Method, system, and storage medium for stress testing of multi-channel board cards

Abstract

The application relates to the technical field of board card testing, and discloses a pressure testing method, a system and a storage medium for a multi-channel board card. The pressure testing method for the multi-channel board card obtains configuration parameters of multiple test channels of the multi-channel board card, encapsulates the configuration parameters of the multiple test channels, generates a test request frame, constructs a first request frame sequence and a second request frame sequence to respectively perform forward pressure testing and negative pressure testing on the multiple test channels of the multi-channel board card synchronously, and obtains forward pressure testing results and negative pressure testing results. The application can improve the accuracy of the pressure testing results.

Description

Technical Field

[0001] This application relates to the field of circuit board testing technology, and in particular to a stress testing method, system and storage medium for multi-channel circuit boards. Background Technology

[0002] Traditional board communication stress testing only supports single-channel, single-command testing. For example, using a dedicated test fixture, Modbus RTU commands are sent one by one through serial port debugging tools (such as SSCOM, SecureCRT, etc.) to perform read and write operations on the device under test.

[0003] However, the aforementioned testing methods can only complete basic verification under ideal steady-state conditions and cannot cover extreme and abnormal conditions such as electromagnetic interference and multiple slave stations operating concurrently in industrial settings. Therefore, the test results obtained based on these methods cannot reflect the true pressure-bearing capacity of the equipment under test in complex environments, leading to insufficient accuracy in the pressure test results. Summary of the Invention

[0004] This application provides a stress testing method, system, and storage medium for multi-channel boards, which can improve the accuracy of stress test results.

[0005] The embodiments of this application provide the following technical solutions: On one hand, embodiments of this application provide a stress testing method for a multi-channel board, applied to a magnetic control system. The magnetic control system includes a power management module, which includes a multi-channel board. The method includes: Obtain the configuration parameters of multiple test channels for a multi-channel board; All configuration parameters of multiple test channels are encapsulated to generate test request frames, which include correct request frames and error request frames. A first request frame sequence is constructed and sent to the multi-channel board to perform forward stress testing on multiple test channels of the multi-channel board simultaneously, and the forward stress test results are obtained. In the first request frame sequence, the proportion of correct request frames is greater than the proportion of incorrect request frames. A second request frame sequence is constructed and sent to the multi-channel board to perform negative stress tests on multiple test channels of the multi-channel board simultaneously, and the negative stress test results are obtained. In the second request frame sequence, the proportion of erroneous request frames is greater than the proportion of correct request frames.

[0006] In some embodiments, constructing a first request frame sequence includes: inserting erroneous request frames into a plurality of correct request frames based on a preset first insertion interval, thereby constructing a first request frame sequence; Constructing a second request frame sequence includes: inserting correct request frames into multiple erroneous request frames based on a preset second insertion interval, thereby constructing a second request frame sequence.

[0007] In some embodiments, forward stress testing is performed simultaneously on multiple test channels of a multi-channel board to obtain forward stress test results, including: The first request frame sequence is simultaneously sent to multiple test channels; Receive multiple test response frames returned by each test channel of the multi-channel board based on the first request frame sequence, the test response frames including the first response frame; Based on multiple first response frames, count the number of successful tests and the number of first abnormal responses for each test channel; Based on the number of successful tests and the number of first abnormal responses for each test channel, calculate the correct instruction recognition rate and the first abnormal response rate for each test channel. The correct instruction recognition rate is the ratio of the number of successful tests to the number of correct request frames in the first request frame sequence, and the first abnormal response rate is the ratio of the number of first abnormal responses to the number of erroneous request frames in the first request frame sequence. The positive stress test results are obtained based on the correct instruction recognition rate and the first anomaly recognition rate of each test channel.

[0008] In some embodiments, based on multiple first response frames, the number of successful tests and the number of first abnormal responses for each test channel are counted, including: Obtain multiple first comparison results corresponding to multiple first response frames, and determine the number of first comparisons that are successfully matched in the multiple first comparison results as the number of successful tests; The number of times that multiple erroneous request frames in the first request frame sequence are identified as abnormal by the multi-channel board is obtained, and the first count is determined as the first abnormal response count.

[0009] In some embodiments, obtaining multiple first comparison results corresponding to multiple first response frames includes: Each first response frame is compared with the test request frames in the request cache queue to determine the first comparison result corresponding to each first response frame. The request cache queue is used to cache test request frames. Based on the first comparison result corresponding to each first response frame, determine multiple first comparison results corresponding to multiple first response frames.

[0010] In some embodiments, negative stress tests are performed simultaneously on multiple test channels of a multi-channel board to obtain negative stress test results, including: The second request frame sequence is simultaneously sent to multiple test channels; Receive multiple test response frames returned by each test channel of the multi-channel board based on the second request frame sequence, the test response frames including the second response frame; Based on multiple second response frames, count the number of second abnormal responses and the number of correct request frames that received normal responses for each test channel; Based on the number of second abnormal responses and the number of correct request frames that received normal responses for each test channel, calculate the second abnormality detection rate and the correct frame survival rate for each test channel. The second abnormality detection rate is the ratio of the number of second abnormal responses to the number of erroneous request frames in the second request frame sequence, and the correct frame survival rate is the ratio of the number of correct request frames that received normal responses to the number of correct request frames in the second request frame sequence. The negative stress test results are obtained based on the second anomaly detection rate and the correct frame survival rate of each test channel.

[0011] In some embodiments, based on multiple second response frames, the number of second abnormal responses and the number of correct request frames that received normal responses for each test channel are counted, including: The second number of times that multiple erroneous request frames in the second request frame sequence are identified as abnormal by the multi-channel board is determined as the second abnormal response count. Obtain multiple second comparison results corresponding to multiple second response frames, and determine the number of successful comparisons among the multiple second comparison results as the number of correct request frames that have received normal responses.

[0012] In some embodiments, obtaining multiple second comparison results corresponding to multiple second response frames includes: Each second response frame is compared with the test request frames in the request cache queue to determine the second comparison result corresponding to each second response frame. The request cache queue is used to cache test request frames. Based on the second comparison result corresponding to each second response frame, determine multiple second comparison results corresponding to multiple second response frames.

