A 0-to-200-voltage grid scanning method and scanning system

Abstract

The application relates to the technical field of semiconductor device testing, and particularly discloses a 0-200V voltage grid scanning method and a scanning system, which comprises the following steps: in the process of grid scanning of multiple devices, a parallel hardware trigger bus mode is adopted to perform grid scanning, a historical voltage monitoring period is set, the voltage change of each device is stably monitored, the voltage stable starting point of each device is determined, the voltage stable starting points of the devices are compared, the fastest voltage stable starting point and the slowest voltage stable starting point are extracted, a waiting synchronization scanning period is constructed, and isothermal state evaluation is performed in the waiting synchronization scanning period; through the evaluation of the isothermal state in the waiting synchronization scanning period, a thermal state access threshold is set, the device is ensured to be in a thermal uniform state when entering a measurement stage, the efficiency advantage of parallel scanning is retained, the temperature inconsistency risk caused by parallel scanning is controlled through the isothermal evaluation mechanism, and the detection precision during scanning detection is improved.

Description

Technical Field

[0001] This invention relates to the field of semiconductor device testing technology, specifically to a 0 to 200V voltage grid scanning method and scanning system. Background Technology

[0002] As the integration level of semiconductor devices continues to increase, the requirements for the accuracy of DC parameter testing are also becoming higher. In the DC parameter testing of integrated circuits, voltage grid scanning is a commonly used testing method. Its basic process is to control the voltage of the device under test (DUT) to gradually change from one value to another (e.g., from 0V to 200V), and measure the corresponding parameters such as current at each voltage grid point to obtain the IV characteristic curve of the device.

[0003] However, in actual testing, due to differences in the characteristics of the DUT ports connected to each device—for example, some ports have larger parasitic capacitances while others have smaller ones—the voltage rise rates of the devices are not consistent when executing the same voltage switching command. To ensure that all devices perform uniform measurements at the same voltage point, existing solutions typically use the voltage stabilization time of the slowest port as the benchmark for uniformly triggering the measurement; that is, it is necessary to wait for the voltages of all ports to stabilize before performing the measurement.

[0004] The problem lies in the fact that while the voltage at the fastest port (e.g., the gate) has stabilized, the slowest port (e.g., the drain) is still in the process of voltage rise. During this waiting period for synchronous scanning, the slowest port, due to its unstable voltage, still experiences a significant charging current in the circuit. This current generates Joule heat inside the device, causing the device temperature to rise continuously. Because the DUT port characteristics of multiple devices differ, the heating rates and magnitudes of each device are also inconsistent, resulting in significant temperature differences between devices at the moment of unified trigger measurement—that is, they are in a non-isothermal state. Since the current, capacitance, and other parameters of semiconductor devices are highly sensitive to temperature, the data measured in a non-isothermal state inevitably includes systematic errors introduced by temperature. This directly affects the accuracy of the IV characteristic curve and the consistency of data between different voltage grid points, ultimately leading to a decrease in scanning detection accuracy.

[0005] Furthermore, existing technologies lack effective monitoring and evaluation methods for the thermal state during the waiting period for synchronous scanning, typically relying on fixed waiting times or empirical values ​​for control. However, different DUTs have varying capacitive loads and power consumption characteristics at different voltage grid points, and the duration of non-isothermal states fluctuates across multiple scans. Fixed waiting times either fail to cover scan cycles with long non-isothermal durations, resulting in compromised accuracy, or lead to excessive waiting in scan cycles with short non-isothermal durations, severely reducing testing efficiency.

[0006] Therefore, the present invention provides a 0 to 200V voltage grid scanning method and scanning system. Summary of the Invention

[0007] The purpose of this invention is to provide a 0 to 200V voltage grid scanning method and scanning system to solve the aforementioned background problems.

[0008] The objective of this invention can be achieved through the following technical solutions:

[0009] A voltage grid scanning method from 0 to 200V, comprising:

[0010] During the grid scanning process of multiple devices, a parallel hardware trigger bus method is used for grid scanning. The historical voltage monitoring cycle is set, and the voltage change of each device is monitored stably to determine the voltage stability starting point of each device.

[0011] By comparing the voltage stabilization start points of each device, the fastest and slowest voltage stabilization start points are extracted, a waiting period for synchronous scanning is constructed, and analysis is performed during the waiting period for synchronous scanning to complete the isothermal state assessment.

[0012] Extract the non-isothermal start point and non-isothermal end point when the voltage is in a non-isothermal state within multiple historical voltage monitoring cycles, obtain the duration of non-isothermal duration, perform stability analysis on the duration of non-isothermal duration, and determine the stability of the duration of non-isothermal duration.

