A method, device and medium for predicting the impact current resistance of a pressure-sensitive resistor of an electric energy meter

Abstract

The application discloses a kind of electric energy meter varistor withstand impact current capacity prediction method, equipment and medium, the electric energy meter varistor withstand impact current capacity prediction method includes: S1: extracting current and times data in varistor specification book;S2: select four-parameter logistic model to carry out resistant times data fitting, and obtain corresponding fitting expression;S3: check fitting result, based on the fitting expression obtained in step S2, complete corresponding expression calculation accuracy verification;S4: using experimental or simulated method, obtain the current of each voltage and each angle varistor, and obtain impact times data;S5: calculate varistor consumption life.

Description

Technical Field

[0001] This application belongs to the technical field of predicting the ability of a varistor to withstand surge current, and particularly relates to a method, device and medium for predicting the ability of a varistor in an energy meter to withstand surge current. Background Technology

[0002] Varistors are widely used in electricity meters for surge protection. Current varistor selection methods rely on experience. When surge levels change or the installation environment becomes complex, there is no accurate model to predict the varistor's performance, leading to improper selection or over-design.

[0003] Existing varistor datasheets provide standard test cycles, which are limited in data. Standard withstand voltage tests increase progressively from 1000V to 2000V, 4000V, and 6000V, with each cycle requiring testing at four angles: 0°, 90°, 180°, and 270°. This results in varying current withstand capabilities for the varistor at different voltages and angles. Whether the current withstand capability and maximum number of cycles for various combinations are sufficient remains to be determined. Summary of the Invention

[0004] The purpose of this application is to overcome the problems of the prior art by disclosing a method, device and medium for predicting the withstand current capability of a voltage meter varistor.

[0005] On the one hand, the objective of this application is achieved through the following technical solution: A method for predicting the surge current withstand capability of a varistor in an energy meter, the method comprising: S1: Extract the current and cycle data from the varistor's datasheet; S2: Select a four-parameter logistic model to fit the tolerance test data and obtain the corresponding fitting expression; S3: Verify the fitting results. Based on the fitting expression obtained in step S2, verify the accuracy of the corresponding expression calculation. S4: Using experimental or simulation methods, obtain the current flowing through the varistor at each voltage and angle, and obtain the number of impacts data; S5: Calculate the lifespan of the varistor.

[0006] According to a preferred embodiment, the data obtained in step S1 consists of at least four points, denoted as (X1, Y1), (X2, Y2), (X3, Y3), and (X4, Y4), where X1, X2, X3, and X4 represent current data, and Y1, Y2, Y3, and Y4 represent the number of times the device has been subjected to current.

[0007] According to a preferred embodiment, the four-parameter logistic model in step S2 is:

[0008] Where Y represents the number of withstand cycles, X represents the inrush current, A represents the number of withstand cycles when the current is extremely small, B represents the number of withstand cycles when the current is very large, C represents the number of withstand cycles when the current is at an intermediate value, and D represents the slope factor.

[0009] According to a preferred embodiment, in step S4, the obtained currents are denoted as I1, I2, I3…In, and the number of impacts of each current is denoted as t1, t2, t3…tn.

[0010] According to a preferred embodiment, step S5 includes: obtaining the fitted expression based on step S2, and completing the calculation of the tolerance limit of each current corresponding to the varistor in step S4, wherein the tolerance limit corresponding to each current is denoted as T1, T2, T3...Tn.

[0011] According to a preferred embodiment, in step S5, the lifespan L of the varistor has been consumed. 消耗 for:

[0012] If L 消耗 If L is greater than 1, the varistor can no longer withstand the combined current; if L 消耗 If the value is less than 1, the varistor can withstand the combined current.

[0013] On the other hand, this application also discloses: An electronic device includes: at least one processor; and a memory communicatively connected to said at least one processor; The memory stores instructions that can be executed by the at least one processor, and the at least one processor executes the instructions stored in the memory to perform the aforementioned method.

[0014] On the other hand, this application also discloses: A computer-readable storage medium for storing instructions that, when executed, cause the aforementioned method to be implemented.

