DUT socket structure with pushers surrounded by electromagnetic absorbers and test arrangement or automatic test equipment comprising the same

Abstract

One embodiment of the application is a device under test socket structure (100, 260, 620, 1510, 1520) comprising a pusher (110, 210, 310, 510, 1310, 1785, 1850, 2030, 2110) and a DUT socket (120, 220, 320, 420, 520, 1020, 1350, 1820, 1910). The DUT socket has a receiving section (130, 230, 330, 430, 1030) configured to receive a DUT (150, 250, 350, 450, 550, 1620, 1720, 2150). The pusher is configured to push the DUT towards or into the receiving section. The pusher is at least partially surrounded by an electromagnetic absorber.

Description

Technical Field

[0001] Embodiments of the present invention relate to an airborne device-under-test (DUT) socket structure having a pusher surrounded by an electromagnetic absorber. Embodiments of the present invention also relate to test setups or automated test equipment including this structure. Embodiments of the present invention relate to how to add a structure made of radio frequency (RF) absorbing material to a near-field airborne socket to improve near-field measurement performance and inter-site isolation in multi-site testing. Embodiments of the present invention relate to an absorber for an automated test equipment near-field socket. Background Technology

[0002] In production environments, multiple devices are manufactured and tested on multiple production lines within the same production workshop using the same machines. With the increasing prevalence of near-field over-the-air (OTA) testing methods, the surrounding environment of the OTA testing area is contaminated by the electromagnetic signals used in OTA testing (which are reflected back from nearby or conductive surfaces), negatively impacting test results and / or their accuracy. Reducing electromagnetic pollution in near-field OTA testing would be beneficial because it improves near-field measurement performance and inter-site isolation in multi-site testing.

[0003] Figure 6 of US 11,496,227 B2 discloses a sheet-like radio wave absorber arranged along the inner wall of a pusher. The radio wave absorber has a rectangular tubular shape along the shape of the pusher and is allowed to surround the device antenna of the DUT. The radio wave absorber on the inner wall of the pusher reduces the reflection of radio waves inside the pusher during OTA testing. This allows for near-field OTA testing with higher accuracy. The same material as the material constituting the radio wave absorber can be used. However, the pusher is merely a frame, causing the pushing force to be unevenly distributed on the DUT, resulting in mechanical stress within the DUT. A uniformly distributed pushing force would improve the stability of the DUT within the socket and simultaneously reduce the mechanical stress of the DUT.

[0004] Therefore, there is a need to provide a socket structure that reduces electromagnetic pollution in near-field OTA testing methods to improve near-field measurement performance and / or inter-site isolation in multi-site testing. Summary of the Invention

[0005] Embodiments of the present invention relate to a device under test (DUT) receptacle structure, for example for over-the-air (OTA) testing, or for example for near-field over-the-air testing. The DUT receptacle structure includes a pusher and a DUT receptacle having a receiving (or accepting) section configured to receive a DUT.

[0006] The pusher is configured to push the DUT toward the receiving section (e.g. toward a recess for receiving the DUT, or toward a contact structure for contacting the DUT, or toward a DUT position within the DUT socket) or to push the DUT into the DUT position (e.g., into the recess for receiving the DUT, or into the contact structure for contacting the DUT, so as to establish better contact, for example, by using the pushing surface of the pusher, or into the DUT position within the DUT socket).

[0007] The pusher is at least partially surrounded by an electromagnetic absorber (e.g., an RF absorber) in a region of its side surface (e.g., the pusher (or a portion thereof) is specifically surrounded by (dedicated) electromagnetic absorbers (e.g., only or exclusively) but not around the entire test setup and not around the rest of the device under test socket; for example, surrounded in such a way that a propagation tunnel surrounded by electromagnetic absorbers is provided between the DUT location and the measurement antenna structure, at least on a portion of the propagation path between the measurement antenna structure and the DUT location).

[0008] For example, electromagnetic absorbers are arranged to prevent unattenuated reflections of waves propagating from the location of the device under test (DUT) or from the test antenna of the DUT at conductive structures or dielectric structures arranged at a distance from the axis of the actuator (e.g., at the support structure of the DUT socket structure).

[0009] For example, the electromagnetic absorber is configured to absorb radiation that leaves the actuator in a direction inclined relative to the axis of the actuator.

[0010] For example, an electromagnetic absorber is configured to absorb radiation propagating from the location of the device under test in a direction that deviates from the direction toward the measuring antenna structure.

[0011] For example, an electromagnetic absorber is configured to absorb radiation propagating from the measuring antenna structure in a direction that deviates from the direction toward the location of the device under test.

[0012] For example, electromagnetic absorbers can be manufactured using molding techniques and / or 3D printing techniques.

[0013] For example, an electromagnetic absorber may include multiple individual absorber segments assembled together.

[0014] For example, the pusher may include a push surface configured to contact the DUT and push the DUT toward the receiving section, and / or configured to push the DUT toward the receiving section or the receiving section or recess of the DUT socket.

[0015] The electromagnetic absorber surrounding the pusher allows the pusher to be a solid block with a pushing surface. This pushing surface can be mated to the DUT. Alternatively, the pusher can receive a replaceable cap with a pushing surface that mates with the DUT. Therefore, the pusher can utilize its entire surface, i.e., the pushing surface, to push the DUT into or towards the receiving section, resulting in a substantially uniform distribution of pushing force while reducing electromagnetic pollution of the surrounding environment, improving near-field measurement performance, and enhancing inter-site isolation in multi-site testing.

[0016] In other words, the DUT receptacle structure includes a DUT receptacle with a receiving section and a pusher surrounded by an electromagnetic absorber. During OTA testing or near-field OTA testing, the pusher pushes the DUT into or towards the receiving section. The electromagnetic absorber surrounding the pusher absorbs radiation or electromagnetic waves or their reflections used in the OTA test, which would otherwise contaminate the surrounding environment or affect the OTA test itself. Therefore, this improves near-field measurement performance and inter-site isolation in multi-site testing.

[0017] For example, the absorber is part of the socket structure. For example, the absorber and pusher are located on the cover, or for example, the absorber and pusher are part of the sorting machine change kit arm in a high-capacity production environment.

[0018] In other words, whether the absorber is part of the DUT socket depends on the specific application. In some embodiments, the absorber may be part of the socket structure, i.e., located on a cover with a pusher. In some cases, it (e.g., the absorber) may be part of the sorting machine change kit arm in high-volume production, or it (e.g., the absorber) may be part of the load plate for more complex AiP modules (such as L-shaped types).

[0019] In a preferred embodiment, the DUT socket includes one or more sidewalls surrounding the receiving section (e.g., in the lower fixed portion of the DUT socket, such as in a part of the DUT socket that remains attached to the load plate when the DUT socket is opened to replace the device under test, such as multiple sidewalls in the case of a generally rectangular or generally square opening surrounding the DUT location, such as a generally circular sidewall in the case of a generally circular opening surrounding the DUT location).

[0020] One or more sidewall surfaces facing the receiving section are at least partially covered by an electromagnetic absorber.

[0021] For example, an electromagnetic absorber covering the sidewall facing the receiving section can be arranged to remain attached to the sidewall when the DUT socket is opened to replace the device under test; for example, an electromagnetic absorber covering the sidewall facing the receiving section can be arranged to surround the pusher when the socket is closed.

[0022] When the receiving section is surrounded by a generally polygonal (e.g., rectangular or generally square) opening, the DUT socket may include, for example, multiple sidewalls. When the receiving section is surrounded by a generally circular or elliptical opening, the DUT socket may include, for example, a single generally circular or elliptical sidewall.

[0023] For example, an electromagnetic absorber covering the sidewall facing the receiving section can be arranged to surround the pusher when the pusher pushes the device under test (DUT) to or into the DUT position.

[0024] For example, the electromagnetic absorber covering the sidewall facing the receiving section can be arranged to surround a movable spatial region of the pusher. For example, the electromagnetic absorber covering the sidewall facing the receiving section can be arranged to surround a spatial region through which the device under test (DUT) is inserted or removed from its position.

[0025] In other words, the electromagnetic absorber covering the sidewalls surrounds the receiving section so as to absorb the lateral radiation of the DUT when it is placed in the receiving section, and also reduce electromagnetic pollution in the receiving section plane or environment, thereby improving near-field measurement performance and site isolation in multi-site testing.

[0026] The electromagnetic absorber covering the sidewall facing the receiving section can be arranged to remain attached to the sidewall when the DUT socket is opened to replace the DUT, and can also be arranged to surround the pusher when the socket is closed or when the pusher pushes the DUT toward or into the receiving section.

[0027] In a preferred embodiment, the side surface of the pusher is completely surrounded by an electromagnetic absorber at least a portion of the longitudinal extension of the pusher (e.g., surrounded in all directions; e.g., surrounded at 360 degrees; e.g., surrounded in a circumferential manner).

[0028] For example, the longitudinal extension of the pusher can be an extension along the pushing direction, and / or, for example, the longitudinal extension of the pusher can be an extension along the axis of the pusher.

[0029] For example, the pusher is not surrounded by an electromagnetic absorber along its entire longitudinal extension; for example, the longitudinal extension of the electromagnetic absorber is shorter than the longitudinal extension of the pusher, such that the portion of the pusher at the push end is not surrounded by the electromagnetic absorber.

[0030] For example, at least a portion of the electromagnetic absorber can be configured to move along with the pusher when the DUT socket is opened to replace the device under test.

[0031] For example, at least a portion of the electromagnetic absorber can be configured to maintain a fixed position relative to the device under test when the DUT socket is opened to replace the device under test.

[0032] For example, at least a first portion of the electromagnetic absorber can be configured to move together with a pusher that is not surrounded by the electromagnetic absorber over its entire longitudinal extension, and for example, at least a second portion of the electromagnetic absorber can be configured to maintain a fixed positional relationship with the receiving section, thereby creating a gap between the first and second portions of the electromagnetic absorber so that the first and second portions of the electromagnetic absorber do not contact each other.

[0033] In other words, the pusher or both the pusher and the receiving section are surrounded by electromagnetic absorbers in each lateral direction to protect the OTA test area from the surrounding environment in each direction. Furthermore, the length of the pusher can be longer than the length of the tubular electromagnetic absorber to create a protective gap, protecting the electromagnetic absorber from damage and improving its lifespan. Additionally, a protective gap can be created by having a gap between the electromagnetic absorber surrounding the pusher and the electromagnetic absorber covering the sidewalls of the DUT socket.

