Electronic component high temperature testing machine

Abstract

The application discloses an electronic component high-temperature testing machine, which comprises a rack, a front-end feeding channel, a roller preheating mechanism, a testing mechanism, a sorting mechanism, a rear-end discharging channel and a material pushing mechanism arranged in sequence along the X direction on the rack. The roller preheating mechanism comprises a heating roller rotating around the X axis, and the outer wall of the heating roller is provided with a plurality of circumferentially distributed preheating long grooves for batch containing and preheating electronic components. The testing mechanism comprises a testing channel and a pair of testing sliders provided with testing pieces, and the relative movement of the testing sliders is used for electric performance testing of the batch electronic components. The sorting mechanism comprises a sorting channel and a rejection assembly, and is used for distinguishing qualified products from unqualified products. The material pushing mechanism is used for material pushing between stations. The electronic components are fully and uniformly heated through the roller type storage preheating, and the automatic testing and sorting are matched, so that the testing efficiency is effectively improved, the testing consistency is ensured, and the structure is compact and the occupied space is small.

Description

Technical Field

[0001] This invention belongs to the field of electronic component testing technology, specifically relating to a high-temperature testing machine for electronic components. Background Technology

[0002] After electronic components are manufactured, their electrical performance parameters need to be tested under high-temperature operating environments to ensure the reliability and stability of the products in practical applications. With the rapid development of new energy, rail transportation, smart grids and other fields, the demand for performance testing of electronic components such as power devices under high-temperature conditions is increasing, and the requirements for batch and high-efficiency testing have become industry trends.

[0003] Currently, the industry's high-temperature testing of electronic components mainly faces the following technical problems and shortcomings: First, the testing efficiency is low and batch processing is poor. Existing technologies often employ a single-device testing mode, placing a single device under test (DUT) in a high-temperature chamber and connecting it to external testing equipment via high-temperature resistant leads. This method can only test one device at a time, resulting in a long testing cycle and failing to meet the capacity requirements for high-temperature testing in large-scale production. Some manufacturers have attempted to use multiplexers to switch channels and test multiple devices sequentially, but general-purpose multiplexers are not designed for high-temperature environments: placing them outside the high-temperature chamber leads to excessive test leads, and long leads introduce additional parasitic parameters, severely impacting measurement accuracy, especially in high-current, high-speed switching tests; placing them inside the high-temperature chamber results in poor high-temperature adaptability and susceptibility to damage, again compromising testing reliability and accuracy.

[0004] Secondly, the preheating rate is slow and the temperature uniformity is poor. Existing high-temperature testing equipment typically uses heating devices to apply high temperatures to the chip under test to perform high-pressure testing. However, reaching the high temperature of the chip requires prolonged and continuous heating, resulting in a slow heating rate and severely impacting testing efficiency. Furthermore, heating the chip with a heating device presents a problem of high external temperature and low internal temperature during the heating process, leading to uneven overall temperature distribution within the chip. In contrast, chips used in high-temperature environments remain under a uniformly high temperature, thus affecting the accuracy and consistency of the test.

[0005] Third, the equipment occupies a large area and has low space utilization. The existing reciprocating pallet-type storage, preheating and feeding solutions require long preheating tracks or multiple preheating stations to achieve batch testing, resulting in a large overall width and length of equipment and occupying a large workshop space. Summary of the Invention

[0006] In view of the shortcomings of the prior art, the purpose of this invention is to provide a high-temperature testing machine for electronic components, which solves the problems of low efficiency, slow and uneven preheating speed, and large space occupation of the equipment in the prior art.

[0007] The above-mentioned technical objective of the present invention is achieved through the following technical solution: A high-temperature testing machine for electronic components includes a frame. Along the X-direction, the frame is sequentially equipped with a front-end feeding channel, a roller preheating mechanism, a testing mechanism, a sorting mechanism, a rear-end discharging channel, and a feeding mechanism. The testing mechanism is electrically connected to a controller, which controls the roller preheating mechanism, the sorting mechanism, and the feeding mechanism. The front-end feeding channel is fixed to the frame and connected to the previous process or a vibratory feeder.

[0008] The drum preheating mechanism includes a heating drum that rotates around the X-axis, and the outer wall of the heating drum is provided with a plurality of circumferentially distributed, axially extending preheating grooves. The testing mechanism includes a testing channel and a pair of test sliders that can move linearly relative to each other. The test sliders are symmetrically arranged on both sides of the testing channel. The preheating groove of the heating roller connects the front feeding channel and the testing channel. The sorting mechanism includes a rejection component and a sorting channel that can be translated along the Y direction; The sorting channel can be connected to a rejection component, or Connect the end of the rear discharge channel and the test channel away from the heating drum.

[0009] Electronic components from the previous process or a vibratory feeder (with a certain ability to push workpieces) enter the front feeding channel. Then, a feeding mechanism pushes a certain number of electronic components from the front feeding channel into the preheating slots of the heating roller. Initially, all preheating slots are filled with workpieces, allowing the heating roller to preheat the electronic components within. During testing, the feeding mechanism pushes electronic components from one of the preheating slots (the first one) into the test channel. Immediately afterward, the feeding mechanism pushes a certain number of electrical components from the front feeding channel into the same preheating slot to replenish them. The heating roller then rotates at a certain angle, aligning the adjacent preheating slot with the front feeding channel and the test channel. After the electronic components in the test channel have been tested, the electronic components from the second preheating slot are pushed into the test channel to replenish them. Through this process, each electronic component in a preheating slot undergoes one full rotation of the heating roller, allowing for sufficient heating time and more uniform heating of the electronic components. Simultaneously, the roller is used for material storage, preheating, and feeding. Compared with the existing reciprocating pallet-based material storage, preheating, and feeding, the roller occupies less space and can significantly reduce the overall equipment width while preheating the same number of electronic components.

