Optical device positioning method, apparatus, device and readable storage medium

Abstract

Embodiments of the present application provide a kind of optical device positioning method, device, equipment and readable storage medium, it is related to optical fiber communication technical field, it is applied to analysis device, analysis device is used to identify device in passive optical network PON, PON includes optical time domain reflectometer OTDR and at least one passive device, OTDR is connected with each passive device, and each passive device is provided with reflector;Including: the reflection information of first reflected light signal and the reflection information of second reflected light signal are acquired;First reflected light signal and second reflected light signal correspond to first test light signal and second test light signal respectively;The wavelength of first test light signal is within the reflectable wavelength range of reflector, and the wavelength of second test light signal is outside the reflectable wavelength range of reflector;According to the reflection information of first reflected light signal and the reflection information of second reflected light signal, the position of each passive device relative to OTDR is determined;In this way, the purpose of efficiently and accurately positioning passive device can be realized.

Description

Technical Field

[0001] This application relates to the field of optical fiber communication technology, and in particular to a method, apparatus, device and readable storage medium for locating optical devices. Background Technology

[0002] With the development of fiber optic communication technology, passive optical networks (PONs) have experienced rapid development and large-scale deployment. PON is a point-to-multipoint (P2MP) system, consisting of an optical line terminal (OLT), an optical distribution network (ODN), and an optical network terminal (ONT) connected sequentially. The ODN, being a passive optical network, is entirely composed of passive components, primarily optical fibers and splitters. Understandably, quality monitoring of these passive components is crucial for troubleshooting ODN faults. To achieve quality monitoring of passive components, their location must first be determined. Currently, this is typically done manually, which is time-consuming and labor-intensive. Therefore, how to efficiently and accurately locate passive components has become an urgent problem to solve. Summary of the Invention

[0003] This application provides a method, apparatus, device, and readable storage medium for locating optical devices, which can efficiently and accurately locate the position of passive devices in a PON.

[0004] To achieve the above objectives, the embodiments of this application adopt the following technical solutions:

[0005] Firstly, a method for locating optical devices is provided. This method is applied to an analysis device used to identify devices in a Passive Optical Network (PON). The PON includes an Optical Time Domain Reflectometer (OTDR) and at least one passive device. Specifically, the OTDR is connected to each passive device, and a reflector is provided at each passive device. The OTDR transmits a first test optical signal and a second test optical signal to the PON. The wavelength of the first test optical signal is within the reflectible wavelength range of the reflector, while the wavelength of the second test optical signal is outside the reflectible wavelength range of the reflector. The reflector reflects the first and second test optical signals transmitted in the optical fiber, respectively, generating a first reflected optical signal corresponding to the first test optical signal and a second reflected optical signal corresponding to the second test optical signal. The OTDR receives the first and second reflected optical signals and generates reflection information of the first and second reflected optical signals. The analysis device acquires the reflection information of the first and second reflected optical signals and determines the position of the passive device relative to the OTDR based on the reflection information of the first and second reflected optical signals.

[0006] This application embodiment utilizes the wavelength sensitivity difference of reflectors to locate them. Specifically, the reflector strongly emits a first test light signal with a wavelength within the reflectable wavelength range and weakly reflects a second test light signal with a wavelength outside the reflectable wavelength range. Thus, the first and second reflected light signals generated at the reflector location show a significant difference. By comparing the reflection information of the first and second reflected light signals, the location of the reflector, and consequently the location of the passive device, can be determined. It is understood that in this application embodiment, the OTDR measurement process and the reflector deployment process are decoupled, allowing the passive device to have its reflector pre-deployed without removal. When locating the passive device, it is only necessary to use the OTDR to transmit multiple test light signals of different wavelengths to the ODN and perform OTDR measurements based on these multiple test light signals. This eliminates the need for manual hardware deployment, significantly shortening the passive device location process and improving efficiency. Furthermore, even if the PON network architecture changes, OTDR measurements can be performed again by retransmitting multiple test light signals of different wavelengths to quickly and accurately locate the passive device.

[0007] In an optional implementation, the reflection information includes the correspondence between the distance relative to the OTDR and the power of the reflected light signal. For example, the reflection information can be a position-power curve generated by the OTDR. By comparing the reflection information corresponding to the first reflected light signal and the reflection information corresponding to the second reflected light signal, the target position can be determined. Wherein, the difference between the power of the first reflected light signal and the power of the second reflected light signal at the target position is greater than a first preset threshold. That is, the degree of reflection of the first test light signal at this position is significantly greater than the degree of reflection of the second test light signal. Therefore, this target position can be located as the position of the reflector, that is, the position of the corresponding passive device. The distance between the passive device and the OTDR can be determined from this position.

[0008] In one optional implementation, the PON includes multiple passive devices to be located. Multiple target locations can then be determined based on the reflection information of the first and second reflected light signals. Additionally, the relative position information between the multiple passive devices can be obtained, and each passive device can be associated with each target location based on this relative position information, thus determining the position of each passive device based on the association. In this embodiment, multiple passive devices in the PON can be located in a single positioning process, thus significantly improving positioning efficiency.

[0009] In one optional implementation, by comparing the reflection information of the first reflected light signal and the reflection information of the second reflected light signal, not only can passive devices with reflectors be located, but the fault type of the passive devices can also be determined. This can improve network operation and maintenance efficiency.

[0010] In one optional implementation, after locating each passive device using the reflection information of the first and second reflected light signals, the power of the first reflected light signal corresponding to the location of the passive device is determined based on the location of the passive device and the reflection information of the first reflected light signal; and the power of the second reflected light signal corresponding to the location of the passive device is determined based on the location of the passive device and the reflection information of the second reflected light signal; then, the fault type of the passive device is determined by judging the power of the first reflected light signal and the power of the second reflected light signal corresponding to the location of the passive device. For example, if the difference between the power of the first reflected light signal and the power of the second reflected light signal at the location of the passive device is greater than a second preset threshold, then a loss fault is determined in the passive device; if the difference between the power of the first reflected light signal and the power of the second reflected light signal at the location of the passive device is less than or equal to the second preset threshold, then a fiber breakage fault is determined in the passive device.

[0011] In an optional implementation, before determining the fault type of the passive device, the fault status of the passive device can be determined based on the power of the first reflected light signal at the location of the passive device and a power reference value. Specifically, if the power of the first reflected light signal at the location of the passive device is less than the power reference value, it indicates a fault in the passive device.

[0012] Secondly, a method for locating optical devices is provided, applied to an optical time domain reflectometer (OTDR), located in a passive optical network (PON). The PON also includes at least one passive device, the OTDR is connected to the at least one passive device, and each of the at least one passive device has a reflector. The method includes: the OTDR transmitting a first test optical signal and a second test optical signal of a second wavelength to the PON, the wavelength of the first test optical signal being within the reflectible wavelength range of the reflector, and the wavelength of the second test optical signal being outside the reflectible wavelength range of the reflector; then, the OTDR receiving a first reflected optical signal corresponding to the first test optical signal and a second reflected optical signal corresponding to the second test optical signal, generating reflection information of the first reflected optical signal and reflection information of the second reflected optical signal; wherein, the first reflected optical signal is formed by the reflection of the first test optical signal by the reflector of each passive device, and the second reflected optical signal is formed by the reflection of the second test optical signal by the reflector of each passive device. The reflection information of the first and second reflected optical signals is used to determine the position of the passive device relative to the OTDR.

