GIS air gap defect equivalent sample construction and multi-physical parameter calibration method and system

Abstract

The application discloses a GIS air gap defect equivalent sample construction and multi-physical parameter calibration method and system, relates to the technical field of power equipment insulation defect simulation and detection calibration, and comprises the following steps: acquiring a parameter set of a target defect region of a GIS insulation piece to be simulated; decomposing the parameter set into a first parameter group, a second parameter group and a third parameter group; performing nondestructive topography measurement on an equivalent sample prepared according to the first parameter group, and establishing a sample digital model according to the measured actual air gap boundary; performing nondestructive topography measurement on the prepared equivalent sample, and establishing a sample digital model according to the measured actual boundary of the closed air gap; independently calibrating the local electric field distribution in the sample digital model according to the second parameter group; independently calibrating the short-wave path attenuation of the equivalent sample according to the third parameter group; calculating the multi-physical deviations of the equivalent sample and performing multi-constraint qualified judgment on the multi-physical deviations, so that comprehensive evaluation of the deviations in each physical dimension is realized.

Description

Technical Field

[0001] This application relates to the field of simulation and calibration technology for insulation defects in power equipment, and in particular to a method and system for constructing equivalent samples of GIS air gap defects and calibrating multiple physical parameters. Background Technology

[0002] In gas-insulated metal-enclosed switchgear (GIS), basin insulators, post insulators, and other epoxy-based composite insulators are prone to developing closed air gap defects internally or at interfaces during manufacturing, assembly, and long-term operation. Due to the significant difference in dielectric constant between the air gap and the solid insulating matrix, local electric field distortion occurs in the air gap region, inducing partial discharge or even insulation breakdown, seriously threatening the safe operation of the equipment. Therefore, it is often necessary to construct artificial defect samples that are "equivalent" to real GIS defects for verifying detection methods, calibrating detection equipment, and validating evaluation algorithms.

[0003] Existing methods for constructing equivalent specimens of GIS air gap defects typically embed all physical constraints, including the geometric parameters of the target defect region, the dielectric parameters of the matrix, the electric field boundary conditions, and the shortwave propagation path, into the specimen itself. Once the specimen is embedded, all of these physical parameters are fixed, and no single parameter can be adjusted independently.

[0004] Due to process factors such as curing shrinkage and template deformation, the actual morphology of the air gaps inside the sample inevitably deviates from the design value. Furthermore, the electric field distribution and short-wave attenuation characteristics are highly sensitive to parameters such as electrode spacing, sample position, material thickness, and composition. When all equivalent conditions are cured within the same solid sample, adjusting any one physical condition to correct a deviation will inevitably affect other physical conditions, creating strong coupling between the various physical parameters. This strong coupling makes independent adjustment of any single physical parameter impossible, resulting in the equivalent sample failing to accurately match the target defect region in all physical dimensions, including geometry, dielectric properties, electric field, and short-wave attenuation.

[0005] Therefore, the key is to break the strong coupling between the equivalent physical conditions so that each physical parameter can be adjusted independently without interfering with each other, so as to achieve accurate matching of the target defect area by the equivalent sample in multiple physical dimensions. Summary of the Invention

[0006] The purpose of this application is to provide a method and system for constructing equivalent specimens of GIS air gap defects and calibrating multiple physical parameters, in order to solve the technical problem in the prior art that all physical constraints such as air gap geometry, matrix material properties, electric field boundary conditions and shortwave propagation paths are solidified in the specimen body, resulting in strong coupling between the equivalent conditions and making it impossible to achieve independent and accurate matching of each physical parameter.

[0007] To achieve the above objectives, this application provides the following solution: Firstly, this application provides a method for constructing an equivalent sample of air gap defects in GIS and calibrating multiple physical parameters, including: Obtain the parameter set for the target defect region of the GIS insulation component to be simulated; The parameter set is divided into a first parameter group for determining the inherent properties of the sample body, a second parameter group for determining the external compensation conditions of the electric field, and a third parameter group for determining the external compensation conditions of shortwave attenuation. Non-destructive morphology measurement was performed on the equivalent sample prepared according to the first parameter set to establish a digital model of the sample based on the measured actual air gap boundary; According to the second set of parameters, the local electric field distribution in the digital model of the sample is independently calibrated by the adjustable electrode assembly to reduce the electric field deviation; According to the third parameter set, the shortwave path attenuation of the equivalent sample is independently calibrated by a detachable attenuation compensation component located on the shortwave propagation path to reduce attenuation deviation; Calculate multiple physical deviations of the equivalent sample relative to the target defect region, and perform multi-constraint acceptance judgment on the equivalent sample based on the multiple physical deviations.

[0008] Secondly, this application provides a GIS air gap defect equivalent sample, which is prepared using the GIS air gap defect equivalent sample construction and multi-physical parameter calibration method described above.

[0009] Thirdly, this application provides a system for constructing equivalent GIS air gap defects and calibrating multiple physical parameters, including: The parameter acquisition and decomposition module is used to acquire the parameter set of the target defect area of ​​the GIS insulation component to be simulated; and divide the parameter set into a first parameter group for determining the inherent properties of the sample body, a second parameter group for determining the external compensation conditions of the electric field, and a third parameter group for determining the external compensation conditions of shortwave attenuation. The non-destructive measurement and reconstruction module is used to perform non-destructive morphology measurement on the equivalent sample prepared according to the first parameter set, and to establish a digital model of the sample based on the measured actual air gap boundary. An electric field calibration module is used to independently calibrate the local electric field distribution in the digital model of the sample according to the second parameter set through an adjustable electrode assembly, so as to reduce electric field deviation. The shortwave attenuation calibration module is used to independently calibrate the shortwave path attenuation of the equivalent sample according to the third parameter set through a detachable attenuation compensation component located on the shortwave propagation path, so as to reduce attenuation deviation. The multi-constraint judgment module is used to calculate multiple physical deviations of the equivalent sample relative to the target defect area, and to perform multi-constraint qualification judgment on the equivalent sample based on the multiple physical deviations.

[0010] Fourthly, this application provides a computer device, including: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of the GIS air gap defect equivalent sample construction and multi-physical parameter calibration method described in any of the above.

[0011] Fifthly, this application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the GIS air gap defect equivalent sample construction and multi-physical parameter calibration method described above.

[0012] Sixthly, this application provides a computer program product, including a computer program that, when executed by a processor, implements the steps of the GIS air gap defect equivalent sample construction and multi-physical parameter calibration method described above.

[0013] According to the specific embodiments provided in this application, the following technical effects are disclosed: This application provides a method and system for constructing equivalent samples of GIS air gap defects and calibrating multiple physical parameters. By decomposing the parameter set of the target defect region into a first parameter set for determining the inherent properties of the sample body, a second parameter set for determining the external electric field compensation conditions, and a third parameter set for determining the external shortwave attenuation compensation conditions, the electric field calibration and shortwave attenuation calibration are independently implemented through adjustable electrode components and detachable attenuation compensation components, respectively, avoiding the coupling problem caused by all constraints being fixed to the sample body. Simultaneously, by performing non-destructive morphology measurements on the prepared equivalent sample and using the measured actual air gap boundary rather than the design ideal, the method utilizes the actual air gap boundary obtained from the measurements. A digital model of the sample was established, eliminating errors caused by process factors such as curing shrinkage and template deformation that led to deviations from the design values ​​in the actual morphology. Based on this, electric field calibration and shortwave attenuation calibration can be completed independently without changing the sample's structure, preserving the sample's repeatability and flexibly adapting to differences in electric field boundary conditions and shortwave propagation paths in different GIS structures. Finally, by calculating multiple physical deviations of the equivalent sample relative to the target defect area and performing multi-constraint qualification judgment, a comprehensive evaluation of deviations in various physical dimensions was achieved, improving the comprehensiveness and reliability of the consistency assessment between the equivalent sample and the real target defect in multiple physical dimensions. Attached Figure Description

[0014] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0015] Figure 1 A flowchart illustrating a method for constructing an equivalent sample of air gap defects in GIS and calibrating multiple physical parameters, provided in an embodiment of this application; Figure 2 This is a schematic diagram of an equivalent sample structure provided in an embodiment of this application; Appendix Figure 2 The markings are as follows: 1-Shell, 2-High voltage electrode, 3-Grounding electrode, 4-Sealed air gap, 5-Composite insulating substrate, 6-Measuring port.

