Control method and device of atomization equipment, and atomization equipment

Abstract

The application provides a control method and device of an atomization device and the atomization device, and applies to the technical field of atomizers. The method comprises the following steps: obtaining a measurement value set obtained by measuring the atomization device; determining a current measurement value of the atomization device according to the measurement value set, and determining a current state of the atomization device according to the current measurement value; inputting the current state into a preset length first-in-first-out window, and when the number of current states being abnormal states in the first-in-first-out window is greater than a number threshold, controlling the atomization device to enter a protection mode. The measurement value set is established, the current measurement value is calculated, and then the accidental sampling noise and the persistent real fault are effectively distinguished. The first-in-first-out window is combined with the number threshold to determine, which not only avoids the protection false triggering caused by single sampling abnormality, but also ensures that the real fault can enter the protection mode in time when the real fault occurs, thereby improving the accuracy and reliability of the atomization device protection.

Description

Technical Field

[0001] This application relates to the field of atomizer technology, and in particular to control methods, devices and atomizing equipment for atomizing devices. Background Technology

[0002] In practical applications, atomizing devices (such as electromagnetic induction heating electronic atomizers) are generally powered by batteries and driven by control circuits to heat the atomizing core for operation. During the operation of the atomizing device, it is necessary to monitor the operating parameters (such as temperature, power, frequency, etc.) in real time.

[0003] In related technologies, when abnormal operating parameters are detected, the atomizing device can trigger the corresponding protection mechanism. However, due to environmental or device-specific factors, the monitored operating parameters of the atomizing device may contain errors, making it impossible to accurately reflect the actual operating status of the atomizing device. This can easily lead to misjudgments and affect normal use by the user. Summary of the Invention

[0004] In view of the above problems, a control method, apparatus, and atomizing device for an atomizing device are proposed to overcome or at least partially solve the above problems, comprising: A method for controlling an atomizing device, the method comprising: Obtain the set of measurement values ​​obtained from measuring the atomizing device; Based on the set of measured values, determine the current measured value of the atomizing device, and based on the current measured value, determine the current state of the atomizing device; The current state is input into a preset length first-in-first-out window, and when the number of abnormal states in the first-in-first-out window exceeds a threshold, the atomizing device is controlled to enter protection mode.

[0005] Optionally, it also includes: If there is no abnormal state in the first-in-first-out window and the most recent current measurement value meets the preset measurement value recovery condition, the atomizing device is controlled to exit the protection mode.

[0006] Optionally, obtaining the set of measurement values ​​obtained by measuring the atomizing device includes: Multiple sample values ​​are obtained by continuously sampling the atomizing device using a sampler. Based on the multiple sampled values, determine the measurement value at a single time point; The set of measurement values ​​is determined based on the measurement values ​​at multiple time points.

[0007] Optionally, determining the current measurement value of the atomizing device based on the set of measurement values ​​includes: Extreme values ​​are removed from the set of measured values. The current measurement value of the atomizing device is determined based on the remaining measurement values ​​in the set of measurement values.

[0008] Optionally, determining the current state of the atomizing device based on the current measurement value includes: When the current measurement value meets the preset abnormal measurement value conditions, the current state of the atomizing device is determined to be an abnormal state; When the current measurement value does not meet the preset abnormal measurement value conditions, the current state of the atomizing device is determined to be a normal state.

[0009] Optionally, when the number of devices in the first-in-first-out window that are currently in an abnormal state exceeds a certain threshold, controlling the atomizing device to enter a protection mode includes: When the number of devices in the first-in-first-out window that are in an abnormal state exceeds the number threshold, if the atomizing device is in operation, the atomizing device is controlled to stop outputting pulse width modulation signals. If the number of devices in the first-in-first-out window that are in an abnormal state exceeds the threshold, the device is prohibited from entering the operating state if it is in standby mode.

[0010] Optionally, it also includes: When the number of devices in the first-in-first-out window that are in an abnormal state exceeds a certain threshold, the device is controlled to send an abnormality alert message.

[0011] A control device for an atomizing device, the device comprising: The measurement value set acquisition module is used to acquire the measurement value set obtained by measuring the atomizing device; The current state determination module is used to determine the current measurement value of the atomizing device based on the set of measurement values, and to determine the current state of the atomizing device based on the current measurement value. The protection mode entry module is used to input the current state into a preset length first-in-first-out window, and when the number of abnormal states in the first-in-first-out window exceeds a threshold, the module controls the atomizing device to enter protection mode.

[0012] An atomizing device includes a processor, a memory, and a computer program stored in the memory and capable of running on the processor, wherein the computer program, when executed by the processor, implements the method described above.

[0013] Optionally, the atomizing device is an electromagnetic induction atomizing device with an inductor coil.

