Radiation scanning device and data processing method, terminal device, and storage medium

Abstract

The application relates to the technical field of ray scanning, and discloses a ray scanning device, a data processing method, a terminal device and a storage medium, which are used for effectively expanding the imaging field of view of parallel light CT without reducing the spatial resolution. The device comprises a ray source, a detector, a sample adjusting table, a first adjusting table for moving a sample, a rotating table arranged on the first adjusting table and used for rotating the sample around a vertical rotating shaft, a second adjusting table arranged on the rotating table and used for finely adjusting the relative position of the sample and the rotating shaft of the rotating table in a second horizontal direction, a third adjusting table arranged on the second adjusting table and used for finely adjusting the relative position of the sample and the rotating shaft of the rotating table in a third horizontal direction, and the second horizontal direction is perpendicular to the third horizontal direction. The ray scanning device further comprises a controller configured to position the rotating shaft of the rotating table in an edge region of a horizontal pixel arrangement direction of the detection surface array.

Description

Technical Field

[0001] This application relates to the field of X-ray scanning technology, and in particular to an X-ray scanning device, a data processing method, a terminal device, and a storage medium. Background Technology

[0002] Synchrotron radiation parallel light CT offers advantages such as high spatial resolution and multi-mode contrast imaging, and is widely used in materials science, energy, and life sciences. In this technique, X-rays irradiate the sample in a parallel manner, and projection data is received by an area array detector.

[0003] However, because the X-ray beam is parallel, the imaging field of view is strictly equal to the effective detector array size, and the magnification ratio cannot be changed by adjusting the sample-detector distance. Furthermore, high-resolution imaging requires high-magnification optical lenses and small-pixel detectors, which directly leads to a smaller field of view, creating an inherent contradiction between spatial resolution and imaging field of view. When the sample size exceeds the detector's field of view, the projected data is truncated, and conventional reconstruction algorithms will produce severe truncation artifacts, resulting in blurred edges and distorted CT values ​​in the reconstructed image.

[0004] To expand the effective field of view, a multi-field stitching scheme involving sample translation exists. This scheme requires moving the sample to multiple lateral positions for separate scanning, and then stitching the data from each field of view together. However, this approach suffers from several drawbacks, including a significant increase in acquisition time, extremely high mechanical precision requirements during the stitching process, susceptibility to stitching artifacts, and complex data processing.

[0005] Therefore, how to effectively expand the imaging field of parallel light CT without reducing spatial resolution is a problem that needs to be solved. Summary of the Invention

[0006] In view of this, embodiments of this application provide a radiographic scanning device, a data processing method, a terminal device, and a storage medium, for effectively expanding the imaging field of parallel light CT without reducing spatial resolution.

[0007] In a first aspect, embodiments of this application provide a radiation scanning device, comprising: A radiation source, used to generate a parallel beam of radiation to irradiate a sample; The detector is placed in the output light path of the X-ray source to receive the X-rays that have penetrated the sample and generate projection data. A sample adjustment stage, positioned between the X-ray source and the detector, includes: The first adjustment stage is used to move the sample along the first horizontal direction; the first horizontal direction is parallel to the horizontal pixel arrangement direction of the detector's detection array. A turntable, set on the first adjustment platform, is used to drive the sample to rotate around a vertical axis; The second adjustment stage, set on the turntable, is used to finely adjust the relative position of the sample and the rotation axis of the turntable in the second horizontal direction. The third adjustment platform, located on the second adjustment platform, is used to finely adjust the relative position of the sample and the rotation axis of the turntable in the third horizontal direction; the second horizontal direction is perpendicular to the third horizontal direction. The X-ray scanning device also includes a controller configured to control the movement of the first adjustment stage, the second adjustment stage, and the third adjustment stage, and to position the rotation axis of the turntable within the edge region of the horizontal pixel arrangement direction of the detection array.

[0008] In some embodiments, the controller is further configured to: control the first adjustment stage, the turntable, the second adjustment stage, and the third adjustment stage to move before positioning the axis of rotation of the turntable within the edge region of the horizontal pixel arrangement direction of the detector array, aligning the axis of rotation with the center of the sample in the second and third horizontal directions.

[0009] In some embodiments, the controller is specifically configured to: control the first adjustment stage to move along a first horizontal direction to a first position, the first position being a position where the rotation axis of the turntable is aligned with the horizontal center of the detector array; control the turntable to rotate to an initial rotation position; at the initial rotation position, the second horizontal direction is parallel to the first horizontal direction; after the sample is placed on the third adjustment stage, control the second adjustment stage to adjust the sample to a second position along the second horizontal direction; the second position being a position where the center of the sample is aligned with the rotation axis of the turntable in the first horizontal direction; control the turntable to rotate to a target rotation position; at the target rotation position, the third horizontal direction is parallel to the first horizontal direction; control the third adjustment stage to adjust the sample to a third position along the first horizontal direction; the third position being a position where the center of the sample is aligned with the rotation axis of the turntable in the third horizontal direction.

[0010] In some embodiments, the controller is further configured to: after positioning the rotation axis of the turntable within the edge region of the horizontal pixel arrangement direction of the detector array, control the turntable to rotate continuously 360° around the vertical rotation axis, and simultaneously control the detector to continuously acquire projection data of the sample in the range of 0° to 360° during the rotation of the turntable.

[0011] In some embodiments, the rotation axis of the turntable is positioned within the edge region of the horizontal pixel arrangement direction of the detector array, specifically including: the distance between the projection of the rotation axis of the turntable on the detector array and the left or right boundary of the horizontal pixel arrangement direction of the detector array does not exceed a preset distance, or does not exceed a preset proportion of the total width of the horizontal pixel arrangement direction of the detector array.

