A plane survey point position determination method, device, equipment and medium

CN122813752APending Publication Date: 2026-09-25CHENGDU AIRCRAFT INDUSTRY GROUP
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Patent Information

Application Number
CN202610884264.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-06-18
Publication Date
2026-09-25

AI Technical Summary

Technical Problem

[0005]本申请提供一种平面测量点位的确定方法、装置、设备及介质,用以解决现有平面测量点位的确定方法存在点位的生成效率和精度较低的问题

Benefits of technology

[0016]与现有技术相比,本申请方法基于边界偏移值,将零部件边界向内偏移,从而构建测量可行域,避免了周边结构的干涉和加工误差的影响,保证后续测点均可实际测量;对可行域进行均匀采样得到目标采样点,从而以点云精准表征不规则平面轮廓形貌,兼顾表征精度与运算效率;对采样点坐标拟合得到主方向直线,配合垂直方向直线平移生成包络矩形,实现了自动适配异形平面的自然走向,将不规则平面归一为规则矩形;通过包络矩形边界尺寸与目标测点数量,分配横竖网格数并网格化生成测量点位,实现测点按平面模式自适应均匀排布,避免了局部疏密不均;通过目标测点数量与网格数的数值关系,判别初始测点规模并迭代优选输出最终测量点位,自动修正测点共线、数量超标或不足问题,无需第三方软件、全程自动化快速规划,实现输出数量合规、分布均匀、可达性好的测量点位,有效提升零部件平面检测精度与点位规划效率。

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Abstract

The application provides a plane measurement point position determination method, device, equipment and medium, used in the technical field of part detection, including: offsetting the part boundary inward to obtain a measurement feasible region, and performing straight line fitting on all target sampling points based on their respective sampling coordinates to obtain a target main direction straight line, respectively translating the target main direction straight line and the target perpendicular direction straight line outward to obtain a target envelope rectangle; determining the grid number corresponding to the main boundary and the perpendicular boundary respectively according to the main boundary value and the perpendicular boundary value corresponding to the target envelope rectangle and the target measurement point position number, and griding the target envelope rectangle to obtain an initial measurement point position number; judging the numerical size relationship corresponding to the initial measurement point position number based on the target measurement point position number and the grid number corresponding to the main boundary and the perpendicular boundary respectively, and determining the corresponding target measurement point position; in this way, the detection efficiency and accuracy of the part measurement point position are improved.
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Description

Technical Field

[0001] This application relates to the field of component testing technology, and in particular to a method, apparatus, equipment and medium for determining planar measurement points. Background Technology

[0002] In the process of manufacturing parts, it is necessary to measure various form and position errors such as flatness, perpendicularity, and position. This involves a large number of planar features, which are usually measured using a coordinate measuring machine (CMM). Before measurement, it is necessary to plan the measurement points for these planar features. In other words, the core pre-process of the CMM inspection work is the measurement point planning, which means determining reasonable sampling coordinate points on the plane to be measured in advance.

[0003] Existing methods for determining planar measurement points typically employ contour sampling for irregular planes. This method is suitable for small planes, but if the plane is large enough that there are insufficient measurement points inside, it cannot accurately characterize the features of the plane to be measured. Alternatively, third-party professional simulation software can be used to generate finite element meshes, which requires manual import of the model and setting of mesh parameters. This process is cumbersome and time-consuming, and finite element meshes are prone to distorted meshes, resulting in uneven density of the planned measurement points and a significant decrease in detection accuracy.

[0004] Therefore, existing methods for determining the location of planar measurement points suffer from low efficiency and accuracy in point generation. Summary of the Invention

[0005] This application provides a method, apparatus, equipment, and medium for determining plane measurement points, in order to solve the problems of low point generation efficiency and accuracy in existing methods for determining plane measurement points.

[0006] In a first aspect, this application provides a method for determining the location of plane measurement points, the method comprising: Based on the boundary offset value, the component boundary is offset inward to obtain the measurement feasible region. Based on the sampling interval, the measurement feasible region is uniformly sampled to obtain multiple target sampling points. Based on their respective sampling coordinates, a straight line is fitted to all target sampling points to obtain the target main direction line. Based on the target main direction line and its perpendicular target vertical direction line, the target main direction line and the target vertical direction line are translated outward to obtain the target envelope rectangle. Based on the principal boundary value and vertical boundary value corresponding to the target envelope rectangle and the number of target measurement points, determine the number of grids corresponding to the principal boundary and vertical boundary respectively, and based on the number of grids, grid the target envelope rectangle to obtain the initial number of measurement points; Based on the number of target measurement points and the number of grids corresponding to the main boundary and vertical boundary, the numerical relationship of the initial number of measurement points is determined, and the corresponding target measurement points are determined according to the numerical relationship.

[0007] In some embodiments of this application, the component boundary is offset inward based on the boundary offset value to obtain a feasible measurement domain, including: Based on the diameter of the measuring probe, the multiplication between the diameter and a preset coefficient is calculated to obtain the boundary offset value, and the feasible measurement region is determined according to the boundary offset value.

[0008] In some embodiments of this application, based on the sampling interval, the feasible measurement region is uniformly sampled to obtain multiple target sampling points, including: Based on the sampling interval, the feasible region for measurement is uniformly sampled to obtain multiple initial sampling points, and it is determined whether the number of initial sampling points is greater than a preset number threshold. If it is greater than the value of the preset increase factor and the sampling interval, the updated sampling interval is determined, and the feasible measurement region is uniformly sampled based on the updated sampling interval to obtain multiple target sampling point clouds. If it is not greater than, then the initial sampling point is determined as the target sampling point.

[0009] In some embodiments of this application, based on the target principal direction line and its perpendicular target vertical direction line, the target principal direction line and the target vertical direction line are translated outward to obtain a target envelope rectangle, including: Based on the target main direction line, determine the target vertical direction line that is perpendicular to each other, and translate the target main direction line and the target vertical direction line outward to obtain the main boundary and vertical boundary that are tangent to the boundary of the component respectively; The target envelope rectangle is determined based on the main boundary and the vertical boundary.

