Methods and systems for identifying changes in the arrangement of components in an enclosed space

Abstract

A method for identifying changes in the arrangement of components in an enclosed space (SS), the enclosed space comprising, internally, at least one transmitter (TX) for transmitting a transmitted signal, at least one controllable reflector (RIS) for reflecting the signal in at least one configurable reflection direction, at least one receiver (RX) for receiving the reflected signal, and at least one first element for reflecting the transmitted signal and / or the reflected signal during a first state determination, and at least one second element for reflecting the transmitted signal and / or the reflected signal during a second state determination, wherein the steps are performed as follows: - transmitting a transmitted signal, applying at least one predetermined reflection direction by the reflector (RIS), reflecting the transmitted signal and / or the reflected signal. The process involves: - determining a first state of the enclosed space (SS) by reflecting and receiving the reflected signal, in which only the at least one first element is arranged in the enclosed space (SS); - determining a second state of the enclosed space (SS) by emitting the emitted signal, applying the at least one predetermined reflection direction by the reflector (RIS), reflecting the emitted signal and / or the reflected signal, and receiving the reflected signal, in which the at least one first element and the at least one second element are arranged in the enclosed space (SS); and - determining a change in the arrangement of the elements in the enclosed space (SS) from the difference between the first state and the second state.

Description

Technical Field

[0001] This invention relates to a method and system for identifying changes in the arrangement of components in an enclosed space. Background Technology

[0002] In industrial applications, it is often necessary to detect mechanical changes in volumetric areas such as equipment cabinets or enclosures, which may be formed, for example, in the arrangement of electronic components, electrical components, devices, connecting elements, or mounting elements in the volume to be observed.

[0003] The volume to be observed can be, for example, an equipment cabinet or a switch cabinet, but it can also be the entire space in a building.

[0004] Changes in switch cabinets can also be caused by, for example, the replacement or expansion of components and the modification of devices or equipment, changes in cable laying, mechanical damage or forgotten tools, and may also be caused by acts of vandalism.

[0005] In the case of electronic components, such as when a wire is damaged and thus forms two wire sections that are no longer connected to each other, changes at the bonding wires in a power module or replacement or manipulation of a microchip can be identified.

[0006] In existing technologies, manual inspections are typically performed on-site to identify such changes. Summary of the Invention

[0007] The objective of this invention is to provide a solution in which changes in an enclosed space can be automatically identified or determined in a simple and reliable manner.

[0008] The objective of the invention is achieved by a method for identifying changes in the arrangement of elements in an enclosed space, the enclosed space comprising, internally, at least one transmitter for transmitting a transmitted signal, at least one controllable reflector for receiving a reflected signal and for reflecting the transmitted signal in at least one configurable reflection direction, at least one receiver for receiving the reflected signal, and at least one first element for reflecting the transmitted signal and / or the reflected signal during a first state determination, and at least one second element for reflecting the transmitted signal and / or the reflected signal during a second state determination, wherein the following steps are performed: - A first state of the enclosed space is determined by emitting a transmission signal, applying at least one predetermined reflection direction in a reflector, reflecting the transmission signal and / or the reflected signal, and receiving the reflected signal, in which only the at least one first element is arranged in the enclosed space; and - A second state of the enclosed space is determined by emitting the emitted signal, applying the at least one predetermined reflection direction in the reflector, reflecting the emitted signal and / or the reflected signal, and receiving the reflected signal, in which the at least one first element and the at least one second element are arranged in the enclosed space; and - Determine the changes in the arrangement of the elements in the enclosed space from the differences between the first state and the second state.

[0009] According to the present invention, changes, such as those in a switch cabinet, are identified by periodically testing the high-frequency characteristics of the volume under observation, such as reflection or dielectric properties, as well as the dielectric properties of components within the volume, preferably using millimeter waves.

[0010] First, the characteristics of the reflected transmitted signal are measured and stored for reference configuration.

