Finished product testing device, system and method for radio frequency identification tag chips

Abstract

The application discloses a kind of finished product testing device, system and method of radio frequency identification tag chip, belong to chip testing technical field.The device includes: radio frequency processing module, for radio frequency communication with radio frequency identification tag chip;Baseband module is used for radio frequency communication protocol analysis;Data processing module is used to execute test script, control radio frequency processing module and radio frequency identification tag chip radio frequency communication, obtain the finished product test result of radio frequency identification tag chip;User interface module is used to connect handler;Handler is used for the feeding and sorting of radio frequency identification tag chip;Modulation and demodulation module is used to modulate and demodulate the signal of user interface module and handler communication.The finished product testing device, system and method of radio frequency identification tag chip disclosed in the application can realize the mass production level test of radio frequency performance and protocol interaction function of radio frequency identification tag chip.

Description

Technical Field

[0001] This application belongs to the field of chip testing technology, and in particular relates to a finished product testing device, system and method for radio frequency identification tag chips. Background Technology

[0002] In related technologies, Radio Frequency Identification (RFID) tag chips are widely used in various fields such as power, logistics, and warehousing. In the manufacturing process of RFID tag chips, the testing process is crucial for ensuring the basic performance of the chips and reducing failures in downstream applications. Currently, the production testing process for RFID tag chips mainly includes chip probing at the wafer stage and final test (FT) after packaging. Traditional final testing focuses on basic hardware performance testing and does not cover core functions such as RF communication and protocol interaction of RFID tag chips. Therefore, how to conduct mass production-level final testing of core functions such as RF communication and protocol interaction of RFID tag chips has become a pressing technical issue that needs to be addressed in this field. Summary of the Invention

[0003] This invention aims to at least solve one of the technical problems existing in the prior art. To this end, this invention proposes a finished product testing device, system, and method for RFID tag chips, which can realize mass production-level testing of the RF performance and protocol interaction functions of RFID tag chips.

[0004] In a first aspect, this application provides a finished product testing device for radio frequency identification tag chips, the device comprising: a radio frequency processing module, a baseband module, a data processing module, a modulation and demodulation module, and a user interface module; The radio frequency processing module is used for radio frequency communication with the radio frequency identification tag chip; The baseband module is used for parsing radio frequency communication protocols; The data processing module is used to execute test scripts, control the radio frequency processing module and the radio frequency identification tag chip for radio frequency communication, and obtain the finished product test results of the radio frequency identification tag chip. The user interface module is used to connect to the sorting machine; the sorting machine is used to feed and sort the radio frequency identification tag chips. The modulation and demodulation module is used to modulate and demodulate the signals used for communication between the user interface module and the sorting machine.

[0005] The RFID tag chip finished product testing device according to this application, by adopting a structure including an RF processing module, a baseband module, a data processing module, a modulation / demodulation module, and a user interface module, performs comprehensive, rapid, automated, and mass-production-level testing of the RF performance and protocol interaction functions of the RFID tag chip. Compared with related technologies that only focus on the process-related aspects of the packaging frame, this device improves the quality inspection system of the entire RFID tag chip production process, effectively screening out RFID tag chips with poor RF performance or protocol interaction functions, thus avoiding problems such as application-end reading failures and data interaction failures from the source. Furthermore, the data processing module can execute test scripts to complete multiple test items covering the core capabilities of the RFID tag chip, including RF activation, protocol interaction, data read / write, access control, and data recovery. The test frequency band covers the core range of the 800MHz-1000MHz ultra-high frequency band, and each test has clear judgment criteria, ensuring the accuracy of the test results. The test coverage is comprehensive, and the results are accurate and reliable.

[0006] According to one embodiment of this application, the user interface module includes: an I / O port unit; the I / O port unit includes at least one DB25 interface.

[0007] According to one embodiment of this application, the DB25 interface includes at least one input port and a plurality of output ports for communicating with the sorting machine, as well as at least one reserved input / output port.

[0008] According to one embodiment of this application, the finished product testing device for the radio frequency identification tag chip includes an interrupt controller for outputting an interrupt signal in response to a test start signal input by the sorting machine; The data processing module includes a hardware triggering unit, which is used to trigger the execution of the test script when the interrupt signal is detected.

[0009] According to one embodiment of this application, the data processing module includes: The self-test and fault handling unit is used for the self-test of the finished product testing device and, in the event of an abnormality during the test, to terminate the test, record the fault log and output the corresponding indication signal.

[0010] According to one embodiment of this application, the radio frequency processing module includes: a receiving unit, a transmitting unit, and a local oscillator.

[0011] According to one embodiment of this application, the data processing module is a PowerPC; the modulation and demodulation module is a field-programmable gate array.

[0012] Secondly, this application provides a finished product testing system for radio frequency identification tag chips, the system comprising: a finished product testing device for radio frequency identification tag chips as described in the first aspect, a host computer, a sorting machine, and at least one test board; The host computer is used to send test configuration files to the finished product testing device; The test board is used to achieve a reliable connection between the finished product testing device and the radio frequency identification tag chip.

[0013] The RFID tag chip finished product testing system of this application adopts a structure including an RF processing module, a baseband module, a data processing module, a modulation and demodulation module, and a user interface module to conduct comprehensive, rapid, automated, and mass-production-level testing of the RF performance and protocol interaction functions of the RFID tag chip. Compared with related technologies that only target the process of packaging framework for finished product testing, this system improves the quality inspection system of the entire RFID tag chip production process. It can effectively screen out RFID tag chips with poor RF performance or protocol interaction functions, and avoid problems such as application-end reading failures and data interaction failures from the source.

[0014] According to one embodiment of this application, the test board is connected to the finished product testing device via an SMA interface; the test board makes reliable contact with the RFID tag chip via an elastic probe array.

[0015] Thirdly, this application provides a method for testing a finished radio frequency identification tag chip, applied to a finished product testing device in the finished product testing system described in the second aspect; the method includes: Receive the test configuration file sent by the host computer; Upon receiving a test start signal from the sorting machine, the test script is executed based on the test configuration file to perform a finished product test on the RFID tag chip; the test start signal is issued by the sorting machine when the RFID tag chip is placed in the target area of ​​the test board; After completing the test, output the test results.

[0016] According to the operation method of the finished product testing device for RFID tag chips in this application, by implementing an automated testing system built with the finished product testing device for RFID tag chips as the core, it is possible to achieve unmanned operation of the entire process of loading, positioning, testing and sorting of RFID tag chips. It can eliminate problems such as positioning deviation and judgment error caused by manual operation, and can significantly reduce the labor cost of mass production testing, improve the consistency and accuracy of test results, and automate the entire process, thereby reducing labor costs and errors.

[0017] According to one embodiment of this application, the test configuration file carries at least information on the execution order of the test scripts corresponding to the test items and / or information on at least one judgment threshold used by the test items.

[0018] According to one embodiment of this application, the test items include at least one of the following: sensitivity test, tag identification code test, point test, backscatter link frequency test, session state function test, tag write test, tag permission test, lock test, and data recovery operation test.

[0019] According to one embodiment of this application, the output test results include: The sorting machine is sent a test end signal and a result signal indicating the test result, so that the sorting machine can sort the RFID tag chip based on the result signal.

[0020] According to one embodiment of this application, the output test results include: The test results are reported to the host computer.

[0021] According to one embodiment of this application, after executing the test script based on the test configuration file to perform finished product testing on the RFID tag chip, the method further includes: If an abnormality occurs during the test, the test will be terminated, a fault log will be recorded, and a corresponding indication signal will be output.

[0022] Fourthly, this application provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the finished product testing method for the radio frequency identification tag chip as described in the third aspect above.

[0023] Fifthly, this application provides a non-volatile computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the finished product testing method for the radio frequency identification tag chip as described in the third aspect above.

[0024] In a sixth aspect, this application provides a computer program product, including a computer program that, when executed by a processor, implements the finished product testing method for the radio frequency identification tag chip as described in the third aspect.