[0010] The test sliders move close together to test a certain number of electrical components in the test channel. After the test is completed, the test results are fed back to the controller. At the same time, the feeding mechanism pushes the tested electronic components into the sorting channel. If all the electronic components in the group are qualified, the feeding mechanism pushes the group of electronic components from the sorting channel into the rear discharge channel. If some of the electronic components in the group are unqualified, the sorting channel moves to the rejection component, and the rejection component rejects all the electronic components in the group.

[0011] The invention is further configured such that: a recessed cavity with an opening on one side is formed inside the heating drum, and a plurality of evenly distributed electric heating rods are sleeved inside the recessed cavity, with one end of each electric heating rod fixed to a baffle plate; a temperature sensor is fixed to the baffle plate and extends into the recessed cavity; The opening of the recessed cavity abuts against or is positioned close to a baffle plate. The heating roller is fixed to a rotating shaft, one end of which is connected to a servo motor that drives its rotation. The rotating shaft is rotatably connected to a frame, and the servo motor is fixed to the frame. A temperature sensor is electrically connected to a controller, which controls the servo motor and the electric heating rod. The temperature sensor detects the temperature inside the recessed cavity and transmits the signal to the controller, which controls the power of the electric heating rod to maintain the temperature inside the recessed cavity within a target range. The servo motor drives the heating roller to rotate through a specific angle each time via the rotating shaft, ensuring the accurate positioning of the preheating tank. The baffle plate not only blocks heat from the recessed cavity, reducing heat exchange with the outside atmosphere, but also prevents electronic components inside the preheating tank from falling out. The baffle plate has a notch communicating with the uppermost preheating tank.

[0012] The electric heating rod is connected to the cavity via a plug-in connection. While the heating drum rotates, the electric heating rod remains stationary, eliminating the need for brushes and simplifying the structure. The relative rotation between the electric heating rod and the heating drum allows for more uniform heating, thus improving the heat distribution uniformity of electronic components. In contrast, directly fixing the electric heating rod inside the heating drum can easily result in single-point heating and uneven heating.

[0013] The invention is further configured such that: the test channel is fixed on a heating block, the heating block is fixedly connected to the frame, the heating block has a built-in resistance wire, and the controller controls the resistance wire. The heating block can heat the test channel, thereby maintaining the electronic components in the heating channel at a certain temperature, preventing them from entering the test channel from the heating drum, where a rapid temperature drop would affect test performance.

[0014] The invention is further configured such that: multiple linearly evenly distributed test pieces are fixed on the test slider; each test slider is connected to a first telescopic cylinder that drives its translation, the first telescopic cylinder is fixed on a test support, the test slider is slidably connected to the test support, and the test support is fixed on a frame. The test pieces are electrically connected to a controller, the controller is equipped with a test circuit, and the controller controls the first telescopic cylinder to work; the first telescopic cylinder can be an electric cylinder or a pneumatic cylinder.

[0015] The lower part of the test channel near the sorting channel has a detection slot formed therein. Each end of the detection slot has a liftable fourth stop and a first optical fiber unit. The fourth stop is fixed to the end of the telescopic rod of a second telescopic cylinder, which can drive the fourth stop upwards to insert into the detection slot and extend into the test channel. The first optical fiber unit is electrically connected to the controller via an optical fiber amplifier. The test pieces at both ends correspond one-to-one with the first optical fiber units at both ends of the detection slot.

[0016] During testing, the feeding mechanism pushes the electronic components in the test channel toward the sorting mechanism. When the two first fiber optic units, in conjunction with the fiber optic amplifier, detect an electrical component, for example, the two fiber optic units correspond to the first and tenth electronic components in the test channel near the sorting mechanism, respectively, the two second telescopic cylinders drive the fourth stop blocks to move upward, placing the ten electronic components between the two fourth stop blocks, thereby positioning the ten electronic components. Then, the first telescopic cylinder drives the test slider to move closer to the ten electronic components, so that the test piece abuts against the pins of the corresponding electronic components, thereby testing the electronic components. The test results are recorded in the controller. The test channel is provided with a notch for inserting the test slider.

[0017] After the test is completed, the fourth stop moves down and resets. The feeding mechanism pushes the ten tested components into the sorting channel, and then pushes the remaining electronic components in the test channel, and so on, checking them in groups of ten. When there are not enough electronic components in the test channel, that is, when the first fiber unit and fiber amplifier for testing the tenth electronic component fail to detect the component, the feeding mechanism pushes the corresponding electronic component from the preheating groove on the heating roller into the test channel to supplement it.

[0018] The present invention is further configured such that: the rejection component includes an air blowing head and a material kicking channel arranged opposite to each other; the air blowing head is connected to a high-pressure air pipe, and the high-pressure air pipe is equipped with a solenoid valve, which is used to cut off or connect the gas in the high-pressure air pipe and is electrically connected to the controller.

[0019] The sorting channel is fixed on the slider of the first Y-axis linear module. The first linear module is fixed on the frame and electrically connected to the controller. The linear module is preferably a servo linear module.