[0011] Subsequent inspection and measurement can confirm the existence of deviations from the reference configuration, i.e., changes in the characteristics of the reflected emission signal, and accordingly confirm the existence of changes in the arrangement of components within an enclosed space, such as structural changes in a component space, and generate a warning. An enclosed space, such as a component space, is understood as an enclosing volume, defined for example by walls, a cover, and a bottom, in order to preferably protect the enclosed components from external influences, for example, by utilizing conductive materials.

[0012] At least one first element and at least one second element form an arrangement of elements in an enclosed space, wherein variations in the arrangement of elements can be determined by the method.

[0013] The corresponding components can also be understood as objects that do not have technical functions.

[0014] Therefore, it is advantageous for enclosed spaces, such as switch cabinets, to have a complete metal conductive enclosure to form a good barrier against external influences, in which other conductive materials can also be used.

[0015] Conductive materials should reflect the emitted signals or form a good barrier against external influences.

[0016] However, it is not mandatory for the casing to be made entirely of metal, but this can improve recognition sensitivity.

[0017] In particular, smaller openings do not interfere with the identification of components or affect the identification in an undesirable manner, wherein the size of the opening may depend on the transmission frequency of the transmitted signal.

[0018] Therefore, it is preferred that the enclosed space has a conductive wall that surrounds the surface of the enclosed volume of the space in a proportion of more than 80%, particularly preferably more than 90% or more than 95%.

[0019] The walls, ceilings, or floors of rooms in buildings made of concrete are sufficiently conductive to be used in accordance with the method according to the invention.

[0020] Enclosed spaces can be, for example, equipment cabinets or switch cabinets, but they can also be entire rooms in a building, such as workshops (Betriebsraum), for example, for transformers, electrical switches, or computers.

[0021] This method works particularly well when components are arranged statically in an enclosed space.

[0022] It is particularly advantageous for movable parts or elements in space if the element is periodically moved back to its starting position and then the method according to the invention is implemented.

[0023] It is also beneficial to detect multiple valid states at different positions of the element and to implement the method according to the invention at the corresponding positions.

[0024] The solution according to the invention offers many advantages, such as enabling a simple, low-cost, and integrated radar system to be used for detailed evaluation of reflection characteristics in a pre-given volume.

[0025] Furthermore, by using a controllable reflector, the volume to be observed can be several times larger than when using a pure transmitter / receiver system, thereby improving accuracy.

[0026] Furthermore, when using an active controllable reflector, the radar system's transmit power can be significantly reduced by the amplification element, which decreases system complexity and cost.

[0027] Measurements can also be repeatedly acquired and evaluated at regular intervals, allowing for the separate detection of successive changes and enabling continuous monitoring and tracking of changes to identify the cause of current failures or analyze system changes.

[0028] This also allows the detection switchgear SS, along with its installed components G1-G4, KK1-KK3, HS1-HS3, K1, and K2, to be restored to their original state.

[0029] Therefore, in the case of switchgear, it is conceivable that changes in the position of copper wires in plastic cable trays can be detected, thereby replacing the equipment with another mechanically identical counterfeit, which may be detected due to the slightly different wiring position after the replacement.

[0030] In the case of electronic printed circuit board assemblies (Elektronik-Flachbaugruppe), HF reflectance measurement has shown that, for example, it is possible to detect bent bond lines, volume changes in solder, and rotation and displacement of individual components.

[0031] An additional advantage is that image data is not collected by the system, which is a data protection advantage compared to camera systems.

[0032] Furthermore, compared to access protection systems that are "similar to alarm devices," this system not only triggers an alarm at the time of access but also indicates changes to the existing system, thereby achieving a higher level of security.

[0033] This method can be improved by making changes in the arrangement of elements structural changes within an enclosed space.

[0034] Here, structural changes in an enclosed space refer to changes in the mechanical arrangement or position of components or parts, which cause changes in the reflection behavior of transmitted signals in the enclosed space.

[0035] Therefore, changes in the arrangement of components can cause changes in the propagation of transmitted signals in an enclosed space, which can be identified and detected as structural changes in the enclosed space.

[0036] The method can be improved in that the enclosed space is an enclosed component space, preferably a switch cabinet.

