Method for diagnosing a target device and electronic device performing the method

Abstract

Disclosed are an electronic device and a device diagnosis method, the electronic device including a diagnosis result output circuit including a plurality of diagnosis circuits and a logic gate connected to output terminals of the plurality of diagnosis circuits, a memory storing an instruction, and a processor connected to the memory, wherein the processor is configured to apply a voltage to one end portion of a plurality of diagnosis target devices included in the plurality of diagnosis circuits, and diagnose whether the plurality of diagnosis target devices are operating normally based on an output value of the diagnosis result output circuit, the output value being generated by the logic gate based on values received from the output terminals of the plurality of diagnosis circuits to which the voltage is applied.

Description

Technical Field

[0001] This disclosure relates to a method for diagnosing a target component and an electronic device for performing the method. Background Technology

[0002] Power conversion devices perform the conversion between DC and AC voltages, or between high and low voltages, to supply power suitable for various situations. If a fault occurs in the connection relationships of the internal circuitry of the power conversion device during operation, there is a risk that the device may be damaged due to overcurrent or may even catch fire. Therefore, various studies have been conducted on methods for determining whether the internal components of a power conversion device are properly connected and driven, and on methods for enhancing the stability and efficiency of the power conversion device. Summary of the Invention

[0003] Technical goals

[0004] The disclosed exemplary embodiments provide a method for diagnosing whether a target element is functioning correctly by applying a voltage to the end of a diagnostic circuit connected to a target element whose proper operation is to be determined, based on the output value of the diagnostic circuit, which is based on values ​​generated by logic gates.

[0005] The technical tasks achieved through the exemplary embodiments of this disclosure are not limited to the technical tasks described above, and other technical tasks can be derived from the exemplary embodiments described below.

[0006] Technical solution

[0007] An electronic device according to an example embodiment may include: a diagnostic result output circuit, the diagnostic result output circuit including a plurality of diagnostic circuits and logic gates connected to the outputs of the plurality of diagnostic circuits; a memory configured to store instructions; and a processor connected to the memory. The processor may be configured to apply a voltage to one end of a plurality of diagnostic target elements included in the plurality of diagnostic circuits, and diagnose whether the plurality of diagnostic target elements are functioning correctly based on the output value of the diagnostic result output circuit, the output value being generated by the logic gate based on values ​​received from the outputs of the plurality of diagnostic circuits to which the voltage has been applied.

[0008] The processor can be configured to determine that the plurality of diagnostic target elements are working normally when a first value is received through the output terminal of the diagnostic result output circuit, and to determine that at least one of the plurality of diagnostic target elements is malfunctioning when a second value is received through the output terminal of the diagnostic result output circuit.

[0009] The plurality of diagnostic circuits may include a first diagnostic circuit. The first diagnostic circuit may include: a first resistor connected to a first terminal of a first diagnostic target element; a second resistor connected to a second terminal of the first diagnostic target element; a third resistor connected to the first resistor; a fourth resistor connected to the second resistor; and a first comparator including a first input terminal connected to the third resistor, a second input terminal connected to the fourth resistor, and an output terminal.

[0010] The ratio of the third resistor to the sum of the first resistor and the third resistor can be greater than the ratio of the fourth resistor to the sum of the second resistor and the fourth resistor.

[0011] When the voltage applied to the first input terminal is greater than the voltage applied to the second input terminal, the first comparator can output a first value to the logic gate through the output terminal, and when the voltage applied to the first input terminal is less than the voltage applied to the second input terminal, the first comparator can output a second value to the logic gate through the output terminal.

[0012] The plurality of diagnostic circuits may include a second diagnostic circuit. The second diagnostic circuit may include: a fifth resistor connected to a first terminal of a second diagnostic target element; a sixth resistor connected to a second terminal of the second diagnostic target element; a seventh resistor connected to the fifth resistor; an eighth resistor connected to the sixth resistor; and a second comparator, the second comparator including a third input terminal connected to the seventh resistor, a fourth input terminal connected to the eighth resistor, and an output terminal, wherein the ratio of the seventh resistor to the sum of the fifth resistor and the seventh resistor is greater than the ratio of the eighth resistor to the sum of the sixth resistor and the eighth resistor.

