A rapid insertion probe device and method of use thereof

Abstract

The application relates to the field of PCB (Printed Circuit Board) probes, in particular to a fast mounting and inserting probe device and a use method thereof. In the return process of the existing positioning member, unavoidable upward axial friction or pulling force is generated on the inserted and mounted probe due to the contact and cooperation relationship between the positioning member and the probe, thereby driving the probe to slightly axially move. The movement directly causes the contact point between the bottom of the probe and the PCB board jack to be offset, thereby affecting the reliability of the electrical connection between the probe and the PCB board and the stability of signal transmission. After the contact between the bottom of the probe and the corresponding jack of the PCB board is in place, the limiting adjusting member is switched to a state of tightly holding the second taper sleeve to relax the first taper sleeve, so that the inserted and mounted probe cannot axially move in the follow-up process of the reset on the sliding chuck.

Description

Technical Field

[0001] This invention relates to the field of PCB board probes, specifically to a rapid probe insertion device and its usage method. Background Technology

[0002] In the manufacturing process of PCB (Printed Circuit Board), probes, as key testing and connection components, need to be precisely inserted into corresponding holes on the PCB. As electronic components become smaller and denser, the probe mounting positions on the PCB are becoming increasingly dense, and the hole diameters are constantly shrinking, which places higher demands on the accuracy, efficiency, and reliability of probe insertion.

[0003] Currently, the most common probe insertion methods in existing technologies mainly employ automated pin insertion equipment. This equipment guides the probe to the corresponding insertion hole on the PCB board using positioning components, and then uses a drive mechanism to press the probe into the hole. However, these existing devices generally suffer from the following shortcomings in practical applications: After the probe is inserted into place, the positioning component needs to retract from the pin position to reset for the next insertion action. However, during the return stroke, the existing positioning component often inevitably generates an upward axial frictional force or pulling force on the inserted probe due to the contact and engagement relationship between it and the probe. This causes the probe to experience slight axial movement, which directly leads to a shift in the contact point between the probe bottom and the PCB board hole, affecting the reliability of the electrical connection between the probe and the PCB board and the stability of signal transmission. Summary of the Invention

[0004] The purpose of this invention is to provide a rapid probe insertion device and its usage method to solve the problems mentioned in the background art. To achieve the above objective, this invention provides the following technical solution: a rapid probe insertion device, including a support slide in the PCB board processing flow, a support plate slidably connected to the support slide, and positioning insertion components arranged on the support plate corresponding to the probe mounting positions on the PCB board.

[0005] Preferably, each of the positioning and insertion components includes a loading cylinder fixedly embedded in a bearing plate. The loading cylinder has an axially extending cavity inside, and a sliding clamp is coaxially arranged inside it. The sliding clamp is axially slidably fitted to the inner wall of the loading cylinder. The outer wall of the loading cylinder has a guide dovetail groove along the axial direction. A handrail is fixedly arranged on the outer wall of the sliding clamp. The handrail extends out of the loading cylinder through the dovetail groove to drive the sliding clamp to slide along the axial direction of the loading cylinder. A first conical sleeve is embedded at the axial position of the sliding clamp. The first conical sleeve is used to contact the outer peripheral wall of the probe when the probe is inserted into the loading cylinder. A second conical sleeve is provided at the bottom of the loading cylinder at the coaxial position of the first conical sleeve.

[0006] Preferably, a pair of limiting adjustment members are provided in the sliding chuck with the axis of the first conical sleeve as the center of symmetry. The limiting adjustment members are used to apply radial extrusion force to the first and second conical sleeves.

