Device and method for verifying the reliability of a scatter parameter analysis assembly

Abstract

Embodiments of the present application relate to the technical field of measurement equipment testing or calibration, and particularly relate to a device and method for verifying reliability of a scattering parameter analysis assembly. The device of embodiments of the present application can use a processing piece and a body assembly to move a target to a predetermined position, and use the processing piece to determine the position of the target according to scattering parameters of the target generated by the scattering parameter analysis assembly, so that the reliability of each component and the cooperation of each component in the scattering parameter analysis assembly can be directly verified by comparing the position of the target with the predetermined position using the processing piece, without verifying each component of the scattering parameter analysis assembly one by one; and the processing piece and the body assembly in the device of embodiments of the present application can change the predetermined position of the target, so that the reliability of the scattering parameter analysis assembly can be verified multiple times, and the reliability of the verification result is enhanced.

Description

Technical Field

[0001] The embodiments of this application relate to the field of testing or calibration technology for measurement equipment, and specifically to an apparatus and method suitable for verifying the reliability of a scattering parameter analysis component. Background Technology

[0002] This section provides background information relevant to this application only and does not necessarily constitute prior art.

[0003] Scattering parameters are network parameters used to describe the signal transmission and reflection characteristics between ports of a radio frequency (RF) or microwave network. They are widely used in RF circuit and antenna design, signal integrity analysis, materials science, and medical testing. Scattering parameters need to be obtained using appropriate scattering parameter analysis equipment, and the accuracy of the obtained scattering parameters directly depends on the performance of the scattering parameter analysis equipment. Therefore, in practical applications, the reliability of the scattering parameter analysis equipment needs to be verified.

[0004] However, existing devices and methods for verifying the reliability of scattering parameter analysis apparatus still have some shortcomings. Summary of the Invention

[0005] A brief overview of this application is provided below to offer a basic understanding of certain aspects thereof. It should be understood that this overview is not an exhaustive summary of the application. It is not intended to identify key or essential parts of the application, nor is it intended to limit its scope. Its purpose is merely to present certain concepts in a simplified form as a prelude to the more detailed description that follows.

[0006] One embodiment of this application provides an apparatus suitable for verifying the reliability of a scattering parameter analysis component. The scattering parameter analysis component is capable of generating scattering parameters of a target. The apparatus includes: a body component, a receiving and mounting component, and a processing component. The processing component is configured to provide predetermined position information to the body component. The body component is configured to move the target to the predetermined position according to the predetermined position information. The receiving and mounting component is configured to contain a dielectric liquid, and the predetermined position of the target is located below the surface of the dielectric liquid. The scattering parameter analysis component is disposed in the receiving and mounting component. The scattering parameter analysis component is configured to generate scattering parameters of the target and send the scattering parameters to the processing component. The processing component is configured to determine the position of the target according to the scattering parameters and compare the position of the target with the predetermined position information provided by the processing component to determine the reliability of the scattering parameter analysis component.

[0007] The apparatus of this application embodiment can move a target to a predetermined position using a processing unit and a body assembly, and determine the target's position using the processing unit based on the target's scattering parameters generated by the scattering parameter analysis assembly. By comparing the target's position with the predetermined position using the processing unit, the reliability of each component in the scattering parameter analysis assembly and the relationship between them can be directly verified without having to verify each component of the scattering parameter analysis assembly individually. Furthermore, the processing unit and body assembly in the apparatus of this application embodiment can change the predetermined position of the target, thereby enabling multiple verifications of the reliability of the scattering parameter analysis assembly and enhancing the credibility of the verification results.

[0008] Another aspect of this application provides a method for verifying the reliability of a scattering parameter analysis component. The scattering parameter analysis component generates scattering parameters of a target. This method employs the apparatus described in any embodiment of the first aspect of this application and specifically includes the following steps: S10: The antenna of the scattering parameter analysis component is mounted on the receiving component of the device; S20: The port extension component of the scattering parameter analysis component is mounted on the receiving component of the device; S30: Different dielectric liquids are disposed in different areas of the receiving component of the device; S40: The vector network analysis component of the scattering parameter analysis component is activated; S50: The processing component of the device provides predetermined position information to the main body component of the device. The main body component of the device moves the target to the predetermined position according to the predetermined position information. The vector network analysis component of the scattering parameter analysis component generates scattering parameters of the target and sends the scattering parameters to the processing component. The processing component determines the position of the target based on the scattering parameters and compares the target's position with the predetermined position information provided by the processing component to determine the reliability of the scattering parameter analysis component.