[0013] The logic gate may include a plurality of input terminals and output terminals connected to the output terminals of the plurality of diagnostic circuits. When all values ​​received from the output terminals of the plurality of diagnostic circuits are the first value, the logic gate may apply the first value to the processor; and when at least one of the values ​​received from the output terminals of the plurality of diagnostic circuits is the second value, the logic gate may apply the second value to the processor.

[0014] Each of the plurality of diagnostic target elements may be a switch or a fuse.

[0015] A target component diagnostic method performed by an electronic device may include the following steps: applying a voltage to one end of a plurality of diagnostic target components included in a plurality of diagnostic circuits; and diagnosing whether the plurality of diagnostic target components are functioning correctly based on the output value of a diagnostic result output circuit, the output value being generated by a logic gate based on values ​​received from the outputs of the plurality of diagnostic circuits to which the voltage has been applied.

[0016] Specific details of other embodiments are included in the detailed description and accompanying drawings.

[0017] Technical effect

[0018] According to the exemplary implementation, one or more of the following effects can be expected.

[0019] According to an exemplary embodiment of this specification, whether a component is functioning correctly can be identified simply by using the logic value generated by the logic gate, without having to perform a separate direct comparison of the voltage amplification rate in determining whether a component that operates by connecting to a power conversion device is functioning correctly.

[0020] Furthermore, according to exemplary embodiments of this specification, the operating status of multiple diagnostic target elements, which are the targets for determining their normal operation, can be identified in a lighter manner based on changes in the logic gates that generate logic values.

[0021] The effects of this disclosure are not limited to those described above, and other effects not explicitly described will be readily understood by those skilled in the art within the scope of the claims. Attached Figure Description

[0022] Figure 1 This is a block diagram illustrating the configuration of an electronic device according to an exemplary embodiment.

[0023] Figure 2 This is a block diagram used to describe the configuration of a diagnostic circuit according to an exemplary embodiment.

[0024] Figure 3 This is a diagram illustrating the configuration of a plurality of diagnostic circuits according to an exemplary embodiment.

[0025] Figure 4 This is a flowchart describing a method for diagnosing a target element according to an exemplary embodiment. Detailed Implementation

[0026] While taking into account the functionality obtained under this disclosure, as many terms as possible from currently widely used general terminology are selected for use in the exemplary embodiments; however, these terms may be replaced by other terms based on the intent, habits, and emergence of new technologies of those skilled in the art. Furthermore, in certain cases, terms arbitrarily chosen by the applicant of this disclosure may be used. In such cases, the meaning of these terms may be described in the corresponding descriptive sections of this disclosure. Therefore, it should be noted that the terms used herein should be interpreted based on their actual meaning and the entirety of this specification, rather than simply on their names.

[0027] Throughout the specification, when a component is referred to as "including" another component, that component should not be construed as excluding other components, provided there is no particular conflict of description and that the component may include at least one other component.

[0028] The expression “at least one of A, B and C” described in this specification may mean: A alone; B alone; C alone; both A and B together; A and C together; B and C together; or all three of A, B and C together.

[0029] In this disclosure, a "terminal" can be implemented as a computer or portable terminal capable of accessing a server or another terminal via a network. Here, a computer can include, for example, a laptop computer, a desktop computer, and a notebook computer equipped with a web browser. A portable terminal can be a wireless communication device that ensures portability and mobility, and includes any type of handheld wireless communication device, such as a tablet PC, a smartphone, or a communication-based terminal such as International Mobile Telecommunications (IMT), Code Division Multiple Access (CDMA), W-CDMA, and Long Term Evolution (LTE).

[0030] In the following description, exemplary embodiments of the present disclosure will be described in detail with reference to the accompanying drawings, enabling those skilled in the art to readily implement the present disclosure. However, the present disclosure may be implemented in many different forms and is not limited to the embodiments described herein.

[0031] Exemplary embodiments of this disclosure will be described in detail below with reference to the accompanying drawings.

[0032] Figure 1 This is a block diagram illustrating the configuration of an electronic device according to an exemplary embodiment.

