Correction method and device of equipment and related equipment

Abstract

The application provides a correction method and device of an equipment and related equipment. According to the technical scheme of the application, N groups of test signals continuously collected from a to-be-tested equipment are processed to obtain N groups of values corresponding to the N groups of test signals, a target power value is generated according to the N groups of power values, a target line loss value is generated through the target power value and a preset power value, and the to-be-tested equipment is corrected according to the target line loss value, thereby realizing accurate testing of the to-be-tested equipment and accurate correction of the to-be-tested equipment after testing.

Description

Technical Field

[0001] This application relates to the field of electromagnetic compatibility testing technology, specifically to a calibration method, apparatus, and related equipment for a device. Background Technology

[0002] With the increasing complexity of mobile phones, the calibration of antennas on production lines still primarily relies on traditional manual methods. A single Device Under Test (DUT) is placed in a shielded box with a flat panel antenna. An industrial control computer program controls the DUT via a Universal Serial Bus (USB) data line to perform calibration tests on non-signaling transmission and reception parameters. Calibration is completed manually by calculating and adjusting line loss. This testing method lacks quantitative evaluation tools, relying solely on recording single calibration values ​​and calculating new line loss on a single basis. It cannot accurately determine whether the calibration has met standards, resulting in low testing productivity, high calibration data deviation, and poor test results for the DUT, thus failing to achieve accurate calibration. Summary of the Invention

[0003] This application provides a calibration method, apparatus, and related equipment for a device, which solves the problem in the related art that it is impossible to accurately calibrate the device under test.

[0004] To solve the above problems, this application is implemented as follows:

[0005] In a first aspect, this application provides a method for calibrating a device, the method comprising:

[0006] The N sets of test signals continuously collected from the device under test are processed to obtain N sets of power values ​​corresponding to the N sets of test signals, where N is a positive integer, and the N sets of test signals are used to test the device under test;

[0007] Based on the N sets of power values, a target power value is generated, which reflects the magnitude of the difference between the N sets of power values.

[0008] The offset is obtained by performing a difference calculation between the target power value and the preset power value;

[0009] A target line loss value is generated based on the offset, and the device under test is corrected based on the target line loss value, wherein the target line loss value represents the transmission loss of the device under test.

[0010] Optionally, generating the target power value based on the N sets of power values ​​includes:

[0011] The validity of the N sets of power values ​​is verified respectively, and N verification results are obtained for each of the N sets of power values. The verification results are used to indicate whether the corresponding power value is valid.

[0012] The N power values ​​are filtered based on the N verification results to obtain M effective power values. The effective power values ​​are the power values ​​whose verification results are valid among the N power values, and M is a positive integer less than or equal to N.

[0013] The target power value is obtained by calculating the mean of the M groups of effective power values.

[0014] Optionally, the step of generating a target line loss value based on the offset and calibrating the device under test based on the target line loss value includes:

[0015] Obtain the historical line loss value corresponding to the device under test;

[0016] The target line loss value is obtained by adding the offset to the historical line loss value.

[0017] The current line loss value of the device under test is adjusted to the target line loss value in order to calibrate the device under test.

[0018] Optionally, before processing the N sets of test signals continuously acquired by the device under test to obtain the N sets of power values ​​corresponding to the N sets of test signals, the method further includes:

[0019] Determine the preset test plan corresponding to the device under test, wherein the preset test plan includes the test process of the N sets of test signals that need to be collected by the device under test during the test;

[0020] According to the preset test plan, test parameters are configured, and the test parameters include at least one of the following: the operating frequency of the device under test, the communication channel number of the device under test, the communication standard of the device under test, and the signal power level of the device under test;

[0021] Based on the test parameters, the test equipment is controlled to establish a communication connection with the device under test, and the test equipment is used to test the device under test;

[0022] The test equipment is controlled to send the N sets of test signals to the device under test.

[0023] Optionally, the step of controlling the test equipment to establish a communication connection with the device under test based on the test parameters includes:

[0024] The device under test is placed inside a coupling shielding box, which is used to shield the interference signals received by the device under test.

[0025] Perform initialization settings on the device under test and the test equipment;

[0026] Once the device under test and the testing equipment have completed their initialization settings, the testing equipment is controlled to establish a communication connection with the device under test based on the test parameters.

[0027] Optionally, controlling the test device to send the N sets of test signals to the device under test includes:

[0028] The test equipment is controlled to load the preset test scheme to generate N radio frequency power signals;

[0029] The N radio frequency power signals are demodulated sequentially to obtain the processed N radio frequency power signals;

[0030] Data acquisition and analog-to-digital conversion are performed on the processed N radio frequency power signals to obtain the N sets of test signals;

[0031] The test equipment is controlled to send the N sets of test signals to the device under test.

[0032] Optionally, the step of controlling the test device to establish a communication connection with the device under test based on the test parameters after the initialization settings of the device under test and the test device are completed includes:

[0033] Once the device under test and the test device have completed their initialization settings, the system information of the test device is obtained. The system information includes at least one of the following: motherboard serial number, hardware version number, software version number, memory size, remaining battery power, network standard information, and operating frequency band.

[0034] Based on the test parameters and the system information, the test equipment is controlled to establish a communication connection with the device under test.

[0035] Optionally, the test signal includes: total radiated power, and / or, total isotropic sensitivity.

[0036] Secondly, this application provides a calibration apparatus for a device, the apparatus comprising:

[0037] The processing module is used to process N sets of test signals continuously collected by the device under test to obtain N sets of power values ​​corresponding to the N sets of test signals, where N is a positive integer, and the N sets of test signals are used to test the device under test.

