Power-on output characteristic test circuit, method and apparatus

Abstract

The application provides a power supply starting output characteristic test circuit, method and device, which comprises a program-controlled power supply, a measured power supply, a program-controlled constant current module, a test trigger module, a load switch-on switch and a data acquisition and analysis module; the output end of the program-controlled power supply is connected with the input end of the measured power supply; the output end of the measured power supply is connected with the acquisition end of the data acquisition and analysis module and the input end of the program-controlled constant current module respectively; the input end of the program-controlled power supply is connected with the first output end of the test trigger module; the acquisition feedback input end of the test trigger module is connected with the output end of the measured power supply, and the program-controlled constant current module is grounded through the load switch-on switch; the second output end of the test trigger module is connected with the load switch-on switch, and whether the program-controlled constant current module is connected with the measured power supply is controlled through the load switch-on signal. The application synchronously applies the impact current with controllable amplitude when the power supply starts to build voltage to a specific voltage threshold.

Description

Technical Field

[0001] This application belongs to the field of power supply testing technology, and in particular relates to a power supply output characteristic testing circuit, method and device during power supply startup. Background Technology

[0002] In practical applications of DC power supplies, downstream electronic devices often experience inrush currents far exceeding normal steady-state values ​​the instant the power supply begins to build up voltage and reaches its minimum operating voltage. Since the power supply is in the process of output voltage build-up at this time, this inrush current can easily cause the output voltage of the power supply under test to drop and oscillate, thereby affecting the normal startup of downstream devices.

[0003] However, most existing power supply output characteristic testing systems are based on conventional electronic load devices, making it difficult to accurately apply an inrush current to simulate the startup of downstream equipment at the moment when the power supply begins to build up voltage and the output reaches a specific voltage point. This lack of simulation of the timing and control conditions of the actual inrush current means that the testing system cannot truly reproduce the dynamic operating conditions of the power supply when it encounters an inrush load during actual startup voltage build-up. Summary of the Invention

[0004] To address the challenge of ensuring both the precise and synchronous application of a controllable inrush current while simultaneously pre-setting the duration of the inrush current and automatically shutting it off when the power supply starts up and reaches a specific voltage threshold, this application discloses a power supply startup output characteristic testing circuit, method, and apparatus.

[0005] This application discloses a power supply startup output characteristic test circuit, including a programmable power supply, a power supply under test, a programmable constant current module, a test trigger module, a load switching switch, and a data acquisition and analysis module; The output terminal of the programmable power supply is connected to the input terminal of the power supply under test; The output terminal of the power supply under test is connected to the acquisition terminal of the data acquisition and analysis module and the input terminal of the programmable constant current module, respectively. The input terminal of the programmable power supply is connected to the first output terminal of the test trigger module, and is used to receive the configuration voltage signal sent by the test trigger module to adjust the output voltage of the programmable power supply. The acquisition feedback input terminal of the test trigger module is connected to the output terminal of the power supply under test, and is used to acquire the voltage information of the power supply under test. The programmable constant current module is grounded through a load switch; the second output terminal of the test trigger module is connected to the load switch, and the load connection signal controls whether the programmable constant current module is connected to the power supply under test. The data acquisition and analysis module is used to acquire voltage information of the power supply under test during startup and load processes, and to analyze the output voltage.

[0006] Optionally, the test triggering module includes a trigger condition setting circuit and a test system controller; The trigger condition setting circuit has a first output terminal and a second output terminal; The first output terminal of the trigger condition setting circuit is connected to the input terminal of the test system controller, and is used to output action information to the test system controller; The second output terminal of the trigger condition setting circuit is connected to the control terminal of the load connection switch, and is used to output a load connection signal to the load connection switch. The trigger condition setting circuit is used to receive the voltage setting signal output by the test system controller and the collected voltage information of the power supply under test, and generate the action information. Simultaneously, the trigger condition setting circuit receives the delayed shutdown control signal output by the test system controller, and generates the load turn-on signal based on the action information and the delayed shutdown control signal; The output terminal of the test system controller is connected to the trigger condition setting circuit and the programmable constant current module, respectively. The test system controller is also used to output a current setting signal to the programmable constant current module to control the constant current amplitude of the programmable constant current module.

[0007] Optionally, the trigger condition setting circuit includes a comparator and a control unit; The first input terminal of the comparator is connected to the first output terminal of the test system controller, and is used to receive the voltage setting signal output by the test system controller; The second input terminal of the comparator is connected in parallel with the acquisition terminal of the data acquisition and analysis module to receive the acquired voltage information of the power supply under test. The comparator is used to compare the acquired voltage with a preset voltage threshold and output action information; The output of the comparator is connected to the first input of the test system controller and the control unit, respectively. The second input terminal of the control unit is connected to the second output terminal of the test system controller, and is used to receive the delayed shutdown control signal output by the test system controller; The output terminal of the control unit is connected to the control terminal of the load switch, and is used to perform AND logic processing on the signals output by the comparator and the test system controller, and then output a load connection signal.

