Method, apparatus, device and computer storage medium for analyzing a reactor

Abstract

The application discloses a reactor analysis method, device, equipment and computer storage medium. The method comprises the following steps: determining the position of each reactor component in the reactor according to a preset installation strategy; determining the defect distribution of the reactor according to the position of each reactor component in the reactor and the defect parameters of each reactor component; determining the quality distribution of the reactor according to the quality evaluation index determined according to the position of each reactor component in the reactor and the defect parameters of each reactor component; and generating analysis data of the reactor based on the defect distribution and the quality distribution. According to the embodiment of the application, analysis data can be provided for a reactor to be constructed.

Description

Technical Field

[0001] This application belongs to the field of nuclear energy technology, and in particular relates to a method, apparatus, equipment and computer storage medium for analyzing a reactor. Background Technology

[0002] With global climate change and the ever-increasing energy demands of various countries, nuclear energy has become a highly regarded energy option. Nuclear power generation does not produce greenhouse gases and can provide a stable and reliable source of electricity, meeting the substantial energy needs.

[0003] Graphite and carbon components can be used as building blocks of nuclear reactors. Defect detection of graphite and carbon components can be performed using reactor component inspection techniques, such as computed tomography (CT) imaging, to screen out compliant graphite and carbon components for nuclear reactor construction.

[0004] However, even compliant graphite and carbon components may contain defects that could affect the structural safety of the entire nuclear reactor when assembled with these components. Therefore, predicting the structural data of the nuclear reactor to be built is crucial for analyzing its safety performance. Summary of the Invention

[0005] This application provides a reactor analysis method, apparatus, device, and computer storage medium, which can provide analytical data for a reactor to be constructed.

[0006] In a first aspect, embodiments of this application provide a reactor analysis method, comprising: determining the position of each reactor component in the reactor according to a preset installation strategy; determining the defect distribution of the reactor based on the position of each reactor component in the reactor and the defect parameters of each reactor component; determining the quality distribution of the reactor based on the quality assessment index determined by the position of each reactor component in the reactor and the defect parameters of each reactor component; and generating reactor analysis data based on the defect distribution and the quality distribution.

[0007] In one embodiment, a reactor component includes a reference point, and the defect parameters of the reactor component include the relative positional relationship between the defect and the reference point. The reactor component includes one or more defects. Determining the defect distribution corresponding to the reactor based on the position of each reactor component within the reactor and the defect parameters of each reactor component includes: determining a first position of the reference point relative to the reactor based on the position of the reactor component within the reactor; determining a second position of each defect relative to the reactor based on the first position of the reference point relative to the reactor and the relative positional relationship between the defect and the reference point; and determining the defect distribution corresponding to the reactor based on the second position of each defect relative to the reactor.

[0008] In one embodiment, determining the second position of each defect relative to the reactor based on the first position of the reference point relative to the reactor and the relative positional relationship between the defect and the reference point includes: obtaining the reference point detection coordinates in the coordinate system corresponding to the detection image and the relative positional relationship between the defect and the reference point based on the detection image, wherein the component standard image is an image determined based on a standard reactor component in a standard placement posture; determining the reference point standard coordinates in the coordinate system corresponding to the component standard image based on the component standard image, wherein the component standard image is an image obtained by the component in a standard placement posture; determining the defect standard coordinates in the coordinate system corresponding to the component standard image based on the reference point standard coordinates, the reference point detection coordinates, and the relative positional relationship; determining the coordinate transformation matrix based on the reference point standard coordinates and the first position of the reference point relative to the reactor; and determining the second position of each defect relative to the reactor based on the defect standard coordinates and the coordinate transformation matrix.

[0009] In one embodiment, the method further includes: obtaining reference point detection coordinates corresponding to reference points and defect detection coordinates corresponding to defects in reactor components based on standard component images; and determining the relative positional relationship between defects and reference points based on reference point detection coordinates and defect detection coordinates.

[0010] In one embodiment, the quality assessment index includes a first index type and a second index type; the quality distribution of the reactor is determined based on the quality assessment index determined by the position of each reactor component in the reactor and the defect parameters of each reactor component, including: determining the first position information corresponding to the component that meets the first index type and the second position information corresponding to the component that meets the second index type based on the position of each reactor component in the reactor; and determining the quality distribution of the reactor based on the first position information and the second position information.

[0011] In one embodiment, the method further includes: determining a first number of defects in a first region and a second number of defects in a second region for a reactor component, wherein the first region is a region where the distance between the reactor component and its outer contour is less than a first distance, and the second region includes a region where the distance between the reactor component and its outer contour is greater than the first distance but less than the second distance, wherein the first distance is less than the second distance; if the first number of defects satisfies a first quantity condition, determining that the reactor component satisfies a first index type; if the first number of defects does not satisfy the first quantity condition, and the second number of defects satisfies the second quantity condition, determining that the reactor component satisfies a second index type.

[0012] In one embodiment, the defect parameters of the reactor components include the defect size and the X-ray absorption coefficient. Based on the defect distribution and mass distribution, analytical data of the reactor is generated, including: generating first data characterizing the uniformity of defect distribution and second data characterizing the symmetry of defect distribution based on the defect distribution, defect size, and X-ray absorption coefficient; and generating third data characterizing the uniformity of component distribution of different mass grades and fourth data characterizing the symmetry of component distribution of different mass grades based on the mass distribution.

[0013] Secondly, embodiments of this application provide a reactor analysis apparatus, the apparatus comprising:

[0014] The first determining device is used to determine the position of each reactor component in the reactor according to a preset installation strategy;

[0015] The second determining device is used to determine the defect distribution of the reactor based on the location of each reactor component in the reactor and the defect parameters of each reactor component.