[0012] Secondly, embodiments of this application provide a data processing method applicable to any of the X-ray scanning devices involved in the first aspect; the method includes: acquiring projection data; the projection data is the sample projection data acquired by the detector when the center of the sample is aligned with the rotation axis of the turntable and the rotation axis of the turntable is located within the edge region of the horizontal pixel arrangement direction of the detector's detection array, and the turntable is rotated by a preset angle; the preset angle is greater than 180°; extracting a first sine wave of the sample based on the projection data; the first sine wave includes a first sub-sine wave of a first angle interval and a second sub-sine wave of a second angle interval; removing duplicate columns between the first sub-sine wave and the second sub-sine wave based on the target number of duplicate columns to be removed; flipping the second sub-sine wave after removing duplicate columns and then stitching it with the first sub-sine wave to obtain a second sine wave; reconstructing the second sine wave to obtain a slice image of the sample.

[0013] In some embodiments, the preset angle is 360°, the first angle range is 0° to 180°, and the second angle range is 180° to 360°.

[0014] In some embodiments, the target number of duplicate columns to be removed is determined by the following steps: setting multiple different candidate numbers of duplicate column removal; for each candidate number of duplicate column removal, removing duplicate columns between the first angle interval and the second angle interval in the sine graph according to the candidate number of duplicate column removal; processing the sine graph after removing duplicate columns to determine the candidate slice image corresponding to the candidate number of duplicate column removal; comparing the artifact situation of each candidate slice image; and determining the candidate number of duplicate column removal corresponding to the candidate slice image with the best artifact situation as the target number of duplicate column removal.

[0015] Thirdly, embodiments of this application provide a data processing apparatus, comprising: an acquisition module for acquiring projection data; the projection data being the sample projection data acquired by the detector when the center of the sample is aligned with the axis of rotation of a turntable, and the axis of rotation of the turntable is located within the edge region of the horizontal pixel arrangement direction of the detector's array, and the turntable rotates by a preset angle; the preset angle is greater than 180°; a processing module for extracting a first sine wave of the sample based on the projection data; the first sine wave includes a first sub-sine wave of a first angle interval and a second sub-sine wave of a second angle interval; the processing module is further configured to remove duplicate columns between the first sub-sine wave and the second sub-sine wave; the processing module is further configured to flip the second sub-sine wave after removing duplicate columns and then stitch it with the first sub-sine wave to obtain a second sine wave; the processing module is further configured to reconstruct the second sine wave to obtain a slice image of the sample.

[0016] Fourthly, embodiments of this application provide a terminal device including a processor and a memory, the memory storing a computer program, and the processor executing the computer program to implement any of the data processing methods in the second aspect.

[0017] Fifthly, embodiments of this application provide a computer-readable storage medium storing a computer program, which, when executed on a processor, implements any of the data processing methods in the second aspect.

[0018] The embodiments of this application have the following beneficial effects: by actively offsetting the rotation axis of the turntable from the detector center and positioning it at the horizontal edge region of the detector array through the controller, the projection data of the sample at different angles during the rotation from 0° to 360° occupies different half of the detector's field of view. Combined with the flipping and stitching in subsequent data processing, the effective imaging field of view can be extended to nearly twice the physical size of the detector.

[0019] During data acquisition, neither the sample nor the detector needs to perform lateral stepping scans or multiple position switching; a single 360° continuous rotation is sufficient to complete the acquisition of all projection data. This avoids mechanical reciprocating motion between multiple positions, significantly shortens the acquisition time, eliminates the need for high-precision multi-station mechanical alignment, reduces reliance on the accuracy of the motion control system, and eliminates the boundary alignment error issues caused by multi-field stitching.

[0020] In practical imaging applications, no hardware modifications are required. A single 360° scan can acquire projection data for both halves of the sample. Then, utilizing the physical property of mirror symmetry in parallel light beam scanning of the front and back projections, and by removing duplicate columns from the sine curve, flipping and stitching, the projection data of the left and right halves of the sample can be synthesized into a complete image of the sample. The 180° sine curve is used to reconstruct the slice image, which not only expands the imaging field of view to nearly twice the physical size of the detector, but also avoids the complex calculation of image registration. At the same time, the deduplication step can be flexibly adjusted to eliminate stitching artifacts, resulting in high-quality sample slice images. Attached Figure Description

[0021] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0022] Figure 1 A schematic diagram of the structure of an X-ray scanning device provided in an embodiment of this application is shown; Figure 2A flowchart of a data processing method provided in an embodiment of this application is shown; Figure 3 A scenario illustration of a data processing method provided in the embodiments of this application. Figure 1 ; Figure 4 This application provides a scenario illustration of a data processing method according to an embodiment. Figure 2 ; Figure 5 This application provides a scenario illustration of a data processing method according to an embodiment. Figure 3 ; Figure 6 This application provides a scenario illustration of a data processing method according to an embodiment. Figure 4 ; Figure 7 This application provides a scenario illustration of a data processing method according to an embodiment. Figure 5 ; Figure 8 This application provides a scenario illustration of a data processing method according to an embodiment. Figure 6 ; Figure 9 This application provides a scenario illustration of a data processing method according to an embodiment. Figure 7 ; Figure 10 The present application provides an overall logical schematic diagram of a data processing method according to an embodiment; Figure 11 The present application provides a schematic diagram of the structure of a data processing device according to an embodiment. Detailed Implementation

[0023] The technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments.

