Apparatus and method for processing measurement data of a spectrometer, mobile device, server, and method for enabling plausibility determination of measurement data of a spectrometer at runtime
Patent Information
- Application Number
- CN202580019016.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2024-03-07
- Filing Date
- 2025-03-03
- Publication Date
- 2026-10-16
AI Technical Summary
例如,如果将错误或无效的测量结果输入到用于确定构成被测对象的塑料类型的模型,则模型可能会输出错误的塑料类型——这可能会导致用户感到沮丧
[0012]根据第七方面,本披露内容提供了一种用于使得能够在运行时对光谱仪的测量数据进行合理性确定的方法。该方法包括在限定条件下执行光谱仪的工厂校准。进一步地,该方法包括根据由光谱仪在工厂校准期间生成的测量数据来确定一个或多个参考值。该方法另外包括将该一个或多个参考值存储在数据存储装置中,该数据存储装置可由用于确定在用户操作期间由光谱仪生成的测量数据是否合理的装置访问。
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Figure CN122935686A_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to the processing of measurement data from a spectrometer. In particular, examples of this disclosure relate to an apparatus and method for processing measurement data from a spectrometer, a mobile device, a server, and a method for enabling the reasonable determination of measurement data from a spectrometer during runtime. Background Technology
[0002] Collecting information about a sample using a spectrometer requires the user to perform various measurements. In many cases, the user is not a spectroscopic or optics expert and therefore unaware of the importance of performing measurements correctly. For example, in the case of a spectrometer integrated into consumer electronics such as a mobile phone, the user is typically not an expert. However, user errors can lead to erroneous or invalid measurements. For example, a user may make one or more of the following errors when performing measurements with a spectrometer: The user may, for example, perform an incorrect open-port measurement and place the reference or target sample on the spectrometer's sample interface. Similarly, the user may perform an incorrect reference sample measurement without placing the reference on the sample interface or with the target sample on the sample interface. When placing the sample on the sample interface, the user may make errors in the sample's positioning and / or orientation relative to the sample interface. Spectrometers and samples are, in many cases, sensitive to the sample's position / or orientation at the sample interface due to their optical scattering properties. Therefore, incorrect sample positioning and / or orientation are likely to result in erroneous or invalid measurement results.
[0003] If incorrect or invalid measurement results are input into a data analysis model (such as a stoichiometric model), the model will output inconsistent results or conclusions. For example, if incorrect or invalid measurement results are input into a model used to determine the type of plastic that makes up the measured object, the model may output the wrong type of plastic—which could frustrate the user.
[0004] Therefore, it may be necessary to improve the processing of spectrometer measurement data. Summary of the Invention
[0005] This need is met by means of apparatus and methods for processing spectrometer measurement data according to the independent claims, mobile devices, servers, methods for enabling the reasonable determination of spectrometer measurement data at runtime, non-transitory machine-readable media, and programs. Advantageous embodiments are defined by the dependent claims.
[0006] According to a first aspect, this disclosure provides an apparatus for processing measurement data from a spectrometer. The apparatus includes a processing circuit system configured to receive the measurement data and determine whether the measurement data is reasonable. If the measurement data is determined to be reasonable, the processing circuit system is further configured to forward the measurement data to a process for evaluating the measurement data.
[0007] According to a second aspect, this disclosure provides a mobile device. The mobile device includes means for processing measurement data from a spectrometer, according to the first aspect. Furthermore, the mobile device includes a spectrometer or an interface circuitry system configured to receive measurement data from the spectrometer. In a first case, the spectrometer is configured to generate measurement data based on measured radiation. In a second case, the spectrometer is located external to the mobile device.
[0008] According to a third aspect, this disclosure provides a server. The server includes means for processing measurement data from a spectrometer, according to the first aspect. Additionally, the server includes an interface circuitry configured to receive measurement data from the spectrometer.
[0009] According to the fourth aspect, this disclosure provides a method for processing measurement data from a spectrometer. The method includes receiving the measurement data and determining whether the measurement data is reasonable. Additionally, if the measurement data is determined to be reasonable, the method includes forwarding the measurement data to a process for evaluating the measurement data.
[0010] According to the fifth aspect, this disclosure provides a non-transitory machine-readable medium on which a program is stored, the program having program code for performing the method according to the fourth aspect when the program is executed on a processor or programmable hardware.
[0011] According to the sixth aspect, this disclosure provides a program having program code for performing the method described in the fourth aspect when the program is executed on a processor or programmable hardware.
[0012] According to the seventh aspect, this disclosure provides a method for enabling the reasonableness determination of measurement data from a spectrometer during operation. The method includes performing factory calibration of the spectrometer under defined conditions. Further, the method includes determining one or more reference values based on measurement data generated by the spectrometer during factory calibration. The method further includes storing the one or more reference values in a data storage device accessible by means of means for determining whether measurement data generated by the spectrometer during user operation is reasonable.
[0013] According to the proposed technique, only reasonable measurement data is fed into the process used to evaluate the measurement data. Therefore, it is possible to avoid inputting erroneous or invalid measurement data into data analysis models (such as chemometric models), which in turn allows for the prevention of poor user experiences. Attached Figure Description
[0014] The following will describe some examples of apparatus and / or methods by way of example only and with reference to the accompanying drawings, in which:
[0015] Figure 1 An example of a device for processing measurement data from a spectrometer is shown;
[0016] Figure 2 An exemplary spectrometer is shown;
[0017] Figure 3 An exemplary comparison of the measured values with a reference curve is shown;
[0018] Figure 4 An exemplary mobile device is illustrated;
[0019] Figure 5 An example server is shown;
[0020] Figure 6 A flowchart illustrating an example of a method for processing measurement data from a spectrometer; and
[0021] Figure 7 A flowchart illustrating an example of a method for enabling the reasonable determination of spectrometer measurement data at runtime is provided. Detailed Implementation
[0022] Some examples will now be described in more detail with reference to the accompanying drawings. However, other possible examples are not limited to the features of these embodiments described in detail. Other examples may include modifications to these features, as well as equivalents and alternatives to these features. Furthermore, the terminology used herein to describe certain examples should not limit other possible examples.
[0023] Throughout the description of the accompanying drawings, the same or similar reference numerals refer to the same or similar elements and / or features, which may be implemented identically or in modified form while providing the same or similar function. For clarity, the thickness of lines, layers, and / or regions in the drawings may also be exaggerated.
[0024] When two elements A and B are combined using "or", unless otherwise explicitly defined in individual cases, this should be understood as disclosing all possible combinations: A only, B only, and A and B. "At least one of A and B" or "A and / or B" can be used as alternative wording for the same combination. The same applies to combinations with more than two elements.
[0025] If the singular form is used (such as "a / an" and "the"), and the use of a single element is not explicitly or implicitly defined as mandatory, other examples may also use several elements to implement the same functionality. If the functionality is described below as being implemented using multiple elements, other examples may use a single element or a single processing entity to implement the same functionality. It will be further understood that when the terms "include," "including," "comprise," and / or "comprising" are used, these terms describe the presence of the specified feature, integer, step, operation, process, element, component, and / or group thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, processes, elements, components, and / or groups thereof.
[0026] Figure 1 A device 100 for processing measurement data 101 from the spectrometer 120 is shown.
