Test device and method suitable for testing power generation performance of temperature difference device under irradiation environment

Abstract

The embodiment of the application relates to the field of test devices of electrical performance, in particular to a test device and method suitable for testing power generation performance of a temperature difference device in an irradiation environment. The test device provided by the embodiment of the application is matched among a heat source assembly, a cold source assembly, a cooling gas providing pipeline, a containing piece and a pressing assembly, so that the cold end of the temperature difference device can be effectively cooled without an additional cooling circuit in the irradiation environment, the temperature of the cold end can be different from the temperature of the coolant of the reactor, the temperatures of the cold end and the hot end can be uniformly adjusted, and the multiple heat source assemblies and the multiple cold source assemblies can be one-to-one correspondingly arranged; and then, according to the test requirement, different gradient test temperature differences and multiple test groups are arranged to perform the test, so that the target orientation, the planning and the test efficiency of the test are improved.

Description

Technical Field

[0001] The embodiments of this application relate to the field of electrical performance testing devices, and particularly to a testing device and method suitable for testing the power generation performance of thermoelectric devices under irradiation. Background Technology

[0002] The statements herein are provided merely as background information in connection with this application and do not necessarily constitute prior art.

[0003] Thermoelectric power generation is a static thermoelectric conversion technology that can directly convert heat energy into electrical energy. It is based on the Seebeck effect, which states that when two different conductors (or semiconductors) are connected to form a circuit and there is a temperature difference between the two connection points, an electromotive force (voltage) is generated in the circuit, thereby forming a current in the closed circuit.

[0004] Thermoelectric devices can generate electricity using various forms of waste heat without involving combustion, emitting no greenhouse gases or harmful gases, making them environmentally friendly. Furthermore, their simple structure and compact size facilitate movement and deployment, making them suitable for various heat source scenarios. In the context of sustainable energy development, it is necessary to test the performance of thermoelectric devices to promote their application. Summary of the Invention

[0005] A brief overview of this application is provided below to offer a basic understanding of certain aspects thereof. It should be understood that this overview is not an exhaustive summary of the application. It is not intended to identify key or essential parts of the application, nor is it intended to limit its scope. Its purpose is merely to present certain concepts in a simplified form as a prelude to the more detailed description that follows.

[0006] One aspect of this application provides a testing apparatus suitable for testing the power generation performance of a thermoelectric device under irradiation. The testing apparatus includes a heat source component, a cold source component, a cooling gas supply pipeline, a container, and a clamping component. The heat source component is configured to heat the hot end of the thermoelectric device, the cold source component is configured to cool the cold end of the thermoelectric device, the cooling gas supply pipeline is configured to supply cooling gas to the cold source component so that the temperature of the cold source component can be regulated, the heat source component, the cold source component, and the cooling gas supply pipeline are disposed in the container, the container is disposed in the coolant of the reactor, the container is configured to use the coolant of the reactor to cool the cold source component, and the clamping component is disposed in the container and configured to apply force to the cold source component so that the thermoelectric device is in uniform contact with the cold source component.

[0007] The testing apparatus provided in the embodiments of this application, through the cooperation between heat source components, cold source components, cooling gas supply pipelines, containment components, and clamping components, enables the cold end of the thermoelectric device to be effectively cooled without an additional cooling circuit under irradiation conditions. The temperature of its cold end can be different from the temperature of the reactor coolant, and the temperatures of its cold and hot ends can be uniformly adjusted. Multiple heat source components and multiple cold source components can also be set one-to-one. Furthermore, according to the testing needs, different gradient test temperature differences and multiple test groups can be set for simultaneous testing, thereby improving the target orientation, planning, and testing efficiency of the test.

[0008] Another aspect of the embodiments of this application provides a method for testing the power generation performance of a thermoelectric device under irradiation, which employs the above-mentioned testing apparatus and includes the following steps: S10: using the cooling gas supply pipeline and the cold source component of the testing apparatus to change the temperature of the cold end of the thermoelectric device; S20: using the heat source component of the testing apparatus to change the temperature of the hot end of the thermoelectric device; S30: testing the power generation performance of the thermoelectric device at different cold end temperatures under step S10 and at different hot end temperatures under step S20. Attached Figure Description

[0009] To further illustrate the above and other advantages and features of this application, the specific embodiments of this application will be described in more detail below with reference to the accompanying drawings. The drawings, together with the following detailed description, are included in and form a part of this specification. Elements having the same function and structure are indicated by the same reference numerals. It should be understood that these drawings only depict typical examples of this application and should not be considered as limiting the scope of this application.