[0020] The first Y-axis linear module drives the sorting channel to translate in the Y direction. When a group of electronic components entering the sorting channel is defective, the sorting channel moves to the rejection component position, aligning the air blowing head and the ejector channel with the two ends of the sorting channel. Then, the air blowing head blows high-pressure gas into the sorting channel, blowing all the electronic components (there may be one or two groups of electronic components in the sorting channel, with a yield rate of 0.01% to 0.05%) into the ejector channel, which is connected to the corresponding defective product collection cylinder. Then, the sorting channel moves back to its original position, aligning with the test channel.

[0021] The present invention is further configured such that the feeding mechanism includes a first feeding head, a second feeding head, a third feeding head, and a fourth feeding head; The first feeding head is used to push the electronic components in the front feeding channel into the preheating long groove; The second feeding head is used to push the electronic components in the preheating long groove into the test channel; The third feeding head is used to push untested electronic components in the test channel; The fourth feeding head is used to push the electronic components that have completed testing in the testing channel to the sorting channel, and the electronic components in the sorting channel are passively pushed to the rear discharge channel.

[0022] The present invention is further configured such that the first, second, third, and fourth feed heads have the same structure, including a third telescopic cylinder, a connecting arm, and a feed head. The two ends of the connecting arm are respectively fixedly connected to the telescopic rod of the third telescopic cylinder and the feed head. The third telescopic cylinder can drive the connecting arm to rise and fall, thereby driving the feed head to rise and fall. When the feed head moves down, it can be inserted between electronic components. When the feed head moves up, it can be disengaged from the corresponding channel.

[0023] The third telescopic cylinder of the first feeding head is fixed to the connecting plate; the third telescopic cylinder of the second feeding head is fixed to the second slider, the second slider is slidably connected to the connecting plate and fixedly connected to the telescopic rod of the fourth telescopic cylinder, the fourth telescopic cylinder is fixed to the connecting plate; the connecting plate is fixed to the slider of the first X-axis linear module; the third telescopic cylinder of the third feeding head is fixedly connected to the slider of the second X-axis linear module; the fourth telescopic cylinder is used to increase the stroke of the second feeding head so that all electronic components in the preheating long slot can smoothly enter the test channel.

[0024] The third telescopic cylinder of the fourth feed head is fixedly connected to the slider of the third X-axis linear module. The first X-axis linear module, the second X-axis linear module, and the third X-axis linear module are fixed on the frame and electrically connected to the controller.

[0025] The present invention is further configured such that: the dial includes a dial seat fixedly connected to the connecting arm, the dial seat has an opening groove formed therein, a dial rod is sleeved in the opening groove, the upper end of the dial rod is rotatably connected in the opening groove by a pin; a bushing is fixed to the lower end of the dial rod extending into the opening groove, a pin is sleeved in the bushing, and a cone is formed to the lower end of the pin extending into the bushing. One side of the lever rests against a horizontally arranged first compression spring, which is inserted into a spring seat and fixedly connected to the lever head seat; the side of the lever away from the first compression spring rests against the inner wall of the opening slot. A vertically positioned second compression spring is held between the upper end of the bushing and the ejector pin.

[0026] When the dial moves down, the cone tip inserts between two adjacent electronic components. The lever and dial head seat are connected by relative rotation, allowing the cone tip to swing at a certain angle to accommodate insertion. The second compression spring acts as a buffer during insertion. The cooperation of the first and second compression springs makes the insertion process more flexible and reduces damage to electronic components.

[0027] The present invention is further configured such that: a front stop block and a rear stop block are respectively sleeved at both ends of the front feeding channel; the front stop block is fixed on the telescopic rod of the front telescopic cylinder; the rear stop block is fixed on the telescopic rod of the rear telescopic cylinder; the front telescopic cylinder and the rear telescopic cylinder are fixed on the frame and electrically connected to the controller.

[0028] When the first feed head pushes electronic components, the front stop moves upward to block the material from entering the front feed channel from the upstream side or the vibratory feeder. When the first feed head moves to the other side of the rear stop, the rear stop moves upward and the front stop moves downward, allowing the material from the upstream side or the vibratory feeder to enter the front feed channel. The rear stop can control the amount of material entering. The insertion point of the first feed head before pushing is directly above the front stop. The number of electronic components pushed into the preheating tank at one time can be roughly controlled by the front and rear stops.

[0029] The present invention is further configured such that a cooling mechanism is provided between the sorting mechanism and the rear discharge channel; The cooling mechanism includes a second Y-axis linear module, a material distribution track is fixed on the slider of the second Y-axis linear module, a cover plate is fixed on the upper end of the material distribution track, and the material distribution track and the cover plate form a plurality of X-axis through cooling grooves; a plurality of heat dissipation holes communicating with the cooling grooves are formed on the cover plate. The cooling tank is abutted against a baffle plate, which has a feed port formed thereon, connecting the cooling tank and the rear discharge channel. The width of the feed port is approximately equal to the width of one cooling tank, allowing only electronic components within the aligned cooling tank to pass through. The second Y-axis linear module and the baffle plate are fixed to the frame and electrically connected to the controller.

