A molten salt heat storage material testing method, apparatus, medium, and product

Abstract

The application discloses a molten salt heat storage material testing method, device, medium and product, relates to the technical field of metal material analysis, and aims to solve the problem of low testing precision of the molten salt heat storage material. The molten salt heat storage material testing method comprises the following steps: repeatedly executing an iteration step until the cumulative amount of a degradation comprehensive index of the molten salt heat storage material reaches a first preset threshold value and / or a physical property parameter of the molten salt heat storage material reaches a second preset threshold value, and outputting cycle data in the process of executing the iteration step. According to the corresponding cycle number of each degradation stage, the testing life of the molten salt heat storage material is obtained. According to at least one of the initial sampling time, the rate sensitivity coefficient, the impact resistance coefficient, the actual test temperature fluctuation range of each degradation stage and the cycle data, the testing life of the molten salt heat storage material is corrected to obtain the cycle life of the molten salt heat storage material.

Description

Technical Field

[0001] This application relates to the field of metal material analysis technology, and in particular to a testing method, equipment, medium and product for molten salt thermal storage materials. Background Technology

[0002] Hybrid molten salt thermal energy storage materials, as a core component of oil pipeline terminal thermal energy storage systems, play a crucial role in efficiently storing and stably releasing energy, and ensuring a continuous supply of heat energy during oil transportation. Cycle life testing of hybrid molten salt thermal energy storage materials is an important method for evaluating their stability and reliability, providing crucial theoretical basis for the design and maintenance of oil pipeline terminal thermal energy storage systems. Currently, a fixed test temperature fluctuation range and sampling time can be used to test the cycle life of hybrid molten salt thermal energy storage materials.

[0003] However, when testing the cycle life of mixed molten salt thermal storage materials using a fixed test temperature fluctuation range and sampling time, the test accuracy of molten salt thermal storage materials is low. Summary of the Invention

[0004] The purpose of this application is to provide a testing method, equipment, medium, and product for molten salt thermal storage materials, aiming to solve the problem of low testing accuracy of molten salt thermal storage materials.

[0005] To achieve the above objectives, this application adopts the following technical solution: In a first aspect, this application provides a testing method for molten salt thermal storage materials, comprising: repeatedly executing iterative steps until the cumulative amount of the comprehensive deterioration index of the molten salt thermal storage material reaches a first preset threshold and / or the physical property parameters of the molten salt thermal storage material reach a second preset threshold, and outputting cyclic data during the execution of the iterative steps. The iterative steps include: acquiring the current physical property parameters, determining the current comprehensive deterioration index based on the current physical property parameters, determining the current deterioration stage based on the current comprehensive deterioration index, and adjusting the test temperature fluctuation range and / or sampling time for the next cycle according to the current deterioration stage. The adjusted test temperature fluctuation range and / or sampling time are used to update the physical property parameters in the next cycle and update the comprehensive deterioration index based on the updated physical property parameters. The cyclic data includes: the corresponding number of cycles for each deterioration stage, the actual test temperature fluctuation range for each cycle, and the sampling time for each cycle.

[0006] The test life of the molten salt thermal storage material is obtained based on the number of cycles corresponding to each stage of degradation.

[0007] The rate sensitivity coefficient, shock resistance coefficient, and actual test temperature fluctuation range of each stage of the molten salt thermal storage material are obtained. Based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range of each degradation stage, and cycle data, the test life of the molten salt thermal storage material is corrected to obtain the cycle life of the molten salt thermal storage material.

[0008] The molten salt thermal storage material testing method provided in this application firstly executes an iterative step, determining the current degradation stage based on the cumulative degradation index, and then adjusting the test temperature fluctuation range and / or sampling time for the next cycle according to the current degradation stage. Under the adjusted conditions, the physical property parameters are updated and the degradation index is recalculated. This adaptive adjustment mechanism can adapt to the real-time operating conditions of the molten salt thermal storage material, solving the problem in related technologies where fixed test temperature fluctuation ranges and sampling times lead to the inability to detect important time points of material degradation in a timely manner, resulting in poor test accuracy. This improves the test accuracy of cycle life testing.

[0009] Secondly, by repeatedly executing the iterative steps until the cumulative amount of the comprehensive degradation index reaches the first preset threshold and / or the physical property parameters reach the second preset threshold, the loop data is output. In this way, the test can be terminated when any condition is met, ensuring the accuracy and robustness of the failure point determination.

[0010] Finally, the rate sensitivity coefficient, shock resistance coefficient, and actual test temperature fluctuation ranges for each stage are obtained. Combined with the initial sampling time and cycle data, the test life is corrected to obtain the cycle life. Specifically, the rate sensitivity coefficient reflects the material's sensitivity to the rate of temperature change and is used to correct life deviations caused by differences in temperature change rates. The shock resistance coefficient reflects the material's tolerance to temperature shocks and is used to correct life deviations caused by differences in temperature fluctuation amplitudes. Considering the rate sensitivity coefficient and shock resistance coefficient ensures that the corrected cycle life accurately reflects the true cycle life in actual application scenarios. The actual test temperature fluctuation ranges for each stage record the actual fluctuation ranges at each degradation stage and are used to correct the deviation between theoretical setpoints and actual values, eliminating test condition deviations caused by equipment control precision, environmental interference, etc. Based on the actual cycle data during the test, multi-dimensional and stage-by-stage fine-tuning of the test life can improve the accuracy of the final output cycle life. In summary, this improves the testing accuracy of molten salt thermal storage materials.

[0011] In some embodiments, the number of physical property parameters is multiple, and the comprehensive degradation index is calculated based on the physical property parameters, including: Multiple physical property parameters are normalized to obtain each normalized physical property parameter, and the weight corresponding to each normalized physical property parameter is obtained.

[0012] The overall degradation index is calculated based on each normalized physical property parameter and its corresponding weight.

[0013] In some embodiments, determining the current degradation stage based on a comprehensive degradation index includes: Obtain a first partitioning threshold and a second partitioning threshold, wherein the first partitioning threshold is less than the second partitioning threshold.

[0014] If the overall degradation index is less than or equal to the first threshold, the current degradation stage is considered to be a stable stage.

[0015] If the overall degradation index is greater than the first threshold and less than or equal to the second threshold, the current degradation stage is a stable degradation stage.