[0013] This application embodiment utilizes the wavelength sensitivity difference of reflectors to locate them. Specifically, the OTDR emits a first test optical signal and a second test optical signal with different wavelengths. The position of the reflector is determined based on the difference between the first reflected optical signal corresponding to the first test optical signal and the second reflected optical signal corresponding to the second test optical signal. It is understood that in this application embodiment, the OTDR measurement process and the reflector deployment process are decoupled, allowing passive devices to have their reflectors pre-deployed without removal. When locating passive devices, it is only necessary to use the OTDR to emit multiple test optical signals of different wavelengths to the ODN and perform OTDR measurements based on these multiple test optical signals. Thus, the entire positioning process does not require manual hardware deployment, significantly shortening the positioning process for passive devices and improving positioning efficiency. Furthermore, even if the PON network architecture changes, it is only necessary to resend multiple test optical signals of different wavelengths to re-perform OTDR measurements, enabling rapid and accurate positioning of passive devices.

[0014] In an optional implementation, the reflection information includes a position-power curve, which indicates the correspondence between the distance relative to the OTDR and the power of the reflected light signal. The OTDR can display a first position-power curve corresponding to the first reflected light signal and a second position-power curve corresponding to the second reflected light signal in the same coordinate system, which can more intuitively determine the difference between the first and second reflected light signals.

[0015] Thirdly, an analysis apparatus is provided for identifying the location of devices in a passive optical network (PON); the PON includes an optical time domain reflectometer (OTDR) and at least one passive device, the OTDR being connected to the at least one passive device, and each of the at least one passive device having a reflector disposed thereon; the analysis apparatus includes:

[0016] The transceiver unit is used to: acquire reflection information of a first reflected light signal and a second reflected light signal. The first reflected light signal is formed by the reflection of a first test light signal by the reflector of each passive device. The second reflected light signal is formed by the reflection of a second test light signal by the reflector of each passive device. The first and second test light signals are transmitted from the OTDR to the PON. The wavelength of the first test light signal is within the reflectable wavelength range of the reflector, and the wavelength of the second test light signal is outside the reflectable wavelength range of the reflector. The processing unit is used to: determine the position of at least one passive device relative to the OTDR based on the reflection information of the first and second reflected light signals.

[0017] In one optional implementation, the reflection information includes the correspondence between the distance relative to the OTDR and the power of the reflected light signal; the processing unit is specifically configured to: determine at least one target position based on the first reflection information corresponding to the first reflected light signal and the second reflection information corresponding to the second reflected light signal, wherein the difference between the power of the first reflected light signal corresponding to the target position and the power of the second reflected light signal corresponding to the target position is greater than a first preset threshold; and determine the position of at least one passive device relative to the OTDR based on the at least one target position.

[0018] In an optional implementation, the PON includes multiple passive devices; the transceiver unit is further configured to: acquire relative position information of the multiple passive devices; the processing unit is specifically configured to: determine the correspondence between each passive device and each target position based on the relative position information; and determine each target position as the position of the corresponding passive device relative to the OTDR based on the correspondence.

[0019] In an optional implementation, the processing unit is further configured to: determine the fault type of at least one passive device based on the reflection information of the first reflected light signal and the reflection information of the second reflected light signal.

[0020] In one optional implementation, the reflection information includes the correspondence between the distance relative to the OTDR and the power of the reflected optical signal; the processing unit is specifically configured to: acquire at least one target location, wherein the difference between the power of the first reflected optical signal corresponding to the target location and the power of the second reflected optical signal corresponding to the target location is greater than a first preset threshold; if the difference between the power of the first reflected optical signal corresponding to the target location and the power of the second reflected optical signal corresponding to the target location is greater than a second preset threshold, then it is determined that the corresponding passive device has a loss fault; if the difference between the power of the first reflected optical signal corresponding to the target location and the power of the second reflected optical signal corresponding to the target location is less than or equal to the second preset threshold, then it is determined that the corresponding passive device has a fiber breakage fault.

[0021] In an optional implementation, the processing unit is further configured to: determine a corresponding passive device fault when the power of the first reflected light signal corresponding to the target location is less than a power reference value.

[0022] Fourthly, an optical time domain reflectometer (OTDR) is provided. The OTDR is located in a passive optical network (PON), which also includes at least one passive device. The OTDR is connected to the at least one passive device, and each of the at least one passive device has a reflector disposed thereon. The OTDR includes:

[0023] The transmitting unit is used to transmit a test optical signal to the PON, the test optical signal including a first test optical signal and a second test optical signal with a second wavelength, the wavelength of the first test optical signal being within the reflectable wavelength range of the reflector, and the wavelength of the second test optical signal being outside the reflectable wavelength range of the reflector; the receiving unit is used to receive the first reflected optical signal corresponding to the first test optical signal and the second reflected optical signal corresponding to the second test optical signal; the processing unit is used to generate reflection information of the first reflected optical signal and the second reflected optical signal, the first reflected optical signal being formed by the reflection of the first test optical signal by the reflector of each passive device, and the second reflected optical signal being formed by the reflection of the second test optical signal by the reflector of each passive device, the reflection information of the first reflected optical signal and the second reflected optical signal being used to determine the position of at least one passive device relative to the OTDR.

[0024] In an optional implementation, the reflection information includes a position-power curve, which indicates the correspondence between the distance relative to the OTDR and the power of the reflected light signal; the processing unit is further configured to: display a first position-power curve corresponding to the first reflected light signal and a second position-power curve corresponding to the second reflected light signal in the same coordinate system.

[0025] Fifthly, an analysis apparatus is provided, comprising: a processor and a memory storing instructions that, when executed by the processor, cause the apparatus to perform the optical device positioning method provided by the first aspect or any possible implementation thereof.

[0026] In a sixth aspect, an optical time domain reflectometer (OTDR) is provided, the OTDR including a processor and a memory storing instructions that, when executed by the processor, cause the OTDR to perform an optical device positioning method as provided in the second aspect or any possible implementation thereof.

[0027] In a seventh aspect, a chip is provided, the chip including a processor and an interface circuit, the processor and the interface circuit being used to support the chip in performing the optical device positioning method provided by the first aspect or any possible implementation thereof.

[0028] Eighthly, a chip is provided, the chip including a processor and an interface circuit, the processor and the interface circuit being used to support the chip in performing the optical device positioning method provided by the second aspect or any possible implementation thereof.

[0029] A ninth aspect provides a computer-readable storage medium storing a computer program or instructions that, when executed, implement the optical device positioning method provided by the first aspect or any possible implementation thereof.

[0030] In a tenth aspect, a computer-readable storage medium is provided, wherein a computer program or instructions are stored therein, which, when executed, implement the optical device positioning method provided in the second aspect or any possible implementation thereof.

[0031] Eleventhly, a computer program product is provided, comprising: a computer program (or code, or instructions) that, when executed, causes a computer to perform the optical device positioning method provided by the first aspect or any possible implementation thereof.

[0032] In a twelfth aspect, a computer program product is provided, comprising: a computer program (or code, or instructions) that, when executed, causes a computer to perform the optical device positioning method provided by the second aspect or any possible implementation thereof.

[0033] In a thirteenth aspect, an optical device positioning system is provided, comprising an analysis device and a passive optical network (PON). The PON includes an optical time domain reflectometer (OTDR) and at least one passive device. The OTDR is connected to the at least one passive device, and each of the at least one passive device has a reflector disposed thereon. The analysis device performs the optical device positioning method provided by the first aspect or any possible implementation thereof, and the OTDR performs the optical device positioning method provided by the second aspect or any possible implementation thereof.