[0010] In some embodiments of this application, the number of grids corresponding to the main boundary and the vertical boundary is determined based on the main boundary value and the vertical boundary value corresponding to the target envelope rectangle and the number of target measurement points, including: The number of envelope measurement points is obtained by dividing the multiplication value between the principal boundary value, the vertical boundary value, and the number of target measurement points by the area of ​​the feasible measurement domain. Then, the number of envelope measurement points is multiplied by each divisor value to obtain the number of grids corresponding to the principal boundary and the vertical boundary.

[0011] In some embodiments of this application, the target envelope rectangle is gridded based on the number of grid points to obtain the initial number of measurement points, including: Based on the number of grids corresponding to each boundary, the target envelope rectangle is gridded, and multiple initial measurement points are determined according to the grid intersections of the target envelope rectangle after gridding. Determine whether the initial measurement points are on the same straight line and whether the line is parallel to any boundary. If so, then based on the boundary line perpendicular to the straight line, increase the number of grid points corresponding to the boundary line, and based on the increased number of grid points, mesh the target envelope rectangle to obtain multiple initial measurement points and their corresponding number of initial measurement points; If not, then the number of initial measurement points is determined as the initial measurement point quantity.

[0012] In some embodiments of this application, based on the number of target measurement points and the number of grids corresponding to the main boundary and vertical boundary, the numerical relationship of the initial number of measurement points is determined, and the corresponding target measurement points are determined according to the numerical relationship, including: The first comparison value is determined based on the difference between the number of target measurement points and the number of grids corresponding to the main boundary. The second and third comparison values ​​are determined based on the sum of the number of target measurement points and the number of grids corresponding to the main boundary and the vertical boundary, respectively. Based on the first comparison value, the second comparison value, and the third comparison value, determine the numerical relationship between the number of initial measurement points; If the number of initial measurement points is not less than the number of target measurement points and not greater than the third comparison value, then target measurement points are randomly selected from the corresponding initial measurement points based on the number of target measurement points. If the number of initial measurement points is less than the first comparison value, the number of grids corresponding to the vertical boundary is increased to obtain the updated number of grids; If the initial number of measurement points is not less than the first comparison value and less than the target number of measurement points, then increase the number of grids corresponding to the main boundary to obtain the updated number of grids; If the number of initial measurement points is greater than the third comparison value but not greater than the second comparison value, then reduce the number of grids corresponding to the main boundary to obtain the updated number of grids; If the number of initial measurement points is greater than the second comparison value, then reduce the number of grids corresponding to the main boundary to obtain the updated number of grids; Based on the updated grid number, the initial number of measurement points is determined, and the numerical relationship corresponding to the initial number of measurement points is iteratively determined to obtain the target measurement points.

[0013] Secondly, this application provides a device for determining the location of planar measurement points, the device comprising: The offset module is used to offset the boundary of the component inward based on the boundary offset value to obtain the measurement feasible region, and to uniformly sample the measurement feasible region based on the sampling interval to obtain multiple target sampling points; The fitting module is used to perform straight line fitting on all target sampling points based on their respective sampling coordinates to obtain the target main direction line. Based on the target main direction line and its perpendicular target vertical direction line, the target main direction line and the target vertical direction line are translated outward to obtain the target envelope rectangle. The determination module is used to determine the number of grids corresponding to the main boundary and vertical boundary based on the main boundary value and vertical boundary value of the target envelope rectangle and the number of target measurement points, and to mesh the target envelope rectangle based on the number of grids to obtain the initial number of measurement points; The judgment module is used to determine the numerical relationship between the number of initial measurement points and the number of grids corresponding to the main boundary and vertical boundary, based on the number of target measurement points and the number of grids corresponding to each of the main boundary and vertical boundary, and to determine the corresponding target measurement points based on the numerical relationship.

[0014] Thirdly, this application provides a computer device, including: a processor, and a memory communicatively connected to the processor; The memory stores the instructions that the computer executes; The processor executes computer execution instructions stored in memory to implement the method of this application.

[0015] Fourthly, this application provides a computer-readable storage medium storing program code, which, when executed by a processor, is used to implement the method of this application.

[0016] Compared with existing technologies, the method of this application is based on boundary offset values, which offsets the boundary of the component inward to construct a feasible measurement domain, avoiding the interference of surrounding structures and the influence of processing errors, and ensuring that subsequent measurement points can be actually measured. The feasible domain is uniformly sampled to obtain target sampling points, thereby accurately representing the irregular planar contour with point clouds, balancing representation accuracy and computational efficiency. The coordinates of the sampling points are fitted to obtain the main direction straight line, which, combined with the vertical straight line translation, generates an envelope rectangle, achieving automatic adaptation to the natural orientation of the irregular plane and normalizing the irregular plane into a regular rectangle. By using the boundary size of the envelope rectangle and the number of target measurement points, the number of horizontal and vertical grids is allocated and gridded to generate measurement points, achieving adaptive and uniform arrangement of measurement points according to the planar pattern, avoiding local uneven density. By using the numerical relationship between the number of target measurement points and the number of grids, the initial measurement point scale is determined and the final measurement point position is iteratively optimized, automatically correcting problems such as collinearity, excessive or insufficient measurement points. Without the need for third-party software, the entire process is automated and fast, achieving compliant, uniformly distributed, and accessible measurement points, effectively improving the accuracy of component planar inspection and the efficiency of point planning. Attached Figure Description

[0017] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0018] Figure 1 A flowchart illustrating a method for determining the location of planar measurement points provided in an embodiment of this application; Figure 2 A schematic diagram of the plane to be measured, provided for a method of determining the location of a plane measurement point according to an embodiment of this application; Figure 3 A schematic diagram of the measurement feasible region for a method for determining the location of planar measurement points provided in an embodiment of this application; Figure 4 A schematic diagram of the feasible region point cloud for a method of determining the location of planar measurement points provided in an embodiment of this application; Figure 5 A schematic diagram of the main direction line for a method of determining the location of a plane measurement point provided in an embodiment of this application; Figure 6 A schematic diagram of the envelope rectangle for a method of determining the location of planar measurement points provided in an embodiment of this application; Figure 7 A grid diagram illustrating a method for determining planar measurement points provided in an embodiment of this application; Figure 8 A schematic diagram of a device for determining the location of planar measurement points provided in an embodiment of this application; Figure 9 This is a structural block diagram of an apparatus for performing a method for determining a planar measurement point according to an embodiment of this application. Detailed Implementation

[0019] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.

