A crystal batch automatic test method and system

Abstract

The application provides a crystal oscillator batch automatic test method and system, and belongs to the technical field of crystal oscillator aging test. The application obtains product specification task data and seat relationship data of a batch of to-be-tested crystal oscillators, binds the to-be-tested crystal oscillators with test seats, collects crystal oscillator frequency data of each test seat according to a preset sampling period, forms a basic frequency sequence, and confirms abnormal seats according to the basic frequency sequence. Then, the application determines an adjacent verification range based on abnormal event data and seat relationship data, and further performs availability discrimination and supplementary confirmation to determine whether adjacent crystal oscillator sampling records can be used for final aging determination. The application can ensure the reliability of test data, reduce unnecessary retesting, reduce the risk of misrelease, and improve the abnormal processing capacity and product delivery efficiency in the unattended batch test scenario.

Description

Technical Field

[0001] This invention relates to the field of crystal oscillator aging test technology, and more specifically to a batch automated testing method and system for crystal oscillators. Background Technology

[0002] Crystal oscillators are electronic devices used to output stable frequency signals and are widely used in communication equipment, navigation equipment, industrial control equipment, metering equipment, and other electronic systems. The frequency stability of crystal oscillators directly affects the timing reference and signal processing accuracy of the entire system. Therefore, during the mass production of crystal oscillators, aging tests are usually a crucial part of quality control before shipment.

[0003] Existing crystal oscillator batch aging test systems typically include computer-based automated testing software, aging cabinets, test boards, crystal oscillator test seats, a power supply control unit, and a frequency acquisition unit. In a typical application, a test batch includes multiple aging cabinets, each containing multiple test boards, and each test board containing multiple crystal oscillator seats. After the operator installs the crystal oscillator under test into each test seat, the computer-based automated testing software reads the product number, nominal frequency, allowable frequency difference range, power supply specifications, aging time, sampling period, and judgment rules. It then powers on the cabinets and acquires frequency data from the crystal oscillators in each seat according to the preset sampling period.

[0004] Traditional batch aging test methods typically treat each crystal oscillator as an independent test object. When a crystal oscillator in a test slot experiences frequency exceeding limits, no output, abnormal oscillation, or continuous sampling failures during testing, the system generally marks that crystal oscillator as an abnormal product and outputs an anomaly report after the test. This approach is suitable for general testing scenarios, where an abnormal crystal oscillator only affects its own test results, and the sampling data of other crystal oscillators remain valid by default. However, in actual batch testing environments, a test anomaly in one crystal oscillator product may affect the anomaly judgment of other crystal oscillators. Although multiple crystal oscillators on the same test board are independent at the product level, they are not completely isolated at the test system level. Multiple crystal oscillator slots may share local power supply branches, ground return paths, board-level frequency sampling switching channels, frequency counting front-ends, or reference paths on the test board. When a crystal oscillator experiences a serious anomaly, such as an abnormally low output terminal, abnormal output signal amplitude, a sudden and significant frequency deviation, repeated changes in oscillation state, or an abnormal increase in supply current, this anomaly may cause sampling results from adjacent slots on the same local power supply branch or the same sampling path to change in a short period of time in ways that are difficult to explain directly.

[0005] For example, in scenarios with the same power supply branch, a sudden increase in the supply current or an abnormal output state of a faulty crystal oscillator may cause a short-term change in the local supply voltage or ground reference state of that branch, causing other crystal oscillators sharing that branch to exhibit frequency sampling value deviations around the same sampling period. In scenarios with the same sampling path, the frequency acquisition module typically reads the frequency output of multiple locations sequentially via a switch array or channel switching method. If the output signal amplitude of the faulty crystal oscillator is abnormal, the waveform edges are abnormal, or a stable counting signal cannot be formed, there may be a short recovery process when the sampling switching path switches to an adjacent channel, causing abnormal changes in the sampling values ​​of adjacent locations. In scenarios with adjacent locations within the board, the trace distance, test fixture position, and local electrical connections of adjacent locations are closer. After one crystal oscillator malfunctions, adjacent locations are more likely to exhibit sampling records inconsistent with their own aging patterns within a similar timeframe. Therefore, a faulty crystal oscillator does not necessarily change the quality status of other crystal oscillator products, but it may affect the test system's interpretation of the sampling data of other crystal oscillator products. If traditional methods still consider all adjacent crystal oscillator sampling data as valid, sampling records affected by abnormal events may be used for the final aging judgment, resulting in false releases. If all adjacent crystal oscillators on the same board are re-aged or the entire board is retested in order to reduce risks, a large number of products that could have been judged normally will have their testing extended, occupying rack resources and affecting delivery.

[0006] Therefore, in the process of automated batch testing of crystal oscillators, how to determine the availability of adjacent crystal oscillator sampling records when a test anomaly occurs in a certain crystal oscillator product is a technical problem that urgently needs to be solved. Summary of the Invention

[0007] The purpose of this invention is to provide a batch automated testing method and system for crystal oscillators, so as to solve the problem that existing batch crystal oscillator aging test methods cannot accurately determine whether the sampling records of adjacent crystal oscillators can be used for the final aging determination after the occurrence of abnormal crystal oscillators.

[0008] To achieve the above objectives, a first aspect of the present invention provides a method for automated batch testing of crystal oscillators, the method comprising: Obtain the product specification task data and seat relationship data of the crystal oscillators to be tested in this batch, and bind each crystal oscillator to the corresponding test seat; wherein, the seat relationship data includes the intra-board adjacent relationship, the relationship of the same power supply branch, and the relationship of the same sampling path between test seats; The crystal oscillator frequency data of each test seat are collected according to the preset sampling period to form a basic frequency sequence corresponding to each test seat, and abnormal event data including abnormal seats are generated. Based on the abnormal event data and the seat relationship data, an adjacent verification range related to the abnormal seat is generated, and seat-level isolation is performed on the abnormal seat, while the test seats within the adjacent verification range continue to undergo aging tests. After the abnormal seat is isolated at the seat level, the sampling path related to the abnormal seat is connected to a preset reference signal to perform reference path verification and generate reference path verification data. Based on the reference path verification data, the sampling records of test seats within the adjacent verification range are divided into time slices and their availability is determined to generate a set of available time slices. Based on the set of available time slices, the aging determination of adjacent crystal oscillators is completed.