[0034] Understandably, the beneficial effects achieved by any of the devices, chips, computer-readable storage media, computer program products, and systems provided above can be referred to in the context of the optical device positioning method provided above, and will not be repeated here. Attached Figure Description

[0035] Figure 1 A network architecture diagram of PON provided in this application embodiment;

[0036] Figure 2 A schematic diagram of an OTDR measurement process provided in an embodiment of this application;

[0037] Figure 3 A schematic diagram of a position-power curve provided for an embodiment of this application;

[0038] Figure 4 Another PON network architecture diagram provided in this application embodiment;

[0039] Figure 5 Another PON network architecture diagram provided in this application embodiment;

[0040] Figure 6 A schematic flowchart illustrating an optical device positioning method provided in an embodiment of this application;

[0041] Figure 7 A schematic diagram of a first position-power curve and a second position-power curve provided for embodiments of this application;

[0042] Figure 8 A flowchart illustrating another optical device positioning method provided in an embodiment of this application;

[0043] Figure 9A A schematic diagram illustrating the relative positions of multiple beam splitters provided in an embodiment of this application;

[0044] Figure 9B A schematic diagram of another first position-power curve and a second position-power curve provided for embodiments of this application;

[0045] Figure 10 A flowchart illustrating a method for fault location of passive devices based on reflection information of a first reflected light signal and a second reflected light signal, provided in an embodiment of this application;

[0046] Figure 11 A schematic diagram of the first position-power curve and the second position-power curve under different fault types provided in the embodiments of this application;

[0047] Figure 12 This is a schematic diagram of the structure of an analysis device provided in an embodiment of this application;

[0048] Figure 13 This is a schematic diagram of another analytical device provided in an embodiment of this application;

[0049] Figure 14 This is a schematic diagram of the structure of an OTDR provided in an embodiment of this application;

[0050] Figure 15 This is a schematic diagram of another OTDR structure provided in an embodiment of this application. Detailed Implementation

[0051] The technical solutions in the embodiments of this application will be described below with reference to the accompanying drawings. In this application, "at least one" means one or more, and "more than one" means two or more. "And / or" describes the relationship between related objects, indicating that there are three relationships. For example, A and / or B means: A exists alone, A and B exist simultaneously, or B exists alone, where A and B can be singular or plural. The character " / " generally indicates that the related objects before and after are in an "or" relationship. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one of a, b, or c means: a, b, c, a and b, a and c, b and c, a, b, and c; where a, b, and c can be single or multiple.

[0052] The embodiments of this application use terms such as "first" and "second" to distinguish objects with similar names, functions, or roles. Those skilled in the art will understand that the terms "first" and "second" do not limit the quantity or order of execution. In this application, words such as "exemplarily" or "for example" are used to indicate that something is being described as an example, illustration, or illustration. Any embodiment or design described as "exemplarily" or "for example" in this application should not be construed as being more preferred or advantageous than other embodiments or design solutions. Specifically, the use of words such as "exemplarily" or "for example" is intended to present the relevant concepts in a concrete manner.

[0053] PON, as a pure media network, uses optical fiber as the transmission medium and adopts a point-to-multipoint topology for signal transmission and distribution. PON can achieve the goal of a large number of users accessing the backbone network at a relatively low cost, and is therefore widely used in fiber-to-the-home (FTTH) and fiber-to-the-building (FTTB) scenarios.

[0054] Figure 1 This is a network architecture diagram of a PON provided for an embodiment of this application. Figure 1 As shown, PON, as a point-to-multipoint fiber optic access network, consists of an optical line terminal (OLT), an optical distribution network (ODN), and an optical network terminal (ONT).

[0055] The OLT is located at the central office and is used to connect to upper-layer networks; for example, the OLT connects to the backbone network. Additionally, the OLT is used to perform conversion between optical and electrical signals.

[0056] The Optical Node (ODN) is located between the Optical Line Terminal (OLT) and the Optical Network Terminal (ONT), used to connect the ONT to the OLT. The ODN mainly consists of passive components such as optical fibers, optical splitters, optical connectors, and optical attenuators, and does not contain any active electronic components. The optical fiber serves as the transmission medium for optical signals, enabling long-distance, low-loss transmission. The optical splitter distributes the optical signal from the OLT evenly or proportionally across multiple branch fibers to achieve point-to-multipoint optical signal transmission. The optical connector connects different fiber segments or links optical fibers to other optical devices, achieving efficient transmission and stable connections. The optical attenuator adjusts the optical signal strength.

[0057] Located at the user end, the ONT provides various service interfaces for users, such as Ethernet and telephone interfaces. Additionally, the ONT performs photoelectric conversion. For example, the ONT converts optical signals transmitted by the OLT into electrical signals for use by the user terminal; or, the ONT converts electrical signals from the user terminal into optical signals, which are then transmitted to the OLT via the ODN.

[0058] PON signal transmission includes uplink signal transmission and downlink signal transmission. In one example:

[0059] Uplink direction: The user terminal sends an electrical signal to the ONT, the ONT converts the electrical signal into an optical signal, and then transmits the optical signal to the OLT through the ODN. Finally, the OLT transmits the optical signal to the backbone network.

[0060] Downlink: The OLT aggregates signals from multiple users on the backbone network and then transmits the aggregated signals to the ODN; then, the optical splitter in the ODN distributes the aggregated optical signals to the corresponding ONTs; finally, the ONT converts the optical signals into electrical signals and sends them to the corresponding user terminals.

[0061] A key feature of PON is the elimination of outdoor active equipment; all signal processing is completed at the central office (e.g., CO equipment room) and in the user's home. Due to its low cost, lack of a separate equipment room, and ease of maintenance, PON is widely used for residential user access services. ODN, on the other hand, uses a point-to-multipoint connection to transmit optical signals from the OLT to the ONT, characterized by wide coverage, massive amounts of data in branch optical paths, and complex scenarios. Furthermore, the fact that ODN consists entirely of passive devices (without power supply) makes fault location difficult. Understandably, quality monitoring of the passive devices in the ODN is crucial for locating faults, and this requires accurately locating and labeling these passive devices.

[0062] In one implementation, an optical time domain reflectometer (OTDR) and an optical fiber reflector can be used to locate passive devices in the ODN. These two devices will be described in detail below:

[0063] (I) Optical Time Domain Reflectometer:

[0064] An OTDR (Optical Time-of-Reflection Detector) is an optical fiber testing instrument based on the Rayleigh scattering and Fresnel reflection phenomena of light. It measures the reflected and scattered light signals by emitting light pulses into the optical fiber. In this way, relevant information about the optical fiber can be obtained by analyzing the reflected and scattered light signals.

[0065] Rayleigh scattering is the cause of scattered light signals. When a light pulse propagates axially in an optical fiber, it scatters in all directions due to the inhomogeneity of the fiber material; some of this scattered light propagates backward along the fiber, forming backscattered light. Fresnel reflection is the cause of reflected light signals. When a light pulse propagates axially in an optical fiber, if it encounters a reflection point with a refractive index different from that of the fiber, that reflection point will generate a strong reflected light signal; the intensity of the reflected light signal is related to the properties of the reflection point and its reflection coefficient.