[0020] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.

[0021] Figure 1 This is a flowchart illustrating a method for determining the location of planar measurement points, provided in an embodiment of this application. Figure 1 As shown, this method for determining the location of planar measurement points may include the following steps: S110. Based on the boundary offset value, offset the component boundary inward to obtain the measurement feasible region, and perform uniform sampling on the measurement feasible region based on the sampling interval to obtain multiple target sampling points.

[0022] Among them, the boundary offset value refers to the distance parameter by which the original boundary of the plane to be measured of the component is offset parallel to the inside of the plane. That is, as the offset distance parameter, it guides the boundary line to shrink inward. For example, the boundary offset value can be 3, which means that all the boundary lines of the original plane shrink 3mm inward.

[0023] The component boundary is the closed contour boundary line separating the measured plane from other surrounding structures and blank areas on the surface of the part design model or actual workpiece. It can be a regular rectangle or an arbitrary irregular curve / polyline boundary; please refer to... Figure 2 , Figure 2 A schematic diagram of the plane to be measured, provided in an embodiment of this application, illustrates a method for determining the location of planar measurement points; as shown. Figure 2 As shown, 1 represents the boundary of the component, which is the original geometric outer contour line of the plane to be measured of the component itself.

[0024] The feasible measurement region refers to the closed and effective measurement area enclosed by parallel inward offsetting according to the boundary offset value, using the original boundary of the component as a reference. It is the effective area of ​​the measured plane that the coordinate measuring machine (CMM) probe can reach and sample without collision or obstruction after eliminating surrounding interference zones and compensating for manufacturing errors. Please refer to [reference needed]. Figure 3 , Figure 3 A schematic diagram of the measurement feasible region for a method for determining the location of planar measurement points provided in this application embodiment; as shown. Figure 3 As shown, 1 represents the boundary of the component, d represents the boundary offset value, and 2 represents the closed effective measurement area formed by the parallel inward offset and contraction according to the boundary offset value.

[0025] The sampling interval refers to the linear distance between two adjacent sampling points when performing discrete uniform sampling within the feasible measurement region.

[0026] The target sampling point refers to the set of all discrete spatial coordinate points obtained after uniformly sampling within the feasible measurement region at a set sampling interval; this also constitutes the feasible region point cloud. Each point has unique three-dimensional spatial sampling coordinates, and all of them fall within the feasible measurement region. Please refer to... Figure 4 , Figure 4 A feasible region point cloud diagram illustrating a method for determining planar measurement points provided in this application embodiment; as shown. Figure 4 As shown, the feasible region 2 plane is discretized into feasible region point cloud 3 by uniform sampling.

[0027] Based on this, in practical applications, considering the manufacturing error of the parts and the interference of the surrounding structure, the boundary of the plane to be measured 1 is offset inward by a distance d to obtain the feasible measurement region 2, and uniform sampling is performed on the feasible measurement region 2.

[0028] S120. Based on their respective sampling coordinates, perform line fitting on all target sampling points to obtain the target main direction line. Based on the target main direction line and its perpendicular target vertical direction line, translate the target main direction line and the target vertical direction line outward to obtain the target envelope rectangle.

[0029] Among them, the target principal direction line is a straight line used to characterize the overall extension direction of the point cloud. It is an infinitely extending straight line, and its direction reflects the main orientation of the measurement feasible region in space. That is, it is the spatially optimal straight line characterizing the overall longest extension trend and overall orientation characteristics of the feasible region of the plane to be measured. Please refer to... Figure 5 , Figure 5 This is a schematic diagram of the main direction line of a method for determining the location of planar measurement points provided in an embodiment of this application; as shown. Figure 5 As shown, a straight line is fitted using the point cloud spatial coordinates within the feasible region point cloud 3 to obtain the main direction straight line 4.

[0030] The target vertical direction line is an auxiliary reference line that is geometrically orthogonal (mutually perpendicular) to the target main direction line in the space where the plane to be measured is located. The lateral extension reference line at 90 degrees to the main direction deflects synchronously with the angle of the main direction line, thus forming a pair of mutually perpendicular direction references with the target main direction line.

[0031] The target envelope rectangle is the smallest circumscribed closed rectangle formed by progressively translating parallel lines along two orthogonal directions, using the target's principal direction line and the target's perpendicular direction line as dual references, until each parallel line is tangent to and encloses the outermost boundary of the feasible measurement region. This rectangle completely encloses the entire feasible measurement region, with angles consistent with the principal direction of the plane, and serves as the smallest regular outer envelope geometry adaptable to irregular planar orientations. Please refer to [reference needed]. Figure 6 , Figure 6 A schematic diagram of the envelope rectangle for a method of determining the location of planar measurement points provided in an embodiment of this application; as shown. Figure 6 As shown, under the constraint of line 4 parallel to the main direction, find the two long sides of the envelope rectangle formed by the two parallel lines intersecting the feasible measurement region 2 on both sides; under the constraint of line 4 perpendicular to the main direction, find the two short sides of the envelope rectangle formed by the two parallel lines intersecting the feasible measurement region 2 on both sides; the two long sides and the two short sides together form the envelope rectangle 5.

