Processing device, processing system, processing method, program, and storage medium

Abstract

The processing apparatus of the embodiment receives a detection result of the intensity of the reflected wave detected by a detector, the detector including: a detection unit for transmitting ultrasonic waves and detecting the reflected waves; and a propagation unit for propagating the ultrasonic waves and the reflected waves. Based on the detection result, the apparatus performs a first determination of the state of the detection unit and a second determination of the state of the propagation unit.

Description

[0001] This application is a divisional application of application number 202180040697.3, filed on June 17, 2021, entitled "Processing apparatus, processing system, processing method, program and storage medium". Technical Field

[0002] Embodiments of the present invention relate to processing apparatus, processing system, processing method, program, and storage medium. Background Technology

[0003] In ultrasound inspections, detectors are used to transmit and detect reflected ultrasound waves. For appropriate inspection results, it is desirable that the detector shows no abnormalities. A technique is needed to identify abnormalities related to the detector.

[0004] Existing technical documents Patent documents Patent Document 1: Japanese Patent Application Publication No. 2019-90727 Summary of the Invention

[0005] The technical problem that the invention aims to solve The technical problem to be solved by the present invention is to provide a processing device, processing system, processing method, program and storage medium capable of judging anomalies related to a detector.

[0006] Means for solving technical problems The processing apparatus of the embodiment receives the detection result of the intensity of the reflected wave detected by the detector, which includes a detection unit for transmitting ultrasonic waves and receiving reflected waves, and a propagation unit for propagating the ultrasonic waves and the reflected waves. Based on the detection result, the processing apparatus performs a first determination of the state of the detection unit and a second determination of the state of the propagation unit. Attached Figure Description

[0007] Figure 1 This is a block diagram illustrating the configuration of the processing system in the implementation method.

[0008] Figure 2 This is a diagram illustrating the state of non-destructive inspection.

[0009] Figure 3 This is a schematic diagram showing the internal structure of the detector.

[0010] Figure 4 This is a schematic diagram illustrating the checks performed by the processing system of the embodiment.

[0011] Figure 5 This is a schematic diagram illustrating the 3D detection results obtained through exploration.

[0012] Figure 6 This is a schematic diagram representing a portion of the detector.

[0013] Figure 7 This is a flowchart representing the first judgment.

[0014] Figure 8 This is a schematic diagram illustrating the first intensity data.

[0015] Figure 9 This is a schematic diagram representing a portion of the detector.

[0016] Figure 10 This is a flowchart representing the second judgment.

[0017] Figure 11 This is a schematic diagram illustrating the second intensity data.

[0018] Figure 12 This is a schematic diagram illustrating the configuration of a processing system in a modified embodiment.

[0019] Figure 13 This is a perspective view showing a portion of a processing system in a modified embodiment.

[0020] Figure 14 This is a flowchart illustrating the operation of the processing system in a modified embodiment.

[0021] Figure 15 It is a block diagram representing the hardware configuration of the processing device. Detailed Implementation

[0022] Hereinafter, various embodiments of the present invention will be described with reference to the accompanying drawings.

[0023] The accompanying drawings are schematic or conceptual, and the relationship between the thickness and width of each part, the ratio of the size between parts, etc., are not necessarily the same as in reality. Even when representing the same part, there may be cases where the dimensions and / or ratios of each other are represented differently according to the accompanying drawings.

[0024] In this application specification and figures, the same reference numerals are given to elements that are already described, and detailed descriptions are appropriately omitted.

[0025] Figure 1 This is a block diagram illustrating the configuration of the processing system in the implementation method.

[0026] like Figure 1 As shown, the processing system 100 of this embodiment includes a processing device 110 and a storage device 120. The storage device 120 stores data related to welding inspection. The processing device 110 processes the data related to welding inspection.

[0027] Figure 1 The processing system 100 shown also includes a detector 130, an input device 140, and a display device 150. The detector 130 sends ultrasonic waves toward the object and detects (receives) the reflected waves. The detector 130 includes, for example, a probe. Hereinafter, the transmission of ultrasonic waves and the detection of reflected waves by the detector 130 will also be referred to as probing.

[0028] The processing device 110 performs various processes based on the detected reflected waves. For example, the processing device 110 can display a user interface on the display device 150. The user can view the data obtained through processing via the user interface displayed on the display device 150. The user can also input data to the processing device 110 via the input device 140 through the user interface.

[0029] The processing device 110 is connected to the storage device 120, the detector 130, the input device 140, and the display device 150 via wired communication, wireless communication, or a network.

[0030] Specific instructions regarding welding inspection. Non-destructive inspection of the welded parts is conducted during welding inspection.

[0031] Figure 2 This is a diagram illustrating the state of non-destructive inspection. Figure 3 This is a schematic diagram showing the internal structure of the detector.

[0032] Detector 130, for example Figure 2 The detector 130 is shaped so that it can be held by hand. The person holding the detector 130 brings the front end of the detector 130 into contact with the welded part 13 to inspect the welded part 13.