[0013] Based on the stability of the determined non-isothermal duration, a reference non-isothermal duration is obtained, the step stop duration extension is determined, and the grid scan step stop duration adjustment operation is performed on the slowest voltage stabilization device according to the step stop duration extension.

[0014] As a further aspect of the present invention, the process for stabilizing the device voltage at the initial point is as follows:

[0015] The historical voltage detection cycle is divided into several historical detection points, and the voltage of each device at each historical detection point is obtained as the unit device voltage value to construct the device voltage change curve.

[0016] By combining adjacent coordinate points on the equipment voltage change curve into a voltage regulation analysis group, multiple voltage regulation analysis groups are obtained.

[0017] The slope calculation formula is used to analyze and process the adjacent coordinate points within each voltage stabilization analysis group to obtain the voltage stabilization analysis value of a single group;

[0018] If a single voltage regulation analysis value is within the single voltage regulation analysis range, it is marked as a voltage regulation group. Multiple voltage regulation groups are extracted, and the coordinate point with the earliest time dimension in the voltage regulation group is used as the comparison coordinate point. The comparison coordinate points in multiple voltage regulation groups are compared before and after in the time dimension, and the earliest comparison coordinate point in time is selected as the starting point of equipment voltage stabilization.

[0019] As a further aspect of the present invention, the process for constructing the waiting synchronous scanning period is as follows:

[0020] Compare the voltage stabilization starting points of all devices over time, select the device with the earliest voltage stabilization starting point as the fastest voltage stabilization starting point, and designate the corresponding device to be scanned as the fastest voltage stabilization device.

[0021] The last device voltage stabilization starting point in the time dimension is selected as the slowest voltage stabilization starting point, and the corresponding device to be scanned is selected as the slowest voltage stabilization device.

[0022] The fastest and slowest voltage stabilization start points are used to construct a waiting period for synchronous scanning.

[0023] As a further aspect of the present invention, the analysis process during the waiting period for synchronous scanning is as follows:

[0024] During the waiting period for synchronous scanning, the temperature values ​​of each device in the fastest voltage stabilization device at each historical detection point are obtained as the device temperature values ​​at a single time point.

[0025] The adjacent historical detection points within the waiting period for synchronous scanning are considered as a temperature analysis sub-period.

[0026] Within the temperature analysis sub-period, the standard deviation of the single-time point device temperature value of each device under adjacent and the same historical detection point is calculated to obtain the single-time point temperature standard deviation.

[0027] The device temperature difference value is obtained by summing and averaging the standard deviations of the two single-time points of temperature.

[0028] Extract the temperature value of each device at a single time point during the waiting period for synchronous scanning, and construct the temperature change curve of each device according to the order of the acquired time.

[0029] As a further aspect of the present invention, the process for evaluating the isothermal state is as follows:

[0030] The temperature change curves of individual devices are combined into a temperature change comparison group to obtain multiple temperature change comparison groups.

[0031] Within the temperature change comparison group, the adjacent coordinate points in the temperature change curve of each single device are calculated using the slope calculation formula, and the difference is taken and the absolute value is obtained to obtain the single-adjacent trend difference value.

[0032] Sum all adjacent trend difference values ​​to obtain the temperature trend difference value;

[0033] The device temperature difference value and the temperature trend difference value are normalized and dimensionless, and then summed to obtain the temperature status identification value.

[0034] If the temperature status identification value is greater than the temperature status identification threshold, it will be displayed as a non-isothermal signal.

[0035] As a further aspect of the present invention, the process for obtaining the non-isothermal starting point and the non-isothermal ending point is as follows:

[0036] Within the historical voltage monitoring period, multiple temperature analysis sub-periods that display non-isothermal signals are selected, and the starting historical detection point within the earliest temperature analysis sub-period in the time dimension is selected as the non-isothermal starting point.

[0037] Multiple temperature analysis sub-periods displayed as isothermal signals are selected, and the starting historical detection point within the earliest temperature analysis sub-period in the time dimension is selected as the non-isothermal termination point.

[0038] As a further aspect of the present invention, the process of obtaining the duration of non-isothermal occurrence and performing stability analysis on the duration of non-isothermal occurrence is as follows:

[0039] The time between the non-isothermal start point and the non-isothermal end point is obtained as the non-isothermal duration.