[0025] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0026] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which: Figure 1 This is a schematic diagram of the structure of the finished product testing device for the radio frequency identification tag chip provided in the embodiments of this application; Figure 2 This is a schematic diagram of the front panel structure of the finished product testing device for the RFID tag chip provided in this application embodiment; Figure 3 This is a schematic diagram of the trigger signal connection of the finished product testing device for the RFID tag chip provided in this application embodiment; Figure 4 This is a schematic diagram of the hardware triggering process for starting testing of the finished product testing device for the RFID tag chip provided in this application embodiment; Figure 5 This is a schematic diagram showing the structure and connection relationship of the finished product testing system for the radio frequency identification tag chip provided in this application embodiment; Figure 6 This is one of the flowcharts illustrating the finished product testing method for the RFID tag chip provided in this application embodiment; Figure 7 This is a timing diagram of the finished product testing method for the radio frequency identification tag chip provided in the embodiments of this application; Figure 8 This is a second schematic flowchart of the finished product testing method for the RFID tag chip provided in the embodiments of this application; Figure 9 This is a schematic diagram of the structure of the electronic device provided in the embodiments of this application. Detailed Implementation

[0027] The technical solutions of the embodiments of this application will be clearly described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application are within the scope of protection of this application.

[0028] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class and the number of objects is not limited; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0029] In related technologies, the production and testing processes of RFID tag chips mainly include wafer probing at the wafer stage and final test (FT) after packaging, as well as laboratory-level RF / protocol testing.

[0030] Wafer testing is a routine initial screening test for RFID tag chips during the wafer manufacturing stage and is an essential test for mass production by chip manufacturers in this field. Wafer testing involves directly contacting the pins of the RFID tag chip die on the wafer with a probe card to verify the basic device characteristics and design specifications of the RFID tag chip. The core testing content of wafer testing usually only includes the basic electrical performance of the RFID tag chip, such as operating voltage, operating current, open and short circuits at pins, and basic electrical signal response. It can only screen out chips with hardware failures caused during wafer manufacturing and does not involve any testing of the RFID tag chip's radio frequency wake-up and protocol interaction functions.

[0031] Traditional finished product testing involves simplified testing of the packaged RFID tag chip. There are no unified mandatory standards in this field, and each manufacturer uses lightweight hardware testing solutions. The test object is not the RFID tag chip itself, but only the packaging frame of the RFID tag chip undergoes process testing. The core testing content of traditional finished product testing generally includes the continuity, open / short circuits, and solder joint strength of the package frame pins. It is only used to troubleshoot hardware connection failures caused by process issues during chip packaging and soldering, and does not involve any testing of the RFID tag chip's RF wake-up and protocol interaction functions.

[0032] Laboratory-level RF / protocol testing involves full performance testing of the RF physical layer and protocol layer of RFID tag chips. This is typically conducted only during the laboratory R&D verification phase. It utilizes sophisticated instruments such as spectrum analyzers and signal generators, following standards like ISO / IEC 18000-6C and / or GB / T 29768, to test a small number of samples of new RFID tag chips during the R&D or finalization stage, verifying the design rationality of the RFID tag chip. However, due to the high equipment cost and long testing time per chip (several hours per chip), this type of testing cannot meet the testing requirements of a full range of chips in mass production. Therefore, no manufacturer in this field has included it in the mass production testing phase. Furthermore, the mass production testing of RFID tag chips is to verify whether the produced RFID tag chips are qualified products; the test items do not need to cover all the contents specified in standards such as ISO / IEC 18000-6C and GB / T 29768.

[0033] Therefore, the testing of RFID tag chips in related technologies has at least the following shortcomings.

[0034] First, there is a gap in the testing of core functions of finished RFID tag chips. Traditional finished product testing only performs process inspections on the packaging framework, and wafer testing only covers the basic electrical performance at the wafer stage. Neither of these methods tests the RF performance (such as sensitivity and backscatter power) and protocol interaction functions (such as BLF rate and session switching) of the packaged RFID tag chip, resulting in a technological gap in the testing of core functions at the packaging level of RFID tag chips.

[0035] Second, there is a lack of dedicated testing equipment for mass production. There are no dedicated testing tools in this field for RF protocols used in mass production testing of RFID tag chips after packaging. Laboratory-level testing solutions cannot meet the needs of testing all chips, resulting in chips with poor protocol interaction not being effectively screened out.

[0036] Third, there is a core contradiction between testing efficiency and completeness. Complete system-level testing of the RF performance and protocol interaction functions of RFID tag chips takes several hours. Related technologies cannot shorten the testing time while ensuring test coverage, making it difficult to meet the rapid testing requirements of a full range of RFID tag chips in the mass production stage.

[0037] In summary, the testing system for RFID tag chips in related technologies suffers from significant gaps: wafer testing only covers basic electrical performance at the wafer level, traditional finished product testing only performs process inspections on the packaging framework, and testing methods capable of comprehensively evaluating the RF performance and protocol interaction functions of RFID tag chips remain only in the laboratory R&D stage and cannot be implemented in a mass production environment. Therefore, there is currently no technical solution in this field that can automate mass production testing of the RF performance and protocol interaction functions of finished RFID tag chips after packaging, representing a significant technological gap.

[0038] The following description, in conjunction with the accompanying drawings, details the finished product testing apparatus, system, and method for RFID tag chips provided in this application through specific embodiments and application scenarios.

[0039] like Figure 1 As shown, the finished product testing device for the RFID tag chip includes: an RF processing module 110, a baseband module 120, a data processing module 130, a modulation and demodulation module 140, and a user interface module 150.

[0040] In practical application, this RFID tag chip finished product testing device can be used to perform rapid and accurate testing of the packaged RFID tag chip's RF performance and protocol interaction functions during the finished product testing phase. The aforementioned RFID tag chip can be a high-frequency (HF) and / or ultra-high-frequency (UHF) RFID tag chip, etc.

[0041] In some embodiments, the finished product testing device for the RFID tag chip can be a tester used for mass production of RFID tag chips.

[0042] In some embodiments, the finished product testing device for the RFID tag chip may mainly include components such as an RF processing module 110, a baseband module 120, a data processing module 130, a modulation and demodulation module 140, and a user interface module 150.

[0043] In some embodiments, the radio frequency processing module 110 is electrically connected to the baseband module 120, the baseband module 120 is electrically connected to the data processing module 130, the user interface module 150 is electrically connected to the modulation and demodulation module 140, and the modulation and demodulation module 140 is electrically connected to the data processing module 130.

[0044] The radio frequency processing module 110 is used for radio frequency communication with the radio frequency identification tag chip.

[0045] In actual implementation, the RF performance and protocol interaction functions of the RFID tag chip to be tested need to be tested. The finished product testing device for the RFID tag chip needs to communicate with the RFID tag chip via RF. The RF communication between the finished product testing device and the RFID tag chip can be specifically performed by the RF processing module 110.

[0046] In some embodiments, the radio frequency processing module 110 can support protocol parsing and radio frequency signal transmission and reception functions as specified in standards such as ISO / IEC 18000-6C and GB / T 29768.

[0047] In some embodiments, the radio frequency processing module 110 may adopt the following parameters, but not limited to the following parameters: operating frequency band of 860MHz-960MHz (covering the core range of the UHF band of 800MHz-1000MHz), transmit power range of -30dBm to +30dBm (steps can be 0.1dBm), receive sensitivity ≤-85dBm, frequency accuracy ±1ppm, support for at least one of ASK modulation and FSK demodulation methods, and data rate adaptation of 40kHz to 640kHz (to meet the BLF test rate range requirements).

[0048] Baseband module 120 is used for radio frequency communication protocol parsing.

[0049] In actual implementation, the baseband module 120 can be used to perform radio frequency communication protocol parsing, specifically including converting baseband information into radio frequency signals that can be wirelessly transmitted, and restoring the original baseband information from the received radio frequency signals.

[0050] Understandably, the radio frequency signal obtained by the baseband module 120 through the conversion of baseband information is sent through the radio frequency processing module 110, and the radio frequency signal received by the radio frequency processing module 110 is used by the baseband module 120 to restore the original baseband information.