[0033] Detector 130 Figure 3 The diagram shows a detection unit 131 and a propagation unit 133. The detection unit 131 includes a plurality of detection elements 132. Each detection element 132 is, for example, a transducer that emits ultrasonic waves with a frequency between 1 MHz and 100 MHz. The plurality of detection elements 132 are arranged in mutually intersecting first and second directions. Figure 3 In the example shown, multiple detection elements 132 are arranged in mutually orthogonal X and Y directions.

[0034] A propagation section 133 is disposed at the front end of the detector 130. The detection section 131 is covered by the propagation section 133. When the front end of the detector 130 contacts the welding section 13, the propagation section 133 is located between the detection section 131 and the welding section 13. If the detection section 131 emits ultrasonic waves, the ultrasonic waves propagate in the propagation section 133 and are transmitted to the outside of the detector 130. If the ultrasonic waves are reflected, the reflected waves propagate in the propagation section 133 and reach the detection section 131. The detection section 131 detects the reflected waves and sends a signal (current) representing the intensity of the reflected waves to the processing device 110. The magnitude (current value) of the current sent from the detection section 131 corresponds to the intensity of the reflected waves. The processing device 110 determines the intensity of the reflected waves based on the current value.

[0035] The propagation section 133 is made of a resin material or similar material that facilitates the propagation of ultrasonic waves. By providing a propagation section 133 whose shape corresponds to the surface of the welded part 13, ultrasonic waves can easily propagate into the interior of the welded part 13. The propagation section 133 can suppress deformation and damage to the detection section 131 when the detector 130 contacts the welded part 13. The propagation section 133 has sufficient hardness to suppress deformation and damage when it contacts the welded part 13.

[0036] like Figure 3 As shown, the detector 130 also includes a plurality of wirings 132a. The plurality of detection elements 132 are respectively connected to the plurality of wirings 132a. The detection elements 132 send signals to the processing device 110 through the wirings 132a. For example, as... Figure 2 As shown, multiple wirings 132a are bundled together as cables 132b and connected to the processing device 110.

[0037] Figure 2 as well as Figure 3 This indicates the condition of the component 10, which is to be welded. Component 10 is manufactured by spot welding its metal plates 11 (first component) and 12 (second component) at the welding section 13. (Example) Figure 3 As shown, a solidified portion 14 is formed in the welded portion 13. The solidified portion 14 is formed by melting and mixing a part of the metal plate 11 and a part of the metal plate 12 and then solidifying them.

[0038] For example, during inspection, it is investigated whether a weld 13 has been formed. Furthermore, during inspection, the diameter of the weld 13 and whether its diameter is sufficient are investigated. During inspection, a couplant 15 is applied to the surface of the object to facilitate the propagation of ultrasonic waves between the object and the detector 130. Each detection element 132 sends ultrasonic waves US towards the component 10 coated with couplant 15 and detects the reflected waves RW from the component 10.

[0039] For example, Figure 3As shown, a detection element 132 sends an ultrasonic wave US towards the weld 13. A portion of the ultrasonic wave US is reflected by the upper or lower surface of the component 10. Multiple detection elements 132 respectively receive (detect) its reflected wave RW. During the inspection, each detection element 132 sequentially sends an ultrasonic wave US and detects each reflected wave RW using multiple detection elements 132. The detector 130 sends the detection result to the processing device 110. Alternatively, the detector 130 may also store the detection result in the storage device 120. The processing device 110 obtains the detection result and inspects the weld based on the detection result.

[0040] Figure 4 This is a schematic diagram illustrating the checks performed by the processing system of the embodiment.

[0041] like Figure 4 As shown in (a), the ultrasonic wave US is reflected by the surface 133a of the propagation part 133, the upper surface 11a and the lower surface 11b of the metal plate 11, and the upper surface 13a and the lower surface 13b of the welding part 13.

[0042] The positions of surfaces 133a, 11a, 13a, 11b, and 13b in the Z-direction are different from each other. That is, the distances in the Z-direction between these surfaces and the detection element 132 are different from each other. If the detection element 132 detects reflected waves from these surfaces, the peak values ​​of the reflected wave intensity are detected. By calculating the time from the transmission of the ultrasonic wave US until the detection of each peak value, it is possible to investigate which surface reflected the ultrasonic wave US.

[0043] Figure 4 (b) and Figure 4 (c) is a graph illustrating the relationship between the time elapsed after the ultrasonic wave US is transmitted and the intensity of the reflected wave RW. Figure 4 (b) and Figure 4 In (c), the horizontal axis represents the intensity of the detected reflected wave RW. The vertical axis represents the elapsed time after the ultrasonic wave US was transmitted. Time, in other words, is the position in the Z direction. Figure 4 The graph in (b) shows the detection results of the reflected waves RW from the upper surface 11a and the lower surface 11b of the metal plate 11. Figure 4 The graph in (c) illustrates the detection results of the reflected wave RW from the upper surface 13a and lower surface 13b of the weld 13. Here, the intensity of the reflected wave RW is expressed in absolute value.