[0013] On the other hand, embodiments of this application provide a stress testing system for a multi-channel board, including: At least one processor; At least one memory for storing at least one program; When at least one program is executed by at least one processor, the at least one processor performs the method described above.

[0014] On the other hand, embodiments of this application provide a non-volatile computer-readable storage medium storing a processor-executable program, which, when executed by a processor, is used to perform the above-described method.

[0015] This application provides a stress testing method for a multi-channel board, applied to a magnetic control system. The magnetic control system includes a power management module, which in turn includes a multi-channel board. The method includes: acquiring configuration parameters of multiple test channels of the multi-channel board; encapsulating all configuration parameters of the multiple test channels to generate test request frames, wherein the test request frames include correct request frames and incorrect request frames; constructing a first request frame sequence and sending the first request frame sequence to the multi-channel board to simultaneously perform positive stress testing on the multiple test channels of the multi-channel board, obtaining positive stress test results, wherein the proportion of correct request frames in the first request frame sequence is greater than the proportion of incorrect request frames; constructing a second request frame sequence and sending the second request frame sequence to the multi-channel board to simultaneously perform negative stress testing on the multiple test channels of the multi-channel board, obtaining negative stress test results, wherein the proportion of incorrect request frames in the second request frame sequence is greater than the proportion of correct request frames.

[0016] By acquiring the configuration parameters of multiple test channels of a multi-channel board, encapsulating the configuration parameters of multiple test channels, generating test request frames, and constructing a first request frame sequence and a second request frame sequence to simultaneously perform positive and negative stress tests on multiple test channels of the multi-channel board, obtaining positive and negative stress test results, this application can improve the accuracy of stress test results. Attached Figure Description

[0017] One or more embodiments are illustrated by way of example with reference numerals in the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements with the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.

[0018] Figure 1 This is a schematic diagram of the structure of a magnetic control system provided in an embodiment of this application; Figure 2 This is a schematic diagram of the structure of a power management module provided in an embodiment of this application; Figure 3 This is a flowchart illustrating a stress testing method for a multi-channel board provided in an embodiment of this application; Figure 4 This is provided in the embodiments of this application. Figure 3 A detailed flowchart of step S303 in the process; Figure 5 This is provided in the embodiments of this application. Figure 4 A detailed flowchart of step S333 in the process; Figure 6 This is provided in the embodiments of this application. Figure 5 A detailed flowchart of step S3331 in the process; Figure 7 This is provided in the embodiments of this application. Figure 6 A detailed flowchart of step S311 in the process; Figure 8 This is provided in the embodiments of this application. Figure 3 A detailed flowchart of step S304 in the process; Figure 9 This is provided in the embodiments of this application. Figure 8 A detailed flowchart of step S343 in the process; Figure 10 This is a schematic diagram of the structure of a multi-channel board pressure testing system provided in an embodiment of this application.

[0019] Explanation of icon numbers: 100. Magnetic control system; 11. Constant current source device; 12. Power management module; 13. Host computer; 121. Central control board; 122. Core board; 123. Power module; 200. Plasma etching machine; 21. Gas output module; 22. Etching chamber; 23. Electrostatic chuck; 23a. Substrate; 24. Coil; 300. Multi-channel board stress testing system; 301. Processor; 302. Memory. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0021] It should be noted that, unless there is a conflict, the various features in the embodiments of this application can be combined with each other, all of which are within the protection scope of this application. In addition, the terms "first" and "second" used in this application do not limit the data, but only distinguish the same or similar items with basically the same function and effect.

[0022] The technical solution of this application is described in detail below with reference to the accompanying drawings: Please see Figure 1 , Figure 1 This is a schematic diagram of the structure of a magnetic control system provided in an embodiment of this application.

[0023] This magnetron control system is applied to semiconductor equipment, such as plasma etching machines, which are used to perform plasma etching processes on substrates such as wafers and display substrates. The working principle of a plasma etching machine is to selectively remove material with nanometer-level precision by using highly reactive gases excited into plasma in a vacuum environment, through the synergistic effect of physical bombardment and chemical reaction.

[0024] like Figure 1 As shown, the plasma etching machine 200 includes a gas output module 21, an etching chamber 22, an electrostatic chuck 23, and a coil 24.

[0025] The gas output module 21 is configured to input a specific type of reactive gas, including fluorine- or chlorine-containing gases, into the gas inlet of the etching chamber 22. The reactive gas is ionized to generate a plasma composed of ions, electrons, and highly reactive free radicals. The gas output module 21 is located outside the plasma etching machine 200 and is connected to the gas inlet of the etching chamber 22 via a pipeline. The gas inlet of the etching chamber 22 is typically designed at the top of the etching chamber 22 to ensure that the gas diffuses evenly throughout the entire etching chamber 22, covers the substrate surface, and then exits from the gas output port at the bottom. The gas output module 21 can output specific types of gas as needed, including CF4, SF6, and CHF3 gases.

[0026] An electrostatic chuck 23 is disposed at the bottom of the etching cavity 22 and is configured to support and hold the substrate 23a. The substrate 23a can be a wafer, a display panel substrate, etc. After the substrate 23a is placed on the surface of the electrostatic chuck 23, the electrostatic chuck 23 firmly fixes the substrate 23a in place through electrostatic adsorption, preventing the substrate 23a from shifting or vibrating during the etching process and ensuring etching uniformity.

[0027] The magnetic control system 100 includes a constant current source device 11, a power management module 12, and a host computer 13.

[0028] The constant current source device 11, located in the plasma etching machine 200, is used to drive the coil 24. It is configured to output a constant driving current according to preset etching process parameters, thereby driving the coil 24 to generate a constant magnetic field within the etching cavity 22, guiding the plasma to etch the substrate. The constant current source device is an adjustable linear constant current power supply with an output current range of 0 to 20A. It is used to drive the coil 24 to generate a magnetic field, controlling the uniformity of the plasma during the etching process. The etching process parameters include substrate material and etching pattern precision. Based on these parameters, the constant current source device 11 determines the corresponding driving current and transmits it to the coil 24 to generate a magnetic field. This magnetic field can constrain and regulate the plasma ion density, guiding the plasma's directional movement and improving etching accuracy.

