Radiation hardened programmable trim circuit, integrated circuit using the same, and electronic device

Abstract

The application discloses an anti-radiation programmable trimming circuit, an integrated circuit using the same and electronic equipment. The trimming circuit comprises a fuse trimming and reading circuit (1), a fuse control circuit (2) and a digital pre-trimming circuit (3). The fuse trimming and reading circuit (1) receives a fuse breaking signal and a data signal, and outputs a fuse trimming signal to the fuse control circuit (2). The fuse control circuit (2) receives the fuse trimming signal from the fuse trimming and reading circuit (1), and receives an inverse pre-trimming signal from the digital pre-trimming circuit (3), and outputs a fuse control signal to the digital pre-trimming circuit (3). The digital pre-trimming circuit (3) receives the data signal and a pre-trimming signal, and outputs the inverse pre-trimming signal to the fuse control circuit (2), and outputs an output signal. The application can realize convenient control on a later-stage circuit, and will not be affected by single event upset, and the circuit reliability is increased.

Description

Technical Field

[0001] This invention relates to the field of tuning circuit technology for integrated circuits, and more specifically, to a radiation-hardened programmable tuning circuit for integrated circuits, an integrated circuit using the radiation-hardened programmable tuning circuit, and a corresponding electronic device. Background Technology

[0002] Integrated circuits often require circuit tuning to adjust circuit parameters or functions to achieve optimal performance. During circuit debugging, pre-tuning functions are needed to adjust the control circuit, find the optimal control signal, and achieve the circuit's best performance.

[0003] With the development of nuclear energy and space technologies, more and more electronic devices are being used in various radiation environments, including electromagnetic radiation from space and radiation generated by nuclear power plants. Microelectronic devices (integrated circuits) are the basic units that make up electronic devices, and semiconductors and microelectronic devices (integrated circuits) are very sensitive to this radiation. Radiation can cause logic circuits to flip, resulting in circuit malfunction. Radiation acts on electronic devices, affecting their performance and function to varying degrees, and may even cause them to fail. Pre-fit circuits are generally digital circuits, which are easily affected by radiation, causing logic circuit flipping and thus circuit malfunction.

[0004] Figure 1 The diagram shows a typical fuse adjustment circuit. (Example:) Figure 1 As shown, the circuit includes a fixed current source I1, a fuse resistor R1, and two inverting amplifiers INV and INV2. Before programming, the fuse resistor R1 is in a low-resistance state, and the current from the fixed current source I1 is relatively small. At this time, the voltage drop across the fuse resistor R1 is lower than the switching voltage of the inverting amplifier INV1, and the output signal Out is low. After programming, the fuse resistor R1 is in a high-resistance state. At this time, the voltage drop across the fuse resistor R1 is higher than the switching voltage of the inverting amplifier INV, and the output signal Out is high. Therefore, the circuit parameters can be adjusted by whether the fuse resistor R1 is programmed. The advantages of this circuit are that it is a non-latching circuit, has strong radiation resistance, and the instantaneous switching of the inverting amplifier circuit has little impact on the subsequent stage circuit. However, the disadvantage of this circuit is that it cannot perform pre-adjustment function and cannot find the optimal adjustment data.

[0005] Figure 2 The diagram shows an existing adjustable fuse adjustment circuit. For example... Figure 2As shown, the circuit includes a fixed current source I1, a fuse resistor R1, an AND gate, a D flip-flop DFF, and two inverting amplifiers INV3 and INV4. Writing a pre-adjustment signal into the D flip-flop DFF changes the output signal Out, allowing the output signal Out to be set to the desired value, thus achieving the pre-adjustment function. One input of the AND gate is the READ signal input, and the other input is connected to the fuse resistor R1. Therefore, when this fuse adjustment circuit is working, the fuse resistor R1 is programmed to have high impedance, resulting in a high voltage drop across it. That is, the voltage at one input of the AND gate is high. When the READ signal is also high, the voltage at the SET pin of the D flip-flop DFF is high, setting the output signal Out to high. If the fuse resistor R1 is not programmed (i.e., has low impedance), the SET pin of the D flip-flop DFF is low, and the output signal Out is low.

[0006] However, the drawback of this tuning circuit is its poor radiation resistance. If the output signal Out after programming is high, and assuming that the inverting amplifier INV3 experiences a single event fault, the reset signal CLR becomes high, which will set the output signal Out of the D flip-flop to low and keep it low, causing subsequent circuit functions to fail.

