A connector assembly and electronic device

Abstract

The application relates to the technical field of connectors, and discloses a connector assembly and an electronic device, wherein the connector assembly comprises a first connector, a second connector and a detection device; the detection device comprises a probe module, a conductor module and a channel detection module; the probe module and the conductor module are arranged on the first connector and the second connector respectively, or the probe module and the conductor module are arranged on the first connector; the channel detection module is electrically connected with the probe module and is used for detecting the electrical connection state between the probe module and the conductor module when the first connector is plugged with the second connector. In this way, the channel detection module can be used for detecting the electrical connection state (normal or abnormal) between the probe module and the conductor module when the first connector is plugged with the second connector, so as to determine the electrical connection state between the first connector and the second connector, and thus the abnormal connection fault of the connector can be quickly checked out.

Description

Technical Field

[0001] This application relates to the field of connector technology, and in particular to a connector assembly and an electronic device. Background Technology

[0002] With the development of communication technology, high-speed signal rates are getting higher and higher. In order to reduce the negative impact of connector mating in communication equipment on high-speed signal quality (such as insertion loss and other key indicators), the requirements for connector mating accuracy (such as mating gap and mating angle) are getting higher and higher. The smaller the mating gap and the smaller the mating angle of the connector, the more beneficial it is to the high-speed signal quality.

[0003] Because connectors in communication equipment are located inside the device and are not visible during operation, it is impossible to detect the connector mating status (mating gap and mating angle) in real time. Currently, only laboratory sampling tests are possible, which makes it impossible to quickly identify abnormal connection faults of connectors during the manufacturing process or when the equipment is in operation. Summary of the Invention

[0004] To address the aforementioned technical problems, embodiments of this application provide a connector assembly and an electronic device.

[0005] In a first aspect, embodiments of this application provide a connector assembly, including a first connector, a second connector, and a detection device for detecting the electrical connection state between the first connector and the second connector; the detection device includes a probe module, a conductor module, and a path detection module, wherein the probe module and the conductor module are respectively disposed on the first connector and the second connector, or both the probe module and the conductor module are disposed on the first connector; the path detection module is electrically connected to the probe module and is used to detect the electrical connection state between the probe module and the conductor module when the first connector and the second connector are plugged in, wherein different electrical connection states between the probe module and the conductor module correspond to different electrical connection states between the first connector and the second connector.

[0006] A normal electrical connection between the probe module and the conductor module indicates a normal electrical connection between the first connector and the second connector; an abnormal electrical connection between the probe module and the conductor module indicates an abnormal electrical connection between the first connector and the second connector. Alternatively, for example, an abnormal electrical connection between the probe module and the conductor module indicates a normal electrical connection between the first connector and the second connector; a normal electrical connection between the probe module and the conductor module indicates an abnormal electrical connection between the first connector and the second connector. Thus, even when the first and second connectors are plugged in, the connection status (normal or abnormal) between the probe module and the conductor module can be detected in real time by the connection detection module to determine the electrical connection status between the first connector and the second connector. This eliminates the need for laboratory sampling tests and allows for rapid identification of connector connection faults during manufacturing or operation.

[0007] In some possible implementations, the pathway detection module is used to detect an electrical connection between the probe module and the conductor module when the insertion of the first connector and the second connector meets a first condition; and to detect a disconnection between the probe module and the conductor module when the insertion of the first connector and the second connector does not meet the first condition.

[0008] In this embodiment of the application, the insertion of the first connector and the second connector satisfies a first condition, which means that the first connector and the second connector are inserted relative to each other and properly engaged. Proper engagement means that the engagement gap and / or engagement angle between the first connector and the second connector meet the electrical connection requirements.

[0009] It is understood that the detection of an electrical connection between the probe module and the conductor module indicates that the electrical connection between the probe module and the conductor module is normal, and conversely, the detection of a disconnection between the probe module and the conductor module indicates that the electrical connection between the probe module and the conductor module is abnormal. Alternatively, the detection of an electrical connection between the probe module and the conductor module indicates that the electrical connection between the probe module and the conductor module is abnormal, and conversely, the detection of a disconnection between the probe module and the conductor module indicates that the electrical connection between the probe module and the conductor module is normal.

[0010] In some possible implementations, the first connector and the second connector are plugged into each other along a first direction, the first connector includes a first mating surface facing the second connector, and the second connector includes a second mating surface facing the first connector; the first condition includes: the maximum distance between the first mating surface and the second mating surface along the first direction is less than or equal to a first distance, the first distance being a distance threshold for maintaining electrical connection between the first connector and the second connector.

[0011] Thus, the access detection module can detect situations where the mating gap (i.e., the maximum distance between the first mating surface and the second mating surface along the first direction) between the first connector and the second connector is less than or equal to the aforementioned distance threshold, thereby providing feedback on the misfitting of the first connector and the second connector.

[0012] In some possible implementations, the probe module includes at least one probe, one end of which is exposed at a first mating surface along a first direction, the probe is elastically movable along the first direction, and each probe is electrically connected to the pathway detection module.

[0013] It is understandable that the tip of the probe protrudes a certain amount from the first mating surface. In practical applications, the amount of protrusion of the tip of the probe from the first mating surface can be designed according to the maximum allowable mating gap between the first connector and the second connector.

[0014] In some possible implementations, the probe module further includes an elastic element, a fixing element, and a limiting structure. The limiting structure includes a limiting groove, wherein at least one probe, the fixing element, and the elastic element are located in the limiting groove, and at least one probe is spaced apart at one end of the fixing element along a first direction, and the elastic element is located at the other end of the fixing element along the first direction. The elastic element is connected to the groove wall of the limiting groove.

[0015] In this way, the probe and the fixing member can move elastically as a whole. For example, the probe can move elastically in the mating direction of the first connector and the second connector, thereby enabling the detection of the mating condition between the first connector and the second connector.

[0016] In some possible implementations, the probe module includes at least one elastic element, which corresponds one-to-one with at least one probe, and each elastic element provides an elastic force along a first direction to the corresponding probe. In this way, each probe can move elastically independently.

[0017] In some possible implementations, the probe module includes a first probe, a second probe, a first elastic element, and a second elastic element. The probe module also includes a limiting structure, which includes a first limiting groove and a second limiting groove. The first probe and the first elastic element are located in the first limiting groove, and the second probe and the second elastic element are located in the second limiting groove.

[0018] In some possible implementations, the conductor module includes a conductor, both the conductor and the probe are disposed on the first connector, and the conductor is electrically connected to the pathway detection module.

[0019] It is understandable that the probe module and the conductor module can be mounted on the same connector, making the detection device more compact and easier to install and maintain.

[0020] In some possible implementations, the conductor is located on the first mating surface, and the conductor is electrically connected to each probe.

[0021] In some possible implementations, the conductor is spaced apart from the first mating surface, and the conductor is disposed in the first connector by an elastic element.

[0022] In some possible implementations, the detection device also includes a trigger structure disposed on the second connector.

[0023] It is understandable that when the first and second connectors are not plugged in, the probe and conductor are not in contact. When the first and second connectors are plugged in relative to each other, the trigger structure pushes the conductor so that the conductor contacts the probe, forming a circuit. Thus, the path detection module can detect abnormal electrical connection between the probe and conductor when the plugging condition between the first and second connectors does not meet the mating clearance requirements, thereby providing feedback on the misalignment of the first and second connectors.

[0024] In some possible implementations, the first condition further includes: the included angle between the first mating surface and the second mating surface is less than or equal to a first angle, where the first angle is a mating angle threshold for maintaining electrical connection between the first connector and the second connector.

[0025] In some possible implementations, the rotatable activity of the structural component is triggered.

