A high-efficiency radio frequency test method

Abstract

The application discloses a kind of high-efficiency radio frequency test methods, it is related to radio frequency test technical field, comprising the following steps: S10, parameter configuration is carried out to PC host computer and measured product;S20, according to the test instruction of PC host computer issue to measured product transmit test data packet;S30, measured product receives and demodulates test data packet, and the number of test data packet is counted to successfully received, after statistics is completed, measured product emits reporting data packet to wireless transceiver test system;S40, receive and demodulate reporting data packet, extract measured data and upload to PC host computer;S50, measured data is sequentially decomposed and handled and classified storage, and the number of test data packet is successfully received to measured product, measured product transmit power and transmit frequency offset are qualified determination;S60, the qualified determination result is summarized, to measured product overall radio frequency performance is comprehensively judged, and generates final test report.The application has the beneficial effect: both reduce cost, and optimize test efficiency.

Description

Technical Field

[0001] This invention relates to the field of radio frequency (RF) testing technology, and more specifically, to an efficient RF testing method. Background Technology

[0002] Currently, in the large-scale manufacturing of wireless communication products (such as remote control modules and IoT terminals), rapid and accurate testing of their radio frequency (RF) performance is a crucial step in ensuring product quality. However, traditional methods rely on specialized equipment such as spectrum analyzers and integrated testers. These instruments typically have complex interfaces and cumbersome testing procedures, requiring specialized technicians for setup and operation. Each test is time-consuming, and the procurement, maintenance, and calibration costs of specialized RF instruments such as spectrum analyzers and integrated testers are extremely high.

[0003] Therefore, this invention provides an efficient radio frequency testing method that can significantly reduce hardware investment and greatly improve the execution speed of the testing process, thereby reducing costs and optimizing testing efficiency. Summary of the Invention

[0004] To overcome the shortcomings of existing technologies, this invention provides an efficient radio frequency testing method that can significantly reduce hardware investment and greatly improve the execution speed of the testing process, thereby reducing costs and optimizing testing efficiency.

[0005] The technical solution adopted by this invention to solve its technical problem is: a high-efficiency radio frequency testing method, applied to a testing device that includes at least a PC host computer, a wireless transceiver testing system, and a signal shielding isolation box, wherein the improvement is that the high-efficiency radio frequency testing method includes the following steps: S10, configure parameters for the PC host computer and the product under test; S20, the wireless transceiver test system transmits test data packets to the product under test in a specified frequency band according to the test instructions issued by the PC host computer; S30, the product under test receives and demodulates the test data packet, and simultaneously counts the number of successfully received test data packets. After the count is completed, the product under test sends a report data packet containing its own information and the number of successfully received test data packets to the wireless transceiver test system. S40, the wireless transceiver test system receives and demodulates the data packets transmitted by the product under test, extracts the test data, and uploads it to the PC host computer; The S50 PC host computer decomposes, processes, and classifies the test data in sequence, and makes a pass / fail judgment on the number of test data packets successfully received by the tested product, the transmission power of the tested product, and the transmission frequency offset. In step S60, the PC-based host computer summarizes the pass / fail judgment results from step S50 to comprehensively judge the overall RF performance of the product under test and generate a final test report.

[0006] Furthermore, the wireless transceiver test system includes a main control MCU unit, a wideband SIP RF chip, a multi-channel RF electronic switch unit, a segmented frequency selection and impedance matching network, a human-machine interface module, and a digitally controlled attenuator. The main control MCU unit is electrically connected to the human-machine interface module, the wideband SIP RF chip, and the digitally controlled attenuator, and the main control MCU unit is communicatively connected to a PC host computer. The multi-channel RF electronic switch unit is electrically connected between the wideband SIP RF chip and the digitally controlled attenuator. The segmented frequency selection and impedance matching network is electrically connected to the digitally controlled attenuator, and the segmented frequency selection and impedance matching network is communicatively connected to a small antenna tower inside a signal shielding isolation box.

[0007] Furthermore, in step S10, the specific method for configuring the parameters of the PC host computer and the product under test is as follows: Import the production model and work order information of the product under test into the PC host computer, and set the test data save path and configure the test parameters in the PC host computer; Fix the product under test onto the test mount inside the signal shielding and isolation box; The PC host computer obtains the corresponding product's wireless frequency band / mode based on the imported work order information, and sends the configuration to the wireless transceiver test system via serial port to configure the corresponding wireless frequency / mode and select the corresponding RF electronic switch to turn on.

