method disclosed herein, before fixing the laser to be tested onto the carrier, the method further includes a calibration step: fixing a standard source laser onto the carrier and moving the carrier to the testing station; performing multi-point acquisition on the standard source laser to obtain multiple sets of test data; calculating calibration coefficients based on the multiple sets of test data; associating and storing the calibration coefficients with the corresponding product series number; and automatically calling the corresponding calibration coefficients to participate in the calculation based on the product series number selected by the user in subsequent tests.

[0023] In this embodiment, the calibration step involves multi-point acquisition and calculation of calibration coefficients using a standard source laser. These calibration coefficients are stored in a one-to-one correspondence with the product series number. When testing different models of lasers, only the corresponding product series number needs to be selected, and the system automatically retrieves the appropriate calibration coefficients, eliminating the need for repeated calibration and improving operational efficiency when testing multiple types of lasers. Attached Figure Description

[0024] The accompanying drawings illustrate exemplary embodiments of the present disclosure and, together with the description thereof, serve to explain the principles of the present disclosure. These drawings are included to provide a further understanding of the present disclosure and are incorporated in and constitute a part of this specification.

[0025] Figure 1 This is a schematic diagram of the external structure of a laser testing system according to one embodiment of the present disclosure.

[0026] Figure 2 This is a schematic diagram of the internal structure of a laser testing system according to one embodiment of the present disclosure.

[0027] Figure 3 This is a schematic diagram of the structure of some components of a laser testing system according to one embodiment of the present disclosure.

[0028] Figure 4 This is a perspective view of some components of a laser testing system according to one embodiment of the present disclosure.

[0029] Figure 5 This is a top view of some components of a laser testing system according to one embodiment of the present disclosure.

[0030] Figure 6 This is a schematic diagram of the structure of a vehicle according to one embodiment of the present disclosure.

[0031] Figure 7 This is a perspective view of a vehicle according to one embodiment of the present disclosure.

[0032] Figure 8 This is a schematic diagram of the structure of a carrier and an electrode sleeve according to one embodiment of the present disclosure.

[0033] Figure 9 This is a schematic diagram of the drive mechanism according to one embodiment of the present disclosure.

[0034] Figure 10 This is a flowchart of a laser testing method according to one embodiment of the present disclosure.

[0035] Figure 11 This is a flowchart of the calibration steps according to one embodiment of the present disclosure.

[0036] Figure label: 100 bases 110 Test Station 111 Electrode Sleeve 112 Guide Hole 120 Loading Station 121 Horizontal slide rail 122 Limit Block 200 vehicles 210 Latch-type electrode assembly 211 Electrode latch 212 Operating components 213 Guide Column 220 clamp base 221 Positioning slot 230 crimp probe module 300 mobile seat 400 Functional Test Module 410 PIV / Spectroscopy Module 411 Integrating Ball 420 Near-field Spot Testing Module 421 Near-field camera 430 Far-field spot test module 431 far-field camera 440 display screen 500 drive mechanism 510 drive motor 520 Screw and Nut Module 521 lead screw 522 Nut 600 Temperature Control Module 700 workbenches 710 Electrical control cabinet. Detailed Implementation

[0037] The present disclosure will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the disclosure. Furthermore, it should be noted that, for ease of description, only the parts relevant to the present disclosure are shown in the accompanying drawings.

[0038] It should be noted that, where there is no conflict, the embodiments and features described in this disclosure can be combined with each other. The technical solutions of this disclosure will now be described in detail with reference to the accompanying drawings and embodiments.

[0039] Unless otherwise stated, the exemplary implementations / embodiments shown are to be understood as providing exemplary features of various details that provide ways in which the technical concepts of this disclosure can be implemented in practice. Therefore, unless otherwise stated, the features of various implementations / embodiments may be additionally combined, separated, interchanged and / or rearranged without departing from the technical concepts of this disclosure.

[0040] To facilitate description and make the technical solutions of this disclosure easier to understand, the terminology of this disclosure will be explained before describing the technical solutions of this disclosure.

[0041] Carrier: refers to a support device used to fix the laser under test and which can move relative to the base, and can move the laser under test between the loading station and the testing station.

[0042] Mobile stand: refers to a platform structure that can be movably set on a base for installing and supporting multiple functional test modules, and moves along a preset path under the action of a drive mechanism.

[0043] Functional test module: refers to the device installed on the mobile base and used to perform specific test items on the laser under test. Each functional test module corresponds to a different test function.

[0044] Test station: refers to the working area on the base used to receive the carrier and position the laser to be tested on the carrier relative to the functional test module.

[0045] In existing technologies, when performing multi-parameter tests on lasers, instruments with different testing functions are typically fixed at different workstations. The laser is then moved to align with each testing instrument sequentially to complete the corresponding test. Moving the laser can easily lead to loosening or misalignment of the electrical contact between the laser and the power probe, affecting test stability and measurement accuracy. At the same time, repeated moving and repositioning also reduces test efficiency, and the dispersed placement of each testing instrument results in a large overall equipment footprint and low integration.

[0046] Figure 1 This is a schematic diagram of the external structure of a laser testing system according to one embodiment of the present disclosure. Figure 2 This is a schematic diagram of the internal structure of a laser testing system according to one embodiment of the present disclosure. Figure 3 This is a schematic diagram of the structure of some components of a laser testing system according to one embodiment of the present disclosure. Figure 4 This is a perspective view of some components of a laser testing system according to one embodiment of the present disclosure. Figure 5 This is a top view of some components of a laser testing system according to one embodiment of the present disclosure.