[0027] Spectrometer 120 is a device adapted (designed, configured) to measure the spectral composition of electromagnetic radiation at (specific, predefined) discrete wavelengths or within a specified (predefined) wavelength range. Specifically, spectrometer 120 may be adapted to measure the spectral composition of light at (specific, predefined) discrete wavelengths or within a specific (predefined) wavelength range. In other words, spectrometer 120 may be an optical spectrometer. Spectrometer 120 may include various components such as a light source, dispersive elements (e.g., diffraction gratings or prisms), a sample interface on which a sample to be measured may be placed, one or more optical filters, and a detector for capturing and quantifying the light intensity at one or more wavelengths or wavelength ranges. The detector may include one or more photosensitive pixels (sensors). Each photosensitive pixel may include a semiconductor material, such as one or more inorganic photoconductive materials, such as lead sulfide (PbS), lead selenide (PbSe), germanium (Ge), indium gallium arsenide (InGaAs), indium antimonide (InSb), or cadmium mercury telluride (HgCdTe or MCT). Incident light can penetrate the semiconductor material of the corresponding photosensitive pixel and induce the generation of charge carriers (e.g., electrons or holes), thereby generating an electrical signal in the semiconductor material. For example, one or more photosensitive pixels can be charge-coupled devices (CCDs) or complementary metal-oxide-semiconductor (CMOS) devices.
[0028] For example, reference measurements of an external reference sample placed on the sample interface of spectrometer 120 can be performed by the user using spectrometer 120. The external reference sample can be a sample (object) with known spectral characteristics. For example, the external reference sample may exhibit 99% reflectance and diffuse (Lambertian) reflection scattering characteristics. Reference measurements allow for the calibration or verification of spectrometer 120, thereby ensuring its accuracy and reliability. Furthermore, the user can use spectrometer 120 to perform sample measurements of a target sample placed on the sample interface of spectrometer 120. The target sample can be a sample (object) with unknown spectral characteristics. In other words, the spectral characteristics of the target sample can be examined. The target sample can be a liquid, gas, or solid. For example, the target sample can be (e.g., human) skin, textiles, plastics, or food. Further still, the user can use spectrometer 120 to perform background measurements (also known as open-port measurements), in which no sample is placed on the sample interface of spectrometer 120. Background measurements allow for the determination of the baseline or background present when no sample is present in the measurement path (e.g., optical path) of spectrometer 120. Background measurements allow for the correction and consideration of environmental or instrument signals that may affect the accuracy of sample measurements.
[0029] Measurement data 101 from spectrometer 120 may be data obtained through operation of spectrometer 120 that captures the intensity or amplitude of electromagnetic radiation (e.g., light) at one or more specific (predefined) wavelengths (e.g., within a specified spectral range). Measurement data 101 may be obtained from the interaction between emitted radiation and a sample (e.g., a reference sample or a target sample) or from the background measured by spectrometer 120 in a corresponding measurement. Measurement data 101 may represent the spectral characteristics measured in the corresponding measurement performed with spectrometer 120. For example, measurement data 101 may represent the spectral characteristics of the sample being measured or the background. Measurement data 101 may indicate (encoded) the corresponding measurement values of one or more measurements (e.g., one or more background measurements, reference measurements, and / or sample measurements) performed with / by spectrometer 120. Measurement data 101 may, for example, include or indicate numerical values corresponding to the intensity or amplitude of detected (measured) radiation at one or more (specific, predefined) discrete wavelengths or wavelength ranges for one or more measurements performed with / by spectrometer 120. For example, measurement data 101 can indicate the corresponding measurement value of one or more photosensitive pixels of spectrometer 120 for one or more of the reference measurement, background measurement, and sample measurement performed by / by spectrometer 120.
[0030] Additionally, the measurement data 101 may include metadata indicating further information about the data elements (i.e., measured values) representing the spectral characteristics of the measurement. For example, the metadata may indicate the time of the measurement performed with spectrometer 120. In other words, the data elements representing the measured values in the measurement data 101 may be timestamped, indicating the time of measurement of the spectral characteristics. Alternatively or additionally, the metadata may indicate the environmental conditions when the measurement was performed with spectrometer 120. In other words, the data elements representing the measured values in the measurement data 101 may be set with further information about the environmental conditions of spectrometer 120 when the measurement was performed. For example, the metadata may indicate the temperature when the measurement was performed with spectrometer 120. Further alternatively or additionally, the metadata may indicate the type of spectrometer used to generate the measured values, i.e., the type of spectrometer used to perform the measurement. However, it should be noted that this disclosure is not limited to the foregoing examples. The metadata may indicate more, less, or different information.
[0031] Apparatus 100 includes a processing circuitry system 110. The processing circuitry system 110 is configured to receive and process measurement data 101. For example, the processing circuitry system 110 may be a single dedicated processor, a single shared processor, or multiple individual processors (some or all of which may be shared), digital signal processor (DSP) hardware, application-specific integrated circuit (ASIC), neuromorphic processor, system-on-a-chip (SoC), or field-programmable gate array (FPGA). The processing circuitry system 110 may optionally be coupled to, for example, a memory, such as read-only memory (ROM), random access memory (RAM), and / or non-volatile memory for storing software. For example, apparatus 100 may include a memory configured to store instructions that, when executed by the processing circuitry system 110, cause the processing circuitry system 110 to perform the steps and methods described herein.
[0032] Processing circuitry 110 is configured to determine whether measurement data 101 is reasonable. In other words, processing circuitry 110 is configured to assess or evaluate the reasonableness of measurement data 101. In this context, the term "reasonable" can mean whether measurement data 101 is logically or reasonably acceptable based on certain criteria or standards. In other words, processing circuitry 110 is configured to assess the credibility, validity, or reasonableness of measurement data. Furthermore, processing circuitry 110 is configured to check whether the provided measurement data 101 is meaningful or reasonable according to predefined criteria. For example, processing circuitry 110 can determine whether measurement data 101 exhibits expected (e.g., predefined or learned) behavior or structure. Criteria or standards used to determine the reasonableness of measurement data 101 can be multifaceted. Specific examples are described below. However, it should be noted that this disclosure is not limited thereto. Additional or different criteria or standards may be used to determine the reasonableness of measurement data 101.
[0033] (Only if) it is determined that the measurement data 101 is reasonable, then the processing circuitry system 110 is configured to forward the measurement data 101 to process 130 for evaluating the measurement data 101. Process 130 in Figure 1The process 130 is shown as a separate element. For example, process 130 may be executed by a circuit system different from processing circuit system 110. In some examples, the separate circuit system for executing process 130 may be part of device 100. In alternative examples, the separate circuit system for executing process 130 is not part of device 100. It should be noted that process 130 may be executed by processing circuit system 110 according to the examples of this disclosure. Process 130 may be a process that receives measurement data 101 (and optionally additional data) as input and outputs conclusions or analytical results, such as the composition of the object being measured (e.g., the type of plastic constituting the object), the maturity of agricultural products, the moisture level of the object being measured (e.g., the object is human skin), or the health or physical fitness level of a person (if a part of the human body is measured). In some examples, process 130 may output recommendations or suggestions, such as applying a certain fertilizer to the tested soil (e.g., based on the mineral content in the soil determined by process 130 from measurement data 101) or administering a dose of insulin (e.g., based on a person's blood glucose level determined by process 130 from measurement data 101). Process 130 may further output confidence values indicating the confidence level of the determined information (e.g., conclusions, analysis results, or recommendations). It should be noted that this disclosure is not limited to the foregoing examples. Depending on the use case and the tested object, other information may be obtained from measurement data 101. Process 130 may, for example, use a data analysis model (e.g., a chemometric model) to draw conclusions, analyze results, or make recommendations based on the input measurement data 101. The data analysis model may, for example, be a mechanistic (i.e., rule-based) model, a trained machine learning model, or a combination thereof.
[0034] The device 100 forwards valid measurement data to the process 130 for evaluating the measurement data 101. Conversely, if the measurement data 101 is determined to be invalid, the processing circuitry 110 can be further configured not to forward the measurement data 101 to the process 130 for evaluating it. Therefore, feeding erroneous or invalid measurement results to the process 130 can be avoided, and thus, unstable results or conclusions output by the process 130 can be prevented. This can prevent a poor user experience.
