Test adapter for high frequency elastic connectors and multi-channel test adapter assembly

Abstract

The application relates to the technical field of radio frequency connector testing, and provides a test adapter for a high-frequency elastic connector and a multi-channel test adapter assembly, which comprises a cable-free rigid coaxial body, the body comprising an inner conductor, an outer conductor and a partial medium support; a coaxial cavity is formed between the inner conductor and the outer conductor, and the partial medium support is arranged in the cavity to fix the inner conductor, and the remaining area is an air medium; one end of the body is provided with a press contact end for axial press contact with the high-frequency elastic connector, and the end face of the inner conductor and the end face of the outer conductor are flush. Through the air medium main cavity and the coplanar press contact design, high-precision and low-loss radio frequency index testing of the elastic connector under a 110 GHz frequency band is realized.

Description

Technical Field

[0001] The present invention relates to the technical field of flexible radio frequency connectors, and in particular to a test adapter and multi-channel test adapter assembly for high-frequency flexible connectors. Background Technology

[0002] As microwave integrated circuits advance to higher frequency bands, flexible RF connectors (such as snap-fit ​​connectors and spring pins) are widely used in signal transmission at 110 GHz and above due to their advantages of small size and wide bandwidth. However, existing technologies have significant drawbacks when performing performance testing on these high-frequency flexible connectors: on the one hand, traditional pin-and-socket standard connectors cannot achieve reliable axial compression contact with flexible connectors, resulting in test interface mismatch; on the other hand, when using PCB boards or cable assemblies as test media, limitations in substrate material loss, manufacturing process precision, and the high-frequency attenuation of the cables themselves make it difficult to maintain a stable 50-ohm impedance match across the entire 110 GHz band. Furthermore, the additional losses introduced by the cables are difficult to calibrate accurately, leading to distorted test results for key RF indicators such as voltage standing wave ratio (VSWR) and insertion loss, making it impossible to accurately assess the true performance of the flexible connector itself. Therefore, there is an urgent need for a dedicated adapter that can achieve low loss, high impedance consistency, and is compatible with flexible connector compression testing at extremely high frequencies. Summary of the Invention

[0003] The purpose of this invention is to overcome the shortcomings of the prior art and provide a test adapter and multi-channel test adapter assembly for high-frequency flexible connectors, which realizes high-precision, low-loss compression testing of the RF indicators of flexible connectors in the 110GHz band.

[0004] The objective of this invention is achieved through the following technical solution: This invention provides a test adapter for high-frequency flexible connectors. The test adapter includes a cableless rigid coaxial body and structural components. The cableless rigid coaxial body is mounted on the structural components. The cableless rigid coaxial body includes an inner conductor, an outer conductor, and a partial dielectric support component, with the inner conductor and the partial dielectric support component disposed within the outer conductor. A coaxial cavity is formed between the inner conductor and the outer conductor, and the partial dielectric support component is connected to the inner conductor. A first end of the outer conductor is provided with a compression contact end for connecting to the high-frequency flexible connector. A second end of the outer conductor is provided with a standard connection end for connecting to a testing instrument. The standard connection end is flush with one end of the inner conductor. The high-frequency flexible connector and the testing instrument are connected for testing through the inner conductor.

[0005] According to one embodiment of the present invention, the outer conductor includes a first outer conductor and a second outer conductor connected to each other; the local dielectric support is an annular dielectric body, which is sleeved on the middle part of the inner conductor and disposed between the first outer conductor and the second outer conductor; the local dielectric support is supported on the inner peripheral wall of the second outer conductor to limit the axial displacement of the annular dielectric body.

[0006] According to one embodiment of the present invention, the inner peripheral wall of the second outer conductor is provided with a supporting portion, and the end of the inner conductor is supported and fixed to the supporting portion.

[0007] According to one embodiment of the present invention, the inner conductor is provided with the mounting portion at one end near the first outer conductor, the mounting portion having an installation limiting port, and the partial dielectric support member being engaged in the installation limiting port.

[0008] According to one embodiment of the present invention, one end of the inner conductor located at the pressing contact end is a solid planar structure, and the other end of the inner conductor is a planar pad structure; and / or, the local dielectric support is provided with a snap-fit ​​portion, the snap-fit ​​portion snaps into the mounting limiting port, and the number of snap-fit ​​portions is multiple, the snap-fit ​​portions are arranged around the periphery of the local dielectric support.

[0009] According to one embodiment of the present invention, the standard connection end is disposed at the end of the second outer conductor away from the first outer conductor, and the pressing contact end is disposed at the end of the first outer conductor away from the second outer conductor.

[0010] According to one embodiment of the present invention, the local dielectric support member has a through hole, the through hole being connected to the inner conductor and the outer conductor, and the through hole being used for a test cable to pass through the through hole and be connected to the outer conductor.

[0011] According to one embodiment of the present invention, the outer peripheral surface of the second outer conductor is provided with a positioning cylindrical surface, which is used to engage with the through hole of the external structural component for positioning.