[0051] In some embodiments, the baseband module 120 can support the RN16 / RN32 random number format specified in the ISO / IEC 18000-6C standard, adapt to the Electronic Product Code (EPC) storage capacity of 0~64KB, and be compatible with the protocol parsing requirements of different specifications of UHF RFID tag chips.

[0052] The data processing module 130 is used to execute test scripts, control the radio frequency processing module 110 and the radio frequency identification tag chip for radio frequency communication, and obtain the finished product test results of the radio frequency identification tag chip.

[0053] In actual execution, the data processing module 130 can execute the test script to control the radio frequency processing module 110 to communicate with the radio frequency identification tag chip via radio frequency communication, and obtain the finished product test results of the radio frequency identification tag chip by sending and receiving data.

[0054] In some embodiments, the test script may include a script for performing at least one of the following: sensitivity test, tag identifier (TID) test, point test, backscatter link frequency (BLF) test, session state function test (also known as "session test"), tag write test, tag permission test, lock test, and data recovery operation test.

[0055] It should be noted that, compared with laboratory-level testing solutions (which take several hours per chip), the nine lightweight testing items adopted in this application embodiment can improve testing efficiency by thousands of times. It can achieve mass production-level full inspection of the RF performance and protocol interaction functions of RFID tag chips after packaging, and can solve the technical contradiction of not being able to balance testing efficiency and testing integrity.

[0056] In some embodiments, the data processing module 130 may include a local storage unit. This application embodiment does not specifically limit parameters such as the storage capacity, log storage format, and interface type of the local storage unit. In some embodiments, the local storage unit may employ built-in ≥8GB flash memory, support offline storage of ≥100,000 test logs, and the log storage format may be compatible with CSV and / or JSON, and can be exported via serial port and / or network port.

[0057] User interface module 150 is used to connect to the sorting machine; the sorting machine is used for feeding and sorting radio frequency identification tag chips.

[0058] In actual implementation, the finished product testing device for the RFID tag chip can be used in conjunction with a sorting machine (Handler). After the sorting machine loads the RFID tag chip, the finished product testing device performs a finished product test on the RFID tag chip. Based on the finished product test results, the sorting machine sorts the RFID tag chip, distinguishing between RFID tag chips that have passed the finished product test (qualified) and RFID tag chips that have failed the finished product test (unqualified).

[0059] In some embodiments, the finished product testing device for the RFID tag chip can be connected to the sorting machine via the user interface module 150 to transmit signals.

[0060] Understandably, the user interface module 150 is also connected to the data processing module 130, ultimately enabling communication between the data processing module 130 and the controller in the sorting machine.

[0061] The modulation and demodulation module 140 is used to modulate and demodulate the signals used for communication between the user interface module and the sorting machine.

[0062] In actual implementation, the modulation and demodulation module 140 can be used to modulate and demodulate the signal communicating between the finished product testing device of the RFID tag chip and the sorting machine.

[0063] In some embodiments, the signal sent by the sorting machine can be demodulated by the modem 140 and sent to the data processing module 130; the data sent by the data processing module 130 can be modulated into a signal by the modem 140 and sent to the sorting machine through the user interface module 150.

[0064] In some embodiments, the finished product testing device for the RFID tag chip can be a dedicated testing device for the radio frequency function and / or protocol of the UHF RFID tag chip, and is the core testing carrier of the finished product testing system for the RFID tag chip.

[0065] In some embodiments, the radio frequency processing module 110, baseband module 120, data processing module 130, modulation and demodulation module 140, and user interface module 150 described above can all be in the form of a printed circuit board (PCB).

[0066] In some embodiments, the finished product testing device for the RFID tag chip can integrate eight PCB boards, including a baseband board, a PowerPC (Performance Optimization With Enhanced RISC–Performance Computing, PPC) board, an FPGA (Field Programmable Gate Array) board, a power supply and indicator board, a LO (Local Oscillator) board, an RX (Receive) board, a TX (Transmit) board, and a user interface board. It possesses core capabilities such as transmitting and receiving RF signals in HF and / or UHF frequency bands, parsing and transmitting protocol commands, real-time determination of test results, external device signal interaction, local data storage, and self-testing and fault handling. It can complete the RF performance and protocol interaction function testing of the RFID tag chip according to standards such as ISO / IEC 18000-6C and / or GB / T 29768. Among them, the baseband board can be used as the baseband module 120, the PowerPC board can be used as the data processing module 130, the FPGA board can be used as the modulation and demodulation module 140, the user interface board can be used as the user interface module 150, the LO board, RX board and TX board form the radio frequency processing module 110, and the power supply and indicator board can be used to provide power to each module inside the finished product testing device of the radio frequency identification tag chip and to display the test status and results through indicator lights.

[0067] In some embodiments, the structure of the front panel of the finished product testing device for the RFID tag chip can be as follows: Figure 2 As shown. The front panel can be equipped with a power switch, status indicator lights, and transmit / receive ports. It can also include a READER / TAG mode switch and a fault reset button. Figure 2 (Not shown in the image).

[0068] The power switch button can also be used to control the power supply to the finished product testing device for the RFID tag chip.

[0069] Among them, such as Figure 2As shown, the status indicator can include 6 indicator lights, which are respectively used for the following states: the RFID tag chip is in reader mode (status indicator READER), the RFID tag chip is in TAG mode (status indicator TAG), the finished product test result of the tested RFID tag chip is passed (status indicator PASS), the finished product test result of the tested RFID tag chip is failed (status indicator FAIL), the RFID tag chip is in transmit mode (status indicator Tx), and the RFID tag chip is in receive mode (status indicator Rx).

[0070] In some embodiments, a solid green READER or TAG status indicator light indicates that the RFID tag chip's finished product testing device has passed self-test or is in standby mode; a flashing green light indicates that the RFID tag chip's finished product testing device is being tested; and a flashing red light indicates that the RFID tag chip's finished product testing device is malfunctioning.

[0071] In some embodiments, a green light on the PASS status indicator indicates that the test has passed, while a red light on the FAIL status indicator indicates that the test has failed.

[0072] It is understandable that the number of status indicator lights is not limited to... Figure 2 The scenario shown can be flexibly configured according to the actual situation.

[0073] The aforementioned transmit / receive port is the core interface for the radio frequency identification (RFID) tag chip finished product testing device to interact with the RFID tag chip (finished product) under test via radio frequency signals. In some embodiments, such as Figure 2 As shown, the aforementioned transmit and receive ports may include a high frequency (HF) transmit (Tx) port, a high frequency (HF) receive (Rx) port, an ultra-high frequency (UHF) transmit (Tx) port, and an ultra-high frequency (UHF) receive (Rx) port.

[0074] In some embodiments, the aforementioned transmit and receive ports may employ an SMA (Sub-Miniature version A) interface with an impedance of 50Ω. It is understood that the type and impedance parameters of the aforementioned transmit and receive ports are not limited to SMA and 50Ω, and can be flexibly set according to actual conditions.

[0075] In some embodiments, the READER / TAG mode switch key can be used to switch the operating mode of the finished product testing device for the RFID tag chip. In some embodiments, the operating mode of the finished product testing device for the RFID tag chip can be set to READER mode by default for testing the finished product of the RFID tag chip; when necessary, the operating mode of the finished product testing device for the RFID tag chip can be switched to TAG mode.

[0076] In some embodiments, the fault reset button can be used to trigger the finished product testing device of the RFID tag chip to restart and perform a self-test again when the finished product testing device of the RFID tag chip is in a fault state.