[0014] The embodiments of this application have the following advantages: In this embodiment, a set of measurement values ​​obtained by measuring the atomizing device is acquired; the current measurement value of the atomizing device is determined based on the set of measurement values, and the current state of the atomizing device is determined based on the current measurement value; the current state is input into a preset length first-in-first-out (FIFO) window, and when the number of abnormal states in the FIFO window exceeds a threshold, the atomizing device is controlled to enter the protection mode. This achieves the effective distinction between intermittent sampling noise and continuous real faults by establishing a set of measurement values ​​and calculating the current measurement value. By combining the FIFO window with the threshold judgment, false triggering of protection due to single sampling anomalies is avoided, and the protection mode can be entered in time when a real fault occurs, thus improving the accuracy and reliability of the atomizing device protection. Attached Figure Description

[0015] To more clearly illustrate the technical solution of this application, the drawings used in the description of this application will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This is a flowchart of the steps of a control method for an atomizing device provided in some embodiments of this application; Figure 2 This is a schematic diagram of the steps of a second control method for an atomizing device provided in some embodiments of this application; Figure 3 This is a flowchart of the steps of a control method for an atomizing device provided in some embodiments of this application; Figure 4 This is a structural block diagram of a control device for an atomizing device provided in some embodiments of this application. Detailed Implementation

[0017] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the application will be further described in detail below with reference to the accompanying drawings and specific embodiments. Obviously, the described embodiments are only some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0018] In atomization devices (such as electromagnetic induction heating electronic atomizers), high-frequency PWM (Pulse Width Modulation) is generally used to modulate power to achieve high power density and fast response. When the PWM frequency is significantly higher than the sampling rate of the system's ADC (Analog-to-Digital Converter), the following problems occur: 1. Sampling aliasing: During a single sampling by the ADC, the PWM waveform may be at a high level or a low level, causing the sampled value to fluctuate wildly between "full voltage (when the PWM waveform is at a high level at the moment of sampling)" and "zero voltage (when the PWM waveform is at a low level at the moment of sampling)," which cannot reflect the true average value.

[0019] 2. Noise interference: High-frequency switching will bring severe ground bounce noise and electromagnetic radiation, and single-point sampling is extremely susceptible to transient spikes.

[0020] 3. Measurement distortion: Fixed phase sampling fails completely in asynchronous or high-frequency asynchronous modes, resulting in unusable measurement values.

[0021] During the ADC sampling process, ADC sampling can be performed periodically in the background (e.g., triggered by a timer, automatically sampling once every 100 microseconds or milliseconds). Regardless of whether the device is in standby mode (low-frequency voltage acquisition) or heating mode (high-frequency current and temperature acquisition), the ADC continuously captures data.

[0022] By acquiring the analog signals from the atomizing device, the ADC (analog-to-digital converter) is responsible for converting external analog signals (such as remaining battery voltage, heating wire current, current temperature, etc.) into digital signals (such as 0-4095) that the microcontroller can recognize. Based on this data, the output power of the next step can be determined, or faults such as short circuits can be identified and cut-off protection can be performed.

[0023] ADC sampling data types can include current (such as the current value flowing through the heating wire or circuit, used for overcurrent protection), voltage (such as the remaining battery voltage, used for undervoltage protection), and temperature (such as the temperature of the heating wire or atomizer core, used for dry burning protection).

[0024] High-frequency switching refers to the fact that atomizing devices cannot adjust heating power like a tap by turning a valve; the battery outputs full power. To control the power, a PMOS (P-channel Metal-Oxide-Semiconductor) transistor (a type of semiconductor switch) is used to perform an extremely fast "on-off-on-off" chopping action via PWM (e.g., switching on and off 100,000 times per second, i.e., a 100kHz high-frequency switching signal). This high-speed switching and instantaneous cutting of large currents causes drastic current surges on the PCB (Printed Circuit Board), resulting in electromagnetic radiation and ground bounce noise.

[0025] Asynchronous or high-frequency asynchronous mode refers to ideal accurate sampling as synchronous sampling, so that the ADC sampling action is strictly aligned with the PWM switch (for example, specifically selecting the moment when the PWM stabilizes at the highest level to sample, to ensure data accuracy).

[0026] In asynchronous / asynchronous modes, due to cost or hardware limitations, the ADC sampling timer and the timer controlling the PWM output are not synchronized; they operate independently. The ADC sampling moment is random, potentially falling on a high-frequency interference spike or a zero level in the PWM signal, causing drastic fluctuations in the sampled value, rendering it unusable directly.

[0027] In related technologies, the following methods are generally adopted: 1. Adding a hardware low-pass filter can smooth the signal, but it will increase hardware cost and PCB area, and will also introduce significant phase delay, affecting the real-time performance of protection.

[0028] 2. The software's simple averaging method cannot eliminate non-Gaussian noise (such as large outlier spikes), which can easily lead to the average value being skewed.

[0029] 3. Single-threshold protection method: In order to avoid false triggering, the protection threshold has to be set too wide, which makes the protection untimely when a real fault (such as a micro short circuit) occurs.

[0030] The value obtained after each sampling conversion by the ADC is directly compared with a preset threshold. If the sampled value is greater than the threshold (for upper limit protection such as overcurrent and overtemperature), it is determined to be abnormal and protection is immediately triggered (such as shutting down PWM); if the sampled value is less than the threshold (for lower limit protection such as undervoltage), it is determined to be faulty and protection is immediately triggered.