[0009] The method of this application embodiment can move the target to a predetermined position using a processing unit and a body component, and determine the target's position using the processing unit based on the target's scattering parameters generated by the scattering parameter analysis component. By comparing the target's position with the predetermined position using the processing unit, the reliability of all components in the scattering parameter analysis component can be directly verified without verifying each component of the scattering parameter analysis component individually. Furthermore, the method of this application embodiment can change the predetermined position of the target, thereby enabling multiple verifications of the reliability of the scattering parameter analysis component and enhancing the credibility of the verification results.

[0010] These and other advantages of this application will become more apparent from the following detailed description of preferred embodiments in conjunction with the accompanying drawings. Attached Figure Description

[0011] To further illustrate the above and other advantages and features of this application, the specific embodiments of this application will be described in more detail below with reference to the accompanying drawings. The drawings, together with the following detailed description, are included in and form a part of this specification. Elements having the same function and structure are indicated by the same reference numerals. It should be understood that these drawings only depict typical examples of this application and should not be considered as limiting the scope of this application.

[0012] It should be noted that the accompanying drawings are not necessarily drawn to scale, but are shown only in a schematic manner without affecting the reader's understanding.

[0013] Figure 1 This is a side view of the apparatus according to an embodiment of the present application, in which some components of the scattering parameter analysis component to be verified are also shown; Figure 2 This is a side view of the apparatus according to an embodiment of the present application, in which some components of the scattering parameter analysis component to be verified are also shown; Figure 3 This is a schematic diagram of the structure of the first cylindrical wall of the device according to an embodiment of this application and the antenna of the scattering parameter analysis component mounted thereon.

[0014] Explanation of reference numerals in the attached figures: 100. Apparatus; 110. Body assembly; 111. Frame; 112. Guide rail; 1121. First guide rail; 1122. Second guide rail; 113. Motor; 114. Motor control unit; 115. Actuator; 120. Receiving mounting component; 121. First cylindrical wall; 1210. Through hole; 1211. Plane; 122. Second cylindrical wall; 123. Third wall; 200. Antenna. Detailed Implementation

[0015] Exemplary embodiments of this application will be described below with reference to the accompanying drawings. For clarity and brevity, not all features of actual implementations are described in the specification. However, it should be understood that many implementation-specific decisions must be made in the development of any such actual embodiment to achieve the developer's specific goals, such as complying with constraints related to the system and business, and these constraints may vary depending on the implementation. Furthermore, it should be understood that while development work can be very complex and time-consuming, such development work is merely a routine task for those skilled in the art who benefit from the content of this application.

[0016] It should also be noted that, in order to avoid obscuring this application with unnecessary details, only the equipment structure and / or processing steps closely related to the solution according to this application are shown in the accompanying drawings, while other details that are not closely related to this application are omitted.

[0017] It should be noted that, unless otherwise defined, the technical or scientific terms used in this application shall have the ordinary meaning as understood by a person with ordinary skills in the field to which this application pertains.

[0018] In the description of the embodiments of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0019] In related technologies, scattering parameter analysis devices used to obtain scattering parameters include multiple components. When verifying the reliability of the scattering parameter analysis device, it is usually necessary to verify each component separately. The verification process is cumbersome and it is difficult to verify the reliability of the cooperation relationship between the various components.

[0020] Based on this, embodiments of this application provide an apparatus suitable for verifying the reliability of a scattering parameter analysis component, which is capable of generating scattering parameters of a target. See also Figure 1 , Figure 1 This is a side view of the apparatus according to an embodiment of the present application, which also shows some components of the scattering parameter analysis component to be verified. The apparatus 100 of this application for verifying the reliability of a scattering parameter analysis component includes: a body assembly 110, a receiving mounting member 120, and a processing member (not shown). The processing member is configured to provide predetermined position information to the body assembly 110, and the body assembly 110 is configured to move a target to a predetermined position according to the predetermined position information. The receiving mounting member 120 is configured to receive a dielectric liquid, and the predetermined position of the target is located below the surface of the dielectric liquid. The scattering parameter analysis component is disposed in the receiving mounting member 120, wherein the scattering parameter analysis component is configured to generate scattering parameters of the target and send the scattering parameters to the processing member. The processing member is configured to determine the position of the target based on the scattering parameters, and compare the position of the target with the predetermined position information provided by the processing member to determine the reliability of the scattering parameter analysis component.