[0016] The third determining device is used to determine the mass distribution of the reactor based on the location of each reactor component in the reactor and the quality assessment index determined by the defect parameters of each reactor component.

[0017] The generation device is used to generate analytical data for the reactor based on the defect distribution and mass distribution.

[0018] Thirdly, embodiments of this application provide a reactor analysis device, the device including: a processor and a memory storing computer program instructions; the processor executes the computer program instructions to implement the reactor analysis method of the first aspect or any embodiment of the first aspect.

[0019] Fourthly, a computer-readable storage medium storing computer program instructions that, when executed by a processor, implement the reactor analysis method of the first aspect or any embodiment of the first aspect.

[0020] Fifthly, embodiments of this application provide a computer program product in which instructions, when executed by a processor of an electronic device, cause the electronic device to perform a reactor analysis method as described in the first aspect or any embodiment of the first aspect.

[0021] The reactor analysis method, apparatus, equipment, and computer storage medium of this application predict the location of each reactor component on the reactor and determine the distribution of defects in the reactor based on the location of the reactor components and their defect parameters. Furthermore, by determining the location of reactor components and quality assessment indicators, the distribution of components of different quality levels in the reactor is determined. Then, based on the distribution of defects and the distribution of components of different quality levels in the reactor, reactor analysis data is generated. The obtained analysis data can be used to analyze the reactor to be built, thereby providing valuable data support for reactor design, optimization, and safety assessment. Attached Figure Description

[0022] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments of this application will be briefly introduced below. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 A schematic flowchart of a reactor analysis method provided in one embodiment of this application is shown;

[0024] Figure 2 A schematic diagram of a reactor architecture provided in one embodiment of this application is shown;

[0025] Figure 3 A schematic diagram of a reactor architecture provided in one embodiment of this application is shown;

[0026] Figure 4 A flowchart illustrating the process of determining the defect distribution of a reactor according to an embodiment of this application is shown.

[0027] Figure 5 A schematic flowchart illustrating the process for determining a second location of each defect relative to the reactor, according to one embodiment of this application, is shown.

[0028] Figure 6A flowchart illustrating the process of determining the mass distribution corresponding to a reactor, according to an embodiment of this application, is shown.

[0029] Figure 7 A schematic flowchart of a reactor analysis method provided in one embodiment of this application is shown;

[0030] Figure 8 A schematic diagram of the process for generating analysis data for a reactor is shown in one embodiment of this application;

[0031] Figure 9 This is a schematic diagram of the structure of an analysis device for a reactor provided in another embodiment of this application;

[0032] Figure 10 This is a schematic diagram of the structure of an analysis device for a reactor provided in another embodiment of this application. Detailed Implementation

[0033] The features and exemplary embodiments of various aspects of this application will be described in detail below. To make the objectives, technical solutions, and advantages of this application clearer, the application will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only intended to explain this application and not to limit it. For those skilled in the art, this application can be implemented without some of these specific details. The following description of the embodiments is merely to provide a better understanding of this application by illustrating examples.

[0034] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising..." does not exclude the presence of additional identical elements in the process, method, article, or apparatus that includes said element.

[0035] With global climate change and the increasing demand for energy from various countries, nuclear energy is gradually becoming a key force in the energy transition. Among them, graphite and carbon components can serve as important functional and structural materials for nuclear reactors. Due to their structure and properties, graphite and carbon components can withstand mechanical loads, thermal stress, irradiation stress, and chemical corrosion for decades under high temperature and high radiation conditions, exhibiting good stability.

[0036] During the production of graphite and carbon components, especially in the calcination, molding, and graphitization processes, the characteristics of the raw materials themselves can lead to defects in the produced nuclear graphite, such as pores, cracks, and inclusions. These defects may extend to a critical point during the service life of the graphite and carbon components, causing them to crack and detach, thereby affecting reactor safety.

[0037] Therefore, to ensure the safety of nuclear reactors, before graphite and carbon components are installed in the reactor, surface inspection methods can be used to detect whether there are non-compliant defects on the surface of graphite and carbon components, and reactor component inspection systems, such as computed tomography (CT) imaging technology, can be used to screen for defects inside graphite and carbon components.

[0038] Even after screening graphite and carbon components, some compliant defects may still exist in each component. These defects, when assembled into a nuclear reactor using these components, could potentially impact the overall structural safety of the reactor. Therefore, predicting the location of defects in the nuclear reactor to be built is crucial for its structural safety.

[0039] To address the problems of the prior art, embodiments of this application provide a method, apparatus, device, and computer storage medium for analyzing reactors. The reactor analysis method provided in this application embodiment will be described first below.

[0040] Figure 1 A schematic flowchart of a reactor analysis method according to an embodiment of this application is shown. Figure 1 As shown, the analysis method for the reactor includes the following steps S110-S140:

[0041] S110. Determine the location of each reactor component in the reactor according to the preset installation strategy.

[0042] For example, a preset installation strategy can be used to characterize the reactor's construction method. This involves assigning a corresponding number to each location of the reactor and establishing a numbering sequence based on the reactor structure, so that the reactor components can be constructed in the order of the numbering sequence. In one example, Figure 2 as well as Figure 3 Schematic diagrams of a reactor architecture provided in one embodiment of this application are shown. Figure 2 As shown, the reactor's overall structure is cylindrical. Therefore, as Figure 3 As shown, the preset installation strategy can be to build the structure in sections from bottom to top along the axial direction of the cylinder.

[0043] The preset installation strategy can be pre-set by relevant technical personnel based on the reactor structure and reactor component specifications.

[0044] For example, after determining a preset installation strategy, the location of each reactor component in the reactor is predicted according to the preset installation strategy.

[0045] Understandably, due to the structure of the reactor, each location within the reactor has a corresponding orientation. Furthermore, due to the structure of the reactor components, each component also has a corresponding orientation when placed on top of the reactor.