[0007] Preferably, each of the two sets of opposing limiting adjustment components includes a mounting frame fixedly mounted on a sliding clamp. An adjustment frame is hinged to the mounting frame via a pin. An annular groove is formed on the sliding clamp, and an annular spring is embedded in the groove. The annular spring abuts against the outer walls of the two adjustment frames. An annular sleeve is fixedly mounted on the adjustment frame at the pin. The annular sleeve has a first interface and a second interface along its circumference. The adjacent sides of the first interface and the second interface are both inclined guide surfaces. A snap-fit ​​spring is also hinged to the mounting frame. The snap-fit ​​spring is elastically connected to the adjustment frame via a tension spring. The snap-fit ​​spring selectively abuts against the first interface or the second interface on the annular sleeve through its end.

[0008] Preferably, a protrusion is fixedly provided on the annular sleeve, and a clearance groove is provided on the sliding chuck corresponding to the position of the protrusion, the clearance groove being located between the protrusion and the first conical sleeve.

[0009] Preferably, between the inner bottom and inner top of the loading cylinder, elastic rods are respectively installed at the positions corresponding to the two sets of limiting adjustment components. The bottom end of each elastic rod is connected to the ball seat via an elastic clip. An abutment ball is embedded in the ball seat. The elastic rod is an elastic reset member with axial tensile rebound performance, and its two ends are respectively fixedly connected to the inner top of the loading cylinder and the ball seat.

[0010] Preferably, the lower end of the adjusting frame has an arc-shaped bending structure and is fixedly provided with a collar, which is movably sleeved on the elastic pull rod and can slide up and down along the elastic pull rod.

[0011] In this embodiment, the inner bottom of the loading cylinder is provided with a conical groove with a conical structure, and a movable ball is movably provided at the lower end port of the adjusting frame.

[0012] In this embodiment, an inclined block is provided on the inner wall of the loading cylinder near the top, corresponding to the adjustment frame, and an inclined frame is provided at the upper end of the adjustment frame, with the inclined frame and the inclined block in sliding contact.

[0013] In this embodiment, the protrusion is provided with a clearance through groove for the elastic tie rod to pass through, so as to ensure that the protrusion and the elastic tie rod do not interfere with each other during the deflection of the adjustment frame.

[0014] Preferably, the method of using the rapid probe insertion device includes the following steps: S1: In the initial state, the limit adjustment component is in the first working state, the first cone sleeve holds the probe tightly, the second cone sleeve is relaxed, and the operator drives the sliding chuck to move downward along the loading cylinder axis through the handrail. The probe moves downward synchronously with the sliding chuck. S2: The probe passes through the first conical sleeve and the second conical sleeve in sequence. When the bottom of the probe contacts the corresponding hole on the PCB board, the lower end of the adjustment frame is guided by the conical groove at the bottom of the loading cylinder, forcing the adjustment frame to deflect around the pin shaft. The end of the snap-fit ​​spring slides from the first interface to the second interface and forms a contact, limiting the adjustment frame to the second angular displacement position. The limiting adjustment component switches to the second working state. S3: The deflection of the adjusting frame causes the protrusion on the annular sleeve to disengage from the outer wall of the first conical sleeve, and the first conical sleeve releases its grip on the probe. At the same time, the collar at the lower end of the adjusting frame causes the elastic rod to undergo elastic deformation, which, through the ball seat, causes the contact ball to squeeze the second conical sleeve to hold the probe tightly. S4: The operator drives the sliding clamp to move upward and reset. The first cone sleeve moves upward synchronously with the sliding clamp to the disengagement zone above the probe tail. Since the first cone sleeve is in a relaxed state, the probe does not undergo axial movement. The second cone sleeve keeps the probe locked. S5: The sliding clamp continues to move upward, and the inclined frame at the upper end of the adjusting frame slides into the inclined block on the inner wall of the loading cylinder. Under the guidance of the inclined surface, the adjusting frame is gradually pushed back to the first angular displacement position. At the same time, the elastic rod drives the contact ball to return to its radial position by means of its own rebound force. The second cone sleeve releases its grip on the probe, and the bearing plate rises vertically and separates from the inserted probe, completing a single insertion operation.