[0044] exist Figure 4 (b) and Figure 4In the curve (c), peak Pe10 is based on the reflected wave RW from surface 133a. Peak Pe11 is based on the reflected wave RW from the upper surface 11a. Peak Pe12 is based on the reflected wave RW from the lower surface 11b. The time from the transmission of the ultrasonic wave US to the detection of peaks Pe11 and Pe12 corresponds to the Z-direction positions of the upper surface 11a and lower surface 11b of the metal plate 11, respectively.

[0045] Similarly, peak Pe13 is based on the reflected wave RW from the upper surface 13a. Peak Pe14 is based on the reflected wave RW from the lower surface 13b. The time from the transmission of the ultrasonic wave US to the detection of peak Pe13 and peak Pe14 corresponds to the Z-direction positions of the upper surface 13a and lower surface 13b of the welded portion 13, respectively.

[0046] The processing device 110 determines whether a peak value Pe12 exists in the intensity distribution of reflected waves in the Z direction at each point in the X-Y plane. Specifically, the processing device 110 detects peak values ​​within a specified range in the Z direction where a peak value Pe12 might be detected. The processing device 110 compares the intensity of the peak value with a specified threshold. If the peak value exceeds the threshold, the processing device 110 determines that the peak value is a peak value Pe12. The presence of a peak value Pe12 indicates that the lower surface 11b exists at that point, and the metal plates 11 and 12 are not bonded. The processing device 110 determines the point where a peak value Pe12 is detected as not bonded. The processing device 110 sequentially determines whether each point in the X-Y plane is bonded. The set of points determined to be bonded corresponds to the weld portion 13.

[0047] The intensity of the reflected wave can be represented in any form. For example, the intensity of the reflected wave output from the detection element 132 may contain both positive and negative values ​​depending on the phase. Various processing methods can be performed based on the reflected wave intensity containing both positive and negative values. The reflected wave intensity containing both positive and negative values ​​can also be transformed into an absolute value. The average value of the reflected wave intensity at each time point can also be subtracted. Alternatively, a weighted average value, a weighted moving average value, or the like can be subtracted from the reflected wave intensity at each time point. Even when using the result of applying these processing methods to the reflected wave intensity, the various processing methods described in this application can be performed.

[0048] For example, the processing device 110 calculates the diameter of the weld portion 13 as an inspection result. The diameter is the length of the weld portion 13 in any direction parallel to the X-Y plane. The processing device 110 may also calculate the thickness of the weld portion 13 or the depth of the upper surface 13a of the weld portion 13 as an inspection result. The thickness of the weld portion 13 is the distance in the Z direction between the upper surface 13a and the lower surface 13b. The thickness of the weld portion 13 can be calculated based on the time difference TD1 between peak values ​​Pe13 and Pe14. The depth of the upper surface 13a is the distance in the Z direction between the upper surfaces 11a and 13a. The depth of the upper surface 13a can be calculated based on the time difference TD2 between peak values ​​Pe11 and Pe13. The processing device 110 may also determine whether the weld is suitable or not based on at least one of the diameter of the weld portion 13, the thickness of the weld portion 13, and the depth of the upper surface 13a, and output the determination result as an inspection result.

[0049] Figure 5 This is a schematic diagram illustrating the 3D detection results obtained through exploration.

[0050] During the investigation, as described above, each detection element 132 sequentially sends ultrasonic waves, and multiple detection elements 132 detect each reflected wave. Figure 3 In the specific example shown, there are a total of 80 detection elements 132, 10 in the X direction and 8 in the Y direction. In this case, the 80 detection elements 132 sequentially transmit ultrasonic waves. Each detection element 132 repeatedly detects the reflected waves 80 times. The detection result of the intensity distribution of the reflected waves in the Z direction is output from each detection element 132. The intensity distributions of the 80 reflected waves output from each detection element 132 are summed. The summed intensity distribution becomes the intensity distribution at the coordinates where each detection element 132 is set in one detection. The same processing is performed on the detection results of each of the 80 detection elements 132. Thus, the intensity distribution of the reflected waves in the Z direction is generated at each point in the X-Y plane. Figure 5 The 3D intensity distribution is shown using an image. Figure 5 In the image, the brighter areas represent the regions with higher intensity reflected ultrasound waves. Three-dimensional intensity distribution data were used in the examination.

[0051] In addition to inspection, the processing device 110 also performs a first determination and a second determination. In the first determination, the processing device 110 determines the state of the detection unit 131. In the second determination, the processing device 110 determines the state of the propagation unit 133.

[0052] (First judgment) Figure 6 This is a schematic diagram representing a portion of the detector.

[0053] like Figure 6As shown, in the detection unit 131, there may be abnormalities in a portion of the multiple detection elements 132 or a portion of the multiple wirings 132a. For example, there may be a break in the wiring 132a, damage to the detection element 132, poor connection between the detection element 132 and the wiring 132a, or the detection element 132 may not operate. Alternatively, there may be damage to the wiring 132a, poor connection between the detection element 132 and the wiring 132a, or the current flowing through the detection element 132 may be smaller than the original current.

[0054] In these cases, the detection element 132, or the detection element 132 connected to the wiring 132a, cannot properly perform the detection of ultrasonic wave transmission or reflection. If the detection result obtained when there is an abnormality in the detection unit 131 is used for the inspection of the welding unit 13, an appropriate inspection result related to the welding unit 13 cannot be obtained. In the first determination, the processing device 110 determines whether there is no... Figure 6 An abnormality was found in the detection unit 131 as shown.