[0026] It is understandable that the rotatable trigger structure can simultaneously detect whether the insertion between the first connector and the second connector meets the requirements for the mating gap and the mating angle. For example, if the mating gap or the mating requirements are not met between the first connector and the second connector, the path detection module detects an abnormal electrical connection between the probe and the conductor, thereby providing feedback on the misfitting information between the first connector and the second connector.

[0027] In some possible implementations, the conductor module includes a conductor, a probe disposed at a first connector, and a conductor disposed at a second connector.

[0028] Thus, the conductor and probe are respectively mounted on different connectors. When the first connector and the second connector are plugged in relative to each other, the conductor can contact the probe and apply pressure to the tip of the probe, thereby compressing the protrusion of the probe.

[0029] In some possible implementations, the detection device includes multiple probe modules distributed on different sides of the first connector that are adjacent to and connected to the first mating surface, and different probe modules correspond to probes of different sizes.

[0030] Here, probes of different sizes refer to probes on different sides having different protrusions relative to the first mating surface. This allows for more precise detection of the degree to which the first connector and the second connector are properly mated when they are inserted.

[0031] In some possible implementations, one of the first connector and the other of the second connector is a male connector and the other is a female connector.

[0032] Secondly, embodiments of this application provide an electronic device including a connector assembly, a first functional module, and a second functional module as described in the first aspect. The connector assembly is used to electrically connect the first functional module and the second functional module, wherein the first connector is connected to the first functional module, and the second functional module is connected to the second connector.

[0033] The technical effects of the second aspect mentioned above can be referred to the technical effects of the first aspect, and will not be repeated here. Attached Figure Description

[0034] Figure 1 According to an embodiment of this application, a schematic diagram of the insertion of a first connector 10 and a second connector 20 is shown;

[0035] Figure 2 According to an embodiment of this application, a structural schematic diagram of a connector assembly 100 is shown;

[0036] Figure 3 According to an embodiment of this application, a schematic diagram of the probe module 120 and conductor module 220 in a first embodiment is shown;

[0037] Figures 4A to 4D According to an embodiment of this application, schematic diagrams are shown of different insertion configurations between the first connector 10 and the second connector 20;

[0038] Figure 5 According to an embodiment of this application, a schematic diagram of the structure of the probe module 120 and the conductor module 220 in the second embodiment is shown;

[0039] Figure 6 According to an embodiment of this application, a schematic diagram of the probe module 120 and conductor module 220 in a third embodiment is shown;

[0040] Figure 7 According to an embodiment of this application, a schematic diagram of the structure of the probe module 120 and the conductor module 220 in the fourth embodiment is shown;

[0041] Figure 8 According to an embodiment of this application, a schematic diagram of the probe module 120 and conductor module 220 in a fifth embodiment is shown;

[0042] Figures 9A to 9C According to an embodiment of this application, schematic diagrams are shown of different insertion configurations between the first connector 10 and the second connector 20;

[0043] Figure 10 According to an embodiment of this application, a schematic diagram of the probe module 120 and conductor module 220 in a sixth embodiment is shown;

[0044] Figures 11A to 11CAccording to an embodiment of this application, schematic diagrams are shown of different insertion configurations between the first connector 10 and the second connector 20;

[0045] Figure 12 According to an embodiment of this application, a schematic diagram of the probe module 120 and conductor module 220 in a seventh embodiment is shown;

[0046] Figures 13A to 13B According to an embodiment of this application, schematic diagrams are shown of different insertion configurations between the first connector 10 and the second connector 20;

[0047] Figure 14 According to an embodiment of this application, a schematic diagram of the structure of the probe module 120 and the conductor module 220 in the eighth embodiment is shown;

[0048] Figure 15A According to an embodiment of this application, a structural schematic diagram of the probe module 120 and the conductor module 220 in the ninth embodiment is shown;

[0049] Figure 15B According to an embodiment of this application, a schematic diagram of the structure of probe module 120 and conductor module 220 in another embodiment is shown;

[0050] Figure 16 According to an embodiment of this application, a structural schematic diagram of the probe module 120 and the conductor module 220 in the tenth embodiment is shown;

[0051] Figure 17 According to an embodiment of this application, a schematic diagram of the structure of the probe module 120 and the conductor module 220 in the eleventh embodiment is shown;

[0052] Figure 18 According to an embodiment of this application, a schematic diagram of the structure of the probe module 120 and the conductor module 220 in the twelfth embodiment is shown;

[0053] Figure 19A and Figure 19B This application embodiment illustrates some application scenarios of the connector assembly 100;

[0054] Figure 20 This application provides embodiments that illustrate some related technologies;

[0055] Figure 21 This application embodiment illustrates schematic diagrams of other related technologies. Detailed Implementation

[0056] The illustrative embodiments of this application include, but are not limited to, a connector assembly and an electronic device.

[0057] It should be noted that the electronic devices in this application's embodiments include, but are not limited to, mobile stations (MS) and mobile terminals (MT). For example, electronic devices can be mobile phones, smart TVs, wearable devices, tablets, desktop computers, laptops, virtual reality (VR) devices, augmented reality (AR) devices, terminals in industrial control, self-driving, remote medical surgery, smart grids, transportation safety, smart cities, smart homes, and so on. This application's embodiments do not limit the specific form of the electronic devices.

[0058] The electronic device in this application embodiment includes a connector assembly, a first functional module, and a second functional module. The first / second functional module is a module used by the electronic device to implement a specific function of the electronic device. The connector assembly is used to electrically connect the first functional module and the second functional module to realize the transmission of electrical signals between the first functional module and the second functional module.

[0059] It should be noted that this application does not limit the specific structure and function of the first / second functional modules. It is understood that the first / second functional modules include, but are not limited to, various electronic devices such as integrated circuits and sensors.

[0060] It is understood that the first functional module and the second functional module are connected in a pluggable manner through a connector assembly. It should be noted that, in this embodiment, one of the first connector and the other of the second connector is a male connector, and the other is a female connector.

[0061] When the first connector and the second connector are plugged into each other, the first functional module and the second functional module are electrically connected and can transmit electrical signals; when the first connector and the second connector are separated, the first functional module and the second functional module are disconnected.

[0062] It is understandable that if the mating precision of the first connector and the second connector is insufficient after they are plugged in, for example... Figure 1The gap between the first connector 10 and the second connector 20 after they are plugged in is large, which will lead to poor fit between the first connector 10 and the second connector 20, abnormal electrical connection, and thus affect the electrical connection and electrical signal transmission between the first functional module and the second functional module.

[0063] Based on this, embodiments of this application provide a detection device, which includes a probe module, a conductor module, and a connection detection module. The probe module and the conductor module are respectively disposed on a first connector and a second connector, or both the probe module and the conductor module are disposed on the first connector. Thus, when the first connector and the second connector are connected, the connection detection module detects the electrical connection state between the probe module and the conductor module. Different electrical connection states between the probe module and the conductor module correspond to different electrical connection states between the first connector and the second connector.

[0064] For example, a normal electrical connection between the probe module and the conductor module indicates a normal electrical connection between the first connector and the second connector; an abnormal electrical connection between the probe module and the conductor module indicates an abnormal electrical connection between the first connector and the second connector. Alternatively, an abnormal electrical connection between the probe module and the conductor module indicates a normal electrical connection between the first connector and the second connector; a normal electrical connection between the probe module and the conductor module indicates an abnormal electrical connection between the first connector and the second connector. Thus, even when the first and second connectors are connected, the connection status (normal or abnormal) between the probe module and the conductor module can be detected in real time by the connection detection module to determine the electrical connection status between the first connector and the second connector. This eliminates the need for laboratory sampling tests and allows for rapid identification of connector connection faults during manufacturing or operation.