[0009] A second aspect of the present invention provides a batch automated testing system for crystal oscillators, the system being used to execute the above-described batch automated testing method for crystal oscillators, the system comprising: The binding module is used to acquire the product specification task data and seat relationship data of the crystal oscillators to be tested in this batch, and bind each crystal oscillator to the corresponding test seat; wherein, the seat relationship data includes the intra-board adjacent relationship, the relationship of the same power supply branch, and the relationship of the same sampling path between test seats; The generation module is used to collect crystal oscillator frequency data of each test seat according to a preset sampling period, form a basic frequency sequence corresponding to each test seat, and generate abnormal event data including abnormal seats. The isolation module is used to generate an adjacent verification range related to the abnormal seat based on the abnormal event data and the seat relationship data, and to perform seat-level isolation on the abnormal seat, while keeping the test seats within the adjacent verification range to continue aging tests. The verification module is used to perform reference path verification on the sampling path access preset reference signal of the abnormal seat after the abnormal seat has been isolated at the seat level, and generate reference path verification data. The determination module is used to divide the sampling records of test seats within the adjacent verification range into time slices and determine availability based on the reference path verification data, generate a set of available time slices, and complete the aging determination of adjacent crystal oscillators based on the set of available time slices.

[0010] Beneficial effects: This invention acquires product specification task data and seat relationship data of the crystal oscillators to be tested in this batch, binds the crystal oscillators to the test seats, collects the crystal frequency data of each test seat according to the preset sampling period, forms a basic frequency sequence, and identifies abnormal seats based on this. Then, based on the abnormal event data and seat relationship data, it determines the adjacent verification range, and then performs availability discrimination and supplementary sampling confirmation to determine whether the adjacent crystal oscillator sampling records can be used for the final aging judgment. This can reduce unnecessary retesting while ensuring the reliability of test data, reduce the risk of false release, and improve the abnormal handling capability and product delivery efficiency in unattended batch testing scenarios. Attached Figure Description

[0011] To more clearly illustrate the technical solutions in the embodiments of the present invention or related technologies, the accompanying drawings used in the description of the embodiments of the present invention or related technologies will be briefly introduced below. Obviously, the drawings described below are merely some embodiments of the present invention. For those skilled in the art, other related drawings can be obtained based on these drawings without any creative effort.

[0012] Figure 1 This is a flowchart of the steps of the automated batch testing method for crystal oscillators in an embodiment of the present invention.

[0013] Figure 2 This is the hardware architecture layout of the automated batch testing system for crystal oscillators in this embodiment of the invention.

[0014] Figure 3 This is a schematic diagram of the time slice distribution before and after an abnormal event in an embodiment of the present invention.

[0015] Figure 4 This is a schematic diagram of the sampling record availability determination and report generation process in an embodiment of the present invention.

[0016] Figure 5 This is a structural principle block diagram of the automated batch testing system for crystal oscillators in an embodiment of the present invention. Detailed Implementation

[0017] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings, tables, and embodiments. It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the invention.

[0018] like Figure 1 As shown in the figure, an automated batch testing method for crystal oscillators proposed in this embodiment of the invention includes the following steps: S10: Obtain the product specification task data and seat relationship data of the crystal oscillators to be tested in this batch, and bind each crystal oscillator to the corresponding test seat; wherein, the seat relationship data includes the intra-board adjacent relationship, the relationship of the same power supply branch, and the relationship of the same sampling path between test seats.

[0019] like Figure 2 As shown, the hardware architecture of this application includes a computer test terminal, an aging cabinet and its cabinet control module, frequency acquisition module and test board; the test board has multiple test seats (S01-S08 are used as examples in the figure), the cabinet control module is used for power supply control, and the frequency acquisition module is used for frequency sampling.

[0020] In this embodiment of the invention, before the batch aging test begins, the computer testing terminal automatically obtains the product specification task data of the crystal oscillators to be tested in this batch from the management system, the batch task table, or a manually imported file. The product specification task data includes the product number, product model, nominal frequency, allowable frequency difference range, power supply specification, total aging time, sampling period, minimum effective sampling quantity, and aging judgment rules.

[0021] Among them, the product number is used to distinguish different crystal oscillators under test; the product model is used to associate with the corresponding specifications; the nominal frequency is used to compare with the actual sampling frequency; the allowable frequency difference range is used to determine whether the sampling data meets the specifications; the power supply specifications are used to enable the cabinet control module to provide the required working power to the corresponding seat; the total aging time and sampling cycle are used to determine the test duration and number of samplings; and the minimum number of valid samples is used to determine whether there is sufficient basis for the final aging judgment.

[0022] The system also acquires seat relationship data. This seat relationship data is test board structure data, used to characterize the intra-board adjacency, shared power supply branch, and shared sampling path relationships between test seats. Intra-board adjacency indicates that two seats are physically adjacent or close to each other on the test board; shared power supply branch relationship indicates that multiple seats share the same local power supply branch or ground return path; shared sampling path relationship indicates that multiple seats are sampled via the same sampling switching unit, frequency counting front end, or related test path.

[0023] As is easily understood, seat relationship data is used to determine which seats' sampling records need to undergo further processing after an anomaly occurs in a particular seat. In traditional testing methods, systems facing an abnormal crystal oscillator typically can only process the abnormal seat itself, or expand the processing to the entire test board. The former may miss adjacent crystal oscillators that share power supply or sampling paths with the abnormal seat, while the latter expands the scope of backtesting. Therefore, this invention, through seat relationship data, can limit the processing scope to test seats that have a structural relationship with the abnormal seat.

[0024] In one implementation, after the operator installs the crystal oscillator under test onto the test board in the aging cabinet, the system establishes a binding relationship between the product number and the test seat through barcode scanning, batch import, or seat selection. For example, if a crystal oscillator with product number X20230317-001 is installed in the fourth seat of the third test board in cabinet one, the system will bind this crystal oscillator as C1-B03-S04. Here, C1 represents cabinet one, B03 represents the third test board, and S04 represents the fourth seat.

[0025] The system then writes the product specification task data, the binding relationship between the product number and the test seat, and the seat relationship data into the batch test task.