[0015] Compared with the prior art, the beneficial effects of the present invention are as follows: In this invention, by setting up a first conical sleeve and a second conical sleeve arranged coaxially, and cooperating with a limiting adjustment component, the two conical sleeves are alternately clamped and released under different working conditions. This solves the problem of contact point offset caused by the axial movement of the probe due to the return stroke of the positioning component during the existing pin insertion process. When the first conical sleeve is in a clamping state on the probe, the second conical sleeve remains loose. The probe can smoothly pass through the second conical sleeve and advance downward under the drive of the first conical sleeve. When the bottom of the probe contacts the corresponding insertion hole on the PCB board, the limiting adjustment component switches to a state of clamping the second conical sleeve and loosening the first conical sleeve. Thus, during the upward resetting process of the sliding clamp, the probe that has been inserted into place will not experience axial movement.

[0016] In this invention, the limiting adjustment component realizes the automatic switching between the clamping states of the first and second conical sleeves. When the sliding clamping plate descends to the bottom of the loading cylinder and the probe contacts the corresponding insertion hole on the PCB board, the movable ball at the lower end of the adjustment frame moves along the inner wall of the conical groove. Under the guidance of the conical groove, the adjustment frame is forced to deflect around the pin shaft, and the annular sleeve switches from the first interface to the second interface. At the same time, the protrusion disengages from the first conical sleeve, and the collar at the lower end of the adjustment frame causes the elastic pull rod to bend and deform. Then, the pressing force is applied to the second conical sleeve through the abutment ball, realizing the coordinated operation of probe insertion and locking, and improving production efficiency.

[0017] In this invention, during the upward repositioning process of the sliding chuck, the inclined frame at the upper end of the adjusting frame forms a sliding contact with the inclined block on the inner wall of the loading cylinder. Under the guidance of the inclined surface, the adjusting frame is gradually pushed back to the initial angular displacement position. Since the sliding chuck has driven the first cone sleeve to move synchronously upward to the disengagement zone above the probe tail, the inner wall of the first cone sleeve has no effective contact with the outer wall of the probe, so it does not interfere with the inserted probe. At the same time, the elastic pull rod resets by its own axial rebound force, driving the abutment ball to exit radially. The second cone sleeve releases its grip on the probe. At this time, the rise of the bearing plate will not produce any adsorption or pulling force on the PCB board, and it can be separated vertically and smoothly, successfully completing the synchronous insertion operation of the entire batch of probes. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the support slide and support plate in this invention; Figure 2 This is a front view of the positioning and insertion component in this invention; Figure 3 This is a three-dimensional structural diagram of the positioning and insertion component in this invention; Figure 4 A cross-sectional view of the loading cylinder in the positioning and insertion component of the present invention. Figure 1 ; Figure 5 A cross-sectional view of the loading cylinder in the positioning and insertion component of the present invention. Figure 2 ; Figure 6 This is a partial three-dimensional structural diagram of the positioning and insertion component in this invention; Figure 7 This is a schematic diagram of the sliding clamp in the positioning and insertion component of the present invention; Figure 8 A cross-sectional view of the sliding clamp in the positioning and insertion component of the present invention. Figure 1 ; Figure 9 A cross-sectional view of the sliding clamp in the positioning and insertion component of the present invention. Figure 2 ; Figure 10 This is a three-dimensional structural diagram of the limiting adjustment component in this invention; Figure 11 This is a partial three-dimensional structural diagram of the limiting adjustment component in this invention; Figure 12 This is a split view of the annular sleeve and the snap-fit ​​spring in this invention; Figure 13 This is a schematic diagram of the elastic tie rod and ball seat in this invention.