[0038] The generation module is used to generate a target power value based on the N sets of power values, wherein the target power value is used to reflect the difference between the N sets of power values;

[0039] The calculation module is used to perform differential calculation on the target power value and the preset power value to obtain the offset;

[0040] The correction module is used to generate a target line loss value based on the offset, and to correct the device under test based on the target line loss value, wherein the target line loss value is used to represent the transmission loss of the device under test.

[0041] Thirdly, this application also provides an electronic device, including a processor, a memory, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the method described in the first aspect above.

[0042] Fourthly, this application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the method described in the first aspect above.

[0043] Fifthly, this application also provides a computer program product, including computer instructions that, when executed by a processor, implement the steps of the method described in the first aspect above.

[0044] This application provides a device calibration method, apparatus, and related equipment. The method includes: processing N sets of test signals continuously acquired by the device under test to obtain N sets of power values ​​corresponding to the N sets of test signals, where N is a positive integer, and the N sets of test signals are used to test the device under test; generating a target power value based on the N sets of power values, the target power value reflecting the difference between the N sets of power values; performing a differential calculation on the target power value and a preset power value to obtain an offset; generating a target line loss value based on the offset; and calibrating the device under test based on the target line loss value, the target line loss value representing the transmission loss of the device under test.

[0045] The embodiments of this application have the following beneficial effects:

[0046] The technical solution of this application processes N sets of test signals continuously acquired by the device under test to obtain N sets of values ​​corresponding to the N sets of test signals. A target power value is generated based on the N sets of power values. A target line loss value is generated by the target power value and a preset power value. The device under test is then calibrated based on the target line loss value, thereby achieving accurate testing of the device under test and accurate calibration of the device under test after testing. Attached Figure Description

[0047] To more clearly illustrate the technical solution of this application, the drawings used in the description of this application will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0048] Figure 1 This is a flowchart illustrating the calibration method of the device in an embodiment of this application;

[0049] Figure 2 This is a schematic diagram of the test system in an embodiment of this application;

[0050] Figure 3 This is a schematic diagram of the calibration test procedure in an embodiment of this application;

[0051] Figure 4 This is a schematic diagram of the structure of the calibration device in the embodiments of this application;

[0052] Figure 5 This is a schematic diagram of the structure of the electronic device provided in the embodiments of this application. Detailed Implementation

[0053] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0054] The terms "first," "second," etc., used in the embodiments of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to these processes, methods, products, or devices. Additionally, the use of "and / or" in this application indicates at least one of the connected objects, such as A and / or B and / or C, representing seven possibilities: including A alone, B alone, C alone, and the presence of both A and B, both B and C, both A and C, and the presence of A, B, and C.

[0055] The embodiments of this application address the problem of poor performance when testing devices under test in related technologies by providing a device calibration method, such as... Figure 1 As shown, the steps of this method include:

[0056] Step 101: Process the N sets of test signals continuously collected by the device under test to obtain N sets of power values ​​corresponding to the N sets of test signals, where N is a positive integer, and the N sets of test signals are used to test the device under test.

[0057] In this embodiment, as Figure 2 As shown, Figure 2 This is a schematic diagram of the test system provided in the embodiments of this application, which includes: a main control computer, a CMW100 / 500 comprehensive tester, a shielded box for placing the device under test (DUT), etc. The main control computer and the comprehensive tester are connected by USB data cables, network cables, etc. The main control computer and the DUT are connected by USB data cables, and the DUT and the CMW100 / 500 comprehensive tester are connected by radio frequency coaxial cables.

[0058] The main control computer is equipped with calibration test programs. Test commands for each chip platform and control commands for each instrument are integrated into these programs. Testers can freely select and configure single or multiple standard scenarios (such as WiFi, 2G, 3G, 4G, 5G NR, etc.) through the program's graphical user interface. The main control computer then issues calibration test commands to the DUT and CMW100 / 500 comprehensive tester to perform corresponding tests. By issuing these commands, the main control program can connect to the DUT and perform calibration tests, and can modify the parameters in the commands to complete different calibration test items.

[0059] Specifically, the testing process in this embodiment includes the device under test (DUT) first sending N consecutive sets of test signals, and then processing the N sets of test signals continuously acquired by the DUT to obtain N sets of power values ​​corresponding to the N sets of test signals. Continuous acquisition excludes random sampling, non-equal interval sampling, and other similar scenarios. Specifically, the processing of the N sets of signals may include signal preprocessing, frequency domain transformation, and power calculation, etc., which are not specifically limited in this embodiment.

[0060] It should be noted that the N sets of test information in this embodiment are generated based on corresponding test instructions. These test instructions can be pre-packaged instructions; when a test is required, the corresponding test instruction can be called to perform the corresponding test, thus achieving automated testing of the device under test (DUT). Specifically, by issuing corresponding calibration test commands, the main control program can connect to the DUT and perform the following types of operations, and modify the parameters in the commands to complete different calibration test items. For example: Managing connected DUTs: Viewing connected DUTs and obtaining their connection status. The DUT may have the following connection statuses: a. Connected to the DUT, and DUT communication is normal; b. Connected to the DUT, but the connection is abnormal, and the DUT is unresponsive; c. Not currently connected to any DUT. File transfer: Transferring files from the main control computer to the DUT, and conversely, transferring files from the DUT to the main control computer. Through this file transfer operation, tools or instruction sets that are not required for signaling calibration tests can be packaged and transferred to the DUT, or DUT behavior logs recorded during the calibration test can be transferred to the main control computer for analysis, etc. System Command Execution: Executes DUT system-level commands, such as disabling the DUT's safe mode to allow subsequent test commands, or obtaining read / write permissions for a folder under different paths on the DUT. DUT Information Viewing: Retrieves various system information about the DUT, such as the DUT motherboard or system serial number, hardware version number, software version number, memory size, remaining battery power, standard and band, and current mode status (power on or off). Debugging and Testing: Most commands controlling the DUT for testing fall into this category, such as calibration test scenarios for standard, band, power, or received signal. In particular, since commands like "configuration parameters" have a generally consistent format, after testers input DUT configuration parameters through the graphical user interface, the main control program will capture these parameters to generate new configuration parameter commands, thereby configuring the DUT test scenarios. Other Commands: Restarts connected DUTs, waits for DUT connections, resets the adb server, and other commands.