[0037] This allows for monitoring of the switchgear after maintenance in a particularly simple way, and checking, for example, whether tools were unintentionally left behind, or whether the configuration of the switchgear has been changed in an unauthorized manner.

[0038] This method can be improved by classifying the received signals in subsequent analysis, for example, by applying artificial intelligence-based methods, and generating and applying corresponding "machine learning" models.

[0039] Here, the first state of the closed space can be determined through model training, and state recognition or reasoning can be performed by determining the second state of the closed space.

[0040] In one improved embodiment of the invention, it is specified that at least one configurable direction of the reflector has at least three, preferably five, and particularly preferably ten directions, which are sequentially configured by the reflector in time during the determination of the state of the enclosed space.

[0041] This can further improve the accuracy of the method.

[0042] For example, a direction in which particularly significant reflection, absorption, or dispersion occurs can be defined, which allows for good classification of the received signal in subsequent analysis, for example, with the aid of artificial intelligence.

[0043] This task is also addressed by a system for identifying changes in the arrangement of components in an enclosed space, the system comprising: - At least one transmitter, said transmitter being arranged within the enclosed space and configured to transmit a signal; and - A controllable reflector, arranged within the enclosed space and configured to receive transmitted signals and reflect transmitted signals in at least one configurable direction; and - At least one first element, arranged within the enclosed space, such that the transmitted signal and / or the reflected signal is reflected at the first element; and - At least one receiver, said receiver being arranged within the enclosed space and configured to receive the reflected signal; Furthermore, the system is also configured to, - A first state of the enclosed space is determined by emitting the emitted signal, applying at least one predetermined reflection direction to the reflector, and receiving the reflected signal, in which only the at least one first element is arranged in the enclosed space; and - A second state of the enclosed space is determined by emitting the emitted signal, applying the at least one predetermined direction by the reflector, and receiving the reflected signal, in which the at least one first element and the at least one second element are arranged in the enclosed space to reflect the emitted signal and / or the reflected signal; and - Determine the changes in the arrangement of the elements in the enclosed space from the differences between the first state and the second state.

[0044] In one improved embodiment of the invention, the at least one second element is formed by separate portions of the at least one first element.

[0045] Thus, for example, it is possible to identify a conductor that has broken, been cut, or melted during operation and has two remaining conductor portions or conductor ends, which were originally connected to the two components.

[0046] In one improved embodiment of the invention, the at least one second element comprises a mechanical tool, an electrical tool, or an electronic tool.

[0047] This allows, for example, the identification of tools that were unintentionally left in the switch cabinet during maintenance.

[0048] In one improved embodiment of the invention, the enclosed space is a component space, preferably a switch cabinet, and the at least one first element includes a component, preferably electronic equipment and / or electrical cables.

[0049] The present invention is particularly well suited for monitoring electrical switchgear that has components, equipment, installation parts or cables.

[0050] In one improved embodiment of the invention, the component space is specified as an electronic component, and the at least one first component includes an electronic semiconductor component.

[0051] The present invention is particularly well suited for monitoring electrical components that have parts, equipment, installations or cables.

[0052] In one improved embodiment of the invention, it is specified that the at least one configurable direction has at least three, preferably five, and particularly preferably ten directions, and the directions can be configured sequentially in time by the reflector during the determination of the state of the enclosed space.

[0053] For example, a direction in which particularly significant reflection, absorption, or dispersion occurs can be defined, which allows for good classification of the received signal in subsequent analysis, for example, with the aid of artificial intelligence.

[0054] These directions can be set in a time-staggered manner to simply maintain system complexity and use simple, controllable reflectors.

[0055] In one improved embodiment of the invention, the enclosed space is at least partially formed of a conductive material, preferably in more than 50%, and particularly preferably more than 75%, of the built-in surface of the enclosed space.