[0016] If the overall degradation index is greater than the second threshold, the current degradation stage is the accelerated degradation stage.

[0017] In some embodiments, adjusting the test temperature fluctuation range and / or sampling time for the next cycle according to the current degradation stage includes: Obtain the initial sampling time and the initial test temperature fluctuation range. When the molten salt thermal storage material is in a stable phase, the sampling time of the next cycle is extended based on the initial sampling time, and the test temperature fluctuation range of the next cycle is maintained as the initial test temperature fluctuation range.

[0018] When the molten salt thermal storage material is in a stable deterioration stage, the sampling time of the next cycle is maintained as the initial sampling time, and the test temperature fluctuation range of the next cycle is maintained as the initial test temperature fluctuation range.

[0019] When the molten salt thermal storage material is in the accelerated deterioration stage, the sampling time of the next cycle is shortened based on the initial sampling time, and the test temperature fluctuation range of the next cycle is expanded based on the initial test temperature fluctuation range.

[0020] In some embodiments, the test life of the molten salt thermal storage material is corrected based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cycle data, to obtain the cycle life of the molten salt thermal storage material, including: The target coefficient is obtained based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cyclic data. The target coefficient includes a compensation coefficient and / or a basic equivalent coefficient. The compensation coefficient is used to correct time-related factors in the test life, and the basic equivalent coefficient is used to correct temperature-related factors in the test life. The compensation coefficient includes an extension compensation coefficient and a shortening compensation coefficient.

[0021] Based on the corresponding number of cycles and target coefficients for each degradation stage, the test life is corrected to obtain the cycle life of the molten salt thermal storage material.

[0022] In some embodiments, the target coefficient is obtained based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cyclic data: The compensation coefficient is calculated based on the initial sampling time, the sampling time corresponding to each cycle, the rate sensitivity coefficient, and the impact resistance coefficient.

[0023] In some embodiments, the target coefficient is obtained based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cyclic data: Based on the actual test temperature fluctuation range of each degradation stage and the actual test temperature fluctuation range of each cycle, the basic equivalent coefficients of each degradation stage are obtained.

[0024] Secondly, a testing device for molten salt thermal storage materials is provided, comprising: a processing unit and an acquisition unit.

[0025] The processing unit is used to repeatedly execute the iterative steps until the cumulative amount of the comprehensive degradation index of the molten salt thermal storage material reaches a first preset threshold and / or the physical property parameters of the molten salt thermal storage material reach a second preset threshold, and outputs the cyclic data during the execution of the iterative steps. The iterative steps include: acquiring the current physical property parameters, determining the current comprehensive degradation index based on the current physical property parameters, determining the current degradation stage based on the current comprehensive degradation index, and adjusting the test temperature fluctuation range and / or sampling time for the next cycle according to the current degradation stage. The adjusted test temperature fluctuation range and / or sampling time are used to update the physical property parameters in the next cycle and update the comprehensive degradation index based on the updated physical property parameters. The cyclic data includes: the corresponding number of cycles for each degradation stage, the actual test temperature fluctuation range for each cycle, and the corresponding sampling time for each cycle.

[0026] The processing unit is also used to obtain the test life of the molten salt thermal storage material based on the number of cycles corresponding to each degradation stage.

[0027] The acquisition unit is used to acquire the rate sensitivity coefficient, impact resistance coefficient, and actual test temperature fluctuation range of the molten salt thermal storage material at each stage.

[0028] The processing unit is also used to correct the test life of the molten salt thermal storage material based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range of each degradation stage, and cycle data, so as to obtain the cycle life of the molten salt thermal storage material.

[0029] Thirdly, an electronic device is provided, including a memory and a processor; the memory is used to store computer-executed instructions, and the processor is connected to the memory via a bus; when the retrieval enhancement generation molten salt thermal storage material testing device is running, the processor executes the computer-executed instructions stored in the memory, so that the retrieval enhancement generation molten salt thermal storage material testing device performs the molten salt thermal storage material testing method of the first aspect.

[0030] The molten salt thermal storage material testing device can be a network device, or a component of a network device, such as a chip system within the network device. This chip system supports the network device in implementing the functions involved in the first aspect and any of its embodiments, such as acquiring, determining, and transmitting data and / or information involved in the aforementioned molten salt thermal storage material testing method. The chip system includes a chip, but may also include other discrete devices or circuit structures.

[0031] Fourthly, a computer-readable storage medium is provided, comprising computer-executable instructions that, when executed on a computer, cause the computer to perform the molten salt thermal storage material testing method of the first aspect.

[0032] Fifthly, a computer program product is also provided, which includes computer instructions that, when executed on a molten salt thermal storage material testing device, cause the molten salt thermal storage material testing device to perform the molten salt thermal storage material testing method as described in the first aspect above.

[0033] It should be noted that the aforementioned computer instructions may be stored, in whole or in part, on a computer-readable storage medium. This computer-readable storage medium may be packaged together with the processor of the molten salt thermal storage material testing device, or it may be packaged separately from the processor of the molten salt thermal storage material testing device; this application does not limit this.

[0034] The descriptions of the second, third, fourth, and fifth aspects of this application can be referenced to the detailed description of the first aspect.

[0035] In the embodiments of this application, the name of the aforementioned molten salt thermal storage material testing device does not limit the equipment or functional module itself. In actual implementation, these devices or functional modules may appear under other names. For example, the receiving unit may also be called a receiving module, receiver, etc. As long as the function of each device or functional module is similar to that of this application, it falls within the scope of the claims of this application and its equivalents. Attached Figure Description

[0036] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0037] Figure 1 This is a schematic diagram of the structure of a molten salt thermal storage material testing system provided in an embodiment of this application; Figure 2 This is a schematic diagram of another molten salt thermal storage material testing system provided in an embodiment of this application; Figure 3 A flowchart illustrating a testing method for molten salt thermal storage materials provided in this application embodiment; Figure 4 A flowchart illustrating an iterative process provided in an embodiment of this application; Figure 5 A schematic diagram of a process for determining the deterioration stage of a mixed molten salt thermal storage material, provided for an embodiment of this application; Figure 6 This is a schematic diagram of a molten salt thermal storage material testing device provided in an embodiment of this application. Detailed Implementation

[0038] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0039] In the description of this application, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, unless otherwise stated, "multiple" means two or more.