[0026] Table 1: Batch Test Tasks X20260520-001 C1-B03-S04 10,000,000Hz ±50Hz 2 hours 24 hours Adjacent to S03 / S05; on the same branch S01-S03; on the same path S08 X20260520-002 C1-B03-S03 10,000,000Hz ±50Hz 2 hours 24 hours Adjacent to S02 / S04; on the same branch S01-S04 X20260520-003 C1-B03-S08 10,000,000Hz ±50Hz 2 hours 24 hours Same path S04 / S06 As shown in Table 1, C1-B03-S04 contains product specification information and structural relationship information between it and other seats. When C1-B03-S04 is identified as an abnormal seat in subsequent steps, the system can determine the adjacent verification range based on this seat relationship summary.

[0027] S20: Collect crystal oscillator frequency data of each test seat according to the preset sampling period, form a basic frequency sequence corresponding to each test seat, and generate abnormal event data including abnormal seats.

[0028] In this embodiment of the invention, after the batch test task is established, the computer test terminal sends a power-on command to the rack control module. The rack control module provides power to the corresponding test seats according to the power supply specifications of each product in the batch test task. After power supply is complete, the system records the power-on start time of each seat and samples the frequency of the crystal oscillator at each seat according to a preset sampling period.

[0029] In one implementation, the sampling period is set to once every 2 hours. If the total aging time is 24 hours, each crystal oscillator will obtain at least 12 sampling records. The sampling period can also be set to once every 1 hour, once every 30 minutes, or other periods, depending on product specifications and production requirements.

[0030] During frequency sampling, the frequency acquisition module sequentially connects to the frequency output terminals of each test station via a sampling switch, and the corresponding frequency is read by the frequency counting unit. After each sampling is completed, the system associates and saves the frequency data with the product number, test station, sampling time, sampling sequence number, nominal frequency, and allowable frequency difference range to form the basic frequency sequence for the corresponding test station.

[0031] Taking a crystal oscillator with a nominal frequency of 10MHz and an allowable frequency difference range of ±50Hz as an example, when the actual frequency of a certain sampling point is 10,000,020Hz, the difference between it and the nominal frequency is 20Hz, which does not exceed the allowable frequency difference range, and the sampling point meets the specification requirements; when the actual frequency of a certain sampling point is 10,000,085Hz, the difference between it and the nominal frequency is 85Hz, which exceeds the allowable frequency difference range, and the sampling point does not meet the specification requirements.

[0032] In one specific implementation, specification deviation judgment can be achieved by calculating the absolute difference between the actual sampling frequency and the nominal frequency, and then comparing this absolute difference with the allowable frequency deviation range. If the absolute difference is less than or equal to the allowable frequency deviation range, the sampling record meets the specifications; if the absolute difference is greater than the allowable frequency deviation range, the sampling record exceeds the specifications. This judgment method directly corresponds to the frequency deviation requirements of crystal oscillator products, making it easy for the system to confirm whether the sampling record meets the product specifications.

[0033] To avoid misjudgments caused by single, sporadic sampling, the system can also employ continuous sampling confirmation rules. In one implementation, when the difference between the sampling frequency and the nominal frequency of two consecutive samples at the same test seat is greater than the allowable frequency difference range, the subsequent sampling time is determined as the abnormal confirmation time, and the sampling sequence number corresponding to the subsequent sample is determined as the abnormal confirmation sampling sequence number. That is, if a test seat exceeds the allowable frequency difference range in both the 5th and 6th samples, the system determines the 6th sampling time as the abnormal confirmation time and the 6th sampling sequence number as the abnormal confirmation sampling sequence number.

[0034] In another implementation, if the difference between the sampling frequency and the nominal frequency is greater than the allowable frequency difference range in at least two out of three consecutive samples taken at the same test seat, the last sampling time that meets this condition is determined as the anomaly confirmation time. For example, if the 4th and 6th samples at a test seat exceed the allowable frequency difference range, the system will determine the 6th sampling time as the anomaly confirmation time. This method can both avoid a single anomaly directly triggering subsequent processes and promptly identify persistent or intermittent anomalies.

[0035] In this embodiment of the invention, after a seat is identified as an abnormal seat, the system generates abnormal event data. The abnormal event data includes at least the abnormal seat, the abnormal product number, the abnormal confirmation sampling number, the abnormal confirmation time, the frequency data at the time of abnormal confirmation, the product's nominal frequency, the allowable frequency difference range, and the seat relationship data of the abnormal seat.

[0036] For example, if seat C1-B03-S04 exceeds the allowable frequency difference range in both the 5th and 6th samples, the system will identify C1-B03-S04 as an abnormal seat and use the 6th sampling time as the abnormal confirmation time. The abnormal seat in the abnormal event data is used to determine the subsequent processing target, the abnormal confirmation time is used to divide the time slices of adjacent crystal oscillator sampling records, the abnormal frequency data is used to record the degree of abnormality, and the seat relationship data of the abnormal seats is used to determine the adjacent verification range.

[0037] S30: Based on the abnormal event data and the seat relationship data, generate an adjacent verification range related to the abnormal seat, and perform seat-level isolation on the abnormal seat, while continuing to perform aging tests on the test seats within the adjacent verification range.

[0038] In this embodiment of the invention, after generating abnormal event data, the system extracts abnormal seats from the abnormal event data and reads the seat relationship data corresponding to the abnormal seats. Based on the seat relationship data, the system includes test seats that have an intra-board adjacent relationship, a relationship with the same power supply branch, or a relationship with the same sampling path as the abnormal seats in the adjacent verification scope.

[0039] Specifically, the adjacent verification range can be generated by first reading the adjacent seats within the board of the abnormal seat and including them in the adjacent verification range; then reading the seats on the same power supply branch of the abnormal seat and including them in the adjacent verification range; then reading the seats on the same sampling path of the abnormal seat and including them in the adjacent verification range; finally, merging the duplicate seats and generating relationship description information for each seat.

[0040] For example, if the abnormal seat is C1-B03-S04, and its adjacent seats within the board are S03 and S05, its seats on the same power supply branch are S01, S02, and S03, and its seats on the same sampling path are S02, S06, and S08, then the adjacent verification range includes S01, S02, S03, S05, S06, and S08. For S03, the relationship description information can be recorded as "adjacent within the board and on the same power supply branch"; for S06, the relationship description information can be recorded as "on the same sampling path"; and for S05, the relationship description information can be recorded as "adjacent within the board". This relationship description information is used in subsequent sampling record availability determination.