[0007] Figure 3 This is a circuit diagram of a fuse circuit from a Chinese invention patent with authorization announcement number CN106057783B. (For example...) Figure 3 As shown, the drawback of this circuit is that when the control data preset terminal Pre_set signal is low, both the input terminal Data_in signal and the fuse control the output terminal Data_out signal, which can easily cause conflicts. For example, when the control data preset terminal Pre_set is low, the transmission gate T1 is open, and the electronic fuse is burned out, the voltage at point A is low. The opening of the transmission gate T1 causes the voltage at point B to follow the voltage at point A. If the input terminal Data_in signal is low, the inverting amplifier INV1 pulls the voltage at point B high, causing a conflict between the output signals of the transmission gate T1 and the inverting amplifier INV1, resulting in an uncertain output Data_out signal. Similarly, when Pre_set is low, the transmission gate T1 is open, and the electronic fuse is not burned out, the voltage at point A is high, and the opening of the transmission gate T1 causes the voltage at point B to follow the voltage at point A. If the input signal Data_in is high, the inverting amplifier INV1 pulls the level at point B low, causing the output signals of transmission gate T1 and inverting amplifier INV1 to conflict, resulting in an uncertain output signal Data_out. Summary of the Invention

[0008] The present invention aims to solve the problem of low radiation resistance of existing adjustment circuits with pre-adjustment function.

[0009] To address the aforementioned technical problems, the first aspect of this invention proposes a radiation-hardened programmable trimming circuit for integrated circuits, comprising a fuse trimming and readout circuit, a fuse control circuit, and a digital pre-trimming circuit; the fuse trimming and readout circuit receives inputs of a fuse-blown signal and a data signal, and outputs a fuse trimming signal to the fuse control circuit; the fuse control circuit receives the fuse trimming signal from the fuse trimming and readout circuit, and receives an inverted pre-trimming signal from the digital pre-trimming circuit, and outputs a fuse control signal to the digital pre-trimming circuit; the digital pre-trimming circuit receives the data signal and the pre-trimming signal, outputs an inverted pre-trimming signal to the fuse control circuit, and outputs an output signal, which serves as the output signal of the radiation-hardened programmable trimming circuit.

[0010] According to a preferred embodiment of the present invention, the fuse control circuit only outputs a high-level fuse control signal when both the fuse trimming signal and the inverting pre-trimming signal are high.

[0011] According to a preferred embodiment of the present invention, the digital pre-adjustment circuit only outputs the data signal as an output signal when the pre-adjustment signal is high.

[0012] According to a preferred embodiment of the present invention, the fuse adjustment and reading circuit includes a first AND gate, a first MOSFET, a second MOSFET, and a fuse resistor; The two inputs of the first AND gate are respectively connected to a fuse signal and a data signal, and its output is connected to the gate of the first MOS transistor; the gate of the second MOS transistor is connected to a bias signal. The first MOSFET and the second MOSFET are connected in parallel, with their sources connected together and their drains grounded. One end of the fuse resistor is connected to a high level, and the other end is connected to the source of two MOSFETs; One end connecting the two MOSFETs also serves as the output terminal of the fuse adjustment and readout circuit, so as to output the fuse adjustment signal.

[0013] According to a preferred embodiment of the present invention, the resistance ratio of the first MOS transistor and the second MOS transistor is between 1:1000 and 1:1000000.

[0014] According to a preferred embodiment of the present invention, the fuse control circuit includes a second AND gate, one input of which is connected to the fuse trimming signal, and the other input is connected to the digital pre-trimming circuit to receive an inverted pre-trimming signal, and its output is a fuse control signal.

[0015] According to a preferred embodiment of the present invention, the fuse control circuit further includes a buffer that receives a fuse adjustment signal from the output of the fuse adjustment and read circuit, and the output of the buffer is connected to one input of the second AND gate.

[0016] According to a preferred embodiment of the present invention, the digital pre-adjustment circuit 3 includes an inverting amplifier, a third AND gate, and an OR gate; the two inputs of the third AND gate respectively receive the pre-adjustment signal and the data signal; the inverting amplifier receives the pre-adjustment signal and outputs an inverted pre-adjustment signal to the second AND gate; the output of the third AND gate is connected to one input of the OR gate, the other input of the OR gate receives the fuse control signal, and the signal output by its output is used as the output signal of the radiation-resistant programmable adjustment circuit.

