Driving waveform modification method, device, system, and computer readable storage medium

Abstract

The application provides a driving waveform modification method, device, system and computer readable storage medium. The driving waveform modification method comprises: obtaining a resonance frequency influence parameter of a linear resonant device; determining a resonance frequency compensation factor of the linear resonant device according to the resonance frequency influence parameter of the linear resonant device and a preset multi-state fusion compensation model; determining an actual resonance frequency of the linear resonant device according to the resonance frequency compensation factor and an initial resonance frequency of the linear resonant device; and modifying original waveform data according to the actual resonance frequency of the linear resonant device to obtain target waveform data. The application can match the frequency of the target waveform data with the actual resonance frequency of the linear resonant device, avoid interference from external factors, cause the linear resonant device to work in a non-resonance state, and finally cause the vibration intensity of the linear resonant device to significantly decrease and the power consumption to increase.

Description

Technical Field

[0001] This application relates to the field of data processing technology, specifically to a method, apparatus, system, and computer-readable storage medium for modifying driving waveforms. Background Technology

[0002] Currently, linear resonant actuators (LRAs), as the core actuators for haptic feedback, are widely used in smartphones, wearable devices, game controllers, automotive touch panels, and other fields. Their working principle is to generate an alternating magnetic field by driving voltage, which causes a permanent magnet mass block to resonate and vibrate under the support of a spring system, thereby producing a precise haptic feedback effect.

[0003] However, due to external interference, current linear resonant devices may operate in a non-resonant state, which causes a significant decrease in the vibration intensity and an increase in power consumption. Summary of the Invention

[0004] This application provides a method, apparatus, system, and computer-readable storage medium for modifying driving waveforms, aiming to solve the above-mentioned technical problems.

[0005] Firstly, this application provides a method for modifying a driving waveform, including: Obtain parameters affecting the resonant frequency of a linear resonant device; Based on the resonant frequency influence parameters of the linear resonant device and the preset multi-state fusion compensation model, the resonant frequency compensation factor of the linear resonant device is determined. The actual resonant frequency of the linear resonant device is determined based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device. Based on the actual resonant frequency of the linear resonant device, the original waveform data is modified to obtain the target waveform data.

[0006] In some embodiments, the resonant frequency compensation factor is equal to the sum of the product of the first coefficient and the driving harmonic content, the product of the second coefficient and the current absolute temperature, and the product of the third coefficient and the temperature difference before and after driving.

[0007] In some embodiments, the parameters affecting the resonant frequency of a linear resonant device include the driving harmonic content; Among them, the resonant frequency compensation factor is related to the content of driving harmonics.

[0008] In some embodiments, the parameters affecting the resonant frequency of the linear resonant device also include the current absolute temperature; Among them, the resonant frequency compensation factor is negatively correlated with the current absolute temperature.

[0009] In some embodiments, the parameters affecting the resonant frequency of the linear resonant device also include the temperature difference before and after driving; Among them, the resonant frequency compensation factor is negatively correlated with the temperature difference before and after driving.

[0010] In some embodiments, the step of modifying the original waveform data according to the actual resonant frequency of the linear resonant device to obtain the target waveform data includes: Calculate the resampling factor based on the sampling rate and the actual resonant frequency; The original waveform data is upsampled according to the resampling factor to obtain intermediate waveform data; The intermediate waveform data is downsampled according to the resampling factor to obtain the target waveform data.

[0011] In some embodiments, prior to the step of determining the actual resonant frequency of the linear resonant device based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device, the method further includes: Determine the initial resonant frequency of the linear resonant device.

[0012] In some embodiments, the step of determining the initial resonant frequency of a linear resonant device includes: A logarithmic frequency sweep excitation is applied to the linear resonant device to drive it to work; The voltage and current data generated by the linear resonant device are collected, and the amplitude-frequency response curve of the linear resonant device is calculated based on the voltage and current data. The initial resonant frequency of the linear resonant device is determined based on its amplitude-frequency response curve.