[0031] In other words, in related technologies, the detection result is usually compared with a threshold by an analog-to-digital converter. If the threshold is exceeded, a protection action is immediately triggered, such as shutting down the power output or flashing the indicator light.

[0032] However, when using the above method, various interference sources exist inside the atomizing device. In particular, when the power switching transistors switch rapidly on and off under the drive of high-frequency pulse width modulation signals, they generate severe ground bounce noise and electromagnetic radiation. These interferences can couple into the ADC sampling signal, causing occasional abnormal jumps in single sampling values, i.e., the detection results are much higher or much lower than the true values.

[0033] In this situation, the single-sampling threshold judgment protection method is prone to falsely triggering protection actions due to single sampling anomalies, causing the atomizing device to frequently enter protection mode when there is no real fault, severely impacting the user experience. Conversely, if the protection threshold is set too leniently to improve anti-interference capabilities, then when a real fault occurs (such as slow overcurrent caused by a micro-short circuit), the failure to trigger protection in time may pose a safety risk.

[0034] Based on this, this application proposes to obtain a set of measurement values ​​obtained by measuring the atomizing device; determine the current measurement value of the atomizing device based on the set of measurement values, and determine the current state of the atomizing device based on the current measurement value; input the current state into a preset length first-in-first-out (FIFO) window, and control the atomizing device to enter the protection mode when the number of abnormal states in the FIFO window exceeds a number threshold. This achieves the effective distinction between occasional sampling noise and continuous real faults by establishing a set of measurement values ​​and calculating the current measurement value. By combining the FIFO window with the number threshold judgment, it avoids false triggering of protection due to single sampling anomalies and ensures that the protection mode can be entered in time when a real fault occurs, thus improving the accuracy and reliability of the atomizing device protection.

[0035] Specifically, the embodiments of this application mainly include the following: 1. By combining hardware oversampling ratio (OSR) with software extreme value removal averaging, that is, by using hardware to accumulate at high speed to reduce white noise, and by using software to sort and remove the maximum / minimum extreme points (outliers), stable measurement values ​​can be obtained even if PWM interference causes the sampled values ​​to occasionally jump.

[0036] 2. The counting and decision mechanism based on the sliding window no longer relies on a single sample value to trigger protection, but instead counts the "number of abnormal states" within the time window; in principle, it completely eliminates false triggers caused by occasional spikes, while ensuring a deterministic response time.

[0037] 3. Preemptive security protection execution logic: Once protection is triggered, the PWM output is immediately blocked at the underlying level and upper-layer business requests are rejected, ensuring that security takes precedence over all business logic.

[0038] 4. A recovery mechanism with hysteresis and window cleaning requirements prevents the protection from entering a critical oscillation state of "trigger-recovery-trigger". By setting a threshold, it ensures that the system only resumes operation after the fault is completely eliminated.

[0039] The present application will be further described below with reference to the accompanying drawings: Reference Figure 1 The diagram illustrates a flowchart of a control method for an atomizing device according to some embodiments of this application, which may specifically include the following steps: Step 101: Obtain the set of measurement values ​​obtained by measuring the atomizing device.

[0040] In practical applications, measurements can be taken from the atomizing device to obtain multiple values, which are then integrated to form a set of measurements. In some examples, the measurements may be for temperature, current, and voltage within the atomizing device.

[0041] For example, the analog signal inside the atomizing device can be sampled multiple times, and the sampled values ​​of the analog signal can be calculated to obtain multiple sampled values. The analog signal can be a physical level signal such as temperature, current, or battery voltage. After determining multiple sampled values, these sampled values ​​can be preprocessed (such as summing, averaging, and removing extreme values) to determine the corresponding measurement values, and a set of measurement values ​​consisting of multiple different time points can be constructed based on time.

[0042] In some embodiments of this application, the atomizing device is an electromagnetic induction atomizing device with an inductor coil.

[0043] In practical applications, atomizing devices may include inductors, capacitors, and heating elements (such as atomizing cores). The atomizing cores are heated by electromagnetic induction, thereby heating and atomizing the atomized liquid.

[0044] In some embodiments of this application, obtaining the set of measurement values ​​obtained by measuring the atomizing device includes: obtaining multiple sampled values ​​obtained by continuously sampling the atomizing device multiple times using a sampler; determining the measurement value at a single time point based on the multiple sampled values; and determining the set of measurement values ​​based on the measurement values ​​at multiple time points.

[0045] In some embodiments, an analog-to-digital converter (ADC) can be used, configured in continuous scan mode (i.e., automatically and cyclically acquiring data from one or more channels without manual intervention), to oversample the analog signal of the atomizing device using a built-in on-chip oversampler, and then convert the sampled analog signal into the corresponding sampled value using the ADC. Oversampling refers to sampling at a sampling frequency that is an integer multiple of the Nyquist sampling frequency (e.g., 4, 8, 16, 32, or 64 times).

[0046] For example, an on-chip oversampler can be used to continuously sample the analog signal of an atomizing device multiple times and convert the sampled analog signals into multiple sample values.