[0017] To address the aforementioned technical problems, a second aspect of the present invention provides an integrated circuit, wherein the assembly circuit includes the aforementioned radiation-resistant programmable trimming circuit for integrated circuits.

[0018] To address the aforementioned technical problems, a third aspect of the present invention provides an electronic device comprising the aforementioned integrated circuit.

[0019] In this invention, during circuit debugging, the digital pre-adjustment circuit controls the subsequent circuit, enabling convenient control. During normal operation, the digital pre-adjustment circuit will not function; the fuse adjustment circuit controls the subsequent circuit. Therefore, single-event upsets in the digital pre-adjustment circuit will not affect subsequent circuits, increasing circuit reliability.

[0020] The digital pre-adjustment circuit of this invention does not require additional radiation protection enhancements, such as multiple redundancy, radiation protection design, etc., thus reducing circuit area and production costs. Attached Figure Description

[0021] To make the technical problems solved by this invention, the technical means adopted, and the technical effects achieved clearer, specific embodiments of this invention will be described in detail below with reference to the accompanying drawings. However, it should be noted that the drawings described below are merely drawings of exemplary embodiments of this invention. Those skilled in the art can obtain drawings of other embodiments based on these drawings without any creative effort.

[0022] Figure 1 This is a circuit diagram of a typical existing fuse adjustment circuit.

[0023] Figure 2 This is a circuit diagram of an existing adjustable fuse adjustment circuit.

[0024] Figure 3This is a circuit diagram of a fuse circuit from a Chinese invention patent with authorization announcement number CN106057783B.

[0025] Figure 4 This is a circuit block diagram of the radiation-resistant programmable trimming circuit of the present invention.

[0026] Figure 5 This is a circuit diagram of one embodiment of the radiation-resistant programmable trimming circuit of the present invention. Detailed Implementation

[0027] To address the problems of existing technologies, this invention proposes to control the switching between the digital pre-adjustment circuit and the fuse adjustment circuit by time-division changing the control signal, thereby realizing the pre-adjustment function and the radiation resistance function of the fuse adjustment circuit.

[0028] The radiation-resistant programmable trimming circuit of the present invention includes a fuse trimming and reading circuit, a fuse control circuit, and a digital pre-trimming circuit; the fuse control circuit receives the fuse trimming signal from the fuse trimming and reading circuit and receives an inverted pre-trimming signal from the digital pre-trimming circuit, and outputs a fuse control signal to the digital pre-trimming circuit; the digital pre-trimming circuit of the present invention receives a data signal and a pre-trimming signal, outputs an inverted pre-trimming signal to the fuse control circuit, and outputs an output signal.

[0029] Exemplary embodiments of the invention will now be described more fully with reference to the accompanying drawings. While these exemplary embodiments can be implemented in various specific ways, they should not be construed as limiting the invention to the embodiments set forth herein. Rather, these exemplary embodiments are provided to make the content of the invention more complete and to facilitate a full communication of the inventive concept to those skilled in the art.

[0030] Subject to the inventive concept, the structures, performance, effects or other features described in a particular embodiment may be combined in any suitable manner with one or more other embodiments.

[0031] In the description of specific embodiments, detailed descriptions of structures, performance, effects, or other features are provided to enable those skilled in the art to fully understand the embodiments. However, this does not preclude those skilled in the art from implementing the present invention with technical solutions that do not contain the aforementioned structures, performance, effects, or other features under specific circumstances.

[0032] The flowchart in the accompanying drawings is merely an exemplary process demonstration and does not imply that the solution of this invention must include all the content, operations, and steps in the flowchart, nor does it imply that they must be executed in the order shown in the diagram. For example, some operations / steps in the flowchart can be decomposed, some operations / steps can be combined or partially combined, etc. Without departing from the inventive spirit of this invention, the execution order shown in the flowchart can be changed according to the actual situation.

[0033] The box in the attached diagram Figure 1 Generally, these refer to functional entities, and do not necessarily correspond to physically independent entities. That is, these functional entities can be implemented in software, in one or more hardware modules or integrated circuits, or in different network and / or processor devices and / or microcontroller devices.