[0035] If measurement data 101 is unreasonable, it cannot be used for the evaluation performed by process 130. Measurements can be repeated to obtain reasonable (i.e., valid) measurement data that can be input into process 130. Therefore, if measurement data 101 is determined to be unreasonable, in some examples, processing circuitry 110 may be further configured to cause human-machine interface (HMI) 140 to output a notification that measurements have been repeated one or more times with spectrometer 120. For example, HMI 140 may be a user-accessible mobile device (such as a mobile phone, wearable computer, or tablet computer) or part thereof. For example, the mobile device may include or communicatively coupled to spectrometer 120. The notification can be multifaceted. For example, the notification may be a graphical notification on a graphical user interface (GUI) output to the display of the mobile device, or an acoustic notification (such as a voice notification output by the loudspeaker of the mobile device). Processing circuitry 110 may be configured, for example, to transmit control data to HMI 140. The control data is encoded with one or more control commands for controlling (instructing) HMI 140 to output the notification. The notification output allows the user to be aware that one or more measurements need to be repeated with the spectrometer 120 to obtain reasonable (valid) measurement data. It should be noted that the HMI 140 is not limited to mobile devices. The HMI 140 can be any terminal device used / accessible by the user, or part of such a device.
[0036] Unreasonable measurement results (such as incorrect measurements) are often caused by the user not performing the measurement correctly. For example, the user may perform an incorrect background measurement and place the reference sample or target sample on the sample interface of the spectrometer 120. Similarly, the user may perform an incorrect reference sample measurement without placing the reference on the sample interface or with the target sample on the sample interface. When placing the sample on the sample interface, the user may make mistakes in the positioning and / or orientation of the sample relative to the sample interface. In many cases, the user is not a spectroscopic or optical expert. In many cases, providing guidance to the user due to unreasonable measurement data can produce reasonable measurement results in the next measurement. Therefore, in some examples, the processing circuitry 110 may be further configured to determine at least one improvement suggestion for repeating one or more measurements with the spectrometer 120 and to output the at least one improvement suggestion from the HMI. By outputting the at least one improvement suggestion, the user can be supported in performing the measurement correctly. Thus, the user experience can be improved. For example, if it is determined that the measurement data 101 is unreasonable, the processing circuitry 110 may be configured to determine a suspected error (mistake) when performing the measurement with the spectrometer based on the measurement data 101. The at least one improvement suggestion can be selected from a lookup table (LUT), for example, based on suspected errors. The LUT can store multiple improvement suggestions for different suspected errors. For example, if analysis of measurement data 101 of the background measurement indicates that an object was placed on the spectrometer's sample interface during the background measurement, the improvement suggestion could be to remove the object from the sample interface and / or clean the sample interface to repeat the background measurement. If analysis of measurement data 101 of the sample measurement indicates that the target sample is incorrectly positioned and / or oriented on the sample interface, the improvement suggestion could be to change (adjust) the target sample's position and / or orientation on the sample interface. It should be noted that this disclosure is not limited to the foregoing examples. Other suggestions may also be used.
[0037] As stated above, various criteria or standards can be used to determine the reasonableness of measurement data 101. Several examples will be described in more detail below. It should be noted that the criteria or standards described below can be used individually or in combination to determine the reasonableness of measurement data 101.
[0038] To determine whether the measurement data 101 is reasonable, the processing circuitry 110 may, for example, analyze metadata included in the measurement data 101. For instance, the processing circuitry 110 may be configured to extract metadata from the measurement data 101 for multiple measurements forming a measurement set. The measurement set may be a series or multiple measurements, such as a series of one or more background measurements, one or more reference measurements, and one or more sample measurements. If the metadata meets predefined criteria, the processing circuitry 110 may be configured to determine that the measurement data 101 for these measurements forming the measurement set is reasonable. On the other hand, if the metadata does not meet predefined criteria, the processing circuitry 110 may be configured to determine that the measurement data 101 for these measurements forming the measurement set is unreasonable. The metadata may indicate various information as described above. For example, the metadata may indicate the measurement time of a corresponding measurement in the measurement set and / or the temperature at which the corresponding measurement in the measurement set was performed. The spectrometer 120 may, for example, include an internal clock for determining the measurement time of a corresponding measurement in the measurement set and / or a temperature sensor for measuring the temperature at which the measurements forming the measurement set are performed.
[0039] Measurements in the measurement set should be performed under substantially similar conditions. While those skilled in the art are aware of compensation methods for slightly different environmental conditions when performing measurements with a spectrometer, the deviation should not be too large. For example, if the measurement set includes reference measurements and sample measurements, and if the temperature difference between the temperature when performing the reference measurement with spectrometer 120 and the temperature when performing the sample measurement with spectrometer 120 is too large, conventional methods for compensating for the temperature difference may result in unacceptable measurement accuracy. Therefore, if the metadata indicates the temperature when performing the corresponding measurement in the measurement set, the processing circuitry system 110 can determine the temperature difference between the temperatures indicated by the metadata and compare it, for example, with a threshold (as an example of a predefined criterion). If the determined temperature difference between the temperatures indicated by the metadata is less than the threshold, the processing circuitry system 110 can determine that the measurement data 101 of these measurements forming the measurement set is reasonable. On the other hand, if at least a portion (e.g., one or more) of the determined temperature differences between the temperatures indicated by the metadata are higher than the threshold, the processing circuitry system 110 can determine that the measurement data 101 of these measurements forming the measurement set is unreasonable. The threshold can be based, for example, on a compensation algorithm (given by the compensation algorithm) used by process 130 to compensate for different temperatures when performing measurements to form a measurement set.
[0040] In many cases, the environmental conditions around the spectrometer 120 change over time. Therefore, the measurement time of the corresponding measurements in the measurement set can also be an indicator of the reasonableness of these measurements forming the measurement set. For example, if the time difference between the individual measurements forming the measurement set is too large, the environmental conditions around the spectrometer 120 are likely to have changed significantly (excessively). Therefore, if the metadata indicates the measurement time of the corresponding measurements in the measurement set, the processing circuitry system 110 can determine the time difference between the measurement times indicated by the metadata and compare it, for example, with a threshold (as an example of a predefined criterion). If the determined time difference between the measurement times indicated by the metadata is less than the threshold, the processing circuitry system 110 can determine that the measurement data 101 of these measurements forming the measurement set is reasonable. On the other hand, if at least a portion (e.g., one or more) of the determined time differences between the measurement times indicated by the metadata are higher than the threshold (i.e., if the timestamps of these measurements forming the measurement set show excessive differences), the processing circuitry system 110 can determine that the measurement data 101 of these measurements forming the measurement set is unreasonable.
[0041] If the measurement data 101 of these measurements forming the measurement set is unreasonable, the processing circuitry 110 can be configured not to forward the measurement data 101 to process 130. In other words, the processing circuitry 110 can reject the measurement data 101. In this case, the processing circuitry 110 can be further configured, for example, to cause the HMI 140 to output a notification to repeat one or more measurements in the measurement set using the spectrometer 120 to obtain a valid measurement set.
[0042] Analyzing the metadata included in the measurement data can allow for the rejection of measurements or sets of measurements that differ excessively (expected or actual) between different measurements.
[0043] In some examples, photosensitive pixels of spectrometer 120 that are sensitive to light within the same wavelength range can be used when making a rationale determination. Sample measurements can be validated using measurement results from multiple photosensitive pixels within the same wavelength range. For example, measurement data 101 can indicate the corresponding measurement values of two or more photosensitive pixels of spectrometer 120 for reference measurements, background measurements, and sample measurements. Two or more photosensitive pixels of spectrometer 120 can be sensitive to light within the same wavelength range. In other words, two or more photosensitive pixels of spectrometer 120 can measure the same portion of the electromagnetic spectrum. For example, two or more photosensitive pixels of spectrometer 120 may include PbS as a photoconductive material and be sensitive to light in a wavelength range between 1 µm and 3 µm.
