Method and device for solving signal line interference problem, computer device, readable storage medium and program product

Abstract

The application relates to a signal line interference problem solving method and device, computer equipment, a computer readable storage medium and a computer program product, and relates to the technical field of display. The method comprises the following steps: obtaining a measured waveform and a measured frequency spectrum distribution of a transmission signal of a signal line; obtaining a first simulation waveform and a first simulation frequency spectrum distribution of the signal line under no reflection; obtaining a second simulation waveform and a second simulation frequency spectrum distribution of the signal line under an actual signal propagation time; determining an interference cause of the interference problem of the signal line based on the three groups of waveforms and frequency spectrum distributions; and adjusting signal integrity of the signal transmitted by the signal line to solve the interference problem of the signal line when the determined interference cause is a target cause. In this way, when the EMI problem of the signal is caused by signal integrity, the EMI problem can be eliminated by solving the signal integrity problem.

Description

Technical Field

[0001] This application relates to the field of display technology, and in particular to a solution, apparatus, computer device, computer-readable storage medium, and computer program product for a signal line interference problem. Background Technology

[0002] Some signal lines commonly used in display devices may exhibit EMI (Electromagnetic Interference) radiation during use. To address this EMI issue, related technologies typically employ embedded signal transmission structures or shielded signal transmission structures for signal line routing within the display device. However, this design places significant demands on both the PCB (Printed Circuit Board) used for wiring and the display device itself. For example, it requires the PCB to have a sufficient number of film layers or adequate internal space for the transmission structure. Clearly, these EMI solutions offered by related technologies cannot meet the needs of multiple scenarios. Summary of the Invention

[0003] Therefore, it is necessary to provide a solution, apparatus, computer equipment, computer-readable storage medium, and computer program product that can be applied to signal line EMI problems in multiple scenarios, addressing the aforementioned technical issues.

[0004] In a first aspect, this application provides a solution to the signal line interference problem, the method comprising:

[0005] The measurement waveform of the signal transmitted by the signal line in the current circuit board is obtained, and the rise time and measurement spectrum distribution of the waveform are obtained based on the measurement waveform.

[0006] The maximum non-reflection length of the signal line is determined based on the rise time, and simulation modeling is performed based on the maximum non-reflection length to obtain the simulation model corresponding to the signal line.

[0007] Based on a preset signal source and the rise time, the simulation is performed in the simulation model to obtain the first simulated waveform and the first simulated spectrum distribution of the signal line under no reflection.

[0008] The signal propagation time of the simulation model is adjusted to the actual signal propagation time of the signal transmitted by the signal line, and simulation is performed in the adjusted simulation model based on the preset signal source and the rise time to obtain the second simulated waveform and the second simulated spectrum distribution of the signal line under the actual signal propagation time.

[0009] Based on the measured waveform, the measured spectrum distribution, the first simulated waveform, the first simulated spectrum distribution, the second simulated waveform, and the second simulated spectrum distribution, the cause of interference in the signal line is determined.

[0010] If the cause of the interference is determined to be the target cause, the signal integrity of the signal is adjusted.

[0011] In one embodiment, determining the cause of interference in the signal line includes:

[0012] If the similarity between the measured waveform and the second simulated waveform is greater than or equal to a preset first similarity, and the similarity between the measured spectrum distribution and the second simulated spectrum distribution is greater than or equal to a preset second similarity, the interference cause corresponding to the signal line is determined to include signal integrity issues.

[0013] If the similarity between the measured waveform and the first simulated waveform is greater than or equal to a preset third similarity, and the similarity between the measured spectrum distribution and the first simulated spectrum distribution is greater than or equal to a preset fourth similarity; or, if the similarity between the measured waveform and the first simulated waveform, and the similarity between the measured waveform and the second simulated waveform are both less than a preset fifth similarity, and the similarity between the measured spectrum distribution and the first simulated spectrum distribution, and the similarity between the measured spectrum distribution and the second simulated spectrum distribution are both less than a preset sixth similarity, then the interference cause corresponding to the signal line is determined to include non-signal integrity issues.

[0014] Wherein, the preset fifth similarity is less than the preset first similarity, the preset sixth similarity is less than the preset second similarity; and / or, the preset fifth similarity is less than the preset third similarity, and the preset sixth similarity is less than the preset fourth similarity.

[0015] In one embodiment, determining the cause of interference corresponding to the signal line includes non-signal integrity issues, including:

[0016] The cause of interference corresponding to the signal line can be determined to include the preset signal source and / or the chip connected to the signal line having parameter setting problems.

[0017] In one embodiment, determining the maximum reflection-free length of the signal line based on the rise time includes:

[0018] Based on the length of the signal corresponding to 1 / 10 of the rise time within a preset medium, the maximum non-reflection length of the signal line is determined; wherein, the rise time is the rise time within one waveform period of the measured waveform.

[0019] In one embodiment, the method further includes:

[0020] The preset signal source is determined based on the preset voltage value, preset rise time, preset fall time, and preset signal rate.

[0021] In one embodiment, acquiring the measurement waveform of the signal transmitted on the signal line in the current circuit board, and obtaining the measurement spectrum distribution of the waveform based on the measurement waveform, includes:

[0022] Obtain the signal transmitting and receiving ends of the signal lines on the current circuit board, and measure the waveform within at least one waveform cycle.

[0023] Based on the measured waveform and the fast Fourier transform, the measurement spectrum distribution associated with the measured waveform is obtained.

[0024] Secondly, this application also provides a device for solving signal line interference problems, the device comprising:

[0025] The signal data acquisition module is used to acquire the measurement waveform of the signal transmitted by the signal line in the current circuit board, and to obtain the rise time and measurement spectrum distribution of the waveform based on the measurement waveform.

[0026] The simulation modeling module is used to determine the maximum non-reflection length of the signal line based on the rise time, and to perform simulation modeling based on the maximum non-reflection length to obtain the simulation model corresponding to the signal line.

[0027] The simulation module is used to perform simulation in the simulation model based on a preset signal source and the rise time to obtain a first simulated waveform and a first simulated spectrum distribution corresponding to the signal line under no reflection; and to adjust the signal propagation time of the simulation model to the actual signal propagation time of the signal transmitted by the signal line, and to perform simulation in the adjusted simulation model based on the preset signal source and the rise time to obtain a second simulated waveform and a second simulated spectrum distribution corresponding to the signal line under the actual signal propagation time.