[0046] S120. Determine the defect distribution of the reactor based on the location of each reactor component in the reactor and the defect parameters of each reactor component.

[0047] The reactor components may include one or more compliance defects.

[0048] It is understandable that defect detection technology can be used to detect defects in each reactor component, thereby determining the defect parameters corresponding to each defect in each reactor component, and selecting compliant reactor components based on the defect parameters to build the reactor.

[0049] Furthermore, after determining the location of reactor components within the reactor, the location of defects in each reactor component can be determined, thereby determining the overall defect distribution of the reactor.

[0050] S130. Determine the mass distribution of the reactor based on the location of each reactor component in the reactor and the quality assessment index determined by the defect parameters of each reactor component.

[0051] For example, quality assessment metrics can be determined based on defect parameters of reactor components. These metrics can be used to evaluate the quality level of reactor components.

[0052] For example, the quality level of each reactor component is determined according to the quality assessment index, and the distribution of different quality levels in the reactor is determined according to the quality level of each reactor and the location of the reactor component in the reactor.

[0053] S140. Based on the defect distribution and mass distribution, generate analysis data for the reactor.

[0054] For example, reactor analysis data can be generated based on the distribution of various defects and components of different quality grades within the reactor. This analysis data can then be used to predict various reactor performance characteristics.

[0055] For example, following a preset installation strategy, the location of each reactor component within the reactor is determined. Based on the location of each reactor component and its defect parameters, the defect distribution of the reactor is determined. Furthermore, based on quality assessment indicators determined by the location of each reactor component and its defect parameters, the mass distribution of the reactor is determined. Then, based on the defect distribution and mass distribution, analytical data for the reactor is generated.

[0056] In this embodiment, the location of each reactor component on the reactor is predicted, and the distribution of defects within the reactor is determined based on the location of the reactor components and their defect parameters. Furthermore, by determining the locations of the reactor components and quality assessment indicators, the distribution of components of different quality levels within the reactor is determined. Then, based on the distribution of defects and the distribution of components of different quality levels within the reactor, reactor analysis data is generated. This acquired analysis data can be used to analyze the reactor to be built, thereby providing valuable data support for reactor design, optimization, and safety assessment.

[0057] For example, the defect parameters of a reactor component may include the relative position of each defect to a reference point. The reactor component may include reference points. A reference point in the reactor component may be any point on the outer contour of the reactor, and there may be one or more reference points.

[0058] Understandably, in order to predict the location of defects in reactor components during the reactor assembly process, reference points can be set in the reactor components and used to characterize the location of defects. By determining the location of reference points in the reactor components, the location of defects in the reactor can be accurately located, thereby determining the defect distribution in the reactor.

[0059] In order to determine the defect distribution of the reactor, as another implementation of this application, another implementation of the reactor analysis method is also provided, as detailed in the following embodiments.

[0060] Figure 4 This illustration shows a flowchart of a process for determining the defect distribution of a reactor according to an embodiment of this application. Figure 4 As shown, the analysis method for the reactor includes the following steps S121-S123:

[0061] S121. Determine the first position of the reference point relative to the reactor based on the position of the reactor components in the reactor.

[0062] S122. Determine the second position of each defect relative to the reactor based on the first position of the reference point relative to the reactor and the relative positional relationship between the defect and the reference point.

[0063] S123. Determine the defect distribution of the reactor based on the second position of each defect relative to the reactor.

[0064] In some embodiments, in S121, the position of the reactor component in the reactor can be determined according to a preset installation strategy, and then the first position of the reference point in the reactor component in the reactor can be determined according to the position of the reactor component.

[0065] The location of reactor components within the reactor can include their specific installation position and their installation orientation.

[0066] In some embodiments, in S122, the second position of each defect relative to the reactor can be determined based on the first position of the reference point relative to the reactor and the relative positional relationship between the defect and the reference point.

[0067] For example, after determining the first position of the reference point in the reactor component, the position of the defect in the component at the current installation position and in the installation attitude can be determined by the relative positional relationship between the defect and the reference point, and then the second position of the defect in the reactor can be determined.

[0068] In some alternative embodiments, Figure 5 A schematic flowchart illustrating the process of determining a second location of each defect relative to the reactor, according to one embodiment of this application, is shown. Figure 5 As shown, the analysis method for the reactor includes the following steps S1221-S1225:

[0069] S1221. Based on the component inspection image, obtain the reference point detection coordinates in the coordinate system corresponding to the component inspection image, as well as the relative positional relationship between the defect and the reference point.

[0070] Among them, the component inspection image is an image obtained by detecting defects in reactor components based on a defect detection system.

[0071] In some optional embodiments, the reference point detection coordinates corresponding to the reference point in the reactor component and the defect detection coordinates corresponding to the defect can be obtained from the component detection image, and the relative positional relationship between the defect and the reference point can be determined based on the reference point detection coordinates and the defect detection coordinates.

[0072] For example, when performing defect detection on reactor components using defect detection technology, a component detection image corresponding to the reactor component can be obtained. For instance, a CT three-dimensional reconstruction image of the reactor component can be obtained using CT imaging technology. The component detection image can include the detection coordinates corresponding to each pixel in the reactor outline and the defect detection coordinates corresponding to each defect.

[0073] Furthermore, any point in the reactor profile can be used as a reference point to determine the reference point detection coordinates corresponding to that reference point, and the relative positional relationship between the defect and the reference point can be constructed based on the reference point detection coordinates and the defect detection coordinates.

[0074] In this embodiment of the application, by determining the coordinates of the reference point and the defect in the component inspection image, the relative positional relationship between the reference point and the defect can be determined. This can accurately determine the location of the defect in the reactor component and provide reliable data support for predicting the distribution of defects in the reactor.