[0077] It should be noted that the finished product testing device for RFID tag chips provided in this application embodiment can serve as the core of an automated finished product testing system for RFID tag chips. This addresses the technical problems in related technologies, such as the lack of mass production testing devices for the RF performance and protocol interaction functions of packaged chip products, and the difficulty in balancing testing efficiency and completeness. Through hardware design or customization of the finished product testing device for RFID tag chips (which may include determining the parameters of the RF processing module 110, the trigger logic for test start, and I / O port definitions), development of a dedicated test project system (which may include refining judgment criteria), design of self-testing and fault handling mechanisms, and standardized test sequence or process design, comprehensive, rapid, and automated testing of the RF performance and protocol interaction functions of packaged RFID chips can be achieved. Furthermore, the finished product testing device for RFID tag chips can seamlessly integrate with industry-standard automated sorting machines, ensuring the yield rate of RFID chips leaving the factory and preventing application-end reading failures and data interaction failures caused by RFID chips with poor RF performance or protocol interaction functions entering the market. This reduces the manpower and time costs associated with replacing RFID chips.

[0078] The RFID tag chip finished product testing device provided in this application embodiment, by adopting a structure including an RF processing module, a baseband module, a data processing module, a modulation / demodulation module, and a user interface module, performs comprehensive, rapid, automated, and mass-production-level testing of the RF performance and protocol interaction functions of the RFID tag chip. Compared with related technologies that only target the process aspects of the packaging frame for finished product testing, this device improves the quality inspection system for the entire RFID tag chip production process. It can effectively screen out RFID tag chips with poor RF performance or protocol interaction functions, avoiding problems such as application-end reading failures and data interaction failures from the source. Furthermore, the data processing module can execute test scripts to complete multiple test items covering the core capabilities of the RFID tag chip, such as RF activation, protocol interaction, data read / write, access control, and data recovery. The test frequency band covers the core range of the 800MHz-1000MHz ultra-high frequency band, and each test has clear judgment criteria, ensuring the accuracy of the test results. The test coverage is comprehensive, and the results are accurate and reliable.

[0079] In some embodiments of this application, the user interface module 150 includes: an I / O port unit; the I / O port unit includes at least one DB25 interface.

[0080] In actual implementation, the user interface module 150 may include at least one I / O (input / output) port unit. In some embodiments, the I / O port unit may be a customized I / O port module or a general-purpose I / O port module.

[0081] It should be noted that the user interface module 150 in this embodiment can be upgraded with hardware to achieve efficient signal interaction and audible and visual alerts of the test status between the finished product testing device of the RFID tag chip and the automated sorting machine through a dedicated I / O port and a buzzer. This can be one of the core customized designs of the finished product testing device of the RFID tag chip to meet the equipment linkage and signal interaction requirements of the finished product testing of the RFID tag chip.

[0082] In some embodiments, each I / O port unit may include at least one 25-pin D-type data interface connector (DB) port, i.e., a DB25 interface. The DB25 interface includes 25 I / O ports, each of which can be used for unidirectional input, unidirectional output, or bidirectional input / output.

[0083] It should be noted that the 25-pin standard DB25 interface is used as the dedicated I / O interface, and the interface definition can take into account both the core testing requirements and the scalability for subsequent system upgrades.

[0084] In some embodiments, the I / O port unit can be used to transmit test interaction signals such as Start of Test (SOT), End of Test (EOT), Pass (PASS), and FAIL, and reserves at least one (e.g., four) expansion I / O port. It connects to an automated sorting machine via a DB25 interface, allowing for compatibility with the signal definitions of different sorting machine models.

[0085] In some embodiments, the allocation of I / O ports for the finished product testing device of the RFID tag chip can be provided by the data processing module 130 and the modulation and demodulation module 140 jointly providing I / O signals.

[0086] In some embodiments, such as Figure 3 As shown, the test start signal is a trigger signal, which can be connected independently to the data processing module 130 (taking the data processing module 130 as a PPC board as an example). In some embodiments, the response delay of the data processing module 130 to the test start signal is very small (e.g., ≤1ms, but not limited to this), ensuring a fast response to the trigger signal.

[0087] In some embodiments, such as Figure 3 As shown, test interaction signals such as test end, test pass, and test failure can be provided by the modem module 140 (taking the modem module 140 as an FPGA board as an example), supporting the parallel transmission of multiple signals.

[0088] In some embodiments, the modulation / demodulation module 140 and the data processing module 130 can be connected via a data bus. The bit width of the data bus (e.g., 32 bits) is not specifically limited in this embodiment.

[0089] In some embodiments, the above-mentioned signal test interaction signal can be compatible with 3.3V TTL (Transistor-Transistor-Logic) level signals.

[0090] According to the embodiments of this application, the finished product testing device for RFID tag chips, through the customized I / O port design (including signal direction definition) implemented by the I / O port unit, achieves seamless linkage with industry-standard automated sorting machines. The core device and the general equipment are seamlessly linked, with higher adaptability. There is no need to modify the structure of the general equipment. Different models of sorting machines can be matched only through the I / O signal adapter board, which can reduce the transformation cost of the production line and make it easier to promote and apply in the industry.

[0091] In some embodiments of this application, the DB25 interface includes at least one input port and multiple output ports for communicating with the sorting machine, as well as at least one reserved input / output port.

[0092] In actual implementation, the DB25 interface described above may include at least one input port and multiple output ports for communicating with the sorting machine, used to transmit different signals. Furthermore, the DB25 interface may also include at least one reserved input / output port.

[0093] In some embodiments, the 25-pin I / O port definition of a DB25 interface can be as shown in Table 1.

[0094] Table 1 Definition of DB25 Interface

[0095] In some embodiments, all I / O ports can interact with the automated sorting machine via the DB25 interface. A customized I / O signal adapter board enables port matching between the tester and different models of sorting machines (adapting to the I / O port definitions of common sorting machines). In some embodiments, four or more I / O ports can be reserved for future expansion based on subsequent functional upgrades (e.g., adding test mode triggers and / or additional status feedback).

[0096] The RFID tag chip finished product testing device provided in this application embodiment, through a customized I / O port design (including signal direction definition) implemented by the I / O port unit, achieves seamless linkage with industry-standard automated sorting machines. The core device seamlessly integrates with general equipment, offering higher adaptability. No structural modifications to general equipment are required; different models of sorting machines can be matched simply through an I / O signal adapter board, reducing production line modification costs and facilitating wider industry adoption. Furthermore, the user interface board reserves at least one I / O port as an expansion port, allowing for expansion of test items and hardware upgrades based on subsequent industry standard updates or RFID tag chip function upgrades, demonstrating excellent technical scalability and lifespan.

[0097] In some embodiments of this application, the finished product testing device for RFID tag chips includes an interrupt controller for outputting an interrupt signal in response to a test start signal input from the sorting machine; The data processing module 130 includes a hardware triggering unit for triggering the execution of a test script upon detection of an interrupt signal.

[0098] In actual execution, the output terminal of the test start signal of the controller in the sorting machine can be electrically connected to the input terminal of the interrupt controller, which is an external device of the data processing module 130, inside the finished product testing device of the RFID tag chip, so as to realize the automatic triggering of the test process based on the falling edge interrupt mechanism.

[0099] In some embodiments, the hardware triggering unit can be used to achieve automated linkage between the finished product testing device of the RFID tag chip and the industry-standard automated sorting machine, so as to complete the test process without human intervention.

[0100] In some embodiments, reference Figure 3 The output of the Test Start (SOT) signal of the controller in the sorting machine can be electrically connected to the input of the interrupt controller, which is a peripheral of the data processing module 130, inside the finished product testing device for the RFID tag chip, forming a hardware interrupt triggering link based on the TTL signal (referring to the test start signal). The high level of the TTL signal is 3.3V, and the low level is 0V. When the level is pulled low, the interrupt controller can report the interrupt signal IRQ2 to the core of the data processing module 130 (e.g., PPC CORE), triggering the automatic start of the test process. The automatic start of the test process can mainly include the automatic start and execution of the test script.

[0101] In some embodiments, the interrupt signal IRQ2 can be processed by the hardware triggering unit in the data processing module 130 to trigger the automatic start of the test process.

[0102] In some embodiments, the trigger program can be integrated into the hardware trigger unit in the data processing module 130. The hardware trigger unit executes the trigger program, responds to the interrupt signal IRQ2, and triggers the automatic start of the test process. In some embodiments, the trigger program can be developed using a high-performance hard real-time operating system (RTOS) kernel such as VxWORKS, but is not limited to this.