[0040] Extract the duration of non-isothermal duration within each historical voltage monitoring cycle, calculate the standard deviation and mean of the summation, obtain the standard deviation and mean of the non-isothermal duration, and use the coefficient of variation formula to calculate and process the non-isothermal duration analysis value.

[0041] If the non-isothermal duration analysis value is greater than the non-isothermal duration analysis threshold, it will be displayed as a non-isothermal duration fluctuation signal.

[0042] If the non-isothermal duration analysis value is less than or equal to the non-isothermal duration analysis threshold, it is displayed as a non-isothermal duration stable signal.

[0043] As a further aspect of the present invention, the process for obtaining the baseline non-isothermal duration is as follows:

[0044] When the signal is displayed as a non-isothermal duration fluctuation signal, the non-isothermal duration within each historical voltage monitoring cycle is compared, and the maximum and minimum non-isothermal durations are summed and averaged to obtain the baseline non-isothermal duration.

[0045] When the signal is displayed as an isothermal duration fluctuation signal, the mean of the non-isothermal duration within each historical voltage monitoring cycle is summed to obtain the baseline non-isothermal duration.

[0046] As a further aspect of the present invention, the process of determining the step stop duration extension and adjusting the step stop duration for the slowest voltage stabilization device during grid scanning is as follows:

[0047] Extract the duration corresponding to each waiting period for synchronous scanning as the waiting duration for synchronous scanning;

[0048] The sum of the waiting time for synchronous scanning and the baseline non-isothermal duration is used to obtain the adjustment amount for extending the step stop time;

[0049] The extended step stop time corresponding to the slowest voltage stabilizing device is summed with the extended step stop time adjustment amount to obtain the adjusted step stop time of the slowest voltage stabilizing device.

[0050] A 0 to 200V voltage grid scanning system, comprising:

[0051] Voltage stability analysis module: Set the historical voltage monitoring cycle, perform stability monitoring on the voltage changes of each device, and determine the voltage stability starting point of each device;

[0052] Isothermal state assessment module: Compare the voltage stabilization start point of each device, extract the fastest voltage stabilization start point and the slowest voltage stabilization start point, construct a waiting synchronous scanning period, and perform analysis within the waiting synchronous scanning period to complete the isothermal state assessment;

[0053] Non-isothermal duration analysis module: Extracts the non-isothermal start point and non-isothermal end point in multiple historical voltage monitoring cycles, obtains the non-isothermal duration, performs stability analysis on the non-isothermal duration, and determines the stability of the non-isothermal duration.

[0054] Scan parameter adjustment module: Based on the stability of the determined non-isothermal duration, obtain the reference non-isothermal duration, determine the step stop duration extension, and perform grid scan step stop duration adjustment operation on the slowest voltage stabilization device according to the step stop duration extension.

[0055] The beneficial effects of this invention are as follows:

[0056] 1. In the process of grid scanning by multiple devices, this invention adopts a parallel hardware trigger bus method for grid scanning, sets a historical voltage monitoring cycle, performs stable monitoring of voltage changes of each device, determines the voltage stabilization start point of each device, compares the voltage stabilization start points of each device, extracts the fastest and slowest voltage stabilization start points, constructs a waiting period for synchronous scanning, and performs isothermal state assessment during the waiting period. By combining the device temperature difference value and temperature trend difference value during the waiting period, a thermal state entry threshold is set, which ensures that the device is in a thermally uniform state when entering the measurement stage. Thus, it retains the efficiency advantage of parallel scanning, and controls the risk of temperature inconsistency caused by parallelism through the isothermal assessment mechanism, thereby improving the detection accuracy during scanning detection.

[0057] 2. This invention extracts the non-isothermal start point and non-isothermal end point during multiple historical voltage monitoring cycles when the device is in a non-isothermal state, and obtains the duration of the non-isothermal duration. Stability analysis is performed on the duration of the non-isothermal duration to determine its stability. Based on the determined stability of the non-isothermal duration, the step stop time extension is obtained. Based on the step stop time extension, the step stop time of the slowest voltage stabilization device is adjusted using a grid scan. By extending the step stop time, it ensures that the device can fully enter an isothermal state even under the worst thermal fluctuation conditions, thereby eliminating the measurement deviation of current / capacitance characteristics caused by temperature differences. Furthermore, it ensures that the IV characteristic curve is not disturbed by transient temperature changes during subsequent scanning and detection, making the thermal accumulation process of each scan more consistent and controllable, reducing unpredictable thermal shocks, and improving the repeatability of long-term testing and the device's resilience. Attached Figure Description

[0058] The invention will now be further described with reference to the accompanying drawings.