[0033] Reference Figure 1The electronic device 100 according to an exemplary embodiment is a device for organizing and providing information. The electronic device 100 may correspond to a power conversion device that converts one form of electrical energy into another. For example, the electronic device 100 may correspond to a rectifier that converts alternating current (AC) to direct current (DC) to convert household or industrial electricity into a form usable by the electronic device. For example, the electronic device 100 may correspond to an inverter that converts DC power to AC power, such that DC power is converted into AC power usable in a home or on the power grid. For example, the electronic device 100 may correspond to a DC-DC converter that converts the voltage level of DC to another level usable in battery management systems and electric vehicles. To determine whether the electrical connection between the input and output circuits, including the system and battery, is in a normal state, the electronic device 100 may provide a function to diagnose whether components 200 corresponding to protective elements such as switches or fuses are functioning correctly before driving the power conversion device. An electronic device 100 according to an exemplary embodiment can determine whether a component 200 is functioning correctly based on values ​​received by a diagnostic circuit included in the electronic device 100, and the entire process for performing diagnostics on a target component will be described in detail below. Here, component 200 may correspond to parts that require operational status diagnostics, such as switches (field-effect transistors (FETs), transistors (TRs), relays) and fuses.

[0034] An electronic device 100 according to an exemplary embodiment may include a diagnostic result output circuit 101, a memory 102, and a processor 103. Figure 1 The electronic device 100 shown herein only illustrates components relevant to exemplary embodiments. Therefore, those skilled in the art will understand that, in addition to… Figure 1 In addition to the components shown, other general-purpose components may also be included.

[0035] The diagnostic result output circuit 101 according to an exemplary embodiment may include a plurality of diagnostic circuits and logic gates connected to the outputs of the plurality of diagnostic circuits. The plurality of diagnostic circuits may include a first diagnostic circuit, to which a first diagnostic target element is connected. Furthermore, the plurality of diagnostic circuits may include a second diagnostic circuit, to which a second diagnostic target element is connected. The plurality of diagnostic circuits of the diagnostic result output circuit 101 may include an Nth diagnostic circuit (N is a natural number) connected in parallel for diagnosing whether the plurality of diagnostic target elements are functioning correctly. The diagnostic result output circuit 101 according to an exemplary embodiment may include logic gates to which the output value of a comparator in each of the plurality of diagnostic circuits is applied. Each of the plurality of diagnostic circuits included in the diagnostic result output circuit 101 according to the exemplary embodiment may include a diagnostic target element, a plurality of resistors, and a comparator, and sends the comparator's output value to the logic gate. The logic gate may apply an output value to the processor 103 based on the output value of the first comparator and the output value of the second comparator of the second diagnostic circuit, enabling the processor 103 to determine whether the diagnostic target element is functioning correctly. In the following description, exemplary embodiments in which the first diagnostic target element and the second diagnostic target element are diagnosed by the diagnostic result output circuit 101 will be primarily described, but this is not limited to the description of the exemplary embodiments according to this disclosure.

[0036] The memory 102 according to an exemplary embodiment may be hardware that stores various data processed in the electronic device 100. The memory 102 may be located within the processor 103 in the electronic device 100 and stores data that has been processed and data that will be processed by the processor 103. Furthermore, the memory may store basic programming and data structures that can provide functionality for at least one exemplary embodiment of the present disclosure, and may also store applications (programs, code modules, instructions), drivers, etc., that can provide functionality for exemplary embodiments of the present disclosure. The memory may include random access memory (RAM) such as dynamic random access memory (DRAM) and static random access memory (SRAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), optical disc read-only memory (CD-ROM), Blu-ray or other optical disc storage, hard disk drive (HDD), solid-state drive (SSD), or flash memory, but the exemplary embodiments according to the present disclosure are not limited to the specific cases mentioned.