[0016] Figure 3 This is a schematic diagram of the structure of a computer device provided in an embodiment of this application. Detailed Implementation

[0017] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0018] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0019] It should be noted that the shortwavelengths described in this application refer to high-energy rays, including X-rays or gamma rays, used to penetrate GIS insulation components and assist in partial discharge detection. In various embodiments of this application, the wavelength range of the shortwavelengths is preferably from 0.001 nm to 10 nm, corresponding to a photon energy range of 0.1 keV to 1 MeV. Those skilled in the art will understand that the specific energy range of the shortwavelengths can be selected according to the wall thickness and material attenuation characteristics of the GIS insulation component under test to adapt to different detection sensitivity requirements.

[0020] Reference Figure 1 This embodiment provides a method for constructing an equivalent sample of air gap defects in GIS and calibrating multiple physical parameters. This method is performed by an operator in conjunction with a calibration system. The calibration system includes non-destructive testing equipment, adjustable electrode components, a shortwave generation and detection component, and a calculation and control unit. The operator performs physical operations such as sample preparation, electrode adjustment, and compensation component replacement according to the instructions output by the calculation and control unit. The calculation, judgment, and deviation comparison in each step are performed by the calculation and control unit. Specifically, this method includes the following steps S1 to S6, wherein: Step S1: Obtain the parameter set of the target defect area of ​​the GIS insulation component to be simulated.

[0021] A target defect region of the GIS insulation component to be simulated is selected. Based on structural drawings, 3D models, non-destructive testing results, material parameters, and electric field calculation results, the geometric parameters, substrate dielectric parameters, gas state parameters, local electric field descriptors, and path attenuation of shortwave propagation from a predetermined incident surface to the target defect region are obtained, forming a parameter set for the target defect region. The geometric parameters include at least four of the following: equivalent air gap volume, principal axis ratio, equivalent thickness, burial depth, orientation angle relative to the target principal electric field direction, boundary curvature, and shape descriptor. The substrate dielectric parameters include dielectric constant, dielectric loss, and shortwave attenuation coefficient. The gas state parameters include gas composition and pressure within the air gap. The local electric field descriptors include at least three of the following: maximum field strength, average field strength, field strength enhancement coefficient, principal field direction, and potential gradient. The shortwave path attenuation is determined according to the linear attenuation coefficient of each propagating material within a predetermined shortwave energy range and the corresponding path length.

[0022] Step S2: Divide the parameter set into a first parameter group for determining the inherent properties of the sample body, a second parameter group for determining the external compensation conditions of the electric field, and a third parameter group for determining the external compensation conditions of shortwave attenuation.

[0023] The parameter set is decomposed into a first parameter set for determining the inherent properties of the sample body, a second parameter set for determining the external compensation conditions for the electric field, and a third parameter set for determining the external compensation conditions for shortwave attenuation. The first parameter set includes at least the dielectric constant, dielectric loss, and shortwave attenuation coefficient of the composite insulating matrix, as well as the volume, principal axis ratio, burial depth, orientation angle, gas composition, and pressure of the closed air gap. The second parameter set includes at least the electrode spacing, electrode end curvature, and relative position of the sample in the adjustable electrode assembly. The third parameter set includes at least the material, thickness, number of layers, and placement position of the attenuation compensation element. This application, through the above-mentioned layered arrangement, enables separate and non-interfering implementation of electric field calibration and shortwave attenuation calibration, avoiding strong coupling caused by all constraints being fixed to the sample body.

[0024] Step S3: Perform non-destructive morphology measurement on the equivalent sample prepared according to the first parameter set, and establish a digital model of the sample based on the measured actual air gap boundary.

[0025] Based on the first set of parameters, the composite insulation matrix formulation, air gap shape, size, embedment depth, orientation, and gas encapsulation method are determined. An equivalent composite insulation sample with a closed air gap is prepared using at least one of the following methods: micro-volume gas injection, sacrificial template removal, layered curing and embedding, locally controllable debonding and gap formation, or thin-sheet template gap formation. After curing, the closed air gap is embedded inside the composite insulation matrix or at the interface, and the air gap region is located within the predetermined electric field range and shortwave propagation path. End faces for installation or calibration can be provided on both sides of the equivalent sample, and positioning marks for determining the measurement and installation directions can be provided on the surface of the equivalent sample.

[0026] After the equivalent sample is cured, the three-dimensional boundary of the actual air gap is obtained by at least one of microfocus X-ray imaging, computed tomography, ultrasonic imaging, optical tomography, or capacitance tomography. Based on the measurement results, the actual volume, principal axis ratio, equivalent thickness, burial depth, orientation angle, and boundary morphology descriptors are calculated, and a digital model of the sample is reconstructed using the measured three-dimensional boundary of the actual air gap. Unlike existing technologies that use ideal design values ​​instead of actual morphology, this application establishes a digital model of the sample based on the measured actual air gap boundary rather than the ideal air gap shape from the design stage. Subsequent electric field calibration is based on the actual digital model of the equivalent sample, thereby reducing the impact of sample manufacturing errors on the calibration results.

[0027] Step S4: Based on the second parameter set, independently calibrate the local electric field distribution in the digital model of the sample using the adjustable electrode assembly to reduce electric field deviation.

[0028] The digital model of the sample reconstructed based on nondestructive topography measurement is placed into the computational domain corresponding to the adjustable electrode assembly. Local electric field descriptors for the closed air gap region are calculated. These local electric field descriptors include at least one of the following: maximum field strength, average field strength, field strength enhancement coefficient, principal field direction, and potential gradient. Based on the deviation between the calculated values ​​of each local electric field descriptor and the target values ​​corresponding to the target defect region, at least one of the following is adjusted: electrode spacing, electrode end curvature, or relative position of the sample in the adjustable electrode assembly, until the deviation of each local electric field descriptor satisfies its respective independent threshold.

[0029] Step S5: Based on the third parameter set, independently calibrate the shortwave path attenuation of the equivalent sample using a detachable attenuation compensation component located on the shortwave propagation path to reduce attenuation deviation.

[0030] Without connecting the equivalent sample to the partial discharge acquisition circuit, a shortwave is sequentially passed through a detachable attenuation compensation element and the equivalent sample along a predetermined path. Under the same detection response conditions, the incident intensity of the shortwave before reaching the equivalent sample and the transmitted intensity after passing through the detachable attenuation compensation element and the equivalent sample are measured, and the path attenuation of the equivalent sample is determined based on the measured incident and transmitted intensities. Based on the deviation between the path attenuation and the shortwave path attenuation in the target defect area, at least one of the following is adjusted: material, thickness, number of layers, placement position of the detachable attenuation compensation element, or sample mounting direction.

[0031] Step S6: Calculate multiple physical deviations of the equivalent sample relative to the target defect area, and perform multi-constraint acceptance judgment on the equivalent sample based on the multiple physical deviations.

[0032] Calculate multiple physical deviations of the equivalent sample relative to the target defect area, and perform multi-constraint acceptance judgment on the equivalent sample based on these deviations. If any deviation fails to meet the corresponding threshold, perform directional correction according to the deviation type, and then return to the corresponding calibration step for re-execution.