[0075] S1222. Based on the component standard image, determine the reference point standard coordinates in the coordinate system corresponding to the component standard image. The component standard image is an image determined based on a standard reactor component in a standard placement posture.

[0076] For example, a standard reactor component can be a reactor component that has a contour consistent with the component in the component inspection image and is free of internal defects. Furthermore, in the component standard image, the standard reactor component is in a standard orientation. This standard orientation can be defined as an end face of the reactor component that is parallel or orthogonal to the coordinate system corresponding to the component standard image.

[0077] For example, a standard component image can be an image representing a reactor component in a standard orientation. The reactor component can include various specifications and models, and the standard component images differ for different specifications and models. It is understood that the reactor component in the standard component image can be a defect-free and error-free reactor component. Furthermore, the standard orientation of the reactor component can be determined based on its installation location and orientation within the reactor.

[0078] In one example, the standard image of a component can be a design drawing of the component.

[0079] For example, the coordinate system corresponding to the standard image of the component can be used to describe the position of each point on the component. The standard coordinates of the reference point can be used to characterize the position of the reference point in the reactor component under the characterized placement orientation of the reactor component.

[0080] S1223. Based on the standard coordinates of the reference point, the detection coordinates of the reference point, and the relative positional relationship, determine the standard coordinates of the defect in the coordinate system corresponding to the standard image of the component.

[0081] For example, the defect standard coordinates can be the position of the defect in the standard reactor orientation.

[0082] The relative positional relationship of reference points in different coordinate systems can be determined based on the standard coordinates and detection coordinates of the reference points. Furthermore, the standard coordinates of the defect in the standard image of the component can be determined based on the relative position between the reference points and the defects.

[0083] For example, a target coordinate transformation matrix is ​​constructed based on the standard coordinates and detected coordinates of the reference point, thereby transforming the component's orientation from the detected image to the standard orientation corresponding to the standard image. Then, based on the relative position between the reference point and the defect, the location of the defect in the standard orientation of the component is determined.

[0084] In one example, the component in the component detection image can be transformed to a standard placement posture using a target coordinate transformation matrix, thereby determining the image of the component in the detection image under the standard placement posture, and then determining the location of the defect in the component based on the position of the component in the transformed image.

[0085] S1224. Determine the coordinate transformation matrix based on the standard coordinates of the reference point and the first position of the reference point relative to the reactor.

[0086] For example, the standard coordinates of the reference point and the first position of the reference point relative to the reactor can determine the corresponding coordinate transformation matrix when changing from the standard placement posture to the installation posture in the reactor. The coordinate transformation matrix may include rotation and translation information to transform the reference point in the coordinate system corresponding to the standard image of the component to the coordinate system corresponding to the reactor.

[0087] S1225. Based on the defect standard coordinates and the coordinate transformation matrix, determine the second position of each defect relative to the reactor.

[0088] For example, the defect in the coordinate system corresponding to the standard image of the component can be transformed to the coordinate system corresponding to the reactor based on the standard coordinates of the defect and the coordinate transformation matrix, thereby determining the second position of the defect in the reactor.

[0089] For example, the reference point detection coordinates and the relative positional relationship between the defect and the reference point are obtained in the component inspection image, and the reference point standard coordinates are determined in the component standard image. Therefore, based on the reference point standard coordinates, the reference point detection coordinates, and the relative positional relationship, the defect standard coordinates in the coordinate system corresponding to the component standard image are determined. Then, using the reference point standard coordinates and the first position of the reference point relative to the reactor, a coordinate transformation matrix is ​​determined, and based on the coordinate transformation matrix, the second position of each defect relative to the reactor is determined. It is understood that since it is difficult to strictly define the placement posture during component inspection, the inspected component can be matched with a component in a standard placement posture using reference points. Specifically, the reference points are used to perform a first coordinate transformation on the inspected component, converting it to a standard placement posture and determining the position of the defect. Further, by determining the position of each component in the reactor, the coordinate transformation matrix corresponding to the component's installation posture in the reactor from the standard placement posture is determined, thereby determining the position of the defect in the reactor.

[0090] In this embodiment, by introducing a reference point and calculating the coordinate transformation matrix, the detected defect location can be accurately mapped from the detection coordinate system to the standard coordinate system, and then further mapped to the reactor coordinate system. Thus, even if there are deviations in the component's orientation during detection, the detected defect location can still be accurately mapped to the reactor coordinate system through the coordinate transformation matrix, thereby achieving precise description and analysis of the defect location.

[0091] In some embodiments, in S123, the defect distribution corresponding to the reactor can be determined based on the second position of each defect relative to the reactor.

[0092] For example, after determining the second location of each defect in the reactor, the defect distribution in the reactor can be determined based on the second location.

[0093] In this embodiment, the second position of each defect relative to the reactor is determined by the first position of the reference point relative to the reactor and the relative positional relationship between the defect and the reference point. Based on the second position of each defect relative to the reactor, the defect distribution of the reactor is determined. This achieves accurate prediction of the reactor defect distribution and provides reliable data support for subsequent reactor safety assessment.

[0094] For example, quality assessment indicators can be categorized into a first indicator type and a second indicator type based on parameters such as the contrast, size, and location of defects in a component. It is understood that defects in a component can be classified according to different indicator types, thereby classifying the component into different quality levels.

[0095] In order to determine the mass distribution of the reactor, as another implementation of this application, this application also provides another implementation of the reactor analysis method, as detailed in the following embodiments.

[0096] Figure 6 This illustration shows a flowchart of a process for determining the mass distribution of a reactor according to an embodiment of this application. Figure 6 As shown, the analysis method for the reactor includes the following steps S131-S132:

[0097] S131. Based on the position of each reactor component in the reactor, determine the first position information corresponding to the component that satisfies the first index type, and the second position information corresponding to the component that satisfies the second index type.