[0041] It's important to note that including a test seat in the adjacent verification range does not necessarily mean that the corresponding crystal oscillator is faulty, nor does it mean that its sampling record is invalid. Rather, it indicates that there is a structural connection between this seat and the faulty seat, requiring additional data analysis after an anomaly occurs. This process separates whether a test seat needs attention from whether it ultimately becomes faulty, avoiding direct rejection or complete disregard.

[0042] After generating the adjacent verification range, the system sends a seat-level isolation command to the rack control module based on the abnormal event data. Seat-level isolation can be achieved by setting a MOS switch, relay, electronic switch, or independent power supply control channel at the power supply end of each test seat, or by disconnecting the connection between the output end of the abnormal seat and the frequency acquisition module through a sampling switch. For test boards with both independent power supply switches and independent sampling access switches, the system prioritizes cutting off the power supply to the abnormal seat and disconnecting the sampling access of the abnormal seat to reduce the possibility of the abnormal crystal oscillator continuing to affect the sampling status of adjacent test seats. After receiving the seat-level isolation command, the rack control module only cuts off the power supply switch of the abnormal seat and / or disconnects the connection of the output signal of that seat participating in sampling, without cutting off the power supply to other seats on the same test board or stopping the overall rack testing.

[0043] It should be noted that, in this embodiment of the invention, seat-level isolation is used to stop the abnormal crystal oscillator from continuing to be in the test operation state, reducing the possibility of the abnormal crystal oscillator continuing to affect the seats on the same board, while maintaining the continuity of the aging process of adjacent crystal oscillators. If the entire board is powered off, although the abnormal source can be stopped quickly, the aging continuity of all crystal oscillators on the same board will be disrupted, and it is usually necessary to recalculate the aging time or arrange the entire board to be retested. In contrast, seat-level isolation can limit the scope of the impact to the abnormal seat itself.

[0044] After isolation of the abnormal test oscillator is completed, the system records the isolation completion time. This time is used to distinguish whether adjacent crystal oscillator sampling records occurred before or after the abnormal test oscillator isolation. Records with sampling times earlier than the isolation completion time are classified as "before isolation"; records with sampling times later than or equal to the isolation completion time are classified as "after isolation." After the abnormal test oscillator is isolated, the system continues to collect crystal oscillator frequency data from each test oscillator within the adjacent verification range. The collected data is still associated with and saved with the product number, test oscillator, sampling time, sampling sequence number, and product specification information. In this way, the aging process of adjacent crystal oscillators is not interrupted due to abnormal test oscillator isolation, and subsequent analysis of the isolated sampling data can determine whether they have recovered to a usable state for assessment.

[0045] S40: After the abnormal seat is isolated at the seat level, the sampling path related to the abnormal seat is connected to a preset reference signal to perform reference path verification and generate reference path verification data.

[0046] After the abnormal seat is isolated at the seat level, the system performs reference path verification. It should be noted that reference path verification is not a retest of the abnormal crystal oscillator itself, but rather, after the abnormal crystal oscillator is isolated, it verifies whether the sampling path related to the abnormal seat can still collect frequency data normally by using a preset reference signal.

[0047] In this embodiment of the invention, reference path verification refers to, after the abnormal seat is isolated at the seat level, connecting a preset reference signal with a known standard frequency to the sampling input terminal originally corresponding to the abnormal seat, or to the upstream input terminal sharing a sampling path with the abnormal seat. This allows the preset reference signal to be read by the frequency acquisition module after passing through the same or related sampling path as the abnormal seat. The deviation between the read reference frequency data and the standard frequency of the reference signal is then used to determine whether the sampling path meets the verification requirements. Here, the same or related sampling paths include the sampling path originally used by the abnormal seat, paths sharing a sampling switch with the abnormal seat, paths sharing a frequency counting front-end with the abnormal seat, or paths that share the same sampling path relationship with the abnormal seat.

[0048] As is easily understood, the preset reference signal can be provided by the reference crystal oscillator on the test board, by the standard frequency source inside the rack, or by the built-in reference output of the frequency acquisition module. The standard frequency and allowable verification deviation of the preset reference signal are known values, and can be read by the frequency acquisition module through the sampling path related to the abnormal position.

[0049] In practice, the system controls the sampling switch on the test board to connect the preset reference signal to the sampling input terminal originally corresponding to the abnormal seat, or to the upstream input terminal sharing a sampling path with the abnormal seat. After passing through the same or related sampling path as the abnormal seat, the preset reference signal is read by the frequency acquisition module. Subsequently, the system compares the read reference frequency data with the standard frequency of the reference signal to determine whether the sampling path meets the verification requirements.

[0050] The verification of the reference path can be determined by calculating the absolute difference between the reference frequency data and the standard frequency of the reference signal, and then comparing this absolute difference with the allowable verification deviation. If the absolute difference is less than or equal to the allowable verification deviation, the relevant sampling path is determined to meet the verification requirements; if the absolute difference is greater than the allowable verification deviation, the relevant sampling path is determined to not meet the verification requirements.

[0051] For example, the preset reference signal standard frequency is 10,000,000Hz, and the allowable verification deviation is 10Hz. If the reference frequency data acquired by the frequency acquisition module is 10,000,006Hz, the difference between the reference frequency data and the standard frequency is 6Hz, which is less than the allowable verification deviation of 10Hz, and the sampling path is determined to meet the verification requirements. If the acquired reference frequency data is 10,000,026Hz, the difference is 26Hz, which is greater than the allowable verification deviation of 10Hz, and the sampling path is determined to not meet the verification requirements.

[0052] The purpose of reference path verification is to ensure that if the required frequency data can still be obtained by reading the known reference signal through the same related sampling path after the abnormal crystal oscillator is isolated, it indicates that the path has the basic conditions for continued sampling after isolation; if the required frequency data cannot be obtained by the reference signal through the path, it indicates that the path itself may have a problem, and the sampling records of related adjacent seats should not be directly included in the final judgment.