[0024] The components of the embodiments of this application described and illustrated in the accompanying drawings can be arranged and designed in a variety of different configurations. Therefore, the following detailed description of the embodiments of this application provided in the drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0025] In the following text, the terms "comprising," "having," and their cognates, which may be used in various embodiments of this application, are intended only to indicate a particular feature, number, step, operation, element, component, or combination thereof, and should not be construed as primarily excluding the presence of one or more other features, numbers, steps, operations, elements, components, or combinations thereof, or adding the possibility of one or more combinations thereof. Furthermore, the terms "first," "second," "third," etc., are used only for distinguishing descriptions and should not be construed as indicating or implying relative importance.

[0026] Unless otherwise specified, all terms used herein (including technical and scientific terms) shall have the same meaning as commonly understood by one of ordinary skill in the art to which the various embodiments of this application pertain. Terms (such as those defined in commonly used dictionaries) shall be interpreted as having the same meaning as in their contextual meaning in the relevant technical field and shall not be construed as having an idealized or overly formal meaning, unless clearly defined in the various embodiments of this application.

[0027] As described in the background section, how to effectively expand the imaging field of parallel light CT without reducing spatial resolution is a problem that needs to be solved.

[0028] Based on this, this application provides a X-ray scanning device. By setting up a first adjustment stage, a turntable, a second adjustment stage, and a third adjustment stage, and combining the coordinated control of the coarse adjustment of the first adjustment stage, the fine adjustment of the second adjustment stage, and the fine adjustment of the third adjustment stage, the rotation axis of the turntable can be actively offset from the center of the detector array to the edge area of ​​the horizontal pixel arrangement direction. Without increasing any hardware cost, a single 360° scan can cover the complete left and right halves of the sample, providing a precise and reliable hardware foundation for subsequent sine wave stitching and reconstruction, and expanding the effective imaging field of view of the detector to nearly twice the original physical size.

[0029] Figure 1 This diagram illustrates the structure of a X-ray scanning device according to an embodiment of this application. Figure 1 As shown, the X-ray scanning device includes a X-ray source 10 ( Figure 1 (Not shown), detector 20, sample stage 30, and controller 40 ( Figure 1 (Not shown).

[0030] Figure 1 Image (a) shows a front view of the X-ray scanning apparatus. Figure 1 (b) shows a top view of the X-ray scanning device.

[0031] The radiation source 10 is used to generate a parallel beam of radiation to irradiate the sample. The radiation is preferably X-rays, which have strong penetrating power and can penetrate the sample and be received by the detector, thereby carrying the structural information inside the sample.

[0032] For example, the X-ray source 10 can be a laboratory-grade X-ray source or a large-scale scientific facility-level synchrotron radiation source. A laboratory-grade X-ray source includes an X-ray tube and collimating optics. The X-ray tube generates a divergent, cone-shaped beam of X-rays, and the collimating optics reshape the scattered beam into a parallel beam to irradiate the sample. A synchrotron radiation source utilizes the electromagnetic radiation generated by high-energy charged particles (such as neutrons, protons, electrons, positrons, etc.) moving in curved paths within a storage ring. Combined with a monochromator (such as a silicon single-crystal spectrometer), a high-intensity monochromatic parallel X-ray beam can be obtained, which can be directly used for sample irradiation.

[0033] Detector 20 is positioned in the output light path of X-ray source 10 to receive the X-rays that have penetrated the sample and generate projection data. Detector 20 is preferably an area array detector, with a rectangular detection array having both horizontal and vertical pixel arrangement directions. The size of the detection array of detector 20 determines the upper limit of the imaging field of view for parallel light scanning.

[0034] Normally, the detector array size of detector 20 is smaller than the illumination range of the parallel beam. However, when the detector array size of detector 20 is larger than the illumination range of the parallel beam, the effective illumination spot can be expanded to nearly twice its size by positioning the rotating shaft at the edge region of the parallel beam spot.

[0035] The sample adjustment stage 30 is disposed between the X-ray source 10 and the detector 20. The sample adjustment stage 30 includes: a first adjustment stage 301, a turntable 302, a second adjustment stage 303, and a third adjustment stage 304.

[0036] Turntable 302 is mounted on first adjustment platform 301, second adjustment platform 303 is mounted on turntable 302, and third adjustment platform 304 is mounted on second adjustment platform 303. That is, the four components of first adjustment platform 301, turntable 302, second adjustment platform 303 and third adjustment platform 304 are stacked vertically to form a four-axis adjustment structure of "coarse adjustment first adjustment platform + rotation + fine adjustment second adjustment platform + fine adjustment third adjustment platform".

[0037] The first adjusting platform 301 is used to move the sample along the first horizontal direction. Since the turntable 302, the second adjusting platform 303, the third adjusting platform 304, and the sample are all placed on the first adjusting platform 301, moving the sample with the first adjusting platform 301 essentially means moving all the components above the first adjusting platform 301 (turntable 302, second adjusting platform 303, third adjusting platform 304, and sample) along the first horizontal direction (i.e.,...). Figure 1The x-direction (parallel to the horizontal pixel arrangement direction of the detector array of detector 20) moves as a whole.

[0038] For example, the first adjustment stage 301 is a coarse adjustment electric displacement stage, whose stroke is greater than the horizontal dimension of the detector array. For example, the stroke of the first adjustment stage 301 is greater than 1.5 times the horizontal dimension of the detector array. The drive motor of the first adjustment stage 301 is a stepper motor or a servo motor.

[0039] The turntable 302 is mounted on the first adjusting platform 301 and is used to drive the sample to rotate around a vertical axis. The turntable 302 can be installed in a fixed or detachable manner. The turntable 302 can be a high-precision air-bearing turntable or a precision worm gear turntable to ensure that the spatial position of the rotation axis of the sample is highly stable during rotation.