[0008] Furthermore, the specific method by which the wireless transceiver test system transmits test data packets to the product under test in a designated frequency band according to the test instructions issued by the PC host computer is as follows: the main control MCU unit of the wireless transceiver test system calls the pre-stored special symbol firmware waveform file according to the test instructions issued by the PC host computer, generates a signal carrying product test information, and sends it to the RF transceiver chip for modulation through the SPI interface; after the modulated signal is filtered by the frequency selection network of the corresponding frequency band and selected by the RF electronic switch, it is transmitted to the test product in a broadcast form through a small antenna tower a preset number of test data packets.

[0009] Furthermore, in step S30, after the product under test receives and successfully demodulates the test data packet, it confirms that the signal transmitted by the wireless transceiver system is a production test command by identifying special metadata. Subsequently, the product under test enters the production test response state and counts the number of successfully received test data packets in real time.

[0010] Furthermore, if the product under test does not receive a new test data packet within 1 second, it is automatically determined that the receiving test phase of the wireless transceiver test system has ended. Subsequently, the test product automatically turns on the radio frequency wireless transmission function and continuously transmits a preset number of reporting data packets containing its own information and the number of successfully received test data packets to the wireless transceiver test system.

[0011] Furthermore, in step S40, after the wireless test system executes the test command issued by the PC host computer, it immediately switches to the receiving mode, receives the reporting data packets transmitted by the product under test in real time and demodulates them to extract all the test data in the data packets, and transmits them to the PC host computer via the serial port.

[0012] Furthermore, in step S50, the method for determining the pass / fail status of the number of successfully received test data packets is as follows: when the number of received test data packets is less than 90% of the total number of packets sent, the test product under test is deemed to have failed to receive the data; when the number of received test data packets is greater than or equal to 90%, the test product is deemed to have passed to receive the data.

[0013] Furthermore, in step S50, the method for determining the pass / fail status of the transmission power and transmission frequency offset of the tested product is as follows: the actual values ​​of the transmission power and transmission frequency offset of the tested product are compared with their respective preset pass / fail thresholds. If the actual value of the transmission power is greater than or equal to the pass / fail threshold, it is determined to be pass / fail. If the actual value of the transmission frequency offset is less than or equal to the pass / fail threshold, it is determined to be pass / fail.

[0014] Furthermore, in step S60, the specific method for comprehensively judging the overall radio frequency performance of the product under test is as follows: if the number of test data packets successfully received by the product under test, the transmit power of the product under test, and the transmit frequency offset are all qualified, then the overall radio frequency performance of the product under test is judged to meet the standard; otherwise, it is judged to be unqualified.

[0015] The beneficial effects of this invention are as follows: This invention directly replaces expensive professional equipment such as spectrum analyzers and comprehensive testers with a highly integrated wireless transceiver test system, thereby reducing hardware investment; by configuring parameters and issuing tasks from the PC host computer, to the wireless system automatically executing transceiver tests, and then to the host computer automatically performing data decomposition, qualification judgment and report generation, a fully automated closed-loop test process is constructed, realizing unmanned testing process and data digitization, and greatly improving the execution speed of the test process. Therefore, this invention reduces costs and optimizes testing efficiency. Attached Figure Description

[0016] Figure 1 This is an overall flowchart of an efficient radio frequency testing method according to the present invention; Figure 2 This is an overall architecture diagram of a test apparatus shown in an exemplary embodiment. Detailed Implementation

[0017] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0018] The following will clearly and completely describe the concept, specific structure, and technical effects of the present invention in conjunction with embodiments and accompanying drawings, so as to fully understand the purpose, features, and effects of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, not all of them. Other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are all within the scope of protection of the present invention. Furthermore, all connections / linkages involved in the patent do not simply refer to direct contact between components, but rather to the ability to form a better connection structure by adding or reducing connecting accessories according to specific implementation conditions. The various technical features in this invention can be combined interactively without contradicting each other.