[0047] like Figures 1 to 5 As shown, this disclosure provides a laser testing system, including a base 100, a carrier 200, a movable base 300, functional testing modules 400, and a drive mechanism 500. The base 100 is provided with a testing station 110. The carrier 200 is used to fix the laser to be tested, and the carrier 200 is movable relative to the base 100 and can move to the testing station 110. The movable base 300 is movably disposed on the base 100. There are at least two functional testing modules 400, each mounted on the movable base 300. The drive mechanism 500 is connected to the movable base 300. The drive mechanism 500 is configured to drive the movable base 300 to move, so that any one of the functional testing modules 400 moves to a position opposite to the carrier 200 on the testing station 110.

[0048] In the laser testing system described above, after the laser under test is fixed on the carrier 200, the carrier 200 moves to the testing station 110, and the laser under test remains in the same position throughout the testing process. When it is necessary to switch test items, the drive mechanism 500 drives the moving base 300 to move, causing the functional test modules 400 mounted on the moving base 300 to move synchronously, so that the required functional test module 400 moves to a position relative to the laser under test on the carrier 200, and the functional test module 400 performs the corresponding test. Since the laser under test remains fixed at the testing station 110 throughout the testing process, there is no relative movement between it and the external electrical connection, thus reducing or even avoiding the problem of loose electrical contact caused by moving the laser, ensuring the stability of the power supply connection and the measurement accuracy. At the same time, the switching of test items is automatically completed by the drive mechanism 500, without the need for manual repositioning, improving testing efficiency. Last but not least, multiple functional test modules 400 are integrated into the same moving base 300, reducing the space occupied by the equipment and improving the integration of the system.

[0049] Figure 6 This is a schematic diagram of the structure of a vehicle according to one embodiment of the present disclosure. Figure 7 This is a perspective view of a vehicle according to one embodiment of the present disclosure. Figure 8 This is a schematic diagram of the structure of a carrier and an electrode sleeve according to one embodiment of the present disclosure.

[0050] like Figures 6 to 8 As shown, in some embodiments of this disclosure, the base 100 is provided with an electrode sleeve 111 at the test station 110, and the carrier 200 is provided with a latch-type electrode assembly 210, which includes an electrode latch post 211 and an operating component 212. The electrode latch post 211 is electrically connected to the power supply terminal of the laser under test. The operating component 212 is connected to the electrode latch post 211 and is used to control the lifting and lowering movement of the electrode latch post 211. When the carrier 200 is located at the test station 110 and the electrode latch post 211 is lowered, the electrode latch post 211 engages with the electrode sleeve 111.

[0051] The working principle of the aforementioned latch-type electrode assembly 210 is as follows: The operating component 212 can be in the form of a handle, lever, or knob. The operator moves or rotates the operating component 212 to move the electrode latch 211 vertically up and down. After the carrier 200 moves along the transverse slide rail 121 to the test station 110, the operator operates the operating component 212 to extend the electrode latch 211 downwards. The lower end of the electrode latch 211 enters the electrode sleeve 111 on the base 100, forming a plug-in engagement. The electrode latch 211 serves both as a conductor to transmit external power to the power supply end of the laser under test and as a mechanical latch to lock the carrier 200 in the test station 110, preventing accidental displacement of the carrier 200 during testing. The electrode sleeve 111 is equipped with conductive springs or conductive contacts, which form a reliable electrical connection when in contact with the electrode latch 211. The electrode sleeve 111 is connected to the laser power supply via a wire, and the driving current provided by the laser power supply is transmitted to the laser under test through the electrode sleeve 111 and the electrode latch 211.

[0052] As an example, the base 100 is provided with a vertically extending guide hole 112, and the latch-type electrode assembly 210 also includes a guide post 213. The guide post 213 is connected to the operating component 212 and is positioned opposite the guide hole 112. When the carrier 200 is in the test station 110 and the electrode latch post 211 is lowered, the guide post 213 is at least partially confined within the guide hole 112.

[0053] The guide post 213 and guide hole 112 can be configured such that the guide post 213 is fixed to the side of the operating component 212 or the electrode latch post 211, and moves up and down synchronously with the electrode latch post 211. The guide hole 112 is located on the base 100 at a position corresponding to the test station 110, and its diameter is slightly larger than the outer diameter of the guide post 213. When the operating component 212 lowers the electrode latch post 211, the guide post 213 enters the guide hole 112 before the electrode latch post 211. The outer wall of the guide post 213 contacts and engages with the inner wall of the guide hole 112, guiding the carrier 200 to make minor adjustments to its position relative to the base 100, so that the electrode latch post 211 is accurately aligned with the electrode sleeve 111. After the guide post 213 enters the guide hole 112, the position of the carrier 200 in the lateral and longitudinal directions is further constrained. The engagement of the guide post 213 and the guide hole 112 also prevents the conductive contacts inside the electrode sleeve 111 from being damaged due to misalignment during the insertion of the electrode latch post 211.

[0054] In some embodiments of this disclosure, the base 100 is provided with a loading station 120, and the carrier 200 is movable between the loading station 120 and the testing station 110. The base 100 is provided with a transverse slide rail 121, and the carrier 200 is slidably disposed on the transverse slide rail 121 and is capable of linearly moving along the transverse slide rail 121 between the loading station 120 and the testing station 110.

