Data acquisition device and data acquisition method

Abstract

The invention relates to a data acquisition device and a data acquisition method. Each time a driving speed is acquired during a vehicle performance test, processing circuitry identifies which speed region of a plurality of partitioned speed regions a target driving speed belongs to. The target driving speed is one of the acquired driving speeds. It is determined whether a reference value is less than or equal to a provisional reference value. One of the provisional reference values that is greater than or equal to a reference value is selected as a selected reference value. It is determined that a manner in which the vehicle performance test is performed satisfies a performance condition when the calculated values associated with the selected reference value in all speed regions are greater than or equal to a threshold value.

Description

[0001] Cross-reference to related applications

[0002] This application is based on and claims priority from Japanese Patent Application No. 2025-048381, filed on March 24, 2025, the entire contents of which are incorporated herein by reference. Technical Field

[0003] 1. Field

[0004] This disclosure relates to data acquisition equipment and data acquisition methods. Background Technology

[0005] 2. Description of related technologies

[0006] In Real-Drive Emissions (RDE) testing, vehicle performance is tested on public roads or similar roadways. The components of the exhaust emissions emitted during vehicle performance testing are analyzed. Vehicle performance testing is required to meet predetermined performance conditions.

[0007] The vehicle performance testing device disclosed in JP2019-203888A shows the driver a driving operation mode that meets the performance conditions during vehicle performance testing. Summary of the Invention

[0008] The present invention is provided to present in a simplified form the selection of concepts further described below in the detailed description. The present invention is not intended to identify key or essential features of the claimed subject matter, nor is it intended to be used as an aid in determining the scope of the claimed subject matter.

[0009] In one general aspect, a data acquisition device installed on a vehicle includes a processing circuit system and a storage device. The processing circuit system is configured to acquire the vehicle's travel speed multiple times. The processing circuitry is configured to perform the following each time a vehicle's driving speed is acquired during a vehicle performance test: identify which of several speed zones the target driving speed belongs to, where the target driving speed is one of the acquired driving speeds; update the sum of the quotient obtained by dividing the target driving speed by the number of times the multiple driving speeds in the identified speed zone are acquired and the quotient obtained by dividing the cumulative value of the multiple driving speeds in the identified speed zone other than the target driving speed by the number of acquisitions, as the average vehicle speed in the identified speed zone; calculate a reference value, which is the product of the vehicle's target driving speed and acceleration; determine whether the reference value is less than or equal to a temporary reference value, which is the value output by the function when the average vehicle speed is input to the output reference value in the identified speed zone, and this temporary reference value is one of the temporary reference values ​​corresponding to multiple speed zones; and for each temporary reference value, update the calculated value with the ratio of the number of reference values ​​less than or equal to the temporary reference value to the number of reference values ​​belonging to the identified speed zone and stored in the storage device. The processing circuitry is configured to perform the following actions after the vehicle performance test is completed: by checking information stored in a storage device; calculating multiple reference values ​​in the corresponding speed regions; selecting one of the temporary reference values ​​that is greater than or equal to the multiple reference values ​​as the selected reference value; determining that the method of conducting the vehicle performance test meets the performance conditions when the calculated values ​​related to the selected reference value in all speed regions are greater than or equal to a threshold; and determining that the method of conducting the vehicle performance test does not meet the performance conditions when the calculated values ​​related to the selected reference value in at least one speed region are less than the threshold.

[0010] In another general aspect, a data acquisition device installed on a vehicle includes a processing circuit system and a storage device. The processing circuit system is configured to acquire the vehicle's travel speed multiple times. The processing circuitry is configured to perform the following each time a vehicle's driving speed is acquired during a vehicle performance test: identify which of a plurality of segmented speed zones the target driving speed belongs to, the target driving speed being one of the acquired driving speeds; update the sum of the quotient obtained by dividing the target driving speed by the number of acquisitions of the plurality of driving speeds in the identified speed zone and the quotient obtained by dividing the cumulative value of the plurality of driving speeds in the identified speed zone other than the target driving speed by the number of acquisitions, as the average vehicle speed in the identified speed zone; calculate a reference value, which is the product of the vehicle's target driving speed and acceleration; determine whether the reference value is less than or equal to a temporary reference value, which is the value output by the function when the average vehicle speed is input to the output reference value in the identified speed zone, and the temporary reference value is one of the temporary reference values ​​corresponding to the plurality of speed zones; and for each temporary reference value, update the number of reference values ​​belonging to the identified speed zone and the number of reference values ​​less than or equal to the temporary reference value stored in the storage device to the calculated value. The processing circuit system is configured to, after the vehicle performance test is completed, perform the following by checking information stored in a storage device: calculating a reference value for each speed region; selecting one of the temporary reference values ​​greater than or equal to the reference value as the selected reference value; for each speed region among multiple speed regions, calculating the ratio of the number of reference values ​​less than or equal to the selected reference value to the number of reference values ​​belonging to that speed region; determining that the method of conducting the vehicle performance test meets the performance conditions when the ratio of less than or equal to the maximum reference value in all speed regions is greater than or equal to a threshold; and determining that the method of conducting the vehicle performance test does not meet the performance conditions when the ratio in at least one speed region is less than the threshold.

[0011] The aforementioned data acquisition equipment can determine whether the method of vehicle performance testing meets the specified performance conditions without requiring a relatively large storage capacity.

[0012] Whether the data collected through vehicle performance testing is suitable for analysis performed during vehicle performance testing and meets performance conditions is determined based on calculated values ​​indicating continuous operation during the vehicle performance testing period. As the calculated value, a value based on the Vapos value can be used. The Vapos value is the product of the vehicle's speed and acceleration during the vehicle performance testing period.

[0013] For example, multiple driving speeds collected during vehicle performance testing are continuously stored until the end of the test. After the test, acceleration is calculated based on the historical driving speed data. In this way, all Vapos values ​​during the vehicle performance test can be calculated. However, when calculating Vapos values ​​in this way to collect the calculated values, a relatively large storage capacity is required to store the data collected throughout the vehicle performance test.

[0014] The goal is to determine whether a vehicle performance testing method meets specified performance conditions without requiring a relatively large storage capacity. The above configuration solves this problem.

[0015] Other features and aspects will be apparent from the following detailed description, drawings and claims. Attached Figure Description

[0016] Figure 1 This is a schematic diagram illustrating the configuration of a vehicle equipped with a data acquisition device according to the first embodiment.

[0017] Figure 2 This is a flowchart illustrating a series of processes performed by the data acquisition device of the comparative example.

[0018] Figure 3 This is a table showing the time points at which the driving speed, vehicle speed, vehicle acceleration, and Vapos values ​​were collected by the data acquisition device of the comparative example.

[0019] Figure 4 This is a scatter plot showing the relationship between the driving speed collected by the data acquisition device of the comparative example through vehicle performance testing and the Vapos value calculated based on the driving speed.

[0020] Figure 5 This shows the calculation of the Vapos value by... Figure 1 A flowchart of a series of processes performed by the data acquisition device.

[0021] Figure 6 It is shown Figure 1 A diagram illustrating how data acquisition devices calculate Vapos values.

[0022] Figure 7 It is a graph of a function used to calculate the baseline value in the low-speed region LVR.

[0023] Figure 8 It is a graph of a function used to calculate the baseline value in the MVR in the medium speed region.

[0024] Figure 9 It is a graph of a function used to calculate the baseline value in the high-speed region HVR.

[0025] Figure 10 It is shown by Figure 1 The flowchart shows a series of processes performed by the data acquisition device when updating the pass rate (OR).

[0026] Figure 11 It is shown by Figure 1 The flowchart shows a series of processes performed by the data acquisition device during the counting process.

[0027] Figure 12 It is shown by Figure 1 The flowchart shows a series of processes performed by the data acquisition device to determine whether the pass rate (OR) meets the performance conditions.

[0028] Figure 13 It is shown by Figure 1 The flowchart shows a series of processes performed by the data acquisition equipment to determine whether the method of conducting vehicle performance testing meets the performance conditions.

[0029] Figure 14 This is a flowchart illustrating a series of processes in a counting process performed by a data acquisition device according to a second embodiment.

[0030] Figure 15 This is a flowchart illustrating a series of processes performed by the data acquisition device according to the second embodiment when determining whether the pass rate OR meets the performance conditions.

[0031] Throughout the accompanying drawings and detailed description, the same reference numerals refer to the same elements. The drawings may not be drawn to scale, and for clarity, illustration, and convenience, the relative sizes, proportions, and depictions of elements in the drawings may be exaggerated. Detailed Implementation

[0032] This specification provides a comprehensive understanding of the described methods, apparatus, and / or systems. Modifications and equivalents of the described methods, apparatus, and / or systems will be readily apparent to those skilled in the art. The sequences of operations are exemplary and may be changed as will be apparent to those skilled in the art, except for operations that must occur in a specific order. Descriptions of functions and constructions well-known to those skilled in the art may be omitted.

[0033] Exemplary embodiments may take different forms and are not limited to the examples described. However, the examples described are thorough and complete and convey the full scope of this disclosure to those skilled in the art.

[0034] In this specification, "at least one of A and B" should be understood to mean "only A, only B, or both A and B".

[0035] Figures 1 to 13The illustrations depict a data acquisition device, a data acquisition method, a data acquisition process, a storage medium, a program product, and a program according to a first embodiment of the present disclosure.

[0036] Structure of vehicle 100

[0037] like Figure 1 As shown, vehicle 100 includes exhaust monitoring device 10, engine 20, data acquisition device 50, and vehicle speed sensor 53. The data acquisition device 50 and exhaust monitoring device 10 are implemented by at least one of one or more electronic control units of vehicle 100.

[0038] like Figure 1 As shown, the data acquisition device 50 includes a processing circuit system 51 and a storage device 52. The storage device 52 is a data acquisition memory module that stores programs or program code. The processing circuit system 51 is a data acquisition processing circuit that executes various processes by executing programs or program code stored in the storage device 52. The processing circuit system 51 includes a processor.