[0040] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," and "communication" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection. They can refer to a direct connection or an indirect connection through an intermediate medium, or a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0041] In embodiments of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, article, or apparatus that includes that element.

[0042] In the embodiments of this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any embodiment or design that is described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design. Specifically, the use of the terms "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0043] In related technologies, cycle life testing of mixed molten salt thermal storage materials used in oil pipeline stations typically employs a fixed test temperature fluctuation range and sampling time, adjusting the test life based on the test temperature fluctuation range and the actual test temperature fluctuation range. However, the cycle life testing methods in these technologies have the following problems: they cannot adjust the test temperature fluctuation range and sampling time according to the degradation stage of the mixed molten salt thermal storage material, resulting in low accuracy in the cycle life test of mixed molten salt thermal storage materials.

[0044] To address the aforementioned issues, this application provides a testing method for molten salt thermal storage materials. It designs a method and apparatus for determining the crack initiation time of pipe circumferential welds based on cross-sectional analysis of circumferential weld fracture and analysis of oxidation products at the fracture surface. By analyzing the cross-sectional analysis of the crack in the pipe circumferential weld and the analysis of oxidation products at the crack fracture surface, the formation and development time of the crack in the pipe circumferential weld is determined. This method is simple in process, uses convenient equipment, and requires less expertise from analysts. It can accurately obtain the formation and development time of circumferential weld cracks, which helps to take corresponding control measures, control the risk of circumferential weld failure, and provide targeted measures to reduce crack generation.

[0045] The above-mentioned testing method for molten salt thermal storage materials can be applied to molten salt thermal storage material testing systems. Figure 1 This is a schematic diagram of a molten salt thermal storage material testing system provided in an embodiment of this application. Figure 1 As shown, the molten salt thermal storage material testing system includes: sensor 101 and electronic device 102.

[0046] The sensor 101 is used to collect the physical property parameters of the molten salt thermal storage material according to the test temperature fluctuation range and / or sampling time.

[0047] Electronic device 102 is used to repeatedly execute the iterative steps until the cumulative amount of the comprehensive deterioration index of the molten salt thermal storage material reaches a first preset threshold and / or the physical property parameters of the molten salt thermal storage material reach a second preset threshold. It outputs the cyclic data during the execution of the iterative steps, obtains the test life of the molten salt thermal storage material based on the corresponding number of cycles for each deterioration stage, and obtains the rate sensitivity coefficient, impact resistance coefficient, and actual test temperature fluctuation range of each stage of the molten salt thermal storage material. Based on at least one of the initial sampling time, rate sensitivity coefficient, impact resistance coefficient, actual test temperature fluctuation range of each deterioration stage, and cyclic data, it corrects the test life of the molten salt thermal storage material to obtain the cycle life of the molten salt thermal storage material.

[0048] The iterative steps include: obtaining the current physical property parameters, determining the current comprehensive degradation index based on the current physical property parameters, determining the current degradation stage based on the current comprehensive degradation index, and adjusting the test temperature fluctuation range and / or sampling time for the next cycle according to the current degradation stage; the adjusted test temperature fluctuation range and / or sampling time are used to update the physical property parameters in the next cycle and update the comprehensive degradation index based on the updated physical property parameters; the cycle data includes: the corresponding cycle number for each degradation stage, the actual test temperature fluctuation range for each cycle, and the corresponding sampling time for each cycle.

[0049] In this embodiment, sensor 101 may include sensors such as a thermal diffusivity acquisition sensor, a high-temperature viscosity acquisition sensor, and an ultrasonic signal acquisition sensor. The thermal diffusivity acquisition sensor may be an infrared temperature sensor, a hot plate sensor, etc., the high-temperature viscosity acquisition sensor may be a falling ball photoelectric velocity sensor, etc., and the ultrasonic signal acquisition sensor may be an external clamp-on non-invasive high-temperature ultrasonic sensor, etc., but this embodiment is not limited in this respect.

[0050] Electronic device 102 can be a physical machine, a base station device, a desktop computer, a server, or a server group composed of multiple servers. This application embodiment does not limit this.

[0051] Figure 2 This is a schematic diagram of another molten salt thermal storage material testing system provided in an embodiment of this application. Figure 2 As shown, the molten salt thermal storage material testing system includes: an exponential solution module, an iterative execution module, a test judgment module, and a lifetime determination module. That is, the above... Figure 1 The electronic device 102 may include: an exponent solving module, an iterative execution module, a test and judgment module, and a lifespan determination module.

[0052] The index calculation module is used to obtain the physical property parameters of molten salt thermal storage materials and calculate the comprehensive deterioration index based on the physical property parameters.

[0053] The iterative execution module is used to repeatedly execute the iterative steps until the cumulative amount of the comprehensive degradation index of the molten salt thermal storage material reaches a first preset threshold and / or the physical property parameters of the molten salt thermal storage material reach a second preset threshold, and outputs the loop data during the execution of the iterative steps. The iterative steps include: obtaining the current physical property parameters, determining the current comprehensive degradation index based on the current physical property parameters, determining the current degradation stage based on the current comprehensive degradation index, and adjusting the test temperature fluctuation range and / or sampling time for the next cycle according to the current degradation stage; the adjusted test temperature fluctuation range and / or sampling time are used to update the physical property parameters in the next cycle and update the comprehensive degradation index based on the updated physical property parameters; the loop data includes: the corresponding number of cycles for each degradation stage, the actual test temperature fluctuation range for each cycle, and the corresponding sampling time for each cycle.

[0054] The test judgment module is used to obtain the test life of molten salt thermal storage material based on the corresponding number of cycles for each degradation stage.

[0055] The life determination module is used to obtain the rate sensitivity coefficient, shock resistance coefficient, and actual test temperature fluctuation range of each stage of the molten salt thermal storage material. Based on at least one of the initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range of each degradation stage, and cycle data, the test life of the molten salt thermal storage material is corrected to obtain the cycle life of the molten salt thermal storage material.

[0056] It should be pointed out that, Figure 1 and Figure 2 The structure shown does not constitute a limitation on the testing system for this molten salt thermal storage material, except... Figure 1 and Figure 2 In addition to the components shown, the molten salt thermal storage material testing system may include more or fewer components than illustrated, or combine certain components, or have different component arrangements.