[0028] The cause determination module is used to determine the cause of interference in the signal line based on the measured waveform, the measured spectrum distribution, the first simulated waveform, the first simulated spectrum distribution, the second simulated waveform, and the second simulated spectrum distribution.

[0029] The problem-solving module is used to adjust the signal integrity of the signal when the cause of the interference is determined to be the target cause.

[0030] Thirdly, this application also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement any of the steps in the first aspect.

[0031] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements any of the steps in the first aspect.

[0032] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, implements any of the steps in the first aspect.

[0033] The present application provides a solution, apparatus, computer device, computer-readable storage medium, and computer program product for signal line interference problems. The solution involves: acquiring a measured waveform of the signal transmitted by a signal line on a current circuit board; obtaining the rise time and measured spectral distribution of the waveform based on the measured waveform; determining the maximum non-reflection length of the signal line based on the rise time; performing simulation modeling based on the maximum non-reflection length to obtain a simulation model corresponding to the signal line; performing simulation in the simulation model based on a preset signal source and rise time to obtain a first simulated waveform and a first simulated spectral distribution of the signal line under non-reflection conditions; adjusting the signal propagation time of the simulation model to the actual signal propagation time of the signal transmitted by the signal line; performing simulation in the adjusted simulation model based on the preset signal source and rise time to obtain a second simulated waveform and a second simulated spectral distribution of the signal line under the actual signal propagation time; determining the cause of interference in the signal line based on the measured waveform, measured spectral distribution, first simulated waveform, first simulated spectral distribution, second simulated waveform, and second simulated spectral distribution; and adjusting the signal integrity of the signal when the cause of interference is determined to be the target cause. As can be seen, the solution to the signal line interference problem provided in this application first acquires the measured waveform and measured spectrum distribution of the transmitted signal of the signal line, then acquires the first simulated waveform and first simulated spectrum distribution of the signal line under no reflection, and the second simulated waveform and second simulated spectrum distribution of the signal line under the actual signal propagation time. Based on these three sets of waveforms and spectrum distributions, the cause of interference in the signal line is determined. Then, when the cause of interference is determined to be the target cause, the signal integrity of the signal transmitted by the signal line can be adjusted to solve the signal line interference problem. Thus, when the EMI problem of the signal is caused by the signal integrity, an appropriate method that can solve the signal integrity problem can be selected to adjust the signal integrity of the signal transmitted by the signal line to eliminate the EMI problem. This method is applicable to solving the EMI problem of signal lines in different scenarios. Attached Figure Description

[0034] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0035] Figure 1 This is a PCB routing method in related technologies;

[0036] Figure 2 This is another PCB routing method in related technologies;

[0037] Figure 3 This is a top view of a PCB wiring diagram in a related technology.

[0038] Figure 4 This is a top view of another type of PCB routing in related technologies;

[0039] Figure 5 This is a flowchart illustrating a solution to a signal line interference problem in one embodiment;

[0040] Figure 6 This is a schematic diagram of the measurement waveform in one embodiment;

[0041] Figure 7 This is a schematic diagram of the first simulated waveform in one embodiment;

[0042] Figure 8 for Figure 6 and Figure 7 A schematic diagram of a fitting result;

[0043] Figure 9 This is a schematic diagram of the waveform optimization result in one embodiment;

[0044] Figure 10 This is a schematic diagram of the EMI optimization results in one embodiment;

[0045] Figure 11 This is a circuit architecture diagram of a circuit board in one embodiment;

[0046] Figure 12 This is a structural block diagram of a device for solving signal line interference problems in one embodiment.

[0047] Figure 13 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0048] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0049] Please refer to Figure 1 and Figure 2 , Figure 1 The diagram shows a PCB routing method for embedded signal transmission, wherein the surface of the signal line 01 is covered with a PCB copper foil 02 with complete continuity. Figure 2 The diagram shows a PCB wiring method for signal shielded transmission, in which a metal cover 03 with complete continuity is provided on the surface of the signal line 01, and the metal cover is usually made of alloy.

[0050] Taking a signal line as an example for transmitting clock signals, in related technologies, clock signal transmission lines typically employ embedded transmission or shielded transmission. For example... Figure 1 As shown, embedded transmission designs the transmission line as a stripline; such as Figure 2 As shown, shielded transmission is when the signal line is designed as a microstrip line, and a metal cap is used to completely cover it.

[0051] visible, Figure 1 and Figure 2 The PCB routing methods shown are all designed to suppress the electromagnetic field components of signals. From a feasibility standpoint, both have limitations. For example, electromagnetic energy shielding of embedded transmission lines requires at least four PCB layers, which undoubtedly increases manufacturing costs. External shielding, on the other hand, requires sufficient PCB routing space and must consider whether the overall product structure allows for shielding, further increasing the cost of external shielding devices. Clearly, both conventional designs require trade-offs in signal energy shielding and increase costs—common solutions to EMI problems in traditional designs. However, neither of these solutions is feasible for a two-layer PCB.

[0052] Please refer to Figure 3 and Figure 4 , Figure 3 and Figure 4 The top view shows the wiring of the clock signal transmission lines on the commercial display PCB board, in which... Figure 3 The microstrip line (signal line 01) deployed on the surface is used to transmit the clock signal of a certain network port chip. Figure 4 The PCB copper foil 02 in the diagram represents the surface reference plane distribution. Figure 3 and Figure 4 The PCBs in each case include a base plate 04 and a core plate 05. The core plate 05 is disposed on the surface of the base plate 04, and the base plate 04 and the core plate 05 form a stacked structure. Since the core plate is a multi-layer board and uses the aforementioned embedded signal transmission, no excessive EMI radiation was detected on the core plate; the EMI radiation mainly originates from the base plate. For this double-layer PCB structure of the base plate, if the above-mentioned... Figure 1 The method shown to solve the EMI problem requires adding more layers, which would significantly increase costs. Figure 2The methods shown for solving EMI problems cannot completely shield the signal lines, and the EMI shielding effect is unpredictable. Furthermore, the molding costs for such irregular external shielding components are relatively high. Therefore, the two conventional methods provided in related technologies are not suitable for this structure, even if adopted... Figure 1 Figure 2 Each of the methods shown also requires a significant increase in cost. Clearly, the EMI solutions provided by these technologies cannot meet the needs of multiple scenarios; therefore, more suitable methods are needed to address the EMI issues of signal lines in PCBs.

