Optical module testing system and parallel testing method

Abstract

The application belongs to the technical field of optical communication and specifically relates to an optical module testing system and a parallel testing method, which comprises a first error code meter, a second error code meter, a first matrix optical switch, a second matrix optical switch and a digital communication analyzer; the first error code meter is connected with the first matrix optical switch; the first matrix optical switch is connected to the RX end of a measured optical module; the second error code meter is respectively connected to the RX end and the TX end of the measured optical module; the second matrix optical switch is connected to the TX end of the measured optical module; and the digital communication analyzer is connected with the second matrix optical switch. The application can improve testing efficiency, reduce investment cost and reduce the replacement cost of production loss parts.

Description

Technical Field

[0001] This invention belongs to the technical field of optical communication, specifically relating to an optical module testing system and a parallel testing method. Background Technology

[0002] In the production process of optical modules, the performance testing of TX (transmitter) and RX (receiver) is a crucial step. Traditional optical module testing methods separate TX and RX testing into two independent processes, which are performed sequentially. In manual production, two separate workstations are needed to perform the relevant testing and production; in automated production, separate robotic arms are required for each process.

[0003] During TX-end testing, the bit error rate analyzer generates / sends an SSPRQ signal to the TX end of the optical module under test. After the optical module emits the optical signal, it passes through devices such as an optical switch and a CDR before entering the DCA to measure various parameters of the optical signal, such as eye diagram and extinction ratio. In automated production lines, a robotic arm is configured to perform relevant end-face inspections, end-face cleaning, and optical module insertion / removal operations for TX-end testing.

[0004] For RX-end testing, a bit error rate (BER) tester is used to generate signals with specific rules (e.g., PRBS31Q encoding) and send them to the RX end of the optical module under test. The BER tester calculates the bit error rate and other metrics for each channel of the optical module by comparing the received signals with its own transmitted signals. Similarly, on automated production lines, specialized robotic arms are needed to perform end-face inspections, cleaning, and optical module insertion / removal operations related to RX-end testing on automated production lines.

[0005] Furthermore, separating TX and RX testing into two processes not only increases production and commissioning time, but also increases the risk of fiber optic connector contamination due to the additional insertion and removal of connectors, thus accelerating connector replacement frequency. This increased frequency of internal module connector replacement in the bit error rate tester leads to decreased efficiency and increased production costs.

[0006] In summary, the traditional method of testing the TX and RX ends of optical modules separately has problems such as long debugging time, low production efficiency, large equipment investment, and increased testing procedures. These problems restrict the acceleration of optical module production capacity, increase the probability of introducing external particulate contamination during debugging and testing, and accelerate the replacement frequency of consumable parts. A new testing method is needed to solve these problems. Summary of the Invention

[0007] This application discloses an optical module testing system and parallel testing method, which can improve testing efficiency, reduce investment costs, and reduce replacement costs of production consumables.

[0008] The first aspect of this application discloses an optical module testing system, including: a first bit error rate tester, a second bit error rate tester, a first matrix optical switch, a second matrix optical switch, and a digital communication analyzer; The first bit error rate tester is connected to the first matrix optical switch; The first matrix optical switch is connected to the RX terminal of the optical module under test; The second bit error rate tester is connected to the RX and TX terminals of the optical module under test, respectively. The second matrix optical switch is connected to the TX terminal of the optical module under test; The digital communication analyzer is connected to the second matrix optical switch.

[0009] As an optional implementation, in the first aspect of the present application, an optical attenuator is provided between the first bit error rate tester and the first matrix optical switch, the first bit error rate tester is connected to the input terminal of the optical attenuator, and the output terminal of the optical attenuator is connected to the first matrix optical switch.

[0010] As an optional implementation, in the first aspect of the embodiments of this application, the optical module testing system further includes an optical splitter and a clock recovery unit. The second matrix optical switch is connected to the input terminal of the optical splitter, the clock recovery unit is connected to one output terminal of the optical splitter and the digital communication analyzer, and the digital communication analyzer is connected to the other output terminal of the optical splitter.