[0056] This enables, in particular, the reflection to be directed toward a target by directing the reflection toward a predetermined conductive portion or surface in which particularly significant reflection, absorption, or dispersion occurs, allowing for good classification of the received signal in subsequent analysis, for example, by means of artificial intelligence. Attached Figure Description

[0057] The invention is described in more detail with reference to embodiments in the following figures. The figures... exist Figure 1 The first embodiment of the present invention for a switch cabinet is shown in cross-sectional view. exist Figure 2 The cross-sectional view in the figure illustrates a second embodiment of the present invention for a printed circuit board assembly.

[0058] It is clear that, for control of the system, the corresponding control devices or modules shown or connected are required. For better clarity, these components are not shown in the diagram. Detailed Implementation

[0059] Figure 1 The first embodiment of the present invention is shown, which has a closed component space in the form of a switch cabinet SS.

[0060] In this example, the elements in the enclosed space are understood as components or tools.

[0061] As components, electronic devices G1-G4 are installed on mounting rails HS1-HS3, i.e., DIN (German Industrial Standard) rails, or at the bottom B of switch cabinet SS.

[0062] The equipment is connected by lines or cables K1 and K2, and the lines or cables are partially laid in cable troughs KK1-KK3.

[0063] The switch cabinet has a metal, i.e. conductive door T, through which access to the components is made during maintenance.

[0064] In addition, at the bottom B of the switch cabinet SS, a tool in the form of pliers Z, which was unintentionally left behind during maintenance, is shown in the figure. The pliers should be identified.

[0065] In addition, the rear wall of the switch cabinet is formed of a conductive metal plate, and the component is mounted on the conductive metal plate.

[0066] Therefore, the switch cabinet has a built-in conductive surface in the component space SS in more than 75% of the proportion.

[0067] Figure 2 A second embodiment of the invention is shown, having a component space in the form of a printed circuit board assembly (FBG).

[0068] Here, the component space FBG is an electronic assembly with a flat structure and a metal cover, the assembly including a first component in the form of electronic semiconductor components BT1-BT3.

[0069] Semiconductor components BT1-BT3 are connected using bonding wires D1 and D2.

[0070] In addition, two broken wire ends D3a and D3b between semiconductor components BT2 and BT3 are shown in the figure, and these wire ends should be identified.

[0071] In addition, the embodiments described in the figures can be similarly understood, and further statements apply with necessary modifications.

[0072] A system for identifying changes in the arrangement of components in a closed component space (FBG) includes a transmitter (TX) arranged within the component space (FBG) and configured to transmit a signal.

[0073] The transmitter TX has transmitting electronics and a transmitting antenna. In principle, only the transmitting antenna needs to be arranged inside the switch cabinet; however, due to its simplicity, the transmitter TX is a compact integrated transmitting module with both electronics and an antenna.

[0074] In addition, the system has a controllable reflector RIS, which is arranged in the component space SS, FBG and is configured to receive the transmitted signal and reflect the transmitted signal in multiple configurable directions.

[0075] The configurable directions, for example, have ten directions, which can be configured sequentially in time by a reflector RIS during the determination of the state of the component space SS, FBG, and for example, pointing to the metal parts of the switch cabinet.

[0076] In addition, the system has multiple components arranged within component spaces SS and FBG such that transmitted signals and / or reflected signals are reflected at the components.

[0077] The first component is the assembly and electrical and mechanical connecting elements, which are arranged and installed in the switch cabinet.

[0078] The second component could be a tool that was accidentally left behind during maintenance.

[0079] In addition, the system has a receiver RX, which is arranged within the component spaces SS and FBG and is configured to receive reflected signals.

[0080] The receiver RX is similar to the transmitter TX, having receiving electronics and a receiving antenna, and is here referred to as a compact integrated receiving module with electronics and an antenna.

[0081] The transmitted signal, the reflected signal, and the signal used for reception are drawn with dashed lines in the figure. The direct signal path between the transmitter and the receiver can be seen, but multipath paths can also be seen via the controllable reflector RIS or via components or equipment G1-G4, cables K1, K2, or pliers Z or the wall or door T of the switch cabinet SS.

