A multi-station automated testing apparatus and method for assembly screens

Abstract

The application discloses a multi-station assembly screen switchable testing device and method. The device comprises a master control ARM, a PLC control module, an EDP signal switching module, a power supply switching module, an IIC and SPI signal switching module, a DC-DC circuit and a signal generator. Through the cooperative control of the PLC and the ARM, the testing signal generated by a single signal generator is switched to four testing stations A, B, C and D as required, and time-sharing multiplex testing is realized. The application solves the problem of low utilization of the traditional testing mode equipment, can improve the utilization of the machine by more than 80%, shorten the production rhythm, and improve the testing capacity and the automation level.

Description

Technical Field

[0001] This invention relates to the field of display screen testing technology, and more specifically to a multi-station automated testing device and method for assembly screens. Background Technology

[0002] In the production testing phase of assembly screens (such as LCD modules), high-precision signal generators are needed to generate specific EDP (Embedded DisplayPort) video signals, stable power supply voltages, and IIC / SPI control signals to illuminate the screen and test its display function, power consumption, and communication. The traditional testing model is one machine per screen, meaning one signal generator is fixedly connected to and tests the screen at one workstation. When the production line has multiple testing workstations (e.g., four) to increase capacity, each workstation needs an independent signal generator. However, since the screen loading, fixing, testing, and unloading operations are performed sequentially, typically only one workstation is in actual testing at any given time. This results in the signal generators at other workstations being idle and waiting, leading to extremely low utilization of expensive testing equipment. For example, with four workstations, the theoretical time utilization rate of the signal generator is only about 25%. This model not only results in high equipment investment costs but also becomes a bottleneck restricting the reduction of testing cycle time and overall capacity improvement. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to overcome the defects of low utilization rate of signal generator equipment, long test cycle and limited production capacity due to the number of equipment in the multi-station screen test of the prior art, and to provide a multi-station assembly screen switchable test device and method that can realize time-division multiplexing of signal sources and significantly improve equipment utilization and test efficiency.

[0004] To solve the above technical problems, the present invention adopts the following technical solution: a multi-station assembly screen switchable testing device, comprising: a main control ARM, a PLC control module, an EDP signal switching module, a power switching module, an IIC and SPI signal switching module, a DC-DC circuit, and a signal generator; The main control ARM is connected to the PLC control module, the EDP signal switching module, the power switching module, and the IIC and SPI signal switching module, respectively. The EDP signal switching module is connected to the EDP signal input module and the DC-DC circuit, the power switching module is connected to the power input module and the DC-DC circuit, and the IIC and SPI signal switching module is connected to the IIC and SPI signal input module and the DC-DC circuit, respectively. The EDP signal input module, the power input module, and the IIC and SPI signal input module are all connected to the signal generator. The EDP signal switching module, the power switching module, and the IIC and SPI signal switching module are all connected to signal output modules A, B, C, and D, respectively. The DC-DC circuit is used to supply power to the main control ARM, the PLC control module, the EDP signal switching module, the power switching module, and the IIC and SPI signal switching module.

[0005] Furthermore, the DC-DC circuit outputs voltages including +3.3V and +5V.

[0006] Furthermore, the main control ARM uses an STM32F103 chip.

[0007] Furthermore, the multi-station assembly screen switchable testing device also includes a PLC-controlled relay, which is connected to the PLC control module and used to input control commands for station switching.

[0008] Furthermore, the signal generator is used to output the EDP signal, power supply voltage, IIC signal, and SPI signal required to light up the screen under test.

[0009] Furthermore, the main control ARM is also configured to: after controlling the EDP signal switching module, the power switching module and the IIC and SPI signal switching module to perform channel switching, read the status feedback signals of each switching module to perform switching verification.

[0010] Furthermore, the PLC control module is configured to send switching instructions for different workstations to the main control ARM through the relays controlled by the PLC in sequence according to a preset test task queue.

[0011] Furthermore, the main control ARM is also configured to upload test result data containing the identifier of the workstation through the communication interface after completing the test of a workstation.