[0066] The scattered light signal is continuously generated throughout the entire optical pulse's transmission in the optical fiber. The longer the propagation distance of the optical pulse in the fiber, the lower the power of the scattered light signal. Furthermore, the intensity of the scattered light signal is relatively weak, typically several orders of magnitude lower than the power of the incident light (i.e., the propagating optical pulse). In contrast, the intensity of the reflected light signal is relatively strong. Especially under ideal reflection conditions, the power of the reflected light signal generated at the reflection point can reach a certain proportion of the incident light power. For example, when the fiber end face is vertically flat and the refractive index is well matched, the power of Fresnel reflected light can reach about 4% of the incident light power, which is much stronger than the scattered light signal.

[0067] This application embodiment mainly locates passive optical devices within the ODN by analyzing reflected light signals. The measurement process of OTDR based on reflected light signals is described below. Figure 2 This is a schematic diagram illustrating an OTDR measurement process provided in an embodiment of this application. Figure 2 As shown, the measurement process includes the following steps:

[0068] S1. Emit an optical pulse into the optical fiber under test.

[0069] The laser source inside the OTDR generates high-intensity optical pulses, which are then injected into the fiber under test via an optical coupler. These optical pulses can have specific wavelengths, widths, and power to accommodate different fiber types and measurement requirements.

[0070] S2. Measure the reflected light signal corresponding to the light pulse.

[0071] When an optical pulse propagates in the optical fiber under test, a reflected light signal is generated at the reflection point. When receiving the optical signal, an OTDR can distinguish and measure the reflected light signal using methods such as waveform analysis, spectrum analysis, and light intensity analysis. The reflected light signal received by the OTDR appears as a sharp pulse in time, and the OTDR can accurately calculate the location of the reflection point based on the timing of this sharp pulse.

[0072] S3. Determine the information of the reflected light signal.

[0073] The information of the reflected light signal includes the location information of the reflection point in the optical fiber that generates the reflected light signal, as well as the power information of the reflected light signal.

[0074] Understandably, the speed of light in an optical fiber is known. Based on the delay between the emission time of the light pulse and the reception time of the reflected light signal, the position information of the reflection point corresponding to the reflected light signal can be determined. This position information indicates the distance of the reflection point relative to the OTDR.

[0075] In one example, taking point A in the fiber under test as an example, assuming that the OTDR emits an optical pulse at time a1, and the reflected optical signal generated at point A arrives at the OTDR at time a2, then the position of point A relative to the OTDR can be determined by the following formula 1:

[0076] L A =v(a2-a1) / 2……………Formula 1

[0077] Among them, L A The position of point A relative to the OTDR is indicated by v, which indicates the speed of light in the optical fiber (typically 2 × 10⁻⁶). 8 The speed is approximately m / s, but the specific speed depends on the refractive index of the optical fiber.

[0078] An OTDR can measure the power of the received optical signal in real time to obtain the correspondence between the power of the optical signal and time, and thus obtain the correspondence between the power of the optical signal and its position (i.e., the distance relative to the OTDR).

[0079] In one example, the OTDR determines the position-power curve based on the power of the optical signal measured in real time. Figure 3 This is a schematic diagram of a position-power curve provided in an embodiment of this application. Figure 3 As shown, the horizontal axis indicates the distance relative to the OTDR, and the vertical axis indicates the power of the optical signal at each distance. Specifically, the position corresponding to the reflection peak (i.e., the highest point of the sharp pulse) on the position-power curve is the distance of the corresponding reflection point relative to the OTDR, and the height of the reflection peak represents the power of the reflected optical signal generated at that point.

[0080] (II) Fiber Optic Reflector:

[0081] A fiber optic reflector (hereinafter referred to as a reflector) is an optical device used to reflect optical signals. When an optical signal propagates through an optical fiber to the location of the reflector, the reflector's special structure or material causes a portion of the light to be reflected back at a specific angle and direction. Light with wavelengths within the reflectible wavelength range of the fiber optic reflector is strongly reflected; light of other wavelengths can pass through the reflector and continue propagating in the optical fiber.

[0082] Fiber optic reflectors include fiber end-face reflectors, fiber optic grating reflectors, and mirror-type fiber optic reflectors. This application does not limit the structural type of the fiber optic reflector. Among them, a fiber optic grating reflector is also known as a fiber optic grating termination filter. A fiber optic grating is a periodic refractive index modulation structure formed inside an optical fiber. When light meeting specific wavelength conditions is incident on the fiber grating, it is reflected back, while light of other wavelengths continues to propagate through the grating. Fiber optic grating reflectors have characteristics such as high reflectivity and good wavelength selectivity, allowing for precise control of the wavelength and bandwidth of the reflected light.

[0083] The following example illustrates the process of locating passive devices in an ODN using an optical time-domain reflectometer and fiber optic reflector:

[0084] Figure 4 This is another PON network architecture diagram provided for an embodiment of this application. (See diagram below.) Figure 4 As shown, the PON includes an OLT and OTDR, an ODN, and an ONT located in the CO equipment room; the ODN includes a primary optical splitter and a secondary optical splitter. The OLT and OTDR are connected to one end of the primary optical splitter via optical fiber, the other end of the primary optical splitter is connected to one end of at least one secondary optical splitter via optical fiber, and the other end of the secondary optical splitter is connected to at least one ONT via optical fiber.

[0085] Taking the positioning of a secondary beam splitter as an example, firstly, without setting up a reflector, the OTDR performs the first measurement; specifically, the OTDR emits light pulses towards the ODN to obtain, for example, Figure 4 The first position-power curve is shown in Figure A. Then, a reflector is set at the second-stage beam splitter, and the OTDR performs a second measurement; specifically, the OTDR again emits a light pulse towards the ODN to obtain the following... Figure 4 The second position-power curve is shown in Figure B. By comparing the first and second position-power curves, the newly added reflection peak in the second position-power curve can be obtained. This reflection peak is understandably generated because the newly installed reflector produces a reflected light signal. Therefore, the position corresponding to this reflection peak is the position of the reflector relative to the OTDR, and the height of the reflection peak represents the power of the reflected light signal produced by the reflector. Thus, based on the position corresponding to the reflection peak, the distance of the reflector relative to the OTDR can be determined, which also determines the distance of the secondary beam splitter relative to the OTDR.

[0086] Therefore, the positioning of passive optical devices depends on the placement of reflectors. When positioning passive optical devices in an ODN, a strict cyclical process of "OTDR measurement → reflector deployment → OTDR secondary measurement" must be followed. The OTDR measurement process and the reflector deployment process cannot be decoupled, and reflector deployment often requires manual intervention. This makes the entire positioning process very lengthy and inefficient. Furthermore, the PON network architecture must remain unchanged before and after reflector deployment; otherwise, incorrect positioning of passive devices will occur. Moreover, if the PON network architecture changes, repositioning the reflector is necessary for repositioning. Therefore, how to efficiently and accurately locate passive optical devices has become a pressing problem to solve.

[0087] This application provides a method for locating optical devices, which decouples the OTDR measurement process from the reflector deployment process. In this embodiment, reflectors are pre-positioned at the locations of the passive devices to be located. When locating the passive devices, the OTDR transmits multiple test light signals of different wavelengths to the ODN, and then the positions of each reflector are determined based on the multiple reflected light signals corresponding to the multiple test light signals. This application can shorten the location process for passive devices, improve location efficiency, and also quickly and accurately locate passive devices even when the PON network architecture changes.

[0088] The technical solutions provided in this application can be applied to various network architectures. The network architecture of this application embodiment will be described below. Figure 5 This is another PON network architecture diagram provided for an embodiment of this application. (See diagram below.) Figure 5 As shown, the PON includes an OLT and OTDR, an ODN, and an ONT located in the CO equipment room. The OLT and OTDR are connected to the ONT via the ODN; additionally, the OTDR communicates with the analysis device.