[0011] As an optional implementation, in the first aspect of the embodiments of this application, the optical module testing system further includes a first connector and a second connector, wherein the first connector and the second connector are respectively connected to the first matrix optical switch, the input terminal of the second bit error rate tester, the output terminal of the second bit error rate tester, and the second matrix optical switch.

[0012] The second aspect of this application discloses a parallel testing method for optical modules, based on the optical module testing system disclosed in the first aspect of this application, including the following steps: A first test path and a second test path are established through the first matrix optical switch and the second matrix optical switch; In the first test path, the first bit error rate tester is controlled to send a first test signal to the RX terminal of the optical module under test, and the second bit error rate tester is controlled to analyze the first output signal from the RX terminal of the optical module under test to obtain the first performance parameter. In the second test path, the second bit error rate tester is controlled to send a second test signal to the TX terminal of the optical module under test, and the digital communication analyzer is controlled to analyze the second output signal from the TX terminal of the optical module under test to obtain the second performance parameter.

[0013] As an optional implementation, in the second aspect of the embodiments of this application, the establishment of the parallel first test path and the second test path specifically includes: Control the first matrix optical switch to connect the output terminal of the first bit error rate tester to the RX terminal of the optical module under test; Control the second matrix optical switch to connect the TX terminal of the optical module under test to the first input terminal of the digital communication analyzer.

[0014] As an optional implementation, in a second aspect of the embodiments of this application, the method further includes: Before starting the test, set the first transmission parameters of the first bit error rate meter; Set the first receiving parameters of the second bit error rate meter to correspond to the first transmitting parameters, and set the second transmitting parameters of the second bit error rate meter; The second receiving parameter of the digital communication analyzer is set to correspond to the second transmitting parameter.

[0015] As an optional implementation, in the second aspect of the embodiments of this application, the method is automatically executed by a test controller, which is used to control the switching of the first matrix optical switch and the second matrix optical switch, as well as to control the startup, parameter setting and data acquisition of the first bit error rate meter, the second bit error rate meter and the digital communication analyzer.

[0016] As an optional implementation, in the second aspect of the embodiments of this application, the test system further includes an optical splitter and a clock recovery unit; the second matrix optical switch connects the optical signal output from the TX terminal of the optical module under test to one path directly to the first input terminal of the digital communication analyzer, and the other path to the input terminal of the optical splitter; one output terminal of the optical splitter is connected to the input terminal of the clock recovery unit, and the output terminal of the clock recovery unit is connected to the second input terminal of the digital communication analyzer; the other output terminal of the optical splitter is connected to the third input terminal of the digital communication analyzer. In the second test path, the digital communication analyzer is configured to: select the signal of the first input terminal or the third input terminal as the analysis object, and use the clock signal provided by the clock recovery unit as the trigger reference to perform eye diagram analysis to obtain the second performance parameter; and / or measure the direct output optical power of the TX terminal through the first input terminal.

[0017] As an optional implementation, in the second aspect of the embodiments of this application, the optical module testing system further includes a first connector and a second connector, wherein the first connector and the second connector are respectively connected to the first matrix optical switch, the input terminal of the second bit error rate tester, the output terminal of the second bit error rate tester, and the second matrix optical switch; Insert the optical module under test into the first connector, control the first matrix optical switch and the second matrix optical switch to switch the link under test to the first connector, and start the corresponding test operation; While waiting for the test, clean the end face of the optical fiber in the second connector, and insert the other optical module under test into the second connector. Once the test of one of the optical modules under test is completed, the first matrix optical switch and the second matrix optical switch are controlled to switch the link under test to the second connector to start the next round of debugging and testing; Based on the test results, qualified optical modules are moved from the first connector to the next production process station, while unqualified optical modules are moved to the unqualified product placement area.