[0044] To determine whether the measurement data 101 is reasonable, the processing circuitry 110 can be configured to determine the corresponding absorbance value of the target sample for each of two or more photosensitive pixels of the spectrometer 120, based on corresponding measurements of the reference measurement, background measurement, and sample measurement. The absorbance of the target sample can be calculated as follows:
[0045] (1)
[0046] in, It is the corresponding absorbance value of each of the two or more photosensitive pixels of the spectrometer 120 for the target sample. These are the corresponding measurement values taken by the photosensitive pixels for the sample. These are the corresponding measurement values of the corresponding photosensitive pixels relative to the reference measurement, and This refers to the corresponding measurement value of the photosensitive pixel relative to the background. Index This represents the corresponding photosensitive pixel of the spectrometer 120.
[0047] All photosensitive pixels operating at the same wavelength should produce the same absorbance. Therefore, if the determined absorbance value... If the difference between the values is less than a threshold, the processing circuit system 110 can be further configured to determine that the measurement data 101 is reasonable. On the other hand, if the determined absorbance value... If the difference between the measured absorbance values exceeds a threshold value, the processing circuitry 110 can be further configured to determine that the measured data 101 is unreasonable. If the measured data 101 is unreasonable, the processing circuitry 130 can be configured not to forward the measured data 101 to process 130. In other words, if the calculated absorbance values differ by more than a given acceptance margin for photosensitive pixels sensitive to the same wavelength, the processing circuitry 130 can be configured to reject the measurement. The threshold can be, for example, 1% or less, 5% or less, 10% or less, or 20% or less.
[0048] If process 130 (e.g., as part of a particular application or use case) is designed for use with a set of target samples, such as target samples belonging to a set of materials, then information about the expected spectrum or absorbance of that set of target samples may be known. This information can be used to determine the reasonableness of measurement data 101. For example, measurement data 101 may indicate the corresponding measurement values of one or more photosensitive pixels of spectrometer 120 for reference measurement, background measurement, and sample measurement. To determine whether measurement data 101 is reasonable, processing circuitry 110 may be configured to determine the corresponding absorbance value of the target sample for one or more photosensitive pixels based on the corresponding measurement values of reference measurement, background measurement, and sample measurement. The corresponding absorbance value may be calculated, for example, according to the mathematical expression (1) above.
[0049] For each of one or more photosensitive pixels, if the determined corresponding absorbance value is within the reference range for the corresponding photosensitive pixel, the processing circuitry 110 can be configured to determine that the measurement data 101 is reasonable. Conversely, if for at least a portion (e.g., one or more) of the one or more photosensitive pixels, the determined corresponding absorbance value is not within the reference range for the corresponding photosensitive pixel, the processing circuitry 110 can be further configured to determine that the measurement data 101 is unreasonable. If the measurement data 101 is unreasonable, the processing circuitry 130 can be configured not to forward the measurement data 101 to process 130. In other words, if the calculated absorbance is not within a known or expected range, the processing circuitry 130 can be configured to reject the sample measurement. For example, if process 130 expects to measure a target sample composed of a certain type of material (e.g., the material is measured to be plastic), the expected spectral or absorbance range of that type of material can be known. The reference range for the corresponding pixel can be obtained from the expected spectral or absorbance range of that type of material. For example, if one or more photosensitive pixels are sensitive to different wavelengths or wavelength ranges, a corresponding reference range can be derived for the corresponding wavelengths or wavelength ranges that the respective photosensitive pixels are sensitive to. The reference range for one or more photosensitive pixels can be determined or provided, for example, as part of factory calibration. If the target sample being measured is made of a material of the expected type, the determined corresponding absorbance value should be within the corresponding reference range. If the target sample being measured is made of a material different from the expected type (e.g., metal instead of plastic), the determined corresponding absorbance value may not be within the corresponding reference range. Even if the spectral measurement itself may have been correctly performed by the user in this case, the sample measurement as part of measurement data 101 will be rejected because the target sample does not conform to the specified sample group expected by process 130, and therefore further processing (e.g., classification) performed by process 130 may be incorrect.
[0050] In some examples, measurement data 101 may indicate the measurements taken by the photosensitive pixels of spectrometer 120 for both a reference measurement and a background measurement. In other words, the spectrometer 120 performs both the background measurement and the reference measurement. If both the background measurement and the reference measurement are performed, they can be checked to see if they perform as expected when compared to each other. To determine whether measurement data 101 is reasonable, processing circuitry 110 may be configured to determine the deviation of the ratio of the reference measurement to the background measurement from a reference ratio (e.g., a calibration factor). If the deviation is less than a threshold, processing circuitry 110 may be configured to determine that measurement data 101 is reasonable. On the other hand, if the deviation is greater than the threshold, processing circuitry 110 may be further configured to determine that measurement data 101 is unreasonable. If measurement data 101 is unreasonable, processing circuitry 130 may be configured not to forward measurement data 101 to process 130. In other words, if the obtained quotient of the reference measurement to the background measurement is not within a certain margin of the calibration factor, the measurement set may be declared false or invalid.
[0051] The comparison with the threshold can be expressed as follows:
[0052] (2)
[0053] in, This indicates the measurement value of the photosensitive pixels of spectrometer 120 relative to the reference measurement. This represents the measurement value of the photosensitive pixel relative to the background. Indicates a reference ratio, and Indicates the threshold. Reference ratio. This can be determined or provided, for example, as part of factory calibration. For example, a reference ratio. It can be temperature-related, and a reference ratio. The value can be selected by the processing circuit system 110 based on the metadata of the measurement data 101 of the reference measurement and the background measurement. The metadata can, for example, indicate the temperature at the time of the corresponding measurement in the reference measurement and the background measurement, and allow the processing circuit system 110 to select a temperature-dependent reference ratio. An appropriate value. The threshold may be, for example, 1% or less of the reference ratio, 5% or less of the reference ratio, 10% or less of the reference ratio, or 20% or less of the reference ratio.
[0054] In some examples, spectrometer 120 may include an internal reflectance target, i.e., a predefined reflectance target within spectrometer 120. According to the examples in this disclosure, measurements obtained from measurements taken against a predefined reflectance target can be used for a reasonableness determination. Figure 2 An exemplary spectrometer 200 including an internally reflective target is shown. The spectrometer 200 can be used for... Figure 1The spectrometer 120 shown.
[0055] Similar to the description above for spectrometer 120, spectrometer 200 includes a detector 210, a light source 220 (e.g., a laser diode and / or a light-emitting diode LED), and a sample interface 240. Figure 2 As shown, a sample 299 (such as a reference sample or target sample) can be placed on the sample interface 240. Light 221 emitted by the light source 220 crosses the sample interface 240 and is reflected by the sample 299. The reflected light 221' crosses the sample interface 240 and reaches the detector 210. The detector 210 includes one or more photosensitive pixels configured to measure the reflected light 221' incident on a respective pixel. Measurement data for the corresponding measurement is generated based on the electrical signals generated by the one or more photosensitive pixels.
[0056] The spectrometer 200 further includes an internal reflectance target (internal reference sample) 250 within the spectrometer 200, i.e., a predefined reflectance target (predefined reference sample). Similar to the external reference sample described above, the predefined reflectance target 250 is a sample with known spectral characteristics. For example, the predefined reflectance target 250 may exhibit 99% reflectance and diffuse (Lambertian) reflection scattering characteristics.
[0057] The spectrometer 200 further includes a second light source 230 (e.g., a laser diode and / or an LED). The second light source 230 emits light 231 toward a predefined reflective target 250. The light 231 is reflected by the predefined reflective target 250. The reflected light 231' reaches the detector 210. One or more photosensitive pixels of the detector 210 measure the reflected light 231' incident on the respective pixel. Based on the electrical signals generated by the one or more photosensitive pixels, measurement data for the corresponding measurements performed in the presence of the predefined reflective target 250 are generated.
