An insertion loss test probe apparatus and grounding system

Abstract

The application relates to the technical field of electronic device testing, and discloses an insertion loss test probe device and a grounding system, which comprises a mounting frame, a probe grounding structure and a rotary adjusting structure, the probe grounding structure is arranged on the mounting frame; the probe grounding structure comprises two probe assemblies, and the two probe assemblies are symmetrically arranged; the rotary adjusting structure is arranged on at least one probe assembly, and the rotary adjusting structure is used for driving the probe assembly to rotate so that the discs in the two probe assemblies are attached. When the discs are thinned to cause the contact pressure to drop or a gap to appear, the probe assembly provided with the rotary adjusting structure can adaptively rotate slightly around the axis. The rotary movement drives the front-end disc to continuously attach to the disc of the other probe assembly, automatically compensates the gap caused by abrasion, realizes dynamic self-adjustment, and guarantees the accuracy of the test.

Description

Technical Field

[0001] This invention relates to the field of electronic device testing technology, specifically to an insertion loss testing probe device and grounding system. Background Technology

[0002] Insertion loss testing technology spans three major fields: radio frequency (RF), high-speed digital, and optical communication. Its development has always kept pace with advancements in communication, computing, and semiconductor technologies. In the future, with the rise of 6G, silicon photonics integration, and AI-assisted testing, insertion loss testing will further evolve towards ultra-high frequency, intelligent, and highly integrated directions. Insertion loss testing is one of the key technologies in high-frequency electronics, communication engineering, signal integrity, and electromagnetic compatibility, primarily used to quantify the degree of signal attenuation in transmission systems. Its testing range covers a wide frequency band from low frequency to terahertz, involving multiple application scenarios such as RF, microwave, millimeter wave, and high-speed digital signals.

[0003] The existing insertion tester probe assembly contains two probes arranged at a 90° angle. Each probe tip is equipped with a disc-shaped shorting piece. By controlling the upper drive mechanism to pull one of the probes, the distance between the two probes can be adjusted to meet the testing requirements of 0.2 to 1.4 mm. Grounding is achieved by relying on the contact of the two discs.

[0004] However, when the two discs are brought into contact, they are usually adjusted manually to allow for an interference fit and friction connection. As the number of tests increases, the discs are prone to wear and thinning due to continuous contact and friction, causing deformation of the dual-probe discs. This results in an inability to maintain stable contact, ultimately leading to a loss of reliable grounding function and affecting test accuracy. Summary of the Invention

[0005] In view of this, the present invention provides an insertion loss test probe device to solve the problem that as the number of tests increases, the disc is easily worn thinner due to continuous contact friction, which causes the dual probe disc to deform, making it unable to maintain stable contact, and ultimately losing reliable grounding function, thus affecting the accuracy of the test.

[0006] In a first aspect, the present invention provides an insertion loss testing probe device, comprising: Mounting rack; A probe grounding structure is mounted on the mounting bracket; the probe grounding structure includes two probe assemblies, which are arranged symmetrically. A rotation adjustment structure is disposed on at least one of the probe assemblies, the rotation adjustment structure being used to drive the probe assemblies to rotate so that the discs in the two probe assemblies are in contact.

[0007] Beneficial Effects: In operation, the rotary adjustment structure drives one or two probe assemblies to rotate, ensuring that the discs of the two probe assemblies remain in contact, forming a stable grounding path. As the number of tests increases, the discs gradually wear down due to contact friction, resulting in a decrease in thickness. When the discs become thinner, causing a drop in contact pressure or the appearance of gaps, the probe assembly with the rotary adjustment structure will adaptively rotate slightly around its axis. This rotational motion causes its front disc to continuously contact the disc of the other probe assembly, automatically compensating for gaps caused by wear. During testing, even if the geometric position changes due to disc wear, automatic rotary adjustment ensures reliable contact and maintains electrical continuity. The rotary adjustment structure responds to the disc wear state throughout the entire process, achieving dynamic self-adjustment and ensuring test accuracy.