[0008] Optionally, the programmable constant current module includes a comparator, a sampling resistor, a first driving transistor and its first current-limiting resistor, and a second driving transistor and its second current-limiting resistor; The first input terminal of the comparator is connected to the test system controller for receiving a current setting signal, and the second input terminal of the comparator is connected to the sampling feedback terminal of the sampling resistor. The output terminal of the comparator is connected to the control terminal of the first driving transistor, and the output terminal of the first driving transistor is grounded through the first current-limiting resistor; at the same time, the output terminal of the first driving transistor is connected to the control terminal of the second driving transistor for driving the second driving transistor. The second driving transistor is connected in series with the second current-limiting resistor. This series branch is then connected in series with the sampling resistor between the output terminal of the power supply under test and the load switch, forming a constant current load with programmable amplitude.

[0009] Optionally, the data acquisition and analysis module includes an analog-to-digital conversion circuit, a data buffer unit, and a data analysis unit; The analog-to-digital converter circuit is used to convert the acquired analog voltage signal of the power supply under test into a digital voltage signal. The data buffer unit is used to store digital voltage signals; The data analysis unit is used to analyze and obtain the output voltage drop amplitude, recovery time, and output oscillation during the voltage build-up process of the power supply under test based on the stored digital voltage signal.

[0010] Another aspect of this application discloses a method for testing the output characteristics during power-on, including: The test system controller outputs a configuration voltage signal to the programmable power supply, a current setting signal to the programmable constant current circuit, a voltage setting signal to the trigger condition setting circuit, and sets the delay shutdown control signal to an active state. Power is supplied to the power supply under test to start building up voltage and outputting voltage. The trigger condition setting circuit detects the output voltage of the power supply under test. When the output voltage reaches the threshold corresponding to the voltage setting signal, the load connection switch is turned on, so that the programmable constant current circuit is connected to the output terminal of the power supply under test. After the test system controller detects the trigger state, it starts timing. After the timing reaches the predetermined time, the delay shutdown control signal is set to an invalid state, and the load connection switch is turned off.

[0011] Optionally, during the entire process from supplying power to the power supply under test to start building up voltage output to disconnecting the load and turning on the switch, the data acquisition and analysis module simultaneously samples and records the output voltage of the power supply under test continuously in real time.

[0012] Optionally, the data acquisition and analysis module synchronously samples and records the output voltage of the power supply under test in real time, including: By collecting the output voltage data, we can analyze and extract the output voltage drop amplitude, recovery time, and output oscillation when the power supply under test encounters an inrush current during startup.

[0013] Optionally, the current setting signal is an analog signal. By changing the voltage amplitude of the current setting signal, the amplitude of the inrush current output by the programmable constant current circuit to the power supply under test can be programmatically adjusted.

[0014] In another aspect, this application also discloses a power-on output characteristic testing device, including the power-on output characteristic testing circuit as described above.

[0015] As described in the above technical solution, this application first uses a test trigger module to output a configuration voltage signal to the programmable power supply to pre-set the required output voltage amplitude of the power supply under test. After the power supply under test starts building up voltage, the test trigger module acquires the output voltage information of the power supply under test in real time through its acquisition feedback input terminal. When the real-time acquired voltage reaches the pre-set test threshold, the test trigger module immediately generates a control signal to drive the load connection switch on the constant current module's grounding circuit to turn on. Since the programmable constant current module has been set with a specific constant current amplitude before the test, the constant current module is directly connected to the output terminal of the power supply under test through the already turned-on load connection switch, thereby applying a known inrush current at the precise moment when the power supply builds up to the specific amplitude. When the preset timer inside the test trigger module reaches the set duration, its output causes the load connection switch to automatically turn off, disconnecting the constant current load and completing one test cycle. Throughout the entire test cycle, the data acquisition and analysis module synchronously records the output voltage of the power supply under test. In summary, the test trigger module determines the timing of current application, the load switching switch acts as the control channel for physical connection, and the programmable constant current module determines the amplitude of the inrush current, ensuring synchronization between power supply voltage build-up and the application of the inrush load. It can also directly simulate the inrush current conditions at the moment of actual downstream equipment startup, thereby solving the problem that existing tests cannot simulate inrush current at a specific moment of power supply startup. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a schematic diagram of the overall module connection structure of a power-on output characteristic test circuit provided in an embodiment of this application; Figure 2 This is a schematic diagram of the internal structure of the trigger condition setting circuit provided in the embodiments of this application; Figure 3This is a schematic diagram of the circuit structure of the programmable constant current module provided in the embodiments of this application; Figure 4 This is a schematic diagram of the internal functional unit division of the data acquisition and analysis module provided in the embodiments of this application; Figure 5 This is a schematic diagram of the process steps of a power-on output characteristic test method provided in the embodiments of this application.

[0018] Explanation of reference numerals in the attached figures: 100. Programmable power supply; 200. Power supply under test; 300. Data acquisition and analysis module; 400. Programmable constant current module; 500. Test trigger module; 510. Trigger condition setting circuit; 520. Test system controller; 600. Load connection switch. Detailed Implementation

[0019] In the following description, specific details such as particular system architectures and technologies are set forth for illustrative purposes and not limiting, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without such specific details.

