Microwave multi-parameter measurement method based on double local oscillator Rydberg atom interferometer
Patent Information
- Application Number
- CN202611218831.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2026-07-21
- Filing Date
- 2026-08-12
- Publication Date
- 2026-10-09
AI Technical Summary
单本振方案缺乏干涉放大机制，相位信息仅编码于波形相位中，无法实现相位-强度的高效转换，且必须依赖外部参考源方可完成相位解算；闭环干涉方案受限于多激光频率的精确锁定与稳定控制，系统可重构性差，且难以实现0°至360°的全范围无模糊相位测量
本发明通过构建双本振马赫 曾德尔型干涉构型，将微波信号的相位信息直接编码为干涉强度，无需外部相位参考或同步触发信号即可完成相位测量，从根本上简化了测量系统结构，降低了对外部参考源的依赖。
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Figure CN122882823A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of quantum optics, and in particular to a microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer. Background Technology
[0002] Rydberg atoms possess extremely large electric dipole moments and polarizability, making them highly sensitive to external electric field signals. They can be used to achieve quantum precision detection of radio frequency, microwave, and AC / DC electric fields by relying on phenomena such as electromagnetic induction transparency, Autler-Townes splitting, and Stark shift. They have advantages such as high measurement accuracy, self-calibration capability, no metal antenna interference, and large dynamic range, and have important application value in fields such as electromagnetic environment monitoring, broadband communication, radar detection, and transient electromagnetic pulse detection.
[0003] Phase is one of the core parameters of microwave signals. High-precision phase measurement is directly related to key applications such as beamforming and channel estimation in wireless communication, coherent combining and target localization in distributed radar, and phase center calibration in antenna metrology. Existing Rydberg atomic microwave phase measurement schemes are mainly divided into two categories: one is based on a single local oscillator superheterodyne architecture, which extracts the relative phase by analyzing the time-domain waveform of the intermediate frequency signal. This method requires an external phase reference signal or a synchronous trigger signal as a reference, and the phase measurement accuracy is limited by the time-domain fitting accuracy, usually only reaching the order of magnitude. The other is based on a closed-loop atomic interference configuration, which achieves phase readout by constructing a quantum interference loop through multiple laser fields. Although this method can improve the phase accuracy to the sub-degree level, it often requires five to six laser fields of different frequencies, making the system structure extremely complex, significantly increasing experimental costs and maintenance difficulties, and making it difficult to extend to phase measurement of arbitrary signal frequencies.
[0004] In existing technologies, both single-local-oscillator superheterodyne schemes and multi-laser closed-loop interferometry schemes have their own limitations. The single-local-oscillator scheme lacks an interferometric amplification mechanism; phase information is only encoded in the waveform phase, making efficient phase-intensity conversion impossible, and it requires an external reference source for phase calculation. The closed-loop interferometry scheme is limited by the precise locking and stable control of multiple laser frequencies, resulting in poor system reconfigurability and difficulty in achieving unambiguous phase measurement across the entire range from 0° to 360°. Furthermore, existing schemes typically only measure a single physical quantity (phase). Important parameters such as microwave signal propagation distance and polarization angle still require additional measurement systems or discrete equipment, making it difficult to achieve unified, high-precision measurement of multiple parameters within a single detection system.
[0005] Therefore, existing Rydberg atomic microwave measurement technology has shortcomings such as phase measurement relying on external references, difficulty in full-range phase readout, complex system structure, and lack of multi-parameter measurement capabilities. There is an urgent need to provide a method that can achieve high-precision full-range phase measurement without the need for external phase references, and simultaneously support unified measurement of multiple parameters such as microwave distance and polarization angle. Summary of the Invention
[0006] To address the shortcomings of existing technologies, this invention proposes a microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer. By constructing a Mach-Zehnder type interferometer in a Rydberg atomic medium using dual microwave local oscillators, high-precision interferometric measurement of multiple parameters such as microwave signal phase, distance, and polarization angle can be achieved.