[0034] The same reference numerals in the accompanying drawings denote the same or similar elements, components, or parts, and therefore, repeated descriptions of the same or similar elements, components, or parts may be omitted below. It should also be understood that although terms such as first, second, third, etc., indicating numbers may be used herein to describe various devices, elements, components, or parts, these devices, elements, components, or parts should not be limited by these terms. That is, these terms are only used to distinguish one from another. For example, a first device may also be referred to as a second device, without departing from the essential technical solution of the invention. Furthermore, the terms "and / or" and "and / or" refer to all combinations including any one or more of the listed items.

[0035] The following describes an embodiment of the apparatus of the present invention, which can be used to perform the method embodiments of the present invention. The details described in the apparatus embodiments of the present invention should be considered as supplements to the above method embodiments; details not disclosed in the apparatus embodiments of the present invention can be implemented with reference to the above method embodiments.

[0036] Figure 4 This is a circuit block diagram of the radiation-resistant programmable trimming circuit of the present invention. (See diagram below.) Figure 4As shown, the radiation-hardened programmable trimming circuit of the present invention includes a fuse trimming and reading circuit 1, a fuse control circuit 2, and a digital pre-trimming circuit 3. The fuse trimming and reading circuit 1 receives inputs of a fuse-breaking signal Burn and a data signal Data, and outputs a fuse trimming signal Trim to the fuse control circuit 2. The fuse control circuit 2 receives the fuse trimming signal Trim from the fuse trimming and reading circuit 1 and receives an inverted pre-trimming signal Inv_pre_trim from the digital pre-trimming circuit 3, and outputs a fuse control signal Fuse_Ctr to the digital pre-trimming circuit 3. The digital pre-trimming circuit 3 receives three input signals: a data signal Data, a pre-trimming signal Pre_trim, and a fuse control signal Fuse_Ctr from the fuse control circuit. It outputs two signals: an inverted pre-trimming signal Inv_pre_trim, which is input to the fuse control circuit 2, and an output signal Out, which is the output signal of the entire radiation-hardened programmable trimming circuit.

[0037] In this scheme, the fuse trimming and reading circuit 1 is used to activate the fuse trimming function based on the burning signal Burn, that is, to blow the internal fuse resistor, generate the fuse trimming signal Trim, and output the fuse trimming signal Trim to the fuse control circuit 2. The fuse control circuit 2 only outputs the high-level fuse control signal Fuse_Ctr when both the fuse trimming signal Trim and the inverted pre-trim signal Inv_pre_trim are high; the digital pre-trim circuit 3 only outputs the data signal Data as the output signal Out when the pre-trim signal Pre_trim is high.

[0038] As can be seen, this invention implements a time-sharing control method, utilizing different scenarios to achieve different functions to realize pre-trim and anti-radiation fuse trimming functions. Through pre-trim, the trimming circuit of this invention has programmable characteristics. Specifically, by adding a fuse control circuit 2 and outputting the inverted pre-trim signal Pre_trim, i.e., the inverted pre-trim signal Inv_pre_trim, to the fuse control circuit 2, and receiving the fuse control signal Fuse_Ctr output by the fuse control circuit 2, the pre-trim function is disabled when the circuit is working normally, and the fuse trimming and reading circuit 1 controls the subsequent circuit. The pre-trim function is only activated when circuit debugging is required. Furthermore, since the fuse control circuit 2 of this invention can use a non-latching circuit, the trimming circuit of this invention has anti-radiation effect. At the same time, the entry of this invention into pre-trim mode is not affected by the state of the trimming and reading circuit 1. Even if the internal fuse resistor has blown, it can still enter the pre-trim mode to continue debugging the circuit.

[0039] Figure 5This is a circuit diagram of one embodiment of the radiation-resistant programmable trimming circuit of the present invention. Figure 5 As shown, In this embodiment, the fuse trimming and readout circuit 1 includes a first AND gate AND1, a first MOSFET M1, a second MOSFET M2, and a fuse resistor Rf. The two inputs of the first AND gate AND1 are respectively connected to the fuse-breaking signal Burn and the data signal Data, and the output is connected to the gate of the first MOSFET M1. The gate of the second MOSFET M2 is connected to the bias signal Bias. The first MOSFET M1 and the second MOSFET M2 are connected in parallel, with their sources connected together and their drains grounded. One end of the fuse resistor Rf is connected to a high level, and the other end is connected to the sources of the two MOSFETs. The end connected to the two MOSFETs also serves as the output of the fuse trimming and readout circuit 1, outputting the fuse trimming signal Trim.