[0103] In some embodiments, the hardware triggering process for starting testing with the finished product testing device of the RFID tag chip can be as follows: Figure 4 As shown. Reference Figure 4 The hardware triggering process for starting the test of the finished product testing device for the RFID tag chip may include the following steps.

[0104] Kernel initialization. The data processing module 130 kernel can complete initialization and load the VxWORKS kernel.

[0105] Configure the IRQ2 register. Configure the interrupt controller register of the data processing module 130 peripheral so that the interrupt controller generates the interrupt signal IRQ2 when it receives the test start signal.

[0106] Configure TTL edge triggering. The trigger mode of interrupt signal IRQ2 can be set to falling edge triggering to match the level change logic of TTL signal from 3.3V to 0V (it is not limited to falling edge triggering mode; when the test start signal is not a TTL signal, falling edge triggering mode, rising edge triggering mode, or other triggering mode can be used depending on the different forms of the test start signal).

[0107] Attach interrupt handlers. Test flow functions can be attached as interrupt handlers, and test flow semaphores can be initialized within the test flow functions.

[0108] Enable interrupt waiting for trigger. When the test start signal is received and the interrupt signal is triggered, the test process function can be synchronized through the test process semaphore, and the finished product test device for the RFID tag chip will automatically start the test script.

[0109] Execute the test process function.

[0110] The interrupt waiting process can also include a host computer trigger. The host computer is the host computer of the finished product testing device for the RFID tag chip, which triggers the finished product testing device for the RFID tag chip to wait for the test start signal from the sorting machine.

[0111] In some embodiments, if the trigger signal is abnormal (e.g., the level is continuously low or the high level exceeds 1 second), the finished product testing device of the RFID tag chip determines that there is a trigger fault, can output fault code E5 and enter standby state.

[0112] The RFID tag chip finished product testing device provided in the embodiments of this application achieves seamless linkage with industry-standard automated sorting machines through a customized I / O port design (including signal direction definition) implemented by a hardware trigger module and I / O port unit. The core device and general equipment are seamlessly linked, with higher adaptability. No structural modifications to general equipment are required. Different models of sorting machines can be matched simply through an I / O signal adapter board, which can reduce the transformation cost of the production line and make it easier to promote and apply in the industry.

[0113] In some embodiments of this application, the data processing module 130 includes a self-test and fault handling unit, used for self-testing of the finished product testing device and, in the event of an abnormality during the testing process, terminating the test, recording a fault log, and outputting a corresponding indication signal.

[0114] In actual implementation, the data processing module 130 may also include a self-test and fault handling unit. The self-test and fault handling unit can be used to implement a self-test and fault handling mechanism, that is, for the self-test and fault handling of the finished product testing device for the RFID tag chip.

[0115] In some embodiments, the self-test and fault handling unit can automatically perform the self-test process after the finished product testing device of the RFID tag chip is powered on, and output fault codes E1-E5 if the self-test fails.

[0116] In some embodiments, when an abnormality occurs during the testing of the RFID tag chip by the finished product testing device, the self-test and fault handling unit can automatically terminate the test, record the fault log, and output a FAIL signal. It is understood that the FAIL signal is the aforementioned test failure signal and can serve as an indication signal corresponding to an abnormality occurring during the test.

[0117] In some embodiments, the self-test and fault handling mechanism may include power-on self-test and fault handling during testing.

[0118] In some embodiments, the power-on self-test (POST) is an automatic self-test process executed after the finished product testing device for the RFID tag chip is powered on, thereby verifying the functions of the RF processing module 110, each I / O port, local storage unit, and hardware trigger unit. It should be noted that the self-test takes approximately 30 seconds; therefore, the above self-test process can be referred to as the 30-second self-test process.

[0119] In some embodiments, the result of the self-test can be indicated by a status indicator light. For example, if the self-test passes, the status indicator light will be solid green; if the self-test fails, the status indicator light will flash red.

[0120] In some embodiments, fault codes can also be output in the event of a self-test failure. Fault codes can indicate which module(s) failed the self-test. For example, fault code E1 can indicate a fault in the RF processing module 110, fault code E2 can indicate an I / O port abnormality, fault code E3 can indicate a local storage unit fault, and fault code E4 can indicate a hardware trigger unit fault.

[0121] In some embodiments, fault handling during testing may include: if a fault such as signal interruption or hardware abnormality occurs during the test, the self-test and fault handling unit may trigger the finished product testing device of the RFID tag chip to automatically terminate the current test, output a fault code and send a FAIL signal to the sorter, and record a fault log at the same time.

[0122] In some embodiments, the fault log may include information such as fault time, test phase, and fault type.

[0123] In some embodiments, the test can be resumed by using the aforementioned fault reset button after the fault has been resolved.

[0124] According to the finished product testing device for RFID tag chips provided in the embodiments of this application, a self-testing and fault handling mechanism is implemented through a self-testing and fault handling unit. The self-testing and fault handling mechanism is complete and reliable, and can quickly locate and record equipment faults. In addition, combined with the local storage unit built into the data processing module, it can support offline storage of more than 100,000 test logs. The logs contain information such as the TID of the RFID chip, test data, and fault details, which facilitates subsequent problem tracing and analysis, improves the traceability of test results, and enhances the reliability and traceability of test results of the finished product testing device for RFID tag chips.

[0125] In some embodiments of this application, the radio frequency processing module 110 includes: a receiving unit, a transmitting unit, and a local oscillator.

[0126] In actual implementation, the radio frequency processing module 110 may include a receiving unit, a transmitting unit, and a local oscillator.

[0127] In some embodiments, the receiving unit, the transmitting unit, and the local oscillator can all be in the form of a printed circuit board. Accordingly, the receiving unit, the transmitting unit, and the local oscillator can be the aforementioned RX board, TX board, and LO board, respectively.

[0128] The finished product testing device for RFID tag chips provided in the embodiments of this application In some embodiments of this application, the data processing module 130 uses a PowerPC; the modulation and demodulation module 140 uses a field-programmable gate array.

[0129] In actual implementation, the data processing module 130 can adopt an embedded architecture, such as PowerPC.

[0130] The modulation and demodulation module 140 uses programmable logic devices (PLDs) such as field-programmable gate arrays.

[0131] According to the finished product testing device for the RFID tag chip provided in the embodiments of this application, the data processing module adopts PowerPC, which has smaller size and power consumption, faster real-time response and better stability. The modulation and demodulation module adopts field-programmable gate array, which has higher energy efficiency, lower power consumption, lower and more stable latency, and greater flexibility.

[0132] This application also provides a finished product testing system for RFID tag chips. (Reference) Figure 5 The finished product testing system for the RFID tag chip may include: a finished product testing device for the RFID tag chip, a host computer, a sorting machine, and at least one test board; The host computer is used to send test configuration files to the finished product testing device; The test board is used to achieve a reliable connection between the finished product testing device and the RFID tag chip.

[0133] In actual implementation, the finished product testing system for the RFID tag chip can take the finished product testing device for the RFID tag chip provided in any of the foregoing embodiments of this application as the core, and cooperate with the host computer, sorting machine and test board to complete the sorting of the finished product testing of the RFID tag chip.

[0134] It should be noted that the finished product testing device for RFID tag chips may include customized hardware trigger units, I / O port units, and host computer control modules. As the core testing equipment of the finished product testing system for RFID tag chips, the finished product testing device for RFID tag chips is paired with industry-standard automated sorting machines. The finished product testing system for RFID tag chips does not require structural modifications to the general automated sorting machines; it achieves automated linkage with the sorting machines solely through the exclusive design of the finished product testing device for RFID tag chips.