[0010] Figure 1 This is a schematic diagram showing the assembled components of the testing device provided in the embodiments of this application; Figure 2 This is a schematic diagram of a heat source component provided in an embodiment of this application; Figure 3 This is a partial schematic diagram of the heating assembly provided in an embodiment of this application; Figure 4 This is a schematic diagram of the structure of the heating element provided in an embodiment of this application; Figure 5 This is a schematic diagram showing the heating element and the insulating element provided in the embodiments of this application before assembly is completed; Figure 6 This is a schematic diagram showing the completed assembly of the heating element and the insulating element provided in the embodiments of this application.

[0011] Explanation of reference numerals in the attached figures: 1. Testing equipment; 10. Heat source assembly; 11. Heating assembly; 111. Heating element; 112. Heating element connector; 113. Insulating component; 12. Heat-conducting component; 20. Cold source assembly; 21. First heat conduction component; 22. Second heat conduction component; 30. Cooling gas supply piping; 40. Retaining parts; 50. Clamping assembly; 51. Support component; 52. Force-bearing component; 53. Elastic force transmission component; 60. Resistance-reducing components; 2. Temperature difference devices. Detailed Implementation

[0012] Exemplary embodiments of this application will be described below with reference to the accompanying drawings. For clarity and brevity, not all features of actual implementations are described in the specification. However, it should be understood that many implementation-specific decisions must be made in the development of any such actual embodiment to achieve the developer's specific goals, such as complying with constraints related to the system and business, and these constraints may vary depending on the implementation. Furthermore, it should be understood that while development work can be very complex and time-consuming, such development work is merely a routine task for those skilled in the art who benefit from the content of this application.

[0013] It should also be noted that, in order to avoid obscuring this application with unnecessary details, only the equipment structure and / or processing steps closely related to the solution according to this application are shown in the accompanying drawings, while other details that are not closely related to this application are omitted.

[0014] The following disclosure provides several different implementations or examples for carrying out this application. To simplify the disclosure of this application, specific examples of components and methods are described below. Of course, these are merely examples and are not intended to limit this application. In the description of the embodiments of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0015] In related technologies, utilizing thermoelectric devices to recover waste heat from reactors for power generation is a development trend for expanding the application scenarios of thermoelectric power generation. However, since thermoelectric devices need to operate under irradiation, and contain industrially integrated power generation units, their power generation performance is affected by the irradiation environment. Therefore, it is necessary to test the power generation performance of thermoelectric devices under irradiation and evaluate its impact to promote the improvement of thermoelectric power generation technology. Currently, existing irradiation devices for thermoelectric devices cannot simulate the actual irradiation environment of a reactor, and the performance data of thermoelectric materials suitable for reactors but not used for power generation cannot represent the performance of thermoelectric devices used for power generation. There is a lack of technical means to directly test the power generation performance of thermoelectric devices under reactor irradiation.

[0016] To address the aforementioned technical problems, one embodiment of this application provides a testing device suitable for testing the power generation performance of thermoelectric devices under irradiation conditions. Figure 1 This is a schematic diagram showing the assembled components of the testing device provided in the embodiments of this application, as shown below. Figure 1 As shown, the test device 1 includes: a heat source assembly 10, a cold source assembly 20, a cooling gas supply pipeline 30, a container 40, and a clamping assembly 50.

[0017] The heat source assembly 10 is configured to heat the hot end of the thermoelectric device 2, and the cold source assembly 20 is configured to cool the cold end of the thermoelectric device 2. The cooling gas supply pipeline 30 is configured to supply cooling gas to the cold source assembly 20 so that the temperature of the cold source assembly 20 can be regulated. The heat source assembly 10, the cold source assembly 20, and the cooling gas supply pipeline 30 are disposed in the housing 40, which is disposed in the coolant of the reactor. The housing 40 is configured to use the coolant of the reactor to cool the cold source assembly 20. The clamping assembly 50 is disposed in the housing 40 and is configured to apply force to the cold source assembly 20 so that the thermoelectric device 2 is in uniform contact with the cold source assembly 20.