[0021] The apparatus 100 of this embodiment can move a target to a predetermined position using a processing unit and a body assembly 110, and determine the target's position using the processing unit based on the target's scattering parameters generated by the scattering parameter analysis assembly. By comparing the target's position with the predetermined position using the processing unit, the reliability of each component in the scattering parameter analysis assembly and the relationship between them can be directly verified without having to verify each component of the scattering parameter analysis assembly individually. Furthermore, the processing unit and body assembly 110 in the apparatus 100 of this embodiment can change the predetermined position of the target, thereby enabling multiple verifications of the reliability of the scattering parameter analysis assembly and enhancing the credibility of the verification results.

[0022] In some embodiments, the processing unit may be disposed on the body assembly 110 or outside the body assembly 110; for example, it may be an external computer. Figure 1 In the illustrated embodiment, the processing unit is a computer located outside the body assembly 110. Figure 1 It is not shown in the document.

[0023] In some embodiments, the scattering parameter analysis component includes multiple antennas 200, port extenders, a vector network analyzer, and signal transmission lines. The port extenders are configured to extend the ports of the vector network analyzer so that the vector network analyzer can be connected to multiple pairs of antennas 200. The signal transmission lines connect each antenna 200 to the port extenders and connect the port extenders to the vector network analyzer. The vector network analyzer is configured to emit microwave signals, which are transmitted via the port extenders to one antenna 200 and sent to a target. The antenna 200 receives microwave signals emitted by another antenna 200 and sends them to the port extenders, which in turn transmit them to the vector network analyzer. The vector network analyzer then analyzes the received microwave signals to generate scattering parameters of the target. The antennas 200 are disposed within a receiving mounting member 120.

[0024] In such an embodiment, the apparatus 100 of this application can directly verify the reliability of each of the multiple components, including the antenna 200, the port extension component, the vector network analyzer, and the signal transmission line, as well as the reliability of the cooperation between the various components.

[0025] See Figure 2 , Figure 2This is a side view of the apparatus according to an embodiment of this application, which also shows some components of the scattering parameter analysis component to be verified. In some embodiments, the body component 110 includes a frame 111, a guide rail 112, a motor 113, a motor controller 114, and an actuator 115. The guide rail 112 is disposed on the frame 111, the motor 113 is disposed on the guide rail 112, the motor controller 114 drives the motor 113 to move, the motor 113 drives the actuator 115 to move, and the actuator 115 is configured to move the target along the guide rail 112 to a predetermined position.

[0026] In this embodiment, the actuator 115, driven by the motor 113, can move the target along the guide rail 112, thereby moving the target to a predetermined position. This method of controlling the target's movement is not only simple to operate, but also allows for highly precise control over the target's position.

[0027] In some embodiments, the receiving mounting member 120 is disposed within the space formed by the frame 111, and the guide rail 112 is disposed at the upper part of the space, so that the target can be conveniently moved below the surface of the dielectric liquid of the receiving mounting member 120.

[0028] In some embodiments, the actuator 115 is configured to move the target in a vertical direction. In such an embodiment, while moving the target on the guide rail 112, the actuator 115 can also move the target below the surface of the dielectric liquid containing the mounting member 120, and the distance between the target and the surface of the dielectric liquid can be changed, thereby changing the depth position of the target below the surface of the dielectric liquid.

[0029] In some embodiments, the guide rail 112 includes a first guide rail 1121 and a second guide rail 1122. The first guide rail 1121 is disposed on the frame 111, and the second guide rail 1122 is disposed on the first guide rail 1121. The extension direction of the second guide rail 1122 is perpendicular to the extension direction of the first guide rail 1121. The second guide rail 1122 is configured to move along the first guide rail 1121 along the extension direction of the first guide rail 1121, and the target is configured to move along the second guide rail 1122 along the extension direction of the second guide rail 1122.

[0030] In this embodiment, the extension direction of the second guide rail 1122 is set perpendicular to the extension direction of the first guide rail 1121, allowing the target to move to any position on the horizontal plane. Since the target can also move in the depth direction of the dielectric liquid, it can thus move to any position within the dielectric liquid.