[0007] The technical solution adopted in this invention is: a microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer, the process of which is as follows: First, a Rydberg atomic interferometry system is constructed, which includes a Rydberg atomic excitation module, an atomic gas cell, a dual local oscillator microwave source module, a photoelectric detection module, and a signal processing module. The atomic gas cell can be any type of hollow structure filled with Rydberg atomic vapor. The photoelectric detection module is used to detect the detection light signal transmitted through the atomic gas cell. The signal processing module is used to process the interference signal output by the photoelectric detection module. Then, a Mach-Zehnder interferometer output is constructed by generating dual microwave local oscillators through a dual local oscillator microwave source module, specifically as follows: The dual local oscillator microwave source module generates a first local oscillator microwave field and a second local oscillator microwave field. The frequencies of the first local oscillator microwave field and the second local oscillator microwave field are symmetrically detuned relative to the center frequency of the signal field under test. The first local oscillator microwave field and the second local oscillator microwave field generated by the dual local oscillator microwave source module are two microwave signals that contain symmetrical frequencies and have a known phase difference in a set spectrum. The known signal is a single-tone signal, or a multi-tone signal, or a frequency comb signal or a frequency modulation signal. Using Rydberg atomic medium as the mixing and interference medium, the microwave field of the signal to be measured is multi-wave mixed with the first local oscillator microwave field and the second local oscillator microwave field to generate two signals with the same frequency and coherent interference in the atomic gas chamber, forming a Mach-Zehnder type interference output; Next, by analyzing the changes in the intensity of the interference output signal caused by the phase, distance, and polarization angle of the signal field under test, the measurement of multiple parameters, including the phase, distance, and polarization angle of the signal field under test, can be achieved.
[0008] As a preferred embodiment, the phase difference between the first local oscillator microwave field and the second local oscillator microwave field is adjusted by electronic control to achieve the translation of the interference fringes, so that the interference critical point is set at any position of the phase of the signal to be measured, thereby realizing unambiguous phase measurement in the full range from 0° to 360°.
[0009] As a preferred embodiment, the signal processing module is used to perform electrical signal processing, and / or optical signal processing, and / or quantum signal processing on the signal obtained by the signal detection module, thereby obtaining the required information.
[0010] As a preferred embodiment, the signal processing module obtains measurement results for signal-defined parameters through a signal processing procedure including bandpass filtering and contrast extraction.
[0011] As a preferred embodiment, the signal field distance measurement is based on a distance-phase-intensity conversion mechanism. The signal processing module acquires and analyzes the changes in interference intensity output by the interference configuration, obtains the spatial propagation cumulative phase of the microwave signal based on the interference intensity inversion, and thereby obtains the microwave propagation distance, thus realizing high-precision measurement of the microwave distance of the signal field to be measured.
[0012] As a preferred embodiment, the signal field polarization angle measurement is based on the polarization-phase-intensity conversion mechanism. The signal processing module acquires and analyzes the changes in interference intensity output by the interference configuration, obtains the effective projected electric field amplitude of the microwave signal based on the interference intensity inversion, and thereby obtains the polarization angle of the microwave signal, thus realizing high-precision measurement of the polarization angle of the signal field to be measured.
[0013] As a preferred embodiment, the atoms used in the Rydberg atom interferometry system are Rydberg atoms, or Rydberg superatoms, or Rydberg excitons; the types of atoms used in the Rydberg atom are alkali metal Rydberg atoms, or alkaline earth metal Rydberg atoms, or other atoms that can be excited to highly excited states.
[0014] As a preferred embodiment, the Rydberg atom excitation module uses single-photon, two-photon, and three-photon excitation methods to excite atoms.