[0029] Coil 24 is electrically connected to constant current source device 11 and is sleeved on etching cavity 22. Coil 24 is configured to generate a magnetic field within etching cavity 22 in response to the input of a driving current, guiding the plasma inside etching cavity 22 towards the substrate for etching. It is understood that when coil 24 receives a driving current, it can form a magnetic field of specific intensity and distribution within etching cavity 22. This magnetic field constrains and guides the ionized plasma within etching cavity 22, ensuring that active ions move precisely towards the target area on the substrate surface, thus guaranteeing the directionality and precision of etching.

[0030] The host computer 13 is communicatively connected to the constant current source device 11 and the power management module 12, and is configured to receive user instruction information, generate drive signals, and send drive signals to the constant current source device 11, so that the constant current source device 11 responds to the drive signals and outputs a constant drive current to the coil 24, so as to drive the coil 24 to form a magnetic field of specific intensity and distribution in the etching cavity 22.

[0031] Please refer to the following: Figure 2 , Figure 2 This is a schematic diagram of the structure of a power management module provided in an embodiment of this application.

[0032] The power management module includes multiple boards.

[0033] like Figure 2 As shown, the power management module 12 includes three types of independent boards: the central control board 121, the core board 122, and the power module 123.

[0034] Among them, the central control board 121, the core board 122, and the power module 123 are each configured with a unique Modbus slave address, and each board has multiple independent test channels. The central control board 121 realizes voltage, current, and resistance acquisition and output polarity control. The core board 122 realizes multi-channel current closed-loop regulation. The power module 123 realizes power output and output parameter monitoring.

[0035] In this embodiment, the multi-board testing method is used to perform production testing and aging verification of the power management module. It is applicable to scenarios such as production line aging testing, stress testing (abnormal frame fault tolerance verification), and functional regression testing. For example, it can be used to perform batch functional verification of three types of circuit boards: core board, power module, and central control board. Alternatively, it can be used to perform remote parameter reading and writing and automated testing of the lower-level machine through the Modbus RTU industrial communication protocol.

[0036] Currently, communication stress testing typically employs dedicated testing fixtures. Serial port debugging tools (such as SSCOM, SecureCRT, etc.) are used to send Modbus RTU commands one by one to perform read and write operations on the device under test, sequentially completing basic communication verifications such as register reading and register writing under single-channel conditions.

[0037] However, the above testing methods can only complete the basic verification of ideal steady-state working conditions. They cannot cover extreme abnormal working conditions such as electromagnetic interference and multiple slave stations in industrial fields. They are difficult to fully test the robustness of the communication protocol stack of multi-channel boards under concurrent load and external interference. Often, the laboratory test is qualified, but after the equipment is put into industrial field, stability problems such as communication blockage, thread deadlock, channel disconnection and message loss occur. Therefore, it is impossible to fully guarantee the long-term reliable operation of multi-channel communication boards.

[0038] Based on this, this application provides a stress testing method for a multi-channel board. By obtaining the configuration parameters of multiple test channels of the multi-channel board, encapsulating the configuration parameters of multiple test channels, generating test request frames, and constructing a first request frame sequence and a second request frame sequence to simultaneously perform positive stress tests and negative stress tests on the multiple test channels of the multi-channel board, respectively, to obtain positive stress test results and negative stress test results. This application can improve the accuracy of stress test results.

[0039] For details, please refer to Figure 3 , Figure 3 This is a flowchart illustrating a stress testing method for a multi-channel board provided in an embodiment of this application.

[0040] The stress testing method for the multi-channel board is applied to a magnetic control system, which includes a power management module and a multi-channel board. Specifically, the main body executing the stress testing method for the multi-channel board is one or at least two processors of a host computer.

[0041] like Figure 3 As shown, the stress testing method for this multi-channel board includes the following steps S301 to S304: Step S301: Obtain the configuration parameters of multiple test channels of the multi-channel board.

[0042] Specifically, the multi-channel board under test refers to a board (or a collection of such boards) with multiple independent communication channels. Each channel serves as a test channel. For example, a multi-channel board is a multi-channel Modbus RTU industrial communication board with multiple independent RS485 communication channels. Each communication channel can independently connect to multiple Modbus slave stations, and each communication channel can serve as a test channel, supporting multi-bus parallel communication. The host computer reads the preset test plan file or receives manual configuration instructions to obtain the configuration parameters corresponding to all test channels on the multi-channel board under test. These configuration parameters include at least: the Modbus slave station address, register read / write address, read / write data length, target read / write value, and channel enable status for each test channel.

[0043] Step S302: Encapsulate all configuration parameters of multiple test channels to generate test request frames, wherein the test request frames include correct request frames and error request frames.

[0044] Specifically, the host computer encapsulates two types of messages based on the configuration parameters of the test channel: (1) Correct request frame: Conforms to the Modbus RTU standard specification and contains a valid slave address, valid function code, valid register address and compliant CRC check code. After the multi-channel board receives the correct request frame, it will respond normally to the read and write commands.

[0045] (2) Error request frame: an abnormal message constructed by the user, such as illegal function code, illegal data address, illegal data frame length, CRC check error, address over-limit, etc. Various types of error request frames are used to cover the main scenarios of communication protocol abnormalities.

[0046] Please refer to Table 1 below, which is a schematic table of an error frame type provided in the embodiments of this application.

[0047]

[0048] Table 1 After all test request frames are generated, they are stored in the request cache queue of the host computer for subsequent message matching and verification.

[0049] Step S303: Construct a first request frame sequence and send the first request frame sequence to the multi-channel board to perform forward stress testing on multiple test channels of the multi-channel board simultaneously and obtain the forward stress test results. In the first request frame sequence, the proportion of correct request frames is greater than the proportion of incorrect request frames.

[0050] Specifically, constructing the first request frame sequence includes: inserting erroneous request frames into multiple correct request frames based on a preset first insertion interval, thereby constructing the first request frame sequence.

[0051] For example: Multiple correct request frames are consecutively arranged according to a preset first insertion interval. These correct request frames form the main message, and error request frames are interspersed between them, then sequentially concatenated to construct the first request frame sequence. It is understood that the first insertion interval and the insertion ratio of error request frames can both be pre-configured.

[0052] It should be noted that the first insertion interval in this embodiment refers to the insertion interval of the request frame, that is, one incorrect request frame is inserted for every N correct request frames.