[0030] The feeding mechanism pushes qualified electronic components from the sorting channel into the first cooling tank. The number of electronic components placed in each cooling tank is an integer multiple of the number inspected at one time. After the first cooling tank is filled with a certain number of electronic components, the second Y-axis linear module moves the distribution track to align the adjacent second cooling tank with the sorting channel. This process is repeated to fill all the cooling tanks. Then, the first cooling tank is aligned with the feed port and sorting channel, and the feeding mechanism pushes the electronic components from the sorting channel into the first cooling tank. The electronic components that were originally in the first cooling tank are squeezed out into the rear discharge channel. After all the electronic components that were originally in the first cooling tank have been squeezed out, the distribution track moves to align the second cooling tank with the feed port and sorting channel, and the same principle is used to squeeze out the electronic components that were originally in the second cooling tank. By setting up multiple cooling tanks, sufficient cooling time can be provided for the electronic components.

[0031] The outstanding effects of this invention are: Compared with existing technologies, this invention, by setting up a heating drum with multiple circumferentially distributed preheating slots, allows electronic components to undergo sufficient preheating time within the heating drum before testing. This results in more uniform heating of the electronic components, solving the problems of slow preheating speed and uneven temperature in existing technologies. Each electronic component in a preheating slot needs to pass through one full rotation of the heating drum before it is touched, ensuring thorough and uniform preheating and effectively improving the heating efficiency and accuracy of subsequent high-temperature tests.

[0032] This invention uses a roller for material storage, preheating, and feeding. Compared to existing pallet-based storage, preheating, and feeding solutions that can reciprocate, the roller occupies less space while preheating the same number of electronic components, which can significantly reduce the overall equipment width and improve workshop space utilization.

[0033] This invention achieves automatic positioning and batch testing of electronic components by setting a test slider and positioning detection components that can move linearly relative to each other in the testing mechanism. The reliable contact between the test piece on the test slider and the pins of the electronic components ensures the accuracy and reliability of the test.

[0034] This invention achieves a fully automated process from preheating, testing, sorting to cooling output by setting up a sorting mechanism to automatically sort qualified and unqualified products, and coordinating with a cooling mechanism to cool qualified electronic components after testing. This significantly improves testing efficiency and reduces labor costs and operational safety risks. Attached Figure Description

[0035] Figure 1 This is a schematic diagram of the structure of the present invention; Figure 2 This is a cross-sectional view of the present invention; Figure 3 for Figure 2 Sectional view along AA; Figure 4 This is a schematic diagram of the drum preheating mechanism of the present invention; Figure 5 This is a schematic diagram of the testing mechanism of the present invention; Figure 6 for Figure 5 A schematic diagram with some parts hidden; Figure 7 This is a schematic diagram of the sorting mechanism of the present invention; Figure 8 This is a schematic diagram of the material feeding mechanism of the present invention; Figure 9 This is a schematic diagram of the material feeding head of the present invention; Figure 10 This is a schematic diagram of the structure of the dial of the present invention; Figure 11 This is a schematic diagram of the cooling mechanism of the present invention; Figure 12 This is a schematic diagram of the structure of other sides of the present invention.

[0036] The arrows in the diagram indicate the direction of movement of the electrical components.

[0037] Reference numerals: 1. Frame; 2. Front feed channel; 21. Front stop; 22. Rear stop; 23. Front telescopic cylinder; 24. Rear telescopic cylinder; 3. Drum preheating mechanism; 31. Heating drum; 32. Preheating groove; 33. Sinking cavity; 34. Electric heating rod; 35. Baffle; 36. Temperature sensor; 37. Rotating shaft; 38. Servo motor; 4. Testing mechanism; 41. Testing channel; 42. Testing slider; 43. Heating block; 44. Test piece; 45. First telescopic cylinder; 46. Testing support; 47. Detection slot; 48. Fourth stop; 49. First fiber optic unit; 410. Second telescopic cylinder; 5. Sorting mechanism; 51. Sorting channel; 52. Air blowing head; 53. Material kicking channel; 54. First Y-axis linear module; 6. Rear discharge channel; 7. Feeding mechanism; 71. First feeding head; 72. Second feeding head; 721. Connecting plate; 73. Third feeding head; 74. Fourth feeding head; 75. Third telescopic cylinder; 76. Connecting arm; 77. Feeding head; 78. Second slider; 79. Fourth telescopic cylinder; 710. First X-axis linear module; 711. Second X-axis linear module; 712. Third X-axis linear module; 713. Feeding head seat; 714. Opening slot; 715. Feeding rod; 716. Pin; 717. Ejector pin; 718. Cone; 719. First compression spring; 720. Spring seat; 722. Bushing; 723. Second compression spring; 8. Cooling mechanism; 81. Second Y-axis linear module; 82. Feeding track; 83. Cover plate; 84. Cooling tank; 85. Heat dissipation hole; 86. Baffle plate; Detailed Implementation

[0038] The specific embodiments of the present invention will be described in further detail below with reference to the accompanying drawings and examples. The following examples are for illustrative purposes only and are not intended to limit the scope of the invention.

[0039] The following is for reference Figures 1 to 12 The present invention will be described as follows: This embodiment provides a high-temperature testing machine for electronic components, such as... Figure 1 As shown, the machine includes a frame 1, on which a front feeding channel 2, a drum preheating mechanism 3, a testing mechanism 4, a sorting mechanism 5, a rear discharge channel 6, and a feeding mechanism 7 are arranged sequentially along the X direction; the testing mechanism 4 is electrically connected to a controller, and the controller controls the operation of the drum preheating mechanism 3, the sorting mechanism 5, and the feeding mechanism 7.