[0057] The testing method for molten salt thermal storage materials provided in the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0058] The molten salt thermal storage material testing method provided in this application embodiment is applied to... Figure 1 Electronic device 102 in the molten salt thermal storage material testing system shown. For example... Figure 3 As shown, the testing method for this molten salt thermal storage material includes S301-S303: S301. Repeat the iterative steps until the cumulative amount of the comprehensive deterioration index of the molten salt thermal storage material reaches the first preset threshold and / or the physical property parameters of the molten salt thermal storage material reach the second preset threshold, and output the loop data during the execution of the iterative steps. The iterative steps include: obtaining the current physical property parameters, determining the current comprehensive deterioration index based on the current physical property parameters, determining the current deterioration stage based on the current comprehensive deterioration index, and adjusting the test temperature fluctuation range and / or sampling time of the next cycle according to the current deterioration stage; the adjusted test temperature fluctuation range and / or sampling time are used to update the physical property parameters in the next cycle and update the comprehensive deterioration index based on the updated physical property parameters.

[0059] The cyclic data includes: the number of cycles for each degradation stage, the actual test temperature fluctuation range for each cycle, and the sampling time for each cycle.

[0060] Molten salt thermal storage materials can also be called hybrid molten salt thermal storage materials. The physical properties of hybrid molten salt thermal storage materials may include: thermal diffusivity, high-temperature viscosity, and ultrasonic signal. The degradation stages include at least one of the following: a stable stage, a steady degradation stage, and an accelerated degradation stage.

[0061] In one possible implementation, during the first iteration, the physical properties of the mixed molten salt thermal storage material can be obtained using the initial sampling time (also known as the base sampling time) and the initial test temperature fluctuation range (also known as the base test temperature fluctuation range). Based on these physical properties, the current comprehensive degradation index is calculated. The current degradation stage is then determined based on the current comprehensive degradation index. The test temperature fluctuation range and sampling time for the next cycle (i.e., the second iteration) are then adjusted according to the current degradation stage.

[0062] Optionally, after obtaining the physical property parameters of the mixed molten salt thermal storage material, the physical property parameters need to be preprocessed. The preprocessing specifically includes: outlier handling, data standardization, missing value imputation, time alignment, and feature smoothing.

[0063] In one possible implementation, during the n1th cycle (i.e., the n1st iteration), after obtaining the degradation index of the current cycle, the degradation stage of the mixed molten salt thermal storage material in the current cycle is determined. The degradation index of the previous n1-1 cycles is reviewed, the actual test temperature fluctuation range and sampling time of the next cycle are determined, and in the next cycle, the updated physical property parameters of the next cycle are obtained based on the actual test temperature fluctuation range and sampling time of the next cycle, and the degradation index of the next cycle is calculated.

[0064] In one possible implementation, when the cumulative amount of the comprehensive degradation index or the physical property parameter is greater than or equal to a preset threshold, the iteration stops and the cycle data of the mixed molten salt thermal storage material in each stage is output.

[0065] The preset thresholds include: the cumulative threshold of the comprehensive degradation index (i.e., the first preset threshold) and the threshold of physical property parameters (i.e., the second preset threshold).

[0066] In this embodiment, the cumulative threshold of the comprehensive degradation index and the threshold of the physical property parameter are obtained through historical data calibration. When the cumulative value of the comprehensive degradation index is greater than or equal to the cumulative threshold of the comprehensive degradation index, or when any physical property parameter is greater than or equal to the corresponding threshold of the physical property parameter, the next cycle is not performed. At the same time, the corresponding number of cycles for each stage of the mixed molten salt thermal storage material, the actual test temperature fluctuation range for each cycle, and the corresponding sampling time are output. The formula for calculating the cumulative value of the comprehensive degradation index (i.e., Formula 2) is as follows: Formula 2; in, This represents the cumulative amount of the overall degradation index. Indicates the first The next loop Indicates the first The sampling time for each cycle.

[0067] For example, such as Figure 4 The diagram shows a flowchart of the iterative process for executing the above iterative steps. The iteration begins by calculating the current cycle degradation index. Then, based on the current cycle degradation index, the current degradation stage, the test temperature fluctuation range for the next cycle, and the sampling time are determined. Further, the physical property parameters are updated in the next cycle. Further, it is determined whether the cumulative degradation index or the physical property parameter has reached a preset threshold. If so, the cycle data is output; otherwise, the current cycle degradation index is recalculated.

[0068] S302. The test life of the molten salt thermal storage material is obtained based on the number of cycles corresponding to each deterioration stage.

[0069] In one possible implementation, the test life of the mixed molten salt thermal storage material can be obtained by summing up the corresponding cycle counts for each stage.

[0070] S303. Obtain the rate sensitivity coefficient, impact resistance coefficient, and actual test temperature fluctuation range of each stage of the molten salt thermal storage material. Based on at least one of the initial sampling time, rate sensitivity coefficient, impact resistance coefficient, actual test temperature fluctuation range of each degradation stage, and cycle data, correct the test life of the molten salt thermal storage material to obtain the cycle life of the molten salt thermal storage material.

[0071] In one possible implementation, the rate sensitivity coefficient, shock resistance coefficient, and actual test temperature fluctuation range of the mixed molten salt thermal storage material can be obtained. Based on the basic sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range of each stage, and cycle data, the test life of the mixed molten salt thermal storage material can be corrected to obtain the cycle life of the mixed molten salt thermal storage material.

[0072] Optionally, after obtaining the rate sensitivity coefficient, shock resistance coefficient, and actual temperature fluctuation range of the mixed molten salt thermal storage material, the data needs to be preprocessed. The preprocessing specifically includes: outlier handling, data standardization, missing value imputation, time alignment, and feature smoothing.

[0073] This embodiment determines the degradation stage of the mixed molten salt thermal storage material by calculating a comprehensive degradation index. Based on the degradation stage, the test temperature fluctuation range and sampling time are adjusted in real time. Simultaneously, the test life is corrected by combining the rate sensitivity coefficient, shock resistance coefficient, and actual temperature fluctuation range. This solves the problem in existing technologies where fixed test temperature fluctuation ranges and sampling times lead to the inability to promptly detect critical degradation points and poor test accuracy. It improves the accuracy of cycle life testing by considering the rate sensitivity coefficient and shock resistance coefficient, ensuring that the corrected cycle life accurately reflects the true cycle life under actual application scenarios.