[0015] Compared with the prior art, the present invention has the following beneficial effects: This invention constructs a dual-local-oscillator Mach-Zehnder interferometer configuration to directly encode the phase information of microwave signals into interference intensity, enabling phase measurement without the need for external phase references or synchronous trigger signals. This fundamentally simplifies the measurement system structure and reduces dependence on external reference sources.
[0016] This invention achieves arbitrary translation of interference fringes by electronically adjusting the phase difference between two local oscillators. Combined with coarse branch determination using a single local oscillator, it can achieve unambiguous, high-precision phase calculation across the entire range of 0° to 360°, with a phase resolution better than 0.1°. This overcomes the limitation of measurement range caused by periodic ambiguity in traditional interferometric schemes. This invention maps microwave propagation distance and polarization angle to interference phase changes sequentially through distance-phase-intensity conversion mechanisms and polarization-phase-intensity conversion mechanisms. Within the same interferometric measurement framework, it achieves unified high-precision measurement of three physical quantities: phase, distance, and polarization angle, without the need for additional measurement equipment, significantly expanding the multi-parameter sensing capability of a single detection system.
[0017] The device described in this invention has a simple structure, and the dual local oscillator sources can be realized based on commercial microwave sources. It does not require complex optical interferometers or multi-laser frequency locking systems. The system is highly reconfigurable and easy to integrate with existing Rydberg atomic superheterodyne receivers, and has good engineering practicality and scalability. Attached Figure Description
[0018] Figure 1 The present invention provides a schematic diagram of a microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer. Figure (a) is a schematic illustration of the cesium atom energy level structure and the dual-local-oscillator microwave field coupling, and Figure (b) is a schematic illustration of the composition of the dual-local-oscillator microwave interferometry system.
[0019] Figure 2 The present invention illustrates the principle of high-precision measurement of signal phase based on a dual-local-oscillator Rydberg atomic interferometer. Figure (a) shows the time-domain waveform of the interference output formed by the coherent superposition of two intermediate frequency signals during the dual-local-oscillator interference process, and Figure (b) shows the response curve of the interference output signal intensity as the signal field phase changes.
[0020] Figure 3 The diagram shows a schematic of the experimental configuration for high-precision measurement of signal distance and polarization angle based on a dual-local-oscillator Rydberg atomic interferometer according to the present invention. Detailed Implementation
[0021] To better understand the present invention, specific embodiments will be given to further illustrate the invention. However, it should be understood that the described embodiments are exemplary embodiments, and the invention can be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this invention will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
[0022] In the embodiments of the present invention, unless otherwise specified and limited, it should be noted that the term "dual local oscillator microwave field" should be interpreted broadly, and can refer to any two microwave signals with modulated frequency, phase and amplitude, whose frequencies are symmetrically detuned relative to the center frequency of the signal field under test, and the relative phase difference between the two local oscillator microwave fields can be continuously adjusted by electronic control; the dual local oscillator microwave field can be generated by two independent microwave signal sources respectively, or by a single microwave signal source after frequency division, phase shifting and amplification links to generate two phase-adjustable local oscillator signals. For those skilled in the art, the specific meaning of the above term can be understood according to the specific circumstances.
[0023] In the embodiments of the present invention, the term "Mach-Zehnder interference" should be interpreted broadly, referring to the coherent superposition of two coherent intermediate frequency signals in a Rydberg atomic medium, with the interference intensity satisfying a certain phase-intensity correlation interference relationship. The interference configuration is not limited to a specific microwave field incident angle or polarization configuration. Any configuration that can form two coherent mixing components in a Rydberg atomic medium and produce constructive or destructive interference falls within the protection scope of the present invention. For those skilled in the art, the specific meaning of the above term can be understood according to the specific circumstances.
[0024] In the embodiments of the present invention, the term "multi-parameter measurement" should be interpreted broadly, referring to the measurement of at least one physical quantity among signal field phase, microwave propagation distance, and signal polarization angle within the same interferometric measurement framework. The measurement can be directly completed by reading the intensity of the interferometric output signal without the need for an external phase reference or synchronous trigger signal. Those skilled in the art can understand the specific meaning of the above term according to the specific circumstances.