[0012] The present invention also provides a multi-channel test adapter assembly for high-frequency flexible connectors, comprising: a structural component; and a test adapter according to the above embodiments, wherein a plurality of the test adapters are arranged in an array and mounted on the structural component; the pressing contact ends of each of the test adapters face the same side, and each of the pressing contact ends is in the same plane; each of the test adapters is fixedly connected to the end face of the structural component by screws.

[0013] According to one embodiment of the present invention, the center-to-center distance between adjacent test adapters is greater than or equal to 4.8 mm; and / or, the center-to-center distance between adjacent test adapters is between 2.5 mm and 4.8 mm.

[0014] Compared with the prior art, the present invention has at least the following advantages: By employing a cableless rigid coaxial body design, test signals are not transmitted through flexible cables, minimizing additional losses introduced during testing. Furthermore, the design incorporates localized dielectric supports that only support the inner conductor, with most of the coaxial cavity using air dielectric. Air dielectric has a lower dielectric constant and lower dielectric loss compared to traditional solid dielectrics. The use of cableless components and redundant dielectric bodies also avoids the high cutoff frequency caused by longer cables. This eliminates the significant transmission losses caused by the skin effect and dielectric filling of flexible cables at 110GHz ultra-high frequencies, avoiding the high RF insertion loss due to longer cables. It achieves continuous and stable 50-ohm characteristic impedance matching throughout the transmission link, preventing signal reflection and test result distortion caused by impedance abrupt changes. This makes the test adapter more suitable for signal transmission requirements at 110GHz and above. The coaxial cavity's size design meets the 50-ohm characteristic impedance matching requirement, maintaining stable impedance consistency across the entire frequency band and effectively solving the problems of poor impedance matching and test result distortion in traditional testing methods. The press-fit contact end sets the inner conductor end face and the outer conductor end face to be flush, which can adapt to the axial press-fit test requirements of high-frequency elastic connectors. It ensures that the inner conductor and the outer conductor can achieve stable contact at the same time when the elastic connector is pressed, avoiding the problems of mismatch and poor contact reliability of traditional plug-in structure interfaces, thereby improving the accuracy and repeatability of test results. Attached Figure Description

[0015] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This is a cross-sectional view of a test adapter in one embodiment; Figure 2 This is a schematic diagram of the inner conductor in one embodiment; Figure 3 This is a schematic diagram of the test adapter in one embodiment; Figure 4 This is a cross-sectional view of a multi-channel test adapter assembly in one embodiment; Figure 5This is a schematic diagram of the structure of a multi-channel test adapter component in one embodiment; Figure Descriptions: 10. Test adapter; 100. Cableless rigid coaxial body; 120. Inner conductor; 1210. Mounting part; 1211. Mounting limit port; 130. Outer conductor; 1310. First outer conductor; 1311. Press-fit contact end; 1320. Second outer conductor; 1321. Supporting part; 1322. Positioning cylindrical surface; 1323. Standard connection end; 140. Partial dielectric support; 1410. Snap-fit ​​part; 1420. Through hole; 200. Coaxial cavity; 300. Structural component; 400. Screw; Detailed Implementation

[0017] To facilitate understanding of the present invention, a more complete description will be given below with reference to the accompanying drawings. Preferred embodiments of the invention are shown in the drawings. However, the invention can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a thorough and complete understanding of the disclosure of the invention.

[0018] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly attached to the other element or there may be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.

[0019] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0020] Please see Figures 1 to 5 To better understand the test adapter 10 of this application, the test adapter 10 will be further explained below: A test adapter 10 for a high-frequency flexible connector includes a cableless rigid coaxial body 100 and a structural component 300. The cableless rigid coaxial body 100 is mounted on the structural component 300. The cableless rigid coaxial body 100 includes an inner conductor 120, an outer conductor 130, and a partial dielectric support 140, with the inner conductor 120 and the partial dielectric support 140 disposed within the outer conductor 130. A coaxial cavity 200 is formed between the inner conductor 120 and the outer conductor 130, and the partial dielectric support 140 is connected to the inner conductor 120. A first end of the outer conductor 130 is provided with a crimping contact end 1311 for connecting with the high-frequency flexible connector. A second end of the outer conductor 130 is provided with a standard connection end 1323 for connecting to a test instrument for testing. The high-frequency flexible connector and the test instrument are connected for testing via the inner conductor 120. Understandably, by adopting a cableless rigid coaxial body 100 structural design, test signals are not transmitted through flexible cables, minimizing additional losses introduced during testing. Simultaneously, the local dielectric support 140 supports only the inner conductor 120, and most of the coaxial cavity 200 uses air as the dielectric. Air dielectric has a lower dielectric constant and dielectric loss than traditional solid dielectrics, making it more suitable for signal transmission requirements in the 110GHz and above ultra-high frequency bands. Combined with the size design of the coaxial cavity 200 to meet the 50-ohm characteristic impedance matching requirement, it can maintain stable impedance consistency across the entire frequency band, effectively solving the problems of poor impedance matching and distorted test results in traditional testing methods. Furthermore, the compression contact 1311 sets the end faces of the inner conductor 120 and outer conductor 130 to be flush, adapting to the axial compression testing requirements of high-frequency flexible connectors. This ensures that the inner conductor 120 and outer conductor 130 can simultaneously achieve stable contact during flexible connector compression, avoiding the problems of interface mismatch and poor contact reliability in traditional plug-in structures, thereby improving the accuracy and repeatability of test results.