[0033] Implementing steps S1 to S6 above achieves the following beneficial effects: By decomposing the parameter set into a first parameter group (inherent properties of the sample body), a second parameter group (external electric field compensation conditions), and a third parameter group (external shortwave attenuation compensation conditions), electric field calibration and shortwave attenuation calibration are implemented independently and without interference through adjustable electrode components and detachable attenuation compensation components, respectively, avoiding the strong coupling problem caused by all constraints being solidified in the sample body; by performing non-destructive morphology measurement on the prepared equivalent sample and establishing a sample digital model using the actual air gap boundary rather than the design ideal value, morphology deviations caused by process factors such as curing shrinkage and template deformation are eliminated; on this basis, electric field calibration and shortwave attenuation calibration can be completed independently without changing the sample body structure, preserving the repeatability of sample preparation and flexibly adapting to the differences in different GIS structures; finally, by calculating multiple physical deviations and performing multi-constraint qualification judgment, a comprehensive evaluation of deviations in each physical dimension is achieved, improving the comprehensiveness and credibility of the consistency assessment between the equivalent sample and the real target defects.

[0034] Furthermore, this application can be modified and extended in various ways based on the foregoing embodiments. For example, the method for determining the shortwave path attenuation in step S1 can be calculated by summing the product of the linear attenuation coefficient and the path length under the condition of a single-energy shortwave source, or by equivalent calculation based on the energy spectrum integral transmittance under the condition of a wide-spectrum shortwave source; the method for preparing the closed air gap in step S3 can be flexibly selected according to the shape and size of the target air gap; the electric field calibration and the shortwave attenuation calibration in step S5 can be performed sequentially or iteratively; the individual thresholds of multiple physical deviations in step S6 can be adjusted according to the actual detection accuracy requirements. The specific values, materials, and models in the foregoing embodiments are only illustrative and do not constitute a limitation on the scope of protection of this application. Those skilled in the art can adjust, combine, or replace the parameters, step order, or structure without departing from the concept of this application, and these all fall within the scope of protection of this application.

[0035] The following describes in detail the specific implementation of the method described above through multiple embodiments. These embodiments are preferred implementations of this application, but not the only ones. Those skilled in the art can adjust the parameters, step order, or structure without departing from the concept of this application.

[0036] In an exemplary embodiment, the extraction of target defect parameters specifically includes steps S1.1 to S1.2, wherein: Step S1.1: Selection of target defect area Select the target defect area in the GIS insulation component to be simulated. The GIS insulation component can be a pot-type insulator, a post insulator, or other epoxy-based composite insulation components. The target defect can be an internal closed air gap, an interface gap, a local debonding void, or a crack-type air gap.

[0037] Step S1.2: Obtaining the parameter set Based on the structural drawings, 3D model, inspection results, or simulation results of the target GIS insulation component, obtain the following parameters for the target defect area: A1) Air gap geometric parameters: including at least four of the following: equivalent volume of air gap, principal axis ratio, equivalent thickness, burial depth, orientation angle relative to the direction of the target principal electric field, boundary curvature, and shape descriptor.

[0038] A2) Dielectric parameters of the substrate: including the dielectric constant, dielectric loss and short-wave attenuation characteristics of the insulating substrate.

[0039] A3) Gas state parameters: including gas composition and pressure in the gas gap.

[0040] A4) Local electric field description quantities: including at least three of the following: maximum field strength, average field strength, field strength enhancement coefficient, main field direction, and potential gradient in the air gap region.

[0041] A5) Shortwave propagation parameters: including the propagation path and attenuation of shortwaves from the surface of the equivalent sample to the air gap region.

[0042] The shortwave path attenuation of the target defect area is determined by the following formula, based on the linear attenuation coefficient of each propagating material within the predetermined shortwave energy range and the corresponding path length: in, For the target path in energy E The attenuation amount, For the first j Such propagation materials in energy E The linear decay coefficient under the following conditions For shortwave in the 1st j The equivalent path length in a propagation material. When using a wide-spectrum short-wavelength source, the energy spectrum integral transmittance is used as the target quantity under the same source spectrum and detector response conditions.

[0043] In one exemplary embodiment, the equivalent constraint layering specifically includes: The above parameter set is decomposed into three groups: sample inherent parameters, electric field boundary compensation parameters, and shortwave attenuation compensation parameters.

[0044] The inherent parameters of the sample (i.e., the first parameter set) include at least the dielectric constant, dielectric loss, and short-wavelength attenuation coefficient of the composite insulating matrix, as well as the volume, principal axis ratio, burial depth, orientation angle, gas composition, and pressure of the closed air gap. These parameters are embedded in the equivalent sample body and will not be changed during subsequent calibration.

[0045] The electric field boundary compensation parameters (i.e., the second parameter set) include at least the electrode spacing, electrode end curvature, and the relative position of the equivalent sample, which are achieved through an adjustable electrode assembly and can be independently adjusted during subsequent calibration.

[0046] The shortwave attenuation compensation parameters (i.e., the third parameter group) include at least the material, thickness, number of layers, and setting position of the attenuation compensation component, which is achieved through a detachable attenuation compensation component and can be adjusted independently during subsequent calibration.

[0047] The purpose of the above-mentioned layered setup is to enable electric field calibration and shortwave attenuation calibration to be performed separately without interference, avoiding strong coupling problems caused by all constraints being fixed in the equivalent sample body, so that each physical parameter can independently approach the target value.

[0048] In one exemplary embodiment, the equivalent sample includes a composite insulating substrate and an air gap region enclosed within or at the interface of the composite insulating substrate. The air gap region is located within a predetermined electric field range and shortwave propagation path. End faces for mounting or calibration may be provided on both sides of the equivalent sample, and positioning marks for determining the measurement and mounting directions may be provided on the surface of the equivalent sample.

[0049] The design and fabrication process of the equivalent sample specifically includes steps S3.1 to S3.3, wherein: Step S3.1: Composite Insulating Matrix Formulation The aforementioned composite insulating matrix is ​​formed from epoxy resin, a curing agent, and inorganic fillers, wherein the inorganic fillers include one or more of alumina, silica, and boron nitride. By adjusting the type, particle size distribution, and content of the inorganic fillers, the dielectric constant and short-wave attenuation coefficient of the composite insulating matrix are made to fall within the target range. Specifically, increasing the alumina filler content can improve the dielectric constant of the matrix, while increasing the boron nitride filler content can improve the thermal conductivity of the matrix and affect the short-wave attenuation characteristics. Those skilled in the art can determine the appropriate filler type and ratio through a limited number of experiments based on the material parameters of the target GIS insulation component.

[0050] Step S3.2: Preparation of sealed air gap The sealed air gap can be prepared by at least one of the following methods: B1) Micro-volume gas injection method: During the casting process of composite insulation material, a fixed amount of gas is injected into a predetermined position through a micro-injection device, and a closed air gap is formed after the composite insulation material is cured.

[0051] B2) Sacrificial Template Removal Method: A removable template (such as a soluble or fusible material) of a specified size is placed in the composite insulating material. After the composite insulating material has initially cured (e.g., cured at 80-100°C for 2-4 hours, so that the matrix reaches a gel state that can support its own shape but is not yet fully cross-linked), the template is removed by dissolution or heating to seal the formed channels, thus creating a closed air gap. This method is preferred for approximately spherical or ellipsoidal air gaps.

[0052] B3) Layered curing and embedding method: First, a layer of composite insulating substrate is prepared, and an air gap forming structure is set on its surface. Then, the upper substrate is covered, and the air gap is embedded inside through layered curing.