[0058] The first light source 220 and the second light source 230 can be configured to emit their light simultaneously or sequentially. In other words, the first light source 220 and the second light source 230 can operate simultaneously or one after the other (i.e., in a time-division duplex (TDD) manner). When the first light source 220 and the second light source 230 emit their light simultaneously, frequency-division duplex (FDD) can be used. That is, the first light source 220 and the second light source 230 can modulate the light they emit at different modulation frequencies. For example, the first light source 220 and the second light source 230 can be configured to emit square wave modulated light with different modulation frequencies. Therefore, the received reflections 221' and 231' can be distinguished by the detector 210 and assigned to the corresponding one of the first light source 220 and the second light source 230.
[0059] exist Figure 2In the example, two separate light sources 220 and 230 are used to illuminate a predefined reflective target 250 and a sample 299. However, this disclosure is not limited thereto. In other examples, a single light source may be used instead. For example, the spectrometer 200 may include a beam splitter configured to split a beam emitted by a single light source into two beams. The first split beam may be guided to the sample interface 240 (similar to...) via a first optical path. Figure 2 The light 221 shown is directed to a predefined reflective target 250 via a different second optical path (similar to...). Figure 2 The light shown is 231).
[0060] For the sake of simplicity, in Figure 2 Other components of the spectrometer 200, such as one or more optical filters, the aforementioned beam splitter, dispersive elements (such as diffraction gratings or prisms), or signal processing circuitry (such as amplifiers or analog-to-digital converters (ADCs)), are omitted.
[0061] As described above, the measurements obtained at a predefined reflective target 250 can be used to determine the reasonableness of measurements obtained from other measurements, such as reference measurements or background measurements. The following will refer to... Figure 1 and Figure 2 Here are a few examples in more detail.
[0062] For example, measurement data 101 can indicate a corresponding first measurement value of one or more photosensitive pixels of spectrometers 120, 200 for a reference measurement and a corresponding second measurement value of the one or more photosensitive pixels for an auxiliary reference measurement. For the reference measurement, it is expected that an external reference sample will (should) be placed on the sample interface of spectrometers 120, 200, and the reflection of emitted light at the external reference sample will be measured by spectrometers 120, 200—similar to... Figure 2 The content shown refers to sample 299. For auxiliary reference measurements, the reflection of emitted light at a predefined reflective target within the spectrometer is measured using spectrometers 120 and 200—similar to... Figure 2 The content is shown for a predefined reflective target 250. Reference measurements and auxiliary reference measurements can be performed simultaneously or one after another—similar to what has been explained above.
[0063] like Figure 2As shown, the optical path of the first light source 220 interacts with the sample interface 240, causing the measurement output by the detector 210 for the reflected light 221' to vary based on the sample 299 placed on the sample interface 240. The second light source 230 utilizes another optical path to a predefined reflective target 250 within the spectrometer. Therefore, the measurement output by the detector 210 for the reflected light 231' is independent of what is placed on the sample interface 240. In other words, the measurement output by the detector 210 for the reflected light 231' is substantially independent of what is placed on the sample interface 240.
[0064] Since the reference sample can have known spectral characteristics, reference measurements can be performed in the presence of the reference sample during factory calibration of spectrometers 120 and 200. In addition, auxiliary reference measurements of a predefined reflectance target 250 within spectrometers 120 and 200 can be performed during factory calibration to determine a reference ratio between the detector output for the reference measurement and the detector output for the auxiliary reference measurement.
[0065] Therefore, whether the reference measurement was performed correctly during the operation of the spectrometers 120 and 200 can be determined by comparing the relationship between the output of the running detector for the reference measurement and the output of the running detector for the auxiliary reference measurement with the reference ratio obtained during factory calibration.
[0066] In other words, to determine whether the measurement data 101 is reasonable, the processing circuitry 110 can be configured to determine the deviation of the ratio of the corresponding first measurement value to the corresponding second measurement value from the corresponding reference ratio of one or more photosensitive pixels. Further, the processing circuitry 110 can be configured to determine whether the measurement data 101 of the reference measurement is reasonable based on the corresponding deviation. In this manner, the effects of different conditions (such as different temperatures of the spectrometers 120 and 200 during factory calibration and operation) are offset by the use of the same detector, light source, etc.
[0067] When determining whether the measurement data 101 of the reference measurement is reasonable based on the corresponding deviation, various criteria can be used. For example, if the corresponding deviation is less than a first threshold, the processing circuit system 110 can be configured to determine that the measurement data 101 is reasonable. This can be represented as follows:
[0068] (3)
[0069] in, This indicates that one or more photosensitive pixels of spectrometers 120 and 200 represent the corresponding first measurement value for a reference measurement. This represents the corresponding second measurement value of one or more photosensitive pixels relative to an auxiliary reference measurement. Indicates a reference ratio, and This represents a first threshold. The first threshold can be, for example, 1% or less of the reference ratio, 5% or less of the reference ratio, 10% or less of the reference ratio, or 20% or less of the reference ratio. On the other hand, if at least one of the one or more deviations is greater than the first threshold, the processing circuitry 110 can be configured to determine that the measurement data 101 is unreasonable. If the measurement data 101 is unreasonable, the processing circuitry 130 can be configured not to forward the measurement data 101 to process 130. For example, if the sample placed on the sample interface of the spectrometers 120, 200 is a target sample instead of a reference sample used for reference measurement, then the ratio... Will be compared with reference ratio The differences are significant. Therefore, it can be determined that the reference measurement data 101 is unreasonable and will not be forwarded to process 130. Thus, unstable output of process 130 can be avoided.
[0070] In alternative examples where spectrometers 120 and 200 include multiple photosensitive pixels, if the relative differences between the deviations of the multiple photosensitive pixels are less than a second threshold, the processing circuitry 110 can be configured to determine that the measurement data 101 is reasonable. Conversely, if not all the relative differences between the deviations of the multiple photosensitive pixels are less than the second threshold, the processing circuitry 110 can be configured to determine that the measurement data 101 is unreasonable. The second threshold can be, for example, 1% or less, 5% or less, 10% or less, or 20% or less. In other words, if the relative differences with a reference ratio (which may be a calibration factor) are similar for all measurements of the detector, the reference measurement can be determined to be valid.
[0071] The aforementioned approach can be similarly used to determine the legitimacy of background measurements. For example, measurement data 101 can indicate a corresponding first measurement value of one or more photosensitive pixels of spectrometers 120, 200 for a background measurement and a corresponding second measurement value of the one or more photosensitive pixels for an auxiliary background measurement. For background measurements, it is expected that no sample is (should not) placed on the sample interface of spectrometers 120, 200, and it is expected that (should) the light received from the environment of spectrometers 120, 200 via sample interface 240 is measured by spectrometers 120, 200.
[0072] For auxiliary background measurements, the reflection of emitted light at a predefined reflective target within the spectrometer is measured using spectrometers 120 and 200—similar to... Figure 2 The content is shown for a predefined reflective target 250. Auxiliary background measurements and auxiliary reference measurements can be performed in the same manner. Background measurements and auxiliary background measurements can be performed simultaneously or one after another—similar to what has been explained above.
[0073] Reference background measurements under defined conditions can be performed during factory calibration of spectrometers 120 and 200. Additionally, auxiliary background measurements of predefined reflectance targets 250 within spectrometers 120 and 200 can be performed during factory calibration to determine a reference ratio between the detector output for the background measurement and the detector output for the auxiliary background measurement.
[0074] Therefore, whether the background measurement was performed correctly during the operation of the spectrometers 120 and 200 can be determined by comparing the relationship between the output of the running detector for the background measurement and the output of the running detector for the auxiliary background measurement with the reference ratio obtained during factory calibration.
[0075] In other words, to determine whether the measurement data 101 is reasonable, the processing circuitry 110 can be configured to determine the deviation of the ratio of the corresponding first measurement value to the corresponding second measurement value from the corresponding reference ratio of one or more photosensitive pixels. Further, the processing circuitry 110 can be configured to determine whether the measurement data 101 of the reference measurement is reasonable based on the corresponding deviation. In this manner, the effects of different conditions (such as different temperatures of the spectrometers 120 and 200 during factory calibration and operation) are offset by the use of the same detector, light source, etc.