[0053] Based on this, the solution to the signal line interference problem provided in this application first obtains the measured waveform and measured spectrum distribution of the transmitted signal of the signal line, then obtains the first simulated waveform and first simulated spectrum distribution of the signal line under no reflection, and the second simulated waveform and second simulated spectrum distribution of the signal line under the actual signal propagation time. Based on these three sets of waveforms and spectrum distributions, the interference cause of the signal line interference problem is determined. Then, when the interference cause is determined to be the target cause, the signal integrity of the signal transmitted by the signal line can be adjusted to solve the signal line interference problem.

[0054] In one exemplary embodiment, such as Figure 5 As shown, a solution to the signal line interference problem is provided, including the following steps 501 to 506. Wherein:

[0055] Step 501: Obtain the measured waveform of the signal transmitted by the signal line in the current circuit board, and obtain the rise time and measured spectrum distribution of the waveform based on the measured waveform.

[0056] The circuit board can be any of the following: rigid circuit board, flexible circuit board, or rigid-flex circuit board. The circuit board can be any of the following: single-sided board, double-sided board, or multilayer circuit board. That is, this application does not limit the specific type of circuit board, nor does it limit the specific application scenario of the circuit board.

[0057] Signal lines can be, for example, clock signal lines, or other signal lines commonly used in the industry on circuit boards, such as power signal lines, data signal lines, etc.

[0058] The measured waveform can be obtained by actually measuring the signal waveform of the signal transmitted by the signal line at both the signal transmitting end and the signal receiving end; specifically, it can be the measured waveform of multiple waveform cycles of the signal transmitted by the signal line.

[0059] The rise time may refer to the time length corresponding to the upward trend of the waveform in one complete waveform cycle among the measured waveforms of multiple waveform cycles. This is only an optional manner for determining the rise time provided in the present application. It is also possible to determine the time length corresponding to the upward trend of the waveform in half a waveform cycle, or the time length corresponding to the upward trend of the waveform in multiple waveform cycles according to requirements.

[0060] The frequency spectrum in the measured spectrum distribution is the abbreviation of frequency spectral density, which is a distribution curve of frequency.

[0061] Exemplarily, waveform detection may be performed first on the signal transmitted during operation by the signal line with an EMI problem in the circuit board, to obtain the measured waveform of the signal transmitted by the signal line in the current circuit board, and then the rise time of the waveform corresponding to the signal transmitted by the signal line and the measured spectrum distribution are acquired based on the measured waveform.

[0062] If the rise time corresponds to the time length corresponding to the upward trend of the waveform in one waveform cycle of the waveform, it may be determined based on the time length corresponding to the upward trend of the waveform in any one waveform cycle, or may be determined after processing based on the time length corresponding to the upward trend of the waveform in multiple waveform cycles; the present application does not make specific limitation on this.

[0063] It should be noted that the rise time of a signal may determine the distribution of harmonics of the signal; therefore, in the case where the measured waveform and the rise time corresponding to the signal are acquired, the spectrum distribution related to the signal may be acquired, that is, the measured spectrum distribution of the waveform may be obtained.

[0064] The EMI problem existing in the process of the clock signal line transmitting the clock signal is often caused by high-order harmonics of the clock signal.

[0065] Step 502: Determine the maximum reflection-free length of the signal line based on the rise time, and perform simulation modeling according to the maximum reflection-free length, to obtain a simulation model corresponding to the signal line.

[0066] Herein, to avoid signal integrity problems, the maximum length of a transmission line without terminal termination is approximately Len_max < RT; len_max represents the maximum length of the transmission line without terminal termination (in inches), and RT represents the signal rise edge (in ns). The maximum length (in inches) of the transmission line without terminal termination is the nanosecond (ns) value of the signal rise edge. If the clock frequency is 10MHz, the clock period is 100ns, the rise edge is about 10ns, then the maximum length of the transmission line without terminal termination is 10in.

[0067] For example, after confirming the rise time of the signal and measuring the spectral distribution, the maximum non-reflective transmission line electrical length corresponding to the signal can be determined based on the rise time, which is also the maximum non-reflective length of the relevant signal line; then, simulation modeling can be performed based on the maximum non-reflective length of the transmission line without impedance control to obtain the simulation model corresponding to the signal line.

[0068] It should be added that, since the signal will not be reflected due to impedance discontinuity under "electrical short circuit" conditions, parameters related to impedance such as linewidth, stack thickness, and dielectric constant can be ignored during simulation modeling. Simulation modeling can be achieved using simulation software such as HFSS, and this application does not specifically limit its application to this. HFSS is an advanced three-dimensional electromagnetic field simulation software suitable for microwave, radio frequency, and other fields.

[0069] Step 503: Perform simulation in the simulation model based on the preset signal source and rise time to obtain the first simulated waveform and the first simulated spectrum distribution of the signal line under no reflection.

[0070] The preset signal source is an ideal signal source, which is an ideal device that can be set during circuit simulation. Its parameters include voltage, rise and fall time, signal rate, etc.

[0071] For example, after obtaining the simulation model corresponding to the signal line, if the SPICE / IBIS model of the chip connected to the signal line is not available, an ideal signal source can be used and the same rise time as the actual test can be set. Simulation can be performed in the simulation model. Based on the simulation results output by the simulation model, the first simulation waveform and the first simulation spectrum distribution of the signal line under no reflection can be obtained. The first simulation waveform can reflect the waveform details, and the first simulation spectrum distribution can reflect the signal spectrum components under no reflection.

[0072] Step 504: Adjust the signal propagation time of the simulation model to the actual signal propagation time of the signal transmitted by the signal line, and perform simulation in the adjusted simulation model based on the preset signal source and rise time to obtain the second simulated waveform and the second simulated spectrum distribution of the signal line under the actual signal propagation time.

[0073] Among them, the signal propagation time (delay) of the simulation model is an adjustable parameter in the simulation model.

[0074] The actual signal propagation time (actual delay) of a signal transmitted through a signal line can be obtained by measuring TDR (Time Domain Reflectometry) using a vector network analyzer. TDR stands for Time Domain Reflectometry, a remote measurement technique for analyzing reflected waves.

[0075] For example, the actual signal propagation time (delay) of the signal line during actual operation can be obtained first, and then the parameter corresponding to the signal propagation time (delay) of the obtained simulation model can be adjusted to the actual signal propagation time; then, through the simulation model after the signal propagation time parameter has been adjusted, simulation is performed based on the preset signal source and rise time to obtain the second simulation waveform and the second simulation spectrum distribution of the signal line corresponding to the actual signal propagation time output by the simulation model.

[0076] Step 505: Based on the measured waveform, measured spectrum distribution, first simulated waveform, first simulated spectrum distribution, second simulated waveform, and second simulated spectrum distribution, determine the cause of interference in the signal line.