[0021] In another embodiment, the outer conductor 130 includes a first outer conductor 1310 and a second outer conductor 1320 that are interconnected. The local dielectric support 140 is an annular dielectric body, which is sleeved on the middle of the inner conductor 120 and disposed between the first outer conductor 1310 and the second outer conductor 1320. The local dielectric support 140 is supported by the inner peripheral wall of the second outer conductor 1320 to limit the axial displacement of the annular dielectric body. In this embodiment, the annular dielectric body is placed at the splice of the two outer conductors 130, and its axial position is limited by the inner peripheral wall of the second outer conductor 1320. Stable positioning of the local dielectric support 140 can be achieved without additional fixing structures, simplifying the overall processing and assembly process. At the same time, it ensures the positional accuracy of the inner conductor 120 and avoids axial movement of the inner conductor 120 during use, further ensuring impedance stability and test reliability at high frequencies. Furthermore, by separating the outer conductor 130 from the inner conductor 120 through the local dielectric support 140, it ensures that the inner conductor 120 is fixed while preventing short circuits between the inner and outer conductors 130.

[0022] In another embodiment, the cableless rigid coaxial body 100 includes an inner conductor 120, an outer conductor 130, and a local dielectric support 140. The outer conductor 130 physically forms the external shielding shell of the adapter, housing the inner conductor 120. In this embodiment, the outer conductor 130 can be a single-piece structure or a modular structure assembled from multiple components, as long as a complete electromagnetic shielding circuit can be formed. The local dielectric support 140 is configured as an insulating isolation component between the inner conductor 120 and the outer conductor 130, and its material is typically polyetheretherketone, polytetrafluoroethylene, or other low-loss engineering plastics to ensure electrical performance at high frequencies.

[0023] In one embodiment, the inner peripheral wall of the second outer conductor 1320 is provided with a supporting portion 1321, and the end of the inner conductor 120 is fixed to the supporting portion 1321. It is understood that the supporting portion 1321 directly provides axial support to the inner conductor 120, forming a dual-point fixation with the annular local dielectric support 140 sleeved in the middle, further improving the fixation stability of the inner conductor 120, preventing displacement of the inner conductor 120 under axial force during the pressing test, ensuring that the end face flushness accuracy of the pressing contact end 1311 is not affected, and maintaining stable high-frequency impedance matching and reliable contact.

[0024] Furthermore, the inner conductor 120 is provided with a mounting portion 1210 at one end near the first outer conductor 1310. The mounting portion 1210 has a mounting limiting port 1211, and the partial dielectric support 140 is engaged with the mounting limiting port 1211. It can be understood that the mounting limiting port 1211 achieves radial positioning and engagement between the partial dielectric support 140 and the inner conductor 120, limiting the relative radial displacement between them. This prevents impedance mismatch caused by eccentric support of the inner conductor 120 during testing, further improving the positional accuracy of the inner conductor 120 and ensuring the stability of high-frequency signal transmission.

[0025] In another embodiment, the inner conductor 120 has a solid planar structure at one end of the press-fit contact 1311, and a planar pad structure at the other end. It is understood that the solid planar structure ensures that the inner conductor 120 fully conforms to the contact surface of the high-frequency elastic connector during press-fit contact, avoiding poor contact or parasitic capacitance changes caused by uneven structures, thus meeting the stable transmission requirements of ultra-high frequency signals above 110GHz. The planar pad structure at the other end can be directly soldered to the inner core of a standard coaxial interface. Compared to traditional plug-in structures, the soldering method achieves lower contact resistance and higher connection strength, avoiding additional impedance changes at the interface and further improving the stability of high-frequency transmission performance.

[0026] In another embodiment, the local medium support 140 is provided with a snap-fit ​​portion 1410, which snaps into the mounting limiting port 1211. There are multiple snap-fit ​​portions 1410, which are arranged around the periphery of the local medium support 140. In this embodiment, by arranging multiple snap-fit ​​portions 1410 around the periphery of the local medium support 140, each snap-fit ​​portion 1410 is evenly distributed along the circumference of the local medium support 140 and simultaneously snaps into the mounting limiting port 1211 at multiple circumferential positions. This forms a multi-point circumferential limiting effect on the local medium support 140, avoiding local stress concentration and snap-fit ​​loosening caused by force on a single snap-fit ​​portion 1410, and ensuring uniform force distribution on the local medium support 140 during assembly and testing. Simultaneously, The uniform distribution of multiple snap-fit ​​portions 1410 can improve the alignment accuracy between the local dielectric support 140 and the inner conductor 120, suppress the radial offset and circumferential rotation of the local dielectric support 140 relative to the inner conductor 120, further ensure the centered positioning of the inner conductor 120 within the coaxial cavity 200, and maintain a uniform dimensional structure of the coaxial cavity 200 in the entire circumference, thereby maintaining a stable 50-ohm characteristic impedance matching, improving the consistency of high-frequency signal transmission and the accuracy and repeatability of test results.

