Xenon lamp performance testing device

Abstract

The present application relates to the technical field of testing device, disclose a kind of xenon lamp performance testing device, comprising: base;Fixed structure is used to fix xenon lamp;Laser emitter is used to emit laser to xenon lamp and excite xenon gas in xenon lamp to form plasma, so that xenon lamp emits light;Observation structure is used to observe the internal state when xenon lamp works;Light power measurement structure is used to measure the total white light output power after xenon lamp is excited by laser;Spectrometer is used to measure the output spectrum after xenon lamp is excited by laser;Host computer is connected with laser emitter, observation structure, light power measurement structure and spectrometer, host computer is configured to control laser emitter to work, and is also configured to determine the performance of xenon lamp according to the measurement information of observation structure, light power measurement structure and spectrometer.According to the xenon lamp performance testing device of the embodiment of the application, the testing process can be simplified, the testing efficiency can be improved, and the performance of the xenon lamp can be evaluated comprehensively.

Description

Technical Field

[0001] This invention relates to the field of testing equipment technology, and in particular to a xenon lamp performance testing device. Background Technology

[0002] Among related technologies, laser-driven white light sources, as a new generation of broadband high-brightness light sources, rely heavily on their internal xenon lamps for performance. High-energy lasers excite xenon gas inside the lamp to form high-temperature plasma, producing white light. The performance of the xenon lamp determines the final output quality, stability, and lifespan of the light source. Currently, xenon lamps face significant challenges in research and development, production screening, and long-term reliability assessment.

[0003] In existing technologies, the performance evaluation of xenon lamps relies on testing with multiple independent devices, resulting in a cumbersome process and difficulty in data integration, leading to inefficient performance evaluations and biased conclusions. Furthermore, existing testing systems cannot conduct in-depth, traceable failure analysis of xenon lamps under simulated real-world operating conditions, nor can they directly observe the stability of the plasma morphology inside the xenon lamp under laser excitation. Plasma morphology stability is a key and intuitive indicator for assessing the long-term operational consistency and health status of a xenon lamp.

[0004] Meanwhile, existing technologies lack effective means to distinguish whether the degradation of xenon lamp output performance stems from the aging of the xenon lamp itself (such as electrode wear, changes in gas purity, etc.) or from a decrease in the coupling efficiency of the external excitation optical path system. This lack of diagnostic capability has kept the reliability assessment of xenon lamps at a crude stage of "passing as long as it lights up" or based on a single output parameter. This not only makes it difficult to support the improvement of product quality, but also fails to provide a scientific and comprehensive data foundation for upstream incoming material inspection and downstream whole-unit life prediction. Summary of the Invention

[0005] This invention aims to at least solve one of the technical problems existing in the prior art. Therefore, one object of this invention is to provide a xenon lamp performance testing device that simplifies the testing process, improves testing efficiency, and enables a comprehensive evaluation of xenon lamp performance.

[0006] A xenon lamp performance testing device according to an embodiment of the present invention includes: a base; a fixing structure mounted on the base for fixing the xenon lamp; a laser emitter adapted to be mounted on the base for emitting laser light to excite the xenon gas inside the xenon lamp to form plasma, thereby causing the xenon lamp to emit light; an observation structure adapted to be mounted on the base for observing the internal state of the xenon lamp during operation; a light power measurement structure adapted to be mounted on the base for measuring the total white light output power of the xenon lamp after being excited by the laser; a spectrometer for measuring the output spectrum of the xenon lamp after being excited by the laser; and a host computer communicatively connected to the laser emitter, the observation structure, the light power measurement structure, and the spectrometer, configured to control the operation of the laser emitter and also configured to determine the performance of the xenon lamp based on the measurement information from the observation structure, the light power measurement structure, and the spectrometer.

[0007] The xenon lamp performance testing apparatus according to the embodiments of this application simplifies the testing process, improves testing efficiency, reduces measurement errors caused by multiple clamping operations and environmental changes, and helps ensure the accuracy of measurement results. Simultaneously, the xenon lamp performance testing apparatus of this application can simultaneously collect multiple data points from the xenon lamp, comprehensively evaluating its performance.

[0008] By emitting a laser from a laser emitter to excite the xenon gas inside the xenon lamp to form plasma, the xenon lamp emits light, realistically simulating the working conditions of a laser-driven white light source. Based on this, the test results obtained using the xenon lamp performance testing device of this application can reflect the performance of the xenon lamp in actual use.

[0009] The host computer can control the laser emitter and receive measurement information from the observation structure, optical power measurement structure, and spectrometer to determine the performance of the xenon lamp. Based on this, the xenon lamp performance testing device can realize the automated measurement and evaluation of xenon lamp performance.

[0010] Furthermore, the xenon lamp performance testing device of this application can simultaneously collect measurement data such as the internal state of the xenon lamp during operation, the total white light output power of the xenon lamp after laser excitation, and the output spectrum of the xenon lamp after laser excitation, which are then comprehensively analyzed by a host computer. This multi-dimensional data fusion enables testers to distinguish whether the degradation of xenon lamp output performance is due to the xenon lamp itself or external factors, supporting the improvement of product quality and providing a scientific and comprehensive data foundation for upstream incoming material inspection and downstream whole-machine life prediction.

[0011] According to some embodiments of the present invention, the fixing structure includes: a first mounting bracket and a clamping part, the first mounting bracket being mounted on a base, and the clamping part being detachably mounted on the first mounting bracket, the clamping part being used to clamp and fix the xenon lamp.

[0012] According to some embodiments of the present invention, the clamping part is formed with a clamping opening that extends through the clamping part in the vertical direction. The clamping opening is used to assemble a xenon lamp so that the clamping part clamps and fixes the xenon lamp.

[0013] According to some embodiments of the present invention, the first mounting bracket includes: a first frame, a second frame, and a third frame. The first frame is fixed to the base, the second frame is movably mounted on the first frame in the vertical direction, the third frame is movably mounted on the second frame in the first direction, and the clamping part is detachably mounted on the third frame. The first direction is perpendicular to the vertical direction.

[0014] According to some embodiments of the present invention, the laser emitter and the fixing structure are opposite to and spaced apart along a first direction to form a receiving space for accommodating a xenon lamp between the laser emitter and the fixing structure, and the laser emitter is movably mounted on the base along the first direction, which is perpendicular to the vertical direction.