[0077] The causes of interference include two main types: EMI caused by non-signal integrity issues and EMI caused by signal integrity issues.

[0078] For example, after obtaining the (actual) measured waveform, (actual) measured spectrum distribution, first simulated waveform, first simulated spectrum distribution, second simulated waveform and second simulated spectrum distribution for the signal line with EMI problem on the circuit board based on the execution steps 501 to 505, the specific cause of the interference problem in the signal line during signal transmission can be determined based on at least four of these six pieces of information, so that relevant personnel can formulate targeted interference elimination solutions based on the determined interference cause.

[0079] Step 506: If the cause of the interference is determined to be the target cause, adjust the signal integrity of the signal.

[0080] Specifically, the target cause could be an EMI-type problem caused by signal integrity issues.

[0081] For example, if it is determined that the specific cause of the interference problem in the signal line during signal transmission is EMI caused by signal integrity issues, the relevant personnel can resolve the interference problem by adjusting the signal integrity of the signal.

[0082] The solution to the signal line interference problem provided in this application first acquires the measured waveform and measured spectrum distribution of the transmitted signal of the signal line. Then, it acquires the first simulated waveform and first simulated spectrum distribution of the signal line under no reflection conditions, and the second simulated waveform and second simulated spectrum distribution of the signal line under the actual signal propagation time. Based on these three sets of waveforms and spectrum distributions, the cause of interference in the signal line is determined. Then, when the cause of interference is determined to be the target cause, the signal integrity of the signal transmitted by the signal line can be adjusted to solve the signal line interference problem. Thus, when the EMI problem of the signal is caused by the signal integrity, an appropriate method that can solve the signal integrity problem can be selected to adjust the signal integrity of the signal transmitted by the signal line to eliminate the EMI problem. This method is applicable to solving the EMI problem of the signal line in different scenarios.

[0083] The present application provides a method to solve the interference problem of signal lines by adjusting the signal integrity of the signal, which means that the "embedded transmission or shielded transmission" method in related technologies can be avoided to solve the EMI problem; thus, it is beneficial to avoid increasing the PCB manufacturing cost and the thickness of the products using PCBs.

[0084] It should also be noted that solutions to signal integrity (SI) problems involve multiple aspects, and the following are some common measures.

[0085] PCB design optimization includes: In terms of routing, reducing trace length, avoiding sharp angles, and using differential pair routing. Regarding layer stack-up, rationally planning power and ground planes to ensure short and continuous signal return paths. In terms of impedance matching, controlling trace impedance to reduce reflections.

[0086] Termination techniques include: For series termination, a resistor is connected in series at the signal source to match the source impedance. For parallel termination, a resistor is connected in parallel at the receiver to match the transmission line impedance. For AC termination, a combination of capacitors and resistors is used to reduce power consumption.

[0087] Power integrity includes: Regarding decoupling capacitors, placing decoupling capacitors near power pins to filter out high-frequency noise. Regarding power planes, using low-impedance power planes to reduce power supply noise.

[0088] Signal simulation and analysis include: In terms of simulation tools, using SI simulation tools (such as Hyperlynx and ADS) for pre-layout and post-layout simulations. In terms of eye diagram analysis, evaluating signal quality through eye diagrams.

[0089] Material selection includes: for low-loss materials, choosing PCB materials with low dielectric constant and low loss tangent; for copper foil type, selecting copper foil with appropriate roughness to reduce signal loss.

[0090] Testing and verification include: For TDR testing, measuring impedance using a time-domain reflectometer; and for network analyzers, measuring S-parameters and evaluating signal transmission characteristics.

[0091] Signal conditioning includes: pre-emphasis, which enhances high-frequency components at the transmitting end; and equalization, which compensates for high-frequency losses at the receiving end.

[0092] Clock distribution includes: in terms of clock tree design, optimizing the clock distribution network to reduce clock jitter and skew; and in terms of PLL / DLL, using phase-locked loops or delay phase-locked loops to stabilize the clock signal.

[0093] Thermal management includes: heat dissipation design to ensure good heat dissipation and prevent temperature from affecting signal integrity.

[0094] The signal layer and the reference plane include: Regarding the reference plane, ensuring that the signal layer is adjacent to the complete reference plane to reduce crosstalk and radiation.

[0095] Differential signals, including differential pairs, are used to improve anti-interference capabilities.

[0096] Signal return path, including: In terms of return path, ensure that the signal return path is short and continuous, and reduce loop area.

[0097] In an exemplary embodiment, determining the cause of interference in a signal line includes: determining that the interference cause includes a signal integrity problem when the similarity between the measured waveform and the second simulated waveform is greater than or equal to a preset first similarity, and the similarity between the measured spectral distribution and the second simulated spectral distribution is greater than or equal to a preset second similarity; or, determining that the interference cause includes a non-signal integrity problem when the similarity between the measured waveform and the first simulated waveform is greater than or equal to a preset third similarity, and the similarity between the measured spectral distribution and the first simulated spectral distribution is greater than or equal to a preset fourth similarity; or, determining that the interference cause includes a non-signal integrity problem when the similarity between the measured waveform and the first simulated waveform, and the similarity between the measured waveform and the second simulated waveform are both less than a preset fifth similarity, and the similarity between the measured spectral distribution and the first simulated spectral distribution, and the similarity between the measured spectral distribution and the second simulated spectral distribution are both less than a preset sixth similarity; wherein the preset fifth similarity is less than the preset first similarity, the preset sixth similarity is less than the preset second similarity; and / or, the preset fifth similarity is less than the preset third similarity, and the preset sixth similarity is less than the preset fourth similarity.

[0098] In this application, the value of any of the preset first similarity, preset second similarity, preset third similarity, preset fourth similarity, preset fifth similarity, and preset sixth similarity is not specifically limited, and the relevant values ​​can be adjusted based on the detection requirements.

[0099] The causes of EMI problems in signal lines proposed in this application can be broadly categorized into two types: EMI caused by non-signal integrity issues and EMI caused by signal integrity issues.