[0019] In the diagram: 1. Bearing slide; 11. Bearing plate; 2. Positioning and mounting component; 21. Loading cylinder; 22. Cavity; 23. Sliding clamp; 24. Guide dovetail groove; 25. Handrail; 26. First cone sleeve; 27. Second cone sleeve; 28. Ring spring; 3. Limit adjustment component; 31. Mounting frame; 32. Pin; 33. Adjustment frame; 34. Ring sleeve; 35. First interface; 36. Second interface; 37. Guide surface; 38. Snap-fit ​​spring; 39. Tension spring; 310. Protrusion; 311. Alternating notch; 312. Elastic tie rod; 313. Ball seat; 314. Abutting ball; 315. Collar; 4. Conical groove; 41. Movable ball; 42. Inclined block; 43. Inclined frame; 44. Clearance through groove. Detailed Implementation

[0020] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0021] Example Please see Figures 1 to 13 The present invention provides a technical solution: a rapid probe insertion device, including a positioning and insertion component 2, which is suitable for the automated insertion process of probes in PCB board processing, and solves the problem of contact point offset caused by the axial movement of the probe due to the return of the positioning component during the existing probe insertion process.

[0022] The positioning and insertion component 2 is integrated on the carrier slide 1 in the PCB board processing flow. The carrier slide 1 is slidably connected to the carrier plate 11. Several positioning and insertion components 2 are fixedly arranged on the carrier plate 11 in a layout corresponding to the probe installation position on the PCB board. The positioning and insertion component 2 is used to provide guidance and limitation during probe insertion.

[0023] Furthermore, each of the positioning and inserting components 2 includes a loading cylinder 21 fixedly embedded in the supporting plate 11. The loading cylinder 21 has an axially extending cavity 22 inside, within which a sliding clamp 23 is coaxially disposed. The sliding clamp 23 is axially slidably fitted to the inner wall of the loading cylinder 21. For ease of external operation, a guide dovetail groove 24 is axially formed on the outer wall of the loading cylinder 21. A handrail 25 is fixedly disposed on the outer wall of the sliding clamp 23, extending through the dovetail groove to the outside of the loading cylinder 21 to drive the sliding clamp 23 to slide axially along the loading cylinder 21. A first conical sleeve 26 is embedded at the axial center of the sliding chuck 23. The first conical sleeve 26 is used to contact the outer peripheral wall of the probe when the probe is inserted into the loading cylinder 21 and to hold it tightly by means of radial contraction force so that the probe can move synchronously with the axial movement of the sliding chuck 23. Correspondingly, a second conical sleeve 27 is provided at the bottom of the loading cylinder 21 at the coaxial center of the first conical sleeve 26. The second conical sleeve 27 is used to hold and lock the probe tightly by means of radial clamping force when the probe passes through the first conical sleeve 26 and moves down to contact the corresponding insertion hole of the PCB board, so as to prevent the probe from following the axial movement when the first conical sleeve 26 moves up and resets.

[0024] In addition, a pair of limiting adjustment members 3 are provided in the sliding chuck 23 with the axis of the first cone sleeve 26 as the center of symmetry. The limiting adjustment members 3 are used to apply radial extrusion force to the first cone sleeve 26 and the second cone sleeve 27 to realize the alternating clamping and release of the two cone sleeves under different working conditions. When the first cone sleeve 26 is in a clamping state on the probe, the second cone sleeve 27 remains relaxed, allowing the probe to smoothly pass through the second cone sleeve 27 and advance downward under the drive of the first cone sleeve 26; Once the bottom of the probe contacts the corresponding insertion hole on the PCB board, the limiting adjustment component 3 switches to a state where the second cone sleeve 27 is tightened and the first cone sleeve 26 is relaxed, thus completing the limiting and fixing of the probe. The subsequent upward movement and reset process of the sliding clamp 23 will not disturb the probe that has been inserted into place.