[0032] Based on this, the target main direction line represents the overall extension direction of the point cloud, and the two long sides of the enclosing rectangle must be parallel to the main direction line to ensure that the rectangle is aligned with the direction of the feasible region. If the direction is not aligned, directly using an axis-aligned rectangle (i.e., a horizontal and vertical rectangle) to enclose an inclined plane will produce a redundant rectangle with a large area, resulting in uneven distribution of grid points in the diagonal direction. Since the plane to be tested is mostly arbitrary, irregular, curved, and has irregular aspect ratios, it is not possible to directly distribute points evenly using a standard grid. By completely enclosing the irregular feasible region with the target enclosing rectangle, the complex free geometric region is transformed into a standard rectangular regular region, which is compatible with the grid method uniform point distribution algorithm. Moreover, the long side of the rectangle is parallel to the main direction, and the short side is parallel to the vertical direction. The placement angle of the rectangle is completely consistent with the natural posture of the plane to be tested, and there will be no problems such as grid skew or excessive blank edges caused by forced straightening.

[0033] S130. Based on the principal boundary value and vertical boundary value corresponding to the target envelope rectangle and the number of target measurement points, determine the number of grids corresponding to the principal boundary and vertical boundary respectively, and based on the number of grids, grid the target envelope rectangle to obtain the initial number of measurement points.

[0034] Among them, the main boundary value refers to the overall side length dimension of the longitudinal extension direction of the target envelope rectangle with the target main direction line as the long side direction. In other words, it is the total length of the long side of the envelope rectangle parallel to the main direction. It is a linear dimension parameter that characterizes the envelope rectangle along the main extension direction of the plane. It corresponds to the longest extension span of the irregular plane to be measured and is the length of the long side of the rectangle that conforms to the natural direction of the plane.

[0035] The vertical boundary value is the overall side length of the target envelope rectangle in the horizontal span direction, with the straight line in the vertical direction of the target as the short side. It is the total length of the short side of the envelope rectangle parallel to the vertical direction. It is a linear dimension parameter that characterizes the horizontal width and narrowness of the envelope rectangle. It corresponds to the widest horizontal span of the plane to be measured. It is orthogonal to the main boundary value and together forms the length and width of the complete minimum envelope rectangle.

[0036] The target measurement point quantity refers to the total number of standard measurement points that must be collected on the plane to be measured according to the actual measurement needs. It is the total number of standard measurement points that are given by humans and rigidly specified by the process. That is, the rated number of sampling points required by the process when measuring coordinate measuring machines. It is a quantity constraint index that the point planning must meet. For example, if the target measurement point quantity is 50, it means that 50 measurement points need to be determined on the plane of the component.

[0037] The number of grid cells is divided into the number of primary boundary grid cells and the number of vertical boundary grid cells. The number of primary boundary grid cells is the number of segments into which the longer side (primary boundary value) of the envelope rectangle is equally divided; the number of vertical boundary grid cells is the number of segments into which the shorter side (vertical boundary value) of the envelope rectangle is equally divided. Please refer to [reference needed]. Figure 7 , Figure 7A grid diagram illustrating a method for determining the location of planar measurement points provided in an embodiment of this application; as shown. Figure 7 As shown, the number of equal segments into which the rectangle is divided to generate grid lines in both the horizontal and vertical directions determines the grid density and the total number of grid intersections.

[0038] The initial number of measurement points refers to the number of points that fall within the feasible measurement region among all grid intersections after the grid is generated within the envelope rectangle. These points are the candidate set of the final measurement points, which can be understood as the total number of original effective measurement points obtained after gridding and screening. It is the total number of effective sampling points that can actually be used for measurement under the current grid density, reflecting the actual scale of usable measurement points under the current grid layout.

[0039] Based on this, the length and width of the envelope rectangle are first determined by the main boundary value and the vertical boundary value. Combined with the number of target measurement points given by the process, the number of horizontal and vertical grids is calculated. Then, the envelope rectangle is gridded with the number of grids, and the number of initial measurement points is screened and counted so that the target measurement points required for this measurement can be further screened and determined.

[0040] S140. Based on the number of target measurement points and the number of grids corresponding to the main boundary and vertical boundary, determine the numerical relationship of the initial number of measurement points, and determine the corresponding target measurement points according to the numerical relationship.

[0041] Among them, the numerical size relationship refers to the size comparison interval relationship formed by the number of initial measurement points and the number of target measurement points, the number of main boundary grids, and the number of vertical boundary grids, respectively, according to the preset multi-interval judgment rules. These relationships are used to determine whether the current grid setting is appropriate and what kind of adjustment operation should be performed. That is, relying on this set of size relationships, it can automatically identify four states: too few, slightly too few, too many, and seriously exceeding the standard. Each state corresponds to a fixed grid number adjustment strategy to achieve automatic iteration without human intervention.

[0042] The target measurement points refer to a set of three-dimensional spatial coordinate points ultimately output by this solution. These points will be used in the automatic measurement program of the coordinate measuring machine. Each point represents the specific location where the probe needs to contact and collect data.

[0043] Based on this, by verifying both the quantity and shape and by adjusting the adaptive grid iteratively, the initial point layout deviation is corrected, and a target measurement point with a compliant quantity and uniform distribution is obtained, so that it can be directly used for coordinate measuring machine precision measurement.

[0044] Based on the feasible implementation of S110 described above, this application further provides a method for offsetting the component boundary inward according to the boundary offset value to obtain a feasible measurement domain, including: Based on the diameter of the measuring probe, the multiplication between the diameter and a preset coefficient is calculated to obtain the boundary offset value, and the feasible measurement region is determined according to the boundary offset value.

[0045] The preset coefficient refers to a pre-determined scaling factor used to increase the diameter of the measuring probe to the boundary offset value. It can be understood as the multiple of the boundary offset distance relative to the probe diameter. With the probe diameter unchanged, the larger the coefficient, the larger the calculated inward offset distance. For example, it can be 1.5, so when the diameter of the measuring probe is d, the corresponding boundary offset value is 1.5d.

[0046] Based on this, the boundary offset value is calculated by multiplying the diameter of the measuring probe by a preset coefficient.

[0047] Based on the feasible implementation of S110 described above, this application further provides a method for uniformly sampling the feasible measurement region based on the sampling interval to obtain multiple target sampling points, including: Based on the sampling interval, the feasible region for measurement is uniformly sampled to obtain multiple initial sampling points, and it is determined whether the number of initial sampling points is greater than a preset number threshold. If it is greater than the value of the preset increase factor and the sampling interval, the updated sampling interval is determined, and the feasible measurement region is uniformly sampled based on the updated sampling interval to obtain multiple target sampling point clouds. If it is not greater than, then the initial sampling point is determined as the target sampling point.