[0015] The aforementioned main solution and its various further alternative solutions can be freely combined to form multiple solutions, all of which are solutions that can be adopted and are claimed in this application. Those skilled in the art, after understanding the solution of this application, will realize that there are many combinations based on the prior art and common general knowledge, all of which are technical solutions to be protected in this application, and will not be exhaustively listed here.

[0016] The beneficial effects of this application are: The method for predicting the surge current withstand capability of the varistor in the energy meter, as described in this application, can accurately predict the withstand limit and remaining life under different surge voltage and combined voltage conditions, guiding the selection of varistors and choosing the most suitable varistor to cope with complex field conditions. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the method for predicting the inrush current withstand capability of the varistor of the energy meter in this application; Figure 2 This is a schematic diagram of the equipment structure in this application. Detailed Implementation

[0018] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. This application can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, unless otherwise specified, the following embodiments and features in the embodiments can be combined with each other.

[0019] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0020] In the description of this application, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of this application is in use. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this application. In addition, the terms "first," "second," and "third," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0021] Furthermore, terms such as "horizontal," "vertical," and "sag" do not imply that components must be absolutely horizontal or suspended, but rather that they can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal relative to "vertical," and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0022] In the description of this application, it should also be noted that, unless otherwise expressly specified and limited, the terms "set up," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0023] Furthermore, it should be noted that unless otherwise specified in this application, the specific structures, connections, positions, power sources, etc. involved are all things that a person skilled in the art can know without creative effort based on the prior art.

[0024] Example 1 refer to Figure 1 As shown in the figure, this embodiment discloses a method for predicting the inrush current tolerance capability of a power meter varistor. The method for predicting the inrush current tolerance capability of a power meter varistor includes the following steps.

[0025] Step S1: Extract the current and cycle data from the varistor's datasheet.

[0026] Preferably, the data obtained in step S1 consists of at least four points, denoted as (X1, Y1), (X2, Y2), (X3, Y3), and (X4, Y4), where X1, X2, X3, and X4 represent current data, and Y1, Y2, Y3, and Y4 represent the number of times the device has been subjected to current.

[0027] Step S2: Select a four-parameter logistic model to fit the tolerance test data and obtain the corresponding fitting expression.

[0028] Preferably, the four-parameter logistic model in step S2 is:

[0029] Where Y represents the number of withstand cycles, X represents the inrush current, A represents the number of withstand cycles when the current is extremely small, B represents the number of withstand cycles when the current is very large, C represents the number of withstand cycles when the current is at an intermediate value, and D represents the slope factor.

[0030] Step S3: Verify the fitting results. Based on the fitting expression obtained in step S2, verify the accuracy of the corresponding expression calculation.

[0031] That is, based on the obtained fitted expression, a real-world scenario verification is performed to determine whether the fitted expression can be used to calculate the withstand cycles of the corresponding type of varistor.

[0032] Step S4: Using experimental or simulation methods, obtain the current flowing through the varistor at each voltage and angle, and obtain the number of impacts data.

[0033] Preferably, in step S4, the obtained currents are denoted as I1, I2, I3…In, and the number of impacts of each current is denoted as t1, t2, t3…tn.

[0034] Step S5: Calculate the lifespan of the varistor.

[0035] Preferably, step S5 includes: obtaining the fitted expression based on step S2, and completing the calculation of the tolerance limit of each current corresponding to the varistor in step S4, with the tolerance limit corresponding to each current denoted as T1, T2, T3...Tn.

[0036] Further, in step S5, the lifespan L of the varistor has been consumed. 消耗 for:

[0037] If L 消耗 If L is greater than 1, the varistor can no longer withstand the combined current; if L 消耗 If the value is less than 1, the varistor can withstand the combined current.

[0038] Based on the method of this application, an analysis of a certain type A pressure sensor was conducted, the specific process of which includes: (1) Extract the core current and cycle data from the A-type varistor specification sheet, including: (5000, 15), (1500, 100), (700, 1000), (300, 1000).