[0074] In some embodiments of this application, there are multiple physical property parameters, and the "calculate the comprehensive degradation index based on the physical property parameters" in S301 above specifically includes S401-S402: S401. Normalize multiple physical property parameters to obtain each normalized physical property parameter, and obtain the weight corresponding to each normalized physical property parameter.

[0075] In other words, the physical property parameters of the obtained mixed molten salt thermal storage material can be normalized and weights can be dynamically allocated to obtain the normalized physical property parameters and corresponding weights.

[0076] In one possible implementation, the physical property parameters can be normalized and converted into dimensionless relative degradation rates. By using sliding window trend analysis and dynamic weight adjustment, the weights can be dynamically allocated to obtain the normalized physical property parameters and their corresponding weights.

[0077] S402. Calculate the comprehensive deterioration index based on each normalized physical property parameter and its corresponding weight.

[0078] In one possible implementation, the core calculation formula for the overall degradation index (i.e., Formula 1) is as follows: Formula 1; in, Represents the rate of degradation of the thermal diffusivity. Represents viscosity degradation rate. This represents the rate of ultrasonic signal degradation. Represents thermal conductivity weight. Represents liquidity weight. Represents the phase separation weight, and satisfies .

[0079] In other words, since different physical properties vary greatly, normalization can unify the data range and prevent a single parameter value from dominating the evaluation. Setting corresponding weights can match the inconsistent degradation rates of different physical properties under long-term high-temperature service in mixed molten salt, and the weight allocation is more in line with the actual degradation mechanism. This makes the calculated comprehensive degradation index more accurate.

[0080] In one possible implementation, a basic sampling time and a basic test temperature fluctuation range can be set, and a first and a second classification threshold can be preset. Based on the comprehensive degradation index, the basic sampling time, and the basic test temperature fluctuation range, and using the first and second classification thresholds, the degradation stage of the mixed molten salt thermal storage material can be divided into a stable stage, a steady degradation stage, and an accelerated degradation stage.

[0081] The basic sampling time, the first division threshold, and the second division threshold can be obtained from simulation experiments by those skilled in the art or set according to actual conditions, and the basic test temperature fluctuation range is obtained through simulation of actual working conditions.

[0082] In some embodiments of this application, the "determining the current degradation stage based on the comprehensive degradation index" in S302 above specifically includes S501, and S502, S503, or S504: S501. Obtain the first division threshold and the second division threshold, wherein the first division threshold is less than the second division threshold.

[0083] S502. When the overall degradation index is less than or equal to the first classification threshold, the current degradation stage is a stable stage.

[0084] S503. When the comprehensive degradation index is greater than the first classification threshold and less than or equal to the second classification threshold, the current degradation stage is a stable degradation stage.

[0085] S504. When the overall degradation index is greater than the second classification threshold, the current degradation stage is the accelerated degradation stage.

[0086] In other words, when the comprehensive degradation index of the mixed molten salt thermal storage material is less than or equal to the first threshold, the mixed molten salt thermal storage material is in a stable stage. When the comprehensive degradation index is greater than the first threshold but less than or equal to the second threshold, it is in a steady degradation stage. When the comprehensive degradation index is greater than the second threshold, it is in an accelerated degradation stage.

[0087] For example, such as Figure 5 The flowchart shown illustrates the process of determining the degradation stages of a mixed molten salt thermal storage material. First, it is determined whether the comprehensive degradation index is less than or equal to a first threshold. If yes, the degradation stage of the mixed molten salt thermal storage material is a stable stage; if not, it is further determined whether the comprehensive degradation index is less than or equal to a second threshold. If yes, the degradation stage of the mixed molten salt thermal storage material is a steady degradation stage; if not, the degradation stage of the mixed molten salt thermal storage material is an accelerated degradation stage.

[0088] In some embodiments of this application, in conjunction with the above-described S501-S504, the phrase "adjusting the test temperature fluctuation range and / or sampling time for the next cycle according to the current degradation stage" in S302 specifically includes S601, and S602, S603, or S604: S601. Obtain the initial sampling time and the initial test temperature fluctuation range.

[0089] S602. When the molten salt thermal storage material is in a stable stage, extend the sampling time of the next cycle based on the initial sampling time, and maintain the test temperature fluctuation range of the next cycle as the initial test temperature fluctuation range.

[0090] In one possible implementation, upper and lower limits for sampling time can be set. When the comprehensive degradation index obtained for n1 consecutive cycles is less than or equal to the first threshold (i.e., the molten salt thermal storage material is in a stable stage for n1 consecutive cycles, meaning the current degradation stage includes the degradation stage of the previous n1 cycles), the sampling time for the next cycle is extended based on the base sampling time. When the extended sampling time for the next cycle is greater than or equal to the upper limit, the sampling time for the next cycle is set as the upper limit, maintaining the actual test temperature fluctuation range of the next cycle as the base test temperature fluctuation range. This extends the sampling cycle under continuous stable operating conditions of the molten salt thermal storage material, effectively reducing sampling frequency, equipment wear, and energy consumption. The upper limit constraint on sampling time prevents missed degradation data due to excessively long cycles. Simultaneously, maintaining a constant temperature fluctuation range ensures the consistency of test data and the accuracy of degradation evaluation.

[0091] S603. When the molten salt thermal storage material is in a stable deterioration stage, the sampling time of the next cycle shall be maintained as the initial sampling time, and the test temperature fluctuation range of the next cycle shall be maintained as the initial test temperature fluctuation range.

[0092] In one possible implementation, when the comprehensive degradation index obtained after n1 consecutive cycles is greater than the first threshold and less than or equal to the second threshold (i.e., the molten salt thermal storage material is in a stable degradation stage for n1 consecutive cycles, meaning the current degradation stage includes the degradation stage of the previous n1 cycles), the sampling time and actual test temperature fluctuation range of the next cycle are kept consistent with those of the current cycle. This maintains the sampling duration and temperature control range unchanged during the stable degradation stage, ensuring stable data acquisition density, eliminating sampling and temperature change interference, and achieving continuous and accurate tracking of the molten salt degradation trend.

