A device and method for detecting internal defects of a laser scattering porcelain insulator
Patent Information
- Application Number
- CN202611016654.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-07-09
- Publication Date
- 2026-09-08
AI Technical Summary
各激光接收探头均为固定安装、独立接收视野,相邻两个激光接收探头的采集视野无法实现无缝衔接覆盖,两个探头斜下方的交汇区域存在视野重叠不足、采集盲区较大的问题,形成固定检测死角
(1)本发明,通过固定环架底部设置底部接收探头,而两侧斜下方设置有侧部接收探头和斜部正向接收探头,当激光射出探头射出激光穿过瓷绝缘子完全被底部接收探头接收,说明瓷绝缘子内部未存在缺陷,当存在激光散射被侧部接收探头以及斜部正向接收探头接收时,说明瓷绝缘子内部存在缺陷,方便检测;
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Figure CN122709337A_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of porcelain insulator testing, specifically a laser scattering porcelain insulator internal defect detection device and method. Background Technology
[0002] Laser scattering detection technology, with its advantages of being non-contact, non-destructive, and highly sensitive, is widely used in the non-destructive testing of internal defects in porcelain insulators. Its principle involves using a laser beam incident on the insulator's interior; when the light encounters an internal defect, it undergoes scattering, refraction, and diffuse reflection. The scattered light signal is collected by a laser receiving probe, and by combining changes in light intensity, optical path distribution, and signal differences, the location, size, and type of the defect are determined. Existing laser scattering detection devices typically employ multiple sets of laser receiving probes arranged in parallel, collecting scattered light in different areas to expand the insulator detection coverage. However, this method has the following drawbacks: Each laser receiving probe is fixedly installed and has an independent field of view. The fields of view of two adjacent laser receiving probes cannot be seamlessly connected and covered. There is insufficient overlap of the fields of view and a large blind spot in the area where the two probes meet diagonally below, forming a fixed detection dead zone. When the internal defect of the insulator is located in the dead zone between the two probes, the scattered light generated by the defect cannot be completely and effectively received by either probe, which can easily lead to missed, insufficient, or missing scattered light signals. Summary of the Invention
[0003] In view of the above situation and to overcome the shortcomings of the prior art, the present invention provides a laser scattering ceramic insulator internal defect detection device and method, which effectively solves the problems mentioned in the background art.
[0004] To achieve the above objectives, the present invention provides the following technical solution: a laser scattering ceramic insulator internal defect detection device, comprising a clamping and moving assembly, wherein a laser detection assembly is disposed below the clamping and moving assembly; The laser detection assembly includes a fixed ring frame, a laser emission probe is installed on the inner bottom wall of the fixed ring frame, a semi-annular bottom arc groove is opened at the bottom of the fixed ring frame, and a sliding frame is provided in the circumferential direction of the fixed ring frame; The sliding frame includes three first sliding frames that are equally spaced at the bottom and sides of the fixed ring frame, and a second sliding frame is provided between two adjacent first sliding frames. A third sliding frame is provided between the first and second sliding frames. A laser receiver is provided on the first sliding frame, and an inclined receiver is provided on the second sliding frame. A synchronous linkage is provided between adjacent laser receivers and inclined receivers.
[0005] Preferably, the laser receiver includes sliding mounting platforms that are slidably mounted on three first sliding frames. The top sliding mounting platform has a bottom receiving probe mounted on its top end, and the two sliding mounting platforms on both sides are clamped together and each has a side receiving probe mounted on one end. A focusing elastic arc plate is provided between two adjacent sliding mounting platforms. Rotating heads are symmetrically mounted on both ends of the focusing elastic arc plate and are rotatably mounted on rotating bases. Two rotating bases are fixedly mounted on the ends of the two sliding mounting platforms away from the clamping moving component.
[0006] Preferably, the inclined receiving component includes a sliding mounting plate slidably mounted on a third sliding frame. An inclined forward receiving probe is mounted on the side of the sliding mounting plate near the fixed ring frame, and a movable mounting plate is provided on the side of the sliding mounting plate away from the fixed ring frame. An inclined backward receiving probe is mounted on the side of the movable mounting plate away from the inclined forward receiving probe, wherein the inclined backward receiving probe is positioned facing the focusing elastic arc plate. Guide rods are symmetrically mounted on the side of the sliding mounting plate near the movable mounting plate, and the movable mounting plate is slidably connected to the guide rods.