[0020] This application discloses, in one aspect, a power-on output characteristic test circuit, such as... Figure 1 As shown, the system includes a programmable power supply 100, a power supply under test 200, a programmable constant current module 400, a test trigger module 500, a load switch 600, and a data acquisition and analysis module 300. The output of the programmable power supply 100 is connected to the input of the power supply under test 200. The output of the power supply under test 200 is connected to both the acquisition terminal of the data acquisition and analysis module and the input of the programmable constant current module 400. The input of the programmable power supply 100 is connected to the first output of the test trigger module 500, used to receive the configuration voltage signal sent by the test trigger module 500 to adjust the programmable constant current module 300. The power supply 100 outputs voltage; the acquisition feedback input terminal of the test trigger module 500 is connected to the output terminal of the power supply under test 200 to acquire voltage information of the power supply under test 200; the programmable constant current module 400 is grounded through the load switch 600; the second output terminal of the test trigger module 500 is connected to the load switch 600, and the load connection signal controls whether the programmable constant current module 400 is connected to the power supply under test 200; the data acquisition and analysis module is used to acquire voltage information of the power supply under test 200 during startup and load processes, and analyze the output voltage.

[0021] Specifically, the output terminal of the programmable power supply 100 is connected to the input terminal of the power supply under test 200, providing the power supply under test 200 with the electrical energy required for startup and operation. The output voltage of the programmable power supply 100 can be adjusted in real time according to the externally input adjustment signal, thereby establishing different initial voltage conditions at the input terminal of the power supply under test 200. The output terminal of the power supply under test 200 is connected to the acquisition terminal of the data acquisition and analysis module and the input terminal of the programmable constant current module 400. Through this connection, the data acquisition and analysis module can directly acquire the real-time voltage information of the power supply under test 200 during startup and load application, while the programmable constant current module 400 receives the electrical energy output by the power supply under test 200 to generate the required load current. The input terminal of the programmable power supply 100 is connected to the first output terminal of the test trigger module 500, used to receive the configuration voltage signal sent by the test trigger module 500. The test trigger module 500 adjusts the output voltage of the programmable power supply 100 through this configuration voltage signal.

[0022] For example, the test trigger module 500 also has a data acquisition feedback input terminal, which is connected to the output terminal of the power supply under test 200. This connection structure enables the test trigger module 500 to acquire the output voltage information of the power supply under test 200 in real time during the start-up voltage build-up process. The test trigger module 500 uses the real-time acquired voltage information of the power supply under test 200 as the basis for determining whether to apply an inrush current. The programmable constant current module 400 has a load switch 600 connected in series in its grounding circuit, meaning that the programmable constant current module 400 is grounded through the load switch 600. The second output terminal of the test trigger module 500 is connected to the control terminal of the load switch 600, and the test trigger module 500 controls the state of the load switch 600 by outputting a load-on signal. When the load connection signal is high, the load connection switch 600 is turned on, and the programmable constant current module 400 is connected to the output circuit of the power supply under test 200, applying a constant current load to the power supply under test 200. When the load connection signal is low, the load connection switch 600 is turned off, the electrical connection between the programmable constant current module 400 and the power supply under test 200 is disconnected, and the constant current load is removed. The data acquisition and analysis module 300 is used to record the voltage information of the power supply under test 200 in real time throughout the entire startup and load application process, and to perform various related analyses on the acquired voltage information.

[0023] In alternative implementations, such as Figure 2As shown, the test trigger module 500 includes a trigger condition setting circuit 510 and a test system controller 520; the trigger condition setting circuit 510 has a first output terminal and a second output terminal; the first output terminal of the trigger condition setting circuit 510 is connected to the input terminal of the test system controller 520, and is used to output action information to the test system controller 520; the second output terminal of the trigger condition setting circuit 510 is connected to the control terminal of the load connection switch 600, and is used to output a load connection signal to the load connection switch 600; the trigger condition setting circuit 510 is used to receive signals from the test system controller. The test system controller 520 outputs a voltage setting signal and collects voltage information from the power supply under test 200, and generates the action information. Simultaneously, the trigger condition setting circuit 510 receives a delayed shutdown control signal output by the test system controller 520, and generates the load turn-on signal based on the action information and the delayed shutdown control signal. The output terminals of the test system controller 520 are connected to both the trigger condition setting circuit 510 and the programmable constant current module 400. The test system controller 520 is also used to output a current setting signal to the programmable constant current module 400 to control the constant current amplitude of the programmable constant current module 400.

[0024] Specifically, the test trigger module 500 includes a trigger condition setting circuit 510 and a test system controller 520. The trigger condition setting circuit 510 has two independent signal output terminals: a first output terminal and a second output terminal. The first output terminal of the trigger condition setting circuit 510 is connected to the input terminal of the test system controller 520, used to output action information to the test system controller 520. After receiving the action information, the test system controller 520 performs corresponding processing based on the information content. The second output terminal of the trigger condition setting circuit 510 is connected to the control terminal of the load switch 600, used to directly output a load-on signal to the load switch 600 to control the conduction or deactivation of the load switch 600. The trigger condition setting circuit 510 itself also has two signal receiving terminals, used to receive the voltage setting signal output by the test system controller 520 and the acquired voltage information from the output terminal of the power supply under test 200, respectively. Based on these two received signals, the trigger condition setting circuit 510 generates action information through internal processing. Meanwhile, the trigger condition setting circuit 510 also receives the delayed shutdown control signal sent by the test system controller 520, and determines the validity of the load connection signal at the output terminal based on the combination of the action information and the state of the delayed shutdown control signal.