[0027] In one embodiment, the standard connection terminal 1323 is located at the end of the second outer conductor 1320 away from the first outer conductor 1310, and the crimping contact terminal 1311 is located at the end of the first outer conductor 1310 away from the second outer conductor 1320. It is understood that by placing the standard connection terminal 1323 at the end of the second outer conductor 1320 away from the first outer conductor 1310 and the crimping contact terminal 1311 at the end of the first outer conductor 1310 away from the second outer conductor 1320, the crimping contact terminal 1311 and the standard connection terminal 1323 are axially positioned at opposite ends of the cableless rigid coaxial body 100. They form a straight coaxial transmission path via the through inner conductor 120. The test signal is directly transmitted from the crimping contact terminal 1311 through the inner conductor 120 to the standard connection terminal 1323. The transmission path is short and without bends, reducing signal reflection and loss during transmission, further adapting to 110GHz. The signal transmission requirements of ultra-high frequency bands and above are met. At the same time, the layout of the press-fit contact end 1311 and the standard connection end 1323 being placed at opposite ends allows the press-fit contact end 1311 to be axially pressed toward the high-frequency elastic connector and the standard connection end 1323 to be docked toward the test instrument. The two do not interfere with each other, which facilitates assembly and operation during the test process.

[0028] In one embodiment, the local dielectric support 140 has a via 1420, which communicates with the inner conductor 120 and the outer conductor 130. It is understood that by creating a via 1420 on the local dielectric support 140 that communicates with the inner conductor 120 and the outer conductor 130, the amount of solid dielectric used in the local dielectric support 140 is reduced. This further reduces the area occupied by solid dielectric within the coaxial cavity 200 and increases the proportion of air dielectric, thereby reducing the equivalent dielectric constant and dielectric loss in the area where the local dielectric support 140 is located. This is more conducive to low-loss transmission of signals in the 110GHz and above ultra-high frequency bands and across the entire frequency band (50GHz). Maintaining the consistency of ohmic characteristic impedance; on the other hand, the via 1420 allows the air medium regions on both sides of the coaxial cavity 200 separated by the local dielectric support 140 to be interconnected through the via 1420, avoiding the local dielectric support 140 from dividing the coaxial cavity 200 into a closed chamber, which helps to balance the air pressure on both sides of the coaxial cavity 200, suppress the influence of air pressure difference caused by changes in ambient temperature on the positional accuracy of the inner conductor 120 and the deformation of the local dielectric support 140, thereby ensuring the stability of impedance at high frequencies; at the same time, the via 1420 also facilitates the flow of gas and medium during assembly, electroplating and cleaning, reduces the process difficulty of assembling the local dielectric support 140 with the inner conductor 120 and the outer conductor 130, and further improves the transmission performance and test results reliability of the cableless rigid coaxial body 100 in the ultra-high frequency band.

[0029] Preferably, a coaxial cavity 200 is formed between the inner conductor 120 and the outer conductor 130. A local dielectric support 140 is disposed within the coaxial cavity 200 to fix the inner conductor 120, and the remaining area of ​​the coaxial cavity 200 is air dielectric. Specifically, this structural design establishes a transmission line architecture with air as the dominant dielectric. Since air has a near-low dielectric constant and an extremely low dielectric loss tangent, allocating most of the volume of the coaxial cavity 200 to air minimizes dielectric absorption loss and dispersion effects during signal transmission. The local dielectric support 140 exists only at necessary mechanical fixing points, for example, occupying only a small portion of the cavity's axial length, thereby achieving optimal impedance matching along the entire length while ensuring the coaxiality and structural stability of the inner conductor 120. This air dielectric-dominated design is the key physical basis for ensuring excellent voltage standing wave ratio and insertion loss performance in the 110GHz band.

[0030] In another embodiment, one end of the cableless rigid coaxial body 100 is provided with a pressing contact end 1311, which is used for axial pressing contact with a high-frequency flexible connector. This pressing contact end 1311 differs from traditional pin-and-socket interconnect structures; it does not contain any elastic springs or slots, but exists as a rigid mating reference surface. During testing, the high-frequency flexible connector under test (such as a snap button, spring pin array, etc.) is pressed axially against this contact end, relying on the compression deformation of the flexible connector itself to establish a reliable electrical path. This method not only eliminates mechanical wear caused by repeated insertion and removal but also avoids impedance abrupt changes caused by inconsistent insertion depth, making it particularly suitable for high-density, multi-channel automated testing scenarios that require frequent replacement of the test device.

[0031] In another embodiment, at the press-fit contact 1311, the end face of the inner conductor 120 is flush with the end face of the outer conductor 130. It is understood that flush means the end faces of the inner conductor 120 and the outer conductor 130 are in the same geometric plane, forming a continuous, stepless mating interface. This coplanar structure provides a uniform pressure distribution reference for the resilient connector, ensuring that the center signal contact and the peripheral ground contact can contact the resilient connector synchronously and at the same height. If the inner conductor 120 protrudes or recedes from the end face of the outer conductor 130, it will cause uneven stress on the resilient connector, resulting in contact resistance fluctuations or, in severe cases, permanent deformation or damage to the elastomer under long-term press-fitting. Therefore, strict flushness of the end faces is not only a requirement for mechanical assembly but also a necessary condition for ensuring impedance continuity of high-frequency signals in the transition region and reducing reflection loss. It should be understood that in actual manufacturing, the flushness is usually controlled within the micrometer tolerance range to meet the stringent electrical requirements of the 110GHz band.