[0089] ODN includes passive devices. Figure 5 Taking the illustrated structure as an example, the ODN includes a primary optical splitter and a secondary optical splitter. The OLT and OTDR are connected to one end of the primary optical splitter via optical fiber. The other end of the primary optical splitter is connected to one end of at least one secondary optical splitter via optical fiber. The other end of the secondary optical splitter is connected to at least one ONT via optical fiber. It is understood that the specific structure of the ODN is not limited in this application embodiment; for example, the secondary optical splitter can also be connected to a tertiary optical splitter, etc.

[0090] In the ODN, reflectors can be placed at any passive device location where positioning is required, for example, in Figure 5 In the structure shown, reflectors are provided at both the first-stage and second-stage beam splitters. In the embodiments of this application, the reflectors provided at each location are only sensitive to light signals of certain wavelengths, while being insensitive to light signals of other wavelengths; that is, the reflectors correspond to a range of reflectable wavelengths, and the reflectors strongly reflect light signals with wavelengths within the range of reflectable wavelengths, while not reflecting light signals with wavelengths outside the range of reflectable wavelengths or reflecting only a very small proportion of them.

[0091] OTDRs are used for multi-wavelength OTDR testing. Specifically, an OTDR can send multiple test optical signals of different wavelengths and perform OTDR testing on each test optical signal to generate multiple position-power curves. An OTDR can display multiple position-power curves in the same coordinate system, which facilitates the analysis of difference events between multiple position-power curves, thereby allowing the location of each reflector to be determined based on these difference events.

[0092] For example, the analysis device corresponds to cloud-based software. The main functions of the cloud-based software include: OTDR data acquisition and parsing, event recognition, multi-wavelength comparison algorithm, reflector marking, etc. Among them, OTDR data acquisition and parsing is used to obtain the above-mentioned multiple position-power curves from the OTDR; event recognition is used to convert the multiple position-power curves into events; the multi-wavelength comparison algorithm is used to analyze the reflector events in the events; reflector marking is used to locate the reflector position according to the reflector events, and to mark the passive device based on the reflector position and the identifier of the corresponding passive device.

[0093] Based on the above network architecture Figure 6 This is a flowchart illustrating a method for positioning an optical device according to an embodiment of this application. Figure 6 As shown, the optical device positioning method includes the following steps:

[0094] S601 and OTDR transmit test optical signals to PON.

[0095] PON includes passive devices used to transmit optical signals. OTDR is connected to the passive devices via optical fiber. The passive devices are equipped with reflectors.

[0096] An OTDR is used for multi-wavelength OTDR testing. The OTDR transmits test optical signals to a passive device via optical fiber. These test optical signals include a first test optical signal and a second test optical signal. For example, the wavelength of the first test optical signal is λ1, and the wavelength of the second test optical signal is λ2. λ1 is within the reflective wavelength range of the reflector, while λ2 is outside the reflective wavelength range of the reflector.

[0097] S602, OTDR receives the first reflected light signal and the second reflected light signal.

[0098] When the first test optical signal is transmitted to the reflector position through the optical fiber, the reflector strongly reflects the first test optical signal because the reflector is sensitive to the wavelength of the first test optical signal, thus generating a first reflected optical signal. When the second test optical signal is transmitted to the reflector position through the optical fiber, the reflector weakly reflects the second test optical signal because the reflector is not sensitive to the wavelength of the second test optical signal, thus generating a second reflected optical signal.

[0099] The OTDR receives the first reflected light signal and the second reflected light signal respectively, and tests the first reflected light signal and the second reflected light signal.

[0100] S603, OTDR generates reflection information of the first reflected light signal and reflection information of the second reflected light signal.

[0101] The reflection information includes the correspondence between the distance relative to the OTDR and the power of the reflected light signal. For example, the OTDR generates a first position-power curve corresponding to the first reflected light signal and a second position-power curve corresponding to the second reflected light signal.

[0102] Understandably, the process of obtaining the position-power curve using OTDR testing can be referenced above. Figure 2 The details of the OTDR test process shown are not elaborated here.

[0103] For example, an OTDR can display a first position-power curve and a second position-power curve in the same coordinate system to obtain the difference event between the first position-power curve and the second position-power curve.

[0104] S604. The analysis device acquires the reflection information of the first reflected light signal and the reflection information of the second reflected light signal.

[0105] For example, the analysis device acquires a first position-power curve and a second position-power curve generated by an OTDR, and determines the reflection peak in the first position-power curve by comparing the first position-power curve and the second position-power curve.

[0106] S605. The analysis device determines the position of at least one passive device relative to the OTDR based on the reflection information of the first reflected light signal and the reflection information of the second reflected light signal.

[0107] Understandably, when the first and second test optical signals are transmitted in the PON, there is no wavelength sensitivity difference at other locations. Therefore, the power of the reflected optical signals at other locations is basically the same. However, at the reflector location, the reflector strongly reflects the first test optical signal but weakly reflects the second test optical signal. Therefore, at the reflector location, the power of the reflected optical signal corresponding to the first test optical signal is much greater than that corresponding to the second test optical signal. This is reflected in the first position-power curve and the second position-power curve. The first position-power curve and the second position-power curve highly overlap at other locations. Only at the reflector location does the first position-power curve corresponding to the sensitive wavelength λ1 show a reflection peak, while the position-power curve corresponding to the non-sensitive wavelength λ2 basically does not have a reflection peak.

[0108] Based on the above characteristics, after the analysis device obtains the first position-power curve and the second position-power curve, it compares the first position-power curve and the second position-power curve to determine the reflection peak in the first position-power curve. It can be understood that the position corresponding to the reflection peak is the distance of the reflector relative to the OTDR, that is, the distance of the passive device with the reflector relative to the OTDR.

[0109] In one example Figure 7 This is a schematic diagram of a first position-power curve and a second position-power curve provided for embodiments of this application. Figure 7 As shown, the first position-power curve corresponds to the first test optical signal, and the second position-power curve corresponds to the second test optical signal. It can be understood that if the difference between the power of the first test optical signal (corresponding to the horizontal axis X) and the power of the second test optical signal (corresponding to the horizontal axis X) is greater than a first preset threshold, then a reflection peak appears at the horizontal axis X. Therefore, the position corresponding to this reflection peak is the position of the reflector. Thus, the distance X between the reflector and the OTDR can be determined, and consequently, the distance X between the passive device with the reflector and the OTDR can also be determined.

[0110] For example, once the distance between the passive device and the OTDR is obtained, the passive device can be marked based on the distance and the marking of the passive device to establish a correspondence between the passive device and the position (distance relative to the OTDR).

[0111] This application embodiment utilizes the wavelength sensitivity difference of reflectors to locate them. Specifically, the reflector strongly emits a first test light signal with a wavelength within the reflectable wavelength range and weakly reflects a second test light signal with a wavelength outside the reflectable wavelength range. Thus, the power of the first reflected light signal corresponding to the first test light signal at the reflector location will be much greater than the power of the second reflected light signal corresponding to the second test light signal. By comparing the first position-power curve and the second position-power curve generated by the OTDR, the reflection peak in the first position-power curve can be determined, and the position of the reflector can be determined using the position corresponding to the reflection peak.