[0012] A multi-station assembly screen switchable testing method based on the above-mentioned device includes the following steps: receiving a station selection instruction; according to the station selection instruction, controlling the EDP signal switching module, the power switching module, and the IIC and SPI signal switching module to switch the test signal generated by the signal generator to the signal output module corresponding to the selected station; and providing a test signal to the assembly screen under test at the selected station through the signal output module for testing.

[0013] A testing system for performing the above method includes: a multi-station assembly screen switchable testing device as described above, and a host computer communicatively connected to the device; the host computer is used to send test task queues to the device and / or receive test result data from the device.

[0014] This invention achieves intelligent time-division multiplexing of test signal sources across multiple workstations through the collaboration of a single signal generator and a multi-channel switching device. This fundamentally changes the binding relationship between test resources and workstations, increases the effective working time ratio of core test equipment, improves the overall equipment utilization rate, and thus significantly reduces the equipment amortization cost of single-screen testing. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure of a multi-station automated testing device for an assembly screen proposed in this invention. Detailed Implementation

[0016] This embodiment provides a multi-station assembly screen switchable testing device. (Reference) Figure 1 The device includes a main control ARM10, a PLC control module 60, an EDP signal switching module 20, a power switching module 30, an IIC and SPI signal switching module 40, a DC-DC circuit 50, and a signal generator 80.

[0017] The main control ARM10 serves as the control core, and its chip model can be, for example, STMicroelectronics' STM32F103 series microcontroller. This main control ARM10 connects to the EDP signal switching module 20, power switching module 30, and IIC and SPI signal switching module 40 via an SPI (Serial Peripheral Interface) bus and multiple general purpose input / output (GPIO) pins to implement control signals. Simultaneously, the main control ARM10 communicates with the PLC control module 60 via a UART (Universal Asynchronous Receiver / Transmitter) serial port.

[0018] The PLC control module 60 can be a standard small PLC unit (such as the Siemens S7-1200 series) responsible for interacting with external production systems or operation panels and receiving advanced control commands.

[0019] EDP ​​signal switching module 20 is used to switch high-speed video signals. Its input terminal is connected to EDP signal input module 100, which is responsible for impedance matching and connection with the EDP signal output port of signal generator 80. EDP signal switching module 20 can be implemented using a four-channel EDP multiplexer chip (such as ADI's ADV3225), which is configured by the main control ARM10 via the SPI bus.

[0020] The power switching module 30 is used to switch DC power supplies. Its input terminal is connected to the power input module 90, which is connected to the programmable power output port of the signal generator 80. The power switching module 30 can be constructed using a high-current-capacity analog switch or multiplexer, and is controlled by the main controller ARM10 via GPIO.

[0021] The IIC and SPI signal switching module 40 is used to switch low-speed control signals. Its input terminal is connected to the IIC and SPI signal input module 110, which is connected to the IIC and SPI control signal output ports of the signal generator 80. This module can be implemented using a multi-channel digital signal switching chip, and is also controlled by the main controller ARM10 via SPI or I2C bus.

[0022] The DC-DC circuit 50 converts the externally input DC power supply (such as +12V or +24V industrial power) into stable +3.3V and +5V voltages. The +3.3V mainly powers the main control ARM10 and the control sections of each switching module; the +5V mainly powers the PLC control module 60, the analog sections of each switching module, and the interface circuits of the signal input / output modules.

[0023] Signal generator 80 is a high-performance display test signal source that can synchronously generate EDP video signals conforming to the specifications of the screen under test, programmable power supply voltages, and IIC / SPI configuration signals for initializing the screen.

[0024] The EDP signal switching module 20, power switching module 30, and IIC and SPI signal switching module 40 each have four independent output channels. These four output channels are respectively connected to physical interface signal output modules A130, B140, C150, and D160. Signal output modules A130, B140, C150, and D160 are four identical output interface boards, which are installed at workstations A, B, C, and D of the test production line, respectively, for connecting to the screen 120 of the assembly under test.

[0025] Furthermore, in this embodiment, the DC-DC circuit 50 specifically adopts a DC-DC power module with a wide input voltage range and dual outputs, such as Murata's MUN12AD05-S3.3. This module converts the external +12V input into isolated +5V and +3.3V outputs, where the +5V output powers the PLC control module 60 and the analog switching chip, and the +3.3V output powers the main control ARM10 and the digital logic chip.