[0032] Furthermore, the local dielectric support 140 occupies only a local axial length of the coaxial cavity 200, with the remaining axial region of the coaxial cavity 200 filled with air. In this embodiment, the dielectric body does not penetrate the entire coaxial cavity 200, but is only provided at a specific position in the middle of the axial direction for a limited length to fix the coaxiality of the inner conductor 120. The area between the inner and outer conductors 130 at both ends of the dielectric body up to the port region is completely filled with air. This "dielectric-air-dielectric" distribution architecture effectively suppresses impedance abrupt changes caused by dielectric discontinuities, ensuring high-precision achievement of 50-ohm impedance matching across the entire length in the 110GHz band. It should be understood that although this embodiment shows the dielectric body located in the middle, in other feasible implementations, as long as local support is satisfied and the overall air-medium dominant characteristics are not compromised, the specific axial position of the dielectric body can be adjusted as needed.

[0033] In one embodiment, the ratio of the outer diameter of the inner conductor 120 to the inner diameter of the first outer conductor 1310 satisfies a 50-ohm characteristic impedance matching requirement; the outer diameter of the inner conductor 120 is 0.434 mm to 0.35 mm, and the inner diameter of the first outer conductor 1310 is 1.0 mm to 0.5 mm. This means that the outer diameter of the inner conductor 120 is 0.434 mm to 0.35 mm, and the inner diameter of the first outer conductor 1310 is 1.0 mm to 0.5 mm. Extremely low voltage standing wave ratio (VSWR) and insertion loss can be achieved in the 110 GHz band. It is particularly important to emphasize that the ±0.005 mm tolerance range specified here is not an arbitrary choice of machining precision, but rather a critical balance point based on the sensitivity to 110 GHz ultra-high frequency performance and the capability of precision machining. At such high frequencies, transmission lines are extremely sensitive to changes in geometry. If the manufacturing tolerance exceeds ±0.005mm, the local impedance will deviate from the allowable threshold by 50 ohms, leading to significant signal reflection and deterioration of the VSWR, rendering the test results unreliable. Conversely, pursuing even smaller tolerances would drastically increase manufacturing costs and scrap rates. Therefore, this tolerance range ensures both the electrical performance consistency required for 110GHz testing and the feasibility of industrial production.

[0034] In one embodiment, the other end of the cableless rigid coaxial body 100 is provided with a standard coaxial interface for docking with test instruments; the inner conductor 120 extends into the standard coaxial interface. It is understood that this standard coaxial interface constitutes the physical and electrical reference for the signal output side of the test adapter 10. In this embodiment, the standard coaxial interface can be of type 1.0-K, 1.85mm, 2.92mm, SMP, or SSMA, etc. This centralized design allows the test adapter 10 of this application to flexibly adapt to vector test instruments or test receivers of different frequency bands and brands, achieving seamless docking as long as the port of the test instrument conforms to the corresponding industry standards.

[0035] In one embodiment, the standard coaxial interface is a 1.0-K type interface. Specifically, the 1.0-K type interface is a precision coaxial connector standard currently used in the RF testing field, specifically designed to cover the DC to 110GHz frequency band. It has an extremely high cutoff frequency and excellent modal purity, effectively suppressing the generation of higher-order modes, making it the preferred interface for millimeter-wave and submillimeter-wave testing. In this embodiment, the 1.0-K type interface is selected to ensure that the test adapter 10 can seamlessly interface with mainstream vector test instruments and 110GHz test accessories, thereby constructing a standardized test link. It should be understood that although this embodiment uses the 1.0-K type interface as a preferred example, this is not an absolute limitation on the scope of protection. In other application scenarios, if the test frequency or equipment configuration is different, this standard coaxial interface can also be replaced with a 1.85mm type, a 2.92mm type, or other precision coaxial interfaces that meet the transmission requirements of the corresponding frequency band, as long as they can achieve low-reflection interconnection with the test instruments.

[0036] In one implementation, the inner conductor 120 is integrally formed. This choice of connection process is crucial for ensuring the quality of ultra-high frequency signal transmission. At the 110 GHz band, the wavelength of electromagnetic waves has shortened to approximately 2.7 mm, at which point any minute physical discontinuity in the transmission path will be amplified into significant parasitic effects. Compared to traditional threaded connections, crimping, or simple mechanical lap joints, welded structures offer high structural strength.