[0112] Understandably, in this embodiment, the OTDR measurement process and the reflector deployment process are decoupled, allowing passive devices to have their reflectors pre-deployed without removal. When locating a passive device, it is only necessary to transmit multiple test optical signals of different wavelengths to the ODN using the OTDR, and then perform OTDR measurements based on these signals. This eliminates the need for manual hardware deployment, significantly shortening the location process and improving efficiency. Furthermore, even if the PON network architecture changes, simply retransmitting multiple test optical signals of different wavelengths and performing OTDR measurements again allows for quick and accurate location of the passive device.

[0113] Understandably, a PON includes multiple passive devices. For example, a reflector can be deployed at each passive device, and then the positions of all passive devices can be located at once.

[0114] Figure 8This is a flowchart illustrating another optical device positioning method provided in an embodiment of this application. Figure 8 As shown, the optical device positioning method includes the following steps:

[0115] S801, The analysis device acquires the relative position information of multiple passive devices.

[0116] Before locating passive devices, reflectors can be pre-deployed for each device. During the deployment of reflectors, the relative positions of multiple passive devices can be determined.

[0117] For example, such as Figure 9A As shown, the primary optical splitter is closer to the OTDR than the secondary optical splitter; multiple fibers from the same primary optical splitter are within the same optical cable, and at each secondary optical splitter, one fiber connects to the secondary splitter, while the others extend backward; thus, the order of the multiple secondary optical splitters can be determined during the PON wiring stage. For example, in... Figure 9A In this configuration, the sequence of multiple beam splitters is: primary beam splitter — secondary beam splitter 1 — secondary beam splitter 2 — secondary beam splitter 3 — ...

[0118] S802 and OTDR transmit test optical signals to PON.

[0119] Understandably, S802 and Figure 6 S601 in the illustrated embodiment is similar and will not be described in detail here.

[0120] S803 and OTDR receive the first reflected light signal and the second reflected light signal.

[0121] Understandably, S803 and Figure 6 S602 in the illustrated embodiment is similar and will not be described in detail here.

[0122] S804 and OTDR generate reflection information of the first reflected light signal and reflection information of the second reflected light signal.

[0123] Understandably, S804 and Figure 6 S603 in the illustrated embodiment is similar and will not be described in detail here.

[0124] S805, The analysis device acquires the reflection information of the first reflected light signal and the reflection information of the second reflected light signal.

[0125] Understandably, S805 and Figure 6 S604 in the illustrated embodiment is similar and will not be described in detail here.

[0126] S806. The analysis device determines multiple target positions based on the reflection information of the first reflected light signal and the reflection information of the second reflected light signal.

[0127] Understandably, because multiple passive devices in a PON are equipped with reflectors, there are multiple target locations with wavelength-sensitive differences. These multiple target locations correspond to the locations of multiple reflectors. At each location, the power of the reflected light signal corresponding to the first test light signal is significantly greater than that corresponding to the second test light signal. This is reflected in the position-power curve, where the first position-power curve has multiple reflection peaks compared to the second position-power curve.

[0128] Based on the above characteristics, after the analysis device obtains the first position-power curve and the second position-power curve, it compares the first position-power curve and the second position-power curve to determine multiple reflection peaks in the first position-power curve. The positions corresponding to the multiple reflection peaks are the multiple target positions.

[0129] S807. The analysis device determines the correspondence between each passive device and each target position based on the relative position information.

[0130] By using the distance between each target location and the OTDR among multiple target locations, each target location can be mapped to each passive device.

[0131] S808 The analysis device determines each target position as the position of the corresponding passive device relative to the OTDR according to the correspondence.

[0132] In one example, Figure 9B This is a schematic diagram of another first position-power curve and a second position-power curve provided for embodiments of this application. (See attached diagram.) Figure 9B As shown, the first position-power curve corresponds to the first test optical signal, and the second position-power curve corresponds to the second test optical signal. The first position-power curve has multiple reflection peaks compared to the second position-power curve; for example, the horizontal axis corresponding to reflection peak 1 is X1, the horizontal axis corresponding to reflection peak 2 is X2, the horizontal axis corresponding to reflection peak 3 is X3, the horizontal axis corresponding to reflection peak 4 is X4, and so on. It can be understood that the horizontal axis represents the distance to the OTDR; Figure 8 Taking the relative positions of the splitters in the PON as an example, reflection peak 1 corresponds to the first-stage splitter, reflection peak 2 corresponds to the second-stage splitter 1, reflection peak 3 corresponds to the second-stage splitter 2, reflection peak 4 corresponds to the second-stage splitter 3, and so on. That is, the distance between the first-stage splitter and the OTDR is X1, the distance between the second-stage splitter 1 and the OTDR is X2, the distance between the second-stage splitter 2 and the OTDR is X3, and the distance between the second-stage splitter 3 and the OTDR is X4.

[0133] In this embodiment of the application, multiple passive devices in a PON can be located in a single positioning process, which greatly improves the positioning efficiency.

[0134] Based on the above description, the reflection information of the first reflected light signal and the reflection information of the second reflected light signal can not only locate the position of the passive device relative to the OTDR, but also determine whether the located passive device is faulty and the type of fault.

[0135] Figure 10 This application provides a flowchart illustrating a method for fault location of passive devices based on reflection information of a first reflected light signal and a second reflected light signal, which includes the following steps:

[0136] S1001. The analysis device determines the position of the passive device based on the reflection information of the first reflected light signal and the reflection information of the second reflected light signal.

[0137] The process of locating passive components using the analytical device can be referenced. Figures 6 to 8 The relevant steps in the illustrated embodiments will not be described in detail here.

[0138] S1002. The analysis device determines whether the passive device has malfunctioned based on the position of the passive device and the reflection information of the first reflected light signal. If yes, proceed to step S1003; otherwise, end the process.

[0139] Understandably, a malfunction in the optical path in front of the reflector will weaken the intensity of the reflected light signal generated by the transmitter. Therefore, the analysis device can compare the power of the first reflected light signal corresponding to the location of the passive device with a power reference value. If the power of the first reflected light signal corresponding to the location of the passive device is less than the power reference value, then the passive device is determined to be faulty.

[0140] The power reference value can be obtained through multiple measurements or preset in advance according to the properties of the reflector; this application does not limit this.

[0141] S1003. The analysis device determines whether the difference between the power of the first reflected light signal and the power of the second reflected light signal at the location of the passive device is greater than a second preset threshold; if yes, then step S1004 is executed; if no, then step S1005 is executed.

[0142] When a passive component malfunctions, the type of fault can be determined by comparing the power of the first reflected light signal and the power of the second reflected light signal at the location of the passive component. Understandably, when a passive component experiences a loss fault, the power of the first reflected light signal, while reduced, will still be stronger than the second reflected light signal. Conversely, when a passive component experiences a fiber breakage fault, the power of the first and second reflected light signals will be almost identical. Therefore, the fault type can be determined based on the difference between the power of the first and second reflected light signals at the location of the passive component.

[0143] S1004. The analysis device determines that the passive component has a wear and tear fault.

[0144] For example, if the difference between the power of the first reflected light signal and the power of the second reflected light signal at the location of the passive device is greater than a second preset threshold, then it is determined that the passive device has a loss fault.

[0145] In one example, such as Figure 11 As shown, when the passive device is not faulty, the first position-power curve and the second position-power curve obtained by the OTDR measuring the first reflected light signal and the second reflected light signal are as follows: Figure 11 As shown in A, the first position-power curve generates a reflection peak, and the position corresponding to the reflection peak is the position of the reflector. At this position, the difference between the power of the first reflected light signal and the power of the second reflected light signal is greater than a first preset threshold, and the power of the first reflected light signal is greater than or equal to the power reference value.