[0034] In a preferred embodiment, the DUT socket includes a plurality of sidewalls surrounding the receiving section, wherein the sidewalls are inclined toward the receiving section, for example to help the pickup machine correctly position the DUT.

[0035] For example, the sloping sidewalls may not be covered by the electromagnetic absorber, for example, to allow the device under test to slide into the device under test position.

[0036] For example, the longitudinal extension of the electromagnetic absorber surrounding the pusher is shorter than the longitudinal extension of the pusher, such that the portion of the pusher at the push end (which intrudes into the spatial region surrounded by the inclined sidewalls) is not surrounded by the electromagnetic absorber.

[0037] For example, the electromagnetic absorber surrounding the pusher and the inclined sidewall do not contact each other to improve the service life of the electromagnetic absorber.

[0038] In a preferred embodiment, the surface of the electromagnetic absorber facing the pusher includes multiple pyramidal structures (e.g., pyramids or truncated pyramids) or conical structures (e.g., cones or truncated cones), which include, for example, electromagnetic absorbing materials (or are made of electromagnetic absorbing materials).

[0039] Electromagnetic absorbers or RF absorbers are designed with a specific shape to function in near-field sockets or DUT sockets.

[0040] The absorption rate of the electromagnetic absorber is improved by the surface of the pyramidal and / or conical structure, which is made of electromagnetic absorbing material and points to the actuating element and / or receiving section.

[0041] In a preferred embodiment, the height of the pyramidal or conical structure is in the range of 0.1 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency for air testing, such as the lowest operating frequency of the DUT socket) and 0.4 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency for air testing, such as the lowest operating frequency of the DUT socket, where the lowest operating frequency may be defined, for example, by a test antenna that is part of the DUT socket).

[0042] Alternatively, the height of the pyramidal or conical structure is within the range of 0.2 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency for air testing, such as the lowest operating frequency of the DUT socket) and 0.3 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency for air testing, such as the lowest operating frequency of the DUT socket). For example, the lowest operating frequency may be defined, for instance, by a test antenna that is part of the DUT socket.

[0043] Choosing the correct height for a pyramid or cone-shaped structure will optimize or maximize the absorption rate of the electromagnetic absorber.

[0044] In a preferred embodiment, the base area of ​​the pyramidal or conical structure is in the range of 0.2 to 0.4 times the square of the wavelength at the lowest operating frequency (e.g., the lowest frequency at which air testing is to be performed, such as the lowest operating frequency of the DUT socket). For example, the lowest operating frequency may be defined, for example, by a test antenna that is part of the DUT socket.

[0045] Choosing the correct base area for a pyramid or cone-shaped structure will optimize or maximize the absorption rate of the electromagnetic absorber.

[0046] In a preferred embodiment, the electromagnetic absorber is arranged to surround a portion of the actuator, such as a portion of the axial (e.g., longitudinal) extension of the actuator, with a gap between the electromagnetic absorber and the actuator.

[0047] For example, to ensure that the electromagnetic absorber is not directly adjacent to the pusher.

[0048] For example, a gap is created between the electromagnetic absorber and the actuator, and the gap varies locally by more than 50%, or even more than 100%.

[0049] In a preferred embodiment, in the portion of the electromagnetic absorber that surrounds the pusher with a spacing between them, the distance between the electromagnetic absorber and the pusher is in the range of 0.2 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency for air testing, such as the lowest operating frequency of the DUT socket) and 0.8 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency for air testing, such as the lowest operating frequency of the DUT socket). For example, the lowest operating frequency may be defined, for example, by a test antenna that is part of the DUT socket.

[0050] Alternatively, in the portion where the electromagnetic absorber surrounds the pusher with a spacing between them, the distance between the electromagnetic absorber and the pusher is in the range of 0.1 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency for air testing, such as the lowest operating frequency of the DUT socket) and 0.6 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency for air testing, such as the lowest operating frequency of the DUT socket). For example, the lowest operating frequency can be defined, for example, by a test antenna that is part of the DUT socket.

[0051] It has been found that the distance between the pusher and the electromagnetic absorber is both mechanically and electromagnetically advantageous, but it has also been found that maintaining a compact space between the pusher and the electromagnetic absorber is advantageous. Therefore, the manufacturing modifications to the DUT socket structure of this invention are minimal compared to non-inventive DUT socket structures. In other words, the electromagnetic absorber can even be adapted to non-inventive DUT socket structures.

[0052] In a preferred embodiment, the electromagnetic absorber is arranged between the pusher and the positioning structure of the DUT socket structure (e.g., a positioning structure that provides alignment (e.g., lateral alignment) of the movable portion of the DUT socket structure (e.g., the upper part of the DUT socket structure including the measurement antenna and the pusher), for example, with a gap between the outer boundary of the electromagnetic absorber and the positioning structure).

[0053] Alternatively or additionally, the electromagnetic absorber is arranged between the pusher and the fixed structure of the DUT socket structure (e.g., a fixed structure that fixes the movable part of the DUT socket structure (e.g., the upper part of the DUT socket structure including the measurement antenna and the pusher) to the stationary part of the DUT socket structure (e.g., the lower part of the DUT socket structure including the position of the device under test), for example, with a gap between the electromagnetic absorber and the fixed structure).

[0054] Alternatively or additionally, the electromagnetic absorber is arranged between the pusher and the waveguide structure of the DUT socket structure (e.g., a waveguide structure that couples a movable portion of the DUT socket structure (e.g., the upper part of the DUT socket structure including the measurement antenna and the pusher) to the signal generator and / or signal receiver, for example, with a gap between the electromagnetic absorber and the waveguide structure).

[0055] Electromagnetic absorbers covering the actuating element (e.g., in the lateral direction, or on a surface opposite to the actuating surface) eliminate or at least reduce radiation reflections from the surface of the positioning structure, the surface of the fixed structure, or the surface of the waveguide structure, thereby further reducing electromagnetic pollution of the surrounding environment and improving near-field measurement performance and inter-site isolation in multi-site testing.

[0056] According to a preferred embodiment, the test setup includes a DUT socket structure or the aforementioned DUT socket structure and a measurement antenna structure, wherein a pusher is arranged between the measurement antenna structure and the receiving section, for example, such that there is an electromagnetic propagation path through the pusher between the measurement antenna structure and the DUT location.

[0057] For example, a propagation path or tunnel between the receiving section and the measuring antenna structure is provided by a pusher or within the pusher, the path or tunnel being surrounded by an electromagnetic absorber for at least a portion of the propagation path.

[0058] For example, the electromagnetic absorber is configured to absorb radiation propagating from the receiving section in a direction that deviates from the direction toward the measuring antenna.

[0059] For example, the electromagnetic absorber is configured to absorb radiation propagating from the measuring antenna in a direction that deviates from the direction toward the receiving section.

[0060] The measurement setup includes the measurement antenna structure, which is positioned as close as possible to the receiving section. The shorter the propagation path between the measurement antenna structure and the receiving section, the less energy is required to transmit the signal between them. Furthermore, a shorter distance between the measurement antenna structure and the receiving section results in less radiation deviating from the propagation path. Additionally, a relatively small implementation can satisfy mechanical requirements and boundary conditions.

[0061] In a preferred embodiment, the test arrangement includes an additional electromagnetic absorber portion having an opening. This additional electromagnetic absorber portion is arranged to at least partially cover the surface of the measuring antenna structure or the conductive structure carrying the measuring antenna structure (e.g., serving as an electromagnetic absorption intermediary layer between the pusher and the conductive structure including or carrying the antenna structure).

[0062] For example, the environment of the antenna structure is exempted in other electromagnetic absorbers (e.g., in the form of an opening).

[0063] For example, the surface of the conductive structure faces the receiving section.

[0064] An additional electromagnetic absorber portion is arranged between a portion of the surface of the conductive structure and the pusher, such that the opening is located on the electromagnetic propagation path between the measurement antenna structure and the receiving section (e.g., such that the opening allows electromagnetic propagation between the measurement antenna structure and the DUT location via the pusher).

[0065] For example, an additional electromagnetic absorber portion with an opening is disposed between a portion of the surface of the conductive structure including or carrying the measurement antenna structure and the surface of the pusher, such that the opening of the additional electromagnetic absorber portion is located on the electromagnetic propagation path between the measurement antenna structure and the receiving section. The surface of the conductive structure faces the receiving section. The additional electromagnetic absorber portion is arranged to at least partially cover the surface of the conductive structure, for example, serving as an electromagnetic absorption interlayer between the pusher and the conductive structure including or carrying the antenna structure.

[0066] An additional electromagnetic absorber portion with an opening, arranged between the conductive structure and the actuator, eliminates or at least reduces reflections of radiation on the surface of the conductive structure including or carrying the antenna structure, while not absorbing measurement signals transmitted along the propagation path between the measurement antenna structure and the receiving section through the opening of the additional electromagnetic absorber portion. Therefore, electromagnetic pollution of the surrounding environment is further reduced to improve near-field measurement performance and inter-site isolation in multi-site testing, and measurements are not hindered by the use of the additional electromagnetic absorber portion.

[0067] In a preferred embodiment, the pusher includes a widening portion in the longitudinal portion near the measurement antenna structure (e.g., such that the portion of the pusher adjacent to the measurement antenna structure is widened, for example, having a larger cross-sectional area in a plane perpendicular to the axis of the pusher compared to the portion of the pusher adjacent to the location of the device under test).

[0068] The widened portion's surface on the DUT side, for example, a surface roughly perpendicular to the propagation path, is partially covered by an electromagnetic absorber.

[0069] For example, the electromagnetic absorber portion is located between the DUT side surface of the widened portion of the pusher and the hollow portion between the pusher and the outer portion of the electromagnetic absorber surrounding the pusher (with a gap between the pusher and the electromagnetic absorber).

[0070] For example, compared to the portion of the pusher adjacent to the receiving section, the widened portion covered by the electromagnetic absorber portion has a larger cross-sectional area in a plane perpendicular to the axis of the pusher.

[0071] For example, the electromagnetic absorber portion extends longitudinally from the receiving section side surface of the widened portion of the pusher to the electromagnetic absorber, while in the transverse or radial direction, depending on whether the bottom of the pusher is polygonal or circular, it extends from the pusher to the outer portion of the electromagnetic absorber surrounding the pusher (with a gap between the pusher and the electromagnetic absorber).

[0072] If the pusher includes a widening portion, and the electromagnetic absorber portion covering the widening portion extends from the pusher to the electromagnetic absorber surrounding the pusher, this eliminates or at least reduces radiation that takes a different path from the propagation path between the measurement antenna structure and the receiving section, further reducing electromagnetic pollution in the surrounding environment, for example to improve near-field measurement performance and inter-site isolation in multi-site testing, without obstructing or blocking the propagation path.