[0039] like Figure 1 As shown, the data acquisition device 50 is communicatively connected to the vehicle speed sensor 53. The vehicle speed sensor 53 measures the travel speed of the vehicle 100. Specifically, the vehicle speed sensor 53 outputs the travel speed of the vehicle 100 per second based on the rotational speed of the output shaft of the vehicle 100. The data acquisition device 50 periodically acquires the travel speed of the vehicle 100 from the vehicle speed sensor 53 while the vehicle 100 is in motion. That is, the data acquisition device 50 acquires the travel speed multiple times.

[0040] like Figure 1 As shown, the exhaust monitoring device 10 includes an exhaust monitoring processing circuit system 11 and an exhaust monitoring storage device 12. The exhaust monitoring storage device 12 stores programs or program code. The exhaust monitoring processing circuit system 11 performs various processes by executing the programs or program code stored in the exhaust monitoring storage device 12. The exhaust monitoring processing circuit system 11 includes a processor.

[0041] Exhaust monitoring device 10 monitors the composition of exhaust gas from engine 20. Exhaust monitoring device 10 collects information about the composition of exhaust gas from various sensors. For example, exhaust monitoring device 10 collects the concentration of nitrogen oxides contained in the exhaust gas from a nitrogen oxide sensor installed in the exhaust pipe of engine 20.

[0042] Overview of vehicle performance testing

[0043] Vehicle performance testing needs to be conducted on roads such as public roads to meet predetermined performance conditions. Data acquisition device 50 collects the travel speed of vehicle 100 during the vehicle performance test. Based on the collected travel speed, data acquisition device 50 determines whether the method of conducting the vehicle performance test of vehicle 100 meets the specified performance conditions.

[0044] Specifically, the data acquisition device 50 calculates a reference value based on the acquired driving speed. Then, the data acquisition device 50 calculates a calculated value based on the reference value, and determines whether the method of conducting the vehicle performance test of vehicle 100 meets the specified performance conditions based on the calculated value. The reference value and the calculated value will be described later. When the data acquisition device 50 determines that the method of conducting the vehicle performance test of vehicle 100 meets the specified performance conditions, the exhaust monitoring device 10 analyzes the components in the exhaust gas released from vehicle 100 during the vehicle performance test.

[0045] The exhaust monitoring device 10 monitors the components of the exhaust gas released during vehicle performance testing of vehicle 100 and stores information about the components in storage device 12. The exhaust monitoring device 10 analyzes the components in the exhaust gas released by vehicle 100 during vehicle performance testing based on the information about the exhaust gas components collected during the vehicle performance testing.

[0046] Determining whether the performance conditions are met in the comparison examples

[0047] Figures 2 to 4 The illustration shows a comparative example of a data acquisition device used to determine whether the method used to perform vehicle performance testing on vehicle 100 meets specified performance conditions. The comparative example's data acquisition device is installed... Figure 1 On vehicle 100 shown. In the comparison example described below, the data acquisition device is compared with... Figure 1 The difference with the data acquisition device 50 is that it is implemented as an external device installed on the vehicle 100, rather than as one or more electronic control units that are components of the vehicle 100. In the following text, the data acquisition device of the comparative example will be referred to as an external device.

[0048] During vehicle performance testing, an external device periodically collects the driving speed of vehicle 100 from vehicle speed sensor 53. The external device continues to store all driving speeds collected during vehicle performance testing in a storage device until the vehicle performance testing ends.

[0049] Figure 2 This illustrates a series of procedures performed by an external device to determine whether the manner in which vehicle performance testing of vehicle 100 is conducted meets performance conditions. After the vehicle performance testing of vehicle 100 has been completed, the external device performs… Figure 2 The series of processes shown below. Figure 2In this context, S represents a step.

[0050] When it begins Figure 2 During the series of processes shown, the external device first executes process S11. In process S11, the external device calculates the Vapos value.

[0051] The Vapos value is the product of the vehicle's speed and acceleration during vehicle performance testing. In the Vapos value, the symbol 'V' indicates the initial 'speed'. The second letter 'a' indicates 'acceleration'. The last three letters 'pos' indicate 'positive'. The Vapos value is a reference value used to determine whether the method of conducting the vehicle performance test on vehicle 100 meets the performance requirements.

[0052] Method for calculating Vapos value in comparison examples

[0053] Figure 3 This is a table showing the time points at which the vehicle 100's speed was collected by an external device, the vehicle 100's speed, acceleration, and Vapos values. References will be made below. Figure 3 Describes how external devices calculate Vapos values.

[0054] exist Figure 3 In this context, the time points at which external devices collect driving speed data are represented by symbols, each symbol consisting of a combination of the letter T and a number. Figure 3 In this context, the number appended after T corresponds to the number of times the external device has collected the vehicle's speed data. For example, T1 indicates the time point during which the external device first collected the vehicle's speed data during the vehicle performance test.

[0055] exist Figure 3 In this context, the speed of vehicle 100 is represented by symbols, each consisting of a combination of the letter V and a number. Figure 3 In this context, the number appended to V corresponds to the time point at which the driving speed was collected. For example, V1 indicates the driving speed of vehicle 100 collected by an external device at time T1.

[0056] exist Figure 3 In the diagram, the acceleration of vehicle 100 is represented by symbols, each consisting of a combination of the letters AC and numbers. Figure 3 In the diagram, the number following AC corresponds to the time point at which the driving speed was collected. For example, AC2 is the acceleration of vehicle 100 at time T2.

[0057] When calculating acceleration at a given point in time, the external device calculates the acceleration at that point in time based on the travel speed measured at a location immediately before and immediately after that point in time. For example, when the external device calculates AC2, it calculates AC2 as shown in Equation 1 below.

[0058] Equation 1

[0059] In Equation 1 above, MT is the measurement time required from when the vehicle speed sensor 53 measures and collects the driving speed one time before a given time point until the vehicle speed sensor 53 measures and collects the driving speed one time after that given time point. As mentioned above, the vehicle speed sensor 53 outputs the driving speed every second. Therefore, in Equation 1, MT, which is the measurement time from time point T1 when collecting V1 to time point T3 when collecting V3, is two seconds. In this way, when the external device calculates the acceleration at a given time point, the external device calculates the acceleration at that time point by dividing the difference between the driving speed measured and collected one time after that time point and the driving speed measured and collected one time before that time point by the measurement time.

[0060] exist Figure 3 In this language, Vapos values ​​are represented by symbols, each consisting of a combination of the letter Va and a number. Figure 3 In the equation, the number appended after Va corresponds to the time at which the driving speed was collected. For example, Va2 is the product of V2 and AC2, where V2 is the driving speed at time T2 and AC2 is the acceleration at time T2. The external device calculates the Vapos value by multiplying the driving speed of vehicle 100 by the acceleration at the time point at which the driving speed was collected.

[0061] After the vehicle performance test is completed, the external device first calculates the acceleration corresponding to all driving speeds stored in the storage device during process S11. That is, the external device calculates the acceleration corresponding to all time points preceding time point T2 during the vehicle performance test. Subsequently, the external device calculates the Vapos value corresponding to all time points preceding time point T2 during the vehicle performance test.

[0062] Pass Rate Determination Process

[0063] like Figure 2 As shown, the external device executes process S11, and then executes process S12. In process S12, the external device executes the pass rate determination process.

[0064] The pass rate is the ratio of the number of Vapos values ​​calculated by the external device to the number of all Vapos values ​​calculated based on all driving speeds collected during the vehicle performance test. In other words, the pass rate is a value calculated by the external device based on the Vapos values ​​used as a reference.

[0065] Figure 4 The diagram illustrates how the external device performs the pass rate determination process.

[0066] Figure 4 This is a scatter plot showing the relationship between driving speed collected by external devices through vehicle performance testing and Vapos values ​​calculated based on driving speed.

[0067] Figure 4 Three velocity regions are shown. (For example...) Figure 4 As shown, the speed zones include the Low-Speed ​​Zone (LVR), Medium-Speed ​​Zone (MVR), and High-Speed ​​Zone (HVR). The Low-Speed ​​Zone (LVR) is the speed range of 60 km / h or less. The Medium-Speed ​​Zone (MVR) is the speed range greater than 60 km / h and less than 90 km / h. The High-Speed ​​Zone (HVR) is the speed range greater than 90 km / h and less than 145 km / h. Figure 4 In the diagram, depending on the driving speed, the point indicating the relationship between the driving speed and the Vapos value is plotted within one of the three speed zones.

[0068] External devices calculate a baseline value for each speed range based on the driving speeds collected during vehicle performance testing. Within each speed range, the external devices compare the Vapos value plotted within that speed range with the calculated baseline value.

[0069] Figure 4 In addition to showing the points indicating the relationship between driving speed and Vapos value, lines indicating the function used to calculate the two reference values—namely, the first reference value and the second reference value—are also shown.

[0070] The function used to calculate the first reference value is represented by the following Equation 2, where RV1 represents the first reference value and Vavg represents the average vehicle speed.

[0071] Equation 2

[0072] The function used to calculate the second reference value RV2 is represented by the following equation 3, where RV2 represents the second reference value and Vavg represents the average vehicle speed.

[0073] Equation 3

[0074] The external device calculates the average vehicle speed plotted within each speed zone. Figure 4 An example of the average vehicle speed for each speed zone, calculated by an external device, is shown. Figure 4 In this context, VLavg represents the average vehicle speed within the low-speed region (LVR). Figure 4 In the MVR, VMAvg represents the average vehicle speed in the medium-speed region. Figure 4 In this context, VHavg represents the average vehicle speed in the high-speed region (HVR). The following section will describe the situation when external devices have already calculated... Figure 4 The average vehicle speed shown is the method by which external devices calculate the throughput.

[0075] The external device determines the baseline value for each speed zone by substituting the average vehicle speed within each zone into Equations 2 and 3. When the calculated average vehicle speed is less than or equal to 74.6 km / h, the external device outputs the first baseline value RV1 by substituting the calculated average vehicle speed into Equation 2 above. When the calculated average vehicle speed is greater than 74.6 km / h, the external device outputs the second baseline value RV2 by substituting the calculated average vehicle speed into Equation 3 above.