[0025] Specifically, each of the two sets of opposing limiting adjustment components 3 includes a mounting bracket 31 fixedly mounted on the sliding clamp 23. An adjustment bracket 33 is hinged to the mounting bracket 31 via a pin 32. The sliding clamp has an annular groove, in which an annular spring 28 is embedded. The annular spring 28 abuts against the outer walls of the two adjustment brackets 33. An annular sleeve 34 is fixedly mounted on the adjustment bracket 33 at the pin 32. The annular sleeve 34 has a first interface 35 and a second interface 36 along its circumference. The adjacent sides of the first interface 35 and the second interface 36 are both inclined guide surfaces 37. A snap-fit ​​spring 38 is also hinged to the mounting bracket 31. The snap-fit ​​spring 38 is elastically connected to the adjustment bracket 33 via a tension spring 39. The snap-fit ​​spring 38 selectively abuts against the first interface 35 or the second interface 36 on the annular sleeve 34 through its end, thereby limiting the adjustment bracket 33 to the corresponding angular displacement position and preventing it from deflecting.

[0026] The annular sleeve 34 is fixedly provided with a protrusion 310, and the sliding chuck 23 is provided with a clearance notch 311 corresponding to the position of the protrusion 310. The clearance notch 311 is located between the protrusion 310 and the first conical sleeve 26. When the adjusting frame 33 is in the first angular displacement position, that is, when the snap-fit ​​spring 38 abuts against the first interface 35, the protrusion 310 applies radial extrusion force to the outer peripheral wall of the first cone sleeve 26 through the clearance notch 311, forcing the first cone sleeve 26 to radially contract, thereby holding the probe located at its axis. When the adjusting frame 33 deflects to the second angular displacement position, that is, when the snap-fit ​​spring 38 abuts against the second interface 36, the protrusion 310 disengages from the outer wall of the first cone sleeve 26, and the first cone sleeve 26 immediately releases its holding state on the probe.

[0027] Between the inner bottom and inner top of the loading cylinder 21, elastic pull rods 312 are respectively installed at the positions corresponding to the two sets of limiting adjustment components 3. The bottom end of each elastic pull rod 312 is connected to the ball seat 313 via an elastic clip. The ball seat 313 is embedded with an abutment ball 314. The elastic pull rod 312 is an elastic reset component with axial tensile rebound energy, and its two ends are respectively fixedly connected to the inner top of the loading cylinder 21 and the ball seat 313. The lower end of the adjusting frame 33 has an arc-shaped bending structure and is fixedly provided with a collar 315. The collar 315 is movably sleeved on the elastic rod 312 and can slide up and down along the elastic rod 312. When the adjusting frame 33 deflects, its lower end applies a bending force to the elastic rod 312 through the collar 315, so as to force the elastic rod 312 to undergo elastic deformation. This causes the ball seat 313 to drive the contact ball 314 to apply radial extrusion force to the outer peripheral wall of the second cone sleeve 27, thereby realizing the tight locking of the probe by the second cone sleeve 27. When the adjusting frame 33 deflects in the opposite direction to reset, the elastic rod 312 uses its own axial rebound force to drive the ball seat 313 and the contact ball 314 to reset radially, releasing the extrusion on the second cone sleeve 27. The ball seat 313 is connected to the elastic card and resets under the action of the elastic card.

[0028] In the initial state, the snap-fit ​​spring 38 and the first interface 35 on the annular sleeve 34 form an abutting engagement. At this time, the protrusion 310 and the outer peripheral wall of the first conical sleeve 26 maintain a squeezing contact, so that the first conical sleeve 26 applies a clamping force to the probe. The probe moves axially under the drive of the sliding clamp 23. When the sliding clamp 23 descends to the bottom of the loading cylinder 21 and the probe contacts the corresponding insertion hole on the PCB board, the adjusting frame 33 deflects around the pin 32. The annular sleeve 34 switches from the first interface 35 to the second interface 36. At this time, the end of the snap-fit ​​spring 38 forms an abutting engagement with the second interface 36, keeping the adjusting frame 33 in the second angular displacement position. During this deflection process, the collar 315 at the lower end of the adjusting frame 33 causes the elastic pull rod 312 to bend and deform. Then, through the ball seat 313, the abutting ball 314 applies a squeezing force to the outer peripheral wall of the second conical sleeve 27, so that the second conical sleeve 27 firmly holds the probe. As the adjusting frame 33 deflects, the protrusion 310 on the annular sleeve 34 disengages from the outer peripheral wall of the first conical sleeve 26, and the first conical sleeve 26 releases its grip on the probe. Subsequently, when the operator drives the sliding clamp 23 to move upward and reset via the handrail 25, the probe will not move upward because the first conical sleeve 26 has loosened. The second conical sleeve 27 maintains a stable lock on the probe, thereby ensuring reliable docking between the bottom of the probe and the PCB board socket.