[0098] For example, the type of index each component meets can be determined based on the defect parameters of each component in the reactor, thereby classifying the components into multiple quality levels. Furthermore, the location information of components meeting different index types can be determined based on the location of each reactor component within the reactor.

[0099] In one example, if a component meets the first index type, it can be classified as a first quality level; if a component meets the second index type, it can be classified as a second quality level.

[0100] S132. Determine the mass distribution of the reactor based on the first position information and the second position information.

[0101] For example, the distribution of component mass in the reactor can be determined based on the first position information of the component corresponding to the first quality level and the second position information of the component of the second quality level.

[0102] In this embodiment, components can be classified into different quality levels based on different index types, and the distribution of components of different quality levels in the reactor can be determined, thereby reducing data storage requirements and achieving data compression. It is understood that in this embodiment, by classifying the quality of components, the mass distribution of components in the reactor is analyzed on a component-by-component basis, thereby achieving compression of massive data volumes.

[0103] For example, contrast can be used as one of the important indicators for evaluating whether reactor components are compliant.

[0104] In one example, the defect contrast P can be expressed by the following formula (1):

[0105]

[0106] Among them, G BG represents the CT value of the defective area. D G represents the average CT value of the matrix. A This is the CT value for air.

[0107] Furthermore, when the defect contrast meets the requirements in Table (1) below, it can be classified into different types of defects.

[0108] Table (1)

[0109] Contrast difference percentage P Defect types P1 < P ≤ P2 Low contrast defect P > P2 High contrast defects

[0110] If the contrast, size and location of a defect in a component meet the requirements of Table (2) below, then the defect is a compliant defect.

[0111] Table (2)

[0112]

[0113] Furthermore, after confirming that the defects are compliant, the quality assessment indicators of the components can be determined based on the contrast requirements, the size of the defects, and the location of the defects.

[0114] In order to determine the quality assessment index of the components, as another implementation of this application, this application also provides another implementation of the reactor analysis method, as detailed in the following embodiments.

[0115] Figure 7 A schematic flowchart of a reactor analysis method according to an embodiment of this application is shown. Figure 7 As shown, the analysis method for the reactor includes the following steps S710-S730:

[0116] S710. Determine the number of first defects in the reactor components in the first region and the number of second defects in the second region, respectively.

[0117] The first region is the region whose distance from the outer contour of the reactor component is less than a first distance, and the second region includes the region whose distance from the outer contour of the reactor component is greater than the first distance but less than the second distance, wherein the first distance is less than the second distance.

[0118] For example, the first region can be a near-surface region within the component. The first distance between the near-surface region and the outer contour of the component can be determined based on the contrast requirements corresponding to the component. For instance, if the reactor frame is a graphite component, the first distance value can be set to D1 (as shown in Table 2); if the reactor frame is a carbon component, the first distance value can be set to D2 (as shown in Table 2).

[0119] The second region can be the far surface region of the component. Furthermore, the second distance between the far surface region and the outer contour of the component can be determined according to the corresponding contrast requirements of the component. For example, if the reactor frame is a graphite component, the second distance value can be set by technicians based on experience; if the reactor frame is a carbon component, the second distance value can be set as the difference between D3 and D2. The value of D3 is greater than the value of D2.

[0120] For example, the number of defects in the first region of each component can be determined as a first number, and the number of defects in the second region can be determined as a second number.

[0121] S720. If the number of first defects is determined to meet the first quantity condition, the reactor components are determined to meet the first index type.

[0122] For example, if it is determined that the number of first defects in a component in a first region meets a first quantity condition, it can be determined that the component meets a first index type, that is, the component belongs to a first quality level.

[0123] In one example, the first quantity condition can be a first defect quantity threshold. If the first defect quantity is less than the first defect quantity threshold, the component can be determined to meet the first indicator type; conversely, if the first defect quantity is greater than or equal to the first defect quantity threshold, the component can be determined not to meet the first indicator type.

[0124] In another example, the first quantity condition can also be that the number of defects is less than the first defect quantity threshold within a preset distance.

[0125] It is understood that the first quantity condition is set by technicians according to the quality requirements of different components. This embodiment of the application is only illustrative and not restrictive.

[0126] S730. If it is determined that the number of first defects does not meet the first quantity condition, and the number of second defects meets the second quantity condition, then the reactor component is determined to meet the second index type.

[0127] For example, if it is determined that the number of first defects in a component in a first region does not meet the first quantity condition, it can be determined whether the number of defects in a second region meets the second quantity condition. If it is determined that the number of first defects does not meet the first quantity condition, and the number of second defects meets the second quantity condition, it can be determined that the component meets the second index type, that is, the component belongs to the second quality level.

[0128] In one example, the second quantity condition can be a second defect quantity threshold. If the second defect quantity is less than the second defect quantity threshold, the component can be determined to meet the second indicator type; conversely, if the second defect quantity is greater than or equal to the second defect quantity threshold, the component can be determined not to meet the second indicator type.

[0129] In another example, the second quantity condition can also be that the number of defects is less than the second defect quantity threshold within a preset distance.

[0130] Similarly, the second quantity condition is set by technicians according to the quality requirements of different components. This embodiment is only illustrative and not restrictive.

[0131] In another example, quality assessment indicators can be used to measure whether defects in a component are located in critical locations such as openings or slots. If it is determined that there are no defects in critical locations such as openings or slots, the component can be classified as a first-level quality component, i.e., a high-quality component. Conversely, if it is determined that there are defects in critical locations such as openings or slots, the component can be classified as a second-level quality component, i.e., a low-quality component. The presence of defects in critical locations such as openings or slots can be determined by calculating the distance from the defect to the component surface.