[0100] Based on this, after obtaining the (actual) measured waveform, (actual) measured spectrum distribution, first simulated waveform, first simulated spectrum distribution, second simulated waveform, and second simulated spectrum distribution of the signal line with EMI problems on the circuit board, the specific cause of EMI in the signal line can be determined based on these six pieces of information. This application provides three determination methods, and these three determination methods correspond to two determination results. Specifically:

[0101] The first judgment method and the corresponding judgment result are as follows: compare the measured waveform and the first simulated waveform, and compare the measured spectrum distribution and the first simulated spectrum distribution. If the similarity between the measured waveform and the first simulated waveform is greater than or equal to the preset third similarity, and the similarity between the measured spectrum distribution and the first simulated spectrum distribution is greater than or equal to the preset fourth similarity, then the corresponding comparison result can be obtained as follows: the interference cause corresponding to the signal line is determined to be a non-signal integrity problem.

[0102] The second judgment method and the corresponding judgment result are as follows: compare the measured waveform and the second simulated waveform, and compare the measured spectrum distribution and the second simulated spectrum distribution. If the similarity between the measured waveform and the second simulated waveform is greater than or equal to the preset first similarity, and the similarity between the measured spectrum distribution and the second simulated spectrum distribution is greater than or equal to the preset second similarity, then the corresponding comparison result can be obtained as follows: the interference cause corresponding to the signal line is determined to be a signal integrity problem.

[0103] The third judgment method and the corresponding judgment result are as follows: compare the measured waveform with the first simulated waveform and the second simulated waveform, and compare the measured spectrum distribution with the first simulated spectrum distribution and the second simulated spectrum distribution. If the similarity between the measured waveform and the first simulated waveform, and the similarity between the measured waveform and the second simulated waveform are both less than the preset fifth similarity, and the similarity between the measured spectrum distribution and the first simulated spectrum distribution, and the similarity between the measured spectrum distribution and the second simulated spectrum distribution are both less than the preset sixth similarity, then the corresponding comparison result is that the interference cause corresponding to the signal line is determined to be a non-signal integrity problem.

[0104] Theoretically, better waveform integrity indicates a more complete transmission of spectral components and that all energy has been transmitted. Incomplete or unusual waveforms suggest that some energy has been radiated or lost through other means. High-frequency components are more likely to radiate because their shorter wavelengths make conductors more likely to form a quarter-wavelength or nearly quarter-wavelength antenna radiator with them.

[0105] This application uses the three judgment methods described above to determine whether the EMI problem on a signal line is caused by a signal integrity issue, thereby achieving accurate localization of the EMI problem. Specifically, for the first judgment method and its corresponding result, the measured signal shows few high-order harmonic components attenuated by the signal line and dielectric, the signal line impedance is well controlled, and the signal source is accurate, indicating that the EMI is not caused by a signal integrity problem. For the second judgment method and its corresponding result, the signal source is accurate, but the measured signal has a signal integrity problem, which would lead to abnormal enhancement of high-order spectral components. Under the same easily radiating architecture, this would be more likely to cause EMI problems. For the third judgment method and its corresponding result, further investigation is needed to determine whether the signal source settings are the same as the actual chip settings.

[0106] In one exemplary embodiment, determining the cause of interference corresponding to a signal line includes non-signal integrity issues, including: determining that the cause of interference corresponding to a signal line includes a preset signal source, and / or a parameter setting problem in the chip connected to the signal line.

[0107] For example, if it is determined that the cause of the EMI problem on the signal line is not a signal integrity issue, then the EMI problem may be caused by unreasonable parameter settings of the preset signal source or unreasonable parameter settings of the chip connected to the signal line. Therefore, if it is determined that the cause of the EMI problem on the signal line is not a signal integrity issue, it is possible to further determine which of the preset signal source and the chip connected to the signal line is causing the EMI problem with inappropriate parameter settings, so that the parameter settings of at least one of the preset signal source and the chip connected to the signal line can be adjusted in a targeted manner to solve the EMI problem on the signal line.

[0108] In an exemplary embodiment, determining the maximum non-reflection length of a signal line based on the rise time includes: determining the maximum non-reflection length of the signal line based on the length traveled in a preset medium by the signal corresponding to 1 / 10 of the rise time; wherein the rise time is the rise time within one waveform period of the measured waveform.

[0109] For example, the maximum non-reflection length of the signal line is the length that the signal travels in the medium in 1 / 10 of the time of the rising edge of the waveform; within this length, the interconnect structure is considered to be "electrically short-circuited" and therefore non-reflective, and the impedance discontinuity of the signal line does not affect the signal quality.

[0110] It should be added that the above-mentioned "signal corresponding to 1 / 10 of the rise time" is only one optional implementation method provided by this application. It is also possible to choose to replace "1 / 10" with any value in the range of 1 / 10-1 / 3 based on the requirements. For example, the value can be selected as 1 / 5, 1 / 4, or 1 / 3.

[0111] In one exemplary embodiment, the method further includes: determining a preset signal source based on a preset voltage value, a preset rise time, a preset fall time, and a preset signal rate.

[0112] For example, an ideal signal source (preset signal source) is an ideal device that can be set during circuit simulation. Its parameters include voltage, rise and fall times, signal rate, etc. In practice, the rise time can be estimated based on the signal rate, generally taking a range of 1 / 10 to 1 / 3 of the reciprocal of the single rate. For example, for a 1Gbps signal, its reciprocal is 1ns, so its rise time range is approximately 100ps-300ps. Therefore, at least one parameter of the preset signal source—voltage value, rise time, fall time, and signal rate—can be selected to ensure that the parameters of the final preset signal source are set to ideal settings.

[0113] In an exemplary embodiment, acquiring the measurement waveform of the signal transmitted by the signal line in the current circuit board, and obtaining the measurement spectrum distribution of the waveform based on the measurement waveform, includes: acquiring the measurement waveform of the signal transmitting end and the signal receiving end of the signal line in the current circuit board within at least one waveform period; and obtaining the measurement spectrum distribution associated with the measurement waveform based on the measurement waveform and the fast Fourier transform.

[0114] For example, the acquisition of the measurement waveform of the signal transmitted by the signal line in the current circuit board can be specifically obtained by measuring the signals corresponding to the signal transmitting end and the signal receiving end of the signal line. This can determine the changes or losses of the signal during the transmission process from the signal transmitting end to the signal receiving end, which helps to improve the accuracy of the final determination of the cause of the EMI problem of the signal line, and also makes it easier to find a more accurate solution to the EMI problem of the signal line.

[0115] After obtaining the measurement waveform of the signal transmitted through the signal line, a Fast Fourier Transform (FFT) can be performed on the measurement waveform to obtain the corresponding measurement spectrum distribution. This application is not limited to this method of obtaining the measurement spectrum distribution of the signal transmitted through the signal line; other methods may also be used.