[0018] Compared with related technologies, the embodiments of this application have the following beneficial effects: This invention employs a synchronous TX and RX testing architecture. A bit error rate (BER) tester sends PRBS31Q encoding, which is connected to the RX terminal of the optical module under test via a first matrix optical switch. The signal then enters a second BER tester for RX bit error rate testing. Simultaneously, the second BER tester sends SSPRQ encoding, which passes through the TX terminal of the optical module under test. The data then enters a DCA (Digital Communication Analyzer) via a second matrix optical switch. The DCA analyzes the TX data to adjust and test related TX terminal parameters such as eye diagram and extinction ratio. This unique architecture allows for simultaneous testing of the TX and RX terminals of the optical module. This testing method breaks the limitation of sequential execution of two processes in traditional testing methods, effectively saving testing time, reducing the frequency of replacing easily damaged or consumable equipment, and lowering the risk of contamination. In automated production line scenarios, only one automated robotic arm is needed to complete the loading and unloading of optical modules and related operations during the testing process, reducing fixed asset investment costs and improving the overall operational stability and efficiency of the automated production line. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the structure of an optical module testing system disclosed in an embodiment of this application; Figure 2 This is a framework diagram of an optical module testing system disclosed in an embodiment of this application; Figure 3 This is one of the flowcharts illustrating a parallel testing method for optical modules disclosed in an embodiment of this application; Figure 4 This is the second flowchart of a parallel testing method for optical modules disclosed in an embodiment of this application.

[0021] The components are: 1. First bit error rate tester; 2. Second bit error rate tester; 3. First matrix optical switch; 4. Second matrix optical switch; 5. Digital communication analyzer; 6. Optical module under test; 7. Optical attenuator; 8. Optical splitter; 9. Clock recovery unit; 10. First connector; 11. Second connector. Detailed Implementation

[0022] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0023] The terms “comprising” and “having”, and any variations thereof, in this application are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not necessarily limited to those steps or units that are explicitly listed, but may include other steps or units that are not explicitly listed or that are inherent to such process, method, product, or device.

[0024] In the description of the embodiments of this application, technical terms such as "first" and "second" are used only to distinguish different objects and should not be construed as indicating or implying relative importance or implicitly specifying the number, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly defined.

[0025] In the embodiments of this application, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. For those skilled in the art, the specific meaning of the above terms in this invention can be understood according to the specific circumstances.

[0026] The technical solution of this application will be described in detail below with reference to specific embodiments.

[0027] Please see Figure 1 An optical module testing system includes: a first bit error rate tester 1, a second bit error rate tester 2, a first matrix optical switch 3, a second matrix optical switch 4, and a digital communication analyzer 5; The first bit error rate tester 1 is connected to the first matrix optical switch 3; The first matrix optical switch 3 is connected to the input port of the RX terminal of the optical module under test 6; The second bit error rate tester 2 is connected to the output port of the RX end and the input port of the TX end of the optical module under test 6, respectively; The second matrix optical switch 4 is connected to the output port of the TX end of the optical module under test 6; The digital communication analyzer 5 is connected to the second matrix optical switch 4.

[0028] In some embodiments, an optical attenuator 7 is provided between the first bit error rate tester 1 and the first matrix optical switch 3. The first bit error rate tester 1 is connected to the input terminal of the optical attenuator 7, and the output terminal of the optical attenuator 7 is connected to the first matrix optical switch 3.

[0029] In some embodiments, the optical module testing system further includes an optical splitter 8 and a clock recovery unit 9. The second matrix optical switch 4 is connected to the input terminal of the optical splitter 8, the clock recovery unit 9 is connected to one output terminal of the optical splitter 8 and a digital communication analyzer 5, and the digital communication analyzer 5 is connected to the other output terminal of the optical splitter 8.

[0030] In some embodiments, the optical module testing system further includes a first connector 10 and a second connector 11, which are respectively connected to the first matrix optical switch 3, the input terminal of the second bit error rate tester 2, the output terminal of the second bit error rate tester 2, and the second matrix optical switch 4; wherein, the first connector 10 and the second connector 11 can be MPO connectors.