[0059] Figure 1 This is a flowchart of the steps of a 0 to 200V voltage grid scanning method of the present invention;

[0060] Figure 2 This is a flowchart illustrating the judgment process of a 0 to 200V voltage grid scanning method in this invention.

[0061] Figure 3 This is a flowchart of a 0 to 200V voltage grid scanning system according to the present invention. Detailed Implementation

[0062] To make the technical means, creative features, objectives and effects of this invention easier to understand, the invention will be further described below in conjunction with specific embodiments.

[0063] Example 1

[0064] When multiple devices perform grid scanning using a parallel hardware-triggered bus, they simultaneously rise from one voltage value to another (e.g., from 100V to 150V). Due to the different characteristics of the DUT ports connected to each device (e.g., some ports have large capacitance, some have small capacitance), the voltage rise rates differ. Therefore, it's necessary to wait for the slowest port voltage to stabilize before triggering the measurement. However, even after the fastest port (gate) voltage stabilizes, it's still necessary to wait for the slowest port (drain) voltage to stabilize. During this waiting period, the slowest port (drain) may experience a significant current during its voltage rise, generating heat. This can lead to a non-isothermal state during scanning, affecting the accuracy of subsequent scanning. Therefore, if... Figure 1 - Figure 2 As shown, this embodiment provides a 0 to 200V voltage grid scanning method, including:

[0065] Step 1: During the grid scanning process of multiple devices, a parallel hardware trigger bus method is used for grid scanning. The historical voltage monitoring cycle is set, and the voltage change of each device is monitored to determine the voltage stabilization starting point of each device.

[0066] In some embodiments, the historical voltage detection period is equally divided into several historical detection points, wherein the interval between adjacent historical detection points is equal.

[0067] The voltage of each device at each historical detection point is obtained as the unit device voltage value, and the device voltage change curve is constructed with the X-axis representing time and the Y-axis representing voltage according to the time sequence of obtaining the unit device voltage values;

[0068] By combining adjacent coordinate points on the equipment voltage change curve into a voltage regulation analysis group, multiple voltage regulation analysis groups are obtained.

[0069] The slope calculation formula is used to analyze and process the adjacent coordinate points within each voltage stabilization analysis group to obtain the voltage stabilization analysis value of a single group;

[0070] If the single-group voltage regulation analysis value is not within the single-group voltage regulation analysis range, it indicates that the equipment output voltage is in an upward trend or a downward trend, and the analyzed voltage regulation analysis group is marked as an unregulated group.

[0071] If the single-group voltage regulation analysis value is within the single-group voltage regulation analysis range, it indicates that the equipment output voltage is in a stable trend stage, and the analyzed voltage regulation analysis group is marked as a voltage regulation group.

[0072] Multiple voltage regulator groups are extracted separately, and the coordinate point with the earliest time dimension in the voltage regulator group is used as the comparison coordinate point. The comparison coordinate points in multiple voltage regulator groups are compared before and after in the time dimension, and the earliest comparison coordinate point in time is selected as the starting point of device voltage stabilization.

[0073] It should be noted that the single-group voltage regulation analysis interval is a pre-defined numerical range used to determine whether the voltage change slope formed by a group of adjacent voltage sampling points has reached a stable voltage state. It is a quantitative threshold range for qualitatively judging the single-group voltage regulation analysis value (i.e., the voltage change slope of adjacent detection points). Specifically, the historical voltage monitoring period is divided into equally spaced historical detection points, and adjacent time-voltage coordinate points are grouped into a voltage regulation analysis group. The single-group voltage regulation analysis value (essentially the voltage change rate per unit time) is then calculated using the slope formula. The single-group voltage regulation analysis interval is the judgment range defined for this slope value.

[0074] Step 2: Compare the voltage stabilization start points of each device, extract the fastest and slowest voltage stabilization start points, construct a waiting period for synchronous scanning, and conduct isothermal state assessment during the waiting period for synchronous scanning.

[0075] In some embodiments, the voltage stabilization start points of all devices are compared before and after in the time dimension, and the device voltage stabilization start point that is the earliest in the time dimension is selected as the fastest voltage stabilization start point, and the corresponding device to be scanned and detected is selected as the fastest voltage stabilization device.

[0076] Similarly, the last stable voltage starting point of the device in the time dimension is selected as the slowest voltage stabilization starting point, and the corresponding device to be scanned is selected as the slowest voltage stabilization device.

[0077] The fastest voltage stabilization start point and the slowest voltage stabilization start point are used to construct a waiting period for synchronous scanning.