[0065] The connector assembly of the above-described detection device in the embodiments of this application will be further described below with reference to the accompanying drawings.

[0066] Figure 2 A schematic diagram of a connector assembly 100 is shown. Figure 2 As shown, the connector assembly 100 includes a first connector 10 and a second connector 20. The first connector 10 includes a housing 110, and the second connector 20 includes a housing 210.

[0067] The first connector 10 and the second connector 20 can be inserted relative to each other along the Z-axis direction (an example of the first direction in this application). The housing 110 has a first mating surface 101 facing the positive Z-axis direction (i.e., facing the second connector 20), and the housing 210 has a second mating surface 201 facing the negative Z-axis direction (i.e., facing the first connector 10).

[0068] When the first connector 10 and the second connector 20 are inserted and properly engaged, the first mating surface 101 and the second mating surface 201 are in close contact with each other, and the electrical connection between the first connector 10 and the second connector 20 is normal. However, when the first connector 10 and the second connector 20 are inserted but not properly engaged, there is a large gap (hereinafter referred to as the mating gap) between the first mating surface 101 and the second mating surface 201 along the Z-axis. If the mating gap exceeds the distance threshold for maintaining electrical connection between the first connector 10 and the second connector 20, it will lead to an abnormal electrical connection between the first connector 10 and the second connector 20.

[0069] In some embodiments, such as Figure 2 As shown, the housing 110 of the first connector 10 is provided with probe modules 120 around its perimeter, and the housing 210 of the second connector 20 is provided with conductor modules 220 around its perimeter. Specifically, the housing 110 has four sides adjacent to the first mating surface 101 (side one facing the positive X-axis, side two facing the negative X-axis, side three facing the positive Y-axis, and side four facing the negative Y-axis), each of which is provided with a probe module 120. The housing 210 has four sides adjacent to the second mating surface 201 (side five facing the positive X-axis, side six facing the negative X-axis, side seven facing the positive Y-axis, and side eight facing the negative Y-axis), each of which is provided with a conductor module 220.

[0070] The four probe modules 120 on the housing 110 correspond one-to-one with the four conductor modules 220 on the housing 210. For example, the probe module 120 on side one corresponds to the conductor module 220 on side five, the probe module 120 on side two corresponds to the conductor module 220 on side six, the probe module 120 on side three corresponds to the conductor module 220 on side seven, and the probe module 120 on side four corresponds to the conductor module 220 on side eight.

[0071] It should be noted that this application does not limit the number or position of the probe module 120 and conductor module 220 included in the detection device, but the probe module 120 and conductor module 220 need to be arranged in groups / pairs. For example, in some embodiments, the housing 110 may have only one probe module 120, and correspondingly, the housing 210 may have only one conductor module 220. In other embodiments, the housing 110 may have only one probe module 120 on side one and side two, and correspondingly, the housing 210 may have only one conductor module 220 on side five and side six. In yet another embodiment, the housing 110 may have two or more probe modules 120 on side one, and correspondingly, the housing 210 may have two or more conductor modules 220 on side five. In yet another embodiment, the probe module 120 may also be located on the first mating surface 101, and the conductor module 220 may be located on the second mating surface 201. Furthermore, when the probe module 120 is disposed on the first mating surface 101, the probe module 120 can reuse the probes on the first mating surface 101 that were originally used for transmitting electrical connections or transmitting electrical signals.

[0072] Continue reading Figure 2 It can be understood that when the first connector 10 and the second connector 20 are inserted relative to each other along the Z-axis, the probe module 120 on the housing 110 and the corresponding conductor module 220 on the housing 210 are relatively close to each other; when the first connector 10 and the second connector 20 are in place, the probe module 120 and the corresponding conductor module 220 are electrically connected. For example, when the first connector 10 and the second connector 20 are inserted relative to each other along the Z-axis, the probe module 120 located on side one of the housing 110 and the conductor module 220 located on side five of the housing 210 are relatively close to each other; when the first connector 10 and the second connector 20 are in place, the probe module 120 located on side one of the housing 110 and the conductor module 220 located on side five of the housing 210 are electrically connected.

[0073] In some embodiments, connector assembly 100 includes a path detection module ( Figure 2 (Not shown), the pathway detection module is electrically connected to each probe module 120. The pathway detection module is used to detect the electrical connection status between the probe module 120 and the corresponding conductor module 220 when the first connector 10 and the second connector 20 are plugged in relative to each other.

[0074] Since the probe module 120 is electrically connected to the corresponding conductor module 220 when the first connector 10 and the second connector 20 are properly engaged, the path detection module can determine that the first connector 10 and the second connector 20 are properly engaged when it detects the electrical connection between the probe module 120 and the corresponding conductor module 220.

[0075] In other words, this embodiment uses a probe module 120 on the first connector 10 and a conductor module 220 on the second connector 20. A connection detection module is used to detect whether there is an electrical connection between the probe module 120 and the corresponding conductor module 220, thereby determining whether the first connector 10 and the second connector 20 are properly fitted. This allows for the rapid identification of abnormal connection faults in the connector assembly 100.

[0076] It should be noted that the electrical connection between the probe module 120 and the corresponding conductor module 220 can be detected by the path detection module to determine that the first connector 10 and the second connector 20 are properly engaged. Alternatively, the disconnection between the probe module 120 and the corresponding conductor module 220 can also be detected by the path detection module to determine that the first connector 10 and the second connector 20 are properly engaged. This application does not limit the scope of this application. Furthermore, in some embodiments of this application, the probe module 120 and the conductor module 220 may also be disposed on the same connector, such as the first connector 20. Specific embodiments will be described in detail below and will not be elaborated here.

[0077] The specific structures of probe module 120 and conductor module 220 are described below, and the working principle of the pathway detection module is explained in conjunction with the specific structures.

[0078] Figure 3 A schematic diagram of the probe module 120 and conductor module 220 in the first embodiment of this application is shown.

[0079] In some embodiments, such as Figure 3 As shown, the probe module 120 includes a probe movable module, which includes two probes 121, a fixing member 122, and a spring 123. The probe module 120 also includes a limiting structure 124.

[0080] The limiting structure 124 has a limiting groove 124a inside, and the probe 121, the fixing member 122, and the spring 123 are all disposed in the limiting groove 124a. The limiting groove 124a is an open groove, and the opening of the limiting groove 124a is located on the surface 1241 of the limiting structure 124 facing the positive Z-axis direction (or facing the conductor module 220). One end of the probe 121 can extend out from the opening of the limiting groove 124a. It should be noted that the probe 121 in this embodiment is made of a conductive material, therefore the probe 121 is conductive.

[0081] like Figure 3As shown, two probes 121 are spaced apart along the Y-axis and fixed to a fixing member 122. One end of the fixing member 122 facing the negative Z-axis direction is connected to one end of a spring 123, and the other end of the spring 123 is connected to the wall of a limiting groove 124a. Thus, the two probes 121 and the fixing member 122 as a whole can move elastically. For example, the probes 121 can move elastically in the Z-axis direction.

[0082] It is understood that in other embodiments of this application, the spring 123 may be replaced by other elastic elements (such as leaf springs), and this application does not limit the type of elastic element.

[0083] Continue reading Figure 3 The conductor module 220 includes a conductor 221 (e.g., a copper sheet) and a fixing structure 222. In some embodiments, the conductor 221 is disposed on the surface 2221 of the fixing structure 222 facing the negative Z-axis direction (or facing the probe module 120), or the conductor 221 is embedded in the fixing structure 222 and exposed on the surface 2221.

[0084] Combination Figure 2 When the first connector 10 and the second connector 20 are inserted relative to each other along the Z-axis and are properly engaged, both probes 121 are in contact with the conductor 221. At this time, the path detection module detects that the electrical connection between the probe module 120 and the conductor module 220 is normal.