[0018] The testing device 1 provided in the embodiments of this application, through the cooperation between the heat source component 10, the cold source component 20, the cooling gas supply pipeline 30, the containment component 40, and the clamping component 50, enables the cold end of the temperature difference device 2 to be effectively cooled without an additional cooling circuit under irradiation conditions. The temperature of its cold end can be different from the temperature of the reactor coolant, and the temperatures of its cold and hot ends can be uniformly adjusted. Multiple heat source components 10 and multiple cold source components 20 can also be set one-to-one. Furthermore, according to the testing needs, different gradient test temperature differences and multiple test groups can be set for simultaneous testing, thereby improving the target orientation, planning, and testing efficiency of the test.

[0019] In some embodiments, Figure 2 This is a schematic diagram of the heat source component 10 provided in an embodiment of this application, as shown below. Figure 2As shown, the heat source assembly 10 includes a heating assembly 11 and a heat-conducting element 12; the heat-conducting element 12 transfers the heat generated by the heating assembly 11 to the hot end of the temperature difference device 2, and the heat-conducting element 12 can make the temperature of the hot end of the temperature difference device 2 uniform; the heating assembly 11 and the heat-conducting element 12 are disposed in the housing 40.

[0020] In such an embodiment, since the pore size of the reactor core is limited, a pair of heat-conducting elements 12 can be symmetrically arranged at both ends of the heating assembly 11 to save space occupied by the test device 1; the heat-conducting elements 12 are usually made of oxygen-free copper, and nickel or gold can also be plated on their surface to further enhance their thermal conductivity.

[0021] The embodiments of this application configure the heat-conducting element 12 to transfer the heat generated by the heating component 11 to the hot end of the temperature difference device 2, thereby heating the hot end of the temperature difference device 2. Furthermore, the heat-conducting element 12 can make the temperature of the hot end of the temperature difference device 2 uniform, so that the hot end of the temperature difference device 2 can be heated evenly, thereby improving the reliability of the test.

[0022] In some embodiments, Figure 3 This is a partial schematic diagram of the heating assembly 11 provided in an embodiment of this application, as shown below. Figure 3 As shown, the heating assembly 11 includes: a plurality of heating elements 111, a heating element connector 112, and an insulating element 113; the heating element connector 112 cooperates with the plurality of heating elements 111 to provide different heating powers, and the insulating element 113 insulates the heating elements 111; the heat generated by the heating elements 111 is transferred to the heat-conducting element 12 through the insulating element 113, and then transferred by the heat-conducting element 12 to the hot end of the temperature difference device 2; the heating elements 111, the heating element connector 112, and the insulating element 113 are disposed in the receiving member 40.

[0023] In such an embodiment, the resistance of the heating element 111 can be determined based on the required temperature of the hot end of the thermoelectric device 2, and a suitable material can be selected based on the resistance of the heating element 111. Figure 4 This is a schematic diagram of the structure of the heating element provided in the embodiments of this application, as shown below. Figure 4 As shown, a plate of a certain thickness can be processed into a mosquito coil-shaped heating element 111. When selecting the plate, if the test temperature does not exceed 800℃, an electrothermal alloy is selected; if the test temperature exceeds 800℃, a molybdenum alloy is selected. The contact area of ​​the heating element 111 is not less than twice the area of ​​the hot end of the thermoelectric device 2, so as to improve the temperature uniformity of the hot end of the thermoelectric device 2.

[0024] In such an embodiment, Figure 5 This is a schematic diagram showing the heating element and the insulating element provided in the embodiments of this application before assembly is completed, as shown below. Figure 5As shown, the insulating component 113 can be determined according to the shape of the heating element 111. According to the temperature required at the hot end of the temperature difference device 2, the insulating component material can be selected from aluminum oxide, aluminum nitride, etc.