[0061] Optionally, the test signal includes: Total Radiated Power (TRP), and / or Total Isotropic Sensitivity (TIS).

[0062] Step 102: Generate a target power value based on the N sets of power values. The target power value is used to reflect the difference between the N sets of power values.

[0063] In this embodiment, after obtaining N power values ​​corresponding to N sets of test signals, a target power value is obtained by calculating the N power values. The target power value represents the variance, standard deviation, average, range, etc., of the N power values, but is not specifically limited in this embodiment. The target power value reflects the relationship between the N power values, thereby demonstrating the fluctuation of the N power values.

[0064] Step 103: Perform differential calculation on the target power value and the preset power value to obtain the offset differential calculation, and obtain the target line loss correction value. The historical line loss reference value is used to represent the transmission loss of the device under test.

[0065] In this embodiment, after calculating the target power value, the offset is obtained by performing a difference calculation between the target power value and the preset power value. The system judges the compliance of the test results based on a preset offset threshold range. For example, if the offset is large, it indicates that the device under test does not meet the requirements and needs to be significantly corrected.

[0066] It should be noted that the offset can also be verified using a preset offset range. Specifically, for example, the preset offset range can be AB. When the preset offset falls within the range of AB, a first test result is generated. When the preset offset falls outside the range of AB, a second test result is generated.

[0067] Specifically, the process of generating the line loss correction value by offset can include: before sending AT commands to control the board, there is a standard target power value. The AT commands are also set according to this target power. Offset value = actual value measured by the instrument - target power value. Line loss correction value = new original line loss value + offset value.

[0068] Start the test - test the actual power - automatically calculate the average of the test values ​​- compare the test values ​​with the expected power based on the old loss - generate a new line loss based on the difference. The test tool is preset with the required system, channel, and expected value. Start the calibration tool. After the tool is initialized, it calls the formal test tool to test each prototype according to the preset test parameters in the test sequence table and saves the test results in a table. After each test, the average of N test results is automatically calculated. The difference between the average value (avgpower) and the expected value (golden power) is calculated (offset). The principle of refunding excess and compensating for deficiency is applied to generate a new line loss.

[0069] Step 104: Generate a target line loss value based on the offset, and correct the device under test based on the target line loss value, wherein the target line loss value is used to represent the transmission loss of the device under test.

[0070] In this embodiment, the target value for adjusting the line loss parameter of the device under test (DUT) is determined by comprehensively calculating the calculated offset and the corresponding line loss value of the DUT. Specifically, based on the current line loss value, corresponding corrections are made according to the direction and magnitude of the offset to finally obtain the target line loss value that the DUT needs to be adjusted to, providing a basis for subsequent device parameter calibration, operational status optimization, and line loss control. Compared with related technologies that lack quantitative evaluation methods and can only calculate new line loss once by recording a single calibration value, making it impossible to accurately determine whether the calibration is up to standard, this application encapsulates a multi-standard calibration test instruction set into an automatic test program. By pre-setting standardized calibration tools and parameter templates, it eliminates the need for manual input of large amounts of calibration data or test results, significantly reducing deployment and implementation time. By calculating the target line loss value, the transmission loss of the DUT can be accurately detected, thereby achieving accurate calibration of the DUT.

[0071] The technical solution of this application processes N sets of test signals continuously acquired by the device under test to obtain N sets of values ​​corresponding to the N sets of test signals. A target power value is generated based on the N sets of power values. A target line loss value is generated by the target power value and a preset power value. The device under test is then calibrated based on the target line loss value, thereby achieving accurate testing of the device under test and accurate calibration of the device under test after testing.

[0072] In this embodiment, the target line loss correction value refers to the standard line loss value that should be achieved after correction, and the historical line loss benchmark value refers to the previously determined standard line loss value. The offset is obtained by calculating the difference between the target line loss correction value and the historical line loss benchmark value. The offset is used to represent the difference between the two, reflecting how much the current corrected standard has changed relative to the historical standard.

[0073] The offset is verified by setting a preset offset range. Specifically, for example, the preset offset range can be AB. When the preset offset falls within the range of AB, a first test result is generated. When the preset offset falls outside the range of AB, a second test result is generated.

[0074] Specifically, the process of generating the line loss correction value by offset can include: before sending AT commands to control the board, there is a standard target power value. The AT commands are also set according to this target power. Offset value = actual value measured by the instrument - target power value. Line loss correction value = new original line loss value + offset value.