[0055] Figure 7 This is a flowchart representing the first judgment. Figure 8 This is a schematic diagram illustrating the first intensity data.

[0056] exist Figure 8 In the diagram, the horizontal axis represents the elapsed time after the ultrasonic wave is transmitted. The vertical axis represents the intensity of the reflected wave at each time point. Figure 8 The intensity is represented using absolute values. The intensity on the vertical axis represents the sum of the intensities detected by each detection element 132 at each time point. In other words, then... Figure 8 This indicates how the total intensity of reflected waves in the X-Y plane is distributed along the Z direction.

[0057] In the first determination, the processing device 110 selects one detection element 132 and sends a signal (current) toward that detection element 132 (step S11). If the selected detection element 132 receives the signal, it sends an ultrasonic wave. Then, multiple detection elements 132 detect their reflected waves. The processing device 110 receives the detection results. The processing device 110 uses the detection results of each detection element 132 at each point in the Z direction to generate... Figure 8 The first intensity data shown (step S12). The first intensity data is obtained, for example, by summing multiple detection results. Alternatively, an average or weighted average may be used instead of summing.

[0058] As a specific example, if Figure 3If one of the 80 detection elements 132 shown transmits an ultrasonic wave US, then all 80 detection elements 132 detect the reflected wave RW. The processing device 110 sums the intensity distribution in the Z direction detected by the 80 detection elements 132. This generates first intensity data. The processing device 110 stores the generated first intensity data in the storage device 120.

[0059] The processing device 110 determines whether all detection elements 132 have been selected (step S13). If there are unselected detection elements 132, step S11 is executed again for one unselected detection element. By repeating steps S11 and S12, multiple first intensity data are generated. For example, if 80 detection elements 132 send ultrasonic waves US respectively, 80 first intensity data are generated.

[0060] If steps S11 and S12 have been performed for all detection elements 132, the processing device 110 selects one of a plurality of first intensity data and detects the intensity of a portion of the reflected wave in that one first intensity data (step S14). For example, Figure 8 As shown, a first range Ra1 in the Z direction capable of detecting reflected waves from surface 133a is preset. The processing device 110 compares the intensity of the reflected waves in the first range Ra1 with a preset first threshold (step S15). When the intensity is above the first threshold, the processing device 110 determines that the detection element 132, which transmitted ultrasound waves related to the first intensity data, is normal. When the intensity is below the first threshold, the processing device 110 determines that the detection element 132 is abnormal. The processing device 110 stores the determination result in the storage device 120.

[0061] As a specific example, the processing device 110 is as follows: Figure 8 The detection device 110 detects the first peak value Pe1, which has the highest intensity within the first range Ra1. The processing device 110 compares the intensity of the first peak value Pe1 with a first threshold Th1. When the intensity of the first peak value Pe1 is greater than or equal to the first threshold Th1, the processing device 110 determines that the detection element 132, which transmitted the ultrasonic wave when the first intensity data was acquired, is normal. When the intensity of the first peak value Pe1 is less than the first threshold Th1, the processing device 110 determines that the detection element 132 is abnormal. In addition to peak intensity, the processing device 110 can also compare the cumulative or average intensity value within the first range Ra1 with the first threshold Th1 to determine the state of the detection element 132.

[0062] When the detection element 132 is determined to be abnormal, the processing device 110 sends the first information (step S16). The first information indicates that the detection unit 131 is abnormal. When the detection element 132 is determined to be normal, the processing device 110 determines whether all the first intensity data has been selected (step S17). If there is unselected first intensity data, step S14 is executed again for the one unselected first intensity data. After the first information is sent, or when there is no unselected first intensity data, the processing device 110 ends the first determination.

[0063] The specific details of the processing in the first determination can be appropriately modified. For example, in the first determination, the processing device 110 may execute steps S14 and S15 whenever the first intensity data is received. When all the detection elements 132 are determined to be normal, the processing device 110 may also send a message indicating that there is no abnormality in the detection unit 131.

[0064] (Second Judgment) Figure 9 This is a schematic diagram representing a portion of the detector.

[0065] When the detector 130 is brought into contact with the front end of the component 10, such as Figure 9 As shown, there is a case where a foreign object F is attached to the propagation section 133. The foreign object F is, for example, a fine metal particle. If the foreign object F is attached to the propagation section 133, the ultrasonic wave US is scattered by the foreign object F on the surface 133a of the propagation section 133. The reflected wave RW advancing towards the detection section 131 decreases, and the intensity of the reflected wave detected by the detection section 131 decreases. If a large amount of foreign object F is attached to the propagation section 133, the intensity of the detected reflected wave decreases significantly. If the detection result obtained when there is an abnormality in the propagation section 133 is used for the inspection of the welded section 13, an appropriate inspection result related to the welded section 13 cannot be obtained. In the second determination, the processing device 110 determines whether there is... Figure 9 The abnormality of the propagation section 133 as shown.