[0040] The second adjustment stage 303 is mounted on the turntable 302 and is used for fine adjustment of the relative position of the sample and the rotation axis of the turntable in the second horizontal direction. The second adjustment stage 303 can be installed in a fixed or detachable manner. The second adjustment stage 303 is a fine-tuning displacement stage, with a stroke less than that of the first adjustment stage 301, but a higher adjustment accuracy.

[0041] The third adjustment stage 304 is mounted on the second adjustment stage 303 and is used for fine adjustment of the relative position of the sample and the rotation axis of the turntable in the third horizontal direction. The third adjustment stage 304 can be fixedly installed or detachably installed. The third adjustment stage 304 is also a fine-tuning displacement stage, with a stroke and adjustment accuracy comparable to or better than the second adjustment stage 303, preferably a high-precision displacement stage of the same model as the second adjustment stage 303. The second horizontal direction is perpendicular to the third horizontal direction.

[0042] The sample is placed on the third adjustment platform 304 and moves in conjunction with the third adjustment platform 304, the second adjustment platform 303, the turntable 302 and the first adjustment platform 301.

[0043] Optionally, the first adjustment stage 301 can also be a manual displacement stage, used with a micrometer or vernier caliper for position reading and adjustment. The second adjustment stage 303 and the third adjustment stage 304 can also be high-precision displacement mechanisms based on different principles, including but not limited to piezoelectric ceramic displacement stages, stepper motor driven ball screw slides, manual differential head slides, etc.

[0044] The controller 40 is electrically connected to the X-ray source 10, the detector 20, and the first adjustment stage 301, the turntable 302, the second adjustment stage 303, and the third adjustment stage 304 of the sample adjustment stage 30, respectively, and is used to send motion control commands to each component and receive position feedback signals.

[0045] For example, controller 40 can be a motion controller with multi-axis linkage control function, which can simultaneously control four motion axes and realize the synchronous triggering of the rotation of turntable 302 and the acquisition of data by detector 20.

[0046] Optionally, the controller 40 can also be a software module integrated into the detector control system or the central control system of the experimental station, which can complete the linkage control of the sample adjustment stage 30 through software instructions.

[0047] The controller 40 is configured to control the movement of the first adjustment stage 301, the second adjustment stage 303 and the third adjustment stage 304, and to position the rotation axis of the turntable 302 within the edge region of the horizontal pixel arrangement direction of the detection array.

[0048] In some embodiments, the controller 40 controls the X-ray source 10, detector 20, first adjustment stage 301, turntable 302, second adjustment stage 303, and third adjustment stage 304, either automatically by executing pre-stored computer instructions or manually by the operator through a software interface.

[0049] In some embodiments, the rotation axis of the turntable 302 is positioned within the edge region of the horizontal pixel arrangement direction of the detector array, specifically including: the distance between the projection of the rotation axis of the turntable 302 onto the detector array and the left or right boundary of the horizontal pixel arrangement direction of the detector array does not exceed a preset distance, or does not exceed a preset proportion of the total width of the horizontal pixel arrangement direction of the detector array.

[0050] For example, the preset distance can be 0.7mm, and the distance between the projection of the rotation axis of the turntable 302 onto the detector array and the right boundary of the horizontal pixel arrangement direction of the detector array does not exceed 0.7mm. As another example, the distance between the projection of the rotation axis of the turntable 302 onto the detector array and the left or right boundary of the horizontal pixel arrangement direction of the detector array does not exceed 10% of the total horizontal width of the detector array.

[0051] Preferably, the axis of rotation of the turntable 302 can be positioned at a distance of 5% of the total horizontal width from the right boundary of the detection array.

[0052] In some embodiments, the controller 40 is further configured to: control the first adjustment stage 301, the turntable 302, the second adjustment stage 303, and the third adjustment stage 304 to move before positioning the axis of rotation of the turntable 302 within the edge region of the horizontal pixel arrangement direction of the detector array, so as to align the axis of rotation with the center of the sample in the second horizontal direction and the third horizontal direction.

[0053] Specifically: Controller 40 controls the first adjustment stage 301 to move along the first horizontal direction to a first position, where the rotation axis of turntable 302 is aligned with the horizontal center of the detection array; controls the turntable 302 to rotate to an initial rotation position; at the initial rotation position, the second horizontal direction is parallel to the first horizontal direction; after the sample is placed on the third adjustment stage 304, controls the second adjustment stage 303 to adjust the sample along the second horizontal direction to a second position; the second position is where the center of the sample is aligned with the rotation axis of turntable 302 in the first horizontal direction; controls the turntable 302 to rotate to a target rotation position; at the target rotation position, the third horizontal direction is parallel to the first horizontal direction; controls the third adjustment stage 304 to adjust the sample along the first horizontal direction to a third position; the third position is where the center of the sample is aligned with the rotation axis of turntable 302 in the third horizontal direction.

[0054] Before the rotation axis is biased to the edge of the detector array of detector 20, the center of the sample is precisely adjusted to the rotation axis of the turntable 302. Through this alignment process, subsequent scans can ensure that the same position of the sample is always within the field of view of detector 20 at different rotation angles, and can also ensure that the 0° and 180° projection data have a strict mirror symmetry relationship.

[0055] The initial rotation position is recorded as the 0° position of the turntable 302. At this position, the movement direction of the second adjusting table 303—the second horizontal direction—is parallel to the first horizontal direction, that is, as shown below. Figure 1 The x-direction is shown; the moving direction of the third adjusting platform 304—the third horizontal direction is perpendicular to the first horizontal direction, that is, as shown... Figure 1 y direction shown.