[0135] It should be noted that the finished product testing system for this RFID tag chip completes the core testing of the RF performance and protocol interaction function of the finished RFID tag chip through the finished product testing device for the RFID tag chip. It completes the loading, positioning and sorting of RFID tag chips through a general automated sorting machine. It realizes the signal interaction between the finished product testing device for the RFID tag chip and the sorting machine through customized hardware trigger units and I / O port units. It realizes the overall control of the finished product testing system for the RFID tag chip through the host computer. All parts work together to complete the fully automated process of loading, testing and sorting of RFID tag chips.

[0136] In some embodiments, the host computer may be a personal computer (PC) or a mobile smart terminal, etc. In some embodiments, the test configuration file may be used to store configuration information used for final product testing of the RFID tag chip under test. In some embodiments, the configuration information may include at least one of the following: information on test items and information on judgment thresholds.

[0137] In some embodiments, the finished product testing device for RFID tag chips can be connected to a host computer via a network cable.

[0138] In some embodiments, the test board is a supporting test carrier for the finished product testing device of the RFID tag chip, used to achieve a reliable connection between the finished RFID tag chip under test and the finished product testing device of the RFID tag chip.

[0139] In some embodiments, the transmit / receive ports of the finished product testing device for each RFID tag chip can be connected to the test board via a circulator.

[0140] In some embodiments, the sorting machine can be connected to a finished product testing device for at least one RFID tag chip via an I / O signal adapter board to enable parallel testing of multiple RFID tag chips.

[0141] In some embodiments, the sorting machine and the I / O signal adapter board, as well as the I / O signal adapter board and the finished product testing device for the RFID tag chip, can be connected via a data cable.

[0142] The RFID tag chip finished product testing system provided in the embodiments of this application, by adopting a structure including an RF processing module, a baseband module, a data processing module, a modulation and demodulation module, and a user interface module, performs comprehensive, rapid, automated, and mass-production-level testing of the RF performance and protocol interaction functions of the RFID tag chip. Compared with the finished product testing of related technologies that only target the process of the packaging frame, this system improves the quality inspection system of the entire RFID tag chip production process, effectively screening out RFID tag chips with poor RF performance or protocol interaction functions, and avoiding problems such as application-end reading failures and data interaction failures from the source.

[0143] In some embodiments of this application, the test board is connected to the finished product testing device via an SMA interface; the test board makes reliable contact with the RFID tag chip via an elastic probe array.

[0144] In actual implementation, the test board can be connected to the RF transmit / receive port of the finished test device for the RFID tag chip via the SMA interface. In some embodiments, the impedance of the SMA interface of the test board can be 50Ω (but is not limited to this) to ensure distortion-free transmission of RF signals.

[0145] In some embodiments, the test board can employ a flexible probe array to achieve reliable contact with the finished RFID tag chip. In some embodiments, the flexible probe array is made of beryllium copper with a contact resistance ≤1Ω (not limited to this), and is compatible with UHF RFID tag chips of ≤5mm×5mm size (not limited to this size), thus enabling reliable contact between the RFID tag chip pins and the test board.

[0146] In some embodiments, the test board can be fixed in a way that is compatible with the base of an automated sorting machine. It can be fixed to the base of the automated sorting machine by a positioning pin, and the positioning accuracy can reach ±0.1mm (not limited to this), ensuring that the relative position of the test board and the RFID tag chip is stable during the test.

[0147] According to the finished product testing system for RFID tag chips provided in the embodiments of this application, the RFID tag chip is fixed by a test board and a reliable RF connection is made between the RFID tag chip and the finished product testing device for the RFID tag chip, thereby enabling the finished product testing of the RFID tag chip based on the finished product testing device for the RFID tag chip.

[0148] This application also provides a method for testing a finished RFID tag chip. This method and system for testing a finished RFID tag chip can be applied to the RFID tag chip testing apparatus provided in any of the foregoing embodiments of this application. (Reference) Figure 6 A method for testing a finished radio frequency identification tag chip may include steps 610, 620 and 630.

[0149] It should be noted that the following description of the finished product testing method for RFID tag chips is based on the perspective of the finished product testing device for RFID tag chips.

[0150] Step 610: Receive the test configuration file sent by the host computer.

[0151] In actual implementation, the test configuration file can be sent from the host computer to the finished product testing device of the RFID tag chip.

[0152] The finished product testing device for RFID tag chips receives a test configuration file and can perform finished product testing on the RFID tag chip under test according to the configuration information stored in the configuration file.

[0153] Step 620: Upon receiving the test start signal from the sorting machine, execute the test script based on the test configuration file to perform a finished product test on the RFID tag chip; the test start signal is issued by the sorting machine when the RFID tag chip is placed in the target area of ​​the test board.

[0154] In practice, the RFID tag chip under test can be placed by the sorter into the target area of ​​the test board connected to the finished product test device of the RFID tag chip. After the RFID tag chip under test is placed in the target area, the sorter can send a Test Start (SOT) signal to the finished product test device of the RFID tag chip (specifically, it can be issued by the controller in the sorter).

[0155] The finished product testing device for this RFID tag chip can be hardware-triggered based on a test start signal to begin the finished product testing of the RFID tag chip. The device can also execute test scripts based on a test configuration file to perform finished product testing on the RFID tag chip.

[0156] Step 630: After completing the test, output the test results.

[0157] In actual operation, after the finished product testing of the RFID tag chip is completed, the finished product testing device can send the test results to the sorting machine and / or the host computer.

[0158] In some embodiments, based on the above test results, the sorting machine may perform the following operations: placing the RFID tag chips that have passed the test in the qualified product area, or placing the RFID tag chips that have failed the test in the unqualified product area.

[0159] In some embodiments, the above test scripts can be used to cover all dimensions of testing requirements, including the radio frequency physical layer, protocol link layer, and storage access layer, thus providing a more comprehensive testing method for the finished RFID tag chip.

[0160] In some embodiments, a judgment threshold can be configured for each test item and each RFID tag chip model. Each test has a clearly defined numerical judgment threshold, which can eliminate subjective judgment and make the finished product testing method of the RFID tag chip more quantitative.

[0161] It should be noted that the finished product testing method for RFID tag chips provided in this application embodiment can achieve a total testing time of ≤5 seconds for a single chip, meeting the mass production cycle requirements.

[0162] According to the finished product testing method for RFID tag chips provided in the embodiments of this application, the automated testing system built with the finished product testing device for RFID tag chips as the core can realize the entire process of unmanned operation of RFID tag chip loading, positioning, testing and sorting. It can eliminate the positioning deviation and judgment error caused by manual operation, and can significantly reduce the labor cost of mass production testing, improve the consistency and accuracy of test results, and automate the entire process, thereby reducing labor costs and errors.

[0163] In some embodiments of this application, the test configuration file carries at least information on the execution order of the test scripts corresponding to the test items and / or information on the judgment threshold used by at least one test item.

[0164] In actual execution, the test configuration file must contain at least the information on the execution order of the test scripts corresponding to the test items and / or the information on the decision threshold used by at least one test item.

[0165] In some embodiments, the execution order of test items can support at least two options, which can be selected through host computer configuration (reflected in the content of the test configuration file). The above execution order can support preset order mode and custom order mode. In some embodiments, the custom order mode must satisfy the constraint that "sensitivity test is a mandatory first execution item".

[0166] In some embodiments, the preset sequence mode can be to execute the tests according to a predetermined sequence of test item numbers. For example, it can execute the tests in the order of numbers 1-9 in Table 2 below, from basic performance to core functions, to avoid test interference.

[0167] In some embodiments, the custom sequence mode can be used to specify the order of test items through the host computer, supporting the skipping of unnecessary test items (which must meet the requirement that "sensitivity test is a mandatory first execution item"), such as only executing the test items with serial numbers 1 and 2 in Table 2 below.

[0168] According to the finished product testing method for RFID tag chips provided in the embodiments of this application, the automated testing system built with the finished product testing device for RFID tag chips as the core can realize the entire process of unmanned operation of RFID tag chip loading, positioning, testing and sorting. It can eliminate the positioning deviation and judgment error caused by manual operation, and can significantly reduce the labor cost of mass production testing, improve the consistency and accuracy of test results, and automate the entire process, thereby reducing labor costs and errors.