[0019] This invention provides an efficient radio frequency testing method, applicable to, for example... Figure 2 The test apparatus shown includes at least a PC host computer, a wireless transceiver test system, and a signal shielding isolation box. Specifically, the wireless transceiver test system includes a main control MCU unit, a wideband SIP RF chip, a multi-channel RF electronic switch unit, a segmented frequency selection and impedance matching network, a human-machine interface module, and a digitally controlled attenuator. The main control MCU unit is electrically connected to the human-machine interface module, the wideband SIP RF chip, and the digitally controlled attenuator, and is communicatively connected to the PC host computer. The multi-channel RF electronic switch unit is electrically connected between the wideband SIP RF chip and the digitally controlled attenuator. The segmented frequency selection and impedance matching network is electrically connected to the digitally controlled attenuator, and is communicatively connected to a small antenna tower inside the signal shielding isolation box.

[0020] It should be noted that in this embodiment, the PC host computer is mainly responsible for importing production model / work order information, starting the test process, configuring data storage paths, and connecting with the MES system, realizing the issuance of test tasks and data feedback. Specifically, it communicates with the wireless transceiver test system via serial port / USB, issues test parameters, collects test data, generates test reports, and synchronizes them to the MES system to achieve production line traceability. The wireless transceiver test system, as the core signal processing unit of the test device, is integrated on a compact PCB circuit board, with an overall size of less than 15cm × 10cm, making it portable and easy to deploy. Specifically, the wireless transceiver test system includes a main control MCU unit and a wideband SIP RF chip. The system comprises a multi-channel RF electronic switch unit, a segmented frequency selection and impedance matching network, a human-machine interface module, and a digitally controlled attenuator. The main control MCU unit uses a low-power, high-performance ARM Cortex-M series microcontroller as the local control core of the wireless transceiver test system. It is responsible for receiving commands from the PC host computer, controlling the switching of the multi-channel RF electronic switch, driving the wideband SIP RF chip to complete signal detection, collecting and processing test data, determining the product's pass / fail status, and uploading data to the host computer. It also stores system calibration parameters and frequency band configuration parameters, ensuring data integrity even when power is off, thus guaranteeing consistency in subsequent tests. The wideband SIP RF chip integrates RF transceiver and... This system-in-package (SIP) RF chip integrates signal processing, power detection, frequency calibration, and analog-to-digital conversion. Operating in the 140MHz~3GHz frequency band, it perfectly adapts to the five major ISM bands: 300~345MHz, 415~470MHz, 861~870MHz, 900~945MHz, and 2.4GHz. It features built-in high-precision signal detection and frequency comparison circuits, replacing the core signal analysis and performance testing functions of traditional spectrum analyzers and comprehensive testers. It can autonomously complete RF signal acquisition, analysis, power conversion, and frequency offset calculation without external professional instruments. The dynamic detection range covers -60dBm to +20dBm, with a detection accuracy error ≤ ± 2dB, meeting the accuracy requirements of mass production testing; the multi-channel RF electronic switch uses a high-isolation, low-insertion-loss broadband RF electronic switch, with an operating frequency band covering DC~6GHz, and a switching time ≤30ns. The main control MCU unit sends control commands to drive channel switching, realizing rapid on / off switching of the five segmented frequency selection networks, ensuring accurate transmission of test signals to the corresponding frequency band processing circuits, avoiding crosstalk between multiple frequency bands, and ensuring test stability; the segmented frequency selection and impedance matching network is equipped with 5 independent segmented frequency selection filter circuits, corresponding to 300~345MHz, 415~470MHz, 861~870MHz, 900~945MHz, and 2.The target test frequency band is 4GHz. Each frequency selection network consists of an LC bandpass filter circuit, a 50Ω impedance matching circuit, and a signal attenuation circuit connected in series. This enables precise screening of useful signals within the corresponding frequency band, suppression of spurious signals and harmonics, and port impedance matching, eliminating signal reflection loss and further improving the accuracy of test indicators. The human-machine interface module includes a 1.3-inch OLED high-definition display screen, two sets of function buttons, and two sets of status indicator lights. The OLED display screen shows in real time key information such as the current test frequency band, transmit power value, frequency offset, receiver sensitivity, and pass / fail status. The function buttons are used for local... Manual frequency band switching, system calibration startup, and test reset operations are included, adapting to local independent testing without a PC host computer. A green indicator light indicates a successful test, while a red indicator light indicates a failed test, providing intuitive feedback on test results and meeting the needs of rapid visual judgment on production lines. The numerically controlled attenuator is specifically a multi-stage step attenuation unit set in the receiving path. This unit consists of an RF electronic switching unit and a multi-channel LC power attenuation network. This solves and realizes step-by-step attenuation control of the received signal power, addressing the problem of packet saturation under strong DUT signals and the inability to distinguish the magnitude of the DUT's transmit power. The multi-channel LC attenuation network consists of pre-calibrated and fixed attenuation channels. The attenuation of each channel is set in 1dB increments, for example: 0dB, 1dB, 2dB, 3dB… up to a maximum of 30dB, or expanded according to actual needs. Furthermore, 0dB corresponds to a DUT actual power value A for a wireless transceiver system achieving a transmission success rate greater than 90%, 1dB corresponds to a DUT actual power value B, and so on, up to a maximum of 30dB corresponding to Z1. These values ​​are stored as pre-stored data in the main control MCU unit of the wireless test system, serving as the basis for comparison and judgment during testing. The entire test setup architecture does not contain any specialized RF test instruments; therefore, this embodiment reduces hardware investment, thereby reducing testing costs.