[0053] After this, the system will save the verification start time, verification end time, reference frequency data, reference signal standard frequency, allowable verification deviation, and verification result as reference path verification data. This reference path verification data is used to assist in subsequent judgments on whether adjacent crystal oscillator sampling records can be directly used.

[0054] S50: Based on the reference path verification data, the sampling records of the test seats within the adjacent verification range are divided into time slices and their availability is determined to generate a set of available time slices. Based on the set of available time slices, the aging determination of adjacent crystal oscillators is completed.

[0055] like Figure 3 As shown in this embodiment of the invention, the system reads the basic frequency sequence of each test seat within the adjacent verification range, and divides its sampling records into time slices based on the anomaly confirmation time, isolation completion time, reference path verification start time, and reference path verification end time. The resulting time slices include a pre-anomaly stable segment, anomaly confirmation associated segment, post-isolation observation segment, and reference path verification associated segment.

[0056] Figure 3 The timeline sequentially shows the test start time t0, anomaly confirmation time, anomaly seat isolation completion time, reference path verification start time, reference path verification end time, and the current aging test end time. The anomaly confirmation time, isolation completion time, reference path verification start time, and reference path verification end time are used to define the stable segment before the anomaly, the anomaly confirmation-related segment, the post-isolation observation segment, and the reference path verification-related segment. Meanwhile, Figure 3 The diagram also illustrates subsequent sampling segments after the reference path verification is completed, used to represent the sampling process that continues after verification.

[0057] Specifically, the pre-anomaly stability segment comprises all valid sampled records from the test start time to the anomaly confirmation time, or a preset number of valid sampled records before the anomaly confirmation time. This segment represents the normal frequency state of adjacent crystal oscillators before the anomaly event. The anomaly confirmation associated segment comprises sampled records from the anomaly confirmation time to the isolation completion time. This segment may contain sampled records affected by the anomaly event and should not be used unconditionally. The post-isolation observation segment comprises sampled records from the isolation completion time to the reference path verification start time. This segment is used to observe whether adjacent crystal oscillators have recovered to a usable state after isolation of the anomaly location. The reference path verification associated segment comprises sampled records from the reference path verification start time to the reference path verification end time, or sampled records within one or more sampling periods after the reference path verification start time to the reference path verification end time. This segment is used in conjunction with the reference path verification results for usability assessment.

[0058] Time-slice partitioning organizes existing sampling records without altering the actual aging process of the crystal oscillator. By partitioning the data, the system can determine which stage of the abnormal event handling process each sampling record is in, avoiding the indiscriminate use of all sampling records for the final judgment.

[0059] like Figure 4 As shown, the sampling record availability determination and report generation process is based on the basic frequency sequence and combines abnormal event data, isolation status data and reference path verification data to divide time slices. Then, after specification deviation judgment and segment difference judgment, it enters the corresponding processing branch. Available records are imported into the available time slice set and used to generate aging judgment results and abnormal event association reports.

[0060] After time-slice division, the system checks the specifications of each sampling record within the adjacent verification range. The method is the same as during anomaly confirmation: the absolute difference between the actual sampling frequency and the nominal frequency is calculated, and this absolute difference is compared with the allowable frequency deviation range. If the difference is less than or equal to the allowable frequency deviation range, it indicates that the sampling record itself is within specifications; if the difference is greater than the allowable frequency deviation range, it indicates that the sampling record has exceeded specifications and can be used as one of the bases for diagnosing anomalies in adjacent crystal oscillators.

[0061] Subsequently, the system performs segment difference judgment. The system first selects representative frequency data from the stable segment before the anomaly. The representative frequency data can be the median frequency value of multiple sampling records in the stable segment before the anomaly. The reason is that the median frequency value is not easily affected by individual sporadic sampling points and is more suitable to represent the stable state of the crystal oscillator before the anomaly occurred.

[0062] In this embodiment of the invention, the segment difference judgment can be achieved by calculating the absolute difference between the actual frequency of the sampled record to be judged and the representative frequency of the stable segment before the anomaly, and then comparing this difference with the allowable range of segment differences. When the difference is within the allowable range of segment differences, it indicates that the sampled record is in good consistency with the stable state before the anomaly; when the difference exceeds the allowable range of segment differences, it indicates that the sampled record has changed significantly relative to the stable state before the anomaly, and further judgment is needed in conjunction with the isolation state and reference path verification results.

[0063] In practical applications, to avoid a lack of basis for the allowable range of segment differences, the allowable range of segment differences can be directly adopted from the allowable frequency range in the product specification task data. If a segment difference ratio is configured in the product specification task data, the allowable range of segment differences can be the product of the allowable frequency range and the segment difference ratio. For example, if the allowable frequency range is ±50Hz and the segment difference ratio is 0.8, then the allowable range of segment differences is 40Hz; if no segment difference ratio is configured, the allowable frequency range is used by default as the allowable range of segment differences.

[0064] Following this, the system marks each sampling record as one of four states based on specification deviation judgment, fragment difference judgment, isolation status, reference path verification data, and relationship description information: Can be used directly: When a sampling record itself does not exceed the specifications, and the difference relative to the stable segment before the anomaly is within the allowable range, and the reference path verification results show that the relevant sampling path meets the verification requirements, the sampling record is marked as can be used directly.

[0065] Need for supplementary sampling confirmation: When a sampling record itself does not exceed the specifications, but occurs before the isolation of the abnormal seat or near the confirmation of the abnormality, and changes significantly relative to the stable segment before the abnormality, the sampling record is marked as needing supplementary sampling confirmation.

[0066] Not Used Temporarily: When the reference path verification results show that the relevant sampling path does not meet the verification requirements, and the test seat and the abnormal seat have the same sampling path relationship, the sampling record is marked as not used temporarily.

[0067] Self-abnormality: When a sampling record exceeds the product specifications, the sampling record is marked as self-abnormal.