[0048] The initial sampling points refer to a set of original discrete spatial coordinate points directly generated within the feasible measurement domain by uniformly and discretely sampling at equal intervals according to the initially set original sampling interval. The number of points has not yet been judged to exceed the limit, and the spacing has not yet been updated and optimized.

[0049] The preset quantity threshold refers to a predetermined fixed critical value used to limit the maximum allowed total number of sampling point clouds, such as 10,000. It is a threshold value for determining whether the initial sampling points are overloaded and whether the sampling interval needs to be increased for resampling. If the number of initial sampling points is greater than the preset quantity threshold, it indicates that the current sampling points are dense and the sampling interval needs to be increased for sparse sampling. If the number of initial sampling points is not greater than the preset quantity threshold, it indicates that the sampling is qualified.

[0050] The preset amplification factor refers to a fixed proportional amplification constant that is predetermined. When the number of initial sampling points exceeds the preset number threshold, the updated sampling interval is determined by multiplying the preset amplification factor by the sampling interval. This factor is used to proportionally amplify the original sampling interval, increase the interval between adjacent sampling points, reduce the number of sampling points per unit area, and thus reduce the total number of sampling points, bringing it back to within the preset number threshold.

[0051] Based on this, the total number of initial sampling points is compared with the preset number threshold to determine whether the point cloud is overloaded or the computational load is excessive. If the number exceeds the limit, the original sampling interval is proportionally enlarged by a preset amplification factor to obtain an updated sampling interval and resample to generate target sampling points with reasonable density and compliant number. If the limit is not exceeded, the initial sampling points are directly used as target sampling points.

[0052] Based on the feasible implementation of S120 described above, this application further provides a method for obtaining a target envelope rectangle by translating the target main direction line and the target vertical direction line outward, respectively, based on the target main direction line and the target vertical direction line perpendicular to it. Based on the target main direction line, determine the target vertical direction line that is perpendicular to each other, and translate the target main direction line and the target vertical direction line outward to obtain the main boundary and vertical boundary that are tangent to the boundary of the component respectively; The target envelope rectangle is determined based on the main boundary and the vertical boundary.

[0053] The main boundary refers to the two parallel lines that are translated to the sides using the main direction line of the target as a parallel reference until the two translated lines are tangent to the outermost boundary of the plane to be measured (the feasible measurement domain) of the component. These two parallel and tangent boundary lines are the main boundaries. In other words, the main boundary is a pair of critical edge lines that are parallel to the main extension direction of the plane and limit the maximum longitudinal span of the envelope rectangle. They are also the lines containing the two long sides of the target envelope rectangle.

[0054] The vertical boundary refers to the two parallel lines that are translated to the sides using the vertical line of the target as a parallel reference until they are tangent to the outermost boundary of the plane to be measured (measuring feasible region) of the component. These two parallel tangent boundary lines are the vertical boundary. In other words, the vertical boundary is orthogonal to the main boundary and is a pair of critical edge lines that limit the lateral span of the envelope rectangle. It is also the line containing the two short sides of the target envelope rectangle.

[0055] Based on this, the least squares fitting of the line is performed using the point cloud spatial coordinates within the feasible region point cloud 3 to obtain the main direction line 4. Under the constraint of the main direction line 4, the two parallel lines that just intersect the measured feasible region 2 on both sides are found to form the two long sides of the envelope rectangle. Under the constraint of the line perpendicular to the main direction line 4, the two parallel lines that just intersect the measured feasible region 2 on both sides are found to form the two short sides of the envelope rectangle. The two long sides and the two short sides together form the envelope rectangle 5.

[0056] Based on the feasible implementation of S130 described above, this application further provides a method for determining the number of grids corresponding to the main boundary and the vertical boundary based on the main boundary value and the vertical boundary value corresponding to the target envelope rectangle and the number of target measurement points, including: The number of envelope measurement points is obtained by dividing the multiplication value between the principal boundary value, the vertical boundary value, and the number of target measurement points by the area of ​​the feasible measurement domain. Then, the number of envelope measurement points is multiplied by each divisor value to obtain the number of grids corresponding to the principal boundary and the vertical boundary.

[0057] Based on this, the principal boundary value can be represented by 'a', the vertical boundary value by 'b', the number of target measurement points by 'n', the area of ​​the feasible measurement region by 's', the number of envelope measurement points by 'm', the number of grids corresponding to the principal boundary by 'p1', and the number of grids corresponding to the vertical boundary by 'p2'. Then: ; ; In the formula This is the floor function.

[0058] Based on the feasible implementation of S130 described above, this application further provides a method for gridding the target envelope rectangle based on the number of grid points to obtain the initial number of measurement points, including: Based on the number of grids corresponding to each boundary, the target envelope rectangle is gridded, and multiple initial measurement points are determined according to the grid intersections of the target envelope rectangle after gridding. Determine whether the initial measurement points are on the same straight line and whether the line is parallel to any boundary. If so, then based on the boundary line perpendicular to the straight line, increase the number of grid points corresponding to the boundary line, and based on the increased number of grid points, mesh the target envelope rectangle to obtain multiple initial measurement points and their corresponding number of initial measurement points; If not, then the number of initial measurement points is determined as the initial measurement point quantity.

[0059] Among them, grid intersection points refer to the intersection nodes formed by drawing equidistant parallel grid lines along the long and short sides of the rectangle according to the grid number corresponding to the main boundary and the vertical boundary within the target envelope rectangle; and the intersection nodes formed by the perpendicular intersection of the vertical grid lines and the horizontal grid lines.

[0060] Based on this, in practical applications, it is determined whether the initial measurement points are on the same straight line. If they are on the same straight line and parallel to the long side of the rectangle, the number of grids P2 corresponding to the vertical boundary, that is, the short side of the rectangle, is increased by 1. If they are on the same straight line and parallel to the short side of the rectangle, the number of grids P1 corresponding to the main boundary, that is, the long side of the rectangle, is increased by 1. Based on the increased number of grids, the target envelope rectangle is re-grid so as to redetermine the number of initial measurement points.