[0169] In some embodiments of this application, the test items include at least one of the following: sensitivity test, tag identification code test, point test, backscatter link frequency test, session state function test, tag write test, tag permission test, lock test, and data recovery operation test.

[0170] In actual implementation, the finished product testing of RFID tag chips can adopt a lightweight test system consisting of nine items, including sensitivity testing, TID testing, point testing, BLF testing, session testing, tag write testing, tag access control testing, lock testing, and data recovery operation testing. Among them, sensitivity testing is a mandatory first item to be performed, and the other test items can be executed in a preset order or a custom order. The total time for all tests on a single chip is ≤5 seconds.

[0171] The specific details of the above nine test items are shown in Table 2.

[0172] Table 2 Detailed list of test items

[0173] In some embodiments, the finished product testing for each RFID tag chip may include at least a sensitivity test; or, in addition to a sensitivity test, it may include at least one of the following: tag identification code test, dot test, backscatter link frequency test, session state function test, tag write test, tag permission test, lock test, and data recovery operation test.

[0174] According to the finished product testing method for RFID tag chips provided in this application, by using a multi-lightweight test item system (including clear judgment criteria), the total time for full-item finished product testing of a single RFID tag chip is controlled within 5 seconds. Compared with laboratory-level testing solutions that take several hours, the efficiency is exponentially improved. Furthermore, the test items cover the core capabilities of RFID tag chips, resolving the core contradiction between testing efficiency and completeness, meeting the testing requirements of all chips in the mass production stage, and achieving efficient mass production-level testing that balances efficiency and completeness. Moreover, the multiple test items that the data processing module can execute test scripts to complete cover the core capabilities of RFID tag chips, such as RF activation, protocol interaction, data read / write, access control, and data recovery. The detection frequency band covers the core range of the 800MHz-1000MHz ultra-high frequency band, and each test has clear judgment criteria, ensuring the accuracy of the test results. The test coverage is comprehensive, and the results are accurate and reliable.

[0175] In some embodiments of this application, outputting test results includes sending a test end signal and a result signal to the sorting machine to indicate the test results, so that the sorting machine can sort the radio frequency identification tag chips based on the result signal.

[0176] In actual operation, the finished product testing device for RFID tag chips can output test results to the sorting machine after completing the test.

[0177] In some embodiments, outputting test results to the sorting machine may include sending a Test End (EOT) signal and a result signal indicating the test results to the sorting machine. The result signal indicating the test results may include the aforementioned PASS signal and FAIL signal, etc.

[0178] In some embodiments, based on the above test results, the sorting machine may perform the following operations: placing the RFID tag chips that have passed the test in the qualified (or good) product area, or placing the RFID tag chips that have failed the test in the unqualified (or defective) product area.

[0179] In some embodiments, when the sorting machine receives a PASS signal, it can place the RFID tag chip under test in the qualified (or good) product area and continue to perform the finished product test of the next RFID tag chip under test; when the sorting machine receives a FAIL signal, it can place the RFID tag chip under test in the unqualified (or defective) product area and continue to perform the finished product test of the next RFID tag chip under test.

[0180] According to the finished product testing method for RFID tag chips provided in the embodiments of this application, the automated testing system built with the finished product testing device for RFID tag chips as the core can realize the entire process of unmanned operation of RFID tag chip loading, positioning, testing and sorting. It can eliminate the positioning deviation and judgment error caused by manual operation, and can significantly reduce the labor cost of mass production testing, improve the consistency and accuracy of test results, and automate the entire process, thereby reducing labor costs and errors.

[0181] In some embodiments of this application, outputting test results includes: reporting the test results to a host computer.

[0182] In actual implementation, the finished product testing device for RFID tag chips can output the test results to the host computer after completing the test. The host computer can store the test results for later traceability and / or result analysis.

[0183] According to the finished product testing method for RFID tag chips provided in the embodiments of this application, the automated testing system built with the finished product testing device for RFID tag chips as the core can realize the entire process of unmanned operation of RFID tag chip loading, positioning, testing and sorting. It can eliminate the positioning deviation and judgment error caused by manual operation, and can significantly reduce the labor cost of mass production testing, improve the consistency and accuracy of test results, and automate the entire process, thereby reducing labor costs and errors.

[0184] In some embodiments of this application, after executing the test script based on the test configuration file and performing finished product testing on the RFID tag chip, the method further includes: terminating the test, recording the fault log and outputting the corresponding indication signal in the event of an abnormality during the test.

[0185] In actual implementation, the finished product testing method for RFID tag chips provided in this application embodiment may also include an exception handling mechanism. During the execution of step 620, if the finished product testing device for RFID tag chips detects an abnormal situation such as signal interruption, trigger timeout, or hardware abnormality during the testing process, it can immediately terminate the current test, send a FAIL signal to the sorting machine, and record a fault log (which may include fault codes, test stages, and time, etc.).

[0186] In some embodiments, when the sorting machine receives a FAIL signal, it can place the RFID tag chip under test in the non-conforming (or defective) product area and continue to perform finished product testing on the next RFID tag chip under test.

[0187] In some embodiments, if the same fault code appears multiple times (e.g., 3 times, but not limited to this) during the testing of the same RFID tag chip, the finished product testing system of the RFID tag chip can automatically pause the current testing process and send a manual intervention prompt to the host computer to troubleshoot the problem.

[0188] According to the finished product testing method for RFID tag chips provided in the embodiments of this application, the finished product testing device for RFID tag chips has a complete self-testing and fault handling mechanism, which can quickly locate and record equipment faults. In addition, combined with the local storage unit built into the data processing module, it can support offline storage of more than 100,000 test logs. The logs contain information such as the TID of the RFID chip, test data and fault details, which facilitates subsequent problem tracing and analysis, improves the traceability of test results, and enhances the reliability and traceability of test results of the finished product testing device for RFID tag chips.

[0189] To facilitate understanding of the above embodiments of this application, the following description is provided in conjunction with... Figure 7 and Figure 8 This describes the process of using a finished product testing system for RFID tag chips to perform finished product testing of RFID tag chips, and the implementation of finished product testing methods for RFID tag chips.

[0190] The finished product testing method for RFID tag chips is a standardized testing sequence and process that enables collaborative operation between the RFID tag chip testing device, the host computer, and the industry-standard automated sorting machine, achieving fully automated testing of RFID tag chips without human intervention. This standardized testing sequence and process generally follows the sequence logic of host computer initialization – test script distribution – sorting machine loading trigger – RFID tag chip testing device execution – test result reporting – sorting machine sorting, clearly defining the signal interaction nodes among the three components.

[0191] In some embodiments, reference Figure 7 The following timing sequence can be used for the finished product testing of RFID tag chips.

[0192] The host computer initializes the equipment and sends a test configuration file to the finished product testing device for RFID tag chips (hereinafter referred to as the "finished product testing device"). The host computer then enters the start test mode. The sorting machine retrieves a chip (referring to the RFID tag chip under test, hereinafter referred to as the "chip") from the tray and presses it onto the test board. After completing chip loading and precise positioning, the automated sorting machine can send an SOT signal to the finished product testing device via a data cable. Upon receiving the SOT signal, the finished product testing device executes the test items. After the test is completed, the finished product testing device can send an EOT signal and a PASS / FAIL signal to the sorting machine. The automated sorting machine completes chip sorting based on the test results. Then, the automated sorting machine can retrieve a chip from the tray (referring to the next RFID tag chip under test in the tray) and press it onto the test board.

[0193] In some embodiments, after the host computer completes the device initialization, it can send a customized test configuration file (which may carry information such as the order of test items and judgment thresholds) to the finished product testing device.

[0194] In some embodiments, after receiving the SOT signal, the finished product testing device can enter a test mode and perform various tests on radio frequency performance and / or protocol interaction functions.

[0195] In some embodiments, after the test is completed, in addition to sending EOT and PASS / FAIL signals to the sorter, the finished product testing device can also report test logs (reporting can begin during the test) and test results (which may include chip TID, data of each test item, and Pass / Fail status, etc.) to the host computer.