[0075] Start the test - test the actual power - automatically calculate the average of the test values ​​- compare the test values ​​with the expected power based on the old loss - generate a new line loss based on the difference. The test tool is preset with the required system, channel, and expected value. Start the calibration tool. After the tool is initialized, it calls the formal test tool to test each prototype according to the preset test parameters in the test sequence table and saves the test results in a table. After each test, the average of N test results is automatically calculated. The difference between the average value (avgpower) and the expected value (golden power) is calculated (offset). The principle of refunding excess and compensating for deficiency is applied to generate a new line loss.

[0076] In some feasible implementations, optionally, generating the target power value based on the N sets of power values ​​includes:

[0077] The validity of the N sets of power values ​​is verified respectively, and N verification results are obtained for each of the N sets of power values. The verification results are used to indicate whether the corresponding power value is valid.

[0078] The N power values ​​are filtered based on the N verification results to obtain M effective power values. The effective power values ​​are the power values ​​whose verification results are valid among the N power values, and M is a positive integer less than or equal to N.

[0079] The target power value is obtained by calculating the mean of the M groups of effective power values.

[0080] In this embodiment, when generating a target power value from N sets of power values, the validity of each of the N sets of power values ​​needs to be verified first, resulting in N verification results for each of the N sets of power values. For example, if some power values ​​deviate significantly from the normal power value, these power values ​​need to be discarded.

[0081] After filtering N sets of power values ​​using N verification results and retaining the valid power values, M sets of valid power values ​​are obtained. The mean of the M sets of valid power values ​​is then calculated to obtain the target power value.

[0082] Specifically, this embodiment first calculates the average power (μ_AvgPower) of N test results using the arithmetic mean method; then, it performs deviation quantization calculation to solve for the offset (Offset = μ_AvgPower - Golden Power) between the average power (μ_AvgPower) and the preset target power value (Golden Power); based on the dynamic equalization compensation principle, it generates a line loss correction value (Loss_Corrected) by back-calculating the offset. This line loss correction value must strictly adhere to the system's preset threshold indicators (including upper and lower limits) to ensure that the power matching accuracy between the antenna and the RF transmission link meets the requirements of industry standards such as 3GPP, thereby ensuring the signal transmission stability and link performance consistency of the communication system.

[0083] Optionally, the step of generating a target line loss value based on the offset and calibrating the device under test based on the target line loss value includes:

[0084] Obtain the historical line loss value corresponding to the device under test;

[0085] The target line loss value is obtained by adding the offset to the historical line loss value.

[0086] The current line loss value of the device under test is adjusted to the target line loss value in order to calibrate the device under test.

[0087] In this embodiment, the historical line loss value of the device under test within a preset historical time period is obtained. The historical line loss value can be the line loss value of the device under test after the most recent correction, the average line loss value within a preset sampling period, or the baseline line loss value determined based on line loss data from multiple historical sampling times.

[0088] The calculated offset is superimposed with the historical line loss value to obtain the target line loss value for the device under test. Specifically, when the offset is positive, the historical line loss value is increased to obtain the target line loss value; when the offset is negative, the historical line loss value is decreased to obtain the target line loss value.

[0089] Obtain the current line loss value of the device under test and compare it with the target line loss value; if the current line loss value is inconsistent with the target line loss value, or if the difference between the two is greater than a preset threshold, generate a correction instruction based on the target line loss value.

[0090] The calibration command is sent to the device under test (DUT) or to a control device that is connected to the DUT in communication, so that the current line loss value of the DUT is adjusted to the target line loss value, thereby completing the calibration of the line loss parameters of the DUT.

[0091] Optionally, before processing the N sets of test signals continuously acquired by the device under test to obtain the N sets of power values ​​corresponding to the N sets of test signals, the method further includes:

[0092] Determine the preset test plan corresponding to the device under test, wherein the preset test plan includes the test process of the N sets of test signals that need to be collected by the device under test during the test;

[0093] According to the preset test plan, test parameters are configured, and the test parameters include at least one of the following: the operating frequency of the device under test, the communication channel number of the device under test, the communication standard of the device under test, and the signal power level of the device under test;

[0094] Based on the test parameters, the test equipment is controlled to establish a communication connection with the device under test, and the test equipment is used to test the device under test;

[0095] The test equipment is controlled to send the N sets of test signals to the device under test.

[0096] In this embodiment, before processing the N sets of test signals continuously collected by the device under test (DUT), a preset test plan for the DUT needs to be determined. This preset test plan includes the test procedure for the N sets of test signals that the DUT needs to collect during the test, such as which model to use for testing, and what the test instructions include. Based on this, test parameters for testing the DUT are configured according to the preset test plan. The test equipment is then controlled to establish a communication connection with the DUT based on these test parameters, thereby sending the N sets of test signals to the DUT through the test equipment.

[0097] Specifically, such as Figure 3 As shown, Figure 3 This is a schematic diagram of the calibration test procedure in this embodiment. The parameter configuration module covers two core configuration dimensions: the first is the preset of basic test parameters, including the test mode configuration during the test tool initialization phase, the upper and lower power thresholds corresponding to each communication standard (based on the anechoic chamber test environment and actual application scenario calibration settings, with a typical value range of [5:5]), the test number threshold (typical value range of 5~50 times), the preset selection of test instruments, and the upper and lower line loss thresholds (typical value range of <38 for frequency bands below 5GHz); the second is the preset of test sequence parameters, specifically including the standardized configuration of key test parameters such as communication standard, operating frequency band, total radiated power and total omnidirectional sensitivity test items, signal bandwidth, modulation method, operating frequency, channel number, antenna ID, target center power value, and system calibration cycle.