[0078] During the waiting period for synchronous scanning, the temperature values ​​of each device in the fastest voltage stabilization device at each historical detection point are obtained as the device temperature values ​​at a single time point.

[0079] The adjacent historical detection points within the waiting period for synchronous scanning are considered as a temperature analysis sub-period.

[0080] Within the temperature analysis sub-period, the standard deviation of the single-time point device temperature value of each device under adjacent and the same historical detection point is calculated to obtain the single-time point temperature standard deviation.

[0081] The device temperature difference value is obtained by summing and averaging the standard deviations of the two single-time points of temperature.

[0082] Extract the single-time point device temperature value of each device during the waiting period for synchronous scanning, and construct a single device temperature change curve with the X-axis as time and the Y-axis as temperature according to the order of the acquired time.

[0083] It should be noted that each device has a corresponding temperature change curve during the waiting period for synchronous scanning;

[0084] The temperature change curves of individual devices are combined into a temperature change comparison group to obtain multiple temperature change comparison groups.

[0085] Within the temperature change comparison group, the adjacent coordinate points in the temperature change curve of each single device are calculated using the slope calculation formula, and the difference is taken and the absolute value is obtained to obtain the single-adjacent trend difference value.

[0086] Sum all adjacent trend difference values ​​to obtain the temperature trend difference value;

[0087] The device temperature difference value and the temperature trend difference value are normalized and dimensionless, and then summed to obtain the temperature status identification value.

[0088] It can be understood that the temperature status identification value represents a comprehensive measure of the degree of temperature difference and the degree of temperature change difference among the devices at this moment. On the one hand, the device temperature difference value reflects the degree of temperature difference between different devices at the same time. On the other hand, the temperature trend difference value reflects the degree of temperature change trend difference among different devices. Specifically, if the temperature status identification value is larger, it indicates that the degree of temperature difference and temperature change difference among the devices is larger. If the temperature status identification value is smaller, it indicates that the degree of temperature difference and temperature change difference among the devices is smaller.

[0089] If the temperature status identification value is greater than the temperature status identification threshold, it indicates that the temperature difference between the various devices and the temperature change difference are large, and it is displayed as a non-isothermal signal.

[0090] If the temperature status identification value is less than or equal to the temperature status identification threshold, it indicates that the temperature difference between the various devices and the temperature change difference are small, and it is displayed as an isothermal signal.

[0091] It should be noted that the temperature state identification threshold is specifically designed for scenarios where multiple devices perform parallel hardware-triggered bus scanning and the capacitive load of the DUT ports varies greatly. Its core function is to provide a clear thermal state qualification boundary during the synchronization period while waiting for the slowest port voltage to stabilize. This ensures that measurements can only be triggered uniformly after the thermal uniformity of the devices meets the requirements, thereby guaranteeing the accuracy of the scanning detection. It is a pre-set quantitative critical standard used to determine whether each device under test has reached an isothermal state during the waiting period for synchronous scanning. It is a boundary value for the qualification judgment of the temperature state identification value.

[0092] The specific solution in this embodiment is as follows: During the grid scanning process of multiple devices, a parallel hardware trigger bus method is used for grid scanning. A historical voltage monitoring cycle is set, and the voltage change of each device is monitored stably to determine the voltage stabilization starting point of each device. The voltage stabilization starting points of each device are compared to extract the fastest and slowest voltage stabilization starting points, constructing a waiting period for synchronous scanning. During the waiting period for synchronous scanning, isothermal state assessment is performed. By combining the device temperature difference value and temperature trend difference value during the waiting period for synchronous scanning, a thermal state entry threshold is set. This mechanism ensures that the device is in a thermally uniform state when entering the measurement stage. Thus, it retains the efficiency advantage of parallel scanning and controls the risk of temperature inconsistency caused by parallel scanning through the isothermal assessment mechanism, thereby improving the detection accuracy during scanning detection.

[0093] Example 2

[0094] like Figure 1 - Figure 2 As shown, this embodiment provides a 0 to 200V voltage grid scanning method, which also includes:

[0095] Step 3: Extract the non-isothermal start point and non-isothermal end point when the voltage is in a non-isothermal state within multiple historical voltage monitoring cycles, obtain the duration of non-isothermal duration, perform stability analysis on the duration of non-isothermal duration, and determine the stability of the duration of non-isothermal duration.

[0096] In some embodiments, within a historical voltage monitoring period, multiple temperature analysis sub-periods that are displayed as non-isothermal signals are selected, and the starting historical detection point within the earliest temperature analysis sub-period in the time dimension is selected as the non-isothermal starting point.