[0053] In one exemplary embodiment, correct request frames are continuously arranged according to a preset first insertion interval. After every 100 consecutive correct request frames are sent, one incorrect request frame is randomly inserted. Each inserted incorrect request frame is randomly selected from a variety of preset incorrect frame types.

[0054] It is understandable that under normal operating conditions in industrial settings, the vast majority of messages in the total communication are legitimate commands conforming to the Modbus RTU protocol specification, with only a small number of abnormal messages occasionally generated due to spatial electromagnetic interference or transient bus disturbances. In the first request frame sequence constructed in this embodiment, legitimate messages constitute the vast majority, with a small number of abnormal messages randomly interspersed, thus highly replicating the typical communication scenario in the equipment environment. This forward stress test verifies whether the multi-channel board can stably handle normal read / write commands under normal service loads and with sporadic interference messages, while also possessing the basic fault-tolerance capability to identify a small number of abnormal messages without communication blockage or task freeze.

[0055] After the host computer completes the first request frame sequence, it uses a concurrent scheduling mechanism to synchronously send message sequences to all test channels of the multi-channel board, enabling multiple test channels to receive and process messages in parallel, simulating the real business scenario of multi-channel concurrent access. The host computer continuously collects the response messages returned by each test channel, completes data statistics and indicator calculation, and finally obtains the positive stress test results, which can simulate the normal working condition in the field where most communication messages are normal and a small number of interference abnormal messages appear randomly.

[0056] Step S304: Construct a second request frame sequence and send the second request frame sequence to the multi-channel board to perform negative stress tests on multiple test channels of the multi-channel board simultaneously and obtain negative stress test results. In the second request frame sequence, the proportion of erroneous request frames is greater than the proportion of correct request frames.

[0057] Specifically, constructing the second request frame sequence includes: inserting correct request frames into multiple erroneous request frames based on a preset second insertion interval, thereby constructing the second request frame sequence.

[0058] For example: Multiple error request frames are consecutively arranged according to a preset second insertion interval. These error request frames form the main message, and correct request frames are interspersed between them, sequentially concatenating them to construct the second request frame sequence. It is understood that the second insertion interval for message transmission and the insertion ratio of error request frames can both be pre-configured.

[0059] It should be noted that the second insertion interval in this embodiment refers to the insertion interval of the request frame, that is, one correct request frame is inserted for every N erroneous request frames.

[0060] In one exemplary embodiment, error request frames are continuously arranged according to a preset second insertion interval. After every 100 consecutive error request frames are sent, one correct request frame is randomly inserted. Furthermore, multiple error request frames are randomly selected from a variety of preset error frame types.

[0061] Understandably, in extremely harsh industrial environments, the bus is subjected to continuous strong electromagnetic interference, bus surge disturbances, or continuous injection of illegal messages from external abnormal devices. This results in a continuous influx of abnormal messages onto the bus, interspersed with a small number of normal service commands. The second request frame sequence constructed in this embodiment, with erroneous request frames dominating and a small number of correct request frames randomly interspersed, can highly replicate the aforementioned extreme impact scenario, simulating the extreme conditions of strong electromagnetic interference and continuous impact from a large number of illegal messages. This negative stress test verifies that under the condition of continuous bombardment of massive amounts of abnormal messages, the protocol processing unit of the multi-channel board will not experience task blocking, deadlock, thread freezing, or channel disconnection; it also verifies whether the board can continuously identify abnormal messages and provide standardized responses, and whether it can still normally respond to the interspersed legitimate commands under the impact of massive abnormal traffic.

[0062] It should be noted that the positive stress test and the negative stress test run mutually exclusively. The positive stress test and the negative stress test are performed synchronously on multiple channels. The parameters of multiple channels are packaged into the same Modbus write frame and sent at once to achieve parallel stress loading of multiple channels. Furthermore, there is no automatic termination condition for the test process, and it must be ended manually by the operator.

[0063] Please refer to the following: Figure 4 , Figure 4 This is provided in the embodiments of this application. Figure 3 A detailed flowchart of step S303 in the process.

[0064] like Figure 4 As shown, step S303 involves simultaneously performing forward stress tests on multiple test channels of the multi-channel board to obtain the forward stress test results, including the following steps S331 to S335: Step S331: Simultaneously send the first request frame sequence to multiple test channels.

[0065] Specifically, the host computer adopts a multi-threaded concurrent scheduling mechanism to generate message distribution tasks in parallel. It synchronously polls and sends the message corresponding to the test request frame in the first request frame sequence to all test channels of the board under test. Multiple test channels simultaneously receive the message corresponding to the test request frame. Furthermore, multiple test channels perform protocol parsing and instruction calculation in parallel to process the message corresponding to the test request frame. This can simulate the scenario of multi-channel concurrent access to verify the parallel processing capability of the multi-channel board.

[0066] Step S332: Receive multiple test response frames returned by each test channel of the multi-channel board based on the first request frame sequence, wherein the test response frames include the first response frame.

[0067] Specifically, after each test channel completes the parsing and instruction calculation of the corresponding test request frame, it sends the corresponding response message back to the host computer according to the Modbus RTU communication specification. This response message is the first response frame. It can be understood that the response frame corresponding to the correct request frame in the first request frame sequence is the first response frame.

[0068] The host computer continuously keeps the serial bus listening thread running, capturing all response data transmitted on the bus in real time, and distinguishing test channels based on the slave address in the response message. The host computer can also classify and cache the first response frames output by different test channels according to the channel number, establish the association between the test response frame and the original test request frame, and prevent the messages of different test channels from being confused with each other.

[0069] Step S333: Based on multiple first response frames, count the number of successful tests and the number of first abnormal responses for each test channel.

[0070] Specifically, the host computer iterates through all the first response frames corresponding to a single test channel. On the one hand, it counts the number of times a legal command is successfully interacted through frame matching verification as the number of successful tests. On the other hand, it counts the number of times the board identifies erroneous request frames and correctly responds to abnormal responses as the number of first abnormal responses, thus realizing independent statistics of dual-channel indicators.

[0071] Step S334: Calculate the correct instruction recognition rate and the first anomaly recognition rate for each test channel based on the number of successful tests and the number of first anomaly responses for each test channel.

[0072] Among them, the correct instruction recognition rate is the ratio of the number of successful tests to the number of correct request frames in the first request frame sequence, and the first anomaly recognition rate is the ratio of the number of first abnormal responses to the number of erroneous request frames in the first request frame sequence.