[0055] The loading station 120 and the transverse slide rail 121 can be configured as follows: the loading station 120 is located on both sides of the testing station 110, and the loading station 120 and the testing station 110 are arranged in the same straight line. The transverse slide rail 121 is fixedly installed on the upper surface of the base 100 and extends in the direction from the loading station 120 to the testing station 110. The bottom of the carrier 200 is provided with a slider that cooperates with the transverse slide rail 121, and the slider can slide freely along the transverse slide rail 121. The operator can install the laser to be tested onto the carrier 200 at the loading station 120, and then manually push the carrier 200 along the transverse slide rail 121 into the testing station 110; after the test is completed, the operator pulls the carrier 200 back to the loading station 120 along the transverse slide rail 121, removes the tested laser, and replaces the next laser to be tested. Limiting blocks 122 can be set at both ends of the transverse slide rail 121, corresponding to the stop positions of the loading station 120 and the testing station 110, respectively.

[0056] Figure 9 This is a schematic diagram of the drive mechanism according to one embodiment of the present disclosure.

[0057] like Figure 9 As shown, as an example, the functional test modules 400 are arranged in a straight line along the moving direction of the movable seat 300. The drive mechanism 500 includes a drive motor 510, a lead screw and nut module 520, and a limit switch (not shown). The drive motor 510 is mounted on the base 100. The lead screw 521 of the lead screw and nut module 520 is connected to the drive motor 510, and the nut 522 of the lead screw and nut module 520 is fixedly connected to the movable seat 300. The limit switch is located on the base 100 and is used to detect the moving position of the movable seat 300.

[0058] Specifically, the installation method and transmission relationship of the aforementioned drive mechanism 500 can be as follows: the drive motor 510 is fixedly installed on the side or bottom of the base 100, and the motor output shaft is connected to one end of the lead screw 521 via a coupling. The two ends of the lead screw 521 are rotatably supported on the base 100 via bearing seats. The axial direction of the lead screw 521 is parallel to the extension direction of the transverse slide rail 121, so that the movement direction of the movable seat 300 is parallel to the movement direction of the carrier 200. The nut 522 is screwed onto the lead screw 521, and the movable seat 300 is fixedly connected to the nut 522 by screws or welding. When the drive motor 510 drives the lead screw 521 to rotate, the nut 522 moves axially along the lead screw 521, thereby driving the movable seat 300 and its various functional test modules 400 to move synchronously. The drive motor 510 can be a stepper motor or a servo motor.

[0059] The number and arrangement of the limit switches are determined based on the number and spacing of the functional test modules 400. Each limit switch is spaced apart on the base 100 along the movement path of the movable seat 300, with the spacing between two adjacent limit switches equal to the spacing between two adjacent functional test modules 400. When the movable seat 300 moves to a position where a functional test module 400 is aligned with the laser under test on the test station 110, the corresponding limit switch is triggered, sending a position signal to the control system, stopping the drive motor 510, and achieving accurate positioning of the functional test module 400. The limit switches can be photoelectric switches, Hall effect switches, or mechanical contact limit switches.

[0060] In some embodiments of this disclosure, the functional test module 400 includes a PIV / spectral test module 410, a near-field spot test module 420, and a far-field spot test module 430.

[0061] The PIV / spectral testing module 410 includes an integrating sphere 411 and a spectrometer interface mounted on the integrating sphere 411. The integrating sphere 411 is fixedly mounted on the movable base 300, with its optical input port facing the test station 110. The integrating sphere 411 contains a PD photodetector for acquiring laser power signals. The spectrometer interface is located on the side wall of the integrating sphere 411 and connects to an external spectrometer via optical fiber. When the PIV / spectral testing module 410 moves to a position opposite the laser under test, the beam emitted by the laser under test directly enters the optical input port of the integrating sphere 411. After multiple diffuse reflections and homogenization by the inner wall of the integrating sphere 411, part of the light is received by the PD photodetector and converted into an electrical signal for PIV testing; the other part of the light enters the spectrometer via the spectrometer interface for spectral testing. PIV testing and spectral testing can be completed synchronously under the same power-on state.

[0062] In some embodiments of this disclosure, the water-cooling of the integrating sphere 411 and the power attenuation at the camera end operate independently. The integrating sphere 411 dissipates heat through a water-cooling channel and a water chiller, and the camera adapts to the laser under test with different power by adjusting the integration time. The two do not need to be coordinated, simplifying the system control logic.

[0063] The near-field spot testing module 420 includes a near-field camera 421 and an optical attenuation device (not shown). The near-field camera 421 is an indium gallium arsenide broadband near-infrared camera with a wavelength response range of 800-1700 nm. The optical attenuation device is mounted at the front of the lens of the near-field camera 421 and is used to attenuate the beam emitted by the laser under test to an intensity range that the camera can receive. When the near-field spot testing module 420 is moved to a position opposite to the laser under test, the emitting surface of the laser under test faces the lens of the near-field camera 421, and the camera directly captures the near-field spot image of the emitting surface of the laser.

[0064] The far-field spot testing module 430 includes a far-field camera 431. A display screen 440 is also fixedly mounted on the base 100, with a preset far-field testing distance between the display screen 440 and the testing station 110. When the far-field spot testing module 430 moves to a position opposite the laser under test, the beam emitted by the laser under test is directly projected onto the display screen 440 to form a far-field spot. The far-field camera 431 is aligned with the display screen 440 to capture the spot image. The host computer calculates the far-field divergence angle based on the captured spot image using the full width at half maximum (FWHM) method.

[0065] In some embodiments of this disclosure, the carrier 200 is detachably equipped with a fixture base 220 for securing COS chips, BAR strips, or VCSEL lasers. The fixture base 220 is connected to the carrier 200 body via screws or a quick-release mechanism. For different types of lasers under test, corresponding fixture bases 220 are configured, each fixture base 220 having a positioning groove 221 or positioning surface matching the package size of the corresponding laser. When changing the type of laser under test, only the corresponding fixture base 220 needs to be replaced; the carrier 200 body and other components remain interchangeable.