[0076] exist Figure 4 In the example shown, VLavg, representing the average vehicle speed in the low-speed zone (LVR), is less than or equal to 74.6 km / h. Figure 4 In the example, the external device outputs the first reference value RV1 by substituting VLavg into Equation 2. Figure 4 The baseline value RVL in the equation is the first baseline value RV1 output by substituting VLavg into Equation 2. That is, in Figure 4 In this case, RVL is the benchmark value for LVR in the low-speed region.

[0077] exist Figure 4 In the example shown, VMAvg, representing the average vehicle speed in the medium-speed MVR region, is less than or equal to 74.6 km / h. Figure 4 In the example, the external device outputs the first baseline value RV1 by substituting VMavg into Equation 2. Figure 4 The baseline value RVM is the first baseline value RV1 output by substituting VMavg into Equation 2. That is, in Figure 4 In the example, RVM is the baseline value for MVR in the medium speed region.

[0078] exist Figure 4 In the example shown, the average vehicle speed VHavg in the high-speed region (HVR) is greater than 74.6 km / h. Figure 4 In the example, the external device outputs the second reference value RV2 by inputting VHavg into Equation 3 above. Figure 4 The baseline value RVH in the equation represents the second baseline value RV2 output by substituting VHavg into Equation 3. That is, in Figure 4 In the example, RVH is the baseline value for HVR in the high-speed region.

[0079] During the pass rate determination process, the external device calculates a baseline value for each speed zone and then determines whether the pass rate for each speed zone is greater than or equal to a threshold. In the comparison example, the threshold is 95%. During the pass rate determination process, for each speed zone, the external device determines whether the ratio of the number of Vapos values ​​drawn within the speed zone that are less than or equal to the baseline value of the speed zone to the total number of Vapos values ​​drawn within the speed zone is greater than or equal to 95%.

[0080] To determine whether the pass rate is greater than or equal to a threshold, the external device plots Vapos values ​​in ascending order for each speed region. When the 95th percentile Vapos value plotted in each speed region is at or below the baseline value for that speed region, the external device determines that the pass rate for that speed region is greater than or equal to the threshold.

[0081] Specifically, to determine whether the throughput in the low-speed region LVR is greater than or equal to a threshold, external devices plot Vapos values ​​within the low-speed region LVR in ascending order. When the Vapos value plotted within the low-speed region LVR is at or below the 95th percentile... Figure 4 When the RVL is in the low-speed region, the external device determines that the throughput in the LVR is greater than or equal to the threshold.

[0082] To determine whether the throughput in the medium-speed MVR is greater than or equal to a threshold, external devices plot Vapos values ​​within the medium-speed MVR in ascending order. Vapos values ​​plotted within the medium-speed MVR that are at or below the 95th percentile are considered valid. Figure 4 When performing RVM, the external device determines that the throughput in the medium-speed region of the MVR is greater than or equal to a threshold.

[0083] To determine whether the throughput in the high-speed zone HVR is greater than or equal to a threshold, external devices plot Vapos values ​​within the high-speed zone HVR in ascending order. Vapos values ​​at the 95th percentile within the high-speed zone HVR are considered valid if they are at or below a certain threshold. Figure 4 When the RVH is reached, the external device determines that the throughput in the high-speed region HVR is greater than or equal to the threshold.

[0084] Performance conditions determined based on pass rate

[0085] like Figure 2 As shown, after executing the pass rate determination process, the external device advances the process to S13. In S13, the external device determines whether the pass rate meets the performance conditions.

[0086] During process S13, when the throughput in all speed regions is determined to be greater than or equal to the threshold, the external device determines that the throughput meets the performance conditions. During process S13, when the throughput in at least one speed region is determined to be less than the threshold, the external device determines that the throughput does not meet the performance conditions.

[0087] When the external device determines that the pass rate meets the performance conditions in process S13 (S13: Yes), the external device proceeds to S14. In S14, the external device determines that the method of performing the vehicle performance test on vehicle 100 meets the performance conditions. Afterward, the external device terminates. Figure 2 The series of processes shown.

[0088] When it is determined that the pass rate does not meet the performance conditions in process S13 (S13: No), the external device proceeds the process to S15. In process S15, the external device determines that the method used to perform the vehicle performance test on vehicle 100 does not meet the performance conditions. Afterward, the external device terminates the process. Figure 2 The series of processes shown.

[0089] As described above, when the performance conditions are determined to be met in the pass rate determination, the external device determines that the method of performing the vehicle performance test of vehicle 100 meets the performance conditions.

[0090] The external device must continue to store all driving speeds collected during the vehicle performance test in the storage device until the vehicle performance test is completed. This is necessary so that the external device can access the data after the vehicle performance test has ended. Figure 2 The method shown determines whether the vehicle performance test of vehicle 100 meets the performance requirements. In this case, external devices require a relatively large storage capacity. Therefore, one or more electronic control units, which are components of vehicle 100, are difficult to function as external devices.

[0091] Determination of whether performance conditions are met by data acquisition device 50

[0092] Compared to the comparative example above, data acquisition device 50 can determine whether the method of conducting vehicle performance testing meets performance conditions while reducing the amount of data to be stored. In the following text, reference will be made to the appendix... Figures 5 to 13 The description data acquisition device 50 determines whether the method of conducting vehicle performance testing meets the performance conditions.

[0093] The method by which data acquisition device 50 calculates Vapos values

[0094] Figure 5 This illustrates a series of processes performed by the data acquisition device 50 when calculating the Vapos value. When the driving speed is acquired from the vehicle speed sensor 53 during vehicle performance testing of vehicle 100, this is performed by the processing circuitry system 51. Figure 5 The series of processes shown. In Figure 5 In this context, S represents a step.

[0095] When it begins Figure 5 During the series of processes shown, the processing circuit system 51 first executes process S21. In process S21, the processing circuit system 51 calculates the previous acceleration ACn-1.

[0096] Figure 6 The diagram illustrates how the processing circuit system 51 calculates the Vapos value.

[0097] exist Figure 6 In this context, Vn-2 is the vehicle speed of 100 previously measured and acquired by the processing circuit system 51. That is, the reference speed is... Figure 5 The series of processes shown begins with the travel speed Vn, and Vn-2 represents the travel speed measured two times prior to it. In other words, Vn-2 is the speed measured two times before that.

[0098] exist Figure 6 In this context, Vn-1 is the vehicle speed of 100, which is collected by the processing circuit system 51 in a previous measurement. That is, the reference is... Figure 5 The series of processes shown depicts the driving speed collected at the start, where Vn-1 is the driving speed collected in the previous measurement. In other words, Vn-1 is the speed collected in the last measurement.

[0099] exist Figure 6 In this measurement, Vn is the vehicle speed of 100 collected by the processing circuit system 51. In other words, Vn is... Figure 5 The series of processes shown depicts the travel speed collected at the start. In other words, Vn is the speed collected in this instance.

[0100] For reference Figure 3 As described, the Vapos value is the product of the driving speed and the acceleration at the time point when that driving speed was collected. During process S21, the processing circuit system 51 calculates the acceleration of the vehicle 100 at the time point when the last speed was collected. At this time, as... Figure 6 As shown, the processing circuit system 51 calculates the previous acceleration ACn-1 based on Vn-2 and Vn in the same manner as Equation 1 above.

[0101] After calculating the previous acceleration, the processing circuit system 51 proceeds to S22. During S22, the processing circuit system 51 determines whether the previous acceleration is greater than a predetermined acceleration. The predetermined acceleration is, for example, 0.1 m / s². 2 .

[0102] When it is determined during process S22 that the previous acceleration was greater than the specified acceleration (S22: Yes), the processing circuit system 51 advances the process to S23. During process S23, the processing circuit system 51 calculates the previous Vapos value. At this time, as... Figure 6 As shown, the processing circuit system 51 calculates the product of the previous acquisition velocity Vn-1 and the previous acceleration ACn-1, which has already been calculated in S21, as the previous Vapos value. Then, the processing circuit system 51 terminates. Figure 5 The series of processes shown.

[0103] In this way, each time the driving speed is collected during the vehicle performance test, the processing circuit system 51 calculates the previous Vapos value as a reference value.

[0104] When it is determined during process S22 that the previous acceleration is less than or equal to the specified acceleration (S22: No), the processing circuit system 51 terminates. Figure 5 The process is illustrated in the following steps. That is, when the current acceleration is less than or equal to the specified acceleration (S22: No), the processing circuit system 51 does not calculate the Vapos value.

[0105] Overview of the pass rate OR calculated by data acquisition device 50

[0106] Unlike the throughput of external devices, the data acquisition device 50 calculates the throughput OR as the ratio of the number of Vapos values ​​less than or equal to a temporary reference value in the speed range to the number of Vapos values ​​belonging to that speed range. The throughput OR is a value calculated by the data acquisition device 50 based on Vapos values ​​used as a reference value. In the following text, the reference value will be referred to as... Figures 7 to 9 Describes the pass rate OR calculated by data acquisition device 50.

[0107] As described above, the reference value in the speed region is calculated by inputting the average vehicle speed in the speed region into a function used to calculate the first reference value or a function used to calculate the second reference value.

[0108] A temporary reference value is a predetermined value among multiple values ​​output by the function used to calculate the reference value in a speed region. Multiple temporary reference values ​​are defined for each speed region.

[0109] Figure 7 This shows the calculation Figure 4The graph shown is a function of the baseline value in the low-speed zone (LVR). The low-speed zone (LVR) is the speed range of 60 km / h or less. Therefore, the average vehicle speed in the low-speed zone (LVR) is always less than or equal to 74.6 km / h. Figure 7 Only the straight line representing the function used to calculate the first reference value RV1 is shown as a function used to calculate the reference value in the low-speed region LVR.