[0066] Figure 10 This is a flowchart representing the second judgment. Figure 11 This is a schematic diagram illustrating the second intensity data.

[0067] exist Figure 11 In the diagram, the horizontal axis represents the elapsed time since the ultrasonic wave was emitted. The vertical axis represents the intensity of the reflected wave at each time point. Figure 11 The intensity is represented by absolute values. Furthermore, the intensity on the vertical axis represents the sum of the intensities at each time point during a single exploration.

[0068] The processing device 110 causes the detection unit 131 to perform a detection (step S21). The processing device 110 uses the detection results obtained through the detection to generate second intensity data (step S22). The second intensity data is the sum of at least a portion of the multiple intensity data obtained by detecting the reflected wave by multiple detection elements 132 during the detection. The second intensity data may also be the average or weighted average of at least a portion of the multiple intensity data. Multiple first intensity data may also be used to generate the second intensity data. For example, the second intensity data may be generated by summing, averaging, or weighting multiple first intensity data. If the first determination is performed before the second determination, the processing device 110 may also sum the multiple first intensity data obtained through the first determination to generate the second intensity data. In this case, the detection is omitted. If the second determination is performed before the first determination, the detection results obtained through the detection of the second determination may also be used for the first determination. By using the detection results obtained from both the first and second determinations in the other, the time required for determination can be shortened.

[0069] As a specific example, whenever Figure 3 When one detection element 132 transmits an ultrasonic wave US, 80 detection elements 132 detect the reflected wave RW. If each of the 80 detection elements 132 transmits an ultrasonic wave US, a total of 6400 detection results are obtained. The processing device 110 sums up the 6400 intensity distributions in the Z direction detected by the detection elements 132. This generates second intensity data. If the first determination is performed before the second determination, the second intensity data can be generated by summing up the 80 first intensity data.

[0070] Processing device 110 detects the intensity of a portion of the reflected wave in the second intensity data (step S23). For example, Figure 11 As shown, a second range Ra2 in the Z direction where reflected waves from surface 133a can be detected is preset. The second range Ra2 can also be the same as the first range Ra1. The processing device 110 compares the intensity of the reflected wave in the second range Ra2 with a preset second threshold (step S24). When the intensity is above the second threshold, the processing device 110 determines that the propagation section 133 is normal. When the intensity is below the second threshold, the processing device 110 determines that the propagation section 133 is abnormal. The processing device 110 stores the determination result in the storage device 120.

[0071] As a specific example, the processing device 110 is as follows: Figure 11The processing device 110 detects the second peak value Pe2, which has the highest intensity within the second range Ra2. The processing device 110 compares the intensity of the second peak value Pe2 with a second threshold Th2. When the intensity of the second peak value Pe2 is greater than or equal to the second threshold Th2, the processing device 110 determines that the propagation section 133 is normal. When the intensity of the second peak value Pe2 is less than the second threshold Th2, the processing device 110 determines that the propagation section 133 is abnormal. In addition to the peak intensity, the processing device 110 can also compare the cumulative or average intensity value within the second range Ra2 with the second threshold Th2 to determine the state of the propagation section 133.

[0072] When the propagation unit 133 is determined to be abnormal, the processing device 110 sends a second message (step S25). The second message indicates that the propagation unit 133 is abnormal. After the second message is sent or when the propagation unit 133 is normal, the processing device 110 ends the second determination.

[0073] The specific details of the processing in the second determination can be appropriately modified. For example, when the propagation section 133 is determined to be normal, the processing device 110 may also send a message indicating that there is no abnormality in the propagation section 133. Furthermore, the second intensity data may be generated using only the detection results from a portion of the detection element 132. For example, if the foreign object F is mainly attached to the outer periphery of the surface 133a, the second intensity data may be generated using the detection results from the detection element 132 located at the outer periphery of the detection section 131.

[0074] Regarding the first and second judgments, the first range Ra1 and the second range Ra2 are set based on the distance in the Z direction between the surface 133a of the detection unit 131 and the propagation unit 133. The first threshold Th1 and the second threshold Th2 are set based on the deviation between the detection results of the intensity of the reflected wave from the surface 133a under normal conditions and the intensity of the reflected wave.

[0075] For example, the processing device 110 outputs the first information or the second information to the display device 150. By checking the first information or the second information displayed on the display device 150, the user can confirm the location and cause of the problem in the detector 130. In addition to the display device 150, the processing device 110 can also send the first information or the second information to a terminal device such as the person performing the inspection or the manager of the welding equipment.

[0076] The processing device 110 may also output first data indicating an anomaly in the detection unit 131 along with the first information. The processing device 110 may also output second data indicating an anomaly in the propagation unit 133 along with the second information. The first data and the second data are, for example, Figure 8 as well as Figure 11The first and second data points can be the detection results of the reflected wave intensity. Alternatively, they can be images representing the detection results of the reflected wave intensity. The first and second data points can also be the intensity of a portion of the reflected wave detected in steps S14 and S23. By outputting the first or second data point, the user can confirm the basis for the processing device 110's determination that the detection unit 131 or the propagation unit 133 is abnormal. This improves the ease of use and reliability of the processing system 100 and the processing device 110.