[0037] In an exemplary embodiment, processor 103 can control all operations of electronic device 100 and process data and signals. Processor 103 may include a microcontroller unit integrated circuit (MCU IC) for a power conversion device. Processor 103 may include at least one hardware unit. Furthermore, processor 103 may be operated by one or more software modules generated by executing program code stored in memory 102. Processor 103 may include memory 102. Processor 103 can execute program code stored in memory 102 to control all operations of electronic device 100 and process data and signals. That is, processor 103 according to the exemplary embodiment can be configured to apply a voltage to one end of a plurality of diagnostic target elements included in a plurality of diagnostic circuits, and diagnose whether the plurality of diagnostic target elements are functioning correctly based on the output value of a diagnostic result output circuit, the output value being generated by logic gates based on values ​​received from the outputs of the plurality of diagnostic circuits to which the voltage has been applied. A detailed description thereof will be provided below.

[0038] The electronic device 100 according to the exemplary embodiments described above may include a processor, a memory (such as permanent memory of a disk drive) for storing and executing program data, a communication port for communicating with external devices, and user interface devices such as touch panels, keys, and buttons. Methods implemented as software modules or algorithms may be stored as computer-readable code or program instructions executable by a processor in a computer-readable recording medium. Here, the computer-readable recording medium may include magnetic storage media (e.g., ROM, RAM, floppy disk, hard disk) and optical reading media (e.g., CD-ROM, digital multifunction disc (DVD)). The computer-readable recording medium may be distributed across a computer system connected via a network, and the computer-readable code may be stored and executed in a distributed manner. The medium may be computer-readable, stored in memory, and executed by a processor.

[0039] Figure 2 This is a block diagram used to describe the configuration of a diagnostic circuit according to an exemplary embodiment.

[0040] refer to Figure 2A first diagnostic circuit 210, included in the diagnostic result output circuit 200, can be connected to a processor 103. The processor 103 can be configured to apply a voltage to terminal N1 of a first diagnostic target element 212 included in the first diagnostic circuit 210. In an exemplary embodiment, the voltage applied to the first diagnostic circuit 210 may correspond to the battery voltage of the power conversion device. According to one exemplary embodiment, the first diagnostic circuit 210 may include a first diagnostic target element 212. According to an exemplary embodiment, the first diagnostic circuit 210 may include a first circuit portion 219, which includes a first resistor R1 connected to one terminal of the first diagnostic target element 212, a third resistor R3 connected to one terminal of the first resistor R1, and a first operational amplifier 215. The first operational amplifier 215 may be driven by a Vcc voltage (e.g., 5V) and may correspond to a buffer structure in which the input and output terminals are connected to each other. According to an exemplary embodiment, the first diagnostic circuit 210 may include a second circuit portion 217, which includes a second resistor R2 connected to one end of the first diagnostic target element 212, a fourth resistor R4 connected to one end of the second resistor R2, and a second operational amplifier 213. Similar to the first operational amplifier 215, the second operational amplifier 213 may be driven by a Vcc voltage.

[0041] In an exemplary embodiment, the first diagnostic circuit 210 can send the output value of the first operational amplifier 215 of the first circuit section 219 and the output value of the second operational amplifier 213 of the second circuit section 217 to the processor 103. The processor 103 can perform calibration to accurately compare the magnitudes of the voltage values ​​received from each comparator and diagnose whether the first diagnostic target element 212 is functioning correctly. For example, the processor 103 can calibrate the voltage values ​​received from the first operational amplifier 215 and the values ​​received from the second operational amplifier 213 to compare the magnitudes of each voltage value. For example, when the first diagnostic target element 212 is functioning correctly, the output values ​​of the first operational amplifier 215 and the second operational amplifier 213 can be sent to the processor 103 according to the magnitude and ratio relationship of the first resistor R1 relative to the fourth resistor R4. The processor 103 can compare the output values ​​of the first operational amplifier 215 and the second operational amplifier 213 with predetermined conditions based on the magnitude and ratio relationship of the first resistor R1 and the fourth resistor R4 to determine that the first diagnostic target element 212 is functioning correctly. For example, when the first diagnostic target element 212 is not working properly (e.g., when the first diagnostic target element 212 is in a conducting state due to its internal open circuit, but in fact the first diagnostic target element 212 is in an open circuit state), since the voltage is not applied to the first resistor R1, the processor 103 can receive the output value of the first operational amplifier 215 as 0 V, and thus determine that the first diagnostic target element 212 is not working properly.