[0110] exist Figure 7 The document defines four temporary reference values, RVL1 to RVL4. RVL1 is... Figure 7 VL1, as the average vehicle speed, is input into Equation 2, where the first reference value RV1 is output. RVL2 is... Figure 7 VL2, as the average vehicle speed, is input into Equation 2, where the first reference value RV1 is output. RVL3 is... Figure 7 VL3, as the average vehicle speed, is input into Equation 2, where the first reference value RV1 is output. RVL4 is... Figure 7 VL4, as the average vehicle speed, is input into Equation 2, where the first reference value RV1 is output. Figure 7 In the middle, the speed decreases in the order of VL4, VL3, VL2, and VL1. Figure 7 In this process, the temporary reference values ​​decrease in the order of RVL4, RVL3, RVL2, and RVL1.

[0111] As shown in Equations 2 and 3, the function used to calculate the baseline value produces a larger baseline value as the driving speed increases. Figure 7 In this context, VL4 is 60 km / h, representing the maximum speed within the low-speed range of the LVR. Therefore, RVL4 is the maximum value of the baseline output within the low-speed range of the LVR.

[0112] Figure 8 This shows the calculation Figure 4 The graph shown is a function of the baseline values ​​in the medium-speed zone MVR. The medium-speed zone MVR is the speed range greater than 60 km / h and within 90 km / h or less. In the medium-speed zone MVR, where the average vehicle speed is less than or equal to 74.6 km / h, a first baseline value RV1 is calculated based on the average vehicle speed. In the medium-speed zone MVR, where the average vehicle speed is greater than 74.6 km / h, a second baseline value RV2 is calculated based on the average vehicle speed. Therefore, Figure 8 The diagram shows a straight line indicating a function for calculating the first reference value RV1 and a straight line indicating a function for calculating the second reference value RV2, as functions for calculating reference values ​​in the MVR region of the medium speed range.

[0113] exist Figure 8The document defines four temporary baseline values, RVM1 to RVM4. RVM1 is... Figure 8 VM1, as the average vehicle speed, is input into Equation 2, where it is the first reference value RV1 output. RVM2 is... Figure 8 VM2, as the average vehicle speed, is input into Equation 2, where the first reference value RV1 is output. RVM3 is... Figure 8 VM3, as the average vehicle speed, is input into Equation 3, where the output is the second reference value RV2. RVM4 is... Figure 8 VM4, as the average vehicle speed, is input into Equation 3, where the output is the second reference value RV2. Figure 8 In the sequence, speed decreases from VM4, VM3, VM2, to VM1. Figure 8 In this process, the temporary reference values ​​decrease in the order of RVM4, RVM3, RVM2, and RVM1.

[0114] exist Figure 8 In this context, VM4 represents 90 km / h, which is the maximum speed in the medium-speed MVR range. Therefore, RVM4 is the maximum value of the baseline output in the medium-speed MVR range.

[0115] Figure 9 This shows the calculation Figure 4 The graph shown is a function of the baseline value in the high-speed zone HVR. The high-speed zone HVR is the speed range greater than 90 km / h and within 145 km / h or less. Therefore, the average vehicle speed in the high-speed zone HVR is always greater than 74.6 km / h. Figure 9 Only the straight line representing the function used to calculate the second reference value RV2 is shown as a function used to calculate the reference value in the high-speed region HVR.

[0116] exist Figure 9 The document defines four temporary reference values, RVH1 to RVH4. RVH1 is... Figure 9 VH1, as the average vehicle speed, is input into Equation 3, where the output is the second reference value RV2. RVH2 is... Figure 9 VH2, as the average vehicle speed, is input into Equation 3, where the output is the second reference value RV2. RVH3 is... Figure 9 VH3, as the average vehicle speed, is input into Equation 3, where the output is the second reference value RV2. RVH4 is... Figure 9 VH4, as the average vehicle speed, is input into Equation 3, where the output is the second reference value RV2. Figure 9 In the middle, the speed decreases in the order of VH4, VH3, VH2, and VH1. Figure 9 In this process, the temporary reference values ​​decrease in the order of RVH4, RVH3, RVH2, and RVH1.

[0117] exist Figure 9 In this context, VH4 is 145 km / h, representing the maximum speed within the high-speed HVR region. Therefore, RVH4 is the maximum value of the baseline output within the high-speed HVR region.

[0118] exist Figures 7 to 9 In this design, four temporary reference values ​​are defined for each speed range. These temporary reference values ​​for each speed range are not limited to... Figures 7 to 9 As shown. Each speed zone can have two, three, or five or more temporary reference values. Furthermore, the number of temporary reference values ​​can vary within a speed zone.

[0119] The data acquisition device 50 compares the calculated Vapos value with multiple temporary reference values ​​within the speed region to which the Vapos value belongs. For each temporary reference value, the data acquisition device 50 calculates the pass rate (OR).

[0120] Data acquisition device 50 update pass rate OR method

[0121] Each time the Vapos value is calculated, the data acquisition device 50 compares the Vapos value with a temporary baseline value and calculates the pass rate OR. Each time the pass rate OR is calculated, the data acquisition device 50 updates the pass rate OR stored in the storage device 52.

[0122] Figure 10 This illustrates a series of processes performed by the data acquisition device 50 when updating the pass rate OR. Figure 10 The series of processes shown is executed by the processing circuit system 51. The processing circuit system 51 executes the process each time the Vapos value is calculated during the vehicle performance test of vehicle 100. Figure 10 The process shown is a series of steps. In other words, the processing circuit system 51 executes... Figure 5 Execution after S23 in the process Figure 10 The process is illustrated in the series of steps shown. Therefore, when it is determined in step S22 that the previous acceleration is less than or equal to the specified acceleration (S22: No), the processing circuit system 51 does not execute the procedure. Figure 10 The series of processes shown. In Figure 10 In this context, S represents a step.

[0123] At the beginning Figure 10 In the series of processes shown, the processing circuit system 51 first executes process S31. During process S31, the processing circuit system 51 identifies the speed range to which the calculated Vapos value belongs. Figure 5In step S31, the processing circuit system 51 calculates the previous Vapos value based on the previous acquisition velocity and the previous acceleration. In step S31, the processing circuit system 51 identifies the previous acquisition velocity as belonging to... Figures 7 to 9 Which velocity region is shown in the diagram?

[0124] Subsequently, the processing circuit system 51 executes process S32. In process S32, the processing circuit system 51 executes a counting process. The counting process involves comparing the Vapos value with a temporary threshold and updating the calculated value.

[0125] Figure 11 This illustrates a series of processes performed by the data acquisition device 50 during the counting process. Figure 11 The series of processes shown are executed by the processing circuit system 51. Figure 11 In this context, S represents a step.

[0126] Processing circuit system 51 performs processing on each temporary reference value in the velocity region identified during process S31. Figure 11 The process is illustrated in the following steps. For example, during process S31, the low-speed region LVR is identified as the region to which the Vapos value belongs, and a boundary is defined within the low-speed region LVR. Figure 7 When the four temporary reference values ​​RVL1 to RVL4 are shown, the processing circuit system 51 performs the following for each of the temporary reference values ​​RVL1 to RVL4: Figure 11 The series of processes shown is repeated once.

[0127] At the start of the counting process, the processing circuit system 51 first executes the process S41. During the process S41, the processing circuit system 51 determines whether the Vapos value calculated in the process S23 is less than or equal to the temporary reference value.

[0128] When it is determined in process S41 that the Vapos value is less than or equal to the temporary reference value (S41: Yes), the processing circuit system 51 proceeds the process to S42. In process S42, the processing circuit system 51 determines to update the pass count. The pass count is the number of Vapos values ​​that are less than or equal to the temporary reference value.

[0129] Following process S42, processing circuit system 51 proceeds to process S43. If, during process S41, it is determined that the Vapos value is greater than the temporary reference value (S41: No), processing circuit system 51 further proceeds to S43. During process S43, processing circuit system 51 updates a pair of count values ​​to the current count value.

[0130] For each temporary reference value, the data acquisition device 50 stores a pair of count values ​​in the storage device 52. Each pair of count values ​​is a combination of the number of Vapos values ​​belonging to the speed range and the throughput associated with the temporary reference value. During process S43, the processing circuit system 51 updates the pair of count values ​​associated with the temporary reference values ​​that were compared with the Vapos values ​​during process S41.

[0131] When process S43 is executed after process S42, the processing circuit system 51 increments each of the pair of count values—the number of Vapos values ​​belonging to the speed region and the pass count associated with the temporary reference value. When process S43 is executed after determining in process S41 that the Vapos value is greater than the temporary reference value (S41: No), the processing circuit system 51 only increments the number of Vapos values ​​belonging to the speed region—which is one of the pair of count values. In other words, in this case, the pass count associated with the temporary reference value—which is one of the pair of count values—does not increment.

[0132] After updating a pair of count values, the processing circuit system 51 executes process S44. During S44, the processing circuit system 51 calculates the throughput OR related to a temporary reference value compared with the Vapos value during process S41. At this time, the processing circuit system 51 calculates the throughput OR as the ratio of the throughput count related to the temporary reference value to the number of multiple Vapos values ​​belonging to the speed region.

[0133] Subsequently, the processing circuit system 51 executes process S45. During process S45, the processing circuit system 51 updates the throughput OR stored in the storage device 52.

[0134] Storage device 52 stores the pass rate OR calculated for each temporary benchmark value during vehicle performance testing. Processing circuitry 51 updates the pass rate OR stored in storage device 52 and associated with the temporary benchmark value compared with the Vapos value in process S41 to the pass rate OR calculated in process S44. Afterward, processing circuitry 51 terminates. Figure 11 The series of processes shown.

[0135] In this manner, the data acquisition device 50 calculates the pass rate OR as the calculated value, and updates the pass rate OR stored in the storage device 52 each time the driving speed is collected during the vehicle performance test of the vehicle 100.

[0136] The process performed after the counting process during vehicle performance testing.

[0137] The processing circuit system 51 performs a counting process on all temporary reference values ​​in the speed range identified during process S31, and then proceeds to S33. During process S33, the processing circuit system 51 calculates the incremental travel distance.