[0008] In one alternative implementation, the probe assembly includes: A probe mounting base, wherein a first mounting hole is provided on the probe mounting base; The probe is disposed in the first mounting hole, and the disc is mounted on the head end of the probe.

[0009] In an optional embodiment, the probe assembly with the rotation adjustment structure further includes a mounting groove, which is formed on the probe mounting base. The inner diameter of the mounting groove is larger than the inner diameter of the first mounting hole. The mounting groove is coaxially arranged with the first mounting hole and communicates with the first mounting hole.

[0010] In one optional embodiment, the rotation adjustment structure includes: A bearing is installed in the mounting groove, and the inner hole of the bearing and the first mounting hole form a mounting channel. A rotating flange is arranged in the mounting channel, and a second mounting hole is provided in the rotating flange along the axial direction of the mounting channel. The probe in the probe assembly with the rotation adjustment structure is adapted to be installed in the second mounting hole. A rotary drive assembly is mounted on the probe mounting base and connected to the rotary flange to provide rotary driving force to the rotary flange.

[0011] In one optional embodiment, the rotating flange has a hanging part protruding to one side; The rotation drive assembly includes: A rotary drive base is mounted on the probe mounting base; An elastic element, one end of which is mounted on the hanging part and the other end is connected to the rotary drive base; The elastic force of the elastic element ranges from 10 to 50g.

[0012] In one alternative embodiment, the elastic element is a tension spring with a K value of 9.8 g / mm.

[0013] In one optional embodiment, a first adjustment hole is provided on the side of the rotary drive base corresponding to the probe mounting base away from the disc; A second adjustment hole is provided on the opposite side of the probe mounting base away from the hanging part; The rotary drive assembly further includes: a first adjusting member and a second adjusting member, wherein the first adjusting member is adapted to pass through the first adjusting hole and be inserted into the probe mounting base to mount the rotary drive base on the probe mounting base; The second adjusting member can pass through the second adjusting hole to abut against the probe mounting base; Under the action of external force, the second adjusting member rotates and drives the rotary driving base to move along the side wall of the first adjusting hole to move away from or closer to the hanging part in order to adjust the elastic force applied by the elastic member to the rotary flange.

[0014] In one optional embodiment, the rotary flange includes: a first sleeve portion and a second sleeve portion, wherein the first sleeve portion and the second sleeve portion are threadedly connected. The outer diameter of the end of the first sleeve portion away from the second sleeve portion is larger than the inner diameter of the mounting groove; The outer diameter of the end of the second sleeve portion away from the first sleeve portion is larger than the inner diameter of the first mounting hole.

[0015] Beneficial effects: By integrating the bearing, separate rotating flange, probe, and drive assembly into the probe mounting base, a wear compensation module is formed, achieving automated maintenance of the grounding status. The adjustable elastic force of the spring element allows operators to adjust it according to actual conditions, optimizing grounding performance based on specific test sensitivity, disc material, or wear condition, thus improving the adaptability of the device. The separate threaded rotating flange design facilitates installation.

[0016] In one alternative implementation, it further includes: A connector fixing bracket is mounted on the side of the mounting bracket; A probe adapter, which is mounted on the connector mounting bracket; The probe adapter is connected to the probe via an adapter cable.

[0017] In one alternative implementation, it further includes: An isolation component, which is fixedly mounted on the connector fixing bracket; The isolation component is used to secure the cable between the probe adapter and the test instrument.

[0018] Beneficial effects: The electrical signal transmission path described above is: probe – adapter cable – probe adapter – main test cable – test instrument. When the main test cable between the probe adapter and the external test instrument experiences slight movement, bending, or pulling due to personnel movement, equipment vibration, or improper operation, the resulting mechanical force is transmitted to the isolation component and connector fixing bracket, rather than directly to the probe adapter and probe, reducing the impact of cable slight movement on the probe. It is suitable for high-precision insertion loss testing at extremely small pitches of 0.2–1.4 mm. Furthermore, compared to cables in related technologies where the probe is directly connected to the external test instrument, the diameter of the adapter cable between the probe and the adapter is significantly reduced. When operating the height adjustment structure, the drive mechanism can more easily and responsively move the entire probe assembly vertically.