[0066] In some embodiments of this disclosure, the laser testing system further includes a power supply module. The power supply module supports both continuous wave and quasi-continuous wave power-up modes. In quasi-continuous wave power-up mode, the pulse width is adjustable, with typical pulse widths including 10μs, 50μs, 100μs, and 200μs, and the operating repetition rate is less than or equal to 1kHz and continuously adjustable. The power supply module provides drive current to the laser under test, and simultaneously acquires current and voltage parameters and transmits them to a host computer.

[0067] For example, current acquisition is divided into two ranges: within the range of 0A to 10A, the current resolution is less than or equal to 0.1mA; and within the range of 10A to 120A, the current resolution is less than or equal to 100mA. Power acquisition is divided into three ranges: within the range of 0W to 10W, the power resolution is less than or equal to 0.1mW; within the range of 10W to 100W, the power resolution is less than or equal to 10mW; and within the range of 100W to 200W, the power resolution is less than or equal to 100mW. This segmented range design ensures that the system maintains appropriate measurement accuracy when testing lasers under test at different power levels.

[0068] In some embodiments of this disclosure, the laser testing system further includes a temperature control module 600. The temperature control module 600 includes a TEC temperature control unit and a water-cooled temperature control unit. The water-cooled temperature control unit has a built-in water chiller with a cooling capacity greater than or equal to 2kW. The operating temperature range of the temperature control module 600 is adjustable from 10℃ to 85℃, with a temperature control accuracy less than or equal to 0.1℃. The TEC temperature control unit is used for testing scenarios requiring high temperature control accuracy, while the water-cooled temperature control unit is used for heat dissipation during high-power laser testing. The outer wall of the integrating sphere 411 is provided with a water-cooling channel, which is connected to the water chiller. Circulating coolant carries away the heat accumulated by the integrating sphere 411 during high-power testing, preventing performance drift or damage to the integrating sphere 411 due to overheating.

[0069] In some embodiments of this disclosure, the integrating sphere 411 is designed and fabricated according to the power, spot size, and divergence angle of the laser under test. The integrating sphere 411 contains a PD photodetector with a wavelength response range of 800 nm to 1700 nm. A spectrometer is connected to the spectrometer interface on the integrating sphere 411 via optical fiber. The spectrometer has a wavelength measurement range of 600 nm to 1700 nm and a wavelength resolution less than or equal to 0.1 nm.

[0070] In some embodiments of this disclosure, the cameras in the near-field spot testing module 420 and the far-field spot testing module 430 are both indium gallium arsenide broadband near-infrared cameras with a wavelength response range of 800 nm to 1700 nm. The camera lens is configured with an appropriate magnification and focal length based on the wavelength and spot parameters of the laser under test. The camera is equipped with an optical attenuation device, which is installed at the front end of the camera lens and has an appropriate attenuation ratio selected based on the wavelength, power, and spot parameters of the laser under test. This device attenuates the laser power entering the camera to within the safe operating range of the camera sensor.

[0071] In some embodiments of this disclosure, near-field spot testing and far-field spot testing employ different optical path arrangements. In near-field spot testing mode, the emitting surface of the laser under test faces the lens of the near-field camera 421, and the camera directly captures the spot image of the emitting surface; the optical path is a direct path. In far-field spot testing mode, the beam emitted by the laser under test is directly projected onto the display screen 440 to form a far-field spot, and the far-field camera 431 is aligned with the display screen 440 to capture the spot image; the optical path is a projection path. All three testing modes—PIV / spectral testing, near-field spot testing, and far-field spot testing—are direct-view methods, without using switching optical elements such as mirrors or beam splitters.

[0072] In some embodiments of this disclosure, the overall structure of the laser testing system includes a workbench 700, which serves as the main frame and supporting platform of the equipment. Above the workbench 700 are arranged laser testing stations 110, a movable seat 300, and various functional testing modules 400. Below the workbench 700 is an electrical control cabinet 710, which houses a host computer, a test control board, a power supply module, and other control hardware. The TEC temperature control unit and the water-cooled temperature control unit are integrated inside the workbench 700. The overall dimensions of the equipment are approximately 1500mm wide, 1800mm high, and 1000mm deep.

[0073] In some embodiments of this disclosure, the laser testing system further includes a test control board. Exemplarily, the test control board is an embedded circuit board installed within the electrical control cabinet 710. The test control board is electrically connected to the PD photodetector, the temperature sensor, and the host computer. The test control board acquires the power signal output from the PD photodetector and the temperature signal output from the temperature sensor, performs analog-to-digital conversion and computational processing, and then transmits the data to the host computer. The host computer summarizes the power and temperature data acquired by the test control board with the current and voltage data acquired by the laser power supply, plots a PIV curve, and extracts relevant photoelectric parameters.

[0074] In some embodiments of this disclosure, the host computer is configured to provide a test item selection interface. Users can select the test items to be performed on this interface, where PIV testing and spectral testing are mandatory by default, while near-field spot testing and far-field spot testing are optional. After the user completes the selection and clicks "Start Test," the host computer controls the drive mechanism 500 to drive the moving base 300 according to the user's selected test items, sequentially moving the corresponding functional test modules 400 to positions opposite the laser under test and performing the corresponding tests. If the user does not select near-field spot testing or far-field spot testing, the moving base 300 will skip the corresponding functional test modules 400 and only move the PIV / spectral testing module 410 into position.