[0007] Preferably, the sliding mounting plate has symmetrical sliding grooves, and a sliding block is slidably installed inside the sliding groove. A first connecting rod is symmetrically hinged to the side of the movable mounting plate near the sliding mounting plate. The ends of the two first connecting rods are respectively hinged to the two sliding blocks. A spring is installed on the side of the two sliding blocks that are close to each other. One end of the spring is fixedly connected to the inner wall of the side of the two sliding grooves that are close to each other.
[0008] Preferably, a pressure rod is fixedly installed on the side of each of the two sliding blocks that is far apart from each other. The pressure rod extends through the side of the sliding mounting plate. Limiting wedge plates are fixedly installed on the inner walls of both sides of the second sliding frame. A pressure gap is formed between the limiting wedge plates on both sides. The width of the pressure gap at the end away from the fixed ring frame is smaller than the width of the pressure gap at the end close to the fixed ring frame.
[0009] Preferably, the synchronous linkage component includes a central connecting plate slidably mounted on a third sliding frame. Two plate slots are symmetrically opened on the central connecting plate, and side connecting plates are slidably mounted inside the plate slots. The two side connecting plates are rotatably connected to a fixed shaft at one end away from each other. The two fixed shafts are fixedly mounted on the sliding mounting plate and the sliding mounting platform.
[0010] Preferably, a connecting groove is provided on the side of the plate groove away from the fixed ring frame, and a vertical sliding box is fixedly installed in the middle of the middle connecting plate on the side away from the fixed ring frame. A linkage slider is slidably installed inside the vertical sliding box, and second connecting rods are symmetrically hinged on both sides of the linkage slider. The ends of the two second connecting rods are respectively hinged to the two side connecting plates.
[0011] Preferably, the fixed ring frame is disposed below the support frame, the fixed ring frame is fixedly installed on the support frame, a lifting cylinder is installed on the support frame, the lifting cylinder is located below the lowest sliding mounting platform, and the output end of the lifting cylinder is fixedly connected to the lowest sliding mounting platform.
[0012] Preferably, the clamping and moving assembly includes a mounting frame, a fixed clamping arm is fixedly mounted on one end of the mounting frame, a movable clamping arm is slidably mounted on the mounting frame, the fixed clamping arm and the movable clamping arm are respectively disposed on both sides of the fixed ring frame, and a rotating clamping plate is mounted on both the fixed clamping arm and the movable clamping arm. The mounting frame is mounted on the linear moving module.
[0013] Preferably, a detection method for a laser scattering ceramic insulator internal defect detection device is as follows: S1. Install the porcelain insulator to be tested between the fixed clamping arm and the movable clamping arm, and move the porcelain insulator through the linear motion module to perform the test; S2. Turn on the laser emission probe to make it emit laser downwards; S3. When the emitted laser is completely received by the bottom receiving probe, it indicates that there are no defects inside the porcelain insulator. S4. When part of the emitted laser is received by the bottom receiving probe, and another part is received by the side receiving probe, the oblique front receiving probe, and the oblique back receiving probe, it indicates that there is a defect in the porcelain insulator.
[0014] Compared with the prior art, the beneficial effects of the present invention are: (1) In this invention, a bottom receiving probe is set at the bottom of the fixed ring frame, and side receiving probes and oblique forward receiving probes are set at the lower sides. When the laser emitted by the laser emission probe passes through the porcelain insulator and is completely received by the bottom receiving probe, it indicates that there is no defect inside the porcelain insulator. When there is laser scattering that is received by the side receiving probes and oblique forward receiving probes, it indicates that there is a defect inside the porcelain insulator, which is convenient for detection. (2) In this invention, an oblique back-facing receiving probe is provided on the side away from the fixed ring frame by the oblique forward receiving probe, and the oblique back-facing receiving probe and the oblique forward receiving probe face opposite directions. An arc-shaped focusing elastic arc plate is provided between two adjacent sliding mounting platforms. The focusing elastic arc plate can focus the scattered laser that has not been received into a small area near the oblique back-facing receiving probe, thereby improving the accuracy of scattered laser detection and avoiding the occurrence of scattered laser receiving dead angles. (3) In this invention, a synchronous linkage component is provided between two adjacent sliding mounting platforms and sliding mounting plates. When the bottom receiving probe is pulled down, it can drive each side receiving probe and the oblique forward receiving probe to move synchronously toward the side away from the fixed ring frame. When the diameter of the porcelain insulator being detected increases, the above operation is performed to ensure the best light-collecting distance and improve the efficiency of scattered light collection. (4) In this invention, when the sliding mounting platform moves away from the fixed ring frame, the focusing elastic arc plate between the two sliding mounting platforms expands elastically and the arc decreases, so that the focusing elastic arc plate focuses the scattered laser area towards the focusing elastic arc plate. When the sliding mounting plates move synchronously, the two pressure rods are driven by the pressure of the inclined surface of the limiting wedge plate to move the inclined part away from the receiving probe towards the focusing elastic arc plate, so as to ensure that it is in the focusing area of the focusing elastic arc plate and improve the scattered laser receiving effect. Attached Figure Description
[0015] The accompanying drawings are provided to further illustrate the invention and form part of the specification. They are used together with the embodiments of the invention to explain the invention and do not constitute a limitation thereof.