[0138] The incremental travel distance is the distance traveled by vehicle 100 from the time the data acquisition device 50 last acquired its speed to the time the data acquisition device 50 last acquired its speed. As mentioned above, the vehicle speed sensor 53 outputs the vehicle 100's speed every second. Therefore, the incremental travel distance is the distance traveled by vehicle 100 in one second. For example, when... Figure 6 When Vn-1 is 60 km / h, the incremental distance from the acquisition time of Vn-2 to the acquisition time of Vn-1 is 1 / 3600 of 60 km. During S33, the processing circuit system 51 calculates the incremental travel distance based on the speed last acquired by the data acquisition device 50.

[0139] Subsequently, the processing circuit system 51 proceeds to S34. During S34, the processing circuit system 51 calculates the accumulated incremental travel distance value. The storage device 52 stores the accumulated incremental travel distance value for each speed range during the vehicle performance test of vehicle 100. During S34, the processing circuit system 51 calculates the accumulated incremental travel distance value for the speed ranges already identified during S31 based on the information stored in the storage device 52.

[0140] Subsequently, the processing circuit system 51 proceeds to S35. During S35, the processing circuit system 51 updates the accumulated incremental travel distance value stored in the storage device 52. At this time, the processing circuit system 51 uses the accumulated value calculated in S34 to update the accumulated incremental travel distance value in the speed range identified in S31, which has already been stored in the storage device 52.

[0141] Subsequently, the processing circuit system 51 executes process S36. During process S36, the processing circuit system 51 calculates the most recent average vehicle speed.

[0142] Storage device 52 stores the average vehicle speed for each speed range during the vehicle performance test. In process S36, processing circuit system 51 calculates the most recent average vehicle speed for the speed range already identified in process S31. The most recent average vehicle speed is calculated using the following equation 4.

[0143] Equation 4

[0144] In Equation 4, VNavg represents the most recent average vehicle speed in the speed region already identified during process S31.

[0145] In Equation 4, V1 is the previously measured speed of vehicle 100. That is, V1 corresponds to... Figure 6 Vn-1 in the equation. In other words, V1, or Vn-1, is the target speed.

[0146] In Equation 4, VPavg represents the average vehicle speed within the speed range identified during process S31, which is currently stored in storage device 52. In other words, VPavg represents the most recent average vehicle speed prior to the acquisition of V1 in Equation 4.

[0147] In Equation 4 above, NC represents the count of the most recent average vehicle speed, including the currently calculated speed. In other words, NC is the number of times the vehicle speed belongs to the speed range already identified in process S31.

[0148] In Equation 4 above, NC-1 represents the calculation count excluding the most recent average vehicle speed currently being calculated. In Equation 4, the product of VPavg and NC-1 represents the cumulative driving speed value excluding V1 within the speed range already identified during process S31. In other words, the product of VPavg and NC-1 is the cumulative value of multiple driving speeds within the identified speed range, excluding the target driving speed (V1). That is, VNavg in Expression 4 represents the sum of the quotient obtained by dividing the target driving speed (V1) by the number of times (NC) multiple driving speeds within the identified speed range are collected, and the quotient obtained by dividing the cumulative value of multiple driving speeds within the identified speed range, excluding the target driving speed (V1) (VPavg×(NC-1)) by the number of collections NC.

[0149] Subsequently, the processing circuit system 51 executes process S37. During S37, the processing circuit system 51 updates the most recent average vehicle speed stored in the storage device 52. At this time, the processing circuit system 51 updates the most recent average vehicle speed within the speed range already identified during process S31, stored in the storage device 52. Then, the processing circuit system 51 terminates. Figure 10 The series of processes shown.

[0150] Performance conditions determined based on pass rate OR

[0151] After the vehicle performance test performed by vehicle 100 is completed, data acquisition device 50 determines whether the pass rate meets the performance requirements. Figure 12 This illustrates a series of procedures performed by the data acquisition device 50 when the pass rate OR is determined to meet performance conditions. Figure 12The series of processes shown are executed by the processing circuit system 51 after the vehicle performance test of vehicle 100 is completed. After the vehicle performance test conducted by vehicle 100 is completed, the processing circuit system 51 performs the following for each speed range: Figure 12 The series of processes shown. In Figure 12 In this context, S represents a step.

[0152] At the beginning Figure 12 During the series of processes shown, the processing circuit system 51 first executes process S51. In process S51, the processing circuit system 51 calculates the reference value in the speed region.

[0153] For reference Figure 10 The storage device 52 stores the most recent average vehicle speed for each speed zone. The average vehicle speed calculated last for each speed zone during the vehicle performance test of vehicle 100 is the average vehicle speed throughout the entire vehicle performance test across that speed zone.

[0154] During process S51, the processing circuit system 51 calculates a reference value based on the most recent average vehicle speed stored in the storage device 52 after the vehicle performance test of vehicle 100 is completed. Specifically, the processing circuit system 51 calculates the reference value in the speed range by inputting the most recent average vehicle speed stored in the storage device 52 into Equation 2 or Equation 3.

[0155] Subsequently, the processing circuit system 51 executes process S52. In process S52, the processing circuit system 51 executes a temporary reference value selection process.

[0156] The temporary reference value selection process is the process of selecting a temporary reference value from a number of temporary reference values ​​defined for a speed range to determine whether the pass rate OR meets the performance conditions.

[0157] Figure 7 The diagram illustrates how to select a reference value from temporary reference values ​​VL1 to VL4 in the low-speed region LVR.

[0158] Figure 7 VLavg, the average vehicle speed in the low-speed region (LVR), and RVL, a reference value calculated based on VLavg, are shown. The processing circuit system 51 selects a temporary reference value that is greater than or equal to the reference value in the speed region and has the minimum value among a plurality of temporary reference values ​​defined for the speed region, as the selection reference value. Figure 7 In the example shown, the processing circuit system 51 selects RVL3 as the selection benchmark value for determining whether the throughput OR meets the performance conditions.

[0159] Subsequently, the processing circuit system 51 executes process S53. In process S53, the processing circuit system 51 determines whether the pass rate OR related to the selection reference value selected in the temporary reference value selection process is greater than or equal to a threshold.

[0160] For reference Figure 11 The storage device 52 stores the pass rate OR of each temporary reference value during the vehicle performance test performed by the vehicle 100. In process S53, the processing circuit system 51 checks the pass rate OR associated with the selected reference value chosen during the temporary reference value selection process, which is stored in the storage device 52. The processing circuit system 51 determines whether the pass rate OR associated with the temporary reference value is greater than or equal to a threshold. The threshold is 95%.

[0161] When it is determined in process S53 that the pass rate OR associated with the temporary reference value is greater than or equal to the threshold (S53: Yes), the processing circuit system 51 proceeds the process to S54. In process S54, the processing circuit system 51 determines whether the travel distance of vehicle 100 in all speed zones is greater than or equal to a specified value.

[0162] For reference Figure 10 The storage device 52 stores the cumulative incremental travel distance value for each speed zone during the vehicle performance test of vehicle 100. The cumulative incremental travel distance value for each speed zone represents the travel distance of vehicle 100 in each speed zone. During S54, the processing circuit system 51 checks the information of the cumulative incremental travel distance value stored in the storage device 52. The processing circuit system 51 determines whether the cumulative incremental travel distance value in each speed zone is greater than or equal to a predetermined value. The predetermined value is, for example, 16 km.

[0163] When the accumulated incremental travel distance value in the speed region is greater than or equal to a predetermined value, the processing circuit system 51 determines that the travel distance of vehicle 100 in the speed region is greater than or equal to the predetermined value. When it is determined in process S54 that the travel distance of vehicle 100 in the speed region is greater than or equal to the predetermined value (S54: Yes), the processing circuit system 51 proceeds to S55. In process S55, the processing circuit system 51 determines whether the number of Vapos values ​​in the speed region is greater than or equal to a predetermined number.

[0164] For reference Figure 11 The storage device 52 stores a pair of count values ​​for each speed zone during vehicle performance testing of vehicle 100. In process S55, the processing circuit system 51 checks the number of Vapos values ​​belonging to the speed zone contained in the pair of count values. The processing circuit system 51 determines whether the number of Vapos values ​​in the speed zone is greater than or equal to a predetermined number.

[0165] When the number of Vapos values ​​in the speed region is determined to be greater than or equal to a predetermined number during process S55 (S55: Yes), the processing circuit system 51 proceeds to S56. During S56, the processing circuit system 51 determines that the throughput in the speed region meets the performance conditions. Then, the processing circuit system 51 terminates. Figure 12 The series of processes shown.

[0166] When it is determined in process S53 that the pass rate OR associated with the temporary reference value is less than the threshold (S53: No), the processing circuit system 51 advances the process to S57.

[0167] During process S54, when the accumulated incremental travel distance value in the speed region is less than a specified value, the processing circuit system 51 determines that the travel distance of vehicle 100 in the speed region is less than the specified value. When it is determined during process S54 that the travel distance of vehicle 100 in the speed region is less than the specified value (S54: No), the processing circuit system 51 proceeds the process to S57.

[0168] If, during process S55, it is determined that the number of Vapos values ​​in the speed region is less than a specified number (S55: No), the processing circuit system 51 will proceed the process to S57.

[0169] During process S57, the processing circuit system 51 determines that the throughput in the speed region does not meet the performance conditions. Then, the processing circuit system 51 terminates. Figure 12 The series of processes shown.

[0170] In this manner, while the driving speed has been collected during the vehicle performance test of vehicle 100, the data acquisition device 50 calculates the pass rate OR for each temporary reference value and updates the pass rate stored in the storage device 52 for each temporary reference value. After the vehicle performance test of vehicle 100 is completed, the data acquisition device 50 determines whether the pass rate OR associated with the selected temporary reference value meets the performance conditions.

[0171] When using a pass rate OR associated with a temporary baseline value, values ​​greater than the baseline value can be compared to the Vapos value. Therefore, the pass rate OR calculated by data acquisition device 50 tends to be output as a higher value than the pass rate OR calculated by an external device. Thus, using data acquisition device 50 makes it more likely that the performance conditions will be met compared to using an external device.