[0039] (2) The fitting formula for type A pressure sensor is:

[0040] (3) Based on the obtained fitting formula, the fitting results are verified. The verification results are shown in Table 1.

[0041] Table 1

[0042] The fitting results are highly accurate and can be used to predict the number of times a varistor will be subjected to combined current surges and the percentage of its remaining lifespan.

[0043] (4) The lifespan of the varistor is completed, as shown in Table 2.

[0044] Table 2

[0045] That is, for the A-type varistor, applied to a single-phase energy meter, in the 6KV surge test experiment, the surge current, surge number and consumption percentage of the varistor are shown in Table 1. The varistor has consumed 93% of its lifespan, and there is still 7% of its lifespan remaining.

[0046] Example 2 like Figure 2 As shown in Embodiment 1, this embodiment also discloses an electronic device, including: at least one processor; and a memory communicatively connected to the at least one processor; the specific connection medium between the processor and the memory is not limited in this embodiment.

[0047] Figure 2 This example illustrates the connection between the processor and memory via a bus. The bus... Figure 2 The connections between other components are shown in thick lines for illustrative purposes only and should not be construed as limiting. Buses can be categorized into address buses, data buses, control buses, etc., but for ease of representation, [the specific bus type is not shown here]. Figure 2 A single thick line is used to represent a processor, but this does not mean there is only one bus or one type of bus. Alternatively, a processor can also be called a controller; there is no restriction on the name.

[0048] In this embodiment, the memory stores instructions executable by the at least one processor. By executing the instructions stored in the memory, the at least one processor performs the method described in Embodiment 1. The processor can implement... Figure 2 The functions of each module in the device are shown.

[0049] The processor is the control center of the device. It can connect to various parts of the control device through various interfaces and lines, and can run or execute instructions stored in memory and call data stored in memory.

[0050] In an alternative design, the processor may include one or more processing units. The processor may integrate an application processor and a modem processor, wherein the application processor primarily handles the operating system, user interface, and applications, while the modem processor primarily handles wireless communication. It is understood that the modem processor may also not be integrated into the processor. In some embodiments, the processor and memory may be implemented on the same chip; in some embodiments, they may also be implemented separately on separate chips.

[0051] The processor can be a general-purpose processor, such as a CPU, digital signal processor, application-specific integrated circuit, field-programmable gate array or other programmable logic device, discrete gate or transistor logic device, or discrete hardware component, capable of implementing or executing the methods, steps, and logic block diagrams disclosed in the embodiments of this invention. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the method for predicting the surge current withstand capability of a varistor in an energy meter disclosed in the embodiments of this invention can be directly manifested as being executed by a hardware processor, or executed by a combination of hardware and software modules within the processor.

[0052] Memory, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs, non-volatile computer-executable programs, and modules. Memory can include at least one type of storage medium, such as flash memory, hard disk, multimedia card, card-type memory, random access memory (RAM), static random access memory (SRAM), programmable read-only memory (PROM), read-only memory (ROM), and electrically erasable programmable read-only memory (EPROM). Only memory (EEPROM), magnetic storage, magnetic disks, optical disks, etc. A memory is any other medium capable of carrying or storing desired program code in the form of instructions or data structures, and accessible by a computer, but is not limited thereto. The memory in embodiments of this invention can also be a circuit or any other device capable of performing storage functions for storing program instructions and / or data.

[0053] By designing and programming the processor, the code corresponding to the method for predicting the surge current withstand capability of a varistor in an energy meter as described in the foregoing embodiments can be embedded into the chip, enabling the chip to execute the steps of the method described in the foregoing embodiments during operation. How to design and program the processor is a technique well-known to those skilled in the art and will not be elaborated upon here.

[0054] Example 3 Based on Embodiment 1, this embodiment also discloses: a computer-readable storage medium for storing instructions that, when executed, cause the method described in Embodiment 1 to be implemented.

[0055] In some alternative embodiments, the present invention also provides that various aspects of the method for predicting the inrush current withstand capability of a varistor in an energy meter can also be implemented in the form of a program product comprising program code that, when the program product is run on a device, causes the control device to perform the steps in the method for predicting the inrush current withstand capability of a varistor in an energy meter according to various exemplary embodiments of the present invention as described above.