[0146] When a passive component experiences a loss failure, the first position-power curve and the second position-power curve obtained by the OTDR measuring the first and second reflected light signals are as follows: Figure 11 As shown in B, the first position-power curve produces a reflection peak, but the height of the reflection peak is low and less than the power reference value; and at the position of the reflector, the difference between the power of the first reflected light signal and the power of the second reflected light signal becomes smaller, but the difference between the power of the first reflected light signal and the power of the second reflected light signal is still greater than the second preset threshold.

[0147] S1005. The analysis device determined that the passive device had a fiber breakage fault.

[0148] For example, if the difference between the power of the first reflected light signal and the power of the second reflected light signal at the location of the passive device is less than or equal to a second preset threshold, then it is determined that the passive device has a fiber breakage fault.

[0149] In one example, such as Figure 11As shown in C, the first position-power curve and the second position-power curve are almost identical, which indicates that the passive device has a fiber breakage fault.

[0150] In this embodiment, by comparing the reflection information of the first reflected light signal and the reflection information of the second reflected light signal, not only can passive devices with reflectors be located, but also the fault type of the passive devices can be determined. This improves network operation and maintenance efficiency.

[0151] This application embodiment can divide the analysis device and OTDR into functional modules according to the above method example. For example, each function can be divided into its own functional modules, or two or more functions can be integrated into one module. The integrated module can be implemented in hardware or as a software functional module. It should be noted that the module division in this application embodiment is illustrative and only represents one logical functional division. In actual implementation, there may be other division methods. The following description uses the division of functional modules according to each function as an example.

[0152] When using integrated units, Figure 12 A schematic diagram of an analysis device according to the above embodiments is shown. The analysis device includes a transceiver unit 1201 and a processing unit 1202. In one possible embodiment, the transceiver unit 1201 supports the analysis device in executing S604 of the above method embodiments, and the processing unit 1202 supports the analysis device in executing S605 of the above method embodiments. In another possible embodiment, the transceiver unit 1201 supports the analysis device in executing S801 and S805 of the above method embodiments, and the processing unit 1202 supports the analysis device in executing S806-S808 of the above method embodiments. In yet another possible embodiment, the processing unit 1202 supports the analysis device in executing S1001-S1005 of the above method embodiments.

[0153] All relevant content of each step involved in the above method embodiments can be referenced from the functional description of the corresponding functional module, and will not be repeated here in the embodiments of this application.

[0154] like Figure 13 The diagram shown is a schematic diagram of the structure of an analysis device according to the above embodiments provided in this application. The analysis device includes a processor 1312 and a transceiver 1313. Further, the analysis device also includes a memory 1311 and a bus 1314. The processor 1312, the memory 1311 and the transceiver 1313 are connected through the bus 1314.

[0155] The processor 1312 is used to control and manage the operation of the analysis device, and the transceiver 1313 is used to support the analysis device in communication, such as supporting the analysis device to communicate with an OTDR.

[0156] In this embodiment, processor 1312 may be a central processing unit, a general-purpose processor, a digital signal processor, an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. It can implement or execute various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this application. The processor may also be a combination that implements computational functions, such as a combination of one or more microprocessors, a combination of a digital signal processor and a microprocessor, etc. The aforementioned bus 1314 may include an address bus, a data bus, a control bus, etc.

[0157] When using integrated units, Figure 14 A schematic diagram of the structure of an OTDR involved in the above embodiments is shown. The OTDR includes a transmitting unit 1401, a receiving unit 1402, and a processing unit 1403. In one possible embodiment, the transmitting unit 1401 is used to support the OTDR in executing S601 of the above method embodiments, the receiving unit 1402 is used to support the OTDR in executing S602 of the above method embodiments, and the processing unit 1403 is used to support the OTDR in executing S603 of the above method embodiments. In another possible embodiment, the transmitting unit 1401 is used to support the OTDR in executing S802 of the above method embodiments, the receiving unit 1402 is used to support the OTDR in executing S803 of the above method embodiments, and the processing unit 1403 is used to support the OTDR in executing S804 of the above method embodiments.

[0158] All relevant content of each step involved in the above method embodiments can be referenced from the functional description of the corresponding functional module, and will not be repeated here in the embodiments of this application.

[0159] like Figure 15 The diagram shown is a schematic diagram of another OTDR involved in the above embodiments provided in this application. The analysis device includes a processor 1512 and a transceiver 1513. Further, the OTDR also includes a memory 1511 and a bus 1514. The processor 1512, the memory 1511 and the transceiver 1513 are connected through the bus 1514.

[0160] The processor 1512 is used to control and manage the operation of the OTDR, and the transceiver 1513 is used to support the OTDR in communication, such as supporting the OTDR to communicate with an analysis device.

[0161] In this embodiment, the processor 1512 may be a central processing unit, a general-purpose processor, a digital signal processor, an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. It can implement or execute various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this application. The processor may also be a combination that implements computational functions, such as a combination of one or more microprocessors, a combination of a digital signal processor and a microprocessor, etc. The bus 1514 may include an address bus, a data bus, a control bus, etc.

[0162] In another embodiment of this application, an optical device positioning system is provided. This system includes an analysis device and a passive optical network (PON). The PON includes an OTDR and at least one passive device. The OTDR is connected to the at least one passive device, and each of the at least one passive device has a reflector disposed thereon. The OTDR can be one of the aforementioned... Figure 14 or Figure 15 The provided OTDR is used to perform the OTDR execution steps in the above-described method embodiments; the analysis device can be as described above. Figure 12 or Figure 13 The provided analysis apparatus is used to perform the steps executed by the analysis apparatus in the above-described method embodiments.

[0163] It is understood that all relevant content of each step involved in the above method embodiments can be referenced in the embodiments of the analysis device and OTDR, as well as the embodiments of the optical device positioning system, and will not be repeated here.

[0164] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of modules or units is merely a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another apparatus, or some features may be ignored or not executed.

[0165] The units described as separate components may or may not be physically separate. A component shown as a unit can be one or more physical units; that is, it can be located in one place or distributed in multiple different locations. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0166] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a readable storage medium. This readable storage medium may include various media capable of storing program code, such as a USB flash drive, external hard drive, read-only memory, random access memory, magnetic disk, or optical disk. Based on this understanding, the technical solution of the embodiments of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product.

[0167] In another embodiment of this application, a chip is provided, the chip including a processor and an interface circuit, the processor and the interface circuit being used to support the chip in performing one or more steps performed by the analysis device in the method embodiments provided above.

[0168] In another embodiment of this application, a chip is provided, which includes a processor and an interface circuit. The processor and the interface circuit are used to support the chip in performing one or more steps of OTDR execution in the method embodiments provided above.

[0169] In another embodiment of this application, a computer-readable storage medium is provided, which stores a computer program or instructions that, when executed, implement one or more steps performed by the analysis device in the method embodiments provided above.

[0170] In another embodiment of this application, a computer-readable storage medium is provided, which stores a computer program or instructions that, when executed, implement one or more steps performed by the OTDR in the method embodiments provided above.

[0171] In another embodiment of this application, a computer program product is provided, comprising: a computer program (or code, or instructions) that, when executed, causes a computer to perform one or more steps as performed by the analysis device in the method embodiments provided above.

[0172] In another embodiment of this application, a computer program product is provided, comprising: a computer program (or code, or instructions) that, when run, causes a computer to perform one or more steps performed by an OTDR as described in the method embodiments provided above.