[0132] In this embodiment of the application, by determining the number of defects in the near and far ranges of the component, the number of defects in the critical locations of the component can be accurately determined, thereby enabling accurate evaluation of the component's performance and quality, avoiding misjudgments of quality due to different defect locations, and improving the accuracy of component quality evaluation.

[0133] In order to generate reactor analysis data, as another implementation of this application, this application also provides another implementation of the reactor analysis method, as detailed in the following embodiments.

[0134] Figure 8 A schematic diagram illustrating the process of generating analytical data for a reactor, according to one embodiment of this application, is shown. Figure 8 As shown, the analysis method for the reactor includes the following steps S141-S142:

[0135] S141. Based on the defect distribution, defect size, and X-ray absorption coefficient, generate first data characterizing the uniformity of the defect distribution and second data characterizing the symmetry of the defect distribution.

[0136] For example, the symmetry of the defect distribution in the reactor and the uniformity of the defect distribution in the reactor can be determined separately, depending on the distribution of defects in the reactor.

[0137] In one example, the symmetry s of the defect distribution can be calculated using the following formula (2):

[0138]

[0139] The location of the defect can be represented as (x, y, z); i can represent the i-th defect; v i The size of the i-th defect can be represented by n; the number of defects can be represented by n; p i The CT value, i.e., the X-ray absorption coefficient, can characterize the i-th defect.

[0140] In another example, the uniformity e of the defects can be calculated using the following formula (3):

[0141]

[0142] Where, d ij It can represent the distance between the i-th defect and the j-th defect; v j This can characterize the size of the j-th defect, i.e., the defect size. Where d ij It can be expressed by the following formula (4):

[0143]

[0144] S142. Based on the mass distribution, generate third data representing the uniformity of component distribution at different mass levels and fourth data representing the symmetry of component distribution at different mass levels.

[0145] For example, the uniformity and symmetry of the distribution of components of different quality grades in the reactor can be determined separately for each quality grade component.

[0146] In one example, the symmetry S of the defect distribution can be calculated using the following formula (5):

[0147]

[0148] The position of a component can be characterized by the position of its center of gravity, which can be represented as (X,Y,Z); n can represent the number of components of different quality levels; and i can represent the i-th component.

[0149] In another example, the uniformity E of the defects can be calculated using the following formula (6):

[0150]

[0151] Here, j can represent the j-th component.

[0152] In this embodiment of the application, by determining the uniformity of the distribution of defects in the reactor and the formation, and by determining the uniformity and symmetry of the distribution of components of different quality grades in the reactor, the overall impact of defects on the reactor and the impact of components of different quality grades on the reactor can be evaluated. This allows for the rapid and accurate identification of problems affecting reactor quality, providing reference data for in-service inspection and life extension assessment of the reactor.

[0153] Based on the reactor analysis method provided in the above embodiments, this application also provides specific implementations of a reactor analysis apparatus. Please refer to the following embodiments.

[0154] First see Figure 9 The reactor analysis apparatus provided in this application includes the following modules:

[0155] The first determining device 901 is used to determine the position of each reactor component in the reactor according to a preset installation strategy;

[0156] The second determining device 902 is used to determine the defect distribution of the reactor based on the position of each reactor component in the reactor and the defect parameters of each reactor component.

[0157] The third determining device 903 is used to determine the mass distribution of the reactor based on the position of each reactor component in the reactor and the quality assessment index determined by the defect parameters of each reactor component.

[0158] The generating device 904 is used to generate analytical data of the reactor based on the defect distribution and the mass distribution.

[0159] As one implementation of this application, a reactor component includes a reference point, and the defect parameters of the reactor component include the relative positional relationship between the defect and the reference point. The reactor component includes one or more defects. The second determining device 902 determines the defect distribution corresponding to the reactor in the following manner based on the position of each reactor component in the reactor and the defect parameters of each reactor component: determining a first position of the reference point relative to the reactor based on the position of the reactor component in the reactor; determining a second position of each defect relative to the reactor based on the first position of the reference point relative to the reactor and the relative positional relationship between the defect and the reference point; and determining the defect distribution corresponding to the reactor based on the second position of each defect relative to the reactor.

[0160] As one implementation of this application, the second determining device 902 determines the second position of each defect relative to the reactor in the following manner based on the first position of the reference point relative to the reactor and the relative positional relationship between the defect and the reference point: Based on the detection image, the reference point detection coordinates in the coordinate system corresponding to the detection image and the relative positional relationship between the defect and the reference point are obtained. The detection image is obtained by performing defect detection on reactor components based on a defect detection system. Based on the component standard image, the reference point standard coordinates in the coordinate system corresponding to the component standard image are determined. The component standard image is an image determined based on a standard reactor component in a standard placement posture. Based on the reference point standard coordinates, the reference point detection coordinates, and the relative positional relationship, the defect standard coordinates in the coordinate system corresponding to the component standard image are determined. Based on the reference point standard coordinates and the first position of the reference point relative to the reactor, a coordinate transformation matrix is ​​determined. Based on the defect standard coordinates and the coordinate transformation matrix, the second position of each defect relative to the reactor is determined.

[0161] As one implementation of this application, the device further includes a fourth determining module, used to obtain the reference point detection coordinates corresponding to the reference point in the reactor component and the defect detection coordinates corresponding to the defect based on the component standard image; and to determine the relative positional relationship between the defect and the reference point based on the reference point detection coordinates and the defect detection coordinates.

[0162] As one implementation of this application, the quality assessment index includes a first index type and a second index type; the third determining device 903 determines the mass distribution of the reactor based on the quality assessment index determined by the position of each reactor component in the reactor and the defect parameters of each reactor component in the reactor as follows: based on the position of each reactor component in the reactor, the first position information corresponding to the component that satisfies the first index type and the second position information corresponding to the component that satisfies the second index type are determined respectively; based on the first position information and the second position information, the mass distribution of the reactor is determined.