[0073] One embodiment creates a test cell including multiple test arrangements as disclosed herein, wherein, for example, an electromagnetic absorber is configured to at least partially absorb radiation propagating from one test site to another.

[0074] One embodiment creates an automated test apparatus that includes a test unit as disclosed herein or a test setup as disclosed herein.

[0075] Further embodiments that can be used separately from the embodiments discussed above will be described below. However, any features, functions, and details described below may be optionally incorporated into any other embodiments disclosed herein, such as those described above. Furthermore, any features, functions, and details described above may be optionally incorporated into any of the embodiments described below.

[0076] One embodiment creates a test setup (e.g., for OTA testing, e.g. for near-field air testing) that includes a DUT socket placed on a load plate (e.g., a test fixture) having a receiving (or receiving) section configured to receive a DUT (e.g., a non-planar DUT), and the test setup includes a measurement antenna structure arranged such that the propagation path between the receiving section and the measurement antenna structure is tilted no more than 45 degrees relative to the plane of the load plate (e.g., the load plate to which the DUT socket is attached).

[0077] For example, in a preferred embodiment, the measurement antenna structure is arranged such that the propagation path between the receiving section and the measurement antenna structure is tilted by no more than 10 degrees relative to the plane of the load plate.

[0078] For example, in a preferred embodiment, the measurement antenna structure is arranged such that the propagation path between the receiving section and the measurement antenna structure is at least substantially parallel to the plane of the load plate.

[0079] For example, the propagation path between the receiving section and the measurement antenna structure is at least partially surrounded by an electromagnetic absorber.

[0080] For example, a (dedicated) electromagnetic absorber may be used to specifically (e.g., only or only) surround the propagation path or a portion of the propagation path, but not around the entire test setup and not around the DUT and not around the DUT socket.

[0081] For example, at least a portion of the propagation path between the measuring antenna structure and the receiving section is surrounded in such a way that a propagation tunnel surrounded by an electromagnetic absorber is provided between the receiving section and the measuring antenna structure.

[0082] For example, electromagnetic absorbers can be manufactured using molding techniques and / or 3D printing techniques.

[0083] For example, an electromagnetic absorber may include multiple individual absorber segments assembled together.

[0084] In other words, the test setup includes the DUT socket and the measurement antenna structure. The propagation path between the DUT socket and the measurement antenna structure is surrounded by an electromagnetic absorber to absorb the radiation or electromagnetic waves or their reflections used in OTA testing, which would otherwise pollute the surrounding environment or affect the OTA test itself, thus improving near-field measurement performance and inter-site isolation in multi-site testing.

[0085] In a preferred embodiment, the propagation path (e.g., a straight propagation path) between the receiving segment and the measurement antenna structure is completely surrounded by an electromagnetic absorber in the lateral direction (e.g., in the radial direction; e.g., in a plane perpendicular to the propagation path) for at least a portion of the longitudinal extension of the propagation path (e.g., surrounded in all directions; e.g., surrounded at 360 degrees; e.g., surrounded in a circumferential manner).

[0086] For example, the propagation path is not surrounded by an electromagnetic absorber along its entire longitudinal extension.

[0087] For example, an electromagnetic absorber surrounds a portion of the adjacent measurement antenna structure along the propagation path.

[0088] For example, the electromagnetic absorber does not surround a portion of the adjacent receiving section of the propagation path.

[0089] For example, the longitudinal extension of the electromagnetic absorber is shorter than the longitudinal extension of the propagation path.

[0090] For example, the longitudinal extension of the electromagnetic absorber is shorter than 70% of the longitudinal extension of the propagation path, or for example, the longitudinal extension of the electromagnetic absorber is shorter than 50% of the longitudinal extension of the propagation path.

[0091] For example, the longitudinal extension of the propagation path can be an extension along the propagation path, and / or where, for example, the longitudinal extension of the propagation path can be an extension from the DUT location to the measurement antenna structure (e.g., to the aperture of the measurement antenna structure).

[0092] In other words, the propagation path between the receiving section and the measurement antenna structure is surrounded by an electromagnetic absorber in each lateral direction to protect the surrounding environment of the OTA test area in each direction. Furthermore, the length of the propagation path can be longer than the length of the tubular electromagnetic absorber to create a protective gap, protecting the electromagnetic absorber from damage and thus extending its lifespan.

[0093] In a preferred embodiment, the load plate includes an opening (e.g., a hole; e.g., an opening completely surrounded by load plate material; e.g., an opening only partially surrounded by load plate material, e.g., a recess adjacent to the edge of the load plate). The receiving section and the measurement antenna structure are partially arranged in the opening, and thus, for example, partially arranged in the plane of the load plate (e.g., such that the propagation path between the receiving section and the measurement antenna structure is partially in the plane of the load plate).

[0094] In a preferred embodiment, the load plate includes an opening (e.g., a hole; e.g., an opening completely surrounded by the load plate material; e.g., an opening only partially surrounded by the load plate material, e.g., a recess adjacent to the edge of the load plate). The electromagnetic absorber is at least partially disposed in the opening.

[0095] In a preferred embodiment, the electromagnetic absorber is arranged such that, at least on a portion of the propagation path between the measuring antenna structure and the receiving section, a propagation tunnel surrounded by the electromagnetic absorber is formed between the receiving section and the measuring antenna structure.

[0096] For example, the axis of the propagation tunnel is tilted no more than 10 degrees relative to the plane of the load plate.

[0097] For example, the interior of the propagation tunnel surrounded by the electromagnetic absorber is located in the plane of the load plate.

[0098] In a preferred embodiment, the DUT socket is configured to receive an L-shaped DUT.

[0099] In a preferred embodiment, one or more surfaces (e.g., inner surfaces) of the electromagnetic absorber facing the propagation path between the receiving section and the measurement antenna structure include structures (e.g., formed by multiple pyramidal structures (e.g., pyramids or truncated pyramids) or conical structures (e.g., cones or truncated cones) (e.g., including or made of electromagnetic absorbing material).

[0100] In a preferred embodiment, the height of the pyramidal or conical structure is between 0.1 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency to be tested in the air) (e.g., the lowest operating frequency of the DUT socket) and 0.4 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency to be tested in the air) (e.g., the lowest operating frequency of the DUT socket) (where the lowest operating frequency may be defined, for example, by a test antenna that is part of the DUT socket).

[0101] Alternatively, the height of the pyramid or cone structure is in the range of 0.2 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency to be tested in the air) (e.g., the lowest operating frequency of the DUT socket) and 0.3 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency to be tested in the air) (e.g., the lowest operating frequency of the DUT socket) (where the lowest operating frequency may be defined, for example, by the test antenna that is part of the DUT socket).

[0102] In a preferred embodiment, the base area of ​​the pyramidal or conical structure is in the range of 0.2 to 0.4 times the square of the wavelength at the lowest operating frequency (e.g., the lowest frequency to be tested in the air) (e.g., the lowest operating frequency of the DUT socket) (where the lowest operating frequency may be defined, for example, by a test antenna that is part of the DUT socket).

[0103] In a preferred embodiment, in the portion of the electromagnetic absorber surrounding the propagation path (e.g., in the direction perpendicular to the propagation path between the receiving section and the measurement antenna structure), the gap width (e.g., the gap width between opposing surfaces of the electromagnetic absorber; e.g., the distance between the peaks of opposing pyramidal or conical structures; e.g., the gap width for wave propagation from the receiving section to the measurement antenna structure or for wave propagation from the measurement antenna structure to the receiving section; e.g., the internal dimension between opposing structures of the electromagnetic absorber) is in the range of 0.2 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency for air testing, e.g., the lowest operating frequency of the DUT socket) and 0.4 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency for air testing, e.g., the lowest operating frequency of the DUT socket). For example, the lowest operating frequency may be defined, for example, by a test antenna that is part of the DUT socket.

[0104] Alternatively, for example, in the portion of the electromagnetic absorber surrounding the propagation path, the gap width (e.g., the gap width between opposing surfaces of the electromagnetic absorber; e.g., the distance between the peaks of opposing pyramidal or conical structures) is in the range of 0.3 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency to be tested in the air, such as the lowest operating frequency of the DUT socket) and 0.5 times the wavelength (e.g., free space wavelength) at the lowest operating frequency (e.g., the lowest frequency to be tested in the air, such as the lowest operating frequency of the DUT socket). For example, the lowest operating frequency may be defined, for example, by a test antenna that is part of the DUT socket.

[0105] In a preferred embodiment, the test arrangement includes an additional electromagnetic absorber portion having an opening. This additional electromagnetic absorber portion is arranged to at least partially cover the surface of the measurement antenna structure or the conductive structure carrying the measurement antenna structure.

[0106] For example, it can be used as an electromagnetic absorption interlayer between a volume surrounded by an electromagnetic absorber and a conductive structure including an antenna structure or carrying an antenna structure.

[0107] For example, the environment of the antenna structure is exempted in other electromagnetic absorber sections (e.g., in the form of an opening).

[0108] For example, the surface of the conductive structure faces the DUT location.

[0109] For example, additional electromagnetic absorber sections are arranged such that the opening is located on the electromagnetic propagation path between the measurement antenna structure and the receiving section.

[0110] For example, it allows the opening to permit electromagnetic propagation between the measurement antenna structure and the receiving section.

[0111] In a preferred embodiment, the test arrangement further includes a pusher configured to push the DUT toward a receiving section (e.g., toward an angled DUT position for receiving the DUT, e.g., toward a contact structure for contacting the DUT, e.g., toward a receiving section within the DUT socket) or to push the DUT into the receiving section (e.g., into an angled DUT position for receiving the DUT, e.g., into a contact structure for contacting the DUT, e.g., into an angled receiving section within the DUT socket, e.g., by using a pushing surface of the pusher).

[0112] The pusher is at least partially surrounded by a second electromagnetic absorber (e.g., an RF absorber) in a region of its side surface, for example.

[0113] Any features, functions, and details disclosed herein with respect to the actuator and the electromagnetic absorber surrounding the actuator may also be optionally applied.

[0114] In a preferred embodiment, the receiving segment is an angled DUT location for receiving an angled DUT (e.g., for receiving a non-planar DUT; e.g., for receiving an L-shaped DUT).