[0116] Regarding the solution to the signal line interference problem provided in this application, this application also provides an alternative implementation method, including the following steps S1 to S8, wherein:

[0117] Step S1: First, obtain the measurement waveform by measuring the waveform of the signal, and then obtain the rise time of the signal based on the measurement waveform. The rise time of the signal determines the distribution of its harmonics, thereby obtaining the distribution of its spectrum, i.e., obtaining the measurement spectrum distribution. EMI problems in clock signals are often caused by the higher harmonics of the clock signal.

[0118] Step S2: After confirming the rise time and measuring the spectrum distribution, calculate the maximum non-reflective transmission line electrical length (maximum non-reflective length of the signal line) based on the rise time. The maximum non-reflective transmission line length is the length that the signal travels in the medium in 1 / 10 of the time of the rising edge. Within this length, the interconnect structure is considered an "electrical short circuit", that is, no reflection. At this time, the impedance discontinuity of the transmission line does not affect the signal quality.

[0119] Step S3: Simulate and model the maximum non-reflection length of the transmission line without impedance control to obtain the simulation model. If the SPICE / IBIS model of the chip is not available, an ideal signal source (preset signal source) can be used and the same rise time as the actual test can be set to perform the simulation. The waveform details under non-reflection (first simulation waveform) and the signal spectrum components under non-reflection (first simulation spectrum distribution) can be obtained.

[0120] Step S4: Extend the transmission line simulation model so that the resulting delay (signal propagation time) is equal to that on the actual PCB transmission line. In other words, adjust the delay (signal propagation time) of the simulation model to match the actual delay (actual signal propagation time) of the signal transmitted on the signal line. Then, through simulation with the adjusted simulation model, obtain the waveform (second simulation waveform) with the actual delay (actual signal propagation time). Further, the corresponding second simulation spectrum distribution can be obtained based on the second simulation waveform.

[0121] Step S5 involves measuring the waveforms at the transmitting and receiving ends of the signal and calculating its actual spectral distribution using FFT. It should be noted that step S5 is equivalent to step S1, both aimed at obtaining the measured waveform and spectral distribution.

[0122] Step S6: Compare the waveform and spectral distribution obtained from the simulation with the actual test waveform and spectral distribution. This will yield several comparison results:

[0123] Result 1: The measured waveforms at the transmitter and receiver are close to the simulated waveform at the maximum non-reflection length without impedance control, and the spectral components are also close; that is, the measured waveform is close to the first simulated waveform, and the measured spectral distribution is close to the first simulated spectral distribution.

[0124] Result 2: The measured waveforms at both the transmitter and receiver are close to the transmission line waveforms under the simulated actual time delay (actual signal propagation time), and the spectral components are also close; that is, the measured waveform is close to the second simulated waveform, and the measured spectral distribution is close to the second simulated spectral distribution.

[0125] Result 3: There is no consistency between the measured waveform and the simulated waveform, and the spectral components show significant changes. That is, the measured waveform and the first simulated waveform are quite different, the measured waveform and the second simulated waveform are also quite different, the measured spectral distribution and the first simulated spectral distribution are quite different, and the measured spectral distribution and the second simulated spectral distribution are also quite different.

[0126] Step S7: Based on the comparison results, determine the possible causes of the difference between the simulated waveform and the measured waveform. For result one above, it indicates that the measured signal has fewer high-order harmonic components attenuated by the transmission line and medium, the transmission line impedance is well controlled, and the signal source is accurate, meaning the EMI is not caused by signal integrity issues. For result two above, the signal source is accurate, but the measured signal has signal integrity issues, which can lead to abnormal enhancement of high-order spectral components. Under the same easily radiating architecture, this is more likely to cause EMI problems. For result three above, it is necessary to check whether the signal source settings are the same as the actual chip settings.

[0127] Step S8: Based on the comparison results above, confirm whether EMI may be caused by SI (signal integrity). If SI problems exist, perform SI optimization.

[0128] This method can distinguish the causes of EMI and avoid over-designing the PCB board for signal lines in order to solve EMI problems. The method proposed in this case can be applied to EMI problems caused by SI, that is, solving SI solves EMI, without the need to use traditional related methods, that is, without the need to add layers or external shielding devices to solve EMI problems.

[0129] Please refer to Figures 6-10 ,in, Figure 9 The red in Figure 7 The red waveform in the image represents the optimized result, while the green waveform indicates that only one reflection occurred. Figure 10In the graph, green represents the EMI radiation of the original waveform, and red represents the optimized waveform. It can be seen that the solution to the signal line interference problem proposed in this application can pinpoint the cause of EMI issues. For example, clock EMI problems are difficult to solve using traditional methods on double-layer boards and increase costs. However, using the method provided in this application, EMI can be resolved by adjusting the signal input signal (SI), and simulation verification has been performed.

[0130] Compared to traditional EMI debugging, which only considers energy shielding without addressing the underlying causes, often leading to over-design of the PCB or related equipment; small devices typically have limited space, and even without adding layers or shielding devices, additional measures such as conductive foam are required. These traditional EMI solutions have long development cycles, increased costs, and problems persist even after multiple iterations.

[0131] Traditional methods, when encountering structural changes or other issues after version iterations, generally require redesigning external shielding devices and re-verifying them, resulting in repetitive work and increased costs.

[0132] Furthermore, traditional EMI debugging relies heavily on manual adjustments, which are slow and lack a clear direction. Using the simulation combined with segmented measured waveform fitting method provided in this application, we can confirm that the transmitted and reflected waveforms are consistent, thus demonstrating that the simulation model is a high-precision model. Using this high-precision model for EMI simulation verification provides valuable insights into its changing trends.

[0133] Furthermore, EMI issues are rarely directly related to SI, especially for clock signals. Software spread spectrum technology and series ferrite beads are often used, but these methods are not universal. Many chips do not support spread spectrum and the series ferrite bead method also has limitations.

[0134] In summary, the solution to the signal line interference problem proposed in this application has achieved outstanding benefits in terms of debugging efficiency, cost control, and performance optimization.

[0135] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0136] Based on the same inventive concept, embodiments of this application also provide a circuit board architecture used in the solution to the aforementioned signal line interference problem, such as... Figure 11 As shown, the circuit board may include a signal transmitting chip 91, a signal receiving chip 92, and an interconnection structure 93 electrically connected between the signal transmitting chip 91 and the signal receiving chip 92; wherein, a first filtering unit 911 may be included between the signal transmitting chip 91 and the interconnection structure 93, and a second filtering unit 921 may be included between the signal receiving chip 92 and the interconnection structure 93.