[0013] In some embodiments, the step of determining the initial resonant frequency of a linear resonant device includes: A step voltage excitation is applied to the linear resonant device to drive it to work; Collect voltage data across the linear resonant device and extract adjacent free decay peaks based on the voltage data; Calculate the logarithmic attenuation rate of adjacent peaks based on adjacent free attenuation peaks, and calculate the attenuation angular frequency; The initial resonant frequency of the linear resonant device is determined based on the logarithmic decay rate and the decay angular frequency.

[0014] Secondly, this application provides a drive waveform modification device, comprising: The acquisition module is used to acquire parameters affecting the resonant frequency of a linear resonant device. The compensation determination module is used to determine the resonant frequency compensation factor of the linear resonant device based on the resonant frequency influence parameters of the linear resonant device and the preset multi-state fusion compensation model. The resonant frequency determination module is used to determine the actual resonant frequency of the linear resonant device based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device. The waveform modification module is used to modify the original waveform data according to the actual resonant frequency of the linear resonant device to obtain the target waveform data.

[0015] Thirdly, this application provides a drive waveform modification system, comprising: One or more processors; Memory; and One or more applications, wherein the applications are stored in memory and configured to be executed by a processor to implement the drive waveform modification method described in the first aspect.

[0016] Fourthly, this application provides a computer-readable storage medium having a computer program stored thereon, the computer program being loaded by a processor to execute the drive waveform modification method described in the first aspect.

[0017] In this embodiment, the resonant frequency compensation factor of the linear resonant device is determined by the resonant frequency influence parameter and the preset multi-state fusion compensation model. The actual resonant frequency of the linear resonant device is determined based on the resonant frequency compensation factor and the initial resonant frequency. Finally, the original waveform data is modified using the actual resonant frequency of the linear resonant device to obtain the target waveform data. This ensures that the frequency of the target waveform data matches the actual resonant frequency of the linear resonant device, avoiding interference from external factors that could cause the linear resonant device to operate in a non-resonant state, ultimately resulting in a significant decrease in the vibration intensity and an increase in power consumption of the linear resonant device. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 A flowchart of a driving waveform modification method in an embodiment of this application is shown; Figure 2 This paper illustrates a flowchart of a method for determining target waveform data in an embodiment of this application. Figure 3 This paper illustrates a flowchart of determining the initial resonant frequency in an embodiment of this application. Figure 4This paper illustrates another flowchart for determining the initial resonant frequency in an embodiment of this application. Figure 5 A schematic diagram of a drive waveform modification device in an embodiment of this application is shown; Figure 6 A schematic diagram of a drive waveform modification system according to an embodiment of this application is shown. Detailed Implementation

[0020] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0021] In the description of this invention, the term "exemplary" is used to mean "serving as an example, illustration, or description." Any embodiment described as "exemplary" in this application is not necessarily to be construed as being more preferred or advantageous than other embodiments. The following description is provided to enable any person skilled in the art to make and use the invention. Details are set forth in the following description for purposes of explanation. It should be understood that those skilled in the art will recognize that the invention can be made without using these specific details. In other instances, well-known structures and processes will not be described in detail to avoid obscuring the description of the invention with unnecessary detail. Therefore, the invention is not intended to be limited to the embodiments shown, but is consistent with the broadest scope of the principles and features disclosed in this application.

[0022] This application provides a method, apparatus, system, and computer-readable storage medium for modifying driving waveforms, which will be described in detail below.

[0023] First, refer to Figure 1 , Figure 1 This paper illustrates a flowchart of a driving waveform modification method according to an embodiment of the present application, wherein the driving waveform modification method includes: Step S101: Obtain the parameters affecting the resonant frequency of the linear resonant device; Specifically, the parameters affecting the resonant frequency of a linear resonant device refer to the parameters that change the resonant frequency of the linear resonant device. For example, the parameters affecting the resonant frequency of a linear resonant device may include, but are not limited to, one or more of the following: driving harmonic content, current absolute temperature, or temperature difference before and after driving.