[0021] Reference Figure 1 As shown, the efficient radio frequency testing method includes the following steps: S10, Configure parameters for the PC host computer and the product under test; specifically, the method for configuring parameters for the PC host computer and the product under test is as follows: Import the production model and work order information of the product under test into the PC host computer, and set the test data save path and configure the test parameters in the PC host computer; Fix the product under test onto the test mount inside the signal shielding and isolation box; The PC host computer obtains the corresponding product's wireless frequency band / mode based on the imported work order information, and sends the configuration to the wireless transceiver test system via serial port to configure the corresponding wireless frequency / mode and select the corresponding RF electronic switch to turn on.

[0022] It should be noted that in this embodiment, the operator imports the production model and corresponding work order information of the current batch of products under test into the PC host computer's operation interface, and sets the local storage path or remote MES system upload path for this round of test data in the software. At the same time, the operator configures the test process parameters, such as the number of transmitted data packets, power adjustment step size, and frequency scanning range. Subsequently, the product under test is securely placed and fixed on the dedicated elastic buckle test base inside the signal shielding isolation box, and the box door is closed to ensure the shielding effect. Afterward, the PC host computer automatically parses and obtains the target test wireless frequency band and communication mode corresponding to the product based on the imported work order information, and sends a control command containing this frequency band / mode information to the main control MCU unit of the wireless transceiver test system through a serial port or USB communication link. After receiving the command, the main control MCU unit drives the "multi-channel RF electronic switch unit" to operate, thereby accurately selecting the "segmented frequency selection and impedance matching network" corresponding to the target frequency band, completing the hardware configuration of the test channel.

[0023] S20, the wireless transceiver test system transmits test data packets to the product under test in a designated frequency band according to the test instructions issued by the PC host computer. Specifically, the method by which the wireless transceiver test system transmits test data packets to the product under test in a designated frequency band according to the test instructions issued by the PC host computer is as follows: the main control MCU unit of the wireless transceiver test system calls the pre-stored special symbol firmware waveform file according to the test instructions issued by the PC host computer, generates a signal carrying product test information, and sends it to the RF transceiver chip for modulation through the SPI interface; after the modulated signal is filtered by the frequency selection network of the corresponding frequency band and selected by the RF electronic switch, it is transmitted to the test product in a broadcast form through a small antenna tower a preset number of test data packets.

[0024] It should be noted that, in this embodiment, after configuration, the main control MCU unit of the wireless transceiver test system, according to the test instructions received from the PC host computer, calls the pre-stored special symbol firmware waveform file containing specific production test instructions from its internal memory, and generates a signal carrying production test information accordingly. Subsequently, the main control MCU unit sends the signal to the wideband SIP RF chip for modulation via the SPI communication interface, converting it into an RF signal. This RF signal first passes through the segmented frequency selection and impedance matching network selected by the main control MCU unit, corresponding to the target test frequency band (e.g., 415-470MHz), to filter out out-of-band noise and complete impedance matching. Then, the signal passes through the channel selected by the multi-channel RF electronic switch unit. Finally, the modulated RF signal is transmitted through a low-loss RF cable to the miniaturized wideband antenna tower inside the signal shielding isolation box, and the antenna tower broadcasts a preset number (e.g., 100) of test data packets to the product under test (DUT) on the fixed test stand within the shielding box.