[0047] In some embodiments, multiple sampled values ​​acquired at the same time point can be processed (e.g., averaged, or the median value) to obtain the measurement value at a single time point. For example, an on-chip oversampler can perform a 16-fold hardware-accumulated average to output the measurement value at a single time point. Assume the actual temperature corresponds to a sampled value of 3000, but due to high-frequency interference, the actual sampled values ​​continuously measured by the analog-to-digital converter at the current time point are constantly fluctuating, such as 3010, 2950, ​​3050, 2980... The on-chip oversampler can continuously sample 16 times at extremely high low-level speeds, sum and average these 16 fluctuating sampled values ​​to obtain the average sampled value of the 16 samples (i.e., the measurement value at a single time point, such as 2998).

[0048] After determining the measurement value at a single time point, multiple measurement values ​​corresponding to multiple consecutive time points can be determined according to a preset time interval (such as 10ms) to construct a set of measurement values.

[0049] In some embodiments, the sampled values ​​can be classified according to the type of analog signal (such as temperature, current, battery voltage), and for the multiple groups of sampled values ​​after classification, the measurement value at a single time point under each type can be determined; then, based on a preset time interval, the measurement values ​​at multiple consecutive time points can be determined to construct a set of measurement values ​​corresponding to different types, such as a set of temperature measurement values, a set of current measurement values, and a set of battery voltage measurement values.

[0050] Step 102: Determine the current measurement value of the atomizing device based on the set of measurement values, and determine the current state of the atomizing device based on the current measurement value.

[0051] After obtaining the set of measurement values, the measurement values ​​in the set can be preprocessed (such as sorting, removing extreme values, taking the median value, averaging, etc.) to determine the current measurement value of the atomizing device.

[0052] The current measurement value can be the current measurement value for temperature, the current measurement value for current, or the current measurement value for battery voltage.

[0053] After determining the current measurement value, the current state of the atomizing device (such as normal state or abnormal state) can be determined by combining preset abnormal measurement conditions. The current state of the atomizing device can be the current state of temperature, the current state of current, or the current state of battery voltage.

[0054] In some embodiments of this application, determining the current measurement value of the atomizing device based on the set of measurement values ​​includes: removing extreme values ​​from the set of measurement values; and determining the current measurement value of the atomizing device based on the remaining measurement values ​​in the set of measurement values.

[0055] After determining the set of measurement values, the values ​​can be sorted in descending order, and extreme values ​​can be removed. Extreme value removal refers to eliminating the largest and smallest values ​​with significant deviations from the set of measurement values ​​to avoid misjudgments caused by occasional interference signals.

[0056] After removing extreme values, the average or median value of the remaining measured values ​​in the measurement set can be calculated, and this average or median value can be used as the current measurement value of the atomizing device, thereby improving the accuracy of the current measurement value and reducing the impact of random interference on the measurement results.

[0057] For example, a set of measurement values ​​(X_{raw}) can be collected every 10ms (e.g., 8 measurement values). These 8 measurement values ​​are sorted from smallest to largest, and the 2 largest and 2 smallest measurement values ​​are discarded (since these sampled values ​​are often the points most affected by PWM switching noise). The average of the remaining 4 measurement values ​​(the median value) is taken to obtain the current measurement value (X_{final}), thereby avoiding the situation where the sampling point is contaminated by noise.

[0058] In the above embodiments, by determining the current measurement value of the atomizing device based on the set of measurement values, the problem of accurate signal measurement under high-frequency PWM environment can be solved. It can effectively filter out random noise and outlier spikes caused by high-frequency switching, thereby avoiding large deviations caused by interference in single sampling.

[0059] In some embodiments of this application, determining the current state of the atomizing device based on the current measurement value includes: determining the current state of the atomizing device as an abnormal state when the current measurement value meets a preset abnormal measurement value condition; and determining the current state of the atomizing device as a normal state when the current measurement value does not meet the preset abnormal measurement value condition.

[0060] In some embodiments, the preset abnormal measurement condition can be a judgment condition set based on a first threshold; wherein, the first threshold can be a current overcurrent threshold, a temperature overheat threshold, or a voltage undervoltage threshold.

[0061] For example, after determining the current measurement value (X_{final}) based on the set of current measurement values, it can be determined whether the current measurement value is greater than the current overcurrent threshold (TH_{limit}); if so, it can be recorded as 1 (indicating an abnormal state), otherwise it can be recorded as 0 (indicating a normal state).

[0062] Based on the set of temperature measurements, after determining the current measurement value, it can be judged whether the current measurement value is greater than the temperature over-temperature threshold; if so, it can be recorded as 1 (indicating an abnormal state), otherwise it can be recorded as 0 (indicating a normal state).

[0063] Based on the set of battery voltage measurements, after determining the current measurement value, it can be judged whether the current measurement value is greater than the undervoltage threshold; if so, it can be recorded as 1 (indicating an abnormal state), otherwise it can be recorded as 0 (indicating a normal state).