[0031] In some embodiments, the receiving mounting member 120 is configured to form a first space and a second space that are isolated from each other. The first space is configured to contain a first dielectric liquid, and the second space is configured to contain a second dielectric liquid. The dielectric constant of the first dielectric liquid is configured to improve the transmittance of microwave signals. The dielectric constant of the second dielectric liquid is configured to simulate the actual application environment of the scattering parameter analysis component. The predetermined position of the target is located below the liquid surface of the second dielectric liquid.

[0032] In this embodiment, by providing a first dielectric liquid that can improve the penetration of microwave signals in the housing mounting 120, the radiation efficiency of the antenna 200 of the scattering parameter analysis component and the quality of the received microwave signals can be improved. By providing a second dielectric liquid in the housing mounting 120, the actual application environment of the scattering parameter analysis component is simulated, and the target is placed below the surface of the second dielectric liquid, so that the target is in an environment similar to the actual application environment of the scattering parameter analysis component, which helps to verify the reliability of the scattering parameter analysis component in practical applications.

[0033] In some embodiments, the first dielectric liquid is configured to match the impedance of the antenna 200 with that of the second dielectric liquid, thereby improving the transmittance of microwave signals.

[0034] In some embodiments, the first dielectric liquid and the second dielectric liquid can be selected by those skilled in the art based on the actual application environment of the scattering parameter analysis component, thereby verifying the reliability of the scattering parameter analysis component under different application environments.

[0035] In some embodiments, the scattering parameter analysis component is applied in the field of detecting intracranial hemorrhage using microwave signals. The scattering parameter analysis component is configured to acquire microwave signals from the patient's brain and determine the corresponding scattering parameters based on the microwave signals, thereby determining intracranial hemorrhage based on the scattering parameters; the dielectric constant of the second dielectric liquid in the device 100 of this embodiment is set to simulate the patient's intracranial environment, with the aim of simulating hemorrhage points in the patient's brain.

[0036] In this embodiment, the dielectric constant of the second dielectric liquid is set to simulate the patient's cranial environment, and the target is placed under the second dielectric liquid, thereby simulating bleeding points in the patient's cranium and verifying the reliability of the scattering parameter analysis component in intracranial hemorrhage detection. Furthermore, the body component 110 can change the position of the target to simulate bleeding points at different locations in the cranium, thereby verifying the reliability of the scattering parameter analysis component when detecting bleeding points at different locations in the cranium. This results in more comprehensive and reliable verification results, and allows for improvements to the scattering parameter analysis component based on the verification results. Thus, during microwave imaging of the patient's cranium, the reliability of the microwave signals from the patient's cranium received by the scattering parameter analysis component and the generated scattering parameters of the cranium are ensured. This allows for the determination of the bleeding status of the cranium using the generated scattering parameters, improving the accuracy and timeliness of intracranial hemorrhage detection.

[0037] In some embodiments, the housing mounting member 120 includes a first cylindrical wall 121, a second cylindrical wall 122, and a third wall 123. The second cylindrical wall 122 is disposed within the first cylindrical wall 121, and the third wall 123 is configured to close one end of the first cylindrical wall 121 and the second cylindrical wall 122. The first cylindrical wall 121, the second cylindrical wall 122, and the third wall 123 form a first space, and the second cylindrical wall 122 and the third wall 123 form a second space. The antenna 200 of the scattering parameter analysis component is disposed on the first cylindrical wall 121.

[0038] In this embodiment, the mounting member 120 is provided with a first cylindrical wall 121, a second cylindrical wall 122, and a third wall 123, such that the mounting member 120 can form a first space and a second space. The first space containing the first dielectric liquid surrounds the second space containing the second dielectric liquid, thereby allowing the first dielectric liquid, which can improve the transmittance of microwave signals, to be disposed between the antenna 200 of the scattering parameter analysis component and the second dielectric liquid simulating the actual application environment of the scattering parameter analysis component. The microwave signals emitted by the antenna 200 and the microwave signals reflected and transmitted by the second dielectric liquid can all pass through the first dielectric liquid first, thereby enhancing their transmittance before being received, thus improving the quality of the microwave signals received by the antenna 200.

[0039] In some embodiments, the end of the receiving mounting member 120 away from the third wall 123 is configured as an opening, the first space communicates with the second space and the outside, so as to facilitate moving the target into the receiving mounting member 120 and injecting a dielectric liquid into the receiving mounting member 120.