[0053] B4) Local controllable debonding and gap formation method: A local debonding area is set between two layers of insulating material, and a closed air gap is formed by controlling the interface bonding state.

[0054] B5) Thin-sheet template gap-forming method: After coating the surface of the thin sheet with a release agent, the thin sheet is placed between two layers of insulating material. After curing, the thin sheet is removed by peeling or debonding to form a flat, closed air gap. This method is preferred for flat interface air gaps.

[0055] The closed air gap described in this application refers to an air gap region whose entire boundary is covered by a composite insulating matrix material or forms a complete interface with the matrix material, and whose internal space has no penetrating gas flow channel with the external atmospheric environment of the equivalent sample. For air gaps prepared using the sacrificial template method or the thin-sheet template gap-forming method, after removing the template or thin sheet, it is necessary to use secondary casting and curing or sealant to seal the operating port to ensure the long-term sealing of the air gap, so as to stably maintain the set gas composition and pressure inside.

[0056] Step S3.3: Gas state control within the air gap When it is necessary to control the gas state in the air gap, a microchannel can be reserved in advance before the air gap is formed, or a microchannel can be opened after the air gap is formed by means of laser drilling, etc. Gas extraction, gas replacement and quantitative filling can be carried out through the microchannel, and then the microchannel can be sealed to keep the gas composition and pressure in the air gap within a predetermined range.

[0057] Reference Figure 2 This embodiment shows a schematic diagram of the structure of the equivalent sample for GIS air gap defects. The equivalent sample is entirely placed within a shielded cavity of a metal shell 1. High-voltage electrodes 2 and grounding electrodes 3 are symmetrically arranged on the left and right sides of the cavity. The high-voltage electrodes 2 are connected to an external high-voltage source, and the grounding electrodes 3 are reliably grounded, used to apply voltage to both sides of the equivalent sample to form an electric field distribution in the closed air gap region. The equivalent sample includes a composite insulating substrate 5 and an air gap region 4 enclosed within the composite insulating substrate 5. The air gap region 4 is located within the electric field range between the two electrodes, and the air gap thickness is...d The geometric parameters, such as burial depth, orientation, and principal axis ratio, are determined based on the measured parameters of the defect area of ​​the target GIS insulation component. A measurement port 6 is provided at the top of the cavity. Short waves are injected vertically downwards into the air gap region along measurement port 6 to measure the attenuation characteristics of the short waves after passing through the equivalent sample. The cavity employs an electromagnetic shielding structure to isolate the influence of external electromagnetic interference on the short wave intensity measurement results and can be filled with different gases to match the gas state around the air gap in the target GIS insulation component.

[0058] The closed air gap described in this application refers to a space where the entire boundary of the air gap region 4 is covered by the composite insulating substrate 5 material or forms a complete interface with the composite insulating substrate 5 material, and there is no gas flow channel penetrating between the internal space of the air gap and the external atmospheric environment of the equivalent sample.

[0059] In a specific example, an ellipsoidal closed air gap detected in a 220kV GIS basin insulator is used as the simulation target, with an equivalent volume of approximately 2.5 mm². 3 The main axis ratio is approximately 2.1, and the embedment depth is approximately 5 mm. The composite insulating matrix is ​​made by mixing bisphenol A type epoxy resin (brand name E-51) and methyl hexahydrophthalic anhydride curing agent at a mass ratio of 100:85, and adding spherical alumina filler (average particle size 5 μm, gradation of coarse:medium:fine = 2:5:3) accounting for 35% of the total matrix mass. After stirring evenly, vacuum degassing is performed for 15 minutes. The air gap is prepared using the sacrificial template method: polymethyl methacrylate (PMMA) microspheres are processed into ellipsoidal templates (major axis 2.2 mm, minor axis 1.05 mm), and after coating the surface with a release agent, they are fixed in the predetermined position of the mold. After pouring the epoxy mixture, it is cured at a constant temperature of 90℃ for 3 hours. After the matrix reaches the gel state, the temperature is raised to 180℃ to thermally decompose and release the PMMA template. The release channel is naturally sealed by the epoxy melt during the subsequent secondary curing process, forming a closed ellipsoidal air gap with an embedment depth of approximately 5.1 mm. The equivalent sample was then placed in an SF6 atmosphere and left to stand for 48 hours to allow the air pressure inside and outside the air gap to equalize. Afterward, it was removed and any micropores on the surface were sealed with epoxy sealant. The actual air gap volume of the equivalent sample prepared using the above process was verified by CT scan to be 2.48 mm. 3 The actual burial depth was 5.1 mm, which was about 2% lower than the target value (5 mm); the actual spindle ratio was 2.05, which was about 2.4% lower than the target value (2.1).

[0060] In an exemplary embodiment, the non-destructive topography measurement and digital model reconstruction process specifically includes steps S4.1 to S4.3, wherein: Step S4.1: Non-destructive morphology measurement After the equivalent sample is prepared, the actual morphology of the air gap inside the equivalent sample is measured non-destructively. Non-destructive measurement can be performed using at least one of the following: microfocus X-ray imaging, computed tomography (CT), ultrasound imaging, optical tomography, capacitance tomography, or other detection methods capable of identifying air gap boundaries.

[0061] Taking microfocus X-ray computed tomography as an example: An equivalent sample is placed in an X-ray CT scanning system, and appropriate tube voltage, tube current, and scanning resolution are set to acquire an image of the internal three-dimensional structure of the equivalent sample. Due to the density difference between the air gap and the solid matrix, the air gap boundary can be clearly identified in the CT image. By performing thresholding and three-dimensional reconstruction on the image, the actual three-dimensional boundary of the air gap is obtained.

[0062] Step S4.2: Calculation of actual parameters Based on the nondestructive measurement results, the following actual parameters were calculated: C1) Actual air gap volume: obtained by integrating a three-dimensional image; C2) Actual principal axis ratio of the air gap: The ratio of the major axis to the minor axis is calculated by fitting an ellipsoid to the three-dimensional boundary; C3) Equivalent thickness of air gap: the ratio of volume to projected area; C4) Actual burial depth of the air gap: the minimum distance from the geometric center of the air gap to the upper surface of the equivalent sample; C5) Actual air gap orientation angle: The angle between the main axis of the air gap and the direction of the target main electric field; C6) Boundary morphology description quantities: including boundary curvature distribution, air gap boundary roughness, or fractal dimension.

[0063] The actual measurement results are compared with the design parameters, and the deviations are recorded as the geometric deviation basis for subsequent multi-constraint qualification judgment.

[0064] Step S4.3: Establishment of digital model of sample A digital model of the sample is reconstructed using the actual three-dimensional boundary of the air gap obtained from measurements. This digital model includes the equivalent sample's external geometry, material properties (dielectric constant, dielectric loss, conductivity, etc.), and the actual three-dimensional boundary of the air gap. Unlike existing technologies that use an ideal air gap shape from the design stage, this application establishes the sample's digital model using the actual air gap boundary obtained from measurements. Subsequent electric field calibration is based on the actual digital model of the equivalent sample, rather than directly using the ideal air gap shape from the design stage, thereby reducing the impact of manufacturing errors of the equivalent sample on the calibration results.

[0065] The digital model of the sample is used in subsequent steps to calculate the local electric field distribution in the closed air gap region.

[0066] In an exemplary embodiment, the independent electric field calibration process specifically includes steps S5.1 to S5.3, wherein: Step S5.1: Physical setup for electric field calibration An equivalent sample is positioned between a pair of calibration electrodes. The adjustable electrode assembly includes replaceable electrodes, a spacing adjustment mechanism, an equivalent sample positioning mechanism, and a finite element calculation unit. The calibration electrodes can be flat plates, rod-plates, coaxial electrodes, insert electrodes, or electrodes with rounded ends. The calibration electrodes can be made of brass, stainless steel, or copper alloy, and their surfaces are polished to reduce the impact of surface roughness on the electric field distribution. The adjustable electrode assembly allows for precise adjustment of the electrode spacing via the spacing adjustment mechanism, and the equivalent sample positioning mechanism allows for adjustment of the position and orientation of the equivalent sample between the two electrodes.