[0077] Explain the effects of the implementation method.

[0078] like Figure 6 as well as Figure 9 As shown, there are cases where abnormalities occur in the detection section 131 or the propagation section 133 of the detector 130. If an inspection using the detector 130 is performed under abnormal conditions, appropriate inspection results may not be obtained. In order to improve inspection accuracy, it is desirable to perform the inspection using a normal detector 130 that does not have the aforementioned abnormalities.

[0079] One method to improve inspection accuracy is the periodic replacement of the detection unit 131 and the propagation unit 133. In this case, a higher replacement frequency is preferable to maintain the normal operation of the detector 130. On the other hand, inspection cannot be performed during the replacement process. Therefore, if the replacement frequency increases, the inspection efficiency decreases. Another method is for the user to confirm the data of the intensity of the detected reflected wave and to determine whether an anomaly exists. In this case, the judgment of anomaly relies on the user's experience and intuition. The replacement of the detection unit 131 requires a longer time compared to the replacement of the propagation unit 133. For example, if both the detection unit 131 and the propagation unit 133 are replaced regardless of the anomaly of the propagation unit 133, the maintenance time required for the detector 130 becomes unnecessarily longer.

[0080] The processing apparatus 110 of the embodiment performs a first determination and a second determination regarding the detector 130. By performing the first and second determinations, it is possible to investigate where an abnormality exists in the detector 130. Therefore, compared to periodically replacing the detection unit 131 and the propagation unit 133, the replacement frequency is reduced, and the efficiency of the inspection is improved. Furthermore, if an abnormality is determined to exist in either the detection unit 131 or the propagation unit 133, the user only needs to replace that one. For example, if an abnormality is determined to exist in the propagation unit 133, the user does not replace the detection unit 131, but only replaces the propagation unit 133. Therefore, the time required for maintaining the detector 130 is shortened, and maintenance costs are also reduced.

[0081] according to Figure 7 as well as Figure 10The first and second judgment methods shown can more accurately determine the abnormalities of the detection unit 131 and the propagation unit 133. Therefore, the possibility of unnecessary replacement of the detection unit 131 or the propagation unit 133 can be reduced.

[0082] The timing of the first and second checks is arbitrary. Preferably, the first and second checks are performed before the inspection of the welded part 13. This improves the accuracy of the inspection.

[0083] The second judgment is preferably performed after the first judgment. If any detection element 132 is abnormal, the total reflected wave intensity will be lower compared to the case where all detection elements 132 are normal. Therefore, in the second judgment, it is possible to incorrectly determine that the propagation section 133 is abnormal. By performing the second judgment after the detection section 131 is determined to be normal, the accuracy of the judgment in the second judgment can be improved. If the detection section 131 is determined to be abnormal, the second judgment is performed after the detection section 131 is replaced. Alternatively, the first judgment can be performed again after the detection section 131 is replaced and before the second judgment.

[0084] For example, the first and second determinations are performed when the detector 130 is away from other components. If the propagation section 133 comes into contact with other components, the intensity of the reflected wave from the surface 133a varies depending on the characteristics of the contacting component. Therefore, incorrect determination results may be output in the first and second determinations. When the first and second determinations are performed when the detector 130 is away from other components, the first threshold Th1 and the second threshold Th2 are set based on the intensity of the reflected wave from the surface 133a in that state.

[0085] Alternatively, specific components may be prepared for the first and second determinations. The first and second determinations are performed when the detector 130 is in contact with these components. As long as the intensity of the reflected wave from the surface 133a can be stabilized, the detector 130 may also be in contact with other components during the execution of the first and second determinations.

[0086] For example, after the first and second judgments, the detector 130 contacts the welded part of the object under inspection and probes the welded part. Through this probe, third intensity data is obtained, representing the intensity of the reflected wave from the welded part. The third intensity data is as follows: Figure 5 The data shown is in 3D. The processing device 110 uses the third intensity data to inspect the weld.

[0087] (Variation example) The inspection of the welded parts described above can also be performed automatically by a robot.

[0088] Figure 12 This is a schematic diagram illustrating the configuration of a processing system in a modified embodiment.

[0089] Figure 13 This is a perspective view showing a portion of a processing system in a modified embodiment.

[0090] Figure 12 The processing system 100a shown includes a processing device 110 and a robot 160. The robot 160 includes a detector 130, a camera device 161, a coating device 162, a manipulator 163, and a control device 164.

[0091] The camera device 161 photographs the welded components to obtain an image. The camera device 161 extracts the weld marks from the image and detects the approximate location of the welded portion 13. The coating device 162 applies coupling agent to the upper surface of the welded portion 13.

[0092] Detector 130, camera device 161 and coating device 162 as follows Figure 13 The robotic arm 163 is shown positioned at its front end. The robotic arm 163 can be a vertical multi-joint type, a horizontal multi-joint type, or a parallel linkage type. Driven by the robotic arm 163, the detector 130, camera device 161, and coating device 162 can be moved. A control device 164 controls the movements of the robotic arm 163. The control device 164 is a so-called robot controller. The movements of the detector 130, camera device 161, and coating device 162 are controlled by the processing device 110 or the control device 164.