[0075] After the test is completed, the host computer compares the measured parameters with the user-preset thresholds and automatically determines whether the test result is qualified. If the result is deemed unqualified, the host computer performs the following operations: marks the test as unqualified in the generated test report, displays a warning message on the host computer interface, and records detailed data of the test for future reference. Detailed data includes information such as drive current, operating voltage, output power, wavelength, and temperature at the time of the unqualified result. If the result is deemed qualified, the host computer generates a test report normally without triggering a warning message.

[0076] The host computer is also equipped with a comparison and analysis interface. The comparison and analysis interface allows users to select multiple historical test results, and the system compares and displays the test current and wavelength of multiple sets of test data to assist users in performance analysis.

[0077] In some embodiments of this disclosure, in quasi-continuous wave power-on mode, the testing method employs a power-on-first, data acquisition-later timing sequence. The host computer controls the power supply module to first apply a driving current to the laser under test. After the power supply stabilizes, the various functional test modules 400 are triggered to acquire data. The acquisition time is set to be greater than ten times the pulse width to ensure that a sufficient number of pulses are covered within one acquisition cycle to obtain a stable average measurement value, without needing to consider precise time synchronization between acquisition and pulses.

[0078] According to another aspect of this disclosure, a technical solution for a laser testing method is provided. By fixing the laser under test to the test station 110 and keeping its position unchanged, the driving mechanism 500 drives the moving seat 300 to switch different functional test modules 400 to be aligned with the laser under test in sequence. This enables the integrated execution of multiple test items at the same station, avoids the problem of unstable electrical contact caused by moving the laser under test during the test, and improves the test efficiency and equipment integration.

[0079] The application scenario of this disclosure can be multi-parameter automated testing on semiconductor laser production lines, and it is suitable for integrated testing of power-current-voltage characteristics, spectral characteristics, near-field spot size and far-field divergence angle of COS chips, BAR bars and VCSEL lasers.

[0080] Figure 10 This is a flowchart of a laser testing method according to one embodiment of the present disclosure.

[0081] like Figure 10 The laser testing method M100 shown includes steps S110 to S140. This method can be executed collaboratively by a host computer, drive mechanism 500, and functional test module 400 in the laser testing system. The host computer can be an industrial computer with test control software installed, and it is communicatively connected to the drive mechanism 500, power supply module, and each functional test module 400 to send control commands and receive test data.

[0082] In step S110, the laser to be tested is fixed to the carrier 200, and the carrier 200 is moved to the test station 110.

[0083] Here, carrier 200 refers to a support device used to fix the laser under test and which can move relative to base 100. Test station 110 refers to the working area on base 100 used to receive carrier 200 and position the laser under test on carrier 200 relative to functional test module 400.

[0084] For example, the carrier 200 can move between the loading station 120 and the testing station 110. The loading station 120 is located in the front region of the base 100, and the testing station 110 is located in the middle region of the base 100, both arranged in the same straight line direction.

[0085] As an example, after the carrier 200 moves to the test station 110, the operator operates the operating part 212 of the latch-type electrode assembly 210 on the carrier 200, causing the electrode latch 211 to descend and dock with the electrode sleeve 111 on the base 100, thus completing the electrical connection of the laser to be tested and the mechanical locking of the carrier 200.

[0086] Through step S110, the laser under test is fixed at the test station 110 before the test begins and will not move during the subsequent test, thereby avoiding the problem of loose electrical contact caused by the change of position of the laser under test.

[0087] In step S120, the host computer receives the test items selected by the user. The test items include at least PIV / spectral testing, and also at least one of near-field spot testing and far-field spot testing.

[0088] Among them, PIV / spectral testing refers to power-current-voltage characteristic testing and spectral characteristic testing of the laser under test. Near-field spot testing refers to directly imaging and photographing the emitting surface of the laser under test. Far-field spot testing refers to photographing the far-field spot projection of the laser under test and calculating the divergence angle.

[0089] For example, the host computer's display interface provides a test item selection area, where users select the test items to be performed by checking checkboxes. The checkboxes for PIV test and spectral test are selected by default and cannot be deselected; the checkboxes for near-field spot test and far-field spot test can be checked or deselected by the user. After the user completes the selection, they click the "Start Test" button, and the host computer records the combination of test items selected by the user.

[0090] Through step S120, users can flexibly configure test items according to actual testing needs, avoid executing unnecessary tests, and save testing time.

[0091] In step S130, according to the test item selected by the user, the moving seat 300 is moved by the drive mechanism 500, so that the corresponding functional test module 400 is moved to a position opposite to the laser to be tested on the carrier 200 located at the test station 110.

[0092] The drive mechanism 500 refers to the device used to drive the movable base 300 to move along a preset path. The functional test module 400 refers to the device installed on the movable base 300 to perform specific test items. The functional test modules 400 are arranged in a straight line along the moving direction of the movable base 300.

[0093] For example, the host computer determines which functional test modules 400 need to be called and the order in which they are called based on the test items selected by the user. The host computer sends control commands to the drive mechanism 500, which drives the moving base 300 to move along the linear slide rail, moving the first required functional test module 400 to a position aligned with the laser under test. After the functional test module 400 completes its corresponding test, the host computer controls the drive mechanism 500 to drive the moving base 300 again to move the next functional test module 400 into place, until all selected test items have been executed.

[0094] As an example, when the user simultaneously selects PIV / spectral testing, near-field spot testing, and far-field spot testing, the host computer first controls the moving base 300 to move the PIV / spectral testing module 410 to align with the laser under test, performing the PIV and spectral tests. Then, it controls the moving base 300 to move the near-field spot testing module 420 into position, performing the near-field spot test. Finally, it controls the moving base 300 to move the far-field spot testing module 430 into position, performing the far-field spot test. When the user only selects PIV / spectral testing, the moving base 300 only moves the PIV / spectral testing module 410 into position, without moving the near-field spot testing module 420 or the far-field spot testing module 430.