[0073] For example, the first request frame sequence contains 1000 correct request frames and 10 incorrect request frames. For one of the test channels, the number of successful tests is 996, and the number of first abnormal responses is 9. Therefore, the correct command recognition rate for this channel is 996 / 1000 = 99.6%, and the first abnormal response recognition rate is 9 / 10 = 90%.

[0074] In the embodiments of this application, the correct instruction recognition rate can reflect the reliability of the multi-channel board in processing legitimate communication instructions, and the first anomaly recognition rate can characterize the multi-channel board's ability to identify illegal messages.

[0075] Step S335: Obtain the positive stress test results based on the correct instruction recognition rate and the first anomaly recognition rate of each test channel.

[0076] Specifically, the results of the forward stress test are characterized by the correct command recognition rate and the first anomaly recognition rate. The correct command recognition rate is the ratio of successful test counts to the total number of correct frames sent, used to evaluate the normal response capability of the tested board under high communication load. The first anomaly recognition rate is the ratio of the number of abnormal responses to the total number of abnormal frames sent, used to evaluate the tested board's ability to detect and reject illegal commands. If both indicators meet the standards, the forward stress test result for that test channel is considered passed. By statistically analyzing the forward stress test results of all test channels, a complete forward stress test report for all test channels is output.

[0077] Please refer to the following: Figure 5 , Figure 5 This is provided in the embodiments of this application. Figure 4 A detailed flowchart of step S333 in the process.

[0078] like Figure 5 As shown, step S333: Based on multiple first response frames, count the number of successful tests and the number of first abnormal responses for each test channel, including the following steps S3331 to S3332: Step S3331: Obtain multiple first comparison results corresponding to multiple first response frames, and determine the number of first comparisons that are successfully matched in the multiple first comparison results as the number of successful tests.

[0079] Step S3332: Obtain the first number of times that multiple erroneous request frames in the first request frame sequence are identified as abnormal by the multi-channel board, and determine the first number as the first abnormal response count.

[0080] Specifically, iterate through all erroneous request frames in the first request frame sequence; count the total number of times the board correctly identifies illegal messages and returns abnormal error responses, and record this as the first abnormal response count. If the multi-channel board receives an erroneous request frame and does not respond at all, or returns a valid normal response, it is not included in the count.

[0081] Please refer to the following: Figure 6 , Figure 6 This is provided in the embodiments of this application. Figure 5 A detailed flowchart of step S3331 is shown.

[0082] like Figure 6 As shown, step S3331: obtaining multiple first comparison results corresponding to multiple first response frames, including the following steps S311 to S312: Step S311: Compare the frame content of each first response frame with the test request frames in the request cache queue to determine the first comparison result corresponding to each first response frame. The request cache queue is used to cache test request frames.

[0083] Specifically, the host computer performs message matching verification on each of the first response frames, generating a first comparison result for each first response frame; it then counts all comparison results, calculates the total number of frames marked as successfully matched, and uses this total number of frames as the number of successful tests for the current test channel.

[0084] Step S312: Based on the first comparison result corresponding to each first response frame, determine multiple first comparison results corresponding to multiple first response frames.

[0085] Specifically, iterate through all the first response frames collected under the current test channel, repeatedly execute the above parsing, matching, and judgment process, generate the first comparison result corresponding to each first response frame, count the multiple first comparison results corresponding to all first response frames to form a complete set of comparison results, and count the total number of frames marked as successfully matched as the number of successful tests.

[0086] Please refer to the following: Figure 7 , Figure 7 This is provided in the embodiments of this application. Figure 6 A detailed flowchart of step S311 is shown.

[0087] like Figure 7 As shown, step S311 involves comparing the frame content of each first response frame with the test request frames in the request cache queue to determine the first comparison result corresponding to each first response frame, including the following steps S3111 to S3114: Step S3111: Obtain the slave address of the first response frame and the actual function code corresponding to the first response frame.

[0088] Specifically, the first response frame is parsed to extract the slave address and actual function code carried in the first response frame; at the same time, the query request cache queue is matched to find the original test request frame corresponding to the first response frame, and the slave address and original function code of the original test request frame are read.

[0089] Step S3112: Determine whether the slave address of the first response frame is equal to the slave address corresponding to the test request frame, and whether the actual function code corresponding to the first response frame is equal to the original function code corresponding to the test request frame.

[0090] Specifically, if the slave address of the first response frame equals the slave address of the original test request frame, and the actual function code of the first response frame equals the original function code of the original test request frame, then the interaction is considered normal, and the first comparison result is marked as a successful comparison.

[0091] Step S3113: Determine the first alignment result as a successful alignment.

[0092] Specifically, if the slave address of the first response frame is equal to the slave address corresponding to the test request frame, and the actual function code corresponding to the first response frame is equal to the original function code corresponding to the test request frame, then the first comparison result is determined to be a successful comparison.

[0093] Step S3114: Determine that the first alignment result is an alignment failure.

[0094] Specifically, if the slave address of the first response frame is not equal to the slave address corresponding to the test request frame, or if the actual function code corresponding to the first response frame is not equal to the original function code corresponding to the test request frame, then the first comparison result is determined to be a comparison failure.

[0095] In this embodiment, both the test request frame and the first response frame are Modbus RTU frames. Upon arrival of the first response frame, the complete frame is immediately extracted from the byte stream, its CRC is checked, and a match is performed. The match is based on two fields: slave address and function code. For a normal response, the function code of the first response frame is the same as the function code of the test request frame in the request buffer queue. For an abnormal response, the function code of the first response frame is equal to the bitwise OR result of the request function code and 0x80. If the match is successful, the test request frame is dequeued from the request buffer queue, and its metadata, such as the starting address and the number of registers, is used to parse the response data field. First response frames that fail to match or whose CRC check fails are silently discarded.

[0096] In this embodiment of the application, the request-response matching mechanism can solve problems such as mismatch between response frames and request frames, delayed response, and bus conflicts in scenarios where multiple devices share the same serial bus, thereby ensuring the reliability and data consistency of high-frequency communication in stress testing scenarios.

[0097] Please refer to the following: Figure 8 , Figure 8 This is provided in the embodiments of this application. Figure 3 A detailed flowchart of step S304 in the process.