[0015] According to some embodiments of the present invention, along the second direction, the observation structure and the optical power measurement structure are located on both sides of the accommodating space, the second direction is perpendicular to the vertical direction, and the second direction intersects the first direction.

[0016] According to some embodiments of the present invention, the observation structure is movably mounted on the base along a second direction.

[0017] According to some embodiments of the present invention, the xenon lamp performance testing device further includes: a second mounting bracket, the second mounting bracket being fixed to the base, the second mounting bracket having a mounting portion forming a light-collecting cavity for opening toward the xenon lamp, and the spectrometer including an optical fiber structure, the optical fiber structure being fixed to the mounting portion and inserted into the light-collecting cavity.

[0018] According to some embodiments of the present invention, the xenon lamp performance testing device further includes: a cooling structure, which is assembled with a laser emitter to cool the laser emitter, and the cooling structure is communicatively connected to a host computer, which is used to control the operation of the cooling structure.

[0019] According to some embodiments of the present invention, the xenon lamp performance testing device further includes: a power supply unit, which is electrically connected to the xenon lamp to supply power to the xenon lamp.

[0020] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0021] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which: Figure 1 This is a partial schematic diagram of a xenon lamp performance testing device according to an embodiment of the present invention; Figure 2 This is an assembly diagram of the mounting structure and optical power measurement structure according to an embodiment of the present invention; Figure 3 This is an assembly diagram of the fixing structure and the xenon lamp according to an embodiment of the present invention; Figure 4 This is an assembly diagram of the base, the first dovetail guide rail, the first mounting base, and the laser emitter according to an embodiment of the present invention. Figure 5 This is an assembly diagram of the base, the second dovetail guide rail, the second mounting base, and the observation structure according to an embodiment of the present invention. Figure 6 This is an assembly diagram of the second mounting bracket and mounting part according to an embodiment of the present invention.

[0022] Figure label: Xenon lamp performance testing device 10; Base 20; Fixed structure 30; first mounting bracket 31; first frame 311; second frame 312; second assembly opening 3121; third opening 3122; third through hole 3123; first assembly hole 3124; third frame 313; clamping part 32; clamping opening 3211; second opening 3212; second through hole 3213; second assembly hole 3221; Xenon lamp 40; Laser emitter 50; Observation structure 60; Optical power measurement structure 70; Capacity: 80; Second mounting bracket 90; Installation part 100; light-transmitting cavity 101; third assembly hole 102; fifth opening 103; fifth through hole 104; Mounting structure 110; fourth frame 111; first fixing part 112; fixing plate 1121; first assembly port 11211; first opening 11212; first through hole 113; First dovetail guide rail 120; First mounting base 130; first dovetail groove 131; first drive structure 132; first rotating wheel 1322; second fixing part 133; first support beam 1331; first guide rod 1332; first pressure head 1333; first locking assembly 1334; first locking nut 13341; Second dovetail guide rail 140; Second mounting base 150; second dovetail groove 151; second drive structure 152; second rotating wheel 1522; third fixing part 153; second support beam 1531; second guide rod 1532; second pressure head 1533; second locking assembly 1534; second locking nut 1535. Detailed Implementation

[0023] Embodiments of the present invention are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and should not be construed as limiting the present invention.

[0024] The following is for reference. Figures 1-6 A xenon lamp performance testing apparatus 10 according to an embodiment of the present invention is described.

[0025] like Figure 1 As shown, the xenon lamp performance testing device 10 according to an embodiment of the present invention includes: a base 20; a fixing structure 30, which is mounted on the base 20 and used to fix a xenon lamp 40; a laser emitter 50, which is adapted to be mounted on the base 20 and used to emit a laser to the xenon lamp 40 to excite the xenon gas inside the xenon lamp 40 to form plasma, so that the xenon lamp 40 emits light; an observation structure 60, which is adapted to be mounted on the base 20 and used to observe the internal state of the xenon lamp 40 when it is working; and a light power measuring device. The optical power measurement structure 70 is suitable for mounting on the base 20 and is used to measure the total white light output power of the xenon lamp 40 after being excited by the laser. The spectrometer is used to measure the output spectrum of the xenon lamp 40 after being excited by the laser. The host computer is communicatively connected to the laser emitter 50, the observation structure 60, the optical power measurement structure 70, and the spectrometer. The host computer is configured to control the operation of the laser emitter 50 and is also configured to determine the performance of the xenon lamp 40 based on the measurement information of the observation structure 60, the optical power measurement structure 70, and the spectrometer.

[0026] Among them, such as Figure 1 As shown, the vertical direction can be defined as the Z direction. The fixing structure 30 is installed on the base 20. Specifically, the fixing structure 30 can be fixedly connected to the base 20 by welding, integral molding, bolt connection, etc.

[0027] The fixing structure 30 is used to fix the xenon lamp 40, as an example, such as Figure 3As shown, the fixing structure 30 may include a clamping part 32, which can be used to clamp and fix the xenon lamp 40. The laser emitter 50 can be a fiber-coupled laser, semiconductor laser, or other device capable of emitting laser light. The laser emitter 50 can be mounted on the base 20. As an example, the laser emitter 50 can be movably mounted on the base 20, facilitating adjustment of the position of the laser emitter 50 along a preset direction. As another example, the laser emitter 50 can be fixed to the base 20. This application describes the laser emitter 50 being movably mounted on the base 20 as an example.

[0028] Laser emitter 50 can emit laser light into xenon lamp 40, providing the laser drive required for excitation testing. The laser emitted by laser emitter 50 can be a high-energy laser, which can penetrate xenon lamp 40 and irradiate its interior, causing the xenon gas inside xenon lamp 40 to become a high-temperature plasma and produce white light. This white light can be broadband white light. It should be noted that broadband white light refers to mixed light with a wide wavelength range, capable of covering a broad spectral range from ultraviolet to near-infrared, forming white light similar to natural light.

[0029] The observation structure 60 can be a high-resolution camera, a high-speed industrial camera, etc. The observation structure 60 can be mounted on the base 20. As one embodiment, the observation structure 60 can be movably mounted on the base 20, facilitating adjustment of its position along a preset direction. As another embodiment, the observation structure 60 can be fixed to the base 20. This application describes the example of the observation structure 60 being movably mounted on the base 20.