[0024] Generally, the parameters affecting the resonant frequency of a linear resonant device can be measured using various sensors. For example, in embodiments where the parameters affecting the resonant frequency of a linear resonant device include the content of driving harmonics, the voltage signal of the linear resonant device during operation can be acquired, and then the voltage signal of the time-domain linear resonant device can be converted into a spectrum using a Fast Fourier Transform (FFT), and the content of driving harmonics can be calculated. As another example, in embodiments where the parameters affecting the resonant frequency of a linear resonant device include the current absolute temperature or the temperature difference before and after driving, this can be measured using a temperature sensor.

[0025] Step S102: Determine the resonant frequency compensation factor of the linear resonant device based on the resonant frequency influence parameters of the linear resonant device and the preset multi-state fusion compensation model. After obtaining the resonant frequency influence parameters of the linear resonant device, the resonant frequency compensation factor of the linear resonant device can be determined based on the resonant frequency influence parameters and the preset multi-state fusion compensation model. The preset multi-state fusion compensation model refers to a mathematical relationship model pre-established and stored for the linear resonant device, used to describe the influence of changes in the resonant frequency influence parameters on the resonant frequency.

[0026] In some embodiments of this application, such as embodiments where the resonant frequency influence parameter of a linear resonant device includes the content of driving harmonics, a preset multi-state fusion compensation model can be expressed by the following formula:

[0027] in, This is the resonant frequency compensation factor. It is a constant. To drive harmonic content.

[0028] It can be seen that the resonant frequency compensation factor can be calculated after obtaining the driving harmonic content, and the resonant frequency compensation factor is related to the driving harmonic content.

[0029] In some embodiments of this application, such as embodiments where the resonant frequency influence parameter of a linear resonant device includes the current absolute temperature, a preset multi-state fusion compensation model can be expressed by the following formula:

[0030] in, This is the resonant frequency compensation factor. It is a constant. The current absolute temperature. Standard temperature (e.g., 25°C).

[0031] It can be seen that the resonant frequency compensation factor can be calculated after obtaining the current absolute temperature, and the resonant frequency compensation factor is negatively correlated with the current absolute temperature.

[0032] In some embodiments of this application, such as embodiments where the resonant frequency influence parameter of a linear resonant device includes the temperature difference before and after driving, a preset multi-state fusion compensation model can be expressed by the following formula:

[0033] in, This is the resonant frequency compensation factor. It is a constant. Temperature difference before and after driving.

[0034] It can be seen that the resonant frequency compensation factor can be calculated after obtaining the temperature difference before and after the drive, and the resonant frequency compensation factor is negatively correlated with the temperature difference before and after the drive.

[0035] It should be noted that the above-mentioned preset multi-state fusion compensation model is only an exemplary embodiment of this application. Those skilled in the art can make equivalent modifications under the guidance of this application. For example, the resonant frequency compensation factor is equal to the sum of the products of the first coefficient and the driving harmonic content, the second coefficient and the current absolute temperature, and the third coefficient and the temperature difference before and after driving. That is, the preset multi-state fusion compensation model can also be expressed by the following formula:

[0036] in, As the first coefficient, As the second coefficient, It is the third coefficient.

[0037] Step S103: Determine the actual resonant frequency of the linear resonant device based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device. After determining the resonant frequency compensation factor, the actual resonant frequency of the linear resonant device can be determined based on the compensation factor and the initial resonant frequency of the linear resonant device. The initial resonant frequency of the linear resonant device refers to the resonant frequency measured beforehand, while the actual resonant frequency refers to the real-time resonant frequency of the linear resonant device.

[0038] In some embodiments of this application, the actual resonant frequency of the linear resonant device can be calculated using the following formula:

[0039] in, This is the actual resonant frequency of the linear resonant device. This is the resonant frequency compensation factor. is the initial resonant frequency of the linear resonant device.

[0040] Step S104: Modify the original waveform data according to the actual resonant frequency of the linear resonant device to obtain the target waveform data.

[0041] Once the actual resonant frequency of the linear resonant device is obtained, the original waveform data can be modified according to this frequency to obtain the target waveform data. In some embodiments of this application, for example, where the actual resonant frequency of the linear resonant device is greater than the initial resonant frequency, the original waveform data can be interpolated to obtain the target waveform data, increasing its frequency to match the actual resonant frequency. In some embodiments of this application, for example, where the actual resonant frequency of the linear resonant device is less than the initial resonant frequency, the original waveform data can be decremented to obtain the target waveform data, decreasing its frequency to match the actual resonant frequency.