[0025] In addition to outputting voltage setting signals and delay shutdown control signals to the trigger condition setting circuit 510, the test system controller 520 also has its output terminals connected to both the trigger condition setting circuit 510 and the programmable constant current module 400. The test system controller 520 outputs a current setting signal to the programmable constant current module 400. This current setting signal is used to set the magnitude of the constant current output by the programmable constant current module 400 during operation, i.e., to control the constant current amplitude of the programmable constant current module 400.

[0026] In alternative implementations, such as Figure 3 As shown, the trigger condition setting circuit 510 includes a comparator and a control unit; the first input terminal of the comparator is connected to the first output terminal of the test system controller 520, and is used to receive the voltage setting signal output by the test system controller 520; the second input terminal of the comparator is connected in parallel with the acquisition terminal of the data acquisition and analysis module, and is used to receive the acquired voltage information of the power supply under test 200; the comparator is used to compare the acquired voltage with a preset voltage threshold and output action information; the output terminal of the comparator is connected to the first input terminal of the test system controller 520 and the first input terminal of the control unit respectively; the second input terminal of the control unit is connected to the second output terminal of the test system controller 520, and is used to receive the delayed shutdown control signal output by the test system controller 520; the output terminal of the control unit is connected to the control terminal of the load on switch 600, and is used to perform AND logic processing on the signals output by the comparator and the test system controller 520, and then output the load on signal.

[0027] In this embodiment, the trigger condition setting circuit 510 consists of a comparator and a control unit. The first input of the comparator is connected to the first output of the test system controller 520, and is used to receive the voltage setting signal output by the test system controller 520. The voltage setting signal represents a preset voltage value for applying the inrush current. The second input of the comparator is connected in parallel with the acquisition terminal of the data acquisition and analysis module, that is, the second input of the comparator is also connected to the output terminal of the power supply under test 200, so that the comparator can receive the acquired voltage information of the power supply under test 200 in real time. The function of the comparator is to compare the acquired real-time output voltage of the power supply under test 200 with the preset voltage threshold represented by the voltage setting signal. When the acquired real-time output voltage of the power supply under test 200 is less than the voltage threshold represented by the voltage setting signal, the output of the comparator outputs an invalid level, indicating that the voltage build-up level of the power supply under test 200 has not yet reached the amplitude condition for applying the inrush current. When the real-time output voltage of the power supply under test 200 is greater than the voltage threshold represented by the voltage setting signal, the output of the comparator outputs an effective level, indicating that the voltage build-up level of the power supply under test 200 has met the amplitude condition for applying the inrush current.

[0028] The comparator's output is connected to the input of the test system controller 520. The test system controller 520 uses the comparator's output signal to determine whether the current output voltage amplitude of the power supply under test 200 has exceeded a preset voltage threshold. Simultaneously, the comparator's output is also connected to the first input of the control unit. The control unit's second input is connected to the second output of the test system controller 520, used to receive the delayed shutdown control signal from the test system controller 520. The control unit itself has logic processing capabilities; in this application, AND logic processing is used for calculation. Based on the level signal output by the comparator indicating whether the voltage threshold has been crossed, and the state of the delayed shutdown control signal output by the test system controller 520, the control unit performs an AND logic operation and outputs the final load-on signal.

[0029] In this application, the comparator and control unit work together to form a dual hardware control mechanism for triggering and cutting off the application of inrush current. When the comparator detects that the output voltage of the power supply under test 200 exceeds a preset threshold, the action information output by the comparator becomes valid. This valid state triggers the test system controller 520 to start internal timing; on the other hand, since the valid state output by the comparator is input to the first input terminal of the control unit, the output of the control unit changes. It should be noted that the final output of the control unit depends on the combined state of the first and second input terminals. When the delayed shutdown control signal is valid and the action information output by the comparator is also valid, the control unit will output a valid load connection signal, thereby driving the load connection switch 600 to conduct, so that the programmable constant current module 400 is connected to the circuit of the power supply under test 200. If either the delayed shutdown control signal or the action information output by the comparator is invalid, the load connection signal output by the control unit will be invalid, and the load connection switch 600 will remain closed.

[0030] In alternative implementations, such as Figure 4 As shown, the programmable constant current module 400 includes a comparator, a sampling resistor, a first driving transistor and its first current-limiting resistor, and a second driving transistor and its second current-limiting resistor. The first input terminal of the comparator is connected to the test system controller 520 to receive a current setting signal, and the second input terminal of the comparator is connected to the sampling feedback terminal of the sampling resistor. The output terminal of the comparator is connected to the control terminal of the first driving transistor, and the output terminal of the first driving transistor is grounded through the first current-limiting resistor. At the same time, the output terminal of the first driving transistor is connected to the control terminal of the second driving transistor to drive the second driving transistor. The second driving transistor and the second current-limiting resistor are connected in series, and this series branch is then connected in series with the sampling resistor between the output terminal of the power supply under test 200 and the load switch 600 to form a constant current load with programmable amplitude.