[0068] Table 2: Results of Sampling Record Marking and Discrimination 1 Stable fragments before anomalies 10,000,008Hz 8Hz — Not executed Can be used directly 2 Stable fragments before anomalies 10,000,010Hz 10Hz — Not executed Can be used directly 3 Stable fragments before anomalies 10,000,009Hz 9Hz — Not executed Can be used directly 4 Anomaly Confirmation Related Fragments 10,000,043Hz 43Hz 34Hz Not executed Further sampling is required for confirmation. 5 Anomaly Confirmation Related Fragments 10,000,047Hz 47Hz 38Hz Not executed Further sampling is required for confirmation. 6 Post-isolation observation footage 10,000,012Hz 12Hz 3Hz Meets verification requirements Can be used directly 7 Reference path verification associated fragments 10,000,011Hz 11Hz 2Hz Meets verification requirements Can be used directly In Table 2, the representative frequency of the stable segment before the anomaly can be taken as the median frequency of the first to third samples, i.e., 10,000,009 Hz. Although the fourth and fifth samples did not exceed the product specification of ±50 Hz, they showed significant changes relative to the representative frequency before the anomaly and occurred near the anomaly confirmation point; therefore, they were marked as requiring additional sampling for confirmation. The sixth and seventh samples occurred after the anomaly seat isolation, and the reference path verification results met the requirements; their frequency data were close to the representative frequency before the anomaly, therefore, they were marked as directly usable.

[0069] After the sampling records are identified, the system writes the sampling times corresponding to the sampling records marked as directly usable into the available time slice set. It should be noted that the available time slice set does not copy all sampling records; it only saves the sampling times that can be used for the final aging determination and their corresponding states. Sampling records marked as temporarily unusable or abnormal do not directly enter the final release determination. If an adjacent test seat has a sampling record marked as requiring supplementary sampling confirmation, the system generates a supplementary sampling task. The supplementary sampling task includes at least the test seat, the sampling sequence number requiring supplementary sampling confirmation, the segment requiring supplementary sampling confirmation, the number of supplementary sampling attempts, and the next executable supplementary sampling time. After the supplementary sampling task is sent to the sampling scheduling module, the sampling scheduling module performs supplementary sampling at the test seat in the next sampling cycle or at the preset supplementary sampling time.

[0070] As is easy to understand, the purpose of supplementary sampling is not to directly use the previously questionable sampling frequency data as valid data, nor to restart the aging test of the entire crystal oscillator, but to confirm whether the crystal oscillator has returned to a frequency state that can be used for judgment after the abnormal event is handled, and to supplement the amount of valid data required for the final judgment by supplementing the frequency data.

[0071] After supplementary sampling is completed, the system acquires the supplementary sampling frequency data and performs specification deviation and segment difference checks on it. Specification deviation checks confirm whether the supplementary sampling frequency data meets product specifications; segment difference checks confirm whether the supplementary sampling frequency data is consistent with the representative frequency of the stable segment before the anomaly. If the supplementary sampling frequency data meets both of these requirements, the system writes the supplementary sampling frequency data as usable frequency data into the available time slice set and records the corresponding original supplementary sampling confirmation segment in the anomaly event association report. If the supplementary sampling frequency data does not meet the specification deviation or segment difference requirements, the system marks the corresponding original supplementary sampling confirmation segment as temporarily unusable and generates a review prompt message.

[0072] Original sampling frequency data marked as requiring supplementary sampling confirmation are not directly included in the final aging assessment. The data ultimately used for aging assessment includes two categories: one is the original sampling frequency data already marked as directly usable; the other is the supplementary sampling frequency data that has been confirmed to meet the requirements. This process avoids directly using suspicious data near the point of anomaly confirmation as the basis for acceptance.

[0073] For example, the 4th and 5th samples in Table 2 are marked as requiring supplementary sampling for confirmation. If the system performs supplementary sampling during the 8th sample, with a sampling frequency of 10,000,010Hz, the difference from the nominal frequency is 10Hz, and the difference from the pre-abnormal frequency of 10,000,009Hz is 1Hz. This indicates that the adjacent crystal oscillator has recovered to a state close to that before the anomalous situation. The system writes the 8th supplementary sampling frequency data into the available time slice set and records the corresponding 4th and 5th supplementary sampling confirmation segments in the report. If the supplementary sampling frequency is 10,000,088Hz, it indicates that the crystal oscillator still has a significant abnormality. The system marks the corresponding suspicious segment as temporarily unusable and prompts for a review of the crystal oscillator or related test paths.

[0074] After completing time-slice identification and supplementary sampling confirmation, the system generates a final set of usable time slices for each test seat within the adjacent verification range. The final set of usable time slices includes sampling times directly marked as usable, as well as sampling times corresponding to the supplementary frequency data. The system extracts the frequency data corresponding to the usable time slice set from the base frequency sequence and the supplementary frequency data to form a usable frequency sequence.

[0075] Subsequently, the system performs an aging test on the available frequency sequence according to the judgment rules in the product specification task data. If all frequency data in the available frequency sequence meets the product specifications and the number of effective samples reaches the minimum judgment requirement, the corresponding crystal oscillator is judged as qualified. If the number of effective samples is insufficient, the system generates an extended sampling task. If there is a record in the available frequency sequence indicating an abnormality of the crystal oscillator itself, the crystal oscillator enters an independent abnormality handling process.

[0076] It should be noted that the minimum judgment requirement means that a crystal oscillator must have at least a preset number of valid sampling records before completing the aging judgment. For example, if a product requires at least 10 valid sampling points during the 24-hour aging period, then if there are fewer than 10 valid sampling points in the available time slice set, the system must not release the product directly, but should extend the sampling process until the number of valid sampling points meets the requirement or the product enters the abnormal handling process. This requirement can prevent insufficient data from causing insufficient basis for release.

[0077] Finally, the system generates an abnormal event correlation report. The report includes at least the abnormal seat, abnormal product number, abnormal confirmation time, abnormal frequency data, abnormal seat isolation time, adjacent verification range, description of the relationship between each adjacent seat, reference path verification data, sampling record discrimination results, supplementary sampling task, supplementary sampling results, available time slice set, and final aging judgment results.

[0078] This report is used to create a complete traceability chain, demonstrating how the system handles adjacent crystal oscillator data after an abnormal crystal oscillator occurs. For example, if an adjacent crystal oscillator is ultimately determined to be qualified, the report can explain that its 4th and 5th samples were marked as requiring additional sampling for confirmation, and the valid judgment data was subsequently supplemented by the 8th additional sampling frequency data. Therefore, the final judgment is not a simple case of ignoring the abnormal event.