[0115] The measurement antenna structure arranged in such a way as to be the first measurement antenna structure is such that the propagation path between the DUT location (e.g., the first part of the angled DUT location) and the measurement antenna structure is tilted no more than 45 degrees relative to the plane of the load plate (e.g., the load plate to which the DUT socket is attached).

[0116] For example, in addition to the first measurement antenna structure mentioned above, the test setup also includes a second measurement antenna structure.

[0117] The first measurement antenna structure is arranged in such a way that a first linear propagation path exists between the first measurement antenna structure and a first portion of the angled DUT location, or equivalently, when the angled DUT is inserted into the DUT socket, a first linear propagation path exists between the first test antenna structure and a first surface of the angled DUT.

[0118] The second measurement antenna structure is arranged in such a way that there is a second linear propagation path between the second measurement antenna structure and the second part of the angled DUT location, or equivalently, when the angled DUT is inserted into the DUT socket, there is a second linear propagation path between the second measurement antenna structure and the second surface of the angled DUT.

[0119] The propagation path between the second portion of the receiving section (e.g., the second portion at the angled DUT location) and the second measurement antenna structure extends through the pusher and is at least partially surrounded by the second electromagnetic absorber.

[0120] For example, the second measurement antenna structure is arranged such that the propagation path between the second part of the receiving section (e.g., the second part of the angled DUT location) and the second measurement antenna structure is approximately perpendicular to the propagation path between the first part of the receiving section (e.g., the first part of the DUT location) and the first measurement antenna structure, with a tolerance of + / -20 degrees.

[0121] If the propagation path between the first portion of the DUT location and the first measurement antenna structure and the propagation path between the second portion of the DUT location and the second measurement antenna structure do not intersect, then the condition of at least approximately orthogonality can be applied to the projection onto a plane perpendicular to the plane of the load plate and including the propagation path between the first portion of the receiving section and the first measurement antenna.

[0122] One embodiment creates a test cell comprising multiple test arrangements as discussed herein, wherein, for example, one or more electromagnetic absorbers are configured to at least partially absorb radiation propagating from one test site to another.

[0123] In a preferred embodiment, the automated testing equipment includes a testing unit or testing arrangement, which includes, for example, multiple testing arrangements arranged at different testing sites.

[0124] For example, an electromagnetic absorber is configured to at least partially absorb radiation propagating from one test site to another.

[0125] In a preferred embodiment, the automated testing equipment includes multiple test units having multiple of the aforementioned test arrangements. For example, within a test unit, the test arrangements are arranged close to each other to simultaneously test similar or identical DUTs, such that, for example, one or more electromagnetic absorbers are configured to at least partially absorb radiation propagating from one test arrangement to another. For example, the test units of the automated testing equipment are arranged at different test stations within one or more production lines, such that, for example, one or more electromagnetic absorbers are configured to at least partially absorb radiation propagating from one test arrangement to another or from one test station to another.

[0126] OTA sockets are platform-independent, meaning they can be replicated or used on any platform. It has been demonstrated that the aforementioned electromagnetic absorbers significantly improve the performance of OTA tests using near-field sockets. Attached Figure Description

[0127] Embodiments of this application will subsequently be described with reference to the accompanying drawings, in which: Figure 1 A schematic diagram of a DUT socket structure having a pusher surrounded by an electromagnetic absorber is shown according to an embodiment; Figure 2 A schematic diagram of a test arrangement having a pusher surrounded by an electromagnetic absorber according to an embodiment is shown; Figure 3 A schematic diagram of an arrangement including two test arrangements according to an embodiment is shown, both test arrangements having an electromagnetic absorber; Figure 4 A schematic diagram of a test arrangement without a pusher but having an electromagnetic absorber according to an embodiment is shown; Figures 5A to 5C A picture of a traditional test setup is shown; Figures 6A to 6D Simulated perspective and cross-sectional views of socket structures with and without an electromagnetic absorber surrounding the pusher are shown; Figures 7A to 7D Simulations of test arrangements with and without electromagnetic absorbers surrounding the actuator and cross-sectional views of their simulated magnetic fields are shown. Figure 8An electromagnetic absorber is shown in the DUT socket structure or test arrangement of the present invention according to an embodiment; Figure 9 A picture shows a test arrangement of an arm attached to a positioning structure according to an embodiment; Figure 10 An image absorber is shown in an embodiment in which the receiving section is surrounded by an electromagnetic absorber; Figures 11A to 11D A comparison of test setups with and without electromagnetic absorbers is shown; Figures 12A to 12D A comparison of test arrangements including the following different socket structures is shown: far-field sockets and near-field sockets with or without electromagnetic absorbers; Figure 13 A cross-sectional view of the test setup of an embodiment is shown; Figures 14A to 14B A perspective view of a simulated conventional test cell with multiple DUT socket structures or test arrangements without electromagnetic absorbers is shown. Figures 15A to 15B A perspective view of a simplified model of a DUT socket structure with or without an electromagnetic absorber is shown for the simulation measurements in Figures 16 and 17. Figures 16A to 16I The simulation measurement setup and simulation test results associated with a standard test setup are shown. Figures 17A to 17I The simulation measurement setup and simulation test results related to the test arrangement of the present invention are shown; Figures 18A to 18F The results of the simulation tests shown in Figures 16 and 17 are a summary or comparison of the simulation test setups. Figures 19A to 19D A test cell with a conventional test setup without an electromagnetic absorber is shown; Figures 20A to 20F A comparison of site isolation or absorption rates between a conventional test setup and the test setup of the present invention is shown; Figures 21A to 21D As shown Figure 3 The results shown include simulations of the test setup with an L-shaped receiving section, including the first and second test setups, as well as simulations of the magnetic field and comparative measurements. Detailed Implementation

[0128] Different embodiments and aspects of the present invention will now be described. Furthermore, additional embodiments will be defined by the appended claims.

[0129] It should be noted that any embodiment defined by the claims may be optionally supplemented by any details, features, and functions described herein. Furthermore, the embodiments described herein may be used alone and may also be optionally supplemented by any details, features, and functions included in the claims.

[0130] Furthermore, it should be noted that the individual aspects described herein can be used individually or in combination. Therefore, details can be added to each of the individual aspects without requiring details to be added to the other aspect. It should also be noted that this disclosure expressly or implicitly describes features that can be used in DUT socket structures, test arrangements, or automated test equipment (ATE). Therefore, any feature described herein can be used in the context of the absorber of a DUT socket structure, the absorber of a test arrangement, or the absorber of an automated test equipment.

[0131] The invention will be more fully understood from the detailed description given below and from the accompanying drawings of embodiments thereof; however, these detailed descriptions and drawings should not be construed as limiting the invention to the specific embodiments described, but are for explanation and understanding only.

[0132] Electromagnetic absorbers or radio frequency (RF) absorber components are designed as part of an overall near-field socket design using three-dimensional (3D) electromagnetic (EM) simulation.

[0133] according to Figure 1 Implementation examples Figure 1 A schematic diagram of a DUT socket structure 100 is shown. The DUT socket structure 100 includes a pusher 110, which is at least partially surrounded by an electromagnetic absorber 140. The DUT socket structure 100 also includes a DUT socket 120, which includes a receiving section 130.

[0134] The pusher 110 is configured to push the DUT 150 into or towards the receiving section 130 of the DUT socket 120. For example, the pusher 110 is configured to push the DUT 150 along a pushing direction 175 or along the axis of the pusher 110. For example, the pusher 110 is configured to push the DUT 150 into or towards the receiving section 130 of the DUT socket 120 using its pushing surface 170.

[0135] The pusher 110 of the DUT socket structure 100 is at least partially surrounded by an electromagnetic absorber 140 or a radio frequency (RF) absorber 140 in a region of its side surface, for example.

[0136] When the DUT 150 is subjected to OTA testing or near-field OTA testing, the electromagnetic absorber 140 is configured to absorb or at least partially absorb radiation propagating in a direction not along the push direction 175 or not along the axis of the pusher, in order to improve the near-field measurement performance of the DUT socket structure 100 and the inter-site isolation in multi-site testing.

[0137] Optionally, the DUT socket structure 100 may also include an electromagnetic absorber 148, which is disposed on the surface of the pusher 110 opposite to the push surface 170, for example between the pusher 110 and the positioning structure, or between the pusher 110 and the fixing structure, or between the pusher 110 and the waveguide structure.

[0138] For example, the receiving section 130 of the DUT socket 120 may also include a contact structure 160 or an electronic contact structure 160 for contacting or establishing a connection or electronic connection with the DUT 150 when the DUT 150 is pushed into the receiving section 130.

[0139] For example, the DUT socket 120 includes one or more sidewalls 180, i.e., multiple sidewalls when the opening of the receiving section is generally polygonal (e.g., rectangular or generally square), or a single generally circular or elliptical sidewall when the opening of the receiving section is generally circular or elliptical. For example, the sidewall 180 may be positioned in the lower fixing portion of the DUT socket to remain attached to the load plate.

[0140] For example, in a first arrangement 123 of the DUT socket 120, one or more sidewalls 180 facing the receiving section 130 are at least partially covered by an electromagnetic absorber 145. The electromagnetic absorber 145 covering the sidewalls 180 surrounds the receiving section 130 to absorb lateral radiation from the DUT 150 when the DUT 150 is placed in the receiving section 130, reducing electromagnetic contamination in the plane of the receiving section 130 or the environment, and further improving near-field measurement performance and inter-site isolation in multi-site testing.

[0141] For example, in the second arrangement 126 of the DUT socket 120, the sidewall 180 is inclined toward the receiving section 130 to help the positioning structure (such as a pickup machine) to correctly position the DUT 150.

[0142] For example, the pusher 110 is longer than the tubular electromagnetic absorber 140, or the electromagnetic absorber 140 does not extend to the end of the entire length of the pusher 110, thereby creating a gap 190 or a protective gap 190 between the electromagnetic absorber 140 and the DUT socket 120 or the sidewall 180 of the DUT socket 120.

[0143] Similarly, additionally or alternatively, in the first arrangement 123 of the DUT socket 120, the sidewall 180 reaches a height higher than the height of the electromagnetic absorber 145, thereby creating a gap 190 or protective gap 190 between the height of the sidewall 180 and the height of the electromagnetic absorber 145.

[0144] The protective gap 190 protects the electromagnetic absorbers 140 and 145 from damage, thereby improving their service life.

[0145] In other words, when the DUT 150 is subjected to OTA testing or near-field OTA testing, the electromagnetic absorber 140 reduces electromagnetic contamination by eliminating or at least partially absorbing radiation propagating in directions other than the push direction 175 or the axis of the pusher 110, thereby improving near-field measurement performance and inter-site isolation in multi-site testing. The electromagnetic absorber 140 is protected from mechanical stress by a protective gap 190.