[0030] When the laser emitter 50 emits a laser to the xenon lamp 40 to excite the xenon gas inside the xenon lamp 40 to form plasma and make the xenon lamp 40 emit light, the observation structure 60 can capture and record the morphology, size, position and stability of the plasma inside the xenon lamp 40 in real time, providing an intuitive basis for judging the working consistency of the xenon lamp 40, the uniformity of the gas distribution inside the xenon lamp 40 and the potential defects of the xenon lamp 40.

[0031] The observation structure 60 may be equipped with a filter that allows white light emitted by the xenon lamp 40 to enter the observation structure 60, while blocking laser light emitted by the laser emitter 50 from entering the observation structure 60, so that the observation structure 60 can acquire a pure plasma image, thereby improving the observation quality of the observation structure 60.

[0032] The optical power measurement structure 70 can be an optical power meter, which can be used to measure the total white light output power of the xenon lamp 40 after it is excited by a laser. For example... Figure 1 , Figure 2As shown, the xenon lamp performance testing device 10 may include a mounting structure 110 for mounting the optical power measurement structure 70, and the mounting structure 110 may be fixed to the base 20.

[0033] like Figure 2 As shown, the mounting structure 110 may include a fourth frame 111 and a first fixing part 112. The fourth frame 111 may extend in the vertical direction and may be fixedly mounted on the base 20. The first fixing part 112 may be assembled to the fourth frame 111 and may include two fixing plates 1121. The two fixing plates 1121 may be arranged alternately along the extension direction (i.e., the vertical direction) of the fourth frame 111. The optical power measurement structure 70 may be snapped between the two fixing plates 1121, thereby achieving reliable installation of the optical power measurement structure 70.

[0034] As one embodiment, the fourth frame 111 can be constructed as a rod-like structure. For example... Figure 2 As shown, the fixing plate 1121 may have a first assembly port 11211 extending through the fixing plate 1121 in the vertical direction. The first assembly port 11211 may be correspondingly set with the fourth frame 111, and the fourth frame 111 may be inserted through the corresponding first assembly port 11211. The fixing plate 1121 may also have a first opening 11212 communicating with the first assembly port 11211. The first opening 11212 may be open to the outside of the fixing plate 1121, so as to realize the quick assembly of the fixing plate 1121 and the fourth frame 111, and at the same time, the installation height of the fixing plate 1121 may be adjusted in the vertical direction.

[0035] Both side walls near the open end of the first opening 11212 can have first through holes 113 penetrating through the corresponding side walls. The first through holes 113 are connected to the first opening 11212, and the two first through holes 113 connected to the same first opening 11212 are arranged opposite each other. A first locking element (e.g., a bolt or nut) can be passed through the two first through holes 113 and tightened, so that the two side walls of the first opening 11212 come together, thereby clamping the fourth frame 111 inserted into the first assembly opening 11211, and locking the fixing plate 1121 at the target height position. The spectrometer can be a fiber optic spectrometer, etc., and can be used to measure the output spectrum of a xenon lamp 40 after it is excited by a laser.

[0036] The host computer can be a central control and data analysis system, and it can communicate with the fixed structure 30, laser emitter 50, observation structure 60, optical power measurement structure 70, and spectrometer. The host computer can control the start and stop of the laser emitter 50.

[0037] The host computer can synchronously acquire measurement information from the observation structure 60, the optical power measurement structure 70, and the spectrometer through integrated software algorithms and hardware interfaces. It then uses an embedded intelligent preprocessing algorithm to perform real-time filtering, noise reduction, and preliminary feature extraction on this measurement information, providing a high-quality data foundation for subsequent in-depth analysis. Furthermore, the host computer can automatically analyze the plasma images acquired by the observation structure 60 using computer vision and pattern recognition algorithms, quantitatively evaluating the plasma's morphological stability, symmetry, and anomalous discharge characteristics. Finally, the host computer can determine the performance of the xenon lamp 40 based on the measurement information from the observation structure 60, the optical power measurement structure 70, and the spectrometer.

[0038] Based on the above, this application embodiment, by setting up a xenon lamp performance testing device 10 with a fixed structure 30, a laser emitter 50, an observation structure 60, an optical power measurement structure 70, a spectrometer, and a host computer, can simultaneously complete the excitation of the xenon lamp 40, the observation of the internal state of the xenon lamp 40 during operation, the measurement and analysis of the total white light output power of the xenon lamp 40 after being excited by the laser, the measurement and analysis of the output spectrum of the xenon lamp 40 after being excited by the laser, and the performance determination of the xenon lamp 40 on the same device.

[0039] Compared to existing technologies that use multiple devices for separate testing, the xenon lamp performance testing device 10 of this application simplifies the testing process, improves testing efficiency, reduces measurement errors caused by multiple clamping operations and environmental changes, and helps ensure the accuracy of measurement results. Simultaneously, the xenon lamp performance testing device 10 of this application can simultaneously collect multiple performance data of the xenon lamp 40, comprehensively evaluating the performance of the xenon lamp 40.

[0040] The xenon lamp 40 emits a laser from the laser emitter 50, which excites the xenon gas inside the xenon lamp 40 to form plasma, causing the xenon lamp 40 to emit light, thus realistically simulating the working conditions of a laser-driven white light source. Based on this, the test results obtained using the xenon lamp performance testing device 10 of this application can reflect the performance of the xenon lamp 40 in actual use.

[0041] The host computer can control the operation of the laser emitter 50, and can receive measurement information from the observation structure 60, the optical power measurement structure 70, and the spectrometer, and determine the performance of the xenon lamp 40. Based on this, the xenon lamp performance testing device 10 can realize the automated measurement and evaluation of the performance of the xenon lamp 40.

[0042] Furthermore, the xenon lamp performance testing device 10 of this application can simultaneously collect measurement data such as the internal state of the xenon lamp 40 during operation, the total white light output power of the xenon lamp 40 after laser excitation, and the output spectrum of the xenon lamp 40 after laser excitation, and these data are comprehensively analyzed by a host computer. This multi-dimensional data fusion allows testers to distinguish whether the degradation of the xenon lamp 40's output performance is due to the xenon lamp 40 itself or external factors, supporting the improvement of product quality and providing a scientific and comprehensive data foundation for upstream incoming material inspection and downstream whole-machine life prediction.