[0031] Test equipment preparation and connection: Prepare two bit error rate testers, labeled as Bit Error Rate Tester 1 and Bit Error Rate Tester 2, one DCA, one CDR, and two matrix optical switches (other cables and optical fibers are not specified). Ensure that all devices are working properly and that the communication interfaces between devices are compatible. Using optical fiber or other suitable transmission cables, connect the output port of the first bit error rate tester 1 to the input port of the first matrix optical switch 3; simultaneously, connect a set of output ports of the first matrix optical switch 3 to the RX terminal of the optical module under test 6, and then connect the output of the RX terminal of the optical module under test 6 to the input port of the second bit error rate tester 2; this constructs a signal transmission path for RX terminal testing, enabling the PRBS31Q encoded signal sent by the first bit error rate tester 1 to pass sequentially through the first matrix optical switch 3 and the RX terminal of the optical module under test 6, and finally reach the second bit error rate tester 2 for bit error rate testing; The second bit error rate tester 2 is electrically connected to a DUT base (test board). The DUT base connects to the TX and RX terminals of the optical module under test 6. Since the optical module under test 6 is already properly connected to the DUT base of the second bit error rate tester 2, it is only necessary to connect the TX terminal of the optical module under test 6 to the input port of the DCA through the other input port of the second matrix optical switch 4. This completes the signal transmission path setup for the TX terminal test. The SSPRQ encoded signal sent by the second bit error rate tester 2 can pass through the TX terminal of the optical module under test 6, and then through the second matrix optical switch 4 to enter the CDR / DCA for clock synchronization, eye diagram, extinction ratio, and other data analysis. The analysis results are analyzed by professional software, which determines whether parameter adjustments are needed. Here, CDR is the clock recovery unit 9, and DCA is the digital communication analyzer 5. The professional software used for analyzing the results is commonly used in this field and is not specifically limited here. Test parameter settings: On the first bit error rate tester 1, set the relevant parameters for sending the PRBS31Q encoded signal, such as signal rate, code type, clock frequency, etc., to ensure that the sent signal meets the test requirements of the 6RX end of the optical module under test. These parameters are usually set according to the specific specifications of the optical module and industry standards. For example, the signal rate may be set to common rates such as 100Gbps / lane or 50Gbps / lane. On the second bit error rate tester 2, on the one hand, the relevant parameters for receiving the signal from the RX end of the optical module under test 6 are set to match the PRBS31Q encoded signal sent by the first bit error rate tester 1 so as to accurately measure the RX bit error rate; on the other hand, the parameters for sending the SSPRQ encoded signal are set, which should also be adjusted according to the test requirements of the TX end of the optical module under test, such as signal rate, frequency, clock and other parameters. On the DCA, parameters for analyzing TX data are set, including the sampling rate for eye diagram measurement, CDR frequency, and the algorithm for calculating extinction ratio / TDECQ. These parameters need to be optimized based on the TX performance indicators of the optical module and the characteristics of the DCA equipment to ensure accurate acquisition of test data such as TDECQ and extinction ratio. Test execution: The first bit error rate meter 1 is activated to start sending PRBS31Q encoded signals. These signals are transmitted to the RX terminal of the optical module under test 6 through the first matrix optical switch 3. After processing the received signal, the optical module under test 6 outputs the signal to the second bit error rate meter 2. The second bit error rate meter 2 monitors the bit error rate of the received signal in real time and records the RX bit error rate data. At the same time, the second bit error rate tester 2 is activated to send an SSPRQ encoded signal; this signal enters the TX terminal of the optical module under test 6, the optical module under test 6 converts the electrical signal into an optical signal and transmits it out, which is then transmitted to the DCA through the second matrix optical switch 4; the DCA analyzes the electrical signal converted from the received optical signal, generates an eye diagram in real time, and calculates relevant parameters such as the extinction ratio; Throughout the testing process, operators can view test data and results in real time through the respective operating interfaces of the first bit error rate tester 1, the second bit error rate tester 2, and the DCA. In some other implementations, the relevant equipment can also transmit test data to the production management system in real time via network connection, facilitating unified management and analysis by production personnel. Integration with automated production lines: In an automated production line environment, an automated robotic arm is configured; the robotic arm inserts the optical module to be tested into the test DUT (test socket) according to a preset program and initiates the relevant TX / RX test operations; While waiting for testing, the robotic arm cleans the end face of the second optical fiber, and then the optical module under test 6 is connected to the optical fiber and connected to the first test port of the bit error rate tester. Once the optical module testing is complete, the optical switch immediately switches the tested link to the second test port to start the next round of testing. At the same time, based on the test results, the robotic arm removes the qualified optical modules from the first test port and moves them to the next production process station, while the unqualified optical modules are moved to the defective product placement area. In this way, the optical module testing process is efficiently connected in the automated production line, further improving production efficiency.