[0019] Secondly, the present invention also provides a grounding system, including the above-described insertion loss test probe device. Attached Figure Description

[0020] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0021] Figure 1 This is a schematic diagram of the overall structure of the insertion loss test probe device according to an embodiment of the present invention; Figure 2 This is a front view of the insertion loss testing probe device according to an embodiment of the present invention; Figure 3 This is a schematic diagram of the probe assembly with a rotation adjustment structure installed according to an embodiment of the present invention; Figure 4 This is a schematic diagram of a probe mounting base with a rotation adjustment structure according to an embodiment of the present invention; Figure 5 This is a schematic diagram of the assembly of the rotating flange and bearing according to an embodiment of the present invention; Figure 6 This is a schematic diagram of the structure of the first sleeve portion and the second sleeve portion according to an embodiment of the present invention; Explanation of reference numerals in the attached figures: 1. Mounting bracket; 2. Probe assembly; 21. Probe mounting base; 211. First mounting hole; 212. Mounting slot; 22. Probe; 23. Mounting pad; 24. Fixing element; 25. Disc; 3. Rotary adjustment structure; 31. Bearing; 32. Rotary flange; 321. First sleeve part; 322. Second sleeve part; 323. Hanging part; 33. Rotary drive assembly; 331. Rotary drive base; 332. First adjustment hole; 333. Second adjustment hole; 334. Elastic element; 335. First adjustment element; 336. Second adjustment element; 4. Connector fixing bracket; 5. Probe adapter. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0023] Insertion loss testing technology spans three major fields: radio frequency (RF), high-speed digital, and optical communication. Its development has always kept pace with advancements in communication, computing, and semiconductor technologies. In the future, with the rise of 6G, silicon photonics integration, and AI-assisted testing, insertion loss testing will further evolve towards ultra-high frequency, intelligent, and highly integrated directions. Insertion loss testing is one of the key technologies in high-frequency electronics, communication engineering, signal integrity, and electromagnetic compatibility, primarily used to quantify the degree of signal attenuation in transmission systems. Its testing range covers a wide frequency band from low frequency to terahertz, involving multiple application scenarios such as RF, microwave, millimeter wave, and high-speed digital signals.

[0024] The existing insertion tester probe assembly contains two probes arranged at a 90° angle. Each probe tip is equipped with a disc-shaped shorting piece. By controlling the upper drive mechanism to pull one of the probes, the distance between the two probes can be adjusted to meet the testing requirements of 0.2 to 1.4 mm. Grounding is achieved by relying on the contact of the two discs.

[0025] However, when the two discs are brought into contact, they are usually adjusted manually to allow for an interference fit and friction connection. As the number of tests increases, the discs are prone to wear and thinning due to continuous contact and friction, causing deformation of the dual-probe discs. This results in an inability to maintain stable contact, ultimately leading to a loss of reliable grounding function and affecting test accuracy.

[0026] To solve the above technical problems, the following will be combined with... Figures 1 to 6 The following describes embodiments of the present invention.

[0027] According to an embodiment of the present invention, an insertion loss test probe device is provided, comprising: a mounting bracket 1, a probe grounding structure, and a rotation adjustment structure 3.

[0028] like Figure 1 and Figure 2 As shown, the probe grounding structure includes two probe assemblies 2, both mounted on a mounting frame 1, and arranged symmetrically on the mounting frame 1. Each probe assembly 2 has a disc 25 at its front end, which serves as a grounding plate. During testing, the discs 25 on the two probe assemblies 2 can contact each other to form a grounding loop. A rotation adjustment structure 3 is provided on at least one of the probe assemblies 2; it can be provided on only one of them or on both probe assemblies 2 simultaneously.

