LED lighting device and LED testing and sorting machine

Abstract

The application belongs to the technical field of mechanical equipment, and particularly relates to an LED lighting device and an LED testing and sorting machine, which are used for lighting an LED. The LED lighting device comprises a probe seat provided with a containing cavity, wherein the probe seat is configured to be capable of linear reciprocating motion in the direction of approaching and moving away from the LED; a probe, wherein the probe is provided with an electrical contact end for lighting the LED; the probe is configured to be capable of rotating around a rotating shaft, so that the two ends of the probe are reversely displaced, and the probe is movably installed in the containing cavity; and a first elastic member, wherein one end of the first elastic member is connected with the probe seat, and the other end of the first elastic member is connected with the probe, so as to provide a pre-tightening force to the probe. The application can realize flexible contact between the probe and the LED.

Description

Technical Field

[0001] This invention relates to the field of LED testing technology, and in particular to an LED lighting device and an LED testing and sorting machine. Background Technology

[0002] During the production and quality inspection of LEDs (light-emitting diodes), optical performance tests, such as brightness and color temperature, are required. Before testing, probes are typically used to contact the LED's electrode leads to energize it and make it light up.

[0003] In automated testing equipment, such as LED testing and sorting machines, probes reciprocate at high frequencies to sequentially contact and illuminate a large number of LEDs on a turntable. During this process, high-speed, repeated physical contact occurs between the probe's contact tip and the LED pins. Currently, the probe directly and without buffering impacts the LED pins. The impact force generated by these high-speed collisions can easily damage the relatively fragile LED pins or cause wear and deformation of the probe tip, thus affecting the stability and yield of the test and shortening the equipment's lifespan. Therefore, how to achieve flexible contact between the probe and the LED, reducing the impact force, is a problem that urgently needs to be solved in existing technologies. Summary of the Invention

[0004] The purpose of this invention is to provide an LED lighting device to solve the problem in the prior art where the probe makes rigid contact with the LED, which can easily lead to excessive impact force and damage to the LED or the probe.

[0005] The present invention adopts the following technical solution: An LED lighting device for lighting LEDs, the LED lighting device comprising: A probe holder is provided with a cavity, and the probe holder is configured to reciprocate linearly along the direction of approaching and moving away from the LED; A probe having an electrical contact end for illuminating the LED, the electrical contact end being able to move closer to or away from the LED as the probe holder reciprocates linearly; the probe is configured to rotate about a pivot axis to cause opposite displacements at both ends of the probe; the probe is movably mounted in a receiving cavity, the receiving cavity being configured to allow adaptive deflection of the probe upon contact with the LED; A first elastic element, one end of which is connected to the probe holder and the other end of which is connected to the probe, provides a preload force to the probe so that the electrical contact end can absorb the impact force through the deflection when it contacts the LED.

[0006] Furthermore, the rotating shaft is mounted on the probe holder, and the probe has an arc-shaped groove on the side facing the rotating shaft. The rotating shaft passes through the arc-shaped groove and abuts against the inner wall of the arc-shaped groove, so that the probe can rotate around the rotating shaft.

[0007] Furthermore, the probe holder is provided with a strip-shaped mounting groove with a U-shaped cross-section. The accommodating cavity is a strip-shaped notch with a rectangular cross-section. The mounting groove intersects the strip-shaped notch perpendicularly. The rotating shaft is mounted on the mounting groove. The cross-sectional area of ​​the strip-shaped notch is larger than the cross-sectional area of ​​the corresponding part of the probe, so that the probe can adaptively deflect within the strip-shaped notch.

[0008] Furthermore, the probe holder includes an upper seat and a lower seat. The upper seat is provided with a first strip groove, and the lower seat is provided with a second strip groove. The first strip groove and the second strip groove together form the strip notch. The mounting groove is provided on the lower seat. The upper end of the first elastic member is connected to the upper seat, and the lower end of the first elastic member is connected to the probe.

[0009] Furthermore, there are two probe holders, which are symmetrically distributed, and each probe holder contains two probes.