[0097] Multiple temperature analysis sub-periods displayed as isothermal signals are selected, and the starting historical detection point within the earliest temperature analysis sub-period in the time dimension is selected as the non-isothermal termination point.

[0098] It should be noted that the case where the temperature analysis sub-periods of non-isothermal signals and isothermal signals overlap are not considered.

[0099] Specifically, the starting detection point of the first consecutive sub-segment is recorded as the non-isothermal starting point only when multiple consecutive temperature analysis sub-segments output non-isothermal signals; similarly, the starting detection point of the first consecutive sub-segment is recorded as the non-isothermal ending point only when multiple consecutive temperature analysis sub-segments recover to isothermal signals.

[0100] The time between the non-isothermal start point and the non-isothermal end point is obtained as the non-isothermal duration.

[0101] Extract the duration of non-isothermal duration within each historical voltage monitoring cycle, and calculate the average of the summations to obtain the average duration of non-isothermal duration.

[0102] The standard deviation of the non-isothermal duration within each historical voltage monitoring cycle is calculated to obtain the standard deviation of the non-isothermal duration.

[0103] The standard deviation and mean of non-isothermal duration were calculated using the coefficient of variation formula to obtain the analysis value of non-isothermal duration.

[0104] Understandably, the meaning of the non-isothermal duration analysis value is: a relative fluctuation index that measures whether the duration of the non-isothermal state is stable in multiple scans. It is mainly used to reflect whether the duration of the non-isothermal state is consistent and predictable in different scan cycles. Specifically, if the non-isothermal duration analysis value is larger, it means that the duration of the non-isothermal state varies greatly in each cycle and the degree of fluctuation is greater. If the non-isothermal duration analysis value is smaller, it means that the duration of the non-isothermal state varies less in each cycle and the degree of fluctuation is smaller.

[0105] If the non-isothermal duration analysis value is greater than the non-isothermal duration analysis threshold, it indicates that the duration of the non-isothermal state varies greatly in each cycle and the degree of fluctuation is large, which is displayed as a non-isothermal duration fluctuation signal.

[0106] If the non-isothermal duration analysis value is less than or equal to the non-isothermal duration analysis threshold, it indicates that the duration of the non-isothermal state varies little in each cycle and the degree of fluctuation is small, which is displayed as a stable non-isothermal duration signal.

[0107] Step 4: Based on the stability of the determined non-isothermal duration, obtain the reference non-isothermal duration, determine the step stop duration extension, and perform grid scanning step stop duration adjustment operation on the slowest voltage stabilization device according to the step stop duration extension.

[0108] In some embodiments, when the non-isothermal duration fluctuation signal is displayed, the non-isothermal duration within each historical voltage monitoring cycle is compared, and the maximum and minimum non-isothermal durations are summed and averaged to obtain the reference non-isothermal duration.

[0109] When the signal is displayed as an isothermal duration fluctuation signal, the average of the non-isothermal duration within each historical voltage monitoring cycle is summed to obtain the baseline non-isothermal duration.

[0110] Extract the duration corresponding to each waiting period for synchronous scanning as the waiting duration for synchronous scanning;

[0111] The sum of the waiting time for synchronous scanning and the baseline non-isothermal duration is used to obtain the adjustment amount for extending the step stop time;

[0112] The extended step stop time corresponding to the slowest voltage stabilizing device is summed with the extended step stop time adjustment amount to obtain the adjusted step stop time of the slowest voltage stabilizing device.

[0113] The specific solution in this embodiment is as follows: Extract the non-isothermal start point and non-isothermal end point during multiple historical voltage monitoring cycles when the device is in a non-isothermal state, and obtain the duration of the non-isothermal duration. Perform stability analysis on the duration of the non-isothermal duration to determine its stability. Based on the determined stability of the duration of the non-isothermal duration, obtain the step stop time extension amount. Based on the step stop time extension amount, perform grid scan step stop time adjustment operation on the slowest voltage stabilization device. By extending the step stop time, ensure that the device can fully enter an isothermal state even under the worst thermal fluctuation conditions, thereby eliminating the measurement deviation of current / capacitance characteristics caused by temperature differences. Furthermore, ensure that the IV characteristic curve is not disturbed by transient temperature changes during subsequent scanning and detection, making the thermal accumulation process of each scan more consistent and controllable, reducing unpredictable thermal shocks, and improving the repeatability of long-term testing and the device's tolerance.