[0037] The outer conductor 130 includes a first outer conductor 1310 and a second outer conductor 1320. The outer peripheral surface of the second outer conductor 1320 is provided with a positioning cylindrical surface 1322, which is used to mate with the through hole of the external structural component 300 for positioning. Specifically, in conjunction with Figure 2 and Figure 3 The structure shown depicts a positioning cylindrical surface 1322, a high-precision geometric surface formed by precision turning or grinding on the outer circumference of the second outer conductor 1320. This surface serves as an inherent mechanical reference feature of the adapter unit itself. It should be understood that although this embodiment uses the cooperation between the positioning cylindrical surface 1322 and the external structural component 300 as an example, the positioning cylindrical surface 1322, as part of the second outer conductor 1320, has structural properties independent of the external components. Even when not assembled with the structural component 300, this feature still constitutes a substantial technical element of the adapter product itself. This design directly integrates the positioning function onto the adapter housing, avoiding the cumulative assembly errors caused by adding separate parts such as positioning pins or flanges, thus ensuring the positional accuracy of the adapter in system integration from the source.

[0038] This application also includes a multi-channel test adapter assembly for high-frequency flexible connectors. This embodiment provides a multi-channel test adapter assembly for high-frequency flexible connectors. The multi-channel test adapter assembly includes a structural component 300 and multiple test adapters 10 as described in the foregoing embodiments. These test adapters 10 are arranged in an array and mounted on the structural component 300. Specifically, the structural component 300 serves as the mechanical carrier and assembly reference for the entire test assembly. Its material is typically selected from metals with good rigidity and thermal conductivity, such as aluminum alloy, stainless steel, or copper alloy, to ensure no deformation under repeated pressing operations and to effectively assist in heat dissipation. The structural component 300 has multiple sets of precision-machined mounting through holes. The positional tolerance of these through holes is strictly controlled to ensure that each test adapter 10 can achieve precise radial positioning through the positioning cylindrical surface 1322 mentioned in the foregoing embodiments. It should be understood that... Figure 5 The test adapter 10 is shown in a rectangular array arrangement. However, in other feasible embodiments, depending on the pin distribution characteristics of the flexible connector under test, the array arrangement can also adopt a linear arrangement, a circular arrangement, or an irregular topology layout, as long as it can meet the space requirements for multi-channel parallel docking. In addition, the fixing method between the test adapter 10 and the structural component 300 is not limited to screw locking 400. Various processes such as interference fit, adhesive fixing, or snap-fit ​​connection can also be used to adapt to different maintenance frequencies and assembly automation requirements.

[0039] In one embodiment, each test adapter 10 is fixedly connected to the end face of the structural component 300 by screws 400. It is understood that the screw 400 connection is a detachable fixing solution. Compared to non-detachable interference fits or adhesive fixations, its biggest advantage is the ability to individually disassemble and replace a single adapter. In multi-channel parallel testing scenarios, if an adapter for a certain channel experiences wear or performance drift due to long-term use, it is not necessary to disassemble the entire test assembly; only the corresponding screw 400 needs to be removed to replace the faulty component, significantly reducing maintenance costs and downtime. It also facilitates periodic calibration of individual adapters by the metrology department, ensuring the traceability of test data. Furthermore, by reasonably adjusting the tightening torque of the screws 400, the height of each adapter protruding from the end face of the structural component 300 can be precisely controlled, achieving fine-tuning of the coplanarity of the end faces of all channel pressing contact ends 1311. This further optimizes the uniformity of force during batch pressing contact, providing a more stable mechanical foundation for 110GHz multi-channel parallel testing.

[0040] As a key structural feature, the pressing contact ends 1311 of each test adapter 10 face the same side, and all pressing contact ends 1311 are in the same plane. "In the same plane" here means that the end faces of all test adapters 10 used for mating with the flexible connectors form a continuous, flat reference plane in spatial geometry, with its flatness error typically controlled at the micrometer level. This feature is crucial for multi-channel simultaneous pressing tests. From a mechanical transmission mechanism perspective, when the high-frequency flexible connector array under test (such as a button array or spring pin array) is axially pressed with the component, only when the contact ends of all channels are strictly coplanar can the axial compression on each flexible connector unit be guaranteed to be completely consistent. If there is a height difference between the end faces of each channel, it will lead to some channels being over-pressurized while others are under-pressurized or even not making contact, resulting in significant differences in contact resistance between channels and discretization of impedance matching. At extremely high frequencies like 110 GHz, even minute fluctuations in contact conditions can be amplified into significant changes in signal reflection and transmission loss, rendering test results for key RF parameters such as voltage standing wave ratio (VSWR) and insertion loss incomparable and unreliable. Therefore, coplanar design is not only a reflection of mechanical assembly precision but also the physical foundation for ensuring the consistency and reliability of multi-channel RF test data.

[0041] Through the aforementioned multi-channel integration and coplanar pressing design, the test adapter component of this embodiment enables batch parallel verification of high-density interconnect products, significantly improving test throughput. Compared to the traditional method of testing each channel individually, this component allows for the simultaneous evaluation of the RF performance of dozens or even hundreds of channels in a single pressing operation, greatly shortening the test cycle and reducing unit test costs. Simultaneously, since all channels share the same rigid structural component 300 as the grounding loop reference, the electromagnetic shielding performance between channels is uniformly guaranteed, reducing crosstalk noise introduced by inconsistent grounding potentials. It should be understood that although this embodiment is described as a single-unit assembly of the test adapter 10, in other embodiments, multiple cableless rigid coaxial bodies 100 can be directly integrally molded with the structural component 300, as long as the final product has the characteristics of multi-channel array arrangement and coplanar pressing end faces. This system-level integrated solution is particularly suitable for large-scale production testing scenarios such as 5G / 6G communication modules, millimeter-wave radar chip packaging, and aerospace microwave components, providing efficient and reliable test infrastructure support for the industrial application of ultra-high frequency flexible connectors.