[0010] Furthermore, the first elastic element and the electrical contact end are located on the same side of the rotating shaft, the upper end of the first elastic element is connected to the upper seat, and the lower end of the first elastic element is connected to the probe; or, The first elastic element and the electrical contact end are located on opposite sides of the rotating shaft. The upper end of the first elastic element is connected to the probe, and the lower end of the first elastic element is connected to the lower seat.

[0011] Furthermore, the LED lighting device also includes a base, a motor, a cam, a bearing, a connecting block, and a second elastic element. The motor is fixed to the base, the connecting block is slidably mounted on the base, the probe holder is mounted on the connecting block, the bearing is mounted on the connecting block, and the side of the bearing abuts against the side of the cam. The cam is mounted on the output end of the motor to drive the connecting block to reciprocate linearly. One end of the second elastic element is connected to the base, and the other end of the second elastic element is connected to the connecting block, so that the side of the bearing and the side of the cam remain in contact.

[0012] Furthermore, the LED lighting device also includes a positioning pin. The upper seat and the lower seat are fixed by screws. The lower seat is provided with a positioning groove. The connecting block is provided with a pin hole corresponding to the position of the positioning groove. The positioning pin passes through the positioning groove and is placed in the pin hole.

[0013] Furthermore, the upper seat is provided with a cylindrical groove, and one end of the first elastic member is connected to the inner top wall of the cylindrical groove.

[0014] This application also provides an LED testing and sorting machine, including a turntable mechanism, an integrating sphere, and an LED lighting device. The turntable mechanism is used to carry the LED and can rotate the LED to the test position. The integrating sphere is located above the test position. The electrical contact end of the LED lighting device can press and light up the LED so that the integrating sphere can test the LED.

[0015] Compared with the prior art, the beneficial effects of the present invention are as follows: By configuring the probe to rotate around a pivot and applying a preload to it using a first elastic element, a seesaw-like buffer structure is constructed. When the electrical contact end of the probe comes into contact with the LED, the reaction force from the LED causes the probe to deflect. This deflection process is resisted by the first elastic element, thus converting the rigid impact energy into the potential energy of the first elastic element. The first elastic element effectively absorbs the impact force, avoiding damage to the LED and the probe itself caused by rigid collisions, significantly improving the stability of the testing system and the service life of the equipment. Even if there is a slight error in the descent position of the probe holder (overshoot), the excess stroke can be absorbed by the deflection of the probe and the compression of the first elastic element, forming a so-called "overstroke protection". Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a schematic diagram of the structure of an LED testing and sorting machine provided in one embodiment of this application; Figure 2 This is a schematic diagram of the probe holder and the probe in a first direction in an LED lighting device according to an embodiment of this application; Figure 3 This is a schematic diagram of the probe holder and the probe in a second direction in an LED lighting device according to an embodiment of this application; Figure 4 This application provides a schematic diagram of the structure of the lower seat and probe in an LED lighting device according to an embodiment of the present application; Figure 5 This is a schematic diagram of the structure of a probe and a rotating shaft in an LED lighting device according to an embodiment of this application; Figure 6 This is a schematic diagram of the structure of the upper seat in an LED lighting device according to an embodiment of this application.

[0018] The components include: probe base 1; upper base 1-1; lower base 1-2; accommodating cavity 1-3; second strip groove 1-4; first strip groove 1-5; mounting groove 1-6; positioning groove 1-7; cylindrical groove 1-8; probe 2; arc-shaped groove 2-1; electrical contact end 2-2; first elastic element 3; rotating shaft 4; base 5; motor 6; cam 7; bearing 8; connecting block 9; clearance notch 9-1; second elastic element 10; turntable mechanism 11; and LED 12. Detailed Implementation

[0019] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present invention.

[0020] Before providing a further detailed description of the embodiments of this application, some of the nouns and terms involved in the embodiments of this application will be explained. The nouns and terms involved in the embodiments of this application are subject to the following interpretations.