[0067] In one optional configuration, the adjustable electrode assembly includes a fixed base, a precision linear guide rail mounted on the base, an electrode support that slides along the guide rail, and a micrometer head adjustment screw that drives the electrode support to move along the guide rail. By rotating the micrometer head adjustment screw, the distance between the two electrodes can be continuously changed with an adjustment accuracy of 0.01 mm. The curvature of the electrode ends is adjusted by using rounded electrode heads with different radii (e.g., R = 2 mm, 5 mm, 10 mm).

[0068] Step S5.2: Electric Field Calculation The digital model of the sample reconstructed based on nondestructive topography measurement is placed into the computational domain corresponding to the adjustable electrode assembly. Specifically, a three-dimensional electric field calculation model including the adjustable electrode assembly and the equivalent sample is established in finite element analysis software, wherein the digital model of the sample adopts the actual three-dimensional boundary of the air gap obtained by the aforementioned nondestructive measurement. The three-dimensional electric field calculation model is meshed, and the mesh is refined in and around the air gap region. Then, a voltage boundary condition corresponding to the target defect region of the GIS insulation component is applied (this voltage boundary condition is set according to the electric field calculation result of the target defect region obtained in step S1), and the electric field distribution of the closed air gap region is calculated to obtain the local electric field descriptor. The local electric field descriptor includes at least one of the following: maximum field strength, average field strength, field strength enhancement coefficient, principal field direction, and potential gradient.

[0069] The dominant field direction is defined as the principal direction vector of the electric field intensity vector in three-dimensional space within the composite insulating matrix region undisturbed by the air gap. The field strength enhancement coefficient is defined as the maximum electric field strength value within the air gap region. The average electric field strength of the equivalent sample body under the same loading conditions, excluding the air gap region. The ratio, i.e. The electric field deviation The calculation is the relative error between the simulation calculation value obtained based on the above definition and the target value corresponding to the target defect area.

[0070] Step S5.3: Electric field deviation judgment and adjustment Based on the electric field deviation between the calculated values ​​of each local electric field descriptor and the corresponding target values ​​in the target defect area, adjustments are made as follows: D1) When the electric field strength in the air gap region of the equivalent sample is lower than the target value, the electrode spacing can be appropriately reduced or the radius of curvature at the electrode end can be adjusted to enhance the electric field strength in the air gap region.

[0071] D2) When the local field strength is excessively concentrated, the radius of curvature at the electrode end (i.e., the radius of the electrode fillet) can be increased or the position of the equivalent sample can be adjusted to make the field strength distribution more uniform.

[0072] D3) When the direction of the electric field is inconsistent with the direction of the main axis of the air gap, the equivalent sample can be rotated or the electrode arrangement direction can be adjusted to match the direction of the electric field with the orientation angle of the air gap.

[0073] Repeat the above electric field calculation and adjustment steps until the deviation of each local electric field descriptor meets its respective independent threshold. The independent thresholds for each local electric field descriptor can be set according to the electric field calculation accuracy requirements of the target defect area of ​​the GIS insulation component and the calibration requirements of the detection equipment. For example, the maximum field strength deviation threshold can be set to ±5%, the field strength enhancement coefficient deviation threshold can be set to ±10%, and the main field direction deviation threshold can be set to ±3°.

[0074] In a specific example, using the same 220kV GIS ellipsoidal air gap defect parameters, the target maximum electric field strength in the target defect region is 6.0 kV / mm, the target field strength enhancement factor is 4.2, and the target angle between the principal field direction and the air gap principal axis is 0° (i.e., the electric field direction is parallel to the air gap principal axis). The digital model of the sample reconstructed based on CT measured boundaries is imported into the finite element software. The initial electrode setup uses flat plates with a spacing of 10 mm, and the sample is placed in the center. The calculated maximum electric field strength in the air gap region is 5.2 kV / mm (approximately 13.3% lower), the field strength enhancement factor is 3.8 (approximately 9.5% lower), and the angle between the principal field direction and the air gap principal axis is 8°.

[0075] Then iterative adjustments are made: The first adjustment shortened the electrode spacing from 10 mm to 8.5 mm, resulting in a calculated increase in the maximum field strength to 5.7 kV / mm, an increase in the enhancement factor to 4.0, and a decrease in the included angle to 5°. In the second adjustment, the flat plate electrode was replaced with a rounded electrode with an end curvature radius R = 8 mm. At the same time, the sample was rotated 5° around the vertical axis. The maximum field strength was calculated to be 5.95 kV / mm, the enhancement coefficient was 4.15, and the included angle of the main field direction was 1.5°.

[0076] The deviations of each local electric field descriptor are as follows: maximum field strength deviation is approximately 0.8% (threshold ±5%), field strength enhancement coefficient deviation is approximately 1.2% (threshold ±10%), and the deviation of the main field direction angle is 1.5° (threshold ±3°). All of these deviations meet their respective independent thresholds, and the electric field calibration is complete. The entire calibration process only adjusted the electrode assembly parameters without changing the equivalent sample body structure.

[0077] In an exemplary embodiment, the shortwave attenuation independent calibration process specifically includes steps S6.1 to S6.4, wherein: Step S6.1: Calibration Prerequisites Shortwave attenuation calibration is performed without connecting the equivalent sample to the partial discharge acquisition circuit. That is, during shortwave attenuation calibration, the equivalent sample is not electrically connected to the partial discharge acquisition circuit, and the number of discharges, discharge amplitude, phase distribution, or discharge statistical time delay are not used as calibration feedback quantities. Shortwave attenuation calibration is only used to match the shortwave propagation conditions of the equivalent sample with the structure of the target GIS insulation component, thus establishing a clear technical boundary with the discharge excitation device and discharge risk identification method.

[0078] Step S6.2: Shortwave Propagation Path Setting The shortwave beam passes sequentially along a predetermined path through a detachable attenuation compensation element and an equivalent sample. The shortwave source can be an X-ray or gamma-ray source, forming a shortwave beam of a predetermined cross-sectional size through a collimation unit. The incident intensity detection unit and the transmitted intensity detection unit can use the same type of detector (such as a semiconductor detector, scintillator detector, or ionization chamber) to ensure that both have the same detection response characteristics for shortwaves within the same energy spectrum. A shielding unit is positioned around the detector to shield it from the influence of stray radiation on the measurement results.

[0079] Step S6.3: Measurement and Calculation The incident intensity of the shortwave before it reaches the equivalent sample and the transmitted intensity after passing through a specified propagation path are measured under the same detection response conditions. The same detection response conditions refer to using the same shortwave source spectrum and the same detection response conditions (such as detector bias, gain, energy window settings, etc.) to ensure that the incident intensity and transmitted intensity are compared on the same physical reference.

[0080] The path attenuation of the equivalent sample is determined based on the measured incident and transmitted intensities. Preferably, the path attenuation can be calculated using the following formula: in, This represents the path attenuation of the equivalent sample. To reach the incident intensity before reaching the equivalent sample, The transmitted intensity is the intensity after passing through the equivalent sample and the removable attenuation compensation component. When a wide-spectrum short-wavelength source is used, the incident intensity and transmitted intensity are the integrated intensity of the energy spectrum, the detector integrated count, or the dose measurement value under the same detection response conditions.