[0031] Furthermore, the programmable constant current module 400 used in this application includes a specific circuit topology. This programmable constant current module 400 includes an operational amplifier unit for voltage comparison as a comparator, a sampling resistor for obtaining current feedback, a first driving transistor and its series-connected first current-limiting resistor, and a second driving transistor and its series-connected second current-limiting resistor. The first input terminal of the comparator is connected to the test system controller 520, receiving the current setting signal output by the test system controller 520; the second input terminal of the comparator is connected to the sampling feedback terminal of the sampling resistor, which is configured in the path of the load current, and the voltage across it reflects the magnitude of the current flowing through it. The comparator receives the current setting signal and the feedback voltage across the sampling resistor, and uses the difference between the two as a control signal to drive the control terminal of the first driving transistor.

[0032] Specifically, when the voltage amplitude of the current setting signal output by the test system controller 520 changes, the comparator adjusts the control voltage at its output accordingly. The comparator's output is connected to the control terminal of the first driving transistor, whose output is grounded through the first current-limiting resistor. Therefore, the first driving transistor will turn on or off according to the comparator's output state. The output of the first driving transistor is also connected to the control terminal of the second driving transistor. Because the conduction state of the first driving transistor determines the drive signal flowing to the control terminal of the second driving transistor, the first driving transistor is configured as the driver of the second driving transistor. The second driving transistor is connected in series with the second current-limiting resistor, and then in series with the sampling resistor between the output terminal of the power supply under test 200 and the load switch 600. This series branch constitutes a load branch capable of absorbing a constant current. When the load switch 600 is closed, the current flows sequentially through the second driving transistor, the second current-limiting resistor, and the sampling resistor. The sampling resistor acquires the current in the loop in real time and feeds it back to the second input terminal of the comparator. This closed-loop feedback mechanism enables the programmable constant current module 400 to output a constant current load with stable amplitude controlled by the voltage amplitude of the current setting signal.

[0033] For example, when the test system controller 520 outputs a current setting signal with an amplitude of V1, the comparator compares it with the voltage across the sampling resistor and generates a corresponding control level at the comparator output. After being converted by the first driving transistor, this controls the conduction level of the second driving transistor, stabilizing the voltage across the sampling resistor at the V1 level. When the test system controller 520 adjusts the voltage amplitude of the current setting signal to V2, the comparator's target reference value changes, causing the first and second driving transistors to adjust, ultimately stabilizing the voltage across the sampling resistor at the V2 level. This physical process enables the adjustability of the output current amplitude of the programmable constant current module 400.

[0034] In an optional implementation, the data acquisition and analysis module 300 includes an analog-to-digital conversion circuit, a data buffer unit, and a data analysis unit; the analog-to-digital conversion circuit is used to convert the acquired analog voltage signal of the power supply under test 200 into a digital voltage signal; the data buffer unit is used to store the digital voltage signal; and the data analysis unit is used to analyze and obtain the output voltage drop amplitude, recovery time, and output oscillation during the voltage build-up process of the power supply under test 200 based on the stored digital voltage signal.

[0035] The data acquisition and analysis module 300 in this application is responsible for processing various signals acquired during the testing process. The data acquisition and analysis module 300 includes an analog-to-digital conversion circuit, a data buffer unit, and a data analysis unit. The analog-to-digital conversion circuit converts the analog voltage signal received by the data acquisition and analysis module from the output of the power supply under test 200 into a digital voltage signal for subsequent digital circuit processing. The data buffer unit receives and stores the digital voltage signal output by the analog-to-digital conversion circuit. The storage function of the data buffer unit ensures that the voltage information recorded during the testing process is not lost and meets the needs of repeated retrieval. The data analysis unit calls the digital voltage signal stored in the data buffer unit and, according to a pre-configured analysis algorithm, analyzes and extracts specific parameters of the power supply under test 200's voltage build-up process, such as the output voltage drop amplitude, output voltage recovery time, and output oscillation when the power supply under test 200 encounters an inrush current during startup.

[0036] This application further discloses a method for testing the output characteristics during power-on, such as... Figure 5 As shown, it includes: S100: The test system controller 520 outputs a configuration voltage signal to the programmable power supply 100, outputs a current setting signal to the programmable constant current circuit, outputs a voltage setting signal to the trigger condition setting circuit 510, and sets the delay shutdown control signal to an active state. S200: Power is supplied to the power supply under test 200 to start building up voltage output. The trigger condition setting circuit 510 detects the output voltage of the power supply under test 200. When the output voltage reaches the threshold corresponding to the voltage setting signal, the load connection switch 600 is turned on, so that the programmable constant current circuit is connected to the output terminal of the power supply under test 200. After the test system controller 520 detects the trigger state, it starts timing. After the timing reaches the predetermined time, the delay shutdown control signal is set to an invalid state, and the load connection switch 600 is turned off.