[0064] For example, the maximum current carrying capacity of the lithium battery and MOSFET used in atomizing devices is 9 amps. Exceeding this value will cause the components to burn out or be damaged. However, the maximum current of the atomizing device during normal operation is only 5 amps. Therefore, the current overcurrent threshold can be preset to 7-8 amps. Once the current measured value reaches or exceeds this overcurrent threshold, it can be determined as an abnormal state.

[0065] Step 103: Input the current state into a preset length first-in-first-out window, and when the number of current states that are abnormal in the first-in-first-out window is greater than the number threshold, control the atomizing device to enter the protection mode.

[0066] In practical applications, one or more FIFO (First In First Out) windows of preset length can be defined and maintained in advance. For example, a FIFO window of preset length N=10 can be maintained (to record the current state of the past 100ms).

[0067] After determining the current status of the atomizing device, the current status can be entered into the first-in-first-out window as a numerical value (e.g., 1 for abnormal status, 0 for normal status).

[0068] In some embodiments, when the current state entered in the first-in-first-out window reaches a preset length, the number of abnormal states in the first-in-first-out window can be counted, and the atomizing device can be controlled to enter a protection mode based on the number of abnormal states combined with a preset number threshold.

[0069] The preset quantity threshold can be flexibly set according to the actual situation, such as any value from 1 to 10, and this application does not impose any restrictions on it.

[0070] For example, a first-in-first-out window with a preset length of N=10 can only hold the current state of 10 atomizing devices. Based on the input current state, the queue of the first-in-first-out window is represented as [0, 0, 1, 0, 0, 0, 1, 1, 0, 0].

[0071] Assuming the preset quantity threshold is 3, when the total number of devices in the first-in-first-out window that are currently in an abnormal state (i.e., state 1) exceeds the preset quantity threshold, it can be determined that the atomizing device is in a continuous abnormal operating condition, and the atomizing device can be controlled to enter the protection mode.

[0072] In some embodiments, when the current state entered in the first-in-first-out window reaches the preset length, new current states can continue to be entered, while the earliest entered current state in the window is deleted, so that the total length of the first-in-first-out window is always the preset length. In this way, the historical states of the atomizing device stored in the window are updated in a loop, the number of abnormal states in the window is continuously counted and judged, and it is ensured that the existence of a continuous abnormality can be accurately determined based on the current state of the atomizing device in the most recent continuous period.

[0073] For example, if the current queue of the first-in-first-out (FIFO) window is represented as [0, 0, 1, 0, 0, 0, 1, 1, 0, 0], and the current state of the atomizing device is determined to be abnormal at the next time point, the new current state can be input into the FIFO window. After input, the queue of the FIFO window will be represented as [0, 1, 0, 0, 0, 1, 1, 0, 0, 1]. At this time, the total number of current abnormal states (i.e., 1) in the FIFO window queue is still greater than the preset threshold, so the atomizing device can continue to be controlled to enter the protection mode, thereby filtering out occasional spike interference.

[0074] In some embodiments, the protection mode may be to limit the output power of the atomizing device or stop it from working, so as to prevent the components from working under abnormal conditions and causing irreversible damage such as burnout or accelerated aging.

[0075] For example, the protection mode can be overcurrent protection mode, battery undervoltage protection mode, or high temperature protection mode. Entering the protection mode can effectively reduce the probability of falsely triggering the protection, avoid misjudging a single occasional interference as a long-term abnormality, and improve the stability of the atomizing device's operation.

[0076] In some embodiments, the preset length of the first-in-first-out window can be set according to the actual situation.

[0077] For example, when using a first-in-first-out (FIFO) window to determine and control the atomizing device to enter the protection mode for high temperature protection, a FIFO window with a preset length of N=5 can be set. If the number of devices in the window that are in an abnormal state exceeds the number threshold (e.g., 3), it can be determined that the atomizing device is in a state of continuous overheating, and the atomizing device can be controlled to enter the high temperature protection mode.

[0078] In some embodiments of this application, controlling the atomizing device to enter a protection mode when the number of devices in the first-in-first-out window that are currently in an abnormal state is greater than a threshold number includes: When the number of devices in the first-in-first-out window that are in an abnormal state exceeds a threshold, if the atomizing device is in operation, the atomizing device is controlled to stop outputting pulse width modulation signals; when the number of devices in the first-in-first-out window that are in an abnormal state exceeds a threshold, if the atomizing device is in standby mode, the atomizing device is prohibited from entering operation mode.

[0079] In practical applications, when the number of devices in an abnormal state within the first-in-first-out (FIFO) window exceeds a certain threshold, the operating mode of the atomizing device can be determined. If the device is in operation, outputting atomized mist, the device can be controlled to stop outputting pulse width modulation signals and cut off the power output of the heating circuit to prevent components from continuously experiencing abnormal conditions and causing irreversible damage. If the device is in standby mode and not yet started, it can be prevented from responding to the start signal to enter the operating state, thus avoiding abnormal risks and improving the safety of the atomizing device.

[0080] In some embodiments of this application, the method further includes: when the number of devices in the first-in-first-out window that are in an abnormal state is greater than a number threshold, controlling the atomizing device to send an abnormal prompt message.