[0146] Alternatively, the DUT socket structure 100 may be supplemented by any features, functions and details disclosed herein, whether individually or in combination.

[0147] according to Figure 2 Implementation examples Figure 2 A schematic diagram of a test setup 200 is shown, which includes a DUT socket structure 260 and a measurement antenna structure 270. The DUT socket structure 260 is similar to... Figure 1 The DUT socket structure 100 includes a pusher 210 (which is at least partially surrounded by an electromagnetic absorber 240) and a DUT socket 220 (which includes a receiving section 230 configured to receive a DUT 250).

[0148] The pusher 210 is now positioned between the measurement antenna structure 270 and the receiving section 230 such that if the DUT 250 is pushed into the receiving section 230, a propagation path 280 can be established between the measurement antenna structure 270 and the receiving section 230 or the test antenna of the DUT 250 via the pusher 210.

[0149] Electromagnetic absorber 240 (but optionally) Figure 1 The surface of the electromagnetic absorber 140 facing the actuator includes multiple pyramidal structures 246 or conical structures 243. The conical or pyramidal shape increases absorption by diffusely reflecting radiation and lengthening the radiation path. The height of the pyramid / truncated pyramid or conical / truncated cone is, for example, between 0.1 and 0.4 times the wavelength at the lowest operating frequency, or between 0.2 and 0.3 times the wavelength at the lowest operating frequency. The base area of ​​the pyramid / truncated pyramid or conical / truncated cone is between 0.2 and 0.4 times the square of the wavelength at the lowest operating frequency.

[0150] Optionally, the pusher 210 may include a widening 215 adjacent to the longitudinal portion of the measuring antenna structure 270. The surface of the widening 215, which is generally perpendicular to the propagation path, may be covered by the electromagnetic absorber portion 293. For example, the electromagnetic absorber portion 293 may extend radially from the surface of the pusher 210 to the outer surface of the electromagnetic absorber 240.

[0151] For example, the test setup may include an additional electromagnetic absorber portion 296 having an opening 299. The additional electromagnetic absorber portion 296 is disposed between a portion of the surface of the conductive structure 275, which includes or carries the measurement antenna structure 270, and the pusher 210, such that the opening 299 is located on the electromagnetic propagation path 280 between the measurement antenna structure 270 and the receiving section 230. The additional electromagnetic absorber portion is arranged to at least partially cover the surface of the conductive structure 275 facing the receiving section 230.

[0152] An additional electromagnetic absorber portion 296 with an opening 299, disposed between the conductive structure 275 and the pusher 210, eliminates or at least reduces the reflection of radiation on the surface of the conductive structure 275, which includes or carries the antenna structure 270, without hindering OTA test measurements by absorbing the measurement signals transmitted along the propagation path 280 between the measurement antenna structure 270 and the test antenna of the receiving section 230 or DUT 250 through the opening 299 of the additional electromagnetic absorber portion 296 and the pusher 210.

[0153] When performing OTA or near-field OTA testing on the DUT 250, the electromagnetic absorber 240, with its surface having a pyramidal structure 246 and / or a conical structure 243, reduces electromagnetic contamination by eliminating or at least partially absorbing radiation propagating in a direction different from or not along the propagation path 280, thereby improving near-field measurement performance and inter-site isolation in multi-site testing. For example, near-field measurement performance and inter-site isolation in multi-site testing are further improved by means of additional electromagnetic absorber portions 293, 296, while near-field OTA testing remains unaffected.

[0154] The DUT socket structure 200 may optionally be supplemented by any features, functions and details disclosed herein, whether individually or in combination.

[0155] according to Figure 3 Implementation examples Figure 3 A schematic diagram of test setup 300 is shown, which includes test setup 360 and test setup 390.

[0156] Test setup 360 is similar Figure 2The test setup 200 includes a measurement antenna structure 370 and a DUT with a socket structure similar to... Figure 1 The DUT socket structure 100 includes a pusher 310 (which is at least partially surrounded by an electromagnetic absorber 340) and a DUT socket 320 (which includes a receiving section 330).

[0157] The test setup 390 includes a measurement antenna structure 375, an electromagnetic absorber 345, and a DUT socket 320 with a receiving section 330.

[0158] Unlike the previous embodiments, the DUT 350 in this embodiment is a non-planar DUT, having a curved shape or an angled shape. For example, Figure 3 The image shows an L-shaped DUT 350.

[0159] Therefore, the DUT socket 320 is also non-planar, having a curved or angled shape, such as an L-shape. For example, the load plate 325 or test fixture 325 holding the DUT socket 320 includes a hole in which a non-planar receiving section 330 of the non-planar DUT socket 320 is configured to receive a non-planar DUT 350.

[0160] The non-planar DUT 350 may include more than one test antenna or test antenna structure, which can be tested by different test arrangements (e.g., test arrangement 360 and test arrangement 390) by transmitting or receiving test signals along propagation path 380 or 385 between the measurement antenna structures 370 and / or 375 of test arrangements 360 and / or 390 and the receiving section 330 or more than one test antenna of the DUT 350. Tests can be performed one after another or simultaneously.

[0161] When the DUT 350 is pushed into the receiving section 330 by the pusher 310 of the test setup 360, no pusher is required in the test setup 390. The propagation path 385 between the test antennas of the receiving section 330 or the DUT 350 is surrounded by an electromagnetic absorber 345 or a tubular electromagnetic absorber 345 to absorb radiation, electromagnetic waves, test signals, or their reflections used in OTA testing or near-field OTA testing, which would otherwise contaminate the surrounding environment or affect any OTA testing performed in the test setups 360 or 390. Therefore, near-field measurement performance and inter-site isolation in multi-site testing are improved.

[0162] use Figure 3In one embodiment, more than one test antenna of a non-planar DUT 350 (such as an L-shaped DUT) can be tested simultaneously or one after another, such that the electromagnetic absorbing materials 340 and 345 surrounding the propagation paths 280 and 285 absorb all or part of the radiation propagating in a direction different from or not along the propagation paths 280 and 285.

[0163] exist Figure 4 The test setup 390 is further described in the text.

[0164] according to Figure 4 Implementation examples Figure 4 A schematic diagram of a test setup 400 is shown. The test setup 400 includes a load plate 425 having apertures to hold a non-planar receiving section 430 of a DUT socket 420. The test setup also includes a measurement antenna structure 470 and a propagation path 480 between the receiving section 430 and a test antenna on the DUT 450. The propagation path 480 may be generally parallel to the load plate 425, or tilted at least no more than 45 degrees or at least no more than 10 degrees relative to the plane of the load plate 425.

[0165] The propagation path 480 is surrounded by an electromagnetic absorber 440 or a tubular electromagnetic absorber 440. The test setup 400 can be used for... Figure 3 It can be used in the test setup 390, but can also be used as a stand-alone test setup, for example when the position of the DUT 450 is fixed within the non-planar receiving section 430 of the non-planar DUT socket 420.

[0166] For example, the surface or inner surface of the tubular electromagnetic absorber 440 facing the propagation path 480 may include a pyramidal or conical structure as described above.

[0167] For example, the electromagnetic absorber 440 forms an electromagnetic absorber tube 440 or an electromagnetic absorber tunnel 440. For example, the propagation path 480 and / or the tubular electromagnetic absorber 440 are partially located in the plane of the load plate 425. That is, the propagation path 480 between the receiving section 430 and the measurement antenna structure 470 is surrounded by the electromagnetic absorber 440 in each lateral direction to protect the surrounding environment of the OTA test area in each direction.

[0168] For example, the longitudinal extension of the electromagnetic absorber tube 440 is shorter than the longitudinal extension of the propagation path 480, for example, shorter than 70% or 50% of the longitudinal extension of the propagation path 480.

[0169] For example, in the portion of the electromagnetic absorber 440 surrounding the propagation path 480, the gap width is in the range of 0.2-0.4 times or 0.3-0.5 times the wavelength at the lowest frequency (the lowest frequency to be tested over-the-air) or the free-space wavelength. The lowest operating frequency can be defined, for example, by the test antenna of the DUT 450. For example, the gap width is the internal dimension between the relative structures of the electromagnetic absorber 440.

[0170] For example, test setup 400 includes an additional electromagnetic absorber portion 490 having an opening 495. The additional electromagnetic absorber portion 490 is arranged such that the opening 495 is located on the electromagnetic propagation path 480 between the measurement antenna structure 470 and the receiving section 430, to at least partially cover the surface of the conductive structure 475 that includes or carries the measurement antenna structure 470. The surface of the conductive structure 475 faces the receiving section 430.

[0171] According to the standard test setup in Figure 5 Figures 5A to 5C A picture of a standard test setup 500 is shown.

[0172] Figure 5A An image is shown showing some portions of a conventional test setup 500. The conventional test setup 500 includes a lower section and an upper section. The lower section is attached to a load board 525 and includes blind-mating interconnects 530 for waveguides and a DUT socket 520 with an encapsulated antenna DUT (DUT-AiP) 550.

[0173] The upper part is disassembled, that is, the pusher 510 is separated from the conductive structure 575, which includes or carries the measurement antenna structure 570.

[0174] Figure 5B The image shows the upper part of the conventional test setup 500 being assembled (i.e., the pusher 510 is attached to the conductive structure 575).

[0175] Figure 5C The image shows the upper part of the conventional test setup 500 being attached or fixed to the lower part of the conventional test setup 500.

[0176] According to the 3D simulation in Figure 6 Figures 6A to 6D Perspective views and cross-sectional views of different versions of DUT socket structures, with and without an electromagnetic absorber surrounding the pusher, are shown.

[0177] Figure 6A A perspective view of a DUT socket structure used to simulate a conventional DUT socket structure 610 is shown, which is similar to the conventional DUT socket structure 500 shown in the picture of Figure 5.

[0178] Figure 6B A cross-sectional view of a conventional DUT socket structure 610 is shown. Arrow 630 indicates multipath reflections from the socket components, which negatively impact measurement accuracy.

[0179] Figure 6C A perspective view of a DUT socket structure 620 for simulating the near-field OTA DUT socket structure 620 of the present invention is shown, which is similar to Figure 1 The socket structure 100 of the present invention includes an electromagnetic absorber 650 or an RF absorber 650 added to the near-field OTA DUT socket structure, surrounding or enclosing the pusher. In some embodiments, optionally, an electromagnetic absorber may also be added to the sidewall of the DUT socket.