[0114] Example 3

[0115] like Figure 3 As shown, this embodiment provides a 0 to 200V voltage grid scanning system, which also includes:

[0116] Voltage stability analysis module: Set the historical voltage monitoring cycle, perform stability monitoring on the voltage changes of each device, and determine the voltage stability starting point of each device;

[0117] Isothermal state assessment module: Compare the voltage stabilization start point of each device, extract the fastest voltage stabilization start point and the slowest voltage stabilization start point, construct a waiting synchronous scanning period, and perform analysis within the waiting synchronous scanning period to complete the isothermal state assessment;

[0118] Non-isothermal duration analysis module: Extracts the non-isothermal start point and non-isothermal end point in multiple historical voltage monitoring cycles, obtains the non-isothermal duration, performs stability analysis on the non-isothermal duration, and determines the stability of the non-isothermal duration.

[0119] Scan parameter adjustment module: Based on the stability of the determined non-isothermal duration, obtain the reference non-isothermal duration, determine the step stop duration extension, and perform grid scan step stop duration adjustment operation on the slowest voltage stabilization device according to the step stop duration extension.

[0120] The foregoing has provided a detailed description of one embodiment of the present invention, but this description is merely a preferred embodiment and should not be construed as limiting the scope of the invention. All equivalent variations and modifications made within the scope of the present invention should still fall within the scope of the present invention.

Claims

1. A method for scanning a voltage grid from 0 to 200V, characterized in that: include: During the grid scanning process of multiple devices, a parallel hardware trigger bus method is used for grid scanning. The historical voltage monitoring cycle is set, and the voltage change of each device is monitored stably to determine the voltage stability starting point of each device. By comparing the voltage stabilization start points of each device, the fastest and slowest voltage stabilization start points are extracted, a waiting period for synchronous scanning is constructed, and analysis is performed during the waiting period for synchronous scanning to complete the isothermal state assessment. Extract the non-isothermal start point and non-isothermal end point in multiple historical voltage monitoring cycles, obtain the duration of non-isothermal conditions, perform stability analysis on the duration of non-isothermal conditions, and determine the stability of the duration of non-isothermal conditions. Based on the stability of the determined non-isothermal duration, a reference non-isothermal duration is obtained, the step stop duration extension is determined, and the grid scan step stop duration adjustment operation is performed on the slowest voltage stabilization device according to the step stop duration extension.

2. The 0 to 200V voltage grid scanning method according to claim 1, characterized in that: The process of stabilizing the equipment voltage at the initial stage is as follows: The historical voltage detection cycle is divided into several historical detection points, and the voltage of each device at each historical detection point is obtained as the unit device voltage value to construct the device voltage change curve. By combining adjacent coordinate points on the equipment voltage change curve into a voltage regulation analysis group, multiple voltage regulation analysis groups are obtained. The slope calculation formula is used to analyze and process the adjacent coordinate points within each voltage stabilization analysis group to obtain the voltage stabilization analysis value of a single group; If a single voltage regulation analysis value is within the single voltage regulation analysis range, it is marked as a voltage regulation group. Multiple voltage regulation groups are extracted, and the coordinate point with the earliest time dimension in the voltage regulation group is used as the comparison coordinate point. The comparison coordinate points in multiple voltage regulation groups are compared before and after in the time dimension, and the earliest comparison coordinate point in time is selected as the starting point of equipment voltage stabilization.

3. The 0 to 200V voltage grid scanning method according to claim 1, characterized in that: The process of constructing the waiting period for synchronous scanning is as follows: Compare the voltage stabilization starting points of all devices over time, select the device with the earliest voltage stabilization starting point as the fastest voltage stabilization starting point, and designate the corresponding device to be scanned as the fastest voltage stabilization device. The last device voltage stabilization starting point in the time dimension is selected as the slowest voltage stabilization starting point, and the corresponding device to be scanned is selected as the slowest voltage stabilization device. The fastest and slowest voltage stabilization start points are used to construct a waiting period for synchronous scanning.

4. The 0 to 200V voltage grid scanning method according to claim 3, characterized in that: The analysis process during the waiting period for synchronous scanning is as follows: During the waiting period for synchronous scanning, the temperature values ​​of each device in the fastest voltage stabilization device at each historical detection point are obtained as the device temperature values ​​at a single time point. The adjacent historical detection points within the waiting period for synchronous scanning are considered as a temperature analysis sub-period. Within the temperature analysis sub-period, the standard deviation of the single-time point device temperature value of each device under adjacent and the same historical detection point is calculated to obtain the single-time point temperature standard deviation. The device temperature difference value is obtained by summing and averaging the standard deviations of the two single-time points of temperature. Extract the temperature value of each device at a single time point during the waiting period for synchronous scanning, and construct the temperature change curve of each device according to the order of the acquired time.