[0061] Based on the feasible implementation of S140 described above, this application further provides a method for determining the numerical relationship between the initial number of measurement points and the corresponding grid numbers of the main boundary and vertical boundary, and determining the corresponding target measurement points based on the numerical relationship, including: The first comparison value is determined based on the difference between the number of target measurement points and the number of grids corresponding to the main boundary. The second and third comparison values ​​are determined based on the sum of the number of target measurement points and the number of grids corresponding to the main boundary and the vertical boundary, respectively. Based on the first comparison value, the second comparison value, and the third comparison value, determine the numerical relationship between the number of initial measurement points; If the number of initial measurement points is not less than the number of target measurement points and not greater than the third comparison value, then target measurement points are randomly selected from the corresponding initial measurement points based on the number of target measurement points. If the number of initial measurement points is less than the first comparison value, the number of grids corresponding to the vertical boundary is increased to obtain the updated number of grids; If the initial number of measurement points is not less than the first comparison value and less than the target number of measurement points, then increase the number of grids corresponding to the main boundary to obtain the updated number of grids; If the number of initial measurement points is greater than the third comparison value but not greater than the second comparison value, then reduce the number of grids corresponding to the main boundary to obtain the updated number of grids; If the number of initial measurement points is greater than the second comparison value, then reduce the number of grids corresponding to the main boundary to obtain the updated number of grids; Based on the updated grid number, the initial number of measurement points is determined, and the numerical relationship corresponding to the initial number of measurement points is iteratively determined to obtain the target measurement points.

[0062] The updated grid number refers to the number of new grid divisions obtained after adjusting the original number of main boundary grids P1 and vertical boundary grids P2 by adding or subtracting 1.

[0063] Iteration refers to repeatedly determining the numerical size relationship corresponding to the number of initial measurement points based on the number of initial measurement points, continuously adjusting the number of grids, and stopping iteration when after a certain round of iteration, the corresponding number of measurement points is not less than the target number of measurement points and not greater than the third comparison value, and then randomly selecting the target measurement points from the corresponding initial measurement points.

[0064] Based on this, in practical applications, it is judged whether the number of initial measurement points meets the requirements: If j < n-P1, increase P2 by 1, re-iterate to determine the numerical size relationship corresponding to the number of initial measurement points, and obtain the target measurement points; If n-P1 ≤ j < n, increase P1 by 1, re-iterate to determine the numerical size relationship corresponding to the number of initial measurement points, and obtain the target measurement points; If n+P2 < j ≤ n+P1, decrease P1 by 1, re-iterate to determine the numerical size relationship corresponding to the number of initial measurement points, and obtain the target measurement points; If n+P1 < j, decrease P2 by 1, re-iterate to determine the numerical size relationship corresponding to the number of initial measurement points, and obtain the target measurement points; Until n ≤ j ≤ n+P2, randomly select n points from j points as measurement points, end the process, and output the measurement points.

[0065] Based on the above steps, it can be seen that the present application offsets the boundary of the component inward based on the boundary offset value, thereby constructing a measurement feasible region, avoiding the influence of interference of surrounding structures and processing errors, and ensuring that all subsequent measurement points can be actually measured; uniform sampling is performed on the feasible region to obtain target sampling points, so that the irregular plane contour morphology can be accurately characterized by point clouds, taking into account both characterization accuracy and operation efficiency; the coordinates of sampling points are fitted to obtain a main direction straight line, which cooperates with vertical straight line translation to generate an envelope rectangle, realizing automatic adaptation to the natural trend of the special-shaped plane and normalizing the irregular plane into a regular rectangle; through the boundary size of the envelope rectangle and the number of target measurement points, the number of horizontal and vertical grids is allocated and measurement points are generated through gridding, realizing adaptive uniform arrangement of measurement points according to the plane mode and avoiding local uneven density; through the numerical relationship between the number of target measurement points and the number of grids, the scale of initial measurement points is discriminated and the final measurement points are output through iterative optimization, which automatically corrects the problems of collinear measurement points, excessive or insufficient number of measurement points, without requiring third-party software, and the whole process is automatic and fast planning, realizing output of measurement points with compliant quantity, uniform distribution and good accessibility, and effectively improving the plane detection accuracy of components and the efficiency of point planning.

[0066] Figure 8 is a schematic structural diagram of an apparatus for determining plane measurement points provided in an embodiment of the present application. As Figure 8 shown, the apparatus for determining plane measurement points comprises: an offset module, a fitting module, a determining module and a judging module; wherein: The offset module is used to offset the boundary of the component inward based on the boundary offset value to obtain the measurement feasible region, and to uniformly sample the measurement feasible region based on the sampling interval to obtain multiple target sampling points; The fitting module is used to perform straight line fitting on all target sampling points based on their respective sampling coordinates to obtain the target main direction line. Based on the target main direction line and its perpendicular target vertical direction line, the target main direction line and the target vertical direction line are translated outward to obtain the target envelope rectangle. The determination module is used to determine the number of grids corresponding to the main boundary and vertical boundary based on the main boundary value and vertical boundary value of the target envelope rectangle and the number of target measurement points, and to mesh the target envelope rectangle based on the number of grids to obtain the initial number of measurement points; The judgment module is used to determine the numerical relationship between the number of initial measurement points and the number of grids corresponding to the main boundary and vertical boundary, based on the number of target measurement points and the number of grids corresponding to each of the main boundary and vertical boundary, and to determine the corresponding target measurement points based on the numerical relationship.

[0067] In this embodiment of the application, the offset module can also be specifically used for: Based on the diameter of the measuring probe, the multiplication between the diameter and a preset coefficient is calculated to obtain the boundary offset value, and the feasible measurement region is determined according to the boundary offset value.