[0173] Finally, it should be noted that the above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A method for positioning optical devices, characterized in that, An analysis device is used to identify the location of devices in a passive optical network (PON), the PON including an optical time domain reflectometer (OTDR) and at least one passive device, the OTDR being connected to the at least one passive device, and each of the at least one passive device having a reflector disposed thereon; the method includes: The reflection information of the first reflected light signal and the reflection information of the second reflected light signal are acquired; the first reflected light signal is formed by the reflection of the first test light signal by the reflector of each passive device, and the second reflected light signal is formed by the reflection of the second test light signal by the reflector of each passive device; the first test light signal and the second test light signal are transmitted from the OTDR to the PON, the wavelength of the first test light signal is within the reflectable wavelength range of the reflector, and the wavelength of the second test light signal is outside the reflectable wavelength range of the reflector; The position of the at least one passive device relative to the OTDR is determined based on the reflection information of the first reflected light signal and the reflection information of the second reflected light signal.

2. The method according to claim 1, characterized in that, The reflection information includes the correspondence between the distance relative to the OTDR and the power of the reflected light signal. Determining the position of the at least one passive device relative to the OTDR based on the reflection information of the first reflected light signal and the reflection information of the second reflected light signal includes: Based on the reflection information corresponding to the first reflected light signal and the reflection information corresponding to the second reflected light signal, at least one target position is determined, wherein the difference between the power of the first reflected light signal corresponding to the target position and the power of the second reflected light signal corresponding to the target position is greater than a first preset threshold. The position of the at least one passive device relative to the OTDR is determined based on the at least one target position.

3. The method according to claim 2, characterized in that, The PON includes multiple passive devices, and determining the position of the at least one passive device relative to the OTDR based on the at least one target position includes: Obtain the relative position information of the plurality of passive devices; Based on the relative position information, the correspondence between each passive device and each target position is determined; Based on the correspondence, each target position is determined as the position of the corresponding passive device relative to the OTDR.

4. The method according to any one of claims 1 to 3, characterized in that, The method further includes: The fault type of the at least one passive device is determined based on the reflection information of the first reflected light signal and the reflection information of the second reflected light signal.

5. The method according to claim 4, characterized in that, The reflection information includes the correspondence between the distance relative to the OTDR and the power of the reflected light signal. Determining the fault type of the at least one passive device based on the reflection information of the first and second reflected light signals includes: At least one target location is obtained, wherein the difference between the power of the first reflected light signal corresponding to the target location and the power of the second reflected light signal corresponding to the target location is greater than a first preset threshold. If the difference between the power of the first reflected light signal corresponding to the target position and the power of the second reflected light signal corresponding to the target position is greater than the second preset threshold, then it is determined that the corresponding passive device has a loss fault. If the difference between the power of the first reflected light signal corresponding to the target location and the power of the second reflected light signal corresponding to the target location is less than or equal to the second preset threshold, then it is determined that the corresponding passive device has a fiber breakage fault.

6. The method according to claim 4 or 5, characterized in that, Before determining the fault type of the at least one passive device based on the reflection information of the first reflected light signal and the reflection information of the second reflected light signal, the method further includes: If the power of the first reflected light signal corresponding to the target location is less than the power reference value, the corresponding passive device is determined to be faulty.

7. An analytical apparatus, characterized in that, The analysis device is used to identify the location of devices in a passive optical network (PON), wherein the PON includes an optical time domain reflectometer (OTDR) and at least one passive device, the OTDR being connected to the at least one passive device, and each of the at least one passive device having a reflector disposed thereon; the analysis device includes: The transceiver unit is used to acquire reflection information of a first reflected optical signal and reflection information of a second reflected optical signal; the first reflected optical signal is formed by the reflection of a first test optical signal by the reflector of each passive device, and the second reflected optical signal is formed by the reflection of a second test optical signal by the reflector of each passive device; the first test optical signal and the second test optical signal are transmitted from the OTDR to the PON, the wavelength of the first test optical signal is within the reflectable wavelength range of the reflector, and the wavelength of the second test optical signal is outside the reflectable wavelength range of the reflector; The processing unit is configured to determine the position of the at least one passive device relative to the OTDR based on the reflection information of the first reflected light signal and the reflection information of the second reflected light signal.

8. The analytical apparatus according to claim 7, characterized in that, The reflection information includes the correspondence between the distance relative to the OTDR and the power of the reflected light signal; The processing unit is specifically configured to determine at least one target position based on the reflection information corresponding to the first reflected light signal and the reflection information corresponding to the second reflected light signal, wherein the difference between the power of the first reflected light signal corresponding to the target position and the power of the second reflected light signal corresponding to the target position is greater than a first preset threshold; and to determine the position of the at least one passive device relative to the OTDR based on the at least one target position.

9. The analytical apparatus according to claim 8, characterized in that, The PON includes multiple passive devices; The transceiver unit is also used to acquire the relative position information of the plurality of passive devices; The processing unit is specifically used to determine the correspondence between each passive device and each target position based on the relative position information; and to determine each target position as the position of the corresponding passive device relative to the OTDR based on the correspondence.

10. The analytical apparatus according to any one of claims 7 to 9, characterized in that, The processing unit is further configured to determine the fault type of the at least one passive device based on the reflection information of the first reflected light signal and the reflection information of the second reflected light signal.

11. The analytical apparatus according to claim 10, characterized in that, The reflection information includes the correspondence between the distance relative to the OTDR and the power of the reflected light signal; The processing unit is specifically configured to acquire at least one target location, wherein the difference between the power of the first reflected light signal corresponding to the target location and the power of the second reflected light signal corresponding to the target location is greater than a first preset threshold; if the difference between the power of the first reflected light signal corresponding to the target location and the power of the second reflected light signal corresponding to the target location is greater than a second preset threshold, then it is determined that the corresponding passive device has a loss fault; if the difference between the power of the first reflected light signal corresponding to the target location and the power of the second reflected light signal corresponding to the target location is less than or equal to the second preset threshold, then it is determined that the corresponding passive device has a fiber breakage fault.

12. The analytical apparatus according to claim 10 or 11, characterized in that, The processing unit is further configured to determine a corresponding passive device fault when the power of the first reflected light signal corresponding to the target position is less than a power reference value.

13. An analytical apparatus, characterized in that, The analysis device includes a processor and a memory, the memory storing instructions that, when executed by the processor, cause the analysis device to perform the optical device positioning method as described in any one of claims 1 to 6.

14. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores instructions that, when executed on the device, cause the device to perform the optical device positioning method as described in any one of claims 1 to 6.

15. A positioning system for optical devices, characterized in that, The optical device positioning system includes an analysis device and a passive optical network (PON); the PON includes an optical time domain reflectometer (OTDR) and at least one passive device, the OTDR is connected to the at least one passive device, and each of the at least one passive device is provided with a reflector. The OTDR is used to generate reflection information of a first reflected light signal and reflection information of a second reflected light signal; the first reflected light signal is formed by the reflection of a first test light signal by the reflector of each passive device, and the second reflected light signal is formed by the reflection of a second test light signal by the reflector of each passive device; the first test light signal and the second test light signal are emitted from the OTDR to the PON, the wavelength of the first test light signal is within the reflectable wavelength range of the reflector, and the wavelength of the second test light signal is outside the reflectable wavelength range of the reflector; The analysis device is used to interact with the OTDR and perform the optical device positioning method as described in any one of claims 1 to 6.

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