[0085] The following is combined Figures 4A to 4D The probe module 120 and conductor module 220 of this embodiment will be further described, and the structure and detection principle of the pathway detection module will be introduced.

[0086] In some embodiments, such as Figure 4A and combined Figure 3 The first mating surface 101 of the housing 110 coincides with the surface 1241 of the limiting structure 124, the second mating surface 201 of the housing 210 coincides with the surface 2221 of the fixing structure 222, and the conductor 221 is embedded in the fixing structure 222 and exposed on the surface 2221.

[0087] When the spring 123 is in its natural state (i.e., not stretched or compressed), the protrusion of the tip of the probe 121 relative to the surface 1241 (first mating surface 101) is b. The relationship between this protrusion and the maximum allowable gap value a along the Z-axis between the first mating surface 101 and the second mating surface 201 is: b ≤ a. Here, the maximum allowable gap value a along the Z-axis between the first mating surface 101 and the second mating surface 201 is also the distance threshold for maintaining electrical connection between the first connector 10 and the second connector 20.

[0088] For example, the protrusion b of the tip of the probe 121 relative to the first mating surface 101 can be 0.8 mm.

[0089] It is understood that when the first connector 10 and the second connector 20 are inserted relative to each other along the Z-axis, the conductor 221 can contact the probe 121 and provide negative Z-axis pressure to the tip of the probe 121, compressing the protrusion of the probe 121 to any value between b and 0. In practical applications, the protrusion of the tip of the probe 121 relative to the first mating surface 101 can be designed according to the maximum allowable mating clearance between the first connector 10 and the second connector 20.

[0090] Continue reading Figure 4A The limiting structure 124 is provided with pins 125, which are metal connection points for electrical connection with the access detection module 300. It is understood that the position of the pins 125 is not limited in this application and can be adjusted according to actual application scenarios and requirements. Each probe 121 can be connected to the pins 125 via a flexible conductor 126. Specifically, one end of the flexible conductor 126 is electrically connected to the end of the probe 121, and the other end is electrically connected to the pin 125, thereby realizing the electrical connection between the probe 121 and the access detection module 300.

[0091] It is understandable that when the first connector 10 and the second connector 20 are inserted relative to each other along the Z-axis and properly engaged, both probes 121 will be in contact with the conductor 221, thus forming a circuit between both probes 121 and the conductor 221. In this case, the circuit detection module 300 detects that the electrical connection between probe 121 and conductor 221 is normal. If only one probe 121 is in contact with conductor 221, no circuit will be formed, and the circuit detection module 300 detects that the electrical connection between probe 121 and conductor 221 is abnormal.

[0092] Continue reading Figure 4A There are gaps y1 and y2 between the two groove walls of the fixing member 122 and the limiting groove 124a along the Y-axis. The gaps y1 and y2 allow the probe 121 and the fixing member 122 to have a maximum range of motion α. ​​It can be understood that the maximum range of motion α is related to the dimensions of the gaps y1 and y2 along the Y-axis and along the Z-axis. Therefore, the maximum range of motion α can be set according to actual needs. This application does not limit the range of the maximum range of motion α.

[0093] Figure 4B A schematic diagram is shown with the probe 121 and the fixture 122 at their maximum range of motion angle α. Figure 4B As shown, when the probe 121 and the fixing member 122 are at the maximum active angle α, the maximum allowable mating angle between the first connector 10 and the second connector 20 (between the first mating surface 101 and the second mating surface 201) is also α.

[0094] For ease of explanation and understanding, Figure 4CA geometrical schematic diagram is shown of the movable angle of probe 121 and the mating angle between the first mating surface 101 and the second mating surface 201. (See diagram for reference.) Figure 4C As shown, the movable angle of probe 121 is the angle between the extension direction of probe 121 and the wall of the limiting groove 124a. When it is at the maximum movable angle α, the mating angle between the first mating surface 101 and the second mating surface 201 needs to be less than or equal to the maximum movable angle α in order to ensure that the conductor 221 on the second mating surface 201 contacts both probes 121 at the same time.

[0095] like Figure 4D As shown, when the angle between the first mating surface 101 and the second mating surface 201 exceeds α, one of the probes 121 cannot make contact with the conductor 221.

[0096] It is understandable that, in practical applications, the maximum range of motion between the probe 121 and the fixing member 122 can be designed based on the maximum allowable mating angle between the first connector 10 and the second connector 20.

[0097] Therefore, in this embodiment, the situation where the first connector 10 and the second connector 20 are plugged in but not properly fitted, as mentioned above, can include the following two possibilities:

[0098] The case where the mating clearance between the first mating surface 101 and the second mating surface 201 exceeds the maximum allowable clearance value a;

[0099] The mating angle between the first mating surface 101 and the second mating surface 201 exceeds the maximum allowable mating angle α.

[0100] It is understandable that in both of the above situations, at least one probe 121 will be unable to make contact with the conductor 221, thereby the path detection module 300 will detect that the electrical connection between the probe 121 and the conductor 221 is abnormal.

[0101] In other words, in this embodiment, the path detection module 300 can detect an abnormal electrical connection between the probe 121 and the conductor 221 (i.e., between the probe module 120 and the conductor module 220) when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value 'a' or the mating angle is less than or equal to 'α'. This allows it to provide feedback that the first connector 10 and the second connector 20 are not properly mated. Conversely, when the mating gap between the first connector 10 and the second connector 20 is less than or equal to 'a' and the mating angle is less than or equal to 'α', the path detection module 300 can detect that the electrical connection between the probe 121 and the conductor 221 is normal. This allows it to provide feedback that the first connector 10 and the second connector 20 are properly mated.

[0102] Figure 5A schematic diagram of the probe module 120 and conductor module 220 in the second embodiment is shown. Figure 3 The difference in the illustrated embodiment is that, Figure 5 The probe module 120 shown also includes a movable pin 127 and a pin shaft 128.

[0103] The fixing member 122 is rotatably connected to one end of the movable pin 127 along the Z-axis via a pin 128, and a spring 123 is sleeved on the other end of the movable pin 127 along the Z-axis. Thus, the movable pin 127 can drive the fixing member 122 and the probe 121 to perform elastic movements under the action of the spring 123.

[0104] and Figure 3 Similarly, in the embodiment shown, the maximum active angle α of the probe 121 is set by setting the amount of protrusion of the tip of the probe 121 relative to the first mating surface 101 and setting the gap size between the groove wall of the limiting groove 124a and the fixing member 122. The abnormal connection situation where the first connector 10 and the second connector 20 do not meet the mating angle or mating gap requirements can be detected by the passage detection module 300.

[0105] Figure 5 The probe module 120 shown is Figure 3 The probe module 120 shown is identical in structure and principle except for the probe active module; therefore, it can be referred to. Figure 3 The relevant descriptions will not be repeated here.

[0106] Figure 6 A schematic diagram of the probe module 120 and conductor module 220 in the third embodiment is shown. Figure 5 The difference in the illustrated embodiment is that, Figure 6 The probe module 120 shown includes two probes 121, a fixing member 122, a spring 123, and a pin 129.

[0107] In this embodiment, the end of the fixing member 122 facing the negative Z-axis is semi-circular, and the limiting groove 124a is designed to mimic the shape of the fixing member 122. A gap is left between the fixing member 122 and the limiting groove 124a to allow the fixing member 122 to move within the limiting groove 124a. The end of the fixing member 122 facing the negative Z-axis abuts against the end of the ejector pin 129 facing the positive Z-axis, and a spring 123 is fitted onto the end of the ejector pin 129 facing the negative Z-axis. Thus, under the action of the spring 123, the ejector pin 129 allows the fixing member 122 and the probe 121 to move within the limiting groove 124a.