[0025] like Figure 1-3 As shown, a microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer is described, and its process is as follows: First, a Rydberg atomic interferometry system is constructed, which includes a Rydberg atomic excitation module, a laser frequency control module, an atomic gas cell, a dual local oscillator microwave source module, a photoelectric detection module, and a signal processing module. The Rydberg atom excitation module is used to excite alkali metal (cesium metal) Rydberg atoms to Rydberg atom, or Rydberg superatom, or Rydberg exciton state; The laser frequency control module is used to lock the laser frequency to the resonant cavity. The resonant cavity can be a microcavity or an ultrastable cavity. The atomic gas cell can be any type of hollow structure filled with the Rydberg atomic vapor. The photoelectric detection module is used to detect the detection light signal transmitted through the atomic gas cell; the signal processing module is used to process the interference signal output by the photoelectric detection module.
[0026] The dual local oscillator microwave source module includes a first microwave signal source and a second microwave signal source. The first microwave signal source and the second microwave signal source are respectively processed through frequency division, phase shifting and amplification links to generate two single-frequency local oscillator signals with adjustable phase.
[0027] Then, a Mach-Zehnder interferometer output is constructed by generating dual microwave local oscillators through a dual local oscillator microwave source module, specifically as follows: The dual local oscillator microwave source module generates a first local oscillator microwave field and a second local oscillator microwave field. The frequencies of the first local oscillator microwave field and the second local oscillator microwave field are symmetrically detuned relative to the center frequency of the signal field under test. The first local oscillator microwave field and the second local oscillator microwave field generated by the dual local oscillator microwave source module are two microwave signals that contain symmetrical frequencies and have a known phase difference in a set spectrum. The known signal is a single-tone signal, or a multi-tone signal, or a frequency comb signal or a frequency modulation signal. Using Rydberg atomic medium as the mixing and interference medium, the microwave field of the signal to be measured is multi-wave mixed with the first local oscillator microwave field and the second local oscillator microwave field to generate two signals with the same frequency and coherent interference in the atomic gas chamber, forming a Mach-Zehnder type interference output; The phase difference between the first local oscillator microwave field and the second local oscillator microwave field is adjusted by electronic control to achieve the translation of the interference fringes, so that the interference critical point is set at any position of the phase of the signal to be measured, thereby realizing unambiguous phase measurement in the full range from 0° to 360°.
[0028] Next, by analyzing the changes in the intensity of the interference output signal caused by the phase, distance, and polarization angle of the signal field under test, high-precision measurement of multiple parameters, including the phase, distance, and polarization angle of the signal field under test, can be achieved.
[0029] The signal processing module is used to perform electrical signal processing, and / or optical signal processing, and / or quantum signal processing on the signals obtained by the signal detection module, thereby obtaining the required information. The signal processing module acquires measurement results for signal-defined parameters through signal processing procedures including bandpass filtering and contrast extraction.
[0030] The signal field distance measurement is based on the distance-phase-intensity conversion mechanism. The signal processing module acquires and analyzes the changes in the interference intensity output by the interference configuration, obtains the spatial propagation cumulative phase of the microwave signal based on the interference intensity inversion, and thus obtains the microwave propagation distance, thereby realizing high-precision measurement of the microwave distance of the signal field to be measured.
[0031] The polarization angle measurement of the signal field is based on the polarization-phase-intensity conversion mechanism. The signal processing module acquires and analyzes the change in interference intensity of the interference configuration output, obtains the effective projected electric field amplitude of the microwave signal based on the interference intensity inversion, and thus obtains the polarization angle of the microwave signal, realizing high-precision measurement of the polarization angle of the signal field to be measured.