[0029] In this embodiment, the inner bottom of the loading cylinder 21 is provided with a conical groove 4 with a conical structure, and a movable ball 41 is movably provided at the lower end port of the adjusting frame 33. When the first interface 35 on the annular sleeve 34 is in a docking state with the snap-fit ​​spring 38, the movable ball 41 can move along the outer wall of the conical groove 4 to provide a guide stroke for the adjusting frame 33.

[0030] In this embodiment, an inclined block 42 corresponding to the adjusting frame 33 is provided on the inner wall of the loading cylinder 21 near the top, and an inclined frame 43 is provided on the upper end of the adjusting frame 33, and the inclined frame 43 slides in contact with the inclined block 42.

[0031] In this embodiment, the protrusion 310 is provided with a clearance through groove 44 for the elastic pull rod 312 to pass through, so as to ensure that the protrusion 310 and the elastic pull rod 312 do not interfere with each other during the deflection of the adjustment frame 33.

[0032] When the first interface 35 of the annular sleeve 34 is in a docking state with the snap-fit ​​spring 38, the first conical sleeve 26 is in a state of pressure clamping the probe, and the probe moves downward under the action of the sliding clamp 23. When the probe is inserted into the corresponding hole on the PCB board, the sliding clamp 23 moves to the bottom of the loading cylinder 21, and the movable ball 41 at the lower end of the adjusting frame 33 moves along the inner wall of the conical groove 4. Under the guidance of the conical groove 4, the adjusting frame 33 is forced to deflect around the pin 32, so that the first interface 35 on the annular sleeve 34 is switched to the second interface 36 and forms an abutment fit with the snap-fit ​​spring 38. The inclined guide surface 37 on the adjacent sides of the first interface 35 and the second interface 36 is designed so that during the rotation switching process of the annular sleeve 34, the end of the snap-fit ​​spring 38 can slide smoothly along the guide surface 37, avoiding rigid jamming. At this time, the first cone sleeve 26 releases its grip on the probe, and the deflection of the adjusting frame 33 causes the collar 315 to apply a bending force to the elastic pull rod 312, which in turn causes the abutment ball 314 to apply a squeezing force to the second cone sleeve 27, fixing the probe in the second cone sleeve 27.

[0033] After all probes are inserted into the corresponding holes on the PCB board, the operator moves the sliding clamp 23 upward to reset. During the reset process, the inclined frame 43 at the upper end of the adjustment frame 33 and the inclined block 42 on the inner wall of the loading cylinder 21 form a sliding contact engagement. Under the guidance of the inclined surface, the adjustment frame 33 is gradually pushed back to the initial angular displacement position. The annular sleeve 34 switches from the second interface 36 back to the first interface 35. Although the snap-fit ​​spring 38 resets and the protrusion 310 extends radially again, since the sliding clamp 23 has driven the first cone sleeve 26 to move upward synchronously to the disengagement area above the probe tail, the clamping effect only acts on the unloaded state. The inner wall of the first cone sleeve 26 has no effective contact with the outer wall of the probe, so it does not interfere with the inserted probe. At the same time, the elastic rod 312 resets by its own axial rebound force, causing the contact ball 314 to retract radially. The second cone sleeve 27 releases its grip on the probe, and all probes have completed precise insertion into the corresponding holes on the PCB board. At this time, since the first cone sleeve 26 is in an unloaded clamping state and the second cone sleeve 27 is completely relaxed, the rise of the bearing plate 11 will not produce any adsorption or pulling force on the PCB board, and can be separated vertically and smoothly to complete the synchronous insertion operation of the entire batch of probes.