[0081] In some embodiments, feedback error messages may include, but are not limited to, alerting the user to an error in the current device through methods such as flashing indicator lights, vibration of the atomizing device, or display on the screen of the atomizing device.

[0082] For example, when the number of devices in the first-in-first-out window that are in an abnormal state exceeds the threshold, the device will notify the user of the malfunction by flashing the LED (Light Emitting Diode) in the atomizing device or displaying a message on the screen (e.g., a red light flashes three times quickly).

[0083] In some embodiments of this application, the method further includes: when there is no current state that is abnormal in the first-in-first-out window, and the most recent current measurement value meets the preset measurement value recovery condition, controlling the atomizing device to exit the protection mode.

[0084] In some embodiments, the preset measurement value recovery condition can be a judgment condition set based on a second threshold. The second threshold can be a current overcurrent recovery threshold, a temperature overheat recovery threshold, or a voltage undervoltage recovery threshold.

[0085] For example, if the current first-in-first-out window queue is [0, 0, 0, 0, 0, 0, 0, 0, 0, 0], meaning there is no current abnormal state, the current measurement value of the most recently input current state can be obtained. It can be determined whether the current measurement value meets the preset measurement value recovery condition. If yes, the atomizing device is controlled to exit the protection mode, and the atomizing device is controlled to enter the operating mode before entering the protection mode; otherwise, the atomizing device is controlled to enter the protection mode.

[0086] The current measurement value meets the preset measurement value recovery condition, which can be either the current measurement value being greater than the second threshold or the current measurement value being less than the second threshold. This application does not impose any restrictions on this.

[0087] For example, the current measurement value is a current measurement value, and the second threshold can be a current overcurrent recovery threshold, such as 5 amps. When the current current measurement value is less than the current overcurrent recovery threshold, it can be determined that the recovery condition is met, and the atomizing device is allowed to exit the protection mode.

[0088] If the current measurement value is a temperature measurement value, the second threshold can be a temperature over-temperature recovery threshold, such as 50 degrees Celsius. When the current temperature measurement value is less than this temperature over-temperature recovery threshold, it can be determined that the recovery condition is met.

[0089] If the current measurement value is for the battery voltage, the second threshold can be a voltage undervoltage recovery threshold, such as 3.2 volts. When the current battery voltage measurement value is greater than this voltage undervoltage recovery threshold, it can be determined that the recovery condition is met.

[0090] This layered, multi-stage judgment method can effectively filter out occasional interference signals, preventing false triggering of protection and affecting normal use, while accurately identifying continuous abnormal operating conditions, protecting the atomizing equipment in a timely manner, extending the equipment's lifespan, and improving safety.

[0091] In this embodiment, a set of measurement values ​​obtained by measuring the atomizing device is acquired; the current measurement value of the atomizing device is determined based on the set of measurement values, and the current state of the atomizing device is determined based on the current measurement value; the current state is input into a preset length first-in-first-out (FIFO) window, and when the number of abnormal states in the FIFO window exceeds a threshold, the atomizing device is controlled to enter the protection mode. This achieves the effective distinction between intermittent sampling noise and continuous real faults by establishing a set of measurement values ​​and calculating the current measurement value. By combining the FIFO window with the threshold judgment, false triggering of protection due to single sampling anomalies is avoided, and the protection mode can be entered in time when a real fault occurs, thus improving the accuracy and reliability of the atomizing device protection.

[0092] The following is in conjunction with the appendix Figure 2 Further explanation of this application: S1 is oversampled via an analog-to-digital converter (ADC).

[0093] S2, Construct a set of measurement values.

[0094] S3 sorts the measured values ​​in the measurement set and removes extreme values.

[0095] S4: Average the remaining measurements in the measurement set to determine the current measurement value.

[0096] S5, determine the current status of the atomizing device based on the current measurement value.

[0097] S6, input the current state into a first-in-first-out window of a preset length.

[0098] S7, determine whether the number of items in the first-in-first-out window that are in an abnormal state is greater than the number threshold; if yes, proceed to S8, otherwise proceed to S9.

[0099] S8 controls the atomizing device to enter protection mode, including but not limited to stopping the output of pulse width modulation signals, prohibiting the atomizing device from entering the working state, and providing feedback on abnormal prompts.

[0100] S9, if the current state is not abnormal in the first-in-first-out window, and the most recent current measurement value meets the preset measurement value recovery condition, control the atomizing device to enter the operating mode before entering the protection mode; otherwise, continue to control the atomizing device to enter the protection mode.

[0101] Reference Figure 3 This document illustrates a flowchart of another control method for an atomizing device provided in some embodiments of this application, which may specifically include the following steps: Step 301: Obtain multiple sample values ​​obtained by continuously sampling the atomizing device through a sampler.

[0102] Step 302: Determine the measurement value at a single time point based on the multiple sampled values.

[0103] Step 303: Determine the set of measurement values ​​based on the measurement values ​​at multiple time points.

[0104] Step 304: Remove extreme values ​​from the set of measured values.

