Optical tweezer array closed-loop adaptive correction system based on experimental feedback

Abstract

The application discloses an experimental feedback-based optical tweezer array closed-loop adaptive correction system, relates to the technical field of optical tweezer array and neutral atom quantum computing, and has the technical scheme as follows: the static error of an optical tweezer experimental system is pre-calibrated to obtain a static calibration function; the loading phase function is loaded to a reconfigurable phase optical element or a fixed phase optical element with the loading phase function is manufactured, an actual optical tweezer array is formed through an optical path, and an image of the actual optical tweezer array is collected; the optical tweezer position is identified and corresponding intensity information is extracted based on the image of the actual optical tweezer array; intensity correction parameters are generated according to the intensity information until the intensity uniformity of the actual optical tweezer array meets a preset condition, and the effect is to improve the stability and uniformity of a large-scale optical tweezer array experimental system.

Description

Technical Field

[0001] This invention relates to the field of optical tweezers arrays and neutral atom quantum computing technology, and more specifically, to a closed-loop adaptive correction system for optical tweezers arrays based on experimental feedback. Background Technology

[0002] In practical optical tweezers array experiments, even if the phase map has good uniformity in theoretical calculations, the experimental system is still affected by factors such as phase optical element surface shape errors, phase response inhomogeneity, lens aberrations, optical path assembly and adjustment errors, laser power drift, and camera imaging errors, resulting in uneven intensity in the actual optical tweezers array. Traditional manual calibration requires a large amount of manual parameter tuning, which is difficult to adapt to long-term operation and large-scale arrays.

[0003] Furthermore, the static aberrations of phase optical elements and optical paths cause deviations between the theoretical phase map and the actual optical field. Relying solely on manual phase optimization calibration is inefficient and has poor repeatability, making it difficult to support long-term stable operation. Existing methods often lack an automatic closed loop from the actual camera image to the compensation parameters. Summary of the Invention

[0004] To address the shortcomings of existing technologies, the present invention aims to provide a closed-loop adaptive correction system for optical tweezers arrays based on experimental feedback.

[0005] To achieve the above objectives, the present invention provides the following technical solution:

[0006] An experimental feedback-based closed-loop adaptive correction system for optical tweezers arrays includes:

[0007] The static error of the optical tweezers experimental system is pre-calibrated to obtain the static calibration function;

[0008] The static calibration function is combined with the basic phase function output by the phase solver to generate the loaded phase function;

[0009] The loading phase function is loaded onto a reconfigurable phase optical element, or a fixed phase optical element with the loading phase function is manufactured, and an actual optical tweezers array is formed through an optical path, and an image of the actual optical tweezers array is acquired;

[0010] Based on the image of the actual optical tweezers array, the position of the optical tweezers is identified and the corresponding intensity information is extracted;

[0011] Strength correction parameters are generated based on the strength information, and the strength correction parameters are fed back to the phase solver to update the input constraints of the phase solver and regenerate the basic phase function;

[0012] The process of generating the basic phase function, generating the loaded phase function, acquiring the actual optical tweezers array image, extracting intensity information, and feeding back intensity correction parameters is repeated until the intensity uniformity of the actual optical tweezers array meets the preset conditions.

[0013] The reconfigurable phase optical element includes at least one of a spatial light modulator, a piston micromirror array, a tunable metasurface, and a programmable phase modulator; for the fixed phase optical element, the final loaded phase function obtained after closed-loop adaptive correction is used to guide the phase distribution design or structural design of the fixed phase optical element.

[0014] Preferably, the static error of the optical tweezers experimental system is pre-calibrated to obtain a static calibration function, specifically including the following steps:

[0015] The system wavefront error is obtained by wavefront measurement, and the surface shape error calibration function of the phase optical element is obtained.

[0016] By scanning parameters, the system aberration calibration function is obtained. The phase optical element surface shape error calibration function and the system aberration calibration function are used together as the static calibration function.

[0017] Preferably, the system aberration calibration function is a set of Zernike polynomials, expressed as:

[0018] ;

[0019] in, For system aberration calibration function, Let k be the coefficient of the kth term. For the first item Basis functions.

[0020] Preferably, the target phase map is generated by calculating the phase optical element surface shape error calibration function, the system aberration calibration function, and the basic phase function using the static calibration function. The calculation formula is as follows:

[0021] ;

[0022] in, For the target phase diagram, Based on the phase function, This is a calibration function for the surface shape error of phase optical elements. This is the system aberration calibration function.