[0095] Through step S130, the switching of test items is automatically completed by the drive mechanism 500, without the need for manual repositioning or moving of the laser to be tested, thus improving the switching accuracy and efficiency.

[0096] In step S140, power is supplied to the laser under test, and the selected test items are tested through the functional test module 400.

[0097] The power supply refers to providing driving current to the laser under test through the power supply module. The power supply module can provide power in two ways: continuous wave and quasi-continuous wave.

[0098] For example, in the quasi-continuous wave power-on mode, a power-on-demand sequence is adopted. The host computer controls the power supply module to first apply a driving current to the laser under test. After the power supply stabilizes, the functional test module 400 is triggered to perform data acquisition. The acquisition time is set to be greater than ten times the pulse width to ensure that a sufficient number of pulses are covered within the acquisition period to obtain a stable average measurement value.

[0099] As an example, after the PIV / spectral testing module 410 is aligned with and powered on the laser under test, the beam emitted by the laser under test directly enters the optical input port of the integrating sphere 411. The PD photodetector collects the power signal, and the spectrometer synchronously collects the spectral signal through the spectrometer interface on the integrating sphere 411. The host computer summarizes the power, current, voltage, and spectral data, and plots the PIV curve and spectrum. After the near-field spot testing module 420 is aligned with and powered on the laser under test, the near-field camera 421 directly captures the near-field spot image of the emitting surface of the laser under test. After the far-field spot testing module 430 is aligned with and powered on the laser under test, the beam emitted by the laser under test is directly projected onto the display screen 440 to form a far-field spot. The far-field camera 431 captures the spot image on the display screen 440, and the host computer calculates the far-field divergence angle based on the spot image.

[0100] Through step S140, multiple test items are executed sequentially at the same test station 110. The laser under test remains fixed throughout the process, and the power supply connection is stable and reliable.

[0101] In some embodiments of this disclosure, when the user selects a test item including near-field spot testing or far-field spot testing, the laser testing method further includes: adjusting the camera integration time in the functional testing module 400 to adapt to the power of the laser under test. Here, camera integration time refers to the length of time the camera sensor accumulates the light signal during a single exposure.

[0102] For example, when the laser under test has a high power, the host computer automatically shortens the camera integration time to prevent the camera sensor from saturating due to receiving too much light signal; when the laser under test has a low power, the host computer automatically extends the camera integration time to ensure that the captured image has sufficient brightness. The adjustment range of the integration time covers from microseconds to milliseconds.

[0103] By automatically adjusting the camera integration time instead of switching mechanical attenuators, the optical path structure is simplified, mechanical actions are reduced, and the dynamic testing range is expanded, allowing the same camera to adapt to lasers of different power levels.

[0104] Figure 11 This is a flowchart of the calibration steps according to one embodiment of the present disclosure.

[0105] like Figure 11 As shown, in some embodiments of this disclosure, before fixing the laser to be tested onto the carrier 200 in step S110, the laser testing method further includes calibration steps S101 to S105.

[0106] In step S101, the standard source laser is fixed to the carrier 200, and the carrier 200 is moved to the test station 110. The standard source laser refers to a standard laser with known photoelectric parameters, used to calibrate the measurement accuracy of the test system.

[0107] In step S102, multiple points of data are collected from the standard source laser to obtain multiple sets of test data. For example, the standard source laser is measured multiple times under different driving currents, and parameters such as power and wavelength are recorded for each measurement to obtain multiple sets of test data.

[0108] In step S103, calibration coefficients are calculated based on multiple sets of test data. Calibration coefficients refer to multiplicative factors or additive offsets used to correct measured parameters in subsequent tests. For example, the known parameters of the standard source laser are compared with the measured parameters of the system, and the ratio or difference between the two is calculated as the calibration coefficient.

[0109] In step S104, the calibration coefficients are associated with and stored as the corresponding product series number. The product series number refers to the identification number defined by the user for different types or models of lasers under test. For example, the host computer provides a product series number input box in the calibration interface. After the user enters the number and clicks save, the calibration coefficients are bound to that number and stored in the host computer's database.

[0110] In step S105, during subsequent tests, the corresponding calibration coefficient is automatically retrieved based on the product series number selected by the user for calculation. For example, the user selects the product series number corresponding to this test from the product series number drop-down list on the test interface. The host computer automatically retrieves the calibration coefficient from the database, multiplies or adds the calibration coefficient when calculating the test result, and outputs the calibrated measurement value.

[0111] Through calibration steps S101 to S105, independent calibration coefficients can be established for different models of lasers under test. During subsequent tests, only the product series number needs to be selected for automatic recall, eliminating the need for repeated calibration each time the laser model is changed, thus improving the operational efficiency when testing multiple types of lasers.

[0112] In some embodiments of this disclosure, when the laser under test is fixed to the carrier 200, electrical contact is achieved between the laser under test and its electrodes via a crimp probe module 230. The crimp probe module 230 is mounted above the carrier 200 and includes a liftable probe holder and multiple probes disposed at the lower end of the probe holder. The positions of the probes correspond to the positions of the electrodes of the laser under test. At the start of the test, the probe holder descends, and the probes crimp onto the electrode surface of the laser under test, establishing an electrical connection; after the test is completed, the probe holder rises, and the probes separate from the electrodes. The crimping and lifting actions of the probes can be performed manually or automatically by a drive mechanism. The crimp probe module 230, together with the latch-type electrode assembly 210, forms a complete electrical path between the laser under test and an external power source.