[0163] As one implementation of this application, the apparatus further includes a fifth determining unit, configured to determine the number of first defects in a first region and the number of second defects in a second region of the reactor component, wherein the first region is a region where the distance between the reactor component and its outer contour is less than a first distance, and the second region includes a region where the distance between the reactor component and its outer contour is greater than the first distance but less than the second distance, wherein the first distance is less than the second distance; if the number of first defects satisfies a first quantity condition, the reactor component is determined to satisfy a first index type; if the number of first defects does not satisfy the first quantity condition and the number of second defects satisfies the second quantity condition, the reactor component is determined to satisfy a second index type.

[0164] As one implementation of this application, the defect parameters of the reactor components include the defect size and the X-ray absorption coefficient. The generating device 904 generates the reactor analysis data based on the defect distribution and mass distribution in the following manner: based on the defect distribution, defect size and X-ray absorption coefficient, it generates first data characterizing the uniformity of the defect distribution and second data characterizing the symmetry of the defect distribution; based on the mass distribution, it generates third data characterizing the uniformity of the component distribution of different quality grades and fourth data characterizing the symmetry of the component distribution of different quality grades.

[0165] Figure 10 A schematic diagram of the hardware structure of the reactor analysis method provided in an embodiment of this application is shown.

[0166] The analysis equipment in the reactor may include a processor 1001 and a memory 1002 storing computer program instructions.

[0167] Specifically, the processor 1001 may include a central processing unit (CPU), an application-specific integrated circuit (ASIC), or one or more integrated circuits that can be configured to implement the embodiments of this application.

[0168] Memory 1002 may include mass storage for data or instructions. For example, and not limitingly, memory 1002 may include a hard disk drive (HDD), floppy disk drive, flash memory, optical disk, magneto-optical disk, magnetic tape, or Universal Serial Bus (USB) drive, or a combination of two or more of these. Where appropriate, memory 1002 may include removable or non-removable (or fixed) media. Where appropriate, memory 1002 may be internal or external to the integrated gateway disaster recovery device. In a particular embodiment, memory 1002 is non-volatile solid-state memory.

[0169] Memory may include read-only memory (ROM), random access memory (RAM), disk storage media devices, optical storage media devices, flash memory devices, and electrical, optical, or other physical / tangible memory storage devices. Therefore, typically, memory includes one or more tangible (non-transitory) computer-readable storage media (e.g., memory devices) encoded with software including computer-executable instructions, and when the software is executed (e.g., by one or more processors), it is operable to perform the operations described with reference to the methods according to one aspect of this disclosure.

[0170] The processor 1001 reads and executes computer program instructions stored in the memory 1002 to implement any of the reactor analysis methods in the above embodiments.

[0171] In one example, the reactor analysis equipment may also include a communication interface 1003 and a bus 1010. Wherein, such as Figure 10 As shown, the processor 1001, memory 1002, and communication interface 1003 are connected through bus 1010 and complete communication with each other.

[0172] The communication interface 1003 is mainly used to realize communication between various modules, devices, units and / or equipment in the embodiments of this application.

[0173] Bus 1010 includes hardware, software, or both, that couples components of an online data traffic metering device together. For example, and not limitingly, the bus may include an Accelerated Graphics Port (AGP) or other graphics bus, an Enhanced Industry Standard Architecture (EISA) bus, a Front Side Bus (FSB), HyperTransport (HT) interconnect, an Industry Standard Architecture (ISA) bus, an Infinite Bandwidth Interconnect, a Low Pin Count (LPC) bus, a memory bus, a Microchannel Architecture (MCA) bus, a Peripheral Component Interconnect (PCI) bus, a PCI-Express (PCI-X) bus, a Serial Advanced Technology Attachment (SATA) bus, a Video Electronics Standards Association Local (VLB) bus, or other suitable buses, or combinations of two or more of these. Where appropriate, bus 1010 may include one or more buses. Although specific buses are described and illustrated in embodiments of this application, any suitable bus or interconnect is contemplated herein.

[0174] The reactor analysis equipment can perform the reactor analysis method described in this application based on the location of components within the reactor, thereby achieving a combination of... Figure 1 and Figure 9 The method described is for analyzing reactors.

[0175] Furthermore, in conjunction with the reactor analysis methods described in the above embodiments, this application embodiment can provide a computer storage medium for implementation. This computer storage medium stores computer program instructions; when these computer program instructions are executed by a processor, they implement any of the reactor analysis methods described in the above embodiments.

[0176] This application also provides a computer program product, including a computer program that, when executed, implements a method for analyzing any of the reactors described in the above embodiments.

[0177] It should be clarified that this application is not limited to the specific configurations and processes described above and shown in the figures. For the sake of brevity, detailed descriptions of known methods are omitted here. In the above embodiments, several specific steps are described and shown as examples. However, the method process of this application is not limited to the specific steps described and shown. Those skilled in the art can make various changes, modifications, and additions, or change the order of steps, after understanding the spirit of this application.

[0178] The functional blocks shown in the above-described structural diagram can be implemented as hardware, software, firmware, or a combination thereof. When implemented in hardware, they can be, for example, electronic circuits, application-specific integrated circuits (ASICs), appropriate firmware, plug-ins, function cards, etc. When implemented in software, the elements of this application are programs or code segments used to perform the required tasks. Programs or code segments can be stored on a machine-readable medium or transmitted over a transmission medium or communication link via data signals carried on a carrier wave. "Machine-readable medium" can include any medium capable of storing or transmitting information. Examples of machine-readable media include electronic circuits, semiconductor memory devices, ROM, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disks, fiber optic media, radio frequency (RF) links, etc. Code segments can be downloaded via computer networks such as the Internet, intranets, etc.