[0032] See Figure 1 , Figure 1 (a) shows a schematic diagram of the cesium atom energy level structure used in this invention. A probe beam is coupled to the transition from the ground state 6S1 / 2 to the intermediate state 6P3 / 2, and a coupling beam is coupled to the transition from the intermediate state 6P3 / 2 to the Rydberg state 50D5 / 2. The probe beam and the coupling beam work together to form a stepped electromagnetic induction transparent configuration. A first local oscillator microwave field and a second local oscillator microwave field are coupled to the transition from the Rydberg state 50D5 / 2 to 51P3 / 2, respectively. The frequencies of the two local oscillator microwave fields are symmetrically detuned relative to the center frequency of the signal field under test. The signal field under test is also coupled to the transition from 50D5 / 2 to 51P3 / 2, and undergoes multi-wave mixing with the two local oscillator microwave fields within the Rydberg atomic medium, generating two signals with the same intermediate frequency. These signals coherently superimpose within the atomic gas chamber, forming a Mach-Zehnder type interference output. The intensity of the interference output is uniquely determined by the signal field phase, which is further correlated with the microwave propagation distance and the signal polarization angle, thereby achieving high-precision measurement of multiple parameters.
[0033] See Figure 1 This is a schematic diagram of the microwave multi-parameter measurement system based on a dual-local-oscillator Rydberg atomic interferometer of the present invention. The system structure is as follows: Figure 1 As shown in (b), the probe beam first passes through the first dichroic mirror, then through the atomic gas cell, and then through the second dichroic mirror before entering the photoelectric detection module. The coupling beam is reflected by the first dichroic mirror, passes through the atomic gas cell, and is reflected by the second dichroic mirror, thus achieving anti-linear propagation with the probe beam in the atomic gas cell. The atomic gas cell is filled with ground-state atoms. The probe beam and the coupling beam work together in the atomic gas cell to excite the ground-state atoms to the Rydberg state, forming Rydberg atoms. The first and second local oscillator microwave fields are radiated into the atomic gas cell, respectively. The signal field to be measured is emitted and radiated into the atomic gas cell using an additional horn antenna. The three microwave fields act together on the Rydberg atoms. The Rydberg atoms form spectral characteristics corresponding to the electromagnetic induction transparency effect on the transmission spectrum of the probe beam. The signal detection module reads the microwave field information sensed by the Rydberg atoms by measuring the light intensity change of the probe beam, converts it into an electrical signal, and transmits it to the signal processing module via a signal cable. Finally, it completes the high-precision measurement of at least one physical quantity among the signal field phase, microwave propagation distance, and signal polarization angle.
[0034] Within the aforementioned system framework, for signal field phase measurement, such as Figure 2 (a) shows a schematic diagram of the time-domain waveform of the interference output formed by the coherent superposition of two intermediate frequency signals during dual local oscillator interference. The first local oscillator microwave field mixes with the signal field to generate the first intermediate frequency signal, and the second local oscillator microwave field mixes with the signal field to generate the second intermediate frequency signal. The two intermediate frequency signals have the same frequency and coherently superimpose within the Rydberg atomic medium to form the interference output. When the phase of the signal field changes, the relative phase of the two intermediate frequency signals changes accordingly, and the amplitude of the interference output exhibits periodic changes.
[0035] Figure 2 (b) shows a schematic diagram of the response curve of the interference output signal intensity as a function of the signal field phase. As shown in the figure, the interference intensity varies with the signal field phase in a cosine periodic manner, and there is a one-to-one correspondence between the minimum position of the interference intensity and the phase of the signal field. Since the interference intensity can be directly read by the photoelectric detection module without the need for an external phase reference signal or synchronous trigger signal, the phase information of the signal field to be measured can be directly obtained by recording the interference intensity and locating its minimum position. By electronically adjusting the relative phase difference between the first local oscillator microwave field and the second local oscillator microwave field, the interference response curve can be shifted along the phase axis, thereby setting the interference critical point at any signal phase. Combined with the single local oscillator coarse measurement mode to determine the interference branches, high-precision phase measurement without ambiguity can be achieved in the full range from 0° to 360°.