[0029] In operation, the rotary adjustment structure 3 drives one or two probe assemblies 2 to rotate, ensuring that the discs 25 of the two probe assemblies 2 are always in contact, forming a stable grounding path.

[0030] As the number of tests increases, the disc 25 gradually wears down due to contact friction, resulting in a decrease in thickness. When the disc 25 becomes thinner, causing a decrease in contact pressure or the appearance of gaps, the probe assembly 2 with the rotation adjustment structure 3 will adaptively rotate slightly around its axis. This rotational motion causes its front disc 25 to continuously adhere to the disc 25 of another probe assembly 2, automatically compensating for the gaps caused by wear.

[0031] During the test, even if the geometric position changes due to wear of the disc 25, the automatic rotation adjustment ensures that the contact remains reliable and the electrical connection is maintained. The rotation adjustment structure 3 responds to the wear state of the disc 25 throughout the test, achieving dynamic self-adjustment and ensuring the accuracy of the test.

[0032] In one embodiment, such as Figure 1 and Figure 2 As shown, a rotation adjustment structure 3 can be set on one of the probe components 2 independently. The two probe components 2 in the probe grounding structure are: the first probe component and the second probe component. Figure 2 In the middle, the left side is the first probe assembly, and the right side is the second probe assembly. In this embodiment, the rotation adjustment structure 3 is disposed on the second probe assembly.

[0033] like Figure 1 and Figure 2As shown, the first probe assembly includes a probe mounting base 21, a probe 22, and a mounting pad 23. The probe mounting base 21 is generally V-shaped, with one side being a vertically positioned vertical section and the other side being an inclined section that bends downwards away from the other probe assembly 2. A first mounting hole 211 for accommodating the probe 22 is provided on the inclined section. The probe 22 is installed in the first mounting hole 211, and a disk 25 for electrical grounding is installed at its head end. The mounting pad 23 is sleeved on the probe 22. The mounting pad 23 has a through hole, and a fastener 24 such as a screw or bolt passes through the mounting pad 23 and the probe mounting base 21, thereby firmly locking the probe 22 in a preset position within the first mounting hole 211.

[0034] like Figures 1 to 6 As shown, the second probe assembly includes a probe mounting base 21, a probe 22, and a mounting pad 23. The probe mounting base 21 is generally V-shaped, with one side being a vertically positioned vertical portion and the other side being an inclined portion that bends downwards away from the other probe assembly 2. A first mounting hole 211 for accommodating the probe 22 is provided on the inclined portion. In the second probe assembly equipped with the rotation adjustment structure 3, an additional mounting groove 212 is machined on its probe mounting base 21. This mounting groove 212 is coaxially formed with the first mounting hole 211, and the inner diameter of the mounting groove 212 is larger than the inner diameter of the first mounting hole 211. The first mounting hole 211 and the mounting groove 212 together form a stepped mounting space.