[0025] S30: The product under test (DUT) receives and demodulates the test data packets, and simultaneously counts the number of successfully received test data packets. After the count is completed, the DUT transmits a report data packet containing its own information and the number of successfully received test data packets to the wireless transceiver test system. Specifically, after the DUT receives and successfully demodulates the test data packets, it identifies the signal transmitted by the wireless transceiver system as a production test command by recognizing special metadata. Subsequently, the DUT enters the production test response state and counts the number of successfully received test data packets in real time. Furthermore, if the DUT does not receive a new test data packet within one second, it automatically determines that the reception test phase of the wireless transceiver test system has ended. The DUT then automatically activates its RF wireless transmission function and continuously transmits a preset number of report data packets containing its own information and the number of successfully received test data packets to the wireless transceiver test system.

[0026] It should be noted that in this embodiment, the product under test (DUT) receives test data packets transmitted by the wireless transceiver test system within a signal shielding isolation box, using its own receiving antenna and RF front-end, and performs demodulation. When the demodulated data contains and identifies a preset "special symbol," the DUT confirms that the current signal is a production test command, and then switches from its normal operating mode to the production test response state, and counts the number of successfully received and correctly verified test data packets in real time. After receiving for a period of time, if the DUT does not detect a new test data packet after a 1-second delay after completing the last successful reception, it automatically determines that the transmission phase of the wireless transceiver test system has ended. Subsequently, the DUT automatically starts its RF transmission function and continuously transmits a set (e.g., 10) of reporting data packets to the wireless transceiver test system according to a predetermined communication format and channel. These data packets encapsulate its own identification information (such as MAC address or product serial number) and the total number of successfully received test data packets counted in the previous stage.

[0027] S40, the wireless transceiver test system receives and demodulates the reporting data packets transmitted by the product under test, extracts the production test data, and uploads it to the PC host computer; when the wireless test system executes the test command issued by the PC host computer, it immediately switches to the receiving mode, receives the reporting data packets transmitted by the product under test in real time, demodulates them to extract all the production test data in the data packets, and transmits them to the PC host computer via serial port uplink.

[0028] It should be noted that, in this embodiment, after executing the instruction from the PC host computer to transmit a preset number of test data packets, the main control MCU unit of the wireless transceiver test system immediately controls the wideband SIP RF chip and the multi-channel RF electronic switch unit to switch the wireless transceiver system from transmit mode to receive mode, and keeps the corresponding segmented frequency selection network channel in the selected state; the RF signal of the reported data packet transmitted by the product under test (DUT) is received through the antenna tower in the signal shielding isolation box. This signal is filtered by the corresponding segmented frequency selection and impedance matching network, selected by the multi-channel RF electronic switch unit, and finally sent to the wideband SIP RF chip for demodulation; the main control MCU unit extracts the production test data reported by the product under test from the demodulated data frame. This data includes the product's own identification information (such as MAC address) and the number of successfully received packets counted in the previous test stage; subsequently, the main control MCU unit packages this extracted production test data through its serial communication interface (such as UART to USB) and transmits it uplink to the PC host computer for subsequent processing, storage and judgment.

[0029] The S50 PC host computer decomposes, processes, and categorizes the test data sequentially, and determines the pass / fail status of the number of successfully received test data packets, the transmit power, and the transmit frequency offset of the tested product. Specifically, the pass / fail status for the number of successfully received test data packets is determined as follows: if the number of received test data packets is less than 90% of the total number of packets sent, the tested product is deemed to have failed to receive the data; if the number of received test data packets is greater than or equal to 90%, the tested product is deemed to have passed to receive the data. The pass / fail status for the transmit power and transmit frequency offset of the tested product is determined as follows: the actual values ​​of the transmit power and transmit frequency offset of the tested product are compared with their respective preset pass / fail thresholds. If the actual value of the transmit power is greater than or equal to the pass / fail threshold, it is deemed to be pass / fail; if the actual value of the transmit frequency offset is less than or equal to the pass / fail threshold, it is deemed to be pass / fail.