[0098] The test module refers to the testing tool first loading the initial test file (usually a dynamic link library .dll file). The host computer drives the device under test (DUT) to output a specified RF power signal through a preset control protocol. This signal is then coupled and acquired by a coupler and transmitted to the test instrument through a low-loss RF transmission cable. The instrument demodulates the received RF signal, acquires the data, and performs analog-to-digital conversion (ADC) processing, quantizing it into a digital signal that can characterize the power characteristics. Subsequently, the quantized data is transmitted back to the host computer test software via an Ethernet link. The software performs compliance judgment based on a preset power threshold range and finally feeds back the judgment result to the user interface (UI) for visualization in real time.

[0099] The core function of the data analysis module is to pre-set the number of calibrations (N) based on the configuration file (ConfigFile) of the automated calibration and testing system, call the standardized test execution module, and sequentially perform calibration tests on N identical devices under test (DUTs) according to key parameters such as system type, frequency band, and channel in the pre-set test parameter sequence library. During the test, the system collects the raw test data of each DUT in real time and stores it in structured data tables (such as Excel / CSV format), supporting data traceability and secondary analysis.

[0100] Optionally, the step of controlling the test equipment to establish a communication connection with the device under test based on the test parameters includes:

[0101] The device under test is placed inside a coupling shielding box, which is used to shield the interference signals received by the device under test.

[0102] Perform initialization settings on the device under test and the test equipment;

[0103] Once the device under test and the testing equipment have completed their initialization settings, the testing equipment is controlled to establish a communication connection with the device under test based on the test parameters.

[0104] In this embodiment, during the testing of the device under test, the device under test is first placed in a coupling shielding box to eliminate other interference signals, thereby improving the test accuracy. The device under test and the test device are then initialized to complete the communication connection and enable subsequent testing.

[0105] Specifically, the testing of the device under test (DUT) includes the following procedure: The DUT is placed in a shielded enclosure and fixed in place; the test program is started by clicking "Start Test Program"; the computer controls the CMW100 / 500 integrated tester, which automatically sets the preset configuration to the RF signal required for DUT testing; the computer obtains DUT access, sets the required standard and band, and current mode status (power on or off); the computer waits 10 seconds for tool initialization to complete, sends a test command, and obtains 10 test values ​​(options 1 to 10 are selectable), taking the average as the baseline output; for each DUT switched, a set of test values ​​needs to be obtained and the average value recalculated, the difference from the expected value is calculated to obtain the new line loss value; after testing all DUTs, the computer program outputs the test results as an Excel file.

[0106] Optionally, controlling the test device to send the N sets of test signals to the device under test includes:

[0107] The test equipment is controlled to load the preset test scheme to generate N radio frequency power signals;

[0108] The N radio frequency power signals are demodulated sequentially to obtain the processed N radio frequency power signals;

[0109] Data acquisition and analog-to-digital conversion are performed on the processed N radio frequency power signals to obtain the N sets of test signals;

[0110] The test equipment is controlled to send the N sets of test signals to the device under test.

[0111] In this embodiment, by loading a preset test scheme (usually a dynamic link library .dll file), the host computer drives the device under test (DUT) to output a specified radio frequency power signal through a preset control protocol. After the signal is coupled and acquired by a coupler, it is transmitted to the test instrument through a low-loss radio frequency transmission cable. The instrument demodulates, acquires, and performs analog-to-digital conversion (ADC) on the received radio frequency signal, quantizing it into a digital signal that can characterize the power characteristics. Subsequently, the quantized data is transmitted back to the host computer test software through an Ethernet link. The software completes the compliance judgment based on the preset power threshold range, and finally feeds back the judgment result to the user interface (UI) for visualization in real time.

[0112] Optionally, the step of controlling the test device to establish a communication connection with the device under test based on the test parameters after the initialization settings of the device under test and the test device are completed includes:

[0113] Once the device under test and the test device have completed their initialization settings, the system information of the test device is obtained. The system information includes at least one of the following: motherboard serial number, hardware version number, software version number, memory size, remaining battery power, network standard information, and operating frequency band.

[0114] Based on the test parameters and the system information, the test equipment is controlled to establish a communication connection with the device under test.

[0115] In this embodiment, after the device under test and the test device have completed their initialization settings, the system information of the test device is obtained, and a communication connection is established between the test device and the device under test using the system information and test parameters, thereby realizing automatic testing.

[0116] It should be noted that, in this embodiment, the test instructions are as follows: First, data processing instructions, encompassing instructions for calculating the mean of N sets of test data and instructions for calculating the deviation between N measured results and the preset expected value; second, deviation correction calculation instructions, specifically implemented using the formula Δ=μ_N+Loss_old (where μ_N is the effective mean of N test data, and Loss_old is the historical line loss baseline value), while also supporting flexible configuration of user-defined extended instructions; third, mean acquisition and filtering instructions, which collect N sets of raw total radiated power (TRP) and total isotropic sensitivity (TIS) test data, first removing abnormal data exceeding the preset threshold, and then using the arithmetic mean method to calculate the mean μ_N of the effective data. The core process of the deviation judgment instruction is as follows: based on the effective mean μ_N and the original line loss baseline value Loss_old, the quantification is completed using the offset calculation formula Offset=μ_N+Loss_old, and finally, the compliance judgment conclusion of the test results is output, providing data support for subsequent link parameter calibration.