[0137] The first filter unit 911 includes a first inductor L1, a first resistor R1 and a first capacitor C1. The first end of the first inductor L1 is electrically connected to the signal transmitting chip 91, and the second end of the first inductor L1 is electrically connected to the interconnection structure 93. The first end of the first resistor R1 is electrically connected to the second end of the first inductor L1, and the second end of the first resistor R1 is grounded through the first capacitor C1.

[0138] The second filter unit 921 includes a second resistor R2 and a second capacitor C2. The first end of the second resistor R2 is electrically connected to the interconnection structure 93, the second end of the second resistor R2 is grounded through the second capacitor C2, and the second end of the second resistor R2 is electrically connected to the signal receiving chip 92.

[0139] The circuit structure of the signal receiving chip 92 may include a third resistor R3, a second inductor L2, a fourth resistor R4, and a third capacitor C3; the first end of the third resistor R3 is electrically connected to the second end of the second resistor R2, the second end of the third resistor R3 is electrically connected to the first end of the fourth resistor R4 through the second inductor L2, the first end of the fourth resistor R4 is also grounded through the third capacitor C3, and the second end of the fourth resistor R4 is grounded.

[0140] like Figure 11This application proposes a chip-to-chip communication method based on a three-segment PCB circuit architecture, which can be used to implement the EMI problem localization method mentioned in this application; the three segments can be specifically divided into:

[0141] First paragraph: Signal transmitting chip and its front-end matching architecture (first filtering unit 911);

[0142] The second paragraph describes the conductor (interconnection structure 93) between the signal transmitting chip and its front-end matching architecture, and the signal receiving chip and its front-end matching architecture. Optionally, two PCBs can be stacked using a PCB and a perforated hole (a PCB process) to form the interconnection structure between the signal transceiver chips. However, this application is not limited to this method and other methods can also be used, such as coaxial cable interconnection.

[0143] The third section describes the signal receiving chip and its front-end matching architecture (second filtering unit 921).

[0144] These three segments can be used to detect the waveform of the signal during transmission, the waveform of the signal after passing through the matching architecture, the waveform of the signal after attenuation and reflection through the interconnect structure and reaching the front end of the signal receiving chip, and the waveform of the signal after passing through the matching architecture of the front end of the receiving chip. Among them, for this application, the transmitted waveform and the waveform after passing through the receiving matching architecture can be used within this application.

[0145] It should be added that, Figure 11 In this application, the positions of the signal transmitting chip 91 and the signal receiving chip 92 can be interchanged. Furthermore, the circuit structure of the signal transmitting chip 91 and the signal receiving chip 92 is merely one possible configuration provided in this application, and this application is not limited thereto.

[0146] Based on the same inventive concept, this application also provides a device for solving the signal line interference problem, which implements the solution to the signal line interference problem described above. The solution provided by this device is similar to the solution described in the above method. Therefore, the specific limitations in one or more embodiments of the device for solving the signal line interference problem provided below can be found in the limitations of the solution to the signal line interference problem described above, and will not be repeated here.

[0147] In one exemplary embodiment, such as Figure 12 As shown, a device 100 for solving signal line interference problems is provided, including: a signal data acquisition module 111, a simulation modeling module 112, a simulation module 113, a cause determination module 114, and a problem solving module 115, wherein:

[0148] The signal data acquisition module 111 is used to acquire the measurement waveform of the signal transmitted by the signal line in the current circuit board, and obtain the rise time and measurement spectrum distribution of the waveform based on the measurement waveform.

[0149] The simulation modeling module 112 is used to determine the maximum non-reflection length of the signal line based on the rise time, and to perform simulation modeling based on the maximum non-reflection length to obtain the simulation model corresponding to the signal line.

[0150] The simulation module 113 is used to perform simulation in the simulation model based on a preset signal source and rise time to obtain the first simulated waveform and the first simulated spectrum distribution of the signal line under no reflection; and to adjust the signal propagation time of the simulation model to the actual signal propagation time of the signal transmitted by the signal line, and to perform simulation in the adjusted simulation model based on the preset signal source and rise time to obtain the second simulated waveform and the second simulated spectrum distribution of the signal line under the actual signal propagation time.

[0151] The cause determination module 114 is used to determine the cause of interference problems in the signal line based on the measured waveform, the measured spectrum distribution, the first simulated waveform, the first simulated spectrum distribution, the second simulated waveform, and the second simulated spectrum distribution.

[0152] Problem-solving module 115 is used to adjust the signal integrity of the signal when the cause of the interference is determined to be the target cause.

[0153] In an exemplary embodiment, the cause determination module 114 is used to determine the cause of interference in the signal line, specifically: when the similarity between the measured waveform and the second simulated waveform is greater than or equal to a preset first similarity, and the similarity between the measured spectral distribution and the second simulated spectral distribution is greater than or equal to a preset second similarity, the cause of interference corresponding to the signal line is determined to include a signal integrity problem; when the similarity between the measured waveform and the first simulated waveform is greater than or equal to a preset third similarity, and the similarity between the measured spectral distribution and the first simulated spectral distribution is greater than or equal to a preset fourth similarity; or, when the similarity between the measured waveform and the first simulated waveform, and the similarity between the measured waveform and the second simulated waveform are both less than a preset fifth similarity, and the similarity between the measured spectral distribution and the first simulated spectral distribution, and the similarity between the measured spectral distribution and the second simulated spectral distribution are both less than a preset sixth similarity, the cause of interference corresponding to the signal line is determined to include a non-signal integrity problem; wherein the preset fifth similarity is less than the preset first similarity, the preset sixth similarity is less than the preset second similarity; and / or, the preset fifth similarity is less than the preset third similarity, and the preset sixth similarity is less than the preset fourth similarity.

[0154] In an exemplary embodiment, the cause determination module 114 is used to determine that the interference cause corresponding to the signal line includes non-signal integrity issues, specifically: determining that the interference cause corresponding to the signal line includes a preset signal source, and / or a parameter setting problem in the chip connected to the signal line.

[0155] In an exemplary embodiment, the simulation modeling module 112 is used to determine the maximum non-reflection length of the signal line based on the rise time. Specifically, it is used to determine the maximum non-reflection length of the signal line based on the length traveled in a preset medium by the signal corresponding to 1 / 10 of the rise time. The rise time is the rise time within one waveform period of the measured waveform.

[0156] In an exemplary embodiment, the simulation module 113 is further configured to determine a preset signal source based on a preset voltage value, a preset rise time, a preset fall time, and a preset signal rate.