[0042] In this embodiment, the resonant frequency compensation factor of the linear resonant device is determined by the resonant frequency influence parameter and the preset multi-state fusion compensation model. The actual resonant frequency of the linear resonant device is determined based on the resonant frequency compensation factor and the initial resonant frequency. Finally, the original waveform data is modified using the actual resonant frequency of the linear resonant device to obtain the target waveform data. This ensures that the frequency of the target waveform data matches the actual resonant frequency of the linear resonant device, avoiding interference from external factors that could cause the linear resonant device to operate in a non-resonant state, ultimately resulting in a significant decrease in the vibration intensity and an increase in power consumption of the linear resonant device.

[0043] In some embodiments of this application, see Figure 2 , Figure 2 The illustration shows a flowchart of determining target waveform data in an embodiment of this application. The step of modifying the original waveform data according to the actual resonant frequency of the linear resonant device to obtain the target waveform data includes: Step S201: Calculate the resampling factor based on the sampling rate and the actual resonant frequency; Specifically, resampling factor It can be calculated using the following formula:

[0044] in, This is the actual resonant frequency. This is the initial resonant frequency.

[0045] Step S202: Upsample the original waveform data according to the resampling factor to obtain intermediate waveform data; It should be noted that upsampling the original waveform data refers to interpolating the original waveform data, for example, by using a resampling factor. For example, with a value of 2, you can insert ( ) between every two points in the original waveform data. - 1) points, assuming the two points are y_i and y_{i+1}, the value of the k-th inserted point is: y_i + (y_{i+1} - y_i) × [k / ]; Where k = 1, 2, ..., - 1.

[0046] In some embodiments of this application, after upsampling the original waveform data to obtain intermediate waveform data, the intermediate waveform data can also be filtered to eliminate the high-frequency image components introduced after interpolation.

[0047] Step S203: Downsample the intermediate waveform data according to the resampling factor to obtain the target waveform data.

[0048] After obtaining the intermediate waveform data, the intermediate waveform data can be downsampled according to the resampling factor to obtain the target waveform data. Downsampling the original waveform data means performing sampling processing on the original waveform data. For example, with a resampling factor R_3=2, one point can be extracted from every two intermediate waveform data to obtain the target waveform data.

[0049] In some embodiments of this application, before determining the actual resonant frequency of the linear resonant device based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device, the method further includes: determining the initial resonant frequency of the linear resonant device so as to determine the actual resonant frequency of the linear resonant device based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device.

[0050] As an exemplary embodiment, see Figure 3 , Figure 3 This paper illustrates a flowchart of an embodiment of the present application for determining the initial resonant frequency, wherein the steps for determining the initial resonant frequency of a linear resonant device include: Step S301: Apply logarithmic frequency sweep excitation to the linear resonant device to drive the linear resonant device to work; Specifically, logarithmic frequency sweep excitation refers to a sinusoidal excitation signal that changes continuously with time according to a logarithmic law. The frequency of the sinusoidal excitation signal varies from 20Hz to 5000Hz and its amplitude is the rated voltage, so as to drive the linear resonant device to work and generate working current.

[0051] Step S302: Collect voltage and current data generated by the linear resonant device, and calculate the amplitude-frequency response curve of the linear resonant device based on the voltage and current data; After applying a logarithmic sweep excitation to the linear resonant device, voltage and current data generated by the device can be collected to calculate its amplitude-frequency response curve. For example, the amplitude corresponding to each frequency in the amplitude-frequency response curve can be calculated using the following formula:

[0052] in, This represents the frequency response corresponding to the voltage data. This represents the frequency response corresponding to the current data.

[0053] Step S303: Determine the initial resonant frequency of the linear resonant device based on the amplitude-frequency response curve of the linear resonant device.

[0054] After determining the amplitude-frequency response curve, the initial resonant frequency of the linear resonant device can be determined based on the amplitude-frequency response curve. For example, the amplitude-frequency response curve can be selected... The frequency near the peak value is the initial resonant frequency of the linear resonant device.