[0117] After testing, operators can troubleshoot based on the root causes of errors displayed on the main control computer. Common fault handling methods are as follows: For CMW100 / 500 test instrument malfunctions, call the test instrument's reset command; for DUT without ports, use Task Manager to close all conflicting processes and re-execute the test command; for tool testing stuck, use Task Manager to close the process, restart the calibration test tool, and execute the initialization command; for no test signal received, print the abnormal test log with error messages. Investigate for abnormal coupling or antenna contact within the shielding box, or abnormal RF paths of the DUT. The data analysis module is responsible for outputting test data and performing preliminary quantitative analysis. After the test execution module completes the full-process functional testing, this module first automatically generates a structured test report according to a preset standardized document format, simultaneously updating and overwriting the test results in real time to the system line loss parameter configuration file (Loss File); secondly, based on pre-configured power thresholds, line loss thresholds, and other judgment indicators, it completes a binary judgment (PASS / FAIL) of the test results compliance. Furthermore, this module supports configurable calibration cycles, with a control period ranging from 1 day to 6 months, which can be flexibly set according to production line rhythm and equipment calibration needs. Simultaneously, test data, judgment results, and calibration records are synchronously uploaded to the factory's Manufacturing Execution System (MES) via a local area network communication link, achieving online closed-loop control of the testing process. This design effectively avoids production risks caused by non-systematic errors such as human error, ensuring the standardization and reliability of the production line testing process.

[0118] The technical solution of this application processes N sets of test signals continuously acquired by the device under test to obtain N sets of values ​​corresponding to the N sets of test signals. A target power value is generated based on the N sets of power values. A target line loss value is generated by the target power value and a preset power value. The device under test is then calibrated based on the target line loss value, thereby achieving accurate testing of the device under test and accurate calibration of the device under test after testing.

[0119] See Figure 4 , Figure 4 This is a structural diagram of the calibration device of the equipment provided in the embodiments of this application, such as... Figure 4 The calibration device 400 of the device shown includes:

[0120] Processing module 410 is used to process N sets of test signals continuously collected by the device under test to obtain N sets of power values ​​corresponding to the N sets of test signals, where N is a positive integer, and the N sets of test signals are used to test the device under test;

[0121] The generation module 420 is used to generate a target power value based on the N sets of power values, wherein the target power value is used to reflect the magnitude of the difference between the N sets of power values;

[0122] Calculation module 430 is used to perform differential calculation on the target power value and the preset power value to obtain the offset;

[0123] The correction module 440 is used to generate a target line loss value based on the offset, and to correct the device under test based on the target line loss value, wherein the target line loss value is used to represent the transmission loss of the device under test.

[0124] Optionally, the power generation module 420 includes:

[0125] The verification submodule is used to verify the validity of the N sets of power values ​​respectively, and obtain N verification results corresponding to the N sets of power values. The verification results are used to indicate whether the corresponding power value is valid.

[0126] The filtering submodule is used to filter the N groups of power values ​​according to the N verification results to obtain M groups of effective power values. The effective power value is the power value whose verification result is valid among the N groups of power values, and M is a positive integer less than or equal to N.

[0127] The second calculation submodule is used to calculate the average of the M groups of effective power values ​​to obtain the target power value.

[0128] Optionally, the calibration module 440 includes:

[0129] The acquisition submodule is used to acquire the historical line loss value corresponding to the device under test;

[0130] The addition submodule is used to add the offset to the historical line loss value to obtain the target line loss value;

[0131] The calibration submodule is used to adjust the current line loss value of the device under test to the target line loss value in order to calibrate the device under test.

[0132] Optional, also includes:

[0133] The determination module is used to determine the preset test plan corresponding to the device under test, wherein the preset test plan includes the test process of the N sets of test signals that need to be collected by the device under test during the test;

[0134] The configuration module is used to configure test parameters according to the preset test plan. The test parameters include at least one of the following: the operating frequency of the device under test, the communication channel number of the device under test, the communication standard of the device under test, and the signal power level of the device under test.

[0135] A connection module is used to control the test equipment to establish a communication connection with the device under test based on the test parameters, wherein the test equipment is used to test the device under test;

[0136] The transmitting module is used to control the test equipment to send the N sets of test signals to the device under test.

[0137] Optionally, the connection module includes:

[0138] A placement submodule is used to place the device under test (DUT) inside a coupling shielding box, which is used to shield the DUT from interference signals received by the DUT.

[0139] The configuration submodule is used to initialize the device under test and the test device.

[0140] The first control submodule is used to control the test device to establish a communication connection with the device under test based on the test parameters after the device under test and the test device have completed their initialization settings.

[0141] Optionally, the sending module includes:

[0142] The first control submodule is used to control the test equipment to load the preset test scheme to generate N radio frequency power signals;

[0143] The processing submodule is used to demodulate the N radio frequency power signals sequentially to obtain the processed N radio frequency power signals;

[0144] The conversion submodule is used to acquire data and perform analog-to-digital conversion on the processed N radio frequency power signals to obtain the N sets of test signals;

[0145] The second control submodule is used to control the test equipment to send the N sets of test signals to the device under test.

[0146] Optionally, the first control submodule includes:

[0147] The acquisition unit is used to acquire system information of the test device after the device under test and the test device have completed the initialization settings. The system information includes at least one of the following: motherboard serial number, hardware version number, software version number, memory size, remaining battery power, standard information, and operating frequency band.

[0148] The control unit is used to control the test equipment to establish a communication connection with the device under test based on the test parameters and the system information.

[0149] Optionally, the test signal includes: total radiated power, and / or, total isotropic sensitivity.