[0021] (1) Probe mount: refers to the base used to mount probes, which can make linear reciprocating motion in the direction of approaching and moving away from LED.

[0022] (2) Probe: refers to a conductive component with an electrical contact end, used to contact the pin of an LED to light it up.

[0023] (3) First elastic element: refers to elastic elements such as second elastic element, which are used to provide preload to the probe so that the probe can deflect when it contacts the LED. The deflection of the probe will compress the first elastic element so that the first elastic element absorbs the impact force and plays a buffering role. Due to the preload of the first elastic element, the reliability of the contact between the electrical contact end and the LED pin can also be guaranteed.

[0024] (4) LED test and sorting machine: refers to an automated device, including a turntable mechanism for carrying and rotating LEDs, and an LED lighting device for lighting LEDs for optical testing, which aims to achieve high-speed and automated quality inspection and classification of LED products.

[0025] (5) Adaptive deflection: This refers to the fact that when the probe contacts the LED, it is allowed to rotate around a pivot in a "seesaw" manner so that the first elastic element absorbs the impact force and avoids rigid collision between the electrical contact end and the LED.

[0026] (6) Preload: refers to a continuous force applied to the probe by the first elastic element before the probe contacts the LED, to ensure that the electrical contact end of the probe can be reset after deflection and maintain stable contact with the LED.

[0027] (7) Electrical contact end: refers to the part on the probe used to contact the pin of the LED, thereby energizing the LED and lighting it up.

[0028] Please see Figures 1 to 6 The LED lighting device of this application addresses the technical problem in existing LED testing equipment where rigid collisions during high-speed contact with the LED under test can easily damage the probe or LED, affecting test yield and equipment lifespan. The LED lighting device of this application enables the probe to achieve flexible self-adaptation upon contact with the LED, thereby absorbing impact energy. The LED lighting device of this application includes a probe holder 1 capable of linear reciprocating motion, a probe 2 capable of rotating around a pivot axis, and a first elastic element 3 providing preload.

[0029] Specifically, the probe holder 1 is configured to reciprocate linearly along the direction of approaching and moving away from the LED 12 under test. This movement is the fundamental action for achieving contact and separation between the probe and the LED electrode in automated testing. By driving the reciprocating motion of the probe holder 1, the probe 2 can be controlled to periodically perform lighting tests on the LED 12 transported from the turntable mechanism 11.

[0030] The probe 2 is a key component for achieving electrical connection, having an electrical contact end 2-2 for illuminating the LED 12. The probe 2 is a conductive rod-shaped part, one end of which is designed to form a good electrical contact with the LED 12 electrode, the electrical contact end 2-2. This electrical contact end 2-2 moves synchronously towards or away from the LED 12 as the probe holder 1 reciprocates linearly. Unlike conventional rigidly fixed probes, the probe 2 in this application is movably mounted in a receiving cavity 1-3 inside the probe holder 1 and is configured to rotate about a solid axis. This allows the two ends of the probe 2 to produce a seesaw-like reverse displacement. The space of the receiving cavity 1-3 is designed to be sufficiently large to allow the probe 2 to undergo an adaptive deflection at a certain angle when contacting the LED 12; at least the space of the receiving cavity 1-3 is greater than the space required for the probe 2 to deflect. This deflection is the core mechanical movement that enables the buffering function. By allowing probe 2 to deflect when subjected to force, it avoids rigid collision between the electrical contact end 2-2 and the LED electrode, transforming the instantaneous impact force into a smooth contact process.