[0108] Understandable, compared to Figure 5In the illustrated embodiment, the pivot point of the probe 121 is the pin 128. In this embodiment, the pivot point of the probe 121 is the contact point between the ejector pin 129 and the fixing member 122. That is, the pivot point moves in the negative Z-axis direction, which can control the maximum movement angle α, making it suitable for scenarios with higher requirements for the accuracy of the mating angle. In addition, the part where the ejector pin 129 mates with the fixing member 122 is semi-circular, which can reduce the coefficient of friction and realize the flexible rotation of the fixing member 122 and the probe 121 and their movement along the Z-axis direction.

[0109] In some embodiments, the end of the ejector pin 129 that abuts against the fixing member 122 may be provided with balls or rollers, thereby further reducing the coefficient of friction.

[0110] Similarly, by setting the amount of protrusion of the tip of the probe 121 relative to the first mating surface 101 and setting the size of the limiting groove 124a, the maximum active angle α of the probe 121 can be set, and then the abnormal connection situation where the first connector 10 and the second connector 20 do not meet the requirements of the mating angle or mating gap can be detected by the passage detection module 300.

[0111] Figure 6 The probe module 120 shown is Figure 3 The probe module 120 shown is identical in structure and principle except for the shape of the probe movable module and the limiting groove 124a. Therefore, it can be referred to Figure 3 The relevant descriptions will not be repeated here.

[0112] Figure 7 A schematic diagram of the probe module 120 and conductor module 220 in the fourth embodiment is shown. Figure 6 The difference in the illustrated embodiment is that, Figure 7 The structure of the fixing member 122 and the shape of the limiting groove 124a in the probe active module of the probe module 120 shown are different.

[0113] In some embodiments, such as Figure 7 As shown, the fixing member 122 includes a main body 1221, an extension 1222 extending in the positive Y-axis direction, and an extension 1223 extending in the negative Y-axis direction. The shape of the limiting groove 124a is similar to the external structure of the fixing member 122. The main body 1221 is used to fix two probes 121. The extensions 1222 and 1223 can move in the positive or negative Z-axis direction within the limiting groove 124a. When the extension 1222 moves in the positive Z-axis direction within the limiting groove 124a, the extension 1223 moves in the negative Z-axis direction within the limiting groove 124a, thereby moving the probes 121.

[0114] It is understood that in this embodiment, the dimensions of the extension 1222 and extension 1223 of the fixing member 122 and the dimension of the limiting groove 124a can be set to set the maximum active angle α of the probe 121, so that the abnormal connection situation where the first connector 10 and the second connector 20 do not meet the requirements of the mating angle or mating gap can be detected by the passage detection module 300.

[0115] It is understood that the probe active module of this embodiment is suitable for connectors that are larger in size in the Y-axis direction but smaller in size in the Z-axis direction.

[0116] Figure 7 The probe module 120 shown can also be referenced. Figure 3 as well as Figure 6 The specific descriptions of the embodiments will not be repeated here.

[0117] Figure 8 A schematic diagram of the probe module 120 and conductor module 220 in the fifth embodiment is shown. Figure 3 The difference in the illustrated embodiment is that, Figure 8 The two probes 121 shown are set independently and can move independently and flexibly.

[0118] In some embodiments, such as Figure 8 As shown, the probe module 120 includes two probes 121, two springs 123, and a limiting structure 124. The limiting structure has two limiting grooves 124a inside, and each limiting groove 124a contains a probe 121 and a spring 123.

[0119] Taking one of the limiting grooves 124a as an example, the limiting groove 124a is an open groove. The opening of the limiting groove 124a is located on the surface 1241 of the limiting structure 124 facing the positive Z-axis direction (that is, facing the conductor module 220). The probe 121 extends along the Z-axis direction, and the end of the probe 121 facing the positive Z-axis direction can protrude from the opening of the limiting groove 124a, while the end facing the negative Z-axis direction is sleeved on the spring 123. Thus, under the action of the spring 123, the probe 121 can move elastically in the Z-axis direction.

[0120] In this embodiment, the first mating surface 101 of the housing 110 coincides with the surface 1241 of the limiting structure 124, the second mating surface 201 of the housing 210 coincides with the surface 2221 of the fixing structure 222, and the conductor 221 is embedded in the fixing structure 222 and exposed on the surface 2221.

[0121] When the spring 123 is in its natural state (i.e., not stretched or compressed), the protrusion of the tip of the probe 121 relative to the surface 1241 (first mating surface 101) is b. The relationship between this protrusion and the maximum allowable gap value a along the Z-axis between the first mating surface 101 and the second mating surface 201 is: b ≤ a. Here, the maximum allowable gap value a along the Z-axis between the first mating surface 101 and the second mating surface 201 is also the distance threshold for maintaining electrical connection between the first connector 10 and the second connector 20.

[0122] It is understood that when the first connector 10 and the second connector 20 are inserted relative to each other along the Z-axis, the conductor 221 can contact the probe 121 and provide negative Z-axis pressure to the tip of the probe 121, compressing the protrusion of the probe 121 to any value between b and 0. In practical applications, the protrusion of the tip of the probe 121 relative to the first mating surface 101 can be designed according to the maximum allowable mating clearance between the first connector 10 and the second connector 20.

[0123] The limiting structure 124 is provided with pins 125, which are metal connection points for electrical connection with the access detection module 300. Each probe 121 can be connected to the pins 125 through a flexible conductor 126, thereby realizing electrical connection with the access detection module 300.

[0124] Conductor module 220 and Figure 3 , Figure 4A The relevant embodiments are the same and can be referred to the above description, so they will not be repeated here.

[0125] The following is combined Figures 9A to 9C The different connection configurations shown illustrate the detection principle of the path detection module in this embodiment.

[0126] like Figure 9A As shown, when the mating gap between the first mating surface 101 and the second mating surface 201 is less than or equal to the gap value a, both probes 121 are in contact with the conductor 221, thus forming a circuit between the two probes 121 and the conductor 221. At this time, the circuit detection module 300 detects that the electrical connection between the probes 121 and the conductor 221 is normal.

[0127] like Figure 9B As shown, when the maximum mating gap between the first mating surface 101 and the second mating surface 201 is greater than the gap value a, one of the probes 121 is in contact with the conductor 221, while the other probe 121 is not in contact with the conductor 221. As a result, the two probes 121 and the conductor 221 cannot form a circuit. At this time, the circuit detection module 300 detects that the electrical connection between the probe 121 and the conductor 221 is abnormal.

[0128] like Figure 9CAs shown, when the gap between the first mating surface 101 and the second mating surface 201 is greater than the gap value a, neither of the two probes 121 contacts the conductor 221, so the two probes 121 and the conductor 221 cannot form a circuit. At this time, the circuit detection module 300 detects that the electrical connection between the probes 121 and the conductor 221 is abnormal.

[0129] Therefore, in this embodiment, the situation where the first connector 10 and the second connector 20 are plugged in but not properly fitted can include: the mating gap between the first mating surface 101 and the second mating surface 201 exceeds the maximum allowable gap value a. In this case, at least one probe 121 cannot contact the conductor 221, and the path detection module 300 detects that the electrical connection between the probe 121 and the conductor 221 is abnormal.

[0130] That is, based on Figure 8 The probe module 120 and the pathway detection module 300, as shown, can detect an abnormal electrical connection between the probe module 120 and the conductor module 220 when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value a, thereby providing feedback that the first connector 10 and the second connector 20 are not properly mated. Conversely, when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value a, the pathway detection module 300 can detect that the electrical connection between the probe module 120 and the conductor module 220 is normal, thereby providing feedback that the first connector 10 and the second connector 20 are properly mated.