[0042] Similarly, when the second diagnostic circuit 220 is connected in parallel to the first diagnostic circuit 210 and includes diagnostic target elements other than the first diagnostic target element 212, the second diagnostic circuit 220 can apply at least two output values ​​to the processor 103 through at least two circuit parts, and the processor 103 can determine whether the diagnostic target element is working properly in a similar manner to the first diagnostic circuit 210.

[0043] Figure 3 This is a diagram illustrating the configuration of a plurality of diagnostic circuits according to an exemplary embodiment.

[0044] refer to Figure 3 The diagnostic result output circuit 300 according to the exemplary embodiment may include a plurality of diagnostic circuits (e.g., a first diagnostic circuit 310 and a second diagnostic circuit 320) and logic gates (e.g., logic gate 330) connected to the output terminals of the plurality of diagnostic circuits.

[0045] For example, the first diagnostic target element 312 may be connected to the first diagnostic circuit 310. The first diagnostic circuit 310 may include a first resistor R1 connected to a first terminal N11 of the first diagnostic target element 312. A battery voltage may be applied to the first terminal N11 of the first diagnostic target element 312. The first diagnostic circuit 310 may include a second resistor R2 connected to a second terminal N12 of the first diagnostic target element 312, a third resistor R3 connected to the first resistor R1, and a fourth resistor R4 connected to the second resistor R2.

[0046] The first diagnostic circuit 310 may include a first comparator 313, which includes a first input terminal 313-1 connected to a fourth resistor R4, a second input terminal 313-2 connected to a third resistor R3, and an output terminal 313-3. In an exemplary embodiment, the first comparator 313 may be configured based on an operational amplifier driven by a Vcc voltage (e.g., 5V) and may be configured to output different logic values ​​based on the voltage difference between the signal voltage and the reference voltage when the signal voltage to be compared is input to the inverting terminal and the reference voltage is input to the non-inverting terminal. The description of the comparators in this disclosure also applies below.

[0047] In an exemplary embodiment, the ratio of the fourth resistor R4 to the sum of the second resistor R2 and the fourth resistor R4 can be greater than the ratio of the third resistor R3 to the sum of the first resistor R1 and the third resistor R3. For example, when the first diagnostic target element 312 is operating normally, the voltage applied to the first terminal N1 of the first diagnostic target element 312 when the first diagnostic target element 312 is closed can also be applied to the second terminal N2 of the first diagnostic target element 312. In this case, because the ratio of the fourth resistor R4 to the sum of the second resistor R2 and the fourth resistor R4 is greater than the ratio of the third resistor R3 to the sum of the first resistor R1 and the third resistor R3, the voltage input to the first comparator 313 through the first input terminal 313-1 connected to the fourth resistor R4 can be greater than the voltage input to the first comparator 313 through the second input terminal 313-2 connected to the third resistor R3. When the voltage applied to the first input terminal 313-1 is greater than the voltage applied to the second input terminal 313-2, the first comparator 313, according to an exemplary embodiment, can output a first value (e.g., "1") to the output terminal 313-3. When the voltage applied to the first input terminal 313-1 is less than the voltage applied to the second input terminal 313-2, the first comparator 313, according to an exemplary embodiment, can output a second value (e.g., "0") to the output terminal 313-3. In this case, each of the first and second values ​​output by the first comparator 313 can correspond to a logic value. In other words, when the first diagnostic target element 312 is operating normally, since the voltage applied to the first input terminal 313-1 becomes greater than the voltage applied to the second input terminal 313-2, the first value can be output from the output terminal 313-3 of the first comparator 313.

[0048] For example, when the first diagnostic target element 312 is not functioning properly (when the first diagnostic target element 212 is in a conducting state due to its internal open circuit, but in reality, the first diagnostic target element 212 is in an open circuit state), the voltage applied to the first terminal N11 of the first diagnostic target element 312 when the first diagnostic target element 312 is closed may not be applied to the second terminal N12 of the first diagnostic target element 312. In this case, the voltage input to the first comparator 313 through the first input terminal 313-1 connected to the fourth resistor R4 may be less than the voltage input to the first comparator 313 through the second input terminal 313-2 connected to the third resistor R3. According to an exemplary embodiment, the second value may be output from the output terminal 313-3 of the first comparator 313.