[0025] In such an embodiment, two heating elements 111 can be respectively disposed on both sides of the insulating member 113, and the two heating elements 111 can be connected by a heating element connector 112, which can be a bolt. Figure 6 This is a schematic diagram showing the assembled heating element 111 and insulating element 113 according to an embodiment of this application, as shown below. Figure 6 As shown, the two heating elements 111 can have a total of three terminals. Depending on the temperature required at the hot end of the temperature difference device 2, the heating elements 111 can be connected in series, in parallel, or in standby mode through different connection methods of the three terminals, thus providing different heating power.

[0026] The embodiments of this application, by configuring the heating element connector 112 to cooperate with multiple heating elements 111, can provide different heating powers, thereby enabling the hot end of the temperature difference device 2 to form multiple different heating temperatures, increasing the number of tests of the temperature difference device 2, and improving testing efficiency; by providing the insulating element 113 to insulate the heating element 111, the heating element 111 and the heating connector 112 can be protected, and the heating element 111 can be prevented from short-circuiting, ensuring the safe use of the heating assembly 11, thereby improving the reliability of the testing device 1 and avoiding frequent replacement of the above components under irradiation conditions.

[0027] In some embodiments, the cold source assembly 20 includes: a first cooling element 21 and a second cooling element 22, which are integrally formed and form a gap between them; a cooling gas supply pipe 30 supplies cooling gas to the gap, which allows cooling gas to flow; a housing 40 is capable of cooling the first cooling element 21 with the coolant of the reactor; the first cooling element 21 cools the second cooling element 22, and the second cooling element 22 cools the cold end of the temperature difference device 2, and the gap is cooled to a temperature that is regulated by the cooling gas; the first cooling element 21 and the second cooling element 22 are disposed in the housing 40; the first cooling element 21 receives the force of the pressing assembly 50, and the force is transmitted to the second cooling element 22, so that the second cooling element 22 makes uniform contact with the temperature difference device 2.

[0028] In such an embodiment, the diameter of the gap formed between the first cooling element 21 and the second cooling element 22 can be 0.3-0.5 mm, and the outer wall of the gap should be as thin as possible. If necessary, the thermal resistance can be increased by increasing the number of gaps; such as Figure 1 As shown, the first cooling component 21 can directly contact the receiving component 40.

[0029] In this embodiment, a first cooling element 21 and a second cooling element 22 are integrally formed with a gap between them. The reactor coolant cools the first cooling element 21 via the containment member 40, the first cooling element 21 cools the second cooling element 22, and the second cooling element 22 cools the cold end of the thermoelectric device 2. Simultaneously, a cooling gas supply pipe 30 supplies cooling gas to the gap, allowing the cooling gas to circulate. The gap also allows the cooling gas to regulate the cooling temperature of the second cooling element 22. By adjusting the composition and flow rate of the cooling gas, the temperature of the cold end of the thermoelectric device 2 can be adjusted to differ from the temperature of the reactor coolant. This allows the cold end of the thermoelectric device 2 to achieve multiple different cooling temperatures, increasing the number of tests that can be performed on the thermoelectric device 2 and reducing the dependence of the test temperature conditions on the reactor coolant. Furthermore, the residual heat from the test is ultimately carried away by the coolant in the reactor via the containment member 40, eliminating the need for an additional cooling circuit and improving the ease of use and disassembly of the device.

[0030] In some embodiments, such as Figure 1 As shown, the cooling gas supply pipe 30 can pass through the first cooling conductor 21 of the cold source assembly 20 so that the cooling gas is supplied to the gap between the first cooling conductor 21 and the second cooling conductor 22 of the cold source assembly 20, so that the temperature of the cold source assembly 20 can be regulated.

[0031] The embodiments of this application provide a cooling gas supply pipe 30 that runs through the first cooling conductor 21 of the cold source assembly 20, which enables the cooling gas to be directly supplied to the gap between the first cooling conductor 21 and the second cooling conductor 22, reducing the loss of cooling gas during transportation, improving cooling efficiency, and thus improving testing efficiency.

[0032] In some embodiments, the pressing assembly 50 includes a support member 51, a force-bearing member 52, and an elastic force-transmitting member 53; the elastic force-transmitting member 53 is fixedly connected to the force-bearing member 52, and transmits the external force received by the force-bearing member 52 to the second cooling guide member 22 of the cold source assembly 20, so that the temperature difference device 2 uniformly contacts the second cooling guide member of the cold source assembly 20; the force-bearing member 52 is movably disposed on the support member 51; the support member 51 is fixedly disposed on the receiving member.