[0026] Furthermore, the main control ARM10 chip is specifically selected as the STM32F103RCT6 chip. This chip is based on the ARM Cortex-M3 core and has abundant SPI, UART, and GPIO resources, which are sufficient to meet the needs of controlling multiple switching modules and communicating with the PLC. Its operating voltage is 2.0V to 3.6V, driven by a +3.3V voltage provided by the DC-DC circuit 50.

[0027] Furthermore, in this embodiment, the device also includes a PLC-controlled relay 70. The PLC-controlled relay 70 is an electromagnetic relay group or solid-state relay module directly driven by the digital output point of the PLC control module 60. When the workstation to be tested (e.g., workstation A) is selected externally via a button, touch screen, or host computer software, the instruction is first sent to the PLC control module 60. The PLC control module 60 then drives the corresponding relay (A-channel relay) in the PLC-controlled relay 70 to engage, generating a level signal. This level signal, as a control instruction for workstation switching, is sent to an interrupt pin or a polled GPIO pin of the main control ARM10.

[0028] Furthermore, the signal generator 80 is a comprehensive test instrument integrating video signal generation, programmable DC power supply, and digital interface control functions, such as the Chroma 29300 series. Its EDP signal output port is connected to the EDP signal input module 100 via a coaxial cable; its programmable power output port is connected to the power input module 90 via a power line; and its IIC and SPI control signal ports are connected to the IIC and SPI signal input modules 110 via ribbon cables. The signal generator 80 outputs specific EDP timing sequences, set voltages and currents, and screen initialization data packets according to test requirements.

[0029] To further improve test reliability, the main control ARM10 is also programmed with a switching self-test function. Specifically, taking the EDP signal switching module 20 as an example, its ADV3225 chip has a digital status feedback pin. After the main control ARM10 sends a command via the SPI bus to switch the channel to the channel corresponding to workstation A, the main control ARM10 will read the status feedback signal of the ADV3225 chip through a GPIO pin configured as an input to confirm whether the currently effective channel address is consistent with the requested channel address. If the read status does not match, the main control ARM10 can determine that the switching has failed and send an error code to the PLC control module 60 via UART, thereby triggering an alarm on the host computer. At the same time, the main control ARM10 can try to resend the switching command or record the fault. If the switching chips used in the power switching module 30 and the IIC and SPI signal switching modules 40 have status feedback functions, the same verification process is performed; if they do not, indirect verification can be performed by reading the readback circuit (such as reading the output voltage through the ADC).

[0030] Furthermore, in this embodiment, the PLC control module 60 can be configured to execute an automated test sequence. The operator or host computer downloads a test task queue (e.g., testing station A, station B, station C, station D sequentially, then looping) to the PLC control module 60. The program inside the PLC control module 60 then controls the corresponding relays in the PLC-controlled relays 70 according to the queue order, thereby automatically sending switching instructions for stations A, B, C, and D to the main control ARM10. Each time the main control ARM10 receives an instruction, it controls each switching module to complete one switching and test. This method achieves continuous automated testing without manual intervention.

[0031] Furthermore, in this embodiment, the main control ARM10 is also configured to have a data reporting function. After completing the test of a workstation (e.g., workstation B), the main control ARM10 will synthesize the test parameters (such as screen current and communication response) returned by the signal generator 80 to generate a test result record. This record explicitly includes the workstation identifier B. Subsequently, the main control ARM10 will send out this test result data containing the workstation identifier B through its other UART port (or Ethernet interface, such as through the W5500 chip extension). This data can be stored and analyzed by an external data acquisition device or directly uploaded to a host computer database connected to the device.

[0032] Furthermore, this embodiment also provides a multi-station assembly screen switchable testing method based on the above-described device. This method is applied to the multi-station assembly screen switchable testing device and specifically includes the following steps: Step S1: Receive the workstation selection instruction. This instruction can come from the PLC control module 60 (triggered by the PLC-controlled relay 70) or from the preset automatic sequence inside the main control ARM10.

[0033] Step S2: Based on the received workstation selection command, the main control ARM10 controls the EDP signal switching module 20, the power switching module 30, and the IIC and SPI signal switching module 40 via SPI and GPIO. For example, when the command is to select workstation C, the main control ARM10 simultaneously configures these three switching modules to switch their respective input signal paths to the output channel connected to the signal output module C150.