[0049] According to an exemplary embodiment, the second diagnostic target element 322 can be connected to the second diagnostic circuit 320. The second diagnostic circuit 320 may include a fifth resistor R5 connected to a first terminal N21 of the second diagnostic target element 322. Battery voltage can be applied to the first terminal N21 of the second diagnostic target element 322. The second diagnostic circuit 320 may include a sixth resistor R6 connected to a second terminal N22 of the second diagnostic target element 322, a seventh resistor R7 connected to the fifth resistor R5, and an eighth resistor R8 connected to the sixth resistor R6. The second diagnostic circuit 320 may include a second comparator 323, which includes a first input terminal 323-1 connected to the eighth resistor R8, a second input terminal 323-2 connected to the seventh resistor R7, and an output terminal 323-3. In an exemplary embodiment, the ratio of the eighth resistor R8 to the sum of the sixth resistor R6 and the eighth resistor R8 may be greater than the ratio of the seventh resistor R7 to the sum of the fifth resistor R5 and the seventh resistor R7.

[0050] For example, when the second diagnostic target element 322 is operating normally, the voltage applied to the first terminal N21 of the second diagnostic target element 322 can also be applied to the second terminal N22 of the second diagnostic target element 322. In this case, since the ratio of the eighth resistor R8 to the sum of the sixth resistor R6 and the eighth resistor R8 is greater than the ratio of the seventh resistor R7 to the sum of the fifth resistor R5 and the seventh resistor R7, the voltage input to the second comparator 323 through the first input terminal 323-1 connected to the eighth resistor R8 can be greater than the voltage input to the second comparator 323 through the second input terminal 323-2 connected to the seventh resistor R7. When the voltage applied to the first input terminal 323-1 is greater than the voltage applied to the second input terminal 323-2, the second comparator 323, according to the exemplary embodiment, can output a first value (e.g., "1") to the output terminal 323-3, and when the voltage applied to the first input terminal 323-1 is less than the voltage applied to the second input terminal 323-2, it can output a second value (e.g., "0") to the output terminal 323-3. In the exemplary embodiment, when the second diagnostic target element 322 is operating normally, since the voltage applied to the first input terminal 323-1 becomes greater than the voltage applied to the second input terminal 323-2, a second value can be output from the output terminal 323-3 of the second comparator 323.

[0051] For example, when the second diagnostic target element 322 is not functioning properly, the voltage applied to the first terminal N21 of the second diagnostic target element 322 may not be applied to the second terminal N22. In this case, the voltage input to the second comparator 323 through the first input terminal 323-1 connected to the eighth resistor R8 may be less than the voltage input to the second comparator 323 through the second input terminal 323-2 connected to the seventh resistor R7. In an exemplary embodiment, when the second diagnostic target element 322 is not functioning properly, since the voltage applied to the first input terminal 323-1 becomes less than the voltage applied to the second input terminal 323-2, a second value can be output from the output terminal 323-3 of the second comparator 323.

[0052] The diagnostic result output circuit 101 according to an exemplary embodiment may further include a logic gate 330. The logic gate 330 includes multiple input terminals (e.g., first input terminal 330-1 and second input terminal 330-2) connected to the output terminals (e.g., output terminal 313-3 of the first comparator 313 and output terminal 323-3 of the second comparator 323) and output terminals (e.g., output terminal 330-3) of multiple diagnostic circuits (e.g., first diagnostic circuit 310 and second diagnostic circuit 320). The logic gate 330 may correspond to an AND gate that outputs a first value only when both or more input signals are first values. When the value received from the output terminal 313-3 of the first comparator 313 is a first value and the value received from the output terminal 323-3 of the second comparator 323 is a first value, the logic gate 330 may apply the first value to the processor 103 through the output terminal 330-1. When at least one of the values ​​received from the output terminals of the multiple diagnostic circuits is a second value, the logic gate 330 may apply the second value to the processor 103. For example, when at least one of the values ​​received from the output terminal 313-3 of the first comparator 313 and the output terminal 323-3 of the second comparator 323 is a second value, the logic gate 330 can apply the second value to the processor 103 through the output terminal 330-1.