[0076] When determining whether the measurement data 101 of the background measurement is reasonable based on the corresponding deviation, various criteria can be used. For example, if the corresponding deviation is less than a first threshold, the processing circuit system 110 can be configured to determine that the measurement data 101 is reasonable. This can be represented as follows:
[0077] (4)
[0078] in, This represents the first measurement value of one or more photosensitive pixels of spectrometers 120 and 200 relative to the background. This represents the corresponding second measurement value of one or more photosensitive pixels relative to the auxiliary background measurement. Indicates a reference ratio, and This represents a first threshold. The first threshold can be, for example, 1% or less of the reference ratio, 5% or less of the reference ratio, 10% or less of the reference ratio, or 20% or less of the reference ratio. On the other hand, if at least one of the one or more deviations is greater than the first threshold, the processing circuitry 110 can be configured to determine that the measurement data 101 is unreasonable. If the measurement data 101 is unreasonable, the processing circuitry 130 can be configured not to forward the measurement data 101 to process 130. For example, if the sample is placed on the sample interface of the spectrometer 120, 200 during background measurement or if there is dirt on the sample interface of the spectrometer 120, 200, then the ratio... Will be compared with reference ratio The differences are significant. Therefore, it can be determined that the background measurement data 101 is unreasonable and will not be forwarded to process 130. Thus, unstable output of process 130 can be avoided.
[0079] In alternative examples where spectrometers 120 and 200 include multiple photosensitive pixels, if the relative differences between the deviations of the multiple photosensitive pixels are less than a second threshold, the processing circuitry 110 can be configured to determine that the measurement data 101 is reasonable. Conversely, if not all the relative differences between the deviations of the multiple photosensitive pixels are less than the second threshold, the processing circuitry 110 can be configured to determine that the measurement data 101 is unreasonable. The second threshold can be, for example, 1% or less, 5% or less, 10% or less, or 20% or less. In other words, if the relative differences with a reference ratio (which may be a calibration factor) are similar for all measurements of the detector, the background measurement can be determined to be valid.
[0080] The first threshold and the second threshold used to determine the reasonableness of the measurement data 101 for the reference measurement and the measurement data 101 for the background measurement can be the same as or different from each other.
[0081] The measurements taken by spectrometers 120 and 200 for background measurements are affected by physical variations in the optical path of the spectrometers 120 and 200, such variations arising, for example, from placing an object on the sample interface of the spectrometers 120 and 200. Background measurements must be performed without a sample or object placed on the sample interface. Users may mistakenly place an object on the sample interface, or the sample interface may be contaminated.
[0082] During factory calibration under controlled conditions, reference measurements for background measurements can be obtained at different ambient temperatures (120°C, 200°C) on the spectrometer. These reference measurements allow verification that the optical path functions as required during background measurements during operation.
[0083] For example, measurement data 101 may indicate the measurement values of the photosensitive pixels of spectrometers 120 and 200 for background measurements. Measurement data 101 may further indicate the temperature during the background measurement. Metadata of measurement data 101 may, for example, indicate the temperature.
[0084] To determine whether the measurement data 101 is reasonable, the processing circuitry 110 can be configured to determine the deviation of the measured value from a temperature-dependent reference curve of the background measurement. The temperature-dependent reference curve indicates a reference value for the background measurement at different temperatures. For example, the temperature-dependent reference curve can be determined by the processing circuitry 110 based on stored reference measurements of the background measurement obtained during factory calibration of the spectrometer 120 and / or during operation of the spectrometer. In other examples, the temperature-dependent reference curve can be determined during factory calibration and stored in a storage device accessible by the processing circuitry 110.
[0085] If the deviation is less than a threshold, the processing circuit system 110 can be configured to determine that the measurement data 101 is reasonable. This can be represented as follows:
[0086] (5)
[0087] in, This indicates the measurement values taken by the 120 and 200 photosensitive pixels of the spectrometer against the background. This represents a temperature-dependent reference curve, and This represents a threshold. The threshold can be, for example, 1% or less, 5% or less, 10% or less, or 20% or less. On the other hand, if the deviation is greater than the threshold, the processing circuitry 110 can be configured to determine that the measurement data 101 is unreasonable. Whether the user correctly performed the background measurement (e.g., no object was placed on the sample interface during the background measurement) can be detected by comparing the measured value of the photosensitive pixel of the spectrometer 120 with a temperature-related reference curve. If the measurement data 101 is unreasonable, the processing circuitry 130 can be configured not to forward the measurement data 101 to process 130.
[0088] Figure 3 The diagram shows a comparison between an exemplary measurement 310 and an exemplary temperature-related reference curve 320. Figure 3 A simplified diagram (300) is shown. The horizontal axis represents temperature T, and the vertical axis represents the values of background measurements and relevant reference curves. The measured value of 310 is for a temperature... The measurement is performed using background measurements. If the deviation between the measured value 310 and the temperature-related reference curve 320 is less than a threshold, that is, if the distance along the vertical axis between the measured value 310 and the temperature-related reference curve 320 is less than a threshold value... If so, then it can be determined that the measurement data is reasonable.
[0089] As described above, the temperature-dependent reference curve can be determined by the processing circuitry 110 based on stored reference measurements (e.g., measurements of the last N background measurements determined to be reasonable) obtained during factory calibration of the spectrometer 120 and / or during spectrometer operation. For example, the processing circuitry 110 can be configured to generate the temperature-dependent reference curve based on N stored measurements of the photosensitive pixels for background measurements. The N stored measurements of the photosensitive pixels for background measurements can be obtained during factory calibration of the spectrometer 120 and / or during spectrometer operation (e.g., measurements of previous background measurements determined to be reasonable). N can be any integer greater than one. The temperature-dependent reference curve can be updated during spectrometer 120 operation. This is in... Figure 3 Further details were provided in [the document / section]. Figure 3 In the example, the temperature-related reference curve 320 is based on stored measurements 301, 302, 303, and 304, that is, in Figure 3 In the example, For example, a temperature-related reference curve can be generated by curve fitting N stored measurements.
[0090] If the background measurement data 101 is determined to be reasonable based on a comparison of the measured value with a temperature-related reference curve, then the processing circuitry system 110 can be configured to replace one of N stored measurements with the measurement value of the photosensitive pixel indicated in the background measurement data 101. For example, the oldest of the N stored measurements can be replaced with the measurement value of the photosensitive pixel indicated in the background measurement data 101. This allows for the updating of the N stored measurements. Figure 3 In the example, the stored measurement value 301 is the oldest among the stored measurements 301, 302, 303, and 304. Therefore, if the deviation of measurement value 310 from the temperature-related reference curve 320 is less than a threshold, the stored measurement value 301 can be replaced with measurement value 310. Alternatively or additionally, if one of the N stored measurements was measured at the same temperature as the measurement value of the photosensitive pixel indicated in the background measurement data 101, or at a temperature where the deviation from the temperature at which the measurement value of the photosensitive pixel indicated in the background measurement data 101 was measured is less than a temperature threshold (e.g., 0.1°C or less, 0.5°C or less, or 1°C or less, or 2°C or less), the stored measurement value can be replaced with the measurement value of the photosensitive pixel indicated in the background measurement data 101. Figure 3In the example, the stored measurement value 304 was measured at the temperature most similar to the temperature at which the measurement value 310 was measured. Therefore, if the temperature at which the stored measurement value 304 was measured is similar to the temperature at which the measurement value 310 was measured... If the deviation is less than the temperature threshold, the stored measurement value 304 can be replaced with the measurement value 310.
[0091] For illustrative purposes only, Figure 3 An exemplary updated temperature-related reference curve 330 is further shown by the processing circuit system 110 after replacing one of the stored measurements 301, 302, 303, and 304 with the measured value 310.