[0033] In such an embodiment, specifically, the force applied to the force-bearing member 52 can be 30-60 kgf.

[0034] In this embodiment, the elastic force transmission member 53 is configured to transmit the external force received by the force-bearing member 52 and apply it to the second cooling conductor 22 of the cold source assembly 20. This ensures that the temperature difference device 2 makes uniform contact with the second cooling conductor of the cold source assembly 20, providing pressure, reducing thermal resistance, and improving the thermal conductivity of the cold end of the temperature difference device 2. This allows the cold end of the temperature difference device 2 to cool down uniformly, thereby improving the reliability of the test. The force-bearing member 52 is movably mounted on the support member 51, and the support member 51 is fixedly mounted on the receiving member. This creates a movable mechanical connection between the clamping assembly 50 and the receiving member, preventing the clamping assembly 50 from falling off and ensuring the clamping effect, thereby improving the stability of the test. Furthermore, during the test, the elastic force transmission member 53 can release the thermal stress generated by the heat source assembly 10, ensuring that the force exerted by the clamping assembly 50 on the temperature difference device 2 remains within a certain range, improving the stability of the test and reducing operation and debugging costs.

[0035] In some embodiments, the cooling gas supply line 30 is further configured to control the gas pressure in the gap between the first cooling element 21 and the second cooling element 22 in the cold source assembly 20.

[0036] In such an embodiment, specifically, cooling gas may enter from one end of the cooling gas supply pipe 30, and the other end of the cooling gas supply pipe 30 may be provided with a pressure-controlled discharge valve, which can release the gas in the gap between the first cooling element 21 and the second cooling element 22 in the cold source assembly 20 in a timely manner.

[0037] This embodiment of the application sets the gas pressure in the cooling gas supply pipeline 30 control device and keeps it closed during the test to prevent the radioactive gas from flowing out, thereby ensuring the safety of the test.

[0038] In some embodiments, the testing device 1 further includes a resistance-reducing component 60, which is respectively disposed between the heat-conducting component 12 of the heat source assembly 10 and the hot end of the temperature difference device 2, and between the second cold-conducting component 22 of the cold source assembly 20 and the cold end of the temperature difference device 2. The resistance-reducing component 60 is configured to reduce the contact thermal resistance between the heat-conducting component 12 of the heat source assembly 10 and the hot end of the temperature difference device 2, and between the second cold-conducting component 22 of the cold source assembly 20 and the cold end of the temperature difference device 2.

[0039] In such an embodiment, specifically, the resistance-reducing component 60 can be a graphite plate with a thickness of 0.5-1mm. Furthermore, holes for arranging thermocouples are respectively opened on the contact surfaces of the heat-conducting component 12 of the heat source assembly 10 and the hot end of the thermocouple 2, and between the second cold-conducting component 22 of the cold source assembly 20 and the cold end of the thermocouple 2. The thermocouples can respectively test the temperature at different locations of the heat-conducting component 12 and the second cold-conducting component 22, and their temperatures are integrated to represent the temperatures of the hot and cold ends of the thermocouple 2.

[0040] The embodiments of this application, by incorporating a resistance-reducing component 60, reduce the contact thermal resistance between the heat-conducting component 12 of the heat source assembly 10 and the temperature difference device 2, and between the second cooling component 22 of the cold source assembly 20 and the temperature difference device 2. This enhances heat and cold conduction, reduces the temperature difference between the hot end of the temperature difference device 2 and the heat source assembly 10, and between the cold end of the temperature difference device 2 and the cold source assembly 20, thereby reducing the heat generation and power consumption of the heat source assembly 10 and the coolant consumption of the cold source assembly 20, saving energy, and improving the economic and environmental benefits of the test. Furthermore, by deploying thermocouples to detect the temperatures of the hot and cold ends of the temperature difference device 2, the test temperature conditions of the temperature difference device 2 can be monitored in real time, thus improving the reliability of the test.