[0032] This application discloses a parallel testing method for optical modules, based on the optical module testing system described in the above embodiments, including the following steps: A first test path and a second test path are established through the first matrix optical switch 3 and the second matrix optical switch 4; In the first test path, the first bit error rate tester 1 is controlled to send a first test signal to the RX terminal of the optical module under test 6, and the second bit error rate tester 2 is controlled to collect and perform bit error analysis on the first output signal from the RX terminal of the optical module under test 6 to obtain the first performance parameter. In the second test path, the second bit error rate tester 2 is controlled to send a second test signal to the TX end of the optical module under test 6, and the digital communication analyzer 5 is controlled to perform data analysis on the second output signal from the TX end of the optical module under test 6 to obtain the second performance parameters.

[0033] In some embodiments, establishing a parallel first test path and a second test path specifically includes: Control the first matrix optical switch 3 to connect the output terminal of the first bit error rate tester 1 to the RX terminal of the optical module under test 6; Control the second matrix optical switch 4 to connect the TX terminal of the optical module under test 6 to the first input terminal of the digital communication analyzer 5.

[0034] In some embodiments, the method further includes: Before starting the test, set the first transmission parameters of the first bit error rate tester 1. The first transmission parameters include the first bit rate and the first test code pattern. The first receiving parameters of the second bit error rate tester 2 are set to correspond to the first transmitting parameters, and the second transmitting parameters of the second bit error rate tester 2 are set independently; wherein, in some other embodiments, the first receiving parameters need to be synchronized with the first bit rate and the first test code pattern; the second transmitting parameters include the second bit rate and the second test code pattern; The second receiving parameter of the digital communication analyzer 5 is set to correspond to the second transmitting parameter. Specifically, the trigger clock of the digital communication analyzer 5 is set to be synchronized with the second bit rate.

[0035] In some embodiments, the method is automatically executed by a test controller, which controls the switching of the first matrix optical switch 3 and the second matrix optical switch 4, as well as the startup, parameter setting, and data acquisition of the first bit error rate tester 1, the second bit error rate tester 2, and the digital communication analyzer 5.

[0036] In some embodiments, the test system further includes an optical splitter 8 and a clock recovery unit 9; the second matrix optical switch 4 connects one optical signal output from the TX terminal of the optical module under test 6 directly to the first input terminal of the digital communication analyzer 5, and the other to the input terminal of the optical splitter 8; one output terminal of the optical splitter 8 is connected to the input terminal of the clock recovery unit 9, and the output terminal of the clock recovery unit 9 is connected to the second input terminal of the digital communication analyzer 5; the other output terminal of the optical splitter 8 is connected to the third input terminal of the digital communication analyzer 5. In the second test path, the digital communication analyzer 5 is configured to: select the signal at its first input terminal or third input terminal as the analysis object, and use the clock signal provided by the clock recovery unit 9 as the trigger reference to perform eye diagram analysis to obtain the second performance parameter; and / or measure the direct output optical power of the TX terminal through its first input terminal.

[0037] In some embodiments, the optical module testing system further includes a first connector 10 and a second connector 11, which are respectively connected to the first matrix optical switch 3, the input terminal of the second bit error rate tester 2, the output terminal of the second bit error rate tester 2, and the second matrix optical switch 4. Insert the optical module under test 6 into the first connector 10, control the first matrix optical switch 3 and the second matrix optical switch 4 to switch the link under test to the first connector 10, and start the corresponding test operation; While waiting for the test, clean the end face of the optical fiber in the second connector 11 and insert the other optical module 6 under test into the second connector 11. Once the test of one optical module 6 is completed, the first matrix optical switch 3 and the second matrix optical switch 4 are controlled to switch the link under test to the second connector 11, and the next round of debugging and testing is started. Based on the test results, qualified optical modules are moved from the first connector 10 to the next production process station, while unqualified optical modules are moved to the unqualified product placement area.