[0180] Figure 6D A cross-sectional view of the DUT socket structure 620 of the present invention is shown. The cross-sectional view also shows the inner surface of the electromagnetic absorber, which includes a plurality of pyramidal or conical structures 640. The pyramidal or conical structures or pyramidal designs are intended to further disperse radiation or its reflection within or within the electromagnetic absorber.

[0181] According to the simulation in Figure 7 Figures 7A to 7D A cross-sectional view of the simulation structure and its simulated magnetic field is shown for a test arrangement that simulates an electromagnetic absorber with and without an enclosing actuator.

[0182] Figure 7A A cross-sectional view of a conventional test setup 710 without an electromagnetic absorber is shown. The conventional test setup 710 is similar to the conventional test setup 500 shown in the picture of Figure 5.

[0183] Figure 7B A cross-sectional view of the simulated electromagnetic field of a conventional test setup 710 without an electromagnetic absorber is shown.

[0184] Figure 7C A cross-sectional view of the test setup 720 of the present invention, which has an electromagnetic absorber 730, is shown.

[0185] Figure 7D A cross-sectional view of the simulated electromagnetic field of the test setup 720 of the present invention, which has an electromagnetic absorber 730, is shown.

[0186] When comparing cross-sectional views of simulated electromagnetic fields in test setups with and without the electromagnetic absorber 730, it becomes clear that the electromagnetic absorber 730 surrounds electromagnetic radiation and eliminates or substantially reduces electromagnetic pollution.

[0187] according to Figure 8 Electromagnetic absorber Figure 8An image of an electromagnetic absorber 810 is shown. The electromagnetic absorber 810 can be used for... Figure 1 In the DUT socket structure 100 of the present invention, or Figures 2 to 4 In any test setup of the present invention. The electromagnetic absorber can be produced, for example, by 3D printing or molding technology, as a single unit 810 or as a component 820 that can be assembled into a single electromagnetic absorber 810. In the example shown in the figures, the absorber module is 3D printed into four parts using a special RF absorbing material, and then they are glued together. 3D printing or 3D printing technology allows for an easy way to create a pyramid shape 830 or a cone shape 830, which is not easily done or produced by using individual sheets of RF absorbing material or by gluing individual sheets of RF absorbing material together.

[0188] according to Figure 9 positioning structure Figure 9 Images of a DUT socket structure or test setup 920 according to an embodiment are shown, including a positioning structure 910 attached to an arm 910 of a sorting machine. The sorting machine arm is configured to lift a pusher surrounded by an electromagnetic absorber 930, while another arm or another positioning structure resets the DUT within a receiving section, which is not visible in the images. A rod 940, for example, is generally parallel to the pusher or the axis of the pusher to support proper positioning.

[0189] according to Figure 10 Implementation examples Figure 10 The image shows an embodiment where the receiving section 1030 of the DUT socket 1020 is surrounded by an electromagnetic absorber 1045, similar to... Figure 1 The first arrangement 123 of the DUT socket 120. Also visible in the image is the pusher 1010 of the test arrangement or DUT socket structure, which is surrounded by an electromagnetic absorber 1040.

[0190] According to the comparison in Figure 11 Figures 11A to 11D A comparison of test setups with and without electromagnetic absorbers is shown.

[0191] Figure 11A A picture shows a conventional test setup without an electromagnetic absorber for comparison.

[0192] Figure 11B A picture shows a test setup of the present invention with an electromagnetic absorber for comparison.

[0193] Figure 11C This demonstrates how, in constructive beamforming mode, such as Figure 11AThe image shows a graph of the measured transmit power versus frequency for each individual antenna element of the DUT antenna array without electromagnetic absorbers.

[0194] Figure 11D This demonstrates how, in constructive beamforming mode, such as Figure 11B The image shows a graph of the measured transmit power versus frequency for each individual antenna element of the DUT antenna array with electromagnetic absorbers.

[0195] When comparing Figure 11C and Figure 11D The graphs of the test results clearly demonstrate that adding an RF absorber reduces the measured power difference between individual antenna elements in near-field measurements, providing better correlation with reference far-field measurements. Compared to conventional OTA socket structures or standard test setups without an RF absorber, adding an RF absorber improves near-field measurement results.

[0196] According to the comparison in Figure 12 Figures 12A to 12D A comparison of test arrangements including the following different socket or socket structures is shown: far-field sockets and near-field sockets with or without electromagnetic absorbers.

[0197] Figure 12A A test setup including a far-field socket structure is shown for comparison.

[0198] Figure 12B A test arrangement for comparison is shown, comprising a near-field socket structure having an electromagnetic absorber surrounding a pusher and a receiving section.

[0199] Figure 12C A test setup for comparison, including a near-field socket structure without any electromagnetic absorbers, is shown.

[0200] Figure 12D A graph showing the comparative results is presented. This graph indicates that the measured transmit power of the DUT with a near-field socket structure featuring an electromagnetic absorber exhibits more monotonic behavior compared to the case without an electromagnetic absorber. This improved monotonicity significantly contributes to the creation of calibration tables for association with far-field measurements.

[0201] according to Figure 13 Implementation examples Figure 13 An embodiment of test arrangement 1300 is shown, which is similar to Figure 2 Test setup.

[0202] The test setup 1300 includes a pusher 1310 with a widened portion 1320. The surface of the widened portion facing the receiving section is covered by an electromagnetic absorber portion 1330.

[0203] also, Figure 13 The dimensional values ​​associated with the electromagnetic absorber 1340 in the exemplary embodiment are also shown. Therefore, the tubular electromagnetic absorber 1340 is shorter than the length of the pusher, such that the distance between the tubular electromagnetic absorber 1340 and the DUT socket 1350 is, for example, 2 mm when the pusher pushes the DUT into or toward the DUT socket 1350. This gap helps to avoid mechanical wear on the absorber while still providing good electromagnetic properties.

[0204] also, Figure 13 The inner surface of the tubular electromagnetic absorber 1340 or the surface facing the pusher 1310 is shown to include a truncated pyramid 1360 with a height of 4 mm. The distance between the tip of the pyramid 1360 or the truncated tip and the pusher 1310 is 7.1 mm. Figure 13 The total width of the electromagnetic absorber 1340, which is the width of the tubular portion plus the height of the truncated pyramid, is also shown to be 7 mm.

[0205] The size of an electromagnetic absorber is primarily determined by mechanical requirements. These requirements relate, for example, to the size of the in-package antenna (AiP) module, the spacing between adjacent sites, and the mechanical requirements of the sorting machine or positioning structure. However, the dimensional designs disclosed herein have been found to also produce favorable electromagnetic properties.

[0206] A large distance between the absorber structure and the DUT is preferred, where the pyramid has a sufficient height to support the lowest frequency being tested. In some cases, trade-offs need to be made for permissible mechanical space within the smaller geometry of the ATE OTA socket. For example, the DUT in the example shown measures 17mm x 17mm. Three-dimensional (3D) electromagnetic (EM) simulations are also used.

[0207] The size values ​​follow the wavelength-related instructions mentioned above, for example, according to Figure 2 Examples of implementations.

[0208] The absorber should not affect the operation of the pusher by, for example, striking the socket and preventing the pusher from performing its function. In the example shown, a 2 mm gap is used to ensure this.

[0209] According to the simulation in Figure 14 Figures 14A to 14B A perspective view of a DUT socket structure is shown for a conventional test unit used to simulate multiple DUT socket structures or test arrangements without electromagnetic absorbers. This test unit is an example of a multi-site replacement kit without isolation or electromagnetic absorbers.

[0210] Figure 14AThe test unit is shown to include eight DUT socket structures 1430 or test arrangements 1430, which are positioned close to each other on a load plate 1420.

[0211] Figure 14B Eight DUT test arrangements 1430 are shown positioned at least close enough to avoid negatively impacting each other's test results. Lightning symbol 1410 indicates inter-site crosstalk between test arrangements, which negatively affects the results of tests or measurements performed simultaneously within test arrangements 1430 that are close to each other.

[0212] The DUT socket structure or test arrangement of the present invention eliminates or at least substantially reduces the inter-site crosstalk effect shown and improves near-field measurement performance.

[0213] According to the simulation in Figure 15 Figures 15A to 15B A perspective view of a simplified model of a DUT socket structure 1510, 1520 with or without an electromagnetic absorber 1530, used for the simulation comparisons in Figures 16 and 17, is shown.

[0214] Figure 15A A perspective view of a simplified model of a DUT socket structure 1510 without an electromagnetic absorber 1530 for simulation testing related to Figure 16 is shown.

[0215] Figure 15B A perspective view of a simplified model of a DUT socket structure 1520 with an electromagnetic absorber 1530 for simulation testing related to Figure 17 is shown.

[0216] According to the simulation measurement in Figure 16 Figures 16A to 16I The simulation measurement setup and results associated with a standard test setup are shown.

[0217] Figure 16A A perspective view of a simulation test unit 1650 on a load plate 1630 is shown, which has eight conventional test arrangements 1610 without any electromagnetic absorbers.

[0218] Figure 16B A perspective view of the simulated DUT 1620 used for simulated measurements in test arrangement 1610 is shown.

[0219] Figure 16CA perspective view of a simulated arrangement 1645 of two conventional test arrangements 1610 is shown, arranged in a manner similar to that of two adjacent conventional test arrangements 1610 within test unit 1650. The simulated arrangement 1645 also includes a boundary 1640. At the top boundary of the conductive structure simulating the measurement antenna structure 1660, the electric field E is defined as E=0. At the bottom boundary of the load plate 1630 of the simulated arrangement, the electric field E is defined as E=0.

[0220] Figure 16D It shows Figure 16C A perspective bottom view of the simulated arrangement 1645 is provided to show the DUT 1620 of the test arrangement 1610 and the measurement antenna structure 1660. The pusher is not shown in order to see the measurement antenna structure 1660.

[0221] Figure 16E It shows Figure 16C A perspective view of the simulated arrangement 1645 is shown, also illustrating the actuator. Here, only test arrangement 1670 is being measured, while test arrangement 1675 remains idle. Only a single antenna of DUT1620 in test arrangement 1670, near the center of arrangement 1645, is transmitting radiation.

[0222] In the measurement of absorptivity or isolation, only a single antenna element is used because the radiated beam is wider than that in beamforming mode. The power of the measurement antenna structure at adjacent idle sites or idle test setups 1675 is then measured.