[0093] S604. When the molten salt thermal storage material is in the accelerated deterioration stage, shorten the sampling time of the next cycle based on the initial sampling time, and expand the test temperature fluctuation range of the next cycle based on the initial test temperature fluctuation range.

[0094] In one possible implementation, when the comprehensive degradation index obtained after n1 consecutive cycles is greater than the second threshold (i.e., the molten salt thermal storage material is in the accelerated degradation stage for n1 consecutive cycles, meaning the current degradation stage includes the degradation stage of the previous n1 cycles), the sampling time for the next cycle is shortened. When the sampling time of the next cycle after the shortening is less than or equal to the lower limit of the sampling time, the sampling time of the next cycle is set as the lower limit of the sampling time, and the basic test temperature fluctuation range is expanded. The actual test temperature fluctuation range of the next cycle is the expanded basic test temperature fluctuation range, and the actual test temperature fluctuation range of each subsequent cycle is fixed as the expanded basic test temperature fluctuation range. In this way, the sampling cycle can be shortened and a lower limit set during the accelerated degradation stage, ensuring that data acquisition is encrypted and no degradation details are missed; the temperature control range is widened and fixed, accelerating the exposure of molten salt aging characteristics and accurately judging the rate of degradation development.

[0095] In some embodiments of this application, the step S303 above, "correcting the test life of the molten salt thermal storage material based on at least one of the initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cycle data, to obtain the cycle life of the molten salt thermal storage material," specifically includes S701-S702: S701. Based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cyclic data, obtain the target coefficient, which includes the compensation coefficient and / or the basic equivalent coefficient.

[0096] The compensation coefficient is used to correct for time-related factors in the test lifespan, while the basic equivalent coefficient is used to correct for temperature-related factors in the test lifespan. The compensation coefficients include extension compensation coefficients and shortening compensation coefficients.

[0097] In one possible implementation, the compensation coefficient and the basic equivalent coefficient can be obtained based on the basic sampling time, the corresponding sampling time of each cycle, the actual test temperature fluctuation range, the rate sensitivity coefficient, the shock resistance coefficient, and the actual temperature fluctuation range of each stage.

[0098] In other words, dual-class target coefficients can be constructed based on multi-dimensional parameters, with compensation coefficients correcting time interference and basic equivalent coefficients correcting temperature interference, thus accurately eliminating lifespan calculation errors caused by temperature and time.

[0099] S702. Based on the corresponding number of cycles and target coefficients for each degradation stage, the test life is corrected to obtain the cycle life of the molten salt thermal storage material.

[0100] In other words, the test life can be corrected by combining the number of segmented cycles with the target coefficient, eliminating the influence of operating condition deviations, and improving the accuracy of calculating the actual cycle life of molten salt.

[0101] In one possible implementation, the test life is corrected based on the compensation coefficient, the basic equivalence coefficient, and the corresponding number of cycles for each stage to obtain the cycle life of the mixed molten salt thermal storage material.

[0102] In this embodiment, the stable phase cycle is divided into multiple parts based on the difference in sampling time. Each part has the same sampling time and actual test temperature fluctuation range. The number of cycles in each part, the basic equivalent coefficient of each part's cycle, and the extension compensation coefficient are multiplied to obtain the equivalent cycle life of each part. The equivalent cycle life of all parts is added together to obtain the equivalent cycle life of the stable phase.

[0103] Based on the difference in sampling time, the accelerated degradation stage is divided into multiple parts. Each part has the same sampling time and actual test temperature fluctuation range. The number of cycles in each part, the basic equivalent coefficient of each part, and the shortening compensation coefficient are multiplied to obtain the equivalent cycle life of each part. The equivalent cycle life of all parts is added together to obtain the equivalent cycle life of the accelerated degradation stage.

[0104] The equivalent cycle life of the mixed molten salt thermal storage material is obtained by adding the equivalent cycle life of the stable phase, the number of cycles in the steady degradation phase, and the equivalent number of cycles in the accelerated degradation phase.

[0105] In some embodiments of this application, the method in S701 above specifically includes S801: S801. Calculate the compensation coefficient based on the initial sampling time, the sampling time corresponding to each cycle, the rate sensitivity coefficient, and the impact resistance coefficient.

[0106] In other words, the extension compensation coefficient and the shortening compensation coefficient can be calculated based on the basic sampling time, the corresponding sampling time of each cycle, the rate sensitivity coefficient, and the impact resistance coefficient.

[0107] In this embodiment, based on the base sampling time, when the sampling time of the current cycle is longer than that of the previous cycle, the quotient of the current cycle's sampling time and the previous cycle's sampling time is reduced by 1 to obtain the sampling time extension ratio for this cycle. The product of the sampling time extension ratio and the rate sensitivity coefficient is then incremented by 1 to obtain the extension compensation coefficient for the current cycle. This extension compensation coefficient is also the extension compensation coefficient for cycles with the same sampling time as the current cycle. That is, a compensation coefficient is generated by combining the sampling duration increase with the rate sensitivity coefficient, and the coefficient is reused within the same sampling period; this quantifies the data sparsity error caused by the extended sampling time and accurately compensates for the interference of time factors on lifetime calculation.

[0108] To address the situation where the sampling time of the current cycle is shorter than that of the previous cycle, the quotient of the current cycle's sampling time and the previous cycle's sampling time is subtracted from 1 to obtain the sampling time reduction ratio. Then, the product of the sampling time prime-even segment ratio and the impact resistance coefficient is subtracted from 1 to obtain the reduction compensation coefficient for the current cycle. This reduction compensation coefficient is also the reduction compensation coefficient for cycles with the same sampling time after the current cycle. In other words, a compensation coefficient is constructed based on the sampling reduction ratio and the impact resistance coefficient, with a unified coefficient for the same period; this offsets the experimental condition disturbance deviations caused by high-frequency dense sampling and avoids distortion in lifetime assessment caused by dense sampling.

[0109] In some embodiments of this application, the method in S701 above specifically includes S901: S901. Based on the actual test temperature fluctuation range of each degradation stage and the actual test temperature fluctuation range of each cycle, the basic equivalent coefficient of each degradation stage is obtained.