[0034] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely preferred examples and are not intended to limit the invention. Various changes and modifications can be made to the invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of the present invention as claimed. The scope of protection of the present invention is defined by the appended claims and their equivalents.

Claims

1. A rapid probe insertion device, characterized in that, Including the support slide (1); The support plate (11) is slidably fitted onto the support slide (1); Several positioning and inserting components (2) are fixedly installed on the carrier plate (11) according to the layout corresponding to the probe installation position on the PCB board; Each of the positioning and inserting components (2) includes a loading cylinder (21) fixedly embedded in the bearing plate (11), and the loading cylinder (21) forms an axially extending cavity (22). The sliding chuck (23) is axially slidably fitted to the inner wall of the loading cylinder (21); The first cone sleeve (26) is embedded in the axial position of the sliding clamp (23) and is used to contact the outer peripheral wall of the probe when the probe is inserted into the loading cylinder (21) and hold it tightly by radial contraction force; The second cone sleeve (27) is located at the bottom of the loading cylinder (21) and is coaxially arranged with the first cone sleeve (26). It is used to hold and lock the probe by radial clamping force when the probe passes through the first cone sleeve (26) and moves down to contact the corresponding insertion hole of the PCB board. A pair of limiting adjustment components (3) are arranged in the sliding clamp (23) with the axis of the first cone sleeve (26) as the center of symmetry, so as to realize the alternating clamping and release of the two cone sleeves under different working conditions.

2. The rapid insertion probe device according to claim 1, characterized in that: The outer wall of the loading cylinder (21) is provided with a guide dovetail groove (24) along the axial direction; A handrail (25) is fixedly provided on the outer wall of the sliding chuck (23). The handrail (25) extends out of the loading cylinder (21) through the dovetail groove to drive the sliding chuck (23) to slide along the axial direction of the loading cylinder (21).

3. The rapid insertion probe device according to claim 2, characterized in that: Each set of the limiting adjustment components (3) includes: The mounting bracket (31) is fixedly mounted on the sliding clamp (23); The adjustment bracket (33) is hinged to the mounting bracket (31) by a pin (32); The annular spring (28) is embedded in the annular groove opened on the sliding chuck (23) and abuts against the outer wall of the two adjusting brackets (33); An annular sleeve (34) is fixedly installed at the pin (32) mounting position of the adjusting frame (33), and has a first interface (35) and a second interface (36) along its circumference. The adjacent sides of the first interface (35) and the second interface (36) are inclined guide surfaces (37). The snap-fit ​​spring (38) is hinged to the mounting bracket (31) and its end selectively abuts against the first interface (35) or the second interface (36) on the annular sleeve (34), thereby limiting the adjusting bracket (33) to the corresponding angular displacement position. A tension spring (39) is elastically connected between the snap-fit ​​spring (38) and the adjusting frame (33); The protrusion (310) is fixedly disposed on the annular sleeve (34); An avoidance notch (311) is provided on the sliding chuck (23) at a position corresponding to the protrusion (310), located between the protrusion (310) and the first cone sleeve (26).

4. The rapid insertion probe device according to claim 3, characterized in that: When the adjusting frame (33) is in the first angular displacement position, the snap-fit ​​spring (38) abuts against the first interface (35), and the protrusion (310) applies radial extrusion force to the outer peripheral wall of the first cone sleeve (26) through the clearance notch (311), forcing the first cone sleeve (26) to produce radial contraction.