[0068] In this embodiment of the application, the offset module can also be specifically used for: Based on the sampling interval, the feasible region for measurement is uniformly sampled to obtain multiple initial sampling points, and it is determined whether the number of initial sampling points is greater than a preset number threshold. If it is greater than the value of the preset increase factor and the sampling interval, the updated sampling interval is determined, and the feasible measurement region is uniformly sampled based on the updated sampling interval to obtain multiple target sampling point clouds. If it is not greater than, then the initial sampling point is determined as the target sampling point.

[0069] In this embodiment of the application, the fitting module can also be specifically used for: Based on the target main direction line, determine the target vertical direction line that is perpendicular to each other, and translate the target main direction line and the target vertical direction line outward to obtain the main boundary and vertical boundary that are tangent to the boundary of the component respectively; The target envelope rectangle is determined based on the main boundary and the vertical boundary.

[0070] In this embodiment of the application, the determining module can also be specifically used for: The number of envelope measurement points is obtained by dividing the multiplication value between the principal boundary value, the vertical boundary value, and the number of target measurement points by the area of ​​the feasible measurement domain. Then, the number of envelope measurement points is multiplied by each divisor value to obtain the number of grids corresponding to the principal boundary and the vertical boundary.

[0071] In this embodiment of the application, the determining module can also be specifically used for: Based on the number of grids corresponding to each boundary, the target envelope rectangle is gridded, and multiple initial measurement points are determined according to the grid intersections of the target envelope rectangle after gridding. Determine whether the initial measurement points are on the same straight line and whether the line is parallel to any boundary. If so, then based on the boundary line perpendicular to the straight line, increase the number of grid points corresponding to the boundary line, and based on the increased number of grid points, mesh the target envelope rectangle to obtain multiple initial measurement points and their corresponding number of initial measurement points; If not, then the number of initial measurement points is determined as the initial measurement point quantity.

[0072] In this embodiment of the application, the determination module can also be specifically used for: The first comparison value is determined based on the difference between the number of target measurement points and the number of grids corresponding to the main boundary. The second and third comparison values ​​are determined based on the sum of the number of target measurement points and the number of grids corresponding to the main boundary and the vertical boundary, respectively. Based on the first comparison value, the second comparison value, and the third comparison value, determine the numerical relationship between the number of initial measurement points; If the number of initial measurement points is not less than the number of target measurement points and not greater than the third comparison value, then target measurement points are randomly selected from the corresponding initial measurement points based on the number of target measurement points. If the number of initial measurement points is less than the first comparison value, the number of grids corresponding to the vertical boundary is increased to obtain the updated number of grids; If the initial number of measurement points is not less than the first comparison value and less than the target number of measurement points, then increase the number of grids corresponding to the main boundary to obtain the updated number of grids; If the number of initial measurement points is greater than the third comparison value but not greater than the second comparison value, then reduce the number of grids corresponding to the main boundary to obtain the updated number of grids; If the number of initial measurement points is greater than the second comparison value, then reduce the number of grids corresponding to the main boundary to obtain the updated number of grids; Based on the updated grid number, the initial number of measurement points is determined, and the numerical relationship corresponding to the initial number of measurement points is iteratively determined to obtain the target measurement points.

[0073] Figure 9 This is a schematic diagram of the structure of an apparatus for performing a method for determining the location of a planar measurement point according to an embodiment of this application. Figure 9 As shown, the device includes: The device may include one or more processors with processing cores, one or more computer-readable storage media such as memory, communication components, etc. The processor, memory, and communication components are connected via a bus.

[0074] In the specific implementation process, at least one processor executes computer execution instructions stored in memory, causing at least one processor to execute the above-described method for determining the location of planar measurement points.

[0075] The specific implementation process of the processor can be found in the above method embodiments, and its implementation principle and technical effect are similar, so it will not be repeated here.

[0076] Furthermore, the processor can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), etc. A general-purpose processor can be a microprocessor or any conventional processor. The steps of the method disclosed in this application can be directly manifested as being executed by a hardware processor, or executed by a combination of hardware and software modules within the processor.

[0077] The memory may include random access memory (RAM) and may also include non-volatile memory (NVM), such as at least one disk storage device.

[0078] The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. Buses can be categorized as address buses, data buses, control buses, etc. For ease of illustration, the buses shown in the accompanying drawings are not limited to a single bus or a single type of bus.

[0079] In some embodiments, a computer program product is also provided, including a computer program or instructions that, when executed by a processor, implement the steps in any of the above-described methods for determining the location of planar measurement points.

[0080] For details on the implementation of each of the above operations, please refer to the previous examples, which will not be repeated here.

[0081] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be performed by instructions, or by instructions controlling related hardware. These instructions can be stored in a computer-readable storage medium and loaded and executed by a processor.

[0082] Therefore, embodiments of this application provide a computer-readable storage medium storing a plurality of program codes, which can be loaded by a processor to execute the steps in any of the methods for determining plane measurement points provided in embodiments of this application.

[0083] The storage medium may include: read-only memory (ROM), random access memory (RAM), disk or optical disk, etc.

[0084] According to one aspect of this application, a computer program product or computer program is provided, the computer program product or computer program including computer instructions stored in a computer-readable storage medium.

[0085] Since the instructions stored in the storage medium can execute the steps in any of the plane measurement point determination methods provided in the embodiments of this application, the beneficial effects that any of the plane measurement point determination methods provided in the embodiments of this application can achieve can be realized. For details, please refer to the previous embodiments, which will not be repeated here.

[0086] Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope of this application is indicated by the appended claims.

[0087] It should be understood that this application is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope.

Claims

1. A method for determining the location of a plane measurement point, characterized in that, The method includes: Based on the boundary offset value, the component boundary is offset inward to obtain the measurement feasible region, and based on the sampling interval, the measurement feasible region is uniformly sampled to obtain multiple target sampling points; Based on their respective sampling coordinates, a straight line is fitted to all the target sampling points to obtain the target main direction line. Based on the target main direction line and the target vertical direction line that is perpendicular to it, the target main direction line and the target vertical direction line are translated outward to obtain the target envelope rectangle. Based on the main boundary value and vertical boundary value corresponding to the target envelope rectangle and the number of target measurement points, determine the number of grids corresponding to the main boundary and vertical boundary respectively, and based on the number of grids, grid the target envelope rectangle to obtain the initial number of measurement points; Based on the number of target measurement points and the number of grids corresponding to the main boundary and the vertical boundary, the numerical relationship of the initial number of measurement points is determined, and the corresponding target measurement points are determined according to the numerical relationship.