[0223] Figure 16F It shows in Figure 16E A cross-sectional view of the simulated electromagnetic field from the simulation test conducted in 1645. Figure 16F This indicates that the electromagnetic radiation from a single antenna of the DUT 1620 within test setup 1670 may affect potential tests or measurements performed within an idle test setup 1675 in the vicinity of test setup 1670.

[0224] Figures 16G to 16I The graph shown—with the horizontal axis representing frequency values ​​in GHz and the vertical axis representing radiated power values ​​in dB—has... Figures 16E to 16F The results of the simulation tests are shown. The transmit ports of the DUT are represented as 1 and 2 for each polarization, the receive ports of the measurement antenna structure of test setup 1670 are represented as 9 and 10, and the receive ports of the measurement antenna structure of idle test setup 1675 are represented as 11 and 12 for each polarization.

[0225] Figure 16GA graph showing simulation results is provided, in which the horizontal polarization of the DUT's port 1, or antenna denoted as 1, transmits radiation that is received at the measurement antennas denoted as 9 and 10 in test setup 1670 and at the measurement antennas denoted as 11 and 12 in idle test setup 1675.

[0226] Figure 16H A graph showing simulation results is provided, in which the DUT's port 2, or antenna denoted as 2, is vertically polarized in transmitting radiation, which is received at the measurement antennas denoted as 9 and 10 in test setup 1670 and at the measurement antennas denoted as 11 and 12 in idle test setup 1675.

[0227] Figure 16I A graph showing simulation results is provided, in which the measuring antennas, designated 9 and 10, of test setup 1670 are transmitting radiation, which is received by the measuring antennas, designated 11 and 12, of idle test setup 1675. In other words, Figure 16I The isolation between the measurement antennas of test setups 1670 and 1675 is shown (e.g., (11,9), (12,9), (11,10), (12,10)).

[0228] Reviewing the simulation test results, it is clear that tests or measurements performed within test setup 1670 affect measurements or tests performed within the adjacent idle test setup 1675.

[0229] According to the simulation measurement in Figure 17 Figure 17A A perspective view of a simulation test unit 1750 on a load plate 1730 is shown, which has eight test arrangements 1710 of the present invention with electromagnetic absorbers 1780.

[0230] Figure 17B A perspective view of a simulated DUT 1720 used for simulated measurements in test setup 1710 of the present invention is shown.

[0231] Figure 17C A perspective view of a simulated arrangement 1745 of two inventive test arrangements 1710 with electromagnetic absorbers 1780 is shown. These two inventive test arrangements are arranged in a manner similar to two adjacent conventional test arrangements 1710 within test unit 1750. The simulated arrangement 1745 also includes a boundary 1740. At the top boundary of the conductive structure simulating the measurement antenna structure 1760, the electric field E is defined as E=0. At the bottom boundary of the load plate 1730 of the simulated arrangement, the electric field E is also defined as E=0.

[0232] Figure 17D It shows Figure 17CA cross-sectional view of the simulated arrangement 1745 shows the measurement antenna structure 1760, electromagnetic absorber 1785, and pusher 1785 of the test arrangement 1710. It is also visible that the surface of the electromagnetic absorber 1780 includes numerous pyramidal structures 1783.

[0233] Figure 17E It shows Figure 17C A perspective view of the simulated arrangement 1745. Here, only test arrangement 1770 is measured, while test arrangement 1775 remains idle. Only a single antenna of DUT 1720 in test arrangement 1770, near the center of arrangement 1745, is emitting radiation.

[0234] In the measurement of absorptivity or isolation, only a single antenna element is used because the radiated beam is wider than that in beamforming mode. The power of the measurement antenna structure at adjacent idle sites or idle test setups 1775 is then measured.

[0235] Figure 17F It shows in Figure 17E A cross-sectional view of the simulated electromagnetic field from the simulation test conducted in 1745. Figure 17F This indicates that the electromagnetic absorber 1780 eliminates or substantially reduces the radiation received by the measurement antenna within the idle test setup 1775. In other words, the electromagnetic radiation from a single antenna of the DUT 1720 within the test setup 1770 does not affect, or minimally affects, any potential tests or measurements performed within the idle test setup 1775 in the vicinity of the test setup 1770.

[0236] Figures 17G to 17I The graph shown—with the horizontal axis representing frequency values ​​in GHz and the vertical axis representing radiated power values ​​in dB—has... Figures 17E to 17F The results of the simulation tests are shown. The transmit ports of the DUT are denoted as 1 and 2 for each polarization, the receive ports of the measurement antenna structure of test setup 1770 are denoted as 9 and 10, and the receive ports of the measurement antenna structure of idle test setup 1775 are denoted as 11 and 12 for each polarization.

[0237] Figure 17G A graph showing simulation results is provided, in which the horizontal polarization of the DUT's port 1, or antenna denoted as 1, transmits radiation that is received at the measurement antennas denoted as 9 and 10 in test setup 1770 and at the measurement antennas denoted as 11 and 12 in idle test setup 1775.

[0238] Figure 17HA graph showing simulation results is provided, in which the DUT's port 2, or antenna denoted as 2, is vertically polarized in transmitting radiation, which is received at the measurement antennas denoted as 9 and 10 in test setup 1770 and at the measurement antennas denoted as 11 and 12 in idle test setup 1775.

[0239] Figure 17I A graph showing simulation results is provided, in which the measuring antennas, denoted as 9 and 10, of test arrangement 1770 are transmitting radiation, which is received by the measuring antennas, denoted as 11 and 12, of idle test arrangement 1775.

[0240] Will Figures 17G to 17I The simulation test results and Figures 16G to 16I By comparing the results of the simulated tests, it is clear that... Figures 17G to 17I The results of the simulated measurement of the transmission power within the test setup 1770 showed relatively small fluctuations, indicating that the electromagnetic absorber 1780 did indeed improve the measurement performance.

[0241] Furthermore, the radiated power received by the measurement antennas arranged in adjacent idle test zones is in Figures 17G to 17I average ratio Figures 16G to 16I The lower values ​​indicate that the electromagnetic absorber 1780 does indeed improve inter-site isolation in a multi-site testing environment. These differences stem from... Figure 18F The diagram makes it even clearer.

[0242] Summary of simulation measurements based on Figure 18 Figures 18A to 18F The results of the simulation tests shown in Figures 16 and 17 are a summary or comparison of the simulation test setups.

[0243] Figure 18A A top view of the simulation setup 1810 is shown, including two adjacent DUT sockets 1820 and the DUTs. It is highlighted that the spacing between adjacent sites, or the distance between DUTs, or the distance between the midpoints of the DUTs used in adjacent simulation test setups, is 60 mm.

[0244] Figure 18B A cross-sectional view of the simulated arrangement 1810 is shown, which illustrates the measurement antenna structure 1830, electromagnetic absorber 1840, and pusher 1850 of the test arrangement 1810.

[0245] Figure 18C A cross-sectional view of the simulated arrangement 1810 is shown, illustrating the measurement antenna structure 1830, electromagnetic absorber 1840, and pusher 1850 of the test arrangement 1810, as shown. Figure 17D As shown, the surface of the electromagnetic absorber 1840 also exhibits numerous pyramidal structures.

[0246] Figure 18DA cross-sectional view of the simulated electromagnetic field during a simulation test conducted in simulation test setup 1810 is shown. Figure 18D This indicates that the electromagnetic radiation from a single antenna of the DUT within the first test setup of test setup 1810 may affect potential tests or measurements performed within an empty second test setup within test setup 1810, which is located in the vicinity of the first test setup.

[0247] Figure 18E A cross-sectional view of the simulated electromagnetic field during a simulation test conducted in simulation test setup 1810 is shown. Figure 18E This indicates that the electromagnetic absorber 1810 surrounding the actuator eliminates or substantially reduces the radiation received by the measurement antenna within the idle second test setup. In other words, the electromagnetic radiation from a single antenna of the DUT within the first test setup does not affect, or minimally affects, any potential tests or measurements performed within the idle second test setup in the vicinity of the first test setup.

[0248] Figure 18F The figure shown—with the horizontal axis representing frequency values ​​in GHz and the vertical axis representing radiated power values ​​in dB—summarizes the results of the simulation tests in Figures 16 and 17. The two antennas or ports of the DUT and the measurement antenna structure have different polarizations, therefore... Figures 16G to 16I and Figures 17G to 17I The graphs can be combined into a single graph, where the number of curves is reduced or the corresponding curves are averaged based on the polarization directions of the transmitting and receiving antennas. Thus, four different types with or without electromagnetic absorbers are shown: common polarization, cross polarization, adjacent common polarization, and adjacent cross polarization.

[0249] Compare Figure 18F The simulation test result curves clearly show that the simulation test results fluctuate less in the test arrangement where the pusher is surrounded by the electromagnetic absorber, indicating that the test arrangement with the electromagnetic absorber of the present invention has improved measurement performance.

[0250] Furthermore, if the test setup includes an electromagnetic absorber, the average radiated power received by the measurement antennas of adjacent idle test setups is lower than if the test setup does not include an electromagnetic absorber. This indicates that electromagnetic absorbers do indeed improve inter-site isolation in multi-site test environments.

[0251] According to the test setup in Figure 19 Figures 19A to 19D The test unit is shown in a conventional test setup without an electromagnetic absorber.

[0252] Figure 19A A top view photograph of a test unit 1950 on a load plate 1930 is shown, which has eight DUT sockets 1910.

[0253] Figure 19B A perspective photograph of a test unit 1950 with eight DUT sockets 1910 is shown, which are simulated in the aforementioned simulated tests or measurements related to conventional test arrangements and the test arrangements of the present invention, as shown in Figures 16, 17, and 18. The spacing, or multi-site spacing, i.e., the distance between adjacent DUT sockets, is 60 mm in the X direction and 63.5 mm in the Y direction.

[0254] Figure 19C A photograph is shown of a test unit 1950 in a standard test setup and its corresponding upper attachment to a positioning structure 1960. The test unit 1950 has eight DUT sockets 1910.

[0255] Figure 19D A close-up photograph shows the two conventional socket structures of the 1970 in the closed position of the test unit 1950.

[0256] According to the comparison in Figure 20 Figures 20A to 20F A comparison of site isolation or absorption rates between a conventional test setup and the test setup of the present invention is shown.

[0257] Figure 20A , Figure 20B Photographs of two conventional test setups 2010 without electromagnetic absorbers are shown. These two conventional test setups are arranged in a manner similar to the two adjacent conventional test setups 2010 within test cell 1950 of Figure 19. In the comparative test, one of the conventional test setups is active, while the other remains idle.