[0056] The target rotation position is denoted as the 90° position of the turntable 302. At this position, the movement direction of the second adjusting table 303—the second horizontal direction—is perpendicular to the first horizontal direction, i.e., as shown below. Figure 1 The y-direction is shown; the moving direction of the third adjusting platform 304—the third horizontal direction is parallel to the first horizontal direction, that is, as shown... Figure 1 The x-direction is shown.

[0057] For example, the process of aligning the center of the sample with the axis of rotation of the turntable 302 can be as follows: 1. Zeroing operation. The controller 40 controls the first adjustment platform 301, the turntable 302, the second adjustment platform 303 and the third adjustment platform 304 to move to their respective mechanical zero point or electrical zero point positions, that is, to the initial rotation position of the turntable 302.

[0058] 2. Align the rotating shaft with the center of detector 20 (coarse adjustment of the first adjustment stage 301). Controller 40 controls the first adjustment stage 301 to move along the first horizontal direction (x-direction). Observe the projection position of the rotation axis of the turntable 302 onto the detector array of detector 20 until the projection is aligned with the horizontal center of the detector array of detector 20. Record the position of the first adjustment stage 301 at this point. This step can be confirmed by installing a crosshair indicator at the location of detector 20 or by observing the image captured by detector 20 itself.

[0059] 3. The turntable 302 is horizontally centered at the 0° position (the second adjustment stage 303 is finely adjusted). The sample is fixed on the third adjustment stage 304, and the controller 40 controls the turntable 302 to rotate to the 0° position. In this position, the movement direction (second horizontal direction) of the second adjustment stage 303 is consistent with the x-direction. The controller 40 controls the second adjustment stage 303 to move slowly along the x-direction, while simultaneously observing the change in the horizontal position of the sample center (or other feature markers of the sample) in the image of the detector 20 in real time, until the sample center moves to the horizontal center position of the detector array of the detector 20. At this time, since the rotation axis center has been aligned with the center of the detector 20 in step 2, the sample center is aligned with the rotation axis of the turntable 302 in the first horizontal direction.

[0060] 4. The turntable 302 is vertically centered at the 90° position (the third adjustment stage 304 is fine-tuned). The controller 40 controls the turntable 302 to rotate to the 90° position. The controller 40 controls the third adjustment stage 304 to move slowly along the x-direction, observing the position change of the sample center in the image of the detector 20, until the sample center moves back to the horizontal center position of the detector array of the detector 20. At this time, the sample center is aligned with the rotation axis of the turntable 302 in the dimension perpendicular to the first horizontal direction.

[0061] After adjustments in steps 2 to 4, the sample center is precisely aligned with the rotation axis of the turntable 302 in both the x and y directions, which are orthogonal dimensions. At this point, no matter what angle the turntable 302 rotates to, the sample center remains on the rotation axis.

[0062] This "co-directional drive, time-sharing operation" design means that the entire sample adjustment stage 30 only requires two layers of fine-tuning structure in the vertical direction, without the need for an independent vertical lifting axis. The structure is compact, enabling the sample to "rotate purely on its own".

[0063] In some embodiments, the controller 40 is further configured to: after positioning the rotation axis of the turntable 302 within the edge region of the horizontal pixel arrangement direction of the detector array, control the turntable 302 to rotate continuously 360° around the vertical rotation axis, and simultaneously control the detector 40 to continuously acquire projection data of the sample in the range of 0° to 360° during the rotation of the turntable.

[0064] After the sample center is aligned with the rotation axis of the turntable 302, the controller 40 further controls the first adjustment stage 301 to move along the first horizontal direction, moving the rotation axis of the turntable 302 away from the center position of the detector array of the detector 20. The detector moves to the edge region of the horizontal pixel arrangement direction of the detector array. This process can also quantitatively determine the adjustment value of the first adjustment stage 301 by means of the detector array size of the detector 20.

[0065] After the axis offset is completed, the controller 40 starts the scanning and acquisition program: controlling the turntable 302 to rotate continuously 360° around the vertical axis, while simultaneously triggering the detector 20 to continuously acquire projection data during the rotation of the turntable 302. The acquisition frame rate of the detector 20 is matched with the rotation speed of the turntable 302 to ensure that a preset number of projection images are acquired uniformly within the 360° range. For example, if the turntable 302 rotates at a constant speed of 0.5° / s and the detector acquires at a frame rate of 10Hz, a total of 720 projection images will be acquired during the 360° rotation, with an angle interval of 0.5°. As another example, if the rotation angle step of the turntable 302 is 0.25°, a total of 1440 projection frames can be acquired.

[0066] The data processing method will now be described in detail with reference to the accompanying drawings and some specific embodiments. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0067] Figure 2 A flowchart of a data processing method according to an embodiment of this application is shown. This data processing method can be executed in the processor built into the controller 40, or in a separate data processing computer. The data processing method includes the following steps: S101. Obtain projection data.

[0068] The projection data refers to the sample's projection data acquired by the detector when the center of the sample is aligned with the rotation axis of the turntable, and the rotation axis of the turntable is located within the edge region of the horizontal pixel arrangement direction of the detector's detection array, after the turntable has been rotated by a preset angle. The preset angle is greater than 180°.

[0069] When the preset angle is greater than 180°, the projection data of the sample rotation will have overlapping parts, requiring subsequent steps.

[0070] The preset angle can be 360°. Correspondingly, the projection data is the projection data of the sample within the rotation angle range of 0° to 360°. Rotating the sample 360° is sufficient to collect all the data of the sample completely, without the need for further rotation.