[0105] Step 305: Determine the current measurement value of the atomizing device based on the remaining measurement values ​​in the set of measurement values.

[0106] Step 306: Determine the current state of the atomizing device based on the current measurement value.

[0107] Step 307: Input the current state into a preset length first-in-first-out window, and when the number of current states that are abnormal in the first-in-first-out window is greater than the number threshold, control the atomizing device to enter the protection mode.

[0108] In this embodiment, multiple sampled values ​​are obtained by continuously sampling the atomizing device through a sampler; a measurement value at a single time point is determined based on the multiple sampled values; a set of measurement values ​​is determined based on the measurement values ​​at multiple time points; extreme values ​​are removed from the measurement values ​​in the set of measurement values; the current measurement value of the atomizing device is determined based on the remaining measurement values ​​in the set of measurement values; the current state of the atomizing device is determined based on the current measurement value; the current state is input into a preset length FIFO window, and when the number of abnormal states in the FIFO window exceeds a threshold, the atomizing device is controlled to enter the protection mode. This achieves the effective distinction between occasional sampling noise and continuous real faults by establishing a set of measurement values ​​and calculating the current measurement value. By combining the FIFO window with the threshold judgment, false protection triggering caused by single sampling anomalies is avoided, and the protection mode can be entered in time when a real fault occurs, thus improving the accuracy and reliability of the atomizing device protection.

[0109] It should be noted that, for the sake of simplicity, the method embodiments are all described as a series of actions. However, those skilled in the art should understand that the embodiments of this application are not limited to the described order of actions, because according to the embodiments of this application, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also understand that the embodiments described in the specification are all preferred embodiments, and the actions involved are not necessarily required by the embodiments of this application.

[0110] Reference Figure 4 The diagram shows a structural schematic of a control device for an atomizing device according to some embodiments of this application, which may specifically include the following modules: The measurement value set acquisition module 401 is used to acquire the measurement value set obtained by measuring the atomizing device; The current state determination module 402 is used to determine the current measurement value of the atomizing device based on the set of measurement values, and to determine the current state of the atomizing device based on the current measurement value. The protection mode entry module 403 is used to input the current state into a preset length first-in-first-out window, and when the number of abnormal states in the first-in-first-out window is greater than a number threshold, the atomizing device is controlled to enter the protection mode.

[0111] In some embodiments of this application, the apparatus further includes: The protection mode control module is used to control the atomizing device to exit the protection mode when there is no abnormal state in the current state in the first-in-first-out window and the most recent current measurement value meets the preset measurement value recovery condition.

[0112] In some embodiments of this application, the measurement value set acquisition module 401 includes: The sampling value acquisition submodule is used to acquire multiple sampling values ​​obtained by continuously sampling the atomizing device through a sampler. The measurement value determination submodule is used to determine the measurement value at a single time point based on the multiple sampled values; The measurement set determination submodule is used to determine the measurement set based on measurement values ​​from multiple time points.

[0113] In some embodiments of this application, the current state determination module 402 includes: An extreme value processing submodule is used to remove extreme values ​​from the measurement values ​​in the measurement value set. The current measurement value determination submodule is used to determine the current measurement value of the atomizing device based on the remaining measurement values ​​in the measurement value set.

[0114] In some embodiments of this application, the current state determination module 402 includes: An abnormal state determination submodule is used to determine that the current state of the atomizing device is an abnormal state when the current measurement value meets a preset measurement value abnormal condition; The normal state determination submodule is used to determine the current state of the atomizing device as normal when the current measurement value does not meet the preset abnormal measurement value conditions.

[0115] In some embodiments of this application, the protection mode entry module 403 includes: The atomizing device control submodule is used to control the atomizing device to stop outputting pulse width modulation signals when the number of devices in the first-in-first-out window that are in an abnormal state is greater than a threshold number, if the atomizing device is in operation. The atomizing device disable submodule is used to prevent the atomizing device from entering the working state if the number of devices in the first-in-first-out window that are in an abnormal state exceeds a certain threshold and the atomizing device is in standby mode.

[0116] In some embodiments of this application, the apparatus further includes: The prompt message feedback module is used to control the atomizing device to send out an abnormal prompt message when the number of devices in the first-in-first-out window that are in an abnormal state exceeds a certain threshold.

[0117] In this embodiment, a set of measurement values ​​obtained by measuring the atomizing device is acquired; the current measurement value of the atomizing device is determined based on the set of measurement values, and the current state of the atomizing device is determined based on the current measurement value; the current state is input into a preset length first-in-first-out (FIFO) window, and when the number of abnormal states in the FIFO window exceeds a threshold, the atomizing device is controlled to enter the protection mode. This achieves the effective distinction between intermittent sampling noise and continuous real faults by establishing a set of measurement values ​​and calculating the current measurement value. By combining the FIFO window with the threshold judgment, false triggering of protection due to single sampling anomalies is avoided, and the protection mode can be entered in time when a real fault occurs, thus improving the accuracy and reliability of the atomizing device protection.