[0037] Specifically, the test system controller 520 first outputs a configuration voltage signal to the programmable power supply 100, a current setting signal to the programmable constant current circuit, and a voltage setting signal to the trigger condition setting circuit 510, while also setting the delay shutdown control signal to an active state. The amplitude of the configuration voltage signal determines the supply voltage output by the programmable power supply 100 to the power supply under test 200, the current setting signal determines the amplitude of the inrush current to be output by the programmable constant current circuit, and the voltage setting signal determines the voltage threshold at which the trigger inrush current is applied. After the delay shutdown control signal is set to an active state, the second input terminal of the control unit in the trigger condition setting circuit 510 remains at a high level.

[0038] Next, the programmable power supply 100 supplies power to the power supply under test 200 according to the configured voltage signal. Upon receiving power, the power supply under test 200 begins to build up voltage, with its output voltage gradually increasing from zero. The comparator in the trigger condition setting circuit 510 continuously monitors the output voltage value of the power supply under test 200. When the output voltage value of the power supply under test 200 reaches the threshold corresponding to the voltage setting signal, the comparator's output state flips, and the action information changes from an invalid state to an active state. This action information is transmitted to the first input terminal of the control unit. Since the second input terminal of the control unit is still active, the control unit outputs a valid load connection signal based on logical operations. The load connection signal is transmitted to the control terminal of the load connection switch 600, causing the load connection switch 600 to conduct. The programmable constant current circuit is connected to the output terminal of the power supply under test 200, applying an inrush current to the power supply under test 200. Simultaneously, the test system controller 520, through real-time monitoring of the action information, detects the trigger state and begins internal timing.

[0039] As the internal timing time of the test system controller 520 reaches the predetermined duration, the test system controller 520 sets the output delayed shutdown control signal to an invalid state. The state flip of the delayed shutdown control signal causes the second input terminal of the control unit to go low. At this time, the control unit sets the load connection signal to an invalid state according to the result of the logical operation. After the load connection signal becomes invalid, the control terminal of the load connection switch 600 receives a shutdown command, the load connection switch 600 turns off, cutting off the power supply circuit of the programmable constant current circuit. The inrush current application process of the power supply under test 200 ends, and the load is disconnected from the output terminal of the power supply under test 200.

[0040] In an optional implementation, during the entire process of supplying power to the power supply under test 200 to enable the power supply under test 200 to start building up voltage output until the load disconnection switch 600 is reached, the data acquisition and analysis module 300 simultaneously samples and records the output voltage of the power supply under test 200 in real time.

[0041] Specifically, throughout the entire test cycle, from the time the programmable power supply 100 supplies power to the power supply under test 200, the power supply under test 200 begins to build up voltage, until the load switching switch 600 is turned off, the data acquisition and analysis module 300 synchronously samples and records the output voltage of the power supply under test 200 in real time. This synchronous acquisition method ensures that the acquired voltage data can establish a temporal correspondence with each stage of the power supply startup process and the inrush current application process, thereby recording the changes in the output voltage of the power supply under test 200 after being affected by the inrush current at each specific moment when the power supply under test 200 builds up voltage.

[0042] In an optional implementation, the data acquisition and analysis module 300 synchronously and continuously samples and records the output voltage of the power supply under test 200 in real time, including: By analyzing the collected output voltage data, the amplitude of the output voltage drop, the recovery time, and the output oscillation of the power supply under test 200 when it encounters an inrush current during startup can be extracted. After acquisition and recording, the data acquisition and analysis module 300 processes the synchronously recorded output voltage data. Specifically, by analyzing the acquired output voltage data, key physical parameters of the power supply under test 200 when encountering an inrush current during startup can be extracted. These parameters include, but are not limited to, the output voltage drop amplitude, recovery time, and output oscillation. The output voltage drop amplitude reflects the degree to which the inrush current pulls down the output voltage of the power supply under test 200; the recovery time reflects the time required for the power supply under test 200 to adjust back to the target voltage after encountering an inrush current; and the output oscillation reflects the fluctuation characteristics generated by the internal closed-loop control of the power supply under test 200 during dynamic adjustments. By analyzing these parameters, users can effectively evaluate the dynamic response capability of the power supply under test 200 to load impacts in practical application scenarios.

[0043] In an optional implementation, the current setting signal is an analog signal. By changing the voltage amplitude of the current setting signal, the amplitude of the inrush current output by the programmable constant current circuit to the power supply 200 under test can be programmatically adjusted.

[0044] Specifically, the current setting signal in this application is configured as an analog signal. The voltage amplitude of this analog signal corresponds to the amplitude of the inrush current output by the programmable constant current circuit. By changing the voltage amplitude of this current setting signal, stepless programmable adjustment of the inrush current amplitude output by the programmable constant current circuit to the power supply 200 under test can be achieved. This method of setting the constant current amplitude using an analog signal allows for direct control of the constant current source composed of a comparator and a drive circuit using a simple output voltage control method.

[0045] In another aspect, this application discloses a power-on output characteristic testing device, including the power-on output characteristic testing circuit as described above.

[0046] Based on the same principle, specific embodiments of the device in this application can be found in the specific implementation of the method, and this application does not limit them.