[0071] Before acquiring projection data, dark field data (detector output when the X-ray source is off or there is no X-ray irradiation) and white field data (detector output when the X-ray source is on and there is no sample) can also be collected. Based on the dark field data and white field data, the projection data can be background corrected to eliminate the influence of detector dark current noise and optical path structure inhomogeneity.

[0072] Alternatively, after acquiring the projection data, the sample can be moved out of the X-ray beam irradiation range, and then dark field data and white field data can be acquired for background correction.

[0073] S102. Based on the projection data, extract the first sine curve of the sample.

[0074] The first sine graph includes a first sub-sine graph of the first angle interval and a second sub-sine graph of the second angle interval.

[0075] It should be understood that the first sub-sine graph and the second sub-sine graph are continuous. Taking a certain angle as a node, the first sine graph is divided into two parts: the first angle interval and the second angle interval. The first sub-sine graph and the second sub-sine graph together constitute the continuous segmentation of the first sine graph in the angle domain.

[0076] Since there is no repeated scanning when the sample is scanned 180° in the X-ray scanning device, the dividing point between the first angle interval and the second angle interval can be 180°.

[0077] For example, the preset angle is 360°, the first angle range is 0° to 180°, and the second angle range is 180° to 360°. Using 180° as the angle boundary, the first sine graph is divided into a first sub-sine graph from 0° to 180° and a second sub-sine graph from 180° to 360°.

[0078] For parallel beam scanning (CT), since the beams are parallel, each slice is reconstructed independently, allowing for layer-by-layer processing. Specifically, based on projection data, for a given slice (i.e., a row of pixels in the probe array), the pixel value sequence of that row at all projection angles is extracted to construct a 0°~360° sine curve for that slice.

[0079] S103. Based on the target number of duplicate columns to be removed, remove duplicate columns between the first sub-sine graph and the second sub-sine graph.

[0080] Because the turntable's axis of rotation is located at the edge of the detector's array, there is a slight overlap between the projected data of the first angular interval and the projected data of the second angular interval at the edge. In the first sine wave, this overlap manifests as several repeating columns, which must be removed.

[0081] In some embodiments, the target number of duplicate columns to be removed is determined by the following steps: setting multiple different candidate numbers of duplicate columns to be removed; for each candidate number of duplicate columns to be removed, removing duplicate columns between the first angle interval and the second angle interval in the sine graph according to the candidate number of duplicate columns to be removed; processing the sine graph after removing duplicate columns to determine the candidate slice image corresponding to the candidate number of duplicate columns to be removed; comparing the artifact situation of each candidate slice image; and taking the candidate number of duplicate columns to be removed corresponding to the candidate slice image with the best artifact situation as the target number of duplicate columns to be removed.

[0082] The artifact situation of candidate slice images can be determined by examining the smoothness of the slice edge structure.

[0083] For example, Figure 3 This is the original first sine curve. Figure 4 The image shows a sine curve from 0° to 180° after directly splicing together columns without removing duplicates. The sine curve is clearly discontinuous and misaligned. Figure 5 Based on Figure 4 The reconstructed slice image of the sine curve shown has an obviously uneven slice outline and exhibits ghosting artifacts. Figure 6 The 0°-180° sine graph, directly spliced ​​after excessive removal of duplicate columns, is noticeably discontinuous and misaligned. Figure 7 Based on Figure 6 The reconstructed slice image of the sine wave shown has an obviously uneven slice outline, exhibiting ghosting artifacts, and the direction of the ghosting is opposite to... Figure 5 on the contrary. Figure 8 To correctly remove duplicate columns and directly splice the 0°-180° sine curve, ensuring a smooth and continuous sine curve, Figure 9 Based on Figure 8 The reconstructed slice image of the sine curve shown has a clear and smooth outline.

[0084] Optionally, a base value for the number of duplicate columns to be removed can be determined first, and then multiple different candidate numbers for removing duplicate columns can be determined based on this base value. For example, if the base value for the number of duplicate columns to be removed is 7, then 7-3, 7-2, 7-1, 7, 7+1, 7+2, 7+3, that is, 4, 5, 6, 7, 8, 9, and 10 can all be determined as candidate numbers for removing duplicate columns.

[0085] The base value for the number of duplicate columns to be removed can be obtained by dividing the axis offset distance d by the detector pixel size p. The axis offset distance d represents the distance between the projection position of the axis center on the detector array and the edge of the detector.

[0086] By setting multiple candidate duplicate column removal quantities and reconstructing slice images separately, and then selecting the optimal deduplication parameters based on artifact conditions, the determination of stitching accuracy is transformed from subjective experience judgment to a parameter optimization process driven by objective image quality feedback. This effectively eliminates sine curve misalignment or data redundancy caused by deviations in the number of deduplications (too many or too few), ensuring the continuity of the stitched sine curve and the structural authenticity of the reconstructed slices. At the same time, this scheme does not rely on additional calibration phantoms or prior knowledge, and can adapt to different samples and offset positions, significantly improving the robustness of the field-of-view expansion reconstruction results and the consistency of image quality.

[0087] S104. After flipping the second sub-sine graph with duplicate columns removed, it is spliced ​​with the first sub-sine graph to obtain the second sine graph.

[0088] For the deduplicated 180°~360° portion of the sine graph (the second sub-sine graph), first flip it vertically, then flip it horizontally (or first flip it horizontally, then flip it vertically), so that the arrangement order of the 180°~360° sine graph is the same as that of the 0°~180° sine graph. Figure 1 To obtain a second sine graph, the first column of the flipped second sub-sine graph is appended to the last column of the first sub-sine graph, resulting in a second sine graph from 0° to 180°.