[0131] Figure 10 A schematic diagram of the probe module 120 and conductor module 220 in the sixth embodiment is shown. Figure 8 The difference in the illustrated embodiment is that conductor 221 is disposed on the first connector 10.

[0132] In some embodiments, such as Figure 10 As shown, both the probe module 120 and the conductor module 220 are disposed in the first connector 10. The structure of the probe module 120 can be referred to... Figure 8 Related embodiments will not be described in detail.

[0133] The conductor module 220 includes a conductor 221 located on the first mating surface 101 and between two probes 121, and electrically connected to each probe 121. Additionally, the conductor 221 is connected to the corresponding pin 125 via a flexible conductor 126, thereby achieving electrical connection with the access detection module 300.

[0134] In this embodiment, when the first connector 10 and the second connector 20 are not plugged in, each probe 121 is electrically connected to the conductor 221. That is, when the first connector 10 and the second connector 20 are not plugged in, the path detection module 300 detects that the electrical connection between each probe 121 and the conductor 221 is normal, which means that the electrical connection between the probe module 120 and the conductor module 220 is normal.

[0135] Continue reading Figure 10 The second connector 20 may be provided with a trigger structure 230, the end of which faces the negative Z-axis direction and is flush with the second mating surface 201. When the first connector 10 and the second connector 20 are inserted relative to each other along the Z-axis direction, the trigger structure 230 contacts the probe 121 and provides pressure in the negative Z-axis direction to the tip of the probe 121, so that the protrusion of the probe 121 is compressed to any value between b and 0.

[0136] The following is combined Figures 11A to 11C The different connection configurations shown illustrate the detection principle of the path detection module in this embodiment.

[0137] like Figure 11A As shown, when the mating gap between the first mating surface 101 and the second mating surface 201 is less than or equal to the maximum gap value a, both probes 121 are in contact with the trigger structure 230, thereby forming an open circuit between each probe 121 and the conductor 221. At this time, the path detection module 300 detects that each probe 121 is abnormally electrically connected to the conductor 221.

[0138] like Figure 11B As shown, when the maximum mating gap between the first mating surface 101 and the second mating surface 201 is greater than the gap value a, one of the probes 121 is in contact with the trigger structure 230, while the other probe 121 is not in contact with the trigger structure 230. Thus, one of the probes 121 forms an open circuit with the conductor 221, while the other probe 121 remains electrically connected to the conductor 221. At this time, the path detection module 300 detects that the electrical connection between one of the probes 121 and the conductor 221 is normal, while the electrical connection between the other probe 121 and the conductor 221 is abnormal.

[0139] like Figure 11C As shown, when the mating gap between the first mating surface 101 and the second mating surface 201 is greater than the maximum gap value a, neither of the two probes 121 contacts the trigger structure 230, so both probes 121 are electrically connected to the conductor 221. At this time, the path detection module 300 detects that each probe 121 is electrically connected to the conductor 221 normally.

[0140] Therefore, in this embodiment, the situation where the first connector 10 and the second connector 20 are plugged in but not properly fitted can include: the mating gap between the first mating surface 101 and the second mating surface 201 exceeds the maximum allowable gap value a. In this case, at least one probe 121 is electrically connected to the conductor 221, and the path detection module 300 detects that at least one probe 121 is electrically connected to the conductor 221 normally.

[0141] That is, based on Figure 10 The probe module 120 and the path detection module 300 shown can detect that at least one probe 121 has a normal electrical connection with the conductor 221 when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value a, thereby providing feedback that the first connector 10 and the second connector 20 are not properly mated. Conversely, when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value a, the path detection module 300 can detect abnormal electrical connections between each probe 121 and the conductor 221, thereby providing feedback that the first connector 10 and the second connector 20 are properly mated.

[0142] In this embodiment, the probe module 120 and the conductor module 220 are mounted on the same connector, making the detection device more compact and easier to install and maintain.

[0143] Figure 12 A schematic diagram of the probe module 120 and conductor module 220 in the seventh embodiment is shown. Figure 10 The difference in this embodiment is that the trigger structure 230 is rotatable.

[0144] In some embodiments, such as Figure 12 As shown, the second connector 20 is provided with a limiting frame 231, and the trigger structure 230 is located inside the limiting frame 231 and connected to the limiting frame 231 via a pin 232. It can be understood that the pin 232 passes through the trigger structure 230, so that the trigger structure 230 can rotate around the pin 232.

[0145] It is understandable that the maximum rotation angle of the trigger structure 230 is set by adjusting the size of the gap between the trigger structure 230 and the limit frame 231, as described above. Figure 4C In the embodiment shown, the maximum active angle α of probe 121 is similar. In practical applications, the maximum rotation angle of trigger structure 230 can be designed based on the maximum allowable mating angle between the first connector 10 and the second connector 20.

[0146] Understandable. Figure 12 The probe module 120 and the conductor module 220 are mounted on the first connector 10. For details, please refer to the above text. Figure 10 The relevant descriptions of the embodiments will not be repeated here.

[0147] The following is combined Figures 13A to 13B The different connection configurations shown illustrate the detection principle of the path detection module in this embodiment.

[0148] like Figure 13A As shown, when the mating angle between the first mating surface 101 and the second mating surface 201 is less than or equal to the maximum mating angle α, and the maximum mating gap is less than or equal to the maximum gap value a, both probes 121 are in contact with the trigger structure 230, thereby forming an open circuit between each probe 121 and the conductor 221. At this time, the path detection module 300 detects that each probe 121 is abnormally electrically connected to the conductor 221.

[0149] like Figure 13B As shown, when the mating angle between the first mating surface 101 and the second mating surface 201 is greater than the maximum mating angle α, or when the mating gap is greater than the maximum gap value a, at least one probe 121 does not contact the trigger structure 230, so at least one probe 121 remains electrically connected. At this time, the path detection module 300 detects that at least one probe 121 is electrically connected to the conductor 221 normally.

[0150] Therefore, in this embodiment, for the situation mentioned above where the first connector 10 and the second connector 20 are plugged in but not properly fitted, the following can be included:

[0151] The case where the mating clearance between the first mating surface 101 and the second mating surface 201 exceeds the maximum allowable clearance value a;

[0152] The mating angle between the first mating surface 101 and the second mating surface 201 exceeds the maximum allowable mating angle α.

[0153] It is understandable that in both of the above situations, at least one probe 121 will remain electrically connected, so that the path detection module 300 can detect that at least one probe 121 is electrically connected to the conductor 221 normally.

[0154] That is, in this embodiment, the path detection module 300 can detect that at least one probe 121 and conductor 221 (i.e., probe module 120 and conductor module 220) have a normal electrical connection when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value 'a' or the mating angle is less than or equal to 'α'. This allows it to provide feedback that the first connector 10 and the second connector 20 are not properly mated. Conversely, when the mating gap between the first connector 10 and the second connector 20 is less than or equal to 'a' and the mating angle is less than or equal to 'α', the path detection module 300 can detect an abnormal electrical connection between each probe 121 and conductor 221. This allows it to provide feedback that the first connector 10 and the second connector 20 are properly mated.

[0155] Figure 14 A schematic diagram of the probe module 120 and conductor module 220 in the eighth embodiment is shown. Figure 12 The difference in the illustrated embodiment is that conductor 221 is disposed on trigger structure 230, thereby conductor 221 is rotatable.

[0156] Specifically, conductor 221 is located at the end of trigger structure 230 facing the negative Z-axis direction, so that trigger structure 230 can drive conductor 221 to rotate as a whole.