[0079] All or part of the steps in the above method can be implemented by hardware related to program instructions. The program can be stored in a computer-readable storage medium and includes several instructions to cause a processor, controller, microcontroller, or test control device to execute all or part of the steps of the method described in this invention. The computer-readable storage medium may include a read-only memory, random access memory, mobile storage device, disk, or optical disk, or other media capable of storing program code.

[0080] like Figure 5 As shown, based on the same inventive concept, this embodiment of the invention also provides a batch automated testing system for crystal oscillators. This system includes a binding module, a generation module, an isolation module, a verification module, and a judgment module.

[0081] Specifically, the binding module is used to acquire product specification task data and seat relationship data of the crystal oscillators to be tested in this batch, and bind each crystal oscillator to the corresponding test seat; wherein, the seat relationship data includes the on-board adjacent relationship, the same power supply branch relationship, and the same sampling path relationship between test seats; the generation module is used to collect the crystal oscillator frequency data of each test seat according to a preset sampling period, form a basic frequency sequence corresponding to each test seat, and generate abnormal event data including abnormal seats; the isolation module is used to generate an adjacent verification range related to the abnormal seat based on the abnormal event data and the seat relationship data, and perform seat-level isolation on the abnormal seat, while keeping the test seats within the adjacent verification range undergoing aging tests; the verification module is used to perform reference path verification by connecting a preset reference signal to the sampling path related to the abnormal seat after the abnormal seat has completed seat-level isolation, and generate reference path verification data; the judgment module is used to divide the sampling records of the test seats within the adjacent verification range into time slices and determine availability based on the reference path verification data, generate a set of available time slices, and complete the aging judgment of adjacent crystal oscillators based on the set of available time slices.

[0082] In practical applications, all of the above modules can be deployed on the computer-side test terminal, or partially deployed on the rack control board or test board control unit. The module division described above is for illustrative purposes only and does not imply that the actual equipment must be divided according to the exact same physical structure. Without affecting the technical effect of this invention, the modules can be integrated or configured separately.

[0083] It should also be noted that the terms "first," "second," etc., used in this document are used only to distinguish different objects and are not used to limit the order or importance. The terms "comprising," "including," or any other variations thereof, as used in this document, are intended to cover non-exclusive inclusion, such that a process, method, system, or product that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to the process, method, system, or product.

[0084] The above-described embodiments are merely illustrative of several implementations of the present invention, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of protection of this invention. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, such as changing the specific lactic acid bacteria strain, adjusting the Bacillus strain, changing the preparation method of the hydrolysate, changing the carrier material, or adjusting the formulation form. These all fall within the scope of protection of this invention. Therefore, the scope of protection of this invention should be determined by the appended claims.

Claims

1. A method for automated batch testing of crystal oscillators, characterized in that, The method includes: Obtain the product specification task data and seat relationship data of the crystal oscillators to be tested in this batch, and bind each crystal oscillator to the corresponding test seat; wherein, the seat relationship data includes the intra-board adjacent relationship, the relationship of the same power supply branch, and the relationship of the same sampling path between test seats; The crystal oscillator frequency data of each test seat are collected according to the preset sampling period to form a basic frequency sequence corresponding to each test seat, and abnormal event data including abnormal seats are generated. Based on the abnormal event data and the seat relationship data, an adjacent verification range related to the abnormal seat is generated, and seat-level isolation is performed on the abnormal seat, while the test seats within the adjacent verification range continue to undergo aging tests. After the abnormal seat is isolated at the seat level, the sampling path related to the abnormal seat is connected to a preset reference signal to perform reference path verification and generate reference path verification data. Based on the reference path verification data, the sampling records of test seats within the adjacent verification range are divided into time slices and their availability is determined to generate a set of available time slices. Based on the set of available time slices, the aging determination of adjacent crystal oscillators is completed.

2. The automated batch testing method for crystal oscillators according to claim 1, characterized in that, Obtain the product specification task data and seat relationship data of the crystal oscillators to be tested in this batch, and bind each crystal oscillator to its corresponding test seat, including: Obtain the product specification task data of the crystal oscillators to be tested in this batch from the management system; wherein, the product specification task data includes product number, nominal frequency, allowable frequency difference range, power supply specification, aging time, sampling period, minimum effective sampling quantity and judgment rules; Obtain the installation position of each crystal oscillator under test in the cabinet, test board, and on-board mounting position, and establish the binding relationship between product number and test position; Based on the seating arrangement, local power supply branch configuration, and frequency sampling path configuration of the test board, seat relationship data corresponding to each test seat is generated; Write the product specification task data, the binding relationship, and the seating relationship data into the batch test task.

3. The automated batch testing method for crystal oscillators according to claim 1, characterized in that, Crystal oscillator frequency data for each test location are collected according to a preset sampling period to form a fundamental frequency sequence corresponding to each test location. This generates abnormal event data containing abnormal locations, specifically including: According to the sampling period in the product specification task data, crystal oscillator frequency data are collected sequentially for each test seat, and the collected crystal oscillator frequency data is associated with the corresponding product number, test seat, sampling time and sampling sequence number to form a basic frequency sequence; Based on the nominal frequency and allowable frequency difference range in the product specification task data, the crystal oscillator frequency data in the basic frequency sequence is judged to deviate from the specification. If the difference between the sampling frequency and the nominal frequency in two consecutive samplings at the same test seat is greater than the allowable frequency difference range, the test is determined as an abnormal test seat, and the subsequent sampling time is determined as the abnormal confirmation time; or, if the difference between the sampling frequency and the nominal frequency in at least two out of three consecutive samplings at the same test seat is greater than the allowable frequency difference range, the test is determined as an abnormal test seat, and the last sampling time that meets this condition is determined as the abnormal confirmation time. Based on the abnormal seat, the abnormal confirmation sampling number, the abnormal confirmation time, the crystal oscillator frequency data at the time of abnormal confirmation, and the seat relationship data corresponding to the abnormal seat, abnormal event data is generated.

4. The automated batch testing method for crystal oscillators according to claim 1, characterized in that, Based on the abnormal event data and the seat relationship data, an adjacent verification range related to the abnormal seat is generated, including: Extract abnormal seats from the abnormal event data and read the seat relationship data corresponding to the abnormal seats; Test seats that have an intra-board adjacent relationship, a power supply branch relationship, or a sampling path relationship with the abnormal seat are included in the adjacent verification range. For each test seat in the adjacent verification range, relationship description information is generated based on the relationship category between it and the abnormal seat. The adjacent verification range and the relationship description information are associated and saved with the abnormal event data to form verification task data.