[0081] Step S6.4: Deviation Judgment and Adjustment Adjust as follows, based on the deviation between the path attenuation and the shortwave path attenuation of the target defect area: E1) When the shortwave attenuation of the equivalent sample is less than the target value, a compensation material with known attenuation characteristics can be added to the incident side of the equivalent sample (such as increasing the number of compensation layers, thickening the compensation, or replacing it with a material with a higher attenuation coefficient).

[0082] E2) When the attenuation is greater than the target value, the shortwave incident direction can be adjusted to change the equivalent path length through the equivalent sample, the thickness or number of layers of the compensation component can be reduced, the material formula of the composite insulation matrix can be readjusted (such as reducing the filler content to reduce the attenuation coefficient), or the installation direction of the equivalent sample can be adjusted.

[0083] The detachable attenuation compensation component is a compensation sheet with known attenuation characteristics. Its material can be copper, aluminum, lead, polyethylene, or other materials with stable shortwave attenuation coefficients. The thickness and number of layers can be selected and combined according to the target attenuation amount. The setting position can be on the incident side or the exit side of the equivalent sample.

[0084] Repeat the above measurement and adjustment steps until the deviation of the path attenuation meets the shortwave equivalent threshold. The shortwave equivalent threshold can be determined according to the calculation accuracy requirements of the shortwave propagation path attenuation in the target GIS structure and the dynamic range of the detection equipment, for example, set to ±5% or ±0.5dB.

[0085] In a specific example, the target value is the path attenuation of shortwave radiation (using an X-ray source, tube voltage 150 kV, tube current 5 mA) incident from the outer shell to the air gap region in the target GIS structure. The target path attenuation is calculated. =3.2dB. The equivalent sample was placed in the short-wavelength detection optical path, and the incident intensity was measured using a semiconductor detector without connecting to the partial discharge acquisition circuit. and transmission intensity Initially measured equivalent sample path attenuation =2.5dB, meaning the shortwave attenuation is 0.7dB lower than the target value, and the path attenuation deviation is... Approximately 21.9% (calculated based on a target value of 3.2 dB) exceeds the shortwave equivalent threshold (±5%), indicating insufficient loss of X-rays when passing through the equivalent sample, requiring additional compensation attenuation.

[0086] Based on the third parameter set, compensation plates were sequentially stacked on the incident side of the sample: first, a 0.2 mm thick copper sheet was added, and the results were then measured again. =2.9dB, the path attenuation deviation was reduced to approximately 9.4% (0.3 dB / 3.2 dB), but it still did not meet the threshold requirement; after adding another 0.1 mm thick copper sheet, the result was measured again. =3.25dB, at which point the path attenuation deviation is approximately 1.6% (0.05 dB / 3.2dB), meeting the shortwave equivalent threshold (±5% or ±0.5 dB). The final attenuation compensation component was determined to be two layers of copper sheets (0.2 mm and 0.1 mm thick, respectively), placed close to the surface of the incident side of the equivalent sample. Throughout the above shortwave attenuation calibration process, before calibration... =21.9% (out of limit), after calibration =1.6% (pass). The two-stage data will be used in step S6 to demonstrate the non-compliance and pass / fail determination, respectively.

[0087] In an exemplary embodiment, the multi-constraint equivalence determination and directional correction process specifically includes steps S7.1 to S7.3, wherein: Step S7.1: Multiple physical deviations Calculate the following deviations between the equivalent sample and the target defect area of ​​the GIS insulation component: F1) Geometric deviation The geometric deviation is determined comprehensively based on the differences in air gap volume, principal axis ratio, equivalent thickness, burial depth, and orientation angle. The square root of the weighted sum of squares of the relative deviations of each geometric parameter, or the maximum value of the relative deviations of each geometric parameter, can be used as the geometric deviation. Specifically, the geometric deviation can be calculated as the root mean square of the relative deviations of each geometric parameter. in, n This represents the total number of geometric parameters involved in the geometric deviation calculation. For the first i Measured values ​​of the geometric parameters of the term. This is the corresponding target value.

[0088] Or take the value in the most unfavorable way: Those skilled in the art can select an appropriate comprehensive deviation calculation method based on the specific defect type and equivalent accuracy requirements. The deviations in the above geometric parameters can be corrected by adjusting the size of the air gap template, the positioning method, or the curing process parameters (such as curing temperature curves and pressure curves) during the sample preparation process.

[0089] F2) Dielectric deviation It is determined based on the difference between the dielectric constant of the matrix and the dielectric loss.

[0090] F3) Gas state deviation Determined based on the differences in gas composition and pressure within the air gap.

[0091] F4) Electric field deviation The value is determined by comprehensively considering the differences in local electric field descriptors among the maximum electric field strength, average electric field strength, electric field enhancement coefficient, main field direction, and potential gradient. The maximum relative deviation of each local electric field descriptor can be taken in the most unfavorable manner, or the overall deviation can be calculated using the root mean square method.

[0092] F5) Shortwave attenuation deviation The attenuation is determined based on the difference between the target attenuation and the measured attenuation of the equivalent sample.

[0093] Step S7.2: Determine the most unfavorable normalization bias Set a corresponding allowable threshold for each deviation. , , , and Each individual threshold can be set independently based on the range of physical parameter variations in the target defect area of ​​the GIS insulation component and the usage requirements of the equivalent sample. For example, the geometric deviation threshold can be set as follows: The dielectric deviation threshold can be set to The gas state deviation threshold can be set to The electric field deviation threshold can be set to The shortwave attenuation deviation threshold can be set to The values ​​above are for illustrative purposes only and can be adjusted according to specific objectives and detection requirements in actual applications.

[0094] According to the worst-case normalization bias Determine the worst-case normalization bias. When When the equivalent sample is deemed qualified, The equivalent sample is deemed unqualified at that time.

[0095] The core advantage of this criterion is that even if a severe mismatch in a certain physical parameter is averaged by other low-bias terms, as long as the normalization deviation of that single term exceeds 1, K If the value exceeds the limit and is greater than 1, the equivalent sample is deemed unqualified, thus ensuring that any serious mismatch in a single item cannot be masked by other low-bias items. For ease of understanding, the following examples illustrate this: Based on the measured data from the examples S3 to S6 above, this judgment example uses the complete measurement results of the same set of samples for calculation. After geometric parameter verification in S3, measured deviation after electric field calibration in S5, and measured deviation after shortwave attenuation calibration in S6, the five normalized deviations of this equivalent sample are as follows: =8% / 10%=0.8 (geometric deviation, comprehensively calculated from the 0.8% volume deviation, 2% burial depth deviation, and 2.4% principal axis ratio deviation in S3), =4% / 5%=0.8 (dielectric deviation), 2% / 10%=0.2 (gas state deviation), =0.8% / 10%=0.08 (electric field deviation, derived from the maximum field strength deviation of 0.8% after S5 calibration), =1.6% / 5%=0.32 (short-wave attenuation deviation, derived from the deviation of 1.6% after S6 calibration). According to the most unfavorable normalized deviation ≤1, this equivalent sample is determined to be qualified.

[0096] To further illustrate the sensitivity of the most unfavorable normalization determination criterion of the present application in capturing a "single weak item", the data before S6 short-wave attenuation calibration (i.e., without the compensation piece added =21.9%, normalized deviation =21.9% / 5%=4.38) is used for comparative calculation: if the short-wave attenuation is not calibrated, then >1, it is directly determined as unqualified. At this time, if the traditional weighted average method (with equal weights) is adopted, the average normalized deviation of the five items is only (0.8+0.8+0.2+0.08+4.38) / 5=1.252. Although it has exceeded 1, if strict mathematical calculation is not adopted and only intuitive judgment is relied on, this exceeding degree may be masked by the first four low deviations, giving an illusion of being close to qualification; while by adopting the most unfavorable criterion of the present application 4.38, it can clearly identify that this single weak item of short-wave attenuation is severely out of limit (exceeding the limit by about 338%), so as to accurately determine unqualified. Then, according to the directional correction path G5 (adding a compensation piece on the short-wave incident side), after the two-step compensation calibration described in S6 drops to 1.6%, the value drops back to 0.8, and the sample is qualified. This comparative calculation intuitively verifies that: ① the determination criterion of the present application can capture any severe mismatch in any physical dimension with the most stringent standard; ② the directional correction path can eliminate the "single weak item" in a targeted manner, so that the sample is transformed from an unqualified state to a qualified state; ③ the change of the value before and after correction (4.38→0.8) clearly reflects the actual effect of the calibration operation.