[0036] Within the aforementioned system framework, for microwave propagation distance measurement and signal polarization angle measurement, such as Figure 3 As shown. Figure 3 A schematic diagram of the experimental configuration for microwave distance measurement and polarization angle measurement of the present invention is shown. Figure 3 As shown, the first and second local oscillator fields are radiated to the atomic gas cell via the first microwave horn antenna, while the signal field to be measured is radiated to the atomic gas cell via the second microwave horn antenna. The spatial propagation distance between horn 2 and horn 1 is denoted as d. After propagating over distance d, the signal field reaches the atomic gas cell, and its propagation distance information is encoded in the cumulative phase of the signal field. This cumulative phase is converted into a change in interference intensity through a dual-local oscillator interference configuration. By reading the interference intensity, the microwave propagation distance can be inverted, achieving high-precision distance measurement. Simultaneously, horn 2 can rotate in the yz plane, and the angle between its polarization direction and the reference polarization axis of horn 1 is denoted as... θ sig , defined as the signal polarization angle. When the polarization angle changes, the effective electric field amplitude of the signal field experienced by the Rydberg atom follows cos( θ sigThe amplitude of the signal field changes regularly, and this change is equivalently converted into a change in interference intensity through a dual-local oscillator interference configuration. By reading the interference intensity, the microwave polarization angle can be inverted, achieving high-precision polarization angle measurement. By configuring the operating point near the critical point of the interference response curve, the measurement resolution of both distance and polarization angle can be significantly improved simultaneously. The interferometric measurement framework of this invention maps the three physical quantities—signal field phase, microwave propagation distance, and signal polarization angle—to a unified change in interference intensity, enabling simultaneous high-precision measurement of multiple parameters within the same system.
[0037] In some embodiments of the present invention, the configuration of the local oscillator and interferometric operating points required for achieving high-precision multi-parameter microwave measurement is determined by the specific application scenario; the frequency detuning of the first local oscillator microwave field and the second local oscillator microwave field can be configured symmetrically or asymmetrically; the intensity distribution of the first local oscillator microwave field and the second local oscillator microwave field can be equal or unequal; the phase difference between the two local oscillator microwave fields can be a fixed value or can be continuously scanned by electronic control to configure the interference critical point at any position of the phase of the signal to be measured; the first local oscillator microwave field and the second local oscillator microwave field can be continuous wave microwave signals or pulse modulation signals.
[0038] In some embodiments of the present invention, the form of the atomic gas cell and the microwave coupling structure is determined by the specific application scenario. It can be a traditional glass gas cell with an external microwave horn antenna, or an integrated micro-fabricated gas cell, a photonic crystal waveguide with a hollow structure, or the microwave electrode or coplanar waveguide can be directly integrated on the gas cell surface to achieve efficient field coupling. The microwave field can be coupled to the atomic gas cell through free space radiation, or through a waveguide or transmission line structure in a near-field manner. The specific coupling method is determined by the measurement accuracy, spatial resolution and system integration required by the application scenario.
[0039] In some embodiments of the present invention, the form of the photoelectric detection module used in the Rydberg atomic interferometry system is determined by the specific application scenario. It can be a balanced photodetector to suppress common-mode noise of the probe light, or a differential detection structure or a multi-channel parallel detection array. The signal processing module can use a real-time digital signal processing device, or a field-programmable gate array or an application-specific integrated circuit to achieve high-speed signal processing. The signal processing module can determine the phase of the signal to be measured by extracting the location of the minimum value of the interference signal intensity, or it can invert the signal field phase, microwave propagation distance and signal polarization angle by fitting the interference response curve or by looking up a table.
[0040] The above description is merely an embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of the claims of this application.