[0030] It should be noted that in this embodiment, the PC host computer parses the production test data uploaded from the wireless transceiver test system, decomposes and classifies the key information, including the number of successfully received test packets reported by the product under test (DUT), and the transmit power and frequency offset data of the DUT measured and preliminarily calculated locally by the wireless transceiver test system. Subsequently, the PC host computer initiates three core judgments: First, it performs a receive sensitivity judgment, calculating the ratio of the number of successfully received packets reported by the DUT to the total number of transmitted packets. If the ratio is lower than 90%, the reception is directly judged as unqualified; if the ratio is up to standard (≥90%), the transmit power of the current test system is recorded as the sensitivity value. To obtain the accurate minimum demodulation sensitivity, the PC host computer controls the test system to gradually reduce the transmit power in steps of 0.5dB or 1dB, and cyclically executes the test process until the lowest transmit power at which the DUT can still maintain a reception success rate of over 90% is found. This power is the finally determined receive sensitivity. Secondly, the transmit power is determined. The host computer, based on the attenuation level of the digitally controlled attenuator locked at the critical point (when the packet reception rate drops to 90%) by the test system, queries the pre-stored calibration data table of "attenuation level - input power" and calculates the actual transmit power of the DUT by combining antenna gain and path loss compensation. The host computer compares the actual transmit power with the preset qualified threshold. If the actual transmit power is greater than or equal to the qualified threshold, the DUT's transmit power is deemed qualified. Finally, the frequency offset is determined. The host computer, based on the optimal packet reception frequency obtained by the test system by scanning near the nominal center frequency (e.g., in 1kHz steps within ±20kHz range), calculates the difference between the frequency and the nominal frequency to obtain the actual frequency offset. After the calculation is completed, the host computer compares the actual frequency offset with its corresponding qualified threshold. If the actual frequency offset is less than or equal to the qualified threshold, the frequency offset is deemed qualified.

[0031] In step S60, the PC-based host computer summarizes the pass / fail judgment results from step S50 to comprehensively assess the overall RF performance of the product under test and generate a final test report. Specifically, the comprehensive assessment of the overall RF performance of the product under test is conducted as follows: if the number of test data packets successfully received, the transmit power, and the transmit frequency offset are all within acceptable limits, the overall RF performance of the product under test is deemed to meet the standards; otherwise, it is deemed to fail.

[0032] It should be noted that in this embodiment, after the PC host computer completes the independent pass / fail determination of the receiving sensitivity, transmitting power and frequency offset in step S50, it summarizes and logically integrates these three determination results; only when the determination results of the three indicators "number of successfully received test data packets (reflecting receiving sensitivity)", "transmitting power of the product under test" and "transmitting frequency offset" are all "pass", the PC host computer finally determines that the overall RF performance of the product under test (DUT) meets the standard (i.e., PASS); if any one or more of these indicators are determined to be unqualified, the overall performance is determined to be unqualified (i.e., FAIL). Subsequently, the PC host computer automatically generates a structured final test report. This report typically includes work order information, a unique product identifier (such as a MAC address), specific measurement values ​​and judgment results for each test indicator, an overall comprehensive judgment conclusion (PASS / FAIL), and a test timestamp. This report is stored locally according to a pre-configured path and can also be uploaded to the Manufacturing Execution System (MES) for data traceability. At the same time, the host computer sends the final judgment conclusion to the wireless transceiver test system via a serial port, causing the indicator lights on its human-machine interaction module to light up (green light represents PASS, red light represents FAIL), and the results are simultaneously displayed on the OLED screen for production line operators to check in real time.

[0033] The above is a detailed description of the preferred embodiments of the present invention. However, the present invention is not limited to the embodiments described. Those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present invention. All such equivalent modifications or substitutions are included within the scope defined by the claims of this application.

Claims

1. A high-efficiency radio frequency testing method, applied to a test apparatus comprising at least a PC host computer, a wireless transceiver test system, and a signal shielding isolation box, characterized in that, The efficient radio frequency testing method includes the following steps: S10, configure parameters for the PC host computer and the product under test; S20, the wireless transceiver test system transmits test data packets to the product under test in a specified frequency band according to the test instructions issued by the PC host computer; S30, the product under test receives and demodulates the test data packet, and simultaneously counts the number of successfully received test data packets. After the count is completed, the product under test sends a report data packet containing its own information and the number of successfully received test data packets to the wireless transceiver test system. S40, the wireless transceiver test system receives and demodulates the data packets transmitted by the product under test, extracts the test data, and uploads it to the PC host computer; The S50 PC host computer decomposes, processes, and classifies the test data in sequence, and makes a pass / fail judgment on the number of test data packets successfully received by the tested product, the transmission power of the tested product, and the transmission frequency offset. In step S60, the PC-based host computer summarizes the pass / fail judgment results from step S50 to comprehensively judge the overall RF performance of the product under test and generate a final test report.