[0082] The system is also designed to implement the following methodological steps: First, the first state of the component space SS and FBG is determined by transmitting a transmission signal, applying a predetermined reflection direction to the reflector RIS, and receiving the corresponding reflected signal. In the first state, only the first component is arranged in the component space SS and FBG.

[0083] Then, a second state of the component space SS, FBG is determined by transmitting a transmission signal, applying a predetermined direction by the reflector RIS, and receiving the reflected signal. In the second state, the first component and the second component are arranged in the component space SS, FBG to reflect the transmission signal and / or the reflected signal.

[0084] Subsequently, the changes in the component arrangement in the component spaces SS and FBG are determined from the differences between the first and second states.

[0085] In other words, radar systems allow for the assessment of the reflectivity of a space illuminated by a transmitting antenna.

[0086] Typically, broadband transmitted signals are struck by reflective objects (e.g., conductive or dielectric) and reflected by these objects.

[0087] It radiates, reflects, and subsequently receives multiple transmitted signals in a time-staggered manner.

[0088] Part of these reflected signals are then reflected back onto the receiving antenna and subsequently evaluated, particularly across the entire spectrum of the received signal, thereby enabling efficient determination of the distance and reflection characteristics of objects reflecting in space.

[0089] Systems with a single antenna or with a transmitting antenna and an additional receiving antenna are low-cost and low-complexity; however, this may result in insufficient spatial resolution of the object being detected.

[0090] In the case of two antennas, namely a separate transmitter TX and receiver RX, the location cannot be definitively determined, and changes in the range illuminated by the transmitter TX can only be roughly identified, making the data basis for such measurements small, and therefore the identification may be unreliable.

[0091] However, systems with multiple transmitters and receivers (not shown in the figure), such as those with highly integrated microchips or corresponding antennas, can also be used to achieve high detection accuracy.

[0092] It is possible to purposefully alter the reflection characteristics of the observed spatial region through a variable reflector RIS, thereby changing the transmission between the transmitter TX and the receiver RX.

[0093] For example, the transmitter TX can be pointed at the reflector RIS in order to control the distribution of transmission power in space, and the space can be decomposed into angular regions that can be sequentially illuminated and accurately analyzed by performing statistical evaluation on the data in terms of changes.

[0094] The controllable reflector RIS should have the most significant effect on the radiation field, and therefore should be located at a location where changes in reflection have a high degree of influence on the radiation field in space.

[0095] Here, the orientation of the antennas of the transmitter TX and receiver RX toward one or more controllable reflectors RIS is an obvious option, where it is not necessarily meaningful for some applications but may also be to avoid directly illuminating the controllable reflectors RIS.

[0096] For example, when evaluating a printed circuit board assembly, the RIS can be mounted next to the corresponding antenna in a housing cover preferably made of conductive material, so that not only the antenna but also the controllable reflector RIS faces the printed circuit board assembly.

[0097] Importantly, the characteristics of the space to be observed have a strong effect on the transmission between transmitted and received signals, and the controllable reflector RIS can influence this transmission as strongly as possible.

[0098] Advantageously, the radiation field in the volume to be observed during the measurement is uncorrelated with external influences.

[0099] Therefore, it is advantageous for the switchgear to have a complete metal enclosure to form a good barrier against external influences, which is often given due to the electromagnetic compatibility requirements for the switchgear, where high-frequency seals may optionally be used additionally in the door area.

[0100] In the case of electronic components, shielding is often less important because the space to be observed is relatively small and reflections outside the area are subject to high attenuation compared to the internal area.

[0101] List of reference numerals in the attached diagram: B. Bottom of switch cabinet BT1-BT1 component D1 and D2 bond wires, intact D3a and D3b bond lines, broken FBG printed circuit board assembly G1-G4 equipment HS1-HS3 mounting rails, DIN rails K1, K2 cables KK1-KK3 Cable Tray RIS Controllable Reflector RX receiver SS switch cabinet TX transmitter Z. Pliers.