[0042] Furthermore, the center-to-center distance between adjacent test adapters 10 is greater than or equal to 4.8 mm; and / or, the center-to-center distance between adjacent test adapters 10 is between 2.5 mm and 4.8 mm. Specifically, the functional boundary is established based on the physical correspondence between the electromagnetic field distribution characteristics and the sensitivity of RF test indicators in the 110 GHz ultra-high frequency band. In multi-channel parallel testing scenarios, the electromagnetic coupling effect between adjacent channels is the core factor restricting the test accuracy and the range of measurable indicators, and the coupling strength has a non-linear attenuation relationship with the channel spacing. This embodiment provides differentiated solutions for application scenarios with different densities and different test requirements by dividing the above two specific spacing ranges, achieving an optimal balance between space utilization and test integrity.

[0043] When the center-to-center distance between adjacent test adapters 10 is greater than or equal to 4.8 mm, electromagnetic coupling between channels is suppressed to an extremely low level, supporting accurate testing of all RF parameters such as voltage standing wave ratio (VSWR), insertion loss, and isolation. In the 110 GHz band, a 4.8 mm distance is approximately 1.76 times the free space wavelength, sufficient to attenuate near-field induced and radiated coupling between adjacent transmission lines to a negligible level. Isolation, in particular, measures the extent to which a signal leaks from one channel to another and is extremely sensitive to crosstalk. Only when the distance reaches or exceeds this threshold can the measured isolation data accurately reflect the shielding performance of the tested flexible connector itself, rather than the inter-channel crosstalk of the test fixture. Therefore, this configuration is suitable for R&D testing or metrology-grade calibration scenarios requiring comprehensive and rigorous verification of RF performance, providing the most complete and reliable test dataset despite its relatively low spatial density.

[0044] When the center-to-center distance between adjacent test adapters 10 is between 2.5mm and 4.8mm, although there is some electromagnetic coupling between channels, the two core transmission indicators, voltage standing wave ratio (VSWR) and insertion loss, can still be accurately measured. Within this distance range, although near-field coupling of adjacent channel signals may significantly interfere with isolation measurements, rendering them unusable for independent evaluation, the VSWR and insertion loss, which characterize the transmission characteristics of a single channel, primarily depend on the impedance matching state and conductor loss within the channel. The impact of external coupling is relatively limited and can be partially compensated for through calibration. This high-density configuration fully utilizes the limited area of ​​the structural component 300, enabling the integration of more test channels within a unit space, significantly improving the test throughput for large-scale arrayed flexible connector products. For example, in mass production screening tests, if only basic continuity and impedance compliance of the product need to be verified, this distance configuration can increase the number of channels tested in a single test several times without sacrificing the accuracy of key performance indicators, thereby significantly reducing the testing cost and time cycle per unit product.

[0045] It should be understood that the above two spacing ranges are preferred values ​​derived from typical simulation and measurement data of the 110GHz band and air-medium coaxial structure, aiming to establish a clear correspondence between structural dimensions and testing capabilities. In practical engineering applications, if the test frequency changes or different dielectric filling schemes are used, the critical spacing value may be adjusted accordingly. For example, at lower frequency bands, due to the longer wavelength, the spacing required to achieve the same isolation may be larger; while at higher frequency bands or with additional shielding measures, the minimum spacing required to maintain basic performance indicators may be further reduced. Therefore, the specific values ​​listed in this embodiment should be regarded as interpretive examples rather than absolute limitations. As long as the spacing between adjacent channels can meet the requirements of the target test indicators for signal-to-noise ratio and crosstalk tolerance, it falls within the protection scope of this application. This design concept, which tightly binds physical structure and functional effect, not only gives multi-channel test adapters flexible adaptability in different application scenarios, but also provides clear technical guidance and theoretical basis for subsequent customized development for specific test needs.

[0046] This embodiment provides a test adapter 10 for high-frequency flexible connectors, which includes a cableless rigid coaxial body 100. Specifically, the cableless rigid coaxial body 100 refers to an independent component that does not rely on flexible RF cables for signal transmission and possesses sufficient mechanical strength to maintain its coaxial structure. Compared to traditional cable test assemblies, this cableless rigid design fundamentally eliminates the additional transmission loss and phase instability caused by cable bending, aging, or loose connectors in the 110GHz ultra-high frequency band. It also avoids the cumbersome cable re-embedding calibration process, thereby significantly improving the dynamic range and measurement accuracy of the test system. It should be understood that although this embodiment uses a single adapter as an example, in other application scenarios, this cableless rigid coaxial body 100 can also serve as a basic unit in a larger-scale test array.