[0040] like Figure 2As shown, the front-end feeding channel 2 is fixed on the frame 1 and is used to connect to the previous process or vibratory feeder, receiving and temporarily storing electronic components to be tested. A front stop 21 and a rear stop 22 are respectively fitted at both ends of the front-end feeding channel 2. The front stop 21 is fixed to the telescopic rod of the front telescopic cylinder 23, and the rear stop 22 is fixed to the telescopic rod of the rear telescopic cylinder 24. The front telescopic cylinder 23 and the rear telescopic cylinder 24 are fixed on the frame 1 and electrically connected to the controller. When the first feeding head 71 pushes the electronic components, the front stop 21 moves upward to block the material from the upstream side or vibratory feeder from entering the front-end feeding channel 2. When the first feeding head 71 moves to the other side of the rear stop 22, the rear stop 22 moves upward and the front stop 21 moves downward, allowing the material from the upstream side or vibratory feeder to enter the front-end feeding channel 2. The rear stop 22 controls the amount of material entering.

[0041] like Figures 2 to 4As shown, the drum preheating mechanism 3 includes a heating drum 31 that rotates around the X-axis. The outer wall of the heating drum 31 has multiple circumferentially distributed, axially extending preheating grooves 32, each used to accommodate multiple electronic components to be tested. A recessed cavity 33 with one open side is formed inside the heating drum 31. Multiple evenly distributed electric heating rods 34 are fitted inside the recessed cavity 33. One end of each electric heating rod 34 is fixed to a baffle 35, and a temperature sensor 36 is fixed to the baffle 35, extending into the recessed cavity 33. The open end of the recessed cavity 33 abuts against or is close to the baffle 35. The heating drum 31 is fixed to a rotating shaft 37, one end of which is connected to a servo motor 38 that drives its rotation. The rotating shaft 37 is rotatably connected to a frame 1, and the servo motor 38 is fixed to the frame 1. The temperature sensor 36 is electrically connected to a controller, which controls the servo motor 38 and the electric heating rods 34. Temperature sensor 36 detects the temperature inside the cavity 33 and transmits the signal to the controller. The controller controls the power of the electric heating rod 34 to maintain the temperature inside the cavity 33 within a target range (e.g., 180-200℃). Servo motor 38 drives heating roller 31 to rotate through a specific angle each time via shaft 37, ensuring the positional accuracy of preheating groove 32. Baffle 35 can block heat from the cavity 33 to reduce heat exchange with the outside atmosphere, and can also block electronic components inside the preheating groove 32 to prevent them from falling out. Baffle 35 has a notch communicating with the uppermost preheating groove 32 for easy discharge. Electric heating rod 34 is connected to the cavity 33 by a plug-in connection. When heating roller 31 rotates, electric heating rod 34 remains stationary, eliminating the need for brushes and simplifying the structure. At the same time, the relative rotation between electric heating rod 34 and heating roller 31 makes the heating effect of electric heating rod 34 on heating roller 31 more uniform, thereby improving the heating uniformity of electronic components. The inner wall of the preheating groove 32 on the heating roller 31 is provided with a high-temperature resistant insulating coating to prevent direct contact between electronic components and the heating roller 31, which could cause short circuits or contamination. The cross-sectional shape of the preheating groove 32 matches the contour of the electronic components to be tested, ensuring that the electronic components are neatly arranged within the preheating groove 32.

[0042] Initially, all preheating slots 32 are filled with workpieces, and the heating roller 31 preheats the electronic components within them. During testing, the second feeding head 72 of the feeding mechanism 7 pushes the electronic components from one of the preheating slots 32 (the first one) into the test channel 41. Simultaneously, the first feeding head 71 immediately pushes a certain number of electrical components from the front feeding channel 2 into the preheating slot 32 to replenish them. Then, the heating roller 31 rotates at a specific angle under the drive of the servo motor 38, aligning the adjacent preheating slot 32 with the front feeding channel 2 and the test channel 41. After the electronic components in the test channel 41 have been tested, the electronic components from the other preheating slot 32 (the second one) are pushed into the test channel 41 to replenish them. Through this scheme, each electronic component in the preheating slot 32 needs to undergo one full rotation of the heating roller 31 before it is turned over, allowing the heating roller 31 to heat the electronic components for a sufficient time, resulting in more uniform heating.

[0043] like Figure 5 and Figure 6 As shown, the testing mechanism 4 includes a testing channel 41 and a pair of test sliders 42 capable of linear relative movement. The pair of test sliders 42 are symmetrically arranged on both sides of the testing channel 41. The testing channel 41 is fixed to a heating block 43, which is fixedly connected to the frame 1. The heating block 43 has a built-in resistance wire, and the controller controls the resistance wire to heat the testing channel 41, so that the electronic components inside the testing channel 41 can be kept at a certain temperature (e.g., around 150°C), avoiding a sharp drop in temperature after entering the testing channel 41 from the heating roller 31, which would affect the testing performance. Multiple linearly distributed test pieces 44 are fixed on the test sliders 42. Each test slider 42 is connected to a first telescopic cylinder 45 that drives its translation. The first telescopic cylinder 45 is fixed to a test support 46, and the test slider 42 is slidably connected to the test support 46, which is fixed to the frame 1. The test pieces 44 are electrically connected to the controller, which contains a testing circuit. The lower part of the test channel 41 near the sorting channel 51 has a detection groove 47 formed therein. Each end of the detection groove 47 is provided with a liftable fourth stop 48 and a first optical fiber unit 49. The fourth stop 48 is fixed to the end of the telescopic rod of the second telescopic cylinder 410. The second telescopic cylinder 410 can drive the fourth stop 48 to move upward and insert it into the detection groove 47 and extend it into the test channel 41. The first optical fiber unit 49 is electrically connected to the controller through an optical fiber amplifier.