[0172] On the other hand, when the Vapos value is relatively high, exhaust components such as nitrogen oxides are more likely to be emitted. When the Vapos value is relatively high, exhaust component analysis is performed after the data acquisition device 50 determines that performance conditions are met based on the calculated pass rate OR. This analysis includes data collected when the vehicle 100 is driving in a mode where components such as nitrogen oxides are easily released. In other words, the results of exhaust component analysis performed after the data acquisition device 50 determines that performance conditions are met using the calculated pass rate OR may be worse than the results of exhaust component analysis performed after an external device determines that the calculated pass rate OR meets the performance conditions. Therefore, when exhaust component analysis is performed after the data acquisition device 50 determines that the calculated pass rate OR meets the performance conditions, the exhaust is less likely to meet emission standards. Therefore, when exhaust component analysis is performed after the data acquisition device 50 determines that the calculated pass rate OR meets the performance conditions, it is easier to reduce the likelihood that vehicles that do not meet emission standards will pass the exhaust component analysis assessment and be sold.

[0173] Final determination by data acquisition device 50

[0174] After determining the performance conditions based on the pass rate OR in each speed zone, the data acquisition device 50 performs a final determination on whether the method of conducting vehicle performance testing on vehicle 100 meets the performance conditions. Figure 13 This illustrates a series of procedures performed by the data acquisition device 50 during the final determination. These procedures are performed across all speed ranges after the vehicle performance test of vehicle 100 is completed. Figure 12 After the series of processes shown, the processing circuit system 51 executes... Figure 13 The series of processes shown.

[0175] At the beginning Figure 13 During the series of processes shown, the processing circuit system 51 first executes process S61. In process S61, the processing circuit system 51 determines that the throughput in all speed regions meets the performance conditions.

[0176] As performed in each speed zone Figure 12 As a result of the series of processes shown, when the processing circuit system 51 executes process S56 in all speed regions, the processing circuit system 51 determines that the pass rate OR in all speed regions meets the performance conditions (S61: Yes). When it is determined in process S61 that the pass rate OR in all speed regions meets the performance conditions (S61: Yes), the processing circuit system 51 proceeds to S62. In process S62, the processing circuit system 51 finally determines that the method of conducting the vehicle performance test of vehicle 100 meets the performance conditions. Afterwards, the processing circuit system 51 terminates. Figure 13 The series of processes shown.

[0177] As performed in each speed zone Figure 12 As a result of the series of processes shown, when the processing circuit system 51 executes process S57 in at least one speed region, the processing circuit system 51 determines that the pass rate OR does not meet the performance conditions in all speed regions (S61: No). When it is determined that the conditions are not met in process S61 (S61: No), the processing circuit system 51 proceeds to S63. In process S63, the processing circuit system 51 finally determines that the method of conducting the vehicle performance test of vehicle 100 does not meet the performance conditions. Thereafter, the processing circuit system 51 terminates. Figure 13 The series of processes shown.

[0178] Operation of the first embodiment

[0179] During each vehicle performance test, when the driving speed is collected, the data acquisition device 50 calculates the acceleration and a Vapos value as a reference. During the vehicle performance test, the data acquisition device 50 performs a comparison of the Vapos value with a temporary reference value and sequentially updates the calculated values. After the vehicle performance test concludes, the data acquisition device 50 checks, based on the calculated values, whether the collected data is appropriate data collected through a vehicle performance test that meets the performance conditions.

[0180] In this manner, the data acquisition device 50 updates the calculated value used to determine the speed each time it acquires the driving speed. Therefore, the data acquisition device 50 only needs to store the updated calculated value. In this embodiment, the data acquisition device 50 does not need to continuously record all the data used to calculate the calculated value until the vehicle performance test is completed.

[0181] Advantages of the first embodiment

[0182] (1-1) The data acquisition device 50 can determine whether the method of performing vehicle performance testing meets the specified performance conditions without requiring a relatively large storage capacity.

[0183] (1-2) The processing circuit system 51 selects the smallest temporary reference value from one or more temporary reference values ​​that are not less than the reference value.

[0184] In other words, the data acquisition device 50 selects the temporary reference value with the smallest value from one or more temporary reference values, each of which is not less than the reference value. Therefore, the data acquisition device 50 can perform the determination based on the temporary reference value that is closest to the reference value.

[0185] (1-3) Each time the driving speed is collected during the vehicle performance test, the processing circuit system 51 calculates the acceleration of the vehicle 100 at the time point when the speed was collected, based on the speed collected two years ago and the speed collected this time. Each time the driving speed is collected during the vehicle performance test, the processing circuit system 51 calculates a reference value based on the speed collected last time and the acceleration at the time point when the speed was collected last time.

[0186] (1-4) Each time a driving speed is collected during a vehicle performance test, the processing circuit system 51 calculates the incremental driving distance. The incremental driving distance is the distance traveled by the vehicle 100 from the time the speed was last measured to the time the speed was last measured. Each time a driving speed is collected during a vehicle performance test, the processing circuit system 51 updates the accumulated incremental driving distance value, which has been calculated for each speed region for the driving speed belonging to that speed region stored in the storage device 52. After the vehicle performance test ends, the processing circuit system 51 checks the information stored in the storage device 52. When the accumulated incremental driving distance value in at least one speed region is less than or equal to a specified value, even if the ratio in all speed regions is greater than or equal to a threshold, the processing circuit system 51 determines that the method of conducting the vehicle performance test does not meet the performance conditions.

[0187] During vehicle performance testing, exhaust-related data can be collected. Exhaust analysis can be performed when the data acquisition device 50 determines that performance conditions are met. The cumulative incremental travel distance value for each speed zone represents the travel distance of vehicle 100 in each speed zone. If the travel distance of vehicle 100 is relatively short, the evaluation material for exhaust analysis may be insufficient during the time period in which vehicle 100 travels at the speed belonging to that speed zone. Therefore, in this embodiment, when the cumulative incremental travel distance value in any speed zone is relatively small, the data acquisition device 50 determines that the performance conditions are not met. Thus, the data acquisition device 50 improves the accuracy of exhaust analysis.

[0188] (1-5) When the number of reference values ​​in any speed region is less than or equal to the specified number, the processing circuit system 51 determines that the method of performing vehicle performance testing does not meet the performance conditions, even if the ratio in all speed regions is greater than or equal to the threshold.

[0189] During vehicle performance testing, exhaust-related data can be collected. When the data acquisition device 50 determines that performance conditions are met, exhaust analysis can be performed. If the number of Vapos values ​​stored for each speed range is relatively small, during periods when the vehicle 100 travels at speeds belonging to that speed range and the number of Vapos values ​​is relatively low, the evaluation material for exhaust analysis may be insufficient. Conversely, when the number of reference values ​​in any speed range is relatively small, the data acquisition device 50 of this embodiment determines that performance conditions are not met. Therefore, the data acquisition device 50 improves the accuracy of exhaust analysis.

[0190] (1-6) When the acceleration at the time point of the last velocity acquisition is less than or equal to the specified acceleration, the processing circuit system 51 does not calculate the reference value.

[0191] During vehicle performance testing, exhaust-related data are collected. When the data acquisition device 50 determines that the performance conditions are met, exhaust analysis can be performed.

[0192] When acceleration is relatively low, the Vapos value tends to be relatively small. If the values ​​to be evaluated include excessively small Vapos values, then the determination of whether the performance conditions are met based on the calculated values ​​tends to produce a determination that the performance conditions are met.

[0193] However, when acceleration is relatively low, the amount of nitrogen oxides emitted from vehicle 100 decreases. Therefore, if vehicle 100 operates at relatively low acceleration for an excessively long period of time, it becomes difficult to accurately assess the environmental impact of exhaust emissions from vehicle 100.

[0194] In this regard, when the acceleration is less than or equal to the specified acceleration, the data acquisition device 50 of this embodiment does not calculate the Vapos value. When the data acquisition device 50 does not calculate the Vapos value, the driving speed at the time of acceleration calculation is not determined based on the calculated value.

[0195] Therefore, this embodiment prevents the data acquisition device 50 from collecting inappropriate data that would make it difficult to accurately assess the environmental impact of exhaust emissions. Furthermore, since the data acquisition device 50 does not calculate the Vapos value, it also does not calculate values ​​that would otherwise be calculated based on the Vapos value. This allows the data acquisition device 50 to reduce the number of arithmetic operations performed.

[0196] (1-7) The data acquisition device 50 is implemented by one or more on-board electronic control units of the vehicle 100. The electronic control unit can perform the functions of the data acquisition device 50. Therefore, during vehicle performance testing, the data acquisition device 50 can easily determine whether the method of conducting the vehicle performance test meets the performance conditions without using external devices capable of storing relatively large amounts of data.

[0197] Figure 14 and Figure 15 A data acquisition device according to a second embodiment of the present disclosure is illustrated. Unlike the first embodiment, the data acquisition device 50 of the second embodiment updates a pair of count values ​​to calculated values ​​during vehicle performance testing of vehicle 100. The following description will focus on the differences from the first embodiment and will not describe the same aspects in detail. For example, the data acquisition device 50 of the second embodiment does not perform... Figure 10 Steps S33 to S35 in the process. Figure 10 Steps S31 to S32 and S36 to S37 are executed.

[0198] How the counting process is executed

[0199] Figure 14 A series of processes performed by the data acquisition device 50 of the second embodiment during the counting process are illustrated. Figure 10 During S32, the data acquisition device 50 of the second embodiment performs... Figure 14 The series of processes shown, rather than Figure 11 The series of processes shown. Figure 14 The series of processes shown are executed by the processing circuit system 51. Figure 14 In this context, S represents a step.

[0200] During the counting process, the processing circuit system 51 performs operations for each temporary reference value in the velocity region identified in process S31. Figure 14 The process is illustrated in the following steps. For example, during process S31, the low-speed region LVR is identified as the region to which the Vapos value belongs, and the low-speed region LVR is defined... Figure 7 When the four temporary reference values ​​are shown, the processing circuit system 51 executes for each of RVL1 to RVL4. Figure 14 The series of processes shown is repeated once.