[0043] In some embodiments of the present invention, such as Figure 3 As shown, the fixing structure 30 may include a first mounting bracket 31 and a clamping part 32. The first mounting bracket 31 is mounted on the base 20, and the clamping part 32 is detachably mounted on the first mounting bracket 31. The clamping part 32 is used to clamp and fix the xenon lamp 40.

[0044] The first mounting bracket 31 can be fixedly connected to the base 20 by welding, integral molding, or other methods. The clamping part 32 is detachably mounted to the first mounting bracket 31. As one embodiment, the clamping part 32 can be detachably connected to the first mounting bracket 31 by fasteners such as screws and bolts. As another embodiment, the clamping part 32 can be provided with a first magnet, and a ferromagnetic material can be provided at the corresponding position of the first mounting bracket 31. The adsorption between the first magnet and the ferromagnetic material can be used to achieve quick assembly and disassembly of the clamping part 32 and the first mounting bracket 31.

[0045] As an example, such as Figure 3 As shown, the clamping part 32 may have a clamping opening 3211, which extends through the clamping part 32 in a vertical direction. The clamping opening 3211 can be used to assemble the xenon lamp 40, so that the clamping part 32 clamps and fixes the xenon lamp 40. As another example, the clamping part 32 may include a multi-jaw chuck, which may have a clamping hole extending through the multi-jaw chuck in a vertical direction. The xenon lamp 40 can pass through the clamping hole to achieve the effect of clamping and fixing the xenon lamp 40 by the clamping part 32.

[0046] By detachably mounting the clamping part 32 to the first mounting bracket 31, clamping parts 32 of different specifications can be replaced, so that the xenon lamp performance testing device 10 can be adapted to xenon lamps 40 of different specifications, which helps to improve the versatility of the xenon lamp performance testing device 10. Furthermore, the detachable design of the clamping part 32 allows the clamping part 32 to be replaced separately after damage, which helps to reduce the maintenance cost of the xenon lamp performance testing device 10.

[0047] In some embodiments of the present invention, such as Figure 3As shown, the clamping part 32 has a clamping opening 3211, which extends through the clamping part 32 in the vertical direction. The clamping opening 3211 is used to assemble the xenon lamp 40 so that the clamping part 32 clamps and fixes the xenon lamp 40.

[0048] Among them, such as Figure 3 As shown, the clamping part 32 may be formed with a clamping opening 3211 for assembling the xenon lamp 40. For example... Figure 3 As shown, the clamping part 32 may also have a second opening 3212 that communicates with the clamping opening 3211. The second opening 3212 may be open to the outside of the clamping part 32.

[0049] Each of the two sidewalls near the open end of the second opening 3212 can have a second through hole 3213 penetrating through the corresponding sidewall. The second through hole 3213 can communicate with the second opening 3212, and two second through holes 3213 communicating with the same second opening 3212 can be arranged opposite to each other. The xenon lamp 40 is moved into the clamping opening 3211, and the second locking member is passed through the two second through holes 3213, thereby reliably clamping and fixing the xenon lamp 40 in the clamping opening 3211.

[0050] By providing a clamping port 3211 for assembling the xenon lamp 40 on the clamping part 32, there is no need to add additional structural parts for assembling the xenon lamp 40. This helps to reduce the number of parts in the xenon lamp performance testing device 10, reduce the manufacturing cost of the xenon lamp performance testing device 10, reduce the weight of the xenon lamp performance testing device 10, and achieve a lightweight design of the xenon lamp performance testing device 10.

[0051] In some embodiments of the present invention, such as Figure 3 As shown, the first mounting bracket 31 may include: a first bracket 311, a second bracket 312 and a third bracket 313. The first bracket 311 is fixed to the base 20. The second bracket 312 is movably mounted on the first bracket 311 in the vertical direction. The third bracket 313 is movably mounted on the second bracket 312 in the first direction. The clamping part 32 is detachably mounted on the third bracket 313. The first direction is perpendicular to the vertical direction.

[0052] Among them, such as Figure 1 As shown, the first direction can be defined as the X direction. Figure 3 As shown, both the first frame 311 and the third frame 313 can be constructed as rod-shaped structures, and the lower end of the first frame 311 can be fixedly connected to the base 20.

[0053] The second frame 312 may have a second assembly port 3121 extending vertically through the second frame 312. The second assembly port 3121 may be configured to correspond one-to-one with the first frame 311, and the first frame 311 may be inserted through the corresponding second assembly port 3121. The second frame 312 may also have a third opening 3122 communicating with the second assembly port 3121. The third opening 3122 may be open to the outside of the second frame 312, allowing the first frame 311 to enter the second assembly port 3121, thus enabling rapid assembly of the second frame 312 and the first frame 311.

[0054] Both side walls near the open end of the third opening 3122 can have third through holes 3123 penetrating through the corresponding side walls. The third through holes 3123 communicate with the third opening 3122, and two third through holes 3123 communicating with the same third opening 3122 are arranged opposite each other. A third locking element can be passed through the two third through holes 3123 to lock the second frame 312 at the target height. The aforementioned third locking element can be a locking bolt, locking screw, etc.

[0055] As an example, such as Figure 3 As shown, the second frame 312 can have a first mounting hole 3124 extending through the second frame 312 in a first direction, and the third frame 313 can be inserted through the first mounting hole 3124. The first mounting hole 3124 can be correspondingly set with the third frame 313. The third frame 313 is movably mounted on the second frame 312 in the first direction. As an embodiment, the third frame 313 is provided with a first slide rail extending in the direction of the third frame 313 (i.e., the first direction). A first slider adapted to the first slide rail can be fixedly mounted on the side wall of the first mounting hole 3124. The effect of the third frame 313 being movably mounted on the second frame 312 in the first direction can be achieved through the sliding cooperation between the first slide rail and the first slider.

[0056] The clamping part 32 can be detachably installed on the third frame 313, such as Figure 3 As shown, the clamping part 32 may also have a second mounting hole 3221 extending through the clamping part 32 in a first direction, and the third frame 313 may pass through the second mounting hole 3221. The clamping part 32 is detachably mounted on the third frame 313. As an embodiment, the clamping part 32 may also have a fourth opening, which may communicate with the second mounting hole 3221. The fourth opening may be open towards the outside of the clamping part 32, so that the third frame 313 can enter the fourth opening from the open end of the fourth opening and enter the second mounting hole 3221 along the fourth opening, realizing the quick assembly of the third frame 313 and the clamping part 32. At the same time, the position of the clamping part 32 mounted on the third frame 313 along the first direction can be adjusted to achieve the effect of adjusting the position of the xenon lamp 40 along the first direction.