[0150] The technical solution of this application processes N sets of test signals continuously acquired by the device under test to obtain N sets of values ​​corresponding to the N sets of test signals. A target power value is generated based on the N sets of power values. A target line loss value is generated by the target power value and a preset power value. The device under test is then calibrated based on the target line loss value, thereby achieving accurate testing of the device under test and accurate calibration of the device under test after testing.

[0151] Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application, such as... Figure 5 As shown, the electronic device 500 includes a memory 510 and a processor 520. The number of processors 520 in the electronic device 500 can be one or more. Figure 5 Taking a processor 520 as an example; the memory 510 and processor 520 in the server can be connected via a bus or other means. Figure 5 Taking the example of a connection between China and Israel via a bus.

[0152] The memory 510, as a computer-readable storage medium, can be used to store software programs, computer-executable programs, and modules, such as the program instructions / modules corresponding to the title generation method in the embodiments of this application. The processor 520 executes various functional applications and data processing of the server / terminal / server by running the software programs, instructions, and modules stored in the memory 510, thereby realizing the above-mentioned device calibration method.

[0153] The processor 520 is used to run the computer program stored in the memory 510, and performs the following steps:

[0154] The N sets of test signals continuously collected from the device under test are processed to obtain N sets of power values ​​corresponding to the N sets of test signals, where N is a positive integer, and the N sets of test signals are used to test the device under test;

[0155] Based on the N sets of power values, a target power value is generated, which reflects the magnitude of the difference between the N sets of power values.

[0156] The offset is obtained by performing a difference calculation between the target power value and the preset power value;

[0157] A target line loss value is generated based on the offset, and the device under test is corrected based on the target line loss value, wherein the target line loss value represents the transmission loss of the device under test.

[0158] Optionally, generating the target power value based on the N sets of power values ​​includes:

[0159] The validity of the N sets of power values ​​is verified respectively, and N verification results are obtained for each of the N sets of power values. The verification results are used to indicate whether the corresponding power value is valid.

[0160] The N power values ​​are filtered based on the N verification results to obtain M effective power values. The effective power values ​​are the power values ​​whose verification results are valid among the N power values, and M is a positive integer less than or equal to N.

[0161] The target power value is obtained by calculating the mean of the M groups of effective power values.

[0162] Optionally, the step of generating a target line loss value based on the offset and calibrating the device under test based on the target line loss value includes:

[0163] Obtain the historical line loss value corresponding to the device under test;

[0164] The target line loss value is obtained by adding the offset to the historical line loss value.

[0165] The current line loss value of the device under test is adjusted to the target line loss value in order to calibrate the device under test.

[0166] Optionally, before processing the N sets of test signals continuously acquired by the device under test to obtain the N sets of power values ​​corresponding to the N sets of test signals, the method further includes:

[0167] Determine the preset test plan corresponding to the device under test, wherein the preset test plan includes the test process of the N sets of test signals that need to be collected by the device under test during the test;

[0168] According to the preset test plan, test parameters are configured, and the test parameters include at least one of the following: the operating frequency of the device under test, the communication channel number of the device under test, the communication standard of the device under test, and the signal power level of the device under test;

[0169] Based on the test parameters, the test equipment is controlled to establish a communication connection with the device under test, and the test equipment is used to test the device under test;

[0170] The test equipment is controlled to send the N sets of test signals to the device under test.

[0171] Optionally, the step of controlling the test equipment to establish a communication connection with the device under test based on the test parameters includes:

[0172] The device under test is placed inside a coupling shielding box, which is used to shield the interference signals received by the device under test.

[0173] Perform initialization settings on the device under test and the test equipment;

[0174] Once the device under test and the testing equipment have completed their initialization settings, the testing equipment is controlled to establish a communication connection with the device under test based on the test parameters.

[0175] Optionally, controlling the test device to send the N sets of test signals to the device under test includes:

[0176] The test equipment is controlled to load the preset test scheme to generate N radio frequency power signals;

[0177] The N radio frequency power signals are demodulated sequentially to obtain the processed N radio frequency power signals;

[0178] Data acquisition and analog-to-digital conversion are performed on the processed N radio frequency power signals to obtain the N sets of test signals;

[0179] The test equipment is controlled to send the N sets of test signals to the device under test.

[0180] Optionally, the step of controlling the test device to establish a communication connection with the device under test based on the test parameters after the initialization settings of the device under test and the test device are completed includes:

[0181] Once the device under test and the test device have completed their initialization settings, the system information of the test device is obtained. The system information includes at least one of the following: motherboard serial number, hardware version number, software version number, memory size, remaining battery power, network standard information, and operating frequency band.

[0182] Based on the test parameters and the system information, the test equipment is controlled to establish a communication connection with the device under test.

[0183] Optionally, the test signal includes: total radiated power, and / or, total isotropic sensitivity.

[0184] The technical solution of this application processes N sets of test signals continuously acquired by the device under test to obtain N sets of values ​​corresponding to the N sets of test signals. A target power value is generated based on the N sets of power values. A target line loss value is generated by the target power value and a preset power value. The device under test is then calibrated based on the target line loss value, thereby achieving accurate testing of the device under test and accurate calibration of the device under test after testing.

[0185] Those skilled in the art will understand that all or part of the steps of the methods described in the above embodiments can be implemented by hardware related to program instructions, and the program can be stored in a readable medium.

[0186] This disclosure also provides a readable storage medium storing a computer program, which, when executed by a processor, can perform the above-described functions. Figure 1 Any step in the corresponding method embodiment can achieve the same technical effect, and will not be repeated here to avoid repetition.