[0047] In traditional testing methods, operators often need to use external electronic load devices and manually control the application time of the load when the power supply under test 200 is turned on. In this conventional operation, it is often difficult to establish an automatic linkage between the load connection and the specific moment of power supply voltage build-up. This is because the load connection timing control depends on the operation and intervention of external personnel, which easily leads to a time misalignment between the load connection time and the arrival time of a specific voltage amplitude during the power supply voltage build-up process. This application introduces a comparator and a control unit into the trigger condition setting circuit 510. This application utilizes the timing function of the test system controller 520 to achieve controllability of the load connection duration. This control mechanism, which combines hardware triggering and timed shutdown, allows the specific timing and duration of load connection to be automatically completed according to the set parameters. Furthermore, the constant current source circuit in its overall circuit structure uses a negative feedback structure of the sampling resistor to ensure the stability of the inrush current amplitude.

[0048] In this embodiment, the load switching switch 600 described above can employ various high-power semiconductor switching devices, such as power MOSFETs or insulated-gate bipolar transistors. This application is not limited to these. The first and second driving transistors described above can also be NPN or PNP transistors, or N-channel or P-channel MOSFETs. The specific type can be selected according to the actual needs of the circuit design and the required power level.

[0049] In specific examples, such as Figure 4As shown, in the circuit topology of the above-mentioned programmable constant current module 400, the first input terminal of comparator U1 receives the current setting signal. In actual use, comparator U1 is an operational amplifier. One end of sampling resistor R3 is connected between the second driving transistor Q2 and the current loop ground terminal, and the other end of sampling resistor R3 is connected to the second driving transistor Q2. The second input terminal of comparator U1 is directly connected to one end of sampling resistor R3 to obtain the voltage across sampling resistor R3. The output terminal of comparator U1 is connected to the control terminal of the first driving transistor Q1. The first terminal of the first driving transistor Q1 is grounded through the current-limiting resistor R1, and the second terminal of the first driving transistor Q1 is connected to the control terminal of the second driving transistor Q2. When the constant current set by the current setting signal flows through sampling resistor R3, comparator U1 automatically adjusts its output voltage according to the feedback voltage. After buffering and power amplification by the first driving transistor Q1, the conduction level of the second driving transistor Q2 is controlled, so that the current through sampling resistor R3 always remains at the constant value set by the current setting signal.

[0050] Furthermore, the control unit in the trigger condition setting circuit 510 is implemented using AND logic gates. For example... Figure 3 As shown, in the specific circuit connection, the output of comparator U2 is connected to the first input of the AND gate, and the delayed shutdown control signal output by the test system controller 520 is connected to the second input of the AND gate. The output of the AND gate is the second output of the trigger condition setting circuit 510. In practical applications, this AND gate can be implemented using a two-input AND gate integrated circuit or a discrete AND gate circuit built with a single diode or transistor. When the acquired voltage information is lower than the amplitude of the voltage setting signal, comparator U2 outputs a low level, the AND gate outputs a low level, and the control terminal of the load connection switch 600 receives an invalid signal. When the acquired voltage information reaches or exceeds the amplitude of the voltage setting signal, the output of comparator U2 flips to a high level. At this time, both inputs of the AND gate are high, its output becomes high, outputting a valid load connection signal, thereby controlling the load connection switch 600 to conduct. Once the test system controller 520 reaches the predetermined time, its delayed shutdown control signal flips from high to low, causing the second input of the logic gate to go low, and its output to flip to low, thus shutting down the load switch 600. The operation information of comparator U2 is also sent to the interrupt trigger input of the test system controller 520, which uses this trigger signal to start the timer.

[0051] In this embodiment, the data acquisition and analysis module 300 continuously and in real-time acquires the output voltage of the power supply under test 200. Its acquisition frequency can be configured according to the frequency of voltage fluctuations in the output voltage of the power supply under test 200. To fully reflect all voltage information during the voltage build-up process of the power supply under test 200, the data acquisition frequency is configured to be no less than twice the highest frequency of the output response of the power supply under test 200, thereby satisfying the requirements of the Nyquist sampling theorem and preventing analysis bias caused by signal aliasing during acquisition.

[0052] Furthermore, those skilled in the art will understand that the specific numerical values ​​and implementation methods described in the above-described embodiments are merely illustrative of the technical content of this application and should not be construed as limiting the scope of protection of this application. This application is not limited thereto. The various embodiments in this specification are described in a progressive manner. Similar or identical parts between embodiments can be referred to interchangeably. Each embodiment focuses on describing the differences from other embodiments. In particular, the system embodiments are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions in the method embodiments.

[0053] The above description is merely an embodiment of this application and is not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A power supply startup output characteristic test circuit, characterized in that, It includes a programmable power supply, a power supply under test, a programmable constant current module, a test trigger module, a load switching switch, and a data acquisition and analysis module; The output terminal of the programmable power supply is connected to the input terminal of the power supply under test; The output terminal of the power supply under test is connected to the acquisition terminal of the data acquisition and analysis module and the input terminal of the programmable constant current module, respectively. The input terminal of the programmable power supply is connected to the first output terminal of the test trigger module, and is used to receive the configuration voltage signal sent by the test trigger module to adjust the output voltage of the programmable power supply. The acquisition feedback input terminal of the test trigger module is connected to the output terminal of the power supply under test, and is used to acquire the voltage information of the power supply under test. The programmable constant current module is grounded through a load switch; the second output terminal of the test trigger module is connected to the load switch, and the load connection signal controls whether the programmable constant current module is connected to the power supply under test. The data acquisition and analysis module is used to acquire voltage information of the power supply under test during startup and load processes, and to analyze the output voltage.