[0047] Compared with the prior art, the present invention has at least the following advantages: By adopting a cableless rigid coaxial body 100 structural design, test signals are not transmitted through flexible cables, minimizing additional losses introduced during testing. Simultaneously, the local dielectric support 400 supports only the inner conductor 200, and most of the coaxial cavity 500 uses air dielectric. Air dielectric has a lower dielectric constant and dielectric loss compared to traditional solid dielectrics. Furthermore, the use of cableless components and redundant dielectric bodies avoids the high cutoff frequency caused by longer cables. This eliminates the significant transmission loss caused by the skin effect and dielectric filling of flexible cables at 110GHz ultra-high frequencies, avoiding the large RF insertion loss caused by longer cables. It achieves continuous and stable 50-ohm characteristic impedance matching throughout the transmission link, avoiding signal reflection and test result distortion caused by impedance abrupt changes. This makes the test adapter 10 more suitable for signal transmission requirements at 110GHz and above. The size design of the coaxial cavity 500 meets the 50-ohm characteristic impedance matching requirement, maintaining stable impedance consistency across the entire frequency band and effectively solving the problems of poor impedance matching and test result distortion in traditional testing methods. The press-fit contact end sets the end face of the inner conductor 200 and the end face of the outer conductor 300 to be flush, which can adapt to the axial press-fit test requirements of high-frequency elastic connectors. This ensures that the inner conductor 200 and the outer conductor 300 can achieve stable contact at the same time when the elastic connector is pressed, avoiding the problems of mismatch and poor contact reliability of traditional plug-in structure interfaces, thereby improving the accuracy and repeatability of test results.

[0048] The embodiments described above are merely illustrative of several implementations of the present invention, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these all fall within the protection scope of the present invention. Therefore, the protection scope of this invention patent should be determined by the appended claims.

Claims

1. A test adapter for high-frequency flexible connectors, characterized in that, The test adapter includes a cableless rigid coaxial body and structural components, with the cableless rigid coaxial body mounted on the structural components. The cableless rigid coaxial body includes an inner conductor, an outer conductor, and a local dielectric support component, with the inner conductor and the local dielectric support component disposed inside the outer conductor; A coaxial cavity is formed between the inner conductor and the outer conductor, and the local dielectric support is connected to the inner conductor to maintain a stable 50-ohm impedance matching across the entire 110 GHz frequency band. The first end of the outer conductor is provided with a pressing contact end, which is used to connect with the high-frequency elastic connector; The outer conductor has a standard connection terminal at its second end, which is used to connect and test with a testing instrument. The standard connection terminal is flush with one end of the inner conductor. The high-frequency flexible connector is connected to the testing instrument via the inner conductor for connection testing.

2. The test adapter according to claim 1, characterized in that, The outer conductor includes a first outer conductor and a second outer conductor that are interconnected. The local dielectric support is an annular dielectric body, which is sleeved on the middle of the inner conductor and disposed between the first outer conductor and the second outer conductor; The local dielectric support is supported on the inner peripheral wall of the second outer conductor to limit the axial displacement of the annular dielectric body.

3. The test adapter according to claim 2, characterized in that, The inner peripheral wall of the second outer conductor is provided with a supporting portion, and the end of the inner conductor is supported and fixed to the supporting portion.

4. The test adapter according to claim 3, characterized in that, The inner conductor is provided with the mounting part at one end near the first outer conductor, and the mounting part has an installation limiting port, and the local medium support is engaged in the installation limiting port.

5. The test adapter according to claim 4, characterized in that, The inner conductor has a solid planar structure at one end of the press-fit contact end, and a planar pad structure at the other end of the inner conductor. And / or, the local medium support is provided with a snap-fit ​​part, the snap-fit ​​part snaps into the installation limiting port, and there are multiple snap-fit ​​parts, the snap-fit ​​parts are arranged around the periphery of the local medium support.

6. The test adapter according to claim 2, characterized in that, The standard connection end is located at the end of the second outer conductor away from the first outer conductor, and the pressing contact end is located at the end of the first outer conductor away from the second outer conductor.

7. The test adapter according to claim 1, characterized in that, The local dielectric support has a through hole, which is connected to the inner conductor and the outer conductor. The through hole is used for test cables to pass through and connect to the outer conductor.

8. The test adapter according to claim 2, characterized in that, The outer circumferential surface of the second outer conductor is provided with a positioning cylindrical surface, which is used to cooperate with the through hole of the external structural component for positioning.

9. A multi-channel test adapter assembly for high-frequency flexible connectors, characterized in that, include: A plurality of test adapters as described in any one of claims 1 to 8, wherein the plurality of said test adapters are arranged in an array; The pressing contact ends of each of the test adapters face the same side, and each of the pressing contact ends is in the same plane; Each of the test adapters is fixedly connected to the end face of the structural component by screws.

10. The multi-channel test adapter assembly according to claim 9, characterized in that, The center-to-center distance between adjacent test adapters is greater than or equal to 4.8 mm; and / or, The center-to-center distance between adjacent test adapters is between 2.5 mm and 4.8 mm.

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