Claims

1. A method for identifying changes in the arrangement of elements in an enclosed space (SS, FBG), the enclosed space internally including at least one transmitter (TX) for transmitting a transmitted signal, at least one controllable reflector (RIS) for reflecting the signal in at least one configurable reflection direction, at least one receiver (RX) for receiving the reflected signal, and at least one first element for reflecting the transmitted signal and / or the reflected signal during a first state determination, and at least one second element for reflecting the transmitted signal and / or the reflected signal during a second state determination, wherein... Implement the following steps: - A first state of the enclosed space (SS, FBG) is determined by emitting a transmission signal, applying at least one predetermined reflection direction by the reflector (RIS), reflecting the transmission signal and / or the reflected signal, and receiving the reflected signal, wherein in the first state, only the at least one first element is arranged in the enclosed space (SS, FBG). as well as - A second state of the enclosed space (SS, FBG) is determined by emitting the emission signal, applying the at least one predetermined reflection direction by the reflector (RIS), reflecting the emission signal and / or the reflected signal, and receiving the reflected signal, wherein in the second state, the at least one first element and the at least one second element are arranged in the enclosed space (SS, FBG); as well as - Determine the changes in the arrangement of the elements in the enclosed space (SS, FBG) from the differences between the first state and the second state.

2. The method according to the preceding claim, wherein the change in the arrangement of the elements is a structural change in the enclosed space.

3. The method according to any one of the preceding claims, wherein the enclosed space is an enclosed component space, preferably a switch cabinet.

4. The method according to any one of the preceding claims, wherein at least one configurable direction of the reflector (RIS) has at least three, preferably five, particularly preferably ten directions, the directions being configured sequentially in time by the reflector (RIS) during the determination of the state of the enclosed space (SS, FBG).

5. A system for identifying changes in the arrangement of components in an enclosed space (SS, FBG), comprising: - At least one transmitter (TX) is arranged within the enclosed space (SS, FBG) and is configured to transmit a signal; as well as - At least one controllable reflector (RIS), said controllable reflector being arranged within the enclosed space (SS, FBG) and configured to reflect signals in at least one configurable direction; as well as - At least one first element, the first element being arranged within the enclosed space (SS, FBG) such that the transmitted signal and / or the reflected signal is reflected at the first element; as well as - At least one receiver (RX) is arranged within the enclosed space (SS, FBG) and is configured to receive signals; Furthermore, the system is also configured to, - A first state of the enclosed space (SS, FBG) is determined by emitting the emission signal, applying at least one predetermined reflection direction by the reflector (RIS), and receiving the reflected signal, in which only the at least one first element is arranged in the enclosed space (SS, FBG). as well as - A second state of the enclosed space (SS, FBG) is determined by emitting the emitted signal, applying the at least one predetermined direction by the reflector (RIS), and receiving the reflected signal, in which the at least one first element and the at least one second element are arranged in the enclosed space (SS, FBG) to reflect the emitted signal and / or the reflected signal; as well as - Determine the changes in the arrangement of the elements in the enclosed space (SS, FBG) from the differences between the first state and the second state.

6. The system according to the preceding claim, wherein the at least one second element is formed by separate portions of the at least one first element.

7. The system according to claim 5 or 6, wherein the at least one second element comprises a mechanical tool, an electrical tool, or an electronic tool (Z).

8. The system according to any one of claims 5 to 7, wherein the enclosed space is a component space (SS, FBG), preferably a switch cabinet, and the at least one first element comprises a component, preferably electronic equipment (G1-G4), and / or electrical cables (K1, K2, D1, D2).

9. The system according to the preceding claim, wherein the component space (SS, FBG) is an electronic component, and the at least one first component comprises electronic semiconductor components (BT1-BT3).

10. The system according to any one of the preceding claims, wherein the at least one configurable direction has at least three, preferably five, particularly preferably ten directions, the directions being configurable sequentially in time by the reflector (RIS) during the determination of the state of the enclosed space (SS, FBG).

11. The system according to any one of the preceding claims, wherein the enclosed space (SS, FBG) is at least partially formed of a conductive material, preferably formed of a conductive material in more than 50%, particularly preferably more than 75%, of the built-in surface of the enclosed space (SS, FBG).

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