[0023] Preferably, the image recognition of the optical tweezers position and extraction of corresponding intensity information based on the actual optical tweezers array specifically includes:

[0024] Identify the center position of each optical tweezer based on actual optical tweezer array images;

[0025] Establish a correspondence between the center position and the target position of the target optical tweezers array;

[0026] A corresponding strength calculation area is defined based on the center location, and the corresponding strength information is extracted from the strength calculation area.

[0027] Preferably, the intensity information extraction method includes at least one of ROI integration, peak intensity extraction, fitting amplitude extraction, and background subtraction integration.

[0028] Preferably, generating intensity correction parameters based on the intensity information specifically includes:

[0029] The strength deviation value is calculated based on the measured strength and the preset target strength.

[0030] Strength correction parameters are generated based on the strength deviation value to update the input constraints of the phase solver.

[0031] Preferably, the intensity correction parameters include at least one of the following: target amplitude correction parameters, target intensity weight, optical tweezers point weight, region weight, and normalized energy distribution parameters;

[0032] The unit that applies the intensity correction parameter includes at least one of a single optical tweezer, an optical tweezer region, an optical tweezer group, and an optical tweezer array.

[0033] Preferably, the intensity correction parameter is generated in at least one of the following methods: proportional update, mean ratio update, normalization update, damping update, recursive update, and feedback control update.

[0034] Compared with the prior art, the present invention has the following beneficial effects:

[0035] In the 50×50 optical tweezers array embodiment of this invention, the non-uniformity is approximately 5.1% without correction, decreasing to approximately 2.2% after double correction. Subsequently, through continuous iteration via feedback loop, the non-uniformity further decreases to approximately 0.7%, eventually entering a stable oscillation range around 0.7%. Correction mainly eliminates the static error of the system, while the feedback loop further compensates for the dynamic error and residual intensity non-uniformity of the real experimental system. With the combination of both, the non-uniformity of the 50×50 optical tweezers array is reduced from approximately 5.1% to approximately 0.7%. This application automatically reduces the intensity non-uniformity of the optical tweezers array through correction, image acquisition, optical tweezers identification, intensity extraction, intensity correction, and feedback loop, thereby improving the stability and uniformity of large-scale optical tweezers array experimental systems. Attached Figure Description

[0036] Figure 1 This is a schematic diagram of the system architecture according to an embodiment of the present invention;

[0037] Figure 2 This is a general flowchart of an embodiment of the present invention;

[0038] Figure 3 This is a flowchart illustrating the phase correction and phase optical element loading process according to an embodiment of the present invention;

[0039] Figure 4 This is a flowchart of the strength compensation closed-loop process based on measured strength in an embodiment of the present invention;

[0040] Figure 5 This is a schematic diagram illustrating the results of an embodiment of the present invention;

[0041] Figure 6 This is a schematic diagram illustrating the change in non-uniformity of the optical tweezers array before and after closed-loop correction according to an embodiment of the present invention. Detailed Implementation

[0042] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0043] Many specific details are set forth in the following description in order to provide a full understanding of the invention. However, the invention may also be practiced in other ways different from those described herein, and those skilled in the art can make similar extensions without departing from the spirit of the invention. Therefore, the invention is not limited to the specific embodiments disclosed below.

[0044] Secondly, the term "an embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in one embodiment" appearing in different places throughout this specification does not necessarily refer to the same embodiment, nor is it a single embodiment or an embodiment selectively excluded from other embodiments.

[0045] Reference Figures 1-6 As shown.

[0046] The embodiments further illustrate the experimental feedback-based closed-loop adaptive correction system for optical tweezers arrays proposed in this invention.

[0047] An experimental feedback-based closed-loop adaptive correction system for optical tweezers arrays includes:

[0048] The static error of the optical tweezers experimental system is pre-calibrated to obtain the static calibration function;

[0049] The loading phase function is generated by combining the static calibration function with the basic phase function output by the phase solver.

[0050] The loading phase function is loaded onto a reconfigurable phase optical element, or a fixed phase optical element with a loading phase function is manufactured, and an actual optical tweezers array is formed through the optical path, and an image of the actual optical tweezers array is acquired;

[0051] Image recognition of optical tweezers position and extraction of corresponding intensity information based on actual optical tweezers arrays;

[0052] Optical tweezers identification employs thresholding, peak detection, centroid localization, Gaussian fitting, template matching, or neural network methods.