[0053] When a first value is applied through the output terminal 330-1 of logic gate 330, the processor 103 according to the exemplary embodiment can determine that both the first diagnostic target element 312 and the second diagnostic target element 322 are functioning normally. When a second value is applied through the output terminal 330-1 of logic gate 330, the processor 103 according to the exemplary embodiment can determine that at least one of the first diagnostic target element 312 and the second diagnostic target element 322 is in a defective state of malfunction. Figure 3In this embodiment, only multiple diagnostic target elements corresponding to the first diagnostic target element 312 and the second diagnostic target element 322 are shown, and multiple diagnostic circuits corresponding to the first diagnostic circuit 310 and the second diagnostic circuit 320 are shown; however, the exemplary embodiments of this disclosure are not limited thereto. For multiple diagnostic target elements included in multiple diagnostic circuits connected in parallel with logic gates 330 having multiple input terminals, the processor 103 according to the exemplary embodiment can perform element diagnosis based on the output value of the logic gates 330 having multiple input terminals.

[0054] Figure 4 This is a flowchart describing a method for diagnosing a target unit according to an exemplary embodiment.

[0055] Reference Figure 4 In operation S410, the electronic device 100 according to the exemplary embodiment can apply voltage to one end of one of the multiple diagnostic target elements included in the multiple diagnostic circuits. For example, with all multiple diagnostic target elements closed, the electronic device 100 according to the exemplary embodiment can apply voltage to one end of one of the diagnostic target elements of the multiple diagnostic circuits included in the diagnostic result output circuit. For example, the voltage applied by the electronic device 100 to one end of the multiple diagnostic target elements may correspond to the battery voltage used to drive the electronic device 100.

[0056] In operation S420, the electronic device 100 according to an exemplary embodiment can diagnose whether a plurality of diagnostic target elements are functioning correctly based on the output value of a diagnostic result output circuit generated by logic gates. In an exemplary embodiment, the output value of the diagnostic result output circuit generated by logic gates can correspond to a logic value generated based on the output value of the comparator of each diagnostic circuit included in the diagnostic result output circuit. When a first value is received through the output terminal of the diagnostic result output circuit, the electronic device 100 according to an exemplary embodiment can determine that the plurality of diagnostic target elements are functioning correctly. When a second value is received through the output terminal of the diagnostic result output circuit, the electronic device 100 according to an exemplary embodiment can determine that at least one of the plurality of diagnostic target elements is malfunctioning. When the first value is received from the diagnostic result output circuit, the electronic device 100 according to an exemplary embodiment can provide a notification that all of the plurality of diagnostic target elements are functioning correctly. When the second value is received from the diagnostic result output circuit, the electronic device 100 can provide a notification that at least one of the plurality of diagnostic target elements is malfunctioning.

[0057] Furthermore, exemplary embodiments of this disclosure are disclosed in this specification and accompanying drawings. It should be understood that the specific terminology used herein is merely for the purpose of readily describing the technical content of this disclosure and facilitating understanding of this disclosure, and is not intended to limit the scope of this disclosure. It will be apparent to those skilled in the art that various modifications based on the technical spirit of this disclosure can be made in addition to the embodiments disclosed herein.

[0058] This exemplary embodiment can be represented by functional blocks and various processing steps. These functional blocks can be implemented by various numbers of hardware and / or software configurations that perform specific functions. For example, this exemplary embodiment can employ integrated circuit configurations such as memory, processors, logic circuits, and lookup tables, which can perform various functions by controlling one or more microprocessors or other control devices. Similar to components that can be executed by software programming or software components, this exemplary embodiment can be implemented by programming or scripting languages ​​such as C, C++, Java, and assembly languages, as well as Python, including various algorithms implemented by combinations of data structures, processes, routines, or other programming configurations. Functional aspects can be implemented by algorithms executed by one or more processors. Furthermore, this exemplary embodiment can employ related technologies for electronic environment setup, signal processing, and / or data processing. The terms “mechanism,” “component,” “device,” and “configuration” are used broadly and are not limited to mechanical and physical elements. These terms can include the meaning of a series of software routines associated with a processor.