5. The 0 to 200V voltage grid scanning method according to claim 4, characterized in that: The process of assessing the isothermal state is as follows: The temperature change curves of individual devices are combined into a temperature change comparison group to obtain multiple temperature change comparison groups. Within the temperature change comparison group, the adjacent coordinate points in the temperature change curve of each single device are calculated using the slope calculation formula, and the difference is taken and the absolute value is obtained to obtain the single-adjacent trend difference value. Sum all adjacent trend difference values ​​to obtain the temperature trend difference value; The device temperature difference value and the temperature trend difference value are normalized and dimensionless, and then summed to obtain the temperature status identification value. If the temperature status identification value is greater than the temperature status identification threshold, it will be displayed as a non-isothermal signal.

6. The 0 to 200V voltage grid scanning method according to claim 1, characterized in that: The process of obtaining the non-isothermal starting point and the non-isothermal ending point is as follows: Within the historical voltage monitoring period, multiple temperature analysis sub-periods that display non-isothermal signals are selected, and the starting historical detection point within the earliest temperature analysis sub-period in the time dimension is selected as the non-isothermal starting point. Multiple temperature analysis sub-periods displayed as isothermal signals are selected, and the starting historical detection point within the earliest temperature analysis sub-period in the time dimension is selected as the non-isothermal termination point.

7. The 0 to 200V voltage grid scanning method according to claim 1, characterized in that: The process of obtaining the duration of non-isothermal conditions and performing stability analysis on the duration of non-isothermal conditions is as follows: The time between the non-isothermal start point and the non-isothermal end point is obtained as the non-isothermal duration. Extract the duration of non-isothermal duration within each historical voltage monitoring cycle, calculate the standard deviation and mean of the summation, obtain the standard deviation and mean of the non-isothermal duration, and use the coefficient of variation formula to calculate and process the non-isothermal duration analysis value. If the non-isothermal duration analysis value is greater than the non-isothermal duration analysis threshold, it will be displayed as a non-isothermal duration fluctuation signal. If the non-isothermal duration analysis value is less than or equal to the non-isothermal duration analysis threshold, it is displayed as a non-isothermal duration stable signal.

8. The 0 to 200V voltage grid scanning method according to claim 7, characterized in that: The process for obtaining the baseline non-isothermal duration is as follows: When the signal is displayed as a non-isothermal duration fluctuation signal, the non-isothermal duration within each historical voltage monitoring cycle is compared, and the maximum and minimum non-isothermal durations are summed and averaged to obtain the baseline non-isothermal duration. When the signal is displayed as an isothermal duration fluctuation signal, the mean of the non-isothermal duration within each historical voltage monitoring cycle is summed to obtain the baseline non-isothermal duration.

9. The 0 to 200V voltage grid scanning method according to claim 1, characterized in that: The process of determining the step stop duration extension and adjusting the step stop duration for the slowest voltage stabilization device during grid scanning is as follows: Extract the duration corresponding to each waiting period for synchronous scanning as the waiting duration for synchronous scanning; The sum of the waiting time for synchronous scanning and the baseline non-isothermal duration is used to obtain the adjustment amount for extending the step stop time; The extended step stop time corresponding to the slowest voltage stabilizing device is summed with the extended step stop time adjustment amount to obtain the adjusted step stop time of the slowest voltage stabilizing device.

10. A 0 to 200V voltage grid scanning system, characterized in that: include: Voltage stability analysis module: Set the historical voltage monitoring cycle, perform stability monitoring on the voltage changes of each device, and determine the voltage stability starting point of each device; Isothermal state assessment module: Compare the voltage stabilization start point of each device, extract the fastest voltage stabilization start point and the slowest voltage stabilization start point, construct a waiting synchronous scanning period, and perform analysis within the waiting synchronous scanning period to complete the isothermal state assessment; Non-isothermal duration analysis module: Extracts the non-isothermal start point and non-isothermal end point in multiple historical voltage monitoring cycles, obtains the non-isothermal duration, performs stability analysis on the non-isothermal duration, and determines the stability of the non-isothermal duration. Scan parameter adjustment module: Based on the stability of the determined non-isothermal duration, obtain the reference non-isothermal duration, determine the step stop duration extension, and perform grid scan step stop duration adjustment operation on the slowest voltage stabilization device according to the step stop duration extension.

Images