[0044] During testing, the third feed head 73 pushes the electronic components in the test channel 41 toward the sorting mechanism 5. When the two first fiber optic units 49, in conjunction with the fiber optic amplifier, detect electrical components (for example, the two first fiber optic units 49 correspond to the first and tenth electronic components in the test channel 41 closest to the sorting mechanism 5, respectively), the two second telescopic cylinders 410 drive the fourth stop 48 upward, positioning the ten electronic components between the two fourth stop 48. Then, the first telescopic cylinder 45 drives the test slider 42 toward the ten electronic components, causing the test piece 44 to abut against the pin of the corresponding electronic component for testing. The test results are recorded in the controller. The test channel 41 has a notch for the test slider 42 to insert. After testing, the fourth stop 48 moves downward to reset, and the fourth feed head 74 pushes the ten tested electronic components into the sorting channel 51. Then, the third feed head 73 pushes the remaining electronic components in the test channel 41, and so on, performing batch testing in groups of ten. When the number of electronic components in the test channel 41 is insufficient (i.e., when the first fiber unit 49, which is detecting the tenth electronic component, fails to detect the electronic component in conjunction with the fiber amplifier), the second feed head 72 pushes the electronic components in the corresponding preheating groove 32 on the heating roller 31 into the test channel 41 to replenish them.

[0045] like Figure 7 As shown, the sorting mechanism 5 includes a rejection component and a sorting channel 51 that can translate along the Y direction. The sorting channel 51 is fixed on the slider of the first Y-direction linear module 54, which is fixed on the frame 1 and electrically connected to the controller. The first Y-direction linear module 54 can drive the sorting channel 51 to translate in the Y direction. The rejection component includes an air blowing head 52 and a material ejection channel 53 that are respectively disposed on the frame. The air blowing head 52 is connected to a high-pressure air pipe, and a solenoid valve is provided on the high-pressure air pipe. The solenoid valve is electrically connected to the controller. When all the electronic components in a group that have entered the sorting channel 51 are qualified, the fourth material ejection head 74 pushes the group of electronic components from the sorting channel 51 into the rear discharge channel 6. If any of the electronic components in the group are defective, the first Y-axis linear module 54 drives the sorting channel 51 to move to the rejection component position, aligning the air blowing head 52 and the kicking channel 53 with the two ends of the sorting channel 51 respectively. The air blowing head 52 blows high-pressure gas to blow all the electronic components in the sorting channel 51 into the kicking channel 53, which is connected to the corresponding defective product collection cylinder. Then the sorting channel 51 moves back to its original position and aligns with the test channel 41.

[0046] like Figure 2 , Figures 8 to 10As shown, the feeding mechanism 7 includes a first feeding head 71, a second feeding head 72, a third feeding head 73, and a fourth feeding head 74. The first feeding head 71 is used to push the electronic components in the front feeding channel 2 into the preheating long groove 32; the second feeding head 72 is used to push the electronic components in the preheating long groove 32 into the testing channel 41; the third feeding head 73 is used to push the untested electronic components in the testing channel 41; and the fourth feeding head 74 is used to push the tested electronic components in the testing channel 41 to the sorting channel 51, and the electronic components in the sorting channel 51 are passively pushed to the rear discharge channel 6.

[0047] The first feed head 71, the second feed head 72, the third feed head 73, and the fourth feed head 74 have the same structure, all including a third telescopic cylinder 75, a connecting arm 76, and a feed head 77. The two ends of the connecting arm 76 are fixedly connected to the telescopic rod of the third telescopic cylinder 75 and the feed head 77, respectively. The third telescopic cylinder 75 can drive the connecting arm 76 to rise and fall, thereby driving the feed head 77 to rise and fall. The feed head 77 can be inserted between electronic components when it moves down, and it can be disengaged from the corresponding channel when it moves up. The third telescopic cylinder 75 of the first feeding head 71 is fixed to the connecting plate 721; the third telescopic cylinder 75 of the second feeding head 72 is fixed to the second slider 78, which is slidably connected to the connecting plate 721 and fixedly connected to the telescopic rod of the fourth telescopic cylinder 79, which is also fixed to the connecting plate 721; the connecting plate 721 is fixed to the slider of the first X-axis linear module 710; the third telescopic cylinder 75 of the third feeding head 73 is fixedly connected to the slider of the second X-axis linear module 711; the third telescopic cylinder 75 of the fourth feeding head 74 is fixedly connected to the slider of the third X-axis linear module 712. The first X-axis linear module 710, the second X-axis linear module 711, and the third X-axis linear module 712 are fixed to the frame 1 and electrically connected to the controller. The fourth telescopic cylinder 79 is used to increase the stroke of the second feeding head 72, so that all electronic components in the preheating long slot 32 can smoothly reach the test channel 41. Each linear module is preferably a servo linear module.