[0035] like Figure 3 , Figure 5 and Figure 6As shown, the rotary adjustment structure 3 includes: a bearing 31, a rotary flange 32, and a rotary drive assembly 33. The bearing 31 is a deep groove ball bearing 31, and two bearings 31 are provided. The two bearings 31 are stacked along the axis of the mounting groove 212 and installed within the mounting groove 212. The outer wall of the bearing 31 is fitted against the inner wall of the mounting groove 212, and the inner hole of the bearing 31 is aligned with the first mounting hole 211, forming a through mounting channel. Screws can be installed on the probe mounting seat 21 at the opening of the mounting groove 212, using the screw heads to press against the outer ring of the bearing 31, thereby fixing the outer ring of the bearing 31 using friction. The rotary flange 32 is arranged within the mounting channel and has a second mounting hole along the axial direction for installing the probe 22 of the probe assembly 2. The rotary flange 32 can be interference-fitted with the bearing 31 to achieve fixation between them. The probe 22 is installed in the second mounting hole, and its head end is equipped with a disc 25 for electrical grounding. The mounting plate 23 is fitted onto the probe 22, and the two are integrally formed. Screws or bolts or other fasteners 24 pass through the mounting plate 23 and the rotating flange 32, thus firmly locking the probe 22 in a preset position within the second mounting hole. The rotating flange 32 is designed as a split type, including a first sleeve portion 321 and a second sleeve portion 322, which are connected by threads. The outer diameter of the first sleeve portion 321 away from the connecting end is designed to be larger than the inner diameter of the mounting groove 212, and the outer diameter of the second sleeve portion 322 away from the connecting end is designed to be larger than the inner diameter of the first mounting hole 211. This design allows the rotating flange 32 to be confined within the mounting channel while retaining rotational freedom. The first sleeve portion 321 has a hanging part 323 protruding to one side.

[0036] The rotary drive assembly 33 includes: a rotary drive base 331, an elastic element 334, a first adjusting element 335, and a second adjusting element 336. For example... Figure 3As shown, the rotary drive base 331 is generally L-shaped and is located at the lower corner of the probe mounting seat 21 in the second probe assembly. Its two walls are respectively attached to the side and top surface of its inclined portion away from the hanging part 323. The elastic force of the elastic element 334 is in the range of 10-50g. Specifically, in this embodiment, the elastic element 334 is usually a tension spring with a K value of 9.8g / mm. One end is connected to the hanging part 323, and the other end is connected to the rotary drive base 331. Its elastic tension provides a preload force for the rotary flange 32 to maintain a continuous rotational trend. The rotary drive base 331 has a first adjustment hole 332 and a second adjustment hole 333. The first adjustment hole 332 is an oblong hole and is located on the side of the rotary drive base 331 corresponding to the probe mounting seat 21 away from the disc 25. The second adjustment hole 333 is located on the side wall of the rotary drive base 331 away from the hanging part 323. The first adjusting member 335 passes through the first adjusting hole 332 to mount the rotary drive base 331 onto the probe mounting base 21, allowing the rotary drive base 331 to move along the inner wall of the first adjusting hole 332 within a certain range. The second adjusting member 336 passes through the second adjusting hole 333 and can abut against the probe mounting base 21. By changing the screw-in depth, the entire rotary drive base 331 can be slightly moved along the side wall of the first adjusting hole 332, thereby changing the tension of the elastic member 334 and realizing the adjustment of the rotary driving force.

[0037] The installation process and working principle of the rotary drive assembly 33 are as follows: Two bearings 31 are pressed into the mounting groove 212, and mounting screws are fixed at the opening of the mounting groove 212, using the screw heads to press the outer ring of the bearings 31 tightly. The first sleeve portion 321 is inserted into the mounting channel from the opening of the mounting groove 212, and the second sleeve portion 322 is inserted into the mounting channel from the other end. The threads are tightened, and axial positioning is achieved using the diameter difference between their two ends. The probe 22 is inserted into the second mounting hole of the rotary flange 32, and the probe 22 is locked to the first sleeve portion 321 using the mounting pad 23 and the fixing member 24. The rotary drive base 331 is installed, and the elastic member 334 is connected. By turning the second adjusting member 336, the position of the rotary drive base 331 is adjusted, so that the tension of the elastic member 334 reaches the preset value.

[0038] During testing, the disc 25 at the tip of probe 22 wears down due to contact friction, reducing its thickness. When wear causes a slight gap between the discs 25 or a decrease in contact pressure, the tension of the elastic element 334, which is always under tension, acts on the mounting portion 323 of the rotating flange 32. This tension drives the rotating flange 32 to rotate slightly around its axis. Since probe 22 is fixedly installed inside the rotating flange 32, the rotation of the rotating flange 32 directly drives probe 22 and its tip disc 25 to rotate, ensuring that the disc 25 always faces and is in close contact with the disc 25 of the other probe 22. This automatically compensates for the gap caused by wear and maintains a stable and reliable grounding contact.