Claims
1. A microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer, the process of which is as follows: First, a Rydberg atomic interferometry system is constructed, which includes a Rydberg atomic excitation module, an atomic gas cell, a dual local oscillator microwave source module, a photoelectric detection module, and a signal processing module. The atomic gas cell can be any type of hollow structure filled with Rydberg atomic vapor. The photoelectric detection module is used to detect the detection light signal transmitted through the atomic gas cell. The signal processing module is used to process the interference signal output by the photoelectric detection module. Then, a Mach-Zehnder interferometer output is constructed by generating dual microwave local oscillators through a dual local oscillator microwave source module, specifically as follows: The dual local oscillator microwave source module generates a first local oscillator microwave field and a second local oscillator microwave field. The frequencies of the first local oscillator microwave field and the second local oscillator microwave field are symmetrically detuned relative to the center frequency of the signal field under test. The first local oscillator microwave field and the second local oscillator microwave field generated by the dual local oscillator microwave source module are two microwave signals that contain symmetrical frequencies and have a known phase difference in a set spectrum. The known signal is a single-tone signal, or a multi-tone signal, or a frequency comb signal or a frequency modulation signal. Using Rydberg atomic medium as the mixing and interference medium, the microwave field of the signal to be measured is multi-wave mixed with the first local oscillator microwave field and the second local oscillator microwave field to generate two signals with the same frequency and coherent interference in the atomic gas chamber, forming a Mach-Zehnder type interference output; Next, by analyzing the changes in the intensity of the interference output signal caused by the phase, distance, and polarization angle of the signal field under test, the measurement of multiple parameters, including the phase, distance, and polarization angle of the signal field under test, can be achieved.
2. The microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer as described in claim 1, characterized in that: The phase difference between the first local oscillator microwave field and the second local oscillator microwave field is adjusted by electronic control to achieve the translation of the interference fringes, so that the interference critical point is set at any position of the phase of the signal to be measured, thereby realizing unambiguous phase measurement in the full range from 0° to 360°.
3. The microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer as described in claim 2, characterized in that: The signal processing module is used to perform electrical signal processing, and / or optical signal processing, and / or quantum signal processing on the signals obtained by the signal detection module, thereby obtaining the required information.
4. The microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer as described in claim 5, characterized in that: The signal processing module obtains measurement results for the set parameters of the signal through a signal processing procedure including bandpass filtering and contrast extraction.
5. The microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer as described in claim 4, characterized in that: The signal field distance measurement is based on a distance-phase-intensity conversion mechanism. The signal processing module acquires and analyzes the changes in interference intensity output by the interference configuration, obtains the spatial propagation cumulative phase of the microwave signal based on the interference intensity inversion, and thus obtains the microwave propagation distance, thereby realizing high-precision measurement of the microwave distance of the signal field to be measured.
6. The microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer as described in claim 4, characterized in that: The polarization angle measurement of the signal field is based on the polarization-phase-intensity conversion mechanism. The signal processing module acquires and analyzes the change in interference intensity output by the interference configuration, obtains the effective projected electric field amplitude of the microwave signal based on the interference intensity inversion, and thus obtains the polarization angle of the microwave signal, thereby realizing high-precision measurement of the polarization angle of the signal field to be measured.
7. A microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer as described in any one of claims 1-6, characterized in that: The atoms used in the Rydberg atom interferometry system are Rydberg atoms, or Rydberg superatoms, or Rydberg excitons; the types of atoms used in the Rydberg atom are alkali metal Rydberg atoms, or alkaline earth metal Rydberg atoms, or other atoms that can be excited to highly excited states.
8. A microwave multi-parameter measurement method based on a dual-local-oscillator Rydberg atomic interferometer as described in any one of claims 1-6, characterized in that: The Rydberg atom excitation module described herein uses single-photon, two-photon, and three-photon excitation methods to excite atoms.