[0258] Figure 20C Photographs are shown of a conventional test setup 2010 for the absorber and an electromagnetic absorber 2020, which is designed to surround the pusher 2030 of the conventional test setup, thereby forming the test setup 2040 of the present invention. In the comparative test, one of the test setups of the present invention is in an active state, while the other remains idle.

[0259] Figure 20D , Figure 20E Photographs of two test arrangements 2040 of the present invention with an electromagnetic absorber 2020 surrounding a pusher 2030 are shown. These two test arrangements are arranged in a manner similar to the two adjacent test arrangements within the test unit 1950 of FIG19.

[0260] Figure 20FThe figure shown—with frequency values ​​in GHz on the horizontal axis and radiated power values ​​in dB on the vertical axis—shows the results of a comparative test or measurement comparing radiated power measured in both active and idle conventional test setups as well as in both active and idle test setups of the present invention.

[0261] The figure shows curves representing the measured radiated power transmitted and received by antennas with the same polarization (i.e., common polarization radiation) in both the conventional test setup and the test setup of the present invention.

[0262] The figure also shows curves representing measurements of radiated power transmitted by an antenna in an active test setup and received or measured by an antenna in an adjacent idle test setup. The transmitting and receiving antennas have the same polarization. The curves shown represent measurements from a conventional test setup and measurements from the test setup of this invention.

[0263] The comparisons performed show results similar to those of the simulation comparisons shown in Figures 16 to 18.

[0264] Comparing the test results of the conventional test setup and the test setup of this invention, i.e. Figure 20F The curves clearly show that the curves associated with the test setup where the pusher is surrounded by an electromagnetic absorber exhibit less fluctuation, indicating that the test setup of the present invention with an electromagnetic absorber has improved measurement performance.

[0265] Furthermore, if the test setup includes an electromagnetic absorber, the average radiated power received by the measurement antennas of adjacent idle test setups is lower than when the test setup does not include an electromagnetic absorber. This indicates that the electromagnetic absorber does indeed improve inter-site isolation in a multi-site test environment. This is a significant improvement in isolation and also an improvement in common polarization performance.

[0266] Simulation of the embodiment according to Figure 21 Figures 21A to 21D As shown Figure 3 The results shown include simulations of the test setup with an L-shaped receiving section, including the first and second test setups, as well as simulations of the magnetic field and comparative measurements.

[0267] Figure 21A A perspective view of the test arrangement 2100 of the present invention is shown. The test arrangement 2100 has an electromagnetic absorber 2120 surrounding a pusher 2110 associated with a first measurement arrangement, and a tubular electromagnetic absorber 2130 surrounding a propagation path 2140 associated with a second test arrangement.

[0268] Figure 21BA perspective view of the test arrangement 2100 of the present invention is shown. The test arrangement 2100 has an electromagnetic absorber 2120 surrounding a pusher 2110 associated with a first measurement arrangement, and a tubular electromagnetic absorber 2130 surrounding a propagation path 2140 associated with a second test arrangement.

[0269] Figure 21C A cross-sectional view of the simulated electromagnetic field of a conventional test setup 2100 is shown during testing in a first test setup of the test setup 2100 of the present invention. The conventional test setup does not have the electromagnetic absorber 2120 surrounding the pusher 2110 associated with the first measurement setup of the test setup 2100 of the present invention, nor does it have the tubular electromagnetic absorber 2130 surrounding the propagation path 2140 associated with the second test setup.

[0270] Figure 21D A cross-sectional view of the simulated electromagnetic field of the test setup 2100 of the present invention is shown during testing in a first test setup of the test setup 2100 of the present invention. The test setup 2100 of the present invention has an electromagnetic absorber 2120 surrounding a pusher 2110 associated with the first measurement setup and a tubular electromagnetic absorber 2130 surrounding a propagation path 2140 associated with the second test setup.

[0271] When comparing cross-sectional views of simulated electromagnetic fields of test setups with and without electromagnetic absorbers 2120 and 2130, it becomes clear that electromagnetic absorbers 2120 and 2130 eliminate or substantially reduce electromagnetic pollution in the environment of the setup, improve near-field measurement performance and site-to-site isolation in multi-site testing.

[0272] Figure 21E A simulated non-planar or L-shaped DUT 2150 is shown for use in simulated comparative testing. The DUT includes multiple antennas 2160, with antennas on edge 2153 being tested. When the antennas are pushed into a test arrangement with an L-shaped receiving section by a pusher 2110, the antennas face the pusher 2110, allowing the antennas to be tested by a first test arrangement.

[0273] Figure 21F The figure shown—with frequency values ​​in GHz on the horizontal axis and radiated power values ​​in dB on the vertical axis—shows the results of a simulated comparative test, in which the antenna of DUT 2153 emits radiation, which is received by common-polarized and cross-polarized antennas of both the first and second test setups of test setup 2100. The figure includes curves representing measurements taken in a conventional test setup without electromagnetic absorbers, as well as curves representing measurements taken in the inventive test setup with electromagnetic absorbers 2120 and 2130.

[0274] Figure 21G A simulated non-planar or L-shaped DUT 2150 is shown for use in simulated comparative testing. The DUT includes multiple antennas 2160, with the antenna at the center 2156 being tested. When the antenna is pushed into a test arrangement with an L-shaped receiving section by a pusher 2110, the antenna faces the pusher 2110, allowing it to be tested by a first test arrangement.

[0275] Figure 21H The figure shown—with frequency values ​​in GHz on the horizontal axis and radiated power values ​​in dB on the vertical axis—shows the results of a simulated comparative test, in which the antenna of DUT 2156 emits radiation, which is received by common-polarized and cross-polarized antennas of both the first and second test arrangements of test setup 2100. The figure includes curves representing measurements taken in a conventional test setup without electromagnetic absorbers, as well as curves representing measurements taken in the inventive test setup with electromagnetic absorbers 2120 and 2130.

[0276] Check Figure 21F and Figure 21H The figure clearly shows that when the test setup includes an electromagnetic absorber, the average radiated power received by the measurement antennas of adjacent idle test setups is lower than when the test setup does not include an electromagnetic absorber. This demonstrates that electromagnetic absorbers do indeed improve inter-site isolation in multi-site test environments.

Claims

1. A device under test (DUT) socket structure (100, 260, 620, 1510, 1520) comprising a pusher (110, 210, 310, 510, 1310, 1785, 1850, 2030, 2110) and a DUT socket (120, 220, 320, 420, 520, 1020, 1350, 1820, 1910), said DUT socket having a receiving section (130, 230, 330, 430, 1030) configured to receive a DUT (150, 250, 350, 450, 550, 1620, 1720, 2150). in, The pusher is configured to push the DUT toward the receiving segment or push the DUT into the receiving segment; and The pusher is at least partially surrounded by an electromagnetic absorber.

2. The DUT socket structure according to claim 1, wherein, The DUT socket includes one or more sidewalls (180) surrounding the receiving section. The surface of one or more sidewalls facing the receiving section is at least partially covered by an electromagnetic absorber.

3. The DUT socket structure according to claim 1, wherein, The DUT socket includes one or more sidewalls surrounding the receiving section, wherein the sidewalls are inclined toward the receiving section.

4. The DUT socket structure according to any one of claims 1 to 3, in, The side surface of the pusher is completely surrounded by the electromagnetic absorber at least a portion of the longitudinal extension of the pusher.

5. The DUT socket structure according to any one of claims 1 to 4, wherein, The surface of the electromagnetic absorber facing the pusher includes multiple pyramidal structures (246, 640, 830, 1360, 1783) or conical structures (243, 640, 830).

6. The DUT socket structure according to claim 5, wherein, The height of the pyramidal or conical structure is in the range of 0.1 times to 0.4 times the wavelength at the lowest operating frequency, or The height of the pyramid-shaped or cone-shaped structure is within the range of 0.2 times to 0.3 times the wavelength at the lowest operating frequency.

7. The DUT socket structure according to claim 5 or 6, wherein, The base area of ​​the pyramid-shaped structure or the cone-shaped structure is in the range of 0.2 to 0.4 times the square of the wavelength at the lowest operating frequency.

8. The DUT socket structure according to any one of claims 1 to 7, in, The electromagnetic absorber is arranged to surround part of the pusher, with a gap between the electromagnetic absorber and the pusher.

9. The DUT socket structure according to any one of claims 1 to 8, in, In the portion of the electromagnetic absorber that surrounds the pusher with a gap between them, the distance between the electromagnetic absorber and the pusher is in the range of 0.2 times to 0.8 times the wavelength at the lowest operating frequency, or... Wherein, in the portion of the electromagnetic absorber that surrounds the pusher with a gap between them, the distance between the electromagnetic absorber and the pusher is in the range of 0.1 times the wavelength at the lowest operating frequency and 0.6 times the wavelength at the lowest operating frequency.

10. The DUT socket structure according to any one of claims 1 to 9, in, The electromagnetic absorber is arranged between the pusher and the positioning structure (910, 1960) of the DUT socket structure; and / or Wherein, the electromagnetic absorber is arranged between the pusher and the fixing structure of the DUT socket structure; and / or The electromagnetic absorber is arranged between the pusher and the waveguide structure of the DUT socket structure.

11. A test setup (200, 300, 360, 390, 400, 500, 720, 920, 1300, 1610, 1670, 1675, 1710, 1770, 1775, 1810, 2040, 2100), comprising a DUT socket structure according to any one of claims 1 to 10 and a measurement antenna structure (270, 370, 375, 470, 570, 1660, 1760, 1830), wherein, The pusher is arranged between the measuring antenna structure and the receiving section.

12. The test setup according to claim 11, in, The test setup includes additional electromagnetic absorber portions (293, 296, 490, 1330) with openings (299, 495). The additional electromagnetic absorber portion is arranged to at least partially cover the surface of the measuring antenna structure or the conductive structure supporting the measuring antenna structure. The surface of the conductive structure faces the receiving section; The additional electromagnetic absorber portion is arranged between the conductive structure (275, 475, 575) and a portion of the surface of the pusher, such that the opening is located on the electromagnetic propagation path (280, 380, 385, 480, 2140) between the measuring antenna structure and the receiving section.

13. The test setup according to claim 11 or 12, in, The pusher includes a widened portion (215, 1320) near the longitudinal portion of the measuring antenna structure, and The surface of the widened portion located on the receiving section side is partially covered by an electromagnetic absorber.

14. An automatic testing device comprising a test arrangement or test unit (1650, 1750, 1950) according to any one of claims 11 to 13, wherein the test unit comprises a plurality of test arrangements according to any one of claims 11 to 13.

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