[0093] Figure 14 This is a flowchart illustrating the operation of the processing system in a modified embodiment.

[0094] First, the processing device 110 performs the first and second determinations (steps S31 and S32). The processing device 110 sends the coordinates of the welded part 13 stored in the storage device 120 to the control device 164. The control device 164 drives the robotic arm 163 to move its front end toward the received coordinates. If the detector 130 moves to the vicinity of the received coordinates, the imaging device 161 takes a picture of the component 10 and detects the detailed position of the welded part 13 from the acquired image (step S33).

[0095] The control device 164 drives the robotic arm 163 to move the coating device 162 to the vicinity of the detected position. The coating device 162 applies coupling agent to the welded part 13 (step S34). The control device 164 drives the robotic arm 163 to move the detector 130 so that the tip of the detector 130 contacts the welded part 13 coated with coupling agent. If the tip of the detector 130 contacts the welded part 13 via the coupling agent, the processing device 110 causes the detector 130 to perform a probe (step S35).

[0096] The processing device 110 inspects the weld 13 based on the detection results (third strength data) obtained through probing (step S36). The processing device 110 determines whether there are any uninspected welds 13 (step S37). If there are uninspected welds 13, the processing device 110 sends the coordinates of the uninspected welds 13 to the control device 164. The control device 164 drives the robotic arm 163 to move its tip toward the received coordinates. Step S33 is executed again for any uninspected welds 13.

[0097] During the operation of the robotic arm 163 used to perform step S33, the first determination and the second determination can also be performed. Therefore, even if an abnormality occurs in the detection unit 131 or the propagation unit 133 during the operation of the robotic arm 163 or the detection process of the detector 130, the abnormality of the detection unit 131 or the propagation unit 133 can be detected earlier.

[0098] If an abnormality is determined in the detection unit 131 or the transmission unit 133 through the first or second determination, the processing device 110 may also send a signal (first information or second information) to the control device 164. If the control device 164 receives the signal, it stops the robotic arm 163. Alternatively, the control device 164 may stop the robotic arm 163 after moving the tip of the robotic arm 163 to a predetermined position.

[0099] Figure 15 It is a block diagram representing the hardware configuration of the processing device.

[0100] For example, the processing device 110 in the embodiment is a computer, having a ROM (Read Only Memory) 111, a RAM (Random Access Memory) 112, a CPU (Central Processing Unit) 113, and an HDD (Hard Disk Drive) 114.

[0101] ROM111 stores programs that control the computer's operations. ROM111 stores programs necessary for the computer to perform the aforementioned processes.

[0102] RAM 112 functions as a storage area for expanding the program stored in ROM 111. CPU 113 contains a processing loop. CPU 113 reads the control program stored in ROM 111 and controls the computer's operations according to the control program. Furthermore, CPU 113 expands various data obtained through the computer's operations into RAM 112. HDD 114 stores the necessary data for reading and the data obtained during the reading process. HDD 114 serves, for example, as... Figure 1 The storage device 120 shown functions.

[0103] The processing device 110 can also replace the HDD 114 and have eMMC (embedded Multi Media Card), SSD (Solid State Drive), SSHD (Solid State Hybrid Drive), etc.

[0104] The various processes and functions of the processing unit 110 can also be implemented through the cooperation of more computers.

[0105] Input device 140 includes at least one of a mouse, keyboard, and touch panel. Display device 150 includes at least one of a monitor and projector. A device such as a touch panel may also function as both input device 140 and display device 150.

[0106] The above describes an example of inspecting the spot-welded weld 13 using processing system 100 or 100a. However, this is not limited to this example; processing system 100 or 100a can also be used to inspect components welded by other methods. For example, processing system 100 or 100a can also inspect components welded by arc welding, laser welding, or seam welding. Non-destructive inspection of components welded by these methods can also be achieved using detector 130.

[0107] The detector 130 can also be applied to non-destructive inspections of components other than those being welded. In this case, by investigating any abnormalities in the detector 130 based on the first and second judgments, inspections can be performed with greater precision.

[0108] Based on the processing apparatus, processing system, or processing method described above, anomalies related to the detector can be determined with higher accuracy. The same effect can be achieved by using a program that enables a computer to operate as the aforementioned processing apparatus.

[0109] The processing of the various types of data mentioned above can also be recorded as programs that can be executed by a computer on non-transitory computer-readable storage media such as disks (floppy disks and hard disks, etc.), optical disks (CD-ROM, CD-R, CD-RW, DVD-ROM, DVD±R, DVD±RW, etc.), and semiconductor memories.

[0110] For example, data recorded on a recording medium can be read by a computer (or embedded system). The recording format (storage format) on the recording medium is arbitrary. For example, a computer reads a program from the recording medium and, based on that program, causes the CPU to execute the instructions described in the program. In a computer, program retrieval (or reading) can also be performed via a network.

[0111] The above embodiments of the present invention have been illustrated, but these embodiments are provided as examples and are not intended to limit the scope of the invention. These new embodiments can be implemented in various other forms, and various omissions, substitutions, and modifications can be made without departing from the spirit of the invention. These embodiments and their variations are included within the scope and spirit of the invention, and are also included within the scope of the invention as described in the claims and its equivalents. Furthermore, the above-described embodiments can be combined with each other for implementation.