5. The rapid insertion probe device according to claim 4, characterized in that: When the adjusting frame (33) deflects to the second angular displacement position, the snap-fit ​​spring (38) abuts against the second interface (36); Between the inner bottom and inner top of the loading cylinder (21), elastic rods (312) are respectively provided at the positions corresponding to the two sets of limiting adjustment components (3). The bottom end of each elastic rod (312) is connected to a ball seat (313) via an elastic card. An abutment ball (314) is embedded in the ball seat (313). The lower end of the adjustment frame (33) has an arc-shaped bending structure and a collar (315) is fixedly installed. The collar (315) is movably sleeved on the elastic rod (312) and can slide up and down along the elastic rod (312).

6. The rapid insertion probe device according to claim 5, characterized in that: The inner bottom of the loading cylinder (21) is provided with a conical groove (4) with a conical structure. A movable ball (41) is movably disposed at the lower end port of the adjusting frame (33). When the first interface (35) on the annular sleeve (34) is in a docking state with the snap-fit ​​spring (38), the movable ball (41) can move along the outer wall of the conical groove (4).

7. A rapid probe insertion device according to claim 6, characterized in that: The inner wall of the loading cylinder (21) near the top is provided with an inclined block (42) that corresponds to the adjustment frame (33). The upper end of the adjustment frame (33) is provided with a ramp frame (43), and the ramp frame (43) slides in contact with the ramp block (42).

8. A rapid probe insertion device according to claim 7, characterized in that: The protrusion (310) has a clearance through groove (44) for the elastic rod (312) to pass through, so as to ensure that the protrusion (310) and the elastic rod (312) do not interfere with each other during the deflection of the adjustment frame (33).

9. A rapid probe insertion device according to claim 7, characterized in that: The elastic tie rod (312) is an elastic reset member with axial tensile rebound performance, and its two ends are fixedly connected to the inner top of the loading cylinder (21) and the ball seat (313) respectively.

10. A method of using a rapid insertion probe device, comprising using a rapid insertion probe device as described in any one of claims 1-8, characterized in that, Includes the following steps: S1: In the initial state, the limit adjustment component (3) is in the first working state, the first cone sleeve (26) holds the probe tightly, the second cone sleeve (27) is relaxed, and the operator drives the sliding chuck (23) to move downward along the loading cylinder (21) through the handrail frame (25). The probe moves downward synchronously with the sliding chuck (23). S2: The probe passes through the first conical sleeve (26) and the second conical sleeve (27) in sequence. When the bottom of the probe contacts the corresponding hole of the PCB board, the lower end of the adjustment frame (33) is guided by the conical groove (4) at the bottom of the loading cylinder (21), which forces the adjustment frame (33) to deflect around the pin shaft (32). The end of the snap-fit ​​spring piece (38) slides from the first interface (35) to the second interface (36) and forms an abutment, limiting the adjustment frame (33) to the second angular displacement position. The limiting adjustment component (3) switches to the second working state. S3: The adjustment frame (33) deflects, causing the protrusion (310) on the annular sleeve (34) to disengage from the outer wall of the first cone sleeve (26), and the first cone sleeve (26) releases its grip on the probe. At the same time, the collar (315) at the lower end of the adjustment frame (33) causes the elastic rod (312) to undergo elastic deformation, which drives the contact ball (314) through the ball seat (313) to squeeze the second cone sleeve (27) so that it holds the probe tightly. S4: The operator drives the sliding chuck (23) to move upward and reset. The first cone sleeve (26) moves upward synchronously with the sliding chuck (23) to the disengagement zone above the probe tail. Since the first cone sleeve (26) is in a relaxed state, the probe does not produce axial movement. The second cone sleeve (27) keeps the probe locked. S5: The sliding clamp (23) continues to move upward, and the inclined plate (43) at the upper end of the adjusting frame (33) slides and engages with the inclined block (42) on the inner wall of the loading cylinder (21). Under the guidance of the inclined plate, the adjusting frame (33) is gradually pushed back to the first angular displacement position. At the same time, the elastic rod (312) drives the abutment ball (314) to radially reset by means of its own rebound force. The second cone sleeve (27) releases the clamping of the probe, and the bearing plate (11) rises vertically and separates from the inserted probe, completing a single insertion operation.

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