[0089] In parallel-light CT, when a sample rotates 180° around a vertical axis, its projection onto the detector undergoes a mirror reversal in both the row and column directions. Therefore, the data arrangement order of the second sub-sine image acquired within the 180° to 360° angle range is reversed compared to the first sub-sine image acquired within the 0° to 180° angle range. If the second and first sub-sine images are directly stitched together, misalignment will occur at the stitching boundary, preventing the formation of a continuous sine image. By flipping the second sub-sine image (after removing duplicate columns) vertically and horizontally, the aforementioned mirror reversal can be eliminated, ensuring that the arrangement order of the second sub-sine image matches that of the first sub-sine image. Figure 1 This ensures that the spliced ​​sine curve is continuous and accurate, providing a correct data foundation for subsequent reconstruction.

[0090] S105. Reconstruct the second sine curve to obtain a slice image of the sample.

[0091] Specifically, the reconstruction algorithm can be the filtered back projection (FBP) algorithm.

[0092] In the reconstructed slice image, the effective imaging range of the sample is about twice the size of the detector array. For example, if the detector array width is 13.3 mm, it can perform CT imaging on a sample with a diameter of about 26 mm and obtain a clear CT image without truncation artifacts.

[0093] The following is combined Figure 10The data processing method provided in this application will be explained from the perspective of overall logic: 1. Parallel light CT, acquiring 0-360° projection data; 2. Perform white point and dark point background correction on all projections; 3. Extract a sine wave from 0 to 360° from a given slice; 4. Remove duplicate columns from the 0-360° sine curve; 5. Flip the sine curve from 180° to 360° vertically and horizontally; 6. Combine the processed 180-360° sine curve with the 0-180° curve; 7. The FBP algorithm is used to reconstruct CT slices from the stitched complete 0-180° sine wave. 8. Determine if the artifacts in the reconstruction result are minimized; 9. If the artifact is minimized, output the processing result; 10. If the artifact is not minimized, redetermine the number of duplicate columns to remove and return to step 4 for another iteration.

[0094] Figure 11 A schematic diagram of a data processing apparatus according to an embodiment of this application is shown. Exemplarily, the data processing apparatus 50 includes an acquisition module 501 and a processing module 502.

[0095] The acquisition module 501 is used to acquire projection data. The projection data is the sample projection data collected by the detector when the center of the sample is aligned with the rotation axis of the turntable and the rotation axis of the turntable is located within the edge area of ​​the horizontal pixel arrangement direction of the detector array. The turntable rotates by a preset angle, and the preset angle is greater than 180°. The processing module 502 is used to extract a first sine wave of the sample based on the projection data. The first sine wave includes a first sub-sine wave of a first angle interval and a second sub-sine wave of a second angle interval. The processing module 502 is also used to remove duplicate columns between the first sub-sine wave and the second sub-sine wave. The processing module 502 is also used to flip the second sub-sine wave after removing duplicate columns and then stitch it with the first sub-sine wave to obtain a second sine wave. The processing module 502 is also used to reconstruct the second sine wave to obtain a slice image of the sample.

[0096] In some embodiments, the processing module 502 is further configured to: set multiple different candidate duplicate column removal quantities; for each candidate duplicate column removal quantity, remove duplicate columns between the first angle interval and the second angle interval in the sine graph according to the candidate duplicate column removal quantity; process the sine graph after removing duplicate columns to determine the candidate slice image corresponding to the candidate duplicate column removal quantity; compare the artifact situation of each candidate slice image; and determine the candidate duplicate column removal quantity corresponding to the candidate slice image with the best artifact situation as the target duplicate column removal quantity.

[0097] It is understood that the apparatus of this embodiment corresponds to the data processing method of the above embodiments, and the options in the above embodiments are also applicable to this embodiment, so they will not be described again here.

[0098] This application also provides a terminal device, exemplary of which includes a processor and a memory, wherein the memory stores a computer program, and the processor executes the computer program to enable the terminal device to perform the functions of the data processing method or the various modules in the data processing apparatus described above.

[0099] The processor can be an integrated circuit chip with signal processing capabilities. The processor can be a general-purpose processor, including at least one of a Central Processing Unit (CPU), Graphics Processing Unit (GPU), Network Processor (NP), Digital Signal Processor (DSP), Application-Specific Integrated Circuit (ASIC), Field-Programmable Gate Array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. The general-purpose processor can be a microprocessor or any conventional processor, capable of implementing or executing the methods, steps, and logic block diagrams disclosed in the embodiments of this application.

[0100] The memory can be, but is not limited to, Random Access Memory (RAM), Read Only Memory (ROM), Programmable Read-Only Memory (PROM), Erasable Programmable Read-Only Memory (EPROM), Electrically Erasable Programmable Read-Only Memory (EEPROM), etc. The memory is used to store computer programs, and the processor can execute the computer programs accordingly after receiving execution instructions.

[0101] This application also provides a computer-readable storage medium for storing the computer program used in the aforementioned terminal device. For example, the computer-readable storage medium may include, but is not limited to, various media capable of storing program code, such as a USB flash drive, a portable hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0102] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can also be implemented in other ways. The apparatus embodiments described above are merely illustrative. For example, the flowcharts and block diagrams in the accompanying drawings show the architecture, functionality, and operation of possible implementations of apparatus, methods, and computer program products according to various embodiments of this application. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that, in alternative implementations, the functions marked in the blocks may occur in a different order than those marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagram and / or flowchart, and combinations of blocks in the block diagram and / or flowchart, can be implemented using a dedicated hardware-based system that performs the specified function or action, or using a combination of dedicated hardware and computer instructions.