[0113] In some embodiments of this disclosure, the laser testing system employs the following workflow during testing: The operator places the laser to be tested onto the carrier 200 at the loading station 120 and presses the electrodes using the pressing probe module 230; the operator pushes the carrier 200 along the transverse slide rail 121 to the testing station 110, and operates the latch-type electrode assembly 210 to lower the electrode latch 211 and mate it with the electrode sleeve 111, completing the electrical connection and mechanical locking; the operator sets test parameters such as temperature and electrical parameters on the host computer interface, and selects the tests to be performed. For the test item, click the "Start Test" button; the host computer, according to the user's selection, sequentially drives the moving base 300 to move the corresponding functional test module 400 to align with the laser under test, and controls the power supply module to supply power to the laser under test, and performs data acquisition; after the test is completed, the host computer automatically generates a test report and determines whether the test result is qualified; the operator operates the latch-type electrode assembly 210 to raise the electrode latch 211, pulls the carrier 200 back to the loading station 120, lifts the crimping probe module 230, takes out the tested laser, and completes one test cycle.

[0114] The working process of the laser testing system based on the above technical solution is as follows: The operator places the laser to be tested on the carrier 200 of the loading station 120, selects the corresponding fixture base 220 according to the type of laser to be tested, and fixes the laser to be tested in the positioning groove 221 or positioning surface of the fixture base 220. By pressing down the probe module 230, the probe is brought into contact with the electrode surface of the laser to be tested, and a preliminary electrical connection is established.

[0115] The operator manually pushes the carrier 200, and the slider at the bottom of the carrier 200 slides along the transverse slide rail 121 on the base 100, moving the carrier 200 linearly from the loading station 120 to the testing station 110. After the carrier 200 is in place, the operator operates or rotates the operating part 212 of the latch-type electrode assembly 210, causing the electrode latch 211 to descend. The lower end of the electrode latch 211 enters the electrode sleeve 111 on the base 100, forming a plug-in fit. The electrode latch 211 transmits external power to the power supply end of the laser under test and locks the carrier 200 in the testing station 110. During the descent of the electrode latch 211, the guide post 213 enters the guide hole 112 before the electrode latch 211, guiding the carrier 200 to fine-tune its position and ensuring that the electrode latch 211 and the electrode sleeve 111 are accurately aligned.

[0116] The operator selects the required tests on the host computer's test item selection interface. PIV and spectral tests are mandatory by default and cannot be deselected; near-field and far-field spot tests are optional, and the operator can select or deselect them according to actual needs. After setting test parameters such as temperature, drive current range, and pulse width, the operator clicks the "Start Test" button.

[0117] The host computer sends control commands to the drive mechanism 500 based on the test items selected by the operator. The drive motor 510 drives the lead screw 521 to rotate, and the lead screw 521 drives the nut 522 and the movable seat 300 fixed thereto to move along the axial direction of the lead screw 521. The movable seat 300 drives the PIV / spectrum test module 410, the near-field spot test module 420, and the far-field spot test module 430 mounted thereon to move synchronously. When the PIV / spectrum test module 410 moves to a position opposite to the laser under test on the test station 110, the corresponding limit switch is triggered, sending a position signal to the control system, and the drive motor 510 stops running.

[0118] The host computer controls the power supply module to provide driving current to the laser under test. In continuous wave power-up mode, the power supply module outputs continuous current; in quasi-continuous wave power-up mode, it outputs pulsed current according to the set pulse width and repetition rate. After the power supply stabilizes, the laser under test emits a beam, which directly enters the optical input port of the integrating sphere 411. After multiple diffuse reflections and homogenization by the inner wall of the integrating sphere 411, part of the beam is received by the PD photodetector and converted into an electrical signal for PIV testing; the other part enters the spectrometer via the spectrometer interface on the side wall of the integrating sphere 411 for spectral testing. The test control board collects the power signal output by the PD photodetector and the temperature signal output by the temperature sensor, while the power supply module collects current and voltage signals. All data are aggregated and sent to the host computer. The host computer plots the PIV curve and spectrum, and extracts the photoelectric parameters.

[0119] The photoelectric parameters automatically extracted by the host computer include: PIV curve, electro-optical conversion efficiency, slope efficiency, series resistance, threshold current, turn-on voltage, center wavelength, full width at half maximum (FWHM), wavelength temperature drift curve, power temperature drift curve, near-field spot image, light intensity curve, fast-axis divergence angle, slow-axis divergence angle, and spot energy (95%). Among these, the slope efficiency and series resistance are calculated based on the PIV curve using a linear regression fitting method, while the far-field divergence angle is calculated based on the spot image using the full width at half maximum (FWHM) method.

[0120] After the PIV / spectral test is completed, if the operator selects the near-field spot test, the host computer controls the drive motor 510 to restart, driving the moving base 300 to move the near-field spot test module 420 to a position opposite to the laser under test. Once in position, the emitting surface of the laser under test faces the lens of the near-field camera 421. The host computer automatically adjusts the camera integration time according to the power of the laser under test. Higher power results in a shorter integration time, while lower power results in a longer integration time. The optical attenuation device attenuates the beam entering the camera to within the sensor's safe operating range. The camera directly captures the near-field spot image of the emitting surface of the laser under test, and the image data is transmitted to the host computer.

[0121] After the near-field spot test is completed, if the operator selects the far-field spot test, the host computer controls the moving base 300 to move the far-field spot test module 430 to a position opposite to the laser under test. Once in position, the beam emitted by the laser under test is directly projected onto the display screen 440 fixed on the base 100, forming a far-field spot on the display screen 440. The far-field camera 431 is aimed at the display screen 440 to capture the spot image, and the host computer calculates the fast-axis divergence angle and slow-axis divergence angle based on the captured spot image using the full width at half maximum (FWHM) method.