[0057] Both side walls near the open end of the fourth opening can have fourth through holes penetrating the respective side walls. These fourth through holes communicate with the fourth opening, and two fourth through holes communicating with the same fourth opening are positioned opposite each other. A fourth locking element can be passed through the two fourth through holes to lock the third frame 313 at the target height position. The aforementioned fourth locking element can be a locking bolt, locking screw, etc.

[0058] The laser emitter 50 and the fixing structure 30 can be arranged opposite to each other and spaced apart along the first direction. By setting the second frame 312 to be movably installed on the first frame 311 in the vertical direction, the height of the xenon lamp 40 can be flexibly adjusted, so that the laser emitted by the laser emitter 50 can be accurately incident into the interior of the xenon lamp 40, which is beneficial for the fixing device to adapt to the clamping requirements of xenon lamps 40 of different lengths.

[0059] By movably mounting the third frame 313 on the second frame 312 along the first direction, the position of the xenon lamp 40 in the first direction can be flexibly adjusted to adjust the distance between the xenon lamp 40 and the laser emitter 50 along the first direction, so that the laser emitted by the laser emitter 50 can be accurately incident into the interior of the xenon lamp 40, thereby making it easier for the fixing device to adapt to the clamping requirements of xenon lamps 40 of different specifications.

[0060] Based on the above, by setting the second frame 312 to be movably installed on the first frame 311 in the vertical direction, and the third frame 313 to be movably installed on the second frame 312 in the first direction, the position of the xenon lamp 40 in the vertical direction and the first direction can be adjusted. This is beneficial for the fixing device to be able to adapt to the clamping requirements of xenon lamps 40 of different specifications, and is beneficial for further improving the versatility of the xenon lamp performance testing device 10.

[0061] Furthermore, the host computer can communicate with the fixed structure 30. Specifically, the fixed structure 30 can be equipped with an electric drive module, which can communicate with the host computer. The host computer can control the electric drive module to adjust the position of the xenon lamp 40 in the vertical direction and the first direction. Simultaneously, the host computer can store standard position parameters for xenon lamps 40 of different specifications. During testing, these parameters can be recalled with a single click to achieve automatic positioning of the xenon lamp 40, eliminating the need for manual operation. This reduces human error and facilitates intelligent performance testing of the xenon lamp 40.

[0062] In some embodiments of the present invention, such as Figure 1 As shown, the laser emitter 50 and the fixed structure 30 are opposite to each other and spaced apart along a first direction to form a receiving space 80 for accommodating the xenon lamp 40 between the laser emitter 50 and the fixed structure 30, and the laser emitter 50 is movably mounted on the base 20 along the first direction, which is perpendicular to the up and down direction.

[0063] Among them, such as Figure 4 As shown, a first dovetail-shaped guide rail 120 extending along a first direction can be fixedly mounted on the base 20. The xenon lamp performance testing device 10 may also include a first mounting base 130 for mounting the laser emitter 50. A first dovetail groove 131 adapted to the first dovetail-shaped guide rail 120 can be formed on the lower side of the first mounting base 130. The first mounting base 130 can be adjusted in the first direction by the fitting and sliding cooperation between the first dovetail groove 131 and the first dovetail-shaped guide rail 120, thereby achieving the effect of movably mounting the laser emitter 50 on the base 20 along the first direction.

[0064] like Figure 4 As shown, a first driving structure 132 may be provided on the first mounting base 130. The first driving structure 132 can drive the first mounting base 130 and the laser emitter 50 to move along the extension direction (i.e., the first direction) of the first dovetail guide rail 120. Specifically, as... Figure 4 As shown, the first drive structure 132 includes a first rotating wheel 1322, a first lead screw, a first gear, and a first rack. The first rotating wheel 1322 and the first gear can be coaxially and fixedly connected to the first lead screw. The first rack can be fixedly mounted on the first dovetail guide rail 120 and can extend along the first direction. The first gear can mesh with the first rack. The first lead screw can be rotatably mounted on the first mounting base 130. By rotating the first rotating wheel 1322, the first gear can be driven to rotate. At this time, the first gear meshes with the first rack, thereby enabling the first mounting base 130 and the laser emitter 50 to move along the first direction.

[0065] like Figure 4 As shown, a second fixing part 133 may also be fixed above the first mounting base 130. The second fixing part 133 can be used to press and fix the laser emitter 50. The second fixing part 133 may include a first support beam 1331, two first guide rods 1332, a first pressure head 1333, and a first locking assembly 1334.

[0066] Two first guide rods 1332 are spaced apart and fixed above the first mounting base 130. A first support beam 1331 passes through the two first guide rods 1332 and is movable in the vertical direction. A first pressure head 1333 is fixed below the first support beam 1331, and the lower contour of the first pressure head 1333 can be adapted to the outer surface contour of the laser emitter 50. A first locking assembly 1334 can be fitted on the first guide rods 1332. The first locking assembly 1334 can be located above the first support beam 1331 and can be used to press the first support beam 1331 so that the second fixing part 133 reliably presses the laser emitter 50. The height of the first support beam 1331 can be adjusted so that the first pressure head 1333 presses the laser emitter 50, and then the position of the first support beam 1331 can be locked by the first locking assembly 1334 to reliably fix the laser emitter 50. The first locking assembly 1334 mentioned above may include a first locking nut 13341, and the first locking nut 13341 may be set in a one-to-one correspondence with the first guide rod 1332.

[0067] By placing the xenon lamp 40 within the housing space 80, the laser emitted by the laser emitter 50 can be precisely incident into the interior of the xenon lamp 40, thereby enabling the testing process to be carried out reliably.

[0068] It should be noted that the tube diameter of different xenon lamps 40 varies, and the optimal plasma formation position inside different xenon lamps 40 is also different. It is necessary to adjust the distance between the laser emitter 50 and the xenon lamp 40 so that the laser emitted by the laser emitter 50 can be incident on the optimal plasma formation position inside the xenon lamp 40 of different specifications.