[0039] By integrating the bearing 31, the separate rotating flange 32, the probe 22, and the drive assembly into the probe mounting base 21, a wear compensation module is formed, achieving automated maintenance of the grounding status. The adjustable elastic force of the elastic element 334 allows operators to adjust it according to actual conditions, optimizing grounding performance based on specific test sensitivity, disc 25 material, or wear condition, thus improving the adaptability of the device. The separate threaded rotating flange 32 design facilitates installation.

[0040] It should be noted that the aforementioned rotation adjustment structure 3 can also be set on the first probe assembly.

[0041] It should be noted that the elastic element 334 mentioned above can also be configured as: an elastic washer, a compression spring, a torsion spring, etc.

[0042] In another embodiment, the probes can also be simultaneously mounted on the first probe assembly and the second probe assembly, as long as the two discs 25 can adaptively fit together under the action of the rotation adjustment structure 3.

[0043] In one embodiment, such as Figure 1 As shown, the insertion loss test probe device also includes: a connector fixing bracket 4, a probe adapter 5, and an isolation component (not shown in the figure).

[0044] The connector mounting bracket 4 has a through hole in its center and is fixedly mounted on the side of the mounting bracket 1 with screws, located above the probe assembly 2. The number of probe adapters 5 corresponds to the number of probe assemblies 2. In this embodiment, there are two probe adapters 5 and two probe assemblies 2, with a one-to-one correspondence. The two probe adapters 5 are mounted on both sides of the connector mounting bracket 4, and can be directly screwed into the openings of the connector mounting bracket 4. One end of the adapter cable is electrically connected to the tail end of the probe 22, and the other end is connected to the inner conductor of the probe adapter 5, thereby establishing a signal path between the probe 22 and the external test equipment. The length of the adapter cable is provided with appropriate margin to allow for the aforementioned rotational fine-tuning of the probe assembly 2.

[0045] The isolation component is a separate assembly fixedly mounted on the connector mounting bracket 4. It is used to clamp, secure, or buffer the main test cable leading from the probe adapter 5. Due to the sensitive adjustment of the elastic element 334, the isolation component is required to create a relatively fixed structure in the lower part of the device.

[0046] The electrical signal transmission path described above is: Probe 22 – Adapter cable – Probe adapter 5 – Main test cable – Test instrument. When the main test cable between the probe adapter 5 and the external test instrument experiences slight movement, bending, or pulling due to personnel movement, equipment vibration, or improper operation, the resulting mechanical force is transmitted to the isolation component and connector fixing bracket 4, and not directly to the probe adapter 5 and probe 22, thus reducing the impact of cable slight movement on probe 22. This design is suitable for high-precision insertion loss testing at extremely small pitches of 0.2–1.4 mm.

[0047] Furthermore, compared to the cable in related technologies where the probe 22 is directly connected to an external testing instrument, the diameter of the adapter cable between the probe 22 and the adapter is greatly reduced. When operating the height adjustment structure, the drive mechanism can more easily and sensitively drive the entire probe assembly 2 to move vertically.

[0048] According to an embodiment of the present invention, another aspect provides a grounding system including the above-described insertion loss test probe device, which has all of its beneficial effects.

[0049] Although embodiments of the invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the invention, and such modifications and variations all fall within the scope defined by the appended claims.

Claims

1. A probe device for testing insertion loss, characterized in that, include: Mounting bracket (1); The probe grounding structure is disposed on the mounting bracket (1); the probe grounding structure includes two probe assemblies (2), which are arranged symmetrically. A rotation adjustment structure (3) is disposed on at least one of the probe assemblies (2), the rotation adjustment structure (3) being used to drive the probe assembly (2) to rotate so that the discs (25) in the two probe assemblies (2) fit together.