2. The power-on output characteristic test circuit according to claim 1, characterized in that, The test triggering module includes a trigger condition setting circuit and a test system controller; The trigger condition setting circuit has a first output terminal and a second output terminal; The first output terminal of the trigger condition setting circuit is connected to the input terminal of the test system controller, and is used to output action information to the test system controller; The second output terminal of the trigger condition setting circuit is connected to the control terminal of the load connection switch, and is used to output a load connection signal to the load connection switch. The trigger condition setting circuit is used to receive the voltage setting signal output by the test system controller and the collected voltage information of the power supply under test, and generate the action information. Simultaneously, the trigger condition setting circuit receives the delayed shutdown control signal output by the test system controller, and generates the load turn-on signal based on the action information and the delayed shutdown control signal; The output terminal of the test system controller is connected to the trigger condition setting circuit and the programmable constant current module, respectively. The test system controller is also used to output a current setting signal to the programmable constant current module to control the constant current amplitude of the programmable constant current module.

3. The power-on output characteristic test circuit according to claim 2, characterized in that, The trigger condition setting circuit includes a comparator and a control unit; The first input terminal of the comparator is connected to the first output terminal of the test system controller, and is used to receive the voltage setting signal output by the test system controller; The second input terminal of the comparator is connected in parallel with the acquisition terminal of the data acquisition and analysis module to receive the acquired voltage information of the power supply under test. The comparator is used to compare the acquired voltage with a preset voltage threshold and output action information; The output of the comparator is connected to the first input of the test system controller and the control unit, respectively. The second input terminal of the control unit is connected to the second output terminal of the test system controller, and is used to receive the delayed shutdown control signal output by the test system controller; The output terminal of the control unit is connected to the control terminal of the load switch, and is used to perform AND logic processing on the signals output by the comparator and the test system controller, and then output a load connection signal.

4. The power-on output characteristic test circuit according to claim 1, characterized in that, The programmable constant current module includes a comparator, a sampling resistor, a first driving transistor and its first current-limiting resistor, and a second driving transistor and its second current-limiting resistor. The first input terminal of the comparator is connected to the test system controller for receiving a current setting signal, and the second input terminal of the comparator is connected to the sampling feedback terminal of the sampling resistor. The output terminal of the comparator is connected to the control terminal of the first driving transistor, and the output terminal of the first driving transistor is grounded through the first current-limiting resistor; at the same time, the output terminal of the first driving transistor is connected to the control terminal of the second driving transistor for driving the second driving transistor. The second driving transistor is connected in series with the second current-limiting resistor. This series branch is then connected in series with the sampling resistor between the output terminal of the power supply under test and the load switch, forming a constant current load with programmable amplitude.

5. The power-on output characteristic test circuit according to claim 1, characterized in that, The data acquisition and analysis module includes an analog-to-digital conversion circuit, a data buffer unit, and a data analysis unit; The analog-to-digital converter circuit is used to convert the acquired analog voltage signal of the power supply under test into a digital voltage signal. The data buffer unit is used to store digital voltage signals; The data analysis unit is used to analyze and obtain the output voltage drop amplitude, recovery time, and output oscillation during the voltage build-up process of the power supply under test based on the stored digital voltage signal.

6. A method for testing the output characteristics of a power supply during startup, characterized in that, include: The test system controller outputs a configuration voltage signal to the programmable power supply, a current setting signal to the programmable constant current circuit, a voltage setting signal to the trigger condition setting circuit, and sets the delay shutdown control signal to an active state. Power is supplied to the power supply under test to start building up voltage and outputting voltage. The trigger condition setting circuit detects the output voltage of the power supply under test. When the output voltage reaches the threshold corresponding to the voltage setting signal, the load connection switch is turned on, so that the programmable constant current circuit is connected to the output terminal of the power supply under test. After the test system controller detects the trigger state, it starts timing. After the timing reaches the predetermined time, the delay shutdown control signal is set to an invalid state, and the load connection switch is turned off.

7. The power supply startup output characteristic test method according to claim 6, characterized in that, Throughout the entire process from supplying power to the power supply under test, causing it to start building up voltage, to disconnecting the load and turning on the switch, the data acquisition and analysis module continuously samples and records the output voltage of the power supply under test in real time.

8. The power supply startup output characteristic test method according to claim 7, characterized in that, The data acquisition and analysis module synchronously samples and records the output voltage of the power supply under test in real time, including: By collecting the output voltage data, we can analyze and extract the output voltage drop amplitude, recovery time, and output oscillation when the power supply under test encounters an inrush current during startup.

9. The power supply startup output characteristic test method according to claim 6, characterized in that, The current setting signal is an analog signal. By changing the voltage amplitude of the current setting signal, the amplitude of the inrush current output by the programmable constant current circuit to the power supply under test can be programmatically adjusted.

10. A device for testing the output characteristics during power-on, characterized in that, Includes the power-on output characteristic test circuit as described in any one of claims 1-5.

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