[0069] As one embodiment, the laser emitter 50 may include a laser source, an optical switching unit, and a focusing unit. Both the optical switching unit and the focusing unit can be mounted on the light-emitting side of the laser source. The optical switching unit may include a detachable mirror assembly, and the focusing unit may include a detachable focusing lens assembly. The focusing lens assembly is used to focus the laser emitted by the laser emitter 50, and the mirror assembly is used to adjust the incident direction of the laser. Specifically, the focusing lens assembly can be configured to use different focal lengths of focusing lenses according to the optical window size of the xenon lamp 40, and the mirror assembly can be configured to use mirrors with different reflection angles according to the optimal excitation focal position of the xenon lamp 40. By changing the focusing lens assembly and the mirror assembly, the focusing degree and incident angle of the laser can be flexibly adjusted for xenon lamps 40 of different specifications, allowing the laser to be efficiently coupled into the xenon lamp 40, exciting xenon gas to form plasma, thereby producing white light.

[0070] In this embodiment, the laser emitter 50 is movably mounted on the base 20 along a first direction, allowing the position of the laser emitter 50 to be adjusted along the first direction. This enables the tester to adjust the distance between the laser emitter 50 and the xenon lamp 40, which facilitates the laser emitted by the laser emitter 50 to be incident on the optimal plasma formation position inside the xenon lamp 40 of different specifications. This also helps the xenon lamp performance testing device 10 to adapt to the testing requirements of xenon lamps 40 of different specifications, further improving the versatility of the xenon lamp performance testing device 10.

[0071] In some embodiments of the present invention, such as Figure 1 As shown, along the second direction, the observation structure 60 and the optical power measurement structure 70 are located on both sides of the accommodating space 80, respectively. The second direction is perpendicular to the vertical direction and intersects with the first direction.

[0072] Among them, such as Figure 1 As shown, the second direction can be defined as the Y direction. The first and second directions can intersect on the same horizontal plane perpendicular to the up and down directions. As one embodiment, the first and second directions can be perpendicular to each other. As another embodiment, the first and second directions are arranged at an acute angle.

[0073] By placing the observation structure 60 and the optical power measurement structure 70 on both sides of the accommodating space 80 along the second direction, and placing the laser emitter 50 and the fixing structure 30 on both sides of the accommodating space 80 along the first direction, the risk of direct laser interference with the optical power measurement structure 70 and the observation structure 60 can be reduced. This allows laser excitation, plasma observation, and optical power measurement to be independent of each other, enabling multi-dimensional synchronous data acquisition and thus comprehensively evaluating the internal morphology and output performance of the xenon lamp 40 under actual working conditions.

[0074] In some embodiments of the present invention, the observation structure 60 is movably mounted on the base 20 along a second direction.

[0075] Among them, such as Figure 5 As shown, a second dovetail-shaped guide rail 140 extending in a second direction can be fixedly mounted on the base 20. The xenon lamp performance testing device 10 may also include a second mounting base 150 for mounting the observation structure 60. A second dovetail groove 151 adapted to the second dovetail-shaped guide rail 140 can be formed on the lower side of the second mounting base 150. Through the fitting and sliding cooperation between the second dovetail groove 151 and the second dovetail-shaped guide rail 140, the position of the second mounting base 150 can be adjusted in the second direction, thereby achieving the effect of movably mounting the observation structure 60 on the base 20 in the second direction.

[0076] like Figure 5As shown, a second driving structure 152 may be provided on the second mounting base 150. The second driving structure 152 can drive the second mounting base 150 and the observation structure 60 to move along the extension direction (i.e., the second direction) of the second dovetail guide rail 140. Specifically, as... Figure 5 As shown, the second drive structure 152 may include a second rotating wheel 1522, a second lead screw, a second gear, and a second rack. The second rotating wheel 1522 and the second gear can be coaxially and fixedly connected to the second lead screw. The second rack can be fixedly mounted on the second dovetail guide rail 120 and can extend along the second direction. The second gear can mesh with the second rack. The second lead screw can be rotatably mounted on the second mounting base 150. By rotating the second rotating wheel 1522, the second gear can be driven to rotate. At this time, the second gear meshes with the second rack, thereby enabling the second mounting base 150 and the observation structure 60 to move along the second direction.

[0077] like Figure 5 As shown, a third fixing part 153 may also be fixed above the second mounting base 150. The third fixing part 153 can be used to press and fix the observation structure 60. The third fixing part 153 may include a second support beam 1531, two second guide rods 1532, a second pressure head 1533, and a second locking assembly 1534.

[0078] Two second guide rods 1532 are spaced apart and fixed above the second mounting base 150. A second support beam 1531 passes through the two second guide rods 1532 and is movable in the vertical direction. A second pressure head 1533 is fixed below the second support beam 1531, and the lower contour of the second pressure head 1533 can be adapted to the outer surface contour of the observation structure 60. A second locking assembly 1534 can be fitted on the second guide rods 1532. The second locking assembly 1534 can be located above the second support beam 1531 and can be used to press the second support beam 1531 so that the third fixing part 153 can reliably press the observation structure 60. The second locking assembly 1534 can be a second locking nut 1535, and the second locking nut 1535 can be set one-to-one with the second guide rods 1532.

[0079] It should be noted that the location of plasma formation inside different models of xenon lamps will vary.

[0080] The xenon lamp performance testing device 10 of this application can make the center of the field of view of the observation structure 60 always aligned with the plasma formation position inside the xenon lamp 40 by moving the observation structure 60 along the second direction, which is conducive to further improving the versatility of the xenon lamp performance testing device 10.

[0081] In some embodiments of the present invention, such as Figure 1 , Figure 6As shown, the xenon lamp performance testing device 10 may further include: a second mounting bracket 90, the second mounting bracket 90 being fixed to the base 20, the second mounting bracket 90 having a mounting part 100, the mounting part 100 forming a light-collecting cavity 101 for opening toward the xenon lamp 40, and the spectrometer including an optical fiber structure, the optical fiber structure being fixed to the mounting part 100 and inserted into the light-collecting cavity 101.

[0082] Among them, such as Figure 1 , Figure 6 As shown, the second mounting bracket 90 can be constructed as a rod-shaped structure extending in the vertical direction. The lower end of the second mounting bracket 90 can be fixedly connected to the base 20. Specifically, the second mounting bracket 90 can be fixedly connected to the base 20 by welding, integral molding, or other methods.