[0041] In some embodiments, such as Figure 1 As shown, the test device 1 may have multiple heat source components 10 and multiple cold source components 20, with each heat source component 10 and each cold source component 20 arranged in a one-to-one correspondence and all disposed in the housing 40.

[0042] In such an embodiment, multiple sets of temperature difference devices 2 can be tested simultaneously. Each set of tests can be performed by arranging neutron shielding material in the containment 40 according to the different neutron fluence in the irradiation environment, and different neutron fluence can be obtained in one test in the same containment 40.

[0043] The embodiments of this application, by setting multiple heat source components 10 and multiple cold source components 20, all disposed in the housing 40, can adjust the number of combinations of heat source components 10 and cold source components 20 according to actual testing needs, thereby adjusting the number of temperature difference devices 2 to be tested, and simultaneously testing multiple temperature difference devices 2, and adjusting the testing conditions according to different irradiation environments, thereby improving testing efficiency.

[0044] In some embodiments, the cooling gas supply line 30 supplies cooling gas to the gap between the first cooling conductor 21 and the second cooling conductor 22 of the plurality of cold source components 20.

[0045] In such an embodiment, specifically, the gap between the first cooling element 21 and the second cooling element 22 of the plurality of cold source components 20 is connected in series through a cooling gas supply pipe 30.

[0046] The embodiments of this application provide cooling gas to the gap between the first cooling element 21 and the second cooling element 22 of multiple cold source components 20 through a cooling gas supply pipeline 30. This allows the cooling gas to simultaneously adjust the temperature of multiple cold source components 20, thereby simultaneously adjusting the temperature of the cold ends of multiple temperature difference devices 2. Furthermore, by adjusting the composition and flow rate of the cooling gas, multiple different cooling temperatures can be achieved at the cold ends of multiple temperature difference devices 2, thereby increasing the number of tests that can be performed on the temperature difference devices 2 and improving measurement efficiency.

[0047] To address the aforementioned technical problems, another aspect of the embodiments of this application provides a method for testing the power generation performance of a thermoelectric device 2 under irradiation conditions. This method employs the testing apparatus 1 provided in the embodiments of this application and includes the following steps: S10: Using the cooling gas supply pipeline 30 and the cold source assembly 20 of the testing apparatus 1, the temperature of the cold end of the thermoelectric device 2 is changed; S20: Using the heat source assembly 10 of the testing apparatus 1, the temperature of the hot spot of the thermoelectric device 2 is changed; S30: At different cold end temperatures of the thermoelectric device 2 determined in step S10 and at different hot end temperatures of the thermoelectric device 2 determined in step S20, the power generation performance of the thermoelectric device 2 is tested.

[0048] Regarding the embodiments of this application, it should also be noted that, without conflict, the embodiments of this application and the features in the embodiments can be combined with each other to obtain new embodiments.

[0049] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. The scope of protection of this application shall be determined by the scope of the claims.

Claims

1. A testing device suitable for testing the power generation performance of thermoelectric devices under irradiation, characterized in that, It includes: heat source components, cold source components, cooling gas supply piping, housings, and clamping components; The heat source component is configured to heat the hot end of the thermoelectric device. The cold source component is configured to cool the cold end of the temperature difference device; The cooling gas supply line is configured to supply cooling gas to the cold source assembly so that the temperature of the cold source assembly can be regulated. The heat source assembly, the cold source assembly, and the cooling gas supply pipeline are disposed in the containment, which is disposed within the coolant of the reactor, and the containment is configured to utilize the coolant of the reactor to cool the cold source assembly. The clamping component is disposed on the receiving member and configured to apply force to the cold source component so that the temperature difference device makes uniform contact with the cold source component.

2. The testing apparatus according to claim 1, characterized in that, The heat source assembly includes: a heating component and a heat-conducting component; The heat-conducting component is configured to transfer the heat generated by the heating assembly to the hot end of the temperature difference device. The heat-conducting component is configured to ensure that the temperature of the hot end of the thermoelectric device is uniform. The heating component and the heat-conducting component are disposed in the receiving component.