[0040] In some embodiments, a plurality of antennas 200 of the scattering parameter analysis component are disposed on the first cylindrical wall 121 along the circumferential direction of the first cylindrical wall 121, and the port extension of the scattering parameter analysis component is disposed on the side of the third wall 123 opposite to the second dielectric liquid.

[0041] In this embodiment, the antenna 200 of the scattering parameter analysis component is arranged along the circumferential direction of the first cylindrical wall 121, enabling it to transmit and receive microwave signals from different directions of the target, thereby receiving more accurate microwave signals. Since the antenna 200 is arranged along the circumferential direction of the first cylindrical wall 121, and the port extension is arranged on the side of the third wall 123 facing away from the second dielectric liquid, the distance between the port extension and each antenna 200 can be equal, facilitating the arrangement of signal transmission lines between the port extension and multiple antennas 200.

[0042] In such an embodiment, the port extension of the scattering parameter analysis component can be located at the bottom of the third wall 123. Figure 1 Not shown in the diagram. Since the antenna 200 is arranged in the circumferential direction along the first cylindrical wall 121 and the port extension is located at the bottom of the third wall 123, this arrangement facilitates the connection between the port extension and the antenna 200, and is closer to the actual use of the port extension and the antenna 200. This makes the reliability of the scattering parameter analysis component verified by the device of the embodiment of this application more practically valuable.

[0043] See Figure 3 , Figure 3 This is a schematic diagram of the structure of the first cylindrical wall of the device according to an embodiment of this application and the antenna of the scattering parameter analysis component mounted thereon. In some embodiments, the first cylindrical wall 121 is configured to form a plurality of through holes 1210, and the antenna 200 of the scattering parameter analysis component is hermetically mounted at a corresponding through hole 1210, so that the radiating port surface of the antenna 200 can directly contact the first dielectric liquid in the first space.

[0044] In such an embodiment, the radiating port surface of the antenna 200 can directly contact the first dielectric liquid in the first space, thereby improving the penetration rate of the microwave signal and thus improving the reception quality of the microwave signal.

[0045] In some embodiments, the first cylindrical wall 121 is formed by a plurality of circumferentially connected planes 1211, and each through hole 1210 is formed on the plurality of planes 1211. The radiating port surface of the antenna 200 mounted in the through hole 1210 is flush with the plane 1211.

[0046] In this embodiment, the radiating port surface of the antenna 200 is flush with the plane 1211, which helps to reduce microwave signal loss and improve the reception quality of microwave signals.

[0047] Embodiments of this application also provide a method for verifying the reliability of a scattering parameter analysis component. The scattering parameter analysis component can generate scattering parameters of a target. The method uses the device 100 in any embodiment of the first aspect of this application and specifically includes the following steps: S10: The antenna 200 of the scattering parameter analysis component is disposed in the receiving mounting part 120 of the device 100; S20: The port extension part of the scattering parameter analysis component is disposed in the receiving mounting part 120 of the device 100; S30: Different dielectric liquids are disposed in different areas of the receiving mounting part 120 of the device 100; S40: The vector network analysis component of the scattering parameter analysis component is activated; S50: The processing unit of the device 100 provides predetermined position information to the body component 110 of the device 100. The body component 110 of the device 100 moves the target to the predetermined position according to the predetermined position information. The vector network analysis component of the scattering parameter analysis component generates the scattering parameters of the target and sends the scattering parameters to the processing unit. The processing unit determines the position of the target according to the scattering parameters and compares the position of the target with the predetermined position information provided by the processing unit to determine the reliability of the scattering parameter analysis component.

[0048] The method of this application embodiment can move the target to a predetermined position using a processing unit and a body component 110, and determine the target's position using the processing unit based on the target's scattering parameters generated by the scattering parameter analysis component. By comparing the target's position with the predetermined position using the processing unit, the reliability of all components in the scattering parameter analysis component can be directly verified without verifying each component of the scattering parameter analysis component individually. Furthermore, the method of this application embodiment can change the predetermined position of the target, thereby enabling multiple verifications of the reliability of the scattering parameter analysis component and enhancing the credibility of the verification results.

[0049] Regarding the embodiments of this application, it should also be noted that, without conflict, the embodiments of this application and the features in the embodiments can be combined with each other to obtain new embodiments.

[0050] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. The scope of protection of this application shall be determined by the scope of the claims.