[0083] As one embodiment, the mounting part 100 is movably disposed on the second mounting frame 90 in the vertical direction, and the mounting part 100 is detachably disposed on the second mounting frame 90. Specifically, as shown... Figure 6 As shown, the mounting portion 100 may have a third mounting hole 102 extending through the mounting portion 100 in the vertical direction, and the second mounting bracket 90 may be inserted through the third mounting hole 102.

[0084] The mounting part 100 may also have a fifth opening 103, which can be connected to the third mounting hole 102. The fifth opening 103 can be opened to the outside of the mounting part 100. The second mounting bracket 90 is mounted in the third mounting hole 102 to realize the quick assembly of the second mounting bracket 90 and the mounting part 100.

[0085] Both side walls near the open end of the fifth opening 103 can have fifth through holes 104 penetrating through the corresponding side walls. The fifth through holes 104 can communicate with the fifth opening 103, and two fifth through holes 104 communicating with the same fifth opening 103 are arranged opposite each other. A fifth locking member can be passed through the two fifth through holes 104 and tightened, clamping the second mounting bracket 90 between the two side walls of the fifth opening 103, thereby locking the mounting part 100 at the target height position. The aforementioned fifth locking member can be a locking bolt, locking screw, etc.

[0086] For example, the end of the optical fiber structure may be provided with an external thread, and the mounting part 100 may be formed with a threaded hole that communicates with the light-collecting cavity 101. The effect of fixing the optical fiber structure to the mounting part 100 and inserting it into the light-collecting cavity 101 can be achieved by using the threaded engagement of the external thread and the threaded hole.

[0087] By placing the optical fiber structure inside the light-collecting cavity 101, when the xenon lamp 40 emits light, only the light entering the interior of the light-collecting cavity 101 from the open end can be received by the optical fiber structure. This helps to reduce the interference of stray light, so that the spectrum measured by the spectrometer can truly reflect the output characteristics of the xenon lamp 40.

[0088] In some embodiments of the present invention, the xenon lamp performance testing device 10 may further include: a cooling structure, which is assembled with the laser emitter 50 to cool the laser emitter 50, and the cooling structure is communicatively connected to a host computer, which is used to control the operation of the cooling structure.

[0089] The cooling structure can be a water-cooled cooling structure, an air-cooled cooling structure, etc. This application uses a water-cooled cooling structure as an example for explanation. Specifically, the cooling structure can include a water-cooled head, a circulation pipeline, a cooling water tank, and a temperature control sensor. The circulation pipeline can connect the water-cooled head and the cooling water tank to form a closed cooling water loop, and the circulation pipeline can be located on the outer wall of the laser emitter 50.

[0090] The cooling structure may include multiple temperature control sensors, all of which can be mounted on the outer wall of the laser emitter 50. These temperature control sensors can communicate with a host computer to collect real-time temperature data of the laser emitter 50 and transmit the temperature data to the host computer. The host computer can then control the operating status of the cooling structure based on the real-time temperature data of the laser emitter 50 collected by the temperature control sensors.

[0091] Specifically, if the real-time temperature data of the laser emitter 50 collected by the temperature control sensor is higher than the preset upper limit temperature, the host computer can control the cooling water tank of the cooling junction to increase the cooling power and increase the cooling water circulation flow rate to improve the heat dissipation intensity. If the real-time temperature data of the laser emitter 50 collected by the temperature control sensor is lower than the preset lower limit temperature, the host computer can control the cooling water tank to reduce the cooling power and decrease the cooling water circulation flow rate, or stop the water circulation to reduce the heat dissipation intensity.

[0092] By setting up a cooling structure, on the one hand, the heat generated by the laser emitter 50 during operation can be removed in a timely manner, which helps to reduce the risk of the laser emitter 50 burning out due to the accumulation of heat generated during continuous operation and helps to improve the service life of the laser emitter 50. On the other hand, it can maintain the laser emitter 50 in a constant thermal equilibrium state, thereby ensuring the stability of the laser emitted by the laser emitter 50, which is crucial for achieving repeatable and highly stable excitation of the xenon lamp 40 plasma.

[0093] In some embodiments of the present invention, the xenon lamp performance testing device 10 may further include: a power supply unit, which is electrically connected to the xenon lamp 40 to supply power to the xenon lamp 40.

[0094] The power supply unit can be an adjustable DC power supply, constant current source, or other device capable of providing stable power. The power supply unit can communicate with a host computer, which can adjust parameters such as the output voltage and current of the power supply unit, thereby providing the low-current drive required for eigenstate testing of the xenon lamp 40.

[0095] Meanwhile, the optical power measurement structure 70 and the spectrometer can respectively measure the luminous power and spectrum of the xenon lamp 40 under low current drive. The power supply unit can also simulate the actual operating current of the xenon lamp 40 in a laser-driven white light source, providing the operating current to the xenon lamp 40 to work with the laser emitter 50 to excite the xenon lamp 40, making the test conditions closer to the real-world application scenario of the xenon lamp 40.

[0096] The host computer can communicate with the power supply unit and is configured to control the start and stop of the laser emitter 50. The host computer has an eigenstate test mode, where it can control the laser emitter 50 to turn off and control the power supply unit to provide a low-current drive to the xenon lamp 40, causing the xenon lamp 40 to emit weak light. In this mode, the optical power measurement structure 70 can measure the eigenstate power of the xenon lamp 40 under low-current drive, and the spectrometer can measure the eigenstate spectrum of the xenon lamp 40 under low-current drive. The host computer also has an excited-state test mode, where it can control the laser emitter 50 to turn on and control the power supply unit to provide operating current to the xenon lamp 40. In this mode, the optical power measurement structure 70 can measure the excited-state power of the xenon lamp 40 after laser excitation, and the spectrometer can measure the excited-state spectrum of the xenon lamp 40 after laser excitation. The host computer is also configured to compare and analyze the eigenstate power and eigenstate spectrum with the excited-state power and excited-state spectrum, respectively, to determine the root cause of xenon lamp 40 performance degradation.