[0016] In the attached diagram: Figure 1 This is a schematic diagram of the laser scattering ceramic insulator internal defect detection device of the present invention; Figure 2 This is a schematic diagram of the laser detection component structure of the present invention; Figure 3 This is a schematic diagram of the fixed ring frame structure of the present invention; Figure 4 This is a schematic diagram of the laser receiver structure of the present invention; Figure 5 For the present invention Figure 4 Enlarged view of point A in the middle; Figure 6 This is a schematic diagram of the inclined receiving component structure of the present invention; Figure 7 This is a schematic diagram of the limiting wedge plate structure of the present invention; Figure 8 This is a schematic diagram of the synchronous linkage structure of the present invention; In the diagram: 1. Clamping and moving assembly; 11. Mounting frame; 12. Fixed clamping arm; 13. Moving clamping arm; 14. Rotating clamping plate; 2. Laser detection assembly; 21. Fixed ring frame; 22. Laser emission probe; 23. Support frame; 24. Lifting cylinder; 25. Bottom arc groove; 26. Sliding frame; 26a. First sliding frame; 26b. Second sliding frame; 26c. Third sliding frame; 27. Laser receiver; 271. Sliding mounting platform; 272. Bottom receiving probe; 273. Side receiving probe; 274. Focusing elastic arc plate; 275. Rotating head; 276. Rotating... 28. Seat; 281. Inclined receiver; 282. Sliding mounting plate; 283. Inclined forward receiving probe; 284. Guide rod; 285. Movable mounting plate; 286. Inclined backward receiving probe; 287. Sliding groove; 288. Sliding block; 289. First connecting rod; 2810. Spring; 2811. Pressure rod; 292. Limiting wedge plate; 293. Synchronous linkage component; 294. Fixed shaft; 295. Middle connecting plate; 296. Plate groove; 297. Side connecting plate; 298. Connecting slide groove; 299. Vertical sliding box; 290. Linkage slider; 291. Second connecting rod. Detailed Implementation
[0017] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.
[0018] Example 1, by Figure 1 The present invention relates to a laser scattering ceramic insulator internal defect detection device, comprising a clamping and moving assembly 1, a laser detection assembly 2 disposed below the clamping and moving assembly 1, the clamping and moving assembly 1 comprising a mounting frame 11, a fixed clamping arm 12 fixedly mounted at one end of the mounting frame 11, a movable clamping arm 13 slidably mounted on the mounting frame 11, the fixed clamping arm 12 and the movable clamping arm 13 being respectively disposed on both sides of a fixed ring frame 21, and a rotating clamping plate 14 mounted on both the fixed clamping arm 12 and the movable clamping arm 13, the mounting frame 11 being mounted on a linear moving module.
[0019] Depend on Figure 2 As shown, the laser detection component 2 includes a fixed ring frame 21, a laser emission probe 22 is installed on the inner bottom wall of the fixed ring frame 21, a semi-annular bottom arc groove 25 is opened at the bottom of the fixed ring frame 21, a sliding frame 26 is arranged in the circumferential direction of the fixed ring frame 21, a support frame 23 is arranged below the fixed ring frame 21, the fixed ring frame 21 is fixedly installed on the support frame 23, and a lifting cylinder 24 is installed on the support frame 23.