[0098] like Figure 8 As shown, step S304 involves simultaneously performing negative stress tests on multiple test channels of the multi-channel board to obtain the negative stress test results, including the following steps S341 to S345: Step S341: Simultaneously send the second request frame sequence to multiple test channels.

[0099] Specifically, the host computer uses a multi-threaded concurrent scheduling mechanism to continuously and synchronously send the message data stream from the second request frame sequence to all test channels of the board under test. The second request frame sequence mainly consists of a massive number of error request frames, continuously subjecting the board's Modbus communication protocol stack to high-intensity abnormal message impacts, simulating extreme working conditions such as strong electromagnetic interference and continuous injection of illegal messages in an industrial setting; this is to test whether the board's underlying communication processing logic experiences stability failures such as message queue blocking, task deadlock, thread deadlock, and channel communication interruption under a long-term bombardment of a large number of abnormal messages.

[0100] Step S342: Receive multiple test response frames returned by each test channel of the multi-channel board based on the second request frame sequence, wherein the test response frames include the second response frames.

[0101] Specifically, each test channel processes the received second request frames sequentially, and according to the validity of the message, sends a corresponding response message back to the host computer according to the Modbus RTU protocol specification. This type of response message is the second response frame. It can be understood that the response frame corresponding to the correct request frame in the second request frame sequence is the second response frame.

[0102] The host computer starts a continuous bus monitoring task, continuously collecting the second response frames returned by each test channel on the bus, and distinguishing the channel to which the message belongs based on the slave address in the message, classifying and caching according to the test channel number, and establishing an association index between the response message and the original request frame to prevent the mixing of multiple channel messages from causing subsequent statistical errors.

[0103] Step S343: Based on multiple second response frames, count the number of second abnormal responses and the number of correct request frames that received normal responses for each test channel.

[0104] Specifically, the host computer performs classification and statistics on all second response frames corresponding to a single test channel: on the one hand, it counts the number of times the multi-channel board identifies various erroneous request frames and provides compliant abnormal responses; on the other hand, it counts the number of times correct request frames interspersed in the second request frame sequence receive legitimate and normal responses. These two indicators are counted independently to comprehensively evaluate the board's anomaly identification capability and its ability to continuously serve normal business operations under extreme impact scenarios.

[0105] Step S344: Calculate the second anomaly identification rate and the correct frame survival rate for each test channel based on the number of second anomaly responses and the number of correct request frames that receive normal responses for each test channel.

[0106] The second anomaly identification rate is the ratio of the number of second anomaly responses to the number of erroneous request frames in the second request frame sequence, and the correct frame survival rate is the ratio of the number of correct request frames that receive normal responses to the number of correct request frames in the second request frame sequence.

[0107] For example, the second request frame sequence contains 1000 erroneous request frames and 50 correct request frames. For one test channel, the number of second abnormal responses was 970, and the number of correct request frames that received normal responses was 46. Therefore, the second abnormality detection rate for this channel is 970 / 1000 = 97.0%, and the correct frame survival rate is 46 / 50 = 92.0%.

[0108] In this embodiment, the second anomaly recognition rate is used to characterize the ability of a multi-channel board to identify illegal packets under the impact of large-scale abnormal packets; the correct frame survival rate is used to evaluate whether legitimate communication commands can interact normally when a large number of erroneous packets continuously interfere, reflecting the robustness of the communication protocol stack against impact and non-blocking.

[0109] Step S345: Obtain the negative stress test results based on the second anomaly detection rate and the correct frame survival rate for each test channel.

[0110] Specifically, the results of the negative stress test are characterized by the second anomaly recognition rate and the correct frame survival rate. The correct frame survival rate represents the proportion of a small number of correct frames that receive normal responses, used to assess whether the device under test can maintain normal operation under continuous abnormal command attacks, i.e., verifying the fault tolerance and recovery capability of its protocol stack. In other words, the correct frame survival rate characterizes whether normal commands can be processed normally when bombarded with a large number of abnormal packets. The second anomaly recognition rate characterizes the board's ability to resist illegal packet attacks. If both indicators meet the standards, the negative stress test result for that test channel is considered passed. By statistically analyzing the negative stress test results of all test channels, a complete negative stress test report for all test channels is output.

[0111] In this embodiment, two levels of stress test scenarios, positive and negative, are set simultaneously: the positive test simulates normal field conditions to verify the normal communication stability and basic anomaly identification capability of the multi-channel board, and can positively evaluate the anti-interference capability of the multi-channel board; the negative test simulates extreme interference conditions to verify that the communication protocol stack will not freeze or the channel will not fail under the impact of massive illegal packets, and can evaluate the fault tolerance and recovery capability of the multi-channel board. The legality of the response is verified by bidirectional matching of frame address and function code, and multiple indicators such as correct instruction recognition rate, anomaly recognition rate, and correct frame survival rate are quantified and output. Compared with traditional manual command issuance testing, automated concurrent testing has higher coverage, exposes communication defects in multi-channel concurrent and electromagnetic interference scenarios in advance, and, by combining positive and negative stress tests, can effectively detect potential defects of the multi-channel board under extreme communication conditions, thereby effectively improving the long-term operational reliability of the power management module inside the magnetic control system of the plasma etching machine.

[0112] Please refer to the following: Figure 9 , Figure 9 This is provided in the embodiments of this application. Figure 8 A detailed flowchart of step S343 in the process.

[0113] like Figure 9 As shown, step S343: Based on multiple second response frames, count the number of second abnormal responses and the number of correct request frames that received normal responses for each test channel, including the following steps S3431 to S3432: Step S3431: Obtain the second number of times that multiple error request frames in the second request frame sequence are identified as abnormal by the multi-channel board, and determine the second number as the second abnormal response count.

[0114] Specifically, the host computer iterates through all erroneous request frames in the second request frame sequence, checking the board's feedback result frame by frame. If the board can identify a protocol violation in the current erroneous request frame and return an abnormal function response frame according to the Modbus protocol standard, the identification is considered valid, and a count is added. The total number of valid identifications is defined as the second abnormal response count. It should be noted that if the board receives an erroneous request frame without any response or returns a normal read / write response message, it indicates that the abnormal identification has failed and is not counted in the second abnormal response count. The second abnormal response count can directly reflect the board's protocol fault tolerance and parsing capability under the impact of massive abnormal messages.