[0055] As another exemplary embodiment, see Figure 4 , Figure 4 This paper illustrates another flowchart for determining the initial resonant frequency in an embodiment of this application, wherein the step of determining the initial resonant frequency of the linear resonant device includes: Step S401: Apply a step voltage excitation to the linear resonant device to drive it to work; Specifically, step voltage excitation refers to a voltage signal that jumps instantaneously from one value to another and remains unchanged at the new value, so as to drive the linear resonant device to work through step voltage excitation.

[0056] Step S402: Collect voltage data across the linear resonant device and extract adjacent free attenuation peaks based on the voltage data; After applying a step voltage excitation to the linear resonant device, the device begins to vibrate. At this point, voltage data across the device can be collected, and adjacent free decay peak values ​​can be extracted from the voltage data. Adjacent free decay peak values ​​refer to the peak amplitude of the voltage waveform across the linear resonant device in the previous cycle and the peak amplitude of the current cycle.

[0057] Step S403: Calculate the logarithmic attenuation rate of adjacent peaks based on adjacent free attenuation peaks, and calculate the attenuation angular frequency; After obtaining the adjacent free attenuation peaks, the logarithmic attenuation rate of the adjacent peaks can be calculated, and the attenuation angular frequency can be calculated. For example, the logarithmic attenuation rate can be calculated using the following formula:

[0058] in, For the amplitude of the i-th peak, , For the i-th peak position, This represents the (i+1)th peak position.

[0059] Meanwhile, the attenuation angular frequency can be calculated using the following formula:

[0060] in, This is the decaying angular frequency.

[0061] Step S404: Determine the initial resonant frequency of the linear resonant device based on the logarithmic attenuation rate and the attenuation angular frequency.

[0062] After obtaining the logarithmic attenuation rate and the attenuation angular frequency, the initial resonant frequency of the linear resonant device can be determined. For example, the initial resonant frequency of the linear resonant device can be calculated using the following formula:

[0063] To better implement the driving waveform modification method in the embodiments of this application, based on the driving waveform modification method, the embodiments of this application also provide a driving waveform modification device, such as... Figure 5 As shown, the driving waveform modification device includes: Acquisition module 501 is used to acquire the resonant frequency influence parameters of the linear resonant device; The compensation determination module 502 is used to determine the resonant frequency compensation factor of the linear resonant device based on the resonant frequency influence parameters of the linear resonant device and the preset multi-state fusion compensation model. The resonant frequency determination module 503 is used to determine the actual resonant frequency of the linear resonant device based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device. The waveform modification module 504 is used to modify the original waveform data according to the actual resonant frequency of the linear resonant device to obtain the target waveform data.

[0064] It should be understood that Figure 5The apparatus and modules shown can be implemented in various ways. For example, in some embodiments, the apparatus and modules can be implemented in hardware, software, or a combination of both. The hardware portion can be implemented using dedicated logic; the software portion can be stored in memory and executed by an appropriate instruction execution system, such as a microprocessor or dedicated-design hardware. Those skilled in the art will understand that the methods and systems described above can be implemented using computer-executable instructions and / or included in processor control code, for example, on a carrier medium such as a disk, CD, or DVD-ROM, a programmable memory such as read-only memory (firmware), or a data carrier such as an optical or electronic signal carrier. The systems and modules of this application can be implemented not only with hardware circuits such as very large-scale integrated circuits or gate arrays, semiconductors such as logic chips, transistors, or programmable hardware devices such as field-programmable gate arrays, programmable logic devices, etc., but also with software, for example, executed by various types of processors, or with a combination of the aforementioned hardware circuits and software (e.g., firmware).

[0065] To better implement the driving waveform modification method in the embodiments of this application, based on the driving waveform modification method, the embodiments of this application also provide a driving waveform modification system, such as... Figure 6 As shown, the drive waveform modification system includes: One or more processors; Memory; and One or more applications, wherein the one or more applications are stored in the memory and configured to be executed by the processor in the steps of the drive waveform modification method described in any of the above embodiments.