[0053] Strength correction parameters are generated based on the strength information, and the strength correction parameters are fed back to the phase solver to update the input constraints of the phase solver and regenerate the basic phase function.

[0054] The phase solver can use different optical tweezers array generation algorithms and is not limited to a specific code implementation.

[0055] Repeat the process of generating the basic phase function, generating the loaded phase function, acquiring the actual optical tweezers array image, extracting intensity information, and feeding back intensity correction parameters until the intensity uniformity of the actual optical tweezers array meets the preset conditions; the preset conditions are the preset target or entering a stable oscillation range.

[0056] Among them, the reconfigurable phase optical element includes at least one of spatial light modulator, piston micromirror array, tunable metasurface, and programmable phase modulator; for the fixed phase optical element, the final loaded phase function obtained after closed-loop adaptive correction is used to guide the phase distribution design or structural design of the fixed phase optical element.

[0057] The static error of the optical tweezers experimental system is pre-calibrated to obtain a static calibration function, which includes the following steps:

[0058] The system wavefront error is obtained by wavefront measurement, and the surface shape error calibration function of the phase optical element is obtained.

[0059] By scanning parameters, the system aberration calibration function is obtained. The phase optical element surface shape error calibration function and the system aberration calibration function are used together as the static calibration function.

[0060] Preferably, the system aberration calibration function is a set of Zernike polynomials, expressed as:

[0061] ;

[0062] in, For system aberration calibration function, Let k be the coefficient of the kth term. For the first item Basis functions.

[0063] The target phase map is generated by calculating the phase optical element surface shape error calibration function, system aberration calibration function, and fundamental phase function using the static calibration function. The calculation formula is as follows:

[0064] ;

[0065] in, For the target phase diagram, Based on the phase function, This is a calibration function for the surface shape error of phase optical elements. This is the system aberration calibration function.

[0066] After phase loading, the industrial camera acquires images of the actual optical tweezers array. The image processing module automatically identifies the position of each optical tweezer, determines the corresponding region for each tweezer, and extracts the intensity of the optical tweezers to form measured intensity information corresponding to the target optical tweezers, the optical tweezers region, or other spatial units.

[0067] Image recognition of optical tweezers positions and extraction of corresponding intensity information based on actual optical tweezers arrays specifically includes:

[0068] Identify the center position of each optical tweezer based on actual optical tweezer array images;

[0069] Establish a correspondence between the center position and the target position of the target optical tweezers array;

[0070] The corresponding strength calculation area is defined based on the center location, and the corresponding strength information is extracted from the strength calculation area.

[0071] Intensity information extraction methods include at least one of ROI (region of interest) integration, peak intensity extraction, fitted amplitude extraction, and background subtraction integration.

[0072] Strength correction parameters are generated based on the strength information, specifically including:

[0073] The strength deviation value is calculated based on the measured strength and the preset target strength.

[0074] Strength correction parameters are generated based on the strength deviation values ​​to update the input constraints of the phase solver.

[0075] Intensity correction is derived from measured intensity information. Its elements can correspond to a single target optical tweezer, optical tweezer region, optical tweezer group, optical tweezer array, or other spatial division unit, and are not limited to one compensation value per optical tweezer.

[0076] The intensity correction elements are generated based on the measured intensity, target intensity, and array statistical characteristics. The calculation methods include proportional updates, mean ratio updates, normalization updates, damping updates, recursive updates, or other feedback control methods. This invention does not limit the specific function form; the core is that the compensation information comes from experimental measurement results and is re-inputted into the subsequent phase generation and loading processes.

[0077] The intensity correction parameters include at least one of the following: target amplitude correction parameters, target intensity weights, optical tweezer point weights, region weights, and normalized energy distribution parameters;

[0078] The unit for applying the intensity correction parameter includes at least one of the following: a single optical tweezer, an optical tweezer region, an optical tweezer group, and an optical tweezer array.