Claims

1. A processing device, The detector receives the detection result of the intensity of the reflected wave detected by the detector, which includes: A detection unit that transmits ultrasonic waves and detects the reflected waves mentioned above; And a propagation section for the propagation of the aforementioned ultrasonic waves and the aforementioned reflected waves, Based on the above detection results, a first determination of the state of the detection unit and a second determination of the state of the propagation unit are performed.

2. The processing apparatus as described in claim 1, If an abnormality is determined in the first judgment above, the first piece of information indicating the abnormality of the detection unit is output. If an abnormality is determined in the second judgment above, the second information indicating the abnormality of the propagation unit is output.

3. The processing apparatus as described in claim 1 or 2, The aforementioned detection unit includes multiple detection elements for transmitting the aforementioned ultrasonic waves and detecting the aforementioned reflected waves. The above detection results include second intensity data, which is the sum of at least a portion of the multiple intensity data obtained by the multiple detection elements detecting the reflected wave respectively. The second determination is performed by comparing the intensity of a portion of the reflected wave in the second intensity data with a pre-set second threshold.

4. The processing apparatus as described in claim 1 or 2, The aforementioned detection unit includes multiple detection elements for transmitting the aforementioned ultrasonic waves and detecting the aforementioned reflected waves. The above detection results include multiple first intensity data obtained by sequentially sending the ultrasonic waves from each of the multiple detection elements and detecting each of the reflected waves. In each of the aforementioned multiple first intensity data, the intensity of a portion of the reflected wave is compared with a pre-set first threshold, thereby performing the aforementioned first judgment.

5. The processing apparatus as described in claim 4, In the second intensity data generated using the aforementioned multiple first intensity data, the intensity of a portion of the reflected wave is compared with a pre-set second threshold, thereby performing the aforementioned second judgment.

6. The processing apparatus according to any one of claims 1 to 5, When receiving the third intensity data obtained by sending the ultrasonic wave to the welding part through the detection unit and detecting the reflected wave from the welding part, the welding part is inspected based on the third intensity data.

7. A processing system comprising: The processing apparatus according to any one of claims 1 to 6; and The aforementioned detector.

8. The processing system as described in claim 7, The aforementioned transmission part is made of resin material.

9. The processing system as described in claim 7 or 8, further comprising: robotic arms; and The control device that controls the aforementioned robotic arm. The detector is located at the front end of the robotic arm.

10. The processing system as described in claim 9, When the above-mentioned processing device determines that there is an abnormality in the detection section in the first determination or that there is an abnormality in the transmission section in the second determination, the control device stops the robotic arm.

11. The processing system as described in claim 9 or 10, The first and second judgments are performed while the detector is separated from the other components.

12. The processing system as described in any one of claims 9 to 11, The first judgment and the second judgment are executed during the movement of the robotic arm.

13. A processing apparatus, Multiple detection elements, each equipped with a detection unit, sequentially transmit ultrasonic waves and receive multiple first intensity data obtained by detecting each reflected wave. The detection unit includes the aforementioned multiple detection elements that transmit the ultrasonic waves and detect the reflected waves. In each of the aforementioned multiple first intensity data, the intensity of a portion of the reflected wave is compared with a pre-set threshold to determine the state of the detection unit.

14. A processing apparatus, The detector receives the detection result of the intensity of the reflected wave detected by the detector, which includes: A detection unit for transmitting ultrasonic waves and detecting the reflected waves; and a propagation unit for propagating the ultrasonic waves and the reflected waves. The state of the propagation section is determined by comparing the intensity of a portion of the reflected wave with a pre-set threshold.

15. A processing method, The detector receives the detection result of the intensity of the reflected wave detected by the detector, which includes: A detection unit that transmits ultrasonic waves and detects the reflected waves mentioned above; And a propagation section for the propagation of the aforementioned ultrasonic waves and the aforementioned reflected waves, Based on the above detection results, a first determination of the state of the detection unit and a second determination of the state of the propagation unit are performed.

16. The processing method as described in claim 15, The first and second judgments are performed while the detector is separated from the other components.

17. The processing method as described in claim 15 or 16, When receiving the third intensity data obtained by sending the ultrasonic wave to the welding part through the detection unit and detecting the reflected wave from the welding part, the welding part is inspected based on the third intensity data.

18. A program, The computer will perform the following processing: The detector receives the detection result of the intensity of the reflected wave detected by the detector, which includes: A detection unit for transmitting ultrasonic waves and detecting the reflected waves; and a propagation unit for propagating the ultrasonic waves and the reflected waves. Based on the above detection results, a first determination of the state of the detection unit and a second determination of the state of the propagation unit are performed.

19. The procedure as described in claim 18, The computer receives the third intensity data obtained by transmitting the ultrasonic wave to the welding part through the detection unit and detecting the reflected wave from the welding part, and inspects the welding part based on the third intensity data.

20. A storage medium, The program as described in claim 18 or 19 is stored.

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