[0066] Those skilled in the art will understand that Figure 6 The structure shown does not constitute a limitation on the drive waveform modification system and may include more or fewer components than shown, or combine certain components, or have different component arrangements. Wherein: Processor 601 is the control center of the system, connecting various parts of the system through various interfaces and lines. It performs various system functions and processes data by running or executing software programs and / or modules stored in memory 602, and by calling data stored in memory 602, thereby providing overall system monitoring. Optionally, processor 601 may include one or more processing cores; processor 601 may be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor. Preferably, processor 601 may integrate an application processor and a modem processor, wherein the application processor mainly handles the operating system, user interface, and applications, and the modem processor mainly handles wireless communication. It is understood that the aforementioned modem processor may not be integrated into processor 601.

[0067] The memory 602 can be used to store software programs and modules. The processor 601 executes various functional applications and data processing by running the software programs and modules stored in the memory 602. The memory 602 may mainly include a program storage area and a data storage area. The program storage area may store the operating system, application programs required for at least one function (such as sound playback function, image playback function, etc.), etc.; the data storage area may store data created by modifying the system based on the driving waveform, etc. In addition, the memory 602 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other volatile solid-state storage device. Accordingly, the memory 602 may also include a memory controller to provide the processor 601 with access to the memory 602.

[0068] Although not shown, the waveform modification system may also include a display unit, etc., which will not be described in detail here. Specifically, in this embodiment, the processor 601 in the waveform modification system loads the executable files corresponding to the processes of one or more application programs into the memory 602 according to the following instructions, and the processor 601 runs the application programs stored in the memory 602 to realize various functions, as follows: Obtain parameters affecting the resonant frequency of a linear resonant device; Based on the resonant frequency influence parameters of the linear resonant device and the preset multi-state fusion compensation model, the resonant frequency compensation factor of the linear resonant device is determined. The actual resonant frequency of the linear resonant device is determined based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device. Based on the actual resonant frequency of the linear resonant device, the original waveform data is modified to obtain the target waveform data.

[0069] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be performed by instructions, or by instructions controlling related hardware. These instructions can be stored in a computer-readable storage medium and loaded and executed by a processor.

[0070] Therefore, embodiments of the present invention provide a computer-readable storage medium, which may include: read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk, etc. A computer program is stored thereon, which is loaded by a processor to execute the steps in any of the linear motor driving methods provided in the embodiments of the present invention. For example, the computer program loaded by the processor can execute the following steps: Obtain parameters affecting the resonant frequency of a linear resonant device; Based on the resonant frequency influence parameters of the linear resonant device and the preset multi-state fusion compensation model, the resonant frequency compensation factor of the linear resonant device is determined. The actual resonant frequency of the linear resonant device is determined based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device. Based on the actual resonant frequency of the linear resonant device, the original waveform data is modified to obtain the target waveform data.

[0071] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the detailed descriptions of other embodiments above, which will not be repeated here.

[0072] The basic concepts have been described above. Obviously, for those skilled in the art, the detailed disclosure above is merely illustrative and does not constitute a limitation of this application. Although not explicitly stated herein, those skilled in the art may make various modifications, improvements, and corrections to this application. Such modifications, improvements, and corrections are suggested in this application, and therefore remain within the spirit and scope of the exemplary embodiments of this application.

[0073] Furthermore, this application uses specific terms to describe embodiments of the application. For example, "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic associated with at least one embodiment of the application. Therefore, it should be emphasized and noted that "an embodiment," "one embodiment," or "an alternative embodiment" mentioned twice or more in different locations in this specification do not necessarily refer to the same embodiment. In addition, certain features, structures, or characteristics in one or more embodiments of the application can be appropriately combined.

[0074] Similarly, it should be noted that, in order to simplify the description of the present application and thus aid in the understanding of one or more embodiments of the invention, the foregoing description of the embodiments of the present application sometimes combines multiple features into a single embodiment, drawing, or description thereof. However, this disclosure method does not imply that the subject matter of the application requires more features than those mentioned in the claims. In fact, the embodiments contain fewer features than all the features of the single embodiments disclosed above.