[0048] The dial 77 includes a dial seat 713 fixedly connected to a connecting arm 76. An opening groove 714 is formed within the dial seat 713, and a lever 715 is sleeved within the opening groove 714. The upper end of the lever 715 is rotatably connected to the opening groove 714 via a pin 716. A bushing 722 is fixed to the lower end of the lever 715 extending into the opening groove 714. A pin 717 is sleeved within the bushing 722, and a conical head 718 is formed at the lower end of the pin 717 extending into the bushing 722. One side of the lever 715 abuts against a horizontally arranged first compression spring 719, which is inserted into a spring seat 720 fixedly connected to the dial seat 713. The side of the lever 715 away from the first compression spring 719 abuts against the inner wall of the opening groove 714. A vertically arranged second compression spring 723 is clamped between the upper ends of the bushing 722 and the pin 717. When the dial 77 moves downward, the cone 718 is inserted between two adjacent electronic components. The lever 715 and the dial seat 713 are rotatably connected, allowing the cone 718 to swing at a certain angle to adapt to the insertion position. The second compression spring 723 acts as a buffer during the insertion process. Through the cooperation of the first compression spring 719 and the second compression spring 723, the insertion process is made more flexible, reducing damage to the electronic components.

[0049] The controller is a PLC controller, used to control the timing of the actions of the servo motor 38, each linear module (first Y-axis linear module 54, first X-axis linear module 710, second X-axis linear module 711, third X-axis linear module 712), each telescopic cylinder (front telescopic cylinder 23, rear telescopic cylinder 24, first telescopic cylinder 45, second telescopic cylinder 410, third telescopic cylinder 75, fourth telescopic cylinder 79) and solenoid valves, to achieve fully automated test process control. Specifically, the PLC controller has a pre-stored test process control program, which controls the actions of each actuator according to the following sequence: First, it controls the front telescopic cylinder 23 and the rear telescopic cylinder 24 to alternately operate to control the quantitative feeding of the front feeding channel 2; then, it controls the third telescopic cylinder 75 of the first X-axis linear module 710 and the first feeding head 71 to push the electronic components from the feeding channel into the preheating long groove 32; it controls the servo motor 38 to drive the heating roller 31 to rotate intermittently; it controls the second feeding head 72 to push the preheated electronic components into the test channel 41; it controls the first telescopic cylinder 45 to drive the test slider 42 to perform the test action; based on the test results, it controls the first Y-axis linear module 54 to drive the sorting channel 51 to translate and controls the solenoid valve to open and close to remove defective products; it controls the third X-axis linear module 712 to drive the fourth feeding head 74 to discharge the material. The PLC controller establishes a communication connection with the external testing machine to realize the interaction between the test trigger signal and the test completion signal, and coordinates the orderly progress of the test process.

[0050] Example 2, as Figure 1 , Figure 11As shown, this embodiment provides a high-temperature testing machine for electronic components. The difference from Embodiment 1 is that a cooling mechanism 8 is further provided between the sorting mechanism 5 and the rear discharge channel 6 to cool the high-temperature electronic components that have passed the test. The cooling mechanism 8 includes a second Y-axis linear module 81. A distributing track 82 is fixed on the slider of the second Y-axis linear module 81. A cover plate 83 is fixed to the upper end of the distributing track 82. The distributing track 82 and the cover plate 83 form multiple X-axis through-holes 84. Multiple heat dissipation holes 85 communicating with the cooling holes 84 are formed on the cover plate 83. One end of the cooling hole 84 near the rear discharge channel 6 is attached to a baffle plate 86. A feeding port is formed on the baffle plate 86, connecting the cooling hole 84 and the rear discharge channel 6. The width of the feeding port is approximately equal to the width of one cooling hole 84, allowing only electronic components within the aligned cooling hole 84 to pass through. The second Y-axis linear module 81 and the baffle plate 86 are fixed on the frame 1 and electrically connected to the controller.

[0051] The fourth feeding head 74 pushes qualified electronic components from the sorting channel 51 into the first cooling tank 84. The number of electronic components placed in each cooling tank 84 is the same as or an integer multiple of the number of components tested at one time. After the first cooling tank 84 is full of electronic components, the second Y-axis linear module 81 moves the distribution track 82 to align the adjacent second cooling tank 84 with the sorting channel 51. The above steps are repeated to fill all cooling tanks 84. Then, the first cooling tank 84 is aligned with the feed port and the sorting channel 51, and the fourth feeding head 74 pushes the electronic components from the sorting channel 51 into the first cooling tank 84. The electronic components originally in the first cooling tank 84 are squeezed out into the rear discharge channel 6. After all the electronic components originally in the first cooling tank 84 have been squeezed out, the distribution track 82 moves to align the second cooling tank 84 with the feed port and the sorting channel 51, and the same principle is used to squeeze out the electronic components in the second cooling tank 84. By setting up multiple cooling tanks 84, the electronic components have sufficient cooling time, ensuring that the electronic components are cooled to a safe temperature before output.

[0052] In summary, this invention fully and uniformly preheats electronic components through the drum preheating mechanism 3, achieves automated batch testing through the testing mechanism 4, automatically sorts qualified and unqualified products through the sorting mechanism 5, automatically cools the tested products through the cooling mechanism 8, and achieves fully automated material conveying through the feeding mechanism 7. It effectively overcomes the shortcomings of low testing efficiency, uneven preheating, and large equipment space occupation in the prior art, and has high industrial application value.

[0053] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of the present invention, and these improvements and modifications assumed above should also be considered within the scope of protection of the present invention.