[0031] To ensure the deflection of probe 2 has a controllable buffering effect and maintains a stable posture when not in contact with LED 12, this application incorporates a first elastic element 3, preferably a spring. The first elastic element 3 and the electrical contact end 2-2 of probe 2 are located on the same side of the rotating shaft. The upper end of the first elastic element 3 is connected to probe base 1, and the lower end is connected to probe 2. The connection methods between the first elastic element 3 and probe base 1, and between the first elastic element 3 and probe 2, include abutment, fixing, etc. This arrangement allows the first elastic element 3 to apply a preload to the electrical contact end 2-2 of probe 2. When probe 2 moves downwards and contacts LED 12, the reaction force from LED 12 overcomes this preload, causing probe 2 to rotate around the shaft and simultaneously compressing the first elastic element 3. The compression process of the first elastic element 3 absorbs the kinetic energy of the impact, thus buffering the impact force. This design solves the problem of device damage caused by high-speed rigid contact, significantly improving the reliability of the test and the durability of the equipment. After buffering, the first elastic element 3 can still drive the electrical contact end 2-2 to move toward the pin of LED12 until contact is made, ensuring the reliability of the contact between the electrical contact end 2-2 and the pin of LED12.

[0032] This application has at least the following beneficial effects: By configuring the probe to rotate around a pivot and applying a preload to it using a first elastic element, a seesaw-like buffer structure is constructed. When the electrical contact end of the probe contacts the LED, the reaction force from the LED causes the probe to deflect. This deflection process is resisted by the first elastic element, thereby converting the rigid impact energy into the potential energy of the first elastic element. The first elastic element thus effectively absorbs the impact force, avoiding damage to the LED and the probe itself caused by rigid collisions, significantly improving the stability of the testing system and the service life of the equipment. Even if there is a slight error (overshoot) in the descent position of the probe holder, the excess stroke can be absorbed by the deflection of the probe and the compression of the first elastic element, forming a so-called "overstroke protection".

[0033] Furthermore, in a preferred embodiment, to provide a stable and precise fulcrum for the rotation of probe 2, the LED lighting device further includes a rotating shaft 4. For example... Figure 5 As shown, the rotating shaft 4 is installed inside the probe holder 1, and the probe 2 has a corresponding arc-shaped groove 2-1 facing the rotating shaft 4. During assembly, the rotating shaft 4 passes through or is embedded in this arc-shaped groove 2-1 and abuts against the inner wall of the arc-shaped groove 2-1. This structure allows the probe 2 to rotate around the rotating shaft 4. The cooperation between the rotating shaft 4 and the arc-shaped groove 2-1 ensures a constant center of rotation, making the deflection movement of the probe smoother and more predictable, thereby ensuring the consistency and reliability of the buffering effect.

[0034] like Figure 4As shown, the probe holder 1 has a strip-shaped mounting groove 1-6, preferably U-shaped in cross-section, for accommodating and placing the rotating shaft 4. Simultaneously, the accommodating cavity 1-3 is specifically defined as a strip-shaped notch with a rectangular cross-section. The mounting groove 1-6 intersects this strip-shaped notch perpendicularly. This layout allows the rotating shaft 4, installed in the mounting groove 1-6, to span across the strip-shaped notch, providing a rotation fulcrum for the probe 2 installed within the notch. Furthermore, the cross-sectional area of ​​this strip-shaped notch is larger than the cross-sectional area of ​​the corresponding part of the probe 2. This dimensional margin provides the necessary deflection space for the probe 2 when contacting the LED 12 and rotating around the rotating shaft 4, ensuring that the probe 2 does not interfere with or get stuck against the upper and lower walls of the accommodating cavity 1-3, thereby guaranteeing the smooth implementation of the buffering function.

[0035] Furthermore, for ease of manufacturing and assembly, the probe holder 1 can adopt a split structure. For example... Figure 2 , Figure 3 , Figure 4 and Figure 6 As shown, the probe holder 1 includes an upper seat 1-1 and a lower seat 1-2. The upper seat 1-1 has a first strip groove 1-5, and the lower seat 1-2 has a second strip groove 1-4. When the upper seat 1-1 and the lower seat 1-2 are closed, the first strip groove 1-5 and the second strip groove 1-4 together form the aforementioned strip-shaped notch, i.e., the cavity 1-3. The mounting groove 1-6 for mounting the rotating shaft 4 is provided on the lower seat 1-2. During assembly, the rotating shaft 4 and the probe 2 can be placed in their respective positions on the lower seat 1-2 first, then the first elastic element 3 can be placed on the probe 2, and finally the upper seat 1-1 can be closed and fixed. In this design, the upper end of the first elastic element 3 can be connected to the inner wall of the upper seat 1-1, and the lower end can be connected to the probe 2. This split design simplifies the assembly process, facilitates subsequent maintenance and replacement of parts, and reduces manufacturing costs and maintenance difficulty.