[0038] This invention has the following advantages: 1. Improved testing efficiency: This invention, through its unique testing architecture, can simultaneously test the TX and RX ends of an optical module, completing the testing of two key performance indicators in a single operation, greatly shortening the testing time for a single optical module; in large-scale production scenarios, this efficiency improvement is even more significant, effectively accelerating the production pace and increasing the product output per unit time. 2. Reduced initial investment costs: For automated production line scenarios, this invention only requires two bit error rate testers, one CDR, one DCA, one set of robotic arm equipment, and two matrix optical switches. Compared with the traditional serial testing process, it saves one set of robotic arms; the reduced space required further saves production site resources and reduces site rental costs. 3. Reduce the replacement cost of consumable parts: Due to the merging of the testing process, the TX to RX process no longer requires changing the test station, which means reducing one module plugging and unplugging action, thereby reducing the frequency of fiber optic replacement and bit error rate tester port base replacement.

[0039] This application discloses a computer-readable storage medium storing a computer program, wherein the computer program causes a computer to execute the optical module parallel testing method disclosed in the above embodiments; wherein the processor may be a central processing unit (CPU).

[0040] This application also discloses an application publishing platform, which is used to publish computer program products. When the computer program products are run on a computer, the computer performs some or all of the steps of the methods described in the above method embodiments.

[0041] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of this application. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. Those skilled in the art should also recognize that the embodiments described in the specification are optional embodiments, and the actions and modules involved are not necessarily essential to this application.

[0042] In the various embodiments of this application, it should be understood that the sequence number of each process does not necessarily imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0043] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units; they can be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0044] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0045] If the integrated units described above are implemented as software functional units and sold or used as independent products, they can be stored in a computer-accessible memory. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several requests to cause a computer device (which can be a personal computer, server, or network device, specifically a processor in the computer device) to execute some or all of the steps of the methods described in the various embodiments of this application.

[0046] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be implemented by a program instructing related hardware. The program can be stored in a computer-readable storage medium, including read-only memory (ROM), random access memory (RAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), one-time programmable read-only memory (OTPROM), electrically-Erasable Programmable Read-Only Memory (EEPROM), compactdisc read-only memory (CD-ROM) or other optical disc storage, disk storage, magnetic tape storage, or any other computer-readable medium capable of carrying or storing data.

[0047] Based on the disclosure and teachings of the foregoing specification, those skilled in the art can make changes and modifications to the above embodiments. Therefore, the invention is not limited to the specific embodiments described above, and any obvious improvements, substitutions, or modifications made by those skilled in the art based on this invention are within the scope of protection of this invention. Furthermore, although some specific terms are used in this specification, these terms are only for convenience of explanation and do not constitute any limitation on the invention.

Claims

1. An optical module testing system, characterized in that, include: First bit error rate tester (1), second bit error rate tester (2), first matrix optical switch (3), second matrix optical switch (4) and digital communication analyzer (5); The first bit error rate tester (1) is connected to the first matrix optical switch (3); The first matrix optical switch (3) is connected to the RX terminal of the optical module under test (6); The second bit error rate tester (2) is connected to the RX and TX terminals of the optical module under test (6), respectively; The second matrix optical switch (4) is connected to the TX terminal of the optical module under test (6); The digital communication analyzer (5) is connected to the second matrix optical switch (4).

2. The optical module testing system as described in claim 1, characterized in that, An optical attenuator (7) is provided between the first bit error rate tester (1) and the first matrix optical switch (3). The first bit error rate tester (1) is connected to the input end of the optical attenuator (7), and the output end of the optical attenuator (7) is connected to the first matrix optical switch (3).

3. The optical module testing system as described in claim 1, characterized in that, The optical module testing system also includes an optical splitter (8) and a clock recovery unit (9). The second matrix optical switch (4) is connected to the input terminal of the optical splitter (8). The clock recovery unit (9) is connected to one output terminal of the optical splitter (8) and the digital communication analyzer (5). The digital communication analyzer (5) is connected to the other output terminal of the optical splitter (8).