[0118] Some embodiments of this application also provide an atomizing device, including a processor, a memory, and a computer program stored in the memory and capable of running on the processor, wherein the computer program, when executed by the processor, implements the method described above.

[0119] Optionally, the atomizing device is an electromagnetic induction atomizing device with an inductor coil.

[0120] Some embodiments of this application also provide a computer-readable storage medium on which a computer program is stored, and when the computer program is executed by a processor, it implements the method described above.

[0121] Some embodiments of this application also provide a computer program product, including a computer program that, when executed by a processor, implements the method described above.

[0122] As the device embodiment is basically similar to the method embodiment, the description is relatively simple, and relevant parts can be found in the description of the method embodiment.

[0123] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties. Furthermore, the collection, use and processing of the relevant data must comply with the relevant laws, regulations and standards of the relevant countries and regions, and corresponding operation entry points are provided for users to choose to authorize or refuse.

[0124] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.

[0125] Those skilled in the art will understand that embodiments of this application can be provided as methods, apparatus, or computer program products. Therefore, embodiments of this application can take the form of entirely hardware embodiments, entirely software embodiments, or embodiments combining software and hardware aspects. Furthermore, embodiments of this application can take the form of computer program products implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0126] This application describes embodiments with reference to flowchart illustrations and / or block diagrams of methods, terminal devices (systems), and computer program products according to embodiments of this application. It should be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing terminal device to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing terminal device, generate instructions for implementing the flowchart illustrations. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0127] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing terminal device to operate in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0128] These computer program instructions can also be loaded onto a computer or other programmable data processing terminal equipment, causing a series of operational steps to be performed on the computer or other programmable terminal equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable terminal equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0129] Although preferred embodiments of the present application have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of the embodiments of the present application.

[0130] Finally, it should be noted that in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or terminal device that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or terminal device. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or terminal device that includes the aforementioned element.

[0131] The control method, apparatus, and atomizing device of the provided atomizing equipment have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A control method for an atomizing device, characterized in that, The method includes: Obtain the set of measurement values ​​obtained from measuring the atomizing device; Based on the set of measured values, determine the current measured value of the atomizing device, and based on the current measured value, determine the current state of the atomizing device; The current state is input into a preset length first-in-first-out window, and when the number of abnormal states in the first-in-first-out window exceeds a threshold, the atomizing device is controlled to enter protection mode.

2. The method according to claim 1, characterized in that, Also includes: If there is no abnormal state in the first-in-first-out window and the most recent current measurement value meets the preset measurement value recovery condition, the atomizing device is controlled to exit the protection mode.

3. The method according to claim 1 or 2, characterized in that, The step of obtaining the set of measurement values ​​obtained by measuring the atomizing device includes: Multiple sample values ​​are obtained by continuously sampling the atomizing device using a sampler. Based on the multiple sampled values, determine the measurement value at a single time point; The set of measurement values ​​is determined based on the measurement values ​​at multiple time points.

4. The method according to claim 3, characterized in that, Determining the current measurement value of the atomizing device based on the set of measurement values ​​includes: Extreme values ​​are removed from the set of measured values. The current measurement value of the atomizing device is determined based on the remaining measurement values ​​in the set of measurement values.

5. The method according to claim 1 or 2, characterized in that, Determining the current state of the atomizing device based on the current measurement value includes: When the current measurement value meets the preset abnormal measurement value conditions, the current state of the atomizing device is determined to be an abnormal state; When the current measurement value does not meet the preset abnormal measurement value conditions, the current state of the atomizing device is determined to be a normal state.

6. The method according to claim 1 or 2, characterized in that, When the number of devices in the first-in-first-out window that are in an abnormal state exceeds a certain threshold, the atomizing device is controlled to enter a protection mode, including: When the number of devices in the first-in-first-out window that are in an abnormal state exceeds the number threshold, if the atomizing device is in operation, the atomizing device is controlled to stop outputting pulse width modulation signals. If the number of devices in the first-in-first-out window that are in an abnormal state exceeds the threshold, the device is prohibited from entering the operating state if it is in standby mode.

7. The method according to claim 6, characterized in that, Also includes: When the number of devices in the first-in-first-out window that are in an abnormal state exceeds a certain threshold, the device is controlled to send an abnormality alert message.

8. A control device for an atomizing equipment, characterized in that, The device includes: The measurement value set acquisition module is used to acquire the measurement value set obtained by measuring the atomizing device; The current state determination module is used to determine the current measurement value of the atomizing device based on the set of measurement values, and to determine the current state of the atomizing device based on the current measurement value. The protection mode entry module is used to input the current state into a preset length first-in-first-out window, and when the number of abnormal states in the first-in-first-out window exceeds a threshold, the module controls the atomizing device to enter protection mode.

9. An atomizing device, characterized in that, It includes a processor, a memory, and a computer program stored in the memory and capable of running on the processor, wherein the computer program, when executed by the processor, implements the method as described in any one of claims 1 to 7.

10. The atomizing device according to claim 9, characterized in that, The atomizing device is an electromagnetic induction atomizing device with an inductor coil.

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