Claims

1. A high-temperature testing machine for electronic components, comprising a frame (1), characterized in that: The frame (1) is provided with a front feeding channel (2), a drum preheating mechanism (3), a testing mechanism (4), a sorting mechanism (5), a rear discharge channel (6), and a feeding mechanism (7) in sequence along the X direction. The drum preheating mechanism (3) includes a heating drum (31) that rotates around the X-axis, and a plurality of circumferentially distributed axially extending preheating grooves (32) are provided on the outer wall of the heating drum (31). The testing mechanism (4) includes a testing channel (41) and a pair of test sliders (42) that can move linearly relative to each other. The test sliders (42) are symmetrically arranged on both sides of the testing channel (41). The preheating groove (32) of the heating drum (31) is connected to the front feed channel (2) and the testing channel (41). The sorting mechanism (5) includes a rejection component and a sorting channel (51) that can be translated along the Y direction; The sorting channel (51) can be connected to a rejection component, or Connect the end of the rear discharge channel (6) and the test channel (41) away from the heating drum (31).

2. The high-temperature testing machine for electronic components according to claim 1, characterized in that: The heating drum (31) has a recessed cavity (33) with an opening on one side. Multiple evenly distributed electric heating rods (34) are sleeved inside the recessed cavity (33). One end of the electric heating rod (34) is fixed on the baffle (35). A temperature sensor (36) is fixed on the baffle (35) and extends into the recessed cavity (33). The opening end of the recessed cavity (33) abuts against or is close to the baffle (35).

3. The high-temperature testing machine for electronic components according to claim 1, characterized in that: The test channel (41) is fixed on the heating block (43).

4. The high-temperature testing machine for electronic components according to claim 1, characterized in that: Multiple linearly evenly distributed test pieces (44) are fixed on the test slider (42). The test channel (41) has a detection channel (47) formed at the lower part of one end near the sorting channel (51). Each end of the detection channel (47) is provided with a liftable fourth stop (48) and a first optical fiber unit (49).

5. The high-temperature testing machine for electronic components according to claim 1, characterized in that: The rejection assembly includes an air blowing head (52) and a kicking channel (53) arranged opposite to each other; The sorting channel (51) is fixed on the slider of the first Y-axis linear module (54).

6. The high-temperature testing machine for electronic components according to claim 1, characterized in that: The feeding mechanism (7) includes a first feeding head (71), a second feeding head (72), a third feeding head (73) and a fourth feeding head (74); The first feeding head (71) is used to push the electronic components in the front feeding channel (2) into the preheating long groove (32); The second feeding head (72) is used to push the electronic components in the preheating long groove (32) into the test channel (41); The third feeding head (73) is used to push untested electronic components in the test channel (41); The fourth feeder head (74) is used to push the electronic components that have been tested in the test channel (41) to the sorting channel (51).

7. The high-temperature testing machine for electronic components according to claim 6, characterized in that: The first feeder head (71), the second feeder head (72), the third feeder head (73) and the fourth feeder head (74) have the same structure, including a third telescopic cylinder (75), a connecting arm (76) and a feeder head (77). The two ends of the connecting arm (76) are fixedly connected to the telescopic rod of the third telescopic cylinder (75) and the feeder head (77) respectively. The third telescopic cylinder (75) of the first feeding head (71) is fixed on the connecting plate (721); the third telescopic cylinder (75) of the second feeding head (72) is fixed on the second slider (78), the second slider (78) is slidably connected to the connecting plate (721) and fixedly connected to the telescopic rod of the fourth telescopic cylinder (79), the fourth telescopic cylinder (79) is fixed on the connecting plate (721); the connecting plate (721) is fixed on the slider of the first X-direction linear module (710); the third telescopic cylinder (75) of the third feeding head (73) is fixedly connected to the slider of the second X-direction linear module (711); The third telescopic cylinder (75) of the fourth feed head (74) is fixedly connected to the slider of the third X-direction linear module (712).

8. The high-temperature testing machine for electronic components according to claim 7, characterized in that: The dial (77) includes a dial seat (713) fixedly connected to the connecting arm (76). An opening groove (714) is formed in the dial seat (713). A lever (715) is sleeved in the opening groove (714). The upper end of the lever (715) is rotatably connected in the opening groove (714) by a pin (716). A bushing (722) is fixed to the lower end of the lever (715) extending into the opening groove (714). A pin (717) is sleeved in the bushing (722). A cone (718) is formed on the lower end of the pin (717) extending into the bushing (722). One side of the lever (715) rests against the first compression spring (719) arranged laterally. The first compression spring (719) is inserted into the spring seat (720), and the spring seat (720) is fixedly connected to the dial head seat (713). The side of the lever (715) away from the first compression spring (719) rests against the inner wall of the opening slot (714). A vertically positioned second compression spring (723) is held between the upper ends of the bushing (722) and the ejector pin (717).

9. A high-temperature testing machine for electronic components according to claim 7, characterized in that: The front feed channel (2) is fitted with a front stop (21) and a rear stop (22) at both ends.

10. A high-temperature testing machine for electronic components according to claim 1, characterized in that: A cooling mechanism (8) is provided between the sorting mechanism (5) and the rear discharge channel (6); The cooling mechanism (8) includes a second Y-axis linear module (81), a material distribution track (82) is fixed on the slider of the second Y-axis linear module (81), and a cover plate (83) is fixed on the upper end of the material distribution track (82). The material distribution track (82) and the cover plate (83) form a plurality of X-axis through cooling grooves (84). A plurality of heat dissipation holes (85) communicating with the cooling grooves (84) are formed on the cover plate (83). The cooling tank (84) is attached to the baffle plate (86), and the baffle plate (86) has a material conveying port formed on it. The material conveying port connects the cooling tank (84) and the rear discharge channel (6).

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