[0110] In other words, the basic equivalent coefficients for each stage can be obtained based on the actual temperature fluctuation range of each stage and the actual test temperature fluctuation range of each cycle.

[0111] In this embodiment, the basic equivalent coefficient for each cycle is obtained by dividing the fluctuation amplitude of the actual temperature fluctuation range of each cycle by the fluctuation amplitude of the actual temperature fluctuation range of each stage. That is, the basic equivalent coefficient is constructed based on the temperature amplitude ratio to quantify the temperature difference between a single cycle and the stage benchmark, specifically correct the life error caused by inconsistent temperature fluctuations, unify the life conversion benchmark under different temperature control conditions, and improve the accuracy of molten salt cycle life conversion.

[0112] The foregoing mainly describes the solutions provided by the embodiments of this application from a methodological perspective. To achieve the above functions, it includes corresponding hardware structures and / or software modules for executing each function. Those skilled in the art should readily recognize that, based on the units and algorithm steps of the examples described in conjunction with the embodiments disclosed herein, this application can be implemented in hardware or a combination of hardware and computer software. Whether a function is executed in hardware or by computer software driving hardware depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0113] This application embodiment can divide the molten salt thermal storage material testing device into functional modules according to the above method example. For example, each function can be divided into a separate functional module, or two or more functions can be integrated into one processing module. The integrated module can be implemented in hardware or as a software functional module. Optionally, the module division in this application embodiment is illustrative and only represents one logical functional division; other division methods may be used in actual implementation.

[0114] like Figure 6 The diagram shown is a structural schematic of a molten salt thermal storage material testing device provided in an embodiment of this application. Figure 6 The molten salt thermal storage material testing device shown includes a processing unit 1001 and an acquisition unit 1002.

[0115] The processing unit 1001 is used to repeatedly execute the iterative steps until the cumulative amount of the comprehensive deterioration index of the molten salt thermal storage material reaches a first preset threshold and / or the physical property parameters of the molten salt thermal storage material reach a second preset threshold, and outputs the loop data during the execution of the iterative steps; the iterative steps include: obtaining the current physical property parameters, determining the current comprehensive deterioration index based on the current physical property parameters, determining the current deterioration stage based on the current comprehensive deterioration index, and adjusting the test temperature fluctuation range and / or sampling time of the next cycle according to the current deterioration stage; the adjusted test temperature fluctuation range and / or sampling time are used to update the physical property parameters in the next cycle and update the comprehensive deterioration index based on the updated physical property parameters; the loop data includes: the corresponding number of cycles for each deterioration stage, the actual test temperature fluctuation range for each cycle, and the sampling time for each cycle.

[0116] The processing unit 1001 is also used to obtain the test life of the molten salt thermal storage material based on the number of cycles corresponding to each deterioration stage. The acquisition unit 1002 is used to acquire the rate sensitivity coefficient, impact resistance coefficient, and actual test temperature fluctuation range of the molten salt thermal storage material at each stage.

[0117] The processing unit 1001 is also used to correct the test life of the molten salt thermal storage material based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range of each deterioration stage, and cycle data, so as to obtain the cycle life of the molten salt thermal storage material.

[0118] In some embodiments, the processing unit 1001 is further configured to normalize multiple physical property parameters to obtain each normalized physical property parameter and obtain the weight corresponding to each normalized physical property parameter. The processing unit 1001 is further configured to calculate a comprehensive degradation index based on each normalized physical property parameter and the weight corresponding to each normalized physical property parameter.

[0119] In some embodiments, the acquisition unit 1002 is further configured to acquire a first division threshold and a second division threshold, wherein the first division threshold is less than the second division threshold. The processing unit 1001 is further configured to define the current degradation stage as a stable stage when the overall degradation index is less than or equal to the first division threshold. The processing unit 1001 is further configured to define the current degradation stage as a smooth degradation stage when the overall degradation index is greater than the first division threshold and less than or equal to the second division threshold. The processing unit 1001 is further configured to define the current degradation stage as an accelerated degradation stage when the overall degradation index is greater than the second division threshold.

[0120] In some embodiments, the acquisition unit 1002 is further configured to acquire the initial sampling time and the initial test temperature fluctuation range. The processing unit 1001 is further configured to, when the molten salt thermal storage material is in a stable phase, extend the sampling time of the next cycle based on the initial sampling time, and maintain the test temperature fluctuation range of the next cycle as the initial test temperature fluctuation range. The processing unit 1001 is further configured to, when the molten salt thermal storage material is in a stable deterioration phase, maintain the sampling time of the next cycle as the initial sampling time, and maintain the test temperature fluctuation range of the next cycle as the initial test temperature fluctuation range. The processing unit 1001, when the molten salt thermal storage material is in an accelerated deterioration phase, shorten the sampling time of the next cycle based on the initial sampling time, and expand the test temperature fluctuation range of the next cycle based on the initial test temperature fluctuation range.

[0121] In some embodiments, the processing unit 1001 is further configured to obtain a target coefficient based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cyclic data. The target coefficient includes a compensation coefficient and / or a basic equivalent coefficient. The compensation coefficient is used to correct time-related factors in the test life, and the basic equivalent coefficient is used to correct temperature-related factors in the test life. The compensation coefficient includes an extension compensation coefficient and a shortening compensation coefficient. The processing unit 1001 is further configured to correct the test life based on the corresponding number of cycles at each degradation stage and the target coefficient to obtain the cycle life of the molten salt thermal storage material.

[0122] In some embodiments, the processing unit 1001 is further configured to calculate the compensation coefficient based on the initial sampling time, the sampling time corresponding to each cycle, the rate sensitivity coefficient, and the impact resistance coefficient.

[0123] In some embodiments, the processing unit 1001 is further configured to obtain the basic equivalent coefficients for each degradation stage based on the actual test temperature fluctuation range for each degradation stage and the actual test temperature fluctuation range for each cycle.

[0124] This application also provides a computer-readable storage medium, which includes computer-executable instructions. When the computer-executable instructions are executed on the computer, the computer performs the molten salt thermal storage material testing method provided in the above embodiments.

[0125] This application also provides a computer program product that can be directly loaded into a memory and contains software code. After being loaded and executed by a computer, the computer program product can implement the molten salt thermal storage material testing method provided in the above embodiments. Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit them. Although the present invention has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the technical solutions of the present invention, and these modifications or equivalent substitutions cannot cause the modified technical solutions to deviate from the spirit and scope of the technical solutions of the present invention.