2. The insertion loss testing probe device according to claim 1, characterized in that, The probe assembly (2) includes: The probe mounting base (21) has a first mounting hole (211). The probe (22) is located in the first mounting hole (211), and the disc (25) is mounted on the head end of the probe (22).

3. The insertion loss testing probe device according to claim 2, characterized in that, The probe assembly (2) provided with the rotation adjustment structure (3) further includes: a mounting groove (212), the mounting groove (212) being formed on the probe mounting base (21), the inner diameter of the mounting groove (212) being larger than the inner diameter of the first mounting hole (211), the mounting groove (212) being coaxially arranged with the first mounting hole (211) and the mounting groove (212) communicating with the first mounting hole (211).

4. The insertion loss testing probe device according to claim 3, characterized in that, The rotation adjustment structure (3) includes: The bearing (31) is installed in the mounting groove (212), and the inner hole of the bearing (31) and the first mounting hole (211) form a mounting channel; A rotating flange (32) is arranged in the mounting channel. The rotating flange (32) has a second mounting hole along the axial direction of the mounting channel. The probe (22) in the probe assembly (2) with the rotating adjustment structure (3) is adapted to be installed in the second mounting hole. A rotary drive assembly (33) is mounted on the probe mounting base (21) and is connected to the rotary flange (32) to provide rotary driving force to the rotary flange (32).

5. The insertion loss testing probe device according to claim 4, characterized in that, The rotating flange (32) is provided with a hanging part (323) protruding to one side; The rotary drive assembly (33) includes: A rotary drive base (331) is mounted on the probe mounting base (21); An elastic element (334) is provided, one end of which is mounted on the hanging part (323) and the other end is connected to the rotary drive base (331). The elastic force of the elastic element (334) ranges from 10 to 50g.

6. The insertion loss testing probe device according to claim 5, characterized in that, The elastic element (334) is a tension spring with a K value of 9.8 g / mm.

7. The insertion loss testing probe device according to claim 5, characterized in that, The rotary drive base (331) has a first adjustment hole (332) on the side opposite to the probe mounting base (21) away from the disc (25). A second adjustment hole (333) is provided on the other side of the probe mounting base (21) away from the hanging part (323); The rotary drive assembly (33) further includes: a first adjustment member (335) and a second adjustment member (336), wherein the first adjustment member (335) is adapted to pass through the first adjustment hole (332) and be inserted into the probe mounting base (21) to mount the rotary drive base (331) on the probe mounting base (21); The second adjusting member (336) can pass through the second adjusting hole (333) to abut against the probe mounting base (21); Under the action of external force, the second adjusting member (336) rotates and drives the rotary driving base (331) to move along the side wall of the first adjusting hole (332) away from or near the hanging part (323) to adjust the elastic force applied by the elastic member (334) to the rotary flange (32).

8. The insertion loss testing probe device according to claim 4, characterized in that, The rotary flange (32) includes: a first sleeve portion (321) and a second sleeve portion (322), wherein the first sleeve portion (321) and the second sleeve portion (322) are threadedly connected; The outer diameter of the end of the first sleeve portion (321) away from the second sleeve portion (322) is larger than the inner diameter of the mounting groove (212); The outer diameter of the end of the second sleeve portion (322) away from the first sleeve portion (321) is larger than the inner diameter of the first mounting hole (211).

9. The insertion loss testing probe device according to claim 2, characterized in that, Also includes: A connector fixing bracket (4) is installed on the side of the mounting bracket (1); The probe adapter (5) is mounted on the connector fixing bracket (4); The probe adapter (5) is connected to the probe (22).

10. The insertion loss testing probe device according to claim 9, characterized in that, Also includes: An isolation component is fixedly mounted on the connector fixing bracket (4); The isolation component is used to secure the cable between the probe adapter (5) and the test instrument.

11. A grounding system, characterized in that, The insertion loss test probe device includes any one of claims 1-10.

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