[0179] It should also be noted that the exemplary embodiments mentioned in this application describe methods or systems based on a series of steps or apparatus. However, this application is not limited to the order of the above steps; that is, the steps can be performed in the order mentioned in the embodiments, or in a different order, or several steps can be performed simultaneously.

[0180] The aspects of this disclosure have been described above with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this disclosure. It should be understood that each block in the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing apparatus to produce a machine such that these instructions, executable via the processor of the computer or other programmable data processing apparatus, enable the implementation of the functions / actions specified in one or more blocks of the flowchart illustrations and / or block diagrams. Such a processor can be, but is not limited to, a general-purpose processor, a special-purpose processor, a special application processor, or a field-programmable logic circuit. It is also understood that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can also be implemented by special-purpose hardware performing the specified functions or actions, or can be implemented by a combination of special-purpose hardware and computer instructions.

[0181] The above description is merely a specific implementation of this application. Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, modules, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here. It should be understood that the protection scope of this application is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this application, and these modifications or substitutions should all be covered within the protection scope of this application.

Claims

1. A method for analyzing a reactor, characterized in that, include: According to the preset installation strategy, determine the location of each reactor component in the reactor; Based on the location of each reactor component in the reactor and the defect parameters of each reactor component, the defect distribution of the reactor is determined. Based on the location of each reactor component in the reactor and the quality assessment index determined by the defect parameters of each reactor component, the mass distribution corresponding to the reactor is determined. Based on the defect distribution and the mass distribution, analytical data for the reactor are generated.

2. The method according to claim 1, characterized in that, The reactor component includes a reference point, and the defect parameters of the reactor component include the relative positional relationship between the defect and the reference point; The step of determining the defect distribution of the reactor based on the location of each reactor component in the reactor and the defect parameters of each reactor component includes: The first position of the reference point relative to the reactor is determined based on the position of the reactor components within the reactor. Based on the first position of the reference point relative to the reactor and the relative positional relationship between the defect and the reference point, determine the second position of each defect relative to the reactor; The defect distribution of the reactor is determined based on the second position of each defect relative to the reactor.

3. The method according to claim 2, characterized in that, Determining the second position of each defect relative to the reactor based on the first position of the reference point relative to the reactor and the relative positional relationship between the defect and the reference point includes: Based on the component inspection image, the reference point detection coordinates in the coordinate system corresponding to the component inspection image and the relative positional relationship between the defect and the reference point are obtained. The component inspection image is obtained by performing defect detection on the reactor component based on the defect detection system. Based on the component standard image, determine the reference point standard coordinates in the coordinate system corresponding to the component standard image. The component standard image is an image determined based on a standard reactor component in a standard placement posture. Based on the reference point standard coordinates, the reference point detection coordinates, and the relative positional relationship, determine the defect standard coordinates in the coordinate system corresponding to the component standard image; Determine the coordinate transformation matrix based on the standard coordinates of the reference point and the first position of the reference point relative to the reactor; Based on the defect standard coordinates and the coordinate transformation matrix, the second position of each defect relative to the reactor is determined.

4. The method according to claim 2 or 3, characterized in that, The method further includes: Based on the component inspection image, obtain the reference point detection coordinates corresponding to the reference point in the reactor component and the defect detection coordinates corresponding to the defect; The relative positional relationship between the defect and the reference point is determined based on the detection coordinates of the reference point and the detection coordinates of the defect.

5. The method according to claim 1, characterized in that, The quality assessment indicators include a first type of indicator and a second type of indicator; The process of determining the mass distribution of the reactor based on the quality assessment indicators determined according to the location of each reactor component in the reactor and the defect parameters of each reactor component includes: Based on the position of each reactor component in the reactor, the first position information of the component that satisfies the first index type and the second position information of the component that satisfies the second index type are determined respectively. Based on the first location information and the second location information, the mass distribution corresponding to the reactor is determined.

6. The method according to claim 5, characterized in that, The method further includes: The number of first defects in a first region and the number of second defects in a second region of a reactor component are determined respectively. The first region is the region where the distance between the reactor component and its outer contour is less than a first distance. The second region includes the region where the distance between the reactor component and its outer contour is greater than the first distance but less than the second distance, where the first distance is less than the second distance. If the number of the first defects is determined to meet the first quantity condition, the reactor component is determined to meet the first index type. If it is determined that the first number of defects does not meet the first quantity condition, and the second number of defects meets the second quantity condition, then the reactor component is determined to meet the second index type.

7. The method according to claim 1, characterized in that, The defect parameters of the reactor components include the size of the defect and the radiation absorption coefficient. The generation of reactor analysis data based on the defect distribution and the mass distribution includes: Based on the defect distribution, the defect size, and the X-ray absorption coefficient, first data characterizing the uniformity of the defect distribution and second data characterizing the symmetry of the defect distribution are generated. Based on the mass distribution, third data representing the uniformity of component distribution at different mass levels and fourth data representing the symmetry of component distribution at different mass levels are generated.

8. An analytical apparatus for a reactor, characterized in that, The device includes: The first determining device is used to determine the position of each reactor component in the reactor according to a preset installation strategy; The second determining device is used to determine the defect distribution of the reactor based on the position of each reactor component in the reactor and the defect parameters of each reactor component. The third determining device is used to determine the mass distribution of the reactor based on the location of each reactor component in the reactor and the quality assessment index determined by the defect parameters of each reactor component. A generating device for generating analytical data of the reactor based on the defect distribution and the mass distribution.

9. An analytical apparatus for a reactor, characterized in that, The device includes: a processor and a memory storing computer program instructions; When the processor executes the computer program instructions, it implements the reactor analysis method as described in any one of claims 1-7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer program instructions that, when executed by a processor, implement the reactor analysis method as described in any one of claims 1-7.

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