[0126] The system provided in the above embodiments is only illustrated by the division of the above functional modules. In practical applications, the above functions can be assigned to different functional modules as needed, that is, the modules or steps in the embodiments of the present invention can be further decomposed or combined. For example, the modules in the above embodiments can be merged into one module, or further divided into multiple sub-modules to complete all or part of the functions described above. The names of the modules and steps involved in the embodiments of the present invention are only for distinguishing the various modules or steps and are not considered as an improper limitation of the present invention.

[0127] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program goods. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program goods embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0128] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program goods according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0129] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0130] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0131] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the specific implementation of the present invention. Any modifications or equivalent substitutions that do not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A testing method for molten salt thermal storage materials, characterized in that, include: Repeat the iterative steps until the cumulative amount of the comprehensive deterioration index of the molten salt thermal storage material reaches the first preset threshold and / or the physical property parameters of the molten salt thermal storage material reach the second preset threshold, and output the loop data during the execution of the iterative steps; The iterative steps include: acquiring the current physical property parameters, determining the current comprehensive degradation index based on the current physical property parameters, determining the current degradation stage based on the current comprehensive degradation index, and adjusting the test temperature fluctuation range and / or sampling time for the next cycle according to the current degradation stage; the adjusted test temperature fluctuation range and / or sampling time are used to update the physical property parameters in the next cycle and update the comprehensive degradation index based on the updated physical property parameters; the cycle data includes: the corresponding cycle number for each degradation stage, the actual test temperature fluctuation range for each cycle, and the corresponding sampling time for each cycle; The test life of the molten salt thermal storage material is obtained based on the number of cycles corresponding to each degradation stage. The rate sensitivity coefficient, shock resistance coefficient, and actual test temperature fluctuation range of the molten salt thermal storage material are obtained. Based on at least one of the initial sampling time, the rate sensitivity coefficient, the shock resistance coefficient, the actual test temperature fluctuation range of each degradation stage, and the cycle data, the test life of the molten salt thermal storage material is corrected to obtain the cycle life of the molten salt thermal storage material.

2. The testing method for molten salt thermal storage materials according to claim 1, characterized in that, The number of physical property parameters is multiple. Based on the physical property parameters, the comprehensive degradation index is calculated, including: Multiple physical property parameters are normalized to obtain each normalized physical property parameter, and the weight corresponding to each normalized physical property parameter is obtained. The degradation index is calculated based on each normalized physical property parameter and its corresponding weight.

3. The testing method for molten salt thermal storage materials according to claim 1, characterized in that, The current degradation stage is determined based on the aforementioned comprehensive degradation index, including: Obtain a first partitioning threshold and a second partitioning threshold, wherein the first partitioning threshold is less than the second partitioning threshold; If the overall degradation index is less than or equal to the first classification threshold, the current degradation stage is a stable stage. When the overall degradation index is greater than the first classification threshold and less than or equal to the second classification threshold, the current degradation stage is a stable degradation stage. If the overall degradation index is greater than the second classification threshold, the current degradation stage is the accelerated degradation stage.

4. The testing method for molten salt thermal storage materials according to claim 3, characterized in that, The adjustment of the test temperature fluctuation range and / or sampling time for the next cycle based on the current degradation stage includes: Obtain the initial sampling time and the initial test temperature fluctuation range; When the molten salt thermal storage material is in the stable stage, the sampling time of the next cycle is extended based on the initial sampling time, and the test temperature fluctuation range of the next cycle is maintained as the initial test temperature fluctuation range. When the molten salt thermal storage material is in the stable deterioration stage, the sampling time of the next cycle is maintained as the initial sampling time, and the test temperature fluctuation range of the next cycle is maintained as the initial test temperature fluctuation range. When the molten salt thermal storage material is in the accelerated deterioration stage, the sampling time of the next cycle is shortened based on the initial sampling time, and the test temperature fluctuation range of the next cycle is expanded based on the initial test temperature fluctuation range.

5. The testing method for molten salt thermal storage materials according to claim 1, characterized in that, The step of correcting the test life of the molten salt thermal storage material based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cyclic data, to obtain the cyclic life of the molten salt thermal storage material, includes: A target coefficient is obtained based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cyclic data. The target coefficient includes a compensation coefficient and / or a basic equivalent coefficient. The compensation coefficient is used to correct for time-related factors in the test lifespan, and the basic equivalent coefficient is used to correct for temperature-related factors in the test lifespan. The compensation coefficient includes an extension compensation coefficient and a shortening compensation coefficient. The test life is corrected based on the number of cycles corresponding to each degradation stage and the target coefficient to obtain the cycle life of the molten salt thermal storage material.

6. The testing method for molten salt thermal storage materials according to claim 5, characterized in that, The process of obtaining the target coefficient based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cyclic data, includes: The compensation coefficient is calculated based on the initial sampling time, the sampling time corresponding to each cycle, the rate sensitivity coefficient, and the impact resistance coefficient.

7. The testing method for molten salt thermal storage materials according to claim 5, characterized in that, The process of obtaining the target coefficient based on at least one of the following: initial sampling time, rate sensitivity coefficient, shock resistance coefficient, actual test temperature fluctuation range at each degradation stage, and cyclic data, includes: Based on the actual test temperature fluctuation range of each degradation stage and the actual test temperature fluctuation range of each cycle, the basic equivalent coefficients of each degradation stage are obtained.

8. An electronic device, characterized in that, include: A processor and a memory; wherein the memory is used to store one or more programs, the one or more programs including computer-executable instructions, and when the device is running, the processor executes the computer-executable instructions stored in the memory to cause the device to perform the molten salt thermal storage material testing method according to any one of claims 1 to 7.

9. A computer-readable storage medium, characterized in that, When the computer-executable instructions stored in the computer-readable storage medium are executed by the processor of the electronic device, the electronic device is capable of performing the molten salt thermal storage material testing method as described in any one of claims 1 to 7.

10. A computer program product, characterized in that, The computer program product includes: a computer program or instructions that, when run on a computer, cause the computer to perform the molten salt thermal storage material testing method as described in any one of claims 1 to 7.

Images