Claims

1. An apparatus for verifying the reliability of a scattering parameter analysis component, the scattering parameter analysis component being capable of generating scattering parameters of a target, characterized in that, The device includes: Main body components, housing and mounting parts, and processing parts. The processing component is configured to provide predetermined position information to the body component. The body component is configured to move the target to a predetermined position based on the predetermined position information. The receiving mounting component is configured to receive a dielectric liquid. The target is located below the surface of the dielectric liquid; The scattering parameter analysis component is disposed within the receiving mounting component, wherein... The scattering parameter analysis component is configured to generate scattering parameters of the target and send the scattering parameters to the processing component; The processing unit is configured to determine the position of the target based on the scattering parameters, and to determine the reliability of the scattering parameter analysis component by comparing the position of the target with the predetermined position information provided by the processing unit.

2. The apparatus according to claim 1, characterized in that, The main body assembly includes a frame, guide rails, a motor, motor control components, and actuators. The guide rail is mounted on the frame. The motor is mounted on the guide rail, and the motor control unit drives the motor to move. The motor drives the actuator to move. The actuator is configured to move the target along the guide rail to a predetermined position.

3. The apparatus according to claim 2, characterized in that, The mounting component is disposed within the space formed by the frame. The guide rail is located at the top of the space.

4. The apparatus according to claim 2 or 3, characterized in that, The guide rail includes a first guide rail and a second guide rail. The first guide rail is disposed on the frame. The second guide rail is disposed on the first guide rail, and the extension direction of the second guide rail is perpendicular to the extension direction of the first guide rail. The second guide rail is configured to move along the first guide rail in the direction of its extension. The target is configured to move along the second guide rail in the direction of its extension.

5. The apparatus according to claim 1, characterized in that, The receiving and mounting components are configured to form a first space and a second space that are isolated from each other. The first space is configured to contain the first dielectric liquid. The second space is configured to contain a second dielectric liquid; The dielectric constant of the first dielectric liquid is set to improve the transmittance of microwave signals; The dielectric constant of the second dielectric liquid is set to simulate the actual application environment of the scattering parameter analysis component; The target is located at a predetermined position below the surface of the second dielectric liquid.

6. The apparatus according to claim 5, characterized in that, The receiving and mounting component includes a first cylindrical wall, a second cylindrical wall, and a third wall. The second cylindrical wall is disposed inside the first cylindrical wall. The third wall is configured to close one end of both the first cylindrical wall and the second cylindrical wall. The first cylindrical wall, the second cylindrical wall, and the third wall form a first space. The second cylindrical wall and the third wall form a second space; The antenna of the scattering parameter analysis component is disposed on the first cylindrical wall.

7. The apparatus according to claim 6, characterized in that, The multiple antennas of the scattering parameter analysis component are arranged along the circumferential direction of the first cylindrical wall. The port extension of the scattering parameter analysis component is located on the side of the third wall opposite to the second dielectric liquid.

8. The apparatus according to claim 6, characterized in that, The first cylindrical wall is configured to form multiple through holes, and the antenna of the scattering parameter analysis component is hermetically mounted at a corresponding through hole, so that the radiating port surface of the antenna can directly contact the first dielectric liquid in the first space.

9. The apparatus according to claim 8, characterized in that, The first cylindrical wall is configured to be formed by a plurality of circumferentially connected planes. Each of the vias is formed on one of the plurality of planes, and the radiating port surface of the antenna mounted on the via is flush with the plane.

10. A method for verifying the reliability of a scattering parameter analysis component, the scattering parameter analysis component being capable of generating scattering parameters of a target, characterized in that, The method employs the apparatus according to any one of claims 1-9, and specifically includes the following steps: S10: The antenna of the scattering parameter analysis component is mounted on the receiving mounting part of the device; S20: The port expansion component of the scattering parameter analysis component is disposed in the receiving mounting component of the device; S30: Different dielectric liquids are respectively provided in different areas of the receiving and mounting components of the device; S40: Activate the vector network analysis component of the scattering parameter analysis assembly; S50: The processing unit of the device provides predetermined position information to the main body component of the device, the main body component of the device moves the target to the predetermined position according to the predetermined position information, the vector network analysis unit of the scattering parameter analysis component generates the scattering parameters of the target, and sends the scattering parameters to the processing unit; The processing unit determines the position of the target based on the scattering parameters, and compares the position of the target with the predetermined position information provided by the processing unit to determine the reliability of the scattering parameter analysis component.

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