[0034] Step S3: The EDP signal, power supply and IIC / SPI signal generated by the signal generator 80 are sent to the signal output module C150 via the EDP signal switching module 20, power switching module 30 and IIC and SPI signal switching module 40 which have been switched to the station C channel, and finally applied to the screen 120 of the assembly under test located at station C, to complete the lighting and testing of the screen.

[0035] Furthermore, this embodiment also provides a test system for executing the multi-station assembly screen switchable test method based on the above-described device. The system includes a multi-station assembly screen switchable test device and a host computer communicatively connected to the device. The host computer can be an industrial personal computer (IPC) with test management software installed. The host computer is connected to the communication interface of the PLC control module 60 and the main control ARM10 via an Ethernet cable. The host computer is used to issue test task queues (such as batch test orders) to the PLC control module 60, and can also directly receive test result data containing station identifiers uploaded by the main control ARM10. The host computer parses, stores, and statistically analyzes the received data, and generates a test report, thereby achieving centralized monitoring and data management of the entire multi-station testing process.

[0036] The above are merely preferred embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A multi-station assembly screen switchable testing device, characterized in that, include: The system includes a main control ARM, a PLC control module, an EDP signal switching module, a power switching module, an IIC and SPI signal switching module, a DC-DC circuit, and a signal generator; the main control ARM is connected to the PLC control module, the EDP signal switching module, the power switching module, and the IIC and SPI signal switching module respectively. The EDP signal switching module is connected to the EDP signal input module and the DC-DC circuit, respectively. The power switching module is connected to the power input module and the DC-DC circuit, respectively. The IIC and SPI signal switching modules are connected to the IIC and SPI signal input modules and the DC-DC circuit, respectively. The EDP signal input module, the power input module, and the IIC and SPI signal input modules are all connected to the signal generator. The EDP signal switching module, the power switching module, and the IIC and SPI signal switching module are all connected to signal output modules A, B, C, and D, respectively. The DC-DC circuit is used to supply power to the main control ARM, the PLC control module, the EDP signal switching module, the power switching module, and the IIC and SPI signal switching module.

2. The multi-station assembly screen switchable testing device according to claim 1, characterized in that, The DC-DC circuit outputs voltages including +3.3V and +5V.

3. The multi-station assembly screen switchable testing device according to claim 1, characterized in that, The main control ARM uses an STM32F103 chip.

4. The multi-station assembly screen switchable testing device according to claim 1, characterized in that, It also includes a PLC-controlled relay, which is connected to the PLC control module and is used to input control commands for workstation switching.

5. The multi-station assembly screen switchable testing device according to claim 1, characterized in that, The signal generator is used to output the EDP signal, power supply voltage, IIC signal and SPI signal required to light up the screen under test.

6. The multi-station assembly screen switchable testing device according to claim 1, characterized in that, The main control ARM is also configured to: after controlling the EDP signal switching module, the power switching module and the IIC and SPI signal switching module to perform channel switching, read the status feedback signals of each switching module to perform switching verification.

7. The multi-station assembly screen switchable testing device according to claim 4, characterized in that, The PLC control module is configured to send switching commands for different workstations to the main control ARM through the relays controlled by the PLC in sequence according to a preset test task queue.

8. The multi-station assembly screen switchable testing device according to claim 7, characterized in that, The main control ARM is also configured to upload test result data containing the identifier of the workstation through the communication interface after completing the test of a workstation.

9. A method for testing a switchable multi-station assembly screen based on the device according to any one of claims 1 to 8, characterized in that, Includes the following steps: Receive a workstation selection command; according to the workstation selection command, control the EDP signal switching module, power switching module, and IIC and SPI signal switching module to switch the test signal generated by the signal generator to the signal output module corresponding to the selected workstation; provide the test signal to the screen of the assembly under test at the selected workstation for testing through the signal output module.

10. A test system for performing the method as described in claim 9, characterized in that, include: The multi-station assembly screen switchable testing device as described in any one of claims 1 to 8, and the host computer communicatively connected to the device; The host computer is used to send test task queues to the device and / or receive test result data from the device.

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