[0187] The computer-readable storage medium of this disclosure can be any combination of one or more computer-readable media. The computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. For example, a computer-readable storage medium can be an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples (a non-exhaustive list) of computer-readable storage media include: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this document, a computer-readable storage medium can be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, apparatus, or device.

[0188] Computer-readable signal media may include data signals propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media may also be any computer-readable medium other than computer-readable storage media, capable of sending, propagating, or transmitting programs for use by or in connection with an instruction execution system, apparatus, or device.

[0189] The program code contained on the storage medium can be transmitted using any suitable medium, including but not limited to wireless, wire, optical fiber, RF, etc., or any suitable combination thereof.

[0190] Computer program code for performing the operations of this disclosure can be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, and C++, and conventional procedural programming languages ​​such as the "C" language or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or terminal. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network—including a local area network (LAN) or a wide area network (WAN)—or can be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0191] The above description represents the preferred embodiments of this disclosure. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principles described herein, and these improvements and modifications should also be considered within the scope of protection of this disclosure.

Claims

1. A calibration method for a device, characterized in that, The method includes: The N sets of test signals continuously collected from the device under test are processed to obtain N sets of power values ​​corresponding to the N sets of test signals, where N is a positive integer, and the N sets of test signals are used to test the device under test; Based on the N sets of power values, a target power value is generated, which reflects the magnitude of the difference between the N sets of power values. The offset is obtained by performing a difference calculation between the target power value and the preset power value; A target line loss value is generated based on the offset, and the device under test is corrected based on the target line loss value, wherein the target line loss value represents the transmission loss of the device under test.

2. The method according to claim 1, characterized in that, The step of generating a target power value based on the N sets of power values ​​includes: The validity of the N sets of power values ​​is verified respectively, and N verification results are obtained for each of the N sets of power values. The verification results are used to indicate whether the corresponding power value is valid. The N power values ​​are filtered based on the N verification results to obtain M effective power values. The effective power values ​​are the power values ​​whose verification results are valid among the N power values, and M is a positive integer less than or equal to N. The target power value is obtained by calculating the mean of the M groups of effective power values.

3. The method according to claim 1, characterized in that, The step of generating a target line loss value based on the offset and calibrating the device under test based on the target line loss value includes: Obtain the historical line loss value corresponding to the device under test; The target line loss value is obtained by adding the offset to the historical line loss value. The current line loss value of the device under test is adjusted to the target line loss value in order to calibrate the device under test.

4. The method according to claim 1, characterized in that, Before processing the N sets of test signals continuously acquired by the device under test to obtain the N sets of power values ​​corresponding to the N sets of test signals, the method further includes: Determine the preset test plan corresponding to the device under test, wherein the preset test plan includes the test process of the N sets of test signals that need to be collected by the device under test during the test; According to the preset test plan, test parameters are configured, and the test parameters include at least one of the following: the operating frequency of the device under test, the communication channel number of the device under test, the communication standard of the device under test, and the signal power level of the device under test; Based on the test parameters, the test equipment is controlled to establish a communication connection with the device under test, and the test equipment is used to test the device under test; The test equipment is controlled to send the N sets of test signals to the device under test.

5. The method according to claim 4, characterized in that, The step of controlling the test equipment to establish a communication connection with the device under test based on the test parameters includes: The device under test is placed inside a coupling shielding box, which is used to shield the interference signals received by the device under test. Perform initialization settings on the device under test and the test equipment; Once the device under test and the testing equipment have completed their initialization settings, the testing equipment is controlled to establish a communication connection with the device under test based on the test parameters.

6. The method according to claim 4, characterized in that, The step of controlling the test device to send the N sets of test signals to the device under test includes: The test equipment is controlled to load the preset test scheme to generate N radio frequency power signals; The N radio frequency power signals are demodulated sequentially to obtain the processed N radio frequency power signals; Data acquisition and analog-to-digital conversion are performed on the processed N radio frequency power signals to obtain the N sets of test signals; The test equipment is controlled to send the N sets of test signals to the device under test.

7. The method according to claim 5, characterized in that, The step of controlling the test device to establish a communication connection with the device under test based on the test parameters after the initialization settings of the device under test and the test device are completed includes: Once the device under test and the test device have completed their initialization settings, the system information of the test device is obtained. The system information includes at least one of the following: motherboard serial number, hardware version number, software version number, memory size, remaining battery power, network standard information, and operating frequency band. Based on the test parameters and the system information, the test equipment is controlled to establish a communication connection with the device under test.

8. The method according to any one of claims 1-7, characterized in that, The test signal includes: total radiated power, and / or, total isotropic sensitivity.

9. A calibration device for an equipment, characterized in that, The device includes: The processing module is used to process N sets of test signals continuously collected by the device under test to obtain N sets of power values ​​corresponding to the N sets of test signals, where N is a positive integer, and the N sets of test signals are used to test the device under test. The generation module is used to generate a target power value based on the N sets of power values, wherein the target power value is used to reflect the difference between the N sets of power values; The calculation module is used to perform differential calculation on the target power value and the preset power value to obtain the offset; The correction module is used to generate a target line loss value based on the offset, and to correct the device under test based on the target line loss value, wherein the target line loss value is used to represent the transmission loss of the device under test.

10. An electronic device, characterized in that, include: A processor, a memory, and a program stored in the memory and executable on the processor, wherein the program, when executed by the processor, implements the steps of the method as described in any one of claims 1 to 8.

11. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the method as described in any one of claims 1 to 8.

12. A computer program product, characterized in that, Includes computer instructions that, when executed by a processor, implement the steps of the method as described in any one of claims 1 to 8.

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