[0059] The above exemplary embodiments are merely examples, and other exemplary embodiments may be implemented within the scope of the appended claims.

Claims

1. An electronic device, the electronic device comprising: A diagnostic result output circuit, comprising multiple diagnostic circuits and logic gates connected to the output terminals of the multiple diagnostic circuits; A memory configured to store instructions; as well as The processor is connected to the memory. The processor is configured to apply a voltage to one end of a plurality of diagnostic target elements included in the plurality of diagnostic circuits, and to diagnose whether the plurality of diagnostic target elements are functioning properly based on the output value of the diagnostic result output circuit, wherein the output value is generated by the logic gate based on the value received from the output end of the plurality of diagnostic circuits to which the voltage has been applied.

2. The electronic device according to claim 1, wherein, The processor is configured to: When a first value is received through the output terminal of the diagnostic result output circuit, it is determined that the plurality of diagnostic target components are working normally, and when a second value is received through the output terminal of the diagnostic result output circuit, it is determined that at least one of the plurality of diagnostic target components is malfunctioning.

3. The electronic device according to claim 1, wherein, The plurality of diagnostic circuits includes a first diagnostic circuit. The first diagnostic circuit includes: A first resistor is connected to a first terminal of a first diagnostic target element; A second resistor is connected to the second terminal of the first diagnostic target element; A third resistor, which is connected to the first resistor; A fourth resistor, the fourth resistor being connected to the second resistor; and A first comparator includes a first input terminal connected to the third resistor, a second input terminal connected to the fourth resistor, and an output terminal.

4. The electronic device according to claim 3, wherein, The ratio of the third resistor to the sum of the first resistor and the third resistor is greater than the ratio of the fourth resistor to the sum of the second resistor and the fourth resistor.

5. The electronic device according to claim 3, wherein, The first comparator is configured to output a first value to the logic gate through the output terminal when the voltage applied to the first input terminal is greater than the voltage applied to the second input terminal, and to output a second value to the logic gate through the output terminal when the voltage applied to the first input terminal is less than the voltage applied to the second input terminal.

6. The electronic device according to claim 1, wherein, The plurality of diagnostic circuits includes a second diagnostic circuit. The second diagnostic circuit includes: A fifth resistor is connected to the first terminal of the second diagnostic target element; A sixth resistor is connected to the second terminal of the second diagnostic target element; A seventh resistor, which is connected to the fifth resistor; An eighth resistor, which is connected to the sixth resistor; and The second comparator includes a third input terminal connected to the seventh resistor, a fourth input terminal connected to the eighth resistor, and an output terminal. Wherein, the ratio of the seventh resistor to the sum of the fifth resistor and the seventh resistor is greater than the ratio of the eighth resistor to the sum of the sixth resistor and the eighth resistor.

7. The electronic device according to claim 1, wherein, The logic gate includes multiple input terminals and output terminals connected to the output terminals of the plurality of diagnostic circuits, and The logic gate is configured to apply the first value to the processor when all the values ​​received from the outputs of the plurality of diagnostic circuits are first values, and to apply the second value to the processor when at least one of the values ​​received from the outputs of the plurality of diagnostic circuits is a second value.

8. The electronic device according to claim 1, wherein, Each of the plurality of diagnostic target elements is a switch or a fuse.

9. A method for diagnosing a target component performed by an electronic device, the method comprising the following steps: Apply a voltage to one end of a plurality of diagnostic target elements included in a plurality of diagnostic circuits; as well as The diagnostic result output circuit is used to diagnose whether the plurality of diagnostic target components are working properly. The output value is generated by logic gates based on the value received from the output terminals of the plurality of diagnostic circuits to which the voltage has been applied.

10. A non-transitory computer-readable recording medium that records a program for performing the target component diagnostic method according to claim 9 in an electronic device.

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