4. The optical module testing system as described in claim 1, characterized in that, The optical module testing system also includes a first connector (10) and a second connector (11), which are respectively connected to the first matrix optical switch (3), the input terminal of the second bit error rate tester (2), the output terminal of the second bit error rate tester (2), and the second matrix optical switch (4).

5. A parallel testing method for optical modules, based on the testing system described in any one of claims 1 to 4, characterized in that, Includes the following steps: A first test path and a second test path are established through the first matrix optical switch (3) and the second matrix optical switch (4); In the first test path, the first bit error rate tester (1) is controlled to send a first test signal to the RX terminal of the optical module under test (6), and the second bit error rate tester (2) is controlled to analyze the first output signal from the RX terminal of the optical module under test (6) to obtain the first performance parameter; In the second test path, the second bit error rate tester (2) is controlled to send a second test signal to the TX end of the optical module under test (6), and the digital communication analyzer (5) is controlled to analyze the second output signal from the TX end of the optical module under test (6) to obtain the second performance parameters.

6. The parallel testing method for optical modules as described in claim 5, characterized in that, The establishment of the parallel first test path and the second test path specifically includes: Control the first matrix optical switch (3) to connect the output terminal of the first bit error rate meter (1) to the RX terminal of the optical module under test (6); Control the second matrix optical switch (4) to connect the TX terminal of the optical module under test (6) to the first input terminal of the digital communication analyzer (5).

7. The parallel testing method for optical modules as described in claim 6, characterized in that, The method further includes: Before starting the test, set the first transmission parameters of the first bit error rate tester (1); Set the first receiving parameters of the second bit error rate meter (2) to correspond to the first transmitting parameters, and set the second transmitting parameters of the second bit error rate meter (2); The second receiving parameter of the digital communication analyzer (5) is set to correspond to the second transmitting parameter.

8. The parallel testing method for optical modules as described in claim 5, characterized in that, The method is automatically executed by a test controller, which controls the switching of the first matrix optical switch (3) and the second matrix optical switch (4), as well as the startup, parameter setting and data acquisition of the first bit error rate tester (1), the second bit error rate tester (2) and the digital communication analyzer (5).

9. The parallel testing method for optical modules as described in claim 6, characterized in that, The test system also includes an optical splitter (8) and a clock recovery unit (9); the second matrix optical switch (4) connects the signal output from the TX terminal of the optical module under test (6) directly to the first input terminal of the digital communication analyzer (5) and the other to the input terminal of the optical splitter (8); one output terminal of the optical splitter (8) is connected to the input terminal of the clock recovery unit (9), and the output terminal of the clock recovery unit (9) is connected to the second input terminal of the digital communication analyzer (5); the other output terminal of the optical splitter (8) is connected to the third input terminal of the digital communication analyzer (5); In the second test path, the digital communication analyzer (5) is configured to: select the signal of the first input terminal or the third input terminal as the analysis object, and use the clock signal provided by the clock recovery unit (9) as the trigger reference to perform eye diagram analysis to obtain the second performance parameter; and / or measure the direct output optical power of the TX terminal through the first input terminal.

10. The parallel testing method for optical modules as described in claim 6, characterized in that, The optical module testing system also includes a first connector (10) and a second connector (11), which are respectively connected to the first matrix optical switch (3), the input terminal of the second bit error rate tester (2), the output terminal of the second bit error rate tester (2), and the second matrix optical switch (4); Insert the optical module under test (6) into the first connector (10), control the first matrix optical switch (3) and the second matrix optical switch (4) to switch the link under test to the first connector (10), and start the corresponding test operation; While waiting for the test, the end face of the optical fiber in the second connector (11) is cleaned, and another optical module (6) under test is inserted into the second connector (11). After the test of one of the optical modules under test (6) is completed, the first matrix optical switch (3) and the second matrix optical switch (4) are controlled to switch the link under test to the second connector (11) to start the next round of debugging and testing; Based on the test results, qualified optical modules are moved from the first connector (10) to the workstation of the next production process, and unqualified optical modules are moved to the unqualified product placement area.

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