[0097] The host computer can also be configured to perform multimodal data fusion of optical performance parameters and plasma morphology characteristics. Specifically, the host computer can acquire optical power data measured by the optical power measurement structure 70, spectral data measured by the spectrometer, and plasma morphology images inside the xenon lamp 40 acquired by the observation structure 60, and align and integrate the above measurement data into a unified multimodal feature vector through an embedded data fusion algorithm.

[0098] The host computer has a pre-trained prediction model. This model is trained using a supervised learning algorithm based on historical experimental data (including plasma image features, optical power attenuation curves, and spectra of the xenon lamp 40). It establishes a complex mapping relationship between multimodal feature vectors and the health status of the xenon lamp 40. The host computer can input the fused multimodal feature vectors into the prediction model, which outputs a health index for the xenon lamp 40. The health index quantifies the current overall health level of the xenon lamp 40; a higher health index indicates that the xenon lamp 40's performance is closer to its initial state, while a lower health index indicates more severe performance degradation.

[0099] Simultaneously, the host computer can also be configured to intelligently predict the remaining reliable lifespan of the xenon lamp 40 based on the health index and the lifespan prediction sub-model in the prediction model. The prediction result of the remaining reliable lifespan can be expressed in time units (such as hours, days) or the number of working cycles.

[0100] The host computer can also be configured to automatically generate a structured intelligent test report based on the health index and the predicted remaining reliable life. This test report includes at least: basic information about the xenon lamp 40, a comparison curve of test data between the intrinsic and excited states, plasma morphology assessment conclusions, the health index, the predicted remaining reliable life, and maintenance recommendations or reliability grading conclusions based on the prediction results.

[0101] With the above settings, the xenon lamp performance testing device 10 can not only complete the performance testing and evaluation of the xenon lamp 40, but also realize the quantitative monitoring of the health status of the xenon lamp 40 and the intelligent prediction of its remaining lifespan, providing scientific and comprehensive data support for the research and development screening, incoming material inspection and whole machine life prediction of the xenon lamp 40.

[0102] Based on this, by setting up a power supply unit, the testing range of the xenon lamp performance testing device 10 can be expanded, enabling the xenon lamp performance testing device 10 to complete the comparative test of the intrinsic state and excited state of the xenon lamp 40, which is conducive to further improving the comprehensiveness and accuracy of the xenon lamp 40 performance evaluation.

[0103] Other configurations and operations of the xenon lamp performance testing apparatus 10 according to embodiments of the present invention are known to those skilled in the art and will not be described in detail here.

[0104] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0105] Although embodiments of the invention have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.

Claims

1. A xenon lamp performance testing device, characterized in that, include: Base (20); A fixing structure (30) is mounted on the base (20) and is used to fix the xenon lamp (40); A laser emitter (50) is adapted to be mounted on the base (20) and is used to emit a laser to the xenon lamp (40) to excite the xenon gas inside the xenon lamp (40) to form plasma so that the xenon lamp (40) emits light. An observation structure (60) is adapted to be installed on the base (20) and is used to observe the internal state of the xenon lamp (40) when it is working. An optical power measurement structure (70) is adapted to be installed on the base (20) and is used to measure the total white light output power of the xenon lamp (40) after it is excited by laser. A spectrometer, the spectrometer being used to measure the output spectrum of the xenon lamp (40) after it is excited by a laser; The host computer is communicatively connected to the laser emitter (50), the observation structure (60), the optical power measurement structure (70), and the spectrometer. The host computer is configured to control the operation of the laser emitter (50) and is also configured to determine the performance of the xenon lamp (40) based on the measurement information of the observation structure (60), the optical power measurement structure (70), and the spectrometer.

2. The xenon lamp performance testing device according to claim 1, characterized in that, The fixing structure (30) includes a first mounting bracket (31) and a clamping part (32). The first mounting bracket (31) is mounted on the base (20), and the clamping part (32) is detachably mounted on the first mounting bracket (31). The clamping part (32) is used to clamp and fix the xenon lamp (40).

3. The xenon lamp performance testing device according to claim 2, characterized in that, The clamping part (32) has a clamping opening (3211) that extends through the clamping part (32) in the vertical direction. The clamping opening (3211) is used to assemble the xenon lamp (40) so that the clamping part (32) clamps and fixes the xenon lamp (40).

4. The xenon lamp performance testing device according to claim 2, characterized in that, The first mounting bracket (31) includes: a first frame (311), a second frame (312) and a third frame (313). The first frame (311) is fixed to the base (20). The second frame (312) is movably mounted on the first frame (311) in the vertical direction. The third frame (313) is movably mounted on the second frame (312) in a first direction. The clamping part (32) is detachably mounted on the third frame (313). The first direction is perpendicular to the vertical direction.

5. The xenon lamp performance testing device according to claim 1, characterized in that, The laser emitter (50) and the fixed structure (30) are opposite to and spaced apart along a first direction to form a receiving space (80) for accommodating the xenon lamp (40) between the laser emitter (50) and the fixed structure (30), and the laser emitter (50) is movably mounted on the base (20) along the first direction, which is perpendicular to the up and down direction.

6. The xenon lamp performance testing device according to claim 5, characterized in that, Along the second direction, the observation structure (60) and the optical power measurement structure (70) are located on both sides of the accommodating space (80), the second direction is perpendicular to the vertical direction, and the second direction intersects the first direction.

7. The xenon lamp performance testing device according to claim 6, characterized in that, The observation structure (60) is movably mounted on the base (20) along the second direction.

8. The xenon lamp performance testing device according to claim 1, characterized in that, The xenon lamp performance testing device (10) further includes: a second mounting bracket (90), which is fixed to the base (20). The second mounting bracket (90) is provided with a mounting part (100), which forms a light-collecting cavity (101) for opening toward the xenon lamp (40). The spectrometer includes an optical fiber structure, which is fixed to the mounting part (100) and inserted into the light-collecting cavity (101).

9. The xenon lamp performance testing device according to claim 1, characterized in that, The xenon lamp performance testing device (10) further includes a cooling structure, which is assembled with the laser emitter (50) to cool the laser emitter (50). The cooling structure is communicatively connected to the host computer, which is used to control the operation of the cooling structure.

10. The xenon lamp performance testing apparatus according to any one of claims 1-9, characterized in that, The xenon lamp performance testing device (10) further includes a power supply unit, which is electrically connected to the xenon lamp (40) to supply power to the xenon lamp (40).

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