[0020] Depend on Figure 3 The sliding frame 26 includes three first sliding frames 26a that are equally spaced at the bottom and sides of the fixed ring frame 21, and a second sliding frame 26b is provided between two adjacent first sliding frames 26a. A third sliding frame 26c is provided between the first sliding frames 26a and the second sliding frames 26b. A laser receiver 27 is provided on the first sliding frame 26a, and an inclined receiver 28 is provided on the second sliding frame 26b. A synchronous linkage 29 is provided between adjacent laser receivers 27 and inclined receivers 28.
[0021] Depend on Figures 3-5 The laser receiver 27 includes sliding mounting platforms 271 that are slidably mounted on three first sliding frames 26a. The top sliding mounting platform 271 has a bottom receiving probe 272 mounted on its top end. The two sliding mounting platforms 271 are interlocked and each has a side receiving probe 273 mounted on one end. A focusing elastic arc plate 274 is provided between two adjacent sliding mounting platforms 271. Rotating heads 275 are symmetrically mounted on both ends of the focusing elastic arc plate 274. The rotating heads 275 are rotatably mounted on rotating seats 276. The two rotating seats 276 are respectively fixedly mounted on the ends of the two sliding mounting platforms 271 away from the clamping moving component 1. The lifting cylinder 24 is located below the bottom sliding mounting platform 271, and the output end of the lifting cylinder 24 is fixedly connected to the bottom sliding mounting platform 271.
[0022] Depend on Figures 6-7The inclined receiving component 28 includes a sliding mounting plate 281 slidably mounted on the third sliding frame 26c. An inclined forward receiving probe 282 is mounted on the side of the sliding mounting plate 281 closest to the fixed ring frame 21. A bottom receiving probe 272 is located at the bottom of the fixed ring frame 21, while side receiving probes 273 and inclined forward receiving probes 282 are located obliquely downwards on both sides. When the laser emitted by the laser emission probe 22 passes through the porcelain insulator and is completely received by the bottom receiving probe 272, it indicates that there are no defects inside the porcelain insulator. When laser scattering occurs and is received by the side receiving probes 273 and inclined forward receiving probes 282, it indicates that there are defects inside the porcelain insulator, facilitating detection. The sliding mounting plate 281 is located away from the fixed ring frame. A movable mounting plate 284 is provided on one side of the 21. An oblique back-facing receiving probe 285 is installed on the side of the movable mounting plate 284 away from the oblique forward receiving probe 282. The oblique back-facing receiving probe 285 is positioned facing the focusing elastic arc plate 274. The oblique forward receiving probe 282 is positioned away from the fixed ring frame 21, and the oblique back-facing receiving probe 285 faces the opposite direction to the oblique forward receiving probe 282. An arc-shaped focusing elastic arc plate 274 is provided between two adjacent sliding mounting platforms 271. The focusing elastic arc plate 274 can focus the unreceived scattered laser to a small area near the oblique back-facing receiving probe 285, thereby improving the accuracy of scattered laser detection. Guide rods 283 are symmetrically mounted on the side of the sliding mounting plate 281 near the movable mounting plate 284. The movable mounting plate 284 is slidably connected to the guide rods 283. Sliding grooves 286 are symmetrically opened on the sliding mounting plate 281. Sliding blocks 287 are slidably mounted inside the sliding grooves 286. First connecting rods 288 are symmetrically hinged on the side of the movable mounting plate 284 near the sliding mounting plate 281. The ends of the two first connecting rods 288 are respectively hinged to the two sliding blocks 287. Springs 289 are installed on the sides of the two sliding blocks 287 that are close to each other. One end of the spring 289 is fixedly connected to the inner wall of the side of the two sliding grooves 286 that are close to each other. Pressure rods 2810 are fixedly installed on the sides of the two sliding blocks 287 that are far from each other. The pressure rods 2810 penetrate to the side of the sliding mounting plate 281. The second sliding frame 26b... Limiting wedge plates 2811 are fixedly installed on both inner walls. A pressure gap is formed between the limiting wedge plates 2811 on both sides. The width of the pressure gap at the end away from the fixed ring frame 21 is smaller than the width of the end of the pressure gap near the fixed ring frame 21. When the sliding mounting platform 271 moves away from the fixed ring frame 21, the focusing elastic arc plate 274 between the two sliding mounting platforms 271 expands elastically and the arc decreases. This causes the focusing elastic arc plate 274 to move towards the focusing elastic arc plate 274. When the sliding mounting plate 281 moves synchronously, the two pressure rods 2810 are driven by the inclined surface pressure of the limiting wedge plate 2811 to move the inclined part away from the receiving probe 285 towards the focusing elastic arc plate 274, ensuring that it is in the focusing area of the focusing elastic arc plate 274 and improving the receiving effect of the scattered laser.