[0196] In some embodiments, the automated sorting machine can complete chip sorting based on the test results output by the finished product testing device, and the finished product testing device returns to standby mode, waiting for the next trigger.

[0197] In some embodiments, reference Figure 8 The finished product testing method for RFID tag chips can include the following fully automated testing steps.

[0198] The finished product testing device completes initialization and self-test upon power-on, and the status indicator light remains solid green, indicating that it has entered standby mode.

[0199] The host computer sends out the test configuration file, and the finished product testing device automatically parses the test configuration file and completes the configuration of the order of test items and the judgment threshold.

[0200] In industry-standard automated sorting machines, the robotic arm picks up a chip from the tray, places the chip at the test point (meaning it is precisely pressed onto the designated position on the test board with a positioning accuracy of ±0.1mm), and sends a position signal to the sorting machine's control module.

[0201] The controller in the sorting machine can send an SOT signal to the finished product testing device when it receives a position signal.

[0202] After receiving the SOT signal, the finished product testing device executes the test, automatically executes the configured test script, and immediately judges and records the results after each test item is completed.

[0203] After the test is completed, the finished product testing device sends an EOT signal to the controller in the sorting machine, and outputs a Pass / Fail signal to the controller in the sorting machine according to the test results. If the test passes, the finished product testing device stores the test log locally and reports the results to the host computer; if the test fails, the finished product testing device records the fault details (which may include the failed test items and failure data).

[0204] The sorting machine sorts the chips, and the controller in the sorting machine controls the robotic arm in the sorting machine to place the chips into the good product area or the defective product area according to the Pass / Fail signal. The robotic arm of the automated sorting machine returns to the material tray to pick up the next chip and repeats the process of picking up and sorting chips. The finished product testing device continuously completes chip testing, realizing continuous automated finished product testing of all chips.

[0205] In some embodiments, such as Figure 9 As shown, this application embodiment also provides an electronic device 900, including a processor 901, a memory 902, and a computer program stored in the memory 902 and executable on the processor 901. When the computer program is executed by the processor 901, it implements the various processes of the above-described embodiment of the operation method of the finished product testing device for radio frequency identification tag chips, and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0206] It should be noted that the electronic devices in the embodiments of this application include the mobile electronic devices and non-mobile electronic devices described above.

[0207] This application also provides a non-volatile computer-readable storage medium storing a computer program. When the computer program is executed by a processor, it implements the various processes of the above-described embodiment of the operation method of the finished product testing device for RFID tag chips and achieves the same technical effect. To avoid repetition, it will not be described again here.

[0208] The processor is the processor in the electronic device described in the above embodiments. The readable storage medium includes computer-readable storage media, such as computer read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk.

[0209] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the operation method of the above-mentioned finished product testing device for radio frequency identification tag chips.

[0210] The processor is the processor in the electronic device described in the above embodiments. The readable storage medium includes computer-readable storage media, such as computer read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk.

[0211] This application embodiment also provides a chip, which includes a processor and a communication interface. The communication interface and the processor are coupled. The processor is used to run programs or instructions to implement the various processes of the above-described embodiment of the operation method of the finished product testing device for radio frequency identification tag chips, and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0212] It should be understood that the chip mentioned in the embodiments of this application may also be referred to as a system-on-a-chip, system chip, chip system, or system-on-a-chip, etc.

[0213] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element. Furthermore, it should be noted that the scope of the methods and apparatuses in the embodiments of this application is not limited to performing functions in the order shown or discussed, but may also include performing functions substantially simultaneously or in the reverse order, depending on the functions involved. For example, the described methods may be performed in a different order than described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

[0214] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the related technology, can be embodied in the form of a computer software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0215] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of this application.

[0216] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0217] Although embodiments of this application have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of this application, the scope of which is defined by the claims and their equivalents.

Claims

1. A testing device for finished radio frequency identification tag chips, characterized in that, include: Radio frequency processing module, baseband module, data processing module, modulation and demodulation module, and user interface module; The radio frequency processing module is used for radio frequency communication with the radio frequency identification tag chip; The baseband module is used for parsing radio frequency communication protocols; The data processing module is used to execute test scripts, control the radio frequency processing module and the radio frequency identification tag chip for radio frequency communication, and obtain the finished product test results of the radio frequency identification tag chip. The user interface module is used to connect to the sorting machine; the sorting machine is used to feed and sort the radio frequency identification tag chips. The modulation and demodulation module is used to modulate and demodulate the signals used for communication between the user interface module and the sorting machine.

2. The finished product testing device for RFID tag chips according to claim 1, characterized in that, The user interface module includes: an I / O port unit; the I / O port unit includes at least one DB25 interface.

3. The finished product testing device for RFID tag chips according to claim 2, characterized in that, The DB25 interface includes at least one input port and multiple output ports for communicating with the sorting machine, as well as at least one reserved input / output port.

4. The finished product testing device for RFID tag chips according to claim 1, characterized in that, The finished product testing device for the radio frequency identification tag chip includes an interrupt controller, which is used to output an interrupt signal in response to the test start signal input by the sorting machine; The data processing module includes a hardware triggering unit, which is used to trigger the execution of the test script when the interrupt signal is detected.

5. The finished product testing device for RFID tag chips according to claim 1, characterized in that, The data processing module includes: The self-test and fault handling unit is used for the self-test of the finished product testing device and, in the event of an abnormality during the test, to terminate the test, record the fault log and output the corresponding indication signal.

6. The finished product testing device for RFID tag chips according to claim 1, characterized in that, The radio frequency processing module includes: a receiving unit, a transmitting unit, and a local oscillator.

7. The finished product testing apparatus for radio frequency identification tag chips according to any one of claims 1 to 6, characterized in that, The data processing module uses a PowerPC; the modulation and demodulation module uses a field-programmable gate array.

8. A finished product testing system for radio frequency identification tag chips, characterized in that, include: The finished product testing device, host computer, sorting machine and at least one test board of the RFID tag chip as described in any one of claims 1 to 7; The host computer is used to send test configuration files to the finished product testing device; The test board is used to achieve a reliable connection between the finished product testing device and the radio frequency identification tag chip.

9. The finished product testing system for RFID tag chips according to claim 8, characterized in that, The test board is connected to the finished product testing device via an SMA interface; the test board makes reliable contact with the RFID tag chip via an elastic probe array.

10. A method for testing a finished radio frequency identification tag chip, characterized in that, The method is applied to the finished product testing device in the finished product testing system as described in claim 8 or 9; the method includes: Receive the test configuration file sent by the host computer; Upon receiving a test start signal from the sorting machine, the test script is executed based on the test configuration file to perform a finished product test on the RFID tag chip; the test start signal is issued by the sorting machine when the RFID tag chip is placed in the target area of ​​the test board; After completing the test, output the test results.

11. The finished product testing method for the RFID tag chip according to claim 10, characterized in that, The test configuration file contains at least information on the execution order of the test scripts corresponding to the test items and / or information on at least one judgment threshold used by the test items.

12. The finished product testing method for the RFID tag chip according to claim 11, characterized in that, The test items include at least one of the following: sensitivity test, tag identification code test, point test, backscatter link frequency test, session state function test, tag write test, tag permission test, lock test, and data recovery operation test.

13. The method for testing the finished product of the radio frequency identification tag chip according to any one of claims 10 to 12, characterized in that, The output test results include: The sorting machine is sent a test end signal and a result signal indicating the test result, so that the sorting machine can sort the RFID tag chip based on the result signal.

14. The method for testing the finished product of the radio frequency identification tag chip according to any one of claims 10 to 12, characterized in that, The output test results include: The test results are reported to the host computer.

15. The method for testing the finished product of the radio frequency identification tag chip according to any one of claims 10 to 12, characterized in that, After executing the test script based on the test configuration file to perform finished product testing on the RFID tag chip, the method further includes: If an abnormality occurs during the test, the test will be terminated, a fault log will be recorded, and a corresponding indication signal will be output.

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