[0115] Step S3432: Obtain multiple second comparison results corresponding to multiple second response frames, and determine the number of successful comparisons among the multiple second comparison results as the number of correct request frames that have received normal responses.

[0116] Specifically, multiple second comparison results corresponding to multiple second response frames are obtained, including: Each second response frame is compared with the test request frames in the request cache queue to determine the second comparison result corresponding to each second response frame. The request cache queue is used to cache test request frames. Based on the second comparison result corresponding to each second response frame, determine multiple second comparison results corresponding to multiple second response frames.

[0117] For example: The host computer parses the second response frame, extracting the slave address and actual function code carried in the second response frame; simultaneously, it matches and queries the request cache queue to find the original correct request frame corresponding to the second response frame, and reads the slave address and original function code of the original correct request frame. Each second response frame is compared and verified with the corresponding original correct request frame in the request cache queue. The verification conditions are: the slave address of the second response frame matches the slave address of the original correct request frame, and the actual function code of the second response frame matches the original function code of the original correct request frame; if the verification conditions are met, the second comparison result is marked as successful. After traversing all second response frames in the current channel, the total number of successfully matched frames is counted. This value represents the number of legitimate instructions interspersed within the sequence that can still receive a normal response from the board under continuous interference from a large number of abnormal messages.

[0118] Specifically, the second response frame is parsed to extract the slave address and actual function code carried in the second response frame; at the same time, the query request cache queue is matched to find the original test request frame corresponding to the second response frame, and the slave address and original function code of the original test request frame are read.

[0119] Determine whether the slave address of the second response frame is equal to the slave address corresponding to the test request frame, and whether the actual function code corresponding to the second response frame is equal to the original function code corresponding to the test request frame.

[0120] Specifically, if the slave address of the second response frame equals the slave address of the original test request frame, and the actual function code of the second response frame equals the original function code of the original test request frame, then the interaction is considered normal, and the second comparison result is marked as a successful comparison.

[0121] Specifically, if the slave address of the second response frame is not equal to the slave address corresponding to the test request frame, or if the actual function code corresponding to the second response frame is not equal to the original function code corresponding to the test request frame, then the second comparison result is marked as a comparison failure.

[0122] Based on the second comparison result corresponding to each second response frame, determine multiple second comparison results corresponding to multiple second response frames.

[0123] Specifically, iterate through all second response frames, execute the above comparison logic frame by frame, and count the multiple second comparison results corresponding to all second response frames; count the total number of frames marked as successfully matched as the number of correct request frames that have received a normal response.

[0124] In this embodiment, a stress testing method for a multi-channel board is provided, applied to a magnetic control system. The magnetic control system includes a power management module, which in turn includes a multi-channel board. The method includes: acquiring configuration parameters of multiple test channels of the multi-channel board; encapsulating all configuration parameters of the multiple test channels to generate test request frames, wherein the test request frames include correct request frames and incorrect request frames; constructing a first request frame sequence and sending the first request frame sequence to the multi-channel board to simultaneously perform positive stress testing on the multiple test channels of the multi-channel board, obtaining positive stress test results, wherein the proportion of correct request frames in the first request frame sequence is greater than the proportion of incorrect request frames; constructing a second request frame sequence and sending the second request frame sequence to the multi-channel board to simultaneously perform negative stress testing on the multiple test channels of the multi-channel board, obtaining negative stress test results, wherein the proportion of incorrect request frames in the second request frame sequence is greater than the proportion of correct request frames.

[0125] By acquiring the configuration parameters of multiple test channels of a multi-channel board, encapsulating the configuration parameters of multiple test channels, generating test request frames, and constructing a first request frame sequence and a second request frame sequence to simultaneously perform positive and negative stress tests on multiple test channels of the multi-channel board, obtaining positive and negative stress test results, this application can improve the accuracy of stress test results.

[0126] Please see Figure 10 , Figure 10 This is a schematic diagram of the structure of a multi-channel board pressure testing system provided in an embodiment of this application.

[0127] like Figure 10 As shown, the multi-channel board stress testing system 300 includes one or more processors 301 and a memory 302. Among them, Figure 10 Take processor 301 as an example.

[0128] Processor 301 and memory 302 can be connected via a bus or other means. Figure 10 Taking the example of a connection between China and Israel via a bus.

[0129] Processor 301 is used to execute the stress testing method for a multi-channel board according to the embodiments of this application. The method is applied to a magnetic control system, which includes a power management module and a multi-channel board. The method includes: acquiring configuration parameters of multiple test channels of the multi-channel board; encapsulating all configuration parameters of the multiple test channels to generate test request frames, wherein the test request frames include correct request frames and incorrect request frames; constructing a first request frame sequence and sending the first request frame sequence to the multi-channel board to simultaneously perform positive stress testing on the multiple test channels of the multi-channel board, obtaining positive stress test results, wherein the proportion of correct request frames in the first request frame sequence is greater than the proportion of incorrect request frames; constructing a second request frame sequence and sending the second request frame sequence to the multi-channel board to simultaneously perform negative stress testing on the multiple test channels of the multi-channel board, obtaining negative stress test results, wherein the proportion of incorrect request frames in the second request frame sequence is greater than the proportion of correct request frames.

[0130] By acquiring the configuration parameters of multiple test channels of a multi-channel board, encapsulating the configuration parameters of multiple test channels, generating test request frames, and constructing a first request frame sequence and a second request frame sequence to simultaneously perform positive and negative stress tests on multiple test channels of the multi-channel board, obtaining positive and negative stress test results, this application can improve the accuracy of stress test results.

[0131] The memory 302, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs, non-volatile computer-executable programs, and modules, such as the program instructions / modules corresponding to the stress testing method for the multi-channel board in the embodiments of this application. The processor 301 executes various functional applications and data processing of the flash memory device by running the non-volatile software programs, instructions, and modules stored in the memory 302, thereby implementing the stress testing method for the multi-channel board in the above-described method embodiments.

[0132] Memory 302 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, memory 302 may optionally include memory remotely located relative to processor 301. Examples of the above-described networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0133] One or more modules are stored in memory 302. When executed by one or more processors 301, they perform the stress testing method for the multi-channel board described in the above method embodiments, for example, the method described above. Figure 3 The steps shown.