[0092] Updating the N stored measurements used to generate the temperature-related reference curve allows for the replacement of outdated measurements. For example, one or more of the N stored measurements may become outdated due to external factors, such as physical damage to the spectrometer's sample interface.
[0093] As described above, the aforementioned exemplary method for determining the reasonableness of the spectrometer's measurement data can be used by the processing circuit system 110, alone or in combination, to determine the reasonableness of the measurement data 101.
[0094] The above-described device 100 can be used in various equipment. Reference will be made below. Figure 4 and Figure 5 Two exemplary devices using device 100 are described. However, it should be noted that this disclosure is not limited thereto. Device 100 can also be used in other devices.
[0095] Figure 4 An example of a mobile device 400 (e.g., mobile phone, smartphone, tablet computer, or laptop computer) that includes the apparatus 100 described above for processing measurement data 101 from a spectrometer is illustrated.
[0096] Mobile device 400 may further include a spectrometer 410 configured to generate measurement data 101 based on measured radiation. For example, spectrometer 410 may be implemented as described above with spectrometers 120 and 200. In other words, mobile device 400 may include an integrated spectrometer. Device 100 is communicatively coupled to spectrometer 410.
[0097] In an alternative example, the mobile device 400 may omit the spectrometer 410 and instead include an interface circuitry 420 configured to receive measurement data 101 from a spectrometer 430 located external to the mobile device 400. In other words, the mobile device 400 may alternatively receive measurement data 101 from a spectrometer separate from the mobile device. The spectrometer 430 may also be implemented as described above with spectrometers 120 and 200. The device 100 is communicatively coupled to the interface circuitry 420. The interface circuitry 420 may be configured for wireless and / or wired communication with the external spectrometer 430.
[0098] The mobile device 400 may include additional components such as an application processor, a baseband processor, memory, a wireless communication circuitry (e.g., for wireless communication according to mobile communication standards defined by the 3GPP or wireless communication standards such as 802.11 defined by the Institute of Electrical and Electronics Engineers (IEEE), an audio driver, a camera driver, a touchscreen, a display driver, sensors, memory, removable memory, a power management integrated circuit, or a battery.
[0099] The process 130 described above for evaluating measurement data deemed reasonable can be executed by the circuitry (e.g., application processor) of the mobile device 400. In other examples, the process 130 can be executed at a server or computing cloud communicatively coupled to the mobile device 400. In these examples, the mobile device 400 can be configured to transmit the deemed reasonable measurement data to the server or computing cloud running the process 130. The mobile device 400 can be further configured to receive conclusions, analysis results, or recommendations output by the process 130 from the server or computing cloud running the process 130. The mobile device 130 can, for example, be configured to output a GUI including graphical elements, such as text and / or graphics representing the conclusions, analysis results, or recommendations output by the process 130.
[0100] Figure 5 An example of a server 500, including the aforementioned apparatus 100 for processing measurement data 101 from a spectrometer, is illustrated schematically. The server 500 may be, for example, part of a data center or a computing cloud.
[0101] Server 500 includes an interface circuitry system 510 configured to receive measurement data 101 from a spectrometer 520 located external to server 500. In other words, server 500 receives measurement data 101 from a spectrometer separate from server 500. Spectrometer 520 can be implemented as described above with spectrometers 120 and 200. Device 100 is communicatively coupled to interface circuitry system 510. Interface circuitry system 510 can be configured for wireless and / or wired communication with external spectrometer 520 or intermediate devices (e.g., mobile phones or tablets) that relay measurement data 101 from spectrometer 520 to the server.
[0102] The aforementioned process 130 for evaluating measurement data deemed reasonable can be executed by the circuitry of server 500 (e.g., the processing circuitry of device 100 or another processing circuitry of the server). Server 500 can be further configured to transmit the conclusions, analysis results, or recommendations output by process 130 from the server to a user's terminal device (e.g., mobile phone, tablet computer, desktop computer, or laptop computer) to output the conclusions, analysis results, or recommendations to the user.
[0103] To further highlight the above measurement data processing, Figure 6 A flowchart illustrating an exemplary method 600 for processing measurement data from a spectrometer is provided. Method 600 includes receiving measurement data at 602 and determining at 604 whether the measurement data is reasonable. If the measurement data is determined to be reasonable, method 600 includes forwarding the measurement data at 606 to a process for evaluating the measurement data. Alternatively, if the measurement data is determined to be unreasonable, method 600 may include not forwarding the measurement data at 608 to a process for evaluating the measurement data.
[0104] Similar to the above, method 600 only feeds reasonable measurement data into the process used to evaluate the measurement data. Therefore, it avoids inputting erroneous or invalid measurement data into the data analysis model (such as a chemometric model), which in turn prevents a poor user experience.
[0105] In combination with the proposed technology or one or more of the examples above (e.g., Figures 1 to 5 This section explains further details and aspects of method 600. Method 600 may include one or more additional optional features corresponding to one or more aspects of the proposed technique or one or more examples above.
[0106] In some of the examples above, one or more reference values (such as reference ratios or reference thresholds) are used for reasonableness determination at runtime. One or more reference values may be prepared in advance based on the examples in this disclosure. Figure 7A flowchart is shown for an exemplary method 700 that enables the reasonableness determination of spectrometer measurement data at runtime.
[0107] Method 700 includes performing a factory calibration of the spectrometer under defined conditions (702). Factory calibration refers to the process of calibrating the spectrometer at a manufacturing plant according to defined standards of defined conditions before it is shipped to a user or distributor. During factory calibration, the spectrometer is adjusted to ensure that it meets defined accuracy standards and operates within the expected tolerance range. Further, method 700 includes determining one or more reference values (704) based on measurement data generated by the spectrometer during factory calibration. The one or more reference values may be, for example, one of the values used for a reasonableness determination during operation in one or more of the examples described above. Method 700 further includes storing the one or more reference values (706) in a data storage device accessible by a device for determining whether the measurement data generated by the spectrometer during user operation is reasonable. As mentioned above, the device 100 for determining whether the measurement data generated by the spectrometer during user operation is reasonable may be part of a mobile device or a server. Therefore, the data storage device may be part of a mobile device or a server. In other examples, the data storage device may be a cloud storage device accessible by device 100.
[0108] Method 700 allows providing one or more reference values such that these reference values can be used to determine reasonableness at runtime based on one or more of the examples above.
[0109] The aspects and features described in the specific examples in the foregoing examples can also be combined with one or more examples in other examples to replace the same or similar features of the other examples, or to introduce features into the other examples.
[0110] The examples may further be or relate to a (computer) program that includes program code for performing one or more of the methods described above when executed on a computer, processor, or other programmable hardware component. Therefore, the steps, operations, or processes of the different methods described above can also be performed by a programmed computer, processor, or other programmable hardware component. The examples may also cover program storage devices (such as digital data storage media) that are machine-readable, processor-readable, or computer-readable, and that encode and / or contain machine-executable, processor-executable, or computer-executable programs and instructions. For example, program storage devices may include or be digital storage devices, magnetic storage media (such as disks and tapes), hard disk drives, or optically readable digital data storage media. Other examples may include computers, processors, control units, (field-programmable arrays) ((F)PLAs), (field-programmable gate arrays) ((F)PGAs), graphics processing units (GPUs), ASICs, integrated circuits (ICs), or SoCs programmed to perform the steps of the methods described above.
[0111] It will be further understood that the disclosure of several steps, processes, operations, or functions in the specification or claims should not be construed as implying that these operations necessarily depend on the described order, unless expressly stated in individual cases or necessary for technical reasons. Therefore, the preceding description does not limit the execution of several steps or functions to a certain order. Furthermore, in other examples, a single step, function, process, or operation may include and / or be decomposed into several sub-steps, sub-functions, sub-processes, or sub-operations.