[0023] Depend on Figure 8The synchronous linkage component 29 includes a central connecting plate 292 slidably mounted on a third sliding frame 26c. Two symmetrical slots 293 are formed on the central connecting plate 292. Side connecting plates 294 are slidably mounted inside the slots 293. The two side connecting plates 294 are rotatably connected to fixed shafts 291 at opposite ends. The two fixed shafts 291 are fixedly mounted on a sliding mounting plate 281 and a sliding mounting platform 271. A connecting groove 295 is formed on the side of the slots 293 away from the fixed ring frame 21. A vertical sliding box 296 is fixedly mounted in the middle of the central connecting plate 292 on the side away from the fixed ring frame 21. The internal sliding mount of the 6 is equipped with a linkage slider 297. The two sides of the linkage slider 297 are symmetrically hinged with second connecting rods 298. The ends of the two second connecting rods 298 are respectively hinged to the two side connecting plates 294. Synchronous linkage components 29 are provided between the two adjacent sliding mounting platforms 271 and the sliding mounting plates 281. When the bottom receiving probe 272 is pulled down, it can drive each side receiving probe 273 and the oblique forward receiving probe 282 to move synchronously away from the fixed ring frame 21. When the diameter of the porcelain insulator being detected increases, the above operation is performed to ensure the optimal light-collecting distance and improve the efficiency of scattered light collection.
[0024] Working principle: During use, the fixed clamping arm 12 and the movable clamping arm 13 clamp both ends of the porcelain insulator, and the ends of the porcelain insulator are in close contact with the end face of the rotating clamping plate 14. The porcelain insulator and the fixed ring frame 21 are coaxially arranged. The linear movement module can drive the mounting frame 11 to move along its length direction, which in turn drives the porcelain insulator to move along its length direction. At the same time, the two rotating clamping plates 14 can drive the porcelain insulator to rotate around its axis, which facilitates the detection of internal defects in the porcelain insulator. During the detection process, the laser emission probe 22 is controlled to emit a laser beam downwards in a straight line, resulting in the following two situations: In scenario one, when there are no defects inside the porcelain insulator, the laser emitted by the laser emission probe 22 passes through the inside of the porcelain insulator and shoots straight down, and is completely received by the bottom receiving probe 272 at the bottom. In scenario two, when a defect occurs inside the porcelain insulator, after the laser emitted by the laser emission probe 22 enters the porcelain insulator, part of the laser is emitted from the bottom of the porcelain insulator and received by the bottom receiving probe 272. The other part of the laser is refracted and scattered to the side due to the influence of the defect, so that it is received by the two side receiving probes 273, the two oblique forward receiving probes 282, and the two oblique backward receiving probes 285 on both sides of the lower side. In summary, when the emitted laser is completely received by the bottom receiving probe 272, it indicates that there are no defects in the insulator below the laser emission probe 22. When part of the emitted laser is received by the bottom receiving probe 272 and the other part is received by the two side receiving probes 273, the two oblique forward receiving probes 282, and the two oblique backward receiving probes 285, it indicates that there are defects in the insulator below the laser emission probe 22.
[0025] When a portion of the scattered laser light passes through the receiving gap between the side receiving probe 273, the oblique front receiving probe 282, and the bottom receiving probe 272, a focusing elastic arc plate 274 is provided between two adjacent sliding mounting platforms 271. The focusing elastic arc plate 274 is concave on the side near the fixed ring frame 21. This causes the unreceived scattered laser light to be reflected when it hits the concave surface of the focusing elastic arc plate 274 and focused on the area where the oblique back receiving probe 285 is located. The laser light is then received by the oblique back receiving probe 285, improving the detection accuracy.