[0036] In one alternative embodiment, to simultaneously contact both electrodes (anode and cathode) of the LED to form a conductive circuit and ensure balanced force application, the LED lighting device is provided with two probe holders 1. These two probe holders 1 are symmetrically distributed, for example, symmetrically arranged with respect to the LED 12. Accordingly, each probe holder 1 can accommodate two probes 2. The probe 2 in one probe holder 1 is used to contact the anode of the LED 12, and the probe 2 in the other probe holder 1 is used to contact the cathode of the LED 12. Providing two probes 2 in one probe holder 1 prevents poor contact between one probe 2 and the LED electrode while the other probe 2 can still contact the LED electrode, ensuring that the two electrodes of the LED form a conductive circuit.

[0037] Furthermore, to achieve high-speed, automated linear reciprocating motion of the probe holder 1, this application embodiment provides a complete drive mechanism. For example... Figure 1As shown, the LED lighting device also includes a base 5, a motor 6, a cam 7, a bearing 8, a connecting block 9, and a second elastic element 10. The second elastic element 10 is preferably a spring. The motor 6 serves as the power source and is fixedly mounted on the base 5. The connecting block 9 can slide up and down along the base 5, while the probe seat 1 is fixedly mounted on the connecting block 9 and moves with it. The bearing 8 is mounted on the connecting block 9, with its outer ring side abutting against the side profile of the cam 7. The cam 7 is mounted on the output shaft of the motor 6. When the motor 6 drives the cam 7 to rotate, the irregular profile of the cam 7 pushes the bearing 8, thereby causing the connecting block 9 to produce precise linear reciprocating motion. This is a mature and reliable transmission method that can smoothly convert rotary motion into linear motion, making it very suitable for high-speed, high-frequency automated applications. To ensure that the bearing 8 always closely conforms to the profile of the cam 7 and avoids separation or impact due to inertia during high-speed motion, a second elastic element 10 is also provided. One end of the second elastic element 10 is connected to the base 5, and the other end is connected to the connecting block 9. It continuously applies a force to the connecting block 9, ensuring that the side of the bearing 8 and the side of the cam 7 remain in pre-tight contact. During the descent of the connecting block 9, the second elastic element 10 pulls on the connecting block 9, preventing it from falling due to gravity while ensuring that the bearing 8 and cam 7 remain in contact. During the ascent of the connecting block 9, the second elastic element 10 assists in its ascent while maintaining contact between the bearing 8 and cam 7. This drive system, through precise mechanical coordination, achieves accurate control of the probe holder 1's movement trajectory and rhythm, forming the basis for efficient automated testing.

[0038] In a preferred embodiment, when the probe holder 1 descends to contact the LED 12 located on the turntable mechanism 11, the connecting block 9 supporting the probe holder 1 also descends accordingly. To avoid the connecting block 9 itself colliding with the turntable mechanism 11 below, such as... Figure 1 As shown, the connecting block 9 has a clearance notch 9-1. Two symmetrically distributed probe holders 1 are respectively installed on both sides of the clearance notch 9-1. When the connecting block 9 descends, the clearance notch 9-1 can just cross the position of the test position of the turntable mechanism 11, so that only the electrical contact end 2-2 of the probe 2 can contact the LED 12.

[0039] like Figure 2 and Figure 4As shown, the upper seat 1-1 and lower seat 1-2 can be fixed with screws or other fasteners. To ensure accurate relative positioning between the probe holder 1 and the connecting block 9, the lower seat 1-2 is provided with a positioning groove 1-7, and the connecting block 9 is provided with a pin hole at the corresponding position of the positioning groove 1-7. During assembly, a positioning pin can pass through the positioning groove 1-7 of the lower seat 1-2 and be inserted into the pin hole of the connecting block 9. After positioning using this pin-hole engagement method, the upper seat 1-1 and lower seat 1-2 are then fixed with screws.