[0112] If aspects of a device or system have already been described, these aspects should also be understood as descriptions of the corresponding method. For example, a block, device, or functional aspect of the device or system may correspond to a feature of the corresponding method, such as method steps. Therefore, aspects of the method description should also be understood as descriptions of corresponding blocks, components, characteristics, or functional features of the corresponding device or system.
[0113] The claims are hereby incorporated into the detailed description, wherein each claim may stand alone as a separate example. It should also be noted that although in the claims, a dependent claim refers to a specific combination with one or more other claims, other examples may also include combinations of dependent claims with the subject matter of any other dependent or independent claim. Such combinations are hereby expressly stated unless it is stated in individual cases that a particular combination is not intended. Furthermore, even if a claim is not directly defined as dependent on any other independent claim, the features of that claim should be included with respect to that other independent claim.
Claims
1. An apparatus (100) for processing measurement data (101) from a spectrometer (120, 200), the apparatus (100) comprising a processing circuit system (110) configured to: Receive the measurement data (101); Determine whether the measurement data (101) is reasonable; and If the measurement data (101) is determined to be reasonable, the measurement data (101) is forwarded to the process (130) for evaluating the measurement data (101).
2. The apparatus (100) as claimed in claim 1, wherein, The measurement data (101) indicates a corresponding first measurement value of one or more photosensitive pixels of the spectrometer (120, 200) for a reference measurement of an external reference sample placed on the sample interface of the spectrometer (120, 200), and a corresponding second measurement value of the one or more photosensitive pixels for an auxiliary reference measurement of a predefined reflectance target within the spectrometer (120, 200), wherein, in order to determine whether the measurement data (101) is reasonable, the processing circuitry (110) is configured to: Determine the deviation between the corresponding ratio of the corresponding first measurement value and the corresponding second measurement value and the corresponding reference ratio of the one or more photosensitive pixels; and Based on the corresponding deviation, determine whether the measurement data (101) of the reference measurement is reasonable.
3. The apparatus (100) as claimed in claim 1 or claim 2, wherein, The measurement data (101) indicates a corresponding first measurement value of one or more photosensitive pixels of the spectrometer (120, 200) for a background measurement on the sample interface of the spectrometer (120, 200) where no sample is placed, and a corresponding second measurement value of the one or more photosensitive pixels for an auxiliary background measurement of a predefined reflective target within the spectrometer (120, 200), wherein, in order to determine whether the measurement data (101) is reasonable, the processing circuitry (110) is configured to: Determine the deviation between the corresponding ratio of the corresponding first measurement value and the corresponding second measurement value and the corresponding reference ratio of the one or more photosensitive pixels; and Based on the corresponding deviation, determine whether the measurement data (101) of the background measurement is reasonable.
4. The apparatus (100) as claimed in claim 2 or claim 3, wherein, The processing circuitry (110) is configured to determine that the measurement data (101) is reasonable under the following conditions: The corresponding deviation is less than the first threshold; and / or The relative difference between the deviations of the multiple photosensitive pixels is less than the second threshold.
5. The apparatus (100) as claimed in claim 1 or claim 2, wherein, The measurement data (101) indicates the measurement value of the photosensitive pixel of the spectrometer (120, 200) against a background measurement on the sample interface of the spectrometer (120, 200) where no sample is placed, and further indicates the temperature at which the background measurement was performed, wherein, in order to determine whether the measurement data (101) is reasonable, the processing circuit system (110) is configured to: Determine the deviation of the measured value from a temperature-correlation reference curve of the background measurement, which indicates the reference value of the background measurement at different temperatures; and If the deviation is less than the threshold, then the measurement data (101) of the background measurement is determined to be reasonable.
6. The apparatus (100) as claimed in claim 5, wherein, The processing circuit system (110) is further configured to: The temperature-related reference curve is generated based on N stored measurements taken against the background by the photosensitive pixel; as well as If it is determined that the measurement data (101) of the background measurement is reasonable, then one of the N stored measurement values is replaced with the measurement value of the photosensitive pixel indicated in the measurement data (101) of the background measurement.
7. The apparatus (100) as claimed in claim 1, wherein, The measurement data (101) indicates the corresponding measurement values of two or more photosensitive pixels of the spectrometer (120, 200) for a reference measurement of an external reference sample placed on the sample interface of the spectrometer (120, 200), a background measurement of a sample interface where no sample is placed, and a sample measurement of a target sample placed on the sample interface, wherein the two or more photosensitive pixels are sensitive to light within the same wavelength range, and wherein, in order to determine whether the measurement data (101) is reasonable, the processing circuitry (110) is configured to: For each of the two or more photosensitive pixels, the corresponding absorbance value of the target sample is determined based on the corresponding measurements of the reference measurement, the background measurement, and the sample measurement; If the determined absorbance values differ from each other by less than a threshold, then the measurement data (101) is deemed reasonable.
8. The apparatus (100) as claimed in claim 1, wherein, The measurement data (101) indicates the corresponding measurement values of one or more photosensitive pixels of the spectrometer (120, 200) for reference measurements of an external reference sample placed on the sample interface of the spectrometer (120, 200), background measurements of a sample interface where no sample is placed, and sample measurements of a target sample placed on the sample interface, and wherein, in order to determine whether the measurement data (101) is reasonable, the processing circuitry (110) is configured to: For the one or more photosensitive pixels, the corresponding absorbance value of the target sample is determined based on the corresponding measurements of the reference measurement, the background measurement, and the sample measurement; If the determined absorbance value for each of the one or more photosensitive pixels is within the reference range for the corresponding photosensitive pixel, then the measurement data (101) is determined to be reasonable.
9. The apparatus (100) as claimed in claim 1, wherein, The measurement data (101) indicates the measurement values of the photosensitive pixels of the spectrometer (120, 200) for reference measurements of an external reference sample placed on the sample interface of the spectrometer (120, 200) and background measurements of a sample interface where no sample is placed, and wherein, in order to determine whether the measurement data (101) is reasonable, the processing circuit system (110) is configured to: Determine the deviation of the ratio of the reference measurement to the background measurement from the reference ratio; and If the deviation is less than the threshold, then the measurement data (101) of the reference measurement and the background measurement are determined to be reasonable.
10. The apparatus (100) according to any one of claims 1 to 9, wherein, To determine whether the measurement data (101) is reasonable, the processing circuit system (110) is configured to: Extract metadata from the measurement data (101) to form a measurement set, wherein the metadata indicates at least one of the measurement time of the corresponding measurement in the measurement set and the temperature at which the corresponding measurement in the measurement set was performed; and If the metadata meets the predefined criteria, then it is reasonable to determine that the measurement data (101) that form the measurement set is reasonable.
11. The apparatus (100) according to any one of claims 1 to 10, wherein, If it is determined that the measurement data (101) is unreasonable, the processing circuit system (110) is further configured to cause the human-machine interface to output a notification that the measurement is repeated using the spectrometer (120, 200).
12. The apparatus (100) as claimed in claim 11, wherein, The processing circuit system (110) is further configured to: Identify at least one improvement recommendation for repeating the measurement using the spectrometer (120, 200); and The human-machine interface shall output at least one improvement suggestion.
13. A mobile device (400), comprising: The apparatus (100) for processing measurement data (101) of a spectrometer according to any one of claims 1 to 14; and One of the following: The spectrometer (410) is configured to generate the measurement data (101) based on the measured radiation; or An interface circuit system (420) is configured to receive the measurement data (101) from the spectrometer (430), wherein the spectrometer (430) is located outside the mobile device (400).
14. A method (600) for processing measurement data from a spectrometer, the method comprising: Receive (602) the measurement data; Determine (604) whether the measurement data is reasonable; as well as If the measurement data is determined to be reasonable, the measurement data is forwarded (606) to the process for evaluating the measurement data.
15. A non-transitory machine-readable medium having a program stored thereon, the program having program code for performing the method of claim 14 when the program is executed on a processor or programmable hardware.