[0157] It should be noted that, in this embodiment, the probe module 120 and the conductor module 220 are respectively disposed on the first connector 10 and the second connector 20, and the probe module 120 adopts... Figure 8 The structure of the illustrated embodiment can be described in detail by referring to [reference needed]. Figure 8 The relevant descriptions of the embodiments shown will not be repeated.

[0158] In this embodiment, when the mating angle between the first mating surface 101 and the second mating surface 201 is less than or equal to the maximum mating angle α, and the maximum mating gap is less than or equal to the maximum gap value a, both probes 121 are in contact with the conductor 221, thereby forming a path between the two probes 121 and the conductor 221. At this time, the path detection module 300 detects that the electrical connection between the probes 121 and the conductor 221 is normal.

[0159] If the mating angle between the first mating surface 101 and the second mating surface 201 is greater than the maximum mating angle α, or if the mating gap is greater than the maximum gap value a, at least one probe 121 will not contact the trigger structure 230, so the two probes 121 and the conductor 221 cannot form a circuit. At this time, the circuit detection module 300 detects that the electrical connection between the probe 121 and the conductor 221 is abnormal.

[0160] Therefore, in this embodiment, for the situation mentioned above where the first connector 10 and the second connector 20 are plugged in but not properly fitted, the following can be included:

[0161] The case where the mating clearance between the first mating surface 101 and the second mating surface 201 exceeds the maximum allowable clearance value a;

[0162] The mating angle between the first mating surface 101 and the second mating surface 201 exceeds the maximum allowable mating angle α.

[0163] It is understandable that in both of the above situations, at least one probe 121 will be unable to make contact with the conductor 221, thereby the path detection module 300 will detect that the electrical connection between the probe 121 and the conductor 221 is abnormal.

[0164] That is, in this embodiment, the path detection module 300 can detect an abnormal electrical connection between the probe 121 and the conductor 221, i.e., between the probe module 120 and the conductor module 220, when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value 'a' or the mating angle is less than or equal to 'α', thereby providing feedback that the first connector 10 and the second connector 20 are not properly mated. Conversely, when the mating gap between the first connector 10 and the second connector 20 is less than or equal to 'a' and the mating angle is less than or equal to 'α', the path detection module 300 can detect that the electrical connection between the probe 121 and the conductor 221 is normal, thereby providing feedback that the first connector 10 and the second connector 20 are properly mated.

[0165] Figure 15A A schematic diagram of the probe module 120 and conductor module 220 in the ninth embodiment is shown. Figure 15A The illustrated embodiment is compared to Figure 10 The only difference in the embodiment shown is that the probe module 120 includes only one probe 121, and the rest of the structure is the same, so it will not be described again.

[0166] The path detection module 300 can detect that the electrical connection between probe 121 and conductor 221 is normal when the mating clearance between the first connector 10 and the second connector 20 is not less than or equal to the maximum clearance value a, thereby providing feedback that the first connector 10 and the second connector 20 are not properly mated. Conversely, when the mating clearance between the first connector 10 and the second connector 20 is less than or equal to the maximum clearance value a, the path detection module 300 can detect that the electrical connection between probe 121 and conductor 221 is abnormal, thereby providing feedback that the first connector 10 and the second connector 20 are properly mated.

[0167] It is understood that in the above embodiment, probe 121 is electrically connected to pin 125 via flexible conductor 126. In other embodiments, such as Figure 15B As shown, probe 121 can be electrically connected to pin 125 via elastic conductor 130 (e.g., a spring). It is understood that elastic conductor 130 can be used instead of flexible conductor 126 in all the embodiments described above.

[0168] Figure 16 A schematic diagram of the probe module 120 and conductor module 220 in the tenth embodiment is shown. Figure 16 The illustrated embodiment is compared to Figure 8 The difference in the illustrated embodiment is that the probe module 120 includes only one probe 121, and the second connector 20 is provided with a pin 240, which is grounded. The conductor 221 is connected to the pin 240 through a flexible conductor 250. The rest of the structure is the same, so it will not be described in detail here.

[0169] In this embodiment, the path detection module 300 can detect an abnormal electrical connection between the probe 121 and the conductor 221 when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value a, thereby providing feedback that the first connector 10 and the second connector 20 are not properly mated. Conversely, when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value a, the path detection module 300 can detect a normal electrical connection between the probe 121 and the conductor 221, thereby providing feedback that the first connector 10 and the second connector 20 are properly mated.

[0170] Figure 17 A schematic diagram of the probe module 120 and conductor module 220 in the eleventh embodiment is shown. Figure 15A The difference in the illustrated embodiment is that conductor 221 is elastically movable.

[0171] In some embodiments, such as Figure 17 As shown, conductor 221 is connected to limiting structure 124 via spring 131. For example, both ends of conductor 221 along the Y-axis are connected to limiting structure 124 via two springs 131, so that conductor 221 can float elastically.

[0172] In other embodiments, other elastic elements may be used to provide elasticity to conductor 221, or conductor 221 itself may be elastic.

[0173] It is understood that when the first connector 10 and the second connector 20 are not plugged in, the probe 121 is not in contact with the conductor 221. When the first connector 10 and the second connector 20 are plugged in relative to each other, the trigger structure 230 pushes the conductor 221 so that the conductor 221 contacts the probe 121 and forms a circuit.

[0174] Therefore, in this embodiment, the path detection module 300 can detect an abnormal electrical connection between the probe 121 and the conductor 221 when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value a, thereby providing feedback that the first connector 10 and the second connector 20 are not properly mated. Conversely, when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value a, the path detection module 300 can detect a normal electrical connection between the probe 121 and the conductor 221, thereby providing feedback that the first connector 10 and the second connector 20 are properly mated.

[0175] Figure 18 A schematic diagram of the probe module 120 and conductor module 220 in the twelfth embodiment is shown. Figure 17 The difference in the embodiment shown is that there are two probes 121, but the rest of the structure is the same and will not be described in detail.

[0176] It is understood that in this embodiment, the path detection module 300 can detect an abnormal electrical connection between at least one probe 121 and conductor 221 when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value a, thereby providing feedback that the first connector 10 and the second connector 20 are not properly mated. Conversely, when the mating gap between the first connector 10 and the second connector 20 is less than or equal to the maximum gap value a, the path detection module 300 can detect that the electrical connection between each probe 121 and conductor 221 is normal, thereby providing feedback that the first connector 10 and the second connector 20 are properly mated.

[0177] It should be noted that the various embodiments of this application have the same or similar structures. Therefore, the descriptions of the probe module 120 and conductor module 220 in each embodiment can be referred to the descriptions in the embodiments with the same or similar structures.

[0178] As mentioned above, the number of probe modules 120 and conductor modules 220 included in the detection device is not limited in the embodiments of this application. Taking probe module 120 as an example, at least one probe module 120 may be provided on at least one side of the housing 110 of the first connector 10.

[0179] In some embodiments, such as Figure 2 As shown, when there are two or more probe modules 120, the length of the probe 121 in each probe module 120 can be different, that is, the amount of protrusion of the probe 121 relative to the first mating surface 101 can be different. In this way, the degree of mating between the first connector 10 and the second connector 20 can be refined.

[0180] For example, such as Figure 2 As shown, the probes 121 on different sides of the four probe modules 120 protrude differently from the first mating surface 101. Therefore, if the access detection module detects that all four probe modules 120 are electrically connected to their corresponding conductor modules 220 normally / abnormally, it indicates that the first connector 10 and the second connector 20 are properly inserted and mated. If the access detection module detects that two or three probe modules 120 are electrically connected to their corresponding conductor modules 220 normally / abnormally, it indicates that the first connector 10 and the second connector 20 are properly inserted and mated. If the access detection module detects that only one probe module 120 is electrically connected to its corresponding conductor module 220 normally, it indicates that the first connector 10 and the second connector 20 are not properly inserted and mated. If the access detection module does not detect that any probe module 120 is electrically connected to its corresponding conductor module 220 normally, it indicates that the first connector 10 and the second connector 20 are not properly mated.