[0040] To ensure the stability and guiding accuracy of the connecting block 9 during high-speed reciprocating motion, in another preferred embodiment, the LED lighting device further includes a slider and a guide rail. One of them (e.g., the guide rail) can be fixed to the base 5, while the other (e.g., the slider) is fixed to the connecting block 9, with the slider slidably mounted on the guide rail. This strictly restricts the movement of the connecting block 9 to one degree of freedom, namely linear movement along the guide rail direction, effectively eliminating undesirable postures such as swaying and deflection that may occur during movement. This improves the stability and repeatability of the probe holder 1's movement, providing a reliable guarantee for achieving high-precision testing.

[0041] To reliably position the first elastic element 3 and prevent it from shifting or buckling during repeated compression and rebound, in an optional embodiment, such as Figure 6 As shown, a cylindrical groove 1-8 is provided above the mounting position of the first elastic element 3 within the upper seat 1-1. The upper end of the first elastic element 3 (e.g., a spiral second elastic element) can be placed within the cylindrical groove 1-8 and connected to the inner top wall of the cylindrical groove 1-8. The side wall of the cylindrical groove 1-8 acts as a radial limit for the first elastic element 3, ensuring that the first elastic element 3 always maintains an upright posture during operation, thereby stably and continuously applying preload to the probe 2 and ensuring consistent buffering performance.

[0042] The complete workflow of this LED lighting device is as follows: 1. Driving and Descending: Motor 6 starts, driving cam 7 to rotate. The contour of cam 7 pushes bearing 8, causing connecting block 9 to move smoothly downwards at high speed along the guide rail. The two probe seats 1 mounted on connecting block 9 descend accordingly. 2. Contact and Buffering: The electrical contact end 2-2 of probe 2 contacts the electrode of LED 12. As connecting block 9 continues to descend (overtravel), the reaction force generated by LED 12 on probe 2 overcomes the preload of the first elastic element 3, forcing probe 2 to deflect at a small angle around the rotating shaft 4. During this process, the first elastic element 3 is compressed, effectively absorbing impact energy, achieving flexible contact and reliable electrical connection, and LED 12 is lit. 3. Testing and Holding Pressure: Cam 7 rotates to its highest point, connecting block 9 is in its lowest position, and probe 2 maintains a stable contact pressure on LED 12 under the action of the first elastic element 3, so that the optical instruments above can test LED 12. 4. Return and Reset: As cam 7 continues to rotate, under the pulling force of the second elastic element 10, connecting block 9 is quickly pulled back to its initial highest position, and probe 2 separates from LED 12. Probe 2 returns to its initial tilted posture under its own weight and the action of the first elastic element 3, ready for the next cycle.

[0043] like Figure 1 As shown in the illustration, this application also provides an LED testing and sorting machine, including a turntable mechanism 11 and the aforementioned LED lighting device. The turntable mechanism 11 carries the LED 12 to be tested and rotates it sequentially to a preset test position through a step-by-step rotation. At the test position, the electrical contact end 2-2 of the probe 2 descends and presses against the electrode of the LED 12, thereby lighting the LED. At this time, the optical detection device (such as an integrating sphere) located above can accurately measure the optical performance (such as brightness, color temperature, spectrum, etc.) of the LED. After the test is completed, the probe 2 is lifted, and the turntable mechanism 11 continues to rotate, sending the tested LED 12 to the subsequent sorting station, where it is classified into different grade bins according to the test results. By combining the LED lighting device with flexible contact function with the automated turntable mechanism, the LED testing and sorting machine of this application can achieve high-speed, non-destructive, and accurate automated testing and sorting of LED products, improving production efficiency and product yield.

[0044] The present invention has been further described above with reference to specific embodiments. The specific descriptions herein should not be construed as limiting the nature and scope of the present invention. Various modifications made by those skilled in the art to the above embodiments after reading this specification are all within the scope of protection of the present invention.