[0122] After all selected test items are completed, the host computer compares the measured parameters with the operator's preset thresholds and automatically determines whether the test results are qualified. If qualified, the host computer generates a test report normally; if unqualified, the host computer marks the test report as unqualified, pops up a warning message on the interface, and records detailed data such as drive current, operating voltage, output power, wavelength, and temperature at the time of unqualification.

[0123] After the test is completed, the operator moves the operating component 212 to raise the electrode latch 211, separating it from the electrode sleeve 111, and unlocking the carrier 200. The operator then pulls the carrier 200 along the transverse slide rail 121 from the test station 110 back to the loading station 120, lifts the crimping probe module 230, and removes the tested laser. A complete test cycle ends, and the operator can place the next laser to be tested and begin a new test cycle.

[0124] If the operator changes to a different model of laser under test, calibration is required before formal testing. The operator fixes the standard source laser on the carrier 200 and moves it to the test station 110, performing multi-point data acquisition under different drive currents to obtain multiple sets of test data. The host computer calculates the calibration coefficient based on the known and measured parameters of the standard source laser. The operator inputs the corresponding product series number, and the calibration coefficient is associated with and stored with the product series number. When testing this model of laser in subsequent tests, the operator selects the corresponding product series number on the host computer interface, and the host computer automatically calls up the calibration coefficient to participate in the calculation and outputs the calibrated measurement value.

[0125] In the description of this specification, the references to terms such as "one embodiment / mode," "some embodiments / modes," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment / mode or example is included in at least one embodiment / mode or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment / mode or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments / modes or examples. Furthermore, without contradiction, those skilled in the art can combine and integrate the different embodiments / modes or examples described in this specification, as well as the features of different embodiments / modes or examples.

[0126] Those skilled in the art should understand that the above embodiments are merely for illustrating the present disclosure and are not intended to limit the scope of the disclosure. Those skilled in the art can make other changes or modifications based on the above disclosure, and these changes or modifications still fall within the scope of the present disclosure.

Claims

1. A laser testing system, characterized in that, include: The base is equipped with a testing station; A carrier for fixing the laser to be tested, the carrier being movable relative to the base and to the test station; A movable base, which is movably disposed on the base; A functional test module, wherein there are at least two functional test modules, and each functional test module is installed on the mobile base; as well as A drive mechanism is connected to the movable base; The drive mechanism is configured to drive the movable seat to move, so that any one of the functional test modules moves to a position opposite to the carrier on the test station.

2. The laser testing system according to claim 1, characterized in that, The base is provided with an electrode sleeve at the test station, and the carrier is provided with a latch-type electrode assembly, the latch-type electrode assembly comprising: An electrode latch, which is electrically connected to the power supply terminal of the laser under test; An operating component, connected to the electrode latch, is used to control the lifting and lowering movement of the electrode latch. When the carrier is located at the test station and the electrode latch is lowered, the electrode latch is engaged with the electrode sleeve.

3. The laser testing system according to claim 2, characterized in that, The base is provided with a vertically extending guide hole, and the latch-type electrode assembly further includes: A guide post, which is connected to the operating component and is positioned opposite to the guide hole; When the carrier is located at the test station and the electrode latch is lowered, the guide post is at least partially confined within the guide hole.

4. The laser testing system according to claim 1, characterized in that, The base is provided with a loading station, and the vehicle is able to move between the loading station and the testing station; The base is provided with a transverse slide rail, the carrier is slidably mounted on the transverse slide rail, and can move linearly along the transverse slide rail between the loading station and the testing station.

5. The laser testing system according to claim 4, characterized in that, The functional test modules are arranged in a straight line along the moving direction of the movable seat, and the driving mechanism includes: A drive motor, which is mounted on the base; A lead screw and nut module, wherein the lead screw of the lead screw and nut module is connected to the drive motor, and the nut of the lead screw and nut module is fixedly connected to the movable base; and A limit switch is disposed on the base and is used to detect the movement position of the movable seat.

6. The laser testing system according to claim 1, characterized in that, The functional testing module includes a PIV / spectral testing module, a near-field spot testing module, and a far-field spot testing module.

7. The laser testing system according to claim 1, characterized in that, The carrier is detachably equipped with a clamp base for securing COS chips, BAR bars, or VCSEL lasers.

8. A laser testing method, applied to the laser testing system according to any one of claims 1 to 7, characterized in that, include: The laser to be tested is fixed to the carrier, and the carrier is moved to the test station; The host computer receives the test items selected by the user. The test items include at least one of PIV / spectral testing, near-field spot testing and far-field spot testing. According to the test items selected by the user, the moving base is driven by the drive mechanism to move, so that the corresponding functional test module is moved to a position opposite to the laser to be tested on the carrier located at the test station; and Power the laser under test and test the selected test items through the functional test module.

9. The laser testing method according to claim 8, characterized in that, When the user selects a test item including near-field spot test or far-field spot test, the camera integration time in the functional test module is adjusted to adapt to the power of the laser under test.

10. The laser testing method according to claim 8, characterized in that, Before fixing the laser to be tested onto the carrier, a calibration step is also included: The standard source laser is fixed to the carrier, and the carrier is moved to the test station; Multiple sets of test data were obtained by collecting data from multiple points on the standard source laser. Calculate the calibration coefficient based on the multiple sets of test data; The calibration coefficients are associated with and stored in relation to the corresponding product series numbers; as well as In subsequent tests, the corresponding calibration coefficients will be automatically invoked for calculation based on the product series number selected by the user.

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