[0097] Step S7.3: Directional correction path When any of the multiple physical deviations does not meet the corresponding threshold, the following directional correction is performed according to the deviation type: G1) When the geometric deviation exceeds the limit, modify the size, positioning method or preparation process parameters of the air gap template.

[0098] G2) When the dielectric deviation exceeds the limit, correct the filler type, particle size distribution or content of the composite insulation matrix.

[0099] G3) When the gas state deviation exceeds the limit, correct the gas replacement parameters (such as the number of replacements, the evacuation time), the inflation pressure, or the sealing process (such as the sealing depth, the sealing material).

[0100] G4) When the electric field deviation exceeds the limit, correct the electrode spacing, electrode end curvature, or equivalent sample position of the adjustable electrode assembly.

[0101] G5) When the shortwave attenuation deviation exceeds the limit, correct the material, thickness, number of layers, setting position, installation direction of the equivalent sample, or the shortwave propagation path length of the detachable attenuation compensation component.

[0102] After correction, return to the corresponding calibration step (step S5 or S6) and re-execute, and re-execute the multi-constraint qualification judgment until all individual deviations meet the corresponding threshold.

[0103] In one exemplary embodiment, the method of this application further includes an equivalent sample number and calibration file, specifically: A unique number is generated for each qualified equivalent sample, and a calibration file is established. The calibration file should include at least the parameter set, equivalent sample design parameters, non-destructive measurement parameters, sample digital model identifier, electric field calibration parameters, shortwave attenuation calibration parameters, individual deviations, the most unfavorable normalized deviation, the applicable target defect type for the equivalent sample, and the effective state of the equivalent sample. The calibration file can be stored in an electronic database to facilitate the reproduction, comparison, and traceability management of equivalent samples from different batches.

[0104] For equivalent samples that have undergone long-term storage, transportation, or repeated use, non-destructive morphology measurements or shortwave attenuation measurements can be performed again. When the verification results exceed the allowable range, the equivalent sample will be marked as requiring recalibration or discontinued, and the status of the equivalent sample will be updated in the calibration file.

[0105] Those skilled in the art should understand that the specific parameters in the above embodiments (such as electrode spacing range, filler content percentage, threshold percentage, etc.) are illustrative examples and can be adjusted in practical applications according to the structure, material, defect type, and application of the equivalent sample of the GIS insulation component to be simulated. The execution order of each step can be adjusted appropriately according to actual conditions. As long as the target parameter acquisition, equivalent sample preparation, actual morphology confirmation, electric field and shortwave attenuation calibration, and equivalence determination can be completed, the technical objective of this application can be achieved.

[0106] The specific equipment types and models used for the aforementioned non-destructive morphology measurement, electric field calibration, and shortwave attenuation calibration do not constitute a limitation on the scope of protection of this application. Any testing equipment that can achieve the same or equivalent functions can be used as a substitute. The type of inorganic filler in the composite insulating matrix is ​​not limited to alumina, silicon dioxide, and boron nitride; other inorganic fillers with similar dielectric and attenuation regulation functions can also be used.

[0107] Furthermore, although this application uses GIS pot insulators and post insulators as typical application scenarios, those skilled in the art will readily understand that the methods and systems of this application are also applicable to the construction and calibration of equivalent samples of internal air gap defects in other epoxy composite insulation components, such as transformer insulators and bushing insulators, and the corresponding equivalent deformations are all within the protection scope of this application.

[0108] Each unit described in this application may be composed of independent equipment, or may be formed by combining a computer, a testing device, and an equivalent sample preparation device.

[0109] This application also provides an application scenario in which the above-mentioned method for constructing equivalent samples of GIS air gap defects and calibrating multiple physical parameters is applied. Specifically, a closed air gap defect detected in a 220kV GIS basin insulator is used as the simulation target. The defect is located near the central conductor of the insulator and is approximately ellipsoidal. The geometric parameters of the target defect region (equivalent volume approximately 2mm²) are obtained through step S1. 3 The equivalent sample was prepared according to steps S2 to S3, and then subjected to non-destructive testing, electric field calibration, shortwave attenuation calibration, and multi-constraint determination according to steps S4 to S6. This yielded an equivalent sample that met all individual threshold requirements. This equivalent sample can be used for subsequent calibration of testing equipment and verification of testing methods. (The sample parameters are: principal axis ratio approximately 2, burial depth approximately 5 mm; substrate dielectric parameters (dielectric constant approximately 4.5); gas state parameters (SF6 atmosphere); and local electric field descriptors (maximum field strength approximately 6 kV / mm).

[0110] Those skilled in the art should understand that the above values ​​only correspond to this specific scenario. In practical applications, the corresponding target parameters can be obtained according to different GIS voltage levels, insulation structure and defect characteristics, and equivalent sample construction and calibration can be carried out according to the method steps of this application, all of which can achieve the technical objectives of this application.

[0111] Based on the same inventive concept, this application also provides a system for implementing the above-described method. The solution provided by this system is similar to the solution described in the above-described method. Therefore, the specific limitations in the one or more GIS air gap defect equivalent sample construction and multi-physical parameter calibration system embodiments provided below can be found in the limitations of the GIS air gap defect equivalent sample construction and multi-physical parameter calibration method described above, and will not be repeated here.

[0112] In one exemplary embodiment, a system for constructing equivalent specimens of GIS air gap defects and calibrating multiple physical parameters is provided, including: a parameter acquisition and decomposition module, a non-destructive measurement and reconstruction module, an electric field calibration module, a shortwave attenuation calibration module, and a multi-constraint determination module.

[0113] The parameter acquisition and decomposition module is used to acquire the parameter set of the target defect area of ​​the GIS insulation component to be simulated, and decompose the parameter set into a first parameter set for determining the inherent properties of the equivalent sample body, a second parameter set for determining the external compensation conditions of the electric field, and a third parameter set for determining the external compensation conditions of shortwave attenuation.

[0114] The non-destructive measurement and reconstruction module is used to perform non-destructive morphology measurement on the equivalent sample prepared according to the first parameter set, and to establish a digital model of the sample based on the measured actual air gap boundary.

[0115] The electric field calibration module is used to independently calibrate the local electric field distribution in the digital model of the sample according to the second parameter set through an adjustable electrode assembly, so as to reduce electric field deviation. The electric field calibration module includes replaceable electrodes, a spacing adjustment mechanism, an equivalent sample positioning mechanism, and a finite element calculation unit. The calibration electrodes can be flat plates, rod-plate electrodes, coaxial electrodes, insert electrodes, or end-rounded electrodes.

[0116] The shortwave attenuation calibration module is used to independently calibrate the shortwave path attenuation of the equivalent sample according to the third parameter set, through a detachable attenuation compensation component located on the shortwave propagation path, in order to reduce attenuation deviation. The shortwave attenuation calibration module includes a shortwave source, a collimation unit, an incident intensity detection unit, an equivalent sample positioning frame, a detachable attenuation compensation component, a transmission intensity detection unit, and a shielding unit.