[0026] When the diameter of the porcelain insulator is large, the operator pulls the lowest sliding mounting platform 271 downward using the lifting cylinder 24. Since a synchronous linkage 29 is set between the sliding mounting platform 271 and the sliding mounting plate 281, the middle connecting plate 292 moves along the third sliding frame 26c, and the two retractable side connecting plates 294 move synchronously relative to each other through the linkage slider 297 and the second connecting rod 298. The ends of the two side connecting plates 294 are rotatably connected to the sliding mounting platform 271 and the sliding mounting plate 281, respectively. When the bottom sliding mounting platform 271 moves away from the fixed ring frame 21, it drives the other two sliding mounting platforms 271 and the two sliding mounting plates 281 to move synchronously along the sliding frame 26 away from the fixed ring frame 21. Thus, when the diameter of the porcelain insulator increases, the bottom receiving probe 272, the side receiving probe 273 and the oblique forward receiving probe 282 all move away from the axis of the porcelain insulator, ensuring the best light-gathering distance and improving the efficiency of scattered light collection. Simultaneously, after the sliding mounting platform 271 moves away from the fixed ring frame 21, the focusing elastic arc plate 274 between the two sliding mounting platforms 271 is elastically unfolded, but it still forms an arc shape. However, the curvature decreases as the sliding mounting platform 271 moves. When the curvature of the focusing elastic arc plate 274 decreases, its focusing position for the scattered laser moves towards the focusing elastic arc plate 274. During the movement of the sliding mounting plate 281 along the second sliding frame 26b away from the fixed ring frame 21, the ends of the two pressure rods 2810 on it are pressed by the inclined surface of the limiting wedge plate 2811, causing the two sliding blocks 287 to move closer to each other. Then, through the two first connecting rods 288, the inclined back-to-receiving probe 285 is pushed along the guide rod 283 towards the focusing elastic arc plate 274, so that the inclined back-to-receiving probe 285 can be finely adjusted to the focusing area of the focusing elastic arc plate 274, thereby improving the receiving effect of the scattered laser.
[0027] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.
[0028] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.
Claims
1. A laser scattering ceramic insulator internal defect detection device, comprising a clamping and moving assembly (1), characterized in that: A laser detection component (2) is provided below the clamping and moving component (1); The laser detection assembly (2) includes a fixed ring frame (21), a laser emission probe (22) is installed on the inner bottom wall of the fixed ring frame (21), a semi-circular bottom arc groove (25) is opened at the bottom of the fixed ring frame (21), and a sliding frame (26) is provided in the circumferential direction of the fixed ring frame (21). The sliding frame (26) includes three first sliding frames (26a) that are equally angled at the bottom and sides of the fixed ring frame (21), and a second sliding frame (26b) is provided between two adjacent first sliding frames (26a), and a third sliding frame (26c) is provided between the first sliding frame (26a) and the second sliding frame (26b). A laser receiver (27) is provided on the first sliding frame (26a), and an inclined receiver (28) is provided on the second sliding frame (26b). A synchronous linkage (29) is provided between adjacent laser receivers (27) and inclined receivers (28).
2. The laser scattering porcelain insulator internal defect detection device according to claim 1, characterized in that: The laser receiver (27) includes sliding mounting platforms (271) that are slidably mounted on three first sliding frames (26a). The top sliding mounting platform (271) has a bottom receiving probe (272) mounted on its top end. The two sliding mounting platforms (271) are clamped together and each has a side receiving probe (273) mounted on one end. A focusing elastic arc plate (274) is provided between two adjacent sliding mounting platforms (271). Rotary heads (275) are symmetrically mounted on both ends of the focusing elastic arc plate (274). The rotary heads (275) are rotatably mounted on the rotating base (276). The two rotating bases (276) are respectively fixedly mounted on the ends of the two sliding mounting platforms (271) away from the clamping moving component (1).
3. The laser scattering porcelain insulator internal defect detection device according to claim 1, characterized in that: The inclined receiving component (28) includes a sliding mounting plate (281) slidably mounted on a third sliding frame (26c). An inclined forward receiving probe (282) is mounted on the side of the sliding mounting plate (281) near the fixed ring frame (21). A movable mounting plate (284) is provided on the side of the sliding mounting plate (281) away from the fixed ring frame (21). An inclined backward receiving probe (285) is mounted on the side of the movable mounting plate (284) away from the inclined forward receiving probe (282). The inclined backward receiving probe (285) is positioned facing the focusing elastic arc plate (274). Guide rods (283) are symmetrically mounted on the side of the sliding mounting plate (281) near the movable mounting plate (284). The movable mounting plate (284) is slidably connected to the guide rods (283).