[0157] In an exemplary embodiment, the signal data acquisition module 111 is used to acquire the measurement waveform of the signal transmitted by the signal line in the current circuit board, and obtain the measurement spectrum distribution of the waveform based on the measurement waveform. Specifically, it is used to: acquire the measurement waveform of the signal transmitting end and the signal receiving end of the signal line in the current circuit board within at least one waveform period; and obtain the measurement spectrum distribution associated with the measurement waveform based on the measurement waveform and the fast Fourier transform.

[0158] The modules in the aforementioned signal line interference solution can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of a computer device in hardware form or independent of it, or stored in the memory of the computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0159] In one exemplary embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 13As shown, the computer device includes a processor, memory, input / output interfaces, a communication interface, a display unit, and an input device. The processor, memory, and input / output interfaces are connected via a system bus, and the communication interface, display unit, and input device are also connected to the system bus via the input / output interfaces. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The input / output interfaces are used for exchanging information between the processor and external devices. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, Near Field Communication (NFC), or other technologies. When executed by the processor, the computer program implements a solution to a signal line interference problem. The display unit is used to form a visually visible image and can be a display screen, a projection device, or a virtual reality imaging device. The display screen can be an LCD screen or an e-ink screen. The input device of the computer device can be a touch layer covering the display screen, or buttons, trackballs, or touchpads set on the casing of the computer device, or external keyboards, touchpads, or mice, etc.

[0160] Those skilled in the art will understand that Figure 13 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0161] In one exemplary embodiment, a computer device is provided, including a memory and a processor, the memory storing a computer program that, when executed by the processor, implements steps in a solution to a signal line interference problem.

[0162] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements steps in a solution to a signal line interference problem.

[0163] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements steps in a solution to a signal line interference problem.

[0164] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0165] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.

[0166] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0167] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A solution to the signal line interference problem, characterized in that, The method includes: The measurement waveform of the signal transmitted by the signal line in the current circuit board is obtained, and the rise time and measurement spectrum distribution of the waveform are obtained based on the measurement waveform. The maximum non-reflection length of the signal line is determined based on the rise time, and simulation modeling is performed based on the maximum non-reflection length to obtain the simulation model corresponding to the signal line. Based on a preset signal source and the rise time, the simulation is performed in the simulation model to obtain the first simulated waveform and the first simulated spectrum distribution of the signal line under no reflection. The signal propagation time of the simulation model is adjusted to the actual signal propagation time of the signal transmitted by the signal line, and simulation is performed in the adjusted simulation model based on the preset signal source and the rise time to obtain the second simulated waveform and the second simulated spectrum distribution of the signal line under the actual signal propagation time. Based on the measured waveform, the measured spectrum distribution, the first simulated waveform, the first simulated spectrum distribution, the second simulated waveform, and the second simulated spectrum distribution, the cause of interference in the signal line is determined. If the cause of the interference is determined to be the target cause, the signal integrity of the signal is adjusted.

2. The method according to claim 1, characterized in that, The reasons for determining the interference problem of the signal line include: If the similarity between the measured waveform and the second simulated waveform is greater than or equal to a preset first similarity, and the similarity between the measured spectrum distribution and the second simulated spectrum distribution is greater than or equal to a preset second similarity, the interference cause corresponding to the signal line is determined to include signal integrity issues. If the similarity between the measured waveform and the first simulated waveform is greater than or equal to a preset third similarity, and the similarity between the measured spectrum distribution and the first simulated spectrum distribution is greater than or equal to a preset fourth similarity; or, if the similarity between the measured waveform and the first simulated waveform, and the similarity between the measured waveform and the second simulated waveform are both less than a preset fifth similarity, and the similarity between the measured spectrum distribution and the first simulated spectrum distribution, and the similarity between the measured spectrum distribution and the second simulated spectrum distribution are both less than a preset sixth similarity, then the interference cause corresponding to the signal line is determined to include non-signal integrity issues. Wherein, the preset fifth similarity is less than the preset first similarity, the preset sixth similarity is less than the preset second similarity; and / or, the preset fifth similarity is less than the preset third similarity, and the preset sixth similarity is less than the preset fourth similarity.

3. The method according to claim 2, characterized in that, The determination of the interference cause corresponding to the signal line includes non-signal integrity issues, including: The cause of interference corresponding to the signal line can be determined to include the preset signal source and / or the chip connected to the signal line having parameter setting problems.

4. The method according to claim 1, characterized in that, Determining the maximum reflection-free length of the signal line based on the rise time includes: Based on the length of the signal corresponding to 1 / 10 of the rise time within a preset medium, the maximum non-reflection length of the signal line is determined; wherein, the rise time is the rise time within one waveform period of the measured waveform.

5. The method according to claim 1, characterized in that, The method further includes: The preset signal source is determined based on the preset voltage value, preset rise time, preset fall time, and preset signal rate.

6. The method according to claim 1, characterized in that, The step of acquiring the measurement waveform of the signal transmitted on the signal line in the current circuit board, and obtaining the measurement spectrum distribution of the waveform based on the measurement waveform, includes: Obtain the signal transmitting and receiving ends of the signal lines on the current circuit board, and measure the waveform within at least one waveform cycle. Based on the measured waveform and the fast Fourier transform, the measurement spectrum distribution associated with the measured waveform is obtained.

7. A device for solving signal line interference problems, characterized in that, The device includes: The signal data acquisition module is used to acquire the measurement waveform of the signal transmitted by the signal line in the current circuit board, and to obtain the rise time and measurement spectrum distribution of the waveform based on the measurement waveform. The simulation modeling module is used to determine the maximum non-reflection length of the signal line based on the rise time, and to perform simulation modeling based on the maximum non-reflection length to obtain the simulation model corresponding to the signal line. The simulation module is used to perform simulation in the simulation model based on a preset signal source and the rise time to obtain a first simulated waveform and a first simulated spectrum distribution corresponding to the signal line under no reflection; and to adjust the signal propagation time of the simulation model to the actual signal propagation time of the signal transmitted by the signal line, and to perform simulation in the adjusted simulation model based on the preset signal source and the rise time to obtain a second simulated waveform and a second simulated spectrum distribution corresponding to the signal line under the actual signal propagation time. The cause determination module is used to determine the cause of interference in the signal line based on the measured waveform, the measured spectrum distribution, the first simulated waveform, the first simulated spectrum distribution, the second simulated waveform, and the second simulated spectrum distribution. The problem-solving module is used to adjust the signal integrity of the signal when the cause of the interference is determined to be the target cause.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

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