2. The method according to claim 1, characterized in that, The step of offsetting the component boundary inward based on the boundary offset value to obtain the measurement feasible region includes: Based on the diameter of the measuring probe, the multiplication between the diameter and a preset coefficient is calculated to obtain the boundary offset value, and the feasible measurement region is determined according to the boundary offset value.

3. The method according to claim 1, characterized in that, The method of uniformly sampling the feasible measurement region based on the sampling interval to obtain multiple target sampling points includes: Based on the sampling interval, the feasible measurement region is uniformly sampled to obtain multiple initial sampling points, and it is determined whether the number of the initial sampling points is greater than a preset number threshold. If it is greater than, then the updated sampling interval is determined according to the product of the preset increase coefficient and the sampling interval, and the measurement feasible region is uniformly sampled based on the updated sampling interval to obtain multiple target sampling point clouds; If it is not greater than, then the initial sampling point is determined as the target sampling point.

4. The method according to claim 1, characterized in that, The step of translating the target main direction line and the target vertical direction line outward based on the target main direction line and the target vertical direction line respectively to obtain the target envelope rectangle includes: Based on the target main direction line, determine the target vertical direction line that is perpendicular to each other, and translate the target main direction line and the target vertical direction line outward to obtain the main boundary and vertical boundary that are tangent to the boundary of the component respectively; The target envelope rectangle is determined based on the main boundary and the vertical boundary.

5. The method according to claim 1, characterized in that, The step of determining the number of grids corresponding to the main boundary and vertical boundary based on the main boundary value and vertical boundary value corresponding to the target envelope rectangle and the number of target measurement points includes: Based on the multiplication value between the main boundary value, the vertical boundary value, and the number of target measurement points, the multiplication value is divided by the area value of the feasible measurement domain to obtain the corresponding number of envelope measurement points. Then, based on the division value between the main boundary value and the vertical boundary value, the number of envelope measurement points is multiplied by each of the division values ​​to obtain the number of grids corresponding to the main boundary and the vertical boundary.

6. The method according to claim 1, characterized in that, The step of gridding the target envelope rectangle based on the number of grid points to obtain the initial number of measurement points includes: Based on the number of grids corresponding to each boundary, the target envelope rectangle is gridded, and multiple initial measurement points are determined according to the grid intersections corresponding to the gridded target envelope rectangle. Determine whether the initial measurement points are on the same straight line and whether the straight line is parallel to any boundary; If so, then based on the boundary line perpendicular to the straight line, increase the number of grid points corresponding to the boundary line, and based on the increased number of grid points, mesh the target envelope rectangle to obtain multiple initial measurement points and their corresponding number of initial measurement point positions; If not, then the number corresponding to the initial measurement points is determined to be the number of initial measurement points.

7. The method according to claim 1, characterized in that, The step of determining the numerical relationship between the initial number of measurement points based on the number of target measurement points and the number of grids corresponding to the main boundary and the vertical boundary, and determining the corresponding target measurement points according to the numerical relationship, includes: The first comparison value is determined based on the difference between the number of target measurement points and the number of grids corresponding to the main boundary. The second and third comparison values ​​are determined based on the sum of the number of target measurement points and the number of grids corresponding to the main boundary and the number of grids corresponding to the vertical boundary, respectively. Based on the first comparison value, the second comparison value, and the third comparison value, determine the numerical relationship corresponding to the number of initial measurement points; If the number of initial measurement points is not less than the number of target measurement points and not greater than the third comparison value, then the target measurement points are randomly selected from the corresponding initial measurement points based on the number of target measurement points. If the number of initial measurement points is less than the first comparison value, then the number of grids corresponding to the vertical boundary is increased to obtain the updated number of grids; If the number of initial measurement points is not less than the first comparison value and is less than the number of target measurement points, then increase the number of grids corresponding to the main boundary to obtain the updated number of grids; If the number of initial measurement points is greater than the third comparison value but not greater than the second comparison value, then the number of grids corresponding to the main boundary is reduced to obtain the updated number of grids; If the number of initial measurement points is greater than the second comparison value, then the number of grids corresponding to the main boundary is reduced to obtain the updated number of grids; Based on the updated grid number, the number of initial measurement points is determined, and the numerical relationship corresponding to the number of initial measurement points is iteratively determined to obtain the target measurement points.

8. A device for determining the location of planar measurement points, characterized in that, The device includes: The offset module is used to offset the boundary of the component inward according to the boundary offset value to obtain the measurement feasible region, and to uniformly sample the measurement feasible region based on the sampling interval to obtain multiple target sampling points; The fitting module is used to perform straight line fitting on all the target sampling points based on their respective sampling coordinates to obtain the target main direction line, and based on the target main direction line and the target vertical direction line perpendicular to it, translate the target main direction line and the target vertical direction line outward to obtain the target envelope rectangle. The determination module is used to determine the number of grids corresponding to the main boundary and the vertical boundary based on the main boundary value and the vertical boundary value corresponding to the target envelope rectangle and the number of target measurement points, and to grid the target envelope rectangle based on the number of grids to obtain the initial number of measurement points; The judgment module is used to determine the numerical relationship between the number of initial measurement points and the number of grids corresponding to the main boundary and the vertical boundary, based on the number of target measurement points and the number of grids corresponding to the main boundary and the vertical boundary, and to determine the corresponding target measurement points according to the numerical relationship.

9. A computer device, characterized in that, include: One or more processors; Memory; One or more programs, wherein the one or more programs are stored in memory and configured to be executed by one or more processors, the one or more programs being configured to perform the method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores program code that can be called by a processor to perform the method as described in any one of claims 1 to 7.