[0075] The above provides a detailed description of a driving waveform modification method, apparatus, system, and computer-readable storage medium provided in the embodiments of this application. Specific examples have been used to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A method for modifying a driving waveform, characterized in that, include: Obtain parameters affecting the resonant frequency of a linear resonant device; The resonant frequency compensation factor of the linear resonant device is determined based on the resonant frequency influence parameters of the linear resonant device and the preset multi-state fusion compensation model. The actual resonant frequency of the linear resonant device is determined based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device. Based on the actual resonant frequency of the linear resonant device, the original waveform data is modified to obtain the target waveform data.

2. The driving waveform modification method as described in claim 1, characterized in that, The resonant frequency compensation factor is equal to the sum of the product of the first coefficient and the driving harmonic content, the product of the second coefficient and the current absolute temperature, and the product of the third coefficient and the temperature difference before and after driving.

3. The driving waveform modification method as described in claim 1, characterized in that, The parameters affecting the resonant frequency of the linear resonant device include the content of driving harmonics. The resonant frequency compensation factor is related to the driving harmonic content.

4. The driving waveform modification method as described in claim 3, characterized in that, The parameters affecting the resonant frequency of the linear resonant device also include the current absolute temperature; The resonant frequency compensation factor is negatively correlated with the current absolute temperature.

5. The driving waveform modification method as described in claim 4, characterized in that, The parameters affecting the resonant frequency of the linear resonant device also include the temperature difference before and after driving; The resonant frequency compensation factor is negatively correlated with the temperature difference before and after the drive.

6. The driving waveform modification method as described in claim 1, characterized in that, The step of modifying the original waveform data according to the actual resonant frequency of the linear resonant device to obtain the target waveform data includes: Calculate the resampling factor based on the sampling rate and the actual resonant frequency; The original waveform data is upsampled according to the resampling factor to obtain intermediate waveform data; The intermediate waveform data is downsampled according to the resampling factor to obtain the target waveform data.

7. The driving waveform modification method as described in claim 1, characterized in that, Before the step of determining the actual resonant frequency of the linear resonant device based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device, the method further includes: Determine the initial resonant frequency of the linear resonant device.

8. The driving waveform modification method as described in claim 7, characterized in that, The step of determining the initial resonant frequency of the linear resonant device includes: A logarithmic sweep frequency excitation is applied to the linear resonant device to drive it to operate; The voltage and current data generated by the linear resonant device are collected, and the amplitude-frequency response curve of the linear resonant device is calculated based on the voltage and current data. The initial resonant frequency of the linear resonant device is determined based on the amplitude-frequency response curve of the linear resonant device.

9. The driving waveform modification method as described in claim 7, characterized in that, The step of determining the initial resonant frequency of the linear resonant device includes: A step voltage excitation is applied to the linear resonant device to drive it to operate; Collect voltage data across the linear resonant device and extract adjacent free decay peak values ​​based on the voltage data; Calculate the logarithmic attenuation rate of adjacent peaks based on the adjacent free attenuation peaks, and calculate the attenuation angular frequency; The initial resonant frequency of the linear resonant device is determined based on the logarithmic attenuation rate and the attenuation angular frequency.

10. A device for modifying a driving waveform, characterized in that, include: The acquisition module is used to acquire the resonant frequency influence parameters of the linear resonant device; The compensation determination module is used to determine the resonant frequency compensation factor of the linear resonant device based on the resonant frequency influence parameters of the linear resonant device and a preset multi-state fusion compensation model. A resonant frequency determination module is used to determine the actual resonant frequency of the linear resonant device based on the resonant frequency compensation factor and the initial resonant frequency of the linear resonant device. A waveform modification module is used to modify the original waveform data according to the actual resonant frequency of the linear resonant device to obtain the target waveform data.

11. A drive waveform modification system, characterized in that, include: One or more processors; Memory; as well as One or more applications, wherein the one or more applications are stored in the memory and configured to be executed by the processor to implement the drive waveform modification method according to any one of claims 1 to 9.

12. A computer-readable storage medium, characterized in that, It stores a computer program, which is loaded by a processor to execute the drive waveform modification method according to any one of claims 1 to 9.

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