[0040] Since the gate of the second MOSFET M2 is connected to the bias signal, it should act as a normally conducting current source, providing approximately a few μA of current. If the fuse resistor Rf is not burned (blown), its resistance is tens of ohms, so the voltage drop across the fuse resistor Rf is very small, and the input of the buffer BUF is a high level. If the fuse resistor Rf is burned, its resistance is several megaohms, the voltage drop across the fuse resistor Rf is very large, and the input of the buffer BUF is a low level. In other embodiments, the second MOSFET M2 can also be replaced by other current sources.

[0041] In this embodiment, to ensure that the fuse resistor Rf blows during adjustment, the on-resistance of the first MOSFET M1 must be sufficiently small, significantly smaller than that of the second MOSFET M2. The ratio of their resistance values ​​can be between 1:1000 and 1:1000000. For example, the resistances of the first MOSFET M1 and the second MOSFET are 10 ohms and 1 megohm, respectively.

[0042] It should be noted that the buffer BUF mentioned above is used to shape the fuse trimming signal Trim. In other embodiments, this buffer can be omitted. The following describes the operating mode of the radiation-hardened programmable trimming circuit in the above embodiment.

[0043] In this embodiment, the fuse control circuit 2 includes a buffer BUF and a second AND gate AND2. The buffer BUF receives the fuse trimming signal Trim from the output of the fuse trimming and reading circuit 1. Its output is connected to one input of the second AND gate AND2. The other input of the second AND gate AND2 is connected to the digital pre-trimming circuit 3 to receive the inverted pre-trimming signal Inv_pre_trim. The output of the second AND gate AND2 outputs the fuse control signal Fuse_Ctr.

[0044] In this embodiment, the digital pre-trimming circuit 3 includes an inverting amplifier INV, a third AND gate AND3, and an OR gate OR. The two inputs of the third AND gate AND3 receive the pre-trimming signal Pre_trim and the data signal Data, respectively. The pre-trimming signal Pre_trim is simultaneously input to the inverting amplifier INV, and the inverted pre-trimming signal Inv_pre_trim output by the inverting amplifier INV is input to the second AND gate AND2 of the fuse control circuit 2. The output of the third AND gate AND3 is connected to one input of the OR gate OR, and the other input of the OR gate OR receives the fuse control signal Fuse_Ctr from the second AND gate AND2 of the fuse control circuit 2. The signal output from the OR gate OR serves as the output signal Out of the radiation-hardened programmable trimming circuit in this embodiment.

[0045] I. Pre-debugging mode During pre-tuning, the pre-tuning signal Pre_trim is high, the output of the inverting amplifier INV is low, the output of the second AND gate AND2 is low, the fuse control circuit is inactive, and the digital pre-tuning circuit operates. The output signal Out is the same as the data signal Data, enabling convenient debugging.

[0046] II. Circuit Breaker Adjustment Mode After the circuit has completed its pre-tuning, if it is necessary to burn out the fuse resistor Rf, the first MOSFET M1 will turn on when both the fuse signal Burn and the data signal Data are at a high level, thus burning out the fuse resistor Rf.

[0047] III. Normal Working Mode During normal operation, the pre-trim signal Pre_trim is low, and the output of the third AND gate AND3 is low. The digital pre-trim circuit 3 will not function, and the fuse trimming and readout circuit 1 controls the subsequent circuits. Therefore, a single-event upset (SWE) in the digital pre-trim circuit 3 will not affect the subsequent circuits. Furthermore, because the fuse control circuit uses a non-latching circuit, a SWE may cause the inverter BUF and the second AND gate AND2 to flip, but it will not cause the output signal Out to be incorrectly latched. Therefore, this circuit has strong SWE resistance.

[0048] As can be seen from the above description, the radiation-resistant programmable trimming circuit of the present invention, compared with the technical solution of the invention patent with authorization announcement number CN106057783B, adopts a buffer BUF, a second AND gate AND2, a third AND gate AND3, and selects the fuse trimming signal Trim and the data signal Data through an OR gate. Even if the fuse resistor Rf burns out and the circuit still needs to be debugged, it can still enter the pre-debugging mode to debug the circuit.