5. The automated batch testing method for crystal oscillators according to claim 1, characterized in that, Seat-level isolation is performed on the abnormal seats, while aging tests continue on the test seats within the adjacent verification range, including: Based on the abnormal event data, a seat-level isolation command is sent to the rack control module; wherein, the seat-level isolation command is configured to cut off the power supply to the abnormal seat and / or disconnect the connection between the output terminal of the abnormal seat and the frequency acquisition module; After the abnormal seat is isolated at the seat level, the isolation completion time is recorded, and isolation status data is generated based on the isolation completion time. The isolation status data is written into the verification task data associated with the abnormal event data, and the crystal oscillator frequency data of the test seats within the adjacent verification range continues to be collected after the isolation completion time.

6. The automated batch testing method for crystal oscillators according to claim 1, characterized in that, After the abnormal seat is isolated at the seat level, a preset reference signal is used to verify the sampling path related to the abnormal seat, generating reference path verification data, including: After the abnormal seat is isolated at the seat level, the control test board connects a preset reference signal to the sampling path related to the abnormal seat; wherein, the preset reference signal is provided by the reference crystal oscillator on the test board, the standard frequency source in the cabinet, or the built-in reference output terminal of the frequency acquisition module; The reference frequency data of the preset reference signal is acquired by the frequency acquisition module and output through the sampling path; Based on the reference frequency data, the standard frequency of the reference signal, and the allowable verification deviation, determine whether the sampling path related to the abnormal seat meets the verification requirements; The verification time, the reference frequency data, the reference signal standard frequency, the allowable verification deviation, and the verification result are used to generate reference path verification data.

7. The automated batch testing method for crystal oscillators according to claim 1, characterized in that, Based on the reference path verification data, the sampling records of test seats within the adjacent verification range are divided into time slices and their availability is determined to generate a set of available time slices, including: Based on the anomaly confirmation time in the anomaly event data, the isolation completion time in the isolation status data, and the verification start time and verification end time in the reference path verification data, the basic frequency sequence of each test seat within the adjacent verification range is divided into a pre-anomaly stable segment, anomaly confirmation associated segment, post-isolation observation segment, and reference path verification associated segment. For any test seat within the adjacent verification range, based on the nominal frequency and allowable frequency difference range of the test seat, a specification deviation judgment is made for each sampling record; Based on the representative frequency data of the test seat in the stable segment before the anomaly, the sampling records in the anomaly confirmation associated segment, the isolation observation segment, and the reference path verification associated segment are judged to determine the segment differences. Based on the isolation status, the reference path verification data, and the relationship description information corresponding to the test seat, the sampling records are marked as directly usable, require supplementary sampling for confirmation, not usable for the time being, or have their own abnormalities. The sampling times corresponding to the sampling records marked as directly usable are written into the available time slice set, and the supplementary sampling task is executed based on the sampling records marked as needing supplementary sampling confirmation.

8. The automated batch testing method for crystal oscillators according to claim 7, characterized in that, Based on the sampling records marked as requiring further sampling confirmation, perform a supplementary sampling task, including: Based on the test seat, sampling sequence number, and reference path verification data corresponding to the sampling record marked as requiring supplementary sampling confirmation, a supplementary sampling task is generated and the supplementary sampling task is sent to the sampling scheduling module; After the supplementary sampling task is executed, the supplementary sampling frequency data of the corresponding test seat is obtained, and based on the product specification task data and the representative frequency data in the stable segment before the anomaly, the supplementary sampling frequency data is judged for specification deviation and segment difference. When the supplementary sampling frequency data meets the specification deviation requirements and segment difference requirements, the supplementary sampling frequency data is written as usable frequency data into the usable time slice set, and the original supplementary sampling confirmation segment corresponding to the supplementary sampling frequency data is recorded in the abnormal event association report. When the supplementary sampling frequency data does not meet the specification deviation requirements or segment difference requirements, the corresponding original supplementary sampling confirmation segment will be marked as temporarily not used, and a review prompt message will be generated.

9. The automated batch testing method for crystal oscillators according to claim 1, characterized in that, The aging determination of adjacent crystal oscillators is completed based on the available time slice set, specifically including: For any test seat within the adjacent verification range, the corresponding sampling time is read from the set of available time slices, and available frequency data is extracted from the base frequency sequence and supplementary sampling frequency data of the test seat based on the corresponding sampling time. Based on the available frequency data and the judgment rules in the product specification task data, the aging judgment result of the crystal oscillator corresponding to the test seat is generated; When the number of valid samples in the available time slice set does not meet the minimum judgment requirement, an extended sampling task is generated, and the available time slice set is updated after the extended sampling task is completed. The abnormal event data, the adjacent verification range, the isolation status data, the reference path verification data, the available time slice set, the supplementary sampling task, and the aging judgment result are written into the abnormal event association report.

10. A batch automated testing system for crystal oscillators, characterized in that, The system is used to perform the automated batch testing method for crystal oscillators according to any one of claims 1-9, the system comprising: The binding module is used to acquire the product specification task data and seat relationship data of the crystal oscillators to be tested in this batch, and bind each crystal oscillator to the corresponding test seat; wherein, the seat relationship data includes the intra-board adjacent relationship, the relationship of the same power supply branch, and the relationship of the same sampling path between test seats; The generation module is used to collect crystal oscillator frequency data of each test seat according to a preset sampling period, form a basic frequency sequence corresponding to each test seat, and generate abnormal event data including abnormal seats. The isolation module is used to generate an adjacent verification range related to the abnormal seat based on the abnormal event data and the seat relationship data, and to perform seat-level isolation on the abnormal seat, while keeping the test seats within the adjacent verification range to continue aging tests. The verification module is used to perform reference path verification on the sampling path access preset reference signal of the abnormal seat after the abnormal seat has been isolated at the seat level, and generate reference path verification data. The determination module is used to divide the sampling records of test seats within the adjacent verification range into time slices and determine availability based on the reference path verification data, generate a set of available time slices, and complete the aging determination of adjacent crystal oscillators based on the set of available time slices.

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