[0181] Furthermore, in this embodiment, the number of probes 121 in a single probe module 120 is not limited. In some embodiments, when there are two or more probes 121 in a single probe module 120, the amount of protrusion of each probe 121 relative to the first mating surface 101 may be different. Moreover, the probes 121 in this embodiment are not limited to elongated needle-like structures, but may be conductors of other shapes, and this application does not limit them in this regard.

[0182] Figure 19A and Figure 19B Some application scenarios for connector assembly 100 are shown. For example... Figure 19A and Figure 19B As shown, connector assembly 100 is typically used in a frame system 001 in an electronic device to support pluggable modules (e.g., a first functional module and a second functional module).

[0183] like Figure 19A or Figure 19B As shown, the first connector 10 is disposed on circuit board 01, and the second connector 20 is disposed on circuit board 02. Circuit board 01 and circuit board 02 can be connected via the first connector 10 and the second connector 20. (Path detection module) Figure 19A and Figure 19B (Not shown) can be set on circuit board 01 or circuit board 02.

[0184] Figure 19A Circuit board 01 extends along the X-axis and Z-axis, and circuit board 02 extends along the X-axis and Y-axis. Figure 19B The difference is that circuit board 02 extends along the Y-axis and Z-axis directions, that is... Figure 19A and Figure 19B Two different interlocking frame systems 001 are shown.

[0185] Figure 20 The diagram illustrates some related techniques for detecting the mating status between the first connector 10 and the second connector 20, such as... Figure 20 As shown, the first connector 10 uses a short signal pin on the first mating surface 101 to detect whether the connection is in place. Specifically, when the short signal pin is detected to be electrically connected to the second connector 20, the connection is confirmed to be in place, ensuring reliable contact of the long signal pin. However, this method has poor detection accuracy; it can only roughly detect whether the connector is in good contact and cannot accurately detect the connector mating gap and mating angle.

[0186] Figure 21 This illustrates other related techniques for detecting the mating status between the first connector 10 and the second connector 20, such as... Figure 21 As shown, a probe-type position sensor 1000 is inserted between the first connector 10 and the second connector 20. However, due to the large size of the probe-type position sensor 1000, it is only suitable for laboratory sampling tests and cannot be applied to the manufacturing process or real-time monitoring of the working status. Furthermore, it can easily lead to connector failure, resulting in reduced reliability of electronic equipment.

[0187] In comparison, the detection module provided in this application embodiment occupies less space, does not affect the original function of the connector, and the probe module 120 and conductor module 220 adopt a purely mechanical structure with a simple structural principle, does not introduce sensors, and has high reliability. When the first connector and the second connector are plugged in, the detection probe module 120 and conductor module 220 are used to determine whether the mating gap and mating angle of the first connector and the second connector meet the design requirements, and the connector mating status can be monitored in real time.

[0188] It should be understood that in the embodiments of this application, terms such as "for example," "in some embodiments," "in other embodiments," and "exemplarily" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as an "example" in this application should not be construed as being more preferred or advantageous than other embodiments or designs. Specifically, the use of the term "example" is intended to present concepts in a concrete manner.

[0189] It should be noted that in the examples and description of this application, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one" does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0190] Although this application has been illustrated and described with reference to certain preferred embodiments thereof, those skilled in the art will understand that various changes in form and detail may be made thereto without departing from the scope of this application.

Claims

1. A connector assembly, characterized in that, It includes a first connector, a second connector, and a detection device for detecting the electrical connection status between the first connector and the second connector; The detection device includes a probe module, a conductor module, and a pathway detection module, wherein... The probe module and the conductor module are respectively disposed in the first connector and the second connector, or the probe module and the conductor module are both disposed in the first connector; The pathway detection module is electrically connected to the probe module and is used to detect the electrical connection state between the probe module and the conductor module when the first connector and the second connector are plugged in. Different electrical connection states between the probe module and the conductor module correspond to different electrical connection states between the first connector and the second connector.

2. The connector assembly according to claim 1, characterized in that, The pathway detection module is used for When the insertion of the first connector and the second connector meets the first condition, an electrical connection between the probe module and the conductor module is detected. If the insertion of the first connector and the second connector does not meet the first condition, a disconnection is detected between the probe module and the conductor module.

3. The connector assembly according to claim 2, characterized in that, The first connector and the second connector are inserted into each other along a first direction, the first connector includes a first mating surface facing the second connector, and the second connector includes a second mating surface facing the first connector; The first condition includes: The maximum distance between the first mating surface and the second mating surface along the first direction is less than or equal to a first distance, which is a distance threshold for maintaining electrical connection between the first connector and the second connector.

4. The connector assembly according to claim 3, characterized in that, The probe module includes at least one probe, one end of which protrudes from the first mating surface along the first direction. The probe is elastically movable along the first direction. Each of the probes is electrically connected to the pathway detection module.

5. The connector assembly according to claim 4, characterized in that, The probe module further includes an elastic element, a fixing element, and a limiting structure. The limiting structure includes a limiting groove. The at least one probe, the fixing member, and the elastic member are located in the limiting groove, and the at least one probe is spaced apart at one end of the fixing member along the first direction, the elastic member is located at the other end of the fixing member along the first direction, and the elastic member is connected to the groove wall of the limiting groove.

6. The connector assembly according to claim 4, characterized in that, The probe module includes at least one elastic element, which corresponds one-to-one with the at least one probe, and each elastic element provides an elastic force along the first direction to the corresponding probe.

7. The connector assembly according to claim 6, characterized in that, The probe module includes a first probe, a second probe, a first elastic element, and a second elastic element. The probe module further includes a limiting structure, which includes a first limiting groove and a second limiting groove. The first probe and the first elastic element are located in the first limiting groove, and the second probe and the second elastic element are located in the second limiting groove.

8. The connector assembly according to any one of claims 4-7, characterized in that, The conductor module includes a conductor, and both the conductor and the probe are disposed on the first connector. The conductor is electrically connected to the pathway detection module.

9. The connector assembly according to claim 8, characterized in that, The conductor is located on the first mating surface, and the conductor is electrically connected to each of the probes.

10. The connector assembly according to claim 8, characterized in that, The conductor is spaced apart from the first mating surface, and the conductor is disposed on the first connector by an elastic element.

11. The connector assembly according to claim 9 or 10, characterized in that, The detection device further includes a trigger structure, which is disposed on the second connector.

12. The connector assembly according to claim 11, characterized in that, The trigger structure is rotatable.

13. The connector assembly according to any one of claims 4-7, characterized in that, The conductor module includes a conductor, the probe is disposed in the first connector, and the conductor is disposed in the second connector.

14. The connector assembly according to claim 5, characterized in that, The first condition also includes: The included angle between the first mating surface and the second mating surface is less than or equal to a first angle, where the first angle is a mating angle threshold for maintaining electrical connection between the first connector and the second connector.

15. The connector assembly according to claim 4, characterized in that, The detection device includes multiple probe modules, which are distributed on different sides of the first connector adjacent to and connected to the first mating surface. Different probe modules correspond to probes of different sizes.

16. The connector assembly according to any one of claims 1-15, characterized in that, Of the first connector and the second connector, one is a male connector and the other is a female connector.

17. An electronic device, characterized in that, The connector assembly comprises any one of claims 1-16, a first functional module, and a second functional module, wherein the connector assembly is used for electrically connecting the first functional module and the second functional module, wherein... The first connector is connected to the first functional module, and the second functional module is connected to the second connector.

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