Claims

1. An LED lighting device, characterized in that, For lighting LEDs, the LED lighting device includes: A probe holder is provided with a cavity, and the probe holder is configured to reciprocate linearly along the direction of approaching and moving away from the LED; A probe having an electrical contact end for illuminating the LED, the electrical contact end being able to move closer to or away from the LED as the probe holder reciprocates linearly; the probe is configured to rotate about a pivot axis to cause opposite displacements at both ends of the probe; the probe is movably mounted in a receiving cavity, the receiving cavity being configured to allow adaptive deflection of the probe upon contact with the LED; A first elastic element, one end of which is connected to the probe holder and the other end of which is connected to the probe, provides a preload force to the probe so that the electrical contact end can absorb the impact force through the deflection when it contacts the LED.

2. The LED lighting device according to claim 1, characterized in that, The rotating shaft is mounted on the probe holder. The probe has an arc-shaped groove on the side facing the rotating shaft. The rotating shaft passes through the arc-shaped groove and abuts against the inner wall of the arc-shaped groove, so that the probe can rotate around the rotating shaft.

3. The LED lighting device according to claim 2, characterized in that, The probe holder has a strip-shaped mounting groove with a U-shaped cross-section. The receiving cavity is a strip-shaped notch with a rectangular cross-section. The mounting groove and the strip-shaped notch intersect perpendicularly. The rotating shaft is mounted in the mounting groove. The cross-sectional area of ​​the strip-shaped notch is larger than the cross-sectional area of ​​the corresponding part of the probe, so that the probe can adaptively deflect within the strip-shaped notch.

4. The LED lighting device according to claim 3, characterized in that, The probe holder includes an upper seat and a lower seat. The upper seat is provided with a first strip groove, and the lower seat is provided with a second strip groove. The first strip groove and the second strip groove together form the strip-shaped notch, and the mounting groove is provided on the lower seat.

5. The LED lighting device according to claim 4, characterized in that, There are two probe holders, which are symmetrically distributed, and each probe holder contains two probes.

6. The LED lighting device according to claim 4, characterized in that, The first elastic element and the electrical contact end are located on the same side of the rotating shaft. The upper end of the first elastic element is connected to the upper seat, and the lower end of the first elastic element is connected to the probe; or, The first elastic element and the electrical contact end are located on opposite sides of the rotating shaft. The upper end of the first elastic element is connected to the probe, and the lower end of the first elastic element is connected to the lower seat.

7. The LED lighting device according to claim 5, characterized in that, The LED lighting device further includes a base, a motor, a cam, a bearing, a connecting block, and a second elastic element. The motor is fixed to the base, the connecting block is slidably mounted on the base, the probe holder is mounted on the connecting block, the bearing is mounted on the connecting block, and the side of the bearing abuts against the side of the cam. The cam is mounted on the output end of the motor to drive the connecting block to reciprocate linearly. One end of the second elastic element is connected to the base, and the other end of the second elastic element is connected to the connecting block so that the side of the bearing and the side of the cam remain in contact.

8. The LED lighting device according to claim 7, characterized in that, The LED lighting device also includes a positioning pin. The upper seat and the lower seat are fixed by screws. The lower seat is provided with a positioning groove. The connecting block is provided with a pin hole corresponding to the position of the positioning groove. The positioning pin passes through the positioning groove and is placed in the pin hole.

9. The LED lighting device according to claim 7, characterized in that, The upper seat is provided with a cylindrical groove, and one end of the first elastic element is connected to the inner top wall of the cylindrical groove.

10. An LED testing and sorting machine, characterized in that, The device includes a turntable mechanism, an integrating sphere, and an LED lighting device as described in any one of claims 1-9. The turntable mechanism is used to carry the LED and can rotate the LED to a test position. The integrating sphere is located above the test position. The electrical contact end of the LED lighting device can press and light up the LED so that the integrating sphere can test the LED.

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