[0049] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of the present invention. It should be understood that the present invention is not inherently related to any specific computer, virtual device, or electronic device, and various general-purpose devices can also implement the present invention. The above descriptions are merely specific embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A radiation-hardened programmable trimming circuit for integrated circuits, characterized in that, It includes a fuse adjustment and reading circuit (1), a fuse control circuit (2), and a digital pre-adjustment circuit (3); The fuse trimming and reading circuit (1) receives the input of the fuse breaking signal Burn and the data signal Data. It starts the fuse trimming function according to the fuse breaking signal Burn, that is, it melts the fuse resistor inside and outputs the fuse trimming signal Trim to the fuse control circuit (2). The fuse control circuit (2) receives the fuse trimming signal Trim from the fuse trimming and reading circuit (1) and the inverted pre-trim signal Inv_pre_trim from the digital pre-trim circuit (3), and outputs the fuse control signal Fuse_Ctr to the digital pre-trim circuit (3). The high-level fuse control signal Fuse_Ctr is only output when both the fuse trimming signal Trim and the inverted pre-trim signal Inv_pre_trim are high. The digital pre-trim circuit (3) receives the data signal Data and the pre-trim signal Pre_trim, outputs the inverted pre-trim signal Inv_pre_trim to the fuse control circuit (2), and outputs the output signal Out. The output signal Out is used as the output signal of the radiation-resistant programmable trimming circuit. The data signal Data is output as the output signal Out only when the pre-trim signal Pre_trim is high.

2. The radiation-hardened programmable trimming circuit for integrated circuits according to claim 1, characterized in that, The fuse adjustment and reading circuit (1) includes a first AND gate (AND1), a first MOS transistor (M1), a second MOS transistor (M2), and a fuse resistor (Rf). The two input terminals of the first AND gate (AND1) are respectively connected to the fuse signal Burn and the data signal Data, and its output terminal is connected to the gate of the first MOS transistor (M1); the gate of the second MOS transistor (M2) is connected to the bias signal Bias. The first MOSFET (M1) and the second MOSFET (M2) are connected in parallel, with their sources connected together and their drains grounded. One end of the fuse resistor (Rf) is connected to a high level, and the other end is connected to the source of two MOS transistors; One end of the two MOS transistors is also used as the output of the fuse trimming and reading circuit (1) to output the fuse trimming signal Trim.

3. The radiation-hardened programmable trimming circuit for integrated circuits according to claim 2, characterized in that, The resistance ratio of the first MOSFET (M1) and the second MOSFET (M2) is between 1:1000 and 1:1000000.

4. The radiation-resistant programmable trimming circuit for integrated circuits according to claim 2, characterized in that, The fuse control circuit (2) includes a second AND gate (AND2), one input of which is connected to the fuse trimming signal Trim, and the other input is connected to the digital pre-trimming circuit (3) to receive the inverted pre-trimming signal Inv_pre_trim, and its output is the fuse control signal Fuse_Ctr.

5. The radiation-hardened programmable trimming circuit for integrated circuits according to claim 4, characterized in that, The fuse control circuit (2) further includes a buffer (BUF) that receives the fuse trimming signal Trim from the output of the fuse trimming and reading circuit (1) and whose output is connected to one input of the second AND gate (AND2).

6. The radiation-hardened programmable trimming circuit for integrated circuits according to claim 5, characterized in that: The digital pre-adjustment circuit (3) includes an inverting amplifier (INV), a third AND gate (AND3), and an OR gate (OR). The two inputs of the third AND gate (AND3) receive the pre-trim signal Pre_trim and the data signal Data, respectively. The inverting amplifier (INV) receives the pre-trim signal Pre_trim and outputs an inverted pre-trim signal Inv_pre_trim to the second AND gate (AND2). The output of the third AND gate (AND3) is connected to one input of the OR gate (OR), and the other input of the OR gate (OR) receives the fuse control signal Fuse_Ctr. The signal output from its output is the output signal Out of the radiation-resistant programmable trimming circuit.

7. An integrated circuit, characterized in that, Includes the radiation-hardened programmable trimming circuit for integrated circuits as described in any one of claims 1 to 6.

8. An electronic device, characterized in that, Includes the integrated circuit described in claim 7.

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