[0201] At the start of the counting process, the processing circuit system 51 first executes procedure S141. During S141, the processing circuit system 51 determines whether the Vapos value calculated in procedure S23 is less than or equal to the temporary reference value. This process is related to... Figure 11 The process executed by the processing circuit system 51 during S41 is the same.

[0202] When it is determined in process S141 that the Vapos value is less than or equal to the temporary reference value (S141: Yes), the processing circuit system 51 advances the process to S142. In process S142, the processing circuit system 51 determines that the count has been updated. This process is related to... Figure 11 The process executed by the processing circuit system 51 during S42 is the same.

[0203] Following process S142, processing circuit system 51 advances the process to S143. If, during process S141, it is determined that the Vapos value is greater than the temporary reference value (S141: No), processing circuit system 51 also advances the process to S143. During S143, processing circuit system 51 updates a pair of count values. This process is consistent with... Figure 11 The process executed by the processing circuit system 51 during S43 is the same. Afterwards, the processing circuit system 51 terminates. Figure 14 The series of processes shown.

[0204] Performance conditions determined based on pass rate OR

[0205] The data acquisition device 50 of the second embodiment determines whether the pass rate OR meets the performance conditions after the vehicle performance test performed by the vehicle 100 is completed. Figure 15 This illustrates a series of procedures performed by the data acquisition device 50 when determining whether the pass rate OR meets the performance conditions. Figure 15 The series of processes shown are executed by the processing circuit system 51 after the vehicle performance test of vehicle 100 is completed. The data acquisition device 50 of the second embodiment executes these processes. Figure 15 The series of processes shown, rather than Figure 12 The process is illustrated in the diagram. After the vehicle performance test conducted by vehicle 100 is completed, the processing circuit system 51 performs the following steps for each speed range: Figure 15 The series of processes shown. In Figure 15 In this context, S represents a step.

[0206] At the beginning Figure 15 In the series of processes shown, the processing circuit system 51 first executes process S151. During process S151, the processing circuit system 51 calculates the reference value in the speed region. This process is related to... Figure 12 The process executed by the processing circuit system 51 in the S51 process is the same.

[0207] Subsequently, the processing circuit system 51 executes process S152. During process S152, the processing circuit system 51 executes a temporary reference value selection process. This process is related to... Figure 12 The process executed by the processing circuit system 51 in the S52 process is the same.

[0208] Subsequently, the processing circuit system 51 executes process S153. In process S153, the processing circuit system 51 calculates the pass rate OR related to the temporary reference value selected during the temporary reference value selection process. The processing circuit system 51 then... Figure 14The counting process shown updates a pair of count values ​​for each temporary reference value. In process S153, the processing circuit system 51 calculates the pass rate OR based on a pair of count values ​​related to the temporary reference value selected during the temporary reference value selection process from among multiple pairs of count values ​​stored in the storage device 52.

[0209] Subsequently, the processing circuit system 51 executes process S154. In process S154, the processing circuit system 51 determines whether the pass rate OR related to the selection reference value selected during the temporary reference value selection process is greater than or equal to a threshold. At this time, the processing circuit system 51 determines whether the pass rate OR calculated in process S153 is greater than or equal to a threshold. The threshold is 95%.

[0210] When it is determined in process S154 that the pass rate OR associated with the temporary reference value is greater than or equal to a threshold (S154: Yes), the processing circuit system 51 proceeds the process to S155. In process S155, the processing circuit system 51 determines whether the travel distance of vehicle 100 in all speed zones is greater than or equal to a predetermined value. This process is related to... Figure 12 The process executed by the processing circuit system 51 during S54 is the same.

[0211] When it is determined in process S155 that the travel distance within the speed range of vehicle 100 is greater than or equal to a predetermined value (S155: Yes), the processing circuit system 51 proceeds to S156. In process S156, the processing circuit system 51 determines whether the number of Vapos values ​​within the speed range is greater than or equal to a predetermined number. This process is related to... Figure 12 The process executed by the processing circuit system 51 during the S55 process is the same.

[0212] When the number of Vapos values ​​in the speed region is determined to be greater than or equal to a specified number during process S156 (S156: Yes), the processing circuit system 51 proceeds to S157. During S157, the processing circuit system 51 determines that the throughput in the speed region meets the performance conditions. Afterward, the processing circuit system 51 terminates. Figure 15 The series of processes shown.

[0213] When it is determined in process S154 that the pass rate OR associated with the temporary reference value is less than the threshold (S154: No), the processing circuit system 51 advances the process to S158.

[0214] When it is determined during process S155 that the travel distance in the speed range of vehicle 100 is less than a specified value (S155: No), the processing circuit system 51 advances the process to S158.

[0215] If, during process S156, it is determined that the number of Vapos values ​​in the speed region is less than a specified number (S156: No), the processing circuit system 51 will proceed the process to S158.

[0216] During process S158, the processing circuit system 51 determines that the throughput in the speed region does not meet the performance conditions. Afterwards, the processing circuit system 51 terminates. Figure 15 The series of processes shown.

[0217] Operation and advantages of the process in the second embodiment

[0218] (2-1) The data acquisition device 50 of the second embodiment has the advantages of the first embodiment (1-2) to (1-7).

[0219] (2-2) Each time the data acquisition device 50 acquires the driving speed during the vehicle performance test, it calculates the acceleration and calculates the Vapos value as a reference value. During the vehicle performance test, the data acquisition device 50 performs a determination to compare the Vapos value with a temporary reference value and updates the calculated values ​​sequentially. Based on the values ​​calculated after the end of the vehicle performance test, the data acquisition device 50 checks whether the acquired data is appropriate data that meets the performance conditions acquired through the vehicle performance test.

[0220] In this manner, the data acquisition device 50 updates the calculated value used to determine the vehicle speed each time it acquires the driving speed. Therefore, the data acquisition device 50 only needs to store the updated calculated value. In other words, the data acquisition device 50 does not need to continuously record all the data used to calculate the calculated value until the vehicle performance test is completed.

[0221] Therefore, the data acquisition device 50 can determine whether the method of conducting vehicle performance testing meets the specified performance conditions without requiring a relatively large storage capacity.

[0222] Other embodiments

[0223] The above embodiments can be modified as follows. The above embodiments and the following modifications can be combined, as long as the combined modifications remain technically consistent with each other.

[0224] Speed ​​range is not limited to Figure 4 and Figures 7 to 9 The speed ranges shown are: Low-speed range (LVR), Medium-speed range (MVR), and High-speed range (HVR). These do not require... Figure 4 and Figures 7 to 9 The speed division is shown. Furthermore, the speed region can be divided into two regions, or it can be divided into four or more regions.

[0225] During the selection of a temporary reference value, the data acquisition device 50 can select a temporary reference value that is greater than the minimum temporary reference value from a plurality of temporary reference values ​​that are greater than or equal to the reference value as the selection reference value.

[0226] Data acquisition equipment 50 is not necessarily required Figure 6 The Vapos value is calculated in the manner shown. For example, data acquisition device 50 can calculate the Vapos value based on the vehicle 100's speed and the output value of a sensor measuring the vehicle 100's acceleration. In this case, in Figure 5 In the series of processes shown, the data acquisition device 50 can calculate the current Vapos value based on the current acquisition speed, rather than based on the previous acquisition speed.

[0227] When the throughput OR in all speed zones is greater than or equal to the threshold, the data acquisition device 50 can determine that the throughput OR meets the performance conditions even if the distance traveled by vehicle 100 in any speed zone is not greater than or equal to the specified distance value.

[0228] When the throughput OR in all speed zones is greater than or equal to the threshold, the data acquisition device 50 can determine that the throughput OR meets the performance conditions even if the number of Vapos values ​​in any speed zone is not greater than or equal to the specified number.

[0229] Even when the calculated previous acceleration is less than or equal to the specified acceleration, the data acquisition device 50 can still calculate the Vapos value.

[0230] The data acquisition device 50 does not necessarily need to be an electronic control unit installed on the vehicle 100. For example, the data acquisition device 50 can be an external device carried on-board in the vehicle 100.

[0231] Data acquisition devices are not limited to devices that include a CPU and ROM and perform software processing. That is, a data acquisition device can have any configuration, provided it has any of the following configurations (a) through (c): (a) The data acquisition device includes one or more processors that execute various processes according to a computer program. The processor includes a CPU and memory modules such as RAM and ROM. The memory modules store program code or instructions configured to cause the CPU to execute processes. Memory modules that are non-transitory computer-readable storage media include any type of media or program product accessible by general-purpose and special-purpose computers. (b) The data acquisition device includes one or more dedicated hardware circuits that execute various processes. Dedicated hardware circuits include, for example, application-specific integrated circuits (ASICs) and field-programmable gate arrays (FPGAs). (c) The data acquisition device includes a processor that executes a portion of various processes according to a program and dedicated hardware circuits that execute the remaining processes.

[0232] Various changes in form and detail may be made to the foregoing examples without departing from the spirit and scope of the claims and their equivalents. These examples are for descriptive purposes only and not for limiting purposes. The description of features in each example should be considered applicable to similar features or aspects in other examples. Appropriate results may be achieved if the sequence is performed in a different order, and / or if the components in the described system, architecture, device, or circuit are combined differently, and / or replaced or supplemented by other components or their equivalents. The scope of this disclosure is not limited by the detailed description but by the claims and their equivalents. All variations within the scope of the claims and their equivalents are included in this disclosure.