2. The efficient radio frequency testing method according to claim 1, characterized in that, The wireless transceiver test system includes a main control MCU unit, a wideband SIP RF chip, a multi-channel RF electronic switch unit, a segmented frequency selection and impedance matching network, a human-machine interface module, and a digitally controlled attenuator. The main control MCU unit is electrically connected to the human-machine interface module, the wideband SIP RF chip, and the digitally controlled attenuator, and is also communicatively connected to a PC host computer. The multi-channel RF electronic switch unit is electrically connected between the wideband SIP RF chip and the digitally controlled attenuator. The segmented frequency selection and impedance matching network is electrically connected to the digitally controlled attenuator, and is also communicatively connected to a small antenna tower inside a signal shielding isolation box.

3. The efficient radio frequency testing method according to claim 2, characterized in that, In step S10, the specific method for configuring the parameters of the PC host computer and the product under test is as follows: Import the production model and work order information of the product under test into the PC host computer, and set the test data save path and configure the test parameters in the PC host computer; Fix the product under test onto the test mount inside the signal shielding and isolation box; The PC host computer obtains the corresponding product's wireless frequency band / mode based on the imported work order information, and sends the configuration to the wireless transceiver test system via serial port to configure the corresponding wireless frequency / mode and select the corresponding RF electronic switch to turn on.

4. The efficient radio frequency testing method according to claim 3, characterized in that, The specific method by which the wireless transceiver test system transmits test data packets to the product under test in a specified frequency band according to the test instructions issued by the PC host computer is as follows: the main control MCU unit of the wireless transceiver test system calls the pre-stored special code element firmware waveform file according to the test instructions issued by the PC host computer, generates a signal carrying product test information, and sends it to the radio frequency transceiver chip for modulation through the SPI interface; After the modulated signal is filtered by the frequency selection network of the corresponding frequency band and selected by the radio frequency electronic switch, it is transmitted to the test product in a broadcast manner through a small antenna tower a preset number of test data packets.

5. The efficient radio frequency testing method according to claim 4, characterized in that, In step S30, after the product under test receives and successfully demodulates the test data packet, it confirms that the signal transmitted by the wireless transceiver system is a production test command by identifying special primitive codes. Subsequently, the product under test enters the production test response state and counts the number of successfully received test data packets in real time.

6. The efficient radio frequency testing method according to claim 5, characterized in that, If the product under test does not receive a new test data packet within 1 second, it is automatically determined that the receiving test phase of the wireless transceiver test system has ended. Subsequently, the test product automatically turns on the radio frequency wireless transmission function and continuously transmits a preset number of report data packets containing its own information and the number of successfully received test data packets to the wireless transceiver test system.

7. The efficient radio frequency testing method according to claim 1, characterized in that, In step S40, after the wireless test system executes the test command issued by the PC host computer, it immediately switches to the receiving mode, receives the reporting data packets transmitted by the product under test in real time, demodulates them, extracts all the test data in the data packets, and transmits them to the PC host computer via the serial port.

8. The efficient radio frequency testing method according to claim 1, characterized in that, In step S50, the method for determining the pass / fail status of the number of successfully received test data packets is as follows: when the number of received test data packets is less than 90% of the total number of packets sent, the test product under test is deemed to have failed to receive the data; when the number of received test data packets is greater than or equal to 90%, the test product is deemed to have passed to receive the data.

9. The efficient radio frequency testing method according to claim 1, characterized in that, In step S50, the method for determining the pass / fail status of the transmission power and transmission frequency offset of the tested product is as follows: the actual values ​​of the transmission power and transmission frequency offset of the tested product are compared with their respective preset pass / fail thresholds. If the actual value of the transmission power is greater than or equal to the pass / fail threshold, it is determined to be pass / fail. If the actual value of the transmission frequency offset is less than or equal to the pass / fail threshold, it is determined to be pass / fail.

10. The efficient radio frequency testing method according to claim 1, characterized in that, In step S60, the specific method for comprehensively judging the overall radio frequency performance of the product under test is as follows: if the number of test data packets successfully received by the product under test, the transmit power of the product under test, and the transmit frequency offset are all qualified, then the overall radio frequency performance of the product under test is judged to be up to standard; otherwise, it is judged to be unqualified.

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