[0117] The multi-constraint judgment module is used to calculate multiple physical deviations of the equivalent sample relative to the target defect region, and to perform multi-constraint acceptance judgment on the equivalent sample based on the multiple physical deviations. The multi-constraint judgment module includes a deviation calculation unit, a comparison judgment unit, and a storage unit. The deviation calculation unit is used to calculate each individual physical deviation, the comparison judgment unit is used to perform acceptance judgment according to the most unfavorable normalized deviation, and the storage unit is used to store deviation data and judgment results.

[0118] The electric field calibration and the shortwave attenuation calibration are performed separately, and the adjustment parameters of the two calibration processes are independent of each other.

[0119] In one exemplary embodiment, a computer device is provided, which may be a server or a terminal, and its internal structure diagram may be as follows. Figure 3As shown, the computer device includes a processor, memory, input / output (I / O) interfaces, and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides the environment for the operating system and computer programs in the non-volatile storage media to run. The database stores target defect parameter sets, sample digital models, electric field calibration parameters, and shortwave attenuation calibration parameters. The I / O interfaces are used for information exchange between the processor and external devices. The communication interface is used for communication with external terminals via a network connection. When the computer program is executed by the processor, it implements a method for constructing equivalent samples of GIS air gap defects and calibrating multiple physical parameters.

[0120] Those skilled in the art will understand that Figure 3 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0121] In one exemplary embodiment, a computer device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0122] In one exemplary embodiment, a computer-readable storage medium is provided storing a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0123] In one exemplary embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above-described method embodiments.

[0124] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0125] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM).

[0126] The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0127] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0128] This document uses specific examples to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the methods and core ideas of this application. Furthermore, those skilled in the art will recognize that, based on the ideas of this application, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A method for constructing an equivalent sample of air gap defects in GIS and calibrating multiple physical parameters, characterized in that, include: Obtain the parameter set for the target defect region of the GIS insulation component to be simulated; The parameter set is divided into a first parameter group for determining the inherent properties of the sample body, a second parameter group for determining the external compensation conditions of the electric field, and a third parameter group for determining the external compensation conditions of shortwave attenuation. Non-destructive morphology measurement was performed on the equivalent sample prepared according to the first parameter set to establish a digital model of the sample based on the measured actual air gap boundary; According to the second set of parameters, the local electric field distribution in the digital model of the sample is independently calibrated by the adjustable electrode assembly to reduce the electric field deviation; According to the third parameter set, the shortwave path attenuation of the equivalent sample is independently calibrated by a detachable attenuation compensation component located on the shortwave propagation path to reduce attenuation deviation; Calculate multiple physical deviations of the equivalent sample relative to the target defect region, and perform multi-constraint acceptance judgment on the equivalent sample based on the multiple physical deviations.

2. The method for constructing equivalent samples of GIS air gap defects and calibrating multiple physical parameters according to claim 1, characterized in that, The first parameter set includes at least the dielectric constant, dielectric loss, and short-wave attenuation coefficient of the composite insulating matrix, as well as the volume, principal axis ratio, burial depth, orientation angle, gas composition, and pressure of the closed air gap; The second parameter set includes at least the electrode spacing, electrode end curvature, and relative position of the sample of the adjustable electrode assembly; The third parameter group includes at least the material, thickness, number of layers, and placement location of the attenuation compensation component.

3. The method for constructing equivalent GIS air gap defects and calibrating multiple physical parameters according to claim 1, characterized in that, The non-destructive morphology measurement includes at least one of microfocus X-ray imaging, computed tomography, ultrasound imaging, optical tomography, or capacitance tomography. The establishment of the digital model of the sample includes: reconstructing the digital model of the sample using the actual three-dimensional boundary of the closed air gap obtained by measurement, and calculating the local electric field distribution based on the reconstructed digital model of the sample.

4. The method for constructing equivalent GIS air gap defects and calibrating multiple physical parameters according to claim 1, characterized in that, The independent calibration of the local electric field distribution specifically includes: The digital model of the sample reconstructed based on the non-destructive topography measurement is placed into the electric field calculation model of the adjustable electrode assembly to calculate the local electric field descriptor of the closed air gap region; the local electric field descriptor includes at least one of the following: maximum field strength, average field strength, field strength enhancement coefficient, main field direction, and potential gradient; Based on the deviation between the calculated value of each local electric field descriptor and the target value corresponding to the target defect region, adjust at least one of the electrode spacing, electrode end curvature, or relative position of the sample of the adjustable electrode assembly until the deviation of each local electric field descriptor satisfies its respective independent threshold.

5. The method for constructing equivalent samples of GIS air gap defects and calibrating multiple physical parameters according to claim 1, characterized in that, The independent calibration of the shortwave path attenuation specifically includes: Under the condition that the equivalent sample is not electrically connected to the partial discharge acquisition circuit, the shortwave passes sequentially through the detachable attenuation compensation component and the equivalent sample along a predetermined path; Under the same detection response conditions, the incident intensity of the shortwave before reaching the equivalent sample and the transmitted intensity after passing through the detachable attenuation compensation component and the equivalent sample are measured, and the path attenuation of the equivalent sample is determined based on the measured incident intensity and the transmitted intensity. Based on the deviation between the path attenuation and the shortwave path attenuation of the target defect area, adjust at least one of the following: material, thickness, number of layers, setting position, or sample installation direction of the detachable attenuation compensation component.

6. The method for constructing equivalent samples of GIS air gap defects and calibrating multiple physical parameters according to claim 1, characterized in that, The multiple physical deviations include geometric deviations. Dielectric deviation Gas state deviation Electric field deviation and shortwave attenuation deviation ; The multi-constraint qualification determination specifically includes: calculating the geometric deviations respectively. Dielectric deviation Gas state deviation Electric field deviation and shortwave attenuation deviation Each deviation corresponds to a preset individual allowable threshold. , , , and According to the most unfavorable normalization bias The equivalent sample is then assessed for conformity; when When the equivalent sample is deemed qualified, The equivalent sample is deemed unqualified at that time.

7. An equivalent sample for air gap defects in GIS, characterized in that, The sample was prepared using the equivalent GIS air gap defect construction and multi-physical parameter calibration method described in any one of claims 1-6.

8. A system for constructing equivalent samples of air gap defects in GIS and calibrating multiple physical parameters, characterized in that, include: The parameter acquisition and decomposition module is used to acquire the parameter set of the target defect area of ​​the GIS insulation component to be simulated. The parameter set is divided into a first parameter group for determining the inherent properties of the sample body, a second parameter group for determining the external compensation conditions of the electric field, and a third parameter group for determining the external compensation conditions of shortwave attenuation. The non-destructive measurement and reconstruction module is used to perform non-destructive morphology measurement on the equivalent sample prepared according to the first parameter set, and to establish a digital model of the sample based on the measured actual air gap boundary. An electric field calibration module is used to independently calibrate the local electric field distribution in the digital model of the sample according to the second parameter set through an adjustable electrode assembly, so as to reduce electric field deviation. The shortwave attenuation calibration module is used to independently calibrate the shortwave path attenuation of the equivalent sample according to the third parameter set through a detachable attenuation compensation component located on the shortwave propagation path, so as to reduce attenuation deviation. The multi-constraint judgment module is used to calculate multiple physical deviations of the equivalent sample relative to the target defect area, and to perform multi-constraint qualification judgment on the equivalent sample based on the multiple physical deviations.

9. A computer device, comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that the processor executes the computer program to implement the steps of the method for constructing an equivalent sample of a GIS air gap defect and calibrating multiple physical parameters as described in any one of claims 1-6.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When executed by a processor, the computer program implements the steps of the method for constructing equivalent GIS air gap defects and calibrating multiple physical parameters as described in any one of claims 1-6.

Images