Claims

1. A data acquisition device installed on a vehicle, comprising: Processing circuit system; as well as Storage devices in, The processing circuitry is configured to collect the vehicle's speed multiple times. The processing circuitry is configured to perform the following operations each time the driving speed is collected during the vehicle performance test: Identify which of the multiple divided speed regions the target driving speed belongs to, where the target driving speed is one of the driving speeds collected; The sum of the quotient obtained by dividing the target driving speed by the number of times multiple driving speeds in the identified speed region are collected, and the quotient obtained by dividing the cumulative value of multiple driving speeds in the identified speed region other than the target driving speed by the number of times they are collected, is used to update the average vehicle speed in the identified speed region. Calculate a reference value, which is the product of the vehicle's target speed and acceleration; Determine whether the reference value is less than or equal to a temporary reference value, which is a value output by a function in the identified speed region. The function outputs the reference value when the average vehicle speed is input to the function, and the temporary reference value is one of a plurality of temporary reference values ​​corresponding to the plurality of speed regions; and The number of reference values ​​less than or equal to the temporary reference value is updated as the calculated value relative to the number of reference values ​​stored in the storage device for each of the plurality of temporary reference values ​​and belonging to the identified speed region. The processing circuitry is configured to perform the following operations after the vehicle performance test is completed, by examining information stored in the storage device: Calculate multiple reference values ​​for each velocity region; One of the multiple temporary benchmark values ​​that is greater than or equal to the multiple benchmark values ​​is selected as the selection benchmark value; When the calculated values ​​related to the selected reference value in all multiple speed zones are greater than or equal to a threshold, it is determined that the manner in which the vehicle performance test is performed meets the performance conditions; and When the calculated value related to the selected reference value in at least one of the plurality of speed zones is less than the threshold, it is determined that the method of performing the vehicle performance test does not meet the performance conditions.

2. The data acquisition device according to claim 1, wherein, The processing circuit system is configured as follows: From a plurality of temporary reference values ​​that are greater than or equal to the reference value, select the temporary reference value with the smallest value as the selected reference value.

3. The data acquisition device according to claim 1 or 2, wherein, The processing circuit system is configured to collect data by repeatedly sampling the vehicle's travel speed. The speed collected in this measurement is the driving speed recorded in this measurement. The speed at which the last data was collected is the driving speed measured in the last measurement. as well as The speed collected two years ago, as the driving speed collected in the measurement two years ago, and The processing circuitry is configured to perform the following operations each time the driving speed is collected during the vehicle performance test: Based on the previously collected speed and the current collected speed, calculate the acceleration of the vehicle at the time point when the previously collected speed was collected; as well as The reference value is calculated based on the previous acquisition velocity and the acceleration at the time of acquiring the previous acquisition velocity.

4. The data acquisition device according to claim 3, wherein, The processing circuitry is configured to perform the following operations each time the driving speed is collected during the vehicle performance test: Calculate the incremental driving distance, which is the distance traveled by the vehicle from the time the speed was last collected to the time the speed was last collected; Identify one of the multiple velocity regions to which the previously acquired velocity belongs; as well as Update the accumulated incremental driving distance value stored in the storage device for each of the plurality of speed zones, wherein the accumulated incremental driving distance value is the cumulative value of the incremental driving distance calculated for driving speeds belonging to that speed zone, and The processing circuitry is configured to perform the following operations after the vehicle performance test is completed, by examining information stored in the storage device: When the cumulative incremental driving distance value in at least one of the plurality of speed zones is less than or equal to a predetermined value, it is determined that the method of conducting the vehicle performance test does not meet the performance conditions, even if the ratio in all the plurality of speed zones is greater than or equal to the threshold.

5. The data acquisition device according to claim 3 or 4, wherein, The processing circuitry is configured to perform the following operations: When the number of reference values ​​in any of the plurality of speed zones is less than or equal to a predetermined number, it is determined that the method of performing the vehicle performance test does not meet the performance conditions, even if the ratio in all the plurality of speed zones is greater than or equal to the threshold.

6. The data acquisition device according to any one of claims 1 to 5, wherein, The processing circuit system is configured as follows: When the acceleration is less than or equal to the specified acceleration, the calculation of the reference value is not performed.

7. The data acquisition device according to any one of claims 1 to 6, wherein, The processing circuitry and the storage device are formed by at least one of one or more on-board electronic control units of the vehicle.

8. A data acquisition device installed on a vehicle, comprising: Processing circuit system; as well as Storage devices in, The processing circuitry is configured to collect the vehicle's speed multiple times. The processing circuitry is configured to perform the following operations each time the driving speed is collected during the vehicle performance test: Identify which of the multiple divided speed regions the target driving speed belongs to, where the target driving speed is one of the driving speeds collected; The sum of the quotient obtained by dividing the target driving speed by the number of times multiple driving speeds in the identified speed region are collected, and the quotient obtained by dividing the cumulative value of multiple driving speeds in the identified speed region other than the target driving speed by the number of times they are collected, is used to update the average vehicle speed in the identified speed region. Calculate a reference value, which is the product of the vehicle's target speed and acceleration; Determine whether the reference value is less than or equal to a temporary reference value, which is a value in the identified speed region output by a function when the average vehicle speed is input to the function, and the temporary reference value is one of a plurality of temporary reference values ​​corresponding to the plurality of speed regions; and The number of reference values ​​belonging to the identified velocity region stored in the storage device for each of the multiple temporary reference values, and the number of reference values ​​less than or equal to that temporary reference value, are updated as the calculated value. The processing circuitry is configured to perform the following operations after the vehicle performance test is completed, by examining information stored in the storage device: Calculate the reference value for each of the plurality of velocity regions; Select one of the temporary benchmark values ​​that is greater than or equal to multiple benchmark values ​​as the selection benchmark value; For each of the plurality of speed regions, calculate the ratio of the number of reference values ​​less than or equal to the selected reference value to the number of reference values ​​belonging to that speed region; When the ratio of values ​​less than or equal to the maximum baseline value across all multiple speed zones is greater than or equal to a threshold, the method of performing the vehicle performance test is determined to meet the performance conditions; and When the ratio in at least one of the multiple speed zones is less than the threshold, it is determined that the method of conducting the vehicle performance test does not meet the performance conditions.

9. The data acquisition device according to claim 8, wherein, The processing circuit system is configured as follows: From a plurality of temporary reference values ​​that are greater than or equal to the reference value, select the temporary reference value with the smallest value as the selected reference value.

10. The data acquisition device according to claim 8 or 9, wherein, The processing circuit system is configured to collect data by repeatedly sampling the vehicle's travel speed. The speed collected in this measurement is the driving speed recorded in this test. The speed collected last time is used as the driving speed collected in the last measurement. as well as The speed collected two years ago, as the driving speed collected in the measurement two years ago, and The processing circuitry is configured to perform the following operations each time the driving speed is collected during the vehicle performance test: Based on the previously collected speed and the current collected speed, calculate the acceleration of the vehicle at the time point when the previously collected speed was collected; as well as The reference value is calculated based on the previous acquisition velocity and the acceleration at the time of acquiring the previous acquisition velocity.

11. The data acquisition device according to claim 10, wherein: The processing circuitry is configured to perform the following operations each time the driving speed is collected during the vehicle performance test: Calculate the incremental driving distance, which is the distance traveled by the vehicle from the time the speed was last collected to the time the speed was last collected; Identify one of the multiple velocity regions to which the previously acquired velocity belongs; as well as Update the accumulated incremental driving distance value stored in the storage device for each of the plurality of speed zones, wherein the accumulated incremental driving distance value is the cumulative value of the incremental driving distance calculated for driving speeds belonging to that speed zone, and The processing circuitry is configured to perform the following operations after the vehicle performance test is completed, by examining information stored in the storage device: When the cumulative incremental driving distance value in at least one of the plurality of speed zones is less than or equal to a predetermined value, it is determined that the method of conducting the vehicle performance test does not meet the performance conditions, even if the ratio in all the plurality of speed zones is greater than or equal to the threshold.

12. The data acquisition device according to claim 10 or 11, wherein, The processing circuitry is configured to perform the following operations: When the number of reference values ​​in any of the plurality of speed zones is less than or equal to a predetermined number, it is determined that the method of performing the vehicle performance test does not meet the performance conditions, even if the ratio in all the plurality of speed zones is greater than or equal to the threshold.

13. The data acquisition device according to any one of claims 8 to 12, wherein, The processing circuit system is configured as follows: When the acceleration is less than or equal to the specified acceleration, the calculation of the reference value is not performed.

14. The data acquisition device according to any one of claims 8 to 13, wherein, The processing circuitry and the storage device are formed by at least one of one or more on-board electronic control units of the vehicle.

15. A data acquisition method executed by a processing circuit system of a data acquisition device installed on a vehicle, the data acquisition method comprising: The vehicle's speed is collected multiple times by the processing circuit system; The method includes performing the following operations using the processing circuitry system each time the driving speed is collected during a vehicle performance test: Identify which of the multiple divided speed regions the target driving speed belongs to, where the target driving speed is one of the driving speeds collected; The sum of the quotient obtained by dividing the target driving speed by the number of times multiple driving speeds in the identified speed region are collected, and the quotient obtained by dividing the cumulative value of multiple driving speeds in the identified speed region other than the target driving speed by the number of times they are collected, is used to update the average vehicle speed in the identified speed region. Calculate a reference value, which is the product of the vehicle's target speed and acceleration; Determine whether the reference value is less than or equal to a temporary reference value, which is a value in the identified speed region output by a function when the average vehicle speed is input to the function, and the temporary reference value is one of a plurality of temporary reference values ​​corresponding to the plurality of speed regions; and In the storage device of the data acquisition device, for each of the plurality of temporary reference values, the ratio of the number of reference values ​​less than or equal to the temporary reference value to the number of reference values ​​belonging to the identified velocity region is stored, and The ratio is updated as the calculated value, and The method further includes: After the vehicle performance test is completed, the processing circuit system is used to check the information stored in the storage device, thereby: Calculate multiple reference values ​​for each velocity region; Select one of the multiple temporary benchmark values ​​that is greater than or equal to the multiple benchmark values ​​as the selected benchmark value; When the calculated values ​​related to the selected reference value in all multiple speed zones are greater than or equal to a threshold, it is determined that the method of performing the vehicle performance test meets the performance conditions; and When the calculated value related to the selected reference value in at least any of the plurality of speed regions is less than the threshold, it is determined that the method of performing the vehicle performance test does not meet the performance conditions.

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