3. The testing apparatus according to claim 2, characterized in that, The heating assembly includes: multiple heating elements, heating element connectors, and insulating elements; The heating element connector is configured to cooperate with multiple heating elements to provide different heating powers. The insulating element is configured to insulate the heating element; The heating element is configured such that the heat it generates is transferred to the heat-conducting element through the insulating element, and then transferred by the heat-conducting element to the hot end of the temperature difference device; The heating element, the heating element connector, and the insulating element are disposed in the receiving member.

4. The testing apparatus according to claim 1, characterized in that, The cold source assembly includes: a first cold-conducting component and a second cold-conducting component. The first cooling component and the second cooling component are integrally formed and a gap is formed between them; The cooling gas supply pipeline is configured to supply the cooling gas to the gap, and the gap is configured to allow the cooling gas to flow through; The containment is configured to cool the first cooling element using the coolant from the reactor. The first cooling element is configured to cool the second cooling element, the second cooling element is configured to cool the cold end of the temperature difference device, and the gap is configured to adjust its cooling temperature through the cooling gas. The first cooling element and the second cooling element are disposed on the receiving member; The first cooling element is configured to receive the force of the pressing assembly, and the force is transmitted to the second cooling element so that the second cooling element makes uniform contact with the temperature difference device.

5. The testing apparatus according to claim 1, characterized in that, The cooling gas supply pipeline is configured to pass through the first cooling conductor of the cold source assembly, so that the cooling gas is supplied to the gap between the first cooling conductor and the second cooling conductor of the cold source assembly, so that the temperature of the cold source assembly can be regulated.

6. The testing apparatus according to claim 1, characterized in that, The clamping assembly includes: a support component, a force-bearing component, and an elastic force-transmitting component; The elastic force transmission component is fixedly connected to the force-receiving component, transmitting the external force received by the force-receiving component and applying it to the first cooling conductor of the cold source assembly, so that the temperature difference device makes uniform contact with the second cooling conductor of the cold source assembly. The force-bearing component is configured to be movably disposed on the support component; The support member is configured to be fixedly mounted on the receiving member.

7. The testing apparatus according to claim 1, characterized in that, The cooling gas supply pipeline is also configured to control the gas pressure in the gap between the first and second cooling elements of the cold source assembly.

8. The testing apparatus according to any one of claims 1-7, characterized in that, It also includes resistance-reducing components. The resistance-reducing components are respectively disposed between the heat-conducting component of the heat source assembly and the hot end of the temperature difference device, and between the second cold-conducting component of the cold source assembly and the cold end of the temperature difference device. The resistance-reducing component is configured to reduce the contact thermal resistance between the heat-conducting component of the heat source assembly and the hot end of the temperature difference device, and between the second cold-conducting component of the cold source assembly and the cold end of the temperature difference device.

9. A testing device suitable for testing the power generation performance of thermoelectric devices under irradiation, characterized in that, It includes: Multiple heat source components, multiple cold source components, cooling gas supply piping, housings, and clamping components; Each of the heat source components and the cold source components is configured in a one-to-one correspondence. The heat source component is configured to heat the hot end of the thermoelectric device. The cold source component is configured to cool the cold end of the temperature difference device; The cooling gas supply line is configured to supply cooling gas to the cold source assembly so that the temperature of the cold source assembly can be regulated. The heat source assembly, the cold source assembly, and the cooling gas supply pipeline are disposed in the containment, which is disposed within the coolant of the reactor, and the containment is configured to utilize the coolant of the reactor to cool the cold source assembly. The clamping component is disposed on the receiving member and configured to apply force to the cold source component so that the temperature difference device makes uniform contact with the cold source component.

10. The testing apparatus according to claim 9, characterized in that, The cooling gas supply pipeline is configured to supply cooling gas to the gap between the first and second cooling conductors of the plurality of cold source assemblies.

11. A method for testing the power generation performance of a thermoelectric device under irradiation, characterized in that, It employs the testing apparatus according to any one of claims 1-10, and includes the following steps: S10: Using the cooling gas supply pipeline and cold source assembly of the test device, the temperature of the cold end of the temperature difference device is changed; S20: Use the heat source component of the test device to change the temperature of the hot end of the temperature difference device; S30: Test the power generation performance of the thermoelectric device under different cold end temperatures determined in step S10 and different hot end temperatures determined in step S20.

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