[0079] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0080] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A closed-loop adaptive correction system for an optical tweezers array based on experimental feedback, characterized in that, include: The static error of the optical tweezers experimental system is pre-calibrated to obtain the static calibration function; The static calibration function is combined with the basic phase function output by the phase solver to generate the loaded phase function; The loading phase function is loaded onto a reconfigurable phase optical element, or a fixed phase optical element with the loading phase function is manufactured, and an actual optical tweezers array is formed through an optical path, and an image of the actual optical tweezers array is acquired; Based on the image of the actual optical tweezers array, the position of the optical tweezers is identified and the corresponding intensity information is extracted; Strength correction parameters are generated based on the strength information, and the strength correction parameters are fed back to the phase solver to update the input constraints of the phase solver and regenerate the basic phase function; The process of generating the basic phase function, generating the loaded phase function, acquiring the actual optical tweezers array image, extracting intensity information, and feeding back intensity correction parameters is repeated until the intensity uniformity of the actual optical tweezers array meets the preset conditions. The reconfigurable phase optical element includes at least one of a spatial light modulator, a piston micromirror array, a tunable metasurface, and a programmable phase modulator; for the fixed phase optical element, the final loaded phase function obtained after closed-loop adaptive correction is used to guide the phase distribution design or structural design of the fixed phase optical element.

2. The closed-loop adaptive correction system for optical tweezers array based on experimental feedback according to claim 1, characterized in that, The static error of the optical tweezers experimental system is pre-calibrated to obtain a static calibration function, which includes the following steps: The system wavefront error is obtained by wavefront measurement, and the surface shape error calibration function of the phase optical element is obtained. By scanning parameters, the system aberration calibration function is obtained. The phase optical element surface shape error calibration function and the system aberration calibration function are used together as the static calibration function.

3. The closed-loop adaptive correction system for optical tweezers array based on experimental feedback according to claim 2, characterized in that, The system aberration calibration function is a set of Zernike polynomials, expressed as: ； in, For system aberration calibration function, Let k be the coefficient of the kth term. For the first item Basis functions.

4. The closed-loop adaptive correction system for optical tweezers array based on experimental feedback according to claim 2, characterized in that, The target phase map is generated by performing calculations using the static calibration function, the phase optical element surface shape error calibration function, the system aberration calibration function, and the fundamental phase function. The calculation formula is as follows: ； in, For the target phase diagram, Based on the phase function, This is a calibration function for the surface shape error of phase optical elements. This is the system aberration calibration function.

5. The closed-loop adaptive correction system for optical tweezers array based on experimental feedback according to claim 1, characterized in that, Based on the image recognition of the actual optical tweezers array, the position of the optical tweezers and the corresponding intensity information are extracted, specifically including: Identify the center position of each optical tweezer based on actual optical tweezer array images; Establish a correspondence between the center position and the target position of the target optical tweezers array; A corresponding strength calculation area is defined based on the center location, and the corresponding strength information is extracted from the strength calculation area.

6. The closed-loop adaptive correction system for optical tweezers array based on experimental feedback according to claim 5, characterized in that, The intensity information extraction method includes at least one of ROI integration, peak intensity extraction, fitting amplitude extraction, and background subtraction integration.

7. The closed-loop adaptive correction system for optical tweezers array based on experimental feedback according to claim 1, characterized in that, Intensity correction parameters are generated based on the intensity information, specifically including: The strength deviation value is calculated based on the measured strength and the preset target strength. Strength correction parameters are generated based on the strength deviation value to update the input constraints of the phase solver.

8. The optical tweezers array closed-loop adaptive correction system based on experimental feedback according to claim 7, characterized in that, The intensity correction parameters include at least one of the following: target amplitude correction parameters, target intensity weight, optical tweezers point weight, region weight, and normalized energy distribution parameters; The unit that applies the intensity correction parameter includes at least one of a single optical tweezer, an optical tweezer region, an optical tweezer group, and an optical tweezer array.

9. The closed-loop adaptive correction system for an optical tweezers array based on experimental feedback according to claim 7, characterized in that, The intensity correction parameters are generated in at least one of the following methods: proportional update, mean ratio update, normalization update, damping update, recursive update, and feedback control update.

10. The closed-loop adaptive correction system for optical tweezers array based on experimental feedback according to claim 1, characterized in that, After receiving the intensity correction parameters, the phase solver updates at least one of the input constraints of the target optical tweezer array, including the target amplitude, target intensity, optical tweezer point weight, region weight, or normalized energy distribution parameters, and re-outputs the basic phase map. In each iteration, the re-output base phase map is combined with the static calibration phase to obtain a new loaded phase map, until the intensity uniformity of the actual optical tweezers array meets the preset conditions.

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