[0103] In addition, the functional modules or units in the various embodiments of this application can be integrated together to form an independent part, or each module can exist independently, or two or more modules can be integrated to form an independent part.

[0104] If the aforementioned functions are implemented as software functional modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a smartphone, personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application.

[0105] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application.

Claims

1. A radiation scanning device, characterized in that, include: A radiation source, used to generate a parallel beam of radiation to irradiate a sample; A detector is placed in the output light path of the X-ray source to receive the X-rays that have penetrated the sample and generate projection data. A sample adjustment stage, disposed between the radiation source and the detector, includes: A first adjustment stage is used to move the sample along a first horizontal direction; the first horizontal direction is parallel to the horizontal pixel arrangement direction of the detector's detection array. A turntable, mounted on the first adjustment platform, is used to drive the sample to rotate around a vertical axis; The second adjustment platform is set on the turntable and is used to finely adjust the relative position of the sample and the rotation axis of the turntable in the second horizontal direction. A third adjustment platform, disposed on the second adjustment platform, is used to finely adjust the relative position of the sample and the rotation axis of the turntable in a third horizontal direction; the second horizontal direction is perpendicular to the third horizontal direction; The X-ray scanning device further includes a controller configured to control the movement of the first adjustment stage, the second adjustment stage, and the third adjustment stage, and to position the rotation axis of the turntable within the edge region of the horizontal pixel arrangement direction of the detection array.

2. The apparatus according to claim 1, characterized in that, The controller is also configured to: Before positioning the rotation axis of the turntable within the edge region of the horizontal pixel arrangement direction of the detection array, control the first adjustment stage, the turntable, the second adjustment stage, and the third adjustment stage to move, aligning the axis of the rotation axis with the center of the sample in the second horizontal direction and the third horizontal direction.

3. The apparatus according to claim 2, characterized in that, The controller is specifically configured as follows: Control the first adjustment platform to move along the first horizontal direction to a first position, where the first position is the position where the rotation axis of the turntable is aligned with the horizontal center of the detection array; Control the turntable to rotate to the initial rotation position; At the initial rotational position, the second horizontal direction is parallel to the first horizontal direction; After the sample is placed on the third adjustment platform, the second adjustment platform is controlled to adjust the sample to the second position along the second horizontal direction; The second position is the position where the center of the sample is aligned with the rotation axis of the turntable in the first horizontal direction; Control the turntable to rotate to the target rotation position; At the target rotation position, the third horizontal direction is parallel to the first horizontal direction; The third adjustment platform is controlled to adjust the sample to a third position along the first horizontal direction; The third position is the position where the center of the sample is aligned with the axis of rotation of the turntable in the third horizontal direction.

4. The apparatus according to claim 1, characterized in that, The controller is also configured to: After positioning the rotation axis of the turntable within the edge region of the horizontal pixel arrangement direction of the detection array, the turntable is controlled to rotate continuously 360° around the vertical rotation axis, and the detector is simultaneously controlled to continuously acquire the projection data of the sample in the range of 0° to 360° during the rotation of the turntable.

5. The apparatus according to any one of claims 1-4, characterized in that, The rotation axis of the turntable is positioned within the edge region of the horizontal pixel arrangement direction of the detection array, specifically including: The distance between the projection of the rotating axis of the turntable onto the detection array and the left or right boundary of the horizontal pixel arrangement direction of the detection array does not exceed a preset distance, or does not exceed a preset proportion of the total width of the horizontal pixel arrangement direction of the detection array.

6. A data processing method, characterized in that, The method is applied to the X-ray scanning apparatus of any one of claims 1-5; the method comprises: Acquire projection data; the projection data is the projection data of the sample acquired by the detector when the center of the sample is aligned with the rotation axis of the turntable and the rotation axis of the turntable is located within the edge area of ​​the horizontal pixel arrangement direction of the detector's detection array, and the turntable is rotated by a preset angle; the preset angle is greater than 180°. Based on the projection data, a first sine curve of the sample is extracted; the first sine curve includes a first sub-sine curve of a first angular interval and a second sub-sine curve of a second angular interval. Based on the target number of duplicate columns to be removed, remove duplicate columns between the first sub-sine graph and the second sub-sine graph; After flipping the second sub-sine graph after removing duplicate columns, it is concatenated with the first sub-sine graph to obtain the second sine graph. The second sine curve is reconstructed to obtain a slice image of the sample.

7. The method according to claim 6, characterized in that, The preset angle is 360°, the first angle range is 0° to 180°, and the second angle range is 180° to 360°.

8. The method according to claim 6, characterized in that, The target number of duplicate columns to be removed is determined through the following steps: Set multiple different numbers of candidate duplicate columns to remove; For each candidate duplicate column removal quantity, remove duplicate columns between the first angle interval and the second angle interval in the sine graph according to the candidate duplicate column removal quantity; Process the sine graph after removing duplicate columns to determine the candidate slice image corresponding to the number of candidate duplicate columns removed; Compare the artifacts in each of the candidate slice images; The number of candidate duplicate columns removed from the candidate slice image with the best artifact condition is determined as the target number of duplicate columns to be removed.

9. A terminal device, characterized in that, The terminal device includes a processor and a memory, the memory storing a computer program, and the processor executing the computer program to implement the data processing method according to claim 6 or 7.

10. A computer-readable storage medium, characterized in that, It stores a computer program that, when executed on a processor, implements the data processing method according to claim 6 or 7.

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