4. The laser scattering porcelain insulator internal defect detection device according to claim 3, characterized in that: The sliding mounting plate (281) is symmetrically provided with sliding grooves (286), and sliding blocks (287) are slidably installed inside the sliding grooves (286). The movable mounting plate (284) is symmetrically hinged to the side of the sliding mounting plate (281) with first connecting rods (288). The ends of the two first connecting rods (288) are respectively hinged to the two sliding blocks (287). Springs (289) are installed on the side of the two sliding blocks (287) that are close to each other. One end of the spring (289) is fixedly connected to the inner wall of the side of the two sliding grooves (286) that are close to each other.
5. The laser scattering porcelain insulator internal defect detection device according to claim 4, characterized in that: A pressure rod (2810) is fixedly installed on the side of each of the two sliding blocks (287) that is far apart from each other. The pressure rod (2810) extends through the side of the sliding mounting plate (281). Limiting wedge plates (2811) are fixedly installed on the inner walls of both sides of the second sliding frame (26b). A pressure gap is formed between the limiting wedge plates (2811) on both sides. The width of the end of the pressure gap away from the fixed ring frame (21) is smaller than the width of the end of the pressure gap close to the fixed ring frame (21).
6. The laser scattering porcelain insulator internal defect detection device according to claim 1, characterized in that: The synchronous linkage component (29) includes a central connecting plate (292) slidably mounted on the third sliding frame (26c). Two plate grooves (293) are symmetrically opened on the central connecting plate (292). Side connecting plates (294) are slidably mounted inside the plate grooves (293). The two side connecting plates (294) are rotatably connected to the fixed shaft (291) at one end away from each other. The two fixed shafts (291) are fixedly mounted on the sliding mounting plate (281) and the sliding mounting platform (271).
7. The laser scattering porcelain insulator internal defect detection device according to claim 6, characterized in that: A connecting groove (295) is provided on the side of the plate groove (293) away from the fixed ring frame (21). A vertical sliding box (296) is fixedly installed in the middle of the side of the middle connecting plate (292) away from the fixed ring frame (21). A linkage slider (297) is slidably installed inside the vertical sliding box (296). Second connecting rods (298) are symmetrically hinged on both sides of the linkage slider (297). The ends of the two second connecting rods (298) are respectively hinged to the two side connecting plates (294).
8. The laser scattering porcelain insulator internal defect detection device according to claim 1, characterized in that: The fixed ring frame (21) is located below the support frame (23). The fixed ring frame (21) is fixedly installed on the support frame (23). A lifting cylinder (24) is installed on the support frame (23). The lifting cylinder (24) is located below the lowest sliding mounting platform (271). The output end of the lifting cylinder (24) is fixedly connected to the lowest sliding mounting platform (271).
9. The laser scattering porcelain insulator internal defect detection device according to claim 1, characterized in that: The clamping and moving assembly (1) includes a mounting frame (11), a fixed clamping arm (12) is fixedly mounted on one end of the mounting frame (11), and a movable clamping arm (13) is slidably mounted on the mounting frame (11). The fixed clamping arm (12) and the movable clamping arm (13) are respectively located on both sides of the fixed ring frame (21). A rotating clamping plate (14) is mounted on both the fixed clamping arm (12) and the movable clamping arm (13). The mounting frame (11) is mounted on the linear moving module.
10. The detection method of the laser scattering porcelain insulator internal defect detection device according to any one of claims 1-9, characterized in that, The detection method is as follows: S1. Install the porcelain insulator to be tested between the fixed clamping arm (12) and the movable clamping arm (13), and move the porcelain insulator through the linear moving module to perform the test; S2. Turn on the laser emission probe (22) to make it emit laser downwards; S3. When the emitted laser is fully received by the bottom receiving probe (272) below, it indicates that there is no defect in the porcelain insulator. S4. When part of the emitted laser is received by the bottom receiving probe (272) and the other part is received by the side receiving probe (273), the oblique front receiving probe (282), and the oblique back receiving probe (285), it indicates that there is a defect in the porcelain insulator.