[0134] This application also provides a non-volatile computer-readable storage medium storing computer-executable instructions that are executed by one or more processors. For example, the one or more processors can execute the stress testing method for the multi-channel board in any of the above method embodiments, such as performing the steps described above.

[0135] This application also provides a computer program product, which includes one or more lines of program code stored in a non-volatile computer-readable storage medium. The processor of the host computer reads the program code from the non-volatile computer-readable storage medium and executes the program code to complete the steps of the stress testing method for the multi-channel board provided in the above embodiments.

[0136] Based on the above description of the embodiments, those skilled in the art will understand that all or part of the steps of the above embodiments can be implemented by hardware, or by a program or program code related to hardware. The program can be stored in a non-volatile computer-readable storage medium, such as a read-only memory, a disk, or an optical disk.

[0137] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented using software plus a general-purpose hardware platform, or of course, using hardware. Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. The non-volatile computer-readable storage medium can be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc.

[0138] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and not to limit them; under the concept of this application, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations as described above in different aspects of this application, which are not provided in detail for the sake of brevity; although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or make equivalent substitutions for some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A stress testing method for a multi-channel board, characterized in that, Applied to a magnetic control system, the magnetic control system including a power management module, the power management module including the multi-channel board, the method includes: Obtain the configuration parameters of multiple test channels of the multi-channel board; All configuration parameters of multiple test channels are encapsulated to generate test request frames, which include correct request frames and error request frames. A first request frame sequence is constructed and sent to the multi-channel board to simultaneously perform forward stress testing on multiple test channels of the multi-channel board and obtain forward stress test results. In the first request frame sequence, the proportion of the number of correct request frames is greater than the proportion of the number of incorrect request frames. A second request frame sequence is constructed and sent to the multi-channel board to simultaneously perform negative stress tests on multiple test channels of the multi-channel board, thereby obtaining negative stress test results. In the second request frame sequence, the proportion of erroneous request frames is greater than the proportion of correct request frames.

2. The method according to claim 1, characterized in that, The construction of the first request frame sequence includes: inserting the erroneous request frame into multiple correct request frames based on a preset first insertion interval, thereby constructing the first request frame sequence; The construction of the second request frame sequence includes: inserting the correct request frame into multiple erroneous request frames based on a preset second insertion interval, thereby constructing the second request frame sequence.

3. The method according to claim 1, characterized in that, The simultaneous forward stress test on multiple test channels of the multi-channel board to obtain the forward stress test results includes: The first request frame sequence is simultaneously sent to multiple test channels; Receive multiple test response frames returned by each of the test channels of the multi-channel board based on the first request frame sequence, wherein the test response frames include the first response frame; Based on multiple first response frames, count the number of successful tests and the number of first abnormal responses for each test channel; Based on the number of successful tests and the number of first abnormal responses for each test channel, calculate the correct instruction recognition rate and the first abnormal response rate for each test channel, wherein the correct instruction recognition rate is the ratio of the number of successful tests to the number of correct request frames in the first request frame sequence, and the first abnormal response rate is the ratio of the number of first abnormal responses to the number of incorrect request frames in the first request frame sequence. The positive stress test results are obtained based on the correct instruction recognition rate and the first anomaly recognition rate for each test channel.

4. The method according to claim 3, characterized in that, The step of counting the number of successful tests and the number of first abnormal responses for each test channel based on multiple first response frames includes: Obtain multiple first comparison results corresponding to multiple first response frames, and determine the number of successful comparisons among the multiple first comparison results as the number of successful tests; The first number of times that multiple error request frames in the first request frame sequence are identified as abnormal by the multi-channel board is obtained, and the first number is determined as the first abnormal response count.

5. The method according to claim 4, characterized in that, The step of obtaining multiple first comparison results corresponding to multiple first response frames includes: Each first response frame is compared with the test request frames in the request cache queue to determine the first comparison result corresponding to each first response frame, wherein the request cache queue is used to cache the test request frames; Based on the first comparison result corresponding to each of the first response frames, multiple first comparison results corresponding to multiple first response frames are determined.

6. The method according to claim 1, characterized in that, The simultaneous negative stress test on multiple test channels of the multi-channel board to obtain the negative stress test results includes: The second request frame sequence is simultaneously sent to multiple test channels; Receive multiple test response frames returned by each of the test channels of the multi-channel board based on the second request frame sequence, wherein the test response frames include the second response frame; Based on multiple second response frames, count the number of second abnormal responses and the number of correct request frames that received normal responses for each test channel; Based on the number of second abnormal responses and the number of correct request frames that received normal responses for each test channel, the second abnormality detection rate and the correct frame survival rate for each test channel are calculated, wherein the second abnormality detection rate is the ratio of the number of second abnormal responses to the number of erroneous request frames in the second request frame sequence, and the correct frame survival rate is the ratio of the number of correct request frames that received normal responses to the number of correct request frames in the second request frame sequence. The negative stress test results are obtained based on the second anomaly detection rate and the correct frame survival rate for each test channel.

7. The method according to claim 6, characterized in that, The step of counting the number of second abnormal responses and the number of correct request frames that received normal responses for each test channel based on multiple second response frames includes: The second number of times that the multiple error request frames in the second request frame sequence are identified as abnormal by the multi-channel board is obtained, and the second number is determined as the second abnormal response number; Obtain multiple second comparison results corresponding to multiple second response frames, and determine the number of successful comparisons among the multiple second comparison results as the number of correct request frames that have received normal responses.

8. The method according to claim 7, characterized in that, The step of obtaining multiple second comparison results corresponding to multiple second response frames includes: Each second response frame is compared with the test request frames in the request cache queue to determine the second comparison result corresponding to each second response frame, wherein the request cache queue is used to cache the test request frames; Based on the second comparison result corresponding to each second response frame, multiple second comparison results corresponding to multiple second response frames are determined.

9. A pressure testing system for a multi-channel board, characterized in that, include: At least one processor; At least one memory for storing at least one program; When at least one of the programs is executed by at least one of the processors, the at least one of the processors implements the method according to any one of claims 1 to 8.

10. A non-volatile computer-readable storage medium storing a processor-executable program, characterized in that, The processor-executable program, when executed by the processor, is used to perform the method as described in any one of claims 1 to 8.

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