Test sorting apparatus

Abstract

The application relates to a test sorting device, which comprises a micro-vibration tray device, a vibration tray with a material port on the top, the vibration tray is used for adjusting the posture of an electronic component to be tested in the vibration tray by self vibration, an upper visual device, a mechanical arm and a control device, the upper visual device and the mechanical arm are electrically connected with the control device, the control device is used for controlling the mechanical arm to pick up the electronic component to be tested in the target posture in the material port according to first shooting information, a material shuttle and a test device arranged at a test station, the material shuttle can be moved between the test station and a first station to transfer the electronic component to be tested, a lower visual device electrically connected with the control device is arranged on the moving path of the mechanical arm moved to the first station through the micro-vibration tray device, the control device is used for controlling the mechanical arm to drive the electronic component to be tested to rotate to change the angle of the electronic component to be tested according to second shooting information, and the control device is used for controlling the mechanical arm to move to the first station through the lower visual device to place the electronic component to be tested in the material shuttle.

Description

Technical Field

[0001] This invention relates to a testing and sorting device. Background Technology

[0002] Electronic components (such as chips) require performance testing after packaging to ensure they meet usage requirements upon leaving the factory. Typically, performance testing of electronic components is performed on testing and sorting equipment.

[0003] Generally, testing and sorting equipment needs to be configured with different feeding carriers to meet the testing needs of electronic components of different specifications or sizes. This not only leads to higher equipment costs and frequent changes of feeding carriers when testing electronic components of different specifications or sizes, but also results in lower testing efficiency. Summary of the Invention

[0004] Therefore, it is necessary to provide a testing and sorting device that can improve upon the aforementioned problems.

[0005] A testing and sorting device, comprising:

[0006] A micro-vibrating disk device includes a vibrating disk with a feed inlet at the top; the vibrating disk is used to adjust the orientation of the electronic component under test located therein by means of its own vibration;

[0007] An upper vision device is used to capture images of the electronic component under test inside the feed inlet from above, forming first image information;

[0008] The robotic arm and control device are both electrically connected to the upper vision device and the robotic arm; the control device is used to control the robotic arm to pick up the electronic component to be tested in the feed port in the target posture according to the first image information.

[0009] A shuttle and a testing device located at a testing station, the shuttle being able to move between the testing station and a first station to transport electronic components;

[0010] The lower vision device, which is electrically connected to the control device, is located on the movement path of the robot arm as it moves to the first workstation via the micro-vibrating disk device. It is used to capture images of the electronic components to be tested picked up by the robot arm when it moves over it, forming second image information.

[0011] The control device is used to control the robot arm to rotate the electronic component under test according to the second image information to change the angle of the electronic component under test, and to control the robot arm to move to the first station via the lower vision device to place the electronic component under test in the shuttle.

[0012] The aforementioned testing and sorting equipment uses a combination of a micro-vibrating plate device, an upper vision device, and a lower vision device to achieve precise feeding of electronic components under test. Since electronic components of different specifications or sizes can be placed in the vibrating plate, the feeding requirements of different electronic components can be met. Different feeding carriers are no longer required for different electronic components, which not only reduces equipment costs but also eliminates the need to frequently change carriers when testing different electronic components, thus improving testing efficiency.

[0013] In one embodiment, the test sorting equipment further includes a feeding device located upstream of the micro-vibrating disk device;

[0014] The feeding device includes a hopper, which is used to transport the electronic component to be tested through the feed port to the vibrating plate by means of its own vibration.

[0015] The feeding device can shake the material from the hopper into the vibratory plate located downstream, reducing impact and collision and protecting the electronic components and the vibratory plate. Furthermore, the feeding device can maintain a moderate and stable material layer within the vibratory plate, ensuring continuous and uniform sorting cycles.

[0016] In one embodiment, the upper vision device is connected to the robotic arm and can move synchronously;

[0017] The upper vision device can move with the robot arm to the first work station to capture the orientation of the electronic component under test in the shuttle to form third image information; the control device is used to control the robot arm to pick up the electronic component under test in the shuttle according to the third image information, drive it to rotate and adjust the angle until the electronic component under test reaches the preset orientation in the shuttle.

[0018] The above setup ensures that the electronic components under test are oriented in the same direction when transported to the testing device, thus guaranteeing smooth transport and testing of the components. Furthermore, the synchronized movement of the upper vision device and the robotic arm facilitates control of their movements, simplifying the control logic.

[0019] In one embodiment, the testing and sorting equipment further includes a testing chamber, the testing chamber having a sealed cavity, and the testing device and the shuttle both being disposed in the sealed cavity;

[0020] The test chamber is equipped with a controllable door at the first work station, and the shuttle can receive electronic components placed by the robot arm when the door is open.

[0021] Typically, testing devices need to control the electronic components under test at a preset temperature for testing. Since both the testing device and the feed shuttle are located in a sealed cavity, the door is only opened when feeding material into the feed shuttle. This reduces the influence of the external environment on the temperature in the sealed cavity, ensuring the temperature control effect of the testing device on the electronic components under test, and thus ensuring the testing effect.

[0022] In one embodiment, the test sorting equipment further includes a receiving device, and the control device is also used to control the robot to move between the first station and the receiving device, so that the robot picks up the tested electronic components in the shuttle and transfers them to the receiving device.

[0023] The above setup allows the robotic arms to be loaded or unloaded by the control device throughout the entire process, eliminating the need for manual handling of the tested electronic components, reducing labor costs, and avoiding damage or contamination to the electronic components caused by human contact.

[0024] In one embodiment, the upper vision device is connected to and can move synchronously with the robotic arm, the robotic arm including a first robotic arm and a second robotic arm spaced apart along a first horizontal direction;

[0025] The upper vision device includes a first imaging mechanism, a ring light source, and two strip light sources. The first imaging mechanism is located between the first robotic arm and the second robotic arm in the first horizontal direction. The ring light source is located below the first imaging mechanism in the vertical direction. The two strip light sources are located on both sides of the first imaging mechanism in the second horizontal direction. The first horizontal direction and the second horizontal direction intersect.

[0026] Both the first robotic arm and the second robotic arm include a driving component, a rotating component, and a picking component. The rotating component is connected to the driving component, and the picking component is connected to the rotating component. The driving component is used to drive the picking component to move along the vertical direction, and the rotating component is used to drive the picking component to rotate around an axis extending along the vertical direction.

[0027] By coordinating the first and second robotic arms, the material shuttle's reception towards the testing device and the material receiving robotic arm's transfer to the receiving device can be performed synchronously, improving testing efficiency. Furthermore, the upper vision device provides illumination to the first imaging mechanism through a ring light source and two strip light sources, enhancing the upper vision device's imaging effect. Simultaneously, the drive assembly can adjust the vertical position of the pickup assembly to facilitate the robotic arm's handling of electronic components, and the rotation assembly can rotate the pickup assembly to change the angle of the picked-up electronic components, thereby improving the accuracy of material handling.

[0028] In one embodiment, the receiving device includes a receiving mechanism and a material box carrying mechanism.

[0029] The feeding and receiving mechanism has at least one tray carrying part, each tray carrying part is used to carry one tray, and the tray is at least one of a feeding tray, a receiving tray, and a transfer tray; the box carrying mechanism has at least one box carrying part, each box carrying part is used to carry one box;

[0030] The control device is also used to control the movement of the robot arm between the first station and the receiving device to transfer electronic components between the receiving device and the shuttle.

[0031] The above settings can assign different functions to the feeding and receiving mechanisms as needed to meet testing requirements. Furthermore, since the receiving device includes both a feeding and receiving mechanism and a material box carrying mechanism, it is also possible to select between tray-based and box-based material receiving to meet different receiving needs.

[0032] In one embodiment, the feeding and receiving mechanism includes a tray support platform, and the tray support portion is disposed on the tray support platform;

[0033] A portion of the material box carrying mechanism is located directly below the material tray carrying platform in the vertical direction, and the remaining portion extends outward to form a protruding section. The protruding section is offset from the material tray carrying platform in the vertical direction, and an insertion area is formed above the protruding section for inserting electronic components into the material box carried on the material box carrying part.