[0056] It should be noted that although several units or sub-units of the apparatus have been mentioned in the detailed description above, this division is merely exemplary and not mandatory. In fact, according to embodiments of the invention, the features and functions of two or more units described above can be embodied in one unit. Conversely, the features and functions of one unit described above can be further divided and embodied by multiple units. Furthermore, although the operation of the method of the invention is described in a specific order in the drawings, this does not require or imply that these operations must be performed in that specific order, or that all the operations shown must be performed to achieve the desired result. Additionally or alternatively, certain steps may be omitted, multiple steps may be combined into one step, and / or one step may be broken down into multiple steps.

[0057] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can be implemented in one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROMs) containing computer-usable program code. The form of a computer program product implemented on ROM, optical memory, etc.

[0058] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a server, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0059] Program code for performing the operations of this invention can be written using any combination of one or more programming languages, including object-oriented programming languages ​​such as Java and C++, as well as conventional procedural programming languages ​​such as C or similar languages. The program code can be executed entirely on the user's computing device, partially on the user's device, as a standalone software package, partially on the user's computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0060] In cases involving remote computing devices, the remote computing device can be connected to the user's computing device via any type of network, including a local area network (LAN) or a wide area network (WAN), or it can be connected to an external computing device (e.g., via the Internet using an Internet service provider).

[0061] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0062] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

Claims

1. A method for predicting the withstand current capability of a voltage regulator in an energy meter, characterized in that, The method for predicting the inrush current withstand capability of the varistor in the energy meter includes: S1: Extract the current and cycle data from the varistor's datasheet; S2: Select a four-parameter logistic model to fit the tolerance test data and obtain the corresponding fitting expression; S3: Verify the fitting results. Based on the fitting expression obtained in step S2, verify the accuracy of the corresponding expression calculation. S4: Using experimental or simulation methods, obtain the current flowing through the varistor at each voltage and angle, and obtain the number of impacts data; S5: Calculate the lifespan of the varistor.

2. The method for predicting the withstand surge current capability of a varistor in an energy meter as described in claim 1, characterized in that, The data obtained in step S1 consists of at least four points, denoted as (X1, Y1), (X2, Y2), (X3, Y3), and (X4, Y4), where X1, X2, X3, and X4 represent current data, and Y1, Y2, Y3, and Y4 represent the number of times the device has been subjected to current.

3. The method for predicting the withstand surge current capability of a varistor in an energy meter as described in claim 2, characterized in that, The four-parameter logistic model in step S2 is as follows: Where Y represents the number of withstand cycles, X represents the inrush current, A represents the number of withstand cycles when the current is extremely small, B represents the number of withstand cycles when the current is very large, C represents the number of withstand cycles when the current is at an intermediate value, and D represents the slope factor.

4. The method for predicting the withstand surge current capability of a varistor in an energy meter as described in claim 3, characterized in that, In step S4, the obtained currents are denoted as I1, I2, I3…In, and the number of impacts of each current is denoted as t1, t2, t3…tn.

5. The method for predicting the withstand surge current capability of a varistor in an energy meter as described in claim 4, characterized in that, Step S5 includes: obtaining the fitted expression based on step S2, and completing the calculation of the tolerance limit of each current corresponding to the varistor in step S4. The tolerance limit corresponding to each current is denoted as T1, T2, T3...Tn.

6. The method for predicting the withstand surge current capability of a varistor in an energy meter as described in claim 5, characterized in that, Step S5, the lifespan L of the varistor has been consumed. 消耗 for: If L 消耗 If L is greater than 1, the varistor can no longer withstand the combined current; if L 消耗 If the value is less than 1, the varistor can withstand the combined current.

7. An electronic device, characterized in that, include: At least one processor; and a memory communicatively connected to the at least one processor; The memory stores instructions executable by the at least one processor, which executes the instructions stored in the memory to perform the method as described in any one of claims 1 to 6.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium is used to store instructions that, when executed, cause the method as described in any one of claims 1 to 6 to be implemented.

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