[0034] The tray support platform and the box support mechanism are arranged in an upper and lower stacked manner. Compared with the side-by-side arrangement of the tray support platform and the box support mechanism, part of the box support mechanism is housed under the tray support platform. This not only reduces the floor space and improves space utilization, but also allows the material to be picked up and put down from the tray when it is being supplied and from the box when it is being received. The robot can operate within a shorter stroke, which improves the response speed of picking up and putting down materials, thereby improving the testing efficiency.

[0035] In one embodiment, the tray support platform is provided with a plurality of tray support portions along a first horizontal direction, and one end of the material box support mechanism along a second horizontal direction is located directly below the tray support platform, and the other end extends out of the tray support platform along the second horizontal direction to form the protruding section;

[0036] The micro-vibrating disk device is arranged side by side with the material tray support platform along the first horizontal direction; the testing device is located at the end of the material tray support platform away from the delivery area along the second horizontal direction, and the first workstation is located between the testing device and the material tray support platform along the second horizontal direction; the lower vision device is arranged side by side with the micro-vibrating disk device along the second horizontal direction and is located at the end of it closer to the testing device; the control device is used to control the robot arm to move along the first horizontal direction and the second horizontal direction to pick up and place electronic components.

[0037] In this way, the material receiving mechanism, the material box carrying mechanism, the micro-vibrating plate device, the lower vision device, the material shuttle and the testing device are arranged in a compact manner on the mounting base, which can reduce the footprint of the testing and sorting equipment.

[0038] In one embodiment, the material box carrier has a material box carrier cavity, and the top of the material box carrier is provided with a feeding port, which is opposite to the feeding area and communicates with the material box carrier cavity;

[0039] The receiving device also includes a material box opening and closing mechanism, which includes a cover plate and a driving component. The cover plate is disposed between the material box carrying mechanism and the material tray carrying platform along the vertical direction. The driving component is used to drive the cover plate to move relative to the material box carrying mechanism to open and close the feeding port.

[0040] When a chip needs to be added to the hopper, the cover will open the corresponding feeding port to facilitate chip insertion; when no chip needs to be added, the cover will close the corresponding feeding port to prevent accidental chip insertion.

[0041] In one embodiment, the test sorting device further includes a mounting base and a drive device. The drive device includes a first drive mechanism and a second drive mechanism connected to each other. The second drive mechanism is mounted on the mounting base and extends along a second horizontal direction. The first drive mechanism extends along a first horizontal direction and is connected at one end to the second drive mechanism. The other end is provided with a roller, which is rotatably supported on the mounting base.

[0042] The robotic arm is connected to the first driving mechanism, which drives the robotic arm to move along the first horizontal direction, and the second driving mechanism drives the robotic arm to move along the second horizontal direction; the first horizontal direction and the second horizontal direction intersect.

[0043] With the above configuration, the first and second drive mechanisms work together to move the robot arm along the first and second horizontal directions, facilitating the robot arm's material handling operations. Furthermore, the first drive mechanism is supported on the mounting base by rollers, which convert sliding friction into rolling friction, significantly reducing movement resistance, making the first drive mechanism more effortless, and improving motion response speed. Attached Figure Description

[0044] Figure 1 A top view of a test sorting device provided in an embodiment of this application;

[0045] Figure 2 An isometric view of a test and sorting device provided in another embodiment of this application;

[0046] Figure 3 for Figure 2 The diagram shows the structure of the micro-vibrating disk device and the feeding device.

[0047] Figure 4 for Figure 2 The diagram shown is a structural representation of the test and sorting equipment with the test chamber concealed.

[0048] Figure 5 for Figure 2 Enlarged view of point E of the test sorting equipment shown;

[0049] Figure 6 for Figure 2 Another structural view of the test sorting equipment shown;

[0050] Figure 7 for Figure 2 The diagram shows the structure of the receiving device of the test sorting equipment mounted on the mounting base.

[0051] Figure 8 for Figure 7 The diagram shows the structure of the hopper carrying mechanism and the hopper opening and closing mechanism (the hopper carrying mechanism in this diagram carries the hopper).

[0052] Figure 9 for Figure 7 Side view of the structure shown;

[0053] Figure 10 for Figure 7 Structural diagram of the middle section;

[0054] Figure 11 for Figure 8 The diagram shows a structural view of the hopper carrying mechanism and the hopper opening and closing mechanism from another perspective (the hopper carrying mechanism in this diagram does not carry a hopper).

[0055] Figure 12 for Figure 11 Structural diagram of the middle section;

[0056] Figure 13 for Figure 8 Exploded view of the structure shown;

[0057] Figure 14 A side view of the material box carrying mechanism of a test sorting device provided in another embodiment of this application;

[0058] Figure 15 for Figure 8 The diagram shows the arrangement of the material boxes carried by the material box carrying mechanism.

[0059] Explanation of reference numerals in the attached figures:

[0060] 1000. Testing and sorting equipment; 100. Receiving device; 20. Receiving mechanism; 21. Tray support platform; 211. Tray support section; 22. Tray positioning assembly; 221. Positioning component; 222. Elastic clamping component; 23. Tray anti-foolproof part; 24. Tray presence / absence detection unit; 25. Tray posture detection unit; 30. Box support mechanism; 31. Box support component; 311. Box support section; 3111. Box support cavity; 31 12. Material box pull-out opening; 3113. Feeding port; 3114. Clearance groove; 312. Base plate; 313. Top plate; 314. Side plate; 315. Sealing plate; 32. Material box positioning assembly; 33. Material box foolproof part; 34. Material box presence / absence detection unit; 35. Material box full detection unit; 36. Stop bar; 40. Support component; 41. Support foot; 50. Accommodation gap; 60. Material box opening / closing mechanism; 61. Cover plate; 611. Communicating port; 62. 63. Drive component; 631. Guide component; 200. Guide chute; 201. Micro vibratory disk device; 202. Vibratory disk; 203. Feed port; 204. Vibratory disk driver; 305. Upper vision device; 306. First imaging mechanism; 307. Ring light source; 308. Strip light source; 409. Robotic arm; 400a. First robotic arm; 400b. Second robotic arm; 401. Drive assembly; 402. Rotation assembly; 403. Pickup assembly; 5 00. Shuttle; 600. Testing device; 700. Lower vision device; 800. Mounting base; 900. Feeding device; 901. Hopper; 902. Hopper driver; 110. Testing chamber; 1101. Door; 120. Drive device; 1201. First drive mechanism; 1202. Second drive mechanism; 130. Roller; A. Feeding area; B. First station; C. Testing station; 2000. Material box; 3000. Material tray. Detailed Implementation

[0061] To make the above-mentioned objects, features, and advantages of the present invention more apparent and understandable, specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of the present invention. However, the present invention can be practiced in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0062] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0063] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0064] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0065] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0066] It should be noted that when an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.

[0067] See Figure 1 and Figure 2 One embodiment of this application provides a testing and sorting device 1000, including a micro-vibrating disk device 200, an upper vision device 300, a robotic arm 400, and a control device (not shown in the figure). Both the robotic arm 400 and the upper vision device 300 are electrically connected to the control device, which can control the upper vision device 300 and the robotic arm 400 to work together. Typically, the micro-vibrating disk device 200 is also electrically connected to the control device, and the control device can also control the operation of the micro-vibrating disk device 200.

[0068] See Figure 3 The micro-vibrating disk device 200 includes a vibrating disk 201 with a feed port 2011 at its top. Electronic components under test (DUTs) can be fed into the vibrating disk 201 from the top feed port 2011 and can also be removed from the vibrating disk 201 from the top feed port 2011. The vibrating disk 201 is used to adjust the posture of the DUTs located within it by its own vibration. Specifically, when the DUTs are fed into the vibrating disk 201, the vibration of the vibrating disk 201 can cause the DUTs to "gently jump, slide, and rotate" on the disk surface, causing the DUTs to disperse from a stack into a single layer, thereby adjusting the posture of the DUTs within the vibrating disk 201. It should be noted that since the vibrating disk 201 adjusts the posture of the DUTs by vibrating the DUTs within it, the position of the DUTs within the vibrating disk 201 also changes simultaneously with the posture adjustment.

[0069] Optionally, the electronic component under test is a chip. It is conceivable that in some other embodiments, the type of electronic component under test is not limited; for example, the electronic component under test could also be a diode, etc.

[0070] Typically, in order to achieve the vibration of the vibrating plate 201, the micro vibrating plate device 200 is equipped with a vibrating plate driver 202. The vibrating plate 201 and the vibrating plate driver 202 are connected. The vibrating plate driver 202 drives the vibrating plate 201 to vibrate, so that the vibrating plate 201 can perform mixed movements of up and down, left and right, rotation and slight flipping, in order to adjust the posture of the electronic component under test in the vibrating plate 201.

[0071] The upper vision device 300 is used to capture first image information of the electronic component under test (DUT) inside the feed inlet 2011 from above. It should be noted that when the upper vision device 300 captures the DUT in the vibrating plate 201, the vibrating plate 201 stops vibrating to allow the upper vision device 300 to clearly capture the DUT. The first image information typically includes the coordinates and angle of the DUT within the vibrating plate 201, the size of the DUT, and the orientation of the front and back sides of the DUT.

[0072] The control device is used to control the robot arm 400 to pick up the electronic component under test (DUT) in the feed inlet 2011 in the target posture based on the first captured information. Since the upper vision device 300 is electrically connected to the control device, the upper vision device 300 can transmit the first captured information to the control device. Based on the first captured information, the control device can obtain the position of the DUT in the vibrating plate 201, and then control the robot arm 400 to pick up the DUT in the target posture. In some specific embodiments, when the DUT is face up, it is considered to be in the target posture, and the control device can control the robot arm 400 to pick up the face-up DUT. Of course, in other embodiments, the specific target posture is not limited here and can be selected as needed.

[0073] Further reading Figure 4 The testing and sorting equipment 1000 also includes a shuttle 500 and a testing device 600. The testing and sorting equipment 1000 includes a first station B and a testing station C. The testing device 600 is located at testing station C. The shuttle 500 can move between the first station B and the testing station C to transport electronic components. (See also...) Figure 2 and Figure 4 The testing and sorting equipment 1000 also includes a lower vision device 700, which is electrically connected to the control device and located on the movement path of the robot arm 400 as it moves to the first station B via the micro-vibrating disk device 200. The lower vision device 700 is used to capture images of the electronic component under test picked up by the robot arm 400 when it passes over it, forming second image information. Specifically, after the robot arm 400 picks up the electronic component under test from the vibrating disk 201, it passes through the lower vision device 700 during the transfer of the electronic component to the shuttle 500. The lower vision device 700 can capture images of the electronic component picked up by the robot arm 400 and form second image information. The second image information includes the relative position information between the electronic component under test and the robot arm 400, as well as the angle information of the electronic component under test.

[0074] It should be noted that since the electronic component under test is usually set as a block shape (such as a cuboid or rectangular block), the angle information of the electronic component under test in the vibrating plate 201 and its angle information on the robot arm 400 can be understood as: the deflection angle of the center line of the electronic component under test with a certain horizontal direction.

[0075] The control device is also used to control the robot arm 400 to rotate the electronic component under test according to the second image information, thereby changing the angle of the electronic component under test, and to control the robot arm 400 to move to the first station B via the lower vision device 700 to place the electronic component under test in the shuttle 500. Since the lower vision device 700 is electrically connected to the control device, the lower vision device 700 can transmit the second image information to the control device. The control device can obtain the position and angle of the electronic component under test on the robot arm 400 according to the second image information, and can then control the rotation and movement of the robot arm 400 according to the second image information to accurately place the electronic component under test in the shuttle 500.

[0076] It should be noted that when the electronic component under test is at the target angle on the robot arm 400, the robot arm 400 does not need to rotate the electronic component under test. At this time, the robot arm 400 only needs to move the electronic component under test to the first station B and place it in the shuttle 500.

[0077] Specifically, the shuttle 500 and the testing device 600 are also electrically connected to the control device. When the electronic component to be tested is placed in the shuttle 500, the control device can control the shuttle 500 to move from the first station B to the testing station C, so as to transfer the electronic component to be tested onto the testing device 600 for testing.

[0078] The testing and sorting equipment 1000 provided in this application embodiment, during testing, uses a micro-vibrating disk device 200 to vibrate and adjust the posture of the electronic component under test within it. An upper vision device 300 captures images of the electronic component under test in the vibrating disk 201 to form first image information. A control device controls a robot arm 400 to pick up the electronic component under test in the target posture based on the first image information from the upper vision device 300. When the robot arm 400 moves above the lower vision device 700, the lower vision device 700 captures images of the electronic component under test picked up by the robot arm 400 to form second image information. The control device controls the robot arm 400 to rotate and move the electronic component based on the second image information from the lower vision device 700 to accurately place the electronic component under test into the feed shuttle 500, thereby achieving precise feeding of the electronic component under test. As can be seen, in this application, the precise feeding of the electronic components under test is achieved through the cooperation of the micro vibrating plate device 200, the upper vision device 300 and the lower vision device 700. Since the vibrating plate 201 can hold electronic components of different specifications or sizes, it can meet the feeding requirements of different electronic components. Different feeding carriers are no longer required for different electronic components, which not only reduces equipment costs but also eliminates the need to frequently change carriers when testing different electronic components, thus improving testing efficiency.

[0079] It should be noted that after the robotic arm 400 has finished picking up the electronic component under test in the target posture, or after picking up part of the electronic component under test in the target posture, the vibrating plate 201 begins its next vibration. After the vibrating plate 201 stops vibrating, the upper vision device 300 takes another picture of the electronic component under test in the vibrating plate 201 and forms the first image information. The control device then controls the robotic arm 400 to pick up the electronic component under test in the target posture again based on the first image information.

[0080] In some embodiments, see Figure 2 The testing and sorting equipment 1000 also includes a mounting base 800. The micro-vibrating disc device 200, upper vision device 300, robotic arm 400, control device, shuttle 500, testing device 600, and lower vision device 700 are all mounted on the mounting base 800, thus improving the integration of the testing and sorting equipment 1000. It should be understood that in some other embodiments, the mounting base 800 may be omitted from the testing and sorting equipment 1000, and this is not a limitation here.

[0081] Continue reading Figure 2 The testing and sorting equipment 1000 also includes a feeding device 900 mounted on a mounting base 800, located upstream of the micro-vibrating disk device 200. (See also...) Figure 3The feeding device 900 includes a hopper 901, which uses its own vibration to convey the electronic components to be tested through the feed inlet 2011 to the vibrating plate 201. If materials are poured directly into the vibrating plate 201 manually, material slamming and accumulation are likely to occur. The feeding device 900 can vibrate the material through the hopper 901 into the downstream vibrating plate 201, reducing impact and collision, and protecting the electronic components and the vibrating plate 201. Furthermore, the feeding device 900 can always maintain a moderate and stable material layer in the vibrating plate 201, ensuring continuous and uniform sorting cycle.

[0082] Typically, the feeding device 900 also includes a hopper driver 902. The hopper 901 and the hopper driver 902 are connected. The hopper driver 902 drives the hopper 901 to perform efficient, low-amplitude composite vibrations (up and down, horizontal, torsional, etc.), and the electronic components to be tested are slowly and evenly delivered to the vibrating plate 201 by "shaking + gravity".

[0083] In some embodiments, see Figure 2 and Figure 5 The upper vision device 300 and the robotic arm 400 are interconnected and can move synchronously. The upper vision device 300 can move with the robotic arm 400 to the first workstation B to capture the orientation of the electronic component under test in the feed shuttle 500, forming third image information. The control device is used to control the robotic arm 400 to pick up the electronic component under test in the feed shuttle 500 and rotate it to adjust its angle until the electronic component under test reaches the preset orientation in the feed shuttle 500. When the electronic component under test is in the preset orientation in the feed shuttle 500, the feed shuttle 500 can transport the electronic component under test to the testing device 600. This setting can ensure that the orientation of the electronic components under test transported to the testing device 600 is the same, so as to ensure the smooth transport and testing of the electronic components under test. Furthermore, since the upper vision device 300 and the robotic arm 400 can move synchronously, it is convenient to control the movement of the upper vision device 300 and the robotic arm 400, simplifying the control logic.

[0084] In some specific embodiments, the electronic component under test is a chip. When the pin1 mark of the chip is in a preset orientation, it proves that the chip is in the correct position in the feed shuttle 500, and the chip can be transported to the testing device 600. When the third image information captured by the upper vision device 300 determines that the pin1 of the chip is not in the preset orientation, the control device controls the robot arm 400 to pick up the chip and rotate it until the pin1 is in the preset orientation, at which point the feeding process ends.

[0085] In some embodiments, see Figure 2 and Figure 6The testing and sorting equipment 1000 also includes a testing chamber 110 mounted on a mounting base 800. The testing chamber 110 contains a sealed cavity, within which the testing device 600 and the shuttle 500 are both located. At the first station B, the testing chamber 110 has a controllable opening and closing door 1101. The shuttle 500 can receive electronic components placed by the robotic arm 400 when the door 1101 is open. Typically, the testing device 600 needs to control the electronic components under test at a preset temperature. Since both the testing device 600 and the shuttle 500 are located within the sealed cavity, and the door 1101 is only opened when feeding material into the shuttle 500, the influence of the external environment on the temperature within the sealed cavity can be reduced, ensuring the temperature control effect of the testing device 600 on the electronic components under test, thereby guaranteeing the testing results.

[0086] In some embodiments, see Figure 2 , Figure 4 and Figure 5 The testing and sorting equipment 1000 also includes a drive unit 120, which includes a first drive mechanism 1201 and a second drive mechanism 1202 connected to each other. The second drive mechanism 1202 is mounted on the mounting base 800 and is along the second horizontal direction. Figure 2 The first drive mechanism 1201 extends along the first horizontal direction (as shown in the Y direction in the other figures). Figure 2 The first drive mechanism 1201 (extending in the X direction as shown in other figures) is connected at one end to the second drive mechanism 1202. The other end of the first drive mechanism 1201 along the first horizontal direction is provided with a roller 130, which is rolled and supported on the mounting base 800. The robot arm 400 is connected to the first drive mechanism 1201, which drives the robot arm 400 to move along the first horizontal direction. The second drive mechanism 1202 drives the robot arm 400 to move along the second horizontal direction. The first and second horizontal directions intersect. Specifically, the first and second horizontal directions are perpendicular.

[0087] With the above configuration, the first drive mechanism 1201 and the second drive mechanism 1202 work together to drive the robot arm 400 to move along the first horizontal direction and the second horizontal direction, facilitating the robot arm 400's material handling operations. Furthermore, the first drive mechanism 1201 is supported on the mounting base 800 by rollers 130. The rollers 130 convert sliding friction into rolling friction, significantly reducing movement resistance, making the second drive mechanism 1202 operate with less effort and improving motion response speed.

[0088] The first drive mechanism 1201 and the second drive mechanism 1202 can be powered by a motor or cylinder, etc., and are not limited here.

[0089] In some embodiments, see Figure 2The testing and sorting equipment 1000 also includes a receiving device 100 mounted on the mounting base 800. The control device is also used to control the movement of the robot arm 400 between the first station B and the receiving device 100, so that the robot arm 400 picks up the tested electronic components in the shuttle 500 and transfers them to the receiving device 100. With this setup, the robot arm 400 is uniformly scheduled to load or unload materials throughout the entire process by the control device, eliminating the need for manual handling of the tested electronic components, reducing labor costs, and avoiding damage or contamination of the electronic components caused by human contact.

[0090] It should be noted that when the robotic arm 400 needs to pick up the measured electronic components in the shuttle 500, the door 1101 also needs to be in the open state. After the measured electronic components in the shuttle 500 are removed, the door 1101 is closed.

[0091] Further reading Figure 7 and Figure 8 The receiving device 100 includes a feeding / receiving mechanism 20 and a hopper carrying mechanism 30. The feeding / receiving mechanism 20 has at least one tray carrying portion 211, each tray carrying portion 211 for carrying one tray 3000, the tray being at least one of a feeding tray, a receiving tray, and a transfer tray. The hopper carrying mechanism 30 has at least one hopper carrying portion 311, each hopper carrying portion 311 for carrying one hopper 2000. A control device is also used to control the movement of the robot arm 400 between the first station B and the receiving device 100 to transfer transfer electronic components between the receiving device 100 and the shuttle 500.

[0092] Typically, a tray has a recess for holding electronic components, and a box has a cavity for holding electronic components.

[0093] Since the feeding and receiving mechanism 20 is used to carry the material tray, and the material tray can be at least one of a feeding tray, a receiving tray, and a transfer tray, when the material tray is a feeding tray, the feeding and receiving mechanism 20 acts as a feeding mechanism to feed material to the shuttle 500; when the material tray is a receiving tray, the feeding and receiving mechanism 20 acts as a receiving mechanism; and when the material tray is a transfer tray, the feeding and receiving mechanism 20 acts as a transfer mechanism. Thus, different functions can be assigned to the feeding and receiving mechanism 20 as needed to meet testing requirements. Furthermore, since the receiving device 100 includes the feeding and receiving mechanism 20 and the material box carrying mechanism 30, it is also possible to select whether to receive material from the tray or from the material box as needed to meet different receiving requirements.

[0094] The feeding and receiving mechanism 20 includes a tray support platform 21, and a tray support part 211 is disposed on the tray support platform 21. A portion of the material box support mechanism 30 is in the vertical direction ( Figure 9In the other accompanying drawings, the portion located directly below the tray support platform 21 (in the Z direction) extends outward to form a protruding section. This protruding section is vertically offset from the tray support platform 21, and a placement area A is formed above the protruding section for placing electronic components into the cassette supported on the cassette carrier 311. In other words, the area above the protruding section is not obstructed by the tray support platform 21, allowing electronic components to be placed into the cassette.

[0095] See Figure 9 Typically, the tray support platform 21 is suspended on the mounting base 800 via the support member 40, forming a receiving gap 50 between the tray support platform 21 and the mounting base 800 in the vertical direction. Part of the cassette carrying mechanism 30 is housed within the receiving gap 50, while the remaining part extends outward from the receiving gap 50 to form an extension section. Above the extension section is a delivery area A for delivering electronic components into the cassette on the cassette carrying part 311.

[0096] In the above configuration, part of the material box carrying mechanism 30 is positioned directly below the material tray carrying platform 21 in the vertical direction, while the remaining part extends outward to form an extension section. That is, the material tray carrying platform 21 and the material box carrying mechanism 30 are arranged in a stacked manner. Compared with the side-by-side arrangement of the material tray carrying platform 21 and the material box carrying mechanism 30, part of the material box carrying mechanism 30 is housed below the material tray carrying platform 21. This not only reduces the floor space and improves space utilization, but also allows the material to be picked up and put away from the material tray when it is being supplied and the material box to be picked up. The robot arm 400 can operate within a shorter stroke, improving the response speed of picking up and putting away materials, thereby improving testing efficiency.

[0097] Optionally, see Figure 7 and Figure 10 The support member 40 includes multiple support legs 41, which are spaced apart. The tray support platform 21 is supported on the multiple support legs 41. In this way, under the joint support of the multiple support legs 41, the tray support platform 21 is firmly fixed on the mounting base 800, ensuring the support and fixation effect of the tray support platform 21.

[0098] It is understood that in other embodiments, the arrangement of the support member 40 is not limited, as long as it allows the tray support platform 21 to be suspended on the mounting base 800.

[0099] In some embodiments, see Figure 7 and Figure 8The material box carrying mechanism 30 extends outward at one end in the second horizontal direction to accommodate the gap 50. The material tray carrying platform 21 is provided with multiple material tray carrying parts 211 along the first horizontal direction, and the material box carrying mechanism 30 is provided with multiple material box carrying parts 311 along the first horizontal direction. With this configuration, the material tray carrying platform 21 can carry multiple material trays along the first horizontal direction, and the material box carrying part 31 can carry multiple material boxes along the first horizontal direction. The robot arm 400 only needs to move back and forth in a straight line along the first horizontal direction to complete the picking and placing of materials, which simplifies the movement trajectory of the robot arm 400 and reduces the programming difficulty of the control system.

[0100] It should be noted that when the tray support platform 21 carries multiple trays 3000, all trays can be used as feed trays, receiving trays, or transfer trays. Alternatively, some trays can be used as feed trays and others as receiving trays, or some as feed trays, others as receiving trays, and still others as transfer trays, etc., without limitation. When the box support mechanism 30 carries multiple boxes 2000, different boxes are used to place electronic components with different test results. For example, electronic components that pass the test are received into one box, and electronic components that fail the test are received into different boxes according to the reason for failure.

[0101] It is understood that in some other embodiments, the arrangement of the tray support portion 211 on the tray support platform 21 is not limited. For example, the tray support portion 211 can also be arranged in an array in the second horizontal direction and the first horizontal direction. Furthermore, the arrangement of the box support portion 311 of the box support mechanism 30 is not limited. For example, the box support mechanism 30 can be configured such that both ends of the box support mechanism 30 in the second horizontal direction extend outward to accommodate gaps 50, and multiple box support portions 311 arranged sequentially along the first horizontal direction are provided at both ends of the box support mechanism 30 in the second horizontal direction.

[0102] In some embodiments, the tray support platform 21 has a flat plate structure, which not only facilitates the processing and manufacturing of the tray support platform 21, but also allows the tray to be placed horizontally on the tray support part 211. It should be understood that in other embodiments, the tray support platform 21 can also be set in other ways, as long as it can achieve the purpose of supporting the tray, and is not limited here.

[0103] See Figure 10 The feeding and receiving mechanism 20 also includes a tray positioning component 22. Each tray support portion 211 is provided with a corresponding tray positioning component 22. The tray positioning component 22 is used to position the tray to the corresponding tray support portion 211. The tray positioning component 22 can position the tray to the corresponding tray support portion 211, preventing the tray from shaking during the feeding or discharging process and ensuring positioning accuracy.

[0104] Optionally, the tray positioning assembly 22 includes a plurality of positioning members 221 and a plurality of elastic clamping members 222. The positioning members 221 are spaced apart from each other on the tray support platform 21 to abut against two adjacent sides of the tray. The elastic clamping members 222 are spaced apart from each other on the tray support platform 21 to clamp the other two adjacent sides of the tray. Typically, the tray is a cuboid disc structure with two first sides arranged opposite each other in the length direction and two second sides arranged opposite each other in the width direction. When the tray is placed on the tray support portion 211, some of the positioning members 221 abut against one of the first sides of the tray, and the remaining positioning members 221 abut against one of the second sides of the tray. Some of the elastic clamping members 222 clamp the other first side of the tray, and the remaining elastic clamping members 222 clamp the other second side of the tray, thereby positioning the tray on the corresponding tray support portion 211.

[0105] The above configuration, with the positioning component 221 and the elastic clamping component 222 working together, not only achieves precise positioning of the material tray, but also allows the elastic clamping component 222 to clamp the material tray on its own elasticity, eliminating the need for additional power components to clamp the material tray. This eliminates the need to consider the wiring issues of power components such as cylinders and motors, resulting in a simple and reliable structure.

[0106] Optionally, the positioning element 221 is a cylindrical structure disposed on the tray support platform 21. Of course, in other embodiments, the positioning element 221 may also be a plate-shaped or block-shaped structure, etc., and is not limited here. Furthermore, in other embodiments, the structure of the tray positioning assembly 22 is not limited, as long as the arrangement can achieve the effect of positioning the tray.

[0107] In some embodiments, see further reference. Figure 10 Each tray support 211 is equipped with a tray error prevention part 23. The tray error prevention part 23 can restrict the tray from being placed backwards or backwards, and prevent the tray from being placed in the wrong direction. If the tray is placed in the wrong direction, it will not be able to be placed accurately in the tray support 211, thereby avoiding errors in picking up materials when the tray is placed in the wrong direction.

[0108] In some embodiments, the feeding and receiving mechanism 20 further includes a tray presence / absence detection unit 24, with each tray support portion 211 corresponding to a tray presence / absence detection unit 24. By setting the tray presence / absence detection unit 24, it is possible to detect whether the corresponding tray support portion 211 is carrying a tray. When the tray support portion 211 is empty, the robot arm 400 will not perform material picking or placing operations at this location, avoiding empty picking and misplacing, and ensuring accurate picking and placing actions and equipment safety.

[0109] The detection unit 24 for the presence or absence of the material tray can be a diffuse reflection photoelectric sensor. When the material tray is placed in position, light shines on the material tray, and the reflected light is reflected back to the receiving end of the sensor. When the controller receives the reflected light signal, it determines that the material tray exists. When there is no material tray, the light is emitted directly without effective reflection, and the receiving end does not receive a signal, thus determining that there is no material tray.

[0110] Continue reading Figure 10 The feeding and receiving mechanism 20 also includes a tray posture detection unit 25 located on the tray support platform 21. The tray posture detection unit 25 is used to detect whether the tray is in a horizontal state to ensure that the tray is in a horizontal state and to ensure the accuracy of picking and placing materials.

[0111] Optionally, the tray posture detection unit 25 is a through-beam photoelectric sensor. When the tray is in a horizontal state, the light from the through-beam photoelectric sensor will not be blocked by the tray. When the tray is not in a horizontal state, the light from the through-beam photoelectric sensor will be blocked by the tray. When the light is blocked, a signal is emitted to facilitate manual intervention for troubleshooting.

[0112] It is understood that in some other embodiments, the presence or absence detection unit 24 and the tray posture detection unit 25 can be selected from other types of sensors, as long as they have the corresponding detection functions.

[0113] In some embodiments, see Figure 7 and Figure 11 The material box carrying mechanism 30 includes a material box carrying member 31 and a material box positioning component 32. A material box carrying portion 311 is formed on the material box carrying member 31, and each material box carrying portion 311 is correspondingly provided with a material box positioning component 32. The material box positioning component 32 is used to position the material box to the corresponding material box carrying portion 311. The material box positioning component 32 can position the material box in the corresponding material box carrying portion 311, preventing the material box from shaking during the feeding process and ensuring positioning accuracy.

[0114] Further reading Figures 11-13 The cartridge carrier 311 has a cartridge carrier cavity 3111. A cartridge pull-out opening 3112 is provided at the end of the extended portion of the cartridge carrier 311 away from its portion located in the receiving gap 50. The cartridge pull-out opening 3112 communicates with the cartridge carrier cavity 3111. Each cartridge carrier 311 has a feeding port 3113 at its top, opposite to the feeding area A. Thus, when a cartridge is placed into the cartridge carrier cavity 3111 via the cartridge pull-out opening 3112, chips can be fed into the cartridge through the feeding port 3113 at the top. When the cartridge is full, it can be pulled out through the cartridge pull-out opening 3112, facilitating both the placement and removal of the cartridges and the feeding of chips.

[0115] It should be understood that the material box carrier 311 can also be configured in other ways, such as the material box carrier 311 only including a carrier plate for carrying the material box. In this case, the material box carrier 311 no longer has a material box carrier cavity 3111, a material box pull-out port 3112 and a feeding port 3113, etc., and the chip can be directly fed into the material box from the top feeding area A.

[0116] In some embodiments, the material box positioning component 32 is a ball-head plunger positioning structure. This structure is located on the cavity wall of the material box bearing cavity 3111. The ball-head plunger structure, with the aid of an internal spring, allows a steel ball to extend and press against the surface of the material box or into a recess within it, ensuring that the other side of the material box abuts against the cavity wall of the material box bearing cavity 3111, thus achieving material box positioning. Since the ball-head plunger positioning structure relies on the elastic force of the spring to position the material box, no additional power component is needed to clamp the material tray. Therefore, there is no need to consider the wiring issues of power components such as cylinders and motors, resulting in a simple and reliable structure.

[0117] It should be understood that in some other embodiments, the setting method of the material box positioning component 32 is not limited, and any setting method that can achieve the effect of positioning the material box is acceptable.

[0118] See Figure 12 Each cartridge carrier 311 is equipped with a corresponding cartridge misplacement prevention part 33. The cartridge misplacement prevention part 33 restricts the cartridge from being placed backwards or backwards, and prevents the cartridge from being placed in the wrong orientation. This ensures the cartridge is accurately placed in the cartridge carrier 311, reducing the adverse effects of inaccurate placement. Furthermore, when the cartridge carrier 31 includes multiple cartridge carriers 311, and these multiple cartridge carriers 311 are used to hold cartridges of different sizes, the cartridge misplacement prevention part 33 also prevents cartridges of different sizes from being mixed up.

[0119] Optionally, the anti-mistake part 33 of the material box is an anti-mistake hole provided in the material box supporting cavity 3111. When the material box is placed in the material box supporting cavity 3111, the protrusion on the material box can be inserted into the corresponding anti-mistake hole. Of course, in some other embodiments, the anti-mistake part 33 of the material box can also be a protrusion or a bump, etc., which is not limited here.

[0120] See Figure 12 The material box carrying mechanism 30 also includes a material box presence / absence detection unit 34, with each material box carrying part 311 corresponding to a material box presence / absence detection unit 34. The material box presence / absence detection unit 34 is used to detect whether a material box is placed in the material box carrying part 311. If no material box is placed, the robot arm 400 will not place material at that position to avoid incorrect material placement and ensure accurate material placement and equipment safety.

[0121] The presence or absence detection unit 34 in the material box can also be a diffuse reflection photoelectric sensor. Its detection principle is similar to that of the presence or absence detection unit 24 in the material tray, and will not be elaborated here.

[0122] The material box carrying mechanism 30 also includes a material box full detection unit 35, and each material box carrying part 311 is provided with a corresponding material box full detection unit 35. The material box full detection unit 35 is used to detect whether the material box is full. When the material box is full of chips, it can output a detection signal to control the robot arm 400 to stop feeding and trigger the full box changing action to prevent the chips from spilling.

[0123] Optionally, the material box full detection unit 35 is a through-beam photoelectric sensor. When the material box is not full, the light of the through-beam photoelectric sensor will not be blocked by the chip. When the light of the through-beam photoelectric sensor is blocked, it proves that the material box is full, and the material box can be removed.

[0124] It is understood that in some other embodiments, the presence or absence of the tray detection unit 24 and the fullness detection unit 35 of the material box can also be other types of sensors, as long as they have the corresponding detection functions.

[0125] In some embodiments, see Figure 7 and Figure 14 The cassette carrying mechanism 30 also includes a baffle 36 disposed on the cassette carrying member 31. The baffle 36 is located at the cassette pull-out opening 3112 and is positioned above the bottom wall of the cassette carrying cavity 3111. The top wall of the cassette carrying cavity 3111 is provided with a relief groove 3114. The vertical depth L1 of the relief groove 3114 is greater than the vertical distance L2 from which the top surface of the baffle 36 protrudes from the bottom wall of the cassette carrying cavity 3111. Under the blocking action of the baffle 36, the cassette can be prevented from accidentally coming out of the cassette pull-out opening 3112. Furthermore, since the depth of the relief groove 3114 is greater than the height of the baffle 36 protruding from the bottom wall of the cassette carrying cavity 3111, when it is necessary to remove the cassette, the cassette can be raised above the baffle 36 and removed from above the baffle 36. This design prevents the material box from accidentally coming out of the material box pull-out opening 3112 without interfering with the normal extraction of the material box.

[0126] For some specific implementation methods, see [link to relevant documentation]. Figure 12The material box carrier 31 includes a bottom plate 312, a top plate 313, side plates 314, and a sealing plate 315. The side plates 314 are vertically positioned between the bottom plate 312 and the top plate 313, and each material box carrier 311 has two corresponding side plates 314. Parts of the bottom plate 312, top plate 313, and side plates 314 are located within the receiving gap 50, with the remaining parts extending out of the receiving gap 50. The sealing plate 315 is located within the receiving gap 50 and is connected to the bottom plate 312, top plate 313, and side plates 314. The top plate 313, bottom plate 312, two side plates 314, and sealing plate 315 together form the material box receiving cavity. The ends of the two side plates 314, bottom plate 312, and top plate 313 away from the sealing plate 315 form a material box pull-out opening 3112. A baffle 36 is connected to the bottom plate 312 and located at the material box pull-out opening 3112. Thus, by setting a bottom plate 312, a top plate 313, a sealing plate 315 and multiple side plates 314, multiple material box support parts 311 can be formed, and each material box support part 311 forms a material box support cavity 3111, which simplifies the structure of the material box support 31.

[0127] In the above embodiment, the material box anti-foolproof part 33 is provided on the sealing plate 315, the material box positioning component 32 is provided on the side plate 314, the material box presence detection unit 34 is provided on the bottom plate 312, and the material box full detection unit 35 is provided on the side plate 314.

[0128] It is conceivable that in other embodiments, the specific structure of the material box carrier 31 is not limited and can be selected as needed. When the structure of the material box carrier 31 is changed, the positions of the material box anti-fooling part 33, the material box positioning component 32, the material box presence / absence detection unit 34, and the material box full detection unit 35 are also adjusted accordingly.

[0129] In some embodiments, see Figure 7 and Figure 8 The feeding and receiving device 100 also includes a cassette opening and closing mechanism 60, which includes a cover plate 61 and a drive member 62. The drive member 62 is mounted on the base, and the cover plate 61 is vertically positioned between the cassette carrier 31 and the tray carrier 21. Specifically, the cover plate 61 covers the top of the cassette carrier 31. The drive member 62 drives the cover plate 61 to move relative to the cassette carrier 31 to open and close the feeding port 3113. Thus, when it is necessary to feed chips into the cassette, the cover plate 61 will open the feeding port 3113 corresponding to the cassette to facilitate feeding; when it is not necessary to feed chips into the cassette, the cover plate 61 will close the feeding port 3113 corresponding to the cassette to avoid accidental feeding.

[0130] The drive unit 62 drives the cover plate 61 to move in a horizontal direction to open and close the feeding port 3113. Specifically, the cover plate 61 is provided with a connecting port 611. When the connecting port 611 is connected to the feeding port 3113, the feeding port 3113 is opened; when the connecting port 611 is misaligned with the feeding port 3113, the feeding port 3113 is closed by the cover plate 61.

[0131] The aforementioned drive component 62 can be a motor or a cylinder, etc., and is not limited here.

[0132] When the material box carrier 31 has multiple feeding ports 3113, each feeding port 3113 can be provided with a corresponding material box opening and closing mechanism 60, or multiple feeding ports 3113 can be provided with a corresponding material box opening and closing mechanism 60, which is not limited here.

[0133] Further reading Figure 8 The material box opening and closing mechanism 60 also includes a guide member 63, which protrudes above the cover plate 61 and has a guide groove 631 that communicates with the connecting port 611. The material box carrier 31 includes multiple material box carrier parts 311, each of which is provided with a corresponding guide member 63. When some feeding ports 3113 are connected to their corresponding guide grooves 631, the remaining feeding ports 3113 are covered by the cover plate 61 and are misaligned with their corresponding feeding ports 3113. This configuration serves two purposes. First, during material feeding, some feeding ports 3113 are open while the remaining ports are closed, reducing the occurrence of abnormal material feeding. Second, since there is a height difference between the material box carrier 31 and the tray carrier 21 in the vertical direction, there is also a height difference when the robot arm 400 picks up and puts materials between the tray and the box. The guide component 63 protrudes from the cover plate 61, which can compensate for the height difference between the tray and the box. When the robot arm 400 picks up materials from the tray and puts them into the box, it does not need to compensate for the Z-axis position. The chip can slide into the box from the guide component 63, which simplifies the program setup.

[0134] For some specific implementation methods, see [link to relevant documentation]. Figure 7 and Figure 15 The material box carrier 31 extends out of the receiving gap 50 at one end along the second horizontal direction. The material box carrier 31 has five material box carrying parts 311 in the first horizontal direction, which can carry five material boxes 2000. The material box 2000 carried by the leftmost material box carrying part 311 contains the qualified chip, and the material boxes 2000 carried by the remaining four material box carrying parts 311 contain the unqualified chip. The driving unit 62 is used to drive the cover plate 61 to move along the first horizontal direction, so that when the leftmost feeding port 3113 is open, the other feeding ports 3113 are closed, and when the leftmost feeding port 3113 is closed, the other feeding ports 3113 are open. This can avoid the mixing of materials due to abnormalities such as flying materials during the test.

[0135] In some embodiments, see Figure 2 The tray support platform 21 is provided with multiple tray support sections 211 along the first horizontal direction. One end of the material box support mechanism 30 along the second horizontal direction is located directly below the tray support platform 21, and the other end extends out of the tray support platform 21 along the second horizontal direction to form an extension section. The micro-vibrating plate device 200 is arranged side by side with the tray support platform 21 along the first horizontal direction; the testing device 600 is located at the end of the tray support platform 21 away from the delivery area along the second horizontal direction, and the first station B is located between the testing device 600 and the tray support platform 21 along the second horizontal direction; the lower vision device 700 is arranged side by side with the micro-vibrating plate device 200 along the second horizontal direction and is located at the end closer to the testing device 600; the control device is used to control the robot arm 400 to move along the first and second horizontal directions to pick up and place electronic components. In this way, the feeding and receiving mechanism 20, the material box carrying mechanism 30, the micro-vibrating plate device 200, the lower vision device 700, the material shuttle 500 and the testing device 600 are arranged in a compact manner on the mounting base 800, which can reduce the footprint of the testing and sorting equipment 1000.

[0136] It should be understood that in some other embodiments, the above-described structures may also be disposed on the mounting base 800 in other ways, which are not limited here.

[0137] Optionally, see Figure 5 The robotic arm 400 includes a first robotic arm 400a and a second robotic arm 400b. During testing, one of the first robotic arm 400a and the second robotic arm 400b can be used as a feeding robotic arm and the other as a receiving robotic arm. After the receiving robotic arm removes the tested electronic components from the shuttle 500, the feeding robotic arm can place the next or the next batch of electronic components to be tested into the shuttle 500. While the shuttle 500 is conveying the electronic components to be tested to the testing device 600, the receiving robotic arm transfers the tested electronic components to the receiving device 100 for collection. The collection from the shuttle 500 to the testing device 600 and the transfer from the receiving robotic arm to the receiving device 100 can be carried out simultaneously, improving testing efficiency.

[0138] Further reading Figure 5The first robotic arm 400a and the second robotic arm 400b are arranged at intervals in the first horizontal direction. The upper vision device 300 includes a first imaging mechanism 301, a ring light source 302, and two strip light sources 303. The first imaging mechanism 301 is located between the first robotic arm 400a and the second robotic arm 400b in the first horizontal direction. The ring light source 302 is located below the first imaging mechanism 301 in the vertical direction. The two strip light sources 303 are located on both sides of the first imaging mechanism 301 in the second horizontal direction. This arrangement allows for a compact layout of the first robotic arm 400a, the second robotic arm 400b, the first imaging mechanism 301, the ring light source 302, and the two strip light sources 303, reducing the footprint. Furthermore, the ring light source 302 and the two strip light sources 303 work together to provide illumination to the first imaging mechanism 301, thereby improving the imaging effect of the upper vision device 300.

[0139] Specifically, the bar light source 303 extends along a first horizontal direction and is capable of rotating around an axis extending along the first horizontal direction. Thus, by controlling the rotation angle of the bar light source 303, the illumination angle, illumination direction, and coverage area can be changed, thereby adjusting the imaging effect.

[0140] Optionally, the lower vision device 700 includes a second imaging mechanism and a light source mechanism, wherein the light source mechanism is used to provide illumination light to the second imaging mechanism, and the second imaging mechanism is used to take pictures of the electronic component under test.

[0141] In some embodiments, see Figure 5 Both the first robotic arm 400a and the second robotic arm 400b include a drive assembly 401, a rotation assembly 402, and a pickup assembly 403. The rotation assembly 402 is connected to the drive assembly 401, and the pickup assembly 403 is connected to the rotation assembly 402. The drive assembly 401 drives the pickup assembly 403 to move vertically, and the rotation assembly 402 drives the pickup assembly 403 to rotate around an axis extending vertically. This configuration allows the drive assembly 401 to adjust the vertical position of the pickup assembly 403, facilitating the pickup and placement of electronic components by the robotic arm 400. The rotation assembly 402 rotates the pickup assembly 403 to change the angle of the picked-up electronic component, thereby improving the accuracy of pickup and placement.

[0142] Both the drive assembly 401 and the rotating assembly 402 can be powered by a motor or cylinder, and the pickup assembly 403 can include a suction nozzle to pick up electronic components. Of course, in some other embodiments, the structure of the pickup assembly 403 is not limited, as long as it can pick up and place electronic components.

[0143] The testing and sorting equipment 1000 provided in the specific embodiments of this application can supply materials in the following ways:

[0144] 1. The micro-vibrating plate device supplies material at 200 mm, and the receiving tray collects the material. The process is as follows:

[0145] The micro-vibrating plate 201 vibrates, scattering and spreading out the electronic components under test. The control device controls the drive device 120 to move the upper vision device 300 above the vibrating plate 201 to photograph the electronic components under test in the vibrating plate 201. Based on the first photographed information from the upper vision device 300, the control device controls the drive device 120 to drive the feeding robot to move and pick up the electronic components under test facing upwards in the vibrating plate 201. The control device controls the drive device 120 to move the feeding robot above the lower vision device 700. The lower vision device 700 photographs the electronic components under test picked up by the feeding robot to form second photographed information. Based on the second photographed information, the control device controls the drive device 120 to move the feeding robot horizontally, and controls the drive assembly 401 to move the picking assembly 403 vertically, and the rotation assembly 402 to rotate the picking assembly 403 around the vertically extending axis, so as to accurately place the electronic components under test in the shuttle 500. The shuttle 500 moves from the first station B to the testing station C to transport the electronic component under test to the testing device 600. The testing device 600 performs temperature control and crimping tests on the electronic component under test. After the electronic component under test is completed by the testing device 600, it is transferred back to the shuttle 500. The shuttle 500 then moves back to the first station B, where a receiving robot picks up the tested electronic component from the shuttle 500 and transfers it to the receiving tray for collection.

[0146] 2. The micro-vibrating plate device 200 feeds the material and the material box collects the material. The workflow of this method is similar to that of the micro-vibrating plate device 200 feeding the material and the material collection tray collecting the material. The difference is that the material collection robot transfers the tested electronic components to the material box for collection.

[0147] 3. The feeding tray feeds the material, and the receiving tray collects the material. In this method, the control device controls the drive device 120 to drive the feeding robot to pick up the electronic components to be tested in the feeding tray, and controls the drive device 120 to drive the receiving robot to pick up the tested electronic components in the shuttle 500 and transfer them to the receiving tray for collection.

[0148] 4. Feeding tray loading and receiving box loading: This method is similar to feeding tray loading and receiving tray loading, except that the receiving robot transfers the tested electronic components to the receiving box for receiving.

[0149] It should be noted that, since the material tray in this application can also be a transfer tray, when multiple temperature range cyclic tests are required for electronic components, after the testing device 600 tests the electronic component at a previous temperature range, the robot arm 400 can pick up the electronic component from the material shuttle 500 and transfer it to the transfer tray. When the testing device 600 switches temperature ranges, the robot arm 400 transfers the electronic component from the transfer tray back to the material shuttle 500. Furthermore, when the testing device 600 tests the electronic component at more than two temperature ranges, the electronic component will flow between the material shuttle 500 and the transfer tray multiple times.

[0150] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0151] The embodiments described above are merely illustrative of several implementations of the present invention, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these all fall within the protection scope of the present invention. Therefore, the protection scope of this invention patent should be determined by the appended claims.

Claims

1. A testing and sorting device, characterized in that, include: The micro-vibrating disk device (200) includes a vibrating disk (201) with a feed inlet (2011) at the top; the vibrating disk (201) is used to adjust the orientation of the electronic component under test located therein by means of its own vibration; An upper vision device (300) is used to capture images of the electronic component under test inside the feed inlet (2011) from above to form first image information; The robotic arm (400) and the control device are both electrically connected to the upper vision device (300) and the robotic arm (400); the control device is used to control the robotic arm (400) to pick up the electronic component under test in the target posture in the feed port (2011) according to the first image information. A shuttle (500) and a testing device (600) located at a testing station (C), wherein the shuttle (500) is capable of moving between the testing station (C) and a first station (B) to transport electronic components; The lower vision device (700), which is electrically connected to the control device, is located on the movement path of the robot (400) moving to the first workstation (B) via the micro-vibrating disk device (200). It is used to capture the electronic components to be tested picked up by the robot when the robot (400) moves over it to form second image information. The control device is used to control the robot (400) to rotate the electronic component under test according to the second shooting information to change the angle of the electronic component under test, and to control the robot (400) to move to the first station (B) via the lower vision device (700) to place the electronic component under test in the shuttle (500).

2. The testing and sorting equipment according to claim 1, characterized in that, The testing and sorting equipment also includes a feeding device (900), which is located upstream of the micro-vibrating disk device (200); The feeding device (900) includes a hopper (901), which is used to transport the electronic component to be tested through the feed port (2011) to the vibrating plate (201) by its own vibration.

3. The testing and sorting equipment according to claim 1, characterized in that, The upper vision device (300) and the robotic arm (400) are connected and can move synchronously; The upper vision device (300) can move with the robot (400) to the first work station (B) to capture the orientation of the electronic component under test in the shuttle (500) to form third shooting information; the control device is used to control the robot (400) to pick up the electronic component under test in the shuttle (500) according to the third shooting information, drive it to rotate and adjust the angle until the electronic component under test reaches the preset orientation in the shuttle (500).

4. The testing and sorting equipment according to claim 1, characterized in that, The testing and sorting equipment also includes a testing chamber (110), which has a sealed cavity inside. The testing device (600) and the shuttle (500) are both located in the sealed cavity. The test chamber (110) is provided with a controllable door (1101) at the first work station (B), and the shuttle (500) can receive electronic components placed by the robot (400) when the door (1101) is opened.

5. The testing and sorting equipment according to claim 1, characterized in that, The test sorting equipment also includes a receiving device (100), and the control device is also used to control the robot (400) to move between the first station (B) and the receiving device (100) so that the robot (400) picks up the tested electronic components in the shuttle (500) and transfers them to the receiving device (100).

6. The testing and sorting equipment according to claim 5, characterized in that, The upper vision device (300) is connected to the robotic arm (400) and can move synchronously. The robotic arm (400) includes a first robotic arm (400a) and a second robotic arm (400b) arranged at intervals along a first horizontal direction. The upper vision device (300) includes a first imaging mechanism (301), a ring light source (302), and two strip light sources (303). The first imaging mechanism (301) is located between the first robotic arm (400a) and the second robotic arm (400b) in the first horizontal direction. The ring light source (302) is located below the first imaging mechanism (301) in the vertical direction. The two strip light sources (303) are located on both sides of the first imaging mechanism (301) in the second horizontal direction. The first horizontal direction and the second horizontal direction intersect. Both the first robotic arm (400a) and the second robotic arm (400b) include a drive assembly (401), a rotation assembly (402), and a pickup assembly (403). The rotation assembly (402) is connected to the drive assembly (401), and the pickup assembly (403) is connected to the rotation assembly (402). The drive assembly (401) is used to drive the pickup assembly (403) to move along the vertical direction, and the rotation assembly (402) is used to drive the pickup assembly (403) to rotate around an axis extending along the vertical direction.

7. The testing and sorting equipment according to claim 5, characterized in that, The receiving device (100) includes a receiving mechanism (20) and a material box carrying mechanism (30). The feeding and receiving mechanism (20) has at least one tray carrying part (211), each of the tray carrying parts (211) is used to carry a tray (3000), the tray being at least one of a feeding tray, a receiving tray and a transfer tray; the box carrying mechanism (30) has at least one box carrying part (311), each of the box carrying parts (311) is used to carry a box (2000). The control device is also used to control the movement of the robot (400) between the first station (B) and the receiving device (100) to transfer electronic components between the receiving device (100) and the shuttle (500).

8. The testing and sorting equipment according to claim 7, characterized in that, The feeding and receiving mechanism (20) includes a tray support platform (21), and the tray support part (211) is disposed on the tray support platform (21); Part of the material box carrying mechanism (30) is located directly below the material tray carrying platform (21) in the vertical direction, and the remaining part extends outward to form a protruding section. The protruding section is offset from the material tray carrying platform (21) in the vertical direction, and an insertion area is formed above the protruding section for electronic components to be inserted into the material box carried on the material box carrying part (311).

9. The testing and sorting equipment according to claim 8, characterized in that, The tray support platform (21) is provided with a plurality of tray support parts (211) along the first horizontal direction. One end of the material box support mechanism (30) along the second horizontal direction is located directly below the tray support platform (21), and the other end extends out of the tray support platform (21) along the second horizontal direction to form the extended section. The micro-vibrating disk device (200) is arranged side by side with the tray support platform (21) along the first horizontal direction; the testing device (600) is located at the end of the tray support platform (21) away from the delivery area along the second horizontal direction; the first workstation (B) is located between the testing device (600) and the tray support platform (21) along the second horizontal direction; the lower vision device (700) is arranged side by side with the micro-vibrating disk device (200) along the second horizontal direction and is located at the end of it closer to the testing device (600); the control device is used to control the robot arm (400) to move along the first horizontal direction and the second horizontal direction to pick up and place electronic components; and / or The material box support part (311) has a material box support cavity (3111), and the top of the material box support part (311) is provided with a feeding port (3113). The feeding port (3113) is opposite to the feeding area (A) and communicates with the material box support cavity (3111). The receiving device (100) further includes a material box opening and closing mechanism (60), which includes a cover plate (61) and a driving member (62). The cover plate (61) is disposed between the material box carrying mechanism (30) and the material tray carrying platform (21) along the vertical direction. The driving member (62) is used to drive the cover plate (61) to move relative to the material box carrying mechanism (30) to open and close the feeding port (3113).

10. The testing and sorting equipment according to any one of claims 1-9, characterized in that, The test sorting equipment also includes a mounting base (800) and a drive device (120). The drive device (120) includes a first drive mechanism (1201) and a second drive mechanism (1202) connected to each other. The second drive mechanism (1202) is mounted on the mounting base (800) and extends along a second horizontal direction. The first drive mechanism (1201) extends along a first horizontal direction and one end is connected to the second drive mechanism (1202), and the other end is provided with a roller. The roller is rotatably supported on the mounting base (800). The robotic arm (400) is connected to the first driving mechanism (1201), which drives the robotic arm (400) to move along the first horizontal direction, and the second driving mechanism (1202) drives the robotic arm